2020 IEEE Technical Field Award Recipients and Citations
2020 IEEE Technical Field Award Recipients and Citations 1. IEEE BIOMEDICAL ENGINEERING AWARD—recognizes outstanding contributions to the field of biomedical engineering—sponsored by the IEEE Circuits and Systems Society, IEEE Engineering in Medicine and Biology Society and the IEEE Signal Processing Society—to Recipient F. STUART FOSTER (FIEEE)—Senior Scientist and Professor, Sunnybrook Research Institute and Department of Medical Biophysics, University of Toronto, Toronto, Ontario, Canada Citation “For contributions to the field of high-resolution imaging.” 2. IEEE CLEDO BRUNETTI AWARD—for outstanding contributions to nanotechnology and technologies for microsystem miniaturization—sponsored by the Brunetti Bequest—to Co-recipients JAMES H. STATHIS (FIEEE)— Principal Research Staff Member, IBM Research, Yorktown Heights, New York, USA AND ERNEST YUE WU (FIEEE)— Senior Technical Staff Member, IBM Research, Albany, New York, USA Citation “For contributions to the understanding of gate dielectric reliability and its application to transistor scaling.” 3. IEEE ELECTRONICS PACKAGING TECHNOLOGY AWARD—recognizes meritorious contributions to the advancement of components, electronic packagaing, or manufacturing technologies—sponsored by the IEEE Electronics Packaging Society—to Co-Recipients MITSUMASA KOYANAGI (LFIEEE)—Senior Research Fellow, Tohoku University, Sendai, Miyagi, Japan AND PETER RAMM (SMIEEE)— Head of Strategic Projects, Fraunhofer EMFT, Bavaria, Germany Citation "For pioneering contributions leading to the commercialization of 3D wafer and die level stacking packaging." 4. IEEE CONTROL SYSTEMS AWARD—recognizes outstanding contributions to control systems engineering, science, or technology—sponsored by the IEEE Control Systems Society—to Recipient ANDERS LINDQUIST (FIEEE)—Zhiyuan Chair Professor, Shanghai Jiao Tong University, Shanghai, China Citation “For contributions to optimal filtering, stochastic control, stochastic realization theory, and system identification.” 5.
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