Pre1305optics Glossary.Indd 1 01.12.14 13:40 Pre1305optics Glossary.Indd 2 01.12.14 13:40 INTRODUCTIONINTRODUCTION

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Pre1305optics Glossary.Indd 1 01.12.14 13:40 Pre1305optics Glossary.Indd 2 01.12.14 13:40 INTRODUCTIONINTRODUCTION OPTICS GLOSSARY A BRIEF EXPLANATION OF CERTAIN OPTICAL TERMS OPTICAL MEASURING PRE1305 PRE1305Optics glossary.indd 1 01.12.14 13:40 PRE1305Optics glossary.indd 2 01.12.14 13:40 INTRODUCTIONINTRODUCTION With seven decades of experience and more than 5,000 specialized products, Mitutoyo is both pioneer and pace setter in the field of precision length measurement technology around the globe. In addition to coordinate and form measuring machines, sensor systems, hardness testing equipment, linear scales and hand-held measuring devices, the better known products also include optical measuring equipment, such as measuring projectors, measuring microscopes and vision measuring systems. Few people are, however, aware that Mitutoyo develops and manufactures the full-range of optics for this equipment itself – so it is not only competent in the field of length measurement technology but also equally expert at optical systems. Unfortunately, a user is also expected to demonstrate the same level of competence in both fields – metrology and optics – if measuring equipment with optical sensors is to be used properly and – even more important – the ensuing results are to be interpreted correctly. This glossary is designed for classic measurement engineers, i.e., for users with in-depth knowledge of metrology but who only have some basic knowledge – possibly dating back to their school days - of optical issues. They will find brief explanations of individual optical terms in this glossary to help them bring their level of knowledge back up to par. As such, the glossary aims to enable them to identify and evaluate the impacts of optical phenomena on the measuring results generated by optical length measurement equipment. 3 PRE1305Optics glossary.indd 3 01.12.14 13:40 CONTENTSCONTENTS Page Page Aberration 7 Transmittent light 34 Balance length 8 Built-in microscope 35 Achromat / Achromatism 9 Entrance pupil 36 Aperture diaphragm 10 Eclipse / Shadowing / Vignetting 36 Apochromat 10 Finitely corrected optical system 37 Working distance 11 Color temperature 38 Astigmatism 12 Color magnification error 39 Resolution 13 Field diaphragm 39 Resolving power 13 Flickering 40 Eye position 15 Fluorescence ring light 40 Exit pupil 16 Fluorescence analysis 41 Axial chromatic aberration 18 Fluorescence microscope 41 Field curvature 19 Focus, focus point / Focal point 42 Image position / Intermediate image position 20 Focal width / Focal length 42 Vision measurement 21 Galileian type / Parallel type (stereo micro- 43 Refraction 22 scope) Law of refraction 23 Ghost image 43 Refraction index 24 Total magnification 44 CCD 25 Greenough type (stereo microscope) 44 Chromatic aberration 26 Green GIF filter 45 CMOS 27 Half mirror / Semi-permeable mirror 46 C-Mount 28 Principal point / Principal plane 47 Deviating mirror / Deviating prism 29 Principal ray 48 Dichroic mirror 29 Bright field analysis 49 Differential interference contrast 30 Infrared microscope 50 Dual image 32 Interference 51 Dual refraction 32 Inverted microscope 51 Dark field analysis 33 Coaxial incident light 52 4 5 PRE1305Optics glossary.indd 4 01.12.14 13:40 CONTENTS Page Page Koehler illumination 52 Reflection 77 Collimator (lens) 53 Ring light 78 Coma 53 Depth of field 79 Condenser (lens) 54 Field number 80 Confocal microscope 55 Visible area 80 Laser 56 Seidel aberrations 81 LB filter 57 True to side image 81 LED lighting 58 Inverted image 81 Light 59 Visible light 82 Light microscope 60 Spectral properties 82 Wavelength of light 61 Spherical aberration 83 Measuring microscope 62 Stereo microscope 84 Metallurgical microscope 63 Telecentric lens 85 Near-infrared radiation 64 Telecentric illumination 86 Near-ultraviolet radiation 64 Total reflection 86 ND filter 65 Transmission factor / Aperture factor 88 Numerical aperture 66 Tube lens 89 Nomarski prism 67 Ultraviolet radiation 90 Subject-image distance 68 Ultraviolet microscope 91 Objective lens 69 Infinitely corrected optical system 92 Eyepiece 70 Magnification uncertainty 92 Optically active materials 71 Distortion 93 Optical density 71 Virtual image 94 Plane correction 72 White balance 94 Polarization 73 Wollaston prism 95 Polarized analysis 74 Centering 95 Prism 75 Point diameter / Point size 76 4 5 PRE1305Optics glossary.indd 5 01.12.14 13:40 6 7 PRE1305Optics glossary.indd 6 01.12.14 13:40 Aberration This is the generic term used to describe imaging errors. Imaging errors are caused by the widest range of different optical effects and result in deterioration in the quality of the image of the work piece, making it appear, for example, unfocused, warped or distorted. These aberrations must be eliminated as far as possible in microscopy since the image must correspond to the work piece if it is to be used to evaluate the work piece. A distinction is made between geometric aberrations, which are caused by the geometric – i.e. spherical - shape of the lens - and chromatic aberrations (chromatic = relating to color), which are caused by different strengths of refraction of the individual wavelengths of light – or colors. The five primary geometric aberrations are also known as “Seidel aberrations”, named after the physicist Philip Ludwig von Seidel, who examined the various types of aberration for the first time back in the second half of the nineteenth century. 6 7 PRE1305Optics glossary.indd 7 01.12.14 13:40 Balance length / Parfocal length A work piece frequently has to be examined at several different levels of magnification in order to perform various microscopy tasks. An objective revolver is generally used for this purpose, which enables objective lenses with different levels of magnification to be easily moved into the microscope’s light path. In order to significantly raise the benefit for the user, it would be helpful if an area that has already been sharply focused using one objective lens could remain sharp when a different level of magnification is set. This is achieved by balancing the length of the objective lenses in revolvers. Balanced – or par- focal – objective lenses are always located at the same distance from the flange of the thread used to attach them to the revolver to the work piece. If the working distance between the objective lens and the work piece is enlarged, the length of the objective lens itself declines accordingly. The aggregate of both lengths always remains the same and is indicated as the balance or parfocal length in technical documentation. W.D: Working Distance P.D. P.D. P.D: Parfocal Distance σ: Half objective beam width W.D W.D 8 9 PRE1305Optics glossary.indd 8 01.12.14 13:40 Achromat / Achromatism If several lenses are combined into a small lens system, the axial chromatic aberration caused by one lens can be compensated by the aberration of another lens. This ensures that the rays of all wavelengths or colors meet up in a single focal point. In the case of more complex lens systems and objective lenses it is, however, not possible to fully compensate the errors caused by all lenses. Only the red and blue rays of light are analyzed in this case, since they form the beginning, respectively, the end of the visible wavelength spectrum. So if their focal points are corrected to ensure that they are in the same position at the end, the focal points of the other colors between them can be assumed to be negligibly close to this position. As such the axial chromatic aberration is minimized. This procedure for minimizing axial chromatic aberration is known as achromatism, a lens system (such as an objective lens) that has been corrected accordingly, is called an achromat. Schematic diagram of an achromat 8 9 PRE1305Optics glossary.indd 9 01.12.14 13:40 Aperture diaphragm An aperture diaphragm is a diaphragm with an adjustable opening that influences the light intensity and resolving power thanks to its precisely defined position in the microscope’s light path. In the case of measuring microscopes, the aperture can be used to ensure maximum accu- racy when measuring pins or waves. If the opening diameter of the diaphragm is optimally adjusted, the marked diffraction effects that otherwise occur on the surfaces can be largely eliminated. Aperture diaphragm diameter (mm) DIAPHRAGM 10 15 25 5 20 1 25 20 15 10 5 0510 15 20 25 30 35 40 45 50 Work piece diameter d (mm) Apochromat The achromatic correction of axial chromatic aberrations is fully sufficient for many analysis purposes. Since achromats are, moreover, comparatively simple and therefore cheap to manufacture, they are frequently used in microscopes. However, achromatic correction, i.e., the correction of red and blue light in a common focal point, is sometimes not sufficient for certain applications. In such cases, a further light – yellow – is corrected in the common focal point together with the light paths of the red and blue lights as the wavelength of yellow light is relatively equidistant to the wavelengths of red and blue light. 10 11 PRE1305Optics glossary.indd 10 01.12.14 13:40 This apochromatic correction produces an even better quality than achromatic correction and eliminates the axial chromatic aberration virtually entirely. Apochromats are, however, much harder to manufacture and therefore, of course, more expensive. Working distance The term working distance is used to describe the distance between the lowest point of the objective lens and the imaged area of the work piece. A larger working distance has proven its worth, especially when performing analyses under non-laboratory conditions. On the one hand, it allows the work piece or specimen to be positioned and removed quickly and simply without risking damage to the work piece or objective lens. The risk of damage when sharpening or adjusting the focus on the image is also minimized, given that the objective lens could easily touch the work piece by accident at a small working distance. Specimens generally also do not need to be prepared in advance if the working distance is large, surfaces do not have to be as flat as possible, since different heights or steps on the work piece are irrelevant as long as they fit within the working distance.
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