A Compound Class of Geometric and Lifetimes Distributions
Total Page:16
File Type:pdf, Size:1020Kb
Send Orders of Reprints at [email protected] The Open Statistics and Probability Journal, 2013, 5, 1-5 1 Open Access A Compound Class of Geometric and Lifetimes Distributions Said Hofan Alkarni* Department of Quantitative Analysis, King Saud University, Riyadh, Saudi Arabia Abstract: A new lifetime class with decreasing failure rateis introduced by compounding truncated Geometric distribution and any proper continuous lifetime distribution. The properties of the proposed class are discussed, including a formal proof of its probability density function, distribution function and explicit algebraic formulae for its reliability and failure rate functions. A simple EM-type algorithm for iteratively computing maximum likelihood estimates is presented. A for- mal equation for Fisher information matrix is derived in order to obtaining the asymptotic covariance matrix. This new class of distributions generalizes several distributions which have been introduced and studied in the literature. Keywords: Lifetime distributions, decreasing failure rate, Geometric distribution. 1. INTRODUCTION and exponential with DFR was introduced by [7]. The expo- nential-Poisson (EP) distribution was proposed by [8] and The study of life time organisms, devices, structures, ma- generalized [9] using Wiebull distribution and the exponential- terials, etc., is of major importance in the biological and en- logarithmic distribution discussed by [10]. A two-parameter gineering sciences. A substantial part of such study is de- distribution family with decreasing failure rate arising by mix- voted to the mathematical description of the length of life by ing power-series distribution has been introduced [11]. A a failure distribution. Sometimes physical considerations of Weibull power series class of distributions with Poisson pre- the failure mechanism may lead to a specific distribution but sented [12, 13] in a master degree thesis presented a class of more often, the choice is made on the basis of how well the generalized Beta distributions, Pareto power series and actual observations of times to failure appear to be fitted by Weibull power series. Lately [14], obtained a class of trun- the distribution. In reliability studies a useful tool for reduc- cated Poisson with any continuous lifetime distribution. ing the range of possible candidates is provided by the shape and monotonicity of the failure rate function since it reflects A further exponentiated type distribution has been intro- some of the characteristics of the mechanism leading to life duced and studied in the literature. The exponential Weibull conclusion. (EW) distribution was proposed [15] to extend the geometric exponential (GE) distribution. This distribution was also Situations where the failure rate function decreases with studied [16-19] introduced four more exponentiated type time have been reported by several authors. Indicative exam- distributions: the exponentiated gamma, exponentiated ples are business mortality [1], failure in the air-conditioning Weibull, exponentiated Gumbel and exponentiated Fréchet equipment of a fleet of Boeing 720 aircrafts or in semicon- distributions by generalizing the gamma, Weibull, Gumbel ductors from various lots combined [2] and the life of inte- and Fréchet distributions in the same way that the GE distri- grated circuit modules [3]. In general, a population is ex- bution extends the exponential distribution. In a recent paper, pected to exhibit a decreasing failure rate (DFR) when its [20] introduced the generalized exponential-Poisson distribu- behavior over time is characterized by 'work hardening' (in tion which extends the exponential-Poisson distribution in engineering terms) or 'immunity' (in biological terms); some- the same way that the GE distribution extends the exponen- times the broader term 'infant mortality' is used to denote the tial distribution. DFR phenomenon. The resulting improvement of reliability with time might have occurred by means of actual physical In this paper we generalize the work of [7] to a class of changes that caused self-improvement or simply it might several lifetime continuous distributions. This paper is orga- have been due to population heterogeneity. Indeed, [2] pro- nized as follow. In Section 2, the new class of geometric vided that the DFR property is inherent to mixtures of distri- lifetime distributions with its probability and distribution butions with constant failure rate [4] for other properties of functions are introduced. In Section 3, the corresponding exponential mixtures [5], demonstrated the converse for any survival and hazard rate functions with some of their proper- gamma distribution with shape parameter less than one. In ties are derived. In Section 4,maximum likelihood estimate addition, [6] give examples illustrating that such results may of the unknown parameters are obtained based on a random hold for mixtures of distributions with rapidly increasing sample via EM algorithm. In Section 5, the entropy for the failure rate. A mixture of truncated geometric distribution geometric lifetime distributions class is discussed. 2. THE CLASS *Address correspondence to this author at the Department of Quantitative Given Z, let T1,…,TZ be independent and identically dis- Analysis, King Saud University, Riyadh, Saudi Arabia; Tel: ?????????????; tributed (iid) random variables with probability density func- Fax: ????????????; E-mail: [email protected] tion (pdf) given by 1876-5270/13 2013 Bentham Open 2 The Open Statistics and Probability Journal, 2013, Volume 5 Said Hofan Alkarni + # fT (x;!) = fT (x;!);! = (!1,…,!k ), k " 1, x,! #! z!1 i = 1! p f x; " z % p 1! F x; " ' ( ) T ( )$ & ( T ( ))( Here, Z is a zero truncated Geometric random variable z=1 with probability mass function given by (1! p) f x;" z 1 T ( ) f (z; p) = (1! p) p ! , z ",0 < p < 1, = Z [1! p( 1! F x;" ]2 ( T ( )) where and Z and Ti, i = 1,…,Z are independent random variables. Let X = min(T ,…,T ) then, the pdf of the random variable X x x 1 z (1# p) f x;! is obtained as F x; p, f x; p, dx T ( ) dx X ( !) = X ( !) = " " [1 p( 1 T x; ]2 0 0 # # ( !) (1 p) f x; ( ) " T ( !) f (x;p,!) = (1) X 2 F x; [1" p( 1" FT x;! ] T ( !) ( ( )) = 1" p( 1" F x;! and hence the cumulative distribution function (cdf) of ( T ( )) X is respectively. F x;! We denote a random variable X with pdf and cdf (1) and F x;p, T ( ) (2) X ( !) = (2) by X ~ GL( p,!) . This new class of distributions gener- 1" p( 1" F x;! ( T ( )) alizes several distributions which have been introduced and studied in the literature. For instance using the probability The proof of the results in (1) and (2) is presented in the density and its distribution function of exponential distribu- following theorem. tion in (1), we obtain the exponential geometric distribution Theorem 2.1. Suppose that T1,…,TZ with [7] and using Wiebull probability density and its distribution + function gives Wiebull geometric distribution [21]. The fT x, ! = fT x, ! , ! = (!1,…,!k ) for , k ! 1, x, " #R i ( ) ( ) model is obtained under the concept of population heteroge- and Z is a zero truncated Geometric variable with probability neity (through the process of compounding). An interpreta- mass function f z; p (1 p) pz!1, z , 0 p 1where tion of the proposed model is as follows: a situation where Z ( ) = ! "N ! < < failure (of a device for example) occurs due to the presence of an unknown number, Z, of initial defects of same kind (a Z and Ti , i = 1,…, Z are independent random variables. If X number of semiconductors from a defective lot, for exam- = min(T ,…,T ) then the pdf and cdf of X are 1 z ple). According to [7], the Ts represent their lifetimes and (1" p) f x;! each defect can be detected only after causing failure, in T ( ) which case it is repaired perfectly. Then the distributional fX (x;p,!) = [1 p( 1 F x; ]2 assumptions given earlier lead to any of the GL distributions " ( " T ( !)) for modeling the time to the first failure X. and Table 1 shows the probability function and the distribu- tion function for some lifetime distributions. F x;! F x;p, T ( ) X ( !) = Some of the other lifetime distributions are excluded 1" p( 1" F x;! ( T ( )) from this table since they do not have nice forms such as Gamma and lognormal distributions although they still can respectively. be applied in this class numerically. Proof: By definition, the pdf of X given Z = z is The qth quantile xq of the GL distribution, the inverse of f x,z;p, z 1 the distribution function F x q is the same as the in- X,Z ( !) " X q = f x;! = = z f x; ! #1" F x; ! % , ( ) X |Z ( ) f (z) T ( ) $ T ( )& Z q(1! p) verse of the distribution function F x = for any T ( q ) 1 pq and hence the joint pdf of X and Z is obtained as ! continuous lifetime with distribution function F . T ( ) fX,Z x,z;p,! = fZ z f X |Z x;! ( ) ( ) ( ) z!1 = (1! p) pz!1zf (x; ") #1! F (x; ")% . 3. SURVIVAL AND HAZARD FUNCTIONS T $ T & Since the GL is not a part of the exponential family, there The marginal pdf and cdf of X are given by are no simple form for moments see for instant (Kus[8]) for " the exponential case. Survival function (also known reliabil- ity function) (sf) and hazard function (known as failure rate f x; p,! = f x,z;p,! X ( ) # X,Z ( ) function) (hf) for the GL class are given in the following z=1 theorem. A Compound Class of Geometric and Lifetimes Distributions The Open Statistics and Probability Journal, 2013, Volume 5 3 Table 1. Probability and Distribution Functions Table 2. Survival and Hazard Functions f (x;p, !) F (x;p,