X-Ray Microscope Röntgenstrahlmikroskop Microscope À Rayons X
(19) TZZ ___T (11) EP 2 511 844 B1 (12) EUROPEAN PATENT SPECIFICATION (45) Date of publication and mention (51) Int Cl.: of the grant of the patent: G06F 21/00 (2013.01) G21K 7/00 (2006.01) 12.08.2015 Bulletin 2015/33 (21) Application number: 12164870.3 (22) Date of filing: 10.10.2007 (54) X-ray microscope Röntgenstrahlmikroskop Microscope à rayons X (84) Designated Contracting States: • Stewart, Jeffrey, J. AT BE BG CH CY CZ DE DK EE ES FI FR GB GR Los Alamos, NM 87544 (US) HU IE IS IT LI LT LU LV MC MT NL PL PT RO SE • Harris, Michael, N. SI SK TR Los Alamos, NM 87544 (US) • Burrell, Anthony, K. (30) Priority: 10.10.2006 US 850594 P Los Alamos, NM 87544 (US) (43) Date of publication of application: (74) Representative: Lorente Berges, Ana 17.10.2012 Bulletin 2012/42 A2 Estudio Legal C/ Hermosilla Nº 59, bajo izq (62) Document number(s) of the earlier application(s) in 28001 Madrid (ES) accordance with Art. 76 EPC: 07874491.9 / 2 084 519 (56) References cited: WO-A1-97/25614 US-A1- 2003 023 562 (73) Proprietor: XRpro Sciences, Inc. US-A1- 2004 128 518 US-A1- 2004 235 059 Los Alamos, NM 87544 (US) US-A1- 2005 015 596 (72) Inventors: • POTTS PHILIP J ET AL: "Atomic spectrometry • Birnbaum, Eva, R. update__X-ray fluorescence spectrometry", Los Alamos, NM 87544 (US) JOURNAL OF ANALYTICAL ATOMIC • Koppisch, Andrew, T. SPECTROMETRY, ROYAL SOCIETY OF Los Alamos, NM 87544 (US) CHEMISTRY, vol. 21, no.
[Show full text]