CTS A ICDS-25 STR B 25th International Conference on Defects in Semiconductors St Petersburg, Russia, July 20–24, 2009 BOOK OF A ISBN 978-5-93634-048-2 9 785936340482 ICDS-25 BOOK OF ABSTRACTS CTS A ICDS-25 STR B 25th International Conference on Defects in Semiconductors St Petersburg, Russia, July 20–24, 2009 BOOK OF A ICDS-25 BOOK OF ABSTRACTS 25th International Conference on Defects in Semiconductors St Petersburg, Russia, July 20–24, 2009 www.ioffe.ru/ICDS-25 BOOK OF ABSTRACTS Ioffe Institute St Petersburg, 2009 This volume was compiled at the Information Services & Publishing Department of the Ioffe Institute from texts submitted by authors via Monomax On-line Form. The texts were converted to LATEX2εwithout any revisions. Proofs of all the abstracts were displayed on the Conference website during June 9–24. All the mistakes found by the authors were corrected. ISBN 978-5-93634-048-2 Information Services & Publishing Department Ioffe Institute 26 Politekhnicheskaya, St Petersburg 194021, Russia Phones: (812) 297 2617 Fax: (812) 297 1017 E-mail:
[email protected] Printed in Russian Federation Organisers Ioffe Physical-Technical Institute Saint Petersburg State Politechnical University with the assistance of Monomax Congressess & Incentives Sponsors Russian Foundation for Basic Research Russian Academy of Sciences Conference Chair Andrei G. Zabrodskii (Ioffe Institute, Russia) International Advisory Committee Alexander Aseev (Russia) Robert Jones (UK) F. Danie Auret (South Africa) Kohei Itoh (Japan) Brian Bech Nielsen (Denmark, Chair) Hiroshi Katayama-Yoshida (Japan) Marilia Caldas (Brasil) Matthew McCluskey (USA) Anna Cavallini (Italy) Patricia Mooney (Canada) Leszek Dobaczewski (Poland) Michael Stavola (USA) Vadim Emtsev (Russia) Chris Van de Walle (USA) Tom Gregorkiewcz (The Netherlands) Joerg Weber (Germany) Stefan Estreicher (USA) Deren Yang (China) Jan Evans-Freeman (UK) Shengbai Zhang (USA) Eugene Haller (USA) International Programme Committee Vadim V.