High-Performance Visible Light Photodetectors Based on Inorganic CZT and Inczt Single Crystals Received: 6 February 2019 Mohd
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OPTI510R: Photonics
OPTI510R: Photonics Khanh Kieu College of Optical Sciences, University of Arizona [email protected] Meinel building R.626 Photodetectors Introduction Most important characteristics Photodetector types • Thermal photodetectors • Photoelectric effect • Semiconductor photodetectors Photodetectors p-n photodiode Response time p-i-n photodiode APD photodiode Noise Wiring Arrayed detector (Home Reading) Point-to-point WDM Transmission System - Building Blocks - transmitter receiver l l 1 terminal transmission line terminal 1 Tx point-to-point link section Rx l2 span l2 amplifier span l3 SMF or SMF or l3 NZDF NZDF EDFA EDFA EDFA l4 l4 DC DC l l 5 WDM mux 5 WDM demux l6 l6 dispersion dispersion ) amplifier - compensation compensation transmissionfiber transmissionfiber line) amplifier - (pre (in (booster) (booster) amplifier ln ln Raman Raman pump pump Laser sources Photodetectors Introduction Convert optical data into electrical data Laser beam characterization • Power measurement • Pulse energy measurement • Temporal waveform measurement • Beam profile Introduction Photodetector converts photon energy to a signal, mostly electric signal such as current (sort of a reverse LED) Photoelectric detector • Carrier generation by incident light • Carrier transport and/or multiplication by current gain mechanism • Interaction of current with external circuit Thermal detector • Conversion of photon to phonon (heat) • Propagation of phonon • Detection of phonon Important characteristics Wavelength coverage Sensitivity Bandwidth (response -
Progress in the Development of Cdte and Cdznte Semiconductor Radiation Detectors for Astrophysical and Medical Applications
Sensors 2009, 9, 3491-3526; doi:10.3390/s90503491 OPEN ACCESS sensors ISSN 1424-8220 www.mdpi.com/journal/sensors Review Progress in the Development of CdTe and CdZnTe Semiconductor Radiation Detectors for Astrophysical and Medical Applications Stefano Del Sordo 1,*, Leonardo Abbene 1,2,*, Ezio Caroli 3, Anna Maria Mancini 4, Andrea Zappettini 5 and Pietro Ubertini 6 1 INAF/IASF Palermo, Via Ugo La Malfa 153, 90146 Palermo, Italy 2 Dipartimento di Fisica e Tecnologie Relative, Università di Palermo,Viale delle Scienze, 90128 Palermo, Italy 3 INAF/IASF Bologna, Via Gobetti 101, 40129 Bologna, Italy; E-Mail: [email protected] (E.C.) 4 Dipartimento di Ingegneria dell’Innovazione, Università del Salento, Via Arnesano, 73100 Lecce, Italy; E-Mail: [email protected] (A.M.M.) 5 IMEM-CNR, Parco Area delle Scienze 37/A, 43100 Parma, Italy; E-Mail: [email protected] (A.Z.) 6 INAF/IASF Roma, Via del Fosso del Cavaliere 100, 00133 Roma, Italy; E-Mail: [email protected] (P.U.) * Authors to whom correspondence should be addressed; E-Mails: [email protected]; (S.D.S.); [email protected] (L.A.); Tel. +39-091-6809563; Fax: +39-091-6882258 (S.D.S.); Tel. +39-091-6615053; Fax: +39-091-6615063 (L.A.) Received: 26 March 2009; in revised form: 5 May 2009 / Accepted: 8 May 2009 / Published: 12 May 2009 Abstract: Over the last decade, cadmium telluride (CdTe) and cadmium zinc telluride (CdZnTe) wide band gap semiconductors have attracted increasing interest as X-ray and gamma ray detectors. -
Two Cadmium Zinc Telluride (CZT) Semiconductor Detectors, a Lacl3(Ce) Scintillator, and an Nai(Tl) Scintillator
Performance comparison of four compact room- temperature detectors – two cadmium zinc telluride (CZT) semiconductor detectors, a LaCl3(Ce) scintillator, and an NaI(Tl) scintillator John K. Hartwell, Member IEEE, Robert J. Gehrke, and Michael E. Mc Ilwain measurement scenarios where portability, compact design, Abstract— The performance characteristics of four compact, and freedom from cryogenics are primary considerations. room-temperature detectors – two scintillators and two A recent publication provided performance comparison semiconductor detectors – were studied. All are commercially- data on three detectors including a ∅10 cm X 10 cm NaI(Tl), available detectors. The two scintillators were a ∅13 mm X a ∅55 mm X 54 mm HPGe detector, and a ∅9 mm X 2 mm 13 mm lanthanum chloride [LaCl3(Ce)] detector and a ∅25 mm X 25 mm sodium iodide [NaI(Tl)] detector. The two CdTe detector [1]. Our work, reported in this paper, provides semiconductor detectors were a 10 mm X 10 mm X 3 mm complimentary assessment data on a different suite of four cadmium zinc telluride (CZT) detector with a coplanar gridded highly portable detectors, including work with the promising anode and a 5 mm X 5 mm X 5 mm CZT detector with an new scintillator LaCl3(Ce). extended cathode. The efficiency, resolution, and peak shape of these devices are compared. Since LaCl (Ce) is a relatively new 3 II. EXPERIMENTAL METHOD commercial scintillator material, additional information on the performance of this detector is presented. Specifically, the The electronics system used for these evaluations consisted impact of naturally-occurring radioactive 138La and additional of a preamplifier, a linear amplifier (Tennelec TC244 or Ortec contamination from alpha-emitting radionuclides on the 460), and an multichannel analyzer (Amptek MCA8000A) background measured with this detector are discussed. -
Photoconductivity of Few-Layered P-Wse2 Phototransistors Via Multi-Terminal Measurements
Photoconductivity of few-layered p-WSe2 phototransistors via multi-terminal measurements Nihar R. Pradhan a,*, Carlos Garcia a,b, Joshua Holleman a,b, Daniel Rhodes a,b, Chason Parkera,c, Saikat Talapatra d, Mauricio Terrones e,f, Luis Balicas a,* and Stephen A. McGill a ,* aNational High Magnetic Field Laboratory, Florida State University, Tallahassee, FL 32310, USA bDepartment of Physics, Florida State University, Tallahassee, FL 32306, USA c Leon High School, Tallahassee, FL 32308, USA dDepartment of Physics, Southern Illinois University, Carbondale, IL 62901, USA eDepartment of Physics, Pennsylvania State University, PA 16802, USA fCenter for 2-Dimensional and Layered Materials, Pennsylvania State University, PA 16802, USA Abstract: Recently, two-dimensional materials and in particular transition metal dichalcogenides (TMDs) were extensively studied because of their strong light-matter interaction and the remarkable optoelectronic response of their field-effect transistors (FETs). Here, we report a photoconductivity study from FETs built from few-layers of p-WSe2 measured in a multi-terminal configuration under illumination by a 532 nm laser source. The photogenerated current was measured as a function of the incident optical power, of the drain-to-source bias and of the gate voltage. We observe a considerably larger photoconductivity when the phototransistors were measured via a four-terminal configuration when compared to a two-terminal one. For an incident laser power of 248 nW, we extract 18 A/W and ~4000% for the two-terminal responsivity (R) and the concomitant external quantum efficiency (EQE) respectively, when a bias voltage Vds = 1 V and a gate voltage Vbg = 10 V are applied to the sample. -
Characterization of Cadmium Zinc Telluride Solar Cells by RF Sputtering Senthilnathan Subramanian University of South Florida
University of South Florida Scholar Commons Graduate Theses and Dissertations Graduate School 6-24-2004 Characterization of Cadmium Zinc Telluride Solar Cells by RF Sputtering Senthilnathan Subramanian University of South Florida Follow this and additional works at: https://scholarcommons.usf.edu/etd Part of the American Studies Commons Scholar Commons Citation Subramanian, Senthilnathan, "Characterization of Cadmium Zinc Telluride Solar Cells by RF Sputtering" (2004). Graduate Theses and Dissertations. https://scholarcommons.usf.edu/etd/1261 This Thesis is brought to you for free and open access by the Graduate School at Scholar Commons. It has been accepted for inclusion in Graduate Theses and Dissertations by an authorized administrator of Scholar Commons. For more information, please contact [email protected]. Characterization of Cadmium Zinc Telluride Solar Cells by RF Sputtering by Senthilnathan Subramanian A thesis submitted in partial fulfillment of the requirements for the degree of Master of Science in Electrical Engineering Department of Electrical Engineering College of Engineering University of South Florida Major Professor: Christos S. Ferekides, Ph.D. Don L. Morel, Ph.D. Yun L. Choiu, Ph.D Date of Approval: June 29, 2004 Keywords: czt, thin films, wide bandgap semiconductors, tandem solar cells © Copyright 2004 , Senthilnathan Subramanian DEDICATION This thesis is dedicated to my family and friends for their love and support. ACKNOWLEDGEMENT I would like to express my gratitude to my Major Professor Dr. Chris Ferekides for his invaluable guidance and support during the course of this work. He has been a great source of inspiration during my work here. I also thank Dr.Don L. Morel and Dr. -
Fabrication of Small-Pixel Cdznte Sensors and Characterization with X-Rays
sensors Article Fabrication of Small-Pixel CdZnTe Sensors and Characterization with X-rays Stergios Tsigaridas 1,∗,† , Silvia Zanettini 2 , Manuele Bettelli 3 , Nicola Sarzi Amadè 3 , Davide Calestani 3 , Cyril Ponchut 1 and Andrea Zappettini 3 1 European Synchrotron Radiation Facility (ESRF), 71 Avenue des Martyrs, F-38043 Grenoble, France; [email protected] 2 Due2lab s.r.l., via Paolo Borsellino 2, 42019 Scandiano, Italy; [email protected] 3 IMEM-CNR, Istituto Materiali per l’Elettronica e il Magnetismo, Consiglio Nazionale delle Ricerche, Parco Area delle Scienze 37/A, 43124 Parma, Italy; [email protected] (M.B.); [email protected] (N.S.A.); [email protected] (D.C.); [email protected] (A.Z.) * Correspondence: [email protected] † Current address: TRIUMF, 4004 Wesbrook Mall, Vancouver, BC V6T 2A3, Canada. Abstract: Over the past few years, sensors made from high-Z compound semiconductors have attracted quite some attention for use in applications which require the direct detection of X-rays in the energy range 30–100 keV. One of the candidate materials with promising properties is cadmium zinc telluride (CdZnTe). In the context of this article, we have developed pixelated sensors from CdZnTe crystals grown by Boron oxide encapsulated vertical Bridgman technique. We demonstrate the successful fabrication of CdZnTe pixel sensors with a fine pitch of 55 µm and thickness of 1 mm and 2 mm. The sensors were bonded on Timepix readout chips to evaluate their response to X-rays Citation: Tsigaridas, S.; Zanettini, S.; provided by conventional sources. Despite the issues related to single-chip fabrication procedure, Bettelli, M.; Sarzi Amadè, N.; reasonable uniformity was achieved along with low leakage current values at room temperature. -
Cd,-,Zn,Te Materials
Source of Acquisition NASA Goddard Space Flight Center Temperature Evolution of Excitonic Absorptions in Cd,-,Zn,Te Materials Manuel A. Quijada and Ross Henry Goddard Space Flight Center, Code 551, Greenbelt, MD 20771, USA ABSTRACT The studies consist of measuring the frequency dependent transmittance (T) and reflectance (R) above and below the optical band-gap in the W/Visible and infrared frequency ranges for Cdl-,Zn,Te materials for x=O and XI-0.04. Measurements were also done in the temperature range from 5 to 300 K. The results show that the optical gap near 1.49 eV at 300 K increases to 1.62 eV at 5 K. Finally, we observe sharp absorption peaks near this gap energy at low temperatures. The close proximity of these peaks to the optical transition threshold suggests that they originate from the creation of bound electron-hole pairs or excitons. The decay of these excitonic absorptions may contribute to a photoluminescence and transient background response of these back-illuminated HgCdTe CCD detectors. Keywords: Keywords: CdZnTe, UV/Vis infrared, transmittance, reflectance, semiconducting gap, photolumi- nescence, exciton 1. INTRODUCTION The ternary compound Cdl-,Zn,Te (CdZnTe) is a semiconducting alloy that is widely used as a base material for x-ray and infrared detectors. In particular, single crystals of CdZnTe wafers are the principal material on which HgCdTe epitaxial layers have been recently grown for the fabrication of infrared sensors on lattice matched CdZnTe substrate.l This has been possible due to recent advances through use of new detector growth technologies2 which involve p/n double layer planar heterostructure arrays grown by Molecular Beam Epitaxy (MBE). -
An Investigation on the Printing of Metal and Polymer Powders Using Electrophotographic Solid Freeform Fabrication
AN INVESTIGATION ON THE PRINTING OF METAL AND POLYMER POWDERS USING ELECTROPHOTOGRAPHIC SOLID FREEFORM FABRICATION By AJAY KUMAR DAS A THESIS PRESENTED TO THE GRADUATE SCHOOL OF THE UNIVERSITY OF FLORIDA IN PARTIAL FULFILLMENT OF THE REQUIREMENTS FOR THE DEGREE OF MASTER OF SCIENCE UNIVERSITY OF FLORIDA 2004 Copyright 2004 by Ajay Kumar Das Dedicated to my mother. ACKNOWLEDGMENTS I extend my sincere gratitude to my advisor and chairman of the thesis committee, Dr. Ashok V. Kumar for his guidance and support during the research work which made this thesis possible. I would also like to thank the thesis committee members Dr. John K. Schueller and Dr. Nagaraj Arakere for their patience in reviewing the thesis and for their valuable advice during the research work. I thank the Design and Rapid Prototyping Laboratory co-workers for being helpful, supportive and making the research a pleasurable experience. Last but not least, I would like to thank my parents for their love and encouragement during my studies abroad. iv TABLE OF CONTENTS Page ACKNOWLEDGMENTS ................................................................................................. iv LIST OF TABLES............................................................................................................. ix LIST OF FIGURES ........................................................................................................... xi ABSTRACT.......................................................................................................................xv CHAPTER -
Photoluminescence Study of Cadmium Zinc Telluride
Graduate Theses, Dissertations, and Problem Reports 2001 Photoluminescence study of cadmium zinc telluride Swati Jain West Virginia University Follow this and additional works at: https://researchrepository.wvu.edu/etd Recommended Citation Jain, Swati, "Photoluminescence study of cadmium zinc telluride" (2001). Graduate Theses, Dissertations, and Problem Reports. 1252. https://researchrepository.wvu.edu/etd/1252 This Thesis is protected by copyright and/or related rights. It has been brought to you by the The Research Repository @ WVU with permission from the rights-holder(s). You are free to use this Thesis in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you must obtain permission from the rights-holder(s) directly, unless additional rights are indicated by a Creative Commons license in the record and/ or on the work itself. This Thesis has been accepted for inclusion in WVU Graduate Theses, Dissertations, and Problem Reports collection by an authorized administrator of The Research Repository @ WVU. For more information, please contact [email protected]. PHOTOLUMINESCENCE STUDY OF CADMIUM ZINC TELLURIDE Swati Jain Thesis submitted to the Eberly College of Arts and Sciences at West Virginia University in partial fulfillment of the requirements for the degree of Master of Science in Physics Nancy C. Giles, Ph.D., Chair Larry E. Halliburton, Ph.D. Mohindar S. Seehra, Ph.D. Department of Physics Morgantown, West Virginia 2001 Keywords: Photoluminescence, PL, CdZnTe, CZT, Cd1-xZnxTe ABSTRACT PHOTOLUMINESCENCE STUDY OF CADMIUM ZINC TELLURIDE SWATI JAIN In this thesis, I present a detailed study of Cd1-xZnxTe crystals with 0 ≤ x ≤ 0.14 using photoluminescence (PL) spectroscopy. -
Laser Printer - Wikipedia, the Free Encyclopedia
Laser printer - Wikipedia, the free encyclopedia http://en. rvi kipedia.org/r,vi ki/Laser_pri nter Laser printer From Wikipedia, the free encyclopedia A laser printer is a common type of computer printer that rapidly produces high quality text and graphics on plain paper. As with digital photocopiers and multifunction printers (MFPs), Iaser printers employ a xerographic printing process but differ from analog photocopiers in that the image is produced by the direct scanning of a laser beam across the printer's photoreceptor. Overview A laser beam projects an image of the page to be printed onto an electrically charged rotating drum coated with selenium. Photoconductivity removes charge from the areas exposed to light. Dry ink (toner) particles are then electrostatically picked up by the drum's charged areas. The drum then prints the image onto paper by direct contact and heat, which fuses the ink to the paper. HP I-aserJet 4200 series printer Laser printers have many significant advantages over other types of printers. Unlike impact printers, laser printer speed can vary widely, and depends on many factors, including the graphic intensity of the job being processed. The fastest models can print over 200 monochrome pages per minute (12,000 pages per hour). The fastest color laser printers can print over 100 pages per minute (6000 pages per hour). Very high-speed laser printers are used for mass mailings of personalized documents, such as credit card or utility bills, and are competing with lithography in some commercial applications. The cost of this technology depends on a combination of factors, including the cost of paper, toner, and infrequent HP LaserJet printer drum replacement, as well as the replacement of other 1200 consumables such as the fuser assembly and transfer assembly. -
High-Temperature Ultraviolet Photodetectors: a Review
High-temperature Ultraviolet Photodetectors: A Review Ruth A. Miller,1 Hongyun So,2 Thomas A. Heuser,3 and Debbie G. Senesky1, a) 1Department of Aeronautics and Astronautics Stanford University, Stanford, CA 94305, USA 2Department of Mechanical Engineering Hanyang University, Seoul 04763, Korea 3Department of Materials Science and Engineering Stanford University, Stanford, CA 94305, USA Abstract Wide bandgap semiconductors have become the most attractive materials in optoelectronics in the last decade. Their wide bandgap and intrinsic properties have advanced the development of reliable photodetectors to selectively detect short wavelengths (i.e., ultraviolet, UV) in high temperature regions (up to 300°C). The main driver for the development of high-temperature UV detection instrumentation is in-situ monitoring of hostile environments and processes found within industrial, automotive, aerospace, and energy production systems that emit UV signatures. In this review, a summary of the optical performance (in terms of photocurrent-to-dark current ratio, responsivity, quantum efficiency, and response time) and uncooled, high-temperature characterization of III-nitride, SiC, and other wide bandgap semiconductor UV photodetectors is presented. a) Author to whom correspondence should be addressed. E-mail: [email protected] 1 I. INTRODUCTION On the electromagnetic spectrum, the ultraviolet (UV) region spans wavelengths from 400 nm to 10 nm (corresponding to photon energies from 3 eV to 124 eV) and is typically divided into three spectral bands: UV-A (400–320 nm), UV-B (320–280 nm), and UV-C (280– 10 nm). The Sun is the most significant natural UV source. The approximate solar radiation spectrum just outside Earth’s atmosphere, calculated as black body radiation at 5800 K using Plank’s law, is shown in Fig. -
Photoconductivity
INSTRUCTIONAL MANUAL Photoconductivity Applied Science Department NITTTR, Sector-26, Chandigarh 0 EXPERIMENT: To study the Photoconductivity of CdS photo-resistor at constant irradiance and constant voltage a. To plot the current- voltage characteristics at constant irradiance. b. To measure photocurrent IPh as a function of irradiance at constant voltage. APPARATUS: Lamp housing, adjustable slit, polarizer, analyzer, two convex lens, photo- resistor, multimeter, an optical bench with fixing mounts. THEORY: Photoconductivity is an optical and electrical phenomenon in which a material become more electrically conductive due to the absorption of electromagnetic radiation such as visible light, ultraviolet light, infrared light, or gamma radiations. It is the effect of increasing electrical conductivity in a solid due to light absorption. When the so-called internal photo effect takes place, the energy absorbed enables the transition of activator electrons into the conduction band and the charge exchange of traps with holes being created in the valence band. In the process, the number of charge carriers in the crystal lattice increases and as a result, the conductivity is enhanced. When light is absorbed by a material such as a semiconductor, the number of free electrons and electron holes changes and raises its electrical conductivity. To cause excitation, the light that strikes the semiconductor must have enough energy to raise electrons across the band gap. When a photoconductive material is connected as part of a circuit, it functions as a resistor whose resistance depends on the light intensity. In this context the material is called a photoresistor. Fig.1 depicts the current flow in a Fig.1 Working of a photoresistor photoresistor when exposed to light rays.