Advanced Topographic Characterization of Variously Prepared Niobium Surfaces and Linkage to RF Losses
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W&M ScholarWorks Dissertations, Theses, and Masters Projects Theses, Dissertations, & Master Projects 2013 Advanced Topographic Characterization of Variously Prepared Niobium Surfaces and Linkage to RF Losses Chen Xu College of William & Mary - Arts & Sciences Follow this and additional works at: https://scholarworks.wm.edu/etd Part of the Condensed Matter Physics Commons, and the Physical Chemistry Commons Recommended Citation Xu, Chen, "Advanced Topographic Characterization of Variously Prepared Niobium Surfaces and Linkage to RF Losses" (2013). Dissertations, Theses, and Masters Projects. Paper 1539623621. https://dx.doi.org/doi:10.21220/s2-4cbq-f475 This Dissertation is brought to you for free and open access by the Theses, Dissertations, & Master Projects at W&M ScholarWorks. It has been accepted for inclusion in Dissertations, Theses, and Masters Projects by an authorized administrator of W&M ScholarWorks. For more information, please contact [email protected]. Advanced Topographic Characterization of Variously Prepared Niobium Surfaces and Linkage to RF Losses Chen Xu Beijing, Beijing, China Master of Science, Tsinghua University, 2007 Bachelor of Science, Fudan University, 2005 A Dissertation presented to the Graduate Faculty of the College of William and Mary in Candidacy for the Degree of Doctor of Philosophy Department of Applied Science The College of William and Mary May,2013 ©Copyright by _Chen Xu, 2013 All Rights Reserved APPROVAL PAGE This Dissertation is submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy Chen Xu Approved by the Committee, Feb 2013 iy L f \ f. ■ Committee Chair Professor Micheal J Kelley, Applied Sdience Departments College of William and Mary Profe' rsor wriliam Cooke, Physics Department College of William and Mary Professor Gunter Lupke, Applied Science Departments College of William and Mary Dr Charles E. Reece, SRF Institute Thomas Jefferson National Accelerator Facility ABSTRACT Superconducting radio frequency (SRF) technology is widely adopted in particle accelerators. The shallow penetration (~ 40 nm) of the RF into superconducting niobium lends great importance to SRF cavity interior surface chemistry and topography. These in turn are strongly influenced by the chemical etching “surface clean-up” that follows fabrication. The principal surface smoothing methods are buffered chemical polish (BCP) and electropolish (EP). The resulting topography is characterized by atomic force microscopy (AFM). The power spectral density (PSD) of AFM data provides a more thorough description of the topography than a single-value roughness measurement. In this work, one dimensional average PSD functions derived from topography of BCP and EP with different controlled starting conditions and durations have been fitted with a combination of power law, K-correlation, and shifted Gaussian models to extract characteristic parameters at different spatial harmonic scales. While the simplest characterizations of these data are not new, the systematic tracking of scale-specific roughness as a function of processing is new and offers feedback for tighter process prescriptions more knowledgably targeted at beneficial niobium topography for SRF applications. Process development suffers because the cavity interior surface cannot be viewed directly without cutting out pieces, rendering the cavities unavailable for further study. Here we explore replica techniques as an alternative, providing imprints of cavity internal surface that can be readily examined. A second matter is the topography measurement technique used. Atomic force microscopy (AFM) has proven successful, but too time intensive for routine use. We therefore introduce white light interferometry (WLI) approach as an alternative. We examined real surfaces and their replicas, using AFM and WLI. W e find that the replica/WLI is promising to provide the large majority of desired information, so that use of the time-intensive AFM approach can be limited to where it is genuinely necessary. The prevalent idea is that sharp features could lead to magnetic quench or enhance the thermal quench. In this report, a calculation on magnetic field is numerically given on fine structure by finite element and conformal mapping methods. Corresponding RF Ohmic loss will be simulated. A certain thermal tolerant will be calculated. A Q~E curve will be predicted from this model. A perturbation model is utilized to calculate rough surface additional RF loss based on PSD statistical analysis. This model will not consider that superconductor will become normal at field higher than transition field. Therefore, it is only expected to explain mid field Q performance. One can calculate the RF power dissipation ratio between rough surface and ideal smooth surface within this field range. Additionally, the resistivity of Nb is temperature and magnetic field dependent from classic thermal feedback model theory. Combining with topographic PSD analysis and Rs temperature and field dependency, a middle field Q slope model could be modeled and the contribution from topography can be simulated. TABLE OF CONTENTS Acknowledgements iii Dedication iv List of Tables v List of Figures vi Chapter 1. Introduction 1 Chapter 2. Superconductivity, surfacetreatments and cavity testing 6 Chapter 3. Enhanced Characterization of Niobium Surface Topography 19 Chapter 4. A topographic power spectral density study of the effect of surface treatment processes on niobium for SRF accelerator cavities 52 Chapter 5. Characterization of Nb SRF cavity materials by White light interferometry and replica techniques 92 Chapter 6. Mechanism of Contribution to Niobium SRF cavities linear RF loss due to topographic surface structures 112 Chapter 7. Superconducting cavity rough surface and interior Magnetic field calculation and explanation of Non-linear surface resistant at high field 124 Appendix A 155 Appendix B 166 Appendix C 175 i Appendix D Autobiography ACKNOWLEDGEMENTS There are many people who have contributed time, knowledge, skill and support to the successful completion of this dissertation. Firstly, I wish to extend my thanks to my advisors Dr Michael J.Kelley and Dr Charles E. Reece for their patience and guidance on my research, study and editing of this manuscript. Without their support and guidance, this work would not have been done. I also really appreciate Dr Gunter Luepke and Dr William Cooke for taking time out of their busy schedule to serve as my dissertation committee members. Their attention, advice and review of this dissertation are extremely valuable to me. Secondly, I wish to acknowledge the exceptional support from SRF institute in Jefferson Lab: Dr Larry Philips, Dr Rongli Geng, Dr Haipeng Wang, Dr Hui Tian for their helpful instruction and discussion. Dr Xin Zhao, Dr Grigory Eremeev, Dr Gianluigi Ciovati, Anne-Marie Valente-Feliciano, Dr Peter Kneisel, Dr Robert Rimmer, Dr Andy T Wu, Dr Jiquan Guo, Dr Shaoheng Wang, Dr Ari Palczewski, Dr Pashupati Dhakal, Dr Todd Satogata, Dr Geoffrey Kraft, Olga Trogimova, Amy Wilkerson and Gary Cheng for their kind help and discussion. Carolyn Camp, for her helpful communication and organization; Stephen Dutton and Michael Morrone, for their electrionic works; I would like also express my thank to Dr Peter Takacs in Brookhaven national lab and Dr Alex Gruvich in Old Dominion University and Dr Xiaoxiong Gu from IBM Yorktown NY for their kind discussions. Thirdly, I would like to thank my officemates, Dr Binping Xiao, Dr Song Jin, Dr Jin Dai , Dr Senthilraja Singaravelu, Liang Zhao, Feisi He , Yongming Li, Jarnadan Upadhyay and Suba De Silva. I would like thank all my friends in the college of William and Mary, in Jefferson Lab, In Old Dominion University. Finally, I wish to express my deepest thanks for the unconditional trust, support and love from my family. Dedicated to Shuqin Wu and Zhongyi Zhao, Jie Zhao and Anxiang Xu. LIST OF TABLES Table 3.1 Averaged Rq and Rdq parameters with and without third order polynomial detrending with AFM scan range 100 pm by 100 pm 50 Table 3.2 Fitting parameters of samples of Single Crystal samples 50 Table 3.3 Lateral lengths and angles between given two cursors 50 Table 3.4 Fitting parameters of Incremental Nanopolished samples 51 Table 3.5 Fitting parameters of Incremental EP samples 51 Table 4.1 Summary of the effect of BCP treatment on topography of nanopolished single crystals 86 Table 4.2 The fitting parameters of Single Crystal Samples 87 Table 4.3 Summary of RMS values on the effect of BCP treatment on topography of fine-grained, nanopolished polycrystalline niobium 88 Table 4.4 Lateral lengths and angles between given two cursors 88 Table 4.5 The fitting parameter of nanopolished samples 89 Table 4.6 Effect of initial EP on fine-grained Nb previously subjected to BCP 89 Table 4.7 the fitting parameter of Incremental light EP Samples at 20°C 90 Table 4.8 Effect of full EP conversion on fine-grained Nb previously subjected to 100 pm BCP 90 Table 4.9 Fitting parameters of Incremental heavy EP Samples at 30°C 91 Table 5.1 Characterization Parameters for white light interferometry 111 Table 6.1 Averaged /?qwith AFM and WLI on different treatments 124 Table 7.1: The temperature, RBCS, Super/ normal conducting RF loss and its percentage are shown as a function of different H 154 v LIST OF FIGURES Figure 2.1 Vertical Testing Areas in Jlab 17 Figure 2.2 Diagram of a typical cavity testing structure 17 Figure 2.3 Surface magnetic field is illustrated on CEBAF 7 cells cavities