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Functional Test- Boundary Scan Geotest MTS, E.U 6 – Impasse de la Nouzotte 78760 – Jouars Pontchartrain – France Tel: +33 9 71 20 89 65 , Fax: +33 1 39 30 29 78 E-mail : [email protected] www.geotestinc.com [email protected] 1 geotestinc.com “How can you optimize your PXI Functional test system in combination with the JTAG Boundary Scan technology ” 2 geotestinc.com THE PRODUCTION TEST FLOW Optical Structural Functional System Assembly inspection test test test Customer • Missing • Solder • At-speed • Configuration parts problems problems problems • Environmental • Process • Stuck @ 0 / 1 • Device testing faults problems • Bridges Targeted fault types The objective is to find faults early and efficiently POST-ASSEMBLY TEST Optical ICT Boundary Functional System Assembly Inspection MDA Scan Test Test Automated Optical Inspection (AOI) can verify component P/N, placement, and orientation are correct • UUT is NOT powered • Components’ functionality cannot be verified • UUT’s nets cannot be verified • Automated X-Ray inspection can be also used for structural test POST-ASSEMBLY TEST Optical ICT Boundary Functional System Assembly Inspection MDA Scan Test Test Manufacturing Defect Analyzer (MDA) test can verify component placement and orientation • To be effective, MDA requires a bed of nails fixture (In-Circuit Test – ICT) and access to all components • Some components with limited access (fine-pitch SMTs and BGAs) limit MDA test effectiveness • MDA cannot verify some Unit Under Test (UUT) nets and cannot verify the UUT is operating correctly BOUNDARY SCAN TEST Optical ICT Boundary Functional System Assembly Inspection MDA Scan Test Test Boundary Scan provides operational test and is used for in-system programming • Tests integrated circuits of UUT and interconnects between IC’s • Provides higher (and more accurate) fault diagnostics • Works mostly with digital components, very little analog components coverage • UUT is not operated “at-speed” and is not operated as it would in “real life” FUNCTIONAL TEST Optical ICT Boundary Functional System Assembly Inspection MDA Scan Test Test Functional test verifies that the UUT operates as it would in “real life” and “at speed” • Full parametric functional test of UUT verifies the UUT will function as required (functional test virtually guarantees that a UUT that passes the test will operate as required when installed in the final product) • Full test coverage of all digital & analog components as well as all UUT nets • Fault diagnostics may be difficult depending on UUT design and availability of test connectors SYSTEM TEST Optical ICT Boundary Functional System Assembly Inspection MDA Scan Test Test System test verifies the final product operates as required • System test is always required on military and commercial avionics programs • Verifies that the end product (or system) functions as required • Rarely performed without running functional test first on all subassemblies • Very limited fault diagnostic TYPICAL FUNCTIONAL TEST SYSTEM INTEGRATED TEST Optical ICT Boundary Functional SystemSystem Assembly Inspection MDA Scan Test TestTest Using the advantages of both Boundary Scan and Functional test, the Integrated Test provides • FULL TEST COVERAGE - Tests all circuits of UUT (analog & digital) as well as all UUT nets • Full parametric functional test of UUT verifies the UUT will function as required • High-performance in-system programming • Higher (and more accurate) fault diagnostics • Functional and boundary-scan tests are highly complementary • PXI platform enables combined testing and reduced capital and operating expenditures • Integrated test steps in ATEasy save development time Overview fault coverage and failure localization F-Test BST Vision MDA/FP ICT • Design Failures • Manufacturing Failures: • Analogue Nets • Opens • Bridges • Stuck at 0 or 1 • Wrong Analogue Components • Missing Analogue Components Insufficient • Bad Orientation of Component probe • (Complex) Digital Nets access • Opens • Bridges • Stuck at 0 or 1 • Wrong Digital Components • Missing Digital Components • Bad Orientation of Component • Wrong Programmed Device • Defective Components • Analogue • Digital Combining Functional and Boundary Scan Test Techniques Product Volume Low Moderate High Product Complexity F-test F test Low MDA Vision ICT MDA F-test F-test ICT Moderate Bscan Bscan Vision ICT F-test F-test F-test High Bscan Bscan Bscan ICT, Vision JTAG Boundary Scan IEEE 1149.1 ??? Boundary-Scan Integration Boundary Scan test vectors integrated into ATEasy TAP1 JTAG Test + TAP Connector Infrastructure uP R Interconnections Extended Iinterconnections R FPGA Memories and control bus Digital I/O Clusters SD PLD Cluster Analogic I/OClusters A/D SD Com. I/O Clusters Cluster Usb Ether. Arinc Flash,cPLD,Fpga Programing F Connecteur Courtesy of JTAG Technologies Functional Test & Boundary Scan Boundary Scan (JTAG) FUNCTIONAL INSTRUMENTATION Hardware Application example #1 Functional Test & Boundary Scan - GOALS • Creation of a generic functional test bench for several architectures. • Easy development and integration of Bscan tools. • Simplification of development. • Speed of implementation. • Increase in the scope of the test. • More accurate diagnostics and failure localisation. • Very good test time/diagnostics time ratio. • Possibility of programming components (FLASH, EEPROM, PLD) • Easier board repair and maintenance. • Simplified production test process (2 steps reduced to 1). • Reduction in the number of test tools (1 instead of 2). Examples of hardware integration PCI3717 Controller PC JTAG Hardware PXI Controller JT2149 QUAD POD IEEE488 Controller TAP1 TAP2 TAP3 TAP4 …. IO JTAG JTAG IO JT2124F168 PXI Rack 6 programmable power supplies Oscilloscope … Generator Matrix Relays Counter Multimeter Multiplexer ARINC 429 ARINC DC INTERFACE RECEIVER Examples of hardware integration Software Integration ATEasy Equip. Being Tested Test executive JTAG controller LabWindowsCVI\ Univ. Driver Controller PIP LW or Board Inf. LabView\ PIP LV JTAG Files or Data-base ATEasy Driver ATEasy ATEasy & DLL Direct Access ExecutorsP.I.P Visualize Boundary Scan (JTAG) Diag. TEST Development Tools Files Vecteurs Software Integration (1) Ateasy Test Program Fault Library Schematics Layout Example of a 20MHz oscillator test External data bus Critical Test but no access FPGA Data0 Data0 CLK IO BS 20 MHz oscillator IOs BS Counter connector TEST PRINCIPLE: Step 1 – Standard B.Scan Interconnection Test Step 2 - Reprogram the FPGA with the B.Scan to re-route the CLK signal to Data0 Step 3 - Set the FPGA to functional mode (BYPASS). Step 4 - Test the 20MHz clock using the test bench counter. Example of an D/A converter test D/A Converter MICRO FPGA Cmd Vout MultimeterDMM PWM Generator connector OscilloscopeScope Vref Out This tests allows the confirmation of the Analogue Conversion part and the analogue signal generation. It is unnecessary to perform a self-test to confirm this function, the Bscan is enough. The failure diagnostics are focused more precisely Example of a Floating output test (0V) +28V Power supply R1 MICRO FPGA Typ. current = 10mA RT est 2k7 100 connector DMM Using the Bscan allows easy control of the floating output Using the power supply and the DMM allows the presence and the value of resistance R1 to be confirmed, together with the cluster formed by the logic gate and the transistor ADVANTAGES Creation of a generic functional test bench for several architectures. Easy integration of Bscan tools. Simplification of development. Speed of implementation. Increase in the scope of the test. More accurate diagnostics. Very good test time/diagnostics time ratio. Simplified production test process (2 steps reduced to 1). Reduction in the number of test tools (1 instead of 2). RESTRICTIONS With the Boundary Scan, we do not always work at the true board speed. More care must be taken when cabling the test tools. (Rules must be observed) Not (always) applicable to digital boards without Boundary Scan architecture. SUMMARY The combination of Boundary Scan with Functional test provides a fast and complete integrated test solution Adding additional instruments (i.e. DIO, Scope) can further enhance test coverage Full test coverage and enhanced diagnostics means shorter time-to-market for your products as well as reduced test & repair costs Victor Fernandes Tel: +33 9 71 20 89 65 E-mail : [email protected] www.geotestinc.com [email protected] 27 geotestinc.com.
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