Polarization Lecture Outline
Total Page:16
File Type:pdf, Size:1020Kb
Load more
Recommended publications
-
Polarization Optics Polarized Light Propagation Partially Polarized Light
The physics of polarization optics Polarized light propagation Partially polarized light Polarization Optics N. Fressengeas Laboratoire Mat´eriaux Optiques, Photonique et Syst`emes Unit´ede Recherche commune `al’Universit´ede Lorraine et `aSup´elec Download this document from http://arche.univ-lorraine.fr/ N. Fressengeas Polarization Optics, version 2.0, frame 1 The physics of polarization optics Polarized light propagation Partially polarized light Further reading [Hua94, GB94] A. Gerrard and J.M. Burch. Introduction to matrix methods in optics. Dover, 1994. S. Huard. Polarisation de la lumi`ere. Masson, 1994. N. Fressengeas Polarization Optics, version 2.0, frame 2 The physics of polarization optics Polarized light propagation Partially polarized light Course Outline 1 The physics of polarization optics Polarization states Jones Calculus Stokes parameters and the Poincare Sphere 2 Polarized light propagation Jones Matrices Examples Matrix, basis & eigen polarizations Jones Matrices Composition 3 Partially polarized light Formalisms used Propagation through optical devices N. Fressengeas Polarization Optics, version 2.0, frame 3 The physics of polarization optics Polarization states Polarized light propagation Jones Calculus Partially polarized light Stokes parameters and the Poincare Sphere The vector nature of light Optical wave can be polarized, sound waves cannot The scalar monochromatic plane wave The electric field reads: A cos (ωt kz ϕ) − − A vector monochromatic plane wave Electric field is orthogonal to wave and Poynting vectors -
Polarizer QWP Mirror Index Card
PH 481 Physical Optics Winter 2014 Laboratory #8 Week of March 3 Read: pp. 336-344, 352-356, and 360-365 of "Optics" by Hecht Do: 1. Experiment VIII.1: Birefringence and Optical Isolation 2. Experiment VIII.2: Birefringent crystals: double refraction 3. Experiment VIII.3: Optical activity: rotary power of sugar Experiment VIII.1: Birefringence and Optical Isolation In this experiment the birefringence of a material will be used to change the polarization of the laser beam. You will use a quarter-wave plate and a polarizer to build an optical isolator. This is a useful device that ensures that light is not reflected back into the laser. This has practical importance since light reflected back into a laser can perturb the laser operation. A quarter-wave plate is a specific example of a retarder, a device that introduces a phase difference between waves with orthogonal polarizations. A birefringent material has two different indices of refraction for orthogonal polarizations and so is well suited for this task. We will refer to these two directions as the fast and slow axes. A wave polarized along the fast axis will move through the material faster than a wave polarized along the slow axis. A wave that is linearly polarized along some arbitrary direction can be decomposed into its components along the slow and fast axes, resulting in part of the wave traveling faster than the other part. The wave that leaves the material will then have a more general elliptical polarization. A quarter-wave plate is designed so that the fast and slow Laser components of a wave will experience a relative phase shift of Index Card π/2 (1/4 of 2π) upon traversing the plate. -
Lab 8: Polarization of Light
Lab 8: Polarization of Light 1 Introduction Refer to Appendix D for photos of the appara- tus Polarization is a fundamental property of light and a very important concept of physical optics. Not all sources of light are polarized; for instance, light from an ordinary light bulb is not polarized. In addition to unpolarized light, there is partially polarized light and totally polarized light. Light from a rainbow, reflected sunlight, and coherent laser light are examples of po- larized light. There are three di®erent types of po- larization states: linear, circular and elliptical. Each of these commonly encountered states is characterized Figure 1: (a)Oscillation of E vector, (b)An electromagnetic by a di®ering motion of the electric ¯eld vector with ¯eld. respect to the direction of propagation of the light wave. It is useful to be able to di®erentiate between 2 Background the di®erent types of polarization. Some common de- vices for measuring polarization are linear polarizers and retarders. Polaroid sunglasses are examples of po- Light is a transverse electromagnetic wave. Its prop- larizers. They block certain radiations such as glare agation can therefore be explained by recalling the from reflected sunlight. Polarizers are useful in ob- properties of transverse waves. Picture a transverse taining and analyzing linear polarization. Retarders wave as traced by a point that oscillates sinusoidally (also called wave plates) can alter the type of polar- in a plane, such that the direction of oscillation is ization and/or rotate its direction. They are used in perpendicular to the direction of propagation of the controlling and analyzing polarization states. -
Static and Dynamic Effects of Chirality in Dielectric Media
Static and dynamic effects of chirality in dielectric media R. S. Lakes Department of Engineering Physics, Department of Materials Science, University of Wisconsin, 1500 Engineering Drive, Madison, WI 53706-1687 [email protected] January 31, 2017 adapted from R. S. Lakes, Modern Physics Letters B, 30 (24) 1650319 (9 pages) (2016). Abstract Chiral dielectrics are considered from the perspective of continuum representations of spatial heterogeneity. Static effects in isotropic chiral dielectrics are predicted, provided the electric field has nonzero third spatial derivatives. The effects are compared with static chiral phenomena in Cosserat elastic materials which obey generalized continuum constitutive equations. Dynamic monopole - like magnetic induction is predicted in chiral dielectric media. keywords: chirality, dielectric, Cosserat 1 Introduction Chirality is well known in electromagnetics 1; it gives rise to optical activity in which left or right handed cir- cularly polarized waves propagate at different velocities. Known effects are dynamic only; there is considered to be no static effect 2. The constitutive equations for a directionally isotropic chiral material are 3, 4. @H D = kE − g (1) @t @E B = µH + g (2) @t in which E is electric field, D is electric displacement, B is magnetic field, H is magnetic induction, k is the dielectric permittivity, µ is magnetic permeability and g is a measure of the chirality. Optical rotation of polarized light of wavelength λ by an angle Φ (in radians per meter) is given by Φ = (2π/λ)2cg with c as the speed of light. The quantity g embodies the length scale of the chiral structure because cg has dimensions of length. -
Mixing of Quantum States: a New Route to Creating Optical Activity Anvar S
www.nature.com/scientificreports OPEN Mixing of quantum states: A new route to creating optical activity Anvar S. Baimuratov1, Nikita V. Tepliakov1, Yurii K. Gun’ko1,2, Alexander V. Baranov1, Anatoly V. Fedorov1 & Ivan D. Rukhlenko1,3 Received: 7 June 2016 The ability to induce optical activity in nanoparticles and dynamically control its strength is of great Accepted: 18 August 2016 practical importance due to potential applications in various areas, including biochemistry, toxicology, Published: xx xx xxxx and pharmaceutical science. Here we propose a new method of creating optical activity in originally achiral quantum nanostructures based on the mixing of their energy states of different parities. The mixing can be achieved by selective excitation of specific states orvia perturbing all the states in a controllable fashion. We analyze the general features of the so produced optical activity and elucidate the conditions required to realize the total dissymmetry of optical response. The proposed approach is applicable to a broad variety of real systems that can be used to advance chiroptical devices and methods. Chirality is known to occur at many levels of life organization and plays a key role in many chemical and biolog- ical processes in nature1. The fact that most of organic molecules are chiral starts more and more affecting the progress of contemporary medicine and pharmaceutical industry2. As a consequence, a great deal of research efforts has been recently focused on the optical activity of inherently chiral organic molecules3, 4. It can be strong in the ultraviolet range, in which case it is difficult to study and use in practice. -
Principles of Retarders
Polarizers PRINCIPLES OF RETARDERS etarders are used in applications where control or Ranalysis of polarization states is required. Our retarder products include innovative polymer and liquid crystal materials. Crystalline materials such as quartz and Retarders magnesium fluoride are also available upon request. Please call for a custom quote. A retarder (or waveplate) is an optical device that resolves a light wave into two orthogonal linear polarization components and produces a phase shift between them. The resulting light wave is generally of a different polarization form. Ideally, retarders do not polarize, nor do they induce an intensity change in the Crystals Liquid light beam, they simply change its polarization form. state. The transmitted light leaves the retarder elliptically All standard catalog Meadowlark Optics’ retarders are polarized. made from birefringent, uniaxial materials having two Retardance (in waves) is given by: different refractive indices – the extraordinary index ne = tր and the ordinary index no. Light traveling through a retarder has a velocity v where: dependent upon its polarization direction given by  = birefringence (ne - no) Spatial Light Modulators v = c/n = wavelength of incident light (in nanometers) t = thickness of birefringent element where c is the speed of light in a vacuum and n is the (in nanometers) refractive index parallel to that polarization direction. Retardance can also be expressed in units of length, the By definition, ne > no for a positive uniaxial material. distance that one polarization component is delayed For a positive uniaxial material, the extraordinary axis relative to the other. Retardance is then represented by: is referred to as the slow axis, while the ordinary axis is ␦Ј ␦  referred to as the fast axis. -
Observation of Elliptically Polarized Light from Total Internal Reflection in Bubbles
Observation of elliptically polarized light from total internal reflection in bubbles Item Type Article Authors Miller, Sawyer; Ding, Yitian; Jiang, Linan; Tu, Xingzhou; Pau, Stanley Citation Miller, S., Ding, Y., Jiang, L. et al. Observation of elliptically polarized light from total internal reflection in bubbles. Sci Rep 10, 8725 (2020). https://doi.org/10.1038/s41598-020-65410-5 DOI 10.1038/s41598-020-65410-5 Publisher NATURE PUBLISHING GROUP Journal SCIENTIFIC REPORTS Rights Copyright © The Author(s) 2020. Open Access This article is licensed under a Creative Commons Attribution 4.0 International License. Download date 29/09/2021 02:08:57 Item License https://creativecommons.org/licenses/by/4.0/ Version Final published version Link to Item http://hdl.handle.net/10150/641865 www.nature.com/scientificreports OPEN Observation of elliptically polarized light from total internal refection in bubbles Sawyer Miller1,2 ✉ , Yitian Ding1,2, Linan Jiang1, Xingzhou Tu1 & Stanley Pau1 ✉ Bubbles are ubiquitous in the natural environment, where diferent substances and phases of the same substance forms globules due to diferences in pressure and surface tension. Total internal refection occurs at the interface of a bubble, where light travels from the higher refractive index material outside a bubble to the lower index material inside a bubble at appropriate angles of incidence, which can lead to a phase shift in the refected light. Linearly polarized skylight can be converted to elliptically polarized light with efciency up to 53% by single scattering from the water-air interface. Total internal refection from air bubble in water is one of the few sources of elliptical polarization in the natural world. -
Applied Spectroscopy Spectroscopic Nomenclature
Applied Spectroscopy Spectroscopic Nomenclature Absorbance, A Negative logarithm to the base 10 of the transmittance: A = –log10(T). (Not used: absorbancy, extinction, or optical density). (See Note 3). Absorptance, α Ratio of the radiant power absorbed by the sample to the incident radiant power; approximately equal to (1 – T). (See Notes 2 and 3). Absorption The absorption of electromagnetic radiation when light is transmitted through a medium; hence ‘‘absorption spectrum’’ or ‘‘absorption band’’. (Not used: ‘‘absorbance mode’’ or ‘‘absorbance band’’ or ‘‘absorbance spectrum’’ unless the ordinate axis of the spectrum is Absorbance.) (See Note 3). Absorption index, k See imaginary refractive index. Absorptivity, α Internal absorbance divided by the product of sample path length, ℓ , and mass concentration, ρ , of the absorbing material. A / α = i ρℓ SI unit: m2 kg–1. Common unit: cm2 g–1; L g–1 cm–1. (Not used: absorbancy index, extinction coefficient, or specific extinction.) Attenuated total reflection, ATR A sampling technique in which the evanescent wave of a beam that has been internally reflected from the internal surface of a material of high refractive index at an angle greater than the critical angle is absorbed by a sample that is held very close to the surface. (See Note 3.) Attenuation The loss of electromagnetic radiation caused by both absorption and scattering. Beer–Lambert law Absorptivity of a substance is constant with respect to changes in path length and concentration of the absorber. Often called Beer’s law when only changes in concentration are of interest. Brewster’s angle, θB The angle of incidence at which the reflection of p-polarized radiation is zero. -
Impact Response of Strengthened Glass with Ultrahigh Residual Compressive Stresses
IMPACT RESPONSE OF STRENGTHENED GLASS WITH ULTRAHIGH RESIDUAL COMPRESSIVE STRESSES By PHILLIP A. JANNOTTI A DISSERTATION PRESENTED TO THE GRADUATE SCHOOL OF THE UNIVERSITY OF FLORIDA IN PARTIAL FULFILLMENT OF THE REQUIREMENTS FOR THE DEGREE OF DOCTOR OF PHILOSOPHY UNIVERSITY OF FLORIDA 2015 © 2015 Phillip A. Jannotti To my hero ACKNOWLEDGMENTS Thanks to my family and friends for their support during my graduate studies, without which my time as a graduate student would not be have been as enjoyable. A special thanks to my girlfriend, Jen, who put up with me during my time here at Florida. Through good times and bad, it is with all of your support that I have reached this point in my life. Thanks to my graduate committee, Dr. Ghatu Subhash, Dr. Peter Ifju, Dr. Nagaraj Arakere, and Dr. John Mecholsky, for their time and attention reviewing my work. Their insight and suggestions have been invaluable to my research. I would like to especially express gratitude to my advisor, Dr. Ghatu Subhash. I sincerely appreciate everything you have done for me, for reading and re-reading every manuscript revision, and for watching and re-watching every presentation. I truly appreciate the countless hours you have invested in me. This research was made with Government support under and awarded by DOD, AirForce Office of Scientific Research, National Defense Science and Engineering Graduate (NDSEG) Fellowship, 32 CFR 168a, and by Saxon Glass Technologies. 4 TABLE OF CONTENTS page ACKNOWLEDGMENTS ...............................................................................................................4 -
Lecture 14: Polarization
Matthew Schwartz Lecture 14: Polarization 1 Polarization vectors In the last lecture, we showed that Maxwell’s equations admit plane wave solutions ~ · − ~ · − E~ = E~ ei k x~ ωt , B~ = B~ ei k x~ ωt (1) 0 0 ~ ~ Here, E0 and B0 are called the polarization vectors for the electric and magnetic fields. These are complex 3 dimensional vectors. The wavevector ~k and angular frequency ω are real and in the vacuum are related by ω = c ~k . This relation implies that electromagnetic waves are disper- sionless with velocity c: the speed of light. In materials, like a prism, light can have dispersion. We will come to this later. In addition, we found that for plane waves 1 B~ = ~k × E~ (2) 0 ω 0 This equation implies that the magnetic field in a plane wave is completely determined by the electric field. In particular, it implies that their magnitudes are related by ~ ~ E0 = c B0 (3) and that ~ ~ ~ ~ ~ ~ k · E0 =0, k · B0 =0, E0 · B0 =0 (4) In other words, the polarization vector of the electric field, the polarization vector of the mag- netic field, and the direction ~k that the plane wave is propagating are all orthogonal. To see how much freedom there is left in the plane wave, it’s helpful to choose coordinates. We can always define the zˆ direction as where ~k points. When we put a hat on a vector, it means the unit vector pointing in that direction, that is zˆ=(0, 0, 1). Thus the electric field has the form iω z −t E~ E~ e c = 0 (5) ~ ~ which moves in the z direction at the speed of light. -
Characterizing the Oblique Incidence Response and Noise Reduction Techniques for Luminescent Photoelastic Coatings
CHARACTERIZING THE OBLIQUE INCIDENCE RESPONSE AND NOISE REDUCTION TECHNIQUES FOR LUMINESCENT PHOTOELASTIC COATINGS By JOHN C. NICOLOSI JR. A THESIS PRESENTED TO THE GRADUATE SCHOOL OF THE UNIVERSITY OF FLORIDA IN PARTIAL FULFILLMENT OF THE REQUIREMENTS FOR THE DEGREE OF MASTER OF SCIENCE UNIVERSITY OF FLORIDA 2004 Copyright 2004 by John C. Nicolosi Jr. ACKNOWLEDGMENTS I would like to thank my advisors, Dr. Peter Ifju and Dr. Paul Hubner, for all of their support and guidance. I would also like to thank Dr. Leishan Chen for all of the assistance he provided me, and Dr. Bhavani Sankar for his valuable advice. I would also like to thank my family members for all of the support they have given me over the years. iii TABLE OF CONTENTS page ACKNOWLEDGMENTS ................................................................................................. iii LIST OF FIGURES .......................................................................................................... vii ABSTRACT....................................................................................................................... ix CHAPTER 1 INTRODUCTION ........................................................................................................1 1.1 Historical Background of Photoelasticity..............................................................1 1.2 Research History at the University of Florida .......................................................3 1.3 Research Objectives...............................................................................................4 -
Ellipsometry
AALBORG UNIVERSITY Institute of Physics and Nanotechnology Pontoppidanstræde 103 - 9220 Aalborg Øst - Telephone 96 35 92 15 TITLE: Ellipsometry SYNOPSIS: This project concerns measurement of the re- fractive index of various materials and mea- PROJECT PERIOD: surement of the thickness of thin films on sili- September 1st - December 21st 2004 con substrates by use of ellipsometry. The el- lipsometer used in the experiments is the SE 850 photometric rotating analyzer ellipsome- ter from Sentech. THEME: After an introduction to ellipsometry and a Detection of Nanostructures problem description, the subjects of polar- ization and essential ellipsometry theory are covered. PROJECT GROUP: The index of refraction for silicon, alu- 116 minum, copper and silver are modelled us- ing the Drude-Lorentz harmonic oscillator model and afterwards measured by ellipsom- etry. The results based on the measurements GROUP MEMBERS: show a tendency towards, but are not ade- Jesper Jung quately close to, the table values. The mate- Jakob Bork rials are therefore modelled with a thin layer of oxide, and the refractive indexes are com- Tobias Holmgaard puted. This model yields good results for the Niels Anker Kortbek refractive index of silicon and copper. For aluminum the result is improved whereas the result for silver is not. SUPERVISOR: The thickness of a thin film of SiO2 on a sub- strate of silicon is measured by use of ellip- Kjeld Pedersen sometry. The result is 22.9 nm which deviates from the provided information by 6.5 %. The thickness of two thick (multiple wave- NUMBERS PRINTED: 7 lengths) thin polymer films are measured. The polymer films have been spin coated on REPORT PAGE NUMBER: 70 substrates of silicon and the uniformities of the surfaces are investigated.