UCLA Electronic Theses and Dissertations
Total Page:16
File Type:pdf, Size:1020Kb
Load more
Recommended publications
-
Theoretical Modelling and Experimental Evaluation of the Optical Properties of Glazing Systems with Selective Films
BUILD SIMUL (2009) 2: 75–84 DOI 10.1007/S12273-009-9112-5 Theoretical modelling and experimental evaluation of the optical properties of glazing systems with selective films ArticleResearch Francesco Asdrubali( ), Giorgio Baldinelli Department of Industrial Engineering, University of Perugia, Via Duranti, 67 — 06125 — Perugia — Italy Abstract Keywords Transparent spectrally selective coatings and films on glass or polymeric substrates have become glazing, quite common in energy-efficient buildings, though their experimental and theoretical characterization selective films, is still not complete. A simplified theoretical model was implemented to predict the optical optical properties, properties of multilayered glazing systems, including coating films, starting from the properties of spectrophotometry, the single components. The results of the simulations were compared with the predictions of a ray tracing simulations commercial simulation code which uses a ray tracing technique. Both models were validated thanks to several measurements carried out with a spectrophotometer on single and double Article History Received: 24 March 2009 sheet glazings with different films. Results show that both ray tracing simulations and the Revised: 14 May 2009 theoretical model provide good estimations of optical properties of glazings with applied films, Accepted: 26 May 2009 especially in terms of spectral transmittance. © Tsinghua University Press and Springer-Verlag 2009 1 Introduction Research in the field of glazing systems technology received a boost passing from single pane to low-emittance The problem of energy efficiency in buildings has been at window systems, and again to low thermal transmittance, the centre of a broad scientific and technical debate in recent vacuum glazings, electrochromic windows, thermotropic years (Asdrubali et al. -
Relativistic Corrections to the Sellmeier Equation Allow Derivation of Demjanov’S Formula
Relativistic corrections to the Sellmeier equation allow derivation of Demjanov’s formula Peter C. Morris∗ Transputer Systems, PO Box 544, Marden, Australia 5070 Abstract A recent paper by V.V. Demjanov in Physics Letters A reported a formula that relates the magnitude of Michelson interferometer fringe shifts to refractive index and absolute velocity. We show that relativistic corrections to the Sellmeier equation allow an alternative derivation of the formula. arXiv:1003.2035v7 [physics.gen-ph] 3 May 2010 ∗Electronic address: [email protected] 1 I. INTRODUCTION In Sellmeier dispersion theory[4], a material is treated as a collection of atoms whose negative electron clouds are displaced from the positive nucleus by the oscillating electric fields of the light beam. The oscillating dipoles resonate at a specific frequency (or wavelength), so the dielectric response is modeled as one or more Lorentz oscillators. For m oscillators the Sellmeier equation may be written. m 2 2 Aiλ n =1+ 2 2 (1) i λ λi X=1 − Here λ is the wavelength of the incident light in vacuum. But if the vacuum is physical and our frame of reference undergoes length contraction due to motion relative to that vacuum, then λ for that direction will be proportionally shorter than in our frame of reference. To correct for that effect, λ in the above formula might need to replaced with λ/γ, where γ is the Lorentz gamma factor. This possibility is explored below. To simplify calculations we will assume that one oscillator dominates the contribution to n. We can then use the following one term form of the Sellmeier equation, Bλ2 n2 =1+ (2) λ2 C − where, if oscillator j is the dominant one, 2 C = λj and m λ2 λ2 − j B = Bj = 2 2 Ai (3) i λ λi X=1 − accounts for contributions to n from all the Ai, at the specific wavelength of λ. -
Preparation and Microstructural Analysis of High-Performance Ceramics
© 2004 ASM International. All Rights Reserved. www.asminternational.org ASM Handbook Volume 9: Metallography and Microstructures (#06044G) Preparation and Microstructural Analysis of High-Performance Ceramics Ulrike Ta¨ffner, Veronika Carle, and Ute Scha¨fer, Max-Planck-Institut fu¨r Metallforschung, Stuttgart, Germany Michael J. Hoffmann, Institut fu¨r Keramik im Maschinenbau, Universita¨t Karlsruhe, Germany IN CONTRAST TO METALS, high-perfor- and impurities. These microstructural variables cubic ZrO2 lattice). Cubic stabilized zirconia is mance ceramics have higher hardness, lower have a strong influence on the method selected also used in as k-sensors for automobile catalytic ductility, and a basically brittle nature. Other for preparation. An example for two different converters and for p(O2) measurement in liquid general properties to note are: excellent high- ZrO2 ceramic materials is illustrated in Fig. 1 and metals. temperature performance, good wear resistance 2. Figure 1 shows the microstructure of tetrag- Because of these differences in mechanical and thermal insulation (low thermal conductiv- onal ZrO2 (TZP, or tetragonal zirconia polycrys- properties and microstructure, the ceramo- ity), as well as high resistance to corrosion and tals). This is a high-strength structural ceramic graphic preparation of TZP and CSZ is quite dif- oxidation. However, the full advantage that these used for room-temperature applications (e.g., ferent. The tough, fine-grained TZP requires materials can provide is strongly dependent on knives and scissors). Tetragonal zirconia poly- longer polishing times for the fine-polishing step composition and microstructure. crystals have a grain size less than 1 lm, an ex- with 1 and 0.25 lm diamond, while CSZ needs Most high-performance ceramics are based on tremely high bending strength ranging from 800 longer polishing times for the coarser polishing high-purity oxides, nitrides, carbides, and bo- to 2400 MPa (115 to 350 ksi), and fracture with 6 and 3 lm diamond compounds. -
Metallographic Procedures and Analysis – a Review
ISSN 2303-4521 PERIODICALS OF ENGINEERING AND NATURAL SCIENCES Vol. 3 No. 2 (2015) Available online at: http://pen.ius.edu.ba Metallographic Procedures and Analysis – A review Enes Akca Erwin Trgo Department of Mechanical Engineering, Faculty of Engineering and Natural Department of Mechanical Engineering, Faculty of Engineering and Natural Sciences, International University of Sarajevo, Hrasnicka cesta 15, 71210 Sarajevo, Sciences, International University of Sarajevo, Hrasnicka cesta 15, 71210 Sarajevo, Bosnia and Herzegovina Bosnia and Herzegovina [email protected] Abstract The purpose of this research is to give readers general insight in what metallography generally is, what are the metallographic preparation processes, and how to analyse the prepared specimens. Keywords: metallography; metallographic specimens; metallographic structure 1. Introduction depends generally on the type of material, and so you can clearly differentiate abrasive cutting (metals), thin Metallography is the study of the microstructure of sectioning with a microtome (plastics), and diamond various metals. To be more precise, it is a scientific wafer cutting (ceramics). discipline of observing chemical and atomic structure of those materials, and as such is crucial for These processes are mostly used in order to minimize determining product reliability. the damage which could alter the microstructure of the material, and the analysis itself. Not only metals, but polymeric and ceramic materials can also be prepared using metallographic techniques, 2.2. Mounting hence the terms plastography, ceramography, materialography, etc. This process protects the material’s surface, fills voids in damaged (porous) materials, and improves handling Steps for preparing metallographic specimen include a of irregularly shaped samples. There are plenty of ways variety of operations, and some of them are: to conduct this operation, and all of them depend on the documentation, sectioning and cutting, mounting, type of material that is being handled. -
Refractive Index Engineering and Optical Properties Enhancement by Polymer Nanocomposites
University of Massachusetts Amherst ScholarWorks@UMass Amherst Doctoral Dissertations Dissertations and Theses March 2016 Refractive Index Engineering and Optical Properties Enhancement by Polymer Nanocomposites Cheng Li University of Massachusetts Amherst Follow this and additional works at: https://scholarworks.umass.edu/dissertations_2 Part of the Materials Chemistry Commons, Nanoscience and Nanotechnology Commons, Polymer and Organic Materials Commons, Polymer Chemistry Commons, and the Semiconductor and Optical Materials Commons Recommended Citation Li, Cheng, "Refractive Index Engineering and Optical Properties Enhancement by Polymer Nanocomposites" (2016). Doctoral Dissertations. 587. https://doi.org/10.7275/7668177.0 https://scholarworks.umass.edu/dissertations_2/587 This Open Access Dissertation is brought to you for free and open access by the Dissertations and Theses at ScholarWorks@UMass Amherst. It has been accepted for inclusion in Doctoral Dissertations by an authorized administrator of ScholarWorks@UMass Amherst. For more information, please contact [email protected]. REFRACTIVE INDEX ENGINEERING AND OPTICAL PROPERTIES ENHANCEMENT BY POLYMER NANOCOMPOSITES A Dissertation Presented by CHENG LI Submitted to the Graduate School of the University of Massachusetts Amherst in partial fulfillment of the requirements for the degree of DOCTOR OF PHILOSOPHY February 2016 Polymer Science and Engineering © Copyright by Cheng Li 2016 All Rights Reserved REFRACTIVE INDEX ENGINEERING AND OPTICAL PROPERTIES ENHANCEMENT BY -
Microstructural Measurements on Ceramics and Hardmetals
A NATIONAL MEASUREMENT A NATIONAL MEASUREMENT GOOD PRACTICE GUIDE GOOD PRACTICE GUIDE No. 21 No. 21 Microstructural Microstructural Measurements on Measurements on Ceramics and Ceramics and Hardmetals Hardmetals Measurement Good Practice Guide No. 21 Measurement Good Practice Guide No. 21 Microstructural Measurements on Ceramics and Hardmetals Eric Bennett, Lewis Lay, Roger Morrell, Bryan Roebuck Centre for Materials Measurement and Technology National Physical Laboratory Abstract: This guide is intended to review the importance of microstructure in determining the properties and performance of technical ceramics and hardmetals. It also promotes good practice in characterising those microstructural features which are relevant to materials performance in order that more informed choices of material can be made for specific applications. Microstructural parameters are described. They are typically characterised in several ways, including measures of grain size, crystallite texture, porosity, and phase volume fractions, as well as the detection of occasional features such as cracks, abnormal grains and inclusions. The importance of microstructural characterisation of these classes of material is reviewed, and possible measurement methods and methods of preparation of test-pieces for making the measurements are described. Based on information taken from the technical literature as well as data generated during NPL research programmes, correlations between microstructural parameters and properties are discussed. Measurement Good Practice Guide No. 21 © Crown Copyright 1997 Reproduced with the permission of the Controller of HMSO and Queen’s Printer for Scotland ISSN 1386–6550 September 1997 Updated, November 2007 National Physical Laboratory Teddington, Middlesex, UK, TW11 0LW Acknowledgements This guide has been produced in a Characterisation of Advanced Materials project, part of the Materials Measurement programme sponsored by the EAM Division of the Department of Trade and Industry. -
A Method for Digital Image Analysis of Ceramic Grains Based on Shape Factor Segmentation
A METHOD FOR DIGITAL IMAGE ANALYSIS OF CERAMIC GRAINS BASED ON SHAPE FACTOR SEGMENTATION Elson de Campos (1); Émerson F. de Lucena (1); Francisco C.L. de Melo (2); Luis Rogerio de O. Hein (1) 1Laboratório de Análise de Imagens de Materiais (LAIMat), Departamento de Materiais e Tecnologia (DMT), Faculdade de Engenharia do Campus de Guaratinguetá (FEG), Universidade Estadual Paulista (UNESP), 12516-410, Guaratinguetá, SP, Brazil, [email protected] 2 Divisão de Materiais (AMR), Instituto de Aeronáutica e Espaço (IAE), Centro Técnico Aeroespacial (CTA), São José dos Campos, SP, Brazil ABSTRACT A very simple and robust method for ceramics grains quantitative image analysis is presented. Based on the use of optimal imaging conditions for reflective light microscopy of bulk samples, a digital image processing routine was developed for shading correction, noise suppressing and contours enhancement. Image analysis was done for grains selected according to their concavities, evaluated by the perimeter ratio shape factor, to avoid consider the effects of breakouts and ghost boundaries due to ceramographic preparation limitations. As an example, the method was applied for two ceramics, to compare grain size and morphology distributions. In this case, most of artifacts introduced by ceramographic preparation could be discarded due to the use of the perimeter ratio exclusion range. Keywords: digital image analysis, perimeter ratio, ceramography, reflective light microscopy 1.Introduction: Ceramics have been used in many engineering applications, which have resulted in extensive research. Most morphological characterization of ceramic grains are performed by qualitative microstructural observations by scanning electron microscope (SEM) [1-5] or few quantitative information [6,7]. -
Analytical Laboratories Table of Contents
Analytical Laboratories Table of Contents Introduction 3 Thermal Testing DSC Differential Scanning Calorimetry DTA Differential Thermal Analysis 4 TGA Thermogravimetric Analysis Coefficient of Thermal Expansion Thermal Conductivity Microscopy 5 Physical Testing Mechanical Testing 6 Particle Characterization Electrical Testing X-Ray Diffraction 7 X-Ray Fluorescence Elemental Analysis by Inductively Coupled Plasma–Optical Emission Spectroscopy 8 Elemental Analysis by Inductively Coupled CoorsTek manufactures critical components and complete Plasma–Mass Spectrometry assemblies for semiconductor, automotive, electronics, medical, telecommunications, military, and other industrial applications. Analysis Case File Using advanced technical ceramics and high-performance plastics, our solutions enable customers’ products to overcome Laser Ablation – ICP-MS of a Ceramic Material 9 technological barriers and improve performance, especially in Additional Facilities demanding or severe service environments. Tests / Samples Sizes CoorsTek has a highly qualified staff to assist with material Materials Testing Standards 10 selection and product design. Please contact us today at +1.303.271.7000 for more information. Sample Sizes Charts 11 For general information about CoorsTek, visit our website at Custom Testing www.coorstek.com. Back Contact Info For analytical services call us at +1.303.277.4606. 2 COORSTEK.COM +1.303.277.4606 [email protected] Introduction The CoorsTek Analytical Laboratories offer a wide variety of services–from Analytical Chemistry -
3 Theory of Optical Coherence Tomography
Improved inspection and micrometrology of embedded structures in multi-layered ceramics Development of optical coherence tomographic methods and tools Rong Su Doctoral Thesis Stockholm, Sweden 2014 Improved inspection and micrometrology of embedded structures in multi-layered ceramics -- Development of optical coherence tomographic methods and tools Copyright © Rong Su, 2014 TRITA IIP-14-01 Industrial Metrology and Optics ISSN 1650-1888 Department of Production Engineering ISBN 978-91-7595-090-7 KTH Royal Institute of Technology SE-100 44 Stockholm, Sweden Printed in 2014 by Universitetsservice US AB To my parents and Xue “Nature uses only the longest threads to weave her patterns, so each small piece of her fabric reveals the organization of the entire tapestry.” Richard Feynman Abstract Roll-to-roll manufacturing of micro components based on advanced printing, structuring and lamination of ceramic tapes is rapidly progressing. This large-scale and cost-effective manufacturing process of ceramic micro devices is however prone to hide defects within the visually opaque tape stacks. To achieve a sustainable manufacturing with zero defects in the future, there is an urgent need for reliable inspection systems. The systems to be developed have to perform high-resolution in- process quality control at high speed. Optical coherence tomography (OCT) is a promising technology for detailed in-depth inspection and metrology. Combined with infrared screening of larger areas it can solve the inspection demands in the roll-to-roll ceramic tape processes. In this thesis state-of-art commercial and laboratory OCT systems, operating at the central wavelength of 1.3 µm and 1.7 µm respectively, are evaluated for detecting microchannels, metal prints, defects and delaminations embedded in alumina and zirconia ceramic layers at hundreds of micrometers beneath surfaces. -
Specimen Preparation Techniques of Materials for Microstructural Analysis
看真相不要看假相 Specimen Preparation Techniques of Materials for Microstructural Analysis 1 Reference e-Book Buehler® SUM-MET™ The Science behind Materials Preparation —————— free down: www.buehler.com Metallography Materialography • Metallography: the study of the microstructure of metals – Can also be used to examine ceramics(ceramography岩相), polymers(plastography) and semiconductors 3 The aim of material preparation: to reveal the true structure of the sample • Specimen preparation quality is the determining factor. • The classic computer adage, “garbage in =garbage out.” 4 Applications Gray Cast Iron The dendrites in aluminum alloy Cu-10.5%S Applications The addition of fibber improves the strength of Intergrated tennis racket Chip Heat-resistant Ceramic Sectioning 取样 Preparation 制样 Etching 浸蚀 Observation 7 Sectioning The specimens selected for preparation must be representative Hammer Vise Clamp Saw 8 Sectioning Electric Spark Cutting 9 Damage of Sectioning • Precautions: Avoid alternation of the microstructure in the area of interest. Recast layer after spark cutting AISI P20 Cutting damage of an 10 annealed titanium specime Sectioning 11 Section Preparation Etching Observation 12 Preparing metallographic specimens • Objective: Remove the damaged layer to give a smooth surface Mounting Polishing (optional) • Mechanical Polishing • Hot Mounting Grinding • electrolytic • Cold polishing Mounting • Clamping 13 Mounting 14 Mounting 15 Mounting 16 Marking of specimens • Engraving • Stamping a code in the specimen Mounting Polishing (optional) -
2 Reflection, Refraction, Diffraction, and Scattering
2 Reflection, refraction, diffraction, and scattering In this chapter we will describe how radiation is reflected off a surface, transmitted into a medium at a different angle, how it is influenced by passing an edge or through an aperture, and how it is scattered and spread out by interactions with particles at various scales. We will focus on the propagation of light. In order to describe the direction in which light propagates, it is often convenient to represent a light wave by rays rather than by wave fronts. In fact, rays were used to describe the propagation of light long before its wave nature was established. Geometrically, the duality is easy to handle: Whenever we indicate the direction of propagation of light by a ray, the wave front is always locally perpendicular to the ray. 2.1 Reflection Figure 2-1. Spheres reflected in the floor and in each other. Reflection occurs when a wave hits the interface between two dissimilar media, so that all of or at least part of the wave front returns into the medium from which it originated. Common examples are reflection of light, as shown in figure 2-1, as well as reflection of surface waves that may be observed in a pool of water, or sound waves reflected as echo from a wall. Reflection of light may be specular or diffuse. The first occurs on a blank mirroring surface that retains the geometry of the beams of light. The second occurs on a rougher surface, not retaining the imaging geometry, only the energy. © Fritz Albregtsen 2008 2-2 Reflection, refraction, diffraction, and scattering 2.1.1 Reflectance Reflectance is the ratio of reflected power to incident power, generally expressed in decibels or percent. -
Index of Refraction from the Near-Ultraviolet to the Near-Infrared from a Single Crystal Microwave-Assisted CVD Diamond
Publications 3-1-2017 Index of Refraction from the Near-Ultraviolet to the Near-Infrared from a Single Crystal Microwave-Assisted CVD Diamond Giorgio Turri Embry-Riddle Aeronautical University, [email protected] Scott Webster University of Central Florida Ying Chen University of Central Florida Benjamin Wickham Element Six Ltd. Andrew Bennett Element Six Ltd. See next page for additional authors Follow this and additional works at: https://commons.erau.edu/publication Part of the Atomic, Molecular and Optical Physics Commons, and the Optics Commons Scholarly Commons Citation Turri, G., Webster, S., Chen, Y., Wickham, B., Bennett, A., & Bass, M. (2017). Index of Refraction from the Near-Ultraviolet to the Near-Infrared from a Single Crystal Microwave-Assisted CVD Diamond. Optical Materials Express, 7(3). https://doi.org/10.1364/OME.7.000855 © 2017 Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved. This Article is brought to you for free and open access by Scholarly Commons. It has been accepted for inclusion in Publications by an authorized administrator of Scholarly Commons. For more information, please contact [email protected]. Authors Giorgio Turri, Scott Webster, Ying Chen, Benjamin Wickham, Andrew Bennett, and Michael Bass This article is available at Scholarly Commons: https://commons.erau.edu/publication/666 Vol. 7, No. 3 | 1 Mar 2017 |