OFFICIAL MEETING GUIDE & EXHIBITOR INFORMATION

Exhibitor Guide Included!

August 5-9, 2018 Baltimore, MD

www.microscopy.org/MandM/2018 See the Unseen at Hitachi Booth #1125

A Brand-New FE-SEM Is Coming! Hitachi is to debut its new model of FE-SEM at M&M 2018. Don't miss this opportunity to explore the innovation! To Be Unveiled at M&M 2018!

Schedule a demo in advance: [email protected]

HT7800 Series Ethos NX5000 120 kV TEM FIB-SEM The NEXT generation of modern Ultra-high resolution imaging and Transmission Electron Microscopes elemental analysis at low voltages

*not available for live demo

SU3500 & FlexSEM 1000 Regulus Series TM4000 ArBlade 5000 ZONE II Specimen Atomic Force Variable-Pressure SEMs Field-Emission SEMs Tabletop SEM Ion-Milling System Cleaner Microscopes

www.hitachi-hightech.com/us [email protected] 1-800-253-3053 © 2018 Hitachi High Technologies America, Inc. All rights reserved.

2018-07July-MMMeetingGuide-veil.indd 1 5/16/2018 2:38:27 PM Future Meeting Dates

2019 August 5-9, 2018 Baltimore, MD

August 4–8 Portland, OR QUESTIONS? Questions regarding the technical content of the meeting or regarding specific sessions may be directed to:

2018 Program Chair August 2-6, 2020 Yoosuf Picard, Carnegie Mellon University MILWAUKEE, WI [email protected] Registration opened March 1, 2018. Please direct questions regarding registration to: [email protected]

Questions regarding exhibits and exhibitors may be directed to: [email protected]

Questions regarding sponsors or sponsorships August 1-5, 2021 may be directed to: [email protected] PITTSBURGH, PA Please direct all other meeting-related questions to: [email protected]

ARE YOU A MEMBER? Join Today and Save on M&M 2018 Registration Fees! July 31-August 4, 2022 Visit http://microscopy.org to join the Microscopy Society of PORTLAND, OR America online, or call 1-800-538-3672 for more information about the benefits of MSA membership.

Visit http://microanalysissociety.org to join the Microanalysis Society and find out information about MAS July 23-27, 2023 membership benefits. MINNEAPOLIS, MN Visit http://www.msc-smc.org for membership information on the Microscopical Society of Canada / Société de Microscopie du Canada.

MICROSCOPY & MICROANALYSIS 2018 MEETING || AugustAugust 5-95-9 || Baltimore,Baltimore, MDMD 3 Falcon 3EC and Glacios for cryo-EM single particle analysis Proven technology for fast 3D structures

Cryo-EM structure of Apoferritin.

The Thermo Scientific™ Falcon™ 3EC direct electron detector features electron counting capabilities that enable the highest sensitivity (DQE). Fully integrated within the Thermo Scientific Glacios™ Cryo-TEM, this combination provides access to cryo-electron microscopy—all within a footprint that fits any lab.

Find out more at thermofisher.com/EM-Sales

© 2018 Thermo Fisher Scientific Inc. All rights reserved. All trademarks are the property of Thermo Fisher Scientific and its subsidiaries unless otherwise specified. On behalf of the Microscopy Society of America, the Microanalysis Society, and the CONTENTS Microscopical Society of Canada (Société de Microscopie du Canada) we invite you to join us August 5-9 in Baltimore, Maryland for Microscopy & Microanalysis 2018. 3 Future Meeting Dates ...... Baltimore and its famous Inner Harbor promise to be an exciting venue that provides ample opportunity for all to visit with old friends and to meet new colleagues with Welcome from Society Presidents . . . 5 a common interest in microscope development and applications. The Inner Harbor also features many stellar attractions for families, including the National Aquarium Sponsors & Advertiser Index ...... 6 and Maryland Science Center, the historic tall ships and U.S. Navy and Coast Guard museum vessels, and the many great dining opportunities, both on land and sea Registration ...... 8 (harbor dinner cruises). We hope that many of you will be able to bring your families along to enjoy all that Charm City and its region have to offer. 10 Essential Meeting Information . . . . . The Program Committee, led by Yoosuf Picard, Alice Dohnalkova, James LeBeau and Nabil Bassim, has developed a comprehensive and exciting group of Symposia Convention Center Map ...... 12-13 led by leaders in their respective fields of microscopy and analysis. As a group, the Symposia capture our members’ diverse fields of research, including Advances in Social Events ...... 14 Instrumentation and Techniques Development, and Applications in the Biological and Physical Sciences. We encourage you to scan through this Call for Papers for Hotel, Travel & City Information . . . 16 a complete list of Symposia, and contribute to the program by submitting one or more scientific papers to the meeting. Presentations will include a range of platform Meetings & Events Schedule . . . 18, 20 and posters. New to our meeting this year will be provision of a small table for each poster presentation, which will allow presenters to use a laptop or other digital media MSA MegaBooth ...... 22 format to present animations and movies of their data to enhance their presentations. The leadership of our Societies and the Program Committee feel that with the Highlights & Awards ...... 23 advancement of three-dimensional reconstruction and other techniques that are best illustrated by these modern dynamic styles, this will provide a unique opportunity for Week-At-A-Glance ...... 25-31 many poster presenters to fully illustrate their data. The meeting itself will be preceded by our usual array of Sunday Short Courses, three Friday, August 4 ...... 25 Pre-Meeting Congresses, and our Sunday evening Opening Reception that provides Saturday, August 5...... 25 an opportunity to network with colleagues and friends. Following the success of the Inaugural Pre-Meeting Congress in St. Louis led by our Early-career Professionals and Sunday, August 6 ...... 25 Student Council, we will again have a Pre-Meeting Congress featuring the outstanding work done by students and post-doctoral Fellows attending the meeting. If you are Monday, August 7 ...... 25 an early-career scientist, please consider contributing to this Pre-Meeting Congress. Tuesday, August 8 ...... 26 The technical program will kick off with our annual Monday morning plenary session, featuring the major awards ceremonies for the sponsoring societies, the M&M meeting Wednesday, August 9 ...... 29 awards, and two exciting plenary talks. One plenary talk will be by Manu Prakash, inventor of the foldscope that has brought imaging to remote regions of the world for imaging of Thursday, August 10 ...... 31 parasites and a range of diseases. The second plenary will be by Jon Larsen, author of “In Search of Stardust: Amazing Micrometeorites and Their Terrestrial Imposters” that provides 33-51 Exhibitor Directory ...... amazing microscopy of micrometeorites found in common locations such as rooftops.

Product & Services Index ...... 52-59 The M&M meeting also showcases the largest annual exhibition in microscopy and features the latest state-of-the-art instrumentation and accessories in microscopy and microanalysis. Educational opportunities throughout the week include tutorials Exhibitor List - By Booth ...... 60 covering select topics in physical and biological sciences, educational outreach sessions for students and teachers, our Technologists’ Forum, and our ever-popular Exhibitor List - By Name...... 62 vendor tutorials, held Monday through Wednesday after the Exhibit Hall closes.

Exhibit Hall Diagram ...... 64-65 M&M 2018 is an opportunity to stay abreast of the latest technologies, hear about new developments in the techniques and applications of all areas of microscopy and microanalysis, and most importantly network with colleagues. We hope to see you in Baltimore!

Robert Price Masashi Watanabe Joaquin Ortega President, President, President, Microscopical Microscopy Society Microanalysis Society Society of Canada / Société of America de Microscopie du Canada

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 5 ™ * SPONSORS Nion U-HERMES -S * New for 2018 Nion Iris Ultra-High Energy Resolution Monochromated EELS-STEM *Spectrometer with Side-entry stage Ultra-high optical performance 0.6 Å spatial resolution at 200 kV 5 meV energy resolution at 30 kV / 6 meV at 60 kV Microscopy Products for Science and Industry * Ultra-flexible cooling, heating, etc. sample holders HREM ultra-stable EELS* optimized for low and high losses Research Inc. * UHV reachable at the sample with side-entry stage * powerful Python-based open-source software as of 5/31/18 Fourier- Filtered Medium-angle annular dark field MAADF,30 kV (MAADF) monochromated 0.5 nm STEM image of graphene. Arrows in FFT mark (1.07 Å)-1 δE ~ 100 meV, V = 30 kV. INDEX TO ADVERTISERS 0 Side-entry *stage with ADVERTISER AD LOCATION liquid N2 Applied Beams Page 33 sample HAADF image of Au Bruker Nano GmbH Page 61 rod nanoparticles, 200 kV, sample at liquid N CRYTUR, spol. s r.o. Page 35 2 temperature. Diatome Page 19 Duniway Stockroom Page 37 EDAX Page 15 Aloof vibrational EEL C3-C5 FFT Electron Microscopy Sciences Cover 4 aberration specturm of ice adsorbed onto an ExpressLO LLC Page 38 corrector h-BN flake, V = 100 kV. Gatan Inside Back Cover 0 Hitachi Inside Front Cover ICDD Page 41 h-BN IXRF Systems Page 11 LO phonon JEOL Page 32 counts Kammrath and Weiss Technologies Page 17 NION Page 7 Intensity ~0.001 1 20meV from Ice Phenom World Page 49 ZLP Maximum O-H stretch Photonics Media Page 66 Monochromated EELS Ted Pella Page 9 Zero Loss Peak (ZLP), 5.0 meV Tescan Page 63 V = 30 kV, acquisition 0 100 200 300 400 Thermo Fisher Scientific Page 4 Ground time = 100 msec. Energy Loss (meV) potential XEI Scientific Page 51 monochromator Normalized Intensity 0 ZEISS Page 21 -20 -10 0 2010 Energy Deviation dE (meV) as of 5/31/18

6 www.microscopy.org/MandM/2018 for up-to-date meeting information See us at Booth 1338 Nion U-HERMES™-S* * New for 2018 Nion Iris Ultra-High Energy Resolution Monochromated EELS-STEM *Spectrometer with Side-entry stage Ultra-high optical performance 0.6 Å spatial resolution at 200 kV *5 meV energy resolution at 30 kV / 6 meV at 60 kV Ultra-flexible cooling, heating, etc. sample holders ultra-stable EELS* optimized for low and high losses * UHV reachable at the sample with side-entry stage * powerful Python-based open-source software

Fourier- Filtered Medium-angle annular dark field MAADF,30 kV (MAADF) monochromated 0.5 nm STEM image of graphene. Arrows in FFT mark (1.07 Å)-1

δE ~ 100 meV, V0 = 30 kV. Side-entry *stage with liquid N2 sample HAADF image of Au rod nanoparticles, 200 kV, sample at liquid N2 temperature.

Aloof vibrational EEL C3-C5 FFT aberration specturm of ice corrector adsorbed onto an h-BN flake, V0 = 100 kV.

h-BN LO phonon counts

Intensity ~0.001 1 20meV from Ice ZLP Maximum O-H stretch Monochromated EELS Zero Loss Peak (ZLP), 5.0 meV V = 30 kV, acquisition 0 100 200 300 400 Ground time = 100 msec. Energy Loss (meV) potential monochromator Normalized Intensity 0 -20 -10 0 2010 Energy Deviation dE (meV) See us at Booth 1338 AR YE S O 50 F

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E E you to register in advance! C years VISIT US AT M&M 2018 ▪ AUGUST 5-9 ▪ BALTIMORE, MD ▪ BOOTH #1012 E • For the most up-to-date registration information, visit http://www.microscopy.org/MandM/2018/ S T. 19 6 8 • Registration can be done either online at: http://www.microscopy.org/MandM/2018/registration or on-site at the meeting registration desk. We encourage you to register in advance and as early as possible. • Register by June 25 (early deadline) and save $100! • Member rates apply to all members (MSA, MAS, MSC-SMC). Membership will be verified.

ATTENTION SPEAKERS and Onsite Registration Desk AWARDEES! Baltimore Convention Center New reimbursement policies for 2018 PELCO easiGlow™ PELCO BioWave® Pro+ Cressington Coating Systems PELCO® Modular SEM Pick up your badge and materials at the Registration desk are in place. Starting this year, no Glow Discharge Cleaning System Microwave Tissue Processor Carbon Evaporation, Metal Sputtering Holders & Mounts according to the schedule below. The Sunday Social starts at reimbursement cash or checks will be 6:30 pm in the Ballroom (4th Level of the Convention Center). distributed onsite at the meeting. Turn in your completed reimbursement form onsite or send it post-meeting. Registration Hours: Checks will be mailed (for U.S.-based Thursday, August 2* 3:00 pm – 5:00 pm participants) on first-come, first- Friday, August 3* 8:00 am – 1:00 pm served basis. Electronic payments (for ® Friday, August 3 1:00 pm – 6:00 pm non-U.S.-based participants) will be NEW Quantifoil processed post-meeting. TEM Substrates Saturday, August 4 8:00 am – 6:00 pm NEW SBEM Tools & Supplies Sunday, August 5 7:00 am – 7:30 pm FEI VolumeScope Pin Stub, Storage, Monday, August 6 7:00 am – 6:00 pm Tweezers & Colloidal Silver Paint Tuesday, August 7 7:30 am – 5:00 pm M&M 2018 Wednesday, August 8 7:30 am – 5:00 pm plenary sessions begin Thursday, August 9 7:30 am – 3:00 pm on Monday, August 6 Exhibitors Only * at 8:30 AM. Symposia end

on Thursday, August 9 Commercial Exhibition Hours: at 5:00 PM. Please plan Cryo-EM Tools & Accessories Monday, August 6 12:00 pm – 5:30 pm your travel accordingly! Large Dewars, Foam Dewars, NEW Products for Specimen Thinning Tuesday, August 7 10:00 am – 5:30 pm Grid Boxes & Grippers in Preparation for Electron Microscopy Wednesday, August 8 10:00 am – 5:30 pm Thursday, August 9 10:00 am – 2:00 pm Exhibitor Move-In: M&M 2018 Vendor Tutorial WIN $50 OFF YOUR NEXT ORDER! Thursday, August 2* 8:00 am – 4:00 pm Join us Tuesday, August 7 at 5:45pm, Booth #1012

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® G E Friday, August 3 8:00 am – 4:30 pm X N I C PELCO BioWave Pro+ Assisted T E

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Saturday, August 4 E Serial Block-Face SEM (SBEM) C years GIFTFIFTY CERTIFICATE DOLLAR E GIFTFIFTY CERTIFICATE DOLLAR Sunday, August 5 8:00 am – 4:30 pm S T. 19 6 8 SBEM requires extended sample processing protocol taking over 123456 Targeted Island Booths Only Microscopy Products for Science and Industry * 5 days to perform. However, using the PELCO BioWave® Pro+, the entire process can now be completed in under a day with identical Visit us at M&M 2018, and enter to win one of Exhibitor Move-Out: results in the SBEM to sample by the standard long protocol. fifty gift certificates for $50 off your next order. Thursday, August 9 2:00 pm – 7:00 pm Images: Rick Webb, University of Queensland Friday, August 10 8:00 am – 5:00 pm

Microscopy Products for Science and Industry 8 www.microscopy.org/MandM/2018 for up-to-date meeting information www.tedpella.com [email protected] 800-237-3526 AR YE S O 50 F

G E N X I C Providing microscopy supplies and specimen preparation REGISTRATION INFORMATION T E A L

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E E C years VISIT US AT M&M 2018 ▪ AUGUST 5-9 ▪ BALTIMORE, MD ▪ BOOTH #1012 E S T. 19 6 8

PELCO easiGlow™ PELCO BioWave® Pro+ Cressington Coating Systems PELCO® Modular SEM Glow Discharge Cleaning System Microwave Tissue Processor Carbon Evaporation, Metal Sputtering Holders & Mounts

NEW Quantifoil® TEM Substrates NEW SBEM Tools & Supplies FEI VolumeScope Pin Stub, Storage, Tweezers & Colloidal Silver Paint

Cryo-EM Tools & Accessories Large Dewars, Foam Dewars, NEW Products for Specimen Thinning Grid Boxes & Grippers in Preparation for Electron Microscopy

M&M 2018 Vendor Tutorial WIN $50 OFF YOUR NEXT ORDER! Join us Tuesday, August 7 at 5:45pm, Booth #1012

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® G E N X I C PELCO BioWave Pro+ Assisted T E

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E Serial Block-Face SEM (SBEM) C years GIFTFIFTY CERTIFICATE DOLLAR E GIFTFIFTY CERTIFICATE DOLLAR S T. 19 6 8 SBEM requires extended sample processing protocol taking over 123456 Microscopy Products for Science and Industry 5 days to perform. However, using the PELCO BioWave® Pro+, the entire process can now be completed in under a day with identical Visit us at M&M 2018, and enter to win one of results in the SBEM to sample by the standard long protocol. fifty gift certificates for $50 off your next order. Images: Rick Webb, University of Queensland

Microscopy Products for Science and Industry www.tedpella.com [email protected] 800-237-3526 Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contam- ination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contami- nant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass ESSENTIAL MEETING & Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi caiton • Geological • Meteorites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • VENUE INFORMATION Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi cation • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantita- tive Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis • Archeology • Museums • Artifacts • Currency • Metals • Alloys • Accessibility Job & Resume Postings/ Proceedings Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical If you require special accommodation in Conference Proceedings are Placement Office lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • order to participate fully in the meeting, (See MSA MegaBooth info on Page 22) distributed at Registration. All Full Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder please ask to speak with the meeting Post your company’s or department’s job Meeting registrations include a free manager, or email MeetingManager@ copy of the proceedings on digital Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for listing, peruse posted resumes for that Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun microscopy.org. Requests made after perfect job candidate, or post your own medium. Hard-copy proceedings are Shot Residue • Material identi caiton • Geological • Meteorites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock July 1 or onsite at the meeting will be resume. Take advantage of thousands of available for purchase ($95) through accommodated as much as possible. Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • microscopists and microscopy companies Cambridge University Press (allow all gathered in one place! Go to the MSA 12-16 weeks for delivery). Inquire Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharma- Awards MegaBooth (Exhibit Hall) for details. at the Registration Desk or email: ceuticals • Contaminant identi cation • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Major Society Awards for MSA, MAS, [email protected]. Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coast- and MSC-SMC, along with M&M ings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • M&M 2019 – Meeting & RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • student awards, will be presented at the MAS Booth Plenary Session immediately following City Information Electronic Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental MAS has a membership and information the first Keynote Talk (Monday morning). Stop by for advance information on the Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne booth located in the main registration For detailed listings of all awards, 2019 M&M Meeting in Portland, Oregon! foyer. Sign up for membership, get Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi caiton • Geological • Meteor- criteria, and award winners, please visit The 2019 table is located in the main information on Society events at or afterites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals http://microscopy.org/MandM/2018/. registration area, and has visitors guides, and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • maps, and other important information the M&M Meeting, and find out all it Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi cation • Raw Material Compo- about the City of Roses. has to offer. Cancellation and sition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Refund Policy Smoking Policy Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • MSA MegaBooth Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Refund requests received prior to July M&M 2018 is a smoke-free meeting. If Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant 13, 2018 will be honored less a $65 (Booth #1329) you wish to smoke, you will need to go (See complete details on Page 22) administrative fee. No refunds will be outside (street level). Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packag- issued for cancellations (for any reason) Check out all that MSA has to offer its ing • Soil Contamination • Material Charac • Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings received on or after July 13, 2018, and members and M&M attendees: Free Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS no refunds will be issued on-site in Internet Café, book display from scientific Tote Bags applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic All non-Exhibitor Full Meeting Baltimore. E-mail: MMRegistration@ publishers, updated information on the Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Registrants are entitled to a meeting conferencemanagers.com. Certification Board, and a DVD Library. Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air tote bag. Bags are distributed in the Register for the popular Vendor Tutorials, Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi caiton • Geological • Meteorites • Phase registration area. sign up for MSA Membership, check out boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Food for Purchase recent editions of Microscopy Today, Inexpensive, portable breakfast and Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • learn about Project MICRO, and join the snack items are available for purchase Volunteer Room Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi cation • Raw Material Composition • Technologists’ Forum. The volunteer & student bursary in the convention center on the ground QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis • Archeology • Muse- office is in the 300 Show Office on the level (7:30 am – 10:30 am). Lunch ums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedi- Registration level. Check in here for concessions are available for purchase Phone Numbers & cal Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • volunteer assignments and sign-outs. inside the exhibit hall during lunch Information Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identi cation • hours (11:00 am – 2:00 pm). • Baltimore Convention Center Main: RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contam- (410) 649-7000 ination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections Baltimore & Regional • Exhibitor Services: http://www. • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi caiton • Geological • Meteorites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Visitor Information bccenter.org/index.php?target=74 Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Stop by the Visit Baltimore booth • Concentra Urgent Care: (410) 752-3010 Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • located inside the convention center, (M-F 8a-5p); www.concentra.com Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi cation • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • to pick up local information, including • Emergency Room (24 hours): Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • maps, dining guides and tour info, and University of Maryland Medical Center: Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • visitor information on Baltimore and (800) 492-5538 Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • surrounding areas. Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Internet & E-mail Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi c- Free wireless internet is available for aiton • Geological • Meteorites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • M&M attendees in the Baltimore Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Convention Center. Check your email Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi ca- and surf the web at the Internet Café tion • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • inside the M&M exhibit hall during Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics exhibit hours (located next to the MSA MegaBooth). For more information on the MegaBooth, see page 22. August 5-9, 2018 Baltimore, MD

10 www.microscopy.org/MandM/2018 for up-to-date meeting information Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contam- ination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contami- nant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass ESSENTIAL MEETING & Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi caiton • Geological • Meteorites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • VENUE INFORMATION Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi cation • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantita- tive Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis • Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi caiton • Geological • Meteorites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharma- ceuticals • Contaminant identi cation • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coast- ings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi caiton • Geological • Meteor- ites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi cation • Raw Material Compo- sition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packag- ing • Soil Contamination • Material Charac • Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi caiton • Geological • Meteorites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi cation • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis • Archeology • Muse- ums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedi- cal Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contam- ination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi caiton • Geological • Meteorites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi cation • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical lters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identi cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identi c- aiton • Geological • Meteorites • Phase boundaries • Mineral identi cation • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi ca- tion • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics BALTIMORE CONVENTION CENTER

CONWAY STREET Level 1

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Unless indicated otherwise, all official conference events are being held at the Baltimore Convention Center, located in downtown Baltimore, Maryland.

12 www.microscopy.org/MandM/2018 for up-to-date meeting information BALTIMORE CONVENTION CENTER

Level 4 CONWAY STREET

The Baltimore Convention Center Ballroom is the location for the VIP Sunday Evening Welcome WEST Reception on Sunday, August 5, FOOD SERVICE/KITCHEN and also the location for the Opening Plenary Session, on Monday, August 6. S

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MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 13 SOCIAL EVENTS

M&M 2018 Sunday Evening Social Event Micrograph Competition Baltimore Convention Center – Ballroom Level (4th floor) This micrograph competition promotes the innovative SUNDAY, AUGUST 5 | 6:30 PM - 9:00 PM blending of art and science. Open to all forms of One ticket is included with most registrations (see microscopic imaging, this year, winners of of this Registration Page for details). Additional tickets: $50 competition will be selected by popular vote! A each for adults; $25 each for children 12 and under. maximum of three (3) cash awards will be presented. *PLEASE NOTE: Onsite availability of tickets is not guaranteed. Register for the meeting and buy extra tickets early to be sure Winners and runners-up will have the chance to see that you’re able to attend. their work published in a conference brochure for M&M NEW FOR 2018: This year’s welcome event at the Baltimore 2019! Submit a Micrograph Contest (get at link below), Convention Center will be a fun and informal entry form and then bring your best get-together. Enjoy a delicious supper buffet work to Baltimore and post it on the contest board! and local brews; and catch up with friends and Boards for posting your work will be in the M&M 2018 colleagues. After the reception, grab some old registration area. For competition rules and details, go to: https://www.microscopy.org/MandM/2018/ and new friends and head down to the Inner meetings/apply_award.cfm. Harbor/Harborplace areas to continue the fun!

Student Poster Awards MAS Social Event – (Immediately following daily Poster Presentations & Happy Hours!) for MAS Members Only! Poster presentations are an excellent format for all - WEDNESDAY, AUGUST 8 | 6:30 PM 9:00 PM participants to engage in intensive discussion with other Stop by the MAS booth in the lobby to check researchers in the field. MSA provides cash awards to your membership status and pick up your the most outstanding student posters (first author) each ticket for the MAS social event on Wednesday day (up to two in each of three categories). Student evening, August 8 – immediately following the poster awards will be presented immediately following MAS Business Meeting. each day’s poster session, in the Exhibit Hall.

14 www.microscopy.org/MandM/2018 for up-to-date meeting information The velocity for stellar results SOCIAL EVENTS

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HOTEL, TRAVEL & CITY INFORMATION

HOTELS & RESERVATIONS The open reservations portal, as well as the most current listing of available hotels and rates, is available at: http://www.microscopy.org/ MandM/2018/hoteltravel/hotel.cfm Book your room through the M&M 2018 Housing Bureau, and get an immediate reservation confirmation. A valid credit card is required to Getting To & Around Baltimore reserve a room. The Baltimore-Washington International (BWI) Maps showing the location of the hotels and convention center are Thurgood Marshall Airport is located only available on the Visit Baltimore website and are downloadable from: 10 miles (roughly 20 minutes by car) from https://baltimore.org/neighborhoods-maps. downtown Baltimore. The airport features free Wi-Fi, guest services information and Turn your ideas n assistance center, and several restaurants, Ground Transportation e stores, and personal-services outlets. CAR/VAN/SHUTTLE: Visit http://bwiairport.com for detailed m s www.bwiairport.com/to-from-bwi/transportation for detailed i e information about the airport. c information on taxi service, limousine service, and scheduled shuttle into reality g e a service fees and schedules. p t MORE BALTIMORE TRAVEL INFO: S S For detailed attraction, tour, dining and travel information for visitors, please go to the Visit Baltimore website at www.baltimore.org. s re HOTEL MAP 1. Baltimore Marriott Inner Harbor at Camden Yards tu 2. Days Inn Baltimore Inner Harbor ra 3. Holiday Inn Inner Harbor ep 4. Lord Baltimore Hotel em T 5. Renaissance Harborplace ls Materia g 4 Testin

1 3 2 5

Inner Harbor

Visit us at booth Kammrath and Weiss Technology / Islip, USA USA / Islip, Technology Weiss and Kammrath 516-313-9742 +1 Phone: Email: [email protected] 211

16 www.microscopy.org/MandM/2018 for up-to-date meeting information www.kammrath-weiss.com Turn your ideas n e m s i e into reality c g e a p t S S

s re u at ep r m Te ls Materia g Testin

Visit us at booth Kammrath and Weiss Technology / Islip, USA USA / Islip, Technology Weiss and Kammrath 516-313-9742 +1 Phone: Email: [email protected] 211

www.kammrath-weiss.com MEETING SCHEDULE As of July 1. Please check the onsite program or your committee chair/liaison to confirm.

All events held at Baltimore Center Convention Center unless otherwise noted.

Friday, August 3, 2018 TIME LOCATION MSA Council 8:30 AM Room 338

Saturday, August 4, 2018 TIME LOCATION MSA Council 8:30 AM Room 338

Sunday, August 5, 2018 TIME LOCATION MAS Council 9:00 AM Room 338 MSC-SMC Council Meeting 12:00 PM Room 334 Microscopy Today Editors & Editorial Board 3:00 PM Room 332 Sunday Welcome Reception 6:30 PM Ballroom I-II (4th level)

Monday, August 6, 2018 TIME LOCATION Technologists’ Forum Board 7:15 AM Room 334 MSA Awards + Fellowship Committees 7:15 AM Room 330 FIG Pharma Lunch Workshop on Data Integrity 12:15 PM Rooms 335-336 MaM Editorial Board 12:15 PM Room 340 MAS Meal with a Mentor 12:15 PM Room 339 FIG: Diagnostic Microscopy 12:15 PM Room 330 FIG: Focused Ion Beam 12:15 PM Room 331 FIG: Atom Probe Field Ion Microscopy 12:15 PM Room 334 International Committee 12:15 PM Room 333 Technologists’ Forum Business Meeting 3:30 PM Room 334 MSA-CUP Elements Committee 4:15 PM Room 333

Student Mixer 5:30 PM Rooms 339-340

Vendor Tutorials in the Exhibit Hall (Sign Up at MSA MegaBooth) 5:45 - 6:45 PM Exhibit Hall

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P.O. Box 550 • 1560 Industry Rd. • Hatfield, Pa 19440 Tel: (215) 412-8390 • Fax: (215) 412-8450 email: [email protected] or [email protected] www.emsdiasum.com MEETING SCHEDULE MEETING SCHEDULE As of July 1. Please check the onsite program or your committee chair/liaison to confirm.

All events held at Baltimore Center Convention Center unless otherwise noted.

Tuesday, August 7, 2018 TIME LOCATION MSA Local Affiliated Societies & MAS Affiliated Regional Societies 7:15 AM Room 330 M&M 2019 – Program Planning for Symposium Organizers 10:00 AM Room 329 MSC-SMC Business Meeting 12:15 PM Room 347 FOM FIG Lunch Meeting 12:15 PM Room 330 MSA Distintuished Scientist Awardees' Lectures 12:15 PM Room 337 Microscopy Today Editorial Board Meeting 12:15 PM Room 323 FIG: Cryo-preparation 12:15 PM Room 333 FIG: Electron Microscopy in Liquids and Gases 12:15 PM Room 331 FIG: Electron Crystallography 12 :15 PM Room 334 FIG: MicroAnalytical Standards 12:15 PM Room 332 FIG: 3D EM in the Biological Sciences 3:30 PM Room 321 MSA Education Committee Meeting 3:30 PM Room 334 FIG Business Meeting 3:30 PM Room 333 Post-Doctoral Researchers’ Reception 5:30 PM Room 330 MSA Student Council 5:30 PM Rooms 331-332 Vendor Tutorials in the Exhibit Hall (Sign Up at MSA MegaBooth) 5:45 – 6:45 PM Exhibit Hall Presidents’ Reception (Invitation Only) 6:30 PM Offsite

Wednesday, August 8, 2018 TIME LOCATION MSA Certification Board 7:15 AM Room 333 MSA Membership Committee 7:15 AM Room 334 MSA Members’ Meeting 12:15 PM Rooms 343-344 MAS Business Meeting 5:15 PM Room 337 Vendor Tutorials in Exhibit Hall (Sign up at MSA MegaBooth) 5:45 PM – 6:45 PM Exhibit Hall MAS Members Social (See MAS Booth for Details) 6:30 PM Offsite

Thursday, August 9, 2018 TIME LOCATION M&M Sustaining Members 8:30 AM Room 330 MSA Standards Committee Meeting 12:15 PM Room 333 M&M 2018 Wrap-Up & Debrief (by invitation only) 4:30 PM Room 330

20 MEETING SCHEDULE The moment “I think” becomes “I know”. This is the moment we work for.

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www.zeiss.com/microscopy/mm MSA MegaBooth in the Open during all Exhibit Hall exhibit hall hours

The MSA MEGABOOTH showcases all that MSA Check out the BOOK DISPLAY – publisher-donated books, divided into a member, stop by to catch up on all the new biological/physical topics. Several new society developments. Member information titles added every year! Come and browse available at Regular, Sustaining (corporate), and the newest titles. Student levels. CERTIFICATION BOARD – Find out about Sign up for VENDOR TUTORIALS here! These MSA’s certi cation program for Electron popular sessions are presented on Monday, Microscopy Technologists and how being Tuesday, and Wednesday evenings after the certi ed can help you in your next job search! exhibit hall has closed for the day. Don’t miss out – advance registration is required! MICROSCOPY TODAY and MICROSCOPY and The INTERNET CAFÉ and PHONE CHARGING MICROANALYSIS are the society’s two STATION are open to all meeting attendees publications – one a magazine format, the during all exhibit hall hours. Bring Your Own other a peer-reviewed scienti c journal. Device! Lots of places to sit and rest your feet Information for authors and advertisers is for a few minutes while you charge your available here. mobile phone, check your email, put the nishing touches on your talk, or collaborate EDUCATIONAL OUTREACH – Includes MSA’s with colleagues. educational outreach program. Browse the materials and nd out how to start an outreach The TECHNOLOGISTS’ FORUM (TF): Attention program in your local area. Get details on the special programming at the M&M meeting for grow and develop your skills, your professional educators and kids of all ages. career, and your network by joining the Forum! Visit the updated Project MICRO display to The PLACEMENT OFFICE is MSA’s job-listing service. Post a job, peruse job listings, post a learn about this organization's education and outreach goals. for your job opening. All for FREE during the meeting!

For more information, visit http://microscopy.org 22 www.microscopy.org/MandM/2018 for up-to-date meeting information http://microscopy.org/MandM/2014 for program details [23] HIGHLIGHTS & AWARDS

MSA Major Society Plenary Session Award Winners

MONDAY, AUGUST 6, 2018 BURTON MEDAL Ballroom (4th Level) – Baltimore Convention Center Lena Kourkoutis, Cornell University, Ithaca, NY For speaker bios and presentation details, visit www.microscopy.org/MandM/2018/program/plenary.cfm ALBERT CREWE AWARD Timothy Pennycook, Max Planck Institute for Solid State Research, Germany

MASER DISTINGUISHED SERVICE AWARD Donovan Leonard, Oak Ridge National Laboratory, Oak Ridge, TN

HILDEGARD H. CROWLEY AWARD FOR Manu Prakash, PhD Jon Larsen OUTSTANDING TECHNOLOGIST, BIOLOGICAL SCIENCES Stanford University, Project Stardust; Jazz Guitarist, Anchi Cheng, New York Structural Biology Stanford, CA Composer, Surrealist Painter, Center, New York, NY Every Child in the World Author, Citizen Scientist Using Microscopy to Find CHUCK FIORI AWARD FOR OUTSTANDING Should Carry a Microscope TECHNOLOGIST, PHYSICAL SCIENCES in Their Pocket Stardust Anywhere Chengyu Song, Lawrence Berkeley National Laboratory, Berkeley, CA

MAS Major Society MSA Distinguished Scientist Award Winners PRESIDENTIAL SCIENCE AWARD Awards & Talks M. Grace Burke, University of Manchester, UK DISTINGUISHED SCIENTIST – PHYSICAL SCIENCES Yimei Zhu, Brookhaven National Laboratory, Upton, NY PRESIDENTIAL SERVICE AWARD Vernon Robertson, JEOL, Peabody, MA DISTINGUISHED SCIENTIST – BIOLOGICAL SCIENCES Richard D. Leapman, National Institutes of Health, Bethesda, MD PETER DUNCUMB AWARD FOR EXCELLENCE IN MICROANALYSIS Richard Leapman, National Institutes of Health, Bethesda, MD

KURT F.J. HEINRICH AWARD Yoosuf Picard, Carnegie Mellon University, Pittsburgh, PA

BIRKS AWARD Weizong Xu, North Carolina State University, Durham, NC

MACRES AWARD Daan Hein Alsem, Hummingbird Scientific, Lacey, WA

COSSLETT AWARD Ivan Pedro Lobato Hoyos, University of Antwerp, Belgium FIRST PLACE 2017 SECOND PLACE 2017 MSA Micrograph Competition MSA Micrograph Competition CASTAING AWARD Broken Flowers: Twisted Centers: Timothy Pegg, Prashant Kumar, Miriam Hiebert, University of Maryland, University of Minnesota Miami University (OH) College Park, MD

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 23 Electron Microscopy Excellence

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Arm200F Microscopy Today.indd 1 5/18/18 10:12 AM All events at the Baltimore Convention Center unless otherwise indicated.

Friday, August 3 ROOM 8:30 am MSA Council 338 Saturday, August 4 8:30 am MSA Council 338

8:30 am – 5:00 pm Pre-Meeting Congress X60 - Pre-Meeting Congress for Students, Post-Docs, and Early-Career Professionals in 345-346 Microscopy and Microanalysis Sunday, August 5

8:30 am – 5:00 pm Sunday Short Courses

X10 - Exploring Cryo-Preparation Techniques for Biological Samples 321 AT-A-GLANCE WEEK X11 - Advanced Focused Ion Beam Methods 322 X12 - Practical Considerations for Image Analysis and ImageJ and Clemex Vision 323 X13 - SerialEM for EM Data Acquisition 324 X14 - Sample Preparation for High-resolution EM of Materials 325 X15 - Introduction to SEM with EDS: Imaging and Compositional Analysis 326 X16 - Multivariate Methods and Image-processing for Quantitative Microscopy 330

8:30 am – 5:00 pm Pre-Meeting Congresses X61 - Standards and Reference Materials for Microanalysis 347-348

X62 - Practical Challenges and Opportunities for in situ/operando Microscopy in Liquids and Gases 345-346

9:00 am MAS Council 338 12:00 pm MSC-SMC Council Meeting 334 3:00 pm Microscopy Today Editors 332 6:30 pm Sunday Welcome Reception Ballroom I-II (4th Level) Monday, August 6 7:15 am MSA Awards + Fellowship Committees 330 7:15 am Technologists’ Forum Board 334 8:30 am – 12:00 pm M&M 2018 Plenary Sessions Ballroom III-IV (4th Level) Opening Welcome Plenary Talk #1: Jon Larsen Project Stardust; Jazz Guitarist, Composer, Surrealist Painter, Author, Citizen Scientist Using Microscopy to Find Stardust Anywhere

MAS Awards Presentation

MSC-SMC Awards Presentation Coffee & Donuts Break Ballroom Foyer (4th Level) MSA Awards Presentation

M&M Meeting Awards Presentation Plenary Talk #2: Manu Prakash, PhD Stanford University, Stanford, CA Every Child in the World Should Carry a Microscope in Their Pocket

12:00 pm – 1:30 pm Lunch Break 12:00 pm – 5:30 pm Exhibit Hall Open Halls E-F-G (Lower Level) 33 http://microscopy.org/MandM/2018 25 Monday, August 6 (Cont’d.) ROOM 12:15 pm MaM Editorial Board 340 12:15 pm MAS Meal with a Mentor 339 12:15 pm Pharma FIG Lunch Workshop on Data Integrity 345-346 12:15 pm FIG: Diagnostic Microscopy 330 12:15 pm FIG: Focused Ion Beam 331 12:15 pm FIG: Atom Probe Field Ion Microscopy 334 12:15 pm International Committee 333

1:30 pm – 3:00 pm P.M. Symposia & Sessions A01.1 - Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging 341 Crystals, Defects, and Atoms A03.1 - Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From 343 Scanning Nanodiffraction to Ptychography and Beyond A10.1 - The Joy of Scanning Electron Microscopy 328 A11.1 - Solid-state X-ray Spectrometry at 50 Years 327 A16.1 - Sterling Newberry Memorial Symposium on X-ray Imaging 323 A17.1 - Surface and Subsurface Microscopy and Microanalysis 326 B04.1 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals 350 B07.1 - Pharmaceuticals: Imaging, Analysis, and Regulation of Medical Products and Devices 348 P01.1 - Advances in Electron, X-ray and Neutron Spectro-imaging/ Holography of Energy 336 Materials and Devices P02.1 - Atomically Thin 2D Materials: Recent Results and Challenges 338

P05.1 - Minimizing Beam-sample Interactions by Modulating Electron Beams in Space and Time 344 X43 - Biological Sciences Tutorial - Cryo-FIB: Overcoming the Hurdle of Sample Preparation 321 for in situ Cryo-Electron Tomography Exhibit Hall 3:00 pm – 5:00 pm Monday Poster Presentations A03.P1 - Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond A10.P1 - The Joy of Scanning Electron Microscopy A11.P1 - Solid-state X-ray Spectrometry at 50 Years A16.P1 - Sterling Newberry Memorial Symposium on X-ray Imaging A17.P1 - Surface and Subsurface Microscopy and Microanalysis B04.P1 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals B07.P1 - Pharmaceuticals: Imaging, Analysis, and Regulation of Medical Products and Devices All Post-Deadline Posters will be presented on this day. 3:30 pm Technologists’ Forum Business Meeting 334 4:15 pm MSA-CUP Book Series Advisory Board Meeting 333 5:00 pm Student Poster Awards Exhibit Hall WEEK AT-A-GLANCE WEEK AT-A-GLANCE 5:30 pm Student Mixer 339-340 5:45 – 6:45 pm Vendor Tutorials (Sign Up at MSA MegaBooth) Exhibit Hall Tuesday, August 7 7:15 am MSA Local Affiliated Societies & MAS Affiliated Regional Societies 330 8:30 am – 10:00 am A.M. Symposia & Sessions A01.2 - Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, 341 Defects, and Atoms A03.2 - Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): 343 From Scanning Nanodiffraction to Ptychography and Beyond A09.1 - Data Analytics and Model-based Imaging for Microstructure and Physical 342 Property Interpretations

26 MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD Tuesday, August 7 (Cont’d.) ROOM

8:30 am – 10:00 am A.M. Symposia & Sessions (Cont’d.) A10.2 - The Joy of Scanning Electron Microscopy 328 A11.2 - Solid-state X-ray Spectrometry at 50 Years 327 A16.2 - Sterling Newberry Memorial Symposium on X-ray Imaging 323 A17.2 - Surface and Subsurface Microscopy and Microanalysis 326 A18.1 - Vendor Symposium 322 B01.1 - Microscopy and Analysis in Forensic Science 348 B03.1 - 3D Structures: from Macromolecular Assemblies to Whole Cells (3DEM FIG) 349 B04.2 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals 350 P01.2 - Advances in Electron, X-ray and Neutron Spectro-imaging/ Holography of Energy 336 Materials and Devices P02.2 - Atomically Thin 2D Materials: Recent Results and Challenges 338 P04.1 - In situ Methods for Probing Properties and Dynamics in Materials 340

P05.2 - Minimizing Beam-sample Interactions by Modulating Electron Beams in Space and Time 344 AT-A-GLANCE WEEK X31.1 - Technologists' Forum Special Topic Session: Specimen Preparation for Correlative 347 FIB-SEM and XRM X45.1 - Biological Sciences Tutorial–How to Get Funding for Instrumentation When Budgets 321 Are Tight (Part I) X90.1 - Microscopy Outreach: Microscopy in the Classroom 324-325 10:00 am – 5:30 pm Exhibit Hall Open Exhibit 10:00 am – 10:30 am Coffee Break Hall 10:00 am M&M 2019 - Program Planning for Symposium Organizers 329

10:30 am – 12:00 pm A.M. Symposia & Sessions (Cont’d.) A01.3 - Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, 341 Defects, and Atoms A02.1 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy 339 A03.3 - Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From 343 Scanning Nanodiffraction to Ptychography and Beyond A04.1 - In situ Transmission Electron Microscopy in Liquid and Gas Cells 345-346 A09.2 - Data Analytics and Model-based Imaging for Microstructure and Physical 342 Property Interpretations A10.3 - The Joy of Scanning Electron Microscopy 328 A11.3 - Solid-state X-ray Spectrometry at 50 Years 327 A17.3 - Surface and Subsurface Microscopy and Microanalysis 326 A18.2 - Vendor Symposium 322 B01.2 - Microscopy and Analysis in Forensic Science 348 B03.2 - 3D Structures: from Macromolecular Assemblies to Whole Cells (3DEM FIG) 349 B04.3 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals 350 P01.3 - Advances in Electron, X-ray and Neutron Spectro-imaging/ Holography of Energy 336 Materials and Devices P02.3 - Atomically Thin 2D Materials: Recent Results and Challenges 338 P03.1 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications 337 P04.2 - In situ Methods for Probing Properties and Dynamics in Materials 340 P05.3 - Minimizing Beam-sample Interactions by Modulating Electron Beams in Space and Time 344 X45.2 – Biological Sciences Tutorial - How to Get Funding for Instrumentation When Budgets 321 Are Tight (Part II) X90.2 - Microscopy Outreach: Microscopy in the Classroom 324-325 12:00 pm – 1:30 pm Lunch Break 12:15 pm Microscopy Today Editorial Board Meeting 323

35 http://microscopy.org/MandM/2018 27 Tuesday, August 7 (Cont’d.) ROOM 12:15 pm FOM FIG Lunch Meeting 330 12:15 pm MSA Distinguished Scientist Awardee Lectures 337 12:15 pm FIG: Cryo-Preparation 333 12:15 pm FIG: Electron Microscopy in Liquids and Gases 331 12:15 pm FIG: Electron Crystallography 334 12:15 pm FIG: MicroAnalytical Standards 332 12:15 pm MSC-SMC Business Meeting 347 1:30 pm – 3:00 pm P.M. Symposia & Sessions

A01.4 - Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, 341 Defects, and Atoms A02.2 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy 339 A03.4 - Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From 343 Scanning Nanodiffraction to Ptychography and Beyond A04.2 - In situ Transmission Electron Microscopy in Liquid and Gas Cells 345-346 A05.1 - Low-energy Electron and Particle Microscopies in Liquid, Gaseous, and Frozen Conditions 329 A09.3 - Data Analytics and Model-based Imaging for Microstructure and Physical 342 Property Interpretations A10.4 - The Joy of Scanning Electron Microscopy 328 A11.4 - Solid-state X-ray Spectrometry at 50 Years 327 A17.4 - Surface and Subsurface Microscopy and Microanalysis 326 A18.3 - Vendor Symposium 322 B01.3 - Microscopy and Analysis in Forensic Science 348 B03.3 - 3D Structures: from Macromolecular Assemblies to Whole Cells (3DEM FIG) 349 B04.4 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals 350 P01.4 - Advances in Electron, X-ray and Neutron Spectro-imaging/ Holography of Energy 336 Materials and Devices P02.4 - Atomically Thin 2D Materials: Recent Results and Challenges 338 P03.2 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications 337 P04.3 - In situ Methods for Probing Properties and Dynamics in Materials 340 P05.4 - Minimizing Beam-sample Interactions by Modulating Electron Beams in Space and Time 344 P09.1 - Microstructure and Mechanics Deformation Symposium 325 X30.1 - Technologists' Forum: E. Ann Ellis Memorial Symposium 347 X41 - Physical Sciences Tutorial - Entrepreneurship in the Microscopy Community 321

3:00 pm – 5:00 pm Tuesday Poster Presentations Exhibit Hall A01.P1 - Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms A03.P2 - Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM):

WEEK AT-A-GLANCE WEEK AT-A-GLANCE From Scanning Nanodiffraction to Ptychography and Beyond A09.P1 - Data Analytics and Model-based Imaging for Microstructure and Physical Property Interpretations A10.P2 - The Joy of Scanning Electron Microscopy A11.P2 - Solid-state X-ray Spectrometry at 50 Years A17.P2 - Surface and Subsurface Microscopy and Microanalysis A18.P1 - Vendor Symposium B01.P1 - Microscopy and Analysis in Forensic Science B03.P1 - 3D Structures: from Macromolecular Assemblies to Whole Cells (3DEM FIG) B04.P2 - Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals

28 MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD Tuesday, August 7 (Cont’d.) ROOM 3:00 pm – 5:00 pm Tuesday Poster Presentations (Cont’d.) P01.P1 - Advances in Electron, X-ray and Neutron Spectro-imaging/ Holography of Energy Materials and Devices P03.P1 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications P04.P1 - In situ Methods for Probing Properties and Dynamics in Materials P09.P1 - Microstructure and Mechanics Deformation Symposium X90.P1 - Microscopy Outreach: Microscopy in the Classroom 3:30 PM FIG: 3D EM in the Biological Sciences 321 3:30 pm FIG Business Meeting 333 3:30 pm MSA Education Committee 334 5:00 pm Student Poster Awards Exhibit Hall

5:30 pm MSA Student Council 331-332 AT-A-GLANCE WEEK 5:30 pm Post-Doctoral Researchers’ Reception 330 5:45 pm Vendor Tutorials (Sign Up at MSA MegaBooth) Exhibit Hall 6:30 pm Presidents’ Reception (Invitation Only) Offsite Wednesday, August 8 7:15 am MSA Certification Board 333 7:15 am MSA Membership Committee 334

8:30 am – 10:00 am A.M. Symposia & Sessions A02.3 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy 339 A03.5 - Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From 343 Scanning Nanodiffraction to Ptychography and Beyond A04.3 - In situ Transmission Electron Microscopy in Liquid and Gas Cells 345-346 A05.2 - Low-energy Electron and Particle Microscopies in Liquid, Gaseous, and Frozen Conditions 329 A09.4 - Data Analytics and Model-based Imaging for Microstructure and Physical 342 Property Interpretations A10.5 - The Joy of Scanning Electron Microscopy 328 A11.5 - Solid-state X-ray Spectrometry at 50 Years 327 A17.5 - Surface and Subsurface Microscopy and Microanalysis 326 B02.1 - Microscopy in Food Science: Bridging Biology and Materials Science 348 B05.1 - Focused on Microbes! 347 B08.1 - 3D Structure of Complex Soft Materials Derived From Electron Tomography 349 P01.5 - Advances in Electron, X-ray and Neutron Spectro-imaging/Holography of 336 Energy Materials and Devices P02.5 - Atomically Thin 2D Materials: Recent Results and Challenges 338 P03.3 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications 337 P04.4 - In situ Methods for Probing Properties and Dynamics in Materials 340 P05.5 - Minimizing Beam-sample Interactions by Modulating Electron Beams in Space and Time 344 P09.2 - Microstructure and Mechanics Deformation Symposium 325 X42 - Physical Sciences Tutorial - Ultra-high Spatial Resolution EBSD: Transmission Kikuchi 321 Diffraction (TKD) in the SEM 10:00 am – 5:30 pm Exhibit Hall Open

10:00 am – 10:30 am Coffee Break Exhibit Hall

37 http://microscopy.org/MandM/2018 29 Wednesday, August 8 continued ROOM 10:30 am – 12:00 pm A.M. Symposia & Sessions (Cont’d.) A02.4 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy 339 A04.4 - In situ Transmission Electron Microscopy in Liquid and Gas Cell 345-346 A05.3 - Low-energy Electron and Particle Microscopies in Liquid, Gaseous, and Frozen Conditions 329 A07.1 - New Advances in Electron Energy Loss Spectroscopy and Allied Techniques 341 A09.5 - Data Analytics and Model-based Imaging for Microstructure and Physical 342 Property Interpretations A10.6 - The Joy of Scanning Electron Microscopy 328 A11.6 - Solid-state X-ray Spectrometry at 50 Years 327 A17.6 - Surface and Subsurface Microscopy and Microanalysis 326 B02.2 - Microscopy in Food Science: Bridging Biology and Materials Science 348 B05.2 - Focused on Microbes! 347 B08.2 - 3D Structure of Complex Soft Materials Derived From Electron Tomography 349 P01.6 - Advances in Electron, X-ray and Neutron Spectro-imaging/Holography of Energy 336 Materials and Devices P02.6 - Atomically Thin 2D Materials: Recent Results and Challenges 338 P03.4 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications 337 P04.5 - In situ Methods for Probing Properties and Dynamics in Materials 340 P07.1 - Planetary Building Blocks and the Techniques Needed to Analyze Them 324 P09.3 - Microstructure and Mechanics Deformation Symposium 325 X32.1 - Technologists' Forum Roundtable Session: Sample Preparation Strategies for 350 Super-Resolution Correlative Electron Microscopy X44 - Biological Sciences Tutorial - Single-particle Cryo-EM: Data Processing Techniques 321 for Obtaining Optimal Results 12:00 pm – 1:30 pm Lunch Break 12:15 pm MSA Members’ Meeting 343-344

1:30 pm – 3:00 pm P.M. Symposia & Sessions A02.5 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy 339 A04.5 - In situ Transmission Electron Microscopy in Liquid and Gas Cells 345-346 A07.2 - New Advances in Electron Energy Loss Spectroscopy and Allied Techniques 341 A08.1 - Machine Learning & Compressive Sensing for Image Acquisition, Processing, 342 and Reconstruction A12.1 - The FIB-SEM Laboratory: Sample Preparation and Beyond 328 A13.1 - Pushing the Limits of Cryo-EM 349 A14.1 - Quantitative Magnetic Characterization in the TEM 338 A15.1 - Strain Analysis from Nano- to Micro-length Scales 327 B06.1 - Imaging Life at New Frontiers of Spatiotemporal Resolution and Adaptive Microscopy 350 WEEK AT-A-GLANCE WEEK AT-A-GLANCE P03.5 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications 337 P04.6 - In situ Methods for Probing Properties and Dynamics in Materials 340 P06.1 - Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in 329 Characterizing National and Synthetic Materials P07.2 - Planetary Building Blocks and the Techniques Needed to Analyze Them 324 P08.1 - Spectroscopic and Imaging Studies in Heritage Science 326 P09.4 - Microstructure and Mechanics Deformation Symposium 325 X40 - Physical Sciences Tutorial - Scanning Nanobeam Diffraction 321 X91 - Microscopy Outreach: Microscopy Explorations 322-323 10:00 am – 12:00 pm Wednesday Poster Presentations Exhibit Hall A02.P1 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy A04.P1 - In situ Transmission Electron Microscopy in Liquid and Gas Cells

38 MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD continued Wednesday, August 8 ROOM 3:00 pm – 5:00 pm Wednesday Poster Presentations (Cont’d.) Exhibit Hall A05.P1 - Low-energy Electron and Particle Microscopies in Liquid, Gaseous, and Frozen Conditions B05.P1 - Focused on Microbes! B06.P1 - Imaging Life at New Frontiers of Spatiotemporal Resolution and Adaptive Microscopy B08.P1 - 3D Structure of Complex Soft Materials Derived From Electron Tomography P01.P2 - Advances in Electron, X-ray and Neutron Spectro-imaging/Holography of Energy Materials and Devices P02.P1 - Atomically Thin 2D Materials: Recent Results and Challenges P03.P2 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications P04.P2 - In situ Methods for Probing Properties and Dynamics in Materials P05.P1 - Minimizing Beam-sample Interactions by Modulating Electron Beams in Space and Time P07.P1 - Planetary Building Blocks and the Techniques Needed to Analyze Them P08.P1 - Spectroscopic and Imaging Studies in Heritage Science EK AT-A-GLANCE WEEK P09.P2 - Microstructure and Mechanics Deformation Symposium 4:00 pm Microscopy Today Innovation Awards Exhibit Hall

5:00 pm Student Poster Awards Exhibit Hall

5:15 pm MAS Business Meeting 337

5:45 pm Vendor Tutorials (Sign Up at MSA MegaBooth) Exhibit Hall

6:30 pm MAS Members’ Social (See MAS Booth for Details) Offsite

Thursday, August 9 ROOM 8:30 am M&M Sustaining Members 330

8:30 am – 10:00 am A.M. Symposia & Sessions A02.6 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy 339 A04.6 - In situ Transmission Electron Microscopy in Liquid and Gas Cells 345-346 A06.1 - Mesoscale Correlative Microscopy and Imaging of Physical, Environmental, 322 and Biological Sciences A07.3 - New Advances in Electron Energy Loss Spectroscopy and Allied Techniques 341 A08.2 - Machine Learning & Compressive Sensing for Image Acquisition, Processing, 342 and Reconstruction A12.2 - The FIB-SEM Laboratory: Sample Preparation and Beyond 328 A13.2 - Pushing the Limits of Cryo-EM 349 A14.2 - Quantitative Magnetic Characterization in the TEM 338 A15.2 - Strain Analysis from Nano- to Micro-length Scales 327 B06.2 - Imaging Life at New Frontiers of Spatiotemporal Resolution and Adaptive Microscopy 350 P03.6 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications 337 P04.7 - In situ Methods for Probing Properties and Dynamics in Materials 340 P06.2 - Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in 329 Characterizing National and Synthetic Materials P07.3 - Planetary Building Blocks and the Techniques Needed to Analyze Them 324 P08.2 - Spectroscopic and Imaging Studies in Heritage Science 326 P09.5 - Microstructure and Mechanics Deformation Symposium 325 10:00 am – 2:00 pm Exhibit Hall Open 10:00 am – 12:00 pm Coffee Break + Poster Session Exhibit Hall 10:00 am – 12:00 pm Thursday Poster Sessions Exhibit Hall A02.P2 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy A04.P2 - In situ Transmission Electron Microscopy in Liquid and Gas Cells

39 http://microscopy.org/MandM/2018 39 Thursday, August 9 continued ROOM 10:00 am – 12:00 pm Thursday Poster Sessions (Cont’d.) Exhibit Hall A06.P1 - Mesoscale Correlative Microscopy and Imaging of Physical, Environmental, and Biological Sciences A07.P1 - New Advances in Electron Energy Loss Spectroscopy and Allied Techniques A08.P1 - Machine Learning & Compressive Sensing for Image Acquisition, Processing, and Reconstruction A12.P1 - The FIB-SEM Laboratory: Sample Preparation and Beyond A13.P1 - Pushing the Limits of Cryo-EM A14.P1 - Quantitative Magnetic Characterization in the TEM P04.P3 - In situ Methods for Probing Properties and Dynamics in Materials P06.P1 - Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing National and Synthetic Materials P09.P3 - Microstructure and Mechanics Deformation Symposium 12:00 pm Student Poster Awards Exhibit Hall 12:00 pm - 1:30 pm Lunch Break 12:15 pm MSA Standards Committee 333 1:30 pm – 3:00 pm P.M. Symposia & Sessions A02.7 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy 339 A04.7 - In situ Transmission Electron Microscopy in Liquid and Gas Cells 345-346 A06.2 - Mesoscale Correlative Microscopy and Imaging of Physical, Environmental, and 322 Biological Sciences A07.4 - New Advances in Electron Energy Loss Spectroscopy and Allied Techniques 341 A08.3 - Machine Learning & Compressive Sensing for Image Acquisition, Processing, 342 and Reconstruction A12.3 - The FIB-SEM Laboratory: Sample Preparation and Beyond 328 A13.3 - Pushing the Limits of Cryo-EM 349 A14.3 - Quantitative Magnetic Characterization in the TEM 338 A15.3 - Strain Analysis from Nano- to Micro-length Scales 327 B06.3 - Imaging Life at New Frontiers of Spatiotemporal Resolution and Adaptive Microscopy 350 P03.7 - Nanoparticles and 1D Materials: Synthesis, Characteristics and Applications 337 P04.8 - In situ Methods for Probing Properties and Dynamics in Materials 340 P06.3 - Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in 329 Characterizing National and Synthetic Materials P07.4 - Planetary Building Blocks and the Techniques Needed to Analyze Them 324 P08.3 - Spectroscopic and Imaging Studies in Heritage Science 326 P09.6 - Microstructure and Mechanics Deformation Symposium 325 3:00 pm - 3:30 pm Coffee Break 3:30 pm - 5:00 pm Late P.M. Symposia (Cont’d.) WEEK AT-A-GLANCE WEEK AT-A-GLANCE A02.8 - Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy 339 A06.3 - Mesoscale Correlative Microscopy and Imaging of Physical, Environmental, and 322 Biological Sciences A07.5 - New Advances in Electron Energy Loss Spectroscopy and Allied Techniques 341 A08.4 - Machine Learning & Compressive Sensing for Image Acquisition, Processing, 342 and Reconstruction A13.4 - Pushing the Limits of Cryo-EMA14.4 - Quantitative Magnetic Characterization in the TEM 349 A14.4 - Quantitative Magnetic Characterization in the TEM 338 P04.9 - In situ Methods for Probing Properties and Dynamics in Materials 340 P06.4 - Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in 329 Characterizing National and Synthetic Materials P08.4 - Spectroscopic and Imaging Studies in Heritage Science 326 4:30 pm M&M 2018 Wrap-Up & Debrief (by invitation only) 333

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36 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR DIRECTORY as of May 31, 2018 Duniway E. A. Fischione Stockroom Corp. #720 Instruments, Inc. #424 E. Fjeld Co, Inc. #1208 48501 Milmont Dr 9003 Corporate Circle 152 Rangeway Rd Fremont, CA 94538 Export, PA 15632 N Billerica, MA 01862 Phone: 650-969-8811 Phone: 724-325-5444 Phone: 978-667-1416 Fax: 650-965-0764 Fax: 724-325-5443 Fax: 978-667-9059 Email: [email protected] Email: [email protected] Email: [email protected] www.duniway.com www.fischione.com www.efjeld.com For 42 years, Duniway Fischione Instruments provides Stockroom has supplied new mechanical specimen preparation Edax #530 and used vacuum equipment tools, plasma cleaners, and TEM to Universities, government tomography specimen holders 91 McKee Dr laboratories, OEM’s, Fortune for single-, dual-, and on-axis Mahwah, NJ 07430 EXHIBITOR DIRECTORY 500 corporations and smaller applications, as well as cryo and Phone: 201-529-4880 end-users around the world. We vacuum transfer applications. Fax: 201-529-3156 manufacture new ion pumps Fischione also offers ion mill Email: [email protected] and controllers (Terranova®) sample preparation instruments, www.edax.com as well as new vacuum gauge including the recently introduced EDAX is a leading provider controllers (Terranova®). Large Model 1051 TEM Mill and Model of innovative materials stock of hardware, supplies, 1061 SEM Mill. characterization systems and valves ready for same encompassing Energy Dispersive day shipment as well as new Spectrometry (EDS), Wavelength and rebuilt pumps (turbo, ion, Dispersive Spectrometry (WDS), mechanical and diffusion). Electron Backscatter Diffraction (EBSD) and X-ray Fluorescence (XRF). The company designs, manufactures, distributes and services hardware and software solutions for a broad range of industries, educational institutions and research organizations.

Electron Microscopy Sciences #616 1560 Industry Rd Hatfield, PA 19440 Phone: 215-412-8400 Fax: 215-412-8450 Email: [email protected] www.emsdiasum.com Electron microscopy sciences will have on display their complete line of accessories, chemicals, supplies and equipment for all fields of microscopy, biological research and general laboratory requirements. As well as our full line of tools, tweezers and dissecting equipment.

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 37 EXHIBITOR DIRECTORY as of May 31, 2018 Fluid Imaging El-Mul Technologies #714 EXpressLO LLC #538 Technologies, Inc. #1444 12 Hamada St. 5483 Lee St. Unit 12 200 Enterprise Dr. Rehovot, 7670315 Israel Lehigh Acres, FL 33971 Scarborough, ME 04074 Phone: +972545643039 Phone: 321-663-3806 Phone: 207-289-3200 Fax: +97289422676 Fax: 321-413-0251 Email: [email protected] Email: [email protected] Email: [email protected] www.fluidimaging.com www.el-mul.com www.EXpressLO.com El -Mul is a designer and EXpressLO LLC is an expert manufacturer of advanced tailor- provider of FIB ex situ lift out and made charged particle detection micromanipulation solutions. Our solutions. We provide detection patented EXpressLO™ grids and systems to Electron Microscopy, methods allow for fast and easy Ion Beam and Mass Spectrometry backside manipulation and post vendors. Our WETSEM® FIB processing since no carbon Technology (Quantomix®) film support is needed. Use our enables wet samples imaging in Pick&Place™ methods for fibers, conventional scanning electron particles, CNTs, thin films and microscopes. WETSEM allows more. Prepare cross-sections back-scattered electrons imaging or plan views for SEM/TEM/ as well as EDX measurements. EBSD/TKD and more. Visit www. Solutions for Material Science and YouTube.com/LAGiannuzzi/videos Life Science are available. for examples.

Ephemeron Labs #508 1901 S 9th St - Rm 217 Philadelphia. PA 19148 EXpressLO™ Phone: 215-839-9071 Expert ex situ Lift Out & Manipulation Solutions Email: terrence@ ephemeron-labs.com Fast, easy, and reproducible www.ephemeron-labs.com Patented grid design and method Complete quantitative EBIC/ Routine backside milling EBAC and multi-mode imaging Re-thin EXLO specimens solution in SEM for solid- Saves FIB instrument time and $$$ state devices and materials. Supports multiple FIB instruments Measure carrier dynamics in PV, Multi-user facility friendly LED, semiconductors. In-situ Pick&Place™ dual pin holder and kit electrical characterization stages, Aspirato™ vacuum module Manipulate CNTs, fibers, particles & more EXHIBITOR DIRECTORY EXHIBITOR conductive epoxy wire-bonding, custom sample chip carriers US Patents 8,740,209 and 8,789, 826 and sample stages, cryostat compatible.

Visit us in Baltimore at M&M 2018 Booth 538 EXpressLO LLC [email protected] www.EXpressLO.com Phone: +1-321-663-3806 Fax: +1-321-413-0251

38 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR DIRECTORY as of May 31, 2018

FOM Networks, Inc. #542 Gatan, Inc. #824 Hinds Instruments, Inc. #540 1 Northfield PLZ Ste 300 5794 W Las Positas Blvd 7245 NE Evergreen Pkwy Northfield, IL 60093 Pleasanton, CA 94588 Hillsboro, OR 97124 Phone: 224-225-9168 Phone: 925-463-0200 Phone: 503-690-2000 Fax: 224-218-2807 Fax: 925-463-0204 Email: cwimmer@ Email: [email protected] Email: [email protected] hindsinstruments.com www.fomnetworks.com www.gatan.com www.hindsinstruments.com The Facility Online Manager Gatan is the world’s leading Quantify your polarized light (FOM) system is the flagship manufacturer of instrumentation microscopy measurements with product of FOM Networks, and software used to enhance the Exicor® MicroImagerTM Inc. FOM proudly serves and extend the operation from Hinds Instruments! This the most customers in the and performance of electron Imaging Microscope is ideal EXHIBITOR DIRECTORY market of Scientific Instrument microscopes. Gatan products, for measuring birefringence Management. More than 150 which are fully compatible with in biological structures, glass, reputable universities and nearly all electron microscope crystals, and many other organic national labs, such as Yale, models, cover the entire range and inorganic samples. • No Dyes Princeton, OSU, UIUC, Rice, of the research process—from or Fluorescent labels required • Brookhaven, Sandia, are using specimen preparation and Measures and images retardation, FOM every day to manage their manipulation to imaging and angle and intensity • Resolution of shared resources. We provide analysis. 0.01nm • Detection limit of 0.1nm 4 types of licenses from free to • Measurement range 1nm to enterprise, and all aspects of FOM 3500nm are customizable. Herzan LLC #1206 23042 Alcalde Dr, Suite E Laguna Hills, CA 92653 HIROX-USA, Inc. #1207 Gamma Vacuum #807 Phone: 949-363-2905 100 Commerce Way - Ste 4 2915 133rd Street W. Fax: 949-340-9751 Hackensack, NJ 07601 Shakopee, MN 55379 Email: [email protected] Phone: 201-342-2600 Phone: 952-445-4841 www.herzan.com Fax: 201-342-7322 Fax: 952-445-7615 Herzan’s mission is to help Email: [email protected] Email: lori.mccloud@ researchers remove environmental www.hirox-usa.com gammavacuum.com noise from disrupting their www.gammavacuum.com measurements. To achieve Gamma Vacuum specializes this goal, Herzan provides in the manufacture, repair uncompromising solutions and distribution of ion and focused on isolating vibration, titanium sublimation pumps. acoustic, and EMI noise. These Gamma Vacuum’s product line solutions include: active vibration includes a wide range of Ion isolation platforms, custom Pumps, TSPs, NEGs, Controllers acoustic enclosures, magnetic field and accessories, along with cancellation systems, site survey service and repair. We provide tools, and the many services customized solutions with required to support these systems. consistent superior quality, at a low initial and operational cost.

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 39 EXHIBITOR DIRECTORY as of May 31, 2018 Hitachi High Technologies iLab Solutions, part of America, Inc. #1125 Hummingbird Scientific #605 Agilent Technologies #537 22610 Gateway Center Dr - 2610 Willamette Dr SE, Ste A PO Box 2995 Ste 100 Lacey, WA 98516 Colorado Springs, CO 80901 Clarksburg, MD 20871 Phone: 360-252-2737 Phone: 617-297-2805 Phone: 603-964-9249 Fax: 360-252-6474 Fax: 877-812-6477 Fax: 603-964-8105 Email: daan_alsem@ Email: [email protected] Email: elyn.seaman@ hummingbirdscientific. www.ilabsolutions.com hitachi-hta.com com www.hitachi-hta.com hummingbirdscientific.com Hitachi High Technologies Integrated Dynamics Hummingbird Scientific builds Engineering #803 America provides technologically products for electron and ion advanced imaging solutions to microscopy with an emphasis 68 Mazzeo Rd meet the complex challenges on transmission electron Randolph, MA 02368 of today’s busy research and microscopes (TEM). In close Phone: 781-326-5700 industrial labs. Challenging the collaboration with our customers, Fax: 781-326-3004 boundaries of expectations, we design and manufacture all Email: [email protected] our expanding and innovative aspects of these complex systems www.ideworld.com product portfolio includes from mechanical, electrical, and Integrated Dynamics Engineering SEM, TEM, STEM, FIB, Ion software design to fabrication IDE has 25+ years experience Milling instrumentation, AFM and assembly. We aim to as a world leader in Active and and Correlative microscopy, provide pioneering solutions for Passive Vibration Isolation, Atmospheric and Tabletop applications in nanotechnology, EMI Cancellation, Acoustic and SEM, OES and XRF, Thermal materials science, and biology. Environmental Control systems Analysis and microscopy sample for SEMs and TEMs with major preparation systems. facilities in Europe, the US, Mid- ibss Group, Inc. #1237 East and Asia. Serving prestigious HREM Research Inc. #906 111 Anza Blvd - Ste 110 universities, semiconductor Burlingame CA 94010 manufacturers, medical facilities 11-10-503 Nibancho Phone: 415-566-5774 and research laboratories globally. Chiyoda, Tokyo 102-0084 Japan Fax: 415-566-9779 Phone: 81-3-5213-4689 Email: elena.grankina@ Fax: 81-3-5213-4689 ibssgroup.com International Centre for Email: ishizuka@ www.ibssgroup.com Diffraction Data (ICDD) #609 hremresearch.com 12 Campus Blvd www.hremresearch.com Newtown Square, PA 19073 HREM Research is a leading IDES, Inc #437 Phone: 610-325-9814 company developing software 5653 Stoneridge Dr - Ste 117 Fax: 610-325-9823 for Quantitative Electron Pleasanton, CA 94588 Email: [email protected] Microscopy. Our flagship Phone: 888-808-4337 www.icdd.com EXHIBITOR DIRECTORY EXHIBITOR software is FFT-Multislice HR(S) Email: [email protected] ICDD’s material identification TEM Image Simulation Package. www.ides-inc.com databases are designed for rapid We also provide a collection IDES provides the most advanced materials identification and of DigitalMicrograph plug-ins: time resolved electron imaging interfaced with diffractometers Exit Wave Reconstruction, STEM solutions available. Our mission is and data analysis systems of and EELS Deconvolution, Strain to develop and market electron the world’s leading software Mapping, Noise Filters for HR(S) imaging technology that will developers and manufacturers TEM, Scan Noise corrector, enable researchers to reveal and of X-ray equipment. Release Multivariate Analysis for SI data, exploit biological and material 2019 of the Powder Diffraction Rocking Beam or Rotated Beam dynamics at ultrafast time scales. File™ (PDF®) contains simulated Electron Diffraction acquisition etc. Selected Area Electron Diffraction Patterns and Electron Backscatter Diffraction Patterns for hundreds of thousands of material data sets.

40 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR DIRECTORY as of May 31, 2018 J. Kraft Microscopy IXRF Systems, Inc. #1117 Services, Inc. #606 JEOL USA, Inc. #812 10421 Old Manchaca Rd - Ste 620 243 W Main St PO Box 386 11 Dearborn Rd Austin, TX 78748 Springville, NY 14141 Peabody, MA 01960 Phone: 512-386-6100 Phone: 716-592-4402 Phone: 978-535-5900 Fax: 512-386-6105 Email: [email protected] Fax: 978-536-2205 Email: [email protected] www.jkraftmicro.com Email: [email protected] www.ixrfsystems.com Specializing in sales & service www.jeolusa.com IXRF Systems manufactures of SEM systems, detectors, JEOL is a leading global industry-leading microanalysis & upgrades. Exclusive North manufacturer of electron systems and x-ray fluorescence American distributor of Point microscopes and analytical (XRF) analyzers for bulk and Electronic upgrades and detectors. instrumentation for scientific micro applications. The IXRF research and industrial software platform is high- applications. Key markets: powered and fully-featured yet nanotechnology, materials easy-to-use and intuitive. IXRF science, life sciences and offers free software upgrades semiconductors. Core product on all of its products as well groups: SEM, TEM, STEM, E-Beam unrivaled service and support. Lithography, EPMA, ion-beam instruments, MS, NMR. Solutions for scientific and industrial R&D including technical and applications expertise, combined with long-term service.

NTENTN ENTE F DFFTN DT Diffraction Data You Can Trust ICDD databases are the only crystallographic databases in the world with quality marksand quality review processes that are ISO certifi ed. PDF-4+ Standardized Data More Coverage All Data Sets Evaluated For Quality Reviewed, Edited and Corrected Prior To Publication Targeted For Material Identifi cation and Characterization

Visit us at M&M Booth 609

www.icdd.com | [email protected] ICDD, the ICDD logo and PDF are registered in the U.S. Patent and Trademark Offi ce. Powder Diffraction File is a trademark of JCPDS – International Centre for Diffraction Data ©2018 JCPDS–International Centre for Diffraction Data – 5/18

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 41 EXHIBITOR DIRECTORY as of May 31, 2018

Kleindiek Linkam Scientific Kammrath and Weiss #610 Nanotechnik #1140 Instruments #423 6 Beech Rd Aspenhaustr. 25 Unit 8, Epsom Metro Downs Islip, NY 11751 Reutlingen 72770 Germany Centre Waterfield Phone: 516-313-9742 Phone: 49 7121 345 395 0 Tadworth Surrey KT20 5LR Fax: 631-224-2620 Fax: 49 7121 345 395 55 United Kingdom Email: [email protected] Email: andrew.smith@ Phone: 44 0 1737 363 476 www.kammrath-weiss.com kleindiek.com Email: duncanstacey@ www.kleindiek.com linkam.co.uk Kammrath and Weiss has www.linkam.co.uk modules and accessories for Kleindiek Nanotechnik has in-situ SEM / FIB testing • over 20 years of experience Linkam develop and manufacture Materials testing: In-situ Tensile- in providing high-end sample characterisation solutions. Compression and Fiber testing nanomanipulators for a wide These are used in many industries modules • Heating / cooling: range of tasks in life science, and universities around the world Heating to 1500ºC, Peltier, light microscopy, and in SEM and to aid in the characterisation LN2 and Liquid Helium Cryo- FIB/SEM. Our compact, precise, of materials from polymers to modules, • IC testing: Precision and highly stable manipulators biological tissue; from metals probing, EBIC modules and provide sub-nanometer steps and ceramics to pharmaceutical ultra-high-speed beam blankers sizes paired with a high degree excipients. We provide solutions • Sample stages: Custom stages of flexibility and ease of use. They for many different application and sample holders for unusual can be equipped with various requirements including electrical, specimens and chambers plug-in tools that further enhance humidity, rheology, freeze drying, Contact: George.Lanzarotta@ their range of applications tensile and Cryo-CLEM. kammrathandweiss.com (e.g.liftout, pick&place,...). LSM Tech LLC #T -1430 Keyence Corporation Ladd Research #705 100 Mountain View Drive of America #1305 83 Holly Ct Etters, PA 17319 500 Park Blvd Williston, VT 05495 Phone: 717-938-4643 Itasca, IL 60143 Phone: 802-658-4961 Fax: 717-938-4588 Phone: 201-930-0100 Fax: 802-660-8859 Email: [email protected] Fax: 201-930-1883 Email: [email protected] www.lsmtech.com Email: [email protected] www.laddresearch.com LSM Tech provides service and www.keyence.com upgrades for Zeiss LSM 510s as KEYENCE Corporation is a well as an exceptional device Leica Microsystems #1038 world leader in high-precision for the research community, the optical measurement and 1700 Leider Ln InverterScope, which may be used advanced microscopes, and Buffalo Grove, IL 60089 on any brand infinity corrected is proud to showcase its Fax: 847-236-3009 microscope. The InverterScope Email: david.chapa@leica- provides your microscope with

EXHIBITOR DIRECTORY EXHIBITOR leading-edge technology for metrology and inspection. microsystems.com more flexibility so that your With products including a new www.leica-microsystems.com microscope may be used as an hybrid 3D laser microscope upright or inverted microscope and digital microscopes, and allows the objective to KEYENCE is well prepared be relocated for more flexible to solve nearly any imaging, research. Stop by the booth to inspection, or analysis need. see the InverterScope.

42 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR DIRECTORY as of May 31, 2018 Mel-Build Microscopy Corporation #1410 Innovations, LLC #718 MTI Instruments, Inc. #805 2-11-36, Ishimaru, Nishi-ku 213 Air Park Rd - Ste 101 325 Washington Avenue Extension Fukuoka Fukuoka 8190025 Marshfield, WI 54449-8626 Albany, NY 12205 Japan Phone: 715-384-3292 Phone: 518-218-2550 Phone: +81-928915111 Email: mark.nelson@ Email: [email protected] Fax: +81-928915111 microscopyinnovations.com www.mtiinstruments.com Email: [email protected] www.microscopyinnovations.com MTI Instruments is a US-based www.melbuild.com/ When a busy lab needs to manufacturer of highly- Mel-Build makes unique TEM accomplish more in a day, advanced tensile systems. specimen holders involved try the mPrep™ System. This Designed for SEMs, AFMs, in a cooling, a tensile, a capsule-based system reduces and LMs, our precision stage tomography, an applied specimen handling, controls technology is backed by 50 EXHIBITOR DIRECTORY field and others. We achieve reagent use, and cuts hands-on years of sophisticated sensing making higher level holders time. For manual or automated and physical measurement than ordinary one by full using processing, mPrep adapts to expertise. Industry, academia, unique and original techniques. your protocols and needs. For and government alike rely on extra-fast results, try the mPrep our systems for greater insight ASP-1000 Auto-Processor—it into early stages of material MEO Engineering Co., offers 45-minute processing of failure, and for accurate material DBA PBS&T Particle Beam kidney tissue for TEM! test data. MTI Instruments Systems Technology #330 is proud to be an ISO 9001: 290 Broadway, Suite 298 2015-certified company. Methuen, MA 01844 MSA Mega Booth #1329 Phone: 978-305-0479 11130 Sunrise Valley Dr, Ste 350 Email: vray@ Reston, VA 20191 Nanomechanics, Inc #406 partbeamsystech.com Phone: 703-234-4115 105 Meco Ln - Ste 100 www.freudlabs.com Fax: 703-435-4390 Oak Ridge TN 37830 Offering sophisticated GALEX™ Email: AssociationManagement@ Email: Gas Injection System (GIS) microscopy.org [email protected] for beam-induced deposition www.microscopy.org and gas-assisted etching The MegaBooth provides MSA in FIB and SEM. Ultra-high membership services to meeting NanoMEGAS USA #507 temperature, rapid-heat HTT attendees. It is comprised of 1095 W Rio Salado Pkwy - #110 laboratory furnaces. Support Membership (including LAS and Tempe, AZ 85281 and maintenance of FIB/SEM Sustaining Members), Publications Phone: 208-867-0142 instrumentation, affordable (Microscopy and Microanalysis Fax: 480-320-4066 and refurbish-able PBS&T and Microscopy Today), MSA Email: [email protected] consumables. Maintenance Committees represented www.nanomegasusa.com training for FIB, SEM, and vacuum are - Certification Board, instrumentation. FIB operator Placement Office, Tech Forum NanoMEGAS systems for training on Failure Analysis, , and Education,. This includes TEM provide nm resolution Circuit Edit, micro- and nano- Educational Outreach, a Book orientation-phase maps machining applications. Display, and Vendor Tutorials. combined with precession electron diffraction. Applications, including strain mapping (Topspin), ab initio structural determination (ADT-3D), grains statistic (ASTAR), and amorphous short range order bond length (e-PDF) characterization, can all be installed on all new or existing TEM microscopes.

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 43 EXHIBITOR DIRECTORY as of May 31, 2018

Nanoscience Instruments #1406 Norcada, Inc. #1142 Olympus America #612 10008 S. 51st - ste 110 4465 99th St 48 Woerd Ave Phoenix, AZ 85044 Edmonton, AB T6E 5B6 Waltham, MA 02453 Phone: 480-758-5400 Canada Phone: 781-419-3900 Fax: 480-758-5401 Phone: 780-431-9637 Email: robin.assencoa@ Email: [email protected] Fax: 780-431-9638 olympus.com www.nanoscience.com Email: [email protected] www.olympus.com For over 15 years, Nanoscience www.norcada.com Olympus provides an industry- Instruments has become Norcada is the premier leading portfolio of innovative a trusted supplier of the manufacturer of high quality, test, measurement, and imaging most innovative and highest ultra-clean SiNx membrane and instruments. Technologies quality analytical solutions to other MEMS devices for TEM, include remote visual inspection, academia and industry. We SEM and X-Ray microscopy. industrial microscopy, specialize in surface science and Holders and MEMS solutions ultrasound, phased array, eddy instrumentation for nanoscale such as Heating chips, current, phased array, and applications. Visit booth #1406 Biasing chips, Liquid Cells optical metrology. to learn about our desktop and Electrochemistry devices scanning electron microscopes, are our specialty. Norcada ion mills, correlative product offering also includes Oxford Instruments #838 microscopes, nanoindenters, customized products such as 300 Baker Ave - Ste 150 optical profilometers, QCM, Silicon, Silicon Dioxide and Concord, MA 01742 tensiometers, AFMs, and Silicon Carbide membrane Phone: 978-369-9933 electrospinning equipment. windows for various scientific Fax: 978-369-8287 applications. Email: [email protected] www.oxford-instruments.com Nion Company #1338 Oxford Instruments 11511 NE 118th St Objects Research Systems #707 NanoAnalysis provides Kirkland, WA 98034 leading-edge tools that enable Phone: 425-576-9060 760 St Paul St W materials characterization Fax: 425-739-0312 Montreal, QC H3C 1M4 Canada and sample manipulation at Email: [email protected] Phone: 514-843-3861 the nanometer scale. Used www.nion.com Fax: 514-543-5475 on electron microscopes Nion supplies world-leading Email: [email protected] (SEM and TEM) and ion- aberration-corrected STEMs www.theobjects.com/dragonfly beam systems (FIB), our tools that excel in spatial resolution Object Research Systems are used for R&D across (1.07 Å at 30 keV), EELS (ORS) develops and provides a wide range of academic resolution (5 meV with advanced imaging software and industrial applications Nion mono-chromator and solutions to research centers including semiconductors,

EXHIBITOR DIRECTORY EXHIBITOR spectrometer), efficient EDXS and engineering groups renewable energy, mining, (>0.7 sr solid angle) and UHV at worldwide to process, visualize, metallurgy, and forensics. the sample. Two sample stages and analyze scientific image are available: ultra-high stability data. Our software is deployed side-insertion cartridge type, or by registered users in more flexible, high-stability side-entry than 80 countries, enabling rod type. www.nion.com advanced and robust workflows that transform your imaging investment into high-value quantitative returns.

44 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR DIRECTORY as of May 31, 2018

Pace Technologies #1404 PNDetector GmbH #905 3601 E 34th St e-newsletters; webinars; and our Otto-Hahn-Ring, 6 Tucson, AZ 85713 website. Visit www.photonics. Munich, 81739 Germany Phone: 520-882-6598 com for more information and to Phone: 0049 89309087-100 Fax: 520-882-6599 subscribe for FREE. Fax: 0049 89 309087-112 Email: ChrisH@ Email: gabriele.linder@ metallographic.com pndetector.de Physical Electronics #716 Pace Technologies is a rapidly www.pndetector.de growing supplier to the field 18725 Lake Dr E PNDetector has been of metallography. Our robust Chanhassen, MN 55317 developing and manufacturing sample preparation equipment Phone: 952-828-6100 advanced radiation detectors is designed for ease of use and Fax: 952-828-6176 for X-ray fluorescence or EXHIBITOR DIRECTORY effective results. Pace Technologies Email: [email protected] microanalysis, materials also offers the highest quality www.phi.com science and quality assurance consumable products for all of Physical Electronics (PHI) is a since 2007. The sensors are your sample preparation needs. subsidiary of ULVAC-PHI, the fabricated in PNDetector´s Come stop by our booth to see world’s leading supplier of UHV own silicon production and how Pace Technologies can help surface analysis instrumentation packaging line. The emphasis improve your sample preparation used for research & development is on Silicon Drift Detectors experience. of advanced materials in a (SDDs), Backscattered Electron number of high technology Detectors (BSD) and Charged fields including: nanotechnology, Coupled Devices (pnCCDs). Park Systems Inc #410 microelectronics, storage media, 3040 Olcott St bio-medical, & basic materials Santa Clara, CA 95054 such as metals, polymers, & PNSensor GmbH #806 Phone: 408-986-1110 coatings. PHI’s innovative XPS, Otto - Hahn - Ring 6 Fax: 408-986-1199 AES and, SIMS technologies D-81739 MŸnchen Germany Email: [email protected] provide unique tools for Phone: (49) 89 30908713 www.parkafm.com satisfying customers needs. Fax: (49) 89 30908711 Email: melanie.schoening@ pnsensor.de PhenomWorld #1112 PIE Scientific LLC #641 www.pnsensor.de See Thermo Fisher Scientific - 3209 Whipple Road Booth #1112 Union City, CA 94587 Phone: 650-204-0875 Point Electronic Email: [email protected] GmbH #908 Photonics Media #405 www.piescientific.com Erich-Neuss-Weg 15 PIE Scientific specializes in Halle D-06120 Germany 100 West Street, 2nd Floor 49 345 472256-22 developing advanced plasma Phone: Pittsfield, MA 01201 Email: [email protected] cleaners for sample cleaning, Phone: 413-499-0514 www.pointelectronic.com Fax: 413-442-3180 surface treatment, and vacuum Email: [email protected] chamber cleaning. EM-KLEEN Point electronic GmbH is www.photonics.com and SEMI-KLEEN plasma cleaner an independent supplier of are the most advanced in-situ detectors, acquisition and Photonics Media brings you plasma cleaners for hydrocarbon control systems for electron and the latest research, product contamination removal inside light microscopy. The company information, and business news SEM, FIB and XPS systems. Tergeo is an established leader in for the entire photonics industry. series table plasma cleaner development of electronics Our extensive resources include is designed to handle fragile and software for advanced four magazines -Photonics SEM/TEM samples with unique techniques, and is a leading Spectra, Biophotonics, Industrial direct+remote dual-source design supplier of quantitative systems Photonics and EuroPhotonics- and pulsed mode operation. for 3D surface reconstruction, available in print and digital; electrical characterisation and the Photonics Buyer’s Guide failure analysis. –available in print and online;

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 45 EXHIBITOR DIRECTORY as of May 31, 2018

Rigaku Americas Protochips, Inc. #1238 Raith America, Inc. #637 Corp. #1428 3800 Gateway Centre Blvd - Ste 306 1377 Long Island Motor Parkway 9009 New Trails Dr Morrisville, NC 27560 Suite 101 The Woodlands, TX 77381 Phone: 919-377-0800 Islandia, NY 11749 Phone: 281-362-2300 Email: robert.blatchford@ Phone: 631-738-9500 Fax: 281-364-3628 protochips.com Fax: 631-738-2055 Email: michelle.goodwin@ www.protochips.com Email: joseph.klingfus@ rigaku.com raithamerica.com www.rigaku.com www.raith.com Quantum Design Raith is a leading precision International #608 instrument manufacturer RMC Boeckeler #1031 10307 Pacific Center Court for large area SEM, electron 4650 S Butterfield Dr San Diego, CA 92121 beam lithography, focused Tucson, AZ 85714 Phone: 858-481-4400 ion beam nanofabrication and Phone: 520-745-0001 Fax: 858-481-7410 nanoengineering. Reverse Fax: 520-745-0004 Email: [email protected] engineering of semiconductor Email: [email protected] www.qdusa.com devices strongly benefits from the www.boeckeler.com large area SEM imaging enabled Quantum Design manufactures For more than 65 years RMC by the automation and stability automated material Boeckeler has specialized in of a professional lithography characterization systems nanoscale research and has system architecture, ultra-precise providing temperatures from 0.05 evolved into a worldwide image calibrations, and the to 1000 K and magnetic fields provider of sample preparation nanoscale accuracy of the laser up to 16 tesla, including inserts instruments for electron and interferometer stage. for Raman spectroscopy. They light microscopy. All RMC also distribute nanolithography Boecekler Instruments, including solution for SEM and novel AFM Renishaw Inc #408 array tomography systems, (AFSEM) for integration into SEM/ ultramicrotomes and more FIB/ He ion microscope, thereby 1001 Wesemann Dr are manufactured in Tucson, adding topographic, magnetic, West Dundee, IL 60118 Arizona, by a team of passionate and electric characterization at Phone: 847-286-9953 people, dedicated to the nanometer scales, also termed as Fax: 847-286-9974 development of RMC products corelative analysis. Email: [email protected] and customer support. www.renishaw.com Renishaw is a recognized Quantum Detectors #1416 leader in Raman spectroscopy, Royal Microscopical R104 RAL producing high performance Society #1308 Harwell, Oxford OX11 0QX Raman systems for a range of 37/38 St Clements United Kingdom applications. Whatever your Oxford, OX4 1AJ United Kingdom Phone: 44 1235 44 5795

EXHIBITOR DIRECTORY EXHIBITOR Raman analysis requirements, Phone: 01865 254764 Email: olivia@ Renishaw’s teams of scientists Email: [email protected] quantumdetectors.com and engineers are here to www.rms.org.uk quantumdetectors.com provide you with expert advice, /merlin-for-em/ as well as product, technical, Quantum Detectors, founded in and applications support. 2007, offer detection systems generated out of advanced research and development at globally leading scientific facilities. Our MerlinEM camera - based on Medipix3 technology and with several installations now globally - brings previously unavailable hybrid pixel detector technology to the EM market.

46 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR DIRECTORY as of May 31, 2018 Scientific Instruments & Applications, Inc. #1005 SmarAct Inc #712 Springer Nature #1023 2773 Heath Ln 2140 Shattuck Ave - Ste 1103 233 Meadowlands Pkwy Duluth, GA 30096 Berkeley, CA 94704 Secaucus, NJ 07094 Phone: 770-232-7785 Phone: 415-766-9006 Phone: 201-348-4033 Fax: 770-232-1791 Email: [email protected] Email: customerservice@ Email: [email protected] www.smaract.com springernature.com www.sia-cam.com SmarAct develops and produces www.springer.com The most affordable TEM piezo-based, high-accuracy camera systems for biology, positioning and measuring Syntek Co., Ltd. #T -1434 materials,clinical pathology, systems for industrial or HRTEM, electron diffraction, research applications in the Leading Venture Plaza 2-403 and teaching applications. micro- and nanometer scale. 75-1 Onocho, Tsurumi-ku Side, bottom, and mid-mount Compact positioner systems Yokohama 2300046 Japan EXHIBITOR DIRECTORY configurations and compatible with numerous degrees of Phone: 81-45-500-6603 with existing detectors. Bottom freedom and parallel kinematics, Email: [email protected] port cameras with very large microscopy stages and laser www.syntek.co.jp/en/ field. Diffraction beam stop. interferometers are assembled Are you happy with existing Automatic recording of TEM to customized, complete robotic diamond knife on your operating parameters. systems, and work under ultramicrotome? If you have no conditions like ultrahigh vacuum, choice but to use that tool you cryogenic temperatures, and are in an unfortunate status. Seiwa Optical non-magnetic materials. I can get no satisfaction with America, Inc #1407 this uncompetitive market. Why 3042 Scott Blvd don’t you try Japanese SYM Santa Clara, CA 95054 SPI Supplies #1105, 1106 knife to find new pleasure in Phone: 408-844-8008 206 Garfield Ave your activities? Fax: 408-844-8944 West Chester, PA 19381 Email: [email protected] Phone: 610-436-5400 www.seiwaamerica.com Fax: 610-436-5755 Technotrade International Inc #1205 For over 50 years, Seiwa Email: [email protected] Optical has been a provider of www.2spi.com 7 Perimeter Rd optical components, systems, Manufacturer and distributor of Manchester, NH 03103 and solutions. Our vision sample preparation equipment Phone: 603-622-5011 systems, such as cameras and and consumables for electron Fax: 603-622-5211 microscopes, can be customized microscopy. Complete line Email: markus@ for the user’s unique application of UV and plasma cleaning technotradeinc.com requirements such as wafer systems. Traditional and high www.technotradeinc.com inspection and biological resolution coating options for inspection. Seiwa Optical invites SEM. Scribing and cleaving tools. you to visit our booth to see Backscatter detectors. Wet Cell our infrared microscope, digital II liquid probe system for SEM. microscope, and atomic force mPrep Capsule Systems, as microscope. well as our high quality coated grids. Our expert staff will be on hand to answer questions about products or procedures.

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 47 EXHIBITOR DIRECTORY as of May 31, 2018

Thermo Fisher Ted Pella Inc. #1012 Scientific #1112 Tousimis #1007 PO Box 492477 5350 NE Dawson Creek Dr 2211 Lewis Ave Redding, CA 96049-2477 Hillsboro, OR 97124 Rockville, MD 20851 Phone: 530-243-2200 Phone: 503-726-7500 Phone: 301-881-2450 Fax: 530-243-3761 Fax: 503-726-2570 Fax: 301-881-5374 Email: [email protected] Email: contact.em@ Email: [email protected] www.tedpella.com thermofisher.com www.tousimis.com www.thermofisher.com/em Ted Pella, Inc. is the premier Tousimis is a globally recognized manufacturer & distributor Thermo Fisher Scientific supplies manufacturer of highly reliable of consumables, supplies & innovative solutions for electron CPD systems. We are based in specimen preparation tools, microscopy, spectroscopy the Washington, DC area with including Precision Thinning and microanalysis. Our TEMs, global sales and service support. Equipment, for microscopy DualBeam™ FIB/SEMs and We have over four decades’ applications. We have a comprehensive portfolio of SEMs, experience designing and comprehensive range of SEM combined with software suites, fabricating our CPD systems. mounts & sample holders, take customers from questions to Our CPD process reproducibly TEM Grids & support films, usable data by combining high- preserves micro & Nano 3D Pelcotec™ calibration standards resolution imaging with physical, structure. Current applications & Cressington sample coating chemical, elemental, mechanical include: Biological, MEMS, Gel, systems. We manufacture and electrical analysis across Nano Particle, C-Nanotubes, the PELCO BioWave® Pro+ scales and modes. Graphene, and others. Microwave Tissue Processor and PELCO easiGlow™ Glow Discharge System. TMC #524 TVIPS GmbH #809 15 Centennial Drive Eremitenweg 1 Peabody, MA 01960 82131 Gauting Bayern 0000 Tescan USA #413 Phone: 978-532-6330 Germany 765 Commonwealth Dr - Ste 101 Fax: 978-531-8682 Phone: 498-985-0656-7 Warrendale, PA 15086 Email: sheryl.aleckna@ Fax: 498-985-0848-8 Phone: 724-772-7433 ametek.com Email: [email protected] Fax: 724-772-7434 www.techmfg.com www.tvips.com Email: achesbrough@ TMC provides complete TVIPS manufactures high- tescan-usa.com environmental control performance camera systems www.tescan.com solutions for microscopy: for Transmission Electron Founded in 1991 by a group of from industry-leading floor Microscopy with resolutions managers and engineers from vibration isolation tables and up to 64 megapixel. Image Tesla with its electron microscopy active benchtop platforms for processing software packages history starting in the 1950’s, optical microscopes to high- allow seamless integration

EXHIBITOR DIRECTORY EXHIBITOR today TESCAN is a globally- performance active piezoelectric into any type of microscope. renowned supplier of Focused vibration cancellation systems Our TEM cameras are based Ion Beam workstations, Scanning for SEMs and TEMs. We also on custom designed CMOS Electron Microscopes and Optical offer advanced active magnetic technology with active Microscopes. TESCAN USA is the field cancellation systems and pixel sensors, featuring North American arm of TESCAN acoustic enclosures, as well as high dynamic range and ORSAY Holdings, a multinational environmental surveys to better exceptional acquisition speed. company established by the determine customer needs. merger of the world leading Czech company TESCAN and French company ORSAY PHYSICS.

48 www.microscopy.org/MandM/2018 for up-to-date meeting information Desktop SEM will never be the same again

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© 2018 Thermo Fisher Scientific Inc. All rights reserved. All trademarks are the property of Thermo Fisher Scientific and its subsidiaries unless otherwise specified. EXHIBITOR DIRECTORY as of May 31, 2018 WITec UES, Inc. #505 Voxa #541 Instruments Corp #711 130G Marketplace Blvd 4401 Dayton-Xenia Dr 1001 26th Ave E Knoxville, TN 37922 Dayton, OH 45432 Seattle, WA 98112 Phone: 217-351-9705 Phone: 937-426-6900 Phone: 206-288-3230 Fax: 217-352-6655 Fax: 937-429-5413 Email: [email protected] Email: witecusa@witec- Email: [email protected] www.projectvoxa.com www.ues.com instruments.com Voxa’s Mochii™ is the world’s www.witec.de Robo-Met 3D® is an automated smallest and most portable WITec is a manufacturer of high 3D Metallography system scanning electron microscope resolution optical and scanning for advanced microstructural (SEM). Small enough to bring in probe microscopy solutions investigations of materials. The your carry-on luggage and boot for scientific and industrial system automatically grinds, up over coffee, Mochii is tablet- applications. A modular product polishes, etches and optically driven with X-ray microanalysis line allows the combination of images materials to reveal 3D (EDS) in a compact affordable different microscopy techniques microstructures at micron-level package! http://mymochii.com such as Raman, NSNOM or resolution over large volumes. Voxa also provides Blade™, an AFM in one single instrument Users can capture porosity, ultra-high-throughput industrial for comprehensive and flexible grains, and phase volume automation suite for EM based on analyses of optical, chemical and statistics in 3D to reveal vital Voxa’s conveyer-belt GridStage™. structural properties of a sample. structure-property relationships. Come see Blade and Mochii in action at booth 541.

Vibration Engineering XEI Scientific, Inc. #1006 Consultants #1424 Wiley #832 1755 E Bayshore Rd - Ste 17 Redwood City, CA 94061 446 Old County Rd - Ste 100-304 111 River St Phone: 650-369-0133 Pacifica, CA 94044 Hoboken, NJ 07030 Fax: 650-363-1659 Phone: 831-465-9189 Phone: 201-748-6000 Email: [email protected] Fax: 831-465-9189 Email: [email protected] www.evactron.com Email: [email protected] www.wiley.com www.vibeng.com Evactron® De-Contaminators by Wiley, a global company, helps XEI Scientific are world leaders people and organizations in remote RF plasma cleaning develop the skills and knowledge Vitatech of carbon contamination in they need to succeed. Our online Electromagnetics LLC #1418 vacuum chambers. Evactrons scientific, technical, medical, and use a unique, energy-efficient 115 Juliad Ct - Ste 105 scholarly journals, combined with hollow cathode plasma source Fredericksburg, VA 22406 our digital learning, assessment to generate oxygen radicals plus Phone: 540-286-1984 and certification solutions help UV for dual-action removal of Fax: 540-286-1865 universities, societies, businesses, Email: [email protected] adventitious carbon at turbo

EXHIBITOR DIRECTORY EXHIBITOR governments, and individuals pump pressures. The new www.vitatech.net increase the academic and Evactron E50 De-Contaminator Vitatech Electromagnetics offers professional impact of their work. outperforms other remote plasma full-spectrum electromagnetic cleaners and is easy to use, field (EMF) and radio frequency powerful, compact, and low cost. (RF) interference engineering services for nano tech, science, research, engineering, medical and hospital projects. Scope of services include: EMI/RFI Site Survey, Simulations, EMI Building Assessments, Active Magnetic Field Cancellation, Passive Magnetic Shielding Solutions and more.

50 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR DIRECTORY as of May 31, 2018 zeroK NanoTech ZEISS #624 Corporation #1241 Zygo Corporation #524 One Zeiss Dr 401 Professional Dr - Ste 125 Laurel Brook Road Thornwood, NY 10594 Gaithersburg MD 20879 Middlefield CT 06455 Phone: 914-681-7627 Phone: 240-702-0081 Phone: 860-347-8506 Email: [email protected] Email: [email protected] Email: [email protected] www.zygo.com As the world’s only manufacturer zeroK is developing a line of of light, X-ray and electron/ focused ion beam (FIB) and SIMS For over 45 years, Zygo ion microscopes, ZEISS offers systems that provide unmatched Corporation is a leading global tailor-made microscope systems performance and new capabilities. provider of comprehensive for industry, materials research We offer high performance Cs+ metrology solutions, precision and academia. A well-trained (2 nm focal spots) for FIB and optics, and electro-optical sales force, an extensive support SIMS applications and unique Li+ design and manufacturing infrastructure and a responsive FIB systems for battery research. services for the both research service team enable customers Our systems all use zeroK’s and production applications. to use their ZEISS microscope new, proprietary laser-cooling The company designs and systems to their full potential. technology. manufactures some of the world’s most advanced noncontact 3D measurement systems providing unmatched performance, versatility, reliability, and value.

Evactron® plasma cleaning gives you the fastest carbon removal rate* The Evactron® E50 DeContaminator has:  An External Hollow Cathode plasma source  High RF power for fast chemical etch  No sputter etch damage or debris generated  “POP™” Ignition at high vacuum—no venting needed  Simple push button or bluetooth GUI operation  Less downtime for cleaning and pumpdown Lowest cost + best performance = best value Have it all with the Evactron E50 DeContaminator. *Visit us at M&M booth #1006 for details.

WWW.EVACTRON.COM 16503690133

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 51 EXHIBITOR CATEGORIES as of May 31, 2018

Accessories (miscellaneous) Backscatter Detectors Electron Microscopy Sciences 616 Angstrom Scientific Inc. 1138 El-Mul Technologies 714 Crytur 1414 Gamma Vacuum 807 El-Mul Technologies 714 Herzan LLC 1206 PNDetector GmbH 905 IDES, Inc 437 Point Electronic GmbH 908 Kammrath and Weiss 610 SPI Supplies 1106,1105 LSM Tech LLC T -1430 MEO Engineering Co., DBA PBS&T 330 Books Particle Beam Systems & Technology Cambridge University Press 706 Microscopy Innovations, LLC 718 NanoMEGAS USA 507 Calibration and Reference Standards / Norcada, Inc. 1142 Reference Materials Scientific Instruments & Applications, Inc. 1005 Point Electronic GmbH 908 SPI Supplies 1106, 1105 AFM / STM Accessories Herzan LLC 1206 Camera / Digital Camera Systems - MTI Instruments, Inc. 805 CDC, CMOS, Megapixel Oxford Instruments 838 Advanced Microscopy Techniques Corp. 1111 Quantum Design International 608 Analitex 1412 WITec Instruments Corp 711 Angstrom Scientific Inc. 1138 DECTRIS Ltd 1438 Anti-Contamination Systems Direct Electron, LP 738 Mel-Build Corporation 1410 Gatan, Inc. 824 PIE Scientific LLC 641 PNDetector GmbH 905 Quantum Detectors 1416 Atom Probe Scientific Instruments & Applications, Inc. 1005 CAMECA 524 Seiwa Optical America, Inc 1407 TVIPS GmbH 809 Atomic Force Microscopes ZEISS 624 Angstrom Scientific Inc. 1138 Anton Paar USA 1405 Chemicals Pace Technologies 1404 Bruker Corporation 514 SPI Supplies 1106, 1105 Coxem Co., Ltd 614

EXHIBITOR CATEGORIES EXHIBITOR Hitachi High Technologies America, Inc. 1125 Kleindiek Nanotechnik 1140 Cold Sputtering Equipment Nanoscience Instruments 1406 Coxem Co., Ltd 614 Quantum Design International 608 Seiwa Optical America, Inc 1407 Confocal Microscopes LSM Tech LLC T-1430 Auger Microscopes Renishaw Inc 408 JEOL USA, Inc. 812 WITec Instruments Corp 711 Physical Electronics 716 ZEISS 624

52 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR CATEGORIES as of May 31, 2018

Consulting Detectors cont. Analitex 1412 IXRF Systems, Inc. 1117 BlueQuartz Software 506 J. Kraft Microscopy Services, Inc. 606 DigiM Solution LLC T -1432 PNDetector GmbH 905 EXpressLO LLC 538 Quantum Detectors 1416 FOM Networks, Inc. 542 TVIPS GmbH 809 HREM Research Inc. 906 MEO Engineering Co., DBA PBS&T Particle Beam Systems & Technology 330 Diamond Knives Vitatech Electromagnetics LLC 1418 Electron Microscopy Sciences 616 RMC Boeckeler 1031

Courses/Workshops Syntek Co., Ltd. T-1434 EXHIBITOR CATEGORIES Anton Paar USA 1405 BlueQuartz Software 506 Digital Archiving / Data Storage Electron Microscopy Sciences 616 BlueQuartz Software 506 DigiM Solution LLC T-1432 Critical Point Dryers Angstrom Scientific Inc. 1138 Dual Beam FIB/SEM SPI Supplies 1106, 1105 Applied Beams LLC 1306 Tousimis 1007 BlueQuartz Software 506 Clark-MXR. Inc. 539 Cryoequipment DigiM Solution LLC T-1432 Kammrath and Weiss 610 EXpressLO LLC 538 Mel-Build Corporation 1410 Hitachi High Technologies America, Inc. 1125 RMC Boeckeler 1031 Raith America, Inc. 637 SmarAct Inc 712 Tescan USA 413 ZEISS 624 Crystallographic Mapping zeroK NanoTech Corporation 1241 Edax 530 BlueQuartz Software 506 E Beam Lithography Hinds Instruments, Inc. 540 Clark-MXR. Inc. 539 NanoMEGAS USA 507 JEOL USA, Inc. 812 TVIPS GmbH 809 Point Electronic GmbH 908 Quantum Design International 608 Databases Raith America, Inc. 637 DigiM Solution LLC T-1432 BlueQuartz Software 506 EDS Detector Repairs and Upgrades International Centre for Diffraction IXRF Systems, Inc. 1117 Data (ICDD) 609

Detectors EDS Detectors & Systems Applied Beams LLC 1306 Bruker Corporation 514 Crytur 1414 Coxem Co., Ltd 614 DECTRIS Ltd 1438 Edax 530 Direct Electron, LP 738 IXRF Systems, Inc. 1117 Edax 530 Oxford Instruments 838 El-Mul Technologies 714 PNDetector GmbH 905 Gatan, Inc. 824 Tescan USA 413 Voxa 541

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 53 EXHIBITOR CATEGORIES continued

Electrical Characterization FIB Accessories Angstrom Scientific Inc. 1138 Applied Beams LLC 1306 Ephemeron Labs 508 Bruker Corporation 514 Kleindiek Nanotechnik 1140 Clark-MXR. Inc. 539 Point Electronic GmbH 908 EXpressLO LLC 538 Quantum Design International 608 Herzan LLC 1206 Kammrath and Weiss 610 Electron Backscattered Diffraction Kleindiek Nanotechnik 1140 (EBSD) Mel-Build Corporation 1410 BlueQuartz Software 506 MEO Engineering Co., DBA PBS&T Bruker Corporation 514 Particle Beam Systems & Technology 330 Edax 530 Physical Electronics 716 Gatan, Inc. 824 Ted Pella Inc. 1012 JEOL USA, Inc. 812 Tescan USA 413 Kammrath and Weiss 610 zeroK NanoTech Corporation 1241 Oxford Instruments 838 Physical Electronics 716 Fixatives Tescan USA 413 Electron Microscopy Sciences 616 Tousimis 1007 Electron Microprobes/EPMA CAMECA 524 Fluorescence Microscopy JEOL USA, Inc. 812 Edax 530 Voxa 541 Electron Microscopy Sciences 616 Linkam Scientific Instruments 423 EMI Cancellation ZEISS 624 Herzan LLC 1206 Integrated Dynamics Engineering 803 Focused Ion Beam Systems/ Vitatech Electromagnetics LLC 1418 Workstations Applied Beams LLC 1306 CAMECA 524 Failure Analysis Clark-MXR. Inc. 539 Anton Paar USA 1405 EXpressLO LLC 538 Applied Beams LLC 1306 Hitachi High Technologies America, Inc. 1125 Attolight/Barnett Technical Services 510 MEO Engineering Co., DBA PBS&T DigiM Solution LLC T -1432 Particle Beam Systems & Technology 330 EXHIBITOR CATEGORIES EXHIBITOR Ephemeron Labs 508 Quantum Design International 608 Gatan, Inc. 824 Raith America, Inc. 637 Hinds Instruments, Inc. 540 Tescan USA 413 JEOL USA, Inc. 812 zeroK NanoTech Corporation 1241 Kammrath and Weiss 610 Kleindiek Nanotechnik 1140 FT-IR Microscopy Linkam Scientific Instruments 423 Clark-MXR. Inc. 539 MEO Engineering Co., DBA PBS&T Particle Beam Systems & Technology 330 Linkam Scientific Instruments 423 MTI Instruments, Inc. 805 Pace Technologies 1404 Glow Discharge Cleaning Raith America, Inc. 637 SPI Supplies 1106, 1105 zeroK NanoTech Corporation 1241 Ted Pella Inc. 1012

54 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR CATEGORIES continued

Image Analysis and Processing Micro-CT Scanning Analitex 1412 BlueQuartz Software 506 Applied Beams LLC 1306 DigiM Solution LLC T -1432 BlueQuartz Software 506 Tescan USA 413 Bruker Corporation 514 DigiM Solution LLC T -1432 Micromanipulators Ephemeron Labs 508 Angstrom Scientific Inc. 1138 Hinds Instruments, Inc. 540 Attolight/Barnett Technical Services 510 Hitachi High Technologies America, Inc. 1125 EXpressLO LLC 538 HREM Research Inc. 906 Kleindiek Nanotechnik 1140 Linkam Scientific Instruments 423

MEO Engineering Co., DBA PBS&T EXHIBITOR CATEGORIES Tescan USA 413 Particle Beam Systems & Technology 330 Voxa 541 Oxford Instruments 838 ZEISS 624 SmarAct Inc 712

Microtome and Immuno-Labeling Ultramicrotome Repair Electron Microscopy Sciences 616 RMC Boeckeler 1031 Microscopy Innovations, LLC 718 Microtomes and Ultramicrotomes Ion Pumps New and Rebuilding Angstrom Scientific Inc. 1138 Duniway Stockroom Corp. 720 Electron Microscopy Sciences 616 Gamma Vacuum 807 RMC Boeckeler 1031

Journals Microwave Tissue Processing Cambridge University Press 706 Ted Pella Inc. 1012 International Centre for Diffraction Data (ICDD) 609 Nano Indentation Knife Resharpening/ Anton Paar USA 1405 Resharpening Services Bruker Corporation 514 Kammrath and Weiss 610 Electron Microscopy Sciences 616 Kleindiek Nanotechnik 1140 Nanoscience Instruments 1406 Light Microscopes Pace Technologies 1404 EXpressLO LLC 538 Quantum Design International 608 Linkam Scientific Instruments 423 Olympus America 612 UES, Inc. 505 Nanopositioners & Stages Kleindiek Nanotechnik 1140 ZEISS 624 SmarAct Inc 712 Zygo Corporation 524 Voxa 541

Metallography Equipment Linkam Scientific Instruments 423 Nanoprobes/Mechanical Microprobes Angstrom Scientific Inc. 1138 Pace Technologies 1404 Hitachi High Technologies America, Inc. 1125 UES, Inc. 505 Nanoscience Instruments 1406 Physical Electronics 716 Quantum Design International 608

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 55 EXHIBITOR CATEGORIES continued

New and Used Equipment Raman Spectroscopy/Microscopy cont. Anton Paar USA 1405 Quantum Design International 608 Gamma Vacuum 807 Renishaw Inc 408 J. Kraft Microscopy Services, Inc. 606 WITec Instruments Corp 711 LSM Tech LLC T-1430 MEO Engineering Co., DBA PBS&T Particle Beam Systems & Technology 330 Scanning Electron Microscopes (SEM) Applied Beams LLC 1306 Scientific Instruments & Applications, Inc. 1005 Attolight/Barnett Technical Services 510 ZEISS 624 Clark-MXR. Inc. 539 zeroK NanoTech Corporation 1241 Coxem Co., Ltd 614 Hitachi High Technologies America, Inc. 1125 Optical Filters, Fluorescence Filters Integrated Dynamics Engineering 803 LSM Tech LLC T-1430 J. Kraft Microscopy Services, Inc. 606 JEOL USA, Inc. 812 Other Nanoscience Instruments 1406 Analitex 1412 Point Electronic GmbH 908 FOM Networks, Inc. 542 Raith America, Inc. 637 MSA Mega Booth 1329 SmarAct Inc 712 Zygo Corporation 524 Tescan USA 413 Voxa 541 Phase Identification ZEISS 624 Analitex 1412 CAMECA 524 Scanning Probe Microscope Edax 530 Accessories Hinds Instruments, Inc. 540 Herzan LLC 1206 International Centre for Diffraction JEOL USA, Inc. 812 Data (ICDD) 609 Kammrath and Weiss 610 NanoMEGAS USA 507 SmarAct Inc 712 UES, Inc. 505 Scanning Transmission Electron Plasma Cleaners Microscopes (STEM) E. A. Fischione Instruments, Inc. 424 Coxem Co., Ltd 614 Gatan, Inc. 824 DECTRIS Ltd 1438 PIE Scientific LLC 641 Hitachi High Technologies America, Inc. 1125

EXHIBITOR CATEGORIES EXHIBITOR SPI Supplies 1106, 1105 HREM Research Inc. 906 XEI Scientific, Inc. 1006 JEOL USA, Inc. 812 Nion Company 1338 Point Electronic GmbH 908 Publishers Quantum Detectors 1416 Cambridge University Press 706 TVIPS GmbH 809 International Centre for Diffraction Data (ICDD) 609 Photonics Media 405 Secondary Ion Mass Wiley 832 Spectrometer (SIMS) CAMECA 524 Physical Electronics 716 Raman Spectroscopy/Microscopy zeroK NanoTech Corporation 1241 Anton Paar USA 1405 Clark-MXR. Inc. 539 Linkam Scientific Instruments 423

56 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR CATEGORIES continued

SEM/STEM Digital Imaging Systems Service & Repair Direct Electron, LP 738 Applied Beams LLC 1306 HREM Research Inc. 906 Gamma Vacuum 807 PNDetector GmbH 905 J. Kraft Microscopy Services, Inc. 606 Point Electronic GmbH 908 LSM Tech LLC T -1430 Raith America, Inc. 637 MEO Engineering Co., DBA PBS&T TVIPS GmbH 809 Particle Beam Systems & Technology 330 Voxa 541 Physical Electronics 716 ZEISS 624

SEM Accessories Advanced Microscopy Techniques Corp. 1111 Service Laboratories EXHIBITOR CATEGORIES Applied Beams LLC 1306 Applied Beams LLC 1306 Bruker Corporation 514 Attolight/Barnett Technical Services 510 Edax 530 MEO Engineering Co., DBA PBS&T Particle Beam Systems & Technology 330 El-Mul Technologies 714 Nanoscience Instruments 1406 Gatan, Inc. 824 Herzan LLC 1206 Integrated Dynamics Engineering 803 Software IXRF Systems, Inc. 1117 Analitex 1412 Kammrath and Weiss 610 BlueQuartz Software 506 Kleindiek Nanotechnik 1140 CAMECA 524 MEO Engineering Co., DBA PBS&T DigiM Solution LLC T-1432 Particle Beam Systems & Technology 330 Direct Electron, LP 738 MTI Instruments, Inc. 805 FOM Networks, Inc. 542 Nanoscience Instruments 1406 Gatan, Inc. 824 PIE Scientific LLC 641 HREM Research Inc. 906 PNDetector GmbH 905 International Centre for Diffraction Data (ICDD) 609 Point Electronic GmbH 908 Linkam Scientific Instruments 423 Quantum Design International 608 NanoMEGAS USA 507 SmarAct Inc 712 Objects Research Systems 707 SPI Supplies 1106, 1105 Olympus America 612 Ted Pella Inc. 1012 TVIPS GmbH 809 Tescan USA 413 Tousimis 1007 XEI Scientific, Inc. 1006 Specimen Preparation & Handling Coxem Co., Ltd 614 SEM Stages, Mounts and Holders E. A. Fischione Instruments, Inc. 424 Ephemeron Labs 508 Ephemeron Labs 508 EXpressLO LLC 538 EXpressLO LLC 538 Gatan, Inc. 824 Hitachi High Technologies America, Inc. 1125 Microscopy Innovations, LLC 718 Hummingbird Scientific 605 Nanoscience Instruments 1406 Kammrath and Weiss 610 RMC Boeckeler 1031 Mel-Build Corporation 1410 Ted Pella Inc. 1012 MTI Instruments, Inc. 805 Voxa 541 SmarAct Inc 712 XEI Scientific, Inc. 1006 Tousimis 1007

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 57 EXHIBITOR CATEGORIES continued

Specimen Storage TEM Accessories Microscopy Innovations, LLC 718 Advanced Microscopy Techniques Corp. 1111 PIE Scientific LLC 641 Attolight/Barnett Technical Services 510 Bruker Corporation 514 Spectrometers DECTRIS Ltd 1438 CAMECA 524 Direct Electron, LP 738 Clark-MXR. Inc. 539 Edax 530 Hinds Instruments, Inc. 540 Electron Microscopy Sciences 616 IXRF Systems, Inc. 1117 EXpressLO LLC 538 Linkam Scientific Instruments 423 Gatan, Inc. 824 PNDetector GmbH 905 Herzan LLC 1206 TVIPS GmbH 809 Hummingbird Scientific 605 IDES, Inc 437 SQUID / Superconducting Quantum Integrated Dynamics Engineering 803 Interference Devices IXRF Systems, Inc. 1117 Quantum Design International 608 Mel-Build Corporation 1410 NanoMEGAS USA 507 Norcada, Inc. 1142 Stage Automation PNDetector GmbH 905 Point Electronic GmbH 908 Scientific Instruments & Applications, Inc. 1005 SmarAct Inc 712 SPI Supplies 1106, 1105 Voxa 541 Ted Pella Inc. 1012 Tousimis 1007 Supplies TVIPS GmbH 809 Duniway Stockroom Corp. 720 XEI Scientific, Inc. 1006 Microscopy Innovations, LLC 718 Norcada, Inc. 1142 TEM Specimen Holders SPI Supplies 1106, 1105 Angstrom Scientific Inc. 1138 Clark-MXR. Inc. 539 Surface Analysis E. A. Fischione Instruments, Inc. 424 Anton Paar USA 1405 EXpressLO LLC 538 CAMECA 524 Gatan, Inc. 824 Nanoscience Instruments 1406 Hummingbird Scientific 605 Physical Electronics 716 Mel-Build Corporation 1410

EXHIBITOR CATEGORIES EXHIBITOR Zygo Corporation 524 Norcada, Inc. 1142 Tousimis 1007 Surface Profiling Voxa 541 Anton Paar USA 1405 CAMECA 524 Testing Equipment Nanoscience Instruments 1406 Anton Paar USA 1405 Zygo Corporation 524 Hinds Instruments, Inc. 540 Kammrath and Weiss 610 Tabletop SEM/TEM MTI Instruments, Inc. 805 Angstrom Scientific Inc. 1138 Olympus America 612 Coxem Co., Ltd 614 Pace Technologies 1404 Hitachi High Technologies America, Inc. 1125 Seiwa Optical America, Inc 1407 Nanoscience Instruments 1406 SmarAct Inc 712 Voxa 541

58 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR CATEGORIES continued Transmission Electron Microscopes (TEM) X-ray Analysis Equipment cont. Clark-MXR. Inc. 539 Oxford Instruments 838 Hitachi High Technologies America, Inc. 1125 Physical Electronics 716 HREM Research Inc. 906 PNDetector GmbH 905 IDES, Inc 437 Tescan USA 413 Integrated Dynamics Engineering 803 ZEISS 624 JEOL USA, Inc. 812 NanoMEGAS USA 507 Physical Electronics 716 Point Electronic GmbH 908 TVIPS GmbH 809 EXHIBITOR CATEGORIES

Vacuum Equipment Denton Vacuum, LLC 1119 Duniway Stockroom Corp. 720 Electron Microscopy Sciences 616 Gamma Vacuum 807 Mel-Build Corporation 1410 Pace Technologies 1404 SmarAct Inc 712

Vacuum Evaporators Denton Vacuum, LLC 1119 SPI Supplies 1106, 1105

Vibration Isolation Systems Herzan LLC 1206 Integrated Dynamics Engineering 803 TMC 524

WDS Detectors & Systems Bruker Corporation 514 Edax 530 Oxford Instruments 838 PNDetector GmbH 905

X-ray Analysis Equipment Anton Paar USA 1405 Bruker Corporation 514 DECTRIS Ltd 1438 Edax 530 El-Mul Technologies 714 IXRF Systems, Inc. 1117 JEOL USA, Inc. 812 Linkam Scientific Instruments 423 Norcada, Inc. 1142 Olympus America 612

MICROSCOPY & MICROANALYSIS 2018 MEETING | August 5-9 | Baltimore, MD 59 EXHIBITOR LIST by company name (as of May 31, 2018)

Company Booth# Company Booth# Company Booth#

Advanced Microscopy Hummingbird Scientific 605 PNSensor GmbH 806 Techniques Corp 1111 ibss Group, Inc. 1237 Point Electronic GmbH 908 Analitex 1412 IDES, Inc. 437 Protochips, Inc. 1238 Angstrom Scientific Inc. 1138 iLab Solutions, part of Quantum Design Anton Paar USA 1405 Agilent Technologies 537 International 608

Applied Beams LLC 1306 Integrated Dynamics Quantum Detectors 1416 Engineering 803 Attolight/Barnett Raith America, Inc. 637 Technical Services 510 International Centre for Diffraction Data (ICDD) 609 Renishaw Inc. 408 BlueQuartz Software 506 IXRF Systems, Inc. 1117 Rigaku Americas Corp. 1428 Bruker Corporation 514 J. Kraft Microscopy RMC Boeckeler 1031 Cambridge University Press 706 Services, Inc. 606 Royal Microscopical Society 1308 CAMECA 524 JEOL USA, Inc. 812 Scientific Instruments & Clark-MXR. Inc. 539 Kammrath and Weiss 610 Applications, Inc. 1005 Keyence Corporation of Coxem Co., Ltd. 614 Seiwa Optical America, Inc. 1407 America 1305 Crytur 1414 SmarAct Inc. 712 Kleindiek Nanotechnik 1140 DECTRIS Ltd. 1438 1105, Ladd Research 705 SPI Supplies 1106 Denton Vacuum, LLC 1119 Leica Microsystems 1038 Springer Nature 1023 DigiM Solution LLC T-1432 Linkam Scientific Syntek Co., Ltd. T-1434 Instruments 423 Digital Surf 425 Technotrade LSM Tech LLC T-1430 Direct Electron, LP 738 International Inc. 1205 Mel-Build Corporation 1410 Duniway Stockroom Corp. 720 Ted Pella Inc. 1012 MEO Engineering Co., Tescan USA 413 E. A. Fischione dba PBS&T Particle Beam Instruments, Inc. 424 Systems Technology 330 Thermo Fisher Scientific 1112 E. Fjeld Co, Inc. 1208 Microscopy Innovations, LLC 718 TMC 524 Edax 530 MSA MegaBooth 1329 Tousimis 1007 Electron Microscopy Sciences 616 MTI Instruments, Inc. 805 TVIPS GmbH 809

El-Mul Technologies 714 NanoMEGAS USA 507 UES, Inc. 505

Ephemeron Labs 508 Nanoscience Instruments 1406 Vibration Engineering Consultants 1424 EXHIBITOR CATEGORIES DIRECTORY EXHIBITOR EXpressLO LLC 538 Nion Company 1338 Vitatech Fluid Imaging Norcada, Inc. 1142 Electromagnetics LLC 1418 Technologies, Inc. 1444 Objects Research Systems 707 Voxa 541 FOM Networks, Inc. 542 Olympus America 612 Wiley 832 Gamma Vacuum 807 838, WITec Instruments Corp 711 Gatan, Inc. 824 Oxford Instruments MR-3 XEI Scientific, Inc. 1006 Herzan LLC 1206 Pace Technologies 1404 ZEISS 624 Hinds Instruments, Inc. 540 Park Systems Inc. 410 zeroK NanoTech HIROX-USA, Inc. 1207 Photonics Media 405 Corporation 1241 Hitachi High Technologies Physical Electronics 716 Zygo Corporation 524 America, Inc. 1125 PIE Scientific LLC 641 HREM Research Inc. 906 PNDetector GmbH 905

60 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR LIST by company name (as of May 31, 2018)

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E Innovation ith Integrity EXHIBITOR LIST by booth number (as of May 31, 2018)

Booth# Company Booth# Company Booth# Company MEO Engineering Co., Electron Microscopy Hitachi High Technologies dba PBS&T Particle Beam 616 Sciences 1125 America, Inc. 330 Systems Technology 624 ZEISS 1138 Angstrom Scientific Inc. 405 Photonics Media 637 Raith America, Inc. 1140 Kleindiek Nanotechnik 408 Renishaw Inc. 641 PIE Scientific LLC 1142 Norcada, Inc. 410 Park Systems Inc. 705 Ladd Research Technotrade 413 Tescan USA 1205 International Inc. 706 Cambridge University Press Linkam Scientific 1206 Herzan LLC 423 Instruments 707 Objects Research Systems 1207 HIROX-USA, Inc. E. A. Fischione 711 WITec Instruments Corp 424 Instruments, Inc. 1208 E. Fjeld Co, Inc. 712 SmarAct Inc. 425 Digital Surf 1237 ibss Group, Inc. 714 El-Mul Technologies 437 IDES, Inc. 1238 Protochips, Inc. 716 Physical Electronics 505 UES, Inc. zeroK NanoTech 718 Microscopy Innovations, LLC 1241 Corporation 506 BlueQuartz Software Keyence Corporation 720 Duniway Stockroom Corp. 507 NanoMEGAS USA 1305 of America 738 Direct Electron, LP 508 Ephemeron Labs 1306 Applied Beams LLC Integrated Dynamics Attolight/Barnett 803 Engineering 1308 Royal Microscopical Society 510 Technical Services 805 MTI Instruments, Inc. 1329 MSA MegaBooth 514 Bruker Corporation 806 PNSensor GmbH 1338 Nion Company 524 CAMECA 807 Gamma Vacuum 1404 Pace Technologies 524 TMC 809 TVIPS GmbH 1405 Anton Paar USA 524 Zygo Corporation 812 JEOL USA, Inc. 1406 Nanoscience Instruments 530 Edax 824 Gatan, Inc. 1407 Seiwa Optical America, Inc. iLab Solutions, part of 537 Agilent Technologies 832 Wiley 1410 Mel-Build Corporation

538 EXpressLO LLC 905 PNDetector GmbH 1412 Analitex

539 Clark-MXR. Inc. 906 HREM Research Inc. 1414 Crytur

540 Hinds Instruments, Inc. 908 Point Electronic GmbH 1416 Quantum Detectors 541 Voxa Scientific Instruments & Vitatech 1005 Applications, Inc. 1418 Electromagnetics LLC

EXHIBITOR CATEGORIES EXHIBITOR 542 FOM Networks, Inc. Vibration Engineering 1006 XEI Scientific, Inc. 605 Hummingbird Scientific 1424 Consultants 1007 Tousimis J. Kraft Microscopy 1428 Rigaku Americas Corp. 606 Services, Inc. 1012 Ted Pella Inc. 1438 DECTRIS Ltd. Quantum Design 608 International 1023 Springer Nature Fluid Imaging 1444 Technologies, Inc. International Centre for 1031 RMC Boeckeler 609 Diffraction Data (ICDD) 1105, 1038 Leica Microsystems 1106 SPI Supplies 610 Kammrath and Weiss Advanced Microscopy 838, 612 Olympus America 1111 Techniques Corp MR-3 Oxford Instruments

614 Coxem Co., Ltd. 1112 Thermo Fisher Scientific T-1430 LSM Tech LLC 1117 IXRF Systems, Inc. T-1432 DigiM Solution LLC

1119 Denton Vacuum, LLC T-1434 Syntek Co., Ltd.

62 www.microscopy.org/MandM/2018 for up-to-date meeting information EXHIBITOR LIST by booth number (as of May 31, 2018) Ultimate Analysis Maximum Versatility Extreme Throughput

Please visit us at Booth #413 M&M 2018, August 5-9, Baltimore, MD www.tescan.com FREIGHT

EXHIBIT HALL

BALTIMORE CONVENTION CENTER as of May 31, 2018 Posters

SHOW OFFICE

1142 1241 145 542 146

1140 1440 439 539440 540 836 837 838 EXIT

01 83 1138 7321 1238 1338 1438 437 537438 538 637

EXIT EXIT 1031 T-1434 832 T-1432

MSA MegaBooth T-1430 430

429 530 1428 EXIT

1023 624 824 1125 1329 1424

425 EXIT UP 423 424 524 720 1119

718 1117 1418

MR 3 616 716 1416

714 1414

614 712 218 2101 1111 1112 1412

MR 2 413 514

612 711 710 809 1410 EXHIBIT HALL EXHIBITHALL 4501 10 906 610 807 908 1007 '' '1207 1208 ' 1308 1407 1408

MR 1 407 408 507 508 608 707 805 905806 906 1005 601150116001 1205 1206 60315031 1405 1406

405 406 505 506 605 606 705 706 803 1404

EXIT EXIT

EL11 EXIT

EXIT ENTRANCE

LOWER PRATT STREET LOBBY 64 FREIGHT

EXHIBIT HALL

Posters

SHOW OFFICE

1142 1241 145 542 146 EXHIBIT HALLEXHIBIT 1140 1440 439 539440 540 836 837 838 EXIT

01 83 1138 7321 1238 1338 1438 437 537438 538 637

EXIT EXIT 1031 T-1434 832 T-1432

MSA MegaBooth T-1430 430

429 530 1428 EXIT

1023 624 824 1125 1329 1424

425 EXIT UP 423 424 524 720 1119

718 1117 1418

MR 3 616 716 1416

714 1414

614 712 218 2101 1111 1112 1412

MR 2 413 514

612 711 710 809 1410

4501 10 906 610 807 908 1007 '' '1207 1208 ' 1308 1407 1408

MR 1 407 408 507 508 608 707 805 905806 906 1005 601150116001 1205 1206 60315031 1405 1406

405 406 505 506 605 606 705 706 803 1404

EXIT EXIT

EL11 EXIT

EXIT ENTRANCE

LOWER PRATT STREET LOBBY 65 Stay Connected.

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Available in print and digital formats. Introducing the Monarc Cathodoluminescence System

To contribute to Photonics Media publications submit a 100-word abstract to Redefining what’s possible in CL microscopy [email protected] for consideration. The Monarc™ offers the most powerful analysis of optical properties below the diffraction limit. Revealing the wavelength, angle, and polarization distributions of luminescence correlated directly with sample ® structure and composition at spatial resolutions better than 10 nm.

Image: Composite wavelength-filtered image extracted from a hyperspectral data cube acquired with the Monarc of a GaN/InGaN MQW sample with V-pit defects (R = 504 ± 2 nm, G = 435 ± 2 nm, V = 365 ± 2 nm).

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