WK,QWHUQDWLRQDO6\PSRVLXP RQ3UHFLVLRQ(QJLQHHULQJ 0HDVXUHPHQWVDQG ,QVWUXPHQWDWLRQ ,63(0, $XJXVW .XQPLQJ&KLQD
3URJUDPPH $EVWUDFWV
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
+RQRUDU\&KDLUV
Academician Guofan Jin7VLQJKXD8QLYHUVLW\&KLQD Academician Tongbao Li7RQJML8QLYHUVLW\&KLQD Academician Zhonghua Zhang1,0&KLQD Academician Jie Gao6LFKXDQ8QLYHUVLW\&KLQD Academician Shenghua Ye7LDQMLQ8QLYHUVLW\&KLQD Academician Yuri V. Chugui7',6,(6LEHULDQ%UDQFKRIWKH5XVVLDQ$FDGHP\RI 6FLHQFHV5XVVLD Prof. Zhu Li+XD]KRQJ8QLYHUVLW\RI6FLHQFHDQG7HFKQRORJ\&KLQD Prof. Ahmed Abou-zeid3K\VLNDOLVFK7HFKQLVFKH%XQGHVDQVWDOW*HUPDQ\ Prof. Peter Rolfe8QLYHUVLW\RI*HQRYD,WDO\ &RQIHUHQFH&KDLUV &KDLU Academician Jiubin Tan+DUELQ,QVWLWXWHRI7HFKQRORJ\&KLQD &RFKDLUV Academician Tony Wilson8QLYHUVLW\RI2[IRUG8. Prof. Harald Bosse3K\VLNDOLVFK7HFKQLVFKH%XQGHVDQVWDOW*HUPDQ\ Academician Min Gu6ZLQEXUQH8QLYHUVLW\RI7HFKQRORJ\$XVWUDOLD Prof. Kuang-Chao Fan1DWLRQDO7DLZDQ8QLYHUVLW\7DLZDQ&KLQD Prof. Wei Gao7RKRNX8QLYHUVLW\-DSDQ Prof. Seung-Woo Kim.RUHD$GYDQFHG,QVWLWXWHRI6FLHQFHDQG7HFKQRORJ\.RUHD 3URJUDP&RPPLWWHH &KDLU Academician Jiubin Tan+DUELQ,QVWLWXWHRI7HFKQRORJ\&KLQD &RFKDLUV Prof. Ahmed Abou-zeid3K\VLNDOLVFK7HFKQLVFKH%XQGHVDQVWDOW*HUPDQ\ Prof. Igor A. Konyakhin6DLQW3HWHUVEXUJ6WDWH8QLYHUVLW\RI,QIRUPDWLRQ 7HFKQRORJLHV0HFKDQLFVDQG2SWLFV5XVVLD Prof. Liang-Chia Chen1DWLRQDO7DLZDQ8QLYHUVLW\7DLZDQ&KLQD Prof. Yongsheng Gao+RQJ.RQJ8QLYHUVLW\RI6FLHQFHDQG7HFKQRORJ\+RQJNRQJ &KLQD 0HPEHUV Prof. Harald Bosse, 3K\VLNDOLVFK7HFKQLVFKH%XQGHVDQVWDOW*HUPDQ\ 3 Prof. Frank Härtig3K\VLNDOLVFK7HFKQLVFKH%XQGHVDQVWDOW*HUPDQ\ Prof. Min Gu6ZLQEXUQH8QLYHUVLW\RI7HFKQRORJ\$XVWUDOLD Prof. Wei Gao7RKRNX8QLYHUVLW\-DSDQ Prof. Richard Leach1DWLRQDO3K\VLFDO/DERUDWRU\8. Dr. Christan Rothleitner3K\VLNDOLVFK7HFKQLVFKH%XQGHVDQVWDOW*HUPDQ\ Prof. Fu-Jen Kao1DWLRQDO
4 Prof. Tianquan Fan,QVWLWXWHRI2SWLFVDQG(OHFWURQLFV&KLQHVH$FDGHP\RI 6FLHQFHV&KLQD Prof. Zili Zhou&KLQHVH$HURQDXWLFDO(VWDEOLVKPHQW&KLQD Prof. Yuchi Lin7LDQMLQ8QLYHUVLW\&KLQD Prof. Hua Ai&KDQJFKXQ,QVWLWXWHRI2SWLFV)LQH0HFKDQLFVDQG3K\VLFV&KLQHVH $FDGHP\RI6FLHQFHV&KLQD Prof. Yinhan Gao-LOLQ8QLYHUVLW\&KLQD Prof. Junjie Guo;L DQ-LDRWRQJ8QLYHUVLW\&KLQD Prof. Donglin Peng&KRQJTLQJ8QLYHUVLW\RI7HFKQRORJ\&KLQD Prof. Guozheng Yan6KDQJKDL-LDRWRQJ8QLYHUVLW\&KLQD Prof. Linna Zhang=KHQJ]KRX8QLYHUVLW\&KLQD Prof. Ying Xu*XDQJGRQJ8QLYHUVLW\RI7HFKQRORJ\&KLQD Prof. Dengxin Hua;L DQ8QLYHUVLW\RI7HFKQRORJ\&KLQD Prof. Jianhua Wang;L DQ7HFKQRORJLFDO8QLYHUVLW\&KLQD Prof. Xiaoyang Yu+DUELQ8QLYHUVLW\RI6FLHQFHDQG7HFKQRORJ\&KLQD Prof. Yueke Wang1DWLRQDO8QLYHUVLW\RI'HIHQVH7HFKQRORJ\&KLQD Prof. Yan Li7VLQJKXD8QLYHUVLW\&KLQD Prof. Xiangzhao Wang6KDQJKDL,QVWLWXWHRI2SWLFVDQG)LQH0HFKDQLFV&KLQD Prof. Guoyu Zhang&KDQJFKXQ8QLYHUVLW\RI6FLHQFHDQG7HFKQRORJ\&KLQD Prof. Yongying Yang=KHMLDQJ8QLYHUVLW\&KLQD Prof. Zhongyu Wang%HLKDQJ8QLYHUVLW\&KLQD Prof. Qun Hao%HLMLQJ,QVWLWXWHRI7HFKQRORJ\&KLQD Prof. Hui Zhao6KDQJKDL-LDRWRQJ8QLYHUVLW\&KLQD Prof. Xiaodong Wang'DOLDQ8QLYHUVLW\RI7HFKQRORJ\&KLQD Prof. Weiqian Zhao%HLMLQJ,QVWLWXWHRI7HFKQRORJ\&KLQD Prof. Tiehua Ma1RUWK8QLYHUVLW\RI&KLQD&KLQD Prof. Mingxing Jiao;L DQ8QLYHUVLW\RI7HFKQRORJ\&KLQD Prof. Yingjie Yu6KDQJKDL8QLYHUVLW\&KLQD Prof. Rongsheng Lu+HIHL8QLYHUVLW\RI7HFKQRORJ\&KLQD Prof. Yong Xu&KDQJFKHQJ,QVWLWXWHRI0HWURORJ\ 0HDVXUHPHQW&KLQD Prof. Yongrui Zhao&KLQD8QLYHUVLW\RI3HWUROHXP&KLQD Prof. Zhihong Liu%HLMLQJ2ULHQWDO,QVWLWXWHRI0HDVXUHPHQWDQG7HVW&KLQD Prof. Liandong Yu+HIHL8QLYHUVLW\RI7HFKQRORJ\&KLQD Prof. Shiyuan Liu+XD]KRQJ8QLYHUVLW\RI6FLHQFHDQG7HFKQRORJ\&KLQD Prof. Changcai Cui+XDTLDR8QLYHUVLW\&KLQD Prof. Zi Xue1DWLRQDO,QVWLWXWHRI0HWURORJ\&KLQD Prof. Jun Han;L DQ7HFKQRORJLFDO8QLYHUVLW\&KLQD Prof. Benyong Chen=KHMLDQJ6FL7HFK8QLYHUVLW\&KLQD Prof. Jigui Zhu7LDQMLQ8QLYHUVLW\&KLQD Prof. Yong Zhu&KRQJTLQJ8QLYHUVLW\&KLQD Prof. Fajie Duan7LDQMLQ8QLYHUVLW\&KLQD Prof. Jun Yang1DWLRQDO8QLYHUVLW\RI'HIHQVH7HFKQRORJ\&KLQD Prof. Yajun Liang%HLMLQJ$HURVSDFH,QVWLWXWHIRU0HWURORJ\DQG0HDVXUHPHQW
5 7HFKQRORJ\&KLQD Prof. Shuming Yang;L DQ-LDRWRQJ8QLYHUVLW\&KLQD Prof. Pengcheng Hu+DUELQ,QVWLWXWHRI7HFKQRORJ\&KLQD Prof. Junning Cui+DUELQ,QVWLWXWHRI7HFKQRORJ\&KLQD Prof. Huijie Zhao%HLKDQJ8QLYHUVLW\&KLQD Prof. Sen Han8QLYHUVLW\RI6KDQJKDLIRU6FLHQFHDQG7HFKQRORJ\&KLQD Prof. Qing He1DWLRQDO,QVWLWXWHRI0HWURORJ\&KLQD Associate Prof. Wenlong Lu +XD]KRQJ8QLYHUVLW\RI6FLHQFHDQG7HFKQRORJ\ &KLQD Associate Prof. Yang Liu+DUELQ,QVWLWXWHRI7HFKQRORJ\&KLQD Associate Prof. Yunfeng Lu1DWLRQDO,QVWLWXWHRI0HWURORJ\&KLQD
6HFUHWDULHVJHQHUDO Prof. Junning Cui+DUELQ,QVWLWXWHRI7HFKQRORJ\&KLQD Associate Prof. Jie Lin+DUELQ,QVWLWXWHRI7HFKQRORJ\&KLQD Prof. Pengcheng Hu+DUELQ,QVWLWXWHRI7HFKQRORJ\&KLQD
6 10th International Symposium on Precision ISPEMI 2018 Engineering Measurements and Instrumentation
August 8-10, 2018 Kunming China
Schedule at a Glance
August 8, 2018 August 9, 2018 August 10, 2018
8:30-8:50 Opening Ceremony 8:00-9:50 Section 1-4
8:50-10:10 Plenary Session I (2) 9:50-10:35 Poster Section
10:10-10:25 Coffee Break 10:35-12:15 Section 5-8
10:25-11:45 Plenary Session II (2) 12:15-13:30 Lunch Reception and Registration 8:00:20:00 11:45-12:05 Photography 13:30-15:05 Section 9-12 (Hotel lobby) 12:0ϱ-13:30 Lunch 15:05-15:50 Poster Section
13:30-15:30 Plenary Session III (3) 15:50-17:45 Section 13-16
15:30-15:45 Coffee Break 18:00-20:00 Closing Ceremony
15:45-17:45 Plenary Session IV (3) Plenary speech: 40 min, keynote: 20min, Invited talk: 15 min, Ordinary presentation: 15 min.
7
3URJUDPRQ$XJXVW 7LPH 2SHQLQJDQG3OHQDU\6SHDNLQJ &KDLU 2SHQLQJ&HUHPRQ\ -LXELQ7DQ 7LWOH 2SWLFDOILEHUVHQVRUVIRULQGXVWULDODSSOLFDWLRQV 3URI.HQQHWK*UDWWDQ &LW\8QLYHUVLW\RI/RQGRQ8. 7RQ\:LOVRQ 7LWOH˖0LQLDWXUHWZRSKRWRQPLFURVFRS\IRUEUDLQLPDJLQJLQIUHHO\EHKDYLQJDQLPDOV 3URI+HSLQJ&KHQJ 3HNLQJ8QLYHUVLW\&KLQD &RIIHH%UHDN 7LWOH˖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¶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±GUHYHU±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resident of the International Measurement Confederation (IMEKO) Dean, City Graduate School Royal Academy of Engineering - George Daniels Professor of Scientific Instrumentation City University of London, UK Professor Grattan graduated in Physics from Queen’s University Belfast with a BSc (First Class Honors) in 1974 and a PhD in Laser Physics. His research involved the use of laser-probe techniques for measurements on potential new laser systems. Following Queen’s, in 1978 he became a Research Fellow at Imperial College of Science and Technology, sponsored by the Rutherford Laboratory to work on advanced photolytic drivers for novel laser systems. This involved detailed measurements of the characteristics and properties of novel laser species and a range of materials involved in systems calibration. In 1983 he joined City University as a “new blood” Lecturer in Physics, being appointed Professor of Measurement and Instrumentation in 1991 and Head of the Department of Electrical, Electronic and Information Engineering. He was appointed Dean of the Schools of Engineering & Mathematical Sciences and of Informatics in 2008, serving until 2012 when he became Dean of the newly formed City Graduate School. His research interests include the use of fiber optic and optical systems in the measurement of a range of physical and chemical parameters. The work has been sponsored by a number of organizations including EPSRC, the EU, private industry and venture capital and he holds a number of patents for his work with industry. He obtained a DSc from City University in 1992 for his sensor work. Professor Grattan is extensively involved with the work of the professional bodies having been Chairman of the Science, Education and Technology of the Institution of Electrical Engineers, the Applied Optics Division of the Institute of Physics and he was President of the Institute of Measurement and Control during the year 2000. He was awarded the Callendar Medal of the Institute of Measurement and Control in 1992, the Hartley Medal of the same Institution in 2015 and the Honeywell Prize for work published in the Institute’s journal as well the Institute of Physics Applied Optics Divisional Prize in 2010. Professor Grattan had been Deputy Editor of the Journal Measurement Science and Technology for several years and currently serves on the Editorial Board of several major journals in his field in the USA and Europe. In January 2001 he was appointed Editor of the IMEKO Journal “Measurement” and now is Editor Emeritus of the Journal. After many years serving on their General Council, he was appointed the President of the International Measurement Confederation (IMEKO) in 2015. He is the author and co-author of about 1300 publications in major international journals and at conferences and is the co-editor (with Professor B T Meggitt) of a five volume topical series on Optical Fiber Sensor Technology. Professor Grattan was Dean of the School of Engineering & Mathematical Sciences and also Dean of the School of Informatics at City University from 2008 to 2012 and in that year was appointed as the Inaugural Dean of the new City Graduate School at the University. 34 3OHQDU\6HVVLRQ, 7LWOH 0LQLDWXUHWZRSKRWRQPLFURVFRS\IRUEUDLQLPDJLQJ LQIUHHO\EHKDYLQJDQLPDOV $XJ &KDLUPDQ 3URI7RQ\:LOVRQ 3URI+HSLQJ&KHQJ Leader of Institute of Molecular Medicine, Peking University Fellow of the Chinese Academy of Sciences Professor Heping (Peace) Cheng received his bachelor and master degrees in applied mathematics & mechanics and biomedical engineering, with physiology as his minor, from Peking University, China. Upon graduation, he served as a junior faculty member in the Department of Electrical Engineering at the same university before earning his Ph.D. degree in physiology in 1995 from the University of Maryland at Baltimore. He then joined the NIH Intramural Research Program as a senior staff fellow, was selected as a tenure- track investigator in 1998 and became the head of the Ca2+ Signaling Section in the Laboratory of Cardiovascular Science, National Institute of Aging, NIH. He was promoted to senior investigator in 2004. He is now a senior investigator heading the Laboratory of Ca2+ Signaling & Mitochondrial Biomedicine in the Institute of Molecular Medicine at Peking University. He was elected to the Chinese National Academy of Sciences in 2013. Co- discovering “Ca2+ sparks” in 1993 and mitochondrial “superoxide flashes” in 2008, he strives to resolve elemental physiological signals in the pursuit of principles of cell signaling. Currently he is engaged in developing novel imaging technology for reverse engineering of brain information processing. 35 3OHQDU\6HVVLRQ,, 7LWOH &RPEEDVHGPXOWLGLPHQVLRQDOFRKHUHQW VSHFWURVFRS\ $XJ &KDLUPDQ 3URI)X-HQ.DR 3URI6WHYHQ&XQGLII Fellow Adjoint of JILA. Harrison M. Randall Collegiate Professor of Physics, University of Michigan, Ann Arbor Fellow of the IEEE, Fellow of the APS, Fellow of the OSA, OSA Meggers Award, Humboldt Research Award Professor Cundiff and his research group work on several aspects of ultrafast optics. One area involves generating and controlling ultrashort pulses, which, of course, provides the foundation for the field of ultrafast optics. However, the group is primarily interested in using ultrashort light pulses for a variety of scientific applications. A natural application is to use the very short duration of the pulses to study processes that occur on similar timescales, which is generally known as ultrafast spectroscopy. Ultrafast spectroscopy not only gives dynamical information, but it also provides information about the fundamentals of how light interacts with matter. One type of ultrafast spectroscopy, known as optical multidimensional coherent spectroscopy, has been developed over the last decade as has proven to be very powerful. The Cundiff group uses ultrafast spectroscopy, including multidimensional coherent spectroscopy, to study a range of system including semiconductors, semiconductor nanostructures and atomic vapors. 36 3OHQDU\6HVVLRQ,, 7LWOH $QRYHOKLJKSUHFLVLRQPDVVPHDVXUHPHQWGHYLFHIRU WKHQHZNLORJUDP $XJ &KDLUPDQ 3URI)X-HQ.DR 'U&KULVWDQ5RWKOHLWQHU Leading scientist of the group mass metrology for Planck balances, Physikalisch-Technische Bundesanstaldt (PTB) Member of German physical society DPG and American physical society Dr. Christian Rothleitner studied physics in Germany, Italy and Venezuela. He received his PhD in experimental physics at the Max Planck Institute for the Science of Light, in Germany, about the development of two free-fall absolute gravimeters in the group of Prof. Lijun Wang (now at Tsinghua University, China). After he received his PhD he made a postdoctorate at the University of Luxembourg where he developed a free-fall experiment to measure the Newtonian constant of gravitation. Thereafter, he joined the German national metrology institute, the Physikalisch-Technische Bundesanstaldt (PTB), where he gained several years of experience in length metrology with a special focus on computed tomography. Now he is the leading scientist of the group mass metrology for Planck balances at PTB. In this position he is responsible for developing a high-precision weighing instrument that will allow to make primary realizations of the SI unit kilogram after its re- definition by end of 2018. This is done in collaboration with the Technical University of Ilmenau where Dr. Rothleitner is also doing his ‘habilitation’, a qualification as a lecturer. Dr. Rothleitner published more than 30 scientific articles in international peer reviewed journals. He is member of the German physical society DPG and of the American physical society APS. 37 3OHQDU\6HVVLRQ,,, 7LWOH 7LPHUHVROYHGLPDJLQJZLWKVWLPXODWHGHPLVVLRQLQ SXPSSUREHPLFURVFRS\ $XJ &KDLUPDQ 3URI6HXQJ:RR.LP 3URI)X-HQ.DR Professor, Institute of Biophotonics, National Yang-Ming University (2004-) Association of Asia Pacific Physical Societies (2016-) Professor Fu-Jen Gao is now in Institute of Biophotonics, National Yang-Ming University since 2004 and also the association of Asia Pacific Physical Societies. He was the president of Physics Society of ROC (2012-2014), vice president of Physics Society of ROC (2012- 2014), associated Dean of Office of Research & Development, NYMU (2006-2011), and also the director, Institute of Biophotonics, NYMU (2004-2011). His research interests are in the field of Stimulated emission based pump-probe microscopy, 4-channel Stokes vector resolved SH polarization microscopy and biomedical optical instrument for endoscopy. During his academic career, the long working distance fluorescence and lifetime measurement via stimulated emission, and laser illumination for endoscopy are the two research highlights. In the field of “long working distance fluorescence and lifetime measurement via stimulated emission”, Prof Gao and his team are focusing on the unique aspect of spatial coherence as a result of stimulated emission, which is utilized for long distance fluorescence detection and lifetime imaging. In contrast with the case of spontaneous emission, high numerical aperture optics is not required to collect the stimulated emission signal efficiently. Meanwhile, in the field of “Laser illumination for endoscopy”, Prof Gao’s team have successfully established a novel ultra-compact endoscopic imaging system, which uses a miniature CMOS sensor (O.D. <1.0 mm) and a few multimode fiber for light delivery. Critically, the illumination is realized by coupling the output of a supercontinuum or RGB laser into the fiber. In this way, very high brightness is possible with extremely small footprint on the illumination part. As a result, the overall diameter (< 1.2 mm) of the endoscope can be much smaller than the currently used models. 38 3OHQDU\6HVVLRQ,,, 7LWOH 6L]HPDWWHUV8QGHUVWDQGLQJDQGH[SORLWLQJWKH OHQJWKVFDOHGHSHQGHQFHRIPDWHULDOSURSHUWLHVDQG QDQRPLFURVFDOHPHDVXUHPHQWV $XJ &KDLUPDQ 3URI6HXQJ:RR.LP 3URI1LJHO0-HQQHWW Professor of Materials, Mechanics and Measurement at Coventry University Chairs of the BSI indentation hardness committee Professor Nigel M Jennett BSc (Hons) (Physics), PhD (Physics), CSci CPhys MinstP has over 25 years' experience of fabrication and characterization of nano-structured materials and 20 years' developing nano-mechanical test methods. He is: Professor of Materials, Mechanics and Measurement at Coventry University, visiting Professor of Engineering at Leicester University, Associate Editor of Philosophical Magazine (and Philos. Mag. Letters), international chair of VAMAS Technical Working Area 22 'Mechanical properties measurement of thin films and coatings', UK technical expert on the CIPM consultative committee hardness working group (CCM-WGH), chairs the BSI indentation hardness committee, leads the UK delegation for ISO working groups drafting standards for indentation-based test methods. Nigel has also served two terms (six years) on the European Commission Certification Advisory Panel for Physical and Physicochemical Properties. Nigel studied Physics at Bristol University (Physics Laboratory prize in 1984 and 1986, and the Raychem prize in 1985). He spent six years researching magnetic multilayers (1990 PhD, 1991 Chartered Physicist), before moving to NPL (1992) to develop traceable Scanned Probe Microscopy and nano-mechanical measurements. In 1998 he created his own research group focused on surfaces, coatings and nano-mechanics and was awarded a Glazebrook Fellowship in 2003 and the NPL Rayleigh award in 2010. Nigel is an experienced leader of projects (Government, Industry and European Commission), and is a regular invited speaker at international conferences. 39 3OHQDU\6HVVLRQ,,, 7LWOH ,QQRYDWLYHWHFKQLTXHVIRUFRQWUDVWVSHFWURPHWULF DQGYLVFRHODVWLFPHDVXUHPHQWVLQVPDOODQLPDO05, $XJ &KDLUPDQ 3URI6HXQJ:RR.LP 3URI2OLYLHU%HXI Senior CNRS research scientist Team leader “NMR and optics: From measure to biomarker” Director of the CREATIS lab (CNRS UMR5220, INSERM U1206) Dr. Olivier Beuf is the senior CNRS research scientist in France. He obtained his PH.D in physics from Université Claude Bernard Lyon 1 in 1998. Dr. Beuf has widely research interests in the field of MR imaging, RF coils, multi-parameters quantitative imaging, liver analysis, cartilage ultra-structure and morphology, and so on. He published more than 80 peer reviewed international journal articles and 8 book chapters. His research works are 1105 citations in WOS and the h-index is as high as 19. Meanwhile, the transfer of technology are 3 patents. Dr. Beuf is also the supervisor of 17 PhD students (14 defended and 3 still supervised). Dr. Beuf is the chairman of the “journées scientifiques sur les nouvelles méthodologies en imagerie du vivant”, Lyon, France (300 delegates). He is the distinguished reviewer of Journal of Magnetic Resonance Imaging (2011 and 2014) and Magna Cum Laude Merit Award of the 30th Meeting of the International Society for Magnetic Resonance in Medicine (2012). 40 3OHQDU\6HVVLRQ,9 7LWOH ,QWHUIHURPHWULFPLFURVFRS\IRUGHWHFWLRQDQG YLVXDOL]DWLRQRIELRORJLFDOQDQRSDUWLFOHV $XJ &KDLUPDQ 3URI1LJHO0-HQQHWW 3URI06HOLPhQO Distinguished Professor of Engineering appointed in electrical and computer engineering, biomedical engineering, physics, and graduate medical sciences. Boston University IEEE Fellow and OSA Fellow Editor-in-Chief for IEEE Journal of Quantum Electronics Contact Information: [email protected] www.bu.edu/OCN Professor M. Selim Ünlü received the B.S. degree from the Middle East Technical University, Ankara, Turkey, in 1986, and the M.S.E.E. (1988) and Ph.D. (1992) degrees from the University of Illinois at Urbana-Champaign, all in electrical engineering. Since 1992, he has been a professor at Boston University. He is currently a Distinguished Professor of Engineering appointed in electrical and computer engineering, biomedical engineering, physics, and graduate medical sciences. He has also served as the Associate Dean for Research and Graduate Programs in engineering. His research interests are in the areas of nanophotonics and biophotonics focusing on high-resolution solid immersion lens microscopy of integrated circuits and development of biological detection and imaging techniques, particularly in high-throughput digital biosensors based on detection of individual nanoparticles and viruses. Dr. Ünlü was the recipient of the NSF CAREER and ONR Young Investigator Awards in 1996. He has been selected as a Photonics Society Distinguished Lecturer for 2005-2007 and Australian Research Council Nanotechnology Network (ARCNN) Distinguished Lecturer for 2007. He has been elevated to IEEE Fellow rank in 2007 for his “contributions to optoelectronic devices” and OSA Fellow rank in 2017 for his “for pioneering contributions in utilization of optical interference in enhanced photodetectors and biological sensing and imaging.” In 2008, he was awarded the Science Award by the Turkish Scientific Foundation. His professional service includes serving as the chair of the Annual Meeting for IEEE Photonics Society and Editor-in-Chief for IEEE Journal of Quantum Electronics. 41 3OHQDU\6HVVLRQ,9 7LWOH 3ODVPRQLFV ([RWLFQDQRSKRWRQLFVEH\RQGWKHOLPLWV $XJ &KDLUPDQ 3URI1LJHO0-HQQHWW 3URI6DWRVKL.DZDWD Professor Emeritus, Osaka University Honorary Scientist RIKEN Osaka University, Suita, Japan Office: P3-300, Photonics Center Email:[email protected] Professor Satoshi Kawata is now Professor Emeritus at Osaka University and Honorary Scientist of RIKEN. He is the founder and the Chairman of the Board of Nanophoton Corp. He is a Fellow of OSA, IOP, SPIE, and JSAP. Satoshi Kawata received his BSc, Msc, and PhD all in Applied Physics in 1974, 76, and 79, respectively, from Osaka University. After the experience of postdoctral fellow of JSPS, he spent two years in University of California, at Irvine as a Research Associate. He joined Osaka University as a faculty member in 1981 and was promoted to Professor of Applied Physics in 1993, and then Distinguished Professor in 2013. In 2002, he joined RIKEN as a Chief Scientist as Head of Nanophotonics Laboratory until his retirement in 2012, and Team Leader of RIKEN until 2015. Professor Kawata is now the Professor Emeritus of Osaka University and Honorary Scientist of RIKEN. He has served as the President of JSAP (Japan Society of Applied Physics) from 2014 to 2016, and the President of Spectroscopical Society of Japan from 2007 to 2008, the Editor of Optics Communications from 2000 to 2009. He is one of the pioneers in near field optics (the inventor of tip-enhanced near-field microscopy), three-dimensional microscopy (laser CT microscopy, 3D optical data storage), plasmonics (SPR sensors, plasmon holography, plasmon laser, plasmonic microscopy), two- photon engineering (two-photon polymerization, two-photon isomerization, two-photon photorefraction, two-photon SPP, etc), bio-imaging, and signal recovery. The "8-micron bull" fabricated with his invented two-photon technology has been awarded in Guinness World Record Book 2004 Edition. 42 3OHQDU\6HVVLRQ,9 7LWOH 'ULYHRSHUDWLRQDOH[FHOOHQFHWKURXJKLQWHOOLJHQW TXDOLW\ $XJ &KDLUPDQ 3URI1LJHO0-HQQHWW 0V/LDR/X Hexagon Manufacturing Intelligence Global Product Marketing Manager Ms. Liao Lu is now Hexagon Manufacturing Intelligence Global Product Marketing Manager. She is also HxGN SMART Quality Product Marketing Manager. With more than 20 years of industrial experience in precision measurement, Ms. Liao Lu has extensive market knowledge and internationalized view on measuring technology and customer application, and has made important contributions to the application and popularization of advanced measuring technology. She received her MSc degrees in Precision Measuring Technology from Tianjin University in 2003. Abstract: Quality is not just dimensional inspection. Quality minimises the difference between the intended and the actual. Intelligent Quality means the active use of data to make quality improvements throughout the product lifecycle. This presentation will review the mindset changing in quality management, blending the innovation hardware and software technology trends on data collection in shop floor, digital connectivity, advanced analytics, and further drive quality improvement via insights gained from digitally connected equipment, people, processes, and operational systems. Introduce using the concept of 3D digital thread to create a rich information ecosystem for smarter manufacturing. 43 &RQWHQWV Session 1 Instrumentation Theory and Methodology (1) [8:00-9:50, Aug. 10, Room 1] ...... 51 S1-1 Metrology of shock-induced dynamic response based on ultrafast ellipsometry [Keynote] .... 51 S1-2 A brief introduction of nano-indentation and it’s application in small-scale mechanical testing [Invited] ...... 51 S1-3 The measurement technology for precision peg-in-hole assembly [Invited] ...... 51 S1-4 Multiple-exposure adaptive selection algorithm for high dynamic range 3D fringe projection measurement [Invited] ...... 52 S1-5 Design and testing of a chromatic dispersion system for displacement application by using a spatial-bandpass-filter ...... 52 S1-6 Establishment of the measuring coordinate system for large gears by gauge block ...... 53 S1-7 Control circuit design of magnetic suspension stylus measuring instrument ...... 53 Session 2 Measurement for Precision and Ultra-Precision Machining [8:00-9:50, Aug. 10, 2018, Room 2]...... 53 S2-1 Development of a parallel micro-CMM with high-precision contact scanning probe [Keynote] ...... 53 S2-2 A new non-contact coordinate measuring machine equipped with light-duty optical probe based on fringe projection profilometry [Invited] ...... 53 S2-3 Precision PGC demodulation for homodyne interferometer modulated with a combined sinusoidal and triangular signal [Invited] ...... 54 S2-4 EEG-based pain level measurement and assessment using machine learning ...... 54 S2-5 A method for GMA internal magnetic field measurement based on temperature compensation ...... 55 S2-6 Precise measurement of large roll angle using digital speckle pattern interferometry ...... 55 S2-7 Research on multi-degree-of-freedom and high-precision touch screen characteristic test instrument ...... 55 Session 3 Novel Instrument and Measurement System (1) [8:00-9:50, Aug. 10, 2018, Room 3] ...... 56 S3-1 Development of optic-electronic autocollimators for monitoring the angular displacements of large objects [Keynote] ...... 56 S3-2 Research on statistical measurement method of the standard particles through airborne particle counter based on FESEM [Invited] ...... 56 S3-3 Precision assessment of high-speed railway slab intelligent inspection system [Invited] ...... 56 S3-4 Absolute distance measurement using synthetic wavelength interferometry of optical frequency combs [Invited] ...... 57 S3-5 Single-shot capturing based on polarizing coupled interferometry for phase measurement of cells ...... 57 S3-6 A novel miniaturized capacitive absolute angular position sensor based on time-grating with reflective structure ...... 57 S3-7 Study on the angular measuring accuracy of the rotary station with varying load ...... 58 Session 4 Novel Instrument and Measurement System (2) [8:00-9:50, Aug. 10, 2018, Room 4] ...... 58 S4-1 Advanced optical metrology using mode-locked lasers [Keynote]...... 58 S4-2 Infrared lens refractive index measurement using confocal tomography [Invited] ...... 59 S4-3 Method for high-precision distance estimation and dispersion mismatch compensation in frequency scanning interferometry [Invited] ...... 59 S4-4 Cell traction force measurement in a large field of view based on the Moire fringe method .. 59 S4-5 Modified short-wave offner imaging spectrometer with low F number and large field of view ...... 59 S4-6 Torque standard machine for calibration of reference torque wrench and torque transducer at NIM ...... 60 S4-7 Dual-comb generation from a dual-ring hybrid mode-locked fiber laser ...... 60 Session 5 Modern Optics and Instruments for Precision Measurement (1) [10:25-12:00, Aug. 10, 2018, Room 1]...... 60 S5-1 Removal of opaque coolant barrier for in-process form profile optical measurement [Keynote] ...... 60 44 S5-2 Process optimization: internal feature measurement for additive-manufacturing parts using X- ray computed tomography [Invited] ...... 61 S5-3 Optical fiber sensing techniques and its applications [Invited] ...... 61 S5-4 Development of chromatic dispersion lens for chromatic confocal microscopy ...... 61 S5-5 Evaluation of the diffraction correction during the 10th International Comparison of Absolute gravimeters (ICAG 2017) ...... 62 S5-6 Design of optical accelerometer using four-quadrant photodetector ...... 62 Session 6 Sensors, Actuators and Application (1) [10:25-12:00, Aug. 10, 2018, Room 2] ...... 62 S6-1 Recent research advance in EMI shielding transparent conductors [Keynote] ...... 62 S6-2 Research and application of a novel randomly encoded hybrid grating interferometric wavefront sensor [Invited] ...... 63 S6-3 Dielectric micro-sphere measurement using whispering gallery mode resonances [Invited] .. 63 S6-4 Micro-LED optical engine with biologically inspired artificial compound eyes for pico- projection display [Invited] ...... 64 S6-5 Analysis of contracting characteristics on aerostatic bearing stylus displacement sensor ...... 64 S6-6 Complicated intermittent scratches detection research on surface of optical components based on adaptive sector scanning algorithm cascading mean variance threshold algorithm ...... 64 Session 7 Micro and Nano Metrology, Macro Metrology [10:25-12:00, Aug. 10, 2018, Room 3] ...... 65 S7-1 Ultrasonic array for NDT using total focusing method imaging algorithm [Keynote] ...... 65 S7-2 Measurement and sensing for graphene and 2D materials by microwave resonance [Invited] ...... 65 S7-3 Novel double-FBARs-on-beam for PZT micro-accelerometer [Invited] ...... 66 S7-4 Applications of wavefront modulation devices in aspheric and freeform measurement [Invited] ...... 66 S7-5 A measurement method for probe microsphere of micro-CMM with double SPMs ...... 66 S7-6 Investigation on the dynamic characteristics of CG-6 relative gravimeter for the micro-gravity network gravimeter for the micro-gravity network ...... 67 Session 8 Laser Measurement Techniques and Instruments (1) [10:25-12:00, Aug. 10, 2018, Room 4] ...... 67 S8-1 Weyl degeneracies in topological metamaterials [Keynote] ...... 67 S8-2 The advance of laser precision measurement instrumentation in the Academy of Opto- Electronics, Chinese Academy of Sciences [Invited] ...... 67 S8-3 Energy analysis method of the laser tracing measurement optical system [Invited] ...... 68 S8-4 All-fiber Fabry-Perot interference structure: key technology and its applications ...... 68 S8-5 Development of hybrid measuring system for the complex micro-arrayed surface ...... 68 S8-6 Kinematics identification and measurement accuracy verification of articulated arm coordinate measuring machines ...... 69 Session 9 Instrumentation Theory and Methodology (2) [13:30-15:05, Aug. 10, 2018, Room 1] ...... 69 S9-1 Displacement laser interferometry with sub-nm or deep sub-nm accuracy [Keynote] ...... 69 S9-2 All-optical difference engine for in-process defect inspection for roll-to-roll printed electronics [Invited] ...... 70 S9-3 Development of auto defect inspection system for cell phone silicone rubber gasket [Invited] ...... 70 S9-4 Measurement on deionized water density based on single silicon sphere ...... 70 S9-5 A novel signal process system for angular displacement sensor of time-grating ...... 70 S9-6 Design and simulation of a 2-DOF parallel linear precision platform utilizing piezoelectric impact drive mechanism utilizing piezoelectric impact drive mechanism ...... 71 Session 10 Instrument and Measurement System Calibration (1) [13:30-15:05, Aug. 10, 2018, Room 2] ...... 71 S10-1 Dealing with systematic effects in measurement uncertainty calculations [Keynote] ...... 71 S10-2 Advanced measurement of super-smooth surface [Invited] ...... 72 S10-3 Dual-comb ranging [Invited] ...... 72 S10-4 The optical-electronic autoreflection sensor for angular deformations measurement ...... 72 S10-5 In-line optical fiber Mach-Zehnder sensor fabricated by CO2 laser and its applications ...... 72 S10-6 A novel earth's gravity method for accelerometer calibration ...... 73 Session 11 Signal Processing and Image Processing [13:30-15:05, Aug. 10, 2018, Room 3] ...... 73 S11-1 Ultraprecision 3D non-contact probing for measurement of micro-structure with high aspect 45 ratio [Keynote] ...... 73 S11-2 A measuring method of spindle rotation error using circular grating and self-collimator [Invited] ...... 74 S11-3 A curve segment method based on fixed dynamic programming and cycled optimization techniques [Invited] ...... 74 S11-4 A fast infrared thermal imaging detection method based on spatial correlation [Invited] .... 74 S11-5 The method of solving the accurate displacement rule with acceleration signal ...... 74 S11-6 A high precision edge detection method for the blurred image in motion measurement ..... 75 Session 12 Sensors, Actuators and Application (2) [13:30-15:05, Aug. 10, 2018, Room 4] ...... 75 S12-1 Ultrasound detection and imaging using microring resonators and laser generated focused ultrasound [Keynote] ...... 75 S12-2 Cold atom interferometry gravimeter [Invited] ...... 75 S12-3 Establishment of standard device for high rotational speed generation [Invited] ...... 76 S12-4 A novel two-dimensional inductive sensor based on planar coils ...... 76 S12-5 A domain adaptation deep transfer method for image classification ...... 76 S12-6 Micro Coordinate Measurement Machine (μCMM) using voice coil actuator with interferometric position feedback ...... 77 Session 13 Laser Measurement Techniques and Instruments (2) [15:50-17:45, Aug. 10, 2018, Room 1] ...... 77 S13-1 Fourier ptychographic imaging [Keynote] ...... 77 S13-2 Multi-matrix optic-electronic systems for measuring the line shifts of the points on the radio- telescope main mirror [Invited] ...... 77 S13-3 Measurement of 3-dB linewidth of FBG Fabry–Perot interferometer using tunable fiber laser [Invited] ...... 78 S13-4 Study on integrated linear time-grating displacement sensor with single alternating light field with single alternating light field ...... 78 S13-5 Deformation measurement of testing machine based on laser interference method ...... 78 S13-6 A two-probe linear encoder by using an arrayed scale grating stitched by multiple separate short gratings ...... 79 S13-7 Corrected differental fitting for height extraction in chromatic confocal microscopy ...... 79 Session 14 Novel Instrument and Measurement System (3) [15:50-17:45, Aug. 10, 2018, Room 2] ...... 80 S14-1 Thermo scientific themis Z: the ultimate in optical performance, reproducibility and flexibility [Keynote] ...... 80 S14-2 Interferometric characterization of large-stroke nano-positioning stage using an optical fiber interferometer with subatomic resolution [Invited] ...... 80 S14-3 Real-time 3D shape measurement by fringe projection and GPU parallel computing [Invited] ...... 80 S14-4 Measurement uncertainty analysis for self-calibration angle encoder [Invited] ...... 80 S14-5 More efficient optical sectioning structured illumination microscopy ...... 81 S14-6 Measurement of unmanned aerial vehicle attitude angles based on a single captured image ...... 81 S14-7 Error analysis method of weighing cycles based on robotic mass measurement system ...... 81 Session 15 Modern Optics and Instruments for Precision Measurement (2) [15:50-17:45, Aug. 10, 2018, Room 3] ...... 82 S15-1 Three-dimensional imaging of live-cell dynamics using light-field microscopy [Keynote] ...... 82 S15-2 Method for simultaneously measuring 6DOF motion errors of linear and rotary axes of cnc machine tools [Invited] ...... 82 S15-3 Development of surface profile measurement system based on super luminescent diode light source [Invited] ...... 82 S15-4 Holographic fabrication of two-dimensional scale gratings for surface encoder by using an orthogonal type two-axis Lloyd's mirror interference lithography [Invited] ...... 83 S15-5 Subwavelength focusing and experimental detection of large-scale metallic multi-annular metasurfaces ...... 83 S15-6 A filter algorithm based on ARMA model to suppress the influence of atmospheric disturbance in laser straightness measurement ...... 84 S15-7 Optical fiber sensing technology in morphing aircrafts and soft robotics...... 84 Session 16 Instrument and Measurement System Calibration (2) [15:50-17:45, Aug. 10, 2018, Room 4] ...... 84 46 S16-1 Ultrathin Terahertz wavefront modulator based on metasurface [Keynote] ...... 84 S16-2 EMI shielding performance evaluation model of the randomized overlapping ring metallic mesh [Invited] ...... 85 S16-3 The optimization of segment's supporting for large astronomical telescopes [Invited] ...... 85 S16-4 Dual-wavelength off-axis quasi-common-path digital holography using polarization- multiplexing and flipping [Invited] ...... 85 S16-5 Key technology and applications of fiber grating fabricated by femtosecond laser ...... 86 S16-6 Field test method and standard instruments for verification of traffic speed meters based on actual traffic ...... 86 S16-7 Theoretical determination and validation of thermal deformation critical point of cnc machine tool bed ...... 87 Poster 1 Instrumentation Theory and Methodology ...... 88 P1-1 Method for spherical form error evaluation using cuckoo search algorithm ...... 88 P1-2 Research on photonic detection method of laser self-mixing interference ...... 88 P1-3 Design of Gaussian filters based on odd and even function continuation for non-closed circular profile ...... 88 P1-4 Misalignment recognition of mass pan in joule balance ...... 89 P1-5 Method of squareness measurement based on laser alignment measuring system ...... 89 P1-6 Choosing parameters of active reference mark optical-electronic systems spatial position control...... 89 P1-7 Research of the temperature influence on the errority of incremental optical-electronic encoders of linear displacements based on raster structures ...... 90 P1-8 Research of technologies in image-based omnidirectional AGV...... 90 P1-9 A uniform and flexible model for three-dimensional measurement of line-structured light sensor ...... 90 P1-10 Multi-structure elements morphology for improved anti-noise edge detection...... 91 Poster 2 Measurement for Precision and Ultra-Precision Machining ...... 91 P2-1 Error analysis of target trajectory tracking applied for measurement of high speed spindle .. 91 P2-2 Force control and visual measurement in precision assembly system ...... 91 P2-3 A measuring method of coaxiality errors for far apart axis ...... 92 P2-4 Research on an accuracy test method of star sensor based on spatial transform ...... 92 P2-5 Variable frequency big current calibration technique ...... 92 P2-6 The effect of contact pressure on resistance measurement of antistatic material ...... 93 P2-7 Fast measurement of small modulus gears based on machine vision ...... 93 Post 3 Novel Instrument and Measurement System ...... 93 P3-1 Bionic vision improves the performances of super resolution imaging ...... 93 P3-3 Measurement method of the compression coefficient of near-monocrystalline silicon density liquid ...... 94 P3-4 An exchangeable end effector for multi-part-assembly system ...... 94 P3-5 Hough transform based image processing algorithm in the optical-electronic angle measuring device ...... 94 P3-6 A differential giant magnetostrictive mitro-displacement actuator ...... 95 P3-7 Design of active vibration isolation system based on electromagnetic and floatation hybrid support ...... 95 P3-9 Robust concrete crack recongnition based on improved image segmentation and SVM ...... 95 P3-10 Development of portable digital ultrasonic guided wave detector based on COM express .. 96 P3-11 Research on self-calibrating phase shifting shadow Moiré technique ...... 96 P3-12 An online vision system for battery FPC connector defects detection based on ASM template matching method ...... 96 P3-13 Recognition and classification of label-free leukocyte scattering detection in peripheral blood basing on pattern recognition method ...... 97 P3-14 A new method for generating large area & tunable non-diffraction structured light ...... 97 P3-15 Fast response circulating cooling water temperature control system based on Smith predictor ...... 97 P3-16 Research on adaptive segmentation method of embossed character image based on wellner 47 algorithm ...... 98 P3-17 Method for detecting ring gear surface defects of wheel speed sensor based on neural network ...... 98 P3-18 Field test method and standard instruments for verification of traffic speed meters based on test vehicle Lei Du*, Qiao Sun, Jie Bai, Zhe Fan ...... 99 P3-19 Construction of a compact laser wavemeter with controlling laser angular drift ...... 99 P3-21 Calibration of geometric error in passive laser tracker ...... 100 P3-22 Defect detection method for complex surface based on human visual characteristics and feature extracting ...... 100 P3-23 An identification method for casing weld in complex environment ...... 100 P3-24 Architecture of rail and wheelset ndt detecting test rig ...... 100 P3-25 A design of high-accuracy angle measurement system for satellite AIT processing ...... 101 P3-27 Design and performance analysis of a novel thermos-structure for measuring thermal drift of optics in a next generation interferometer ...... 101 P3-28 Long-range automatic precision displacement measuring of winding system using double timing belt transmission ...... 101 Poster 4 Modern Optics and Instruments for Precision Measurement ...... 102 P4-1 Comparison of spacing detection algorithms for optical straight fringes images ...... 102 P4-2 Improved design principle of Dyson concentric infrared imaging spectrometer ...... 102 P4-3 Research of scintillation crystal’s refractive index’s homogeneity based on ellipsometric method ...... 102 P4-4 FPGA-accelerated one-dimensional Fourier reconstruction LCD defect detection algorithm 103 P4-5 Non-destructive rapid inspection methods for sptial light modulator using swept source optical coherence tomography ...... 103 P4-6 Image displacement analysis for electro-optical system for deflection measurement of floating docks ...... 104 P4-7 Modified visible offner imaging spectrometer with low F number and large field of view .... 104 P4-8 Modified short-wave offner imaging spectrometer with low F number and large field of view ...... 104 P4-9 Choice of optimal resolution and array for integrated photosynthetically active radiation spectroradiometer ...... 105 Poster 5 Sensors, Converters, and Control System ...... 105 P5-1 Combining compound eyes and human eye: a hybrid bionic imaging method for FOV extension and foveated vision ...... 105 P5-2 Parameter identification of inertial velocity sensor for low-frequency vibration measurement ...... 105 P5-3 Microfluidic contact lens for continuous non-invasive intraocular pressure monitoring ...... 106 P5-4 Revise compensation to the angle estimate error using multi-groups sensor ...... 106 P5-5 Soil moisture sensor design based on fiber Bragg grating ...... 106 P5-6 Dynamic sensitivity distribution of linear electrostatic sensor matrix ...... 107 P5-7 Bias electric field distribution analysis for a non-contact nano-probe based on tunneling effect ...... 107 P5-8 The meat product quality control by a polarimetric method...... 107 P5-9 Eye positioning based on windowed gray-scale integral projection algorithm ...... 108 P5-10 Using carbon nanotube membrane as counter electrode in voltammetric electronic tongue system ...... 108 P5-11 Autonomous time synchronization method of wireless ad hoc sensor network and its implementation on CC1350 system...... 108 P5-12 Strain transfer characteristics of resistance strain-type transducer ...... 109 P5-13 Dependence of stress distribution in electrical strain gauges on micro-morphology of sensitive grids ...... 109 P5-14 A high resolution and response speed interrogation method for FBGs-based sensors ...... 109 Poster 6 Optoelectronic System and Optical Instruments Design ...... 110 P6-1 Research and evaluation of geometric element data fitting software for coordinate measurement machine ...... 110 48 P6-3 Super-resolution scanning microscopy with virtually structured illumination ...... 110 Poster 7 Laser Measurement Techniques and Instruments ...... 111 P7-1 Orthogonally polarized self-mixing grating interferometer for two-dimensional displacement measurement ...... 111 P7-2 Angle measurement for cross-line target image based on Fourier-polar transform algorithm ...... 111 P7-3 Analysis of modern non-invasive methods of optoelectronic control of the skin ...... 112 P7-4 Sensing the atmosphere of coastal areas of laser detection methods ...... 112 P7-5 Cotton neps on-line measurement based on near-infrared structured light images fusion light images fusion ...... 112 P7-6 Displacement measurement with MEMS based slit sensor ...... 113 P7-8 Study on the temperature characteristics of the triangular prisms ring cavity ...... 113 P7-9 Doppler-shifted laser self-mixing interferometry for enhanced detection sensitivity ...... 113 P7-10 Aerosol particle size distribution retrieval algorithm and error analysis based on multi- wavelength radar ...... 114 P7-11 Comparison and analysis of automatic focusing methods on pure phase objects in digital holographic microscopy ...... 114 P7-12 Research on the key technology of detecting the defects of wheelset tread based on photoelectricity ...... 114 P7-13 Research on laser frequency locking system using orthogonally demodulated pound–drever– hall method ...... 115 P7-14 Non-destructive detection of seed viability based on biospeckle technique ...... 116 P7-15 The structural optimal design and stability improvement of dual-axis optoelectronic level 116 P7-16 The possibility of measuring low altitudes above the sea surface with pulsed laser altimeter under conditions of fog and haze ...... 116 P7-17 Characterization of surface roughness by double blanket model from laser speckle images ...... 116 P7-18 Design, fabrication, identification and test of a closed-loop moving magnetic scanning module for RGB laser projector ...... 117 P7-19 Data processing for Femur Model Laser scanning ...... 117 P7-21 An auto-gain based homodyne laser vibrometer with enhanced adaptability to reflectivity ...... 117 P7-22 A real-time nonlinear error measurement method with picometer accuracy and free from target motion state ...... 118 Poster 8 Instrument and Measurement System Calibration ...... 118 P8-2 Research on high accuracy calibration method of rotary axis of tube parts ...... 118 P8-3 Study on resonant high-acceleration calibration system ...... 118 P8-4 Research of the polarization-optical parameters of a solid-state matrix photomultiplier ..... 119 P8-5 Keysight B1505A power device analyzer output pulse current calibration method ...... 119 P8-6 Characterization of beam splitter using Mueller matrix ellipsometry ...... 119 P8-7 Parameter optimization of measuring and control elements in the monitoring systems of complex technical objects with triple reflector ...... 120 P8-8 Wavelength calibration system for diode laser ...... 120 P8-9 Analysis of the extraction accuracy of the corner point of the camera using polarization imaging ...... 120 P8-10 Directional phase-shift circular arrays targets for out-of-focus camera calibration ...... 121 P8-11 Fabrication and characterization of nanostructure multi-step sample...... 121 P8-12 Study of gPhone gravimeter-119 for gravity variations observation during International Comparison of Absolute Gravimeters 2017 ...... 121 P8-13 A calibration method of micro device reconfigurable assembly system ...... 122 P8-14 Study on the calibration technology of electrostatic field tester ...... 122 P8-15 Characterization of a liquid crystal variable retarder by Mueller matrix ellipsometry ...... 122 P8-16 Parallelism measurement based on rail stack installation ...... 123 P8-17 Self-calibration method of precision shafting angle measurement error based on multiple reading heads ...... 123 49 Poster 10 Micro and Nano Optics ...... 123 P10-1 Optimization algorithm to shape optical beam for laser direct writing ...... 123 Poster 11 Accuracy Theory and Uncertainty Analysis ...... 124 P11-1 A chi-square statistic of arithmetic mean and its application in inter-laboratory comparison ...... 124 P11-2 Decoupling atmosphere Rayleigh-Brillouin scattering spectrum in kinetic regime ...... 124 P11-3 Based on MATLAB: the analysis of key comparison reference value (KCRV) and its uncertainty using Markov chain Monte Carlo (MCMC) method ...... 124 P11-4 An expression method of CMC based on unitary linear regression equastion ...... 125 P11-5 Evaluation of task specific measurement uncertainty for gear measuring instrument using VGMI ...... 125 P11-6 Probe error analysis of articulated arm coordinate measuring machine ...... 125 P11-7 Misjudgment risk estimation for product inspection based on measurement uncertainty . 126 Poster 12 Advanced Measurement Techniques ...... 127 P12-1 A fast global calibration method for T-type 3D four-wheel aligner ...... 127 P12-2 A new method for measuring the geometrical characteristics of crankshaft in-situ ...... 127 P12-3 A research on bolt loosening monitoring based on Lamb wave ...... 127 P12-4 Design and implementation of flexible display reliability testing instrument ...... 128 P12-5 Instruments and equipment monitoring system based on the internet of things technology ...... 128 P12-6 The internal air gap measurement equipment for dynamic pressure motor ...... 128 P12-7 Theoretical analysis and digital simulation of a new capacitive sensor ...... 128 P12-8 Phase measuring method and error compensation in 3D profile measurement ...... 129 P12-9 An underwater detecting system based on photoacoustic effect for underwater ranging and 3D topography measurement ...... 129 P12-10 A compact design of optical scheme for a two-probe absolute surface encoder ...... 129 P12-14 Real-time distance measurement data processing platform based on absolute two- dimensional grating scale ...... 130 P12-15 Design and testing of a compact optical lens module for multi-degree-of freedom grating interferometry application ...... 130 P12-16 Optical fiber Fabry-Perot acoustic sensor based on large PDMS diaphragm ...... 131 P12-18 System design of lithium battery internal resistance measurement using Labview ...... 131 P12-19 Error mapping for rotary axes of machine tools based on pose measurement principle ... 131 P12-20 Probe design of nano coordinate measuring machine based on grating strain sensor ...... 132 P12-21 Improved two dimensional micro-/nanoradian angle generator with single rotation center located on tilting plane and error compensation of capacitive sensors ...... 132 P12-22 Automatic real-time compensation of wavelength of heterodyne interferometer ...... 133 P12-23 Experimental study on non-linear calibration of two-dimensional nano-positioning stage ...... 133 P12-24 Embedded intelligent camera algorithm based on hardware IP ...... 133 P12-25 Synthesis and metrology of cellulose nanocrystal films ...... 134 P12-26 Fabrication process and error detection technologies for injection molding aspheric lens134 P12-27 Review of convolutional neural network optimization and training in image processing .. 135 P12-28 Research on key technologies of quadrupole electromagnetic tweezer ...... 135 P12-29 Extracting road edges from MLS point clouds via a local planar fitting algorithm ...... 136 P12-30 Optimization on metering accuracy of smart electricity meter by temperature compensation ...... 136 P12-31 Research of variable-frequency big current calibration ...... 136 P12-32 Study on FMCW laser ranging technology based on nonlinear error compensation ...... 137 50 Oral Presentation Session 1 Instrumentation Theory and Methodology (1) [8:00-9:50, Aug. 10, Room 1] S1-1 Metrology of shock-induced dynamic response based on ultrafast ellipsometry [Keynote] Hao Jiang*, Zhicheng Zhong, Shiyuan Liu* State Key laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China *Email: [email protected] (H.J.), [email protected] (S. L.) $Q XOWUDIDVW HOOLSVRPHWU\ V\VWHP LV SURSRVHG WR PHDVXUH WKH VKRFNLQGXFHG G\QDPLF UHVSRQVH RI PDWHULDOV 6LQFH WKH XOWUDIDVW PHDVXUHPHQW WHFKQLTXH LV FRPELQHG ZLWK WKH HOOLSVRPHWU\ WKH SURSRVHG V\VWHP FDQ VLPXOWDQHRXVO\ REWDLQ WKH NLQHPDWLF SDUDPHWHUV DQG WKH RSWLFDO FRQVWDQWV RI WKH VKRFNHG PDWHULDOV LQ D VLQJOH PHDVXUHPHQW 7KH XOWUDIDVW HOOLSVRPHWU\ V\VWHP HPSOR\V D SXPSSUREH FRQILJXUDWLRQ$QXOWUDVKRUWDQGKLJKSRZHUODVHUSXOVHSXPSVWKHPDWHULDOVWRJHQHUDWHWKHVKRFNZDYHV ZKLOHDFKLUSHGODVHUSXOVHSUREHVWKHVKRFNHGUHJLRQRIWKHVDPSOH$VSDFHVKLIWHGIUHTXHQF\GRPDLQ LQWHUIHURPHWHU 66)', LVXVHGWRGHWHFWWKHG\QDPLFFKDQJHVLQWKHSKDVHDQGDPSOLWXGHRIWKHUHIOHFWHG SUREH EHDP 7KH G\QDPLF UHVSRQVLYH FKDUDFWHULVWLFV RI VKRFNHG PDWHULDOV FDQ EH REWDLQHG LQ D VLQJOH VKRW:HXVHDWUDQVSDUHQWSRO\FDUERQDWHILOPDVWKHVDPSOHWREHPHDVXUHGDQGEXLOGDGRXEOHOD\HUWKLQ ILOP PRGHO IRU WKH VDPSOH 7KH VLPXODWLRQ UHVXOWV VKRZ WKDW WKH G\QDPLF SDUDPHWHUV RI WKH VKRFNHG SRO\FDUERQDWH FDQ EH H[WUDFWHG ZLWK D UHODWLYHO\ KLJK SUHFLVLRQ ZKLFK LQGLFDWHV WKDW WKH XOWUDIDVW HOOLSVRPHWU\ V\VWHP ZLWK WKH FRUUHVSRQGLQJ PHWKRG LV IHDVLEOH DQG HIIHFWLYH LQ WKH PHWURORJ\ RI WKH VKRFNLQGXFHGG\QDPLFUHVSRQVHRIWKHWUDQVSDUHQWPDWHULDOV S1-2 A brief introduction of nano-indentation and it’s application in small-scale mechanical testing [Invited] Xiaodong Hou* Coventry University, Priory Street, Coventry, West Midlands, CV1 5FB, UK *Email: [email protected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¶V XVLQJ %ULQHOO LQGHQWDWLRQ 7KLVWDONZLOOJLYHDEULHILQWURGXFWLRQRI,,7DQGGLVFXVVWKHSODVWLFLW\VL]HHIIHFWFORVHO\DVVRFLDWHGZLWK QDQRLQGHQWDWLRQWHVWLQJ7KLVWDONZLOODOVRJLYHDQEURDGRYHUYLHZRI,,7EDVHGVPDOOVFDOHPHFKDQLFDO WHVWLQJ DQG SRLQW RXW WKH FKDOOHQJHV LW LPSRVHV RQ WKH FXUUHQWO\ VFLHQWLILF XQGHUVWDQGLQJV DQG WHVWLQJ PHWKRGVWDQGDUGLVDWLRQ S1-3 The measurement technology for precision peg-in-hole assembly [Invited] Xiaodong Wang1,2* Xingyuan Wang2, Tongqun Ren1,2, Yue Wang2, Zhifeng Lou1,2, Yi Luo1,2 1Key Laboratory for Precision and Non-Traditional Machining Technology, Ministry of Education, Dalian University of Technology, Dalian 116024, PR China 2Key Laboratory for Micro/Nano Technology and System of Liaoning Province, Dalian University of Technology, Dalian 116024, PR China *Email: [email protected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ultiple-exposure adaptive selection algorithm for high dynamic range 3D fringe projection measurement [Invited] Haihua Cui*, Zhaojie Li, Xiaosheng Cheng, Wenhe Liao Nanjing University of Aeronautics & Astronautics, College of Mechanical and Electrical Engineering, Nanjing, China 210016 *Email: [email protected] ,Q RUGHU WR FRYHU WKH KLJK G\QDPLF H[SRVXUH UDQJH UHTXLUHPHQW RI KLJK UHIOHFWLYH VXUIDFH WKH SDSHU GHYHORSV D SKDVH VKLIWLQJ ' PHDVXUHPHQW PHWKRG EDVHG RQ PXOWLSOHH[SRVXUH DGDSWLYH VHOHFWLRQ DOJRULWKP$WILUVWWKHFDPHUDUHVSRQVHFXUYHIXQFWLRQLVFDOLEUDWHGE\WKHVHTXHQFHVLPDJHVFRYHUHGWKH KLJKHVWDQGORZHVWLQWHQVLW\YDOXHRIWKHSKDVHVKLIWLQJIULQJH7KHLQWHQVLW\YDOXHRIWKHVDPSOHGSL[HOV RI GLIIHUHQW H[SRVXUH WLPH DUH XVHG WR FRPSXWHG WKHQRQOLQHDU FXUYH IXQFWLRQ ZKLFK VKRZV WKH LPDJH LQWHQVLW\YDOXHDQGH[SRVXUHYDOXHWKHQWKHLUUDGLDQFHYDOXHRIFDSWXUHGLPDJHLVFDOLEUDWHGEDVHGRQWKH OLQHDUUHODWLRQEHWZHHQWKHH[SRVXUHWLPHDQGYDOXH7KHUHODWLYHLUUDGLDQFHYDOXHRIDOOWKHLPDJHSL[HOV LV FRPSXWHG ZLWK WKH FDPHUD UHVSRQVH FXUYH IXQFWLRQ $QG WKHQ WKH DGDSWLYH VHOHFWLRQ DOJRULWKP IRU H[SRVXUHWLPHLVSURSRVHGEDVHGRQWKHGRXEOHWKUHVKROGSULQFLSOH7KHFDSWXUHGLPDJHSL[HOLQWHQVLW\ YDOXHLVQ¶WH[FHHGLQJWKHKLJKHVWYDOXH9DQGWKHORZHVWYDOXH9XVHGIRUSKDVHVKLIWLQJPHDVXUHPHQW $WODVWGLIIHUHQWH[SRVXUHWLPHQRGHLVVHOHFWHGDGDSWLYHO\7KHVHTXHQFHVLPDJHVZLWKPXOWLH[SRVXUH WLPHDUHIXVHG,QRUGHUWRHYDOXDWHWKHSHUIRUPDQFHRIWKLVPHWKRGVRPHW\SLFDOPHWDOSDUWVDQGEODGH ZLWKKLJKUDQJHRIUHIOHFWLYLW\VXUIDFHVDUHXVHGIRU'PHDVXUHPHQWDQGFRQVWUXFWLRQH[SHULPHQW7KH H[SHULPHQWUHVXOWVYHULI\WKHIHDVLELOLW\RIWKHSURSRVHGPHWKRG S1-5 Design and testing of a chromatic dispersion system for displacement application by using a spatial-bandpass-filter Jiao Bai1,2, Xiaohao Wanga, Xinghui Li1*, Qian Zhou1, Kai Ni1 1Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen, 518055, China 2Institute of Materials, China Academy of Engineering Physics, Mianyang, 621907, China *Email: [email protected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ȝP8QGHUVXFKDFRQGLWLRQWKHPHDVXUHPHQWHUURULVQRODUJHUWKDQȝPRYHUDȝP PHDVXUHPHQWUDQJH 52 S1-6 Establishment of the measuring coordinate system for large gears by gauge block Shao-Kang Li, Zhong-Peng Zheng, Lin-Yan Wang* Xi'an Technological University, China *Email: [email protected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ȝP DQG ȝP UHVSHFWLYHO\ ZKLFKFDQPHHWWKHUHTXLUHPHQWRIWKHPHGLXPSUHFLVLRQODUJHJHDUPHDVXUHPHQW S1-7 Control circuit design of magnetic suspension stylus measuring instrument Jianfei Zhou, Suping Chang*, Chunbing Hu, Zhongyu Zhang, Hao Wu, Zhongyu Zhang School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China *Email: [email protected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ession 2 Measurement for Precision and Ultra-Precision Machining [8:00-9:50, Aug. 10, 2018, Room 2] S2-1 Development of a parallel micro-CMM with high-precision contact scanning probe [Keynote] Chih-Liang Chu*, Hung-Chi Chen Dept. of Mechanical Engineering, Southern Taiwan University of Science and Technology, Tainan, Taiwan, China *Email: [email protected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rȝP S2-2 A new non-contact coordinate measuring machine equipped with light-duty 53 optical probe based on fringe projection profilometry [Invited] Huijie Zhao, Mingyi Xing, Hongzhi Jiang*, Yang Xu, Xiaochun Diao, Chenghao Liu School of Instrumentation Science and Opto-electronics Engineering, Beihang University, Key Laboratory of Precision Opto-mechatronics Technology, Ministry of Education, No.37 Xueyuan Road, Haidian District, Beijing, 100191, China. *Email: [email protected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recision PGC demodulation for homodyne interferometer modulated with a combined sinusoidal and triangular signal [Invited] Liping Yan, Zhouqiang Chen, Benyong Chen*, Jiandong Xie, Shihua Zhang, Yingtian Lou, Enzheng Zhang Zhejiang Sci-Tech University, China *Email: [email protected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based pain level measurement and assessment using machine learning Mingxin Yu, Lianqing Zhu*, Mingli Dong, Guangkai Sun, Hong Li, Yanlin He Beijing Engineering Research Center of Optoelectronic Information Science and Instruments, School of Instrument Science and Optoelectronic Engineering, Beijing Information Science and Technology University, Beijing, 100016, China *Email: [email protected] 3DLQ LV D FRPSOH[ KXPDQ H[SHULHQFH DQG D V\PSWRP QXPHURXV PHGLFDO FRQGLWLRQV ZLWK DQDWRPLF SK\VLRORJLF SV\FKRVRFLDO DQG FXOWXUDO GHWHUPLQDQWV &OLQLFLDQV GHSHQG RQ SDWLHQWV¶ VHOIUHSRUWHG LQIRUPDWLRQDVZHOODVDVVHVVPHQWVRIPXOWLSOHFOLQLFDOFXHV$OWKRXJKSDLQLVFRQVLGHUHGDQLPSRUWDQW IDFWRULQSDWLHQWFDUHIHZPHWKRGVDUHDYDLODEOHIRUREMHFWLYHPHDVXUHPHQWDQGDVVHVVPHQWRISDLQ,Q SUDFWLFHVHWWLQJVWKHPRVWFRPPRQPHDVXUHVDYDLODEOHIRUSDLQDVVHVVPHQWDUHYHUEDOUDWLQJVFDOHVYLVXDO DQDORJ VFDOHV DQG QXPHULF UDWLQJ VFDOHV +RZHYHU WKHVHV VHOIUHSRUWLQJ PHDVXUHV ZKLFK FRPH IURP SDWLHQWV¶ LQGLYLGXDO DVVHVVPHQWV VXIIHU IURP KLJK YDULDELOLW\ &RQVHTXHQWO\ REMHFWLYH PHDVXUHPHQW RI SDLQ KDV ORQJ EHHQ FOLQLFLDQV¶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method for GMA internal magnetic field measurement based on temperature compensation Jiamin Chen1, Hui Zhou2, Yuxuan Tang1, Lei Wang1* 1Ultra-precision Optoelectronic Instrument Engineering Center, Harbin Institute of Technology, Harbin, 150001, China 2National Instruments, 58# Haiqu Road, Pudong New Area, Shanghai, 200120, China *Email: [email protected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î7FDQEH DFKLHYHGRYHUDUDQJHRIP7DQGWKHUHSHDWDELOLW\RIRYHUDOOPHDVXUHPHQWLV7KHUHIRUHWKH SURSRVHGPHWKRGFDQEHXVHGWRPHDVXUHWKHLQWHUQDOPDJQHWLFILHOGRI*0$HIIHFWLYHO\DQGUHOLDEO\ S2-6 Precise measurement of large roll angle using digital speckle pattern interferometry Jing Yang1, Sijin Wu1*,Weixian Li1, Lianxiang Yang2, Ji Liu3 1School of Instrumentation Science and Opto-electronics Engineering, Beijing Information Science and Technology University, Beijing 100192, China 2Department of Mechanical Engineering, Oakland University, Rochester, Michigan 48309, USA 3School of Information and Communications, North University of China, Taiyuan, Shanxi 030051, China *Email: [email protected] 5HFHQWO\ D QRQFRRSHUDWLYH PHWKRG RI UROO DQJOH PHDVXUHPHQW XVLQJ GLJLWDO VSHFNOH SDWWHUQ LQWHUIHURPHWU\ '63, LVLQWURGXFHG0HFKDQLVPZDVGHGXFHGDQGWKHPDWKHPDWLFPRGHORIUROODQJOH PHDVXUHPHQW ZDV HVWDEOLVKHG 7KH QRYHO PHWKRG DOVR HQMR\V VRPH RWKHU DGYDQWDJHV VXFK DV KLJK DFFXUDF\ VWDQGRII QRQFRQWDFW DQG IXOOILHOG PHDVXUHPHQW +RZHYHU WKLV PHWKRG LV RQO\ XVHG IRU SUHFLVHPHDVXUHPHQWRIYHU\VPDOOUROODQJOHZKLFKLVXSWRDIHZPLOOLUDGLDQVGXHWRWKHOLPLWDWLRQRI '63,¶VPHDVXULQJUDQJH,QWKLVDUWLFOHDPHDQVRIUDQJHHQODUJHPHQWIRU'63,UROODQJOHPHDVXUHPHQW LVLQWURGXFHG:LWKWKLVPHDQVODUJHUROODQJOHFDQEHGLYLGHGLQWRDQXPEHURIVPDOODQJOHVZKLFKDUH PHDVXUHGLQVHTXHQFH7KHUHIRUHWKHODUJHDQJOHLVWKHQGHWHUPLQHGE\FDOFXODWLQJWKHVXPRIWKHVHVPDOO DQJOHV 7KH SURSRVHG PHWKRG RI UROO DQJOH LV FKDUDFWHUL]HG E\ KLJKUHVROXWLRQ DQG ODUJHUDQJH PHDVXUHPHQW S2-7 Research on multi-degree-of-freedom and high-precision touch screen characteristic test instrument Meng Su*, Linyi Huang, Huawei Xu China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China *Email: [email protected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ession 3 Novel Instrument and Measurement System (1) [8:00-9:50, Aug. 10, 2018, Room 3] S3-1 Development of optic-electronic autocollimators for monitoring the angular displacements of large objects [Keynote] Igor A. Konyakhin* ITMO University, Department Optic-electronics Devices and Systems, 49 Kronverksky Pr., St. Petersburg, 197101 Russia *Email: [email protected] :D\VRILPSURYLQJDXWRFROOLPDWRUVIRUPRQLWRULQJDQJXODUGLVSODFHPHQWVDUHDQDO\]HG7KHUHVXOWVRIDQ DQDO\VLV RI FRQWURO HOHPHQWV EDVHG RQ WHWUDKHGUDO UHIOHFWRUV ZLWK IODW DQG FRQH UHIOHFWLQJ VLGHV DUH SUHVHQWHG7KHWHFKQLFDOFKDUDFWHULVWLFVRIH[SHULPHQWDOPRGHOVRIFRQWUROHOHPHQWVDUHSUHVHQWHG7KH IHDWXUHVRIWHWUDKHGUDOUHIOHFWRUDVWKHFRQWUROHOHPHQWVIRUWKUHHD[LVDXWRFROOLPDWRUVDUHGLVFXVVHG S3-2 Research on statistical measurement method of the standard particles through airborne particle counter based on FESEM [Invited] Zhiliang Gao1*, Qizheng Ji1, Jian Chen2, Xunbiao Zhang3, Weihong Zhang1, Junge Tan1 Chenyan Wang2 1Beijing Orient Institute for Measurement & Test, Beijing 100086 2Suzhou Sujing Automation Equipment Corporation, Suzhou 215122 3Shanghai Indoor Contamination Control Industry Association, Shanghai 20000 *Email: [email protected] 7KHWUDFHDELOLW\RIFOHDQQHVVSDUDPHWHUKDVUHFHLYHGKLJKDWWHQWLRQIURPWKHPHWURORJ\LQGXVWU\RIOLJKW VFDWWHULQJDLUERUQHSDUWLFOHFRXQWHU%DVHGRQWKHPHWURORJ\PHWKRGRIWKHELJSDUWLFOHFRQFHQWUDWLRQDQG WKH WUDFHDELOLW\ PHWKRG RI DLUERUQH SDUWLFOH FRXQWHU¶V FRXQWLQJ SHUIRUPDQFH RQ VPDOO SDUWLFOH VL]H E\ VWDWLVWLFDO DQDO\VLV WKLV SDSHU WULHV WR EXLOG D FRRUGLQDWH V\VWHP RI WKH SDUWLFOH GLVWULEXWLRQ RQ $$2 $QRGLF$OXPLQXP2[LGH PHPEUDQHWKURXJKWKHSDUWLFOHFRXQWHUFKRRVHWKHVWDWLVWLFDOVDPSOHIURPWKH FRRUGLQDWH V\VWHP E\ DHURG\QDPLFV REVHUYH WKH SDUWLFOHV RQ PHPEUDQH E\ )(6(0 )LHOG (PLVVLRQ 6FDQQLQJ(OHFWURQ0LFURVFRSH HYDOXDWHWKHXQFHUWDLQW\RIPHDVXUHPHQWRQVWDQGDUGSDUWLFOHVWDWLVWLFV XVLQJWKHIRUPXODRIWKHWRWDOSDUWLFOHVQXPEHURQPHPEUDQHDQDO\]HWKHPHDVXUHPHQWXQFHUWDLQW\UDQJH DQGWKHNH\DIIHFWLQJIDFWRUVDQGSXWIRUZDUGDPHWKRGRILPSURYLQJVWDQGDUGSDUWLFOHVWDWLVWLFVDFFXUDF\ LQWHVWSURFHVVFRQWURO7KHWHVWUHVXOWVSURYHWKDWWKHPHWKRGKDVYDOXHRQLPSURYHPHQWRIWKHWKHRU\RI WKHFOHDQQHVVWUDFHDELOLW\V\VWHPEDVHGRQ)(6(0DQGVWDWLVWLFDODQDO\VLV S3-3 Precision assessment of high-speed railway slab intelligent inspection system [Invited] Shichao Li1, Tonggang Zhang1, 2*, Cheng Chen1, Jiong An1 1Faculty of Geosciences and Environmental Engineering, Southwest Jiaotong University, Chengdu 610031, China 2State-province Joint Engineering Laboratory of Spatial Information, Technology for High-Speed Railway Safety, Chengdu 610031, China *Email: [email protected] :LWKWKHUDSLGGHYHORSPHQWRIKLJKVSHHGUDLOZD\WKHUHDUHPDQ\SUREOHPVZLWKWKHWUDGLWLRQDOUDLOZD\ VODEDVVHVVPHQWPHWKRG7KHWUDGLWLRQDOPHWKRGLVVORZDQGLWVSUHFLVLRQLVOLPLWHGE\WKHSUHFLVLRQRI VSHFLILHGWRROVIRUUDLOZD\VODELQVSHFWLRQ6FKRODUVKDYHGHYHORSHGDYDULHW\RILQVSHFWLRQV\VWHPVIRU UDLOZD\VODEJHRPHWU\6LQFHWKRVHV\VWHPV¶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bsolute distance measurement using synthetic wavelength interferometry of optical frequency combs [Invited] Guanhao Wu*, Lei Liao State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China *Email: [email protected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ingle-shot capturing based on polarizing coupled interferometry for phase measurement of cells Lu Zhang1, Chunhui Zhao1*, Yingzhe Tu1, He Yang1, Chunwei Zhang1, Lele Luo1, Li Yuan2 1School of Mechanical Engineering, Xian Jiaotong University, Xian, Shannxi 710049, China 2First Affiliated Hospital, Xian Jiaotong University, Xian, Shannxi 710049, China *Email: [email protected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ȝP SRO\VW\UHQHEHDGVZLWKGLDPHWHUȝPDQGFOLQLFDOEORRGFHOOVZLWKGLDPHWHUDERXWȝPDUHH[DPLQHG UHVSHFWLYHO\E\RXUH[SHULPHQWDOV\VWHP7KHUHVXOWVDIWHUWKH+LOEHUWWUDQVIRUPVKRZWKDWWKHSKDVHRID FRYHUVOLS LV UHFRYHUHG FOHDUO\ ZKLFK SURYH WKDW WKLV PHWKRG LV H[SHFWHG WR SURYLGH DQ DGYDQWDJHRXV DSSURDFKIRUODEHOIUHHSKDVHGHWHFWLRQRIFOLQLFDOFHOOVLQDG\QDPLFHQYLURQPHQW S3-6 A novel miniaturized capacitive absolute angular position sensor based on time- grating with reflective structure Hewen Wang1, a, Kai Peng2, b, Xiaokang Liu2, c*, Zhicheng Yu1, d, Hongji Pu3, e 1School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China. 2Engineering Research Center of Mechanical Testing Technology and Equipment (Ministry of Education), Chongqing University of Technology, Chongqing 400054, China. 3State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China. *Email: [email protected], [email protected], [email protected], [email protected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rcc PHDVXUHPHQWDFFXUDF\RYHUDQHQWLUH FLUFXPIHUHQFH0RUHRYHUWKHURWRULVZLUHOHVVRZLQJWRWKHUHIOHFWLYHVWUXFWXUHZKLFKKDVDZLGHUUDQJH RIDSSOLFDWLRQVLQHQJLQHHULQJ S3-7 Study on the angular measuring accuracy of the rotary station with varying load Jia Hou1,2*, Zi Xue2, Yao Huang2, Shuliang Ye1, Yuling Gu2 1China Jiliang University, Hangzhou, Zhejiang, China, 310018 2National Institute of Metrology, China, No.18, Bei San Huan Dong Lu, Beijing, P.R. China 100013 *Email: [email protected] 7KHYDU\LQJORDGPD\OHDGWRYDU\LQJGHIRUPDWLRQRIWKHEHDULQJV\VWHPRIWKHURWDU\VWDWLRQ7KLVSDSHU SUHVHQWVWKHLQIOXHQFHPHFKDQLVPRIEHDULQJV\VWHPGHIRUPDWLRQRQDQJXODUPHDVXULQJGHYLDWLRQ7KH DWWDFKPHQW HUURU GXH WR HFFHQWULFLW\ DQG LQFOLQDWLRQ RI WKH JUDGXDWLRQ WR WKH EHDULQJ ZDV DQDO\]HG LQ QXPHULFDO VLPXODWLRQ 7KH VW DQG QG RUGHU )RXULHU FRPSRQHQWV RI WKH DQJXODU GHYLDWLRQ FXUYHV ZHUH REWDLQHG DW WKH DWWDFKPHQW FRQGLWLRQ RI HFFHQWULFLW\ DQG LQFOLQDWLRQ VHSDUDWHO\ $ VHULDO RI FURVV FDOLEUDWLRQH[SHULPHQWVRIDQDLUEHDULQJURWDU\VWDWLRQZLWKYDU\LQJORDGZHUHFDUULHGRXW7KHPD[LPXP GLIIHUHQFHVREWDLQHGEHWZHHQWKHUHVXOWVRIWKHH[SHULPHQWVZHUH¶¶7KHVHGLIIHUHQFHVZHUHDQDO\]HG DVZHOO Session 4 Novel Instrument and Measurement System (2) [8:00-9:50, Aug. 10, 2018, Room 4] S4-1 Advanced optical metrology using mode-locked lasers [Keynote] Seung-Woo Kim* Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Science Town, Daejeon 34141, South Korea *Email: [email protected] 3UHFLVLRQLVDFRPPRQDVSHFWWKDWJRYHUQVPRVWRIWRGD\¶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nfrared lens refractive index measurement using confocal tomography [Invited] Weiqian Zhao*, Lirong Qiu, Yun Wang Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China *Email: [email protected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î LQ WKH ZDYHOHQJWK RI QP ,5&5,0 SURYLGHV D QRYHO DSSURDFK IRU WKH KLJK SUHFLVLRQQRQFRQWDFWDQGFRQYHQLHQWPHDVXUHPHQWRIWKHUHIUDFWLYHLQGH[RIDQ,5OHQV S4-3 Method for high-precision distance estimation and dispersion mismatch compensation in frequency scanning interferometry [Invited] Hao Pan*, Xinghua Qu, Fumin Zhang State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, Tianjin 300072, China *Email: [email protected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ell traction force measurement in a large field of view based on the Moire fringe method Fan Zhang1,2*, Lianqing Zhu1,2 1Beijing Laboratory for Biomedical Detection technology and Instrument, Beijing Information Science & Technology University, China 2Beijing Key Lab of Optoelectronic Measurement Technology, Beijing Information Science & Technology University, China *Email: [email protected] 7KLVSDSHUUHSRUWVPHDVXULQJFRQWUDFWLOLW\RIQHRQDWDOUDWYHQWULFXODUP\RF\WHV 1590 XVLQJDQRYHO FHOOIRUFHVHQVRUQDPHO\DGRXEOHVLGHGPLFURSLOODUDUUD\ '0$ GHYHORSHGIRUERWKVLQJOHFHOOIRUFH PHDVXUHPHQWVXVLQJFRQYHQWLRQDOPLFURVFRS\DVZHOODVKLJKWKURXJKSXWFHOOIRUFHPDSSLQJEDVHGRQWKH RSWLFDO PRLUp HIIHFW 7KH FRQWUDFWLRQ IRUFH PDS RI 1590 FXOWXUHG RQ '0$ ZDV DFTXLUHG ZLWK QDQRQHZWRQDQGVXEPLFURQVFDOHUHVROXWLRQXVLQJFRQIRFDOPLFURVFRS\)RUWKHPRLUpEDVHGPHWKRGWKH ORFDODYHUDJHRIWKHFHOOFRQWUDFWLRQIRUFHZDVGHULYHGIURPWKHPRLUpSDWWHUQZKLFKDOORZVPDSSLQJFHOO FRQWUDFWLRQ IRUFH XVLQJ D ; REMHFWLYH OHQV HQDEOLQJ WKH DFTXLVLWLRQ RI D ODUJHU ILHOGRIYLHZ WKDQ FRQYHQWLRQDOPLFURVFRS\ S4-5 Modified short-wave offner imaging spectrometer with low F number and large field of view 59 Qian Zhou1, Peng Yan1, Xinghui Li1*, Kai Ni1, Xiaohao Wang1,2,3 1Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen, 518055, China 2Research Institute of Tsinghua University in Shenzhen, Shenzhen, 518057, China [email protected] *Email: [email protected] '\VRQDQGRIIQHUDUHWZRW\SLFDOFRQFHQWULFLPDJLQJVSHFWURPHWHUFRQILJXUDWLRQZLWKGXDOWHOHFHQWULFLW\ LQ REMHFW DQG LPDJH VSDFHD VPDOO ) QXPEHU ORZ VPLOH DQG NH\VWRQH HWF ,Q VRPH FRQGLWLRQ VXFK DV 2FHDQFRORUUHPRWHVHQVLQJWKHLPDJLQJVSHFWURPHWHUVUHTXLUHVPDOO)QXPEHUWRREWDLQKLJKHUOXPLQRXV IOX[ +RZHYHU ZKHQ ) QXPEHU LV VPDOO RIID[LV DEHUUDWLRQ EHFRPHV ODUJHU ,Q VKRUWZDYH LQIUDUHG ZDYHEDQGWKHVSHFWUDOUHVSRQVHEDQGRIWKHVHOHFWHGYLVLEOHGHWHFWRULVaȝPZLWKîSL[HO QXPEHUVDQGîȝPSL[HOVL]H:KHQ)QXPEHULVZHVHOHFWIXVHGVLOLFDDVPDWHULDORIWKHSODQR FRQYH[ OHQV DQG XVH WUDGLWLRQDO WZRZDYHOHQJWK DVWLJPDWLVP PHWKRG WR GHVLJQ WKH YLVLEOH LPDJLQJ VSHFWURPHWHUEDVHGRQ'\VRQFRQILJXUDWLRQ,QUHVXOWLQJ'\VRQVSHFWURVFRSLFLPDJLQJV\VWHPWKHSODQR FRQYH[KDVDWKLFNQHVVRI PP S4-6 Torque standard machine for calibration of reference torque wrench and torque transducer at NIM Feng Meng*, Zhimin Zhang, Dianlong Zhang National institute of metrology, Beijing, P.R.China *Email: [email protected] 7KHSDSHUGHVFULEHVDQHZWRUTXHVWDQGDUGPDFKLQHDW1,07KHQHZUHIHUHQFHWRUTXHVWDQGDUGPDFKLQH LV GHVLJQHG WR FDOLEUDWH WKH UHIHUHQFH WRUTXH ZUHQFK DQG WRUTXH WUDQVGXFHU 7KH UHODWLYH H[SDQGHG XQFHUWDLQW\RIWKLVWRUTXHVWDQGDUGIURP1PWR1PLVEHWWHUWKDQî N 7KHFDOLEUDWLRQ H[SHULPHQWRIWKUHHNLQGVRIUHIHUHQFHWRUTXHZUHQFKHVE\WKHQHZUHIHUHQFHWRUTXHVWDQGDUGPDFKLQHLV GHVFULEHGLQWKHSDSHU S4-7 Dual-comb generation from a dual-ring hybrid mode-locked fiber laser Ruitao Yang1,2*, Hao Sun1, Jiahao Guo1, Haijin Fu1, Hongxing Yang1, Pengcheng Hu1, Zhigang Fan2, Jiubin Tan1 1Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China 2Postdoctoral Research Station of Optical Engineering, Harbin Institute of Technology, Harbin 150080, China *Email: [email protected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ession 5 Modern Optics and Instruments for Precision Measurement (1) [10:25-12:00, Aug. 10, 2018, Room 1] S5-1 Removal of opaque coolant barrier for in-process form profile optical 60 measurement [Keynote] Y. Gao*, J. Zhu, R. Li, F. Xie Department of Mechanical and Aerospace Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China *Email: [email protected], [email protected], [email protected], [email protected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ȝPHYHQXQGHUD PDVVLYHDPRXQWRIFRRODQWZKHUHWKHFRRODQWWKLFNQHVVLVPP7KLVPHDQVDUHODWLYHXQFHUWDLQW\RIV LVXSWRDQGWKHZRUNSLHFHVXUIDFHLVGHHSO\LPPHUVHGLQWKHRSDTXHFRRODQW S5-2 Process optimization: internal feature measurement for additive-manufacturing parts using X-ray computed tomography [Invited] Dawei Xu1*, Fang Cheng1, Yu Zhou1, Natalaray Thaddie1, Peixian Lim1, Liping Zhao2 1Advanced Remanufacturing and Technology Centre, Agency for Science, Technology and Research (A*STAR), 3 CleanTech Loop, CleanTech Two, #01/01, Singapore 637143; 2National Metrology Centre, Agency for Science, Technology and Research (A*STAR), 1 Science Park Drive, Singapore 118221 *Email: [email protected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ptical fiber sensing techniques and its applications [Invited] Lianqing Zhu* Beijing Information Science and Technology University Email: [email protected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evelopment of chromatic dispersion lens for chromatic confocal microscopy Kun Zhang1, Qing Yu1*, Changcai Cui2, Shiwei Fu1, Fang Cheng1, Ming Chang1, Ruilan Zhou1 1College of Mechanical Engineering and Automation, Huaqiao University, Xiamen, 361021, China 2Institute of Manufacturing Technology, Huaqiao University, Xiamen, 361021, China *Email: [email protected] &KURPDWLFFRQIRFDOPLFURVFRS\ &&0 KDVEHHQZLGHO\DSSOLHGLQLQGXVWU\PHGLFLQHDQGRWKHUUHVHDUFK 61 ILHOGV &RPSDUHG WR WUDGLWLRQDO ODVHU VFDQQLQJ FRQIRFDO PLFURVFRS\ /6&0 &&0 IRFXVHV RQ WKH UHODWLRQVKLSEHWZHHQGLVSODFHPHQWDORQJWKHRSWLFDOD[LVDQGZDYHOHQJWKRIOLJKWVRXUFH7KXVWKHRSWLFDO HOHPHQWRID[LDOFKURPDWLFGLVSHUVLRQLVWKHNH\GHYLFHLQ&&08QIRUWXQDWHO\WKHUHODWLRQVKLSRIWKH D[LDOFKURPDWLFGLVSHUVLRQYHUVXVWKHZDYHOHQJWKLVQRWOLQHDUDQGWKHFKURPDWLFGLVSHUVLRQUDQJHLVIL[HG LQ JHQHUDOO\ ,Q WKLV SDSHU D QRYHO FKURPDWLF GLVSHUVLRQ OHQV ZKLFK LV QDPHG WXEH OHQV 7/ ZDV GHVLJQHGWRVROYHWKHSUREOHPVPHQWLRQHGDERYH7KHIXQFWLRQRI7/ZDVWRJHQHUDWHDODUJHDQGOLQHDU FKURPDWLF GLVSHUVLRQ DORQJ WKH RSWLFDO D[LV DQG D UHSODFHDEOH REMHFWLYH ZDV DGGHG WR FRQWURO WKH FKURPDWLFGLVSHUVLRQUDQJH%RWKWKHVLPXODWLRQDQGWKHH[SHULPHQWUHVXOWVLQGLFDWHGWKDWWKHFKURPDWLF GLVSHUVLRQUDQJHPRGXODWHGE\7/DQGUHSODFHDEOHREMHFWLYHZDVYDULDEOH DQGWKHPRVWLPSRUWDQWWKLQJ ZDVWKHQRQOLQHDULWLHVRIWKHVHFKURPDWLFGLVSHUVLRQVZHUHDOPRVWDOOEHWWHUWKDQZKLFKZDVKLJKO\ OLQHDU7KXVWKHGHVLJQHG7/FRXOGEHILWWRYHUVDWLOHPHDVXULQJGHPDQGV S5-5 Evaluation of the diffraction correction during the 10th International Comparison of Absolute gravimeters (ICAG 2017) Qiyu Wang, Jinyang Feng, Shanliang Liu, Duowu Su, Chunjian Li, Shuqing Wu* National Institute of Metrology, Beijing, 100029, China *Email: [email protected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esign of optical accelerometer using four-quadrant photodetector Ying–Jun Lei1, Rui–Jun Li1*, Qi Li1, Lian–Sheng Zhang1, Kuang–Chao Fan1,2 1School of Instrument Science and Opto–electronics Engineering, Hefei University of Technology, Hefei, China 2School of Mechanical Engineering, Dalian University of Technology, Dalian, China *Email: [email protected] /RZIUHTXHQF\YLEUDWLRQLVDKDUPIXOIDFWRUWKDWDIIHFWVWKHDFFXUDF\RIPLFURQDQRPHDVXULQJPDFKLQHV /RZIUHTXHQF\YLEUDWLRQFDQQRWEHFRPSOHWHO\HOLPLQDWHGE\SDVVLYHFRQWUROPHWKRGVVXFKDVWKHXVHRI DLUIORDWLQJ SODWIRUPV 7KHUHIRUH ORZIUHTXHQF\ YLEUDWLRQ PXVW EH PHDVXUHG EHIRUH EHLQJ VXSSUHVVHG DFWLYHO\,QWKLVVWXG\WKHGHVLJQRIDORZFRVWKLJKVHQVLWLYLW\RSWLFDODFFHOHURPHWHULVSURSRVHG7KLV RSWLFDODFFHOHURPHWHUPDLQO\FRPSULVHVWKUHHFRPSRQHQWV DVHLVPLFPDVVDOHDIVSULQJDQGDVHQVLQJ FRPSRQHQW EDVHG RQ D IRXUTXDGUDQW SKRWRGHWHFWRU 43' :KHQ D YLEUDWLRQ LV GHWHFWHG WKH VHLVPLF PDVVPRYHVXSDQGGRZQGXHWRWKHHIIHFWRILQHUWLDDQGWKHOHDIVSULQJH[KLELWVDFRUUHVSRQGLQJHODVWLF GHIRUPDWLRQ ZKLFK LV DPSOLILHG E\ XVLQJ DQ RSWLFDO OHYHU DQG PHDVXUHG E\ WKH 43' 7KHQ WKH DFFHOHUDWLRQ FDQ EH FDOFXODWHG 7KH UHVRQDQW IUHTXHQFLHV DQG HODVWLF FRHIILFLHQWV RI YDULRXV VHLVPLF VWUXFWXUHVDUHVLPXODWHGWR DWWDLQWKHRSWLPDOGHWHFWLRQ RIORZIUHTXHQF\ ORZDPSOLWXGHYLEUDWLRQ7KH DFFHOHURPHWHU LV FDOLEUDWHG XVLQJ D KRPHPDGH YLEUDWLRQ FDOLEUDWLRQ V\VWHP DQG WKH FDOLEUDWLRQ H[SHULPHQWDOUHVXOWVGHPRQVWUDWHWKDWWKHVHQVLWLYLW\RIWKHRSWLFDODFFHOHURPHWHULV 9 PāVí WKH PHDVXUHPHQWUDQJHRIWKHDFFHOHURPHWHULV aPāVíDQGWKHRSHUDWLQJIUHTXHQFLHVUDQJHIURP +] WR +] 7KH HIILFDF\ RI WKH RSWLFDO DFFHOHURPHWHU LQ PHDVXULQJ ORZIUHTXHQF\ ORZDPSOLWXGH G\QDPLFUHVSRQVHVLVYHULILHG Session 6 Sensors, Actuators and Application (1) [10:25-12:00, Aug. 10, 2018, Room 2] S6-1 Recent research advance in EMI shielding transparent conductors [Keynote] Zhengang Lu, Jiubin Tan*, Heyan Wang, Limin Ma, Yeshu Liu, Xi Lu, Jinxuan Cao, Shen Lin Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin Institute of Technology, Harbin 150080, China 62 *Email: [email protected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esearch and application of a novel randomly encoded hybrid grating interferometric wavefront sensor [Invited] Yongying Yang1*, Rui Zhang1, Zijian Liang1, Pin Cao2 1State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China 2Hangzhou Zernike Optical Technology Co., Ltd, Hangzhou 311112, China *Email: [email protected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ielectric micro-sphere measurement using whispering gallery mode resonances [Invited] Masaki Michihata* Research Center for Advanced Science and Technology, the University of Tokyo *Email: [email protected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icro-LED optical engine with biologically inspired artificial compound eyes for pico-projection display [Invited] Heng Zhao*, Dengxin Hua, Jun Wang, Qing Yan School of Mechanical and Precision Instrument Engineering of Xi'an University of Technology, 5 South Jinhua Road, Xi'an, Shaanxi, PR China *Email: [email protected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nalysis of contracting characteristics on aerostatic bearing stylus displacement sensor Hao Wu, Suping Chang*, Chunbing Hu, Jianfei Zhou, Zhongyu Zhang School of Mechanical Science and Engineering, Huazhong University of Science and Technology,Wuhan 430074; *Email: [email protected] ,QWKLVSDSHUWKHG\QDPLFDQGVWDWLFFRQWDFWFKDUDFWHULVWLFVRIWKHDHURVWDWLFEHDULQJVW\OXVGLVSODFHPHQW VHQVRU DUH DQDO\]HG LQFOXGLQJ VWDWLF FRQWDFW GDPDJH DQG G\QDPLF UHVSRQVH 7KH G\QDPLF UHVSRQVH DW IUHTXHQF\DQGGLIIHUHQWVSHHGVLVVWXGLHGDQGREWDLQHGWKHUHODWLRQVKLSEHWZHHQWKHPHDVXUHGIRUFHDQG IUHTXHQF\DQGYHORFLW\7KHVW\OXVGRHVQRWFRQWDFWZHOOIURPWKHVXUIDFHZKHQWKHPHDVXULQJIRUFHLV OHVVWKDQ,QWKLVFDVHWKHWUDFHDELOLW\RIWKHWLSFDQEHDQDO\]HGEDVHGRQWKHFKDUDFWHULVWLFVRIWKH DPSOLWXGH )LQDOO\ WKH H[SHULPHQWDO YHULILFDWLRQ RI WKH UHOHYDQW WKHRU\ LV REWDLQHG E\ PHDVXULQJ WKH DOXPLQXPWXUQLQJVDPSOHDWGLIIHUHQWVSHHGV S6-6 Complicated intermittent scratches detection research on surface of optical components based on adaptive sector scanning algorithm cascading mean variance threshold algorithm Fanyi Wang1, Pin Cao2 , Yongying Yang1*, Rongzhi Liu1, Fan Wu1, Pengfei Zhang1, Jiabin Jiang1, Huiting Chai1, Yihui Zhang1, Yubin Du1, Guohua Feng1, Xiang Xiao1, Yanwei Li1 1State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China 2Hangzhou Zernike Optical Technology Co., Ltd., Hangzhou 311112, China *Email: [email protected] ,QLQHUWLDOFRQILQHPHQWIXVLRQV\VWHPWKHLQWHUPLWWHQWVFUDWFKHVRQWKHSROLVKHGVXUIDFHRIVLQJOHVLGHG SROLVKHGDQGERWWRPVXUIDFHIURVWHGRSWLFDOFRPSRQHQWVDUHFRPSOH[DQGLW¶VRIJUHDWGLIILFXOW\WRH[WUDFW WKHPFRPSOHWHO\,QRUGHUWRVROYHWKLVSUREOHPHVWDEOLVKHGLQWKHOLJKWILHOGVXUIDFHGHWHFWLRQV\VWHP WKLVSDSHUEULQJVIRUZDUGDQRYHOLQWHUPLWWHQWVFUDWFKGHWHFWLRQPHWKRGEDVHGRQDGDSWLYHVHFWRUVFDQQLQJ DOJRULWKP $6& FDVFDGLQJ PHDQ YDULDQFH WKUHVKROG DOJRULWKP 097+ ,Q WKH SUHSURFHVVLQJ VWHS GLYLGLQJ WKH RULJLQDO LPDJH LQWR VXELPDJHV ZLWK D QXPEHU RI LQWHJHU PXOWLSOH RI FRUHV VR DV WR IXOO\ FRPSUHVVLPDJHSURFHVVLQJWLPHXWLOL]LQJSDUDOOHOSURFHVVLQJXVLQJPHDQILOWHUWREDODQFHEDFNJURXQG DQG WKHQ REWDLQLQJ ELQDU\ VXELPDJHV XWLOL]LQJ PRUSKRORJ\ DQG WKUHVKROG RSHUDWLRQV ILQDOO\ XWLOL]LQJ 64 7ZRSDVV DOJRULWKP WR ODEHO WKH FRQQHFWHG GRPDLQV RI ELQDU\ VXELPDJHV ,Q WKH GHWHFWLRQ VWHS FRQVLGHULQJ WKH FRPSOH[LW\ RI WKH SDWWHUQ RI LQWHUPLWWHQW VFUDWFKHV $6& LV ILUVW XVHG IRU URXWLQH LQWHUPLWWHQW VFUDWFKHV VWLWFKLQJ DQG WKHQ VXSSOHPHQWHG E\ 097+ ,Q WKH YHULILFDWLRQ VWHS LQ RUGHU WR SURYHWKDWWKHGHWHFWHGLQWHUPLWWHQWVFUDWFKHVVDWLVI\WKHFULWHULDIRUVFUDWFKHVLQKXPDQH\HVWKHPHWKRG RIVXSSRUWYHFWRUPDFKLQH 690 SDWWHUQUHFRJQLWLRQLVXWLOL]HGWRFRPSDUHWKHGHWHFWHGUHVXOWVZLWKWKH FRQWLQXRXVVFUDWFKVDPSOHVGHWHFWHGE\KXPDQH\HV7KLVDOJRULWKPKDVKLJKGHJUHHRISDUDOOHOLVPKLJK VSHHG DQG VWURQJ UREXVWQHVV 7KH H[SHULPHQWDO UHVXOWV LOOXVWUDWH WKDW WKH FRPSOHWH H[WUDFWLRQ UDWH RI LQWHUPLWWHQWVFUDWFKHVLV WKHDYHUDJHSURFHVVLQJWLPHRIVLQJOHLPDJHLVPHUHO\ VHFRQGDQG WKHDFFXUDF\UDWHRIGHWHFWLRQLVXSWR E\690YHULILFDWLRQ Session 7 Micro and Nano Metrology, Macro Metrology [10:25-12:00, Aug. 10, 2018, Room 3] S7-1 Ultrasonic array for NDT using total focusing method imaging algorithm [Keynote] Jie Zhang* Ultrasonics and NDT group, Department of Mechanical Engineering, University of Bristol, Bristol, UK *Email: [email protected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easurement and sensing for graphene and 2D materials by microwave resonance [Invited] Ling Hao* National Physical Laboratory, Hampton Rd., Teddington TW11 0LW, UK *Email: [email protected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ovel double-FBARs-on-beam for PZT micro-accelerometer [Invited] Lu Wang, Dejiang Lu, Libo Zhao, Zhuangde Jiang State Key Laboratory for Manufacturing Systems Engineering, International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Collaborative Innovation Center of Suzhou Nano Science and Technology, School of Mechanical Engineering, Xi an Jiaotong University, Xi an 710049, China *Email: [email protected], [email protected], [email protected], [email protected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ǻI VHQVLWLYH FKDUDFWHULVWLFFXUYHRIWKH)%$5DFFHOHURPHWHULVILWWHGWKURXJKWKHVLPXODWLRQGDWD)LQDOO\WKH0(06 SUHSDUDWLRQSURFHVVRIWKHGRXEOH)%$5RQEHDPPLFURDFFHOHURPHWHULVSUHVHQWHG S7-4 Applications of wavefront modulation devices in aspheric and freeform measurement [Invited] Qun Hao, Yan Ning, Yao Hu* Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China *Email: [email protected], [email protected], [email protected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ʌDWQP ZDYHOHQJWKDQGKDVDOLQHDUL]HGSKDVHGLVWULEXWLRQ,WFRLQFLGHVZHOOZLWKWKHDYHUDJHPRGXODWLRQFXUYH RIIHUHGLQWKHPDQXDORIWKHGHYLFH7KLVSDSHUSURYLGHVDVLPSOHDQGDFFXUDWHPHWKRGIRUSL[HOZLVH SKDVHPRGXODWLRQFKDUDFWHULVWLFVFDOLEUDWLRQ S7-5 A measurement method for probe microsphere of micro-CMM with double SPMs 66 Chuan-Zhi Fang1,2, Qiang-Xian Huang1*, Meng Mi1, Chao-Qun Wang1, Li-Juan Chen1, Lian-Sheng Zhang1 1School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, 230009, China 2Anhui Institute of Information Technology, Wuhu, 241000, China *Email: [email protected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nvestigation on the dynamic characteristics of CG-6 relative gravimeter for the micro-gravity network gravimeter for the micro-gravity network Shan-Liang Liu, Jin-Yang Feng, Qi-Yu Wang, Duo-Wu Su, Chun-Jian Li, Shu-Qing Wu* National Institute of Metrology, Beijing 100029, China *Email: [email protected] &*LVDQHZJHQHUDWLRQRIIXOODXWRPDWLFUHODWLYHJUDYLPHWHUSURGXFHGE\6FLQWUH[&RPSDQ\&DQDGD ,WFDQEHXVHGWRPHDVXUHWKHYHUWLFDOJUDYLW\JUDGLHQWDFFXUDWHO\7KLVSDSHUPDLQO\DGGUHVVHVG\QDPLF SUHFLVLRQDQDO\VLVRIWKHYHUWLFDOJUDYLW\JUDGLHQWPHDVXUHPHQWEDVHGRQ&*JUDYLPHWHU:HDQDO\]H WKHUHSHDWDELOLW\DQGFRQVLVWHQF\RIVHYHUDO&*JUDYLPHWHUVLQG\QDPLFWHVW7KHVWDWLFDQGG\QDPLF H[SHULPHQWDOGDWDEDVHGRQWKHIRXUQXPEHURI&*JUDYLPHWHUVVKRZWKDWWKHG\QDPLFSUHFLVLRQRIWKLV LQVWUXPHQWLVEHWWHUWKDQȝ*DOāK7KHVWDWLF]HURGULIWUDWHVDUHDOOOHVVWKDQȝ*DOāK2QHRIWKH&* JUDYLPHWHUV KDV EHHQ XVHG WR PRQLWRU WKH 1,0 1DWLRQDO ,QVWLWXWHRI0HWURORJ\&KLQD ORFDOJUDYLW\ QHWZRUN HVSHFLDOO\ LQ PRQLWRULQJ WKH YHUWLFDO JUDYLW\ JUDGLHQW :H VKRXOG FRQVLGHU WKH HYDOXDWLRQ RI G\QDPLFSHUIRUPDQFHRI&*JUDYLPHWHUVDQG Session 8 Laser Measurement Techniques and Instruments (1) [10:25-12:00, Aug. 10, 2018, Room 4] S8-1 Weyl degeneracies in topological metamaterials [Keynote] Shuang Zhang* School of Physics and Astronomy, University of Birmingham, Birmingham B15 2TT, United Kingdom *Email: [email protected] 0HWDPDWHULDOV KDYH DWWUDFWHG WUHPHQGRXV DWWHQWLRQ GXH WR WKHLU H[RWLF RSWLFDO SURSHUWLHV DQG IXQFWLRQDOLWLHVWKDWDUHQRWDWWDLQDEOHIURPQDWXUDOO\RFFXUULQJPDWHULDOV,QSDUWLFXODUPHWDPDWHULDOVFDQ EH GHVLJQHG WR LQWURGXFH VWURQJ VSLQRUELW FRXSOLQJ IRU OLJKW DQG FRQVHTXHQWO\ QRQWULYLDO WRSRORJLFDO SURSHUWLHV,QWKLVWDON ,ZLOOVWDUWZLWKDEULHILQWURGXFWLRQWRWKHFRQFHSWVRI%HUU\FXUYDWXUH&KHUQ QXPEHU :H\O GHJHQHUDFLHV DQG WRSRORJLFDO SKRWRQLFV , ZLOO VKRZ WKDW FRPELQDWLRQ RI FKLUDOLW\ DQG K\SHUEROLFLW\ ±± DQ H[WUHPH IRUP RI DQLVRWURS\ FDQ UHVXOW LQ QRQWULYLDO WRSRORJLFDO RUGHUV LQ PHWDPDWHULDOV DQG FRQVHTXHQWO\ WRSRORJLFDOO\ SURWHFWHG SKRWRQLF VXUIDFH VWDWHV WKDW DUH LPPXQH IURP VFDWWHULQJE\GHIHFWVDQGVKDUSHGJHV7KH:H\OSRLQWVLQVXFKV\VWHPVUHVXOWIURPWKHFURVVLQJEHWZHHQ WKH EXON ORQJLWXGLQDO SODVPRQ PRGH DQG WKH WUDQVYHUVH FLUFXODUO\ SRODUL]HG SURSDJDWLQJ PRGHV 7KH SKRWRQLFµ)HUPLDUFV¶ZHUHGLUHFWO\REVHUYHGLQWKHPLFURZDYHUHJLPH S8-2 The advance of laser precision measurement instrumentation in the Academy of Opto-Electronics, Chinese Academy of Sciences [Invited] Weihu Zhou*, Dabao Lao, Fengdeng Dong, Rongyi Ji, Jingguo Zhu 67 Laser measurement department, Academy of Opto-Electronics, Chinese Academy of Sciences, 9 Dengzhuang South Road, Haidian District, Beijing 100094, China *Email: [email protected] 7KHUHVHDUFKDQGGHYHORSPHQWDGYDQFHRIODVHUSUHFLVLRQPHDVXUHPHQWLQVWUXPHQWVLQWKHDFDGHP\RI 2SWR(OHFWURQLFV &KLQHVH $FDGHP\ RI 6FLHQFHV LV SUHVHQWHG 7KH LQVWUXPHQWV PDLQO\ LQFOXGH IHPWRVHFRQG ODVHU WUDFNHU GLVWDQFH UDQJHU EDVHG RQ IHPWRVHFRQG RSWLFDO FRPE PXOWLUHDGLQJ KHDG SUHFLVLRQ JRQLRPHWHU '2) ODVHU WUDFNHU DXWRPDWLF DOLJQPHQW V\VWHP IRU UDLO LQVSHFWLRQ /LGDU HWF 6RPHNH\WHFKQRORJLHVZLOOEHDGGUHVVHGDQGVROXWLRQVZLOOEHSURSRVHG S8-3 Energy analysis method of the laser tracing measurement optical system [Invited] Hongfang Chen1*, Liang Tang1, Huixu Song1, Bo Yu1, Zhaoyao Shi1 Beijing University of Technology *Email: [email protected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ll-fiber Fabry-Perot interference structure: key technology and its applications Wen Zhang1,2, Lianqing Zhu1,2*, Mingli Dong1,2* 1Beijing Engineering Research Center of Optoelectronic Information and Instruments, Beijing Information Science and Technology University, Beijing 100016, People’s Republic of China 2Beijing Laboratory of Optical Fiber Sensing and System, Beijing Information Science and Technology University, Beijing 100016, People’s Republic of China *Email: [email protected], [email protected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evelopment of hybrid measuring system for the complex micro-arrayed surface Tong Guo*, Zhenshan Sun, Jinping Chen, Xing Fu, Xiaotang Hu State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China *Email: [email protected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¶V PHDVXUHPHQW UHVXOWV RQ D VWHS VWUXFWXUH WKH YHUWLFDOVFDQQLQJZKLWHOLJKWLQWHUIHUHQFHVKRZVJRRGPHDVXULQJIXQFWLRQ7KHPLFURDUUD\HGVWUXFWXUH¶V VXUIDFHZDVPHDVXUHGE\ZKLWHOLJKWYHUWLFDOVFDQQLQJLQWKHVDPHFRRUGLQDWHV\VWHPWKHYHUWH[RIWKH PLFURDUUD\ FHOO VWUXFWXUH LV VFDQQHG ZLWK $)0 7KLV H[SHULPHQW YHULILHV WKH FRPSOH[ PHDVXUHPHQW IXQFWLRQRIWKHV\VWHPRQWKHFRPSOH[VXUIDFHZLWKPLFURDUUD\HGVWUXFWXUHV S8-6 Kinematics identification and measurement accuracy verification of articulated arm coordinate measuring machines Sen Wang1, Guanbin Gao1*, Jun Zhao1, Wen Wang2 1Faculty of Mechannical and Electrical Engineering, Kunming University of Science and Technology, Kunming 650500, China 2School of Mechanical Engineering, Hangzhou Dianzi Univerisity, Hangzhou 310018, China *Email: [email protected] 7KH $UWLFXODWHG $UP &RRUGLQDWH 0HDVXULQJ 0DFKLQH $$&00 LV D NLQG RI FRRUGLQDWH PHDVXULQJ GHYLFH LQ WKH IRUP RI DQ DUWLFXODWHG URERW 7R LPSURYH WKH DFFXUDF\ RI $$&00 D NLQHPDWLF LGHQWLILFDWLRQ PHWKRG LV SUHVHQWHG LQ WKLV SDSHU )LUVWO\ ZH SHUIRUP WKH NLQHPDWLFV PRGHOLQJ DQG VLPXODWLRQWRUHDOL]HWKHNLQHPDWLFWUDQVIRUPDWLRQIURPWKHMRLQWVSDFHWRWKHFRRUGLQDWHVSDFH7KHQZH HVWDEOLVK DQ HUURU PRGHO DQG XVH OHDVW VTXDUHV PHWKRG WR LGHQWLI\ NLQHPDWLF SDUDPHWHUV $QG WKH HIIHFWLYHQHVVRIWKHOHDVWVTXDUHVPHWKRGIRUNLQHPDWLFSDUDPHWHULGHQWLILFDWLRQLVVWXGLHG)LQDOO\WKH H[SHULPHQWVRIVLQJOHSRLQWUHSHDWDELOLW\DFFXUDF\DQGWKHVWDQGDUGJDXJHDFFXUDF\DUHSHUIRUPHG7KH H[SHULPHQWDOUHVXOWVVKRZWKDWSURSRVHGWKHNLQHPDWLFLGHQWLILFDWLRQPHWKRGFDQHIIHFWLYHO\LPSURYHWKH PHDVXUHPHQWDFFXUDF\RIWKHMRLQWFRRUGLQDWHPHDVXULQJPDFKLQH Session 9 Instrumentation Theory and Methodology (2) [13:30-15:05, Aug. 10, 2018, Room 1] S9-1 Displacement laser interferometry with sub-nm or deep sub-nm accuracy [Keynote] Pengcheng Hu1,2, Haijin Fu1, Hongxing Yang1, Ruitao Yang1, Jiubin Tan1* 1D-403 Science Park, Harbin Institute of Technology, 2 Yikuang Street, Harbin 150080, China [email protected] *Email: [email protected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î 6HFRQGO\ ZH KDYH EXLOW KHWHURG\QH LQWHUIHURPHWHUV ZLWK VSDWLDOO\ VHSDUDWHG EHDPV LQ ZKLFK WKH SHULRGLF QRQOLQHDULW\ HUURU LV XQGHU VHYHUDO WHQV RI SLFRPHWHU /DVWO\ GLIIHUHQW SKDVH HYDOXDWH PHWKRGV KDYH EHHQ VWXGLHG DQG 69 RSWLPL]HGWRDFKLHYHSKDVHUHVROXWLRQDVKLJKDVVHYHUDOSLFRPHWHU S9-2 All-optical difference engine for in-process defect inspection for roll-to-roll printed electronics [Invited] Xiaobing Feng1*, Rong Su1, Tuomas Happonen2, Jian Liu3, Richard Leach1 1Manufacturing Metrology Team, Faculty of Engineering, University of Nottingham, Nottingham NG8 1BB, UK 2VTT Technical Research Centre of Finland, P.O. Box 1100, 90571 Oulu, Finland 3Centre of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, 92 West Da-Zhi Street, Harbin, 150001, China *Email: [email protected] 7KHLQFUHDVLQJFDSDELOLWLHVRIUROOWRUROO 55 SULQWLQJSURFHVVHVSUHVHQWFKDOOHQJHVIRUTXDOLW\FRQWURO UHTXLULQJLQSURFHVVLQVSHFWLRQRIODUJHVXEVWUDWHVZLWKKLJKUHVROXWLRQDWKLJKVSHHG,QWKLVSDSHUDQDOO RSWLFDOGLIIHUHQFHHQJLQH $2'( VHQVRUKDVEHHQGHYHORSHGIRULQSURFHVVGHIHFWLQVSHFWLRQIRU55 SULQWHG HOHFWURQLFV 7KH $2'( VHQVRU DFKLHYHV KLJKVSHHG LQVSHFWLRQ E\ XWLOLVLQJ WKH SULQFLSOH RI FRKHUHQW RSWLFDO VXEWUDFWLRQ WR PLQLPLVH GDWD SURFHVVLQJ 7KH FDSDELOLW\ RI WKH GHYHORSHG VHQVRU LV GHPRQVWUDWHGXVLQJLQGXVWULDOSULQWHGHOHFWULFDOFLUFXLW\VDPSOHVDQGWKHVHQVRULVFDSDEOHRILQVSHFWLQJ DUHDVRIPPZLGWKZLWKDUHVROXWLRQRIWKHRUGHURIVHYHUDOPLFURPHWUHV S9-3 Development of auto defect inspection system for cell phone silicone rubber gasket [Invited] Chao-Ching Ho*, Jhih-Jia Lu, Po-Chieh Li Graduate Institute of Manufacturing Technology and Department of Mechanical Engineering, National Taipei University of Technology, Taipei 10608, Taiwan, China *Email: [email protected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easurement on deionized water density based on single silicon sphere Jintao Wang1*, Jinyue Zhang2, Kai Wei1, Lin Tong1, Xuesong Bao1 1National Institute of Metrology, Beijing 100029 2China Jiliang University, Zhe Jiang, Hangzhou 310018 *Email: [email protected] 'XHWRJRRGVWDELOLW\GHLRQL]HGZDWHULVXVXDOO\XVHGDVUHIHUHQFHPDWHULDOIRUOLTXLGRUVROLGGHQVLW\ PHDVXUHPHQW ,W LV YHU\ LPSRUWDQW WR GHWHUPLQH WKH GHQVLW\ RI GHLRQL]HG ZDWHU XQGHU GLIIHUHQW WHPSHUDWXUH7KHPRVWFRPPRQPHWKRGLVE\XVLQJILWWLQJIRUPXODVXFKDV7DQDND(TXDWLRQ+RZHYHU DOPRVWDOOWKHILWWLQJIRUPXODLVIRUSXUHZDWHURU602:,WLVQHFHVVDU\WRFDUU\RXW UHVHDUFKRQWKH VXLWDELOLW\RIWKHVHIRUPXODVIRUGHLRQL]HGZDWHU+\GURZHLJKLQJPHWKRGLVXVHGWRPHDVXUHWKHGHQVLW\ RIGHLRQL]HGZDWHUZKLFKLVEDVHGRQ$UFKLPHGHV¶VSULQFLSOH2QH PPVLQJOHVLOLFRQVSKHUHLVXVHGDV VROLG GHQVLW\ UHIHUHQFH DQG WKH VSKHUH GHQVLW\ LV GHWHUPLQHG E\ ;5) PHWKRG DQG KLJKDFFXUDF\ FRPSDUDWRU S9-5 A novel signal process system for angular displacement sensor of time-grating Wei Wang1, Zhaoyao Shi1, Donglin Peng2* 70 1College of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing, China 2College Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing, China *Email: [email protected] 7KHDQJXODUGLVSODFHPHQWVHQVRUEDVHGRQWLPHJUDWLQJLVDQRYHONLQGRIGLVSODFHPHQWVHQVRUEXWWKHUH LVDOLPLWDWLRQLQVRPHDSSOLFDWLRQVZLWKKDUVKHQYLURQPHQWRZLQJWRH[WUDFWLQJDQJXODULQIRUPDWLRQXVHV WKHDQDORJSKDVHGHWHFWRU7RUHGXFHWKHHUURUFRPHVIURPVROXWLRQDQGLPSURYHWKHVWDWLFVWDELOLW\RI VHQVRUDQRYHOVLJQDOSURFHVVV\VWHPLVSUHVHQWHG,QFRPSDULVRQWRWKHWUDGLWLRQDOPHWKRGXVLQJDQDORJ HOHFWULFDO WHFKQRORJ\ WR REWDLQ DQJXODU GLVSODFHPHQW WKH SURSRVHG PHWKRG XVHV WKH $OO SKDVH )DVW )RXULHUWUDQVIRUP $3))7 WKDWKDVDSHUIHFWSHUIRUPDQFHRQVXSSUHVVLQJWKHVSHFWUXPOHDNDJHDQGWKH SURSHUW\RISKDVHLQYDULDQWWRREWDLQWKHSKDVHDQJOH,QWKHSDSHUZHGHVLJQWKHFRUHV\VWHPIRUGDWD VDPSOLQJDQGSURFHVVLQJ)LUVWO\LWXWLOL]HV$3))7WRWUDQVIRUPWKHVHQVLQJVLJQDOIURPWLPHGRPDLQWR IUHTXHQF\GRPDLQ LQDGGLWLRQWKHDQJOHLVFDOFXODWHGLQWKHSKDVHVSHFWUXP)LQDOO\WKHH[SHULPHQWDO SODWIRUPLVGHVLJQHGWRYHULI\WKHSHUIRUPDQFHRIWKHSURSRVHGWHFKQLTXH7KHHUURURIWKHQRYHOPHWKRG LV FRPSDUHG WR WKDW RI WKH WUDGLWLRQDO PHWKRG LW FDQ EH FRQFOXGHG WKDW WKH SURSRVHG PHWKRG LV YHU\ HIIHFWLYHLQVXSSUHVVLQJQRLVHDQGHQKDQFHVWKHVWDELOLW\LQDVWDWLFFRQGLWLRQ S9-6 Design and simulation of a 2-DOF parallel linear precision platform utilizing piezoelectric impact drive mechanism utilizing piezoelectric impact drive mechanism Chengliang Pan*, Ting Zhang, Tianliang Dai, Liling Han, Haojie Xia, Liandong Yu School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, Anhui 230009, China *Email: [email protected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ession 10 Instrument and Measurement System Calibration (1) [13:30-15:05, Aug. 10, 2018, Room 2] S10-1 Dealing with systematic effects in measurement uncertainty calculations [Keynote] Michael P. Krystek* Physikalisch-Technische Bundesanstalt *Email: [email protected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dvanced measurement of super-smooth surface [Invited] Sen Han1,2* 1College of Optical-Electrical and Computer Engineering University of Shanghai for Science and Technology, Shanghai 200093, China 2Suzhou H&L Instruments LLC, Suzhou 215123, China *Email: [email protected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ual-comb ranging [Invited] Guanhao Wu*, Lijiang Zeng State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China *Email: [email protected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he optical-electronic autoreflection sensor for angular deformations measurement Igor A. Konyakhin*, Aiganym M. Sakhariyanova** ITMO University, Department of Optical-Electronic Devices and Systems, 49 Kronverksky pr., St. Petersburg, Russian Federation, 197101 *Email: [email protected], [email protected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n-line optical fiber Mach-Zehnder sensor fabricated by CO2 laser and its applications Hong Li, Lianqing Zhu*, Fanyong Meng, Mingli Dong* 1Beijing Engineering Research Center of Optoelectronic Information and Instrument, Beijing Key Laboratory of Optoelectronic Measurement Technology, Beijing Laboratory of Optical Fiber Sensing and System, Beijing Information Science & Technology University, Beijing, 100016, China 72 *Email: [email protected], [email protected] 7KH0DFK±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novel earth's gravity method for accelerometer calibration Shengyang Zhou1, Chenguang Cai2, Ying Wang1*, Zhihua Liu2, Ming Yang1 1Beijing University of Chemical Technology, Beijing, China, 100029 2National Institute of Metrology, Beijing, China, 100029 *Email: [email protected] $GYDQFHG ORZ IUHTXHQF\ YLEUDWLRQ FDOLEUDWLRQ LV LPSHUDWLYH UHTXLUHG DV WKH ZLGH DSSOLFDWLRQV RI ORZ IUHTXHQF\ DFFHOHURPHWHUV /RZ IUHTXHQF\ FDOLEUDWLRQ LV FRPPRQO\ UHDOL]HG E\ WKH (DUWK¶V JUDYLW\ PHWKRG RU WKH ODVHU LQWHUIHURPHWU\ +RZHYHU DIIHFWHG E\ WKH OLPLWHG VWURNH RI WKH VWDQGDUG YLEUDWLRQ VKDNHU WKH FDOLEUDWLRQ SUHFLVLRQ RI ODVHU LQWHUIHURPHWU\ DW YHU\ ORZ IUHTXHQF\ LV XVXDOO\ QRW LGHDO $OWKRXJKWKH(DUWK¶VJUDYLW\PHWKRGFDQDYRLGWKLVORZFDOLEUDWLRQSUHFLVLRQDWYHU\ORZIUHTXHQF\LWV FDOLEUDWLRQIUHTXHQF\XVXDOO\ +]GXHWRWKHLQIOXHQFHRIURWDWRUFHQWULSHWDODFFHOHUDWLRQ,QWKLVSDSHU WKH(DUWK¶VJUDYLW\PHWKRGPHQWLRQHGLQ,62LVLPSURYHGE\XVLQJDQHIIHFWLYHLPDJHIHDWXUH GHWHFWLRQPHWKRG7KLVPHWKRGGHWHFWVWKHDQJHOEHWZHHQ(DUWK¶VJUDYLW\ILHOGGLUHFWLRQDQGDFFHOHUDWLRQ VHQVLWLYLW\D[LVGLUHFWLRQWRLPSURYHWKH(DUWK¶VJUDYLW\VWDWLFFDOLEUDWLRQDFFXUDF\ Session 11 Signal Processing and Image Processing [13:30-15:05, Aug. 10, 2018, Room 3] S11-1 Ultraprecision 3D non-contact probing for measurement of micro-structure with high aspect ratio [Keynote] Junning Cui*, Xingyuan Bian, Yesheng Lu, Shaokai Wang Center of Ultra-precision Optoelectronic Instrument, Harbin Institute of Technology *Email: [email protected] ,QRUGHUWRPDNHXOWUDSUHFLVLRQGLPHQVLRQDODQGSURILOHPHDVXUHPHQWRIVPDOOVWUXFWXUHVZLWKKLJKDVSHFW UDWLRSRVVLEOHD'SURELQJPHWKRGEDVHGRQVSKHULFDOFDSDFLWLYHHIIHFWLVSURSRVHGIRU'QRQFRQWDFW SURELQJZLWKQDQRPHWHUUHVROXWLRQ$VSKHULFDOFDSDFLWLYHSUREHZLWKLGHQWLFDOVHQVLQJFKDUDFWHULVWLFLQ DQ\ DUELWUDU\ VSDWLDO GLUHFWLRQ LV XVHG WR FRQYHUW WKH PLFUR JDS EHWZHHQ WKH SODWH DQG WKH SDUW EHLQJ PHDVXUHG LQWR D FDSDFLWLYH VLJQDO 0RVW RI WKH HOHFWULF OLQHV RI IRUFH RI WKH VSKHULFDO FDSDFLWLYH SODWH FRQFHQWUDWHZLWKLQDVPDOOUHJLRQEHWZHHQWKHSODWHDQGWKHSDUWEHLQJPHDVXUHGVRWKDWWKHSURSHUWLHVRI 'QRQFRQWDFWSURELQJLVRWURS\FKDUDFWHULVWLFVDSSUR[LPDWHSRLQWVHQVLQJDQGPHDVXUDELOLW\RIVPDOO VWUXFWXUHVZLWKODUJHDVSHFWUDWLRDUHHIIHFWLYHO\FRPELQHGLQWKHSURSRVHGSURELQJPHWKRG([SHULPHQWDO UHVXOWV LQGLFDWH WKDW ZLWK D PP VSKHULFDO SURELQJ KHDG DQG D VW\OXV ZLWK DVSHFW UDWLR RI WKH SURELQJV\VWHPKDVDPHDVXUHPHQWUDQJHRIȝPDQGDUHVROXWLRQEHWWHUWKDQQP:LWKQRQOLQHDULW\ FRUUHFWHGLWVUHVLGXDOQRQOLQHDUHUURULVOHVVWKDQQPLQWKHIXOOPHDVXUHPHQWUDQJH$VHULHVRISUREHV KDV EHHQ IDEULFDWHG DQG WHVWHG DQG WKH UHVXOWV VKRZ WKDW WKH UHVROXWLRQ RI WKH SURELQJ V\VWHP KDV WKH SRWHQWLDOWRUHDFKVXEQDQRPHWHURUGHU 73 S11-2 A measuring method of spindle rotation error using circular grating and self- collimator [Invited] Xiupeng Hao*, Kuang-Chao Fan, Xiaodong Wang Dalian University of Technology, China *Email: [email protected], [email protected], [email protected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curve segment method based on fixed dynamic programming and cycled optimization techniques [Invited] Xiao-Qia Yin, Wei Tao*, Hui Zhao Department of Instrument Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China *Email: [email protected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fast infrared thermal imaging detection method based on spatial correlation [Invited] Libing Bai1, Xue Chen1, Yuhua Cheng1, Lulu Tian1, Bin Liu2, Haichao Yu1* 1School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China 2College of Information and Communication Engineering, Harbin Engineering University, Harbin 150001, China *Email: [email protected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he method of solving the accurate displacement rule with acceleration signal Jiawei Ding1, Jiandong Ma2, Yunliang Qin2, Jing Fan2, Bo Fang1*, Jiacheng Hu1 74 1China Jiliang Universty, HangZhou, ZheJiang, China, 310018 2Chang Qing Oil Field Branch Company, Technical monitoring center, Xi'an, ShanXi, China, 710021 *Email: [email protected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high precision edge detection method for the blurred image in motion measurement Ying Zhang1*, Chenguang Cai1, Zhihua Liu1, Ming Yang2 1National Institute of Metrology, Beijing, China, 100029 2Beijing University of Chemical Technology, Beijing, China, 100029 *Email: [email protected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ession 12 Sensors, Actuators and Application (2) [13:30-15:05, Aug. 10, 2018, Room 4] S12-1 Ultrasound detection and imaging using microring resonators and laser generated focused ultrasound [Keynote] Taehwa Lee, Cheng Zhang, Qiaochu Li, L. Jay Guo Department of Electrical Engineering and Computer Science, the University of Michigan, Ann Arbor, MI 48109, USA *Email: [email protected] 2SWLFDOGHWHFWLRQRIXOWUDVRXQGLVEDVHGRQWKHLQWHUDFWLRQRIVWUDLQILHOGDQGRSWLFDOILHOGLQDQRSWLFDO UHVRQDWRU IRU VHQVLWLYH GHWHFWLRQ 6SHFLDO RSWLFDO WUDQVPLWWHUV JHQHUDWH DQG IRFXV XOWUDVRXQG WDUJHWLQJ KLJKDPSOLWXGHIRFXVHGXOWUDVRXQGIRULPDJLQJDQGWKHUDSHXWLFDSSOLFDWLRQV S12-2 Cold atom interferometry gravimeter [Invited] Lingxiao Zhu, Shuhua Yan, Aiai Jia, Chunhua Wei, Qixue Li, Xu Zhang, Jun Yang* National University of Defense Technology, Changsha, Hunan, 410073, P. R. China *Email: [email protected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stablishment of standard device for high rotational speed generation [Invited] Qiao Sun*, Jie Bai, Lei Du, Zhe Fan, Hongbo Hu National Institute of Metrology, 18 BeiSanHuanDongLu, Beijing, China 100029 *Email: [email protected], [email protected], [email protected], [email protected], [email protected] 7KH KLJK URWDWLRQDO VSHHG VWDQGDUG GHYLFH EDVHG RQ EUXVKOHVV '& FRUHOHVV PLFUR PRWRU DQG )3*$ WHFKQRORJ\IRUKLJKDFFXUDF\URWDWLRQDOVSHHGFRQWUROZDVLQYHVWLJDWHGDQGHVWDEOLVKHGZLWKUHVROXWLRQRI UPLQLQWKHPHDVXUHPHQWUDQJHRIUPLQWRUPLQ7KHH[SDQGHGFDOLEUDWLRQXQFHUWDLQW\ RI WKLV VWDQGDUG GHYLFH LV î N 7KH VWUXFWXUH RI WKH GHYLFH DQG NH\ WHFKQRORJ\ LQYROYHG ZHUH GHVFULEHG κ 7KH GXDO FORVHGORRS FRQWURO VROXWLRQ ZDV H[SODLQHG 7KH FDOLEUDWLRQ UHVXOWV ZHUH SURYLGHGκ7KLVKLJKURWDWLRQDOVSHHGVWDQGDUGGHYLFHLVXVHGDVDQLPSRUWDQWZRUNLQJVWDQGDUGIRUWKH IHDVLEOHWUDFHDELOLW\RIKLJKSUHFLVLRQRSWLFDOWDFKRPHWHUVDQGURWDWLRQDOVSHHGPHDVXULQJLQVWUXPHQWVDW PHDVXUHPHQWUDQJHDERYHUPLQ S12-4 A novel two-dimensional inductive sensor based on planar coils Liang Wu*, Shi Xu, Yangyang Wang, Rui Zhang, Yang Liu Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing University of Technology, Chongqing 400054, China *Email: [email protected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u PPDQGWKHPD[LPXPOLQHDULW\LQ RQHSLWFKLV7KHSHUIRUPDQFHRIVHQVRUPD\EHLPSURYHGE\RSWLPL]LQJWKHOD\RXWRISULPDU\ VHFRQGDU\ZLQGLQJVDQGVLJQDOSURFHVVLQJFLUFXLW S12-5 A domain adaptation deep transfer method for image classification Yu Chen, Chunling Yang*, Yan Zhang*, Yuze Li School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, Heilongjiang, 150001, China *Email: [email protected], [email protected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icro Coordinate Measurement Machine (μCMM) using voice coil actuator with interferometric position feedback Liang Yu1,2*, Gabor Molnar1, Sebastian Bütefisch1, Christian Werner1, Rudolf Meeß1, Hans-Ulrich Danzebrink1, Jens Flügge1 1Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany 2Institute of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080 *Email: [email protected] 4XDQWLWDWLYH GHWHUPLQDWLRQ RI GLPHQVLRQDO SURSHUWLHV OLNH OHQJWK GLDPHWHU KHLJKW HWF LV HVVHQWLDO LQ UHVHDUFKGHYHORSPHQWDQGLQSURGXFWLRQSURFHVVFRQWURO7RPHHWWKHVHUHTXLUHPHQWVWKHZLGHO\XVHG DSSURDFKLVWKHFRRUGLQDWHPHDVXUHPHQWWHFKQLTXH7KHHTXLSPHQWVWKHFRRUGLQDWHPHDVXULQJPDFKLQHV &00V ±XVLQJWKHPHQWLRQHGWHFKQLTXHFRYHUDZLGHPHDVXUHPHQWUDQJHIURP PHWUHWRQDQRPHWUH %HORZDQHZO\GHYHORSHGHTXLSPHQWIRUWKHPLFURVFDOHLVSUHVHQWHG7KHV\VWHP±WKHPLFURFRRUGLQDWH PHDVXULQJPDFKLQHV ȝ&00 FRQVLVWVRIDSURELQJV\VWHPYRLFHFRLOEDVHGDFWXDWRUVDQGDQLQWHJUDWHG LQWHUIHURPHWULF PHDVXUHPHQW V\VWHP 7KH NH\ FRPSRQHQW LQ DGGLWLRQ WR WKH SURELQJ V\VWHP ±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ession 13 Laser Measurement Techniques and Instruments (2) [15:50-17:45, Aug. 10, 2018, Room 1] S13-1 Fourier ptychographic imaging [Keynote] Guoan Zheng* University of Connecticut *Email: [email protected] )RXULHUSW\FKRJUDSK\ )3 LVDUHFHQWO\GHYHORSHGSKDVHUHWULHYDODSSURDFKIRUODUJHILHOGRIYLHZDQG KLJKUHVROXWLRQ LPDJLQJ 7KLV WHFKQLTXH VWLWFKHV WRJHWKHU PDQ\ YDULDEO\ LOOXPLQDWHG ORZUHVROXWLRQ PHDVXUHPHQWV LQ WKH )RXULHU VSDFH WR H[SDQG WKH IUHTXHQF\ SDVVEDQG DQG UHFRYHU WKH KLJKUHVROXWLRQ FRPSOH[ REMHFW LPDJH :LWKRXW LQYROYLQJ DQ\ PHFKDQLFDO VFDQQLQJ LW IDFLOLWDWHV ODUJH ILHOG RI YLHZ LPDJLQJLQDVLPSOHDQGUREXVWPDQQHU,QWKLVWDON,ZLOOGLVFXVVWKHSULQFLSOHRIWKH)3DSSURDFKDQGLWV DSSOLFDWLRQVLQJLJDSL[HOPLFURVFRS\TXDQWLWDWLYHSKDVHLPDJLQJ'KRORJUDSKLFLPDJLQJORQJUDQJH PDFURVFRSLFLPDJLQJ,ZLOODOVRGLVFXVVKRZWRPRGHOWKH)RXULHUSW\FKRJUDSKLFLPDJLQJSURFHVVXVLQJ D QHXUDO QHWZRUN DQG WKH H[WHQVLRQ RI WKH )3 DSSURDFK IRU LQFRKHUHQW LPDJLQJ VHWWLQJV 7KH )3 LQQRYDWLRQ PD\ SURYLGH QHZ LQVLJKWV IRU WKH GHYHORSPHQW RI KLJKUHVROXWLRQ LPDJLQJ SODWIRUPV XVLQJ SKRWRQ;UD\DQGHOHFWURQ S13-2 Multi-matrix optic-electronic systems for measuring the line shifts of the points on the radio-telescope main mirror [Invited] Igor Konyakhin*, Minh Hoa Tong ITMO University, Department Optic-electronics Devices and Systems, 49 Kronverksky Pr., St. Petersburg, 197101 Russia *Email: [email protected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ȝP SURGXFHG 2PQL9LVLRQ DV LPDJH DQDO\]HU 7KH FRPSXWHU VLPXODWLRQHUURUDQGWKH H[SHULPHQWDOHUURUPHDVXUHPHQWZDVPPDWWKHUDQJHPPRQDZRUNLQJGLVWDQFHPZKLFK DOORZVPHDVXULQJWKHGHIRUPDWLRQRIUDGLRWHOHVFRSHFRQVWUXFWLRQZLWKWKHPLUURUGLDPHWHUP S13-3 Measurement of 3-dB linewidth of FBG Fabry–Perot interferometer using tunable fiber laser [Invited] Dajuan Lyu1, Peide Liu2, Wentao Zhang2*, Liangming Xiong1 1State Key Laboratory of Optical Fiber and Cable Manufacture Technology, Yangtze Optical Fibre and Cable Joint Stock Limited Company, Wuhan, 430073, China 2Optoelectronic System Laboratory, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China *Email: [email protected] :HSUHVHQWDVLPSOHPHWKRGWRPHDVXUHWKHG%OLQHZLGWKRIWKHVKDUSSHDNLQWKHVSHFWUXPRIWKHILEHU %UDJJJUDWLQJEDVHG)DEU\±3HURW )%*)3 LQWHUIHURPHWHU$QDUURZOLQHZLGWKWXQDEOHODVHULVXVHGIRU VZHHSLQJWKH)%*)3WRDFKLHYHWKHUHIOHFWLRQVSHFWUXP$WULDQJOHZDYHLVXVHGWRGULYHWKHQDUURZ OLQHZLGWKWXQDEOHODVHU7KHOLQHZLGWKRIWKHVKDUSSHDNLVPHDVXUHGZLWKDUHVROXWLRQRISP S13-4 Study on integrated linear time-grating displacement sensor with single alternating light field with single alternating light field Changli Li1,2, Min Fu1,2*, Ge Zhu1,2, Zhiwei Pu1,2, Xiaoyu Yu1,2 1College of Mechanical Engineering, Chongqing University of Technology, Chongqing, 400054, China 2Engineering Research Center of Mechanical Testing Technology and Equipment, Ministry of Education, Chongqing Key Laboratory of Time-Grating Sensing and Advanced Testing Technology, Chongqing University of Technology, Chongqing, 400054, China *Email: [email protected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ȝP XVLQJJUDWLQJSLWFKRIPPLQWKHPHDVXULQJUDQJHRIPP S13-5 Deformation measurement of testing machine based on laser interference method Bin Mao1,2, Jianjun Cui2*, Kai Chen3, Honglin Shu3, Xueping Shen2, Hongwei Shao2 1Shanxi Institute of Metrology Science, Xi’an 710065, China 2National Institute of Metrology, Beijing 100013, China 3School of Mechanical and Power Engineering, Henan Polytechnic University, Jiaozuo, Henan 454000, China *Email: [email protected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two-probe linear encoder by using an arrayed scale grating stitched by multiple separate short gratings Xinghui Li, Weihan Yuan, Kai Ni*, Qian Zhou, Xiaohao Wang Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University Tsinghua Campus, Xili University Town, Shenzhen, Guangdong, 518055, China *Email: [email protected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orrected differental fitting for height extraction in chromatic confocal microscopy Cheng Chen1, WenJun Yang1, Hong Zhu1, Jian Fu1, Chi Zhang1, Jian Wang1, Xiaojun Liu1, Wenlong Lu1*, Xiangqian (Jane) Jiang1,2 1State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, P. R. China 2EPSRC Centre for Innovative Manufacturing in Advanced Metrology, University of Huddersfield, Huddersfield, HD1 3DH, UK *Email: [email protected] $V IRU FKURPDWLF FRQIRFDO VHQVRU V\VWHP ZLWK OLPLWHG FRPSXWDWLRQDO FDSDFLW\ D IDVW SHDN H[WUDFWLRQ DOJRULWKPZLWKFRQVLGHUDWHDFFXUDF\LVLQXUJHQWGHPDQG+RZHYHUFXUUHQWSHDNH[WUDFWLRQDOJRULWKPV VXFK DV WKH FHQWURLG DOJRULWKP &$ DQGQRQOLQHDU ILWWLQJ DOJRULWKPV FDQQRW EDODQFH WKH DFFXUDF\ DQG FRPSXWDWLRQDO HIILFLHQF\ 7KXV ZH SURSRVH DQ DFFXUDWH SHDN H[WUDFWLRQ DOJRULWKP ZLWK JRRG FRPSXWDWLRQDOHIILFLHQF\FDOOHGFRUUHFWHGGLIIHUHQWLDOILWWLQJDOJRULWKP &')$ $WILUVWWKHGLIIHUHQWLDO VLJQDOGHULYHGIURPWKHRULJLQDOD[LDOUHVSRQVHVLJQDOLVOLQHDUO\ILWWHGIRULQLWLDOSHDNH[WUDFWLRQ7KHQ FRUUHVSRQGLQJ V\VWHPDWLF HUURU RI WKLV OLQHDU ILWWLQJ RSHUDWLRQ LV DQDO\]HG XVLQJ D ILUVWRUGHU OLQHDU QRQKRPRJHQHRXVGLIIHUHQWLDOHTXDWLRQ$WODVWHUURUFRPSHQVDWLRQWKDWLVWKHVROXWLRQWRWKLVHTXDWLRQLV 79 LPSOHPHQWHGZLWKDQLQWURGXFWLRQRIVXPGLIIHUHQFHVRIVDPSOLQJLQWHQVLW\7KHSHUIRUPDQFHRI&')$ LV FRPSDUHG ZLWK WZR FRQYHQWLRQDO SHDN H[WUDFWLRQ DOJRULWKPV LQFOXGLQJ WKH &$ DQG *DXVVLDQ ILWWLQJ DOJRULWKP *)$ XVLQJ 0RQWH &DUOR VLPXODWLRQV &')$ LV IRXQG WR KDYH D FRPSDUDEOH DFFXUDF\ SHUIRUPDQFHZLWK*)$ZKLOHKDYHDPXFKKLJKHUFRPSXWDWLRQDOHIILFLHQF\ Session 14 Novel Instrument and Measurement System (3) [15:50-17:45, Aug. 10, 2018, Room 2] S14-1 Thermo scientific themis Z: the ultimate in optical performance, reproducibility and flexibility [Keynote] Erwan Sourty* Thermo Fisher Scientific, China Email: [email protected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nterferometric characterization of large-stroke nano-positioning stage using an optical fiber interferometer with subatomic resolution [Invited] Tao Jin2*, Zhi Li1, Lars Daul1, Helmut Wolff1, Ludger Koenders1, Wenmei Hou1 1Physikalisch-Technische Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany 2University of Shanghai for Science and Technology, Jungong Rd. 516, YangPu District, Shanghai, China *Email: [email protected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eal-time 3D shape measurement by fringe projection and GPU parallel computing [Invited] Huijie Zhao1,2, Yang Xu1, Hongzhi Jiang1*, Xiaochun Diao1, Chenghao Liu1, Mingyi Xing1 1Key Laboratory of Precision Opto-mechatronics Technology, Ministry of Education, School of Instrumentation Science and Opto-electronics Engineering, Beihang University, Beijing 100191, China 2Qingdao Research Institute of Beihang University, Qingdao 266101, China *Email: [email protected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easurement uncertainty analysis for self-calibration angle encoder [Invited] Yao Huang1*, Zi Xue1, Dan Qiao2 80 1National Institute of Metrology, China, No.18, Bei San Huan Dong Lu, Beijing, P.R. China 2Beijing Aerospace Times Optical-electronic Technology Co., 100094, Beijing, P.R. China *Email: [email protected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ore efficient optical sectioning structured illumination microscopy Changchun Chai, He Zhou, Peng Zhou, Chi Zhang, HZ Yan, XT Guo, Xiaojun Liu* State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, 1037 Luo yu Road, Wuhan, China *Email: [email protected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easurement of unmanned aerial vehicle attitude angles based on a single captured image Huaxia Deng1, Lijun Ren1, Jin Zhang1*, Mengchao Ma1, Xiang Zhong1*, Pengcheng Wen2 1Hefei University of Technology 2AVIC Xi'an Aeronautics Computing Technique Research Institute *Email: [email protected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rror analysis method of weighing cycles based on robotic mass measurement system Lei Dong*, Zhen Li, Gang Zheng Shaanxi Institute of Metrology Science Xi’an, Shaanxi, 710065, China *Email: [email protected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ession 15 Modern Optics and Instruments for Precision Measurement (2) [15:50-17:45, Aug. 10, 2018, Room 3] S15-1 Three-dimensional imaging of live-cell dynamics using light-field microscopy [Keynote] Haoyu Li* Center of Ultra-precision Optoelectronic Instrument, Harbin Institute of Technology *Email: [email protected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ethod for simultaneously measuring 6DOF motion errors of linear and rotary axes of cnc machine tools [Invited] Qibo Feng, Bin Zhang*, Fajia Zheng, Jiakun Li Key Lab of Luminescence and Optical Information, Ministry of Education, Beijing Jiaotong University, Beijing 100044, China *Email: [email protected], [email protected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evelopment of surface profile measurement system based on super luminescent diode light source [Invited] Dian Bian, Xinyu Yan, Yang Lu, Liandong Yu* Hefei University of Technology(HFUT), Tunxi Road No.193, 230009, China *Email: [email protected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ʌ ZKLFKPD\VHYHUHO\OLPLWWKHDSSOLFDWLRQRIWKHPHDVXUHPHQW+RZHYHUWKLVSURMHFWXVHVDVKRUWFRKHUHQW OHQJWK6/'OLJKWVRXUFHLWFDQDYRLGʌSKDVHDPELJXLW\SUREOHPV%HVLGHVLWFDQSHUIRUPDIXOOVFDQLQ DODUJHUVWHSDQGDFKLHYHUDSLGRQOLQHPHDVXUHPHQWRIWKHWDUJHWVXUIDFH S15-4 Holographic fabrication of two-dimensional scale gratings for surface encoder by using an orthogonal type two-axis Lloyd's mirror interference lithography [Invited] Xinghui Li, Haiou Lu, Weihan Yuan, Qian Zhou, Kai Ni, Xiaohao Wang* Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University Tsinghua Campus, Xili University Town, Shenzhen, Guangdong, 518055, China *Email: [email protected] ,Q WKLV SDSHU DQ RUWKRJRQDO W\SH WZRD[LV /OR\G¶V PLUURU LQWHUIHUHQFH OLWKRJUDSK\ WHFKQLTXH ZDV HPSOR\HGWRIDEULFDWHWZRGLPHQVLRQDOSODQDUVFDOHJUDWLQJVIRUVXUIDFHHQFRGHUDSSOLFDWLRQ7KHWZR D[LV /OR\G¶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ȝP SHULRG LQ ; DQG <GLUHFWLRQV ZHUH DFKLHYHG E\ XVLQJ WKH FRQVWUXFWHG H[SHULPHQW V\VWHP ZLWK D QP +H&G ODVHU VRXUFH $WRPLF IRUFH PLFURVFRSH $)0 LPDJHVDQGGLIIUDFWLRQSHUIRUPDQFHVYHULILHGWKDWWKHWZRD[LV/OR\G¶VPLUURULQWHUIHURPHWHUZLWKDVPDOO XQGHVLUHGLQWHUIHUHQFHEHWZHHQWZRUHIOHFWHGEHDPVXQGHUDQRUGHURIQRPLQDOYDOXHRIFDQSURYLGHD EHWWHUIDEULFDWLRQUHVXOWIRUVFDOHJUDWLQJVDSSOLFDWLRQ S15-5 Subwavelength focusing and experimental detection of large-scale metallic multi-annular metasurfaces Tong Wang1,2, Tao Liu1, Shuming Yang1*, Biyao Cheng1, Qiang Liu1, Kang Liu1 1Xi’an Jiaotong University, State Key Laboratory for Manufacturing System Engineering, No.28, Xianning West Road, Xi’an, China, 710049 2Zhengzhou University of Light Industry, Institute of Mechanical and Electrical Engineering, No.5, Dongfeng Road, Zhengzhou, China, 450002 *Email: [email protected] 7RUHDOL]HDORQJZRUNLQJGLVWDQFHDQGKLJKUHVROXWLRQIRFXVLQJIRUGLIIUDFWLRQRSWLFDOHOHPHQWWKHODUJH VFDOH RSWLFDO HOHPHQWV QHHGHG WR EH HPSOR\HG %DVHG RQ WKH YHFWRULDO DQJXODU VSHFWUXP WKHRU\ DQG JHQHWLF DOJRULWKP D ODUJHVFDOH PHWDOOLF PXOWLDQQXODU PHWDVXUIDFH 0$0 ZDV GHVLJQHG 7KH 0$0 UHDOL]HVVXEZDYHOHQJWKIRFXVLQJDQGKDVDPDLQIRFDOVSRWZLWKLQWKHUDQJHRIȝP7KHIRFDOOHQJWK LVȝP8VLQJHOHFWURQEHDPOLWKRJUDSK\WKHGHVLJQHG0$0ZDVIDEULFDWHG7KHH[SHULPHQWDOVHWXS ZDVEXLOW:HH[SHULPHQWDOO\REWDLQHGWKHLQWHQVLW\GLVWULEXWLRQRIWKHPDLQIRFDOVSRW7KHWKHRUHWLFDO DQGH[SHULPHQWDOUHVXOWVKDYHDJRRGDJUHHPHQWZKLFKVKRZWKDWWKHSURSRVHGPHWKRGFDQEHXVHGWR GHVLJQWKHODUJHVFDOH0$0 83 S15-6 A filter algorithm based on ARMA model to suppress the influence of atmospheric disturbance in laser straightness measurement Yayong Wang, Shujie Liu*, Shixin Zhang, Yubin Huang, Kuangchao Fan School of Mechanical Engineering, Dalian University of Technology, Dalian 116024, China *Email: [email protected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ptical fiber sensing technology in morphing aircrafts and soft robotics Xu Zhang1,2, Yang Hu1,2, Daoming Qu1,2, Guangkai Sun1,2, Lianqing Zhu1,2* 1Beijing Key Laboratory of Optoelectronic Measurement Technology, Beijing Information Science & Technology University, Beijing, 100101, China 2Bionic and Intelligent Equipment Lab, Beijing Information Science and Technology University, Beijing 100016, China *Email: [email protected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ession 16 Instrument and Measurement System Calibration (2) [15:50-17:45, Aug. 10, 2018, Room 4] S16-1 Ultrathin Terahertz wavefront modulator based on metasurface [Keynote] Yan Zhang*, Xinke Wang, Jiasheng Ye, Shengfei Feng, Peng Han, Wenfeng Sun Beijing Key Laboratory of Metamaterials and Devices, Key Laboratory of Terahertz Optoelectronics, Ministry of Education, Beijing Advanced Innovation Center for Imaging Technology, Department of Physics, Capital Normal University, Beijing, 100048, China *Email: [email protected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shielding performance evaluation model of the randomized overlapping ring metallic mesh [Invited] Yongmeng Liu1*, Cuilian Zuo1, Chuanzhi Sun1*, Hui Jin2, Jihui Ma3, Jiubin Tan1 1Ultra-precision Optoelectronic Instrument Engineering Center, Harbin Institute of Technology, Harbin, 150001, China 2Changchun institute of optics, fine mechanics and physicsˈChinese Academy of sciences, Changchun, 130033, China 3Beijing Institute of Spacecraft Environment Engineering, Beijing, 100094, China *Email: [email protected], [email protected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he optimization of segment's supporting for large astronomical telescopes [Invited] Yongfeng Song, Liangzhou Chen*, Chang Song, Xiaojun Liu State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China. *Email: [email protected] ([LVWLQJ D[LDO VXSSRUW IRU VHJPHQWV PRVWO\ DGRSWV WKH :KLIIOHWUHH VXSSRUW PRGH 7KH ORFDWLRQ RI WKH VXSSRUW SRLQW ZLOO KDYH D JUHDW LQIOXHQFH RQ WKH VXUIDFH SUHFLVLRQ RI WKH SULPDU\ PLUURU DQG WKHQ LQIOXHQFHWKHILQDOLPDJLQJTXDOLW\RIWKHWHOHVFRSH$WSUHVHQWWKHUHLVQRVSHFLDOVXSSRUWWHFKQRORJ\IRU WUDGLWLRQDODQGWKLQPLUURU,QWKLVSDSHUWKHUHVHDUFKLVEDVHGRQ/27¶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ual-wavelength off-axis quasi-common-path digital holography using 85 polarization-multiplexing and flipping [Invited] Lei Liu1, Zhi Zhong1, Mingguang Shan1*, Bin Liu1, Gunagyu Luan2, Ming Diao1, Yabin Zhang1 1College of Information and Communication Engineering, Harbin Engineering University, Harbin, Heilongjiang 150001, China 2College of Information Technology, Heilongjiang Bayi Agricultural University, Daqing, Heilongjiang 163319, China *Email: [email protected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ey technology and applications of fiber grating fabricated by femtosecond laser Wei He1,2, Lianqing Zhu1,2*, Mingli Dong1,2* 1Beijing Engineering Research Center of Optoelectronic Information and Instruments, Beijing Information Science and Technology University, Beijing 100016, P. R. China 2Beijing Laboratory of Optical Fiber Sensing and System, Beijing Information Science and Technology University, Beijing 100016, P. R. China *Email: [email protected], [email protected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ield test method and standard instruments for verification of traffic speed meters based on actual traffic Lei Du*, Qiao Sun, Jie Bai, Zhe Fan Division of Mechanics and Acoustics, National Institute of Metrology, Beijing 100029, P.R. China *Email: [email protected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heoretical determination and validation of thermal deformation critical point of cnc machine tool bed Hongtao Yang, Li Li*, Yongjun Pang, Bangshen Chen, Shidai Zhang School of Mechanical Engineering, Anhui University of Science and Technology, Huainan, AnHui, 232001 *Email: [email protected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oster Presentation Poster 1 Instrumentation Theory and Methodology P1-1 Method for spherical form error evaluation using cuckoo search algorithm Lin Jiang, Jingzhi Huang*, Xiangshuai Ding, Xiangzhang Chao Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, 150001, China *Email: [email protected] 7R REWDLQ WKH DFFXUDWH HYDOXDWLRQ RI PLQLPXP ]RQH VSKHULFLW\ WKLV SDSHU LQYHVWLJDWHV D PHWKRG LQ &DUWHVLDQFRRUGLQDWHVXVLQJFXFNRRVHDUFK &6 DOJRULWKP,QWKLVPHWKRGDQDSSURSULDWHVSDFHLVVHWDV WKHVHDUFK]RQHDFFRUGLQJWRWKHVROXWLRQREWDLQHGZKLFKLVEDVHGRQOHDVWVTXDUHFULWHULD7KHDLPRI VHDUFK LV WR ILQG WKH EHVW FDQGLGDWH SRVLWLRQ LQILQLWHO\ DSSUR[LPDWLQJ WKH LGHDO UHIHUHQFH FHQWHU RI PLQLPXP]RQHVSKHUH,QRUGHUWRLPSURYHWKHVHDUFKHIILFLHQF\WZRHVVHQWLDOSDUDPHWHUVLQ&6QDPHO\ WKHFRQWUROFRHIILFLHQWĮ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esearch on photonic detection method of laser self-mixing interference Wei Xia, Junbao Chen, Yufeng Tao, Hui Hao, Dongmei Guo, Ming Wang* Jiangsu Key Laboratory on Opto-electronic Technology, School of Physics and Technology, Nanjing Normal University, Nanjing, 210023, China *Email: [email protected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esign of Gaussian filters based on odd and even function continuation for non- closed circular profile Jingzhi Huang*, Huixin Zheng, Lin Jiang, Xiangzhang Chao, Xiangshuai Ding Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, 150001, China *Email: [email protected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isalignment recognition of mass pan in joule balance Yang Bai1,2, Yunfeng Lu1,2, Zhengkun Li1,2, Dawei Wang3, Qing He1,2, Zhonghua Zhang1,2 1National Institute of Metrology, Beijing 100029, China 2Key Laboratory for the Electrical Quantum Standard of AQSIQ, Beijing 100029, China 3Instrument Science and Technology, Harbin Institute of Technology, Harbin 150080, China *Email: [email protected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ethod of squareness measurement based on laser alignment measuring system Binghe Wang*, Yanhui Kang Metrology in Length and Precision Engineering, National Institute of Metrology, Beijing 100029 *Email: [email protected] ,QRUGHUWRPHDVXUHWKHVTXDUHQHVVRIODUJHVL]HZRUNSLHFHVDPHWKRGRIVTXDUHQHVVPHDVXUHPHQWEDVHG RQODVHUDOLJQPHQWV\VWHPZDVLQWURGXFHG7KHVWUXFWXUHDQGSULQFLSOHRIWKHODVHUDOLJQPHQWV\VWHPZHUH SUHVHQWHG7KHVTXDUHQHVVPHDVXULQJPHWKRGRIWKHVTXDUHQHVVPHDVXULQJV\VWHPDQGWKHODVHUDOLJQPHQW V\VWHPZHUHGHVFULEHGUHVSHFWLYHO\7KLVSDSHULPSURYHGWKHPHWKRGRIVTXDUHQHVVPHDVXUHPHQWEDVHG RQ ODVHU DOLJQPHQW V\VWHP DQG PDGH WKH DFFXUDF\ VDWLVILHG ZLWK WKH UHTXLUHPHQW RI PRVW LQVLWH PHDVXUHPHQW7KHH[SHULPHQWVVKRZWKDWWKHVTXDUHQHVVPHDVXUHPHQWDFFXUDF\RIWKHODVHUDOLJQPHQW V\VWHPFDQEHLPSURYHGWRȝPPP P1-6 Choosing parameters of active reference mark optical-electronic systems spatial position control Ivan S. Nekrylov*, Мaksim А. Kleshchenok, Anastasia A. Blokhina, Elena A. Sycheva, Igor Konyakhin, Sergey V. Mednikov Department of Optical-Electronic Devices and Systems, ITMO University, 197101, 49 Kronverkskiy pr., Saint-Petersburg, Russia *Email: [email protected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esearch of the temperature influence on the errority of incremental optical- electronic encoders of linear displacements based on raster structures Mednikov V. Sergey*, Vasilev S. Alexandr, Blokhina A. Anastasia, Kleshchenok A. Maksim, Nekrylov S. Ivan, Konyakhin A. Igor Dept. of Optical-Electronic Devices and Systems, ITMO University, 197101, 49 Kronverkskiy pr., Saint-Petersburg, Russia *Email: [email protected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¶V$QDO\]LQJWKHHIIHFWRIWHPSHUDWXUHRQWKH FRXUVHRILQIRUPDWLRQWUDQVIRUPDWLRQLWLVSRVVLEOHWRGLYLGHWKHPDLQHPHUJLQJSDUWLDOFRPSRQHQWVRIWKH DGGLWLRQDOHUURULQWRWZRJURXSV HUURUVGXHWRFKDQJHVLQWKHUHODWLYHVSDWLDOSRVLWLRQRIWKHHOHPHQWVRIWKH2(/'( HUURUVGXHWRFKDQJHVLQSDUDPHWHUVDQGFKDUDFWHULVWLFVRIHOHPHQWVRIWKH2(/'( P1-8 Research of technologies in image-based omnidirectional AGV Jian Bao, Zai Luo*, Dong Li China Jiliang University, Hangzhou 310018, China *Email: [email protected] 7KLVWRSLFPDLQO\VWXGLHVWKHQDYLJDWLRQSDUDPHWHUVREWDLQHGE\LPDJHSURFHVVLQJWHFKQRORJ\WRDFKLHYH RPQLGLUHFWLRQDOPRELOH$*9DXWRQRPRXVQDYLJDWLRQ7KHFDPHUDLVPRXQWHGRQWKHERWWRPRIWKHERG\ RIWKH$*9DQGFDSWXUHVWKHEODFNWDSHSDWKRQWKHJURXQG,PDJHSUHSURFHVVLQJLVSHUIRUPHGLQFOXGLQJ LPDJHJUD\LQJLPSURYHG&$11<DOJRULWKPHGJHGHWHFWLRQ7KHQWKH+RXJKWUDQVIRUPLVXVHGWRGHWHFW WKHSDWKRIWKHSUHSURFHVVHGLPDJH)LQDOO\DVWUDLJKWOLQHLVVHOHFWHGWRREWDLQWKHHIIHFWLYHHGJHOLQH DQGWKHQDYLJDWLRQGHYLDWLRQSDUDPHWHUVDUHH[WUDFWHG([SHULPHQWDOUHVXOWVVKRZWKDWWKHHIIHFWLYHQHVVRI WKHJXLGDQFHWHFKQLTXHVLQWKLVSDSHUKDVDFKLHYHGWKHH[SHFWHGUHVXOWV P1-9 A uniform and flexible model for three-dimensional measurement of line- structured light sensor Zhe Li, Jiwen Cui*, Jianwei Wu, Tong Zhou, Jiubin Tan Center of Ultra-precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150001, P. R. China *Email: [email protected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ulti-structure elements morphology for improved anti-noise edge detection Jiwen Cui*, Yarui Ma, Houhu Lai, Hui Wang, Jiubin Tan Institute of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China *Email: [email protected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oster 2 Measurement for Precision and Ultra-Precision Machining P2-1 Error analysis of target trajectory tracking applied for measurement of high speed spindle An Jin, Jiamin Chen, Wenguo Yang, Xinggang Wang, Lei Wang *, Jie Lin, Peng Jin, Jiubin Tan Institute of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China *Email: [email protected] 7KHPHDVXUHPHQWRIVSLQGOHUDGLDOHUURUPRWLRQLVDFKLHYHGEDVHGRQWDUJHWWUDMHFWRU\WUDFNLQJ 777 (UURUDQDO\VLVRI777PHWKRGLVSHUIRUPHGLQWKLVSDSHU7DUJHWWUDMHFWRU\GRHVQ¶WFRQWDLQLQIRUPDWLRQ DERXWD[LDOHUURUPRWLRQ7KHWLOWHUURUPRWLRQLVLQFOXGHGLQWKHWDUJHWWUDMHFWRU\+RZHYHUWKHWLOWHUURU PRWLRQLVVPDOOHQRXJKWREHLJQRUHG7KHURXQGQHVVHUURURIWKHWDUJHWWUDMHFWRU\LVDVVHVVHGWRREWDLQ WKHUDGLDOHUURUPRWLRQRIWKHVSLQGOH7KHH[SHULPHQWDOUHVXOWVFRQILUPWKDWWKHSURSRVHGPHWKRGFDQEH DSSOLHGWRPHDVXUHWKHUDGLDOHUURUPRWLRQRIDKLJKVSHHGVSLQGOHKDYLQJDPD[LPXPURWDWLRQDOVSHHGRI UP P2-2 Force control and visual measurement in precision assembly system Yawei Li1, Xiaodong Wang1,2, Yi Luo1,2*, Shengsheng Sun1 1Key Laboratory for Micro/Nano Technology and System of Liaoning Province, Dalian University of Technology, Dalian 116024, China 2Key Laboratory for Precision and Non-traditional Machining of Ministry of Education, Dalian University of Technology, Dalian 116024, China *Email: [email protected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measuring method of coaxiality errors for far apart axis Yuansong Zheng2, Zhifeng Lou1,2, Ying Li2, Xiaodong Wang1,2*, Yue Wang2 1Key Laboratory for Precision and Non-Traditional Machining Technology, Ministry of Education, Dalian University of Technology, Dalian 116024, PR China 2Key Laboratory for Micro/Nano Technology and System of Liaoning Province, Dalian University of Technology, Dalian 116024, PR China *Email: [email protected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esearch on an accuracy test method of star sensor based on spatial transform Miao Li*, Xueyang Ma, Wei Yu, Yikang He, Lianwen Zhou, Yiwei Shen Shanghai Institute of Aerospace Control Technology *Email: [email protected] 7KLVSDSHUPDNHVXVHRIWKHUHODWLYHO\VWDEOHJURXQGVSHHGDQGWKHUHDOVWDUU\VN\XQGHUWKHFRQGLWLRQRI RXWILHOG VWDUJD]LQJ 7KH UHODWLYH WUDQVIRUPDWLRQ RI WKH VSDFH DQG PRWLRQ RI WKH VWDU VHQVRU SDWWHUQ LV FDUULHGRXW:HWHVWWKHDFFXUDF\RIWKHVWDUVHQVRUE\FDOFXODWLQJWKHYHFWRUDQJOHDQGRYHUFRPHVWKH GLVDGYDQWDJHVVXFKDVWKHH[LVWLQJWHFKQRORJ\FDQQRWVLPXODWHWKHUHDOVWDUU\VN\,WSURYLGHVDQHIIHFWLYH PHWKRGWRWHVWWKHSUHFLVLRQRIWKHJURXQGIDFLQJVWDUVHQVRU P2-5 Variable frequency big current calibration technique Jianzhen Cai* Beijing Orient Institute of Measurement *Email: [email protected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he effect of contact pressure on resistance measurement of antistatic material Yafei Yuan, Yu Zhang*, Weihong Zhang, Qizheng Ji, Na Feng, Ming Yang, Shanshan Ma, Jihao He Beijing Orient Institute of Measurement and Test, Beijing, 100094 *Email: [email protected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ast measurement of small modulus gears based on machine vision Jianguo Tao* China Jiliang University *Email: [email protected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ost 3 Novel Instrument and Measurement System P3-1 Bionic vision improves the performances of super resolution imaging Yuqing Xiao1, Jie Cao1,2*, Zihan Wang1, Qun Hao1, Haoyong Yu3, Qiang Luo4 1Key Laboratory of Biomimetic Robots and Systems, Ministry of Education, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, China 2Department of Biomedical Engineering, National University of Singapore, Singapore, 117575, Singapore 3NUS Suzhou Research Institute (NUSRI), Suzhou Industrial Park, Suzhou, 215123, China 4Xi’an Institute of Modern Control Technology, Xi’an 710065, China *Email: [email protected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easurement method of the compression coefficient of near-monocrystalline silicon density liquid Xin-Yu Ma1,2*, Jin-Tao Wang2, Zhi-Yong Luo2 1China Jiliang University, Hangzhou 310018, China 2Division of Mechanic and Acoustic, National Institute of Metrology, Beijing 100013, China *Email: [email protected] 7KHVWDQGDUGQHDUVLOLFRQOLTXLG NJP LVDPL[WXUHOLTXLGRIWULEURPRSURSDQHDQGGLEURPRHWKDQH LQDFHUWDLQSURSRUWLRQ7KLVOLTXLGLVXVHGWRPHDVXUHWKHGHQVLW\RIVLQJOHFU\VWDOVLOLFRQVSKHUHVE\D VWDWLF VXVSHQVLRQ PHWKRG DQG WKH DQDO\VLV RI WKH GLIIHUHQFH LQ WKH PLFUR GHQVLW\ EHWZHHQ WZR VLOLFRQ VSKHUHV0HDVXULQJWKHGLIIHUHQFHLQWKHPLFURGHQVLW\RIWKHVLOLFRQVSKHUHVLVRIJUHDWVLJQLILFDQFHIRU WKHQHZGHILQLWLRQRIWKHQHZPDVVRINLORJUDPV,QRUGHUWRREWDLQWKHPLFURGHQVLW\GLIIHUHQFHRIWKH VLOLFRQVSKHUHVLW LVQHFHVVDU\WRFDOFXODWHWKHVWDWLFSUHVVXUHYDOXHDQGWKHWHPSHUDWXUHE\ VHSDUDWHO\ DGMXVWLQJWKHVLQJOHFU\VWDOVLOLFRQVSKHUHVWRWKHVDPHVXVSHQVLRQVWDWHDQGWKHFRPSUHVVLRQFRHIILFLHQW RI WKH QHDUPRQRFU\VWDOOLQH VLOLFRQ GHQVLW\ OLTXLG 7KURXJK WKH DGMXVWPHQW RI WKH VDPH K\GURVWDWLF VXVSHQVLRQVWDWHRIDVLQJOHVLOLFDEDOOLQGLIIHUHQWVXVSHQVLRQVWDWHVWKHOLQHDUFRQVWDQWVPHDVXUHGE\WKH OLQHDU PRGHO DUH DQDO\]HG WR FDOFXODWH WKH OLTXLG FRPSUHVVLRQ FRHIILFLHQW )RU WKLV SXUSRVH D VWDWLF VXVSHQVLRQ PHDVXULQJ GHYLFH IRU D VLQJOH FU\VWDO VLOLFRQ EDOO ZDV GHVLJQHG WR PDLQWDLQ WKH ZDWHU EDWK ZLWKLQDUDQJHRIPNZLWKLQKRXUVDQGWKHSRVLWLRQFRQWURORIWKHVLOLFRQEDOOZDVGHWHUPLQHGE\ FRQWUROOLQJWKHSUHVVXUHRIWKHXSSHUFRPSXWHU P3-4 An exchangeable end effector for multi-part-assembly system Shengsheng Sun1, Yi Luo1,2*, Xiaoxu Qiao1, Xiaodong Wang1,2 1Key Laboratory for Micro/Nano Technology and System of Liaoning Province, Dalian University of Technology, Dalian 116024, People’s Republic of China 2Key Laboratory for Precision and Non-traditional Machining of Ministry of Education, Dalian University of Technology, Dalian 116024, People’s Republic of China *Email: [email protected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ough transform based image processing algorithm in the optical-electronic angle measuring device Anton Nogin*, Igor Konyakhin Dept. of Optical-Electronic Devices and Systems / ITMO University, 14-16 Grivtsova per., Saint- Petersburg, Russian Federation, 190000 *Email: [email protected] 7KHDUWLFOHLVEDVHGRQVRPHUHVHDUFKZKLFKLVFRQVLGHULQJWKHWKUHHD[LVDQJOHPHDVXULQJDXWRFROOLPDWRU DQG+RXJKWUDQVIRUPEDVHGLPDJHSURFHVVLQJDOJRULWKPIRULW,QRUGHUWRPHDVXUHDQJXODUGLVSODFHPHQWV DURXQGWKHWKUHHPDLQFRRUGLQDWHD[HV 2;Ɉ<DQGɈ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differential giant magnetostrictive mitro-displacement actuator Jing Wang1, Lei Wang1*, Yixin Li1, Junzhong Li1, Xiaoyu Zhu2 1Instrument Science and Technology, Harbin Institute of Technology, Harbin 150080, China 2National Instruments, 58# Haiqu Road, Pudong New Area, Shanghai, 200120, China; *Email: [email protected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r QPDUHVROXWLRQRIQPZLWKLQDȝPWUDYHOUDQJH,QWKHFRPSRVLWHFRQWURO V\VWHP D K\VWHUHVLVIUHH VLQXVRLGDO GLVSODFHPHQW RXWSXW ZLWK DQ DPSOLWXGH RI ȝP ZLWKLQ +] LV UHDOL]HGDQGWKHPD[LPXPRXWSXWHUURULVȝPZKLFKHIIHFWLYHO\LPSURYHVWKHG\QDPLFSHUIRUPDQFH RIWKHDFWXDWRUDQGLPSURYHVWKHORDGFDSDFLW\RIWKHDFWXDWRU P3-7 Design of active vibration isolation system based on electromagnetic and floatation hybrid support Zhen Zhang, Lei Wang*, Junzhong Li, Jing Wang, Jiamin Chen, Pengxuan Li, Yunfei Han Institute of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, 150001 Harbin, P.R. China *Email: [email protected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obust concrete crack recongnition based on improved image segmentation and SVM Qiancheng Zhao, Jiang Shao*, Tianlong Yang College of Electromechanical, Hunan University of Science and Technology, Xiangtan 411201, China *Email: [email protected] 7KLVZRUNSUHVHQWVDQDXWRPDWLFDOFUDFNUHFRJQLWLRQDSSURDFK&RPSDUHGZLWKWKHH[LVWLQJPHWKRGVLW SURYLGHVDVLJQLILFDQWLQFUHDVHLQUREXVWQHVVDQGHIILFLHQF\IRUODUJHVFDOHXVHXQGHUZLGHO\YDU\LQJILHOG FRQGLWLRQV ,QKHUHQW FKDUDFWHULVWLFV RI FUDFN LPDJHV DUH H[SORLWHG XVLQJ SURSRUWLRQDO VHJPHQWDWLRQ FRPELQHG ZLWK UREXVW IHDWXUH H[WUDFWLRQ WR LPSURYH PDFKLQH OHDUQLQJ FODVVLILHU SHUIRUPDQFH ([SHULPHQWV VKRZ WKDW WKLV PHWKRG SHUIRUPV ZHOO LQ FODVVLI\ FUDFN LPDJHV FDSWXUHG IURP FRQFUHWH 95 VWUXFWXUHV P3-10 Development of portable digital ultrasonic guided wave detector based on COM express Meiju Zhang1, Wei Liu1, Defeng Liu1, Feiyue An2, Honglei Chen2, Zenghua Liu2* 1Beijing Changcheng Aeronautical Measurement and Control Technology Research Institute of AVIC, Beijing 100022, China 2College of Mechanical Engineering and applied Electronics Technology, Beijing University of Technology, Beijing 100124, China *Email: [email protected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esearch on self-calibrating phase shifting shadow Moiré technique Hubing Du*, Jianhong Yu, Shaofeng Zhang School of Mechatronic Engineering, Xi’an Technological University, Xi'an, Shaanxi, 710032, P. R. China. *Email: [email protected] 7KH SKDVH VKLIWLQJ VKDGRZPRLUp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n online vision system for battery FPC connector defects detection based on ASM template matching method Zhuo Zhao1,2, Bing Li1,2*, Fei Gao1, Lei Chen1, Meiting Xin1 1School of Mechanical Engineering, Xi’an Jiaotong University 2State Key Laboratory for Manufacturing System Engineering, No.99 Yanxiang Road, Yanta District, Xi’an 710049, Shaanxi, China *Email: [email protected], [email protected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ecognition and classification of label-free leukocyte scattering detection in peripheral blood basing on pattern recognition method Lu Zhang1*, Lele Luo1, Zewen Yang1, Yingzhe Tu1, Chunhui Zhao1, Chunwei Zhang1, Li Yuan2 1State Key Laboratory for Manufacturing System Engineering, School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, Shaanxi, 710049, China 2Department of Laboratory Medicine, the First Affiliated Hospital, Xi’an Jiaotong University, Xi’an, Shaanxi, 710049, China *Email: [email protected] 7KH GLDJQRVLV RI GLVHDVHG EORRG FHOOV LQ ODEHOIUHH FRQGLWLRQV KDV PDQ\ DGYDQWDJHV IRU H[DPSOH LW GRHVQ¶W GHVWUR\ FHOOV¶ DFWLYLW\ FRPSRVLWLRQ PRUSKRORJLFDO DQG SK\VLRORJLFDO VWUXFWXUHV ,W SOD\V DQ LPSRUWDQW UROH LQ FOLQLFDO GLDJQRVLV RI GLVHDVHG FHOOV LQ WKH IXWXUH 7KH NH\ VFLHQWLILF SUREOHP LQ WKLV UHVHDUFKLVWRILQGRXWODEHOIUHHFHOO¶VLQYHUVHSULQFLSOHVZKLFKFDQPDWFKXSZLWKODEHOIUHHFHOOV¶W\SHV DQGVSHFLILFLW\LQWKHLUOLJKWVFDWWHULQJSDWWHUQV,QRUGHUWRVROYHWKLVSUREOHPWKHODUJHFOLQLFDOGDWDLV UHTXLUHG7KHUHIRUHSDWWHUQUHFRJQLWLRQPHWKRGVDUHDSSOLHGLQWKLVVWXG\2QWKHRWKHUKDQGGLIIHUHQW IURP FRQYHQWLRQDO SDWWHUQ UHFRJQLWLRQ PHWKRGV D PHWKRG ZKLFK FDQ EH KHOSIXO WR WUDFH WKH ODZV IRU SDWWHUQ UHFRJQLWLRQ VHHPV YHU\ LPSRUWDQW EHFDXVH LW FDQ ILJXUH RXW WKH UHODWLRQV EHWZHHQ VFDWWHULQJ IHDWXUHVDQGODEHOIUHHFHOO¶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new method for generating large area & tunable non-diffraction structured light Lihua Peng* Huazhong University of Science and Technology *Email: [email protected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ȝP ZKRVH DUHD LV DSSUR[LPDWHO\ WLPHV WKH DUHD RI LQFLGHQW EHDP RQHGLPHQVLRQDO H[WHQVLRQ 7KHRUHWLFDODQDO\VLVDQGVLPXODWLRQDUHFDUULHGRXWWREXLOGWKHPRGHORIJHQHUDWLQJVWUXFWXUHGOLJKWE\WKH LQWHUIHUHQFH WKHRU\ 7KH VLPXODWLRQ UHVXOW RI WKH RSWLPDO RSWLFDO V\VWHP VKRZV WKDW D ODUJH DUHD RI VWUXFWXUHG OLJKW ZLWK IOH[LEOH WHQDELOLW\ LV IRUPHG ZKHQ D FROOLPDWHG EHDP SURSDJDWHV WKURXJK WKH V\VWHPZKLFKVKRZVJUHDWSURVSHFWLQVWUXFWXUHGOLJKWPHDVXUHPHQW P3-15 Fast response circulating cooling water temperature control system based on Smith predictor Yesheng Lu, Junning Cui*, Yue Zhao Department of Automatic test and Control, Harbin Institute of Technology, Harbin, 150080, PR China *Email: [email protected], [email protected], [email protected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esearch on adaptive segmentation method of embossed character image based on wellner algorithm Xili Duan, Jing Le*, Yuyang Ming, Shaowei Chen, Mingxing Tang School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, Xi'an 710048, China *Email: [email protected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³FHQWHUDURXQG´LGHDWKH:HOOQHUDOJRULWKPLVLPSURYHGZLWKWKHPHDQYDOXHDQGWKHLPDJH SL[HOSRLQWVDUHWUDYHUVHGWRDFKLHYHLPDJHELQDUL]DWLRQ)LQDOO\WKHILQDOVHJPHQWDWLRQUHVXOWLVREWDLQHG E\ FRPELQLQJ PRUSKRORJLFDO RSHUDWLRQV 7KH YHULILFDWLRQ H[SHULPHQWDO UHVXOWV VKRZ WKDW WKH SURSRVHG PHWKRG KDV JRRG VHOIDGDSWLYHQHVV DQG DFFXUDF\ IRU WKH JUD\VFDOH KLVWRJUDP LPDJH ZLWK XQLPRGDO FKDUDFWHULVWLFV P3-17 Method for detecting ring gear surface defects of wheel speed sensor based on neural network Zhenwei Huang1*, Jina Liang1, Lei Liu2, Jiacheng Hu2 1China Quality Certification Center, Beijing, China, 100070 2China Jiliang University, Hangzhou, Zhejiang, China, 310018 *Email: [email protected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ield test method and standard instruments for verification of traffic speed meters based on test vehicle Lei Du*, Qiao Sun, Jie Bai, Zhe Fan Division of Mechanics and Acoustics, National Institute of Metrology, Beijing 100029, P.R. China *Email: [email protected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onstruction of a compact laser wavemeter with controlling laser angular drift Yindi Cai1*, Baokai Feng1, Kuang-Chao Fan1 School of Mechanical Engineering, Dalian University of Technology, Dalian, 116023, China *Email: [email protected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ltrasonic characteristics of contact stress of small interference fitting parts Yue Wang2, Zhifeng Lou1,2*, Xingyuan Wang2, Xiaodong Wang1,2 1Key Laboratory for Precision and Non-Traditional Machining Technology, Ministry of Education, Dalian University of Technology, Dalian 116024, PR China 2Key Laboratory for Micro/Nano Technology and System of Liaoning Province, Dalian University of Technology, Dalian 116024, PR China *Email: [email protected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alibration of geometric error in passive laser tracker Liang Xu, Zhifeng Lou*, Kuang-Chao Fan, Liding Wang, Yuchen Tian Dalian University of Technology, China *Email: [email protected], [email protected], [email protected], [email protected], [email protected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efect detection method for complex surface based on human visual characteristics and feature extracting Yubin Du1, Pin Cao2, Yongying Yang1*, Fanyi Wang1, Rongzhi Liu1, Fan Wu1, Pengfei Zhang1, Huiting Chai1, Jiabin Jiang1, Yihui Zhang1, Guohua Feng1, Xiang Xiao1, Yanwei Li1 1State Key Laboratory of Modern Optical Instrumentation, Department of Optical Engineering, Zhejiang University, 38 Zheda Road, Hangzhou 310027, China 2Hangzhou Zernike Optical Technology Co.,Ltd. Hangzhou 311112, China. *Email: [email protected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n identification method for casing weld in complex environment Jiahao Ou, Xian Wang*, Zhou Xu School of Mechanical Engineering, HuNan University of Science and Technology, Xiangtan, 411201, China *Email: [email protected] 7KLVSDSHUSURYLGHVDQLQGHQWLILFDWLRQPHWKRGIRUFDVLQJZHOGLQFRPSOH[HQYLURQPHQW)LUVWO\GHWHFWLQJ DUHJLRQRILQWHUHVW 52, RISLSHWRQDUURZWKHVHDUFKLQJUDQJH&RSSHUSLSHLVVHJPHQWHGE\FRPELQLQJ JUD\VFDOHFKDUDFWHULVWLFVDQGFRORUFKDUDFWHULVWLFV6HFRQGO\EDVHGRQWKHFKDUDFWHULVWLFVWKDWWKHFDVLQJ ZHOG RQ FRSSHUSLSH FRXOGEH HURGHG LQ ELQDU\ LPDJH WKH ZHOG SRWHQWLDO UHJLRQV DUH REWDLQHG E\ WKH PRUSKRORJLFDO RSHUDWLRQ WRUHGXFH LQWHUIHUHQFH RQ SLSH )LQDOO\ DFFRUGLQJ WR WKH SRVLWLRQ RI WKH ZHOG FKDUDFWHULVWLFVRQWKHFRSSHUSLSHWRLGHQWLI\WKHZHOGV7KHH[SHULPHQWUHVXOWVVKRZWKDWWKHFDVLQJZHOG FRXOGEHLGHQWLILHGDFFXUDWHO\E\WKLVPHWKRG P3-24 Architecture of rail and wheelset ndt detecting test rig 100 Hongfu Zhou1*, Yanghua He2, Yuguang Mo2 1School of Mechanical and Automobile Engineering, South China University of Technology, 510641, Guangzhou, China 2Foshan Ye Peng Machinery Co., Ltd., 528131, Foshan, China *Email: [email protected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design of high-accuracy angle measurement system for satellite AIT processing Yalu Chen, Zhihui Li* Shanghai Institute of Satellite Equipment, Shanghai 200240, China *Email: [email protected] ,Q RUGHU WR VROYH WKH SUREOHPV DQG VKRUWFRPLQJV RI FXUUHQW DQJOH PHDVXUHPHQW PHWKRGV IRU VDWHOOLWHV DVVHPEO\ DQG LQVSHFWLRQ VXFK DV OLPLWHG ILHOG RI YLVLRQ UHODWLYHO\ ORZ SUHFLVLRQ DQG ORZ GHJUHH RI DXWRPDWLRQ D QRYHO GHVLJQRI KLJK DFFXUDF\ DQJOH PHDVXUHPHQW V\VWHP LV SURSRVHG 7KHQHZ V\VWHP FRPSRVHG RI DXWRFROOLPDWRU HOHFWURQLF JUDGLHQWHU WZRGLPHQVLRQDO SUHFLVH WXUQWDEOH DQG VWDQGDUG PLUURUVZRUNVE\DFWXDOFROOLPDWLRQPHDVXULQJDPRQJWKHPHDVXUHGWDUJHWDXWRFROOLPDWRUDQGVWDQGDUG PLUURUVZLWKWKHPHDVXULQJEDVLVRIHDUWKZKLFKLVEXLOWE\HOHFWURQLFJUDGLHQWHU7KLVSDSHUIRFXVHVRQ WKH VSHFLILF VWUXFWXUH GHVLJQ HQJLQHHULQJ PRGDO DQG DUUDQJHPHQW SODQ RI DXWRPDWLF PHDVXULQJ DOVR LQFOXGHVSUHFLVLRQFDOLEUDWLRQWHVWLQWKHHQG$FFRUGLQJWRWKHUHVXOWRIWKHWHVWWKHDQJOHPHDVXUHPHQW V\VWHPUHDFKHVWKHSUHFLVLRQRIƎDQGUHSHDWDELOLW\RIƎ P3-27 Design and performance analysis of a novel thermos-structure for measuring thermal drift of optics in a next generation interferometer Guolong Wu, Hongxing Yang*, Haijin Fu, Pengcheng Hu Institute of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin *Email: [email protected], [email protected], [email protected], [email protected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ong-range automatic precision displacement measuring of winding system using double timing belt transmission Duxi Liu*, Jinshun Xu, Tong Li School of Mechanical Engineering, Northwestern Polytechnical University, Xi’an, 710072, China *Email: [email protected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oster 4 Modern Optics and Instruments for Precision Measurement P4-1 Comparison of spacing detection algorithms for optical straight fringes images Yuexin Wang*, Fuzhong Bai, Xiaojuan Gao, Ying Wang College of Mechanical Engineering, Inner Mongolia University of Technology, Hohhot, 010051, China *Email: [email protected] 2SWLFDOIULQJHLVRQHRILPSRUWDQWRXWSXWLQIRUPDWLRQIURPWKHRSWLFDOV\VWHPV6RPHLPSRUWDQWRSWLFDORU V\VWHP SDUDPHWHUV FDQ EH REWDLQHG E\ DQDO\]LQJ WKH IULQJH LQIRUPDWLRQ IURP RSWLFDO V\VWHP VXFK DV LQWHUIHURPHWHU V\VWHP RU GLIIUDFWLRQ VHWXS 7KH VWUDLJKW IULQJH LV D NLQG RI RSWLFDO IULQJHV IUHTXHQWO\ DSSHDULQJLQ P4-2 Improved design principle of Dyson concentric infrared imaging spectrometer Qian Zhou1*, Peng Yan1, Xinghui Li1, Kai Ni1, Xiaohao Wang1,2 1Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China 2Research Institute of Tsinghua University in Shenzhen, Shenzhen 518057, China *Email: [email protected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esearch of scintillation crystal’s refractive index’s homogeneity based on 102 ellipsometric method Daria A. Drozdova*, Victoria A. Ryzhova, ITMO University, Russian Federation *Email: [email protected] ,QWKLVZRUNZHSURSRVHHOOLSVRPHWULFPHWKRGDSSOLHGWRWKHDQDO\VLVRIVFLQWLOODWLRQFU\VWDO¶VUHIUDFWLYH LQGH[LQRUGHUWRGHILQHLW¶VXQLIRUPLW\WKURXJKRXWWKHZKROHVWUXFWXUHRIWKHLQYHVWLJDWHGFU\VWDO7KH PHWKRG XVHG LQ WKLV ZRUN LV QRUPDO LQFLGHQFH WUDQVPLVVLRQ HOOLSVRPHWU\ 7KH WHFKQLTXH FRQVLVWV RI GLUHFWLQJSODQHPRQRFKURPDWLFZDYHQRUPDOO\ LQFLGHQWRQWRFU\VWDO¶VVXUIDFH%\ NQRZLQJ IHDWXUHVRI OLJKWLOOXPLQDWLQJWKHREMHFWDQGVRPHHVVHQWLDOSDUDPHWHUVRIFU\VWDO¶VVWUXFWXUH VXFKDVLQIRUPDWLRQ DERXW LW¶V LVRWURS\ DQG LQWHUQDO VWUXFWXUH ZH FDQ FDOFXODWH SRODUL]DWLRQ DQJOHV Ȍ ɢ ǻ XVLQJ HTXDWLRQVWKDWFRQQHFWFU\VWDO¶VIHDWXUHVDQGSDUDPHWHUVRIOLJKWWKDWLOOXPLQDWHWKHLQYHVWLJDWLQJREMHFW &RPSXWDWLRQRIWKHVHDQJOHVLVEDVLVRIWKLVPHWKRGDQGLWJLYHVXVDSRVVLELOLW\WRFDOFXODWHDQGDQDO\]H FU\VWDO¶VIHDWXUHVZHDUHLQWHUHVWHGLQ2QHRIWKHPDLQSUREOHPVZLWKVFLQWLOODWLRQFU\VWDOVLVVWUXFWXUH¶V KHWHURJHQHLW\WKDWOHDGVWRGLIIHUHQWYDOXHRIFKDUDFWHULVWLFVWKDWDUHHVVHQWLDOIRUIXUWKHUFDOFXODWLRQVDQG XVHRILQYHVWLJDWLQJFU\VWDOLQYDULRXVVFKHPHV7KHUHDUHFXUUHQWO\PDQ\HOOLSVRPHWULFDOPHWKRGVXVHGLQ GLIIHUHQWFDVHVRQHRIWKHPRVWSRSXODULVEDVHGRQQRQQRUPDOOLJKWLQFLGHQFHWKDWODWHUUHIOHFWVIURP WKH FU\VWDO¶V VXUIDFH WR WKH DQDO\]HU +RZHYHU LQ WKLV VWXG\ LW LV QRW YHU\ HIIHFWLYH WR XVH LW GXH WR LPSRVVLELOLW\RIWDNLQJPHDVXUHPHQWVRQSDUWLFXODUOHYHOVRIKLJKQHVVIRUWRFRPSDUHUHIUDFWLYHLQGH[¶V YDOXH RQ WKH VDPH OHYHOV EXW GLIIHUHQW VXUIDFHV RI OLJKW LQFLGHQFH 'XULQJ WKLV H[SHULPHQW ZH XVHG HOOLSVRPHWHU/()0DVDQLQVWUXPHQWWKDWJLYHVXVDSRVVLELOLW\WRPDNHSUHFLVHPHDVXUHPHQWV7KLV GHYLFHZDVDOVRSUHIHUDEOHEHFDXVHRIHFRQRPLFUHDVRQV 'XULQJWKLVUHVHDUFKZHKDYHQRWLFHGQRQXQLIRUPLW\RIWKHFU\VWDO¶VUHIUDFWLYHLQGH[GLVWULEXWLRQ7KH UHVXOWVRIWKLVVWXG\DUHLPSRUWDQWIRUIXWXUHDSSOLFDWLRQRIWKHLQYHVWLJDWHGFU\VWDOLQVFKHPHVRIGLIIHUHQW GHYLFHVDQGWKH\ZLOOFHUWDLQO\EHXVHIXOIRUIXQGDPHQWDOXQGHUVWDQGLQJRIVFLQWLOODWLRQFU\VWDO¶VIHDWXUHV DQGKRZLWVDGYDQWDJHVDQGGLVDGYDQWDJHVFDQEHWDNHQLQWRDFFRXQW2QWKHRWKHUKDQGWKHVHUHVXOWVDUH RQ FRQVLGHUDEOH SUDFWLFDO LPSRUWDQFH LQ WHUPV RI RSWLPL]DWLRQ RI WKH VFLQWLOODWLRQ FU\VWDOV RSHUDWLRQDO FRQGLWLRQVIRULPSURYLQJWKHLUIXQFWLRQDOLW\ P4-4 FPGA-accelerated one-dimensional Fourier reconstruction LCD defect detection algorithm Yin-Fei Pan, Rong-Sheng Lu* School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China *Email: [email protected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on-destructive rapid inspection methods for sptial light modulator using swept source optical coherence tomography Pingping Jia1,2*, Hong Zhao1, Yuwei Qin2, Meiqi Fang1, Xiaopeng Guo1 1State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049, 103 China 2School of Mathematics and Physics, Weinan Normal University, Weinan, 714000, China *Email: [email protected] $ KLJK VSHHG VZHSW VRXUFH RSWLFDO FRKHUHQFH WRPRJUDSK\ 662&7 V\VWHP KDV EHHQ SURSRVHG IRU WRPRJUDSKLFPDSRIVSDWLDOOLJKW PRGXODWRU ,QWKHRSWLFDODUUDQJHPHQWDVZHSWVRXUFHZLWKN+] D[LDOVFDQQLQJ UDWH DQG D FRPSDFW 0LFKHOVRQ LQWHUIHURPHWHU ZDV DSSOLHG 7KH LPSOHPHQWHG 662&7 V\VWHP KDV DQ D[LDO UHVROXWLRQ RI ȝP DQG SHQHWUDWLRQ GHSWK RI PP 7KH WZRGLPHQVLRQDO WRPRJUDSKLFJUD\VFDOHPDSVRIWKHVDPSOHFDQEHREWDLQHGLQUHDOWLPH$VDUHVXOWWKHWKLFNQHVVRIJODVV VXEVWUDWHOLTXLGFU\VWDOOD\HUDQGWKHVLOLFRQVXEVWUDWHFRXOGEHREWDLQHGVLPXOWDQHRXVO\&RPSDUHGZLWK WKH WUDGLWLRQDO GHWHFWLRQ PHWKRGV 7KH 662&7 V\VWHP KDV WKH FKDUDFWHULVWLFV RI IDVW LPDJLQJ VSHHG VWDEOHUHSHDWDELOLW\RIPHDVXUHPHQWZLWKKLJKUHVROXWLRQDQGQRQGHVWUXFWLYH P4-6 Image displacement analysis for electro-optical system for deflection measurement of floating docks Hoang Anh Phuong, Alexey A. Gorbachev, Igor A. Konyakhin Department of Optical and Electronic Devices and Systems, ITMO University, 49, Kronverkskiy pr., Saint- Petersburg, 197101, Russia *Email: [email protected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odified visible offner imaging spectrometer with low F number and large field of view Qian Zhou1, Peng Yan1, Xinghui Li1*, Kai Ni1, Xiaohao Wang1,2,3 1Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China 2Research Institute of Tsinghua University in Shenzhen, Shenzhen 518057, China [email protected] *Email: [email protected] '\VRQDQGRIIQHUDUHWZRW\SLFDOFRQFHQWULFLPDJLQJVSHFWURPHWHUFRQILJXUDWLRQZLWKGXDOWHOHFHQWULFLW\ LQ REMHFW DQG LPDJH VSDFHD VPDOO ) QXPEHU ORZ VPLOH DQG NH\VWRQH HWF ,Q VRPH FRQGLWLRQ VXFK DV 2FHDQFRORUUHPRWHVHQVLQJWKHLPDJHVSHFWURPHWHUVUHTXLUHVPDOOHU)QXPEHUWRREWDLQKLJKHUOXPLQRXV IOX[+RZHYHUZKHQ)QXPEHULVVPDOOHURIID[LVDEHUUDWLRQEHFRPHVODUJHU,QYLVLEOHZDYHEDQGWKH VSHFWUDOUHVSRQVHEDQGRIWKHVHOHFWHGYLVLEOHGHWHFWRULVaȝPZLWKîSL[HOQXPEHUVDQG îȝPSL[HOVL]H:KHQ)QXPEHULVZHVHOHFW%.DVPDWHULDORIWKHSODQRFRQYH[OHQVDQG XVHWUDGLWLRQDOWZRZDYHOHQJWKDVWLJPDWLVPPHWKRGWRGHVLJQWKHYLVLEOHLPDJLQJVSHFWURPHWHUEDVHGRQ '\VRQFRQILJXUDWLRQ,QUHVXOWLQJ'\VRQVSHFWURVFRSLFLPDJLQJV\VWHPWKHSODQRFRQYH[KDVDWKLFNQHVV PP P4-8 Modified short-wave offner imaging spectrometer with low F number and large field of view Qian Zhou1, Peng Yan1, Xinghui Li1*, Kai Ni1, Xiaohao Wang1,2,3 1Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China 2Research Institute of Tsinghua University in Shenzhen, Shenzhen 518057, China [email protected] 104 *Email: [email protected] '\VRQDQGRIIQHUDUHWZRW\SLFDOFRQFHQWULFLPDJLQJVSHFWURPHWHUFRQILJXUDWLRQZLWKGXDOWHOHFHQWULFLW\ LQ REMHFW DQG LPDJH VSDFHD VPDOO ) QXPEHU ORZ VPLOH DQG NH\VWRQH HWF ,Q VRPH FRQGLWLRQ VXFK DV 2FHDQ FRORU UHPRWH VHQVLQJ WKH LPDJLQJ VSHFWURPHWHUV UHTXLUH VPDOOHU ) QXPEHU WR REWDLQ KLJKHU OXPLQRXVIOX[+RZHYHUZKHQ)QXPEHULVVPDOOHURIID[LVDEHUUDWLRQEHFRPHVODUJHU,QVKRUWZDYH LQIUDUHG ZDYH EDQG WKH VSHFWUDO UHVSRQVH EDQG RI WKH VHOHFWHG YLVLEOH GHWHFWRU LV aȝP ZLWK îSL[HOQXPEHUVDQGîȝPSL[HOVL]H:KHQ)QXPEHULVZHVHOHFWIXVHGVLOLFDDVPDWHULDO RIWKHSODQRFRQYH[OHQVDQGXVHWUDGLWLRQDOWZRZDYHOHQJWKDVWLJPDWLVPPHWKRGWRGHVLJQWKHYLVLEOH LPDJLQJVSHFWURPHWHUEDVHGRQ'\VRQFRQILJXUDWLRQ,QUHVXOWLQJ'\VRQVSHFWURVFRSLFLPDJLQJV\VWHP WKHSODQHFRQYH[KDVDWKLFNQHVVRI PP7KLVW\SHRIOHQVLVGLIILFXOWWRPDQXIDFWXUHLQSUDFWLFH DQGWKH'\VRQFRQILJXUDWLRQDOVRKDVWKHSUREOHPRIGHWHFWRUSODFHPHQW P4-9 Choice of optimal resolution and array for integrated photosynthetically active radiation spectroradiometer S.S. Baev1,2*, I.A. Konyakhin1, V.V. Korotaev1, V.N. Kuzmin2, A.A. Maraev1, K.A. Tomsky2 1ITMO University, St. Petersburg, 197101, Russian Federation 2TKA Scientific Instruments, St. Petersburg, 192289, Russian Federation *Email: [email protected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oster 5 Sensors, Converters, and Control System P5-1 Combining compound eyes and human eye: a hybrid bionic imaging method for FOV extension and foveated vision Zihan Wang1, Jie Cao1, Qun Hao1*, Fanghua Zhang1 1School of optics and photonics, Beijing Institute of Technology, Key Laboratory of Biomimetic Robots and Systems, Ministry of Education, Beijing 100081, China 2NUS Suzhou Research Institute (NUSRI), Suzhou, Industrial Park, Suzhou 215123, China *Email: [email protected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arameter identification of inertial velocity sensor for low-frequency vibration measurement Junzhong Li, Lei Wang*, Bo Zhao, Guolong Zhao, Jing Wang, Zhen Zhang, Jiamin Chen, Shitong Wang Institute of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150001, P.R. China *Email: [email protected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icrofluidic contact lens for continuous non-invasive intraocular pressure monitoring Hongbin An, Liangzhou Chen*, Xiaojun Liu, Bin Zhao State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China. *Email: [email protected] 7KLVSDSHUSURSRVHVDPLFURIOXLGLFFRQWDFWOHQVIRUFRQWLQXRXVQRQLQYDVLYHLQWUDRFXODUSUHVVXUH ,23 PRQLWRULQJ7KHPLFURIOXLGLFFRQWDFWOHQVLVWKHUHIHUHQFHVHQVLQJVWUXFWXUHDQGIDEULFDWHGE\XVLQJWKH FKHPLFDO DVVLVWHG ERQGLQJ DQG QH[W WKHUPRIRUPLQJ WHFKQRORJLHV 7KH FXUYDWXUH RI WKH FRQWDFW OHQV LV PDGHFRUUHVSRQGVVXEVWDQWLDOO\WRWKDWRIFRUQHDVRDVWKDWWKH3'06 3RO\GLPHWK\OVLOR[DQH VHQVLQJ OD\HUFDQZHDURQFRUQHDWR³IHHOLQJ´LWVH[SDQVLRQ7KHFRUQHD¶VGHIRUPDWLRQLVYDULHGLQSDFHZLWK,23 ZKLOHWKH,23FDQEHVLPSO\PRQLWRUHGE\XVLQJWKHVPDUWSKRQHWRRSWLFDOO\GHWHFWWKHPRYHPHQWRI YLVLEOHOLTXLGLQWKHPLFURFKDQQHOV7KHVLPXODWLRQDQGPHDVXUHPHQWUHVXOWVRIWKHGHYLFHVZLWKGLIIHUHQW GHVLJQVDUHSUHVHQWHGVKRZLQJDJRRGOLQHDULW\LQWKHPHDVXUHPHQWRIDUWLILFLDOH\HSUHVVXUHWHVWV,QQH[W ZRUN WKH GHYLFHV ZLOO EH UHGHVLJQHG WR PHHW WKH QHHGV RI LQWUDRFXODU SUHVVXUH PRQLWRULQJ DQG WHVW LQ YLYR P5-4 Revise compensation to the angle estimate error using multi-groups sensor Shuxian Wang1, Donglin Peng1,2, Zhiyi Wu2, Tianheng Zhang2, Yangyang Wang2 1Hefei University of Technology School of Instrumentation Science and Opto-electronics, Hefei 23009, China 2Chongqing University of Technology. Engineering Research Center of Mechanical Testing Technology and Equipment Ministry, Chongqing 400054, China *Email: [email protected] 7KHPDJQHWRUHVLVWDQFH 05 VHQVRUKDVEHHQVXFFHVVIXOO\GHPRQVWUDWHGLQURWDWLRQDOVSHHGDQGSRVLWLRQ GHWHFWLRQKRZHYHUWKHXQHYHQPDJQHWLFILHOGRUWKHLQVWDOODWLRQHFFHQWULFLW\DUHDOOGHFUHDVHWKHVLJQDO TXDOLW\ DQG LQIOXHQFH WKH UHOLDELOLW\ RI PHDVXUHPHQW 7KHUHIRUH WKLV SDSHUSUHVHQWV WKH WKHRU\ RI WLPH JUDWLQJ LQ GLVSODFHPHQW FDOFXODWLRQ DQG SURSRVHV D UHYHUVH FRPSHQVDWLRQ PHWKRG XVLQJ PXOWLJURXSV VHQVRUWRLPSURYHPHDVXUHPHQWSHUIRUPDQFH$SDLURIOLQHDUWXQQHOPDJQHWRUVLVWDQFH 705 VHQVRUVDUH VSDWLDOO\GLVSODFHGE\ HOHFWULFDODQGH[FLWHGE\VLQRUFRVVLJQDOV7KHRWKHUSDLUVVHQVRUVDUHUHYHUVH SODFHGDQGHOHFWULFDOGHJUHHVDSDUWWRWKHIRUPHU$FRPSHQVDWHGWUDYHOLQJZDYHLVJRWZKRVHSKDVH LVSURSRUWLRQDOWRWKHGLVSODFHPHQWRIURWDWLRQ7KHDQJOHGLVSODFHPHQWLVPHDVXUHGE\FRXQWLQJWKHWLPH SXOVHVWKDWVHUYHDVPHDVXUHPHQWVWDQGDUGV7KHHIIHFWLYHQHVVRIWKHSURSRVHGVFKHPHLVYHULILHGWKURXJK DSURWRW\SHSHUPDQHQWPDJQHWPRWRUV\VWHP7KDWVKRZVWKHDPSOLWXGHRIWKHPHDVXUHPHQWHUURUIURP WKH WR ZKLFK UHGXFHV E\ WKH VSHFLDO DUUDQJHPHQW RI WKH PXOWLJURXSV 705 VHQVRUV (YHQ WKRXJK WKH PDJQHWLF VHQVRU SUHVHQWHG KHUH XVHV 705 VHQVRUV WKH SURSRVHG WHFKQLTXH LV VXLWHG ZLWKRXWDQ\PRGLILFDWLRQIRU+DOODQGRWKHU05VHQVRUVDVZHOO P5-5 Soil moisture sensor design based on fiber Bragg grating Kejun Yan*, Jun Liu, Na Sun, Wenting Zhong School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an 710048, China *Email: [email protected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a5+WKHVHQVLWLYLW\LVSP5+DQGWKHDFFXUDF\RIWKHVHQVRULV P5-6 Dynamic sensitivity distribution of linear electrostatic sensor matrix Heming Gao*, Bingyan Fan, Huiwen Deng, Yingxing Min, Jun Liu Mechanical and Precision Instrument Engineering, Xi an University of technology, No. 5, Jinhua South Road, Shanxi Prov, Xi’an 710048, China *Email: [email protected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ias electric field distribution analysis for a non-contact nano-probe based on tunneling effect Xingyuan Bian, Junning Cui*, Jiubin Tan Department of Automatic test and Control, Harbin Institute of Technology, Harbin, 150080, PR China *Email: [email protected], [email protected], [email protected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he meat product quality control by a polarimetric method Anastasia A. Blokhina*, Victoria A. Ryzhova, Valery V. Korotaev, Maksim A. Kleshchenok, Igor Konyakhin Department of Optical-Electronic Devices and Systems, ITMO University, Saint-Petersburg, Kronverkskiy pr., 49 Russia *Email: [email protected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ye positioning based on windowed gray-scale integral projection algorithm Jianmin Zhou1,2*, Faling Wang1,2, Chenchen Zhang1,2, Xiaosu Liao1,2 1School of Mechatronics & Vehicle Engineering, East China Jiaotong University, Nanchang, Jiangxi, 330013, China 2Key Laboratory of Ministry of Education for Conveyance and Equipment, Nanchang Jiangxi, 330013, China *Email: [email protected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sing carbon nanotube membrane as counter electrode in voltammetric electronic tongue system Yazhuo Li1*, Xiangdong Zhou2 1College of Physics and Information Engineering, Jianghan University, Wuhan 430056, China 2College of Mechanical Engineering, Hubei University of Technology, Wuhan 430068, China *Email: [email protected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utonomous time synchronization method of wireless ad hoc sensor network and its implementation on CC1350 system Sili Liu, Jianyun Chen*, Jiahao Li Instrument Science and Technology, National of Defense Technology, Changsha 410003, China *Email: [email protected] :LUHOHVVDGKRFVHQVRUQHWZRUNVKDYHEHHQXVHGPRUHDQGPRUHLQUHFHQW\HDUVDQGWKH\DUHPDLQO\XVHG LQWKHFRQWLQXRXVPRQLWRULQJRIFRPSOH[HQYLURQPHQW7KHORZSRZHUDQGGXDOIUHTXHQF\FKDUDFWHULVWLFV RI WKH 6LPSOH /LQN && /DXQFK 3DG PLFUR FRQWURO SODWIRUP DUH YHU\ VXLWDEOH IRU WKH UHVHDUFK RI ZLUHOHVVDGKRFVHQVRUQHWZRUNV%HFDXVHWKHV\QFKURQL]DWLRQRIHDFKQRGHFORFNLVWKHSUHPLVHRIWKH QRUPDOZRUNRIZLUHOHVVVHQVRUQHWZRUNWKLVSDSHUPDLQO\VWXGLHVWKHWLPHV\QFKURQL]DWLRQSUREOHPRI && GHYHORSPHQW ERDUG ,Q WKLV SDSHU WKH DGYDQWDJHV DQG GLVDGYDQWDJHV RI WKH H[LVWLQJ WLPH V\QFKURQL]DWLRQ PHWKRGV DUH DQDO\]HG WKHQ WKH /763 DOJRULWKP LV VHOHFWHG DW WKH HQG DQG WKH 108 H[SHULPHQWDO YHULILFDWLRQ LV FDUULHG RXW RQ 0$7/$% VRIWZDUH SODWIRUP DQG && V\VWHP 7KH H[SHULPHQWUHVXOWVKRZVWKDWWKHWLPHV\QFKURQL]DWLRQSUHFLVLRQDQGH[WHQVLELOLW\RIWKHDOJRULWKPFDQ PHHWWKHUHTXLUHPHQWRIQHWZRUNLQJ P5-12 Strain transfer characteristics of resistance strain-type transducer Zhigang Wang1, Chi Xiao1, Yinming Zhao2, Yongqian Li1*, Zili Zhou3 1Key Laboratory of Micro/Nano Systems for Aerospace of Ministry of Education, Northwestern Polytechnical University, Xian, Shaanxi, 710072, China 2Beijing Changcheng Institute of Metrology & Measurement, Beijing, 100095, China 3Chinese Aeronautical Establishment, Chaoyang District, Beijing, 100029, China *Email: [email protected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ependence of stress distribution in electrical strain gauges on micro- morphology of sensitive grids Zhigang Wang1, Chi Xiao1, Yunlong Mao1, Yinming Zhao2, Zili Zhou3, Yongqian Li1* 1Key Laboratory of Micro/Nano Systems for Aerospace of Ministry of Education, Northwestern Polytechnical University, Xian, Shaanxi, 710072, China 2Beijing Changcheng Institute of Metrology & Measurement, Beijing 100095, China 3Chinese Aeronautical Establishment, Chaoyang District, Beijing, 100029, China *Email: [email protected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aȝP LV UHODWLYHO\ ODUJH DQG WKH YDULDWLRQLVUHODWLYHO\JHQWOHLQȝPaȝP7KHVLQXVRLGDOFRQWRXUSHULRGVKRXOGEHFRQWUROOHGDERYH ȝP P5-14 A high resolution and response speed interrogation method for FBGs-based sensors Hong Dang, Kunpeng Feng, Xun Sun, Yihua Jin, Jiwen Cui*, Jiubin Tan Center of Ultra-precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150080, China *Email: [email protected] 5HFHQWO\ILEHU%UDJJJUDWLQJV )%*V KDYHSOD\HGVLJQLILFDQWUROHVLQDYDULHW\RIILHOGVVXFKDVRSWLFDO FRPPXQLFDWLRQ GLPHQVLRQDO PHWURORJ\ EXLOGLQJV KHDOWK PRQLWRULQJ XOWUDVRQLF ZDYHV DQG YLEUDWLRQ PHDVXUHPHQWSHWURFKHPLFDODQGRWKHUKDUVKUHPRWHHQYLURQPHQWVRZLQJWRWKHLUH[FHOOHQWSHUIRUPDQFHV 109 OLNHHOHFWURPDJQHWLFLQVHQVLWLYLW\KLJKDFFXUDF\DQGORQJWHUPVWDELOLW\,QJHQHUDO)%*VEDVHGVHQVRUV DUHXVXDOO\GHFRXSOHGE\GHWHFWLQJWKHYDULDWLRQVRI)%*V¶FHQWUDOZDYHOHQJWKZKHUHLQWKHDFFXUDF\DQG G\QDPLF FKDUDFWHULVWLFV RI WKH )%*VEDVHG VHQVLQJ DUHGLUHFWO\GHSHQGHQWRQ WKH VSHFWUXP UHVROXWLRQV DQGUHVSRQVHVSHHGRIWKHLQWHUURJDWLRQPHWKRG+RZHYHUFRQYHQWLRQDOVSHFWUXPLQWHUURJDWLRQPHWKRGV ZKLFK GLUHFWO\ XWLOL]H DQ RSWLFDO VSHFWUXP DQDO\]HU 26$ ZLWK D ORZ UHVROXWLRQ DQG UHVSRQVH VSHHG FDQQRW VDWLVI\ WKH UHTXLUHPHQWV RI GHWHFWLQJ VPDOO DQG G\QDPLF YDULDWLRQV RI WKH )%*V¶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oster 6 Optoelectronic System and Optical Instruments Design P6-1 Research and evaluation of geometric element data fitting software for coordinate measurement machine Xuewei Cui1, HengZheng Wei2*, Weinong Wang2 1China JiLiang University , Hangzhou 310018, China 2National Institute of Metrology, Beijing 100029, China *Email: [email protected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uper-resolution scanning microscopy with virtually structured illumination Su Zhang, Jingtao Li, Limin Zou*, Hui Zhong, Xuemei Ding Institute of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, No.2 Yikuang street, Harbin, China *Email: [email protected], [email protected], [email protected], [email protected], [email protected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³VKLIW´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oster 7 Laser Measurement Techniques and Instruments P7-1 Orthogonally polarized self-mixing grating interferometer for two-dimensional displacement measurement Liheng Shi, Dongmei Guo*, Lingwen Kong, Ming Wang, Wenkui Cai Jiangsu Key Lab on Opto-Electronic Technology, School of Physical Science and Technology, Nanjing Normal University, Nanjing 210023, PR China *Email: [email protected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ngle measurement for cross-line target image based on Fourier-polar transform algorithm Fuzhong Bai1*, Jun Kong1, Tieying Zhang2, Yongxiang Xu1, Xingrong Shi3 1College of Mechanical Engineering, Inner Mongolia University of technology, Huhhot, Inner Mongolia 010051, China 2Chifeng Product Quality and Measurement Inspect Institute, Chifeng, Inner Mongolia, 024005, China 3Beijing Xicheng College of Economic Science, Beijing 100035, China *Email: [email protected] ,Q YLVXDO GHWHFWLRQ ILHOGV EDVHG RQ OLQH VWUXFWXUHG OLJKW WKH DQDO\VLV RI RSWLFDO VWULSH LPDJH LV D NH\ SUREOHP)RUWKHFURVVOLQHWDUJHWLPDJHWKURXJKPHDVXULQJWKHDQJOHEHWZHHQWZROLQHDURSWLFDOVWULSHV WKHWDUJHWSRVLWLRQRUVRPHV\VWHP¶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nalysis of modern non-invasive methods of optoelectronic control of the skin Anastasia Bulykina*, Victoria Ryzhova, Valery Korotaev, Igor Konyakhin ITMO University, Saint-Petersburg 197101, Russian Federation. *Email: [email protected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ensing the atmosphere of coastal areas of laser detection methods Leonid Smirnov*, Victoria Ryzhova, Alexander Grishkanich, Igor Konyakhin Russia, Saint-Petersburg, ITMO University. *Email: [email protected] ,QWKLVSDSHUDZHDWKHUSKHQRPHQRQFDOOHGDKXUULFDQHLVFRQVLGHUHG0DMRUFRPSRQHQWVDUHFRQVLGHUHG DQG VHOHFWHG $IWHU WKH DQDO\VLV RI WKH FRPSRQHQWV WKH LQGLFDWRU VXEVWDQFHV DUH FKRVHQ DFFRUGLQJ WR ZKLFKWKHGHWHFWLRQRIWKHLQFLSLHQWSKHQRPHQRQZLOOEHFDUULHGRXWLQWKHIXWXUH7KHPHWKRGRIUHPRWH VHQVLQJLVFRQVLGHUHGIRUGHWHFWLQJVPDOOFRQFHQWUDWLRQVRILQGLFDWRUVXEVWDQFHVLQWKHDLU7KHVRXQGLQJ DUHDLVFKRVHQWRVWXG\WKHDWPRVSKHUHIRUWKHSUHVHQFHRILQGLFDWRUVXEVWDQFHV7KHUHVXOWVRIFDOFXODWLQJ WKHEDFNVFDWWHULQJSRZHUIRUVRPHLQGLFDWRUVXEVWDQFHVDUHSUHVHQWHGGHSHQGLQJRQWKHUDQJH P7-5 Cotton neps on-line measurement based on near-infrared structured light images fusion light images fusion Zhi-Feng Zhang*, Xue-Nian Fu, Jian-Wei Chen, Yu-Rong Li, Jia-Min Chang, Yu-Sheng Zhai, Li-Jie Geng Zhengzhou University of Light Industry *Email: [email protected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isplacement measurement with MEMS based slit sensor Hang Chen1, Yue Gao2, Peng Jin1, Jiubin Tan1, Jie Lin1* 1Center of Ultra-precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150080, China 2Beijing Aerospace Institute for Metrology and Measurement Technology, No. 1 South Dahongmen Road, Beijing 100076, China *Email: [email protected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tudy on the temperature characteristics of the triangular prisms ring cavity Jianning Liu1*, Zheng Lu2, Lina Ren1, Mingxing Jiao1, Xiaoyun Bian1 1School of Mechanical and Precision Instrument Engineering, Xi' an University of Technology, Xi' an, Shaanxi 710048, China 2North Jierui Opto-Electronics Technology Ltd, Xi' an, Shaanxi 710111, China *Email: [email protected] 7KH UHIUDFWLYH LQGH[HV RI SULVPV DUH DIIHFWHG E\ WHPSHUDWXUH KHQFH WKH RSWLFDO FKDUDFWHULVWLFV RI WULDQJXODUSULVPVULQJFDYLW\LVGLVWXUEHGHQRXJKWRDIIHFWWKHVWDELOLW\RIWKHODVHUJ\UR&RQVLGHULQJWKH WHPSHUDWXUH SHUWXUEDWLRQ WKH WUDQVPLVVLRQ PDWULFHV RI WKH UHIOHFWHG DQG UHIUDFWHG EHDPV RQ WKH SULVP VXUIDFHVKDYHEHHQPRGLILHG7KHPRGLILHGUHVXOWVDUHWKHROGîEHDPWUDQVIHUPDWULFHVDUHFRUUHFWHGWR QHZîPDWULFHVDQGWKHWHPSHUDWXUHSHUWXUEDWLRQVDUHDGGHG$FFRUGLQJWRWKHVHOIFRQVLVWHQWWKHRU\RI WKH ODVHU ULQJ FDYLW\ D SK\VLFDO PRGHO RI WKH ULQJ FDYLW\ OLJKW WUDQVPLVVLRQ ZLWK WKH WHPSHUDWXUH GLVWXUEDQFHKDVEHHQHVWDEOLVKHG7KHWKHRUHWLFDODQDO\VLVVKRZVWKDWZKHQWKHWHPSHUDWXUHYDULHVIURP ćWR ć WKH FKDQJHV RI WKH RSWLFDO FDYLW\OHQJWK IUHTXHQF\ RIIVHW DQG VFDOH IDFWRU DUH ȝP 0+]DQG îUHVSHFWLYHO\$QH[SHULPHQWDOV\VWHPRIWKHSULVPODVHUJ\URVFRSHKDVEHHQ HVWDEOLVKHGZKRVHWHPSHUDWXUHFDQEHFKDQJHGDQGWKHH[SHULPHQWDOUHVXOWVDJUHHZLWKWKHWKHRUHWLFDO YDOXHV P7-9 Doppler-shifted laser self-mixing interferometry for enhanced detection sensitivity Ke Kou*, Tianhong Lian, Cuo Wang, Guanlei Zhang School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an 710048, Shaanxi, China *Email: [email protected] 'XULQJ WKH ODVW VHYHUDO GHFDGHV ODVHU VHOIPL[LQJ LQWHUIHURPHWU\ 60, KDV DWWUDFWHG ORWV RI UHVHDUFK LQWHUHVW ZRUOG ZLGH PDLQO\ GXH WR LWV LQWULQVLF PHULW RI VHOIDOLJQPHQW KLJKVHQVLWLYLW\ DEVHQFH RI 113 FRPSOH[RSWLFDOFRPSRQHQWVDQGUHJDUGOHVVQHVVRIODVHUW\SHV$PRQJWKHOLWHUDWXUHVIRFXVLQJRQ60, WKHODVHUGLRGH /' LVWKHPRVWIUHTXHQWO\XWLOL]HGODVHUW\SHZKLOHWKHVROLGVWDWHODVHU 66/ KDVUDUHO\ EHHQ UHSRUWHG 7KH RSHQFDYLW\ W\SH 66/ KDV PRUH DGMXVWPHQW IOH[LELOLW\ EXW VXIIHUV IURP H[WHUQDO YLEUDWLRQDQGDLUGLVWXUEDQFHZKHUHDVWKHPLFURFKLS 0& 66/VKRZVPRUHFRPSDFWFRQILJXUDWLRQDQG VWDEOHSHUIRUPDQFHFDWFKLQJDWWHQWLRQIURPVRPHUHVHDUFKHUVDOUHDG\,WKDVEHHQUHSRUWHGWKDWDSDLURI DFRXVWRRSWLFPRGXODWRU $20 RQHXSVKLIWLQJWKHRWKHUGRZQVKLIWLQJ KDVEHHQHPSOR\HGWRDFKLHYH DSSURSULDWHIUHTXHQF\VKLIWVRIWKHRUGHURIa+]ZKLFKLVDSSUR[LPDWHO\WKHUHOD[DWLRQRVFLOODWLRQ IUHTXHQF\OHYHORIWKH0&%HQHILWLQJIURPWKLVXOWUDKLJKVHQVLWLYLW\DQGQRQFRRSHUDWLYHPHDVXUHPHQWV KDYH EHHQ GHPRQVWUDWHG +RZHYHU WKH $20 VFKHPH KDV WKH GUDZEDFNV RI KLJK FRVW DQG FRPSOH[ FRQILJXUDWLRQ7KLVPDQXVFULSWDLPVDWDQRWKHUIUHTXHQF\VKLIWLQJWHFKQLTXHZKLFKLVEDVHGRQ'RSSOHU HIIHFW WR PRYH WKH VKLIWHG IUHTXHQF\ WRZDUGV WKH UHOD[DWLRQ RVFLOODWLRQ IUHTXHQF\ RI D 0& WR IXUWKHU HQKDQFHWKH60,VHQVLWLYLW\ P7-10 Aerosol particle size distribution retrieval algorithm and error analysis based on multi-wavelength radar Haiyan Hou, Jun Liu*, Wenting Zhong, Kejun Yan, Huige Di School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an, 710048, China *Email: [email protected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omparison and analysis of automatic focusing methods on pure phase objects in digital holographic microscopy Yun Liu*, Xuan Li, Junhong Xing, Mingxing Jiao Key Lab of NC Machine Tools and Integrated Manufacturing Equipment of the Education Ministry & Key Lab of Mechanical Manufacturing Equipment of Shananxi Province, Xi’an University of Technology, Xi’an, 710048, China *Email: [email protected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esearch on the key technology of detecting the defects of wheelset tread based 114 on photoelectricity Guili Xu*, Danyu Mu, Shuanggao Li, Huang Xiang, Dawei Zeng Nanjing University of Aeronautics and Astronautics *Email: [email protected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esearch on laser frequency locking system using orthogonally demodulated pound–drever–hall method Juan Su1,2, Mingxing Jiao1*, Jiang Fei1, Junhong Xing1 1Xi'an University of Technology, Faculty of Mechanical and Precision Instrument Engineering, No.5 South Jinhua Road, Xi’an, China, 710048 2Xi’an Shiyou University, School of Electronic Engineering, No.18 East Section Second Dianzi Road, Xi’an, China, 710065 *Email: [email protected] %DVHGRQWKHSULQFLSOHRIRUWKRJRQDOGHPRGXODWLRQD3RXQG'UHYHU+DOOODVHUIUHTXHQF\ORFNLQJVFKHPH LVGHYHORSHG,QWKHRUWKRJRQDOGHPRGXODWLRQ3RXQG'UHYHU+DOOV\VWHPWKUHHVLQHVLJQDOVDUHJHQHUDWHG VLPXOWDQHRXVO\XVLQJDGLUHFWGLJLWDOV\QWKHVL]HU$SKDVHVLQHVLJQDOLVXVHGWRGULYHDQHOHFWURRSWLF PRGXODWRUWRSURGXFHWKHSKDVHVLGHEDQGVDQGDQGSKDVHVLQHVLJQDOVDUHXVHGDVUHIHUHQFH VLJQDOVIRUSKDVHGHPRGXODWLRQ7KHSKDVHPRGXODWHGODVHUEHDPLVFRXSOHGZLWKDUHIHUHQFH)DEU\±3p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±3pURWFDYLW\FDQDXWRPDWLFDOO\WUDFNODVHUIUHTXHQF\YDULDWLRQ 115 P7-14 Non-destructive detection of seed viability based on biospeckle technique Ang Wu1,2, Juanhua Zhu1*, Zeliu Tao3 , Hao Zhang1 1College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou 450002, China 2School of Instrument Science˂Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, China 3Training Center, Hefei University of Technology, Hefei 230009, China *Email: [email protected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he structural optimal design and stability improvement of dual-axis optoelectronic level Ying Li, Zhifeng Lou*, Kuang-Chao Fan Dalian University of Technology, China *Email: [email protected], [email protected], [email protected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he possibility of measuring low altitudes above the sea surface with pulsed laser altimeter under conditions of fog and haze D.T. Nguyen*, E.G. Lebedko St. Petersburg National Research University of Information Technologies, Mechanics and Optics *Email: [email protected] $QDO\]HGEDFNVFDWWHULQJUHWXUQRIIRJDQGKD]HZLWKYDULRXVGHQVLW\:LWKFRQVLGHULQJWKHFRHIILFLHQWRI UHIOHFWLRQ IURP WKH VHD VXUIDFH OHVV WKDQ SURSRVHG PHDVXUHPHQW EDVHG RQ WKH GURS RI WKH EDFNVFDWWHULQJ UHWXUQ 'HWHUPLQHG WKH UDQJH DQG HVWLPDWHG HUURU RI PHDVXUHPHQW GHSHQGLQJ RQ WKH WUDQVIHU IXQFWLRQ RI WKH UHFHLYLQJDPSOLI\LQJ FLUFXLW LQ FDVH RI LQHUWLDO DQG QRQLQHUWLDO GHWHFWLRQ 'HWHUPLQHGWKHHQHUJ\FRPSHQVDWLRQIRUVSHFLILHGPHDVXUHPHQWSUHFLVLRQ P7-17 Characterization of surface roughness by double blanket model from laser speckle images L. Yang*, F. Ji, Y. Z. Zhang, M. J. Xu, J. J. Chen, R. S. Lu School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China 116 *Email: [email protected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esign, fabrication, identification and test of a closed-loop moving magnetic scanning module for RGB laser projector Chien-Kai Chung1*, Chen-Chang Lin1, Ming-Fu Chen1, Shih-Feng Tseng2 1Instrument Technology Research Center, National Applied Research Laboratories, No. 20 R&D Road VI, Hsinchu Science Park, Hsinch 30076, Taiwan, China 2Department of Mechanical Engineering, National Taipei University of Technology, 1 Sec. 3, ZhongXiao E. Rd., Taipei 10608, Taiwan, China *Email: [email protected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ata processing for Femur Model Laser scanning Beishen Wei1, Lin Zhou2* 1School of Mechanical and Electric Engineering, Guangzhou University, Guangzhou, China 2Fifth affiliated hospital, Guagnzhou University of Medicine, Guangzhou, China *Email: [email protected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n auto-gain based homodyne laser vibrometer with enhanced adaptability to reflectivity Ke Wang, Haijin Fu, Di Chang, Pengcheng Hu*, Hongxing Yang, Ruitao Yang, Jiubin Tan Institute of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China *Email: [email protected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real-time nonlinear error measurement method with picometer accuracy and free from target motion state Haijin Fu, Yue Wang, Ruidong Ji, Pengcheng Hu*, Hongxing Yang, Ruitao Yang, Jiubin Tan Instrument Science and Technology, Harbin Institute of Technology, Harbin 150080, China *Email: [email protected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oster 8 Instrument and Measurement System Calibration P8-2 Research on high accuracy calibration method of rotary axis of tube parts Guisuo Xia*, Junfeng Qin, Yanjun Fu, Ziyang Qin Key Laboratory of Nondestructive Testing of Ministry of Education, Nanchang Hangkong University, Nanchang, 330063, China *Email: [email protected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tudy on resonant high-acceleration calibration system Qi Lv1, Chenguang Cai2*, Guodong Zhai1, Zhihua Liu2, Jiachun Cheng1 1China University of Mining & Technology, Beijing, China, 100083 2National Institute of Metrology, Beijing, China, 100029 118 *Email: [email protected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esearch of the polarization-optical parameters of a solid-state matrix photomultiplier Anastasiya Y. Lobanova, Victoria A. Ryzhova, Konyakhin A. Igor* Department of Optical-Electronic Devices and Systems, ITMO University, 197101, Russia *Email: [email protected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eysight B1505A power device analyzer output pulse current calibration method Beichen Guo*, Shuqiang Wang, Jingjing Li, Zhi Sun Beijing Oriental Institute of Measurement and TestˈBeijing 100086, China *Email: [email protected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haracterization of beam splitter using Mueller matrix ellipsometry Song Zhang, Jiamin Liu, Hao Jiang*, Shiyuan Liu State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China *Email: [email protected] 119 3RODUL]DWLRQGLVWRUWLRQLVDSKHQRPHQRQZKLFKWKHSRODUL]DWLRQVWDWHRIRXWSXWOLJKWGHYLDWHVIURPWKH WKHRUHWLFDOH[SHFWDWLRQ'XHWRWKHGHVLJQGHIHFWVDQGSURFHVVOLPLWDWLRQVSRODUL]DWLRQGLVWRUWLRQLQEHDP VSOLWWHULVLQHYLWDEOHZKLFKUHVXOWVLQWKHVLJQLILFDQWHUURUVLQWKHRSWLFDOV\VWHPV$WKHRUHWLFDODQDO\VLV PHWKRG EDVHG RQ 0XHOOHU PDWUL[ LV SURSRVHG IRU FKDUDFWHUL]LQJ WKH EHDP VSOLWWHU ,Q WKH SURSRVH DSSURDFK SRODUL]DWLRQ GLVWRUWLRQ LQ WKH EHDP VSOLWWHU LQFOXGLQJ GHSRODUL]DWLRQ OLQHDU DQG FLUFXODU ELUHIULQJHQFH DQG OLQHDU GLDWWHQXDWLRQ FLUFXODU GLFKURLVP KDYH EHHQ FRQVLGHUHG :LWK WKH SURSRVHG PHWKRG ZH FDQ FKDUDFWHUL]H WKH EHDP VSOLWWHUV DQG H[WUDFW WKH UHODWHG HIIHFWLYH RSWLFDO SDUDPHWHUV RI SRODUL]DWLRQGLVWRUWLRQ7KH0XHOOHUPDWULFHVRIWZRGLIIHUHQWFRPPRQO\XVHGEHDPVSOLWWHUVPHDVXUHGE\ DFRPPHUFLDO0XHOOHUPDWUL[HOOLSVRPHWHU 00( DUHFRQVLVWHQWO\ILWWHGE\WKHSURSRVHGPHWKRGDQGWKH UHVLGXDOHUURUVKDYHVKRZQWKHLPSURYHPHQWFRPSDUHGWRWKHFRQYHQWLRQDOPHWKRGV P8-7 Parameter optimization of measuring and control elements in the monitoring systems of complex technical objects with triple reflector Maksim Kleshchenok*, Ivan Nekrylov, Anastasia Blokhina, Sergey Mednikov, Valery Korotaev, Igor Konyakhin Department of Optical-Electronic Devices and Systems, ITMO University, Kronverkskiy lane, 49, Saint-Petersburg, 197101, Russian Federation *Email: [email protected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avelength calibration system for diode laser Xiang Cheng, Xiaojun Liu*, Hongzhou Yan, Jian Luo, Hong Zhu, He Zhou School of Mech. Sci. &Eng, Huazhong Univ. of Sci. and Tech.,Wuhan 430074,China *Email: [email protected] &XUUHQWO\ WKH GLRGH ODVHU LV ZLGHO\ XVHG LQ WKH ILHOG RI RSWRHOHFWURQLFV HVSHFLDOO\ LQ SUHFLRXV PHDVXUHPHQWEDVHGRQODVHULQWHUIHURPHWU\,QWKHPHDVXUHPHQWODVHUZDYHOHQJWKVWDELOLW\LVHVSHFLDOO\ LPSRUWDQW6LQFHWKHODVHUZDYHOHQJWKLVHDV\WREHLQIOXHQFHGE\WKHHQYLURQPHQWDQGGULYHFXUUHQWUHDO WLPHPRQLWRULQJDQGFDOLEUDWLRQRIGLRGHODVHUZDYHOHQJWKLVSDUWLFXODUO\LPSRUWDQWIRULQWHUIHURPHWU\,Q WKLVSDSHUDUHDOWLPHZDYHOHQJWKPRQLWRULQJDQGFDOLEUDWLRQV\VWHPIRUGLRGHODVHUEDVHGLQWHUIHUHQFH PHDVXUHPHQWZDVGHYHORSHG7KHH[SHULPHQWV\VWHPZDVEXLOWDQGH[SHULPHQWVZHUHFRQGXFWHGWRYHULI\ WKHIHDVLELOLW\RIWKHV\VWHP P8-9 Analysis of the extraction accuracy of the corner point of the camera using polarization imaging Zhenmin Zhu*, Xinyun Wang, Quanxin Liu School of Electrical and Automation Engineering, East China Jiaotong University, Nanchang 330013, China *Email: [email protected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irectional phase-shift circular arrays targets for out-of-focus camera calibration Xu Liu, Rongsheng Lu* School of Instrument Science and Opto-electronic Engineering, HFUT, Hefei, 230009, China *Email: [email protected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abrication and characterization of nanostructure multi-step sample Xiaotong Wu1*, Shenghuai Wang1,2, Chunlong Zou1 1School of Mechanical Engineering, Hubei University of Automotive Technology, Shiyan, Hubei, 442002 2School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074 *Email: [email protected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tudy of gPhone gravimeter-119 for gravity variations observation during International Comparison of Absolute Gravimeters 2017 Qiyu Wang1, Lishuang Mou2, Jinyang Feng1*, Shuqing Wu1, Chunjian Li1, Duowu Su1 1National Institute of Metrology, Beijing 100029, China 2China Jiliang University, Hangzhou, Zhejiang 310018, China *Email: [email protected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ȝ*DOGXULQJWKH 121 SHULRGRI,&$* P8-13 A calibration method of micro device reconfigurable assembly system Ye Ruan* Dalian University of Technology, China *Email: [email protected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ĭPPDQGPPUHVSHFWLYHO\ P8-14 Study on the calibration technology of electrostatic field tester Na Feng, Ya-Fei Yuan*, Yu Zhang, Shan-Shan Ma, Qi-Zheng Ji Beijing oriental institute of measurement and test Beijing 100093 *Email: [email protected] 7KH FDOLEUDWLRQ RI WKH HOHFWURVWDWLF ILHOG WHVWHU LV RI JUHDW VLJQLILFDQFH IRU LPSURYLQJ WKH GHWHFWLRQ SUHFLVLRQRIWKHVSDFHSODVPDILHOGHQVXULQJWKHVDIHODXQFKRIWKHVDWHOOLWHDQGDFFXUDWHO\SUHGLFWLQJWKH OLJKWQLQJ DQG VR RQ +RZHYHU WKHUH LVQ¶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haracterization of a liquid crystal variable retarder by Mueller matrix ellipsometry Honggang Gu1, Peng Wei1, Xiuguo Chen1*, Hao Jiang1, Chuanwei Zhang1, Shiyuan Liu1* 1State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China *Email: [email protected], [email protected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arallelism measurement based on rail stack installation Yuchen Tian, Zhifeng Lou*, Kuang-chao Fan, Liang Xu, Ying Li Dalian University of Technology, China *Email: [email protected], [email protected], [email protected], [email protected], [email protected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elf-calibration method of precision shafting angle measurement error based on multiple reading heads Run Zhang, Wenhui Bao, Huining Zhao, Huakun Jia, Liandong Yu* School of Instrumation Science and Opto-electronics engineering, Hefei University of Technology, 230009, China *Email: [email protected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oster 10 Micro and Nano Optics P10-1 Optimization algorithm to shape optical beam for laser direct writing Danyang Li, Jian Guan, Peng Jin, Jie Lin* Center of Ultra-precision Optoelectronic Instrument, Harbin Institute of Technology, Harbin 150080, China *Email: [email protected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oster 11 Accuracy Theory and Uncertainty Analysis P11-1 A chi-square statistic of arithmetic mean and its application in inter-laboratory comparison Chenzhe Hang1,2, Guoyuan Ma1*, Jianli Liu3, Dinghua Xu2 1College of Environmental and Energy Engineering, Beijing University of Technology, Beijing, 100124, China 2Division of Energy and Environmental Measurement, National Institute of Metrology, Beijing, 100029, China 3Division of Electromagnetic Compatibility, Henan Institute of Metrology, Zhengzhou, 450008, China *Email: [email protected] 8QGHUWKHFRQGLWLRQWKDWFRPSDULVRQUHVXOWVDUH*DXVVLDQGLVWULEXWHGZLWKDFRPPRQPHDQDFKLVTXDUH VWDWLVWLFVRIDULWKPHWLFPHDQLVSURSRVHGDQGLQYHVWLJDWHGWKURXJKWKH0RQWH&DUORVLPXODWLRQ6LPXODWLRQ UHVXOWVVKRZWKDWWKHDULWKPHWLFPHDQKDVLWVRZQ Q± WKRUGHUFKLVTXDUHVWDWLVWLFVXQGHUWKHFRQGLWLRQ WKDW WKH XQFHUWDLQWLHV RI SDUWLFLSDQWV DUH FRPSDUDEOH )XUWKHUPRUH WKH GHQVLW\ FXUYH RI WKH SURSRVHG VWDWLVWLFVLVFRQILQHGEHWZHHQWKH Q± WKRUGHUDQGILUVWRUGHUFKLVTXDUHXQGHUWKHFRQGLWLRQWKDWWKH XQFHUWDLQWLHVRISDUWLFLSDQWVDUHLQFRPSDUDEOH+RZHYHUWKHH[SHFWHGYDOXHRIWKLVVWDWLVWLFVHTXDOVQ± ZKLFKLVXQDIIHFWHGE\WKHXQFHUWDLQWLHV%DVHGRQWKHVHSURSHUWLHVWKHSURSRVHGVWDWLVWLFVLVDSSOLHGWR WKHFRPPRQPHDQPRGHODQGWKHUDQGRPHIIHFWVPRGHOE\H[DPSOHV P11-2 Decoupling atmosphere Rayleigh-Brillouin scattering spectrum in kinetic regime Jiale Kang, Dengxin Hua, Tingyao He, Jingjing Liu, Qing Yan, Jun Wang* Mechanical and Precision Instrument, Xi'an University of Technology, Xian 710048, China *Email: [email protected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ased on MATLAB: the analysis of key comparison reference value (KCRV) and its uncertainty using Markov chain Monte Carlo (MCMC) method Haiyun Zhang1*, Dinghua Xu1, Jianli Liu2, Tiepeng Zhao3 1Division of Energy and Environmental Measurement, National Institute of Metrology, Beijing 100029, China 2Division of Electromagnetic Compatibility, Henan Institute of Metrology, Zhengzhou 450008, China 3Architectural Design Institute, China Academy of Building Research, Beijing 100013, China *Email: [email protected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ÀXHQFHZLWKWKHH[DPSOH P11-4 An expression method of CMC based on unitary linear regression equastion Jingjing Li*, Xiaoding Huang, Beichen Guo, Huan Zhang, Beibei Hu Beijing Oriental Institute of Measurement and Test, Beijing 100086, China *Email: [email protected] &DOLEUDWLRQDQG0HDVXUHPHQW&DSDELOLW\ &0& LVDFDOLEUDWLRQODERUDWRU\WKDWFDQSURYLGHFDOLEUDWLRQ DQGPHDVXUHPHQWFDSDELOLW\WRWKHXVHULQWKHQRUPDOFRQGLWLRQVWKH&0&KDVDYDULHW\RIH[SUHVVLRQV 5HJUHVVLRQDQDO\VLVLVDVWDWLVWLFDOWHFKQLTXHIRUVWXG\LQJFRUUHODWLRQEHWZHHQNH\TXDOLW\FKDUDFWHULVWLFV DQGWKHFDXVHYDULDEOHV$IWHULQGHSHQGHQWO\FROOHFWLQJQJURXSVRIH[SHULPHQWDOGDWD [L\L L « QZHFDQPHDVXUHWKHUHOHYDQF\EHWZHHQWKHWZRYDULDEOHVZLWKWKHFRUUHODWLRQFRHIILFLHQW$FFRUGLQJWR WKH VWLSXODWLRQV RI GLJLWDO PXOWLPHWHU¶V FDOLEUDWLRQ PHWKRG LQ --)lj&DOLEUDWLRQ 6SHFLILFDWLRQ IRU 0XOWLPHWHUVNJ ZH FDQ DQDO\]H WKH VRXUFHV RI WKH PHDVXUHPHQW XQFHUWDLQWLHV PDLQO\ LQFOXGHV WKH IROORZLQJ DVSHFWV XQFHUWDLQWLHV RI WKH PHDVXUHPHQWV LQWURGXFHG E\ WKH VWDQGDUG LQVWUXPHQWV XQFHUWDLQWLHVRIWKHPHDVXUHPHQWVLQWURGXFHGE\WKHPHDVXULQJLQVWUXPHQW¶VUHVROXWLRQ XQFHUWDLQWLHVRI WKH PHDVXUHPHQWV LQWURGXFHG E\ WKH PHDVXUH UHSHDWDELOLW\ 7KLV SDSHU DQDO\]H WKH FRPSRQHQWV RI WKH DERYHXQFHUWDLQWLHVDQH[SUHVVLRQPHWKRGRI&0&EDVHGRQXQLWDU\OLQHDUUHJUHVVLRQHTXDWLRQKDVJLYHQ 7DNH $JLOHQW $ 9 '& YROWDJH UDQJH DV DQ H[DPSOH ZKHQ WKH PHDVXUHG YDOXH LV 9 WKH XQFHUWDLQW\ FDOFXODWHG LV î9 ZKHQ WKH PHDVXUHG YDOXH LV 9 WKH XQFHUWDLQW\ FDOFXODWHG LV î9 7KH &0& FDQ EH H[SUHVVHG DV \ î[î LQ D VWUDLJKW OLQH ILWWLQJ RQ WKH $'&YROWDJH9UDQJH P11-5 Evaluation of task specific measurement uncertainty for gear measuring instrument using VGMI Peili Yin, Jianhua Wang* School of Mechatronic Engineering, Xi’an Technological University, Xi’an 710021 , China *Email: [email protected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robe error analysis of articulated arm coordinate measuring machine Zeliang Cai, Zai Luo, Hui Liu 125 China Jiliang Univerisity, Xueyuan Street, Xiasha Higher Education Zone, Jianggan District, Hangzhou, Zhejiang, China *Email: [email protected], [email protected], [email protected] 5HVHDUFKHG RQ WKH SUREH¶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ȝP 7KH DYHUDJH HUURU LV UHGXFHG IURP PP WR PPZKLFKLPSURYHGWKHPHDVXUHPHQWDFFXUDF\RIWKH$$&00 P11-7 Misjudgment risk estimation for product inspection based on measurement uncertainty Yinbao Cheng1*, Zhongyu Wang1, Xiaohuai Chen2, Hongli Li2, Jing Lü3, Huadong Fu3 1School of Instrumentation Science and Opto-electronics Engineering, Beihang University, Beijing 100191, China 2School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei 230009, China 3China National Accreditation Service for Conformity Assessment, Beijing 100062, China *Email: [email protected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oster 12 Advanced Measurement Techniques P12-1 A fast global calibration method for T-type 3D four-wheel aligner Dongzhao Huang*, Qiancheng Zhao Hunan Provincial Key Laboratory of Health Maintenance for Mechanical Equipment, Hunan University of Science and Technology, Xiangtan City, Hunan Province, China 411201 *Email: [email protected], [email protected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new method for measuring the geometrical characteristics of crankshaft in- situ Dongliang Liu, Peng Zheng*, Zhanxin Zhi Mechanical Engineering Institute of Zhengzhou University, Henan, China. *Email: [email protected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research on bolt loosening monitoring based on Lamb wave Qi Chang*, Heming Gao, Weixi Yang, Guoqiang Shi School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an, 710048, China *Email: [email protected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esign and implementation of flexible display reliability testing instrument Meng Su*, Linyi Huang, Huawei Xu China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, P. R. China *Email: [email protected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nstruments and equipment monitoring system based on the internet of things technology Meng Su*, Linyi Huang, Huawei Xu China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, P. R. China *Email: [email protected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he internal air gap measurement equipment for dynamic pressure motor Tongqun Ren*, Bo Qin, Xiangdong Xu, Zhirou Liu, Xiaodong Wang Dalian University of Technology, China *Email: [email protected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ȝP P12-7 Theoretical analysis and digital simulation of a new capacitive sensor Dianhong Yu*, Ximin Li, Lin Li School of Mechanical & Instrumental Engineering Xi’an University of Technology, Xi’an, Shaanxi, 710048, China *Email: [email protected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hase measuring method and error compensation in 3D profile measurement Yan Zhang1, Zili Zhang2,3, Yueqiang Li1, Weihu Zhou2,3*, Yang He1, Wei Li1 1School of Instrument Science and Opto-Electronics Engineering, Beijing Information Science & Technology University, Beijing, China 100192 2Academy of Opto-Electronics, Chinese Academy of Science, Beijing, P. R. China 100094 3University of Chinese Academy of Sciences, Beijing, 100049 *Email: [email protected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n underwater detecting system based on photoacoustic effect for underwater ranging and 3D topography measurement Qian Zhou, Kai Hu, Kai Ni, Xinghui Li *, Xiaohao Wang Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Tsinghua Campus, Xili University Town, Shenzhen, Guangdong, 518055, China *Email: [email protected] ,QWKLVSDSHUDQXQGHUZDWHUGHWHFWLQJV\VWHPEDVHGRQSKRWRDFRXVWLFHIIHFWIRUXQGHUZDWHUUDQJLQJDQG ' WRSRJUDSK\ PHDVXUHPHQW LV SURSRVHG 7KH EDVLF SULQFLSOH RI WKLV V\VWHP LV WR REWDLQ WKH GLVWDQFH EHWZHHQWKHWDUJHWDQGWKHGHWHFWLQJV\VWHPE\PHDVXULQJWKHSURSDJDWLRQWLPHRIVRXQGZDYHSURGXFHG E\ SKRWRDFRXVWLFHIIHFW RFFXUULQJ RQ WKH WDUJHW VXUIDFH ,Q WKLV SURSRVDO WKH SXOVHG ODVHU RI QP LV DGRSWHG $IWHU LW¶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compact design of optical scheme for a two-probe absolute surface encoder Xinghui Li, Yaping Shi, Peirong Wang, Kai Ni, Qian Zhou*, Xiaohao Wang Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Tsinghua 129 Campus, Xili University Town, Shenzhen, Guangdong, 518055, China *Email: [email protected] $QLPSURYHGRSWLFDOVFKHPHRISODQHHQFRGHULVSUHVHQWHGLQWKLVSDSHU7KHPRGXODWLRQRIGLIIUDFWLYH EHDPV IURP VFDOH JUDWLQJ DQG UHIHUHQFH JUDWLQJ LV DQDO\]HG V\VWHPDWLFDOO\ 2Q WKLV EDVLV LQGHSHQGHQW PRGXODWLRQ RI HLJKW GLIIUDFWLYH EHDPV IURP VFDOH JUDWLQJ DQG UHIHUHQFH JUDWLQJ ZLWK QR FURVV HIIHFW EHWZHHQHDFKRWKHULVDFKLHYHGZLWKDQLPSURYHGGHVLJQRIHDV\WRDGMXVWDQGVLPSOHLQVWUXFWXUHZKLFK LVORZFRVWDQGIOH[LEOHLQXVHGDQGFDQEHXVHGLQRSWLFDOVFKHPHRIOLQHDUHQFRGHU)XUWKHUWKHUHVHDUFK VXEGLYLGHV WKH RSWLFDO GHVLJQ LQWR WKUHH IXQFWLRQ DUHD PRGXODWLRQ RI GLIIUDFWLYH EHDPV RSWLFDO VXEGLYLVLRQ DQG SKRWRHOHFWULF GHWHFWLRQ 6HSDUDWH GHVLJQ GHFUHDVHV WKH FRXSOLQJ UHODWLRQVKLS EHWZHHQ YDULRXV RSWLFDO HOHPHQWV ZKLFK LPSURYHV WKH FRQYHQLHQFH RI RSWLFDO DOLJQPHQW DQG UHGXFHV WKH FXPXODWLYHHUURULQGHEXJJLQJSURFHVVWRDFHUWDLQH[WHQW,QWKLVVWXG\DVWDQGDUGLQWHUIHUHQFHUDQJLQJ V\VWHP LV VHW XS E\ XVLQJ D JUDWLQJ ZLWK D ȝP SHULRG 7KH W\SLFDO IRXU SDWK LQWHUIHUHQFH VLJQDOV DUH FROOHFWHG7KHTXDOLW\RIWKHLQWHUIHUHQFHVLJQDOYHULILHGWKHIHDVLELOLW\DQGVXSHULRULW\RIWKHLQQRYDWLYH GHVLJQ P12-14 Real-time distance measurement data processing platform based on absolute two-dimensional grating scale Xinghui Li, Su Xiao, Qian Zhou, Kai Ni*, Xiaohao Wang Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Tsinghua Campus, Xili University Town, Shenzhen, Guangdong, 518055, China *Email: [email protected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esign and testing of a compact optical lens module for multi-degree-of freedom grating interferometry application Xinghui Li, Xiang Xiao, Haiou Lu, Kai Ni, Qian Zhou *, Xiaohao Wang Division of Advanced Manufacturing, Graduate School at Shenzhen, Tsinghua University, Tsinghua Campus, Xili University Town, Shenzhen, Guangdong, 518055, China *Email: [email protected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ptical fiber Fabry-Perot acoustic sensor based on large PDMS diaphragm Han Zhou1, Bingkun Wu1, Mingguang Shan1, Lei Liu1, Haichao Yu2, Zhi Zhong1, Bin Liu1* 1College of Information and Communication Engineering, Harbin Engineering University, Harbin, Heilongjiang 150001, China; 2School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China *Email: [email protected] $Q H[WULQVLF )DEU\3HURW LQWHUIHURPHWULF ILEHU PLFURSKRQH EDVHG RQ 3'06 GLDSKUDJP ZDV SURSRVHG 7KHODUJHIUHHVWDQGLQJ3'06GLDSKUDJPZLWKDGLDPHWHURIPPLVSUHSDUHGE\DVLPSOH³VSLQVWULS´ SURFHVV([SHULPHQWDOUHVXOWVKRZVWKDWWKHIDEULFDWHGVHQVRUKDVDKLJKG\QDPLFSUHVVXUHVHQVLWLYLW\RI DERXWG%UHUDGȝ3DLQWKHUDQJHRIa+]7KHQRLVHHTXLYDOHQWDFRXVWLFVLJQDOOHYHORIWKH PLFURSKRQH OLPLWHG E\ WKH HQYLURQPHQWDO QRLVH LV DERXW ȝ3D+] $QG WKH G\QDPLF UDQJH LV WHVWHG WR EH PRUH WKDQ G% 7KH SURSRVHG PLFURSKRQH LV H[SHFWHG WR EH XVHG LQ WKH ILHOG RI ZHDN DFRXVWLFSUHVVXUHWHVWLQJ P12-18 System design of lithium battery internal resistance measurement using Labview Cun Chang1*, Tianjian Wu1, Wanfu Yang1, Hao Li2, Zhonghan Hao3, Qing Chang1 1College of Engineering, Heilongjiang University 2Heilongjiang Provincial Institute of Measurement & Verification 3East China University of Science and Technology *Email: [email protected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rror mapping for rotary axes of machine tools based on pose measurement principle Haitao Li1*, Jiangong Sun1, Xianming Gao1, Xinlong Yang2, Junjie Guo3 1Shaanxi University of Science & Technology 2Xi'an Institute of Space Radio Technology 131 3Xi'an Jiaotong University *Email: [email protected] /DVHUWUDFNHUKDVEHHQLQWURGXFHGVXFFHVVIXOO\IRUJHRPHWULFGHYLDWLRQVFDOLEUDWLRQRIPXOWLD[LVPDFKLQH WRROV ,Q WKLV SDSHU D QHZ PHWKRG FDOOHG ³SRVH PHDVXUHPHQW SULQFLSOH´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robe design of nano coordinate measuring machine based on grating strain sensor Fuan Cheng, Xugang Feng*, Jiayan Zhang Institute of electrical and information engineering, Anhui University of Technology, Anhui Ma’anshan 243032, China *Email: [email protected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mproved two dimensional micro-/nanoradian angle generator with single rotation center located on tilting plane and error compensation of capacitive sensors Fan Zhu*, Xinran Tan, Jian Shi, Yang Yu, Jiubin Tan* Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, 150080, Harbin, China *Email: [email protected], [email protected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utomatic real-time compensation of wavelength of heterodyne interferometer Wei Jin1, Qi Li2*, Yushu Shi2, Sitian Gao2, Wei Li2, Shi Li2 1College of Mechanical and Electrical Engineering, China Jiliang University, Hangzhou 310018, China 2National Institute of Metrology, Beijing 100029, China *Email: [email protected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xperimental study on non-linear calibration of two-dimensional nano- positioning stage Qi Zhou1,2, Qi Li2, Yu-Shu Shi2, Shi Li2, Lu Huang2, Si-Tian Gao2* 1School of Mechanical Engineering and Automation, Zhejiang Sci-tech University, Hangzhou, Zhejiang 310018, China 2National Institute of Metrology, Beijing 100029, China *Email: [email protected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ȝP DQG ȝP $IWHU FDOLEUDWLRQWKHPD[LPXPQRQOLQHDULW\RIWKH[D[LVLVQPDQGWKHPD[LPXPQRQOLQHDULW\HUURURIWKH \D[LVLVQP0HDQZKLOHDPDWKHPDWLFDOPRGHOLVHVWDEOLVKHGWRFDOFXODWHWKHFRXSOHGGLVSODFHPHQW DQG \DZ DQJOH 7KH DFWXDO FRXSOHG GLVSODFHPHQW DQG \DZ DQJOH RI ;?< ZHUH OLPLWHG WR QP DQG ȝUDG P12-24 Embedded intelligent camera algorithm based on hardware IP Guodong Liu, Qifeng Luo, Bingguo Liu*, Binghui Lu, Pan Guo Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China *Email: [email protected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ynthesis and metrology of cellulose nanocrystal films Cong Cao*, Dongsheng Zhao, Ying Tang, Tingting Peng Shandong Institute of Metrology, Jinan 250014, China *Email: [email protected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abrication process and error detection technologies for injection molding aspheric lens Lingcheng Liu, Xuemin Cheng* Graduate School at Shenzhen, Tsinghua University, Shenzhen, 518055, Guangdong ,P. R. China *Email: [email protected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eview of convolutional neural network optimization and training in image processing Yong Ren, Xuemin Cheng* Graduate School at Shenzhen, Tsinghua University, Shenzhen, 518055, Guangdong, P. R. China *Email: [email protected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esearch on key technologies of quadrupole electromagnetic tweezer He Ni, Jingtao Li, Limin Zou*, Peng Zhang, Xuemei Ding Department of Automatic Test and Control, Harbin Institute of Technology, Harbin 150001, China *Email: [email protected] ,Q WKLV SDSHU WKH TXDGUXSROH HOHFWURPDJQHWLF WZHH]HU LQVWDOOHG LQ D IOXRUHVFHQW PLFURVFRSH ZDV GHYHORSHGIRUWKHSXUSRVHRIDFKLHYLQJSUHFLVHFRQWURORIPDJQHWLFPLFURVSKHUHV¶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xtracting road edges from MLS point clouds via a local planar fitting algorithm Jingzhong Xu*, Ge Wang, Lina Ma, Jiarong Wang School of Remote Sensing and Information Engineering, Wuhan University, Wuhan, CHINA *Email: [email protected] $V WKH EDVLF HOHPHQW RI D URDG URDG HGJHV DUH RI JUHDW VLJQLILFDQFH IRU LQWHOOLJHQW WUDQVSRUWDWLRQ DQG XUEDQ IRXQGDWLRQDO JHRJUDSKLF LQIRUPDWLRQ FRQVWUXFWLRQ 0RELOH ODVHU VFDQQLQJ 0/6 SURYLGHV DQ HIIHFWLYHZD\WRH[WUDFWURDGLQIRUPDWLRQEXWLWLVGLIILFXOWWRH[WUDFWDFFXUDWHURDGHGJHVIURPDODUJH VFDOH GDWDVHW ZLWK FRPSOH[URDG FRQGLWLRQV ,Q WKLV SDSHU ZH SURSRVHD PHWKRG WR H[WUDFW URDG HGJHV IURP0/6GDWDEDVHGRQDORFDOSODQDUILWWLQJDOJRULWKP)LUVWVFDQQLQJOLQHVDUHH[WUDFWHGEDVHGRQWKH KRUL]RQWDO SURMHFWLRQ GLVWDQFH EHWZHHQ WKH ODVHU SRLQWV 6HFRQG D SODQDU ILWWLQJ PHWKRG LV DGRSWHG WR H[WUDFWURDGFXUESRLQWV5RDGFXUESRLQWVDUHWKHQFOXVWHUHGDQGRSWLPL]HGE\GLIIHUHQWLDWLQJWKHGLVWDQFH EHWZHHQURDGFXUESRLQWVDQGWKHDX[LOLDU\OLQH)LQDOO\DOLQHDUOHDVWVTXDUHVILWWLQJPHWKRGLVDSSOLHGWR REWDLQWKHURDGHGJHV7KUHHH[SHULPHQWDOGDWDVHWVZLWKPXOWLW\SHURDGPDUNLQJVZHUHXVHGWRHYDOXDWH WKHSHUIRUPDQFHRIWKHSURSRVHGPHWKRG7KHUHVXOWVGHPRQVWUDWHWKHIHDVLELOLW\DQGHIIHFWLYHQHVVRIWKH SURSRVHGPHWKRG P12-30 Optimization on metering accuracy of smart electricity meter by temperature compensation Lu Wang, Mingdong Lv, Xuerong Ye* Department of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China *Email: [email protected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esearch of variable-frequency big current calibration Xiaoding Huang1*, Yazhen Tong1, Jianzhen Cai1, Jianting Zhao2, Xin Zhang3 1Beijing Orient Institute of Measurement and Test, Beijing 100086, China 2National Institute of Metrology, China, Beijing 100102, China 3ShenyangZhongchuan Measurement Technology co., LTD, Shenyang 110179, China *Email: [email protected] 0HDVXULQJ 9DULDEOHIUHTXHQF\ ELJ FXUUHQW KDV D JUHDW WHFKQLFDO GLIILFXOW\ \RX ILUVW QHHG WUDQVIHU 9DULDEOHIUHTXHQF\ELJFXUUHQWWRVPDOOFXUUHQWLVHDV\WRPHDVXUHDQGWKHQWUDQVIHUYDULDEOHIUHTXHQF\ VPDOOFXUUHQWWRDYROWDJH,QWKLVSDSHUZHXVHVD]HURIOX[FXUUHQWWUDQVIRUPHUWUDQVIHUKLJKFXUUHQWLQWR D VPDOO FXUUHQW DIWHU WKHQ XVH D VKXQW WUDQVIHU DOWHUQDWLQJ FXUUHQW WR D YDULDEOH IUHTXHQF\ YROWDJH UHDOL]LQJKLJKDFFXUDF\YDULDEOHIUHTXHQF\ELJFXUUHQWFDOLEUDWLRQPHDVXUHPHQWXQFHUWDLQW\XSWRî 136 ZKLFKFDQPHHWWKHQHHGVRIWKHFXUUHQWFDOLEUDWLRQLWKDVEHHQXVHGLQPDQ\SURMHFWDQGDFKLHYHGJRRG UHVXOWV P12-32 Study on FMCW laser ranging technology based on nonlinear error compensation Jincheng Song, Lizhen Guo, Hao Zhu, Yinxiao Miao, Ke liu Beijing Aerospace Institute for Metrology and Measurement Technolog *Email: [email protected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a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aPWKHPHDVXUHPHQWHUURULVOHVVWKDQȝP 137