E-PG PATHSHALA- Computer Science Computer Architecture Module 25 Memory Hierarchy Design - Basics

Total Page:16

File Type:pdf, Size:1020Kb

E-PG PATHSHALA- Computer Science Computer Architecture Module 25 Memory Hierarchy Design - Basics ,e-PG PATHSHALA- Computer Science Computer Architecture Module 25 Memory Hierarchy Design - Basics The objectives of this module are to discuss about the need for a hierarchical memory system and also discuss about the different types of memories that are available. The previous modules dealt with the Central Processing Unit (CPU), where we discussed about the Arithmetic and Logical Unit (ALU) and the control path implementation. We also looked at different techniques for improving the performance of processors by exploiting ILP. This module discusses about another component of the digital computer – viz., memory. Whenever we look at the memory system, we would want to have fast, large and also cheap memories. Now, having all that together is not possible. Faster memories are more expensive and may also occupy more space. Therefore, having all these features together in a memory system is not practical and the only solution to reap all the benefits is to have a hierarchical memory system. In a hierarchical memory system, the entire addressable memory space is available in the largest, slowest memory and incrementally smaller and faster memories, each containing a subset of the memory below it, proceed in steps up toward the processor. This hierarchical organization of memory works primarily because of the Principle of Locality. That is, the program accesses a relatively small portion of the address space at any instant of time. We are aware of the statement that the processor spends 90% of the time on 10% of the code. There are basically two different types of locality: temporal and spatial. – Temporal Locality (Locality in Time): If an item is referenced, it will tend to be referenced again soon (e.g., loops, reuse) – Spatial Locality (Locality in Space): If an item is referenced, items whose addresses are close by tend to be referenced soon (e.g., straightline code, array access) And for the past two decades or so, the hardware has relied on the principle of locality for providing speed. Temporal and spatial locality insure that nearly all references can be found in smaller memories and at the same time gives the illusion of a large, fast memory being presented to the processor. Figure 25.1 shows a hierarchical memory system. The faster, smaller and more expensive memories are closer to the processor. As we move 1 away from the processor, the speed decreases, cost decreases and the size increases. The registers and cache memories are closer to the processor, satisfying the speed requirements of the processor, the main memory comes next and last of all, the secondary storage which satisfies the capacity requirements. Indicated in the figure are also the typical sizes and access times of each of these types of memories. The registers which are part of the CPU itself have very low access times of a few hundreds of picoseconds and the storage space is a few thousand of bytes. The first level cache has a few kilobytes and the access times are only a few nanoseconds. The second level cache has a few hundred kilobytes and the access times increase to about 10 nanoseconds. The storage increases to a few megabytes in the case of the third level of cache, and the access times increase to a few tens of nanoseconds. The main memory has access times in the order of a few hundreds of nanoseconds, but also has larger storage. Storage is in order of terabytes for the secondary storage and the access times go to a few milliseconds. Following along the same lines, the figure also shows the memory hierarchy for a personal mobile device. Figure 25.1 2 Figure 25.2 Figure 25.2 shows the memory performance gap. Although people have come up with different technological advancements to increase the speed of the processors as well as memory, the memory speeds have not kept up with the processor speeds, as indicated in Figure 25.2. The hierarchical memory system tries to hide the disparity in speed by placing the fastest memories near the processor. Memory hierarchy design becomes more crucial with recent multi-core processors because the aggregate peak bandwidth grows with the number of cores. For example, Intel Core i7 can generate two references per core per clock. With four cores and 3.2 GHz clock, there are 25.6 billion 64-bit data references/second and 12.8 billion 128-bit instruction references= 409.6 GB/s. The DRAM bandwidth is only 6% of this (25 GB/s). Therefore, apart from a hierarchical memory system, we require different optimizations like Multi-port, pipelined caches, two levels of cache per core and shared third-level cache on chip. High-end microprocessors typically have more than 10 MB on- chip cache and it is to be noted that this consumes large amount of area and power budget. Different types of memory: There are different types of memory available. One classification is based on the access types. A Random Access Memory (RAM) has the same access time for all locations. There are two types of RAM – Dynamic and Static RAM. Dynamic Random Access Memory has high density, consumes less power, is cheap and slow. It is called dynamic, because it needs to be “refreshed” regularly. An SRAM - Static Random Access Memory has low density, consumes high power, is expensive and fast. Here, the content will last “forever” (until power is lost). We also have “Not-so-random” Access Technology, where the access time varies from location to location and from time to time. Examples for this type of memory include disks and CDROMs. There is also one more type of memory, viz., sequential access memory 3 where the access time is linear in location (e.g.,Tape). Normally, Dynamic RAM (DRAM) is used for main memory and Static RAM (SRAM) is used for cache. Static RAM: Figure 25.3 gives the construction of a typical SRAM cell. It requires six transistors for construction – hence the reduced density and increased cost. The six transistors are connected in a cross connected fashion. They provide regular and inverted outputs. Since it is implemented using CMOS process, it requires low power to retain the bit. Figure 25.3 Organization of SRAM Memory: Figure 25.4 shows the single dimensional organization of an SRAM memory consisting of 16 words of 4-bits each. The four address bits are given to the address decoder which selects one of the 16 words. All bits of that word are selected. Write Enable signal is used to enable the write operation. The Data input lines are used to write fresh data into the selected word and the Data output lines are used to read data from the selected word. 4 Figure 25.4 Dynamic RAM: A DRAM cell is made up of a single transistor and a capacitor, as shown in Figure 25.5, leading to reduced cost and storage space. However, this is a destructive read out. It needs to be periodically refreshed, say every 8 ms., but each row can be refreshed simultaneously. For a write operation, we have to drive the bit line and select the row. For a read operation, we have to precharge the bit line to Vdd and select the row. The cell and bit line share charges and there is very small voltage change on the bit line. The sense amplifier can detect changes of ~1 million electrons. Once the read is performed, a write is to be done to restore the value. Refresh is just a dummy read to every cell. The advantage of DRAM is its structural simplicity: only one transistor and a capacitor are required per bit, compared to four or six transistors in SRAM. This allows DRAM to reach very high densities. The transistors and capacitors used are extremely small; billions can fit on a single memory chip. Due to the dynamic nature of its memory cells, DRAM consumes relatively large amounts of power, with different ways for managing the power consumption. 5 Figure 25.5 Organization of DRAM Memory: Figure 25.6 shows the two dimensional organization of DRAM. The cells are arranged as a two dimensional array. The address lines are divided into two parts – one part used for the row decoder and the other part for the column decoder. Only the cell that is selected by the row and column decoder can be read or written. As always, though the Data input and Data output lines are not shown, they are used for the Write and Read operations, respectively. In order to conserve the number of address lines, the address lines can be multiplexed. The upper half of address can be transmitted first and then the lower half of the address. The Row Address Strobe (RAS) indicates that the row address is transmitted and the Column Address Strobe (CAS) indicates that the column address is being transmitted. Figure 25.6 Memory Optimizations: We know that even though faster memory technologies have been brought in, the speed of memory is still not comparable to the processor speeds. This is a major bottleneck. Recall Amdahl’s law which specifies that there will be a limitation on the overall performance if the common operations like memory operations are not speeded up. Memory capacity and speed should grow linearly with processor speed. However, unfortunately, memory capacity and speed has not kept pace with 6 processors. Therefore, we can think of some optimizations to improve memory accesses. The optimizations that are normally carried out are: – Multiple accesses to same row – Synchronous DRAM • Added clock to DRAM interface • Burst mode with critical word first – Wider interfaces – Double data rate (DDR) – Multiple banks on each DRAM device Different types of DRAM: Based on the optimizations performed, there are different types of DRAMS.
Recommended publications
  • Computer Architectures
    Computer Architectures Processor+Memory Richard Šusta, Pavel Píša Czech Technical University in Prague, Faculty of Electrical Engineering AE0B36APO Computer Architectures Ver.1.00 2019 1 The main instruction cycle of the CPU 1. Initial setup/reset – set initial PC value, PSW, etc. 2. Read the instruction from the memory PC → to the address bus Read the memory contents (machine instruction) and transfer it to the IR PC+l → PC, where l is length of the instruction 3. Decode operation code (opcode) 4. Execute the operation compute effective address, select registers, read operands, pass them through ALU and store result 5. Check for exceptions/interrupts (and service them) 6. Repeat from the step 2 AE0B36APO Computer Architectures 2 Single cycle CPU – implementation of the load instruction lw: type I, rs – base address, imm – offset, rt – register where to store fetched data I opcode(6), 31:26 rs(5), 25:21 rt(5), 20:16 immediate (16), 15:0 ALUControl 25:21 WE3 SrcA Zero WE PC’ PC Instr A1 RD1 A RD ALU A RD Instr. A2 RD2 SrcB AluOut Data ReadData Memory Memory A3 Reg. WD3 File WD 15:0 Sign Ext SignImm B35APO Computer Architectures 3 Single cycle CPU – implementation of the load instruction lw: type I, rs – base address, imm – offset, rt – register where to store fetched data I opcode(6), 31:26 rs(5), 25:21 rt(5), 20:16 immediate (16), 15:0 Write on rising edge of CLK RegWrite = 1 ALUControl 25:21 WE3 SrcA Zero WE PC’ PC Instr A1 RD1 A RD ALU A RD Instr.
    [Show full text]
  • 256M(16Mx16) GDDR SDRAM HY5DU561622CT
    HY5DU561622CT 256M(16Mx16) GDDR SDRAM HY5DU561622CT This document is a general product description and is subject to change without notice. Hynix Electronics does not assume any responsibility for use of circuits described. No patent licenses are implied. Rev. 1.3 / Oct. 2004 HY5DU561622CT Revision History Revision History Draft Date Remark No. 0.1 Defined Preliminary Specification Dec. 2002 0.2 Defined IDD Spec. Feb. 2003 0.3 Improvement of VDD from 2.8V to 2.5V in 300MHz Mar. 2003 0.4 Changed IDD Spec. Apr. 2003 0.5 166MHz Speed added. May. 2003 1) Changed VDD Value of HY5DU561622CT-33/36 from 2.5V to 2.6V 0.6 June 2003 2) Added tRC@Auto Precharge Parameter in AC CHARACTERISTICS - I 0.7 Added 350MHz Speed June 2003 0.8 Changed VDD/VDDQ min/max range of HY5DU561622CT- 33 /36 July 2003 1) Changed tRAS_max Value from 120K to 100K in All Frequency 0.9 2) Changed IDD6 value from 3mA to 4mA in All Frequency Aug. 2003 3) Changed Refresh Time from 64ms to 32ms in All Frequency 1.0 Refresh Time restore to 64ms from 32ms Jun. 2004 1.1 Insert AC Overshoot comment Aug. 2004 1.2 tRAS_max change Sep. 2004 1.3 tRAS_min & tQHS change Oct. 2004 Rev. 1.3 / Oct. 2004 2 HY5DU561622CT PRELIMINARY DESCRIPTION The Hynix HY5DU561622CT is a 268,435,456-bit CMOS Double Data Rate(DDR) Synchronous DRAM, ideally suited for the point-to-point applications which requires high bandwidth. The Hynix 16Mx16 DDR SDRAMs offer fully synchronous operations referenced to both rising and falling edges of the clock.
    [Show full text]
  • An Analysis of Solderability and Manufacturability of Moisture
    An Analysis of Solderability and Manufacturability of Moisture Sensitive Electronic Components After Long Term Environmentally Controlled Storage Channel One International LLC 400 N. Tampa St. Suite 2850 Tampa, FL 33602 By: Lee Melatti Copyright 2012 Channel One International LLC. and Lee Melatti Subject Device Description with RH of typically less than 1%. The specially The subject device is comprised of five (5) very large designed cabinets are data logged and alarmed with scale integrated circuits mounted on a high density remote monitoring to alert in the case of an out of multi-chip hybrid module. The part number of the specification event. The humidity control is dual hybrid module is 216T9NGBGA13FHG with a redundant and the subject devices remained within device description of ATI (now an AMD company) the controlled environment at all times prior to the Mobility Radeon ™ 9000 M9-CSP64 Graphics analysis. Processor Unit, RoHS compliant. The module is an FR4 material Printed Circuit Board (PCB) mounted The test units were put into long-term environmental with an ATI designed GPU circuit in a plastic storage on 11/10/2007. The storage conditions were encapsulated Fine Ball Grid Array (FBGA) package. maintained from that date until two (2) devices were This is then mounted on the bottom (ball) side of the removed from long-term storage on 11/30/2011 and PCB and conformal coated. Additionally, there are shipped to an independent firm for analysis. The four (4) 128Mbit GDDR SDRAM devices from independent engineering firm is a military and Samsung Semiconductor, part number K4D26323G- avionics system manufacturer with extensive VC33 in 144 ball FBGA packages, mounted to the experience in component quality analysis.
    [Show full text]
  • Product Guide SAMSUNG ELECTRONICS RESERVES the RIGHT to CHANGE PRODUCTS, INFORMATION and SPECIFICATIONS WITHOUT NOTICE
    捷多邦,您值得信赖的PCB打样专家! Apr. 2010 Consumer Memory Product Guide SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind. This document and all information discussed herein remain the sole and exclusive property of Samsung Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property right is granted by one party to the other party under this document, by implication, estoppel or other- wise. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where product failure could result in loss of life or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply. For updates or additional information about Samsung products, contact your nearest Samsung office. All brand names, trademarks and registered trademarks belong to their respective owners. ⓒ 2010 Samsung Electronics Co., Ltd. All rights reserved. - 1 - Apr. 2010 Product Guide Consumer Memory 1. CONSUMER MEMORY ORDERING INFORMATION 1 2 3 4 5 6 7 8 9 10 11 K 4 X X X X X X X X - X X X X SAMSUNG Memory Speed DRAM Temperature & Power Package Type Product Revision Density & Refresh Interface (VDD, VDDQ) Organization Bank 1. SAMSUNG Memory : K 7. Interface ( VDD, VDDQ) 2 : LVTTL (3.3V, 3.3V) 2. DRAM : 4 8 : SSTL_2 (2.5V, 2.5V) 3. Product Q : SSTL_18 (1.8V, 1.8V) 6 : SSTL_15 (1.5V, 1.5V) S : SDRAM H : DDR SDRAM K : POD_18 (1.8V, 1.8V) T : DDR2 SDRAM B : DDR3 SDRAM 8.
    [Show full text]
  • R60, R60e, R61, and R61i
    ® ThinkPad R60, R60e, R61, and R61i Hardware Maintenance Manual November 2007 This manual supports: ThinkPad R60 (MT 9455, 9456, 9457, 9458, 9459, 9444, 9445, 9460, 9461, 9462, 9463, 9464, 9446, and 9447) ThinkPad R60e (MT 0656, 0657, 0658, and 0659) ThinkPad R61 (MT 8942, 8943, 8944, 8945, 8947, 8948, and 8949) ThinkPad R61i (MT 0656, 0657, 0658, 0659, 9455, 9456, 9457, 9458, 9459, 9444, 9445, 9460, 9461, 9462, 9463, 9464, 9446, 9447, 8942, 8943, 8944, 8945, 8947, 8948, and 8949) ® ThinkPad R60, R60e, R61, and R61i Hardware Maintenance Manual Note Before using this information and the product it supports, be sure to read the general information under “Notices” on page 260. Third Edition (November 2007) © Copyright Lenovo 2007. All rights reserved. LENOVO products, data, computer software, and services have been developed exclusively at private expense and are sold to governmental entities as commercial items as defined by 48 C.F.R. 2.101 with limited and restricted rights to use, reproduction and disclosure. LIMITED AND RESTRICTED RIGHTS NOTICE: If products, data, computer software, or services are delivered ″ ″ pursuant a General Services Administration GSA contract, use, reproduction, or disclosure is subject to restrictions set forth in Contract No. GS-35F-05925. Contents About this manual . .1 Retaining serial numbers . .54 Removing and replacing a FRU . .57 1010 Battery pack . .58 Introduction . .3 1020 Ultrabay Enhanced device for R60, R61, and Important service information . .3 R61i . .59 Strategy for replacing FRUs . .3 1030 Hard disk drive cover, hard disk drive, and Strategy for replacing a hard disk drive . .4 hard disk drive rubber rails .
    [Show full text]
  • Product Selection Guide of CONTENTS
    http://www.BDTIC.com/Samsung Samsung Semiconductor, Inc. September 2006 Product Selection Guide http://www.BDTIC.com/SamsungTABLE OF CONTENTS M EM ORY AND STORAGE SYSTEM LSI SECTION A PAGE SECTION B PAGE DRAM ASICs 3b – 5b DDR3 SDRAM 3a ASIC ORDERING INFORMATION 6b DDR2 SDRAM 3a-4a LCD DRIVER ICs 7b – 8b DDR SDRAM 4a-5a LCD DRIVER IC ORDERING INFORMATION 9b SDRAM 6a-7a MOBILE APPLICATION PROCESSORS 10b RDRAM 7a CMOS IMAGE SENSORS 10b MOBILE SDRAM 8a MICROCONTROLLERS 11b-14b GRAPHICS DDR SDRAM 8a MICROCONTROLLER ORDERING INFORMATION 15b DRAM ORDERING INFORMATION 9a-11a SERIAL EPROMS 16b FLASH NAND, OneNAND, NOR FLASH 12a NAND FLASH ORDERING INFORMATION 13a TFT-LCD ASYNCHRONOUS SRAM SECTION C PAGE LOW-POWER SRAM 14a M ONITOR/INDUSTRIAL LCD PANELS LOW-VOLTAGE AND LOW-POWER SRAM 14a 15" , 17" 3c MICRO-POWER AND LOW-VOLTAGE SRAM 14a 19" 3c HIGH DENSITY, LOW POWER (UtRAM) 15a 20.1" , 21.3" 4c HIGH-SPEED ASYNCHRONOUS FAST SRAM 15a 22.0", 23.0", 24.0", 30.0" 4c ASYNCHRONOUS SRAM ORDERING INFORMATION 16a LCD TV/A.V. SYNCHRONOUS SRAM HD 23",26",32",40",46" 5c SPB & FT SRAM 17a-18a FULLHD 40", 46” , 52” , 57” 5c NtRAM 18a-19a M OBILE PHONES LATE-WRITE R-R SRAM 19a-20a MAIN DISPLAYS 6c DDR / II / II+ SRAM 20a-22a MAIN + EXTERNAL DISPLAYS 6c QDR / II / II+ SRAM 22a-23a INFORM ATION DISPLAYS SYNCHRONOUS SRAM ORDERING INFORMATION 24a 40",46",57",82" 7c M ULTI-CHIP PACKAGE DIGITAL IMAGING: ENTERTAINMENT NAND/DRAM 25a DSC/DVC/PHOTO PRINTERS/PMP/VOIP/GAMES 8c NOR/SRAM and NOR/UtRAM 26a M OBILE AV OneNAND/DRAM 26a MINI PCS/CNS/CAR TVS/P-DVDS/ 9c NOR/DRAM 26a INDUSTRIAL APPLICATIONS STORAGE HARD DISK DRIVES 27a OPTICAL STORAGE SOLUTIONS 28a-29a SAMSUNG SEMICONDUCTOR, INC.
    [Show full text]
  • W9412g2ib 1M × 4 Banks × 32 Bits Gddr Sdram
    W9412G2IB 1M × 4 BANKS × 32 BITS GDDR SDRAM Table of Contents- 1. GENERAL DESCRIPTION.................................................................................................................................4 2. FEATURES ........................................................................................................................................................4 3. KEY PARAMETERS...........................................................................................................................................5 4. BALL CONFIGURATION....................................................................................................................................6 5. BALL DESCRIPTION .........................................................................................................................................7 6. BLOCK DIAGRAM..............................................................................................................................................9 7. FUNCTIONAL DESCRIPTION .........................................................................................................................10 7.1 Power Up Sequence...........................................................................................................................10 7.2 Command Function ............................................................................................................................11 7.2.1 Bank Activate Command......................................................................................................11
    [Show full text]
  • 256M(16Mx16) Gddr SDRAM HY5DU561622ETP
    HY5DU561622ETP 256M(16Mx16) gDDR SDRAM HY5DU561622ETP This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any responsibility for use of circuits described. No patent licenses are implied. Rev. 1.1 / Oct. 2005 1 1HY5DU561622ETP Revision History Revision No. History Draft Date Remark 0.1 Defined Preliminary Specification Oct. 2004 0.2 VDD/VDDQ Define Apr. 2005 0.3 VDD/VDDQ, tDPL, tDAL change & CL5 insert Jul. 2005 1.0 tRCDWT Change (2clk -> 3clk) at 275/ 300/ 350MHz Speed bin Sep. 2005 1.1 Changed IDD3P value & Delete 166MHz speed bin Oct. 2005 Rev. 1.1 / Oct. 2005 2 1HY5DU561622ETP DESCRIPTION The Hynix HY5DU561622ETP is a 268,435,456-bit CMOS Double Data Rate(DDR) Synchronous DRAM, ideally suited for the point-to-point applications which requires high bandwidth. The Hynix 16Mx16 DDR SDRAMs offer fully synchronous operations referenced to both rising and falling edges of the clock. While all addresses and control inputs are latched on the rising edges of the CK (falling edges of the /CK), Data, Data strobes and Write data masks inputs are sampled on both rising and falling edges of it. The data paths are inter- nally pipelined and 2-bit prefetched to achieve very high bandwidth. All input and output voltage levels are compatible with SSTL_2. FEATURES • 2.5V +/-5% VDD and VDDQ power supply • Data outputs on DQS edges when read (edged DQ) supports 250/200 Mhz Data inputs on DQS centers when write (centered DQ) • 2.6V +/- 0.1V VDD/VDDQ power supply supports 300/ 275Mhz
    [Show full text]
  • Efficient Design and Communication for 3D Stacked Dynamic Memory
    EFFICIENT DESIGN AND COMMUNICATION FOR 3D STACKED DYNAMIC MEMORY An Undergraduate Research Scholars Thesis by ANDREW DOUGLASS Submitted to the Undergraduate Research Scholars program at Texas A&M University in partial fulfillment of the requirements for the designation as an UNDERGRADUATE RESEARCH SCHOLAR Approved by Research Advisor: Dr. Sunil Khatri May 2017 Major: Computer Engineering TABLE OF CONTENTS Page ABSTRACT .................................................................................................................................. 1 ACKNOWLEDGMENTS ............................................................................................................ 2 NOMENCLATURE ..................................................................................................................... 3 CHAPTER I. INTRODUCTION ...................................................................................................... 6 History of DRAM Architectures ........................................................................... 6 Rambus DRAM ................................................................................................. 10 Graphics DRAM ................................................................................................ 11 Current DIMM Issues ......................................................................................... 12 3D Stacked Memory ........................................................................................... 15 II. RING BASED MEMORY .......................................................................................
    [Show full text]
  • TU Wien Aktuelle Speichertechnologien (RAM)
    TU Wien Embedded Computing Systems Institut fur¨ Technische Informatik Mark Volcic 0425294 033/535 Aktuelle Speichertechnologien (RAM) Bakkalaureatsarbeit Im Rahmen der LVA SE Seminar mit Bakkalaureatsarbeit Betreuung: Andreas Steininger Wien, 1. Juni 2007 1 Inhaltsverzeichnis Abbildungsverzeichnis 4 Tabellenverzeichnis 6 1 Ubersicht¨ 7 2 Begriffserkl¨arung 8 2.1 random access – read only . 8 2.1.1 RAM – random access memory . 8 2.1.2 ROM – read only memory . 8 2.2 volatile – non volatile . 8 2.2.1 volatile memory . 8 2.2.2 non-volatile memory . 9 2.3 Latenzzeit versus Datendurchsatz . 9 3 DRAM – Klein und billig 11 3.1 Allgemeines . 11 3.2 Aufbau und Funktionsweise . 11 3.2.1 1-Bit-Speicherzelle . 11 3.2.2 Speichermatrix . 12 3.2.3 Lesen und Schreiben . 13 3.2.4 Refresh . 15 3.2.5 Zusammenfassung . 15 3.3 Technologien . 16 3.3.1 FPM-DRAM – Fast Page Mode DRAM . 16 Burst-Mode . 16 Beispiel . 16 Interleaving . 17 3.3.2 EDO-DRAM – Extended Data Out DRAM . 17 Beispiel . 18 3.3.3 Burst EDO . 18 3.3.4 SDRAM – Synchronous DRAM . 19 Beispiel . 20 Read-Timing . 20 Write-Timing . 20 3.3.5 RDRAM – Rambus DRAM . 21 3.3.6 DDR-SDRAM – Double Data Rate SDRAM . 22 Pins und Symbole . 22 Read-Timing . 23 Write-Timing . 24 Inhaltsverzeichnis 2 3.3.7 DDR2-SDRAM . 24 Terminierung . 25 Pins und Symbole . 26 Read-Timing . 26 Write-Timing . 27 3.3.8 DDR3-SDRAM . 28 3.4 Anwendungen . 29 3.4.1 Embedded DRAM . 29 3.5 Zusammenfassung . 29 3.5.1 Vorteile .
    [Show full text]
  • Chapter 5 - Internal Memory
    Chapter 5 - Internal Memory Luis Tarrataca [email protected] CEFET-RJ Luis Tarrataca Chapter 5 - Internal Memory 1 / 106 Table of Contents I 1 Introduction 2 Semiconductor Main Memory Timing Waveforms Major types of semiconductor memory Random-access memory Dynamic RAM (DRAM) Static RAM (SRAM) DRAM vs SRAM Read-only memory (ROM) Chip Logic Luis Tarrataca Chapter 5 - Internal Memory 2 / 106 Table of Contents II 3 Error Correction Hamming code 4 Advanced DRAM organization Synchronous DRAM (SDRAM) Double Data Rate SDRAM (DDR-SDRAM) Graphics Double Data Rate SDRAM (GDDR-SDRAM) High Bandwidth Memory (HBM) 5 References Luis Tarrataca Chapter 5 - Internal Memory 3 / 106 Introduction Introduction Previous chapter discussed memory. This chapter presents: • semiconductor main memory subsystems. • ROM; • DRAM; • SRAM memories • error control techniques used to enhance memory reliability • more advanced DRAM architectures; Luis Tarrataca Chapter 5 - Internal Memory 4 / 106 Introduction But why do we need these types of memories? Any ideas? Luis Tarrataca Chapter 5 - Internal Memory 5 / 106 Introduction But why do we need these types of memories? Any ideas? • Remember these guys? Luis Tarrataca Chapter 5 - Internal Memory 6 / 106 Introduction But why do we need these types of memories? Any ideas? • Remember these guys? • Serial memory takes different lengths of time to access information: • depends on where the desired location is relative to the current position; Luis Tarrataca Chapter 5 - Internal Memory 7 / 106 Semiconductor Main Memory Semiconductor
    [Show full text]
  • Displays, Memory and Storage Selector Guide
    DRAM FLASH - SSD FLASH MCP STORAGE DISPLAYS PRODUCT SELECTION DISPLAYS, MEMORY AND STORAGE GUIDE 1H 2017 CONTACTS Samsung Semiconductor, Inc. Samsung continues to lead the industry with the broadest portfolio of memory products and display technology. Its DRAM, flash, mobile and graphics memory are found in many computers — from ultrabooks to powerful servers — and in a wide range of handheld devices such as smartphones and tablets. Samsung is also a leader in display panels for smartphones, TVs and monitors and public information displays. In addition, Samsung provides the industry’s widest line of storage products from the consumer to enterprise levels. These include flash storage, such as Solid State Drives, and a range of embedded flash storage products. Markets DRAM SSD FLASH ASIC LOGIC LCD/OLED MOBILE/WIRELESS NOTEBOOK PCs/ ULTRABOOKS™ DESKTOP PCs/ WORKSTATIONS SERVERS NETWORKING/ COMMUNICATIONS CONSUMER ELECTRONICS www.samsung.com/us/samsungsemiconductor TABLE OF CONTENTS DRAM DRAM PAGES 4–13 samsung.com/dram • DDR4 SDRAM • Graphics DRAM • DDR3 SDRAM • Mobile DRAM • DDR2 SDRAM • Ordering Info FLASH - SSD PAGES 14–15 samsung.com/flash • eMMC • Solid State Drives (SSD) • Universal Flash Storage (UFS) MULTI-CHIP PACKAGES PAGES 16 samsung.com/mcp • eMMC + LPDDR2 • eMMC + LPDDR3 STorAGE PAGES 17–19 samsung.com/flash-ssd • Solid State Drives (SSD) DISPLAyS PAGES 20-21 samsungdisplay.com • Public Information Display (PID) • Indoor PID Product Classification • E-Board • SNB/UNB • Outdoor PID CONTACTS PAGES 22–23 samsung.com/semiconductor/sales-network
    [Show full text]