System in a Package (SiP) Technical Solution Sheet

SiP and Module Definitions SiP is an assembly of 2 or more semiconductor devices (IC and or Discrete chips or packaged devices) with passive components or integrated passive devices (IPD) into a standard package format to complete a sub-system assemblies in an LGA, BGA or leadless (QFN) format. The SiP technology has ability to bring together multi chips and package assembly and test techniques to create highly integrated products with optimized cost, size and performance. Note: UTAC offers SiP standard packages (leadframe, laminate based) that characterized by combination of one or multiple chips of different functionality either side by side or stacked , which may include passive components and/ or integrated passive devices (IPD) using wire bonding or technology interconnect. UTAC offers in SiP design, assembly and Test with integration and size reduction by using different package forms, factors and assembly capabilities and technology. Power amplifier (PA/RF) module, USB drives and are examples of Multiple & Stacked Bonding standard SiP UTAC assembles and tests. UTAC SiP / Module Solutions Advantages • Laminate based LGA or BGA or FCBGA System miniaturization through package sub-system • • Leadless leadframe TLA, QFN or GQFN or MIS (array option) integration form factor benefits. • Multi Chip package (MCP) for PA/RF Power Amplifier module Electrical performance optimization through short • • Power management solutions interconnects and well characterized component • Memory, Multimedia cards and USB drives integration that facilitate system design. • 3D Embedded Chip solution EMI/RFI shielding is an option for SiP or • • High Density Passives & Pre-packaged IC integration solution modules which can include isolation between RF and digital sections of a SiP or module. UTAC Capabilities Summary • Thermal performance optimization through integration of • SiP is a strategic segment for UTAC with multi-chip and SMT established package design, assembly and materials capabilities in multiple factories technologies that can provide 2 sided chip cooling and • Stacked Die, Embedded Die, Flip Chip engineered management of die hot spots. • Wirebond (Au, PdCu, AuPdCu) • Mechanical performance optimization leveraging • EMI/RFI shielding established package thermal cycle and shock data, • Extremely thin configurations and mold caps material properties and finite element modeling simulation • Thick mold caps for large components (inductors) capabilities. • Film assist molding for exposed die (thermal management or • System design optimization and time to market benefits sensor solutions) through well characterized SiP or module performance • Wide range of passives integrated, planar 2D and 3D pkg data that enable plug/play and bill of material reduction/ architectures i.e. Passive components minimum of 01005, management. crystal, large inductors, PiP (Pre-packaged QFN, LGA, WLCSP) and Connector integration • High Density passive components integration • Package co-design and simulation technology • Full turnkey assembly and test servies Edition: Q1 2019, rev B w ww.utacgroup.com

System in a Package (SiP) 2 Technical Solution Sheet

SiP Package Selection Considerations

LGA-SiP / BGA-SiP Substrate Based 3D w/ Embedded (Multi Layers Specific Specific Capability) QFN/LGA Performance Electrical & Functionality

Routable QFN-SiP Power LGA SiP

QFN-SiP Thick Mold Cap. : 3.4 ~7.2mm Reliability Thermal & Leadframe Based (1 Layer Capability) Low Pin Count High Pin Count I/O Count & Design Complexity

SiP Module Design Flow

C6

C10 R8 C13 C67

C69

C3

R7

C9 C5

C11 U3

C7 C37 C12 C15 C36

L1 R6

U2 C8 C35 C4

C14 C34

C2 U5 C26

R4

R3

C18 C33

C32

R13

R5 C68 C25 C17

C42 C19 C62 C24

C1 R1 R2

C61 C66

C57 C65

C64

C63

C60 C43

C41 C20

C44

C38

L2 L3 C21 C54

C50 C49

C45

C39 C22 C53

C74

C40

C58 C23 C52 C59

C51

C16 C46 R10

C48 C47

C56 C55

C71

C70

U1 R9 U4

R12 R11

C72

C73

C31

C29

C28

C30

C27

FB3 FB2 FB1 Package Design Feasibility Design Input Package Design, Package Package Studies & Documents, Feasibility Design Review & Layout & Simulation Manufacturing Schematic & BOM Packaging Approval (order) Functional Robustness Risk Assessment Optimization Solution Verification Review

UTAC SiP Package Types

QFN Routable QFN /GQFN BGA / LGA Package size Package size 2.8x1.6mm – 15x15mm Package size 3x3mm – 21x21mm Mold thickness 4x2mm – 18x23mm Mold thickness 0.5mm – 3.8mm Mold thickness 0.5mm – 2.0mm Leadframe Surface Finishes/Thickness 0.5mm – 7.2mm Substrate Matte Sn, PPF / 8 mils Leadframe Finish and Thickness 2L – 6L Features Single layer Cu, PPF / 5 and 8 mils Features 0402, PiP (QFN), Solder die attach, Features 01005, PiP (QFN/ BGA/ WLCSP), Large Inductor 0201, PiP (QFN), Solder die attach, Solder die attach Application Large 3D Inductor Application Power, Data servers, DC/DC & Buck Application RF, PA/FEM, Power, Servers, Converters Power, Data servers, Converters Infotainment

FET FET QFN Die

4L UDP 110L LGA 256L BGA 4L 2.8x1.6mm 64L 15x15mm 24L 17x19mm 42L 18x23mm 11.1x16.0mm 10x14mm 21x21mm

Note: UTAC SiP and Module solutions are constructed with standard or customer specified materials. www.utacgroup.com Edition: Q1 2019, rev B SiP Design to Qualification Flow 3

 Design from customer netlist and eBOM 1. Package  Package stackup Design  Design Tool (UPD, APD, CAM 350, AutoCAD…etc)  Customer requirements to design rule check

2.Design  DFS report + Risk assessment Feasibility Study  Package Simulations (DFS) & Thermal/Electrical/M Simulation echanical)  DFMEA

 Process flow characterization 3.Process  Parameter Characterization Characterization  DOE optimization  Failure Analysis

 Process and parameter ready  Confirmation Run 4. Validation  Pre-Qual lot  Reliability Study  Failure Analysis

 Assembly Report  Reliability 5. Qualification Report  MSL test, Stress test Temperature HAST Autoclave Cycling Chambers Chambers Chambers

Note: UTAC SiP and Module solutions are constructed with standard or customer specified materials. www.utacgroup.com Edition: Q1 2019, rev B