Bibliography and Further Reading

Total Page:16

File Type:pdf, Size:1020Kb

Bibliography and Further Reading Bibliography and Further Reading CHAPTER 1 J. Topping, Errors of Observation and their Treatment, 4th edn, Chapman and Hall, 1972. R. K. Penny, The Experimental Method, Longman, 1974. P. R. Bevington, Data Reduction and Error Analysis for the Physical Sciences, McGraw-Hill, 1969. Open University Science Foundation Course Team, The Handling of Experimental Data, Open University Press, 1970. CHAPTER 2 B. E. Jones, Instrumentation, Measurement and Feedback, McGraw-Hill, 1978. M. J. Usher, Sensors and Transducers, Macmillan, 1985. L. F. Adams, Engineering Measurements and Instrumentation, English Universities Press, 1975. B. A. Gregory, An Introduction to Electrical Instrumentation and Measurement Systems, Macmillan, 1973. CHAPTER 3 Strain Measurements, Briiel and Kjaer. J. M. Calvert and M. A. H. McCausland, Electronics, Wiley, 1978. H. Ahmed and P. J. Spreadbury, Analogue and Digital Electronics for Engineers, 2nd edn, Cambridge University Press, 1984. P. Horowitz and W. Hill, The Art of Electronics, Cambridge University Press, 1980. Z. H. Meiksin and P. C. Thackeray, Electronic Design with Off-the-shelf Integrated Circuits, Parker Publishing Company Inc, 1980. 217 218 INSTRUMENTATION FOR ENGINEERS CHAPTER 4 M. E. VanValkenburg, Analogue Filter Design, Holt, Rinehart and Winston, 1982. R. A. Williams, Communications Systems Analysis and Design, Prentice-Hall, 1987. CHAPTER 5 As chapter 3. CHAPTER 6 P. Horowitz and W. Hill, The Art of Electronics, Cambridge University Press, 1980. A. Colin, Programming for Microprocessors, Butterworth, 1979. D. Aspinall, The Microprocessor and its Application, Cambridge University Press, 1978. CHAPTER 7 R. D. Stuart, An Introduction to Fourier Analysis, Methuen, 1966. K. G. Beauchamp and C. K. Yuen, Digital Methods for Signal Analysis, Allen and Unwin, 1979. J. S. Bendat and A. G. Piersol, Random Data: Analysis and Measurement Procedures, Wiley, 1971. CHAPTER 8 R. B. Randall, Frequency Analysis, Briiel and Kjaer, 1977. CHAPTER 9 C. Chatfield, The Analysis of Time Series, 2nd edn, Chapman and Hall, 1980. K. G. Beauchamp, Signal Processing, Allen and Unwin, 1973. J. S. Bendat and A. G. Piersol, Measurement and Analysis of Random Data, Wiley, 1966. J. S. Bendat, Principles and Applications of Random Noise Theory, Wiley, 1958. J. S. Bendat and A. G. Piersol, Engineering Applications of Correlation and Spectral Analysis, Wiley, 1980. Index 54 series 120 Bit 136 74 series 120 Boolean algebra 119, 121-5 Breaking strain 27, 28 AC amplifier 64-5 Bridge circuit 29, 42-55 AC bridge 42, 53-5 Bus transceivers 132-3 AC tachometer 23-4 Butterworth filter class 82-3 Accelerometer 13, 24-5, 41 Byte 136 Acoustic sensors 38-9 Active filter 79-101 Cable capacitance 72 Actuator 2 Campbell diagram 167-8 A/ D I A converters 103 Cantilever vibration 164-7 ADC 102-17 Capacitive displacement transducers Address decoders 133, 145 16-18 Aliasing 96, 102, 186-90 Capacitive sensors 16-18 Analogue filters 79-101 Capacitor microphones 38 Analogue multiplexers 115-16 Carbon-track potentiometer 16 Analogue spectrum analyser 180-2 CARRY flag 136 Analogue-to-digital converter see ADC Central processing unit 140-2 Antialiasing 102, 186-90 Centronics port 118 Attenuator 64 Ceramic microphones 38 Autocorrelation 203-13 Charge amplifier 72 Chebyshev filter class 82-3 Bandpass filter 5, 79-80, 85-6, 89-90, Choice of sampling parameters 187 96-7 Circle diagram 137 Bandstop filter 80-1 CMOS circuits 121 Bandwidth 56, 60 CMOS outputs 119-20 Baud 157 Combinationallogic 121-5 BCD 138 Combining random and systematic Bearing 161 errors 10-12 Bidirectional buffers 132-3 Common Mode Gain (CMG) 58-9 Binary arithmetic 119, 135-8 Common Mode Rejection Ratio Binary code 135-8 (CMRR) 59 Binary coded decimal 138 Comparator (analogue) 73 219 220 INDEX Comparator (digital) 133-4 Filter design 84-97 Comparison of window functions 197- Filter order 81-2 8, 201 First-order bandpass filter 85-6 Compensation (strain gauges) 27, 29, First-order filters 84-6 45-50 First-order high-pass filter 85 Complement, of a number 136 First-order low-pass filter 84-5 Complex form of the Fourier series 177 Flash encoder see Parallel encoder Compliance 71 Flow sensors 29-32 Constant current source 65 Forward transform 178 Convolution 207-8 Fourier analysis 170 Cooley and Tukey's FFT algorithm 185 Fourier cosine series 173 Corner frequency 80, 95-6 Fourier series 170-7 Correlation 205-16 Fourier sine series 17 4 CPU 138-9, 140-2 Fourier transform 177-9 Cross-correlation 213-16 Fourier's integrals 172 Current-to-voltage converter 71 Fourier's theorem 170 Fourth-order high-pass filter 94 Fourth-order low-pass D/ A converter see DAC filter 93 Frequency DAC 102-3, 105-9 domain analysis 159 DC bridge 42 Frequency-to-voltage converters 109 DC tachometer 23 Full bridge 49-52 Deterministic signal 203-4 DFT 184 Gain-bandwidth product 60, 61 Differential amplifier 65-6 Gain-frequency diagram 60 Differentiator 70-1 Gauge factor 26-8, 45 Digital device families 118-21 Gauge resistance 26-8 Digital filter 79 Gaussian function 7, 12 Digital spectrum analysers 182 Gaussian window 198, 201 Digital-to-analogue converter see DAC Generalised instrumentation design Digitisation 102 3-6 Dirac delta function 164 Goodness-of-fit tests 12 Dirichlet's conditions 170 Gray code 18 Discrete Fourier Transform see DFT Half-bridge Displacement sensing 13-21 46-9 Distortion 61, 161 Hall effect sensor 39-40 Hamming Dual slope integration 112-13 window 197-8, 201 Dummy gauge 29, 45-6 Handling precautions (CMOS) 121 Dynamic range 96, 202 Handshaking 157 Hanning window 197-8, 201 Heisenberg's Uncertainty Principle Electret microphones 38 4-5 Electrical resistance strain gauge 25-7 Hexadecimal notation 138 Ensemble 204 High-pass filter 79-80 Equal-ripple filter see Chebyshev filter Hot-wire anemometer 30 class HPIB see IEEE Interface Ergodic process 205 Hydrophone 39 Error analysis 6-12 Even and odd functions 173-4 IEEE Interface 118, 157-8 Impedance bridge 53-5 Fast Fourier Transform (FFT) 184-8 Impulse see Dirac delta function Fatigue life (of strain gauges) 27-8 Inductive sensors 53-5 Filter class 82-3 Input bias current 59-60 INDEX 221 Input impedance 58 Optical gratings 21 Input-output impedance 58 Optical sensors 35 Integrating ADC 112-13 Output impedance 58 Integrator 68, 70 Interrupt service routine 144 Parallel analysers (real time) 181-2 Inverting amplifier 62-3 Parallel encoder 110-12 Parallel plate capacitor 17-18 Linear moving magnet transducer Parallel-to-serial conversion 134-5 22-3 Perfect filters 80 Linear Variable Differential Peripheral interface 142-3 Transformer 14-15 Photovoltaic cells 36-7 Lissajous figure 68 Piezoelectric effect 24 Load cell 28-9 Piezoelectric sensors 24-5, 38 Logic identities 123, 125 Pistonphone 39 Longitudinal velocity sensing 21-3 Pitot tube 30-1 Low-frequency turbulence 39 Poisson's ratio 49, 52 Low-pass filter 79-80 Potentiometer displacement LVDT see Linear Variable transducers 15-16 Differential Transformer Power spectrum 208, 213 Precision rectifier 67-9 Magnetic microphone 38 Pressure sensors 28-30 Magnetic velocity sensing 21-4 Primary sensing element 3 Mass flow rate sensor 30 Probability density 204 Maximally flat filter see Butterworth Pseudorandom noise 210 filter class Pulse counter 144-51 Mean 7, 204 Push-pull sensor 53-4 Mean square value 204 Mechanical strain gauges 25 Quarter-bridge 44-6 Memory 139-40 Microphones 38-9 Random access memory (RAM) 139 Microprocessor 138-44 Random errors 7-9 Microprocessor interfacing 118-58 Random noise 204-13 Microprocessor timing diagram 150-1 Read-only memory (ROM) 139 Modal domain 164-7 Real filter transfer functions 80 Modal response diagram 167 Recovery time 67, 73 Modifier 5 Resistance-wire thermometer 33 Modulating transducers 5-6 Resistive bridges 42-52 Moving coil velocity sensor 21-2 Resonance 24-5, 164 Multiple path problems 215-16 Reverse Fourier Transform 178 Multiplexed ADC 115-16 RF5609A 95-6, 100-1 RM5604 96-9 Natural binary 135-6 RM5605 96-9 Noise immunity 119 RM5606 96-9 Non-inverting amplifier 63-4 Root mean square 204 Normalised filter design 84 Rotary LVDT 15 Number codes 135-8 Rotary potentiometer 16 Nyquist frequency 186, 199 Rotational velocity sensing 23-4 RS232 157 Op-amp see Operational amplifier RS432 157 Op-amp rules 62 Operational amplifier 55-73 Sample-and-hold devices 109-10 Optical displacement sensors 18-21 Sampling 102 222 INDEX Saturation 70, 73 Tensile strain measurement 47-9, Scratch gauges 25 51-2 Second-order bandpass filter 89-90 Thermistor 33-4 Second-order filters 86-90 Third-order filter 90 Second-order high-pass filter 88-9 Third-order high-pass filter 92-3 Second-order low-pass filter 86-8 Third-order low-pass filter 90-2 Self-exciting sensors see Self- Time domain 159 generating sensors Timing (microprocessor) 150-1 Self-generating sensors 5 Tracking converter 115 Semiconductor strain gauges 27-8 Transient response of filters 82 Semiconductor temperature sensors Tri-state buffers 131 33-4 TTL circuits 119-20 Serial-to-parallel conversion 134-5 TTL inputs 119-20 Shaft whirl 168 TTL outputs 119-20 Shannon's sampling theorem 188-90 Turbine flow sensor 31-2 Signal classification 203-5 Two's complement 138 Signal conditioning 2, 55 Signal conversion 102-17 UART 134-5 buffer 131 Signed arithmetic 136 Unidirectional Significance tests 12 Unity-gain voltage follower 63 Simple bending, measurement of strain Variable permittivity capacitive in 46-7, 50-1 transducer 17 Slew rate 60-1 Variable-area capacitive sensor 17-18 Slip rings 23 Variable-separation capacitive sensor Special-purpose
Recommended publications
  • Using Rctime to Measure Resistance
    Basic Express Application Note Using RCtime to Measure Resistance Introduction One common use for I/O pins is to measure the analog value of a variable resistance. Although a built-in ADC (Analog to Digital Converter) is perhaps the easiest way to do this, it is also possible to use a digital I/O pin. This can be useful in cases where you don't have enough ADC channels, or if a particular processor doesn't have ADC capability. Procedure RCtime BasicX provides a special procedure called RCtime for this purpose. RCtime measures the time it takes for a pin to change state to a defined value. By connecting a fixed capacitor and a variable resistor in an RC circuit, you can use an I/O pin to measure the value of the variable resistor, which might be a device such as a potentiometer or thermistor. There are two common ways to wire an RCtime system. The first is to tie the variable resistor to ground. Figure 1 shows this configuration. The advantage here is less chance of damage from static electricity: Figure 1 Figure 2 The second configuration is shown in Figure 2. Here we use the opposite connection, where the capacitor C is tied to ground and the variable resistor RV is tied to 5 volts: In both circuits resistor R1 is there to protect the BasicX chip's output driver from driving too much current when charging the capacitor. To take a sample, the capacitor is first discharged by taking the pin to the correct state. In the case of Figure 1, the pin needs to be taken high (+5 V) to produce essentially 0 volts across the capacitor, which causes it to discharge.
    [Show full text]
  • Memristor-The Future of Artificial Intelligence L.Kavinmathi, C.Gayathri, K.Kumutha Priya
    International Journal of Scientific & Engineering Research, Volume 5, Issue 4, April-2014 358 ISSN 2229-5518 Memristor-The Future of Artificial Intelligence L.kavinmathi, C.Gayathri, K.Kumutha priya Abstract- Due to increasing demand on miniaturization and low power consumption, Memristor came into existence. Our design exploration is Reconfigurable Threshold Logic Gates based Programmable Analog Circuits using Memristor. Thus a variety of linearly separable and non- linearly separable logic functions such as AND, OR, NAND, NOR, XOR, XNOR have been realized using Threshold logic gate using Memristor. The functionality can be changed between these operations just by varying the resistance of the Memristor. Based on this Reconfigurable TLG, various Programmable Analog circuits can be built using Memristor. As an example of our approach, we have built Programmable analog Gain amplifier demonstrating Memristor-based programming of Threshold, Gain and Frequency. As our idea consisting of Programmable circuit design, in which low voltages are applied to Memristor during their operation as analog circuit element and high voltages are used to program the Memristor’s states. In these circuits the role of memristor is played by Memristor Emulator developed by us using FPGA. Reconfigurable is the option we are providing with the present system, so that the resistance ranges are varied by preprogram too. Index Terms— Memristor, TLG-threshold logic gates, Programmable Analog Circuits, FPGA-field programmable gate array, MTL- memristor threshold logic, CTL-capacitor Threshold logic, LUT- look up table. —————————— ( —————————— 1 INTRODUCTION CCORDING to Chua’s [founder of Memristor] definition, 9444163588. E-mail: [email protected] the internal state of an ideal Memristor depends on the • L.kavinmathi is currently pursuing bachelors degree program in electronics A and communication engineering in tagore engineering college under Anna integral of the voltage or current over time.
    [Show full text]
  • Lab 1: the Bipolar Junction Transistor (BJT): DC Characterization
    Lab 1: The Bipolar Junction Transistor (BJT): DC Characterization Electronics II Contents Introduction 2 Day 1: BJT DC Characterization 2 Background . 2 BJT Operation Regions . 2 (i) Saturation Region . 4 (ii) Active Region . 4 (iii) Cutoff Region . 5 Part 1: Diode-Like Behavior of BJT Junctions, and BJT Type 6 Experiment . 6 Creating Your Own File . 6 Report..................................................... 8 Part 2: BJT IC vs. VCE Characteristic Curves - Point by Point Plotting 8 Prelab . 8 Experiment . 8 Creating Your Own File . 8 Parameter Sweep . 9 Report..................................................... 10 Part 3: The Current Mirror 11 Experiment . 12 Simulation . 12 Checkout . 12 Report..................................................... 13 1 ELEC 3509 Electronics II Lab 1 Introduction When designing a circuit, it is important to know the properties of the devices that you will be using. This lab will look at obtaining important device parameters from a BJT. Although many of these can be obtained from the data sheet, data sheets may not always include the information we want. Even if they do, it is also useful to perform our own tests and compare the results. This process is called device characterization. In addition, the tests you will be performing will help you get some experience working with your tools so you don't waste time fumbling around with them in future labs. In Day 1, you will be looking at the DC characteristics of your transistor. This will give you an idea of what the I-V curves look like, and how you would measure them. You will also have to build and test a current mirror, which should give you an idea of how they work and where their limitations are.
    [Show full text]
  • Ltspice Tutorial Part 4- Intermediate Circuits
    Sim Lab 8 P art 2 – E fficiency R evisited Prerequisites ● Please make sure you have completed the following: ○ LTspice tutorial part 1-4 Learn ing Objectives 1. Build circuits that control the motor speed with resistor network and with MOSFET usingLTSpice XVII. 2. By calculating the power efficiency of two speed control circuits, learn that the use of MOSFET in a speed control circuit can increase the power efficiency. Speed control by resist or network ● First, place the components as the following figure. For convenience, we use a resistor in series with an inductor to model the motor. Set the values of resistors, the inductor and the voltage source like the figure. Speed control by resist or network ● Next, connect the circuit as the following figure. We first connect the left three 100 Ω resistors to the circuit. Also, add a label net called “Vmotor_1” and place it right above R6. W e want to monitor the voltage across the motor in this way. ● At the same time, like what we did to a capacitor in previous labs, we also need to set initial conditions for an inductor. Click “Edit” -> Spice Directive -> set “.ic i(L1) = 0”. Speed control by resist or network ● Next, set the simulation condition as the left figure. We are ready to start the simulation. ● The reason to set the stop time as 0.1ms is to observe the change of Vmotor_1 through time from a transient state to steady state. Motor Model Speed control by resist or network ● Run the simulation. ● Plot Vmotor_1 and the current flowing through R6.
    [Show full text]
  • Basic DC Motor Circuits
    Basic DC Motor Circuits Living with the Lab Gerald Recktenwald Portland State University [email protected] DC Motor Learning Objectives • Explain the role of a snubber diode • Describe how PWM controls DC motor speed • Implement a transistor circuit and Arduino program for PWM control of the DC motor • Use a potentiometer as input to a program that controls fan speed LWTL: DC Motor 2 What is a snubber diode and why should I care? Simplest DC Motor Circuit Connect the motor to a DC power supply Switch open Switch closed +5V +5V I LWTL: DC Motor 4 Current continues after switch is opened Opening the switch does not immediately stop current in the motor windings. +5V – Inductive behavior of the I motor causes current to + continue to flow when the switch is opened suddenly. Charge builds up on what was the negative terminal of the motor. LWTL: DC Motor 5 Reverse current Charge build-up can cause damage +5V Reverse current surge – through the voltage supply I + Arc across the switch and discharge to ground LWTL: DC Motor 6 Motor Model Simple model of a DC motor: ❖ Windings have inductance and resistance ❖ Inductor stores electrical energy in the windings ❖ We need to provide a way to safely dissipate electrical energy when the switch is opened +5V +5V I LWTL: DC Motor 7 Flyback diode or snubber diode Adding a diode in parallel with the motor provides a path for dissipation of stored energy when the switch is opened +5V – The flyback diode allows charge to dissipate + without arcing across the switch, or without flowing back to ground through the +5V voltage supply.
    [Show full text]
  • Digital Potentiometers Design Guide
    Analog and Interface Products Digital Potentiometers Design Guide www.microchip.com/analog Digital Potentiometer Solutions Microchip’s Family of Digital Potentiometers Microchip offers a wide range of devices that allow you to select the best fit for your application needs. Some of the selection options include: ■ End-to-end resistance (RAB) values ■ Resistor network confi gurations • 2.1 kΩ to 100 kΩ (typical) • Potentiometer (voltage divider) ■ Resolution • Rheostat (variable resistor) • 6-bit (64 steps) ■ Single, dual and quad potentiometer options • 7-bit (128/129 steps) ■ Different package options • 8-bit (256/257 steps) ■ Special features ■ Serial interfaces • Shutdown mode • Up/down • WiperLock™ technology • SPI ■ Low-power options • I2C ■ Low-voltage options (1.8V) ■ Memory types ■ High-voltage options (36V or ±18V) • Volatile • Non-volatile (EEPROM) Microchip offers digital potentiometer devices with typical end-to-end resistances of 2.1 kΩ, 5 kΩ, 10 kΩ, 50 kΩ and 100 kΩ. These devices are available in 6, 7 or 8 bits of resolution. The serial interface options allow you to easily integrate the device into your application. For some applications, the simple up/down interface will be adequate. Higher-resolution devices (7-bit, 8-bit) often require direct read/write to the wiper register. This is supported with SPI or I2C interfaces. SPI is simpler to implement, but I2C uses only two signals (pins) and can support multiple devices on the serial bus without additional pins. Microchip offers both volatile and non-volatile (EEPROM) devices, allowing you the flexibility to optimize your system design. The integrated EEPROM option allows you to save digital potentiometer settings at power-down and restore to its original value and power-up.
    [Show full text]
  • Conductive Plastic and Cermet MODPOT Panel Potentiometers
    Series 70 Custom Potentiometer Designer Guide .015 [0.38mm] 1/8 [3.18mm] .250 .055 [6.35mm] [1.47mm] 36 ROUTE 10, STE 6 • EAST HANOVER • NEW JERSEY Phone 973-887-2550 • T oll Free 1-800-631-8083 • Fax 973-887-1940 Internet http://www • 07936 .potentiometers.com POT PROTOTYPES PRONTO! Dual Potentiometer, Dual Rotary Switch, Single Potentiometer, Single Rotary Switch, Single Potentiometer, Dual Potentiometer, Single Flatted 1/8” Shaft, Solder Lugs Single Slotted 1/4” Shaft, Solder Lugs Single 1/4” Shaft, Solder Lugs Dual Shaft, Solder Lugs Dual Potentiometer, Single Potentiometer, Triple Potentiometer, Quad Potentiometer, Single 1/4” Shaft, PC Pins Single Slotted 1/4” Shaft, PC Pins Single 1/8” Shaft, PC Pins Single 1/4” Shaft, Solder Lugs Now almost any special combination potentiometer you specify can be manufactured and shipped soon after your order is received. Since Clarosystem and Mod Pot potentiometers are modular in construction, we can produce prototype quantities of 1/2 or 5/8 inch square, conductive plastic, cermet, or hot molded carbon pots for you in just a few hours . and even production quantities in a matter of days with our VIP (Very Important Potentiometer) service! Over one billion combinations of single, dual, triple, quad arrangements, push-pull or rotary switches and hundreds of shaft terminal variations can be produced. If you need a potentiometer and you need it fast, call our product manager or fax us your requirements using the WHY WAIT? Custom Potentiometer Order Forms included in this catalog. 36 Route 10, STE 6 East Hanover, NJ 07936-0436 Phone 973-887-2550 Toll Free 1-800-631-8083 FAX 973-887-1940 http://www.potentiometers.com Series 70, 72 Hot-Molded Carbon*, Conductive Plastic (CP), and Cermet Panel Potentiometers Unmatched Flexibility The MOD POT® Family includes: Series 70 – Metal or Plastic Shaft – Metal Bushing.
    [Show full text]
  • AN-1206 Application Note
    AN-1206 APPLICATION NOTE One Technology Way • P. O. Box 9106 • Norwood, MA 02062-9106, U.S.A. • Tel: 781.329.4700 • Fax: 781.461.3113 • www.analog.com Variable Gain Inverting Amplifier Using the AD5292 Digital Potentiometer and the OP184 Op Amp VDD CIRCUIT FUNCTION AND BENEFITS R3 1kΩ +15V/+30V This circuit provides a low cost, high voltage, variable gain V+ OP184 VOUT inverting amplifier using the AD5292 digital potentiometer V V– IN –15V/GND R2 in conjunction with the OP184 operational amplifier. 4.99kΩ ± 1% C1 V 10pF SS The circuit offers 1024 different gains, controllable through an SPI-compatible serial digital interface. The ±1% resistor tolerance VDD R +15V/+30V AW performance of the AD5292 provides low gain error over the RAB 20kΩ full resistor range, as shown in Figure 2. AD5292 SERIAL INTERFACE VSS The circuit supports input and output rail to rail for both single –15V/GND 08426-001 supply operation at +30 V and dual supply operation at ±15 V; Figure 1. Variable Gain Inverting Amplifier (Simplified Schematic: and is capable of delivering up to ±6.5 mA output current. Decoupling and All Connections Not Shown) In addition, the AD5292 has an internal 20-times programmable The circuit gain equation is memory that allows a customized gain setting at power-up. The (1024 − D)× RAB circuit provides accuracy, low noise, low THD, and is well suited G = − 1024 (3) for signal instrumentation conditioning. R2 CIRCUIT DESCRIPTION where D is the code loaded in the digital potentiometer. Table 1. Devices Connected/Referenced When the circuit input is an ac signal, the parasitic capacitances Product Description of the digital potentiometer can cause undesirable oscillation in AD5292 10-bit, 1% resistor tolerance digital potentiometer the output.
    [Show full text]
  • EXPERIMENT 6 REPORT Bipolar Junction Transistor (BJT) Characteristics
    Name & Surname: University of Bahçeşehir Engineering Faculty ID: Electrical-Electronics Department Date: EXPERIMENT 6 REPORT Bipolar Junction Transistor (BJT) Characteristics Objectives: 1. To determine transistor type (npn, pnp),terminals, and material using a DMM 2. To graph the collector characteristics of a transistor using experimental methods 3. To determine the value of alpha and beta ratios of a transistor. Equipment Required: (1) 1 kΩ (1) 220 kΩ (1) 5 kΩ - POT (1) 1 MΩ- POT (1) 2N3904 (1) Transistor without terminal identification. Theory: Bipolar transistors are made of either silicon (Si) or germanium (Ge). Their structure consists of two layers of n-type material separated by a layer of p-type material (NPN), or two layers of p-type material separated by a layer of n-type material (PNP). In either case, the center layer forms the base of the transistor, while the external layers form the collector and the emitter of the transistor. It is this structure that determines the polarities of any voltages applied and the direction of the electron or conventional current flow. With regard to the latter, the arrow at the emitter terminal of the transistor symbol for either type of transistor points in the direction of conventional current flow and thus provides a useful reference (Figure 5.2.) one part of this experiment will demonstrate how you can determine the type of transistor and its material, and identify its three terminals. The relationship between the voltages and the currents associated with a bipolar junction transistor under various operating conditions determine its performance. These relationships are collectively known as the characteristics of the transistors.
    [Show full text]
  • Replacing Digital Potentiometers with Precision Dacs
    Replacing Digital Potentiometers with Precision DACs However, a majority of DACs include an output buffer. When Can a Digital Potentiometer (DPOT) be In addition, some DACs also include a reference, and Replaced by a Precision Digital-to-Analog a reference buffer. The reference buffer ensures that Converter (DAC)? the voltage of the DAC output is known, while the This seems like a simple question, but to thoroughly output buffer allows for current drive capability. understand the trade-offs of replacing a DPOT with a PVDD DAC, it is important to understand the difference LOAD VCC SENSOR between the two device types and how they are used. (A) ILOAD (B) H VREF H DPOT H DPOT R/8 DAC W R/8 + ± REF DPOT MCU W ± + R/8 R/8 L VSET R/8 R/8 R L SET R/8 R/8 ± R/8 R/8 OUTPUT W + (C) I2C/SPI I2C/SPI VCC R/8 R/8 H ± Digital Logic and NVM Digital Logic and NVM DPOT R/8 R/8 W + + LOAD R/8 R/8 VLOAD L - L Figure 1. Figure 2. A DPOT is a digitally controlled IC that mimics a How are DPOTs Used? manual predecessor: the potentiometer. It consists of DPOTs have many applications where they are well- a resistor string and switches that connect the out suited. For example, they can be used as a resistor (also called the "wiper") to the tap points on the string. divider of a static (or dynamic) voltage resistor divider, A controller that interprets digital commands sets the or as a variable resistor in an op amp feedback switches, which connect the wiper to the desired tap network.
    [Show full text]
  • X9C102, X9C103, X9C104, X9C503 Datasheet
    DATASHEET X9C102, X9C103, X9C104, X9C503 FN8222 Digitally Controlled Potentiometer (XDCP™) Rev 4.00 Jan 11, 2019 The X9C102, X9C103, X9C104, X9C503 are digitally Features controlled (XDCP) potentiometers. The device consists of a • Solid-State Potentiometer resistor array, wiper switches, a control section, and nonvolatile memory. The wiper position is controlled by a • Three-Wire Serial Interface three-wire interface. • 100 Wiper Tap Points The potentiometer is implemented by a resistor array - Wiper Position Stored in Non-volatile Memory and composed of 99 resistive elements and a wiper switching Recalled on Power-up network. Between each element and at either end are tap • 99 Resistive Elements points accessible to the wiper terminal. The position of the wiper element is controlled by the CS, U/D, and INC inputs. - Temperature Compensated The position of the wiper can be stored in non-volatile - End-to-End Resistance, ±20% memory and then be recalled upon a subsequent power-up - Terminal Voltages, ±5V operation. • Low Power CMOS The device can be used as a three-terminal potentiometer or -VCC = 5V as a two-terminal variable resistor in a wide variety of - Active Current, 3mA max. applications ranging from control to signal processing to - Standby Current, 750µA max. parameter adjustment. • High Reliability Pinout - Endurance, 100,000 Data Changes per Bit X9C102, X9C103, X9C104, X9C503 - Register Data Retention, 100 years (8 LD SOIC, 8 LD PDIP) TOP VIEW • X9C102 = 1k • X9C103 = 10k INC 1 8 V CC • X9C503 = 50k U/D 2 7 CS • X9C104 = 100k
    [Show full text]
  • ON Semiconductor Is an Equal Opportunity/Affirmative Action Employer
    ON Semiconductor Is Now To learn more about onsemi™, please visit our website at www.onsemi.com onsemi and and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of onsemi product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. onsemi reserves the right to make changes at any time to any products or information herein, without notice. The information herein is provided “as-is” and onsemi makes no warranty, representation or guarantee regarding the accuracy of the information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using onsemi products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/ or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. onsemi does not convey any license under any of its intellectual property rights nor the rights of others.
    [Show full text]