Selected Papers from the International Mixed Signals Testing and Ghz/Gbps Test Workshop
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VLSI Design Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop Guest Editors: Bozena Kaminska, Marcelo Lubaszewski, and José Machado da Silva Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop VLSI Design Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop Guest Editors: Bozena Kaminska, Marcelo Lubaszewski, and Jose´ Machado da Silva Copyright © 2008 Hindawi Publishing Corporation. All rights reserved. This is a special issue published in volume 2008 of “VLSI Design.” All articles are open access articles distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Editor-in-Chief Saeid Nooshabadi, University of New South Wales, Australia Associate Editors Mohab H. Anis, Canada Wolfgang Kunz, Germany Matteo Sonza Reorda, Italy Soo-Ik Chae, Korea Wieslaw Kuzmicz, Poland Yvon Savaria, Canada Kiyoung Choi, Korea Chang-Ho Lee, USA Peter Schwarz, Germany Ayman Fayed, USA Marcelo Lubaszewski, Brazil Jose Silva-Martinez, USA Pascal Fouillat, France Pol Marchal, Belgium Luis Miguel Silveira, Portugal Amit Kumar Gupta, Australia Mohamed Masmoudi, Tunisia Sheldon Tan, USA David Hernandez, USA A. Mondragon-Torres, USA Rached Tourki, Tunisia Xian-Long Hong, China Maurizio Palesi, Italy Spyros Tragoudas, USA Masaharu Imai, Japan Rubin A. Parekhji, India Alberto Valdes-Garcia, USA Yong-Bin Kim, USA Zebo Peng, Sweden Chua-Chin Wang, Taiwan Israel Koren, USA Adam Postula, Australia Sungjoo Yoo, Korea David S. Kung, USA Michel Renovell, France Avi Ziv, Israel Contents Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop, Bozena Kaminska, Marcelo Lubaszewski, and Jose´ Machado da Silva Volume 2008, Article ID 165673, 2 pages ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator, V. Kerzerho,´ P. Cauvet, S. Bernard, F. Aza¨ıs,M.Renovell,M.Comte,andO.Chakib Volume 2008, Article ID 482159, 8 pages Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach, E. J. Peral´ıas, M. A. Jalon,´ and A. Rueda Volume 2008, Article ID 657207, 8 pages Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test, Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, and Jean-Louis Carbonero Volume 2008, Article ID 596146, 9 pages A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector Approach,Jose´ A. Soares Augusto and Carlos Beltran´ Almeida Volume 2008, Article ID 630951, 8 pages Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems, Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, and Abhjit Chatterjee Volume 2008, Article ID 418165, 10 pages A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization, L. A. Rocha, L. Mol, E. Cretu, R. F. Wolffenbuttel, and J. Machado da Silva Volume 2008, Article ID 283451, 7 pages Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing, E. Simeu, H. N. Nguyen, P. Cauvet, S. Mir, L. Rufer, and R. Khereddine Volume 2008, Article ID 294014, 10 pages MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing, D. C. Keezer, D. Minier, P. Ducharme, D. Viens, G. Flynn, and J. McKillop Volume 2008, Article ID 291686, 8 pages A Dependable Micro-Electronic Peptide Synthesizer Using Electrode Data,H.G.Kerkhoff, X.Zhang,F.Mailly,P.Nouet,H.Liu,andA.Richardson Volume 2008, Article ID 437879, 9 pages Hindawi Publishing Corporation VLSI Design Volume 2008, Article ID 165673, 2 pages doi:10.1155/2008/165673 Editorial Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop Bozena Kaminska,1 Marcelo Lubaszewski,2 and Jose´ Machado da Silva3 1 School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada V5A 1S6 2 Electrical Engineering Department (DELET), Federal University of Rio Grande do Sul (UFRGS), Av. Osvaldo Aranha 103, 90.035-190 Porto Alegre, RS, Brazil 3 Faculdade de Engenharia da Universidade do Porto, Rua Dr Roberto Frias, 4200-465 Porto, Portugal Correspondence should be addressed to Jose´ Machado da Silva, [email protected] Received 14 July 2008; Accepted 14 July 2008 Copyright © 2008 Bozena Kaminska et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. This special issue of the VLSI Design journal is dedicated harmonic distortion using waveform generators with the to the 13th IEEE International Mixed Signals Testing Work- same resolution as the ADC under test. Another issue with shop (IMSTW) and 3rd IEEE International GHz/Gbps Test ADC testing concerns the complexity of data processing. Workshop (GTW), held in June 2007 at Povoa´ de Varzim, A new algorithm for estimating ADCs’ nonlinearity is Portugal. proposed by E. J. Peral´ıas et al., which is based on the spectral For the first time these two workshops were joined processing of the ADC output to estimate its harmonic together in a single event dedicated to all aspects of testing, amplitudes and phase-shifts from which the INL signature is design for testability and reliable design of integrated mixed derived, as an alternative to resorting to the time-consuming signals/technologies, functions, and systems. These include code histogram test. testing, design verification, and design for manufacturability Every millisecond cut in testing time can save millions of monolithic mixed signals/technologies systems-on-chip, of dollars in a production run. That can be achieved after circuits running in the multi-GHz clock range and/or includ- finding the proper set of tests. With the “Choice of a High- ing I/O capable of multi-Gbps data rates, and heterogeneous Level Fault Model for the Optimization of Validation Test Set systems including system-in-package and printed circuit Reused for Manufacturing Test,” as presented by Y. Joannon board implementations. The technology spectrum included et al., the number and efficiency of test stimuli can be analogue, mixed signals, high-speed input/output, radio- optimized. Fault modeling and simulation is also crucial for frequency (RF), micro-electro-optical-mechanical systems diagnosis purposes. Augusto and Almeida present “A Tool (MEOMSs), and nanotechnology. for Single-Fault Diagnosis in Linear Analog Circuits with This special issue comprises the most outstanding contri- Tolerance Using the T-vector Approach” which accounts for butions selected from the best papers presented at this joint tolerances in components’ values. event, after having undergone an additional reviewing pro- High frequencies in the gigahertz range together with cess, and constitutes a display of advanced research focusing the use of diverse digital modulation methods such as on challenges and solutions associated with domains in the binary phase-shift keying (BPSK) and quadrature (QPSK) forefront of complex chip design. The selected nine papers phase-shift keying, code division multiple access (CDMA), address the test and characterization of A/D converters and orthogonal frequency division multiplexing (OFDM), (ADC), fault modeling, simulation, and diagnosis of analog complicate the testing of RF transceivers. V. Natarajan et circuits, builtin calibration and diagnosis of RF transmitters, al. show how built-in testing features can be used to help andtestofMEOMSdevices. diagnosing and calibrating functional parameters. The paper from Vincent Kerzerho´ et al. presents a A method for diagnosing capacitive MEMS accelerom- technique which allows the dynamic testing of ADC for eters is proposed by L. A. Rocha et al. which allows 2 VLSI Design estimating overetching, mismatch, and Young’s modulus parameters relying on the measurement of pull-in voltages and resonance frequency. The advances in MEMS technology allow the develop- ment of devices for RF applications, namely as switches. RF MEMS-based switches are characterized (compared namely with FET’s and PIN diodes) by presenting low insertion loss, power consumption, fabrication cost, and intermodulation, further with high isolation (tens of GHz). The paper presented by E. Simeu et al. describes a new method to test RF MEMS which allows extracting the high-frequency characteristics of the switch from the envelope of its response to a low-frequency actuation test stimulus. MEMS switches are also good candidates to be used as builtin test circuitry. The loopback testing of multigigahertz devices can be enhanced by using MEMs switches, taking advantage of their higher bandwidth and smaller size compared to traditional relays, and SiGe logic to configure a variety of active loopback structures, as it is shown by D. C. Keezer et al. MEMS devices have been also developed for biochemical and microfluidics applications, namely on droplet-based peptide synthesizers for initial diagnosis of cancer or virus. H. G. Kerkhof et al. address the reliability of these diagnoses with a technique to detect droplet presence or purity problems via current or impedance measurements using electrodes near the peptide collector area. On behalf of the journal, we would like to conclude this Editorial to thank our former Chief Editor, Dr. Bernard Courtois for his support in the publication of this Special Issue. We would also like to take this opportunity to thank the help