Official Meeting Guide & Exhibitor Information

Official Meeting Guide & Exhibitor Information Exhibitor Guide http://microscopy.org/MandM/2017 INCLUDED! s r a e y 751942-2017 Hitachi Solutions at M&M 2017 Hitachi provides comprehensive solutions to support your success inside the lab Low-Voltage STEM/SEM and beyond through innovative, reliable, analytical ergonomic, and robust products. STEM + Hitachi EELS Have your private demo of Hitachi’s + EDX performance surpassing 2 sr @ 200 kV latest solutions at M&M 2017! Schedule your demo in advance at: [email protected]

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QUESTIONS? Questions regarding the technical content of the meeting or regarding specific sessions may be directed to:

2017 PROGRAM CHAIR Jay Potts, University of South Carolina [email protected] August 5-9, 2018 Baltimore, MD REGISTRATION IS OPEN. Please direct questions regarding registration to: [email protected]

Questions regarding exhibits and exhibitors may be directed to: August 4-8, 2019 [email protected] PORTLAND, OR Questions regarding sponsors or sponsorships may be directed to: [email protected] Please direct all other meeting-related questions to: [email protected]

Are You A Member? August 2-6, 2020 Join Today and Save on M&M MILWAUKEE, WI 2017 Registration Fees!

Visit http://microscopy.org to join the Microscopy Society of America online, or call 703-234-4115 for more information about the benefits of MSA membership. August 1-5, 2021 PITTSBURGH, PA

Visit http://microanalysissociety.org to join the Microanalysis Society and find out information about MAS membership benefits.

July 31-August 4, 2022 Visit http://fieldemission.org for PORTLAND, OR membership information on the International Field Emission Society.

On the cover: “Micro-Sailboat Racing” Dale Hensley and Bernadeta Srijanto, Oak Ridge National Laboratory, 2016 MSA Micrograph Contest Entry “Cascading Confetti” Eric Formo, University of Georgia, First Place Winner of the 2016 MSA Micrograph Competition

MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO [3] Single Particle Analysis A workflow that is pushing the boundaries of modern science

Cryo-EM structure of F-actin decorated with tropomyosin at 3.7Å resolution. Courtesy of Max Planck Institute of Molecular Physiology, Dortmund, Germany.

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On behalf of the sponsoring societies, we invite you to join us August 6-10 Contents in St. Louis, Missouri for Microscopy & Microanalysis 2017. The theme of the M&M 2017 meeting is “Anniversaries.” At this meeting the Microscopy Future Meeting Dates ...... 3 Society of America and the Microanalysis Society, which established the joint M&M meeting format more than twenty years ago, will celebrate Welcome Letter ...... 5 their 75th and 50th anniversaries, respectively. We are pleased to feature special commemorative logos for each society during this anniversary year. Sponsors ...... 6 In addition, the M&M meeting is cosponsored for the first time by the International Field Emission Society to commemorate the 50th anniversary Advertiser Index ...... 6 of the invention of the atom probe. Sustaining Members ...... 9 The meeting’s Week at a Glance Schedule is on pages 25-32. We are Registration ...... 10 excited to offer special anniversary programming this year! Anniversary lectures by pioneering figures in microscopy and microanalysis will be Essential Meeting & Venue featured in special morning and midday sessions. You’ll be able to hear Information ...... 12 about the development and future prospects for instrumentation and techniques that are at the forefront of our field today, while enjoying some Convention Center Floor Plan . . . . 14 complimentary coffee and a breakfast item. MSA’s Student Council will Hotel, Travel & City Information . . 15 be hosting an inaugural pre-meeting event on Saturday that will treat attendees to a sampling of the best work, across scientific disciplines, Social Events & Onsite Awards . . . 16 presented at the meeting by early career scientists.

Anniversary Lectures ...... 18 The meeting itself will be preceded by our usual array of Sunday Short Courses as well as four Pre-Meeting Congresses. The technical program Meetings & Special will kick off with our annual Monday morning plenary session, featuring Events Schedule ...... 20 the major awards ceremonies for the sponsoring societies, the M&M Highlights & Awards ...... 22 meeting awards, and two exciting plenary talks by Eric Betzig, winner of the 2014 Nobel Prize in Chemistry “for the development of super-resolved Megabooth ...... 24 fluorescence microscopy,” and Keith Riles, a member of the LIGO Scientific Collaboration that in 2015 detected gravitational waves, a prediction of Week At-A-Glance Einstein’s theory of general relativity. Following the plenary session, the Friday ...... 25 Exhibition Hall opens to attendees, the largest annual exhibition in the Saturday ...... 25 field showcasing the latest state-of-the-art instrumentation and accessories Sunday ...... 25 in microscopy and microanalysis. Educational opportunities throughout Monday ...... 25 the week include tutorials covering select topics in physical and biological sciences, educational outreach sessions for students and teachers, our Tuesday ...... 27 Technologists’ Forum, and our ever-popular vendor tutorials, held Monday Wednesday ...... 29 through Wednesday after the Exhibit Hall closes. M&M 2017 will provide Thursday ...... 31 you with the opportunity to stay abreast of the latest new technologies, hear the latest developments in the techniques and applications of all Exhibitor Directory ...... 33 areas of microscopy and microanalysis, and most importantly network with Exhibitor Categories ...... 51 colleagues. As the saying goes: “Meet me in St. Louis!”

Exhibitor List by Booth ...... 60 Ian M. Anderson Masashi Watanabe David J. Larson President, President, President, International Exhibitor List by Name ...... 62 Microscopy Society Microanalysis Society Field Emission Society of America Exhibit Hall Diagram ...... 64

MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO [5] > 2017 Sponsors

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Company Page # Company Page # Amptek, Inc. 33 Hitachi High Technologies America, Inc. 2 International Centre For Diffraction Data Applied Beams, LLC 34 19 (ICDD) Bruker Corporation 8 IXRF Systems, Inc. 50 Diatome 13 Kammrath and Weiss 17 Digital Surf 19 Nion Company 63 Duniway Stockroom Corp. 36 Photonics 49 EDAX 23 Scienion US, Inc. 61 Electron Microscopy Sciences 68 Ted Pella Inc. 56-57 Evactron 37 Tescan USA 7 EXpressLO, LLC 38 Thermo Fisher Scientific 4 Gatan, Inc. 67 Zeiss 11

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(as of June 1, 2017) 3Scan Lehigh Microscopy School Advanced MicroBeam, Inc. Leica Microsystems, Inc. Advanced Microscopy Techniques Mager Scientific, Inc. Angstrom Scientific Inc. Materials Analytical Services, LLC Applied Physics Technologies, Inc. Micro Star Technologies, Inc. AYO Technologies Inc. Micron, Inc. Birla Carbon Company NanoSpective Boeckeler Instruments Inc Nion Co. Bruker Nano Analytics Ohio State University CAMECA Instruments, Inc. Oxford Instruments America, Inc. Carl Zeiss Microscopy, LLC Pace Technologies Carnegie Mellon University PNDetector GmbH Denton Vacuum LLC Probe Software, Inc. Diatome U.S. Protochips, Inc. Direct Electron, LP PulseTor, LLC Duniway Stockroom Corp. RaySpec Ltd (used to be SGX Sensortech) E.A. Fischione Instruments, Inc. Scientific Instrumentation Services, Inc. EDAX Inc. SEMTEC Laboratories, Inc. Electron Microscopy Sciences SEMTech Solutions, Inc. EMSIS GmbH Separation Science EXpressLO LLC South Bay Technology, Inc. FEI Company SPI Supplies/Structure Probe, Inc. Gatan, Inc. Ted Pella, Inc. Geller MicroÅnalytical Laboratory, Inc. TESCAN USA Grant Scientific Corp. Thermo Fisher Scientific, Inc. HGST Tousimis Research Corporation Hitachi High Technologies America, Inc. TSS Microscopy LLC HREM Research Inc. XEI Scientific, Inc. Hummingbird Precision Machine Co. Hysitron, Inc. ibss Group, Inc. International Centre for Diffraction Data IXRF Systems, Inc. 2017 JEOL USA, Inc

[9] www.microscopy.org/MandM/2017 for up-to-date meeting informationMICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO [9] > Registration

Online registration will be open until AUGUST 2. We encourage you to register in advance and as early as possible!

• For the most up-to-date registration information, visit http://www.microscopy.org/MandM/2017 • Registration can be done either online at: http://www.microscopy.org/MandM/2017/registration or onsite at the meeting registration desk. • Member rates apply to all members (MSA, MAS, IFES). Membership will be verified.

Onsite Registration Desk Speaker and Awardee Reimbursement Desk America’s Center Convention Complex is located at Registration and will be open Sunday – Thursday during the meeting. Stop by at your Pick up your badge and materials at the Registration convenience to submit your form and receipts. desk according to the schedule below. The Sunday Social starts at 6:30 pm in the Grand Ballroom, which is at the Marriott St Louis Grand Hotel across the street. You must have your badge and ticket to enter the reception. M&M 2017 plenary Registration Hours: sessions begin on Thursday, August 3* 1:00 pm – 5:00 pm Monday, August 7 at Friday, August 4* 8:00 am – 1:00 pm 8:30 AM. Symposia end Friday, August 4 1:00 pm – 6:00 pm on Thursday, August 10 Saturday, August 5 8:00 am – 6:00 pm Sunday, August 6 7:00 am – 7:30 pm at 5:00 PM. Please Monday, August 7 7:00 am – 6:00 pm plan your travel Tuesday, August 8 7:30 am – 5:00 pm accordingly! Wednesday, August 9 7:30 am – 5:00 pm Thursday, August 10 7:30 am – 3:00 pm *EXHIBITORS ONLY

Commercial Exhibition Hours: Monday, August 7 12:00 pm – 5:30 pm Tuesday, August 8 10:00 am – 5:30 pm Wednesday, August 9 10:00 am – 5:30 pm Thursday, August 10 10:00 am – 2:00 pm

Exhibitor Move-In:

Thursday, August 3 8:00 am – 4:00 pm Targeted Island Booths Only Friday, August 4 8:00 am – 4:30 pm Saturday, August 5 8:00 am – 4:30 pm Sunday, August 6 8:00 am – 4:30 pm

Exhibitor Move-Out: Thursday, August 10 2:00 pm – 7:00 pm Friday, August 11 8:00 am – 5:00 pm

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www.zeiss.com/crossbeam > Essential Meeting & Venue Information

Accessibility Job & Resume Postings/ Proceedings If you require special accommodation Placement Office Conference Proceedings are distributed in order to participate fully in the See MSA MegaBooth info on Page 22. at Registration. All Full Meeting meeting, please ask to speak with Post your company’s or department’s job registrations include a free copy of the meeting manager, or email listing, peruse posted resumes for that the proceedings on digital medium. [email protected]. perfect job candidate, or post your own Hard-copy proceedings are available for Requests made after July 1 or onsite at resume. Take advantage of thousands of purchase through Cambridge University the meeting will be accommodated as microscopists and microscopy companies Press (allow several weeks for delivery). much as possible. all gathered in one place! Go to the MSA Inquire at the Registration Desk or MegaBooth (Exhibit Hall) for details. email: [email protected]. Awards Major Society Awards for MSA, MAS, M&M 2018 – Meeting & MAS Booth and IFES, along with M&M student MAS has a membership and information awards, will be presented at the City Information booth located in the main registration Plenary Session immediately following Stop by for advance information on foyer on the 1st level outside the exhibit the first Keynote Talk (Monday the 2018 M&M Meeting in Baltimore, hall entrance. Sign up for membership, morning). For detailed listings of all Maryland! The 2018 booth is located get information on Society events at or awards, criteria, and award winners, in the main registration area, and after the M&M Meeting, and find out all please visit http://microscopy.org/ has visitors guides, maps, and other it has to offer. MandM/2017. important information about Charm City. Smoking Policy: Cancellation and Refund Policy MSA MegaBooth [Booth #304] M&M 2017 is a smoke-free meeting. Refund requests received prior to See complete details on Page 22. If you wish to smoke, you will need July 21, 2017 will be honored less a Check out all that MSA has to offer its to go to designated outdoor areas. $60 administrative fee. No refunds members and M&M attendees: Free will be issued for cancellations (for Internet Café, book display from scientific publishers, updated information on the Tote Bags any reason) received on or after July All non-Exhibitor Meeting Registrants 21, 2017, and no refunds will be Certification Board, and a DVD Library. Register for the popular Vendor Tutorials, are entitled to a meeting tote bag. Bags issued onsite in St. Louis, MO. Email: are distributed in the registration area. MMRegistration@conferencemanagers. sign up for MSA Membership, check com or fax (703) 964-1246. out recent editions of Microscopy Today, learn about Project MICRO, and join the Volunteer Room Technologists’ Forum. The volunteer & student bursary office is Food for Purchase in the 116 Show Office on the st1 level. Inexpensive, portable breakfast and Phone Numbers & Information Check in here for volunteer assignments snack items are available for purchase and sign-outs. in the convention center on the ground • America’s Center Convention Complex level (7:30 am – 10:30 am). Lunch Main: (314) 342-5036 concessions are available for purchase • Exhibitor Services: https:// inside the exhibit hall during lunch explorestlouis.com/meetings- hours (11:00 am – 2:00 pm). conventions/americas-center/exhibitor- information/ • Downtown Urgent Care: St. Louis & Regional (314) 436-9300; Visitor Information http://stlhealthworks.com/ Stop by the Explore St. Louis booth located inside the convention center to pick up local information including maps, dining guides, tour info, and visitor information on St. Louis and surrounding areas.

Internet & Email Free wireless internet is available for M&M attendees in the America’s Center Convention Complex. Check your email and surf the web at the Internet Café inside the M&M exhibit hall during exhibit hours (located next to the MSA MegaBooth). For more information on the MegaBooth, see page 22.

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[14] www.microscopy.org/MandM/2017 for up-to-date meeting information 13TH C M C L O SHERATON C U H Hotel, Travel, & City Information A O L

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HOTELS & RESERVATIONS Getting to & around St. Louis The open reservations portal, as well as the most current listing of available The St. Louis-Lambert International Airport hotels and rates, is available at: http://www.microscopy.org/MandM/2017/ (STL) is located only 14 miles (roughly 20 hoteltravel/hotel.cfm. minutes by car) from downtown St. Louis. Book your room through the M&M 2017 Housing Bureau, and get an The airport features free Wi-Fi, guest services immediate reservation confirmation. A valid credit card is required to information and assistance center, and several reserve a room. restaurants, stores, and personal-services outlets. Visit http://flystl.com/ for detailed Maps showing the location of the hotels and convention center are information about the airport. available on the Explore St. Louis website and are downloadable from: https://explorestlouis.com/travel-tools/maps/. Ground Transportation

CAR/VAN/SHUTTLE: Visit http://www.flystl.com/parking-and- transport/parking for detailed information on taxi service, limousine service, and scheduled shuttle service fees and schedules.

MORE ST. LOUIS TRAVEL INFO: For detailed attraction, tour, dining, and travel information for visitors, please visit Explore St. Louis at www.explorestlouis.com

MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO [15] > Social Events & Onsite Awards s r

M&M 2017 Sunday Evening Social Event a e y MARRIOTT ST LOUIS GRAND HOTEL – MAJESTIC BALLROOM 751942-2017 SUNDAY, AUGUST 6, 2017 | 6:30 PM - 9:00 PM Micrograph Competition One ticket is included with most registrations (see Registration Page for details). This micrograph competition promotes ADDITIONAL TICKETS: the innovative blending of art and $80 each for adults; $35 each for children 12 and under. science. Open to all forms of microscopic *PLEASE NOTE: Onsite availability of tickets is not guaranteed. Register for imaging, winners of this competition are the meeting and buy extra tickets early to be sure that you’re able to attend. selected on the basis of artistic merit and This year’s welcome event at the general audience appeal. A maximum of Marriott St. Louis Grand Hotel will three (3) cash awards will be presented. Winners and runners-up will have the be a fun and informal get-together. chance to see their work published in Enjoy a delicious Midwest-inspired a conference brochure for M&M 2018! supper buffet; catch up with friends Bring your best work with you to St. Louis and colleagues. Remember that and enter the competition! Boards for St. Louis is the ultimate Anheiser- posting your work will be in the M&M Busch “company town”! After the 2017 registration area. For competition rules and details, go to: reception, grab some old and new http://www.microscopy.org/MandM/ friends and check out some of the 2017/meetings/apply_award.cfm watering holes in Laclede’s Landing

and the Ballpark Village area. s r a e y 751942-2017 Student Poster Awards (Immediately following daily Poster Presentations & Happy Hours!) MAS Social Event – Poster presentations are an excellent format for MAS Members Only! for all participants to engage in intensive discussion with other researchers in the WEDNESDAY, AUGUST 9, 2017 | 6:30 PM - 9:00 PM field. MSA provides cash awards to the Stop by the MAS booth in the lobby to check your most outstanding student posters (first membership status and pick up your ticket for the author) each day (up to two in each of three MAS social event on Wednesday evening, August 9 – categories). Student poster awards will be presented immediately following each day’s immediately following the MAS Business Meeting. poster session, in the Exhibit Hall.

[16] www.microscopy.org/MandM/2017 for up-to-date meeting information

> Anniversary Lectures Talks Given by Pioneering Figures in Microscopy & Microanalysis

TH MSA 75TH ANNIVERSARY LECTURE IN MAS 50 ANNIVERSARY LECTURE IN THE BIOLOGICAL SCIENCES: THE ANALYTICAL SCIENCES: Development of High-Resolution Microanalysis: What is it, Where did it TEM for Imaging Native, Radiation- come from, and Where is it going? Sensitive Biomolecules Dale E. Newbury, NIST Fellow, National Institute of Standards and Technology Robert M. Glaeser, Lawrence Berkeley National Laboratory, University of California, Berkeley, CA “Microanalysis” in the Microanalysis Society parlance refers to spatially-resolved elemental and molecular analysis performed at Following the commercial introduction of “direct detection” the micrometer to nanometer to picometer scales. Our “founding cameras in ~2012, single-particle electron cryo-microscopy father”, Raymond Castaing, achieved the first practical elemental (cryo-EM) has produced atomic-resolution structures for a microanalysis at the micrometer scale in his seminal PhD large number of biological macromolecules. This new capability thesis of 1951, wherein he not only made the first successful requires that the native, hydrated structure be maintained during microprobe instrument for electron-excited x-ray spectrometry imaging, of course. This is something that, at first glance, is but also described the physical basis for converting the measured not compatible with putting specimens into the vacuum of the x-ray intensities into concentration values. Electron-excited x-ray electron microscope. Furthermore, ionization damage happens microanalysis has been the backbone of MAS and its predecessors so easily for such specimens that high-resolution features are too (EPASA, the Electron Probe Analysis Society of America and the noisy to be discerned in images recorded with a “safe” exposure. Microbeam Analysis Society), and it has been joined by other While practical work-arounds have partially circumvented these excitation beams (ions and photons) and spectrometries (ion, problems, current results still fall well short of what is physically electron, and photon). Although every niche in excitation-detection possible. Additional technical improvements are thus very combinations has been explored, present excitement comes welcome and, indeed, expected. These include reliable phase from exploiting large scale data structures collected as multi- plates, which have just begun to appear, and cameras whose dimensional spectrum images with the advanced software systems quantum efficiency is at least 2x-improved at high resolution. that can mine these vast structures for the information contained therein. The future as always is unpredictable, but improvements in spatial resolution, efficiency, and specificity are likely.

MSA 75TH ANNIVERSARY LECTURE IN THE PHYSICAL SCIENCES: Smarter than an iPhone: The TH Emergence of the Modern Microscope IFES LECTURE MARKING THE 50 ANNIVERSARY OF THE INVENTION OF Ondrej L. Krivanek, Nion R&D, Dept of Physics, Arizona State University THE ATOM PROBE: Much like mobile phones, microscopes in general and electron microscopes in particular have made great strides in sophistication, The Point-Projection Microscope power and user-friendliness. The underlying technology is the John A. Panitz, University of New Mexico modern microprocessor, which has automated the mundane, and The Field Emission Microscope, introduced in 1937, was first made the sophisticated readily accessible. Point-Projection Microscope. This talk will highlight the legacy of The progress has happened on many fronts: the first Point-Projection Microscope and its progenies: the Field • microscope optics, which can include several hundred Ion Microscope, the Topografiner and the Atom-Probe. The Atom- independently adjustable optical elements, in order to resolve Probe Field Ion Microscope was introduced in 1967. For the first <0.5 Å and <10 meV time a microscope became available that could determine the • autotuning algorithms, which are able to adjust tens of nature of one single atom seen on a metal surface and selected independent optical parameters in quasi-real-time, and make the from neighboring atoms at the discretion of the observer. In 1973 instrument user-friendly despite all the optical elements “under the 10 cm Atom Probe was introduced. Patented in 1975 as the the hood” Field Desorption Spectrometer and dubbed the Imaging Atom- • detectors, which are getting close to the ultimate: capturing the X, Probe, it allowed individual atoms to be identified and imaged as a Y, t (time) and E (energy) signature of every arriving electron function of depth from the surface; thereby becoming the first 3-D • analysis software, which is able to separate weak signals from Atom Probe, Today, the Atom .Probe has emerged as an important noise and discern subtle data patterns in data sets amounting to tool in the arsenal of tools used to develop new materials for many Gigabytes. technology and industry. As Atom Probe technology advances new This talk will review the progress made, and provide practical vistas of exploration will emerge, continuing the unique legacy of examples of new capabilities. the Point-Projection Microscope.

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As of June 1. Please check the onsite program or your committee chair/liaison to confirm!

All events held at America’s Center Convention Complex unless otherwise noted.

Friday, August 4, 2017 TIME MSA Council 8:30 AM

Saturday, August 5, 2017 TIME MSA Council 8:30 AM

Sunday, August 6, 2017 TIME IFES Steering Committee 9:00 AM MAS Council 9:00 AM

Microscopy Today Editors & Editorial Board 3:00 PM Sunday Evening Social Events 6:30 PM Marriott St. Louis Grand Hotel

Monday, August 7, 2017 TIME Technologists’ Forum Board 7:15 AM MSA Awards + Fellows Committees 7:15 AM

MaM Editorial Board 12:15 PM MAS Meal with a Mentor 12:15 PM FOM FIG Roundtable 12:15 PM FIG: Diagnostic Microscopy 12:15 PM FIG: Focused Ion Beam 12:15 PM FIG: Atom Probe Field Ion Microscopy 12:15 PM Technologists’ Forum Business Meeting 3:30 PM MSA-CUP Book Series Advisory Board 4:15 PM

Student Mixer 5:30 PM

Vendor Tutorials in Exhibit Hall (Sign up in advance at MSA MegaBooth) 5:45 – 6:45 PM

All room locations will be printed in the Onsite Program and published in the M&M 2017 Mobile App (available 2 weeks prior to the meeting).

[20] www.microscopy.org/MandM/2017 for up-to-date meeting information > Meetings & Special Events Schedule

As of June 1. Please check the onsite program or your committee chair/liaison to confirm!

All events held at America’s Center Convention Complex unless otherwise noted.

Tuesday, August 8, 2017 TIME MSA Local Affiliated Societies & MAS Affiliated Regional Societies 7:15 AM M&M 2018 – Program Planning for Symposium Organizers 10:00 AM MSA Distinguished Scientists Awardee Lectures 12:15 PM FIG: Cryo-preparation 12:15 PM FIG: Electron Microscopy in Liquids and Gases 12:15 PM FIG: Electron Crystallography 12:15 PM FIG: FOM (Lunch Meeting) 12:15 PM

FIG: MicroAnalytical Standards 12:15 PM FIG: 3D EM in the Biological Sciences 3:00 PM MSA Education Committee 3:30 PM FIG Business Meeting 3:30 PM Post-Doc Reception 5:30 PM MSA Student Council 5:30 PM

Vendor Tutorials at the Exhibit Hall (Sign up in advance at MSA MegaBooth) 5:45 – 6:45 PM

Presidents’ Reception (Invitation Only) Offsite

Wednesday, August 9, 2017 TIME MSA Certification Board 7:15 AM MSA Membership Committee 7:15 AM MAS - ANSI Meeting Tentative MSA Members’ Meeting 12:15 PM FIG: Pharmaceuticals 12:15 PM MAS Business Meeting 5:15 PM

Vendor Tutorials in Exhibit Hall (Sign up in advance at MSA MegaBooth) 5:45 PM – 6:45 PM

MAS Members Social (See MAS Booth for Details) Offsite

Thursday, August 10, 2017 TIME M&M Sustaining Members 8:30 AM MSA Standards Committee 12:15 PM

M&M 2017 Wrap-Up & Debrief (by invitation only) 5:30 PM

MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO [21] > Highlights & Awards

Additional MSA

Plenary Session Talks s r

Major Society a e y MONDAY, AUGUST 7, 2017 Award Winners 751942-2017 AMERICA’S BALLROOM, AMERICA’S CENTER CONVENTION COMPLEX BURTON MEDAL For speaker bios and presentation details, visit Christopher Russo, MRC Laboratory of http://www.microscopy.org/MandM/2017/program/plenary.cfm Molecular Biology, Cambridge, UK

ALBERT CREWE AWARD Eric Betzig, PhD Pishane Huang, University of Illinois, Janelia Farm Research Campus, Ashburn, VA Urbana-Champaign, IL Imaging Life at High GEORGE PALADE AWARD Rengasayee Veeraraghavan, Virginia Tech Spatiotemporal Resolution Carilion Research Institute, Roanoke, VA

MASER DISTINGUISHED SERVICE AWARD Keith Riles, PhD David Tomlin, Azimuth Corporation, Dayton, OH University of Michigan, Ann Arbor, MI HILDEGARD H. CROWLEY AWARD FOR OUTSTANDING Detecting Massive Black Holes TECHNOLOGIST, BIOLOGICAL SCIENCES via Attometry—Gravitational Wave Patricia Connelly, NHLBI, NIH (retired) Astronomy Begins CHUCK FIORI AWARD FOR OUTSTANDING TECHNOLOGIST, PHYSICAL SCIENCES Richard Martens, University of Alabama, Tuscaloosa, AL MSA Distinguished Scientist Awards & Talks TUESDAY, AUGUST 8, 2017, 12:15 PM MAS Major Society AMERICA’S CENTER CONVENTION COMPLEX, ROOM TBA Award Winners

DISTINGUISHED SCIENTIST – PHYSICAL SCIENCES PRESIDENTIAL SCIENCE AWARD Nestor Zaluzec Mike Miller, Oak Ridge National Laboratory, Argonne National Laboratory, Lemont, IL Oak Ridge, TN PRESIDENTIAL SERVICE AWARD DISTINGUISHED SCIENTIST – BIOLOGICAL SCIENCES Daniel Kremser, Battelle, Columbus, OH

David Piston PETER DUNCUMB AWARD FOR EXCELLENCE IN Washington University, St. Louis, MO MICROANALYSIS Thomas Kelly, CAMECA Instruments, Inc., Milwaukee, WI

KURT F.J. HEINRICH AWARD FIRST PLACE WINNER OF THE 2016 MSA MICROGRAPH COMPETITION Andrew Herzing, National Institute for Eric Formo, University of Georgia, “Cascading Confetti” Standards and Technology, Gaithersburg, MD

BIRKS BEST CONTRIBUTED PAPER AWARD Ivan Blum, Université et INSA de Rouen, Saint Etienne du Rouvray, France

CASTAING BEST STUDENT PAPER AWARD Adam Sarafian,Woods Hole Oceanographic Institution, Woods Hole, MA

MACRES BEST INSTRUMENTATION/ SOFTWARE PAPER AWARD Pieter Kruit, Delft University of Technology, Delft, The Netherlands

COSSLETT BEST INVITED PAPER AWARD Philipp R. Heck, The Field Museum of Natural History, Chicago, IL

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a MSA MegaBooth e y 751942-2017 in the M&M 2017 Open during all Exhibit Hall exhibit hall hours

The MSA MEGABOOTH showcases all that MSA Check out the BOOK DISPLAY – publisher-donated books, divided into a member, stop by to catch up on all the new biological/physical topics. Several new society developments. Member information titles added every year! Come and browse available at Regular, Sustaining (corporate), and the newest titles. Student levels. CERTIFICATION BOARD – Find out about Sign up for VENDOR TUTORIALS he re! These MSA’s certi cation program for Electron popular sessions are presented on Monday, Microscopy Technologists and how being Tuesday, and Wednesday evenings after the certi ed can help you in your next job search! exhibit hall has closed for the day. Don’t miss out – advance registration is required! MICROSCOPY TODAY and MICROSCOPY and The INTERNET CAFÉ and PHONE CHARGING MICROANALYSIS are the society’s two STATION are open to all meeting attendees publications – one a magazine format, the during all exhibit hall hours. Bring Your Own other a peer-reviewed scienti c journal. Device! Lots of places to sit and rest your feet Information for authors and advertisers is for a few minutes while you charge your available here. mobile phone, check your email, put the nishing touches on your talk, or collaborate EDUCATIONAL OUTREACH – Includes MSA’s with colleagues. educational outreach program. Browse the materials and nd out how to start an outreach The TECHNOLOGISTS’ FORUM (TF): Attention program in your local area. Get details on the special programming at the M&M meeting for grow and develop your skills, your professional educators and kids of all ages. career, and your network by joining the Forum! Visit the updated Project MICRO display to The PLACEMENT OFFICE is MSA’s job-listing service. Post a job, peruse job listings, post a learn about this organization's education and outreach goals. for your job opening. All for FREE during the meeting!

For more information, visit http://microscopy.org

http://microscopy.org/MandM/2014 for program details [23] > Friday, August 4, 2017

8:30 AM MSA Council > Saturday, August 5, 2017

8:30 AM MSA Council 8:30 AM – 5:00 PM Pre-Meeting Congress

X60 – Inaugural Pre-Meeting Congress for Early Career Professionals in Microscopy & Microanalysis > Sunday, August 6, 2017

8:30 AM – 5:00 PM Sunday Short Courses X10 – Specimen Preparation for Biological EM of Resin-embedded Samples: Cryo-methods, Correlative LM-EM and 3-D Imaging X11 – Immunolabeling Technology for Light and Electron Microscopy

X12 – Practical Considerations for Image Analysis and Use of ImageJ/Fiji

X13 – 3-D Reconstruction with SerialEM and IMOD

X14 – Detectors: If You Can’t Detect It, Then You Can’t Measure It WEEK AT-A-GLANCE

X15 – Variable Pressure and Environmental Scanning Electron Microscopy: What Can They Do For Me?

8:30 AM – 5:00 PM Pre-Meeting Congresses

X62 – Smaller, Faster, Better: New Instrumentation for Electron Microscopy

X63 – Understanding Radiation Beam-Damage during Cryo-, ETEM, Gas- and Liquid-Cell Electron Microscopy

9:00 AM MAS Council

9:00 AM IFES Steering Committee 10:00 AM Pre-Meeting Congress

X61 – Focused Ion Beam Applications and Equipment Developments

6:30 PM Sunday Evening Social Event — Marriott St Louis Grand Hotel - Majestic Ballroom > Monday, August 7, 2017

7:15 AM MSA Awards + Fellows Committees

7:15 AM Technologists’ Forum Board

8:30 AM – 12:00 PM M&M 2017 Plenary Sessions

Opening Welcome PLENARY TALK #1: Eric Betzig, Janelia Farm Research Campus, Ashburn, VA Imaging Life at High Spatiotemporal Resolution MAS Awards Presentation IFES Awards Presentation Coffee & Donuts Break MSA Awards Presentation M&M Meeting Awards Presentation PLENARY TALK #2: Keith Riles, PhD, University of Michigan, Ann Arbor Detecting Massive Black Holes via Attometry – Gravitational Wave Astronomy Begins

*Room Locations will be published in the Onsite Program and in the M&M 2017 Meeting App. http://microscopy.org/MandM/2017 | 25 > Monday, August 7, 2017 (Cont’d.)

12:00 PM – 1:30 PM Lunch Break

12:00 PM – 5:30 PM Exhibit Hall Open

12:15 PM MaM Editorial Board

12:15 PM MAS Meal with a Mentor

12:15 PM FOM FIG Roundtable

12:15 PM FIG: Diagnostic Microscopy

12:15 PM FIG: Focused Ion Beam

12:15 PM FIG: Atom Probe Field Ion Microscopy

1:30 PM – 3:00 PM PM Symposia & Sessions

A04 – Advances in Programming of Quantitative Microscopy for Biological and Materials Science A05 – Advances in FIB Instrumentation and Applications in Materials and Biological Sciences A10 – Advances in Scanning Electron Microscopy—Transmission Modes and Channeling Effects A11 – Instrumentation of Atom Probe: 50 Years and Counting A18 – Celebrating 50 Years of Microanalysis B01 – Gina Sosinsky Memorial Symposium: Imaging of Cellular Communications B04 – 3D and Intravital Imaging in Development and Beyond P03 – Advanced Microscopy and Microanalysis of Complex Oxides P06 – Nanoparticles: Synthesis, Characterization, and Applications P08 – Geological Sample Characterization using Various Imaging Modalities 3:00 PM – 5:00 PM Monday Poster Presentations

A02 – Compressive Sensing, Machine Learning, and Advanced Computation in Microscopy A04 – Advances in Programming of Quantitative Microscopy for Biological and Materials Science A10 – Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects A11 – Instrumentation of Atom Probe: 50 Years and Counting WEEK AT-A-GLANCE A18 – Celebrating 50 Years of Microanalysis B01 – Gina Sosinsky Memorial Symposium: Imaging of Cellular Communications B04 – 3D and Intravital Imaging in Development and Beyond P03 – Advanced Microscopy and Microanalysis of Complex Oxides P06 – Nanoparticles: Synthesis, Characterization, and Applications P08 – Geological Sample Characterization using Various Imaging Modalities

3:30 PM Technologists’ Forum Business Meeting

4:15 PM MSA-CUP Book Series Advisory Board Meeting

5:00 PM Student Poster Awards

5:30 PM Student Mixer

5:45 PM – 6:45 PM Vendor Tutorials (Sign up in advance at MSA MegaBooth)

26 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO > Tuesday, August 8, 2017

7:15 AM MSA Local Affiliated Societies & MAS Affiliated Regional Societies

7:30 AM MAS 50th Anniversary Lecture in the Analytical Sciences

X72 – Microanalysis: What Is It, Where Did It Come From, and Where Is It Going? Dale E. Newbury, National Institute of Standards and Technology 8:30 AM – 10:00 AM AM Symposia & Sessions X30 – Tech Forum: Cryo-Tomography of Macromolecular Complexes in Whole Cells: Lessons in Cryo-FIB Milling X42 – Biological Sciences Tutorial: CyroEM with Phase Plates X90 – Microscopy Outreach: Microscopy in the Classroom A02 – Compressive Sensing, Machine Learning, and Advanced Computation in Microscopy A04 – Advances in Programming of Quantitative Microscopy for Biological and Materials Science A05 – Advances in FIB Instrumentation and Applications in Materials and Biological Sciences A07 – Materials Characterization using Atomic-scale EDX/EELS Spectroscopy A10 – Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects A11 – Instrumentation of Atom Probe: 50 Years and Counting A16 – In situ and operando Characterization of Materials Processes in Liquids and Gases A18 – Celebrating 50 Years of Microanalysis B01 – Gina Sosinsky Memorial Symposium: Imaging of Cellular Communications B07 – Bridging the Gap: Technologies and Methods for Correlative Light and Charged Particle Microscopy of Biological Systems WEEK AT-A-GLANCE P01 – Characterization of Semiconductor Materials and Devices P03 – Advanced Microscopy and Microanalysis of Complex Oxides P04 – Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices P06 – Nanoparticles: Synthesis, Characterization, and Applications P07 – Advanced Characterization of Energy-Related Materials P08 – Geological Sample Characterization using Various Imaging Modalities P10 – Diamonds: From the Origins of the Universe to Quantum Sensing in Materials and Biological Science Applications

10:00 AM – 5:30 PM Exhibit Hall Open

10:00 AM – 10:30 AM Coffee Break in Exhibit Hall

10:00 AM M&M 2018—Program Planning for Symposium Organizers

10:30 AM – 12:00 PM AM Symposia & Sessions (Cont’d.)

X32 – Tech Forum: Developing and Applying Light Sheet Imaging Technology to the Study of Dynamic Biological Systems A02 – Compressive Sensing, Machine Learning, and Advanced Computation in Microscopy A04 – Advances in Programming of Quantitative Microscopy for Biological and Materials Science A05 – Advances in FIB Instrumentation and Applications in Materials and Biological Sciences A07 – Materials Characterization using Atomic-scale EDX/EELS Spectroscopy A10 – Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects A12 – Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography A16 – In situ and operando Characterization of Materials Processes in Liquids and Gases A18 – Celebrating 50 Years of Microanalysis B06 – 3D Structures of Macromolecular Assemblies, Cellular Organelles, and Whole Cells B07 – Bridging the Gap: Technologies and Methods for Correlative Light and Charged Particle Microscopy of Biological Systems P01 – Characterization of Semiconductor Materials and Devices P03 – Advanced Microscopy and Microanalysis of Complex Oxides P04 – Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices P06 – Nanoparticles: Synthesis, Characterization, and Applications

*Room Locations will be published in the Onsite Program and in the M&M 2017 Meeting App. http://microscopy.org/MandM/2017 | 27 > Tuesday, August 8, 2017 (Cont’d.)

10:30 AM – 12:00 PM AM Symposia & Sessions (Cont’d.) P07 – Advanced Characterization of Energy-Related Materials P08 – Geological Sample Characterization using Various Imaging Modalities P10 – Diamonds: From the Origins of the Universe to Quantum Sensing in Materials and Biological Science Applications 12:00 PM – 1:30 PM Lunch Break

12:15 PM MSA Distinguished Scientist Awardee Lectures

12:15 PM FIG: Cryo-Preparation

12:15 PM FIG: Electron Microscopy in Liquids and Gases

12:15 PM FIG: Electron Crystallography

12:15 PM FIG: FOM (Lunch Meeting)

12:15 PM FIG: MicroAnalytical Standards 1:30 PM – 3:00 PM PM Symposia & Sessions X31 – Atomic Force Microscopy for Imaging and Materials/Biomaterials: Properties Characterization of Surfaces, Films and Interfaces X43 – Biological Sciences Tutorial: Practical Strategies for Cryo-CLEM Experiments A02 – Compressive Sensing, Machine Learning, and Advanced Computation in Microscopys A05 – Advances in FIB Instrumentation and Applications in Materials and Biological Sciences A06 – Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy A07 – Materials Characterization using Atomic-scale EDX/EELS Spectroscopy A10 – Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects A12 – Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography A16 – In-situ and operando Characterization of Materials Processes in Liquids and Gases A17 – Biological Soft X-ray Tomography A18 – Celebrating 50 Years of Microanalysis B06 – 3D Structures of Macromolecular Assemblies, Cellular Organelles, and Whole Cells B08 – Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals WEEK AT-A-GLANCE P01 – Characterization of Semiconductor Materials and Devices P03 – Advanced Microscopy and Microanalysis of Complex Oxides P04 – Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices P06 – Nanoparticles: Synthesis, Characterization, and Applications P07 – Advanced Characterization of Energy-Related Materials P08 – Geological Sample Characterization using Various Imaging Modalities P10 – Diamonds: From the Origins of the Universe to Quantum Sensing in Materials and Biological Science Applications 3:00 PM – 5:00 PM Tuesday Poster Presentations X90 – Microscopy Outreach: Microscopy in the Classroom A06 – Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy A07 – Materials Characterization using Atomic-scale EDX/EELS Spectroscopy A10 – Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects A12 – Reconstruction, Simulations, and Data Analysis in Atom Probe Tomography A18 – Celebrating 50 Years of Microanalysis B06 – 3D Structures of Macromolecular Assemblies, Cellular Organelles, and Whole Cells B07 – Bridging the Gap: Technologies and Methods for Correlative Light and Charged Particle Microscopy of Biological Systems B08 – Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals B09 – Methodologies, Technologies and Analysis of Biological Specimens

28 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO 3:00 PM – 5:00 PM Tuesday Poster Presentations (Cont’d.) P03 – Advanced Microscopy and Microanalysis of Complex Oxides P04 – Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices P06 – Nanoparticles: Synthesis, Characterization, and Applications P07 – Advanced Characterization of Energy-Related Materials P08 – Geological Sample Characterization using Various Imaging Modalities P10 – Diamonds: From the Origins of the Universe to Quantum Sensing in Materials and Biological Science Applications 3:00 PM FIG: 3D EM in the Biological Sciences

3:30 PM FIG Business Meeting

3:30 PM MSA Education Committee

5:00 PM Student Poster Awards

5:30 PM Post-Doctoral Researchers’ Reception

5:30 PM MSA Student Council

5:45 PM Vendor Tutorials (Sign up in advance at MSA MegaBooth)

6:30 PM Presidents’ Reception (Invitation Only) > Wednesday, August 9, 2017 WEEK AT-A-GLANCE

7:15 AM MSA Certification Board

7:15 AM MSA Membership Committee

7:30 AM IFES Lecture Marking the 50th Anniversary of the Invention of the Atom Probe

X73 – The Point-Projection Microscope John A. Panitz, University of New Mexico 8:30 AM – 10:00 AM AM Symposia & Sessions X40 – Physical Sciences Tutorial: Large Scale Data Acquisition and Analysis for Materials Imaging and Spectroscopy A02 – Compressive Sensing, Machine Learning, and Advanced Computation in Microscopy A06 – Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy A07 – Materials Characterization using Atomic-scale EDX/EELS Spectroscopy A08 – Advances and Applications of Aberration-Corrected EM A09 – Standards, Reference Materials, and Their Applications in Quantitative Microanalysis A10 – Advances in Scanning Electron Microscopy—Transmission Modes and Channeling Effects A13 – Applications of Atom Probe Tomography A14 – Nanomechanical Characterization of Materials using Microscopy and Microanalysis Techniques A16 – In-situ and operando Characterization of Materials Processes in Liquids and Gases A17 – Biological Soft X-ray Tomography B06 – 3D Structures of Macromolecular Assemblies, Cellular Organelles, and Whole Cells B08 – Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals P01 – Characterization of Semiconductor Materials and Devices P03 – Advanced Microscopy and Microanalysis of Complex Oxides P04 – Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices P07 – Advanced Characterization of Energy-Related Materials P08 – Geological Sample Characterization using Various Imaging Modalities

*Room Locations will be published in the Onsite Program and in the M&M 2017 Meeting App. http://microscopy.org/MandM/2017 | 29 > Wednesday, August 9, 2017 (Cont’d.)

10:00 AM – 5:30 PM Exhibit Hall Open

10:00 AM – 10:30 AM Coffee Break in Exhibit Hall 10:30 AM – 12:00 PM AM Symposia & Sessions (Cont’d.)

X44 – Biological Sciences Tutorial: Freeze Fracture, Deep-Etch & 3D Anaglyphs A01 – Vendor Symposium A02 – Compressive Sensing, Machine Learning, and Advanced Computation in Microscopy A06 – Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy A08 – Advances and Applications of Aberration-Corrected EM A09 – Standards, Reference Materials, and their Applications in Quantitative Microanalysis A13 – Applications of Atom Probe Tomography A14 – Nanomechanical Characterization of Materials using Microscopy and Microanalysis Techniques A15 – Pushing the Limits of Cryo-TEM: Development and Applications A16 – In-situ and operando Characterization of Materials Processes in Liquids and Gases A17 – Biological Soft X-ray Tomography B06 – 3D Structures of Macromolecular Assemblies, Cellular Organelles, and Whole Cells B08 – Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals P01 – Characterization of Semiconductor Materials and Devices P02 – TEM/STEM/EELS/SNOM of Ultralow Energy Excitations P03 – Advanced Microscopy and Microanalysis of Complex Oxides P04 – Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices P07 – Advanced Characterization of Energy-Related Materials P08 – Geological Sample Characterization using Various Imaging Modalities 12:00 PM – 1:30 PM Lunch Break

12:15 PM MAS - ANSI Meeting (tentative)

12:15 PM MSA Members’ Meeting

12:15 PM FIG: Pharmaceuticals WEEK AT-A-GLANCE 1:30 PM – 3:00 PM PM Symposia & Sessions

X41 – Physical Sciences Tutorial: Entrepreneurship in the Microscopy Community X91 – Family Affair A01 – Vendor Symposium A03 – Big, Deep and Smart Data in Microscopy A08 – Advances and Applications of Aberration-Corrected EM A09 – Standards, Reference Materials, and Their Applications in Quantitative Microanalysis A13 – Applications of Atom Probe Tomography A14 – Nanomechanical Characterization of Materials using Microscopy and Microanalysis Techniques A15 – Pushing the Limits of Cryo-TEM: Development and Applications A16 – In-situ and operando Characterization of Materials Processes in Liquids and Gases B02 – Microstructure Characterization of Food Systems B05 – Pharmaceutical and Medical Science P01 – Characterization of Semiconductor Materials and Devices P02 – TEM/STEM/EELS/SNOM of Ultralow Energy Excitations P03 – Advanced Microscopy and Microanalysis of Complex Oxides P05 – Imaging and Spectroscopy of Beam-sensitive Materials P07 – Advanced Characterization of Energy-Related Materials

30 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO > Wednesday, August 9, 2017 (Cont’d.)

3:00 PM – 5:00 PM Wednesday Poster Sessions A01 – Vendor Symposium A05 – Advances in FIB Instrumentation and Applications in Materials and Biological Sciences A08 – Advances and Applications of Aberration-Corrected EM A09 – Standards, Reference Materials, and Their Applications in Quantitative Microanalysis A13 – Applications of Atom Probe Tomography A16 – In-situ and operando Characterization of Materials Processes in Liquids and Gases B02 – Microstructure Characterization of Food Systems B05 – Pharmaceutical and Medical Science B08 – Utilizing Microscopy for Research and Diagnosis of Diseases in Humans, Plants and Animals P01 – Characterization of Semiconductor Materials and Devices P02 – TEM/STEM/EELS/SNOM of Ultralow Energy Excitations P03 – Advanced Microscopy and Microanalysis of Complex Oxides P04 – Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices P06 – Nanoparticles: Synthesis, Characterization, and Applications P07 – Advanced Characterization of Energy-Related Materials 5:00 PM Student Poster Awards

5:15 PM MAS Business Meeting

5:45 PM Vendor Tutorials (Sign up in advance at MSA MegaBooth) WEEK AT-A-GLANCE 6:30 PM MAS Members’ Social (See MAS Booth for Details) > Thursday, August 10, 2017 7:30 AM MSA 75th Anniversary Lecture in the Biological Sciences X70 – Development of High-resolution TEM for Imaging Native, Radiation-sensitive Biomolecules Robert M. Glaeser, Lawrence Berkeley National Laboratory, University of California, Berkeley 8:30 AM M&M Sustaining Members Meeting 8:30 AM – 10:00 AM AM Symposia & Sessions A01 – Vendor Symposium A03 – Big, Deep and Smart Data in Microscopy A08 – Advances and Applications of Aberration-Corrected EM A13 – Applications of Atom Probe Tomography A14 – Nanomechanical Characterization of Materials using Microscopy and Microanalysis Techniques A15 – Pushing the Limits of Cryo-TEM: Development and Applications A16 – In-situ and operando Characterization of Materials Processes in Liquids and Gases A18 – Celebrating 50 Years of Microanalysis B02 – Microstructure Characterization of Food Systems B03 – Imaging the Biology of Cells and Tissues: Just Do It Right P01 – Characterization of Semiconductor Materials and Devices P02 – TEM/STEM/EELS/SNOM of Ultralow Energy Excitations P03 – Advanced Microscopy and Microanalysis of Complex Oxides P05 – Imaging and Spectroscopy of Beam-sensitive Materials P07 – Advanced Characterization of Energy-Related Materials P09 – Application of Advanced Characterization Methods to Examine Materials Used in Nuclear Power Systems 10:00 AM – 2:00 PM Exhibit Hall Open 10:00 AM – 12:00 PM Coffee Break + Poster Session

*Room Locations will be published in the Onsite Program and in the M&M 2017 Meeting App. http://microscopy.org/MandM/2017 | 31 > Thursday, August 10, 2017 (Cont’d.)

10:00 AM – 12:00 PM Thursday Poster Sessions A03 – Big, Deep and Smart Data in Microscopy A08 – Advances and Applications of Aberration-Corrected EM A13 – Applications of Atom Probe Tomography A14 – Nanomechanical Characterization of Materials using Microscopy and Microanalysis Techniques A15 – Pushing the Limits of Cryo-TEM: Development and Applications A16 – In-situ and operando Characterization of Materials Processes in Liquids and Gases B03 – Imaging the Biology of Cells and Tissues: Just Do It Right P01 – Characterization of Semiconductor Materials and Devices P05 – Imaging and Spectroscopy of Beam-sensitive Materials P07 – Advanced Characterization of Energy-Related Materials P09 – Application of Advanced Characterization Methods to Examine Materials Used in Nuclear Power Systems 12:00 PM Student Poster Awards

12:00 PM – 1:30 PM Lunch Break

12:15 PM MSA Standards Committee 12:15 PM MSA 75th Anniversary Lecture in the Physical Sciences X71 – Smarter Than an iPhone: The Emergence of the Modern Microscope Ondrej Krivanek, Nion R&D, Arizona State University 1:30 PM – 3:00 PM PM Symposia A01 – Vendor Symposium A03 – Big, Deep and Smart Data in Microscopy A08 – Advances and Applications of Aberration-Corrected EM A14 – Nanomechanical Characterization of Materials using Microscopy and Microanalysis Techniques A15 – Pushing the Limits of Cryo-TEM: Development and Applications A16 – In-situ and operando Characterization of Materials Processes in Liquids and Gases A18 – Celebrating 50 Years of Microanalysis

WEEK AT-A-GLANCE B03 – Imaging the Biology of Cells and Tissues: Just Do It Right B05 – Pharmaceutical and Medical Science P01 – Characterization of Semiconductor Materials and Devices P05 – Imaging and Spectroscopy of Beam-sensitive Materials P07 – Advanced Characterization of Energy-Related Materials P09 – Application of Advanced Characterization Methods to Examine Materials Used in Nuclear Power Systems 3:00 PM – 3:30 PM Coffee Break 3:30 PM – 5:00 PM Late PM Symposia A01 – Vendor Symposium A15 – Pushing the Limits of Cryo-TEM: Development and Applications A18 – Celebrating 50 Years of Microanalysis B03 – Imaging the Biology of Cells and Tissues: Just Do It Right B05 – Pharmaceutical and Medical Science P05 – Imaging and Spectroscopy of Beam-sensitive Materials P09 – Application of Advanced Characterization Methods to Examine Materials Used in Nuclear Power Systems 5:30 PM M&M 2017 Wrap-Up & Debrief (By invitation only)

32 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO > Exhibitor Directory 19th International Microscopy Congress (IMC19) c/o Arinex Pty Ltd #418 Amptek Inc. #309 Angstrom Science, Inc. #1624 Level 10 51 Druitt Street 14 De Angelo Dr 5425 Hollister Avenue, Suite 110 Sydney NSW 2000 Australia Bedford, MA 01730 Santa Barbara, CA 93111 Phone: +61292650700 Phone: 781-275-2242 Phone: 805-845-7446 Email: [email protected] Fax: 781-275-3470 Email: [email protected] Web: www.imc19.com Email: [email protected] Web: www.amptek.com Join us at IMC19 to be held 9–14 Angstrom Scientific Inc. #1210 September 2018, in the heart of Sydney, Australia. We are planning 120 N Central - Ste 3 Analitex #329 an outstanding scientific program led Ramsey, NJ 07446 by world renowned speakers that will Akerbyvagen 186 Phone: 201-962-7222 showcase exciting new developments Taby 18737 Sweden Fax: 201-962-8290 and demonstrate the transformational Phone: 46 703 911598 Email: [email protected] role of microscopy in underpinning a Email: [email protected] Web: www.angstrom.us range of physical and life sciences. Web: www.analitex.com Angstrom Scientific Inc. Whilst at IMC19 explore the iconic AnaliteX offers the following services provides nanotech and materials Opera House and Harbour Bridge and and tools: Consulting in HRTEM characterization solutions. Specifically: experience a myriad of other unique imaging and diffraction for materials Kleindiek Nano-manipulators and Australian experiences. scientists (data collection and stages, Hitachi Tabletop-SEM/EDX and processing); Software packages for AFM, Deben Microscopy Accessories, 3D electron diffraction tomography Leica EM Sample Prep Equipment, Advanced Microscopy data collection and processing; EMSIS TEM cameras, Nanojehm SEM EXHIBITOR DIRECTORY Techniques Corp. #916 Software packages for data processing Image Optimization, Molecular Vista 242 W Cummings Park of HRTEM images and electron Nanoscale IR AFM (PIFM), MelBuild Woburn, MA 01801 diffraction patterns, and phase TEM holders and used SEMs/ FIBS. Phone: 978-774-5550 identifications; Software packages Visit booth #1210 and/or our website Fax: 978-739-4313 for crystallographic computing, www.angstrom.us. Email: [email protected] visualizations, and simulations. Web: www.amtimaging.com AMT celebrates 25 years of offering cutting edge digital cameras for TEM. 2 2 Be the first to have a live demo in our New!70 mm and 25 mm FAST SDD® booth of our new in-situ and cryo- capable CMOS cameras with the fast for readout speeds, extremely low noise EDS (SEM) Applications levels and non-blooming architecture. Come see us in Booth 916!

Agilent Technologies, iLab Operations Software #1630 5301 Stevens Creek Blvd Amptek’s new FAST SDD® detectors for EDS use with SEMs utilize

Santa Clara CA 95051 "C2 Series" X-ray windows (Si3N4) and have excellent low energy re- Phone: 617-297-2805 sponse. Its high intrinsic efficiency makes it ideal for EDX, XEDS, Fax: 877-812-6477 EDXA and EDXMA. Email: [email protected] Web: www.agilent.com/chem/ilab Beryllium Kα 100 eV energy iLab Operations Software, a part of 39.0 eV FWHM the Agilent CrossLab family, is an enterprise web-based management tool designed to support operations Carbon Kα 277 eV energy for centralized shared research 45.2 eV FWHM resources. Its functionality includes request management, storeroom management, sample processing, 0 100 200 300 400 500 600 r equipment reservation management, usage tracking, billing and invoicing, ® reporting, and lab requisitioning and www.amptek.com spend tracking tools. http://microscopy.org/MandM/2017 | 33 > Exhibitor Directory (Cont’d.)

Applied Physics Applied Beams LLC #225 Technologies, Inc. #616 Barnett Technical Services #217 14855 SW Murray Scholls Dr 1600 NE Miller St 5050 Laguna Blvd - Ste 112-620 Beaverton, OR 97007 McMinnville, OR 97128 Elk Grove, CA 95758 Phone: 503-608-7237 Phone: 503-434-5550 Phone: 916-897-2441 Email: [email protected] Fax: 503-434-1312 Email: steve.barnett@barnett- Web: www.appliedbeams.com Email: [email protected] technical.com At Applied Beams we specialize Web: www.a-p-tech.com Web: www.barnett-technical.com in custom-configured SEM and Applied Physics Technologies FIB systems, micromachining and specializes in thermionic and field Benchmark Technologies #T-117 analytical services, and revitalizing emission cathodes. APTech is a your microscope with products specialty producer and supplier 7E Kimball Lane that extend and enhance system of CeBix® cathodes (cerium Lynnfield MA 01940 performance. Our HyperFIB system is hexaboride), LaB6 cathodes Phone: 203-213-3002 the only plasma FIB upgrade on the (lanthanum hexaboride), HfC Email: [email protected] market for legacy FIB tools. Our high cathodes (hafnium carbide), Web: benchmarktech.com quality yet affordable consumables CFE and ESE sources. Our Benchmark Technologies is a are form, fit and function equal cathodes have been used in leading supplier of lithography to or better than the OEM. Easy many different applications: test reticles to the semiconductor Government transactions using our microscopy, microanalysis, additive industry. Leveraging its expertise GSA contract. manufacturing, and other industries in test pattern design and that use electron sources in their nanofabrication, the company products and work. has launched a new resolution/ calibration target designed specifically for Quantitative Phase Imaging. The company is also developing and will soon launch a super resolution target. Benchmark can also develop custom targets based on user-specific requests.

Boeckeler Instruments Inc. #820 4650 S Butterfield Dr EXHIBITOR DIRECTORY

EXHIBITOR DIRECTORY Tucson, AZ 85714 Phone: 520-745-0001 Fax: 520-745-0004 Email: [email protected] Web: www.boeckeler.com RMC Boeckeler will demonstrate sample prep products for 3-D and correlative imaging workflows. See the ATUMtome automated tape collecting ultramicrotome and ASH- 100 advanced substrate holder. RMC Boeckeler actively seeks opportunities and partnerships to create sample prep products for faster imaging. Evening tutorials with key scientists include the ATUMtome, ASH-100, and advancements in cryo-ultramicrotomy of polymer materials. Register early.

appliedbeams.com | +1-503-608-7237 | [email protected]

34 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Bruker Corporation #1308 Carl Zeiss Microscopy, LLC #1018 Denton Vacuum, LLC #1019 5465 E Cheryl Pkwy One Zeiss Dr 1259 N Church St - Bldg 3 Madison, WI 53711 Thornwood, NY 10594 Moorestown, NJ 08057 Phone: 608-276-3000 Phone: 914-681-7771 Phone: 856-439-9100 Fax: 608-276-3006 Email: [email protected] Fax: 856-439-9111 Email: [email protected] Web: www.zeiss.com/us/microscopy Email: [email protected] Web: www.bruker.com Throughout the world, ZEISS Web: www.dentonvacuum.com Bruker offers a broad range of stands for the highest quality and systems for EDS and WDS X-ray reliability. Carl Zeiss Microscopy Diatome US #1109 spectrometry, EBSD, micro-X-ray is part of the Carl Zeiss group, a fluorescence and micro computed leading organization of companies 1560 Industry Rd tomography on the electron operating worldwide in the optical Hatfield PA 19440 microscope. Also, a range of 2D and optoelectronical industry. As the Phone: 215-412-8400 & 3D surface profiler solutions world’s only manufacturer of light, Fax: 215-412-8450 with specific information needed X-ray and electron/ion microscopes, Email: [email protected] to answer surface measurement Carl Zeiss Microscopy offers tailor- Web: www.emsdiasum.com questions with speed, accuracy, made systems for industry, materials Diatome US will have on display and ease. Welcome Hysitron - research and academia. its complete line of Diatome knives nanomechanical testing technologies for room temperature and cryo are applied to solving material issues sectioning for biological as well as for a diverse set of applications. Coxem Co., Ltd #330 material sciences in a variety of EXHIBITOR DIRECTORY #201. 199 Techno 2-ro, Yuseong-gu inclination angles to meet all of your EXHIBITOR DIRECTORY Daejeon 34025 Korea (South) microtomy needs. As well, Diatome Cambridge University Press #1010 Phone: 82 42 861 1685 will have on display their unique 1 Liberty Plaza Fax: 82 42 861 1689 micro manipulator. New York, NY 10006 Email: [email protected] Phone: 212-337-5000 Web: www.coxem.com Digital Surf #517 Email: [email protected] Coxem is one of market-leading Web: www.cambridge.org manufacturers of Scanning Electron 16 rue Lavoisier A world leader in academic Microscope. We offer bench-top Besancon, France 25000 publishing, Cambridge publishes SEM EM series, console type SEM Phone: +33381504800 over 1,500 new academic and CX series with various optional Email: [email protected] professional books annually, covering functions. Please contact us Web: www.digitalsurf.com a breadth of subject areas and for more information about our Digital Surf has been providing the publish over 380 peer-reviewed products and applications you industrial and scientific community academic journals. We publish are interested in, we will provide with best-in-class surface imaging Microscopy and Microanalysis, and optimized solution for you. and metrology software for over 25 Microscopy Today on behalf of the years. Mountains software solutions Microscopy Society of America, in are available for a wide range of addition to their book series. DECTRIS Ltd. #131 profilers and microscopes, including: Taefernweg 1 3D confocal and interferometric Baden-Daettwil 5405 Switzerland microscopes/profilers; Scanning CAMECA Instruments, Inc. #324 Phone: 0041 56 500 2100 Electron Microscopes (SEM); Atomic 5500 Nobel Dr - Ste 100 Fax: 0041 56 500 2101 Force Microscopes and other SPM; Madison, WI 53711 Email: [email protected] and Spectrometers, etc. Phone: 203-459-0623 Web: www.dectris.com Fax: 203-261-5506 DECTRIS is the technology leader in Email: [email protected] X-Ray detection. The DECTRIS photon Web: www.cameca.com counting detectors have transformed basic research at synchrotron light sources, as well as in the laboratory and with industrial X-Ray applications. DECTRIS aims to continuously improve the measurement quality, thereby enabling new scientific findings. This pioneering technology is the basis of a broad range of products, all scaled to meet the needs of various applications.

http://microscopy.org/MandM/2017 | 35 > Exhibitor Directory (Cont’d.) Electron Microscopy Direct Electron, LP #730 EDAX #324 Sciences #1110 13240 Evening Creek Dr, Ste. 311 91 McKee Dr 1560 Industry Rd San Diego, CA 92128 Mahwah, NJ 07430 Hatfield, PA 19440 Phone: 858-384-0291 Phone: 201-529-4880 Phone: 215-412-8400 Fax: 858-366-4981 Fax: 201-529-3156 Fax: 215-412-8450 Email: [email protected] Email: [email protected] Email: [email protected] Web: www.directelectron.com Web: www.edax.com Web: www.emsdiasum.com Direct Electron designs and EDAX is a leading provider of Electron microscopy sciences will manufactures next-generation innovative materials characterization have on display their complete line direct detection cameras for systems encompassing Energy of accessories, chemicals, supplies electron microscopy. Our vision— Dispersive Spectrometry (EDS), and equipment for all fields of Innovation Propelling Discovery— Wavelength Dispersive Spectrometry microscopy, biological research and is focused on empowering our (WDS), Electron Backscatter general laboratory requirements. customers to expand the frontiers Diffraction (EBSD) and X-ray As well as our full line of tools, of science. Our approach involves: Fluorescence (XRF). EDAX tweezers and dissecting equipment (1) A strong commitment to develops the best solutions for research and development, (2) micro- and nano-characterization, Unique features to improve where elemental and/or structural efficiency, and (3) A collaborative information is required, making culture with exceptional customer analysis easier and more accurate. service and support.

Duniway Stockroom Corp. #1229 48501 Milmont Dr Fremont, CA 94538 Phone: 650-969-8811 Fax: 650-965-0764 Email: [email protected] Web: www.duniway.com Refurbishing or servicing an For 41 years, Duniway Stockroom has supplied new and used electron microscope? Scope us vacuum equipment to Universities, government laboratories, OEM’s, out for your ion pump needs. EXHIBITOR DIRECTORY EXHIBITOR DIRECTORY Fortune 500 corporations and smaller end-users around the world. We manufacture new ion pumps and controllers (Terranova®) as well as new vacuum gauge controllers (Terranova®). Large stock of hardware, supplies, and valves ready for same day shipment as well as new and rebuilt pumps (turbo, ion, mech and diffusion).

E. Fjeld Co, Inc. #1626 152 Rangeway Rd Visit us in booth 1229! N Billerica, MA 01862 Phone: 978-667-1416 New | Rebuilt | Rebuilding Services Fax: 978-667-9059 Email: [email protected] Web: www.efjeld.com STOCKROOM CORP. 8 0 0 . 4 4 6 . 8 811 w w w. d u n i w a y. c o m

36 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Evactron by Ephemeron Labs #1632 XEI Scientific, Inc. #1108

1901 S 9th St - Rm 217 1755 E Bayshore Rd - Ste 17 Philadelphia, PA 19148 Redwood City, CA 94061 Phone: 215-839-9071 Phone: 650-369-0133 Email: [email protected] Fax: 650-363-1659 Web: www.ephemeron-labs.com Email: [email protected] Ephemeron Labs specializes in EBIC, Web: www.evactron.com EBAC, RCI, and in-situ electrical Evactron® De-Contaminators by measurements of solid state devices. XEI Scientific are world leaders in Provide customization of electrical remote RF plasma cleaning of carbon biasing sample holders for variable contamination in vacuum chambers. temperature measurements for SEM, Evactrons use a unique, energy- AFM, SPM. efficient hollow cathode plasma source to generate oxygen radicals plus UV for dual-action removal of adventitious carbon at turbo pump pressures. The new Evactron 50 De-Contaminator outperforms other remote plasma cleaners and is easy to use, powerful, compact, and low cost. EXHIBITOR DIRECTORY

Evactron® plasma cleaning gives you the fastest carbon removal rate*

New Evactron® 50 Turbo-Plasma™ cleaner for your SEM/FIB  20-50 Watt RFHC plasma for fast chemical etch  No sputter etch damage or debris  Starts at High Vacuum—no venting  Push button or Bluetooth operation  Evactron reliability and 5 year Warranty  Lowest Cost, Best Value Have it all with the Evactron 50 De-Contaminator. *Visit us at M&M booth 1108 for details.

WWW.EVACTRON.COM 16503690133

http://microscopy.org/MandM/2017 | 37 > Exhibitor Directory (Cont’d.)

EXpressLO LLC #331 EXpressLO™ 5483 Lee St Unit 12 Expert ex situ Lift Out & Manipulation Solutions Lehigh Acres, FL 33971

Phone: 321-663-3806 Fax: 321-413-0251 Fast, easy, and reproducible Email: [email protected] Patented grid design and method Web: www.EXpressLO.com Routine backside milling Expert provider of FIB ex situ lift out Re-thin EXLO specimens and micromanipulation solutions for Saves FIB instrument time and $$$ site specific analyses of materials Supports multiple FIB instruments including our patented EXpressLO™ Multi-user facility friendly grids and methods. Fast and easy Pick&Place™ dual pin holder and kit backside manipulation and post Aspirato™ vacuum module FIB processing is possible since no Manipulate CNTs, fibers, particles & more carbon film support needed. The US Patents 8,740,209 and 8,789, 826 preferred method for manipulation to MEMS devices for TEM. Fast and easy manipulation of CNTs, fibers, particles. See www.YouTube.com/ LAGiannuzzi/videos for examples.

FEI Company #1318 Visit us in St. Louis at M&M 2017 booth 331

5350 NE Dawson Creek Dr EXpressLO LLC Hillsboro, OR 97124 [email protected] www.EXpressLO.com Phone: 503-726-2578 Phone: +1-321-663-3806 Fax: +1-321-413-0251 Email: [email protected] See Thermo Fisher Scientific (formerly FEI) Booth #1318

Finger Lakes FemtoTools AG #1231 Instrumentation #125 Fischione Instruments #1222

EXHIBITOR DIRECTORY Furtbachstrasse 4 7287 W Main St 9003 Corporate Circle Buchs 8107 Switzerland Lima, NY 14485 Export, PA 15632 Phone: +41448444425 Phone: 585-624-3760 Phone: 724-325-5444 Email: simon.muntwyler@ Email: [email protected] Fax: 724-325-5443 femtotools.com Web: www.flicamera.com Email: [email protected] Web: www.femtotools.com FLI designs and manufactures Web: www.fischione.com FemtoTools develops and sells low-noise, cooled sCMOS and CCD Fischione Instruments designs, high-precision instruments for cameras. We manufacture industry manufactures, and services sample mechanical testing in the micro- leading 23 msec filter wheels. The preparation products for electron and nano domains. This includes breakthrough cube switcher INCITE microscopy. Products include ion in-situ SEM nanomechanical testing improves microscopy throughput by milling preparation; plasma cleaners, systems (in-situ SEM nanoindenters) 10x. The new Kepler 4 MP back- and TEM tomography holders. Stop and standalone, benchtop illuminated KL400 sCMOS camera by to see the new tabletop ion milling micromechanical testing systems. offers 95% peak QE with only 1.3 and polishing systems for TEM and e- noise; frame rates of 48 fps are SEM: Model 1051 TEM Mill and possible. Our deep cooled ProLine Model 1061 SEM Mill. Also available and MicroLine CCD cameras for demos is the Microscopy Today are OEM favorites. Sensors are Innovation Award-winning PicoMill available up to 50 MP. TEM specimen preparation system.

38 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Hitachi High Technologies FOM Networks, Inc. #1232 Herzan LLC #209 America, Inc. #623 1 Northfield Plz, Ste 300 23042 Alcalde Dr - Ste E 22610 Gateway Center Dr - Ste 100 Northfield, IL 60093 Laguna Hills, CA 92653 Clarksburg, MD 20871 Phone: 224-225-9168 Phone: 949-363-2905 Phone: 800-253-3053 Fax: 224-218-2807 Fax: 949-340-9751 Fax: 301-990-0472 Email: [email protected] Email: [email protected] Email: [email protected] Web: www.fomnetworks.com Web: www.herzan.com Web: www.hitachi-hightech.com/us The Facility Online Manager (FOM) Over the last two decades, Herzan’s Hitachi High Technologies America system is the flagship product of environmental solutions have is a leading supplier of imaging FOM Networks, Inc. FOM proudly enabled instrument manufacturers equipment and solutions worldwide. serves the most customers in the and end users the ability to Our expanding and innovative market of Scientific Instrument achieve maximum resolution when product portfolio includes SEM, Management. More than 150 performing precise nano-scale TEM, STEM, FIB, Ion Milling reputable universities and national research. Herzan specializes in instrumentation, AFM and SPM, labs, such as Yale, Princeton, OSU, providing research-grade acoustic Atmospheric and Tabletop SEM, and UIUC, Rice, Brookhaven, Sandia, enclosures (the AEK-Series), sample prep systems to answer the are using FOM every day to manage sub-hertz vibration isolation demands of today’s busy research their shared resources. We provide platforms (the TS and AVI Series), and industrial labs. 4 types of licenses from free to comprehensive site analysis tools enterprise, and all aspects of FOM (the WaveCatcher), and uniquely are customizable. tailored EMI isolation solutions. HORIBA Scientific #213

3880 Park Ave. EXHIBITOR DIRECTORY Edison, NJ 08820 Gatan, Inc. #504 HIROX-USA, Inc. #313 Phone: 732-494-8660 5794 W Las Positas Blvd 100 Commerce Way Email: [email protected] Pleasanton, CA 94588 Hackensack, NJ 07601 Web: www.horiba.com/scientific Phone: 925-463-0200 Phone: 201-342-2600 HORIBA Scientific manufactures Fax: 925-463-0204 Fax: 201-342-7322 Raman spectrometers, hybrid and Email: [email protected] Email: [email protected] modular Raman, AFM-Raman, Web: www.gatan.com Web: www.hirox-usa.com Raman-Photolum, and transmission Gatan is the world’s leading Hirox-USA is the pioneer of 3D Raman, plus optical components, manufacturer of instrumentation and Digital Microscopes. Our digital scientific cameras & light sources software used to enhance and extend microscope system is a combined and high performance CCDs. the operation and performance tool that is able to do observation, Recent innovations are LabSpec 6’s of electron microscopes. Gatan measurement, and recording. Hirox’s ParticleFinder to enable automation products, which are fully compatible high-quality optical, mechanical, and ease of use for particle analysts, with nearly all electron microscope and lighting designs have the EasyNav Raman Navigation package models, cover the entire range of the capability of achieving an expansive for sharp, rapid Raman imaging, research process—from specimen magnification range from 0x-7000x and MicOS microspectrometer for preparation and manipulation to and incorporate a variety of features, luminescence measurements imaging and analysis. including live full focus and real-time 2D/3D tiling with an auto XY stage.

http://microscopy.org/MandM/2017 | 39 > Exhibitor Directory (Cont’d.)

Hysitron HREM Research Inc. #932 (Bruker Corporation) #720 IDES, Inc #519 14-48 Matsukazedai 9625 W 76th St 5653 Stoneridge Dr - Ste 117 Higashimastuyama 355-0055 Japan Minneapolis, MN 55344 Pleasanton, CA 94588 Phone: 81-493-35-3919 Phone: 952-835-6366 Phone: 888-808-4337 Fax: 81-493-35-3919 Fax: 952-835-6166 Fax: 888-808-4337 Email: [email protected] Email: [email protected] Email: [email protected] Web: www.hremresearch.com Web: www.bruker.com/ Web: www.ides-inc.com HREM Research is a leading nanomechanical-testing IDES provides the most advanced company developing software Hysitron (Bruker Corporation) time resolved electron imaging for Quantitative Electron Hysitron, recently acquired by Bruker solutions available. Our mission Microscopy. Our flagship software Corporation, proudly offers SEM, is to develop and market electron is FFT-Multislice HR(S)TEM Image TEM, AFM, and XRM instruments imaging technology that will enable Simulation Package. We also provide that deliver a variety of quantitative researchers to reveal and exploit a collection of DigitalMicrograph techniques for nanomechanical biological and material dynamics at plug-ins: Exit Wave Reconstruction, characterization. Supported ultrafast time scales. STEM and EELS Deconvolution, modes of in-situ testing include Strain Mapping, HR(S)TEM Noise nanoindentation, compression, Filters, Scan Noise corrector, bend, and tensile testing with direct IFG / Fischer Technology #224 Multivariate Analysis for SI data, observation of the entire stress- 750 Marshall Phelps Rd Rocking or Rotated Beam Electron induced deformation process. Windsor CT 06095 Diffraction acquisition etc. Phone: 860-683-0781 Email: [email protected] ibss Group, Inc. #1130 Web: www.fischer-technology.com Hummingbird Scientific #830 111 Anza Blvd, Suite 110 IFG (Institute of Scientific 2610 Willamette Dr Burlingame, CA 94010 Instruments) and Fischer Technology Lacey, WA 98516 Phone: 650-513-1488 are world leaders in the field of high Phone: 360-252-2737 Fax: 650-513-1884 quality measurement technology Fax: 360-252-6474 Email: andrew.villegas@ and components for the analytical Email: daan@ ibssgroup.com industry. Products include XRF- hummingbirdscientific.com Web: www.ibssgroup.com spectrometers as well as high Web: www.hummingbirdscientific.com The GV10x DS plasma cleaner precision capillary optics for beam Hummingbird Scientific builds and related products are used shaping of X-rays, the iMOXS modular products for electron and ion successfully in EM and Synchrotron X-ray source and X-ray windows. Our EXHIBITOR DIRECTORY microscopy with an emphasis on labs around the world. For in- products are used in process-near in transmission electron microscopes situ cleaning, reduces carbon & and off-line metrology. (TEM). In close collaboration with hydrocarbon contamination 10 to our customers, we design and 20x more effectively than traditional manufacture all aspects of these methods at vacuum pressure safe for Integrated Dynamics complex systems from mechanical, TMP operation. The Mobile Cubic Engineering IDE #1032 electrical, and software design to Asher, helps prevent high resolution 68 Mazzeo Dr fabrication and assembly. We aim imaging degradation and additional Randolph, MA 02368 to provide pioneering solutions for chamber contamination build up Phone: 781-326-5700 applications in nanotechnology, through in situ, ex situ cleaning and Fax: 781-326-3004 materials science, and biology. sample storage. Email: [email protected] Web: www.ideworld.com Integrated Dynamics Engineering IDE has 25+ years experience as a world leader in Active and Passive Vibration Isolation, EMI Cancellation, Acoustic and Environmental Control systems for SEMs and TEMs with major facilities in Europe, the US, Mid-East and Asia. Serving prestigious universities, semiconductor manufacturers, medical facilities and research laboratories globally.

40 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO International Centre for Keyence Corporation Diffraction Data (ICDD) #1329 JEOL USA, Inc. #708 of America #514 12 Campus Blvd 11 Dearborn Rd 500 Park Blvd Suite 500 Newtown Square, PA 19073 Peabody, MA 01960 Itasca, IL 60143 Phone: 610-325-9814 Phone: 978-535-5900 Phone: 201-930-0100 Fax: 610-325-9823 Fax: 978-536-2205 Fax: 201-782-0848 Email: [email protected] Email: [email protected] Email: [email protected] Web: www.icdd.com Web: www.jeolusa.com Web: www.keyence.com ICDD’s material identification JEOL is a leading global KEYENCE Corporation is a world databases are designed for rapid manufacturer of electron microscopes leader in advanced microscopes materials identification and and analytical instrumentation for for imaging and measurement interfaced with diffractometers and scientific research and industrial applications. With a wide product data analysis systems of the world’s applications. Key markets: range that includes Digital leading software developers and nanotechnology, materials science, Microscopes, 3D Laser Scanning manufacturers of X-ray equipment. life sciences and semiconductors. Confocal Microscopes, and Release 2018 of the Powder Core product groups: SEM, TEM, Fluorescence Microscopes, KEYENCE Diffraction File™ (PDF®) contains STEM, E-Beam Lithography, EPMA, Corporation has the microscope simulated Selected Area Electron ion-beam instruments, MS, NMR. products to meet nearly any Diffraction Patterns and Electron Solutions for scientific and industrial requirement. If you’re using an optical Backscatter Diffraction Patterns for R&D including technical and microscope or any surface analysis hundreds of thousands of material applications expertise, combined with equipment, these systems are a must data sets. long-term service. see. Stop by for a live demo! EXHIBITOR DIRECTORY

IXRF Systems, Inc. #1211 Kammrath and Weiss #211 10421 Old Manchaca Rd - Ste 620 George Lanzarotta Austin, TX 78748 6 Beech Rd Phone: 512-386-6100 Islip, NY 11751 Email: [email protected] Phone: 516-313-9742 Web: www.ixrfsystems.com Fax: 631-224-2620 Email: george.lanzarotta@ kammrathandweiss.com J. Kraft Microscopy Web: www.kammrath-weiss.com/en/ Services, Inc. #318 Manufacturer of accessories for 243 W Main St microscopy Kammrath and Weiss Springville, NY 14141 produces electro-mechanical devices Phone: 716-592-4402 and full systems to enhance all Fax: 716-592-4407 SEM and Dual-beam microscopes Email: [email protected] for applications in material testing, Web: www.jkraftmicro.com nanotechnology, mechanical engineering, failure analysis, At J. Kraft Microscopy we are research and more. Modules and committed to our customers and sub-stages for tensile testing, matching the best equipment and heating, cooling, beam-blanking, services to their application. As the sample manipulation and custom exclusive retailer of Point Electronic designs are made in Germany with equipment in North America, we high precision and fine mechanics. are excited to offer complete SEM upgrades. Giving existing SEMs modern PC controls, increased reliability, intuitive user software and reduced overall cost to own. Please stop and see our newly upgraded SEM on display for info and demonstration.

http://microscopy.org/MandM/2017 | 41 > Exhibitor Directory (Cont’d.)

Keysight Technologies #1622 Ladd Research #920 Microscopy Innovations, LLC #311 5301 Stevens Creek Blvd 83 Holly Ct 213 Air Park Rd - Ste 101 Santa Clara, CA 95051 Williston, VT 05495 Marshfield, WI 54449-8626 Phone: 480-756-5900 Phone: 802-658-4961 Phone: 715-384-3292 Email: mengmeng.zhang@ Fax: 802-660-8859 Email: mark.nelson@ keysight.com Email: [email protected] microscopyinnovations.com Web: www.keysight.com Web: www.laddresearch.com Web: www.microscopyinnovations.com The compact Keysight 8500B Ladd is the only US manufacturer When a busy lab needs to FE-SEM is optimized for low- of quality aperture discs & accomplish more in a day, try the voltage imaging, extremely high strips for EMs, FIBs, satellites mPrep™ System. This capsule- surface contrast & resolution. This & other uses. Our clean, burr- based system reduces specimen technologically advanced system free holes range from .1um & handling, controls reagent use, and offers fully integrated energy up, in a variety of materials. We cuts hands-on time. For manual or dispersive spectroscopy (EDS) also provide, a wide-range of EM automated processing, mPrep adapts allowing quantitative elemental supplies, chemicals, evaporation to your protocols and needs. For analysis to be performed on & sputtering systems. Products extra-fast results, try the mPrep ASP- arbitrary points, a continuous line include nitrocellulose strips & 1000 Auto-Processor — it offers scan, or in a user-defined map. solution, diamond knives, Mercox, 45-minute processing of kidney coated grids, specialty adhesives, tissue for TEM! conductive paints, Glutaraldehyde Kleindiek Nanotechnik #1212 & tungsten/alumina crucibles. Aspenhaustr. 25 Microscopy Society of America Reutlingen BW 72770 Germany MegaBooth #304 Leica Microsystems #908 Phone: +4971213453950 12100 Sunset Hills Rd - Ste 130 Fax: +49712134539555 1700 Leider Ln Reston, VA 20190 Email: [email protected] Buffalo Grove, IL 60089 Phone: 937-255-9413 Web: www.kleindiek.com Phone: 800-248-0123 Fax: 937-656-7292 Fax: 847-236-3009 Kleindiek Nanotechnik Email: AssociationManagement@ Email: david.chapa@leica- manufactures high-end micro- microscopy.org microsystems.com and nanopositioning devices Web: www.microscopy.org Web: www.leica-microsystems.com designed to be integrated into The MegaBooth provides MSA optical microscopes, SEMs, Leica Microsystems develops membership services to meeting and FIB/SEMs for a wide range and manufactures microscopes attendees. It is comprised of EXHIBITOR DIRECTORY of applications. These include and scientific instruments for the Membership (including LAS and handling and characterization analysis of microstructures and Sustaining Members), Publications of CNTs, nanowires, and other nanostructures. The company (Microscopy and Microanalysis and nanostructures, manipulating is one of the market leaders in Microscopy Today), MSA Committees small particles from the nanometer compound and stereo microscopy, represented are - Certification Board, to millimeter range, TEM sample digital microscopy, confocal laser Placement Office, Tech Forum preparation, and many more. scanning microscopy, electron , and Education,. This includes Nanoprobing and in situ AFM microscopy sample preparation, Educational Outreach, a Book systems are also available. optical coherence tomography, and Display, and Vendor Tutorials. surgical microscopes.

42 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Nanomechanics, Inc. #118 Nanoscience Instruments #429 Norcada, Inc. #1131 105 Meco Ln. 10008 S. 51st - Ste 110 4465 99th St Oak Ridge TN 37830 Phoenix, AZ 85044 Edmonton, ABT6E 5B6 Phone: 865-207-9813 Phone: 480-940-3940 Canada Email: sebastian.ward@ Fax: 480-940-3941 Phone: 780-431-9637 nanomechanicsinc.com Email: [email protected] Fax: 780-431-9638 Web: www.nanomechanicsinc.com Web: www.nanoscience.com Email: [email protected] Our principle mission is to enable Nanoscience Instruments supplies Web: www.norcada.com our customers to evaluate and a variety of in situ and standalone understand the mechanical SEM products for a wide variety performance of their materials on of applications, from fundamental NT-MDT Spectrum micro and nano scales. With field research to high-throughput quality Instruments #132 experts in nanomechanical testing, control. Stop by to talk with an 7910 S. KYRENE RD. #107 data acquisition, system integration applications expert about our novel Tempe, AZ 85284 and software development on our solutions for electron microscopy, Phone: 480-493-0093 staff, we are well positioned to correlative fluorescence-electron Fax: 602-358-8134 provide you with the most accurate microscopy, nanoindentation, Email: [email protected] results along with leading edge cathodoluminescence, mechanical Web: www.ntmdt-si.com characterization. testing, and ion milling. Our goal is to provide researchers with the most sophisticated instruments for quantitative NanoMEGAS USA #1618 Nanosurf, Inc #129 EXHIBITOR DIRECTORY measurements of structure and 1095 W Rio Salado Pkwy - #110 300 Tradecenter, Suite 5450 properties of materials. Tempe, AZ 85281 Woburn, MA 01801 Phone: 480-389-6816 Phone: 781-549-7361 Fax: 480-320-4066 Email: [email protected] Object Research Systems #1214 Email: [email protected] Web: www.nanosurf.com/en Web: www.nanomegasusa.com 760 St Paul St W - Ste 101 Manufactures AFM+ scientific Montreal, H3C 1M4 Canada The NanoMEGAS ASTAR system instruments for industry and Phone: 514-843-3861 for TEM allows nm resolution research. Our product line spans Fax: 514-543-5475 orientation-phase maps combined a full range of AFM solutions from Email: [email protected] with precession electron diffraction. All-In-One Table-Top systems up to Web: www.theobjects.com Applications including strain the innovative AFSEM - offering fully Founded in 2004 and based in mapping (Topspin), ab initio correlative in situ AFM analysis in Montreal, Object Research Systems structural determination (ADT- your SEM or dual beam. Visit our (ORS), develops advanced 3D 3D), grains statistic (ASTAR), and booth for a first-hand look at the visualization solutions used by amorphous short range order bond AFSEM and speak with one of our research centers, engineering groups, length (e-PDF) characterization can experts about your application. be installed on all new or existing and production facilities to process, TEM microscopes. visualize, and analyze image data. Nion Company #204 Deployed by registered users in more than 80 countries, our software 11511 NE 118th St empowers users to extract the most Kirkland, WA 98034 value from their imaging system Phone: 425-576-9060 investments and to solve complex Fax: 425-739-0312 industrial and research problems. Email: [email protected] Web: www.nion.com Nion supplies world-leading aberration-corrected STEMs that excel in spatial resolution (0.57 Å at 200 keV), EELS resolution (7 meV with Nion mono-chromator and spectrometer), efficient EDXS (0.7 sr solid angle) and ultra-high sample- level vacuum (10-10 torr range). Two sample stages are offered: ultra-high stability side-insertion cartridge type, or flexible, high-stability side-entry rod type. www.nion.com http://microscopy.org/MandM/2017 | 43 > Exhibitor Directory (Cont’d.)

Olympus America, Inc. #219 Pace Technologies #214 Phenom-World B.V. #430 48 Woerd Ave 3601 E 34th St Dillenburgstraat 9T Waltham, MA 02453 Tucson, AZ 85713 Eindhoven 5652 AM Phone: 781-419-3900 Phone 520-882-6598 Netherlands Email: [email protected] Email: [email protected] Phone: +31 40 259 73 60 Web: www.olympus-ossa.com Web: www.metallographic.com Email: vivian.de.corti@ phenom-world.com Olympus provides an industry- Pace Technologies offers a wide Web: www.phenom-world.com leading portfolio of innovative range of cost-effective, high quality test, measurement, and imaging metallographic testing equipment Phenom-World is now globally the instruments including: remote and consumables. Our booth will be yearly number 1 manufacturer visual inspection, industrial featuring our TERAPRESS TP-7500 of desktop scanning electron microscopy, ultrasound, phased programmable electro-hydraulic microscopes and imaging and array, eddy current, and optical automated mounting press in analysis packages for sub-micron- metrology instruments. Products addition to our GIGA-0900 vibratory scale applications. Our SEM-based include ultrasonic flaw detectors polisher, an effective tool for EBSD systems are used in a broad range and thickness gages, videoscopes, sample preparation. We look forward of markets and environments. We microscopes, advanced NDT to fulfilling all of your metallographic continuously invest, develop and systems, X-ray fluorescence (XRF) sample preparation needs. integrate our products to help analyzers, industrial scanners, customers improve their return on probes, and accessories. investment and time to data, and to Park Systems Inc #232 increase system functionality. 3040 Olcott St Oxford Instruments #724 Santa Clara, CA 95054 Photo Electron Soul Inc. #126 300 Baker Ave - Ste 150 Phone: 408-986-1110 Concord, MA 01742 Fax: 408-986-1199 Incubation Facility, Nagoya Phone: 978-369-9933 Email: [email protected] University, Furo-cho, Chikusa-ku, Fax: 978-369-8287 Web: www.parkafm.com Nagoya AICHI 4640814 Japan Email: [email protected] Phone: +81-52-747-6483 Park Systems is a world leading Web: www.oxford-instruments.com/ Email: inquiry@ manufacturer of atomic force businesses/nanotechnology/ photoelectronsoul.com microscopy (AFM) systems with nanoanalysis Web: www.photoelectronsoul.com a complete range of products for Oxford Instruments NanoAnalysis researchers and industry engineers “Semiconductor photocathode as a provides leading-edge tools that new electron source for microanalysis EXHIBITOR DIRECTORY in biological science, materials enable materials characterization research, semiconductor, and storage and microfabrication” One of the and sample manipulation at the industries. Park’s AFM provides most promising applications is nanometer scale. Used on electron the highest data accuracy, superior electron microscopy, such as dynamic microscopes (SEM and TEM) productivity, and lowest operating TEM imaging, cryo-TEM, and EELS. and ion-beam systems (FIB), our cost. See our Park NX10 and Park Our electron gun system is compact tools are used for R&D across NX20, the premiere choices for and simple enough to install it in the a wide range of academic and nanotechnology research, at http:// conventional electron microscopes. industrial applications including www.parkafm.com. semiconductors, renewable energy, mining, metallurgy, and forensics.

44 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Quantum Design Physical Electronics #229 PNDetector GmbH #1429 International #120 18725 Lake Dr E Otto - Hahn - Ring 6 10307 Pacific Center Court Chanhassen, MN 55317 D-81739 München Germany San Diego, CA 92121 Phone: 952-828-6100 Phone: (49) 89 30908713 Phone: 858-481-4400 Fax: 952-828-6176 Fax: (49) 89 30908711 Web: www.qdusa.com Email: [email protected] Email: [email protected] Web: www.phi.com Web: www.pnsensor.de PHI is a subsidiary of ULVAC-PHI, PNDetector is producing advanced Quantum Detectors Ltd. #212 the world’s leading supplier of UHV radiation detectors for microanalysis, R104 RAL, Harwell surface analysis instrumentation quality assurance and materials Oxford, United Kingdom used for research & development science in their own cleanroom Phone: +44 01235445795 of advanced material. Applications fabrication facilities. PNDetector Email: [email protected] include nanotechnology, offers state-of-the-art detectors for Web: www.quantumdetectors.com microelectronics, photovoltaics, X-ray spectroscopy and electron Quantum Detectors Ltd is an data storage, bio-materials & imaging such as SDDs and pnCCD established spin-out from Diamond catalysis. PHI’s innovative XPS, AES camera systems used in a wide Light Source and the Science and & TOF-SIMS technologies provide variety of instruments in Electron Technology Facilities Council UK, customers with unique tools to solve Microscopy and X-ray Fluorescence. delivering world leading detector challenging materials problems & technology developed there to a accelerate the development of new wider audience. At M&M2017 material & products. PNSensor GmbH #1330 we will be showcasing Merlin – Otto - Hahn - Ring 6 our advanced Medipix detector EXHIBITOR DIRECTORY D-81739 München Germany development combining direct PIE Scientific LLC #420 Phone: (49) 89 309087200 detection of electrons and rapid Fax: (49) 89 309087210 readout in a pixelated format, ideal 63 Bovet Rd - Ste 106 Email: [email protected] for applications such as 4D STEM San Mateo, CA 94402 Web: www.pnsensor.de and TEM dynamic imaging. Phone: 650-204-0875 Fax: 650-240-8671 The key competence of the scientific Email: [email protected] research company PNSensor is Web: www.piescientific.com development and production of Raith America, Inc. #929 detectors operating at their physical PIE Scientific specializes in developing 1377 Long Island Motor Pkwy limits for applications in basic and advanced plasma cleaners for sample Suite 101 applied science and material analysis. cleaning, surface treatment, and Islandia, NY 11749 The detectors are optimized for high vacuum chamber cleaning. EM-KLEEN Phone: 631-738-9500 resolution ultrafast spectroscopy and and SEMI-KLEEN plasma cleaner Fax: 631-738-2055 imaging applications based on Active are the most advanced in-situ plasma Email: [email protected] Pixel Sensors (DePFET) and pnCCDs. cleaners for hydrocarbon contamination Web: www.raith.com removal inside SEM, FIB and XPS Raith is a leading precision systems. Tergeo series table plasma instrument manufacturer for large cleaner is designed to handle fragile Protochips, Inc. #924 area SEM, electron beam lithography, SEM/TEM samples with unique 3800 Gateway Centre Blvd - Ste 306 focused ion beam nanofabrication and direct+remote dual-source design and Morrisville, NC 27560 nanoengineering. Reverse engineering pulsed mode operation. Phone: 919-341-2612 of semiconductor devices strongly Fax: 919-341-2748 benefits from the large area SEM Email: [email protected] imaging enabled by the automation Web: www.protochips.com and stability of a professional lithography system architecture, Protochips empowers researchers ultra-precise image calibrations, and to discover and analyze new the nanoscale accuracy of the laser phenomenon by visualizing interferometer stage. nanoscale processes in completely new ways. Our field-proven products offer an unparalleled view into sample behavior by combining in situ control with the analysis and resolution capabilities of the modern electron microscope. Through continual innovation, we create solutions that improve productivity and generate actionable data to accelerate discovery. http://microscopy.org/MandM/2017 | 45 > Exhibitor Directory (Cont’d.)

Scientific Instruments & Renishaw Inc. #317 Applications, Inc. #1230 SmarAct Inc. #1331 5277 Trillium Blvd 2773 Heath Ln 2140 Shattuck - STE 1103 Hoffman Estates, IL 60192 Duluth, GA 30096 Berkeley, CA 94704 Phone: 847-286-9953 Phone: 770-232-7785 Phone: 415-766-9006 Fax: 847-286-9974 Fax: 770-232-1791 Email: [email protected] Email: [email protected] Email: [email protected] Web: www.smaract.com Web: www.renishaw.com Web: www.sia-cam.com SmarAct develops and produces The most affordable TEM camera piezo-based high-accuracy positioning systems for biology, materials, and measuring systems for the micro- Rigaku Americas Corp. #218 clinical pathology, HRTEM, and nanometer scale applications. 9009 New Trails Dr electron diffraction, and teaching Comprehensive positioner systems The Woodlands, TX 77381 applications. Side, bottom, and with numerous degrees of freedom Phone: 281-362-2300 mid-mount configurations and and parallel kinematics, microscope Fax: 281-364-3628 compatible with existing detectors. stages and laser interferometers Email: [email protected] Bottom port cameras with very can be assembled to custom-built, Web: www.rigaku.com large field. Diffraction beam stop. complete robotic systems, and Automatic recording of TEM work under extreme conditions, Rigaku introduces a unique X-ray operating parameters. e.g., ultrahigh vacuum, cryogenic microscope, the nano3DX. The new temperatures, and non-magnetic Rigaku nano3DX is a true X-ray materials. microscope (XRM) with the ability to measure relatively large samples at SEC CO., Ltd #417 high resolution. This is accomplished 4900 Hopyard Rd Suite 100 by using a high powered rotating Pleasanton, CA 94588 SPI Supplies #520 anode X-ray source and a high- Phone: 866-601-6266 206 Garfield Ave resolution CCD imager. For more Fax: 925-231-1709 West Chester, PA 19381 information: http://www.rigaku.com/ Email: [email protected] Phone: 610-436-5400 products/xrm/nano3dx. Web: www.nanoimages.com Fax: 610-436-5755 Live Demonstrations of the SNE- Email: [email protected] 4500M Tabletop SEM / EDS system Web: www.2spi.com Royal Microscopical offering best-in-class features Manufacturer and distributor of Society #207 normally found only in full-size SEM sample preparation equipment and 37/38 St Clements systems such as: 5-Axis XYZRT consumables for electron microscopy. Stage, 5nm Resolution, 30kV Complete line of UV and plasma EXHIBITOR DIRECTORY Oxford OX4 1AJ United Kingdom Excitation Energy, variable Apertures cleaning systems. Traditional and Phone: +44 (0)1865 254760 and more. Demonstrations of the high resolution coating options for Email: [email protected] new MIPAR Image Analysis software SEM. Ion milling solutions for SEM Web: www.rms.org.uk will also be available. Distributed and TEM. Wet Cell II liquid probe in North America by NanoImages, system. We also offer the mPrep The RMS is an international society, LLC, www.nanoimages.com. SEC Capsule System as well as our high at the forefront of new developments Co Ltd also offers 2D and 3D X-Ray quality coated grids. Our expert staff in microscopy and imaging. The Inspection systems. will be on hand to answer questions society is dedicated to advancing about products or procedures. science and developing careers by organising meetings and courses, Seiwa Optical America, Inc. #226 publishing the Journal of Microscopy and infocus, as well as organising 3042 Scott Blvd. the European Microscopy Congress in Santa Clara, CA 95054 Copenhagen, Denmark in 2020. Phone: 408-844-8008 Email: [email protected] Web: www.seiwaamerica.com SCIENION US, Inc. #231 For over 50 years, Seiwa Optical has 11 Deer Park Dr - Ste 100 been a provider of both standard and Monmouth Junction, NJ 08852 custom optical solutions for machine Email: [email protected] vision, inspection, and industrial Web: www.scienion.com processing. At the M&M Show this year, Seiwa Optical America will have live demonstrations of our infrared and digital microscopes, microscope cameras, and optical comparator.

46 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Thermo Fisher Scientific Springer #1015 Ted Pella Inc. #1309 (formerly FEI) #1318 233 Spring St PO Box 492477 5350 NE Dawson Creek Dr New York, NY 10013 Redding, CA 96049 Hillsboro, OR 97124 Phone: 212-460-1500 Phone: 530-243-2200 Phone: 503-726-7500 Fax: 212-460-1700 Fax: 530-243-3761 Fax: 503-726-2570 Email: minerva.rodriguez@ Email: [email protected] Email: [email protected] springer.com Web: www.tedpella.com Web: www.fei.com Web: www.springer.com Ted Pella, Inc. is the premier Thermo Fisher Scientific supplies Looking to publish your research? manufacturer & distributor innovative solutions for microscopy Discover Springer’s print and of consumables, supplies & and microanalysis. We provide electronic publication services, specimen preparation tools for SEMs, TEMs, and DualBeam™ FIB/ including open access! Get high- all your microscopy applications. SEMs combined with advanced quality review, maximum readership Comprehensive range of SEM software suites to take customers and rapid distribution. Visit our booth mounts & sample holders, TEM from questions to usable data by or springer.com/authors. You can also grids & support films, Pelcotec(TM) combining high-resolution imaging browse key titles in your field and calibration standards, Cressington with physical, elemental, chemical, buy (e)books at discount prices. With sample coating systems, specimen and electrical analysis across scales Springer you are in good company. preparation tools. Manufacturer and modes—through the broadest of the PELCO BioWave(R) Pro+ sample types. Microwave Tissue Procesor & PELCO Synergy Systems easiGlow(TM) Glow Discharge System.

Corporation #210 TMC #324 EXHIBITOR DIRECTORY PO Box 177 15 Centennial Drive Montrose, CO 81402 Tescan USA #1508 Peabody, MA 01960 Phone: 970-240-9429 765 Commonwealth Dr - Ste 101 Phone: 978-532-6330 Email: [email protected] Warrendale, PA 15086 Fax: 978-531-8682 Web: www.synsysco.com Phone: 724-772-7433 Email: [email protected] Fax: 724-772-7434 Web: www.techmfg.com SynSysCo is the authorized Email: [email protected] distributor for Anest Iwata scroll TMC provides complete Web: www.tescan-usa.com pumps and LOT dry screw pumps. environmental solutions for We offer complete OEM maintenance TESCAN USA is a leading supplier microscopes: the new Everstill services for most roughing and in North America of Scanning K-400, the patented active benchtop cryopumps including repairs, parts Electron Microscopes and Focused vibration cancellation platform; and training. Anest Iwata Oil-Free Ion Beam workstations. The quality, STACIS and SEM-Base proprietary Vacuum Pumps & Compressors performance and reliability of our Piezoelectric Active Vibration Kashiyama NeoDry Multilobe Roots products are the foundation of Cancellation Systems for SEMs and SSC Compact Dry Scrolls Sumitomo our business, serving customers TEMs, CleanBench the industry Cryogenics - Pumps & Compressors in academia, industry and the standard for pneumatic vibration Synergy Cryogenics Maintenance government sector. With most of our isolation for optical microscopes, Services Visit us @ Booth 210 or staff being electron microscopists, Mag-NetX cancels magnetic fields www.SynSysCo.com 1-866-Dry-Pump and analysts, we understand the for SEMs and TEMs. SEM-Closure diverse needs of our customers. protects SEMs from acoustic noise.

Technotrade International Inc #1030 Thermo Fisher Scientific #1412 7 Perimeter Rd 1316 18th St Manchester, NH 03103 Two Rivers, WI 54241 Phone: 603-622-5011 Phone: 920-793-1121 Fax: 603-622-5211 Fax: 920-794-6478 Email: [email protected] Email: kimberly.hughes@ Web: www.technotradeinc.com thermofisher.com Web: www.thermoscientific.com/ Introducing the new HPF Compact hamilton 03, High Pressure Freezer made by the Engineering Office of Martin Wohlwend. With 20% greater freezing performance and user adjustable parameters to set each specimens optimum vitrification pressure. A new quick-release specimen holder for CLEM will be shown. http://microscopy.org/MandM/2017 | 47 > Exhibitor Directory (Cont’d.)

Vitatech Tousimis #614 Electromagnetics LLC #323 WITec Instruments Corp. #1031 2211 Lewis Ave 115 Juliad Ct - Ste 105 130G Market Place Blvd Rockville, MD 20851 Fredericksburg, VA 22406 Knoxville, TN 37922 Phone: 301-881-2450 Phone: 540-286-1984 Phone: 865-984-4445 Fax: 301-881-5374 Fax: 540-286-1865 Email: [email protected] Email: [email protected] Email: [email protected] Web: www.witec-instruments.com Web: www.tousimis.com Web: www.vitatech.net WITec is the leading German Tousimis is a globally recognized manufacturer of confocal and manufacturer of highly reliable CPD scanning-probe microscopes for systems based in the USA with global Voxa #121 Raman, Atomic Force (AFM), sales and service support. Our 45 years 1001 26th Ave E and Scanning Near-Field Optical of CPD experience in both designing Seattle, WA 98112 Microscopy (SNOM). WITec has and fabricating reliable CPD systems Phone: 415-858-0393 been distinguished by its innovative will benefit your work! Our process Email: [email protected] product portfolio and a microscope reproducibly preserves Micro & Nano 3D Web: www.voxa.com design that enables combinations of structures. Current applications include: the various imaging techniques within Voxa provides innovative and Biological, Bio-MEMS, Aerogel, MEMS, one system. To this day, WITec’s accessible imaging automation Graphene, MOF and others. Please visit us confocal microscopes are unrivaled systems. Come see our high- to see what is new this year! in sensitivity, resolution and imaging throughput reel-to-reel TEM capabilities. automation and sample TVIPS GmbH #1129 preparation suite, including GridStage and Strider. Voxa also Wolfram #115 Eremitenweg 1 offers Mochii, the world’s smallest 82131 Gauting, Germany production SEM. Small enough 100 Trade Center Dr Phone: 49 89 8506567 to fit in the overhead bin of an Champaign, IL 61820 Fax: 49 89 8508488 airplane, Mochii is a tablet-driven Phone: 217-398-0700 Email: [email protected] portable SEM now offering x-ray Fax: 217-398-0747 Web: www.tvips.com microanalysis (EDS) in a compact Email: [email protected] For 30 years, TVIPS has manufactured affordable package! Web: http://wolfram.com high-performance camera systems for http://mymochii.com Wolfram has been defining the Transmission Electron Microscopy with computational future for three resolutions from 1 to 64 megapixel. decades. As the creators of Powerful image acquisition and Wiley #1430 Mathematica, Wolfram|Alpha, and

EXHIBITOR DIRECTORY processing software packages allow 111 River St the Wolfram Language, we are the seamless integration into any type Hoboken, NJ 07030 leader in developing technology of microscope. Our latest generation Phone: 201-748-6000 and tools that inject sophisticated of TEM cameras is based on custom Fax: 201-748-6617 computation, knowledge, and designed CMOS technology with active Email: [email protected] interactivity into everything. Learn pixel sensors, featuring high dynamic Web: www.wiley.com more at www.wolfram.com. range & exceptional acquisition speed. 2017 sees Microscopy & Analysis celebrating 30 years, the world’s Zygo Corporation #324 UES, Inc. #223 longest established print and online magazine concerned with Laurel Brook Rd 4401 Dayton-Xenia Rd microscopical research. Compelling Middlefield, CT 06455 Dayton, OH 45432 content, cutting-edge practice and Phone: 860-347-8506 Phone: 937-426-6900 latest news in the field reaches Fax: 860-347-8372 Fax: 937-429-5413 46,000 subscribers through three Email: [email protected] Email: [email protected] regional editions—Americas, EMEA Web: www.zygo.com Web: www.ues.com & Asia Pacific. Visit our booth to Zygo Corporation is a worldwide Robo-Met 3D® is a fully automated, sign up for your free copy or register supplier of optical metrology serial sectioning system for three- via www.microscopy-analysis.com instruments, precision optics, dimensional microstructural and discover more exciting Wiley and electro-optical design and investigations of materials. The system publications. manufacturing services, providing sequentially polishes away micron layers productivity and yield improvement of material, optionally etches, and then solutions for manufacturers of precision optically images large areas and volumes components for a variety of industries. of the sample with high accuracy. Post- Zygo Corporation provides a wide processing reassembles this data into range of inspection, surface analysis, 3D models. precision displacement measurement, and automated solutions. 48 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Strike Gold with 50 years of Industry-Leading Magazines

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Science IXRF electronics • Glass Chipsinterface • Paint quantitative accuracy, separate peak overlaps, with nearly every EDS detector or can rebuild, maintain Cross Sectionsand even • produceMetals/alloys trace level • x-raySoils maps • Stones to reveal • Gun Shotand Resi supportdue your• Material existing detector.identificaiton IXRF guarantees • Geological • Mete- orites • Phaseelemental boundaries distributions. • Mineral identification • Miningresolution test cores and light • Marineelement performance.Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Anal- ysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identification • Raw Material Composi- tion • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis •VISIT Imaging US for AT Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • AlloysM&M • Gemstones 2017 • Paints BOOTH • Inks • Pigments #1211 • Corrosion Products • Coastings Analysis • Microelec- tronics PackagingContact Us: • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical filters • Photovoltaics • [email protected] coatings • |Wear www.ixrfsystems.com resistance • | RoHS 512.386.6100 applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Elec- tronic Components • Defect Analysis • Contaminant Identification • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer M&M2017-Full-PageAD.indd 1 4/25/17 8:32 PM > Exhibitor Categories

Accessories (miscellaneous) Camera / Digital Camera Systems - Agilent Technologies, iLab CDC, CMOS, Megapixel Operations Software 1630 Advanced Microscopy Techniques Corp. 916 Benchmark Technologies T-117 Analitex 329 Evactron by XEI Scientific, Inc. 1108 Carl Zeiss Microscopy, LLC 1018 FOM Networks, Inc. 1232 Direct Electron, LP 730 Kammrath and Weiss 211 Finger Lakes Instrumentation 125 Microscopy Innovations, LLC 311 Gatan, Inc. 504 PIE Scientific LLC 420 HORIBA Scientific 213 Technotrade International, Inc. 1030 Quantum Detectors Ltd. 212 Scientific Instruments & Applications, Inc. 1230 AFM / STM Accessories TVIPS GmbH 1129 Herzan LLC 209 Nanosurf, Inc 129 Cold Sputtering Equipment NT-MDT AMERICA, INC 132 SEC CO., Ltd 417 Oxford Instruments 724 Park Systems Inc 232 Confocal Microscopes Carl Zeiss Microscopy, LLC 1018 Anti-Contamination Systems Digital Surf 517 Evactron by XEI Scientific, Inc. 1108 EXHIBITOR DIRECTORY Keyence Corporation of America 514 Fischione Instruments 1222 Leica Microsystems 908 ibss Group, Inc. 1130 NT-MDT AMERICA, INC 132 PIE Scientific, LLC 420 Olympus America, Inc. 219 WITec Instruments Corp. 1031 Atomic Force Microscopes Angstrom Scientific, Inc. 1210 Consulting Bruker Corporation 1308 Analitex 329 Digital Surf 517 Applied Physics Technologies, Inc. 616 Hitachi High Technologies America, Inc. 623 IDES, Inc. 519 Keysight Technologies 1622 Object Research Systems 1214 Nanosurf, Inc. 129 FOM Networks, Inc. 1232 NT-MDT AMERICA, Inc. 132 Wolfram 115 Park Systems, Inc. 232 WITec Instruments Corp. 1031 Courses/Workshops Diatome US 1109 Auger Microscopes Electron Microscopy Sciences 1110 Physical Electronics 229 Royal Microscopical Society 207

Backscatter Detectors Critical Point Dryers IFG / Fischer Technology 224 Tousimis 614 J. Kraft Microscopy Services, Inc. 318 PNDetector GmbH 1429 Cryoequipment Books Boeckeler Instruments Inc. 820 Cambridge University Press 1010 SmarAct Inc. 1331 Royal Microscopical Society 207 Synergy Systems Corporation 210 Springer 1015

Calibration and Reference Standards / Reference Materials IFG / Fischer Technology 224 http://microscopy.org/MandM/2017 | 51 > Exhibitor Categories (Cont’d.)

Crystallographic Mapping Electron Backscattered Diffraction (EBSD) Analitex 329 Bruker Corporation 1308 EDAX 324 EDAX 324 NanoMEGAS USA 1618 International Centre for Diffraction Data (ICDD) 1329 Oxford Instruments 724 Databases FOM Networks, Inc. 1232 International Centre for Diffraction Data Electron Microprobes / EPMA (ICDD) 1329 JEOL USA, Inc. 708 Voxa 121 Detectors Coxem Co., Ltd 330 EMI Cancellation DECTRIS Ltd. 131 Herzan LLC 209 Direct Electron, LP 730 Integrated Dynamics Engineering IDE 1032 Finger Lakes Instrumentation 125 HORIBA Scientific 213 Failure Analysis Olympus America Inc. 219 Angstrom Scientific Inc. 1210 PNDetector GmbH 1429 Applied Beams LLC 225 PNSensor GmbH 1330 EDAX 324 Quantum Detectors Ltd. 212 Ephemeron Labs 1632

EXpressLO LLC 331 Diamond Knives Keyence Corporation of America 514 Diatome US 1109 Kleindiek Nanotechnik 1212 Ladd Research 920 Leica Microsystems 908

Olympus America Inc. 219 Dual Beam FIB/SEM Pace Technologies 214 Carl Zeiss Microscopy, LLC 1018 Park Systems Inc 232 Raith America, Inc. 929 Tescan USA 1508 EXHIBITOR DIRECTORY FIB accessories Thermo Fisher Scientific (formerly FEI) 1318 Applied Beams, LLC 225 E Beam Lithography EXpressLO LLC 331 331 FemtoTools AG 1231 1231 Applied Physics Technologies, Inc. 616 Hummingbird Scientific 830 830 Photo Electron Soul, Inc. 126 Hysitron ( Bruker Corporation) 720 720 Raith America, Inc. 929 Kammrath and Weiss 211 EDS Detectors & Systems Kleindiek Nanotechnik 1212 Physical Electronics 229 229 Angstrom Scientific Inc. 1210 Ted Pella Inc. 1309 Bruker Corporation 1308 Coxem Co., Ltd 330 EDAX 324 Filaments and Filament Rebuilding - Field JEOL USA, Inc. 708 Emission Sources, LaB6 Sources Oxford Instruments 724 Applied Physics Technologies, Inc. 616 PNDetector GmbH 1429 SEC CO., Ltd 417

Electrical Characterization Ephemeron Labs 1632

52 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Fluorescence Microscopy Knives Carl Zeiss Microscopy, LLC 1018 Diatome US 1109 Finger Lakes Instrumentation 125 HORIBA Scientific 213 Light Microscopes Keyence Corporation of America 514 Carl Zeiss Microscopy, LL 1018 Leica Microsystems 908 HIROX-USA, Inc 313 Nanoscience Instruments 429 Keyence Corporation of America 514 Leica Microsystems 908 Focused Ion Beam Systems / Workstations Tescan USA 1508 Applied Beams LLC 225 Zygo Corporation 324 EXpressLO LLC 331 FOM Networks, Inc. 1232 Metallography Equipment Hitachi High Technologies America, Inc. 623 FemtoTools AG 1231 Leica Microsystems 908 Pace Technologies 214 Raith America, Inc. 929 Thermo Fisher Scientific (formerly FEI) 1318 Micro-CT Scanning FT-IR Microscopy Rigaku Americas Corp. 218

Finger Lakes Instrumentation 125 Micromanipulators EXHIBITOR DIRECTORY Glow Discharge Cleaning Angstrom Scientific, Inc. 1210 Diatome US 1109 PIE Scientific LLC 420 331 SPI Supplies 520 EXpressLO LLC Ted Pella Inc. 1309 Kleindiek Nanotechnik 1212 Oxford Instruments 724 Immuno-Labeling SmarAct Inc. 1331

Microscopy Innovations, LLC 311 Microtome and Ultramicrotome Repair Image Analysis and Processing Boeckeler Instruments Inc. 820

Analitex 329 Bruker Corporation 1308 Microtomes and Ultramicrotomes Direct Electron, LP 730 Boeckeler Instruments Inc. 820 HREM Research Inc. 932 Diatome US 1109 Object Research Systems 1214 Leica Microsystems 908

SEC CO., Ltd 417 Wolfram 115 Microwave Tissue Processing Ladd Research 920 Ion Pumps New and Rebuilding Ted Pella Inc. 1309

Duniway Stockroom Corp. 1229 Nano Indentation Journals FemtoTools AG 1231 Cambridge University Press 1010 Hysitron ( Bruker Corporation) 720 Royal Microscopical Society 207 IFG / Fischer Technology 224 Springer 1015 Keysight Technologies 1622 Nanomechanics, Inc. 118 Knife Resharpening / Resharpening Services Nanoscience Instruments 429 Diatome US 1109 Rigaku Americas Corp. 218

http://microscopy.org/MandM/2017 | 53 > Exhibitor Categories (Cont’d.) Nanopositioners & Stages Raman Spectroscopy/Microscopy Kleindiek Nanotechnik 1212 HORIBA Scientific 213 Raith America, Inc. 929 NT-MDT AMERICA, INC 132 SmarAct Inc. 1331 Rigaku Americas Corp. 218 Tescan USA 1508 Nanoprobes / Mechanical Microprobes WITec Instruments Corp. 1031

Ephemeron Labs 1632 Kleindiek Nanotechnik 1212 Scanning Electron Microscopes (SEM) Nanoscience Instruments 429 Applied Beams LLC 225 Raith America, Inc. 929 Applied Physics Technologies, Inc. 616 Carl Zeiss Microscopy, LLC 1018 New and Used Equipment Coxem Co., Ltd 330 Duniway Stockroom Corp. 1229 Digital Surf 517 J. Kraft Microscopy Services, Inc. 318 Hitachi High Technologies 623 Scientific Instruments & Applications, Inc. 1230 America, Inc. 1032 Synergy Systems Corporation 210 Integrated Dynamics Engineering IDE Technotrade International Inc 1030 J. Kraft Microscopy Services, Inc. 318 JEOL USA, Inc. 708 Osmium Coaters Keysight Technologies 1622 Nanoscience Instruments 429 SPI Supplies 520 Phenom-World B.V. 430 Other Photo Electron Soul Inc. 126 Raith America, Inc. 929 19th International Microscopy Congress (IMC19) c/o Arinex Pty Ltd 418 SEC CO., Ltd 417 Agilent Technologies, iLab Tescan USA 1508 Operations Software 1630 Thermo Fisher Scientific (formerly FEI) 1318 FOM Networks, Inc. 1232 Voxa 121 Microscopy Society of America MegaBooth 304

EXHIBITOR DIRECTORY Scanning Probe Microscope Accessories Phase Identification Herzan, LLC 209 211 Analitex 329 Kammrath and Weiss 132 Benchmark Technologies T-117 NT-MDT AMERICA, INC 232 NanoMEGAS USA 1618 Park Systems Inc International Centre for Diffraction Physical Electronics 229 Data (ICDD) 1329 SmarAct Inc. 1331

Plasma Cleaners Scanning Transmission Electron Evactron by XEI Scientific, Inc. 1108 Microscopes (STEM) Fischione Instruments 1222 Coxem Co., Ltd 330 ibss Group, Inc. 1130 Direct Electron, LP 730 PIE Scientific LLC 420 EXpressLO LLC 331 SPI Supplies 520 Hitachi High Technologies America, Inc. 623

HREM Research Inc. 932 Publishers Nion Company 204 Cambridge University Press 1010 Photo Electron Soul Inc. 126 Royal Microscopical Society 207 Protochips, Inc. 924 Springer 1015 Thermo Fisher Scientific (formerly FEI) 1318 Wiley 1430 Quantum Detectors Ltd. 212

54 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Scanning Tunneling Microscopes Service & Repair Digital Surf 517 J. Kraft Microscopy Services, Inc. 318 Scientific Instruments & 1230 SEM Accessories Applications, Inc. Synergy Systems Corporation 210 Advanced Microscopy Techniques Corp. 916

Applied Beams LLC 225 Boeckeler Instruments Inc. 820 Service Laboratories Agilent Technologies, iLab Electron Microscopy Sciences 1110 Operations Software 1630 Ephemeron Labs 1632 Applied Beams LLC 225 Evactron by XEI Scientific, Inc. 1108 Park Systems Inc 232 EXpressLO LLC 331 FemtoTools AG 1231 Society and Event Organizer Gatan, Inc. 504 Royal Microscopical Society 207 Herzan LLC 209 Hummingbird Scientific 830 Software Hysitron ( Bruker Corporation) 720 Agilent Technologies, iLab 1630 ibss Group, Inc. 1130 Operations Software Integrated Dynamics Engineering IDE 1032 Analitex 329 J. Kraft Microscopy Services, Inc. 318 Digital Surf 517 EXHIBITOR DIRECTORY Kammrath and Weiss 211 Ephemeron Labs 1632 1212 Kleindiek Nanotechnik FOM Networks, Inc. 1232 Ladd Research 920 Gatan, Inc. 504 Nanomechanics, Inc. 118 HREM Research, Inc. 932 Nanosurf, Inc 129 International Centre for Diffraction Phenom-World B.V. 430 Data (ICDD) 1329 Photo Electron Soul Inc. 126 Object Research Systems 1214 PIE Scientific LLC 420 Phenom-World B.V. 430 PNDetector GmbH 1429 Thermo Fisher Scientific (formerly FEI) 1318 Protochips, Inc. 924 Wolfram 115

SPI Supplies 520 Ted Pella Inc. 1309 Specimen Preparation & Handling Tousimis 614 Boeckeler Instruments Inc. 820 WITec Instruments Corp. 1031 Coxem Co., Ltd 330 Electron Microscopy Sciences 1110 SEM Stages, Mounts and Holders Evactron by XEI Scientific, Inc. 1108 Ephemeron Labs 1632 Fischione Instruments 1222 Hysitron ( Bruker Corporation) 720 Gatan, Inc. 504 Kammrath and Weiss 211 JEOL USA, Inc. 708 Phenom-World B.V. 430 Microscopy Innovations, LLC 311 SmarAct Inc. 1331 Pace Technologies 214 Tousimis 614 Technotrade International Inc. 1030 Voxa 121 Ted Pella Inc. 1309 Tousimis 614 SEM/STEM Digital Imaging Systems Bruker Corporation 1308 Specimen Storage Direct Electron, LP 730 Microscopy Innovations, LLC 311 311

J. Kraft Microscopy Services, Inc. 318 Protochips, Inc. 924 Quantum Detectors Ltd. 212 TVIPS GmbH 1129 http://microscopy.org/MandM/2017 | 55

TED PELLA, INC. PREMIER SUPPLIER ACCESSORIES, STANDARDS 49 YEARS OF SAMPLE PREPARATION INSTRUMENTS & CONSUMABLES OF EXCELLENCE The Ted Pella, Inc. Story

Founded in January 1968 by Ted and Christel Pella, the company prides itself with excellence of service and a wide ranging product portfolio supplied to our valued customers globally in microscopy and the applied sciences.

Introducing PELCO® Geoslides We manufacture and sell instruments Storage Boxes & Petrographic Slides and supplies worldwide to serve laboratories dedicated to a variety of types of microscopy: Transmission and Scanning Electron Microscopy, Electron Microprobe Analysis, FIB Microscopy, Atomic Force Microscopy, Confocal Laser Microscopy ® PELCO BioWave Pro+ PELCO easiGlow™ and Light Microscopy. Microwave Processing System Glow Discharge System We serve colleges and universities, Trusted Technology, Enhanced Efficiency Optimized for Cleaning TEM Grids private companies, hospitals and various branches of government, domestic and PELCO® Microscopy international. Our products help customers in a diverse set of fields including: Calibration Standards Aerospace, Automotive, Biology, Biotech- Magnification, Resolution, Microanalysis nology, Chemistry, Chemical Engineering, Energy, Failure Analysis, Food & Beverag- es, Forensics, Genetics, Histology, Metals/ Plastics/Rubber/Materials Science, MEMS, Metallurgy/Metallography, Microelectron- ics, Nanotechnology, Neurosciences, Pa- thology, Pharmaceuticals, Physics, Quality Assurance and Semiconductors.

Among our talented scientific staff are specialists in the field of the life sciences including histology, biological electron microscopy, ultramicrotomy, and immu- ® ® Cressington Sputter Motic BA310 MET & PELCO Modular SEM nogold staining. We also have specialists & Carbon Coaters BA310 MET-T Microscopes Holders & Mounts in materials science experienced in electron microscopy, optical light microscopy, Complete Line of Desktop Vacuum Cost-effective Incident Light & Combination Comprehensive, Cost-effective, vacuum coating, metallography, petrog- Coating Instruments Available Incident / Reflected Light Microscopes Interchangeable Between SEM Platforms raphy, image analysis, grids, sample holders and calibration standards. Ted Pella, Inc. is recognized as the leader in microwave tissue processing technology and is active in applications develop- Microscopy Products for Science and Industry M&M 2017 | BOOTH 1309 ment in this area. We continually strive to Come visit us August 7–10 in St. Louis, MO provide our customers in all of the fields www.tedpella.com [email protected] 800-237-3526 with outstanding products and services. > Exhibitor Categories (Cont’d.) Spectrometers TEM Accessories Gatan, Inc. 504 Advanced Microscopy Techniques Corp. 916 HORIBA Scientific 213 Boeckeler Instruments Inc. 820 IFG / Fischer Technology 224 Gatan, Inc. 504 Physical Electronics 229 Herzan, LLC 209 Hummingbird Scientific 830 Stage Automation Hysitron (Bruker Corporation) 720 SmarAct Inc. 1331 IDES, Inc. 519 Voxa 121 Integrated Dynamics Engineering IDE 1032 Ladd Research 920 Stereoscopic Viewing Systems NanoMEGAS USA 1618 Electron Microscopy Sciences 1110 Photo Electron Soul, Inc. 126 PNDetector GmbH 1429 Supplies Protochips, Inc. 924 Electron Microscopy Sciences 110 Scientific Instruments & Applications, Inc. 1230 Ladd Research 920 SPI Supplies 520 Microscopy Innovations, LLC 311 Ted Pella Inc. 1309 Pace Technologies 214 Tousimis 614 Quantum Detectors Ltd. 212 Surface Analysis Coxem Co., Ltd 330 TEM Specimen Holders Digital Surf 517 Fischione Instruments 1222 HORIBA Scientific 213 Hummingbird Scientific 830 JEOL USA, Inc. 708 Hysitron (Bruker Corporation) 720 Keyence Corporation of America 514 Protochips, Inc. 924 Nanoscience Instruments 429 Voxa 121 Nanosurf, Inc 129

Olympus America Inc. 219 Testing Equipment EXHIBITOR DIRECTORY Physical Electronics 229 WITec Instruments Corp. 1031 Benchmark Technologies T-117 Zygo Corporation 324 FemtoTools AG 1231 HIROX-USA, Inc. 313 Surface Profiling IFG / Fischer Technology 224 Keyence Corporation of America 514 Kammrath and Weiss 211 Park Systems, Inc. 232 NT-MDT AMERICA, INC 132 Zygo Corporation 324 Olympus America, Inc. 219 Zygo Corporation 324 Tabletop SEM/TEM Angstrom Scientific Inc. 1210 Applied Physics Technologies, Inc. 616 Hitachi High Technologies America, Inc. 623 SEC CO., Ltd 417 Nanoscience Instruments 429 Phenom-World B.V. 430 Voxa 121

58 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Transmission Electron Microscopes (TEM) Applied Physics Technologies, Inc. 616 Direct Electron, LP 730 Hitachi High Technologies America, Inc. 623 HREM Research, Inc. 932 Integrated Dynamics Engineering IDE 1032 JEOL USA, Inc. 708 NanoMEGAS USA 1618 Photo Electron Soul, Inc. 126 Protochips, Inc. 924 Scientific Instruments & Applications, Inc. 1230 Thermo Fisher Scientific (formerly FEI) 1318

Vacuum Equipment Duniway Stockroom Corp. 1229 Electron Microscopy Sciences 1110 Synergy Systems Corporation 210 Technotrade International Inc. 1030

EXHIBITOR DIRECTORY Vacuum Evaporators Ladd Research 920 SPI Supplies 520 Technotrade International Inc. 1030

Vibration Isolation Systems Herzan, LLC 209 Integrated Dynamics Engineering IDE 1032 TMC 324

WDS Detectors & Systems Bruker Corporation 1308 EDAX 324 Oxford Instruments 724 Rigaku Americas Corp. 218

X-ray Analysis Equipment Angstrom Scientific Inc. 1210 EDAX 324 Finger Lakes Instrumentation 125 IFG / Fischer Technology 224 International Centre for Diffraction Data (ICDD) 1329 Olympus America Inc. 219 Oxford Instruments 724 Phenom-World B.V. 430 Physical Electronics 229 PNDetector GmbH 1429 Rigaku Americas Corp. 218 SEC CO., Ltd 417 http://microscopy.org/MandM/2017 | 59 > Exhibitor List by Booth (As of 4/15/17)

BOOTH EXHIBITOR NAME BOOTH EXHIBITOR NAME BOOTH EXHIBITOR NAME

Benchmark Technologies Analitex Electron Microscopy T-117 329 1109 Sciences 115 Wolfram Research, Inc. 330 Coxem Co., Ltd Electron Microscopy 1110 118 Nanomechanics, Inc. 331 EXpressLO LLC Sciences Voxa SEC Co. Ltd. c/o 121 417 1129 TVIPS GmbH NanoImages, LLC 125 Finger Lakes Instrumentation 1130 ibss Group, Inc. IMC19 Congress c/o 418 126 Photo Electron Soul, Inc. Arinex Pty Ltd 1131 Norcada, Inc. 129 Nanosurf, Inc. 420 PIE Scientific LLC 1210 Angstrom Scientific, Inc. 131 DECTRIS Ltd 429 Nanoscience Instruments 1211 IXRF Systems, Inc. NT-MDT Spectrum 132 430 Phenom-World 1212 Kleindiek Nanotechnik Instruments 504 Gatan, Inc. 1214 Objects Research Systems 204 Nion Company Keyence Corporation of Fischione Instruments 514 1222 207 Royal Microscopical Society America 1229 Duniway Stockroom Corp. 209 Herzan, LLC 517 Digital Surf SARL Scientific Instruments & 1230 210 Synergy Systems Corporation 519 IDES, Inc Applications, Inc. 211 Kammrath and Weiss 520 SPI Supplies 1231 FemtoTools AG 212 Quantum Detectors 614 Tousimis 1232 FOM Networks, Inc. 213 HORIBA Scientific Applied Physics Bruker Corporation 616 1308 Technologies, Inc. 214 Pace Technologies 1309 Ted Pella Inc. Hitachi High Technologies 623 217 Barnett Technical Services America, Inc. 1318 FEI Company 218 Rigaku Americas Corp. Thermo Fisher Scientific 708 JEOL USA, Inc. 1318 (formerly FEI) 219 Olympus America Inc 720 Hysitron, Inc. International Centre for 1329 223 UES, Inc. 724 Oxford Instruments Diffraction Data (ICDD) 224 IFG - Fischer Technologies 730 Direct Electron, LP 1330 PNDetector GmbH 225 Applied Beams LLC EXHIBITOR DIRECTORY 820 Boeckeler Instruments Inc. 1331 SmarAct, Inc. 226 Seiwa Optical America, Inc 830 Hummingbird Scientific 1412 Thermo Fisher Scientific 229 Physical Electronics 908 Leica Microsystems 1429 PNSensor GmbH 231 SCIENION US, Inc. Advanced Microscopy Wiley 916 1430 Techniques Corp. 232 Park Systems, Inc. 1508 Tescan USA Microscopy Society of 920 Ladd Research 304 1618 NanoMEGAS USA America MegaBooth 924 Protochips, Inc. 1622 Keysight Technologies 309 Amptek, Inc. 929 Raith America, Inc. 1624 Angstrom Science, Inc. 311 Microscopy Innovations, LLC 932 HREM Research, Inc. 1626 E. Fjeld Co, Inc. 313 HIROX-USA, Inc. 1010 Cambridge University Press iLab Solutions, part of 1630 317 Renishaw Inc. 1015 Springer Agilent Technologies J. Kraft Microscopy 318 1018 Carl Zeiss Microscopy, LLC 1632 Ephemeron Labs Services, Inc. 1019 Denton Vacuum, LLC Vitatech 323 Electromagnetics LLC Technotrade International, 1030 Inc. 324 CAMECA Instruments, Inc. 1031 WITec Instruments Corp 324 Edax/Ametek Integrated Dynamics 1032 324 TMC Engineering 324 Zygo Corporation 1108 XEI Scientific, Inc.

60 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO Automated TEM Sample Preparation

Deposit multiple different samples, each about 100 pL, at different locations, on almost any grid or cell.

M&M Booth 231

For more information, please email us at [email protected] or visit www.scienion.com/sciTEM > Exhibitor List by Name (As of 4/15/17)

EXHIBITOR NAME BOOTH EXHIBITOR NAME BOOTH EXHIBITOR NAME BOOTH

Advanced Microscopy ibss Group, Inc. 1130 Protochips, Inc. 924 916 Techniques Corp. IDES, Inc. 519 Quantum Detectors Ltd. 212 Amptek, Inc. 309 IFG - Fischer Technologies 224 Raith America, Inc. 929 Analitex 329 iLab Solutions 1630 Renishaw, Inc. 317 Angstrom Science, Inc. 1624 IMC19 Congress c/o Rigaku Americas Corp. 218 418 Angstrom Scientific Inc. 1210 Arinex Pty Ltd Royal Microscopical Society 207 Applied Beams LLC 225 Integrated Dynamics 1032 Engineering IDE SCIENION US, Inc. 231 Applied Physics 616 International Centre for Scientific Instruments & Technologies, Inc. 1329 1230 Diffraction Data (ICDD) Applications, Inc. Barnett Technical Services 217 IXRF Systems, Inc. 1211 SEC CO., Ltd 417 Benchmark Technologies T-117 J. Kraft Microscopy Seiwa Optical America, Inc. 226 Boeckeler Instruments Inc. 820 318 Services, Inc. SmarAct, Inc. 1331 Bruker Corporation 1308 JEOL USA, Inc. 708 SPI Supplies 520 Cambridge University Press 1010 Kammrath and Weiss 211 Springer 1015 CAMECA Instruments, Inc. 324 Keyence Corporation 514 Synergy Systems Corporation 210 Carl Zeiss Microscopy, LLC 1018 of America Technotrade International Inc. 1030 Coxem Co., Ltd 330 Keysight Technologies 1622 Ted Pella Inc. 1309 DECTRIS Ltd. 131 Kleindiek Nanotechnik 1212 Tescan USA 1508 Denton Vacuum, LLC 1019 Ladd Research 920 Thermo Fisher Scientific 1412 Digital Surf 517 Leica Microsystems 908 Thermo Fisher Scientific 1318 Direct Electron, LP 730 Microscopy Innovations, LLC 311 (formerly FEI) Microscopy Society of Duniway Stockroom Corp. 1229 304 TMC 324 America MegaBooth E. Fjeld Co, Inc. 1626 Tousimis 614 Nanomechanics, Inc. 118 EDAX 324 TVIPS GmbH 1129

EXHIBITOR DIRECTORY NanoMEGAS USA 1618 Electron Microscopy Sciences 1109 UES, Inc. 223 Nanoscience Instruments 429 Vitatech Electron Microscopy Sciences 1110 323 Nanosurf, Inc. 129 Electromagnetics, LLC Ephemeron Labs 1632 Nion Company 204 Voxa 121 EXpressLO, LLC 331 Norcada, Inc. 1131 Wiley 1430 FEI Company 1318 NT-MDT Spectrum 132 WITec Instruments Corp. 1031 FemtoTools AG 1231 Instruments Wolfram 115 Finger Lakes Instrumentation 125 Object Research Systems 1214 XEI Scientific, Inc. 1108 Fischione Instruments 1222 Olympus 219 Zygo Corporation 324 FOM Networks, Inc. 1232 Oxford Instruments 724 Gatan, Inc. 504 Pace Technologies 214 Herzan, LLC 209 Park Systems, Inc. 232 HIROX-USA, Inc. 313 Phenom-World 430 Hitachi High Technologies Photo Electron Soul, Inc. 126 623 America, Inc. Physical Electronics 229 HORIBA Scientific 213 PIE Scientific, LLC 420 HREM Research, Inc. 932 PNDetector GmbH 1429 Hummingbird Scientific 830 PNSensor GmbH 1330 Hysitron, Inc. 720

62 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO www.nion.com +1 425 822 1521

1 CFEG energy distribution

Zero loss peak (ZLP) acquired with y t

i 250 meV Nion UltraSTEM MC, 3ms, n s

e 0.5 60kV primary voltage compared 7 meV to the unmonochromated ZLP. I n t Monochromated EELS ZLP 0 -150 -100 -50 0 50 100 150 200 250 Energy loss (meV) a

EEL spectrum of Guanine acquired with Nion UltraSTEM MC aloof mode, 60keV primary voltage, compared with FTIR spectrum.

ity (arb. units) Peaks b-e show vibrations due to different H bonds. s c d b e Peter Rez et al., Nature Comm 7 (2016) 10945. EELS Inten

0.1 0.2 0.3 0.4 0.5 Energy loss (eV)

1k x 1k EEL chemical map of LaMnO3/SrMnO3 superlattice. Monkman et al., Nature Mater. 11 (2012) 855-859.

1.4 1000 °C 1.2 1.0 0.8 Hexagonal BN phonon loss 0.6 and gain peaks measured 0.4 at 1000°C and 300°C at ORNL. 0.2

Norm. Intensity (arb. units) 0 The ratio of gain/loss peak -200 -100 0 100 200 Energy (meV) intensities is a sensitive measure of the local 1.4 300 °C sample temperature 1.2 1.0 Courtesy Drs. Idrobo, Lupini 0.8 Krivanek, et al. 0.6 0.4 0.2

Norm. Intensity (arb. units) 0 -200 -100 0 100 200 Energy (meV) > Exhibit Hall Diagram (As of 4/15/17)

POSTERS

64 | MICROSCOPY & MICROANALYSIS 2017 MEETING | August 6-10 | St. Louis, MO POSTERS

ENTRANCE

http://microscopy.org/MandM/2017 | 65 Savethe DATE

August 5-9, 2018 Baltimore, MD Groundbreaking MOF Results

Gatan K2 camera reveals the surface and interfacial structure of MOF ZIF-8

The Gatan K2® and K2 IS direct detection cameras capture high-resolution MOF images at an unprecedented low dose to enable scientists to understand and design more efficient materials for energy and environmental applications.

For more information, see the landmark study Unravelling surface and interfacial structure of a metal-organic framework by transmission electron microscopy available through Nature Materials (dx.doi.org/10.1038/ nmat4852), or visit: www.gatan.com/MOF.

MOF ZIF-8 structures recorded by the K2 camera; exposure = 3 s; total dose = 4.1 e-/A2; TEM magnification 43 kx; 300 kV (uncorrected) EMS_Academy Ad_May2017_Layout 1 5/16/17 10:36 PM Page 1

Spacious Labs State-of-the-Art Equipment Certified Instructors New Equipment Demos Announcing the EMS Microscopy Academy

We are excited to announce that our new academy is now open! We are COURSES now offering training courses and workshops led by our certified faculty. Aurion Immuno Gold Located next to our extensive warehouse in Hatfield, PA, just minutes from Biological SEM Philadelphia, we are now also offering demonstrations of new equipment. Biological TEM Take advantage of the knowledge Electron Microscopy Sciences is now Cryosectioning/Immunogold able to provide and the valuable information you will gain. Cryo SEM Materials Ultramicrotomy Pharma Applications “An abundance of practical info, built on the necessary Pharma Polymorphism theoretical background!” – Aurion Workshop Attendee X-Ray Microanalysis SIGN UP FOR A CLASS TODAY, OR SUGGEST A COURSE THAT YOU WANT... VISIT OUR WEBSITE TO MAKE A COURSE REQUEST... www.emsdiasum.com

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