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International Test Conference Magdy Abadir Ralf Arnold Freescale Semiconductor Infineon Technologies International Salem Abdennadher Patrick Au Test Conference Intel IBM Jais Abraham Florence Azais AMD L1RMM 2009 Technical Erkan Acar Charles Bachand Paper Reviewers Intel Advanced Micro Devices YiCai Dhruva Acharyya Kedarnath Balakrishnan LSI Verigy AMD Adrian Carbine Brice Achkir Mehdi Baradaran Tahoori Intel Cisco Systems Northeastern University Darrell Carder John Acken Thomas Bartenstein Freescale Semiconductor CityWeb Cadence Design Systems. Luigi Carro SamanAdham Pouria Bastani UFRGS LogicVision Canada Intel John Carulli Vishwani Agrawal Luis Basto Texas Instruments Auburn University Cadence Design Systems Olivier Caty NisarAhmed Nadir Basturkmen Sun Microsystems Texas Instruments Intel Krishnendu Chakrabarty Heiko Ahrens Bernd Becker Duke University Freescale Semiconductor University of Freiburg Tapan Chakraborty Robert Aitken Dawit Belete Alcatel-Lucent ARM Freescale Semiconductor Krishna Chakravadhanula Zaid AI-Ars Serge Bernard Cadence Design Systems Delft University ofTechnology L1RMM Sreejit Chakravarty Hussain AI-Asaad Paul Berndt LSI University of California at Davis Cypress Semiconductor Victor Champac Gregory Aldrich Jayanta Bhadra National Inst. for Astrophysics Mentor Graphics Freescale Semiconductor Kameshwar Chandrasekar Micheal Ales Sandeep Bhatia Intel Texas Instruments Atrenta Yi-Shing Chang Bashir AI-Hashimi Bhargab Bhattacharya Intel Indian Statistical Institute Mohammad AIi-Bakhshian Mango Chao McGill University Dilip Bhavsar National Chiao-Tung University Intel Chris Allsup Abhijit Chatterjee Synopsys Sounil Biswas Georgia Institute of Technology NVIDIA Sobeeh Almukhaizim Gang Chen Kuwait University Shawn Blanton Mentor Graphics Carnegie Mellon University Anthony Ambler Chen-Huan Chiang University of Texas at Austin Cristiana Bolchini Alcatel-Lucent Technologies Politecnico di Milano Ali Ameri Vivek Chickermane McGill University Alberto Bosio Cadence Design Systems L1RMM Enamul Amyeen Kelma Christophe Intel Sebastian Bota NXP Semiconductors Universitat de les Illes Balears Dong An Kun Chuai CMC Microsystems Ben Brown McGill Univers ity LTX-Credence Sadok Aouini Jaeyong Chung McGill University Victoria Bruce University of Texas at Austin Advanced Micro Devices Davide Appello Christopher Clark STMicroelectronics Steve Butkovich Intellitech Cisco Systems Dave Armstrong Thomas Clouqueur Advantest Kenneth Butler AMD Texas Instruments 17 INTERNATIONAL Don Edenfeld Saket Goyal ~ TEST CONFERENCE Intel LSI 2009 Stefan Eichenberger Shalabh Goyal NXP Semiconductors National Semiconductor William Eisenstadt James Grealish 2009 Technical University of Florida Intel Paper Reviewers William Eklow XinliGu Cisco Systems Cisco Systems Edward Cole, Jr. Sandia National Laboratories Piet Engelke lois Guiller Albert-Ludwigs -Universitat Freiburg Synopsys Dennis Conti IBM Frank-Uwe Faber Ruifeng Guo Infineon Technologies AG Mentor Graphics Bruce Cory NVIDIA Daniel Fan Puneet Gupta NVIDIA Erika Cota Lei Fang UFRGS Microsoft Sandeep Gupta University of Southern California Alfred Crouch Michele Favalli ASSET InterTech University of Ferrara Alan Hales Texas Instrruments Dariusz Czysz Derek Feltham Poznan University ofTechnology Intel Said Hamdioui Delft University of Technology Ramyanshu Datta D. Michael Fennelly Texas Instruments Roos Instruments Gert Hansel Qimonda Scott Davidson John Ferrario Sun Microsystems IBM Ian Harris University of California Irvine Frans De Jong Scott Fetherston NXP Semiconductors PLX Technology Peter Harrod ARM Dirk De Vries Marie-Lise Flottes PDF Solutions L1RMM Ismed Hartanto Xilinx Frank Demmerle Hideo Fujiwara Infineon Technologies Nara Institute of Science and Technol­ Gurgen Harutyunyan ogy Virage Logic rao desineni IBM George Gal Kazumi Hatayama McGill Semiconductor Technology Academic Stefano Di Carlo Research Center Politecnico di Torino Murali Gala Sun Microsystems Charles Hawkins Giorgio Di Natale University of New Mexico L1RMM Anne Gattiker IBM John Hayes Paul Dickinson Sun Microsystems Colm Gavin Sybille Hellebrand Credence University of Paderborn Luigi Dilillo L1RMM Philip Geiger Christopher Henderson Dell Inc Semitracks, Inc. Jason Doege AMD Grady Giles graham hetherington Advanced Micro Devices texas instruments Art Downey Advantest Pamela Gillis Mokhtar Hirech IBM Synopsys Vijay Durairaj Synopsys Patrick Girard Michael Hsiao L1RMM/CNRS Virginia Tech Bradley Dutton Auburn University Emil Gizdarski Jiun-Lang Huang Synopsys National Taiwan University Kumar Dwarakanath DAFCA Dimitris Gizopoulos Yu Huang University of Piraeus Mentor Graphics Jennifer Dworak Brown University Sandeep Goel Leendert Huisman Theodore Eaton Robert Gottlieb Bill Huott Cisco Ststems Intel IBM 18 Tomoo Inoue David Lavo Hiroshima City University UC Santa Cruz International Kazuhiko Iwasaki Donghwi Lee Test Conference Tokyo Metropolitan University NVIDIA Vikram Iyengar Chris Lemoine IBM LTX-Credence 2009 Technical Gerald Johnson Regis Leveugle Paper Reviewers Teradyne INPG TM Mak Doug Josephson Adam Ley Intel Intel ASSET InterTech Yiorgos Makris Hong-Shin Jun James Li Yale University Cisco Systems National Taiwan University Hans Manhaeve Dimitri Kagaris Jin-Fu Li Q-Star Test nv Southern Illinois University National Central University prasad mantri Seiji Kajihara Mike Li Sun Microsystems Kyushu Institute of Technology Altera Martin Margala Sumant Kale Xiaowei Li University of Massachusetts Lowell Texas Instruments Chinese Academy of Sciences Erik Jan Marinissen Sungho Kang Yanjing Li IMEC Yonsei University Stanford University Gregory Maston Rohit Kapur Eric Liau Synopsys Synopsys Qimonda Mitsuo Matsuomoto Ramesh Karri Ken Lick Advantest Polytechnic Institute of NYU Xijiang Lin Peter Maxwell Mark Kassab Mentor Graphics Aptina Imaging Mentor Graphics Yen-Tzu Lin Teresa McLaurin Xrysovalantis Kavousianos Carnegie Mellon University ARM University of loannina Chunsheng Liu Vishal Mehta David Keezer NVIDIA NVIDIA Georgia Institute ofTechnology Jin Liu Sankaran Menon Brion Keller Texas Instruments Intel Cadence Design Systems Xiao Liu Henri Merkelo Hans Kerkhoff Texas Instruments atSpeed Technologies CTIT - University of Twente J.C. Lo Cecilia Metra Kee Sup Kim University of Rhode Island University of Bologna Intel Ethan Long Salvador Mir Seongwon Kim Texas Instruments TIMA Laboratory IBM T.J. Watson Research Center Marc Loranger Subhasish Mitra David King FormFactor Stanford University Texas Instruments Lawrence Luce Yukiya Miura Nektarios Kranitis Teradyne Tokyo Metropolitan University University of Athens Yuhai Ma Kohei Miyase Andrzej Krasniewski Advantest America Kyushu Institute ofTechnology Warsaw University of Technology Marco Macedo Kartik Mohanram Sandip Kundu McGill University Rice University University of Massachusetts Jose' Machado da Silva Claudio Montiel Claus Kuntzsch Universidade do Porto Texas Instruments Carl Moore Akinori Maeda Maxim Integrated Products Mary Kusko Verigy Japan IBM Grzegorz Mrugalski Ashraf Majid Mentor Graphics Eric Larson Georgia Institute of Technology Self Employed Peter Muhmenthaler Amitava Majumdar Muhmenthaler Erik Larsson AMD Linkoping University 19 INTERNATIONAL George Ontko Michele Portolan ~ TEST CONFERENCE Texas Instruments Alcatel-Lucent 2009 Nobuaki Otsuka Paolo Prinetto Toshiba Politecnico di Torino Sule Ozev Mike Purtell 2009 Technical Arizona State University Intersil Paper Reviewers Andrea Paganini Carol Pyron IBM Freescale Semiconductor Nilanjan Mukherjee Mentor Graphics Rubin Parekhji Jie Qin Texas Instruments (India) Auburn University Tom Munns Munns Consulting Joonsung Park Wangqi Qiu The University of Texas at Austin Pextra Corporation Fidel Muradali National Semiconductor Sung-Boem Park Jaan Raik Stanford University Tallinn University ofTechnology Amit Nahar Texas Instruments Kenneth Parker Rajesh Raina Agilent Technologies Freescale Semiconductor Michinobu Nakao Renesas Technology Bruce Parnas Raghuraman Rajanarayanan AMD Tom Napier Ishwar Parulkar FormFactor Sun Microsystems Janusz Rajski Mentor Graphics Suriyaprakash Natarajan Antonis Paschalis Intel NCSR Rochit Rajsuman Roctechnology Udaya Natarajan Chintan Patel Intel University of Maryland Baltimore C Ravikumar County Texas Instruments Debashis Nayak Intel Jayashri Patil Jeff Rearick International Institute of Information AMD Jim Neeb Technology Intel Maurizio Rebaudengo Srinivas Patil Politecnico di Torino Nicola Nicolici Intel McMaster University Sudhakar Reddy Bipul Paul University of Iowa Phil Nigh Toshiba America Research IBM Rosa Reinosa Sandeep Pendharkar Hewlett-Packard D Nikolos Advanced Micro Devices Michel Renovell Dayton Norrgard Rajesh Pendurkar L1RMM Agilent Technologies RMI Corporation Paul Reuter Franc Novak Zebo Peng Mentor Graphics Jozef Stefan Institute Linkoping University Mike Ricchetti Jim O'Reilly Charles Pilch AMD IC Test Northwest Texas Instruments Alan Righter Steven Oakland James Plusquellic Analog Devices IBM Microelectronics University of New Mexico Jochen Rivoir Cengiz Oezcan Frank Poehl Verigy Philips Semiconductors Infineon Technologies Gordon Roberts Ajay Ojha OseiPoku McGill University Intel Carnegie Mellon University Gordon Robinson David Oka Ilia Polian Independent Consultant LOA Technology Inc Albert-Ludwigs-University of Freiburg Rosa Rodriguez Toshiyuki Okayasu Irith Pomeranz Universitat Politecnica de Catalunya Advantest Purdue University Jeffrey Roehr Martin Omana Wojtek Poppe MediaTek Wireless University of Bologna NVIDIA Luis Rolindez Toshinobu Ono Jean-Michel Portal STMicroelectronics NEC
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