Engineering Trade-off Considerations Regarding Design-for-Security, Design- for-Verification, and Design-for-Test Melanie Berg AS&D in Support of NASA/GSFC
[email protected] Kenneth LaBel NASA/GSFC
[email protected] Presented by Melanie Berg at the Symposium on Hardware Oriented Security and Trust (HOST), McLean, VA May 3trd 2018 Acronyms • Application specific integrated circuit (ASIC) • Equivalence Checking (EC) • Phase locked loop (PLL) • Advanced Encryption Standard (AES) • Error-Correcting Code (ECC) • Physical unclonable function (PUF) • Agile Mixed Signal (AMS) • Evolutionary Digital Filter (EDF) • Place and Route (PR) • • ARM Holdings Public Limited Company (ARM) Field programmable gate array (FPGA) • Power on reset (POR) • Floating Point Unit (FPU) • Asynchronous assert synchronous de-assert • Processor (PC) • Global Industry Classification (GIC) (AASD) • Random Access Memory (RAM) • Gate Level Netlist GLN) • Automotive Electronics Council (AEC) • • Global Route (GR) Register transfer language (RTL) • Block random access memory (BRAM) • Hardware Design Language (HDL) • Reliability (R) • Built-in-self-test (BIST) • High Performance Input/Output (HPIO) • Reliability of BRAM (RBRAM) • Bus functional Model (BFM) • High Pressure Sodium (HPS) • Reliability of configuration (RConfiguraiton) • Clock domain crossing (CDC) • High Speed Bus Interface (PS-GTR) • Reliability of configurable logic block (RCLB) • Combinatorial logic (CL) • Input – output (I/O) • Reliability of global routes (RGL) • Commercial off the shelf (COTS)