Nanotechnology ? Nram (Nano Random Access
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Chapter 3 Semiconductor Memories
Chapter 3 Semiconductor Memories Jin-Fu Li Department of Electrical Engineering National Central University Jungli, Taiwan Outline Introduction Random Access Memories Content Addressable Memories Read Only Memories Flash Memories Advanced Reliable Systems (ARES) Lab. Jin-Fu Li, EE, NCU 2 Overview of Memory Types Semiconductor Memories Read/Write Memory or Random Access Memory (RAM) Read Only Memory (ROM) Random Access Non-Random Access Memory (RAM) Memory (RAM) •Mask (Fuse) ROM •Programmable ROM (PROM) •Erasable PROM (EPROM) •Static RAM (SRAM) •FIFO/LIFO •Electrically EPROM (EEPROM) •Dynamic RAM (DRAM) •Shift Register •Flash Memory •Register File •Content Addressable •Ferroelectric RAM (FRAM) Memory (CAM) •Magnetic RAM (MRAM) Advanced Reliable Systems (ARES) Lab. Jin-Fu Li, EE, NCU 3 Memory Elements – Memory Architecture Memory elements may be divided into the following categories Random access memory Serial access memory Content addressable memory Memory architecture 2m+k bits row decoder row decoder 2n-k words row decoder row decoder column decoder k column mux, n-bit address sense amp, 2m-bit data I/Os write buffers Advanced Reliable Systems (ARES) Lab. Jin-Fu Li, EE, NCU 4 1-D Memory Architecture S0 S0 Word0 Word0 S1 S1 Word1 Word1 S2 S2 Word2 Word2 A0 S3 S3 A1 Decoder Ak-1 Sn-2 Storage Sn-2 Wordn-2 element Wordn-2 Sn-1 Sn-1 Wordn-1 Wordn-1 m-bit m-bit Input/Output Input/Output n select signals are reduced n select signals: S0-Sn-1 to k address signals: A0-Ak-1 Advanced Reliable Systems (ARES) Lab. Jin-Fu Li, EE, NCU 5 Memory Architecture S0 Word0 Wordi-1 S1 A0 A1 Ak-1 Row Decoder Sn-1 Wordni-1 A 0 Column Decoder Aj-1 Sense Amplifier Read/Write Circuit m-bit Input/Output Advanced Reliable Systems (ARES) Lab. -
Section 10 Flash Technology
10 FLASH TECHNOLOGY Overview Flash memory technology is a mix of EPROM and EEPROM technologies. The term “flash” was chosen because a large chunk of memory could be erased at one time. The name, therefore, distinguishes flash devices from EEPROMs, where each byte is erased individually. Flash memory technology is today a mature technology. Flash memory is a strong com- petitor to other memories such as EPROMs, EEPROMs, and to some DRAM applications. Figure 10-1 shows the density comparison of a flash versus other memories. 64M 16M 4M DRAM/EPROM 1M SRAM/EEPROM Density 256K Flash 64K 1980 1982 1984 1986 1988 1990 1992 1994 1996 Year Source: Intel/ICE, "Memory 1996" 18613A Figure 10-1. Flash Density Versus Other Memory How the Device Works The elementary flash cell consists of one transistor with a floating gate, similar to an EPROM cell. However, technology and geometry differences between flash devices and EPROMs exist. In particular, the gate oxide between the silicon and the floating gate is thinner for flash technology. It is similar to the tunnel oxide of an EEPROM. Source and INTEGRATED CIRCUIT ENGINEERING CORPORATION 10-1 Flash Technology drain diffusions are also different. Figure 10-2 shows a comparison between a flash cell and an EPROM cell with the same technology complexity. Due to thinner gate oxide, the flash device will be more difficult to process. CMOS Flash Cell CMOS EPROM Cell Mag. 10,000x Mag. 10,000x Flash Memory Cell – Larger transistor – Thinner floating gate – Thinner oxide (100-200Å) Photos by ICE 17561A Figure 10-2. -
Universal Memory
BRIEFING No.4 ICT UNIVERSAL MEMORY Memory is an integral part of information processing devices and is needed for short‐term stor‐ age such as when computer programs are being executed or text documents are processed. Currently, three main types of memory exist: SRAM offers very high speed at a high cost, DRAM is average in terms of speed and cost, and Flash memory is a low cost, low speed solution for applications that need to retain the data even when power is disconnected. A group of emerg‐ ing memory devices called universal memory aim to combine all these features in a single de‐ vice.1 Developments in universal memory devices may eventually lead to the introduction of novel October 2010 October memory architectures that offer increased performance, enable smaller mobile devices, and offer novel features in traditional products such as cars or domestic appliances. Nanotechnol‐ ogy is an integral part of emerging memory research as it is becoming increasingly difficult to enhance the performance of current devices by scaling the technology further. It is unlikely that a single technology will emerge as the universal memory technology; however, the develop‐ ments in this sector will enhance the energy efficiency and performance of memory devices. Currently, the Integrated Circuit (IC) market is dominated by US and Asia based companies. Uni‐ versal memory and nanotechnology based solutions could provide an opportunity for Europe to gain ground in the sector. Background volatility. Its disadvantage compared to SRAM and DRAM is speed. None of the existing memory technologies provide all of the required properties. -
AXP Internal 2-Apr-20 1
2-Apr-20 AXP Internal 1 2-Apr-20 AXP Internal 2 2-Apr-20 AXP Internal 3 2-Apr-20 AXP Internal 4 2-Apr-20 AXP Internal 5 2-Apr-20 AXP Internal 6 Class 6 Subject: Computer Science Title of the Book: IT Planet Petabyte Chapter 2: Computer Memory GENERAL INSTRUCTIONS: • Exercises to be written in the book. • Assignment questions to be done in ruled sheets. • You Tube link is for the explanation of Primary and Secondary Memory. YouTube Link: ➢ https://youtu.be/aOgvgHiazQA INTRODUCTION: ➢ Computer can store a large amount of data safely in their memory for future use. ➢ A computer’s memory is measured either in Bits or Bytes. ➢ The memory of a computer is divided into two categories: Primary Memory, Secondary Memory. ➢ There are two types of Primary Memory: ROM and RAM. ➢ Cache Memory is used to store program and instructions that are frequently used. EXPLANATION: Computer Memory: Memory plays a very important role in a computer. It is the basic unit where data and instructions are stored temporarily. Memory usually consists of one or more chips on the mother board, or you can say it consists of electronic components that store instructions waiting to be executed by the processor, data needed by those instructions, and the results of processing the data. Memory Units: Computer memory is measured in bits and bytes. A bit is the smallest unit of information that a computer can process and store. A group of 4 bits is known as nibble, and a group of 8 bits is called byte. -
Solid State Drives Data Reliability and Lifetime
Solid State Drives Data Reliability and Lifetime White Paper Alan R. Olson & Denis J. Langlois April 7, 2008 Abstract The explosion of flash memory technology has dramatically increased storage capacity and decreased the cost of non-volatile semiconductor memory. The technology has fueled the proliferation of USB flash drives and is now poised to replace magnetic hard disks in some applications. A solid state drive (SSD) is a non-volatile memory system that emulates a magnetic hard disk drive (HDD). SSDs do not contain any moving parts, however, and depend on flash memory chips to store data. With proper design, an SSD is able to provide high data transfer rates, low access time, improved tolerance to shock and vibration, and reduced power consumption. For some applications, the improved performance and durability outweigh the higher cost of an SSD relative to an HDD. Using flash memory as a hard disk replacement is not without challenges. The nano-scale of the memory cell is pushing the limits of semiconductor physics. Extremely thin insulating glass layers are necessary for proper operation of the memory cells. These layers are subjected to stressful temperatures and voltages, and their insulating properties deteriorate over time. Quite simply, flash memory can wear out. Fortunately, the wear-out physics are well understood and data management strategies are used to compensate for the limited lifetime of flash memory. Floating Gate Flash Memory Cells Flash memory was invented by Dr. Fujio Masuoka while working for Toshiba in 1984. The name "flash" was suggested because the process of erasing the memory contents reminded him of the flash of a camera. -
Nanotechnology Trends in Nonvolatile Memory Devices
IBM Research Nanotechnology Trends in Nonvolatile Memory Devices Gian-Luca Bona [email protected] IBM Research, Almaden Research Center © 2008 IBM Corporation IBM Research The Elusive Universal Memory © 2008 IBM Corporation IBM Research Incumbent Semiconductor Memories SRAM Cost NOR FLASH DRAM NAND FLASH Attributes for universal memories: –Highest performance –Lowest active and standby power –Unlimited Read/Write endurance –Non-Volatility –Compatible to existing technologies –Continuously scalable –Lowest cost per bit Performance © 2008 IBM Corporation IBM Research Incumbent Semiconductor Memories SRAM Cost NOR FLASH DRAM NAND FLASH m+1 SLm SLm-1 WLn-1 WLn WLn+1 A new class of universal storage device : – a fast solid-state, nonvolatile RAM – enables compact, robust storage systems with solid state reliability and significantly improved cost- performance Performance © 2008 IBM Corporation IBM Research Non-volatile, universal semiconductor memory SL m+1 SL m SL m-1 WL n-1 WL n WL n+1 Everyone is looking for a dense (cheap) crosspoint memory. It is relatively easy to identify materials that show bistable hysteretic behavior (easily distinguishable, stable on/off states). IBM © 2006 IBM Corporation IBM Research The Memory Landscape © 2008 IBM Corporation IBM Research IBM Research Histogram of Memory Papers Papers presented at Symposium on VLSI Technology and IEDM; Ref.: G. Burr et al., IBM Journal of R&D, Vol.52, No.4/5, July 2008 © 2008 IBM Corporation IBM Research IBM Research Emerging Memory Technologies Memory technology remains an -
Embedded DRAM
Embedded DRAM Raviprasad Kuloor Semiconductor Research and Development Centre, Bangalore IBM Systems and Technology Group DRAM Topics Introduction to memory DRAM basics and bitcell array eDRAM operational details (case study) Noise concerns Wordline driver (WLDRV) and level translators (LT) Challenges in eDRAM Understanding Timing diagram – An example References Slide 1 Acknowledgement • John Barth, IBM SRDC for most of the slides content • Madabusi Govindarajan • Subramanian S. Iyer • Many Others Slide 2 Topics Introduction to memory DRAM basics and bitcell array eDRAM operational details (case study) Noise concerns Wordline driver (WLDRV) and level translators (LT) Challenges in eDRAM Understanding Timing diagram – An example Slide 3 Memory Classification revisited Slide 4 Motivation for a memory hierarchy – infinite memory Memory store Processor Infinitely fast Infinitely large Cycles per Instruction Number of processor clock cycles (CPI) = required per instruction CPI[ ∞ cache] Finite memory speed Memory store Processor Finite speed Infinite size CPI = CPI[∞ cache] + FCP Finite cache penalty Locality of reference – spatial and temporal Temporal If you access something now you’ll need it again soon e.g: Loops Spatial If you accessed something you’ll also need its neighbor e.g: Arrays Exploit this to divide memory into hierarchy Hit L2 L1 (Slow) Processor Miss (Fast) Hit Register Cache size impacts cycles-per-instruction Access rate reduces Slower memory is sufficient Cache size impacts cycles-per-instruction For a 5GHz -
MSP430 Flash Memory Characteristics (Rev. B)
Application Report SLAA334B–September 2006–Revised August 2018 MSP430 Flash Memory Characteristics ........................................................................................................................ MSP430 Applications ABSTRACT Flash memory is a widely used, reliable, and flexible nonvolatile memory to store software code and data in a microcontroller. Failing to handle the flash according to data-sheet specifications can result in unreliable operation of the application. This application report explains the physics behind these specifications and also gives recommendations for the correct management of flash memory on MSP430™ microcontrollers (MCUs). All examples are based on the flash memory used in the MSP430F1xx, MSP430F2xx, and MSP430F4xx microcontroller families. Contents 1 Flash Memory ................................................................................................................ 2 2 Simplified Flash Memory Cell .............................................................................................. 2 3 Flash Memory Parameters ................................................................................................. 3 3.1 Data Retention ...................................................................................................... 3 3.2 Flash Endurance.................................................................................................... 5 3.3 Cumulative Program Time......................................................................................... 5 4 -
The Rise of the Flash Memory Market: Its Impact on Firm
The Rise of the Flash Web version: Memory Market: Its Impact July 2007 on Firm Behavior and Author: Global Semiconductor Falan Yinug1 Trade Patterns Abstract This article addresses three questions about the flash memory market. First, will the growth of the flash memory market be a short- or long-term phenomenon? Second, will the growth of the flash memory market prompt changes in firm behavior and industry structure? Third, what are the implications for global semiconductor trade patterns of flash memory market growth? The analysis concludes that flash memory market growth is a long-term phenomenon to which producers have responded in four distinct ways. It also concludes that the rise in flash memory demand has intensified current semiconductor trade patterns but has not shifted them fundamentally. 1 Falan Yinug ([email protected]) is a International Trade Analyst from the Office of Industries. His words are strictly his own and do not represent the opinions of the US International Trade Commission or of any of its Commissioners. 1 Introduction The past few years have witnessed rapid growth in a particular segment of the 2 semiconductor market known as flash memory. In each of the past five years, for example, flash memory market growth has either outpaced or equaled that 3 of the total integrated circuit (IC) market (McClean et al 2004-2007, section 5). One observer expects flash memory to have the third-strongest market growth rate over the next six years among all IC product categories (McClean et al 2007, 5-6). As a result, the flash memory share of the total IC market has increased from 5.5 percent in 2002, to 8.1 percent in 2005. -
Parallel Computer Architecture and Programming CMU / 清华 大学
Lecture 20: Addressing the Memory Wall Parallel Computer Architecture and Programming CMU / 清华⼤学, Summer 2017 CMU / 清华⼤学, Summer 2017 Today’s topic: moving data is costly! Data movement limits performance Data movement has high energy cost Many processors in a parallel computer means… ~ 0.9 pJ for a 32-bit foating-point math op * - higher overall rate of memory requests ~ 5 pJ for a local SRAM (on chip) data access - need for more memory bandwidth to avoid ~ 640 pJ to load 32 bits from LPDDR memory being bandwidth bound Core Core Memory bus Memory Core Core CPU * Source: [Han, ICLR 2016], 45 nm CMOS assumption CMU / 清华⼤学, Summer 2017 Well written programs exploit locality to avoid redundant data transfers between CPU and memory (Key idea: place frequently accessed data in caches/buffers near processor) Core L1 Core L1 L2 Memory Core L1 Core L1 ▪ Modern processors have high-bandwidth (and low latency) access to on-chip local storage - Computations featuring data access locality can reuse data in this storage ▪ Common software optimization technique: reorder computation so that cached data is accessed many times before it is evicted (“blocking”, “loop fusion”, etc.) ▪ Performance-aware programmers go to great effort to improve the cache locality of programs - What are good examples from this class? CMU / 清华⼤学, Summer 2017 Example 1: restructuring loops for locality Program 1 void add(int n, float* A, float* B, float* C) { for (int i=0; i<n; i++) Two loads, one store per math op C[i] = A[i] + B[i]; } (arithmetic intensity = 1/3) void mul(int -
Process Variation Aware DRAM (Dynamic Random Access Memory) Design Using Block-Based Adaptive Body Biasing Algorithm
CORE Metadata, citation and similar papers at core.ac.uk Provided by DigitalCommons@USU Utah State University DigitalCommons@USU All Graduate Theses and Dissertations Graduate Studies 12-2012 Process Variation Aware DRAM (Dynamic Random Access Memory) Design Using Block-Based Adaptive Body Biasing Algorithm Satyajit Desai Utah State University Follow this and additional works at: https://digitalcommons.usu.edu/etd Part of the Computer Engineering Commons Recommended Citation Desai, Satyajit, "Process Variation Aware DRAM (Dynamic Random Access Memory) Design Using Block- Based Adaptive Body Biasing Algorithm" (2012). All Graduate Theses and Dissertations. 1419. https://digitalcommons.usu.edu/etd/1419 This Thesis is brought to you for free and open access by the Graduate Studies at DigitalCommons@USU. It has been accepted for inclusion in All Graduate Theses and Dissertations by an authorized administrator of DigitalCommons@USU. For more information, please contact [email protected]. PROCESS VARIATION AWARE DRAM (DYNAMIC RANDOM ACCESS MEMORY) DESIGN USING BLOCK-BASED ADAPTIVE BODY BIASING ALGORITHM by Satyajit Desai A thesis submitted in partial fulfillment of the requirements for the degree of MASTER OF SCIENCE in Computer Engineering Approved: Dr. Sanghamitra Roy Dr. Koushik Chakraborty Major Professor Committee Member Dr. Reyhan Bhaktur Dr. Mark R. McLellan Committee Member Vice President for Research and Dean of the School of Graduate Studies UTAH STATE UNIVERSITY Logan, Utah 2012 ii Copyright c Satyajit Desai 2012 All Rights Reserved iii Abstract Process Variation Aware DRAM (Dynamic Random Access Memory) Design Using Block-Based Adaptive Body Biasing Algorithm by Satyajit Desai, Master of Science Utah State University, 2012 Major Professor: Dr. -
A 3T Gain Cell Embedded DRAM Utilizing Preferential Boosting for High Density and Low Power On-Die Caches Ki Chul Chun, Pulkit Jain, Jung Hwa Lee, and Chris H
IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 46, NO. 6, JUNE 2011 1495 A 3T Gain Cell Embedded DRAM Utilizing Preferential Boosting for High Density and Low Power On-Die Caches Ki Chul Chun, Pulkit Jain, Jung Hwa Lee, and Chris H. Kim, Senior Member, IEEE Abstract—Circuit techniques for enabling a sub-0.9 V logic-com- for achieving low static power and high operating speed. patible embedded DRAM (eDRAM) are presented. A boosted 3T SRAMs have been the embedded memory of choice due to gain cell utilizes Read Word-line (RWL) preferential boosting to their logic compatibility and fast access time. Recently, em- increase read margin and improve data retention time. Read speed is enhanced with a hybrid current/voltage sense amplifier that al- bedded DRAMs (eDRAMs) have been gaining popularity in lows the Read Bit-line (RBL) to remain close to VDD. A regu- the research community due to features such as small cell size, lated bit-line write scheme for driving the Write Bit-line (WBL) is low cell leakage, and non-ratioed circuit operation. There have equipped with a steady-state storage node voltage monitor to over- been a number of successful eDRAM designs based on tradi- come the data ‘1’ write disturbance problem of the PMOS gain cell without introducing another boosted supply for the Write Word- tional 1T1C DRAM cells as well as logic-compatible gain cells line (WWL) over-drive. An adaptive and die-to-die adjustable read [2]–[9]. 1T1C cells are denser than gain cells, but at the cost of a reference bias generator is proposed to cope with PVT variations.