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Admittance, Conductance, Reactance and Susceptance of New Natural Fabric Grewia Tilifolia V

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Admittance, Conductance, Reactance and Susceptance of New Natural Fabric Grewia Tilifolia V Sensors & Transducers Volume 119, Issue 8, www.sensorsportal.com ISSN 1726-5479 August 2010 Editors-in-Chief: professor Sergey Y. Yurish, tel.: +34 696067716, fax: +34 93 4011989, e-mail: [email protected] Editors for Western Europe Editors for North America Meijer, Gerard C.M., Delft University of Technology, The Netherlands Datskos, Panos G., Oak Ridge National Laboratory, USA Ferrari, Vittorio, Universitá di Brescia, Italy Fabien, J. Josse, Marquette University, USA Katz, Evgeny, Clarkson University, USA Editor South America Costa-Felix, Rodrigo, Inmetro, Brazil Editor for Asia Ohyama, Shinji, Tokyo Institute of Technology, Japan Editor for Eastern Europe Editor for Asia-Pacific Sachenko, Anatoly, Ternopil State Economic University, Ukraine Mukhopadhyay, Subhas, Massey University, New Zealand Editorial Advisory Board Abdul Rahim, Ruzairi, Universiti Teknologi, Malaysia Djordjevich, Alexandar, City University of Hong Kong, Hong Kong Ahmad, Mohd Noor, Nothern University of Engineering, Malaysia Donato, Nicola, University of Messina, Italy Annamalai, Karthigeyan, National Institute of Advanced Industrial Science Donato, Patricio, Universidad de Mar del Plata, Argentina and Technology, Japan Dong, Feng, Tianjin University, China Arcega, Francisco, University of Zaragoza, Spain Drljaca, Predrag, Instersema Sensoric SA, Switzerland Arguel, Philippe, CNRS, France Dubey, Venketesh, Bournemouth University, UK Ahn, Jae-Pyoung, Korea Institute of Science and Technology, Korea Enderle, Stefan, Univ.of Ulm and KTB Mechatronics GmbH, Germany Arndt, Michael, Robert Bosch GmbH, Germany Erdem, Gursan K. Arzum, Ege University, Turkey Ascoli, Giorgio, George Mason University, USA Erkmen, Aydan M., Middle East Technical University, Turkey Atalay, Selcuk, Inonu University, Turkey Estelle, Patrice, Insa Rennes, France Atghiaee, Ahmad, University of Tehran, Iran Estrada, Horacio, University of North Carolina, USA Augutis, Vygantas, Kaunas University of Technology, Lithuania Faiz, Adil, INSA Lyon, France Avachit, Patil Lalchand, North Maharashtra University, India Fericean, Sorin, Balluff GmbH, Germany Ayesh, Aladdin, De Montfort University, UK Fernandes, Joana M., University of Porto, Portugal Bahreyni, Behraad, University of Manitoba, Canada Francioso, Luca, CNR-IMM Institute for Microelectronics and Baliga, Shankar, B., General Monitors Transnational, USA Microsystems, Italy Baoxian, Ye, Zhengzhou University, China Francis, Laurent, University Catholique de Louvain, Belgium Barford, Lee, Agilent Laboratories, USA Fu, Weiling, South-Western Hospital, Chongqing, China Barlingay, Ravindra, RF Arrays Systems, India Gaura, Elena, Coventry University, UK Basu, Sukumar, Jadavpur University, India Geng, Yanfeng, China University of Petroleum, China Beck, Stephen, University of Sheffield, UK Gole, James, Georgia Institute of Technology, USA Ben Bouzid, Sihem, Institut National de Recherche Scientifique, Tunisia Gong, Hao, National University of Singapore, Singapore Benachaiba, Chellali, Universitaire de Bechar, Algeria Gonzalez de la Rosa, Juan Jose, University of Cadiz, Spain Binnie, T. David, Napier University, UK Granel, Annette, Goteborg University, Sweden Bischoff, Gerlinde, Inst. Analytical Chemistry, Germany Graff, Mason, The University of Texas at Arlington, USA Bodas, Dhananjay, IMTEK, Germany Guan, Shan, Eastman Kodak, USA Borges Carval, Nuno, Universidade de Aveiro, Portugal Guillet, Bruno, University of Caen, France Bousbia-Salah, Mounir, University of Annaba, Algeria Guo, Zhen, New Jersey Institute of Technology, USA Bouvet, Marcel, CNRS – UPMC, France Gupta, Narendra Kumar, Napier University, UK Brudzewski, Kazimierz, Warsaw University of Technology, Poland Hadjiloucas, Sillas, The University of Reading, UK Cai, Chenxin, Nanjing Normal University, China Haider, Mohammad R., Sonoma State University, USA Cai, Qingyun, Hunan University, China Hashsham, Syed, Michigan State University, USA Campanella, Luigi, University La Sapienza, Italy Hasni, Abdelhafid, Bechar University, Algeria Carvalho, Vitor, Minho University, Portugal Hernandez, Alvaro, University of Alcala, Spain Cecelja, Franjo, Brunel University, London, UK Hernandez, Wilmar, Universidad Politecnica de Madrid, Spain Cerda Belmonte, Judith, Imperial College London, UK Homentcovschi, Dorel, SUNY Binghamton, USA Chakrabarty, Chandan Kumar, Universiti Tenaga Nasional, Malaysia Horstman, Tom, U.S. Automation Group, LLC, USA Chakravorty, Dipankar, Association for the Cultivation of Science, India Hsiai, Tzung (John), University of Southern California, USA Changhai, Ru, Harbin Engineering University, China Huang, Jeng-Sheng, Chung Yuan Christian University, Taiwan Chaudhari, Gajanan, Shri Shivaji Science College, India Huang, Star, National Tsing Hua University, Taiwan Chavali, Murthy, VIT University, Tamil Nadu, India Huang, Wei, PSG Design Center, USA Chen, Jiming, Zhejiang University, China Hui, David, University of New Orleans, USA Chen, Rongshun, National Tsing Hua University, Taiwan Jaffrezic-Renault, Nicole, Ecole Centrale de Lyon, France Cheng, Kuo-Sheng, National Cheng Kung University, Taiwan Jaime Calvo-Galleg, Jaime, Universidad de Salamanca, Spain Chiang, Jeffrey (Cheng-Ta), Industrial Technol. Research Institute, Taiwan James, Daniel, Griffith University, Australia Chiriac, Horia, National Institute of Research and Development, Romania Janting, Jakob, DELTA Danish Electronics, Denmark Chowdhuri, Arijit, University of Delhi, India Jiang, Liudi, University of Southampton, UK Chung, Wen-Yaw, Chung Yuan Christian University, Taiwan Jiang, Wei, University of Virginia, USA Corres, Jesus, Universidad Publica de Navarra, Spain Jiao, Zheng, Shanghai University, China Cortes, Camilo A., Universidad Nacional de Colombia, Colombia John, Joachim, IMEC, Belgium Courtois, Christian, Universite de Valenciennes, France Kalach, Andrew, Voronezh Institute of Ministry of Interior, Russia Cusano, Andrea, University of Sannio, Italy Kang, Moonho, Sunmoon University, Korea South D'Amico, Arnaldo, Università di Tor Vergata, Italy Kaniusas, Eugenijus, Vienna University of Technology, Austria De Stefano, Luca, Institute for Microelectronics and Microsystem, Italy Katake, Anup, Texas A&M University, USA Deshmukh, Kiran, Shri Shivaji Mahavidyalaya, Barshi, India Kausel, Wilfried, University of Music, Vienna, Austria Dickert, Franz L., Vienna University, Austria Kavasoglu, Nese, Mugla University, Turkey Dieguez, Angel, University of Barcelona, Spain Ke, Cathy, Tyndall National Institute, Ireland Dimitropoulos, Panos, University of Thessaly, Greece Khan, Asif, Aligarh Muslim University, Aligarh, India Ding, Jianning, Jiangsu Polytechnic University, China Sapozhnikova, Ksenia, D.I.Mendeleyev Institute for Metrology, Russia Kim, Min Young, Kyungpook National University, Korea South Saxena, Vibha, Bhbha Atomic Research Centre, Mumbai, India Ko, Sang Choon, Electronics. and Telecom. Research Inst., Korea South Seif, Selemani, Alabama A & M University, USA Kockar, Hakan, Balikesir University, Turkey Seifter, Achim, Los Alamos National Laboratory, USA Kotulska, Malgorzata, Wroclaw University of Technology, Poland Sengupta, Deepak, Advance Bio-Photonics, India Kratz, Henrik, Uppsala University, Sweden Shah, Kriyang, La Trobe University, Australia Kumar, Arun, University of South Florida, USA Shearwood, Christopher, Nanyang Technological University, Singapore Kumar, Subodh, National Physical Laboratory, India Shin, Kyuho, Samsung Advanced Institute of Technology, Korea Kung, Chih-Hsien, Chang-Jung Christian University, Taiwan Shmaliy, Yuriy, Kharkiv National Univ. of Radio Electronics, Ukraine Lacnjevac, Caslav, University of Belgrade, Serbia Silva Girao, Pedro, Technical University of Lisbon, Portugal Lay-Ekuakille, Aime, University of Lecce, Italy Singh, V. R., National Physical Laboratory, India Lee, Jang Myung, Pusan National University, Korea South Slomovitz, Daniel, UTE, Uruguay Lee, Jun Su, Amkor Technology, Inc. South Korea Smith, Martin, Open University, UK Lei, Hua, National Starch and Chemical Company, USA Soleymanpour, Ahmad, Damghan Basic Science University, Iran Li, Genxi, Nanjing University, China Somani, Prakash R., Centre for Materials for Electronics Technol., India Li, Hui, Shanghai Jiaotong University, China Srinivas, Talabattula, Indian Institute of Science, Bangalore, India Li, Xian-Fang, Central South University, China Srivastava, Arvind K., Northwestern University, USA Liang, Yuanchang, University of Washington, USA Stefan-van Staden, Raluca-Ioana, University of Pretoria, South Africa Liawruangrath, Saisunee, Chiang Mai University, Thailand Sumriddetchka, Sarun, National Electronics and Computer Technology Liew, Kim Meow, City University of Hong Kong, Hong Kong Center, Thailand Lin, Hermann, National Kaohsiung University, Taiwan Sun, Chengliang, Polytechnic University, Hong-Kong Lin, Paul, Cleveland State University, USA Sun, Dongming, Jilin University, China Linderholm, Pontus, EPFL - Microsystems Laboratory, Switzerland Sun, Junhua, Beijing University of Aeronautics and Astronautics, China Liu, Aihua, University of Oklahoma, USA Sun, Zhiqiang, Central South University, China Liu Changgeng, Louisiana State University, USA Suri, C. Raman, Institute of Microbial Technology, India Liu, Cheng-Hsien, National Tsing Hua University, Taiwan Sysoev, Victor, Saratov State Technical University, Russia Liu, Songqin, Southeast University, China Szewczyk, Roman, Industrial Research Inst. for Automation and Lodeiro, Carlos, University of Vigo, Spain Measurement, Poland Lorenzo, Maria Encarnacio,
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