crystals Article The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities Yue Cao 1,* , Dina Sheyfer 1 , Zhang Jiang 2, Siddharth Maddali 1 , Hoydoo You 1 , Bi-Xia Wang 1,3 , Zuo-Guang Ye 3 , Eric M. Dufresne 2 , Hua Zhou 2, G. Brian Stephenson 1 and Stephan O. Hruszkewycz 1 1 Materials Science Division, Argonne National Laboratory, Lemont, IL 60439, USA;
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[email protected] (S.O.H.) 2 Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA;
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[email protected] (H.Z.) 3 Department of Chemistry and 4D LABS, Simon Fraser University, Burnaby, BC V5A 1S6, Canada;
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[email protected] Received: 10 November 2020; Accepted: 27 November 2020 ; Published: 4 December 2020 Abstract: How materials evolve at thermal equilibrium and under external excitations at small length and time scales is crucial to the understanding and control of material properties. X-ray photon correlation spectroscopy (XPCS) at X-ray free electron laser (XFEL) facilities can in principle capture dynamics of materials that are substantially faster than a millisecond. However, the analysis and interpretation of XPCS data is hindered by the strongly fluctuating X-ray intensity from XFELs. Here we examine the impact of pulse-to-pulse intensity fluctuations on sequential XPCS analysis. We show that the conventional XPCS analysis can still faithfully capture the characteristic time scales, but with substantial decrease in the signal-to-noise ratio of the g2 function and increase in the uncertainties of the extracted time constants.