Organic Field-Effect Transistors
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Room Temperature Ultrahigh Electron Mobility and Giant Magnetoresistance in an Electron-Hole-Compensated Semimetal Luptbi
High Electron Mobility and Large Magnetoresistance in the Half-Heusler Semimetal LuPtBi Zhipeng Hou1,2, Wenhong Wang1,*, Guizhou Xu1, Xiaoming Zhang1, Zhiyang Wei1, Shipeng Shen1, Enke Liu1, Yuan Yao1, Yisheng Chai1, Young Sun1, Xuekui Xi1, Wenquan Wang2, Zhongyuan Liu3, Guangheng Wu1 and Xi-xiang Zhang4 1State Key Laboratory for Magnetism, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China 2College of Physics, Jilin University, Changchun 130023, China 3State Key Laboratory of Metastable Material Sciences and Technology, Yanshan University, Qinhuangdao 066004, China 4Physical Science and Engineering, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia. Abstract Materials with high carrier mobility showing large magnetoresistance (MR) have recently received much attention because of potential applications in future high-performance magneto-electric devices. Here, we report on the discovery of an electron-hole-compensated half-Heusler semimetal LuPtBi that exhibits an extremely high electron mobility of up to 79000 cm2/Vs with a non-saturating positive MR as large as 3200% at 2 K. Remarkably, the mobility at 300 K is found to exceed 10500 cm2/Vs, which is among the highest values reported in three-dimensional bulk materials thus far. The clean Shubnikov-de Haas quantum oscillation observed at low temperatures and the first-principles calculations together indicate that the high electron mobility is due to a rather small effective carrier mass caused by the distinctive band structure of the crystal. Our finding provide a new approach for finding large, high-mobility MR materials by designing an appropriate Fermi surface topology starting from simple electron-hole-compensated semimetals. -
Imperial College London Department of Physics Graphene Field Effect
Imperial College London Department of Physics Graphene Field Effect Transistors arXiv:2010.10382v2 [cond-mat.mes-hall] 20 Jul 2021 By Mohamed Warda and Khodr Badih 20 July 2021 Abstract The past decade has seen rapid growth in the research area of graphene and its application to novel electronics. With Moore's law beginning to plateau, the need for post-silicon technology in industry is becoming more apparent. Moreover, exist- ing technologies are insufficient for implementing terahertz detectors and receivers, which are required for a number of applications including medical imaging and secu- rity scanning. Graphene is considered to be a key potential candidate for replacing silicon in existing CMOS technology as well as realizing field effect transistors for terahertz detection, due to its remarkable electronic properties, with observed elec- tronic mobilities reaching up to 2 × 105 cm2 V−1 s−1 in suspended graphene sam- ples. This report reviews the physics and electronic properties of graphene in the context of graphene transistor implementations. Common techniques used to syn- thesize graphene, such as mechanical exfoliation, chemical vapor deposition, and epitaxial growth are reviewed and compared. One of the challenges associated with realizing graphene transistors is that graphene is semimetallic, with a zero bandgap, which is troublesome in the context of digital electronics applications. Thus, the report also reviews different ways of opening a bandgap in graphene by using bi- layer graphene and graphene nanoribbons. The basic operation of a conventional field effect transistor is explained and key figures of merit used in the literature are extracted. Finally, a review of some examples of state-of-the-art graphene field effect transistors is presented, with particular focus on monolayer graphene, bilayer graphene, and graphene nanoribbons. -
A Stable and High Charge Mobility Organic Semiconductor with Densely Packed Crystal Structure Hong Meng,* Fangping Sun, Marc B
Published on Web 07/04/2006 2,6-Bis[2-(4-pentylphenyl)vinyl]anthracene: A Stable and High Charge Mobility Organic Semiconductor with Densely Packed Crystal Structure Hong Meng,* Fangping Sun, Marc B. Goldfinger, Feng Gao, David J. Londono, Will J. Marshal, Greg S. Blackman, Kerwin D. Dobbs, and Dalen E. Keys Central Research and DeVelopment, Experimental Station, E. I. DuPont Company, Wilmington, Delaware 19880-0328 Received April 18, 2006; E-mail: [email protected] Interest in organic thin film transistors (OTFTs) and their use in Scheme 1. One-Step Synthesis of DPPVAnt various technological applications has grown significantly in recent years.1,2 To realize the full potential of these applications, it is necessary to identify conjugated semiconductors with high mobility and robust environmental stability. Organic oligomers investigated to date include p-type, n-type, and p/n-type bipolar semiconduc- tors.3,4 So far, the highest charge carrier mobility in thin film transistors has been observed with pentacene, which has been used as a benchmark p-type semiconductor material with a charge mobility over 1.0 cm2/V‚s, as reported by several labs.5 However, the poor stability and reproducibility of pentacene-based OTFTs may limit pentacene’s commercial potential. Recently, Anthony’s large band gap of the compound is consistent with the greater group reported a series of solution processible pentacene and stability of DPPVAnt relative to pentacene.11 The stability of anthradithioene derivatives with silylethynyl-substituted structures.6 DPPVAnt was further confirmed by studying its electrochemical The stability and the charge mobility have been improved relative behavior. -
Temperature-Induced Oligomerization of Polycyclic Aromatic Hydrocarbons
www.nature.com/scientificreports OPEN Temperature-induced oligomerization of polycyclic aromatic hydrocarbons at ambient Received: 7 June 2017 Accepted: 10 July 2017 and high pressures Published: xx xx xxxx Artem D. Chanyshev 1,2, Konstantin D. Litasov1,2, Yoshihiro Furukawa3, Konstantin A. Kokh1,2 & Anton F. Shatskiy1,2 Temperature-induced oligomerization of polycyclic aromatic hydrocarbons (PAHs) was found at 500–773 K and ambient and high (3.5 GPa) pressures. The most intensive oligomerization at 1 bar and 3.5 GPa occurs at 740–823 K. PAH carbonization at high pressure is the fnal stage of oligomerization and occurs as a result of sequential oligomerization and polymerization of the starting material, caused by overlapping of π-orbitals, a decrease of intermolecular distances, and fnally the dehydrogenation and polycondensation of benzene rings. Being important for building blocks of life, PAHs and their oligomers can be formed in the interior of the terrestrial planets with radii less than 2270 km. High-pressure transformations of polycyclic aromatic hydrocarbons (PAHs) and benzene become extremely important due to wide applications for example in graphene- and graphene-based nanotechnology1–3, synthesis of organic superconductors4, 5, petroleum geoscience, origin of organic molecules in Universe and origin of life. In particular, PAHs were found in many space objects: meteorites6–8, cometary comae9, interstellar clouds and planetary nebulas10–12. Although the prevalent hypothesis for the formation of these PAHs is irradiation-driven polymerization of smaller hydrocarbons13, alternative explanation could be shock fragmentation of carbonaceous solid material11. PAH-bearing carbonaceous material could contribute to the delivery of extraterrestrial organic materials to the prebiotic Earth during the period of heavy bombardment of the inner Solar System from 4.5 to 3.8 Ga ago14–16. -
3-July-7Pm-Resistivity-Mobility-Conductivity-Current-Density-ESE-Prelims-Paper-I.Pdf
_____________________________________________________________________ Carrier drift Current carriers (i.e. electrons and holes) will move under the influence of an electric field because the field will exert a force on the carriers according to F = qE In this equation you must be very careful to keep the signs of E and q correct. Since the carriers are subjected to a force in an electric field they will tend to move, and this is the basis of the drift current. Figure illustrates the drift of electrons and holes in a semiconductor that has an electric field applied. In this case the source of the electric field is a battery. Note the direction of the current flow. The direction of current flow is defined for positive charge carriers because long ago, when they were setting up the signs (and directions) of the current carriers they had a 50:50 chance of getting it right. They got it wrong, and we still use the old convention! Current, as you know, is the rate of flow of charge and the equation you will have used should look like Id = nAVdq where Id = (drift) current (amperes), n = carrier density (per unit volume) A = conductor (or semiconductor) area, vd = (drift) velocity of carriers, q = carrier charge (coulombs) which is perfectly valid. However, since we are considering charge movement in an electric field it would be useful to somehow introduce the electric field into the equations. We can do this via a quantity called the mobility, where d = E In this equation: 2 -1 -1 = the drift mobility (often just called the mobility) with units of cm V s -1 E = the electric field (Vcm ) We know that the conduction electrons are actually moving around randomly in the metal, but we will assume that as a result of the application of the electric field Ex, they all acquire a net velocity in the x direction. -
Carrier Concentrations
2 Numerical Example: Carrier Concentrations 15 -3 Donor concentration: Nd = 10 cm Thermal equilibrium electron concentration: ≈ 15 –3 no Nd = 10 cm Thermal equilibrium hole concentration: 2 2 ⁄ ≈2 ⁄ ()10 –3 ⁄ 15 –3 5 –3 po =ni no ni Nd ==10 cm 10 cm 10 cm Silicon doped with donors is called n-type and electrons are the majority carriers. Holes are the (nearly negligible) minority carriers. EECS 105 Fall 1998 Lecture 2 Doping with Acceptors Acceptors (group III) accept an electron from the lattice to fill the incomplete fourth covalent bond and thereby create a mobile hole and become fixed negative charges. Example: Boron. B– + mobile hole and later trajectory immobile negatively ionized acceptor -3 Acceptor concentration is Na (cm ), we have Na >> ni typically and so: one hole is added per acceptor: po = Na equilibrium electron concentration is:: 2 no = ni / Na EECS 105 Fall 1998 Lecture 2 Compensation Example shows Nd > Na positively ionized donors + + As As B– − negatively ionized acceptor mobile electron and trajectory ■ Applying charge neutrality with four types of charged species: ρ () ===– qno ++qpo qNd – qNa qpo–no+Nd–Na 0 2 we can substitute from the mass-action law no po = ni for either the electron concentration or for the hole concentration: which one is the majority carrier? answer (not surprising): Nd > Na --> electrons Na > Nd --> holes EECS 105 Fall 1998 Lecture 2 Carrier Concentrations in Compensated Silicon ■ For the case where Nd > Na, the electron and hole concentrations are: 2 n ≅ ≅ i no Nd – Na and po ------------------- Nd – Na ■ For the case where Na > Nd, the hole and electron concentrations are: 2 n ≅ ≅ i p o N a – N d and n o ------------------- N a – N d Note that these approximations assume that | Nd - Na|>> ni, which is nearly always true. -
Orbital Alignment and Morphology of Pentacene Deposited on Au(111) and Sns2 Studied Using Photoemission Spectroscopy
J. Phys. Chem. B 2003, 107, 2253-2261 2253 Orbital Alignment and Morphology of Pentacene Deposited on Au(111) and SnS2 Studied Using Photoemission Spectroscopy P. G. Schroeder, C. B. France, J. B. Park, and B. A. Parkinson* Department of Chemistry, Colorado State UniVersity, Fort Collins, Colorado 80523 ReceiVed: March 21, 2002; In Final Form: September 30, 2002 The energy level alignment at the pentacene/Au(111) and pentacene/SnS2 interfaces was determined using in situ thin film deposition in combination with X-ray and ultraviolet photoemission spectroscopy (UPS). The organic thin films were grown by vapor deposition in multiple steps and then sequentially characterized in situ after each growth step. The pentacene/Au(111) interface is an ohmic contact that yielded a strong (0.95 eV) interfacial dipole barrier. The vacuum-cleaved SnS2 single crystal substrates provided clean, atomically flat and chemically inert surfaces, allowing for the investigation of the core level energy shifts and interface dipoles without interference from chemical reactions or effects of the substrate morphology. Low-intensity X-ray photoemission work function measurements enabled the detection of the overlayer thickness-dependent onset of charging in the UPS measurements. This allowed for precise determination of the position of the highest occupied molecular orbital of the organic molecules at the investigated interfaces. Differences in the orientation of the pentacene molecules on the two substrates were proposed based on analysis of the UP spectra, scanning -
ECE 340 Lecture 41 : MOSFET II
ECE 340 Lecture 41 : MOSFET II Class Outline: •Mobility Models •Short Channel Effects •Logic Devices Things you should know when you leave… Key Questions • Why is the mobility in the channel lower than in the bulk? • Why do strong electric fields degrade channel mobility ? • What is the major difference between long channel and short channel MOSFETs? • How can I turn these into useful logic devices? M.J. Gilbert ECE 340 – Lecture 41 12/10/12 MOSFET Output Characteristics This makes sense based on what we already know about MOSFETs… For low drain voltages, the MOSFET looks like a resistor if the MOSFET is above threshold and depending on the value of VG. Now we can obtain the conductance of the channel… +++++++++++++ ++++ - - - - - - •But again, this is only valid in the linear regime. •We are assuming that VD << VG – VT. Depletion Region Channel Region M.J. Gilbert ECE 340 – Lecture 41 12/10/12 MOSFET Output Characteristics So we can describe the linear +++++++++++++ ++++ Pinch off regime, but how do we describe the VD saturation regime… - - - - - - • As the drain voltage is increased, the voltage across the oxide decreases near the drain end. • The resulting mobile charge also decreases in the channel Depletion Region Channel Region near the drain end. • To obtain an expression for the drain current in saturation, substitute in the saturation condition. M.J. Gilbert ECE 340 – Lecture 41 12/10/12 MOSFET Output Characteristics Let’s summarize the output characteristics for NMOS and PMOS… - - - - - - NMOS P-type Si + + + + + + + + + + + + + PMOS N-type Si M.J. Gilbert ECE 340 – Lecture 41 12/10/12 Mobility Models Let’s try a simple problem… For an n-channel MOSFET with a gate oxide thickness of 10 nm, VT = 0.6 V and Z =25 µm and a channel length of 1 µm. -
Mechanism of Mobility Increase of the Two-Dimensional Electron Gas in Heterostructures Under Small Dose Gamma Irradiation A
Mechanism of mobility increase of the two-dimensional electron gas in heterostructures under small dose gamma irradiation A. M. Kurakin, S. A. Vitusevich, S. V. Danylyuk, H. Hardtdegen, N. Klein, Z. Bougrioua, B. A. Danilchenko, R. V. Konakova, and A. E. Belyaev Citation: Journal of Applied Physics 103, 083707 (2008); View online: https://doi.org/10.1063/1.2903144 View Table of Contents: http://aip.scitation.org/toc/jap/103/8 Published by the American Institute of Physics Articles you may be interested in Gamma irradiation impact on electronic carrier transport in AlGaN/GaN high electron mobility transistors Applied Physics Letters 102, 062102 (2013); 10.1063/1.4792240 Influence of γ-rays on dc performance of AlGaN/GaN high electron mobility transistors Applied Physics Letters 80, 604 (2002); 10.1063/1.1445809 Two dimensional electron gases induced by spontaneous and piezoelectric polarization in undoped and doped AlGaN/GaN heterostructures Journal of Applied Physics 87, 334 (1999); 10.1063/1.371866 Annealing of gamma radiation-induced damage in Schottky barrier diodes Journal of Applied Physics 101, 054511 (2007); 10.1063/1.2435972 60 Electrical characterization of Co gamma radiation-exposed InAlN/GaN high electron mobility transistors Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 31, 051210 (2013); 10.1116/1.4820129 Review of radiation damage in GaN-based materials and devices Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 31, 050801 (2013); 10.1116/1.4799504 JOURNAL OF APPLIED PHYSICS 103, 083707 ͑2008͒ Mechanism of mobility increase of the two-dimensional electron gas in AlGaN/GaN heterostructures under small dose gamma irradiation ͒ A. -
Carrier Scattering, Mobilities and Electrostatic Potential in Mono-, Bi- and Tri-Layer Graphenes
Carrier scattering, mobilities and electrostatic potential in mono-, bi- and tri-layer graphenes Wenjuan Zhu*, Vasili Perebeinos, Marcus Freitag and Phaedon Avouris** IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598, USA ABSTRACT The carrier density and temperature dependence of the Hall mobility in mono-, bi- and tri-layer graphene has been systematically studied. We found that as the carrier density increases, the mobility decreases for mono-layer graphene, while it increases for bi- layer/tri-layer graphene. This can be explained by the different density of states in mono- layer and bi-layer/tri-layer graphenes. In mono-layer, the mobility also decreases with increasing temperature primarily due to surface polar substrate phonon scattering. In bi- layer/tri-layer graphene, on the other hand, the mobility increases with temperature because the field of the substrate surface phonons is effectively screened by the additional graphene layer(s) and the mobility is dominated by Coulomb scattering. We also find that the temperature dependence of the Hall coefficient in mono-, bi- and tri-layer graphene can be explained by the formation of electron and hole puddles in graphene. This model also explains the temperature dependence of the minimum conductance of mono-, bi- and tri-layer graphene. The electrostatic potential variations across the different graphene samples are extracted. I. INTRODUCTION In the past few decades, the semiconductor industry has grown rapidly by offering every year higher function per cost. The major driving force of this performance increase is device scaling. However, scaling is becoming more and more difficult and costly as it approaches its scientific and technological limits. -
Lecture 3 Electron and Hole Transport in Semiconductors Review
Lecture 3 Electron and Hole Transport in Semiconductors In this lecture you will learn: • How electrons and holes move in semiconductors • Thermal motion of electrons and holes • Electric current via drift • Electric current via diffusion • Semiconductor resistors ECE 315 – Spring 2005 – Farhan Rana – Cornell University Review: Electrons and Holes in Semiconductors holes + electrons + + As Donor A Silicon crystal lattice + impurity + As atoms + ● There are two types of mobile charges in semiconductors: electrons and holes In an intrinsic (or undoped) semiconductor electron density equals hole density ● Semiconductors can be doped in two ways: N-doping: to increase the electron density P-doping: to increase the hole density ECE 315 – Spring 2005 – Farhan Rana – Cornell University 1 Thermal Motion of Electrons and Holes In thermal equilibrium carriers (i.e. electrons or holes) are not standing still but are moving around in the crystal lattice because of their thermal energy The root-mean-square velocity of electrons can be found by equating their kinetic energy to the thermal energy: 1 1 m v 2 KT 2 n th 2 KT vth mn In pure Silicon at room temperature: 7 vth ~ 10 cm s Brownian Motion ECE 315 – Spring 2005 – Farhan Rana – Cornell University Thermal Motion of Electrons and Holes In thermal equilibrium carriers (i.e. electrons or holes) are not standing still but are moving around in the crystal lattice and undergoing collisions with: • vibrating Silicon atoms • with other electrons and holes • with dopant atoms (donors or acceptors) and -
Binding of Polycyclic Aromatic Hydrocarbons to Polyadenylic Acid A
Proceeding8 of the National Academy of Science8 Vol. 67, No. 3, pp: 1337-1344, November 1970 Binding of Polycyclic Aromatic Hydrocarbons to Polyadenylic Acid A. Morrie Craig and I. Isenberg DEPARTMENT OF BIOCHEMISTRY AND BIOPHYSICS, OREGON STATE UNIVERSITY, CORVALLIS, OREGON 97331 Communicated by Norman Davidson, August 13, 1970 Abstract. A number of polycyclic aromatic hydrocarbons bind. to the double- stranded, acid form of polyadenylic acid (poly A). Model building shows that these hydrocarbons may intercalate in the helix, and be well protected from con- tact with the aqueous medium. Hydrocarbons that are too large to be so pro- tected are found not to bind. A size criterion for the binding of hydrocarbons to poly A therefore exists. This criterion differs from one that was previously found for DNA. The size criteria for DNA and poly A, together, serve as strong evidence for the intercalation model for hydrocarbon complexes. Model-building experiments show that only a small portion of the hydro- carbon need extend into the medium to prevent binding. This finding implies that in two cases (1,2,5,6-dibenzanthracene - poly A and 3,4-benzpyrene DNA) the structure of the complex is almost completely determined by the size criterion alone. It is now established'-" that a group of polycyclic aromatic hydrocarbons will complex to DNA. An intercalation model of these complexes, proposed by Boyland and Green' and Liquori et al.,2 has been central to all subsequent dis- cussions of hydrocarbon-DNA interaction. Although an intercalation model has appeared reasonable, compelling evidence in its behalf has been lacking.