ELECTRONICS AUTHENTICITY TESTING USING COMPREHENSIVE TWO-DIMENSIONAL GAS CHROMATOGRAPHY by Joseph C
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ELECTRONICS AUTHENTICITY TESTING USING COMPREHENSIVE TWO-DIMENSIONAL GAS CHROMATOGRAPHY by Joseph C. Cacciatore A Thesis Submitted to the Faculty of Purdue University In Partial Fulfillment of the Requirements for the degree of Master of Science School of Engineering Technology West Lafayette, Indiana December 2019 2 THE PURDUE UNIVERSITY GRADUATE SCHOOL STATEMENT OF COMMITTEE APPROVAL Dr. J. Eric Dietz, Chair Department of Computer and Information Technology Dr. Gozdem Kilaz, Chair School of Engineering Technology Dr. Ken Burbank School of Engineering Technology Approved by: Dr. Duane Dunlap Head of the Graduate Program 2 TABLE OF CONTENTS LIST OF TABLES .......................................................................................................................... 5 LIST OF FIGURES ........................................................................................................................ 6 LIST OF ABBREVIATIONS ......................................................................................................... 7 DEFINITIONS ................................................................................................................................ 8 ABSTRACT .................................................................................................................................... 9 INTRODUCTION .............................................................................................. 10 1.1 Introduction to the Problem .............................................................................................. 10 1.2 Statement of the Problem .................................................................................................. 11 1.3 Research Question ............................................................................................................ 12 1.4 Significance....................................................................................................................... 12 1.5 Scope ................................................................................................................................. 13 1.6 Assumptions ...................................................................................................................... 13 1.7 Limitations ........................................................................................................................ 14 1.8 Delimitations ..................................................................................................................... 15 REVIEW OF LITERATURE ............................................................................. 16 2.1 Electronic Device Counterfeiting and the Department of Defense .................................. 16 2.2 Canine Scent Detection ..................................................................................................... 20 2.3 Triphenylphosphine Oxide ................................................................................................ 24 2.4 Comprehensive Two-Dimensional Gas Chromatography (GC×GC) ............................... 26 2.5 Solid-Phase Microextraction (SPME)............................................................................... 28 2.6 Comparing GC×GC Capabilities to Canines .................................................................... 29 2.7 Summary of Literature ...................................................................................................... 33 RESEARCH METHODOLOGY ........................................................................ 36 3.1 Research Framework and Inspiration ............................................................................... 36 3.2 Research Type ................................................................................................................... 37 3.3 Research Design................................................................................................................ 37 3.4 Sample Composition ......................................................................................................... 38 3.5 Control Composition ......................................................................................................... 38 3.6 Sampling Method .............................................................................................................. 39 3 3.7 Sample Analysis................................................................................................................ 40 3.8 Unit of Measurement ........................................................................................................ 41 3.9 Variables ........................................................................................................................... 41 3.10 Experimental Instruments ............................................................................................... 41 3.11 Research Question .......................................................................................................... 42 3.12 Hypotheses ..................................................................................................................... 42 3.13 Data Analysis .................................................................................................................. 43 3.14 Conclusion ...................................................................................................................... 43 RESULTS ........................................................................................................... 44 4.1 GC×GC-TOF/MS Output ................................................................................................. 44 4.2 Data Sorting ...................................................................................................................... 50 4.3 Common VOCs in Controls .............................................................................................. 51 4.4 Common VOCs in Microchip Technology Microcontrollers ........................................... 54 4.5 Common VOCs in Texas Instruments Microcontrollers .................................................. 54 4.6 Common VOCs in SanDisk MicroSDs............................................................................. 55 4.7 Significant VOCs Unique to Sources ............................................................................... 56 4.8 VOCs Unique to Microcontrollers and MicroSDs with Regard to Type.......................... 58 4.9 Common VOC Across All Sample Populations ............................................................... 58 4.10 Confirmation of VOCs using Retention Time Analysis ................................................. 59 SUMMARY, CONCLUSIONS, AND RECOMMENDATIONS ...................... 68 5.1 Summary ........................................................................................................................... 68 5.2 Conclusions ....................................................................................................................... 69 5.3 Recommendations ............................................................................................................. 72 LIST OF REFERENCES .............................................................................................................. 75 APPENDIX VOC PEAK AREA COMPARISON .................................................................... 79 4 LIST OF TABLES Table 3.1 Sample Composition ..................................................................................................... 38 Table 3.2 Control Compositions ................................................................................................... 39 Table 3.3 Data Processing Parameters and Descriptions .............................................................. 41 Table 4.1 Microchip Technology Raw Data Output ..................................................................... 44 Table 4.2 Texas Instruments Raw Data Output ............................................................................ 45 Table 4.3 SanDisk MicroSD Raw Data Output ............................................................................ 46 Table 4.4 Controls Raw Data Output ............................................................................................ 47 Table 4.5 Sampling Order ............................................................................................................. 47 Table 4.6 Common VOCs in Controls .......................................................................................... 51 Table 4.7 Common VOCs Found in Microchip Technology Microcontroller Samples ............... 54 Table 4.8 Common VOCs Found in Texas Instruments Microcontroller Samples ...................... 55 Table 4.9 Common VOCs found in SanDisk MicroSD Samples ................................................. 55 Table 4.10 Significant VOCs Unique to Texas Instruments Microcontrollers ............................. 57 Table 4.11 Significant VOCs Unique to SanDisk MicroSDs ....................................................... 57 Table 4.12 Significant VOCs Having Consistent Retention Times .............................................. 61 5 LIST OF FIGURES Figure 2.1 DoD Logistics Supply Map for Electronic Components ............................................. 18 Figure 4.1 Microcontroller VOC Peak Area Comparison ............................................................ 64 Figure 4.2 MicroSD VOC Peak Area Comparison ......................................................................