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Dispersion and Filters
Optical Filters: Dispersion and Filters Turan Erdogan, PhD (CTO and Co-founder) Semrock, A Unit of IDEX Corporation May 31, 2011 www.semrock.com Dispersion matters sometimes • Often we can sufficiently characterize the spectral performance of an optical filter by determining simply the amount of light intensity (I) it transmits (T(λ)) and it reflects (R(λ)) • T and R are called the “intensity transmission” and “intensity reflection” coefficients filter Iin IT = T(l)Iin IR = R(l)Iin 2 When dispersion matters • However, if the filter is used in an optical system that is sensitive to the phase of the light, we must use the “amplitude transmission” (t exp(iφt)) and “amplitude reflection” (r exp(iφr)) coefficients • t and r determine the amplitude of the electric field of the light that is transmitted and reflected, respectively, and φt and φr determine the change in phase of the electric field • The transmitted and reflected intensity is proportional to the square of the electric field filter 2 Iin = |Ein| phase Ein phase sensitive sensitive optical optical if (l) 2 Et = t(l)e t Ein IT = |Et| 2 system if (l) system IR = |Er| Er = r(l)e r Ein 3 When dispersion matters • Examples of cases when and where phase matters and the amplitude (rather than intensity) coefficients must be used include: . The filter is used in one arm of an interferometer, such that the light transmitted through or reflected off of the filter is coherently combined with light from the other arm or from elsewhere in the system . The filter is used to transmit or reflect a short pulse (<< 1 picosecond) such that its phase can cause the pulse to be chirped and therefore broadened or distorted filter 2 Iin = |Ein| phase Ein phase sensitive sensitive optical optical if (l) 2 Et = t(l)e t Ein IT = |Et| 2 system if (l) system IR = |Er| Er = r(l)e r Ein 4 Impact of optical filter dispersion • Consider the impact of dispersion on a short pulse reflected off of a filter with amplitude reflection coefficient r exp(iφ ) r filter . -
Chapter 4 Reflected Light Optics
l CHAPTER 4 REFLECTED LIGHT OPTICS 4.1 INTRODUCTION Light is a form ofelectromagnetic radiation. which may be emitted by matter that is in a suitably "energized" (excited) state (e.g.,the tungsten filament ofa microscope lamp emits light when "energized" by the passage of an electric current). One ofthe interesting consequences ofthe developments in physics in the early part of the twentieth century was the realization that light and other forms of electromagnetic radiation can be described both as waves and as a stream ofparticles (photons). These are not conflicting theories but rather complementary ways of describing light; in different circumstances. either one may be the more appropriate. For most aspects ofmicroscope optics. the "classical" approach ofdescribing light as waves is more applicable. However, particularly (as outlined in Chapter 5) when the relationship between the reflecting process and the structure and composition ofa solid is considered. it is useful to regard light as photons. The electromagnetic radiation detected by the human eye is actually only a very small part of the complete electromagnetic spectrum, which can be re garded as a continuum from the very low energies and long wavelengths characteristic ofradio waves to the very high energies (and shortwavelengths) of gamma rays and cosmic rays. As shown in Figure 4.1, the more familiar regions ofthe infrared, visible light, ultraviolet. and X-rays fall between these extremes of energy and wavelength. Points in the electromagnetic spectrum can be specified using a variety ofenergy or wavelength units. The most com mon energy unit employed by physicists is the electron volt' (eV). -
Optical Properties of Tio2 Based Multilayer Thin Films: Application to Optical Filters
Int. J. Thin Fil. Sci. Tec. 4, No. 1, 17-21 (2015) 17 International Journal of Thin Films Science and Technology http://dx.doi.org/10.12785/ijtfst/040104 Optical Properties of TiO2 Based Multilayer Thin Films: Application to Optical Filters. M. Kitui1, M. M Mwamburi2, F. Gaitho1, C. M. Maghanga3,*. 1Department of Physics, Masinde Muliro University of Science and Technology, P.O. Box 190, 50100, Kakamega, Kenya. 2Department of Physics, University of Eldoret, P.O. Box 1125 Eldoret, Kenya. 3Department of computer and Mathematics, Kabarak University, P.O. Private Bag Kabarak, Kenya. Received: 6 Jul. 2014, Revised: 13 Oct. 2014, Accepted: 19 Oct. 2014. Published online: 1 Jan. 2015. Abstract: Optical filters have received much attention currently due to the increasing demand in various applications. Spectral filters block specific wavelengths or ranges of wavelengths and transmit the rest of the spectrum. This paper reports on the simulated TiO2 – SiO2 optical filters. The design utilizes a high refractive index TiO2 thin films which were fabricated using spray Pyrolysis technique and low refractive index SiO2 obtained theoretically. The refractive index and extinction coefficient of the fabricated TiO2 thin films were extracted by simulation based on the best fit. This data was then used to design a five alternating layer stack which resulted into band pass with notch filters. The number of band passes and notches increase with the increase of individual layer thickness in the stack. Keywords: Multilayer, Optical filter, TiO2 and SiO2, modeling. 1. Introduction successive boundaries of different layers of the stack. The interface formed between the alternating layers has a great influence on the performance of the multilayer devices [4]. -
F I L T E R K
FILTERKIT 322 Woodwork Lane Palatine IL 60067 P: 847-359-3550 F: 847-359-3567 v2.1 [email protected] June16, 2009 www.midopt.com ABOUT MIDWEST OPTICAL SYSTEMS FK100 FILTER KIT CONTENTS ARTICLES Founded in 1988 as a manufacturer of custom precision Our continued commitment to optical components and systems, we have since been innovation has lead to the rotating Machine Vision Filters An overview involved exclusively in the design, manufacture, import Right Angle Attachment (left) that gives you more options for placing and export of vision-specific elements used by a diverse cameras in your system, and the Types of Filters The 8 major types of filters produced by MidOpt for machine vision applications variety of industries and end users. Over time, the company multi-purpose Slip Mount that lets has evolved and is now recognized worldwide as the premier you add filters to lenses when Machine v/s Photographic Filters Why photographic filters are not suitable for machine vision operations resource for filters, lenses and accessories used in industrial (1) there are no filter threads Testing with Filters Testing the effects of filtering and monochromatic lighting imaging applications. and (2) when a filter is desired for use on a wide- Increase Resolution Filters with High-Resolution and Telecentric Lenses; Chromatic Aberration By combining this extensive optics background with our angle lens. expertise in machine vision imaging, MidOpt continues Filter Applications UV Fluorescence, Polarizing, IR Blocking and Light Balancing Filters to develop economical and solutions for industrial image processing that are simply not found elsewhere. We provide FILTER NO. -
UV Optical Filters and Coatings
UV Optical Filters and Coatings BARR PRECISION OPTICS & THIN FILM COATINGS Materion Barr Precision Optics & Thin Film Coatings is a leading manufacturer and supplier of precision optical filters, hybrid circuits, flexible thin films and custom thin film coating services. We offer coating solutions for manufacturers in the defense, commercial, space, science, astronomy and thermal imaging markets. UltraViolet (UV) Optical Filters and Coatings Materion offers Ultraviolet (UV) optical filters and coatings used Material Options Include: in a wide variety of existing and emerging UV-based applications. n Metal-Dielectric Bandpass Filters, fully blocked from Whether the requirement is for small, prototype UV filter quantity, a the UV to IR “one-of-a-kind” coated optic, or for large-scale volume manufactur- n UVA, UVB Filters - fully blocked ing associated with an OEM application, Materion is equipped to n UV Filter Arrays, Discrete and Patterned meet the need. With Materion’s approach to filter design and manu- n UV Bandpass Filters with high transmission – facture, our filter design engineers work closely with our customers’ made with Environmentally-Durable Oxide Films optical system designers throughout the filter development process. n Mercury-line Isolation Filters such as i-line and g-line Filters The optical filters and coatings that result from this collaborative n AR-Coatings for UV Spectral Range process often serve to optimize the performance characteristics n UV Laser Bandpass Filters of our customers’ instruments and applications. When it comes to filter design and manufacture in the UV spectral range, Materion has n Solderable-metalized coatings developed an extensive library of manufacturing plans for UV filters n Wide UV Passband Filters (such as filters in UVC) and coatings which can be deployed or tailored to produce optical blocked for use with SiC or GaN Detectors filters, that best match customer requirements. -
Optical Properties of Materials JJL Morton
Electrical and optical properties of materials JJL Morton Electrical and optical properties of materials John JL Morton Part 5: Optical properties of materials 5.1 Reflection and transmission of light 5.1.1 Normal to the interface E z=0 z E E H A H C B H Material 1 Material 2 Figure 5.1: Reflection and transmission normal to the interface We shall now examine the properties of reflected and transmitted elec- tromagnetic waves. Let's begin by considering the case of reflection and transmission where the incident wave is normal to the interface, as shown in Figure 5.1. We have been using E = E0 exp[i(kz − !t)] to describe waves, where the speed of the wave (a function of the material) is !=k. In order to express the wave in terms which are explicitly a function of the material in which it is propagating, we can write the wavenumber k as: ! !n k = = = nk0 (5.1) c c0 where n is the refractive index of the material and k0 is the wavenumber of the wave, were it to be travelling in free space. We will therefore write a wave as the following (with z replaced with whatever direction the wave is travelling in): Ex = E0 exp [i (nk0z − !t)] (5.2) In this problem there are three waves we must consider: the incident wave A, the reflected wave B and the transmitted wave C. We'll write down the equations for each of these waves, using the impedance Z = Ex=Hy, and noting the flip in the direction of H upon reflection (see Figure 5.1), and the different refractive indices and impedances for the different materials. -
Investigation of Dichroism by Spectrophotometric Methods
Application Note Glass, Ceramics and Optics Investigation of Dichroism by Spectrophotometric Methods Authors Introduction N.S. Kozlova, E.V. Zabelina, Pleochroism (from ancient greek πλέον «more» + χρόμα «color») is an optical I.S. Didenko, A.P. Kozlova, phenomenon when a transparent crystal will have different colors if it is viewed from Zh.A. Goreeva, T different angles (1). Sometimes the color change is limited to shade changes such NUST “MISiS”, Russia as from pale pink to dark pink (2). Crystals are divided into optically isotropic (cubic crystal system), optically anisotropic uniaxial (hexagonal, trigonal, tetragonal crystal systems) and optically anisotropic biaxial (orthorhombic, monoclinic, triclinic crystal systems). The greatest change is limited to three colors. It may be observed in biaxial crystals and is called trichroic. A two color change may be observed in uniaxial crystals and called dichroic. Pleochroic is often the term used to cover both (2). Pleochroism is caused by optical anisotropy of the crystals Dichroism can be observed in non-polarized light but in (1-3). The absorption of light in the optically anisotropic polarized light it may be more pronounced if the plane of crystals depends on the frequency of the light wave and its polarization of incident light matches plane of polarization of polarization (direction of the electric vector in it) (3, 4). light that propagates in the crystal—ordinary or extraordinary Generally, any ray of light in the optical anisotropic crystal is wave. divided into two rays with perpendicular polarizations and The difference in absorbance of ray lights may be minor, but different velocities (v1, v2) which are inversely proportional to it may be significant and should be considered both when the refractive indices (n1, n2) (4). -
(12) Patent Application Publication (10) Pub. No.: US 2013/0258661 A1 Jousse Et Al
US 20130258661A1 (19) United States (12) Patent Application Publication (10) Pub. No.: US 2013/0258661 A1 Jousse et al. (43) Pub. Date: Oct. 3, 2013 (54) WHTE LED LIGHTING DEVICE AND A Publication Classification LIGHTINGAPPLIANCE (51) Int. Cl. (71) Applicant: MAQUET SAS, Ardon (FR) F2IV 9/10 (2006.01) F2IV33/00 (2006.01) (72) Inventors: Robin Jousse, La Chapelle Saint (52) U.S. Cl. Mesmin (FR); Cécilia Valteau, Ligny Le CPC ............... F2IV 9/10 (2013.01); F2IV33/0068 Ribault (FR); Lionel Comte, La (2013.01) Chapelle Saint Mesmin (FR) USPC ........................................... 362/235; 362/293 (57) ABSTRACT An LED lighting device (6) having an LED (8) emitting white (73) Assignee: MAQUET SAS, Ardon (FR) light and optical filter means (12) suitable for filtering the white light emitted by the LED (8). The optical filter means Appl. No.: 13/793.288 comprise at least two optical filters (12) that have different (21) transmission coefficients and that are positionable to filter the light emitted by the LED (8) individually. The lighting device (22) Filed: Mar 11, 2013 (6) includes a power supply unit (10) suitable for delivering different power supply currents to the LED (8) depending on (30) Foreign Application Priority Data whether one or the other of the optical filters (12) is positioned to filter the light from the LED (8), so as to modify the color Mar. 27, 2012 (FR) ...................................... 12 52735 temperature of the light emitted by the LED (8). Patent Application Publication Oct. 3, 2013 Sheet 1 of 3 US 2013/0258661 A1 S50 8 750 850 Wavelength an Patent Application Publication Oct. -
7.1 Optical Constants and Light Transmittance
7 . Optical Properties 7・ 1 Optical Constants and Light Transmittance The refractive index of Iupilon / NOVAREX at normal temperature is nD 25℃ = 1,585 The temperature characteristic is as shown in Fig. 4・1・1‐1. The refractive index of other resins was shown in Table 7・1‐1. Table 7・1‐1 Refractive index of various plastics Polymers nD 25 Polymers nD 25 Polymers nD 25 Polymethyl・methacrylate1.490‐1.500 Polystyrene 1.590‐1.600 (PMMA) 1.570 PETP 1.655 Polymethylstyrene 1.560‐1.580 Acrylonitrile・ 66 Nylon 1.530 Polyvinyl acetate 1.450‐1.470 Styrene(AS Polyacetal 1.480 Polytetrafluoroethylene 1.350 Polutrifluoro Polyvinyl chloride 1.540 1.430 Phenoxy resin 1.598 ethylene monochloride Polyvinylidene chloride 1.600‐1.630 1.510 Polysulphone 1.633 Low density polyethylene High density Cellulose acetate 1.490‐1.500 1.540 SBR 1.520‐1.550 polyethylene Propionic acid 1.460‐1.490 Polypropylene 1.490 TPX 1.465 Cellulose 1.460‐1.510 Polybutyrene 1.500 Epoxy resin 1.550‐1.610 Nitrocellulose The relation between light transmittance and thickness of Iupilon / NOVAREX is shown in Fig. 7・1‐1. The wavelength characteristic is shown in Fig. 7・1‐2. The light transmittance wavelength characteristics of polycarbonate and other transparent materials are shown in Fig. 7・1‐3. light transmittance light (%) transmi- ttance (%) thickness (mm) wavelength (nm) Fig. 7・1‐1 Relation between light Fig. 7・1‐2 Light transmittance of Iupilon / transmittancee and thickness of Iupilon / NOVAREX NOVAREX glass 5.72mm injection molding PMMA 3.43mm compression molding light 3.25mm transmittance injection molding (%) PC 3.43mm wavelength (nm) Fig. -
Radiometry of Light Emitting Diodes Table of Contents
TECHNICAL GUIDE THE RADIOMETRY OF LIGHT EMITTING DIODES TABLE OF CONTENTS 1.0 Introduction . .1 2.0 What is an LED? . .1 2.1 Device Physics and Package Design . .1 2.2 Electrical Properties . .3 2.2.1 Operation at Constant Current . .3 2.2.2 Modulated or Multiplexed Operation . .3 2.2.3 Single-Shot Operation . .3 3.0 Optical Characteristics of LEDs . .3 3.1 Spectral Properties of Light Emitting Diodes . .3 3.2 Comparison of Photometers and Spectroradiometers . .5 3.3 Color and Dominant Wavelength . .6 3.4 Influence of Temperature on Radiation . .6 4.0 Radiometric and Photopic Measurements . .7 4.1 Luminous and Radiant Intensity . .7 4.2 CIE 127 . .9 4.3 Spatial Distribution Characteristics . .10 4.4 Luminous Flux and Radiant Flux . .11 5.0 Terminology . .12 5.1 Radiometric Quantities . .12 5.2 Photometric Quantities . .12 6.0 References . .13 1.0 INTRODUCTION Almost everyone is familiar with light-emitting diodes (LEDs) from their use as indicator lights and numeric displays on consumer electronic devices. The low output and lack of color options of LEDs limited the technology to these uses for some time. New LED materials and improved production processes have produced bright LEDs in colors throughout the visible spectrum, including white light. With efficacies greater than incandescent (and approaching that of fluorescent lamps) along with their durability, small size, and light weight, LEDs are finding their way into many new applications within the lighting community. These new applications have placed increasingly stringent demands on the optical characterization of LEDs, which serves as the fundamental baseline for product quality and product design. -
Full Text [PDF]
IPASJ International Journal of Electrical Engineering (IIJEE) Web Site: http://www.ipasj.org/IIJEE/IIJEE.htm A Publisher for Research Motivation ........ Email:[email protected] Volume 5, Issue 8, August 2017 ISSN 2321-5984 Spectral and Thermal Effects on the Transmission Modulation Depth and Attenuation Level Estimation of High Density Optical Filters Mr. M.K. Mathur JNTUH College of Engineering, Hyderabad ABSTRACT There are many operating parameters describing optical filter properties such as the amount absorbed electromagnetic radiation which depends on the operating signal wavelength; the amount of the absorbing material in the radiation path (filter thickness); and the absorption coefficient of the material at that wavelength. This paper has presented fused silica (SiO2) glass, polystyrene (PS) plastic and arsenide trisulfide (AS2 S3) glass band pass optical filters for visible and near infrared spectrum regions over wide range of the affecting parameters. Filter transmittance, filter optical density, attenuation level or blocking level, filter correlation factor, and transmission modulation depth are the major interesting design parameters under room temperature and high temperature effects. 1. INTRODUCTION Optical filters are devices which selectively transmit light of certain properties while blocking (absorbing) the reminder [1]. In general they’re sensitive to light of particular wavelengths (and in consequence color) or range of wavelengths. This property makes optical filters often used in many industrial applications. In many branches of industry source emitting intense non-visible radiation (for example white hot metal or glass) has to be monitored. Optical filters are often used for such applications. In such cases infrared (IR) or heat absorbing filters are used in order to block mid infrared wavelengths (thermal radiation) but allow visible light to be transmitted. -
Method of Determining the Optical Properties of Ceramics and Ceramic Pigments: Measurement of the Refractive Index
CASTELLÓN (SPAIN) METHOD OF DETERMINING THE OPTICAL PROPERTIES OF CERAMICS AND CERAMIC PIGMENTS: MEASUREMENT OF THE REFRACTIVE INDEX A. Tolosa(1), N. Alcón(1), F. Sanmiguel(2), O. Ruiz(2). (1) AIDO, Instituto tecnológico de Óptica, Color e Imagen, Spain. (2) Torrecid, S.A., Spain. ABSTRACT The knowledge of the optical properties of materials, such as pigments or the ceramics that contain these, is a key feature in modelling the behaviour of light when it impinges upon them. This paper presents a method of obtaining the refractive index of ceramics from diffuse reflectance measurements made with a spectrophotometer equipped with an integrating sphere. The method has been demonstrated to be applicable to opaque ceramics, independently of whether the surface is polished or not, thus avoiding the need to use different methods to measure the refractive index accor- ding to the surface characteristics of the material. This method allows the Fresnel equations to be directly used to calculate the refractive index with the measured diffuse reflectance, without needing to measure just the specular reflectance. Al- ternatively, the method could also be used to measure the refractive index in transparent and translucent samples. The technique can be adapted to determine the complex refractive index of pigments. The reflectance measurement would be based on the method proposed in this paper, but for the calculation of the real part of the refractive index, related to the change in velocity that light undergoes when it reaches the material, and the imaginary part, related to light absorption by the material, the Kramers-Kronig relations would be used.