Overview of Silicon Semiconductor Device Physics
Dr. David W. Graham
West Virginia University Lane Department of Computer Science and Electrical Engineering © 2009 David W. Graham
1 Silicon
Silicon is the primary semiconductor used in VLSI systems
Si has 14 Electrons
Energy Bands (Shells) Valence Band
Nucleus
At T=0K, the highest energy band occupied by Silicon has 4 outer shell / an electron is valence electrons called the valence band. 2 Energy Bands
• Electrons try to occupy the lowest Disallowed energy band possible } Energy • Not every energy States level is a legal state Increasing for an electron to Electron occupy Energy Allowed • These legal states } Energy tend to arrange States themselves in bands
Energy Bands
3 Energy Bands
EC Conduction Band First unfilled energy band at T=0K E Energy g Bandgap
EV Valence Band Last filled energy band at T=0K
4 Band Diagrams
Increasing electron energy EC
Eg
EV Increasing voltage Band Diagram Representation Energy plotted as a function of position
EC Æ Conduction band Æ Lowest energy state for a free electron
EV Æ Valence band Æ Highest energy state for filled outer shells
EG Æ Band gap Æ Difference in energy levels between EC and EV - Æ No electrons (e ) in the bandgap (only above EC or below EV) Æ EG = 1.12eV in Silicon
5 Intrinsic Semiconductor
Silicon has 4 outer shell / valence electrons
Forms into a lattice structure to share electrons
6 Intrinsic Silicon
The valence band is full, and no electrons are free to move about
EC
EV
However, at temperatures above T=0K, thermal energy shakes an electron free
7 Semiconductor Properties
For T > 0K Electron shaken free and can • Generation – Creation of an electron (e-) cause current to flow and hole (h+) pair
• h+ is simply a missing electron, which leaves an excess positive charge (due to
an extra proton) • Recombination –if an e- and an h+ come in contact, they annihilate each other
h+ e– • Electrons and holes are called “carriers” because they are charged particles –
when they move, they carry current
• Therefore, semiconductors can conduct electricity for T > 0K … but not much
current (at room temperature (300K), pure
silicon has only 1 free electron per 3 trillion atoms)
8 Doping
• Doping – Adding impurities to the silicon crystal lattice to increase the number of carriers • Add a small number of atoms to increase either the number of electrons or holes
9 Periodic Table
Column 3 Column 4 Elements have 3 Elements have 4 electrons in the electrons in the Valence Shell Valence Shell
Column 5 Elements have 5 electrons in the Valence Shell
10 Donors n-Type Material
Donors • Add atoms with 5 valence-band electrons • ex. Phosphorous (P) • “Donates” an extra e- that can freely travel around
• Leaves behind a positively charged nucleus (cannot move)
• Overall, the crystal is still electrically + neutral • Called “n-type” material (added negative carriers)
• ND = the concentration of donor atoms [atoms/cm3 or cm-3] ~10 15-10 20cm-3
• e- is free to move about the crystal 2 (Mobility μn ≈1350cm /V)
11 Donors n-Type Material
Donors n-Type Material • Add atoms with 5 valence-band electrons – – – • ex. Phosphorous (P) + + – – + + + + • “Donates” an extra e- that can freely + + – – – + – + – travel around + + + – • Leaves behind a positively charged – + – + – + + + – – + – nucleus (cannot move) • Overall, the crystal is still electrically neutral Shorthand Notation • Called “n-type” material (added + Positively charged ion; immobile negative carriers) – Negatively charged e-; mobile;
• ND = the concentration of donor Called “majority carrier” atoms [atoms/cm3 or cm-3] + Positively charged h+; mobile; ~10 15-10 20cm-3 Called “minority carrier”
• e- is free to move about the crystal 2 (Mobility μn ≈1350cm /V)
12 Acceptors Make p-Type Material
Acceptors • Add atoms with only 3 valence- band electrons • ex. Boron (B) • “Accepts” e– and provides extra h+ to freely travel around
• Leaves behind a negatively h+ charged nucleus (cannot move)
– • Overall, the crystal is still electrically neutral • Called “p-type” silicon (added positive carriers)
• NA = the concentration of acceptor atoms [atoms/cm3 or cm-3] • Movement of the hole requires
breaking of a bond! (This is hard, 2 so mobility is low, μp ≈ 500cm /V)
13 Acceptors Make p-Type Material
p-Type Material Acceptors • Add atoms with only 3 valence- + + + band electrons – – + + – – – – • ex. Boron (B) – – + + + – + – – + – – • “Accepts” e– and provides extra h+ + to freely travel around + – + – + – – – + + – + • Leaves behind a negatively charged nucleus (cannot move) • Overall, the crystal is still Shorthand Notation electrically neutral – Negatively charged ion; immobile • Called “p-type” silicon (added + Positively charged h+; mobile; positive carriers) Called “majority carrier” • N = the concentration of acceptor – Negatively charged e-; mobile; A atoms [atoms/cm3 or cm-3] Called “minority carrier” • Movement of the hole requires
breaking of a bond! (This is hard, 2 so mobility is low, μp ≈ 500cm /V)
14 The Fermi Function
The Fermi Function • Probability distribution function (PDF) • The probability that an available state at f(E) an energy E will be occupied by an e- 1 1 ()Ef = ()− f kTEE 1+ e 0.5
E Æ Energy level of interest E Æ Fermi level f E Æ Halfway point f E Æ Where f(E) = 0.5 k Æ Boltzmann constant = 1.38×10-23 J/K = 8.617×10-5 eV/K T Æ Absolute temperature (in Kelvins)
15 Boltzmann Distribution
>>− kTEE If f f(E) Then 1 ()≈ eEf ( −− f ) kTEE 0.5 Boltzmann Distribution • Describes exponential decrease in the density of particles in thermal equilibrium with a potential gradient Ef E • Applies to all physical systems • Atmosphere Æ Exponential distribution of gas molecules ~E -4kT ~E +4kT • Electronics Æ Exponential distribution of electrons f f • Biology Æ Exponential distribution of ions
16 Band Diagrams (Revisited)
E
EC Eg Ef
EV Band Diagram Representation 0.5 1 f(E) Energy plotted as a function of position
EC Æ Conduction band Æ Lowest energy state for a free electron Æ Electrons in the conduction band means current can flow
EV Æ Valence band • Virtually all of the Æ Highest energy state for filled outer shells valence-band energy Æ Holes in the valence band means current can flow levels are filled with e- - Ef Æ Fermi Level • Virtually no e in the Æ Shows the likely distribution of electrons conduction band
EG Æ Band gap Æ Difference in energy levels between EC and EV - Æ No electrons (e ) in the bandgap (only above EC or below EV) Æ EG = 1.12eV in Silicon
17 Effect of Doping on Fermi Level
Ef is a function of the impurity-doping level
n-Type Material
E
EC Ef
EV 0.5 1 f(E)
• High probability of a free e- in the conduction band • Moving E closer to E (higher doping) increases the number of available f C majority carriers
18 Effect of Doping on Fermi Level
Ef is a function of the impurity-doping level
p-Type Material 1− (Ef ) E EC
Ef EV 0.5 1 f(E)
• Low probability of a free e- in the conduction band • High probability of h+ in the valence band
• Moving E closer to E (higher doping) increases the number of available f V majority carriers
19 Equilibrium Carrier Concentrations
n = # of e- in a material + p = # of h in a material
- ni = # of e in an intrinsic (undoped) material
Intrinsic silicon • Undoped silicon • Fermi level • Halfway between Ev and Ec • Location at “Ei”
E
EC Eg Ef
EV 0.5 1 f(E)
20 Equilibrium Carrier Concentrations
Non-degenerate Silicon • Silicon that is not too heavily doped • Ef not too close to Ev or Ec Assuming non-degenerate silicon
( − if ) kTEE = ienn
()− fi kTEE = ienp Multiplying together
2 = nnp i
21 Charge Neutrality Relationship
• For uniformly doped semiconductor • Assuming total ionization of dopant atoms
− + − NNnp AD = 0
# of carriers # of ions
Total Charge = 0 Electrically Neutral
22 Calculating Carrier Concentrations
• Based upon “fixed” quantities
• N A, ND, ni are fixed (given specific dopings for a material) • n, p can change (but we can find their equilibrium values) 1 ⎡ 2 ⎤ 2 − AD ⎛ − NNNN AD ⎞ 2 n = + ⎢⎜ ⎟ + ni ⎥ 2 ⎣⎢⎝ 2 ⎠ ⎦⎥ 1 ⎡ 2 ⎤ 2 − DA ⎛ − NNNN DA ⎞ 2 p = + ⎢⎜ ⎟ + ni ⎥ 2 ⎣⎢⎝ 2 ⎠ ⎦⎥ n 2 = i n 23 Common Special Cases in Silicon
1. Intrinsic semiconductor (NA = 0, ND = 0) 2. Heavily one-sided doping 3. Symmetric doping
24 Intrinsic Semiconductor (NA=0, ND=0)
Carrier concentrations are given by
= nn i
= np i
== npn i
25 Heavily One-Sided Doping
>>≈− nNNN iDAD
>>≈− nNNN iADA This is the typical case for most semiconductor applications
If D >> , >> nNNN iDA (Nondegenerate, Total Ionization)
Then ≈ Nn D n 2 p ≈ i N D
If A >> , >> nNNN iAD (Nondegenerate, Total Ionization)
Then ≈ Np A n 2 n ≈ i N A
26 Symmetric Doping
Doped semiconductor where ni >> |ND-NA|
• Increasing temperature increases the number of intrinsic carriers • All semiconductors become intrinsic at sufficiently high temperatures
≈ ≈ npn i
27 Determination of Ef in Doped Semiconductor
⎛ N ⎞ ⎜ D ⎟ if =− kTEE ln⎜ ⎟ for D >> , >> nNNN iDA ⎝ ni ⎠ ⎛ N ⎞ ⎜ A ⎟ for fi =− kTEE ln⎜ ⎟ A >> , >> nNNN iAD ⎝ ni ⎠
Also, for typical semiconductors (heavily one-sided doping)
⎛ n ⎞ ⎛ p ⎞ ⎜ ⎟ ⎜ ⎟ [units eV] if =− kTEE ln⎜ ⎟ −= kT ln⎜ ⎟ ⎝ ni ⎠ ⎝ ni ⎠
28 Thermal Motion of Charged Particles
• Look at drift and diffusion in silicon • Assume 1-D motion • Applies to both electronic systems and biological systems
29 Drift
Drift → Movement of charged particles in response to an external field (typically an electric field)
E-field applies force F = qE which accelerates the charged particle. However, the particle does not accelerate indefinitely because of collisions with the lattice (velocity saturation) Average velocity
µ → electron mobility n → empirical proportionality constant between E and velocity
µp → hole mobility E µ ≈ 3µ µ↓ as T↑ n p
30 Drift
Drift → Movement of charged particles in response to an external field (typically an electric field)
E-field applies force F = qE which accelerates the charged particle.
However, the particle does not accelerate Current Density indefinitely because of collisions with the lattice (velocity saturation) J ,driftn = μnqnE Average velocity
µ → electron mobility q = 1.6×10-19 C, carrier density n → empirical proportionality constant n = number of e-
between E and velocity p = number of h+
µp → hole mobility
µ ≈ 3µ µ↓ as T↑ n p
31 Resistivity
• Closely related to carrier drift • Proportionality constant between electric field and the total particle current flow 1 ρ = where q ×= 10602.1 −19 C ()+ μμpn pnq n-Type Semiconductor p-Type Semiconductor 1 1 ρ = ρ = μ Nq Dn μ Nq Ap • Therefore, all semiconductor material is a resistor – Could be parasitic (unwanted) – Could be intentional (with proper doping)
• Typically, p-type material is more resistive than n-type material for a given amount of doping
• Doping levels are often calculated/verified from resistivity measurements
32 Diffusion
Diffusion → Motion of charged particles due to a concentration gradient • Charged particles move in random directions
• Charged particles tend to move from areas of high concentration to areas of
low concentration (entropy – Second Law of Thermodynamics)
• Net effect is a current flow (carriers moving from areas of high concentration
to areas of low concentration)
(xdn ) q = 1.6×10-19 C, carrier density ,diffn = qDJ n dx D = Diffusion coefficient
()xdp n(x) = e- density at position x + ,diffp −= qDJ p p(x) = h density at position x dx
→ The negative sign in Jp,diff is due to moving in the opposite direction from the concentration gradient - → The positive sign from Jn,diff is because the negative from the e cancels out the negative from the concentration gradient
33 Total Current Densities
Summation of both drift and diffusion
= ,driftnn + JJJ ,diffn ()xdn μ += qDqnE (1 Dimension) n n dx (3 Dimensions) μn n∇+= nqDqnE
,driftpp += JJJ ,diffp ()xdp μ −= qDqpE (1 Dimension) p p dx
μ p p∇−= pqDqpE (3 Dimensions)
Total current flow
= + JJJ pn
34 Einstein Relation
Einstein Relation → Relates D and µ (they are not independent of each other) kTD = μ q
UT = kT/q → Thermal voltage = 25.86mV at room temperature ≈ 25mV for quick hand approximations → Used in biological and silicon applications
35 Changes in Carrier Numbers
Primary “other” causes for changes in carrier concentration • Photogeneration (light shining on semiconductor) • Recombination-generation
Photogeneration ∂n ∂p = = G Photogeneration rate ∂t ∂t L light light
Creates same # of e- and h+
36 Changes in Carrier Numbers
Indirect Thermal Recombination-Generation ∂p Δ− p = + h in n-type material n0, p0 Æ equilibrium carrier concentrations ∂t −GR τ p n, p Æ carrier concentrations under arbitrary conditions
∂n Δ− n Δn, Δp Æ change in # of e- or h+ from = e- in p-type material equilibrium conditions ∂t −GR τ n
Assumes low-level injection
<<Δ 0 , ≈ nnnp 0 in type-n material
<<Δ 0 , ≈ pppn 0 in type-p material
37 Minority Carrier Properties
Minority Carriers • e- in p-type material + • h in n-type material Minority Carrier Lifetimes
• τn Æ The time before minority carrier electrons undergo recombination in p-type material
• τp Æ The time before minority carrier holes undergo recombination in n-type material
Diffusion Lengths • How far minority carriers will make it into “enemy territory” if they are injected into that material
- n = DL τ nn for minority carrier e in p-type material
+ p = DL τ pp for minority carrier h in n-type material
38 Equations of State
• Putting it all together • Carrier concentrations with respect to time (all processes)
• Spatial and time continuity equations for carrier concentrations
∂n ∂n ∂n ∂n ∂n = + + + ∂t ∂t ∂t ∂t ∂t other drift diff −GR light)( 1 ∂n ∂n J n +⋅∇= + q ∂t ∂t other 14243 −GR light)( Current to Related to Current
∂p ∂p ∂p ∂p ∂p = + + + ∂t ∂t ∂t ∂t ∂t other drift diff −GR light)( 1 ∂p ∂p J p +⋅∇−= + q ∂t ∂t other 142 43 −GR light)( Current to Related to Current
39 Equations of State
Minority Carrier Equations • Continuity equations for the special case of minority carriers • Assumes low-level injection
2 Δ∂ np Δ∂ np Δnp = Dn 2 − + GL ∂t ∂x τ n
Light generation
Indirect thermal recombination
∂n 1 ∂Jn J, assuming no E-field qDn and also →⋅∇ DJ nn ∂x q ∂x
2 Δ∂ pn Δ∂ p Δpnn = Dn 2 − + GL ∂t ∂x τ p
np, pn Æ minority carriers in “other” type of material
40