Electromechanical Properties and Defect Chemistry of High-Temperature Piezoelectric Materials

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Electromechanical Properties and Defect Chemistry of High-Temperature Piezoelectric Materials Electromechanical Properties and Defect Chemistry of High-Temperature Piezoelectric Materials Habilitationsschrift zur Erlangung der venia legendi f¨ur das Fachgebiet Materialwissenschaft Fakult¨at f¨ur Natur- und Materialwissenschaften der Technischen Universit¨at Clausthal vorgelegt von Dr. Holger Fritze Juni 2007 Abstract Conventional piezoelectric materials such as quartz are widely used as high precision transducers and sensors based on bulk acoustic waves. However, their operation temperature is limited by the intrinsic materials properties to about 500◦C. Anticipated high-temperature applications including thermo- gravimetry on small volumes and gas sensing based on stoichiometry change of thin sensor films are feasible by applying materials that retain their piezo- electric properties up to higher temperatures. Langasite (La3Ga5SiO14)and gallium phosphate (GaPO4) are promising candidates. Factors limiting po- tential use of those crystals include excessive conductive and viscous losses, deviations from stoichiometry and chemical instability. The objective of this work is to identify the related microscopic mechanisms, to correlate elec- tromechanical properties and defect chemistry and to improve the stability of the materials by e.g. appropriate dopants. Part I of this study is related to the electromechanical properties of lang- asite and gallium phosphate. They are determined at temperatures of up to 1050◦C and described by a one-dimensional physical model. The latter is de- veloped with special consideration of losses. Key properties relevant for stable operation of resonators are identified to be shear modulus, density, electrical conductivity and effective viscosity. In order to quantify their impact on fre- quency and damping, a generalized Sauerbrey equation is given. Further, an equivalent electrical circuit for high-temperature resonator devices is derived which makes the physical model handy for routine data evaluation. Temperature ranges of predominant viscosity and conductivity related losses are identified. Most remarkably, langasite and gallium phosphate res- onators are shown to exhibit bulk acoustic waves up to at least 1400 and 900◦C, respectively. Their mass sensitivity at elevated temperatures is about as high as that of quartz at room temperature. Temperature related fre- quency fluctuations can be compensated almost entirely by using higher vi- bration modes. Within its operation temperature range, gallium phosphate shows significantly lower losses than langasite. I Part II is focussed on mass and charge transport in single crystalline lan- gasite. Those phenomena are correlated with langasite’s defect chemistry and electromechanical properties. First of all, the dominant charge carriers are identified. Undoped langasite shows predominant ionic conduction at elevated temperatures. As long as the atmosphere is nearly hydrogen-free, the transport is governed by oxygen movement. A dominant role of hydro- gen is observed in hydrogenous atmospheres since the diffusion coefficient of hydrogen is orders of magnitude higher than that of oxygen. The loss in langasite is found to be governed up to about 650◦Cbyvis- coelastic damping related to the above mentioned movement of oxygen ions. Based on langasite’s defect chemistry donor doping is expected to lower that loss contribution and shown to be effective. Above 650◦C the impact of the conductivity related loss becomes pronounced. Here, lowering the conduc- tivity results generally in decreased losses. Further, the evaluation of langasite’s applicability is focused on mapping the regimes of gas insensitive operation. The most relevant feature with re- spect to frequency fluctuations of resonator devices is the formation of oxygen vacancies. The calculated frequency shift induced by redox related reactions only exceeds the limit of ± 4Hzbelow10−17 bar at 1000◦C, below 10−24 bar at 800◦Candbelow10−36 bar at 600◦C in nominally hydrogen free at- mospheres. Water vapor is found to shift the resonance frequency at higher oxygen partial pressures. In the hydrogen containing atmospheres applied here, langasite can be regarded as a stable resonator material above oxygen partial pressures of above 10−13 barat800◦Cand10−20 barat600◦C. The incorporation of OH-groups into the material determines the frequency shift. Finally, application examples are summarized to demonstrate the capa- bilities of high-temperature stable piezoelectric materials. II Contents 1 Introduction 1 1.1PiezoelectricResonators..................... 1 1.2OpenQuestions.......................... 4 1.3Objectives............................. 6 1.4ScopeofthisWork........................ 8 I Electromechanical Properties 9 2 Continuum-mechanical Models 11 2.1ThicknessShearModeResonators................ 11 2.2One-dimensionalPhysicalModel................. 13 2.3EquivalentCircuit........................ 24 2.4ResonatorQualityFactor..................... 31 2.5LimitationsoftheModels.................... 35 3 Parameter Study 37 3.1One-dimensionalPhysicalModel................. 37 3.2EquivalentCircuitModel..................... 46 4 Materials Properties 55 4.1FitProcedure........................... 55 4.2Results............................... 59 5 Resonance Properties 69 5.1ResonanceFrequency....................... 70 5.2TemperatureCompensation................... 72 5.3MassSensitivity.......................... 75 5.4ResonatorQualityFactor..................... 77 5.5MassResolution.......................... 77 5.6ImpactoftheMaterialsParameters............... 80 III II Atomistic Transport 83 6 Defect Chemistry of Langasite 85 6.1CationSites............................ 86 6.2HydrogenFreeAtmospheres................... 88 6.3HydrogenContainingAtmospheres............... 95 7 Mass and Charge Transport 99 7.1DiffusiveTransport........................ 99 7.2 Equilibration Times . .......................104 7.3 Ionic Conductivity . .......................106 7.4 Electrical Conductivity ......................107 7.5 Gallium Loss ...........................116 8 Correlation 121 8.1GasAtmosphereDependentFrequency.............121 8.2 Correlation of Loss and Conductivity . ............125 III Application Relevant Studies and Outlook 133 9 Application Relevant Studies 135 9.1GasSensorApplications.....................135 9.2Micro-ElectromechanicalStructures...............136 9.3High-temperatureStableElectrodes...............137 10 Outlook 141 10.1Models...............................141 10.2Materials.............................142 Summary 143 A Materials Data 147 B Effective Electrode Area 152 C Experimental Details 156 D Terms and Acronyms 165 Bibliography 171 IV Chapter 1 Introduction 1.1 Piezoelectric Resonators Quartz resonators vibrating in the thickness-shear mode are well known as Quartz Crystal Microbalances (QCM)1. Very small mass changes during film deposition onto resonators or gas composition dependent stoichiometry changes of thin films already deposited onto the resonators can be correlated with their resonance frequency shift [1, 2]. Thereby, specific surface affin- ity layers allow chemical sensing. Such devices are able to detect monolayer variations on its surface providing thereby a very high sensitivity. For exam- ple, changes in mass equivalent to 0.1 monolayers of oxygen atoms can be detected which enables the stoichiometry determination of surface oxides [3]. Fig. 1.1 presents a typical QCM setup which consists of a piezoelectric disk, key hole shaped electrodes and a sensor film. Anticipated application fields of such resonant sensors are the in-situ de- position rate monitoring during chemical vapor deposition, thermogravime- try on small volumes and gas sensing based on stoichiometry change of thin sensor films. Thus, operating conditions exceeding 500◦C are often required. Figure 1.1: Piezoelectric resonator operated in the thickness shear mode. 1Terms and acronyms are listed in Appendix D. 1 2 CHAPTER 1. INTRODUCTION Table 1.1: Operation temperature limits of piezoelectric materials. material temperature remarks reference limit [◦C] Li2B4O7 230 excessive ionic conductivity [6] LiNbO3 300 decomposition [6–9] LiTaO3 300 decomposition [6] α-quartz 573 phase transformation [4, 5] AlPO4 588 phase transformation [6, 19, 20] GaPO4 970 phase transformation [12–14] AlN ∼1000 oxidation resistance [15–18] langasite 1470 melting point [10, 11] As a consequence, conventional piezoelectric materials cannot be used. Their maximum operation temperature is limited by intrinsic materials properties such as phase transformations and high losses. For example, α-quartz un- dergoes a destructive phase transformation at 573◦C [4]. In practice, the maximum temperature of about 450◦Cisdeterminedbyhighlosses[5].Non- stoichiometric lithium niobate (LiNbO3) and lithium tetraborate (Li2B4O7) either decompose at 300◦C or exhibit phase transformations at 500◦C, re- spectively [6–9]. The operation of piezoelectric materials can be extended to higher temperatures by applying materials that retain their piezoelec- tric properties up to higher temperatures. Langasite (La3Ga5SiO14), its iso- morphs and gallium phosphate (GaPO4) are promising candidates for high- temperature applications. They enable operation temperatures significantly above 500◦C. The ultimate temperature limits are given by the melting point ◦ of langasite and the phase transition of GaPO4 at 1470 [10, 11] and 970 C [12–14], respectively. Aluminium nitride (AlN) can be, in principle, used up to 1150◦C. However, the lack of sufficiently large crystals and poor oxidation resistance prevent
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