Bibliography and Further Reading

CHAPTER 1

J. Topping, Errors of Observation and their Treatment, 4th edn, Chapman and Hall, 1972. R. K. Penny, The Experimental Method, Longman, 1974. P. R. Bevington, Data Reduction and Error Analysis for the Physical Sciences, McGraw-Hill, 1969. Open University Science Foundation Course Team, The Handling of Experimental Data, Open University Press, 1970.

CHAPTER 2

B. E. Jones, Instrumentation, Measurement and Feedback, McGraw-Hill, 1978. M. J. Usher, and , Macmillan, 1985. L. F. Adams, Engineering Measurements and Instrumentation, English Universities Press, 1975. B. A. Gregory, An Introduction to Electrical Instrumentation and Measurement Systems, Macmillan, 1973.

CHAPTER 3

Strain Measurements, Briiel and Kjaer. J. M. Calvert and M. A. H. McCausland, Electronics, Wiley, 1978. H. Ahmed and P. J. Spreadbury, Analogue and for Engineers, 2nd edn, Cambridge University Press, 1984. P. Horowitz and W. Hill, The Art of Electronics, Cambridge University Press, 1980. Z. H. Meiksin and P. C. Thackeray, Electronic Design with Off-the-shelf Integrated Circuits, Parker Publishing Company Inc, 1980.

217 218 INSTRUMENTATION FOR ENGINEERS

CHAPTER 4

M. E. VanValkenburg, Analogue Filter Design, Holt, Rinehart and Winston, 1982. R. A. Williams, Communications Systems Analysis and Design, Prentice-Hall, 1987.

CHAPTER 5

As chapter 3.

CHAPTER 6

P. Horowitz and W. Hill, The Art of Electronics, Cambridge University Press, 1980. A. Colin, Programming for , Butterworth, 1979. D. Aspinall, The and its Application, Cambridge University Press, 1978.

CHAPTER 7

R. D. Stuart, An Introduction to Fourier Analysis, Methuen, 1966. K. G. Beauchamp and C. K. Yuen, Digital Methods for Signal Analysis, Allen and Unwin, 1979. J. S. Bendat and A. G. Piersol, Random Data: Analysis and Measurement Procedures, Wiley, 1971.

CHAPTER 8

R. B. Randall, Frequency Analysis, Briiel and Kjaer, 1977.

CHAPTER 9

C. Chatfield, The Analysis of Time Series, 2nd edn, Chapman and Hall, 1980. K. G. Beauchamp, Signal Processing, Allen and Unwin, 1973. J. S. Bendat and A. G. Piersol, Measurement and Analysis of Random Data, Wiley, 1966. J. S. Bendat, Principles and Applications of Random Noise Theory, Wiley, 1958. J. S. Bendat and A. G. Piersol, Engineering Applications of Correlation and Spectral Analysis, Wiley, 1980. Index

54 series 120 Bit 136 74 series 120 Boolean algebra 119, 121-5 Breaking strain 27, 28 AC 64-5 Bridge circuit 29, 42-55 AC bridge 42, 53-5 Bus transceivers 132-3 AC tachometer 23-4 Butterworth filter class 82-3 Accelerometer 13, 24-5, 41 Byte 136 Acoustic sensors 38-9 Active filter 79-101 Cable capacitance 72 Actuator 2 Campbell diagram 167-8 A/ D I A converters 103 Cantilever vibration 164-7 ADC 102-17 Capacitive displacement transducers Address decoders 133, 145 16-18 Aliasing 96, 102, 186-90 Capacitive sensors 16-18 Analogue filters 79-101 microphones 38 Analogue multiplexers 115-16 Carbon-track potentiometer 16 Analogue spectrum analyser 180-2 CARRY flag 136 Analogue-to-digital converter see ADC 140-2 Antialiasing 102, 186-90 Centronics port 118 64 Ceramic microphones 38 Autocorrelation 203-13 Charge amplifier 72 Chebyshev filter class 82-3 Bandpass filter 5, 79-80, 85-6, 89-90, Choice of sampling parameters 187 96-7 Circle diagram 137 Bandstop filter 80-1 CMOS circuits 121 Bandwidth 56, 60 CMOS outputs 119-20 Baud 157 Combinationallogic 121-5 BCD 138 Combining random and systematic Bearing 161 errors 10-12 Bidirectional buffers 132-3 Common Mode Gain (CMG) 58-9 Binary arithmetic 119, 135-8 Common Mode Rejection Ratio Binary code 135-8 (CMRR) 59 Binary coded decimal 138 Comparator (analogue) 73

219 220 INDEX

Comparator (digital) 133-4 Filter design 84-97 Comparison of window functions 197- Filter order 81-2 8, 201 First-order bandpass filter 85-6 Compensation (strain gauges) 27, 29, First-order filters 84-6 45-50 First-order high-pass filter 85 Complement, of a number 136 First-order low-pass filter 84-5 Complex form of the Fourier series 177 Flash encoder see Parallel encoder Compliance 71 Flow sensors 29-32 Constant current source 65 Forward transform 178 Convolution 207-8 Fourier analysis 170 Cooley and Tukey's FFT algorithm 185 Fourier cosine series 173 Corner frequency 80, 95-6 Fourier series 170-7 Correlation 205-16 Fourier sine series 17 4 CPU 138-9, 140-2 Fourier transform 177-9 Cross-correlation 213-16 Fourier's integrals 172 Current-to-voltage converter 71 Fourier's theorem 170 Fourth-order high-pass filter 94 Fourth-order low-pass D/ A converter see DAC filter 93 Frequency DAC 102-3, 105-9 domain analysis 159 DC bridge 42 Frequency-to-voltage converters 109 DC tachometer 23 Full bridge 49-52 Deterministic signal 203-4 DFT 184 Gain-bandwidth product 60, 61 Differential amplifier 65-6 Gain-frequency diagram 60 Differentiator 70-1 Gauge factor 26-8, 45 Digital device families 118-21 Gauge resistance 26-8 Digital filter 79 Gaussian function 7, 12 Digital spectrum analysers 182 Gaussian window 198, 201 Digital-to-analogue converter see DAC Generalised instrumentation design Digitisation 102 3-6 Dirac delta function 164 Goodness-of-fit tests 12 Dirichlet's conditions 170 Gray code 18 Discrete Fourier Transform see DFT Half-bridge Displacement sensing 13-21 46-9 Distortion 61, 161 Hall effect 39-40 Hamming Dual slope integration 112-13 window 197-8, 201 Dummy gauge 29, 45-6 Handling precautions (CMOS) 121 Dynamic range 96, 202 Handshaking 157 Hanning window 197-8, 201 Heisenberg's Uncertainty Principle Electret microphones 38 4-5 Electrical resistance strain gauge 25-7 Hexadecimal notation 138 Ensemble 204 High-pass filter 79-80 Equal-ripple filter see Chebyshev filter Hot- anemometer 30 class HPIB see IEEE Interface Ergodic process 205 Hydrophone 39 Error analysis 6-12 Even and odd functions 173-4 IEEE Interface 118, 157-8 Impedance bridge 53-5 Fast Fourier Transform (FFT) 184-8 Impulse see Dirac delta function Fatigue life (of strain gauges) 27-8 Inductive sensors 53-5 Filter class 82-3 Input bias current 59-60 INDEX 221

Input impedance 58 Optical gratings 21 Input-output impedance 58 Optical sensors 35 Integrating ADC 112-13 Output impedance 58 Integrator 68, 70 Interrupt service routine 144 Parallel analysers (real time) 181-2 Inverting amplifier 62-3 Parallel encoder 110-12 Parallel plate capacitor 17-18 Linear moving magnet Parallel-to-serial conversion 134-5 22-3 Perfect filters 80 Linear Variable Differential Peripheral interface 142-3 14-15 Photovoltaic cells 36-7 Lissajous figure 68 Piezoelectric effect 24 Load cell 28-9 Piezoelectric sensors 24-5, 38 Logic identities 123, 125 Pistonphone 39 Longitudinal velocity sensing 21-3 Pitot tube 30-1 Low-frequency turbulence 39 Poisson's ratio 49, 52 Low-pass filter 79-80 Potentiometer displacement LVDT see Linear Variable transducers 15-16 Differential Transformer Power spectrum 208, 213 Precision 67-9 Magnetic microphone 38 Pressure sensors 28-30 Magnetic velocity sensing 21-4 Primary sensing element 3 Mass flow rate sensor 30 Probability density 204 Maximally flat filter see Butterworth Pseudorandom noise 210 filter class Pulse counter 144-51 Mean 7, 204 Push-pull sensor 53-4 Mean square value 204 Mechanical strain gauges 25 Quarter-bridge 44-6 Memory 139-40 Microphones 38-9 Random access memory (RAM) 139 Microprocessor 138-44 Random errors 7-9 Microprocessor interfacing 118-58 Random noise 204-13 Microprocessor timing diagram 150-1 Read-only memory (ROM) 139 Modal domain 164-7 Real filter transfer functions 80 Modal response diagram 167 Recovery time 67, 73 Modifier 5 Resistance-wire thermometer 33 Modulating transducers 5-6 Resistive bridges 42-52 Moving coil velocity sensor 21-2 Resonance 24-5, 164 Multiple path problems 215-16 Reverse Fourier Transform 178 Multiplexed ADC 115-16 RF5609A 95-6, 100-1 RM5604 96-9 Natural binary 135-6 RM5605 96-9 Noise immunity 119 RM5606 96-9 Non-inverting amplifier 63-4 Root mean square 204 Normalised filter design 84 Rotary LVDT 15 Number codes 135-8 Rotary potentiometer 16 Nyquist frequency 186, 199 Rotational velocity sensing 23-4 RS232 157 Op-amp see RS432 157 Op-amp rules 62 Operational amplifier 55-73 Sample-and-hold devices 109-10 Optical displacement sensors 18-21 Sampling 102 222 INDEX

Saturation 70, 73 Tensile strain measurement 47-9, Scratch gauges 25 51-2 Second-order bandpass filter 89-90 33-4 Second-order filters 86-90 Third-order filter 90 Second-order high-pass filter 88-9 Third-order high-pass filter 92-3 Second-order low-pass filter 86-8 Third-order low-pass filter 90-2 Self-exciting sensors see Self- Time domain 159 generating sensors Timing (microprocessor) 150-1 Self-generating sensors 5 Tracking converter 115 Semiconductor strain gauges 27-8 Transient response of filters 82 Semiconductor temperature sensors Tri-state buffers 131 33-4 TTL circuits 119-20 Serial-to-parallel conversion 134-5 TTL inputs 119-20 Shaft whirl 168 TTL outputs 119-20 Shannon's sampling theorem 188-90 Turbine flow sensor 31-2 Signal classification 203-5 Two's complement 138 Signal conditioning 2, 55 Signal conversion 102-17 UART 134-5 buffer 131 Signed arithmetic 136 Unidirectional Significance tests 12 Unity-gain voltage follower 63 Simple bending, measurement of strain Variable permittivity capacitive in 46-7, 50-1 transducer 17 Slew rate 60-1 Variable-area capacitive sensor 17-18 Slip rings 23 Variable-separation capacitive sensor Special-purpose filter devices 95-7 17-18 Spectrum analysers 180-8 Vector flow 30-1 Spring-mass system 159 Vector flow transducer 30-1 Standard deviation 7 Vector response diagrams 168-70 Standard error 7 Virtual earth 63 State parameters 2 Voltage Supply Rejection Ratio Stationary signals 205 (VSRR) 59 Stepped filter analysers 180 Volume flow sensors 31-2 Strain gauge 25-9 VRD see Vector response diagrams Strain gauge transducers 28-9 Stress 47-9 Waterfall diagram 167-8 Successive approximation ADC Wheatstone bridge 42-3 113-15 Windowing 190-9 Summing amplifier 66-7 Windshields 39 Swept-filter analyser 181 Wire and foil strain gauges 26 Switched-capacitor filter 95 Wire-wound potentiometer 16 Systematic error 9-10 Word 136 X register 142 Tachometer 23-4 Temperature sensors 32-4 Zero error 6