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August 2-6 Milwaukee, WI Look Inside for Program Details, Plenary Speakers, Pre-Meeting Congresses, and more! August 2-6 Milwaukee, WI Deadline: Call for Submissions February 21, 2020 www.microscopy.org/MandM/2020 for up-to-date meeting information Letter from the Presidents On behalf of the Microscopy Society of America and the Microanalysis Society, we invite you to join us August 2-6, 2020, for August 2-6 Milwaukee, WI Microscopy & Microanalysis 2020 at the Wisconsin Convention Center in Milwaukee, Wisconsin! “Brew City” is excited to welcome M&M back after 30 years. Milwaukee is an excellent summer Questions? destination, with comfortable temperatures in the 80s, lots of outdoor TECHNICAL MEETING CONTENT: and lakeside activities, and a healthy pub and foodie culture! 2020 Program Chair Huolin Xin, University of California-Irvine The Program Committee, led by Huolin Xin, Elizabeth Wright, [email protected] and John Fournelle, has developed an exciting group of symposia, spanning advances in instrumentation and techniques REGISTRATION: development, as well as applications in the analytical, biological, Registrar and physical sciences. We encourage you to browse this Call for [email protected] Submissions for the complete symposium list, and to submit one or more contributions for platform or poster presentation. Tables EXHIBITS & EXHIBITORS: will continue to be provided at the poster boards for fully dynamic Exhibits Manager multimedia poster presentations. [email protected] SPONSORS & SPONSORSHIPS: The main meeting will be preceded by the ever-popular Sunday Sponsorship Manager Short Courses and three Pre-Meeting Congresses and will officially [email protected] start with the Opening Welcome Reception on Sunday evening. The Reception is a great place for all attendees to meet new GENERAL: colleagues and reconnect with old friends. Students and early-career Meeting Manager professionals are especially encouraged to participate in the MSA [email protected] Student Council’s Annual Pre-Meeting Congress that highlights outstanding work by student and postdoctoral fellow attendees. On Monday morning, the Plenary Session kicks off the scientific program with two exciting plenary lectures by Dr. Yi Cui (nanomaterials science and engineering, Stanford University) and Dr. Maria McNamara Are You aModied A Member? (paleobiology, University of York), and the presentations of the M&M Join Today and Save on meeting awards and awards from the sponsoring societies. M&M 2020 Registration Fees! In addition to the strong scientific program, what sets the M&M meeting apart is the Exhibit Hall, the world’s largest annual microscopy exhibition, which showcases the latest in microscopy Visit http://microscopy.org to join the instrumentation and accessories. Don’t miss the highly popular Microscopy Society of America online, or for vendor tutorials, held Monday through Wednesday after hours in the more information about the benefits of MSA Exhibit Hall. Other educational opportunities throughout the week membership. include focused biological and physical science tutorials, educational outreach programs, and our Technologists’ Forum special and roundtable sessions. Visit http://the-mas.org to find out the As always, M&M 2020 will be the premier meeting to attend to stay benefits of MAS membership. abreast of the latest technologies, hear about new developments in applications across all areas of microscopy and microanalysis, and most importantly network with colleagues. COVER IMAGES: ‘Molecular Sociology’ Revealed by in situ Cryo-Electron See you in Milwaukee! Tomograph by Qiang Guo, Max-Planck-Institute of Biochemistry, Germany Esther Bullitt, Boston University Gear Wheel by Additive Manufacturing by Gaby Ketzer- President, Microscopy Society of America Raichle, Aalen University, Germany CoFeSi Alloy, as Cast, Color Etched Metallographic Section Rhonda Stroud, U.S. Naval Research Laboratory by Felix Trauter, Institut für Materialforschung, Germany President, Microanalysis Society 2 www.microscopy.org/MandM/2020 for up-to-date meeting information Analytical Sciences Symposia A01 Advances in Modeling, Simulation, • Advantages of direct electron detectors and Artificial Intelligence in in EELS Microscopy and Microanalysis for • New science by combining A07 Advances in Quantitative new acquisition and processing Physical and Biological Systems Electron Beam Microanalysis methodologies, and advancements in (EDS and WDS) ORGANIZERS: EELS instrumentation and detectors ORGANIZERS: Yi Jiang, Argonne National Laboratory • EELS in biological sciences Huihuo Zheng, Argonne National Laboratory Stephen Seddio, Thermo Fisher Scientific Colin Ophus, Lawrence Berkeley National Laboratory Philippe Pinard, Oxford Instruments Ellen Keene, Dupont Inc. A04 Pushing the Limits of Detection Paul Carpenter, Washington University Nicholas Ritchie, National Institute of Standards • Artificial intelligence and machine learning in Quantitative (S)TEM Imaging, EELS, and EDX and Technology in microscopy and microanalysis • Innovations in instrumentation and • Advanced algorithms for inverse problems ORGANIZERS: algorithms for quantitative x-ray (e.g. ptychography, tomography, etc.) Christian Dwyer, Arizona State University microanalysis • Software, workflow, and infrastructure for Paul Voyles, University of Wisconsin-Madison • Applications to materials science, geological data acquisition and processing Philip Batson, Rutgers University science, and beyond • Novel methods for multimodal and Ye Zhu, Hong Kong Polytechnic University, • Combined EDS and WDS quantitative x-ray multidimensional data analysis (e.g. Hong Kong microanalysis on the SEM or EPMA visualization, segmentation, temporal • Quantitative (S)TEM imaging and • Accuracy of standardless and standards- measurements, etc.) based approaches to x-ray quantification • Practical challenges and solutions spectroscopy • Detector technology capable of • Low-energy x-ray spectroscopy and in applying advanced algorithms to quantification experimental data elucidating subtle behavior • New developments in modeling and • Low-dose imaging and spectroscopy simulation of electron scattering • Numerical processing for the isolation of weak signals A08 X-ray-, Electron-, and Synchotron- Based X-ray Imaging and Analysis A02 Four-Dimensional Scanning ORGANIZERS: A05 Crystallography at the Transmission Electron Microscopy Jeffrey Davis, EOS GmbH, Germany Nanoscale and MicroED with (4D-STEM): New Experiments and Nikolaus Cordes, Idaho National Laboratory Electrons and X-rays Eric Telfeyan, GE Global Research Data Analyses for Determining Richard Wuhrer, University of Western Sydney, Materials Functionality and ORGANIZERS: Huifang Xu, University of Wisconsin‐Madison Australia Biological Structures J. G. Wen, Argonne National Laboratory • Imaging using laboratory sources, such ORGANIZERS: M. C. Cherukara, Argonne National Laboratory as µXRF, µXRD and µCT David Muller, Cornell University Marija Gajdardziska, University of Wisconsin‐ • Synchrotron research using broad beam, Damien McGrouther, University of Glasgow, Milwaukee soft x-ray or coherent methods United Kingdom • Atomic-resolution 3D tomography • Electron beam methods such as SEM-EDS Jinwoo Hwang, The Ohio State University • Coherent diffraction imaging including x-ray mapping • Software, hardware and instrumentation • Advances in experiments and analyses of Ptychographic methods for x-ray imaging 4D-STEM using fast pixelated detectors • Correlating 3D atomic • Correlative microscopy and applications • Electron ptychography for extreme arrangements of chemical order/ of x-ray imaging in materials science resolution imaging and beyond disorder and crystal defects • Differential phase contrast imaging of • Combined methods of using electrons electromagnetic fields in materials and x-ray A09 Surface and Subsurface • Scanning diffraction, CBED, and novel • 3D precession electron diffraction analysis of the data Microscopy and Microanalysis of • Strain and diffraction contrast methods Physical and Biological Specimens for quantifying local structure and A06 Direct Phase Imaging with ORGANIZERS: heterogeneity Coherent Electron Beam in TEM Vincent Smentkowski, General Electric ‐ Research • Applications to life sciences, and ORGANIZERS: John A Chaney, The Aerospace Corporation combining 4D-STEM with in situ methods Myung‐Geun Han, Brookhaven National Xiao‐Ying Yu, Pacific Northwest National Laboratory Laboratory Igor Sokolov, Tufts University Lin Zhou, Ames Laboratory • State-of-the-art surface analysis and A03 Impact of Recent Advancement Kai He, Clemson University instrumentation in Instrumentation/Detectors on Martha McCartney, Arizona State University • Advances in scanning probe microscopy Electron Energy Loss Spectroscopy • Developments in instrumentation, for quantitative analysis including for Physical and Biological Sciences methods, and algorithms for phase nano-scale chemical, mechanical and ORGANIZERS: retrieval microscopy electrical analyses, for example, TERS, IR, Toshihiro Aoki, University of California-Irvine • Nanoscale magnetic and electric field nanomechanical modes • How novel surface methods expand and William Bowman, University of California-Irvine mapping in advanced materials and complement traditional SEM/TEM Steven R Spurgeon, Pacific Northwest semiconductor devices • Correlative microscopy /multi- National Laboratory • Phase plate and holographic imaging for dimensional microscopy—combining Fredrik S. Hage, SuperSTEM, United Kingdom
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