Acronyms in Mass Spectrometry
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Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry
AC11CH02_Winograd ARI 3 May 2018 15:10 Annual Review of Analytical Chemistry Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry Nicholas Winograd Department of Chemistry, Pennsylvania State University, University Park, Pennsylvania 16802, USA; email: [email protected] Annu. Rev. Anal. Chem. 2018. 11:29–48 Keywords First published as a Review in Advance on bioimaging, cluster ion beams, phospholipids, instrumentation, molecular February 28, 2018 depth profiling, molecular dynamics computer simulations The Annual Review of Analytical Chemistry is online at anchem.annualreviews.org Abstract https://doi.org/10.1146/annurev-anchem- Gas cluster ion beams (GCIBs) provide new opportunities for bioimaging 061516-045249 Annual Rev. Anal. Chem. 2018.11:29-48. Downloaded from www.annualreviews.org and molecular depth profiling with secondary ion mass spectrometry (SIMS). Access provided by Pennsylvania State University on 02/26/19. For personal use only. Copyright c 2018 by Annual Reviews. These beams, consisting of clusters containing thousands of particles, ini- All rights reserved tiate desorption of target molecules with high yield and minimal fragmen- tation. This review emphasizes the unique opportunities for implementing these sources, especially for bioimaging applications. Theoretical aspects of ANNUAL REVIEWS Further the cluster ion/solid interaction are developed to maximize conditions for Click here to view this article's online features: successful mass spectrometry. In addition, the history of how GCIBs have • Download figures as PPT slides become practical laboratory tools is reviewed. Special emphasis is placed on • Navigate linked references • Download citations the versatility of these sources, as size, kinetic energy, and chemical compo- • Explore related articles • Search keywords sition can be varied easily to maximize lateral resolution, hopefully to less than 1 micron, and to maximize ionization efficiency. -
Characterization of a Glow Discharge Ion Source for the Mass Spectrometric Analysis of Organic Compounds
Characterization of a Glow Discharge Ion Source for the Mass Spectrometric Analysis of Organic Compounds D. Carazzato and M. J. Bertrand Regional Center for Mass Spectrometry, Department of Chemistry, University of Montreal, Montreal, Canada A glow discharge ion source has been constructed for the mass spectrometric analysis of organic compounds. Characterization of the source has been made by studying the effect of pressure and discharge current on ionic distributions by anodic ion sampling along the discharge axis. Ion and electron densities and electronic temperatures have been calculated by using the single Langmuir probe technique to correlate the extraction efficiency with measured ion distributions and gain some insight into the ionization of organic molecules. The spectra obtained for several classes of organic compounds show that formation of parent-molecular ions by proton transfer, resulting partly from the background water molecules, is a major low energy process while charge transfer, Penning ionization, and electron ionization are probably responsible for the fragmentation observed. The spectra result from the simultaneous occurrence of high and low energy reactions, and their structural information content is very high, yielding both molecular and extensive fragment ion information. The glow discharge ion source has proved to be essentially maintenance-free, easy to operate, stable, and can be used at reasonable mass resolution (up to 7000). The source also provides picogram range detection limits and has a linear response range of about six orders of magnitude, which makes it an interesting ion source for routine analysis. Preliminary work conducted with chromatographic interfaces indicates that its use can be easily extended to both gas and liquid chromatography. -
Calibration Factors for Fast Flow Glow Discharge Mass Spectrometry (FF-GD-MS) in Continuous and Pulsed Mode
POSTER NOTE 30687 Calibration factors for Fast Flow Glow Discharge Mass Spectrometry (FF-GD-MS) in continuous and pulsed mode Authors: Torsten Lindemann, Joachim Hinrichs, Nicholas Lloyd, Thermo Fisher Scientific, Bremen, Germany Abstract The Thermo Scientific™ Element GD Plus™ GD-MS was used to measure a set of 13 iron based certified reference materials. Calibration factors for 29 elements were obtained in continuous and pulsed mode. In continuous mode operation, the calibration factors obtained confirm most of those factors previously used for semiquantitative analyses. However, significantly improved Introduction accuracy can be expected for Ti, V, Cr, and Zr with the Sector field glow discharge mass spectrometry is data obtained during this study. applied for the analysis of high purity bulk metals and alloys, semiconductors and ceramics, especially by the In pulsed mode operation, the calibration factors for many aerospace, electronics and photovoltaic industries. elements are similar to the ones in continuous mode. In detail though, some elements show lower calibration The Element GD Plus GD-MS features a fast flow glow factors. Therefore, a dedicated RSF table for pulsed mode discharge source that can be operated in continuous is recommended to support accurate routine operation for or pulsed mode. Continuous mode operation offers the semiquantitative analyses. advantage of high sputter rates to remove contaminated surface layers quickly. Also, the widely applied set of Most elements are analyzed within the accuracy range calibration factors (Standard RSF = general Relative of ±30 %, considered to be typical for semiquantitative Sensitivity Factors) is based on continuous mode operation. GD-MS analyses. For improved accuracy, the use of a dedicated set of calibration factors is advisable. -
The Use of Dc Glow Discharges As Undergraduate Educational Tools Stephanie A
The use of dc glow discharges as undergraduate educational tools Stephanie A. Wissel, Andrew Zwicker, Jerry Ross, and Sophia Gershman Citation: American Journal of Physics 81, 663 (2013); doi: 10.1119/1.4811435 View online: http://dx.doi.org/10.1119/1.4811435 View Table of Contents: http://scitation.aip.org/content/aapt/journal/ajp/81/9?ver=pdfcov Published by the American Association of Physics Teachers Articles you may be interested in Motivating Students to Do Homework Phys. Teach. 52, 295 (2014); 10.1119/1.4872413 Measuring the Effectiveness of Simulations in Preparing Students for the Laboratory Phys. Teach. 51, 113 (2013); 10.1119/1.4775536 New insights into student understanding of complete circuits and the conservation of current Am. J. Phys. 81, 134 (2013); 10.1119/1.4773293 Conductance quantization: A laboratory experiment in a senior-level nanoscale science and technology course Am. J. Phys. 81, 14 (2013); 10.1119/1.4765331 A low-cost spatial light modulator for use in undergraduate and graduate optics labs Am. J. Phys. 80, 211 (2012); 10.1119/1.3666834 This article is copyrighted as indicated in the article. Reuse of AAPT content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to IP: 198.35.1.48 On: Fri, 20 Jun 2014 16:13:40 The use of dc glow discharges as undergraduate educational tools Stephanie A. Wissela) and Andrew Zwickerb) Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 Jerry Ross Shawnee State University, Portsmouth, Ohio 45662 Sophia Gershman Advanced Research Innovation in Science Education (ARISE), Scotch Plains, New Jersey 07076 (Received 12 October 2012; accepted 4 June 2013) Plasmas have a beguiling way of getting students interested in physics. -
Mass Spectrometer Detectors
Mass Spectrometer Detectors www.sge.com Ion Detectors for Virtually all Mass Spectrometry Applications Electron multipliers are used in a wide range of applications to Figure 2. Secondary Electron Emission detect and measure small signals of ions, electrons or photons. One of the main applications for an electron multiplier is for 6 the detection of ions in a mass spectrometer. ACTIVE FILM Multipliers manufactured by ETP ( a division of SGE Group 5 of Companies) are the result of 15 years experience in 4 supplying high performance electron multipliers for use in mass spectrometry applications. The performance of this 3 unique type of ion detector has seen it become widely used in almost all fields of mass spectrometry (including ICP-MS, 2 GC-MS, LC-MS, TOF and SIMS). 1 An electron multiplier is used to detect the presence of ion Secondary Electron Emissions signals emerging from the mass analyser of a mass 0 spectrometer. It is essentially the "eyes" of the instrument (see 0 100 200 300 400 500 Figure 1). The task of the electron multiplier is to detect Incident Electron Energy (eV) every ion of the selected mass passed by the mass filter. How The average number of secondary electrons emitted from the efficiently the electron multiplier carries out this task surface of an ETP electron multiplier plotted against the represents a potentially limiting factor on the overall system energy of the incident primary electron. sensitivity. Consequently the performance of the electron multiplier can have a major influence on the overall (often referred to as a channel electron multiplier or CEM). -
The Use of Glow Discharge Optical Emission Spectroscopy to Quantify Internal Carburization in Supercritical CO2
The 6th International Supercritical CO2 Power Cycles Symposium March 27 - 29, 2018, Pittsburgh, Pennsylvania The Use of Glow Discharge Optical Emission Spectroscopy to Quantify Internal Carburization in Supercritical CO2 Michael J. Lance Donovan N. Leonard Bruce A. Pint Senior R&D Staff Member R&D Staff Member Group Leader Oak Ridge National Laboratory Oak Ridge National Laboratory Oak Ridge National Laboratory Oak Ridge, TN 37831-6068 Oak Ridge, TN 37831-6064 Oak Ridge, TN 37831-6156 [email protected] [email protected] [email protected] Michael J. Lance is a Senior Research and Development Staff Member in Oak Ridge National Laboratory’s Materials Science and Technology Division. He received a B.S. in 1992 from Alfred University and an M.S. and PhD from Rutgers University in 1998 in Ceramic Science and Technology. He joined Oak Ridge National Laboratory as a staff member in 1998 and has been active in several research areas including emissions control technologies for diesel engines, high- temperature oxidation and heat exchanger fouling. Donovan N. Leonard is a Senior Technical Staff Member in the Materials Science & Technology Division at Oak Ridge National Laboratory. He received his Ph.D. in Materials Science & Engineering from North Carolina State University in 2002 and joined ORNL in 2007. Currently his research involves applying advanced microscopy and microanalysis methods to energy related materials at length scales from the atomic level to the macro scale. More specifically, aberration corrected STEM/EELS of quantum materials in addition to EPMA/WDS, EBSD and EDS analysis of materials for fossil, fusion and solar applications. Bruce A. -
Microchannel Plate Detectors
Reprinted from Nuclear Instruments and Methods, Vol. 162, 1979, pages 587 to 601 MICROCHANNEL PLATE DETECTORS JOSEPH LADISLAS WIZA 1. Introduction typical. Originally developed as an amplification element for A microchannel plate (MCP) is an array of 104-107 image intensification devices, MCPs have direct sensitivity miniature electron multipliers oriented parallel to one to charged particles and energetic photons which has another (fig. 1); typical channel diameters are in the range extended their usefulness to such diverse fields as X-ray1) 10-100 µm and have length to diameter ratios (α) between and E.U.V.2) astronomy, e-beam fusion studies3) and of 40 and 100. Channel axes are typically normal to, or biased course, nuclear science, where to date most applications at a small angle (~8°) to the MCP input surface. The have capitalized on the superior MCP time resolution channel matrix is usually fabricated from a lead glass, characteristics4-6). treated in such a way as to optimize the secondary emission The MCP is the result of a fortuitous convergence of characteristics of each channel and to render the channel technologies. The continuous dynode electron multiplier walls semiconducting so as to allow charge replenishment was suggested by Farnsworth7) in 1930. Actual from an external voltage source. Thus each channel can be implementation, however, was delayed until the 1960s considered to be a continuous dynode structure which acts when experimental work by Oschepkov et al.8) from the as its own dynode resistor chain. Parallel electrical contact USSR, Goodrich and Wiley9) at the Bendix Research to each channel is provided by the deposition of a metallic Laboratories in the USA, and Adams and Manley10-11) at coating, usually Nichrome or Inconel, on the front and rear the Mullard Research Laboratories in the U.K. -
Modern Real Mass Spectrometry
“Real” (Modern) Mass Spectrometry (Part I) Alex J. Roche 1 MS is fundamentally important • If you want to publish a new compound, 3 pieces of data are required: – relevant NMR (H, C, F, P, Pt, N, D, B, ...) – Mass Spectrometry (low resolution) – Elemental Analysis (CHN) or HRMS • Confirmation of a compound usually requires the 1st two • Industrially, GCMS / HPLCMS is the most common general Chemical Identification / Characterization tool • ACS accreditation guidelines state “instruments and equipment in a good undergraduate chemistry program include …gas chromatography mass spectrometry (GC-MS), and apparatus or instruments for Mass Spectrometry”. 2 Mass Spectrometry “What do you know about that ?” • Basic concept ? (what is it?) • What’s the point ? (what information does it provide?) • Underlying physics ? (why does it work?) • Underlying mechanics ? (how does it work?) 3 What we (I) teach Ions are generated, bent by magnetic field, and separated according to m/z ratio. → molecular weight information, and 4 structural information Agilent Quote (After significant bartering) $228,000 = Agilent Technologies Triple Quad HPLCMS with Multimode Source Instrument. MOST COMMON MODERN STANDARD MS INSTRUMENT 5 • Where is the triple quad ? • Where is the ESI or APCI? 6 • “...This type of ionization is compatible with triple quadrupole and ion-trap analyzers. Not so much with magnetic sector instruments (if you can still find one)...” 7 Photographic Mass Spec Trivia plate • 1803 Dalton “Mass consists of atoms...” • 1911 Thompson 1st mass spectrometer • 1940 Berry Electron Impact Ionization for organics • 1980 ESI, FAB, MALDI • Up to current day, MS fundamental characterization tool. • 2002 Nobel Prize MALDI / ESI (Tanaka / Fenn) •(4th MS area Nobel Prize) • Mass is measured in a.m.u. -
Characterization of Morphological and Chemical Properties of Scandium Containing
Characterization of Morphological and Chemical Properties of Scandium Containing Cathode Materials A dissertation presented to the faculty of the College of Arts and Sciences of Ohio University In partial fulfillment of the requirements for the degree Doctor of Philosophy Michael V. Mroz May 2020 © 2020 Michael V. Mroz. All Rights Reserved. 2 This dissertation titled Characterization of Morphological and Chemical Properties of Scandium Containing Cathode Materials by MICHAEL V. MROZ has been approved for the Department of Physics and Astronomy and the College of Arts and Sciences by Martin E. Kordesch Professor of Physics and Astronomy Florenz Plassmann Dean, College of Arts and Sciences 3 ABSTRACT MROZ, MICHAEL V., Ph.D., May 2020, Physics and Astronomy Characterization of Morphological and Chemical Properties of Scandium Containing Cathode Materials Director of Dissertation: Martin E. Kordesch Understanding thermionic cathodes is crucial for the future development of communication technologies operating at the terahertz frequency. Model cathode systems were characterized using multiple experimental techniques. These included Low Energy Electron Microscopy, X-Ray Photoemission Spectroscopy, and Auger Electron Spectroscopy. This was done to determine the mechanisms by which tungsten, barium, scandium, and oxygen may combine in order to achieve high current densities via thermionic emission. Barium and scandium films are found to dewet from the tungsten surfaces studied, and not diffuse out from bulk sources. The dewetted droplets were found to contribute the most to thermal emission. Barium oxide and scandium oxide are also found to react desorb from the emitting surface at lower temperatures then the metals themselves. The function of scandium in scandate cathodes was determined to act as an inhibitor to oxide formation. -
Practical Comparisons Between RF-GD-OES and SIMS
Glow Discharge Optical Emission Spectroscopy TECHNICAL NOTE 23 Practical Comparisons Between RF-GD-OES and SIMS Patrick Chapon, Jobin Yvon S.A.S., Horiba Group, Longjumeau, France Keywords: method comparison Secondary ion mass spectrometry (SIMS) has mine the appropriateness of the two methods. been a very valuable tool for the analysis of bulk These differences are described below. materials, particularly in the cases where very high sensitivity is required (e.g. precious metals, 1 Analysis time catalysts and semiconductor materials). SIMS relies on high energy (2-5 keV) bombardment Because of the need for extremely low pressures (sputtering) of the sample using an ion beam for SIMS analysis, extensive pump down times (gun) in high vacuum (<10-7 Torr) as its means are required. For many analyses, pump down of removing material from the solid surface and times of more than 1 hour are common. It is mass analysis of those species which are ejected important to realize that the presence of residual as charged species (ions). gases (N or O) on the sample surface greatly effect the performance of the SIMS experiment, Radio frequency glow discharge atomic emission both in terms of absolute sensitivity and in the spectrometry (RF-GD-OES) is similar to SIMS in relative sensitivity between the elements. For that sputtering is the means of removing materi- this reason, sample carousels containing many al from the sample surface. In contrast, though, samples are usually loaded in the source volume the glow discharge is a reduced-pressure (10 at a single time. On the other hand, even in the Torr) plasma that generates the sputtering ions in case of gaseous element analysis, the RF-GD- situ from a low flow of argon. -
Modern Mass Spectrometry
Modern Mass Spectrometry MacMillan Group Meeting 2005 Sandra Lee Key References: E. Uggerud, S. Petrie, D. K. Bohme, F. Turecek, D. Schröder, H. Schwarz, D. Plattner, T. Wyttenbach, M. T. Bowers, P. B. Armentrout, S. A. Truger, T. Junker, G. Suizdak, Mark Brönstrup. Topics in Current Chemistry: Modern Mass Spectroscopy, pp. 1-302, 225. Springer-Verlag, Berlin, 2003. Current Topics in Organic Chemistry 2003, 15, 1503-1624 1 The Basics of Mass Spectroscopy ! Purpose Mass spectrometers use the difference in mass-to-charge ratio (m/z) of ionized atoms or molecules to separate them. Therefore, mass spectroscopy allows quantitation of atoms or molecules and provides structural information by the identification of distinctive fragmentation patterns. The general operation of a mass spectrometer is: "1. " create gas-phase ions "2. " separate the ions in space or time based on their mass-to-charge ratio "3. " measure the quantity of ions of each mass-to-charge ratio Ionization sources ! Instrumentation Chemical Ionisation (CI) Atmospheric Pressure CI!(APCI) Electron Impact!(EI) Electrospray Ionization!(ESI) SORTING DETECTION IONIZATION OF IONS OF IONS Fast Atom Bombardment (FAB) Field Desorption/Field Ionisation (FD/FI) Matrix Assisted Laser Desorption gaseous mass ion Ionisation!(MALDI) ion source analyzer transducer Thermospray Ionisation (TI) Analyzers quadrupoles vacuum signal Time-of-Flight (TOF) pump processor magnetic sectors 10-5– 10-8 torr Fourier transform and quadrupole ion traps inlet Detectors mass electron multiplier spectrum Faraday cup Ionization Sources: Classical Methods ! Electron Impact Ionization A beam of electrons passes through a gas-phase sample and collides with neutral analyte molcules (M) to produce a positively charged ion or a fragment ion. -
Glow Discharge Optical Spectroscopy and Mass Spectrometry
QIT; Fourier transform ion cyclotron resonance, FTICR; Glow Discharge Optical and time-of-flight, TOF) instrumentation are well suited Spectroscopy and Mass for coupling to the glow discharge (GD). The GD is a relatively simple device. A potential gradient Spectrometry (500–1500 V) is applied between an anode and a cathode. In most cases, the sample is also the cathode. A noble gas (mostly Ar) is introduced into the discharge region before Annemie Bogaerts power initiation. When a potential is applied, electrons are Research group PLASMANT, University of accelerated toward the anode. As these electrons accelerate, Antwerp, Wilrijk-Antwerp, Belgium they collide with gas atoms. A fraction of these collisions are of sufficient energy to remove an electron from a support gas atom, forming an ion. These ions are, in 1 Introduction 1 turn, accelerated toward the cathode. These ions impinge 2 The Glow Discharge 2 on the surface of the cathode, sputtering sample atoms from the surface. Sputtered atoms that do not redeposit 2.1 Fundamental Glow Discharge Processes 2 on the surface diffuse into the excitation/ionization regions 2.2 Radiofrequency-Powered Glow Discharge of the plasma where they can undergo excitation and/or Operation 6 ionization via a number of collisional processes, and the 2.3 Pulsed Operation of the Glow Discharge 6 photons or ions created in this way can be detected with 2.4 Applications 8 optical emission spectroscopy or mass spectrometry. 3 Spectrochemical Methods of Analysis 11 GD sources offer a number of distinct advantages that 3.1 Basic Requirements Necessary to Obtain make them well suited for specific types of analyses.