Light Emitting Diodes Reliability Review ⇑ Moon-Hwan Chang A, Diganta Das A, P.V
Microelectronics Reliability 52 (2012) 762–782 Contents lists available at ScienceDirect Microelectronics Reliability journal homepage: www.elsevier.com/locate/microrel Light emitting diodes reliability review ⇑ Moon-Hwan Chang a, Diganta Das a, P.V. Varde a,c, Michael Pecht a,b, a CALCE Center for Advanced Life Cycle Engineering, University of Maryland, College Park, MD 20742, United States b Center for Prognostics and System Health Management, City University of Hong Kong, Hong Kong, China c Homi Bhabha National Institute, Reactor Group, Dhruva Complex, Bhabha Atomic Research Centre, Mumbai 400 085, India article info abstract Article history: The increasing demand for light emitting diodes (LEDs) has been driven by a number of application cat- Received 21 February 2011 egories, including display backlighting, communications, medical services, signage, and general illumina- Received in revised form 9 July 2011 tion. The construction of LEDs is somewhat similar to microelectronics, but there are functional Accepted 16 July 2011 requirements, materials, and interfaces in LEDs that make their failure modes and mechanisms unique. Available online 15 August 2011 This paper presents a comprehensive review for industry and academic research on LED failure mecha- nisms and reliability to help LED developers and end-product manufacturers focus resources in an effec- tive manner. The focus is on the reliability of LEDs at the die and package levels. The reliability information provided by the LED manufacturers is not at a mature enough stage to be useful to most con- sumers and end-product manufacturers. This paper provides the groundwork for an understanding of the reliability issues of LEDs across the supply chain.
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