Progress In Electromagnetics Research, PIER 102, 267{286, 2010 PLANAR TRANSMISSION LINE METHOD FOR CHAR- ACTERIZATION OF PRINTED CIRCUIT BOARD DI- ELECTRICS J. Zhang CISCO Systems, Inc. CA, USA M. Y. Koledintseva Missouri University of Science & Technology Rolla, MO, USA G. Antonini Department of Electrical Engineering University of L'Aquila Poggio di Roio, 67040 AQ, Italy J. L. Drewniak Missouri University of Science & Technology Rolla, MO 65401, USA A. Orlandi Department of Electrical Engineering University of L'Aquila Poggio di Roio, 67040 AQ, Italy K. N. Rozanov Institute for Theoretical and Applied Electromagnetics Russian Academy of Sciences Moscow 125412, Russia Corresponding author: M. Y. Koledintseva (
[email protected]). 268 Zhang et al. Abstract|An e®ective approach to characterize frequency-dispersive sheet materials over a wide RF and microwave frequency range based on planar transmission line geometries and a genetic algorithm is proposed. S-parameters of a planar transmission line structure with a sheet material under test as a substrate of this line are measured using a vector network analyzer (VNA). The measured S-parameters are then converted to ABCD matrix parameters. With the assumption of TEM/quasi-TEM wave propagation on the measured line, as well as reciprocity and symmetry of the network, the complex propagation constant can be found, and the corresponding phase constant and attenuation constant can be retrieved. Attenuation constant includes both dielectric loss and conductor loss terms. At the same time, phase term, dielectric loss and conductor loss can be calculated for a known transmission line geometry using corresponding closed- form analytical or empirical formulas.