New Applications of Excimer Lamps to the Low Temperature Photo

Total Page:16

File Type:pdf, Size:1020Kb

New Applications of Excimer Lamps to the Low Temperature Photo NEW APPLICATIONS OF EXCIMER LAMPS TO THE LOW TEMPERATURE PHOTO-DEPOSITION OF THIN FILMS A thesis submitted to the University of London for the degree of Doctor of Philosophy PHILIPPE BERGONZO Department of Electronic and Electrical Engineering UNIVERSITY COLLEGE LONDON ProQuest Number: 10055371 All rights reserved INFORMATION TO ALL USERS The quality of this reproduction is dependent upon the quality of the copy submitted. In the unlikely event that the author did not send a complete manuscript and there are missing pages, these will be noted. Also, if material had to be removed, a note will indicate the deletion. uest. ProQuest 10055371 Published by ProQuest LLC(2016). Copyright of the Dissertation is held by the Author. All rights reserved. This work is protected against unauthorized copying under Title 17, United States Code. Microform Edition © ProQuest LLC. ProQuest LLC 789 East Eisenhower Parkway P.O. Box 1346 Ann Arbor, Ml 48106-1346 à Karine, à mes parents, Abstract Over the last decade, the requirement for low temperature processing in the semiconductor industry has become apparent due to the continued reduction in device geometry and the emergence of temperature sensitive materials. Of the low temperature techniques available, photo-enhanced processing of materials is very promising since the growing films are not subject to damaging ionic bombardment which is present in plasma assisted systems. Here is presented the development of a flexible large area, low temperature photo enhanced chemical vapour deposition reactor (photo-CVD) for apphcations to low temperature thin films processing. The development of novel excimer lamps has opened up the field of direct photo- CVD. Such lamps are a cheap and intense source of visible, UV and vacuum ultraviolet radiation (YUV: below 200nm), The major breakthrough with the development of these lamps is that they offer a large number of wavelengths that can be used for selective photo-CVD. The fabrication and characterisation of those light sources were conducted, and various devices generating up to a few watts are presented. Applications of the available radiation are also presented such as for the direct VUV enhanced generation of ozone and various metal-organic depositions (MOD). For the first time, the 172nm radiation of a xenon excimer lamp has been used to deposit silicon dioxide (Si 0 2 ), silicon nitride (SigN^), and silicon oxynitride films from the photo-CVD of gas mixtures of silane with nitrous oxide and anunonia, and at temperatures as low as 300°C. Fast deposition (up to 500Â/min) of Si 0 2 was also achieved by irradiating silane and oxygen gas mixtures. Investigations into the deposition photochemistry are reported, together with the characterisation of the deposited material properties. Good Si 0 2 and SigN^ film quality was obtained, as well as a very good control of the stoichiometry in the case of silicon oxynitride film deposition, therefore providing interesting perspectives for electronic and optical applications. Abstract Acknowledgements The completion of this project would not have been possible without the help and assistance from a number of people, all of whom contributed in their own special way, and rightly deserve their mention here. I am grateful to all the persons who allowed me to use their equipment, such as Prof. M. Green for the ellip some try measurements. Dr. S. Best and Miss E. Lloyd for the FTIR analyses, and Dr. S.J.B. Corrigan who lent me a vacuum ultraviolet monochromator without expecting it back. I would also like to acknowledge Dr. M. Dubois for the SIMS analysis, and Dr. V. Craciun and his Romanian compatriots who did the XPS measurements. I am deeply indebted to Dr Frank Beech and Dr. Glenn C. Tyrrell for proof­ reading the manuscripts of this thesis, and dealing with my written French accent. Their constructive suggestions and advices were invaluable in the making of this dissertation, as well as their help on many occasions during this research, in spite of the numerous arguments I had with Glenn. I shall also recognise the support of the Service Science and Technology of the French Embassy, and namely of Mrs. V. Fleurette, who managed to make possible my military service as a researcher at UCL. I am also indirectly very thankful to Parthiv Patel, who let me take over his project. Many thanks are also due to all the people from room 919, and in particular to the great colleagues and friends who are R. Duncan Marshall and Tim H. York, for having shared so many technical problems, as well as so many late night discussions and social events. Since they had to cope with my French arrogance, I forgive Duncan for cycling faster than I, and Tim for smoking all my cigarettes. I am also deeply grateful to Dr U. Kogelschatz, from ABB, who, further to sponsor this work, also let me learn all the necessary knowledge involved with excimer lamps technologies in his laboratory. I greatly appreciate how he often solved my problems at the other end of the fax machine. I am also indebted to Prof. P. Pinard, who further to recommending me for this PhD and always trying his best for my grant applications, was indeed like a second supervisor, especially in terms of motivation and moral support. Finally, I would like to thank my supervisor Ian W. Boyd, for accepting me as a research student in his laboratory. I recognise that I owe him very much, for his understanding and encouragement, his scientific advice, his moral support, and his financial contribution. In fact, in spite of tremendous efforts to find a grant for this project, no success was ever gained from almost 12 applications for an EEC studentship over the last three years. Ian managed to sort out my financial difficulties by juggling with contracts, other grants, and arranging financed periods during the completion of this project. January 1994 UCL, London Table of Contents Abstract Preface and Acknowledgements Table of Contents 1 Introduction 4 Chapter I ...................... Photo-CVD, Apparatus and Methods 8 1- Introduction to photo-CVD processing 9 1.1- ..................The need for low temperature techniques 9 1.2- ...........................A brief outline on other techniques 9 1.3 - Photo-enhanced Chemical Vapour Deposition 10 1.4- .........................Sources of Vacuum Ultraviolet light 13 2.- ..................................Design of a photo-CVD reactor 17 2.1- Stipulations 17 2 .2 r General diagram of the photo-CVD reactor 18 2.3- Safety requirements 25 2.4- M aintenance 26 3.-.... ................... Characterisation of the deposited films 27 3.1 - Ellipsometry 27 3.2- ............................................... Infra-red spectrometry 31 4.- C o n c lu sio n 34 References to chapter 1 35 C hapter! .............................................................. Excimer Lamps 38 1.- ................Silent discharges for excimer generation 39 1.1- Electrical discharges for UV generation 39 1.2 - .......The silent discharge or dielectric barrier discharge 42 1.3- ..............................Application to rare gas molecules 49 2.- Excimer lamps {X > 160nm)54 2.1- ................................. Construction of excimer lamps 54 2.2- .................................................Power measurements 58 3 - ..................................................VUV excimer lamps 64 3.1- Introduction 64 3.2 ...............................Initial VUV excimer lamp design 64 3.3- Improvements 66 3.4- Incorporation to a CVD reactor 69 4.- Conclusion 70 References to chapter 2 71 Contents page 1 Chapters ................. Initial Applications of Excimer Lamps 74 1.- .........................Photochemical generation of ozone 75 1.1- ............................Fundamentals of ozone generation 75 1.2- .........................Ozone generation with UV radiation 79 1.3- The VUV enhanced ozone reactor 82 1.4- Conclusion 90 2.- ....................Application of excimer lamps to MOD 91 2.1- ....................................................Experimental set-up 91 2.2- ..................................UV induced metal depositions 93 2.3- ................ UV induced dielectric material depositions 96 2.4- ..................................................................... Conclusion 100 References to chapter 3 101 Chapter 4 ....................... The Photochemical Deposition and Characterisation of Silicon Dioxide Layers 103 1 -................................ The photo-CVD of silicon dioxide from silane and nitrous oxide gas mixtures 104 1.1- ............................................ Experimental conditions 104 1.2- .............................................. Results and discussion 110 1.3- Conclusion 118 2- .......................... The photo-CVD of silicon dioxide from silane and oxygen gas mixtures 120 2.1- ...................................................................Introduction 120 2.2- ..............Experimental details and sample preparation 121 2.3- .............................................. Results and discussion 125 2.4- ..................................................................... Conclusion 135 References to chapter 4 137 Chapters ........................The Photochemical Deposition and Characterisation of Silicon Nitride and Oxynitride Layers 140 1.- The photo-CVD of silicon nitride from silane and ammonia gas mixtures 141 1 .1 - ..... ............................................................Introduction 141 1.2- .................................................. Experimental details 142 1.3- .... ..............................The window
Recommended publications
  • Modification Cleaning Bonding
    EXCIMER LAMP LIGHT SOURCE Bonding Cleaning Modification EXCIMER LAMP LIGHT SOURCE RESULTS * Data verified by in-house testing. ■Surface modification of various materials TLS B0019EA Modification 100 Irradiation distance: 2 mm 90 Irradiation time: 10 s Irradiation atmosphere: air Surface modification technology is 80 utilized in a wide range of industrial Before processing fields. Compared to ordinary techniques, 70 After processing material modification using excimer 60 lamps is considered precision modifica- 50 tion because it occurs via a chemical reaction on the atomic or molecular level. 40 Moreover, this is clean modification that 30 does not harm the material and generates 20 no dust particles, and so is effective in 10 fields requiring more advanced levels of CONTACT ANGLE TO PURE WATER (°) material modification. 0 PET TAC PPS PVA COP Acrylic Polyimide Glass epoxy Polyethylene Polypropylene Polycarbonate ■Surface modification of resin ■Bonding pre-processing (improve adhesiveness) Example: Polyphenylene sulfide (PPS) + polyolefin (PO) 80° 3 15° Improved 2 about 3 times 1 Before excimer light irradiation After excimer light irradiation BONDING STRENGTH 0 Before processing After processing by excimer light by excimer light TLS B0013EA PRINCIPLE 1 Excimer lamp 2 Vacuum UV light In air O3 O(1D) O3 O(1D) O3 (Wavelength: 172 nm) 1 O2 O3 + O( D) Reaction O3 O(1D) O3 O(1D) O3 H HHH HHHH OH O OH COOH CCCC Resin material CCCC CCCC HHHH HHHH HHHH Vacuum UV light at a wavelength Bonds in material surface are Imparts hydrophilicity to the material of 172 nm generates ozone and simultaneously broken up by surface since chemical reaction active oxygen in large quantities.
    [Show full text]
  • ENTERED ATOM Instrument Corporation, Ct Al., § August 16, 2018 § David J
    Case 4:12-cv-01811 Document 142 Filed in TXSD on 08/16/18 Page 1 of 6 UNffiD STATES DISTRICT COURT SOUTHERN DISTRICT UnitedOF TEXAS States District Court Southern District of Texas ENTERED ATOM Instrument Corporation, ct al., § August 16, 2018 § David J. Bradley, Clerk Plaintiffs, § § 1Jcrsus § Civil Action H-I2-r8II § § Petroleum Analyzer Company, L.P., § § Defendant. § Findings and Conclusions 1. Background. Franek Olstowski worked for Petroleum Analyzer Company, L.P., before becoming president and part-owner of ATOM Instrument Corporation. ATOM and Petroleum develop, manufacture, and repair instruments for chemical analysis of hydrocarbons. In 2002, while working as a consultant for Petroleum, Olstowski developed an excimer light source to detect sulfur using ultraviolet fluorescence. He did this separately from his work at Petroleum. In 2003 and 2005, under a non-disclosure agreement, Petroleum and he talked about licensing his technology but did not reach an agreement. Olstowski was awarded a patent in 2007. Excimer is short for excited dimer. It is a combination of a noble gas and a reactive gas that produces ultraviolet light when excited by electricity. Possible combinations include krypton and chloride, xenon and chloride, and xenon and bromine. An excimer detects, in this case, sulfur by making it glow. like an excimer, :z;inc or cadmium can be used as a source of ultraviolet light. In 2006, Petroleum sued ATOM and Olstowski in Texas state court, claiming ownership of the excimer technology. In their contract, Olstowski and Petroleum had agreed to arbitrate, so the court sent them to do that. The arbitration panel awarded Olstowski ownership of all the technology.
    [Show full text]
  • Excimer Lamps/Excimer Irradiation Unit | USHIO INC
    11/18/2020 Excimer lamps/Excimer irradiation unit | USHIO INC. HOME Products Information Products Excimer lamps/Excimer irradiation unit Excimer lamps/Excimer irradiation unit Modification Cleaning MEMS, Electronic Semiconductors Components Liquid Crystal Display Printed Circuit Board and Functional Materials Biology and Chemistry PKG Energy Printing Excimer VUV light is the very high-energy light generated by lamps containing noble gases or noble-gas hydride compounds. Externally applying high-energy electrons to a sealed lamp containing a noble gas or noble gas hydride compound generates intense plasma discharge (dielectric barrier discharge). This plasma features high-energy electron content, and can be extinguished instantly. The plasma discharge instantly excites the atoms of the discharge gas (noble gas) to their excimer (Xe) state (high- energy orbital atoms form excimer excited molecules). The excimer-specific spectrum is emitted when atoms return from this excimer state to their original condition (ground state). This emission is called VUV light. Download * * * * Favorites Print catalog For inquiries regarding "222 nm ultraviolet (UV-C) light antibacterial and viral inactivation device," please contact : Sales Department 5, Sales Division, Light Source Business Division TEL: +81-3-5657-1016 / E-Mail: [email protected] Features Main applications Case study Product Lineup Options FAQ High photon energy VUV (vacuum ultraviolet) light at a wavelength of 180 nm or less, which is not available using conventional UV lamps, emits light efficiently to evoke or accelerate chemical reactions otherwise unachievable with conventional UV light. Single wavelength Excimer emission features a single peak emission wavelength with light emitted only in a very narrow range around the peak.
    [Show full text]
  • New Applications with the EX-Mini Compact Excimer Lamp Light Source
    2015 01 INTERVIEW PAGE 6 New Applications with the EX-mini Compact Excimer Lamp Light Source OPTO-SEMICONDUCTOR PRODUCTS PAGE 15 ELECTRON TUBE PRODUCTS PAGE 19 SYSTEMS PRODUCTS PAGE 26 Low-noise MPPC for precision Deep UV light source – higher Easy-to-use – NanoZoomer-SQ measurement power than LED Digital Slide Scanner June 22-25, 2015 Munich, Germany Hall A2, Booth 303 PHOTONNOVATION Content Medical Life ScienceDrug DiscoveryMeasurementAnalytical Semicond. Prod.Optical CommsSecurity Industry ND InspectionAcademic Research OPTO-SEMICONDUCTOR PRODUCTS 15 MPPC®/MPPC Module S13360 Series, C13365/C13366 Series 16 CMOS Linear Image Sensor S13131 17 Mini-spectrometer C13053MA 18 InAsSb Photovoltaic Detector (Non-cooled Type) P13243 Series ELECTRON TUBE PRODUCTS 19 Deep UV Light Source (UVCL) L12848-305 20 Excimer Lamp Light Source L11751-01, E12499, C11997 21 Opto-Spectrum Generator L12194-00-34054 22 NIR-PMT Unit H12397-75 23 Fast Decay Time Phosphor J12782-09D SYSTEMS PRODUCTS 24 ORCA-Flash4.0 LT with W-VIEW Mode™ 26 NanoZoomer-SQ Digital Slide Scanner C13140-21 27 ImagEM X2-1K EM-CCD Camera C9100-24B LASER PRODUCTS 28 LD Irradiation Light Source (SPOLD) L11785-61 29 Super Luminescent Diode (SLD) L12856-04 CompaNY NEWS APPLICATION REPORT 4 Hamamatsu holds the IEEE Milestone dedication ceremony 10 Tumor detection in fluorescent tissue microarrays enables high-through- in recognition of 20-inch photomultiplier tubes put analysis of multiple cancer biomarkers 5 Hamamatsu establishes a new subsidiary to enhance sales 12 Investigations of emission
    [Show full text]
  • New Approaches in Optical Lithography Technology for Subwavelength Resolution
    Rochester Institute of Technology RIT Scholar Works Theses 5-2005 New approaches in optical lithography technology for subwavelength resolution Hoyoung Kang Follow this and additional works at: https://scholarworks.rit.edu/theses Recommended Citation Kang, Hoyoung, "New approaches in optical lithography technology for subwavelength resolution" (2005). Thesis. Rochester Institute of Technology. Accessed from This Dissertation is brought to you for free and open access by RIT Scholar Works. It has been accepted for inclusion in Theses by an authorized administrator of RIT Scholar Works. For more information, please contact [email protected]. NEW APPROACHES IN OPTICAL LITHOGRAPHY TECHNOLOGY FOR SUBW A VELENGTH RESOLUTION by Hoyoung Kang M.S. Hanyang University (1987) A dissertation submitted in partial fulfillment of the requirements for the degree of Ph.D. in the Chester F. Carson Center for Imaging Science of the College of Science Rochester Institute of Technology May 2005 Author HoyoungKang Hoyoung Kang . Accepted by CHESTER F. CARLSON CENTER FOR IMAGING SCIENCE COLLEGE OF SCIENCE ROCHESTER INSTITUTE OF TECHNOLOGY ROCHESTER, NEW YORK CERTIFICATE OF APPROVAL Ph. D. DEGREE DISSERTATION The Ph.D. Degree Dissertation of Hoyoung Kang has been examined and approved by the dissertation committee as satisfactory for the dissertation requirement for the Ph.D. degree in Imaging Science Bruce W. Smith Dr. Bruce W. Smith, Thesis Advisor Zoran Ninkov Dr. Zoran Ninkov M. Kotlarchyk Dr. Michael Kotlarchyk Paul Michaloski Paul Michaloski, Date Thesis/Dissertation Author Permission Statement Title of thesis or dissertation: ________________---;- ____ N eu.l I'>.pproecb 1'0 OptIc 0..0 (!'t-b03k=A.phJ Te.cb'Y>C)lo~ y Nrumeofauthor: ____H_D~y~o_U_~ __ ~~ __~~~~~~~~ ___________~ ____ Degree: ph.
    [Show full text]
  • STERILRAY Vs . LARSON ELECTRONICS
    Case 3:21-cv-01166-X Document 1 Filed 05/21/21 Page 1 of 38 PageID 1 IN THE UNITED STATES DISTRICT COURT FOR THE NORTHERN DISTRICT OF TEXAS HIGH ENERGY OZONE LLC d/b/a FAR- ) UV STERILRAY and S. EDWARD ) NEISTER, ) ) Civil Action No. 3:21-cv-1166 Plaintiffs, ) ) JURY TRIAL DEMANDED v. ) ) LARSON ELECTRONICS LLC, ) ) Defendant. ) COMPLAINT Plaintiffs High Energy Ozone LLC d/b/a Far-UV Sterilray (“HEO3”) and Mr. S. Edward Neister (“Mr. Neister”) (collectively, “Plaintiffs”), allege as follows: INTRODUCTION 1. More than fifteen years ago, physicist S. Edward Neister developed and patented methods for deactivating or destroying harmful microorganisms using a new spectrum of ultraviolet (UV) light. Mr. Neister’s methods included the development and use of Krypton-Chloride excimer lamps that emit a peak wavelength at 222 nm in conjunction with other wavelengths. Unlike the 254 nm UV light—which had been used for decades for sanitization but was dangerous to humans—applying 222 nm UV light does not penetrate human skin or eyes, making it far better and more useful than traditional lamps and methods of use. 2. Mr. Neister’s patented technology became the foundation for the family business. Mr. Neister and his brother John Neister originally founded the company Case 3:21-cv-01166-X Document 1 Filed 05/21/21 Page 2 of 38 PageID 2 that would become HEO3 in 2005 in a small town in New Hampshire. HEO3 is producing and selling lamps designed to perform Mr. Neister’s patented methods of killing harmful microorganisms. 3.
    [Show full text]
  • Targeted Phototherapy
    Review TTargetedargeted pphototherapyhototherapy Article VVenkataramenkataram MysoreMysore ABSTRACT Centre for Advanced Phototherapy is one of the most important therapeutic modalities in dermatology. This fi eld has Dermatology, Bangalore, India seen several major advances in the recent years, the most recent being targeted phototherapy. Targeted phototherapy, which includes laser and nonlaser technologies, delivers light/laser AAddressddress forfor ccorrespondence:orrespondence: in the ultraviolet spectrum, of specifi c wavelength, specifi cally targeted at the affected skin Dr. Venkataram Mysore, Venkat Charmalaya - Centre and thereby avoids many of the side effects of conventional phototherapy. The treatment for Advanced Dermatology, has been claimed to be effective, quick, and needing fewer treatment sessions. The article 3437 1st G cross 7 main reviews this new mode of phototherapy. Subbanna Garden, Vijay Nagar, Bangalore – 560 040, Key words: Excimer laser, excimer light, phototherapy, psoriasis, targeted phototherapy, India. E-mail: [email protected] vitiligo DDOI:OI: 10.4103/0378-6323.48655 PMID: 19293497 IINTRODUCTIONNTRODUCTION etc. These machines have the following disadvantages: 1. Exposure of uninvolved areas Phototherapy is used for a wide variety of skin diseases. 2. Slow delivery system and lengthy treatment There has been considerable progress in cellular sessions and cutaneous photobiology leading to improved 3. Multiple and frequent visits to clinic understanding of different photodermatoses and their 4. Difficulty in treating certain areas (such as treatment. However, the developments in phototherapy genitalia, oral mucosa, ear, etc) have been comparatively slow, as reflected in a recent 5. Difficulty in treating children who may feel publication that “developments in phototherapy have intimidated by the large machines not kept pace with scientific progress, as has been the 6.
    [Show full text]
  • Excimer Lamp Pumped by a Triggered Discharge
    ENTE PER LE NUOVE TECNOLOGIE, L'ENERGIA E L'AMBIENTE Dipartimento Innovazione ET f\T- - 9k 13 EXCIMER LAMP PUMPED BY A TRIGGERED DISCHARGE G. BALDACCHINI, S. BOLLANTI, P. Dl LAZZARO, F. FLORA, G. GIORDANO, T. LETARDI, A. RENIERI, G. SCHINA Centro Ricerche Frascati, Roma G. CLEMENTI, F. MUZZI, C.E. ZHENG EL.EN., (Electronic Engineering), Firenze MASTER DISTRIBUTION OF THIS DOCUMENT IS UNLIMITED FOREIGN SALES PROHIBITED RT/INN/96/13 DISCLAIMER Portions of this document may be illegible in electronic image products. Images are produced from the best available original document ABSTRACT Radiation characteristics and discharge performances of an excimer lamp are described. The discharge of the HCl/Xe gas mixture at an atmospheric pres­ sure, occurring near the quartz tube wall, is initiated by a trigger wire. A maximum total UV energy of about 0.4 J in a (0.8-0.9) ps pulse, radiated from a 10 cm discharge length, is obtained with a total discharge input energy of 8 J. Excimer lamps are the preferred choice for medical and material processing ir­ radiations, when the monochromaticity orcoherence of U V light is not required, due to their low cost, reliability and easy mantainance. (DISCHARGE UV LAMP). RIASSUNTO In questo iavoro vengono illustrate le caratteristiche di eccitazione e di emissione radiativa di ima lampada ad eccimeri. La scarica di eccitazione e innescata da un filo ad alia lensione e si sviluppa vicino alia parete del tubo di quarzo in una miscela di gas HCl/Xe a pressione atmosferica. Con un’energsa d; 8 J depositata dalla scarica in una lampada lunga 10 cm, si ottiene un’cnergia massima irraggiata nell’ultravioletto di 0.4 J in un impulse di 0.8-0.9 ps di durata.
    [Show full text]
  • Excimer Lamp Excimer Lamp
    RFRF DISCHARGEDISCHARGE TYPETYPE EXCIMEREXCIMER LAMPLAMP L12431L12431 Reforming Cleaning Making it "PERFECT" with "LIGHT" ! Making changes with "LIGHT" ! The possibilities of light for "Reforming" and "CLEANING" ! Principle Application examples Features of the Hamamatsu excimer lamps Reforming ISurface reforming of PET plastic Excimer lamp 80° Uniformity irradiates a large area Hamamatsu 1 long flat lamps Surface reforming technology is utilized in a 15° by use of a long flat lamp In air (wavelength 172 nm) wide range of industrial fields. Material re- Uniformity characteristics (along short axis) forming using excimer lamps is considered O2 O3 + O(1D) Long flat lamps vs. cylindrical lamps precision reforming compared to ordinary 3 1 3 1 3 O O( D) O O( D) O H2OH2O techniques because it occurs via a chemical H2O H2O Before irradiation After irradiation reaction on the atomic or molecular level. HHHH 100 Plastic I Moreover, this is a clean reforming that does CCCC CCCC Bonding pre-processing (improve adhesiveness) 90 material not harm the substrate or generate dust parti- Example: PPS (polyphenylene sulfide) + PO (polyolefin) 80 HHHH HHHH Good uniformity since entire surface is cles and so is an effective technology in 3 in close proximity Vacuum ultraviolet light at a wave- Bonds in material surface are bro- 70 fields requiring more advanced levels of mate- length of 172 nm generates ozone ken simultaneously with ozone and rial reforming. Improved 60 and active oxygen in large quanti- active oxygen generation, and the 2 Cylindrical lamps from ties. resulting moisture evaporates. about other companies Surface reforming using excimer lamps can 3 times 50 be used to increase adhesiveness and improve 40 1 functionality of materials such as by giving Bonding strength 30 UV power meter: Hamamatsu H9535-172 hydrophilicity to them, making it useful in a Lamp to UV power meter distance: 5 mm 2 20 Pinhole is interposed between lamp and UV power meter wide range of fields and materials.
    [Show full text]
  • In-Situ Photo-Dissociation and Polymerization of Carbon Disulfide with Vacuum Ultraviolet Microplasma Flat Lamp for Organic Thin
    applied sciences Article In-Situ Photo-Dissociation and Polymerization of Carbon Disulfide with Vacuum Ultraviolet Microplasma Flat Lamp for Organic Thin Films Jinhong Kim 1 and Sung-Jin Park 1,2,* 1 Laboratory of Optical Physics and Engineering, Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA; [email protected] 2 Eden Park Illumination, Inc., Champaign, IL 61821, USA * Correspondence: [email protected] Abstract: Vacuum UV (VUV) photo-dissociation for a liquid phase organic compound, carbon disulfide (CS2), has been investigated. 172 nm (7.2 eV) VUV photons from Xe2* excimers in a microcavity plasma lamp irradiated free-standing liquid droplets on Si substrate in each a nitrogen environment and an atmospheric air environment. Selective and rapid dissociation of CS2 into C-C, C-S or C-O-S based fragments was observed in the different gas environments during the reaction. Thin-layered polymeric microdeposites have been identified by characterization with a Scanning electron microscope (SEM), Energy dispersive x-ray spectroscopy (EDX), Raman spectroscopy and X-ray photoelectron spectroscopy (XPS). This novel photo-process from the flat VUV microplasma lamp introduces another pathway of low-temperature organic (or synthetic) conversion for large area deposition. The in-situ, selective conversion of various organic precursors can be potentially used in optoelectronics and nanotechnology applications. Citation: Kim, J.; Park, S.-J. In-Situ Keywords: carbon disulfide; microplasma; photo-dissociation; polymerization; 172 nm VUV lamp Photo-Dissociation and Polymerization of Carbon Disulfide with Vacuum Ultraviolet Microplasma Flat Lamp for Organic Thin Films. Appl. Sci. 2021, 11, 2597.
    [Show full text]
  • Parametric Study of Dielectric Barrier Discharge Excimer UV Lamps Supplied with Controlled Square Current Pulses
    Parametric study of dielectric barrier discharge excimer UV lamps supplied with controlled square current pulses Hubert Piquet, Arnold Wiesner, David Florez, Antoine Belinger, Rafael Diez To cite this version: Hubert Piquet, Arnold Wiesner, David Florez, Antoine Belinger, Rafael Diez. Parametric study of dielectric barrier discharge excimer UV lamps supplied with controlled square current pulses. Pro- ceedings of SPIE, the International Society for Optical Engineering, SPIE, The International Society for Optical Engineering, 2018, vol. 10614, pp. 1-7. 10.1117/12.2305508. hal-01785337 HAL Id: hal-01785337 https://hal.archives-ouvertes.fr/hal-01785337 Submitted on 4 May 2018 HAL is a multi-disciplinary open access L’archive ouverte pluridisciplinaire HAL, est archive for the deposit and dissemination of sci- destinée au dépôt et à la diffusion de documents entific research documents, whether they are pub- scientifiques de niveau recherche, publiés ou non, lished or not. The documents may come from émanant des établissements d’enseignement et de teaching and research institutions in France or recherche français ou étrangers, des laboratoires abroad, or from public or private research centers. publics ou privés. Open Archive TOULOUSE Archive Ouverte (OATAO) OATAO is an open access repository that collects the work of some Toulouse researchers and makes it freely available over the web where possible. This is an author’s version published in : http://oatao.univ-toulouse.fr/19891 Official URL : https://doi.org/10.1117/12.2305508 To cite this version : Piquet, Hubert and Wiesner, Arnold and Florez, David and Belinger, Antoine and Diez, Rafael Parametric study of dielectric barrier discharge excimer UV lamps supplied with controlled square current pulses.
    [Show full text]
  • FEATURES Articles: O Applicationsand Efficacy of Uvlight for Food O Mercury-Freevacuum-(VUV) Anduv Excilamps O Ultraviolettechnology In
    FEATURES Articles: o Applicationsand Efficacy of UVLight for Food o Mercury-freeVacuum-(VUV) andUV Excilamps o UltravioletTechnology in WaterReclamation UV Reactors and Headers at the Water TreatmentPlant in\4ctoria, BC o Designand Construction of a LargeUltraviolet | (UV) ^ DisinfectionFacility /avn\; TreatingUnfiltered Water F, .i i-1++++ \.U// : I i+*I JoinIUVA! I onlineat ii;'**r*'iuva'org Barrier dischargesin an "excilamp" tfre NewStandird in WastewaterD'isinfection Followingthe successof the C3 l5O'",Calgon Carbon Corporation's UV Technologies Divisionis launchingthe newestaddition to the C3Series* wastewater disinfection productline - the C35OO'". With powerfulyet energy-efficient 500 Watt lamps, it c3 500* is designedfor the mostchallenging high-flow municipal wastewater applications." MakingWater and Air Saferand Cleaner wwwcaI gonca rbon'Gom/uv UVTechnologies Division Calgon- Carbon Corporation, 800-422-7266 Contents Index of Advertisers 4 President's Message 30 American Air & Water 4 Editorial 20 American Ultraviolet 9 Atlantic Ultraviolet 5 Hot UV News Inside Front Cover Calgon Carbon 5 UV Industry News 7 CDM 6 News from IUVA 10 Dr. Gröbel 7 Application Note 15 ETA plus 8 Conference Report: First Mid-East Conference 8 Hazen and Sawyer on Ultraviolet Technologies 30 Light Sources 9 Water is Cheap – Ridiculously Cheap! Back Cover Philips Inside Back Cover Trojan UV 30 UV Systec ARTICLES: 11 Applications and Efficacy of UV Light for Foods Tatiana Koutchma and Cindy Stewart 16 Mercury-free Vacuum-(VUV) and UV Excilamps: Lamps of the Future? Thomas Oppenländer and Edward Sosnin 21 Ultraviolet Technology in Water Reclamation from Secondary Effluent: A Perspective from the Tropical Environment Rongjing Xie Editor in Chief: Dr. James R.
    [Show full text]