International Bulletin on Atomic and Molecular Data for Fusion

XAO102965

IBAMD--60 INTERNATIONAL BULLETIN ON ATOMIC AND MOLECULAR DATA FOR FUSION

Number 60

June 2001

32/40

INTERNATIONAL ATOMIC ENERGY AGENCY, VIENNA, 2001 PLEASE BE AWARE THAT ALL OF THE MISSING PAGES IN THIS DOCUMENT WERE ORIGINALLY BLANK INTERNATIONAL BULLETIN ON ATOMIC AND MOLECULAR DATA FOR FUSION

Number 60 June 2001

Contributors: M. E. Bannister, J. L. Delcroix, J. Fuhr, H. B. Gilbody, C. C. Havener, D. Humbert, T. Kato, P. S. Krstic, Yu. V. Martynenko, F. W. Meyer, T. J. Morgan, F. M. Ownby, R. A. Phaneuf, M. S. Pindzola, A. Robey, D. R. Schultz, P. C. Stancil, E. W. Thomas and W. L. Wiese

Editor: J.A. Stephens Atomic and Molecular Data Unit Nuclear Data Section IAEA

Editorial Board: J. L. Delcroix, GAPHYOR, France R. E. H. Clark, IAEA Yu. V. Martynenko, Scientific Research Center "Kurchatov Institute", Russian Federation D. R. Schultz, Oak Ridge National Laboratory, USA T. Kato, National Institute for Fusion Science, Japan W. L. Wiese, National Institute for Standards and Technology, USA

INTERNATIONAL ATOMIC ENERGY AGENCY VIENNA, 2001 Copies of this bulletin may be obtained from

Nuclear Data Section International Atomic Energy Agency Wagramer Strasse 5 P.O. Box 100 A-1400 Vienna, Austria

INTERNATIONAL BULLETIN ON ATOMIC AND MOLECULAR DATA FOR FUSION IAEA, VIENNA, 2001

IBAMD/60 ISSN 0258-8048

Printed by the IAEA in Austria July 2001 FOREWORD

The International Bulletin on Atomic and Molecular Data for Fusion is prepared by the Atomic and Molecular Data Unit, International Atomic Energy Agency, and published and distributed free of charge by the IAEA to assist in the development of fusion research and technology. The references and indexations included in the Bulletin are provided by atomic data centres at the following institutions: Oak Ridge National Laboratory, Oak Ridge, USA National Institute for Standards and Technology, Gaithersburg, USA Kurchatov Institute, Moscow, Russian Federation National Institute for Fusion Science, Toki-shi, Japan Universite de Paris XI, (Paris-Sud), Orsay, France Nuclear Data Section, IAEA, Vienna, Austria Information in this Bulletin is presented in four parts. In Part 1, the Atomic and Molecular Data Information System (AMDIS) of the International Atomic Energy Agency is presented. In Part 2, the indexed papers are listed separately for structure and spec- tra, atomic and molecular collisions, and surface interactions. The structure and spectra indexation lines are grouped by process. The first column gives the reactants, the second column indicates the character of the data contained (Th for theoretical, Ex for experi- mental, and E/T for both experimental and theoretical). The number in the last column is the reference number in Part 3 of the Bulletin. The atomic and molecular indexation lines are grouped by one collision partner (photon, electron or heavy particle). The first column gives the reactants, the second column gives the process, the third column gives the energy range with the appropriate units, and the last two columns are the same as in the structure and spectra indexation lines. The particle-surface interactions indexation lines are grouped by process. The first column gives the reactants, the second the energy range with the appropriate units, and the last two columns are the same as in the previous cases. Part 3 contains all the bibliographic data for both the indexed and non-indexed ref- erences. Those references which are indexed in Part 1 are identified by the repeated indexation lines. The Author Index (part 4) refers to the bibliographic references con- tained in part 3. Contributions are solicited on data generation work in progress and on new data in the course of publication. Contributions should include an explanation of their applicability to fusion research and should be sent to:

Atomic and Molecular Data Unit Nuclear Data Section International Atomic Energy Agency Wagramer Strasse 5 P.O. Box 100 A-1400 Vienna, Austria

e-mail: [email protected] WWW access: http://www-amdis.iaea.org/ In addition to the regular publication of the Bulletin, the IAEA Atomic and Molecular Data Unit also performs selective retrospective retrievals from the entire (1950-present) bibliographic data base on request. Retrievals are free of charge and can be made on all of the information indexed in the Bulletin.

Vienna, June 2001 Jeffrey Stephens Editor TABLE OF CONTENTS

1. The Atomic and Molecular Data Information System 7

2. INDEXATION 9

2.1 Structure and Spectra 9 2.1.1 Atomic Structure, Molecular Structure 9 2.1.2 Interatomic Potentials 9 2.2 Atomic and Molecular Collisions 10 2.2.1 Photon Collisions 10 2.2.2 Electron Collisions 15 2.2.3 Heavy Particle Collisions 18 2.3 Surface Interactions 28 2.3.1 Sputtering 28 2.3.2 Chemical Reactions 31 2.3.3 Neutralization, Ionization, Dissociation 31 2.3.4 Adsorption, Desorption 32 2.3.5 Reflection 33 2.3.6 Secondary Electron Emission 34 2.3.7 Other Surface Interactions 35 2.4 Particle Beam-Matter Interactions 36 2.5 Interaction of Atomic Particles with Fields 44

3. BIBLIOGRAPHY 45

3.1 Structure and Spectra 45 3.2 Atomic and Molecular Collisions 45 3.2.1 Photon Collisions 45 3.2.2 Electron Collisions 59 3.2.3 Heavy Particle Collisions 70 3.3 Surface Interactions 90 3.4 Particle Beam-Matter Interactions 107 3.5 Interaction of Atomic Particles with Fields 118

4. AUTHOR INDEX 123 1 The Atomic and Molecular Data Information System

AMDIS is the Atomic and Molecular Data Information System of the International Atomic Energy Agency, established and maintained by the Atomic and Molecular Data Unit, Nuclear Data Section. AMDIS contains two main parts: a bibliographic database for atomic and molecular data for fusion research, and numerical databases of recommended and evaluated atomic, molecular iand plasma-surface interaction data. AMBDAS, Atomic and Molecular Bibliographic Data System, is an on-line, menu- driven and simple to use bibliographic data retrieval system. It contains more than 38200 bibliographic entries with atomic, molecular and plasma-surface interaction data of in- terest to fusion research, dating back to 1950. It contains all references published in the International Bulletin on Atomic and Molecular Data for Fusion 1-58, CIAMDA 80, CIAMDA 87, and CIAMDA 98. Entries may be retrieved by author, process, reactants, type of reference, year of publication, energy range and data source (theoretical or experi- mental). The system has a HELP window which is terminal independent (it sends ASCII characters only). The output may be viewed on the screen or written to a file either in ASCII or LaTeX format, to be transferred to the remote user using FTP or electronic mail from our anonymous FTP server. Users of this system must register with the A+M Data Unit to obtain a password, as guest user logins are no longer permitted. ALADDIN, A Labelled Atomic Data INterface, is a database system developed in order to provide a standard and flexible format and interface for the exchange and management of numerical atomic, molecular and plasma-material interaction data of in- terest to fusion research. It was originally designed by R. Hulse at the Princeton Plasma Physics Laboratory. It is the system adopted by the IAEA and the Atomic Data Cen- tre Network, an international group of sixteen data centres from several countries, for the exchange of data since 1988. AMDIS now contains a new interface to ALADDIN. ALADDIN has recently been converted to an entirely web-driven system, which can be accessed at http://www-amdis.iaea.org/aladdin.html. It is a simple to use interface that facilitates searching for recommended or evaluated atomic, molecular, plasma-surface interaction and material properties data. Options to plot selected data are also avail- able. An ALADDIN entry consists on searchable (hierarchical) labels that characterize the process, reactants and any other important information; boolean labels which give in- formation about the source, year, laboratory or data centre, and reference; comment lines and the numerical data. The data may be given by a parametrization through an analytic fit or the data itself. With the web interface the user may also obtain a figure with data and labels, text accompanying the data, and the Fortran source of the evaluation function. AMDIS may also be reached by telnet via the INTERNET. A User's Manual for this facility is stored in LaTeX format on our FTP server (ripcrsOl.iaea.or.at) and our web server, and a hard copy can be sent upon request. Further information regarding the A+M Data Unit's programmes and AMDIS may be accessed through the WWW: http://www- amdis.iaea.org/. 2 INDEXATION

2.1 Structure and Spectra

Structure, Spectra Atomic Structure Th 1 Structure, Spectra Molecular Structure Th 1

2.1.1 Interatomic potentials

H* H Th 332 H H2!+ Th 230 i+ H H2 Th 230 He-1 He Th 273 He He Th 322 He Be Th 242 He Mg Th 242 He Ca Th 242 He Sr Th 242 He Ba Th 242 Li1+ Li Th 247 Be Th 244 co2 CO CO Th 227 N H2 Th 238 N* H2 Th 238 NO* H2O 257 O Th 252 o2 Ne Ne Th 334 Ne* Ne* Th 334 Ne Ne Th 322 Na Na 270 1+ Na N2 Th 248 Cl cr1 Th 289 Cl Cl Th 289 Cl1+ Cl Th 289 Rb Rb Th 335 Rb Cs Th 284 Cd* Ar Th 256 Cd Ar Th 256 Cd* Cd Th 256 Cd Cd Th 256 Xe* Xe Ex 232 Xe Xe Ex 232 2.2 Atomic and Molecular Collisions

2.2.1 Photon Collisions hi/ + H1 Photodetachment Th 106 hi/ + H-1 Photodetachment 0.38-5.00 eV Th 32 hi/ + H-1 Photoionization 0.09-0.37 eV Th 88 hi/ + H* Elastic Scattering 5.00-300.00 eV 108 hi/ + H Elastic Scattering 5.00-300.00 eV 108 hu + H Photoionization 0.50-8.00 K Th 89 hi/ + H Photoionization 15.00-250.00 eV 75 hi/ + H Photoionization Th 49 hz/ + H Photoionization E/T 46 hz/ + H Photoionization 4.90-15.00 eV Th 45 hz/ + H Photoionization Th 40 hi/ + H Photoionization 17.00 eV Th 34 hi/ + H1+ Photodetachment 0.09-0.37 eV Th 88 hi/ + H2 Total Absor., Scat. Th 65 hi/ + H2 Photodissociation Th 65 hu + H2 Photodissociation 44.00-76.00 eV Ex 64 hi/ + H2 Photodissociation 2.86-2.96 eV Ex 20 hi/ + H2 Photoionization 44.00-76.00 eV Ex 64 hi/ + H2 Photoionization Th 39 1+ hi/ + H3 Photodissociation 1.17 eV Ex 76 hu + H2O Photodissociation 536.50-539.50 eV 25 hi/ + H2O Photoionization 10.00-70.00 eV E/T 31 hi/ + H2O Photoionization 536.50-539.50 eV 25 hu + D2O Photodissociation 536.50-539.50 eV 25 hi/ + D2O Photoionization 536.50-539.50 eV 25 hu + Ue Photoexcitation 69.00-76.80 eV Th 103 hi/ + He Photoionization 69.00-76.80 eV Th 103 hi/ + He Photoionization 4.90-26.40 eV Th 87 hi/ + He Photoionization 90.00-130.00 eV 81 hi/ + He Photoionization 4.99 eV Th 74 hi/ + He Photoionization 1.77 eV Th 70 hi/ + He Photoionization 1.59 eV Th 60 hi/ + He Photoionization 40.00 eV E/T 54 hu + Ue Photoionization 5.40-32.60 eV Th 48 hi/ 4- He Photoionization 79.00-160.00 eV 35 hi/ + He Photoionization 4.99 eV Th 30 hi/ + He Photoionization 5.00-5.19 eV Th 29 hi/ + He Photoionization 0.04-5.00 keV Th 6 hi/ 4- Li Photoexcitation 64.50-67.50 eV Th 56 hi/ + Li Photoionization 142.00-142.60 eV 118 h^ + Li Photoionization 205.00-240.00 eV 98 hi/ + Li Photoionization 71.00-74.00 eV Th 95 hi/ + Li Photoionization 64.50-67.50 eV Th 56 hi/ + Li2+ Photoionization 30.00 eV Th 51 hu + B Elastic Scattering 5.00-300.00 eV 108 hi/ + C Elastic Scattering 0.10-10.00 keV Th 116 hi/ + C1+ Elastic Scattering 0.10-10.00 keV Th 116 hi/ + C2+ Elastic Scattering 0.10-10.00 keV Th 116 hu + C3+ Elastic Scattering 0.10-10.00 keV Th 116 hi/ + C4+ Elastic Scattering 0.10-10.00 keV Th 116 1+ hi/ + CH4 Photoionization 12.62-12.63 eV Ex 21

10 hi/ + CO Photoionization 10.00-70.00 eV E/T 31 hi/ + CO Photoionization 22.30-23.75 eV Ex 22 hi/ + CO2 Photodissociation 290.00-298.00 eV 115 hi/ + CO2 Photodissociation Ex 67 hi/ + CO2 Photoionization 290.00-298.00 eV 115 hi/ + N1+ Photoexcitation 2.48-24.80 eV Th 14 hi/ + N2 Photodissociation 37.00-69.00 eV Ex 62 hi/ + N2 Photoexcitation 1.42-14.46 eV Ex 19 hi/ + N2 Photoionization 90.00 eV Th 99 hi/ + N2 Photoionization Th 93 hi/ + N2 Photoionization 37.00-69.00 eV Ex 62 hi/ + N2 Photoionization 10.00-70.00 eV E/T 31 hi/ + N2 Photoionization 200.00 eV 28 hi/ + N2 Photoionization 404.00-420.00 eV 24 2+ hi/ + N2 Photodissociation Ex 107 2+ hi/ + N2 Photoionization Ex 107 hi/ + NO Photoionization Ex 50 hi/ + O1+ Photoexcitation 2.50-40.00 eV Th 61 hi/ + O2 Total Absor., Scat. 4.13-6.46 eV Th 26 hi/ + O2 Photodissociation 15.00-25.00 eV Ex 102 hi/ + O2 Fluorescence 15.00-25.00 eV Ex 102 hi/ 4- O2 Photoionization 16.00-35.00 eV E/T 119 hi/ + O2 Photoionization Th 93 2+ hi/ + O2 Photodissociation Ex 107 2+ hi/ + O2 Photoionization Ex 107 hi/ + F-1 Photodetachment 0.08-0.25 Ry Th 68 hi/ 4- F-1 Photodetachment 1.10-3.50 eV Th 43 hi/ + Ne Photoexcitation 865.00 eV 94 hu + Ne Photoexcitation 0.00-1.63 keV Th 52 hi/ + Ne Photoionization 92.21 eV Ex 114 hi/ + Ne Photoionization 865.00 eV 94 hi/ + Ne Photoionization 0.00-1.63 keV Th 52 hi/ + Ne Photoionization 1.55 eV E/T 47 hi/ + Ne Photoionization 21.80-81.60 eV Th 9 hi/ + Ne Photoionization 0.04-5.00 keV Th 6 hi/ + Ne7+ Photoionization Th 58 hi/ + Na Photoexcitation 10.00-250.00 eV 97 hi/ + Na Photoexcitation 50.00-120.00 eV 33 his + Na* Photoexcitation 50.00-120.00 eV 33 hi/ + Na Photoionization 50.00-120.00 eV 33 hi/ + Na* Photoionization 50.00-120.00 eV 33 YLV + Na Photoionization 5.00 eV E/T 27 hi/ + Na1+ Photoionization 21.80-81.60 eV Th 9 h^ + Mg Photoionization 2.00-19.00 MeV/amu E/T 117 hi; + Mg1+ Photoionization 25.00-160.00 eV 38 hi/ + Mg2+ Photoionization 21.80-81.60 eV Th 9 hi/ +Al Photoexcitation Ex 42 hi/ + A12O3 Photoexcitation Ex 42 hi/ + S2+ Photoexcitation 0.04-29.53 eV Th 4 hi/ + S4+ Photoexcitation 4.69-43.35 eV E/T 8 hf + Ar Photon Collisions Th 82 hi/ + Ar Photoexcitation Th 82 hi/ + Ar Photoexcitation 2.33-30.00 eV Ex 59 hi/ + Ar Photoionization E/T 91

11 hi/ + Ar Photoionization Th 82 hi/ + Ar Photoionization 1.55 eV Ex 72 hi/ + Ar Photoionization 2.33-30.00 eV Ex 59 hi/ + Ar Photoionization 45.00-58.00 eV E/T 41 hi/ + Ar Photoionization 0.04-5.00 keV Th 6 9+ hi/ + Ar Photoexcitation 2.10-2.82 eV Ex 11 13+ hv + Ar Photoexcitation 2.10-2.82 eV Ex 11 14+ hi/ + Ar Photoexcitation 2.10-2.82 eV Ex 11 hi/ + K Photoionization 5.00 eV E/T 27 1 his + Ca- Photodetachment 0.10-4.00 eV Ex 86 hi/ + Ca Photoionization 31.40 eV Th 71 hi/ 4- Sc Photoionization 5.00-80.00 eV Th 96 hi/ + Fe1+ 1+ Photoexcitation 6.20 eV Ex 5 hi/ + Fe Photoexcitation 4.79-5.59 eV Ex 3 hi/ + Fe4+ 5+ Photoexcitation Th 16 hi/ + Fe Photoexcitation 50.30 eV Th 18 hi/ + Fe14+ 1+ Photoionization 33.59-600.00 Ry 78 hi/ + Ni Photoexcitation 7.08-8.55 eV Ex 10 hi/ + Ni17+ 18+ Photoexcitation Th 17 hu + Ni Photoionization 112.00-122.00 eV 120 hi/ + Cu Elastic Scattering 1.00-116.00 keV 100 hi/ + Ge Total Absor., Scat. 86.50 keV Ex 104 hi/ + Ge Elastic Scattering 86.50 keV Ex 104 hi/ + Ge Photoexcitation 86.50 keV Ex 104 hi/ + Ge Photoionization 59.50 keV Ex 111 hi/ + As Photoexcitation 6.20-24.80 eV Th 15 hi/ + As1+ 2+ Photoexcitation 6.20-24.80 eV Th 15 hi/ + As Photoexcitation 6.20-24.80 eV Th 15 hz/ + Kr Photon Collisions Th 82 hi/ + Kr Photoexcitation Th 82 hi/ + Kr Photoionization E/T 91 hi/ 4-Kr Photoionization Th 82 hi/ + Kr Ex hi/ + Kr Photoionization 14.31-14.36 eV 57 Photoionization 0.04-5.00 keV Th 6 hi/ + Rb E/T hi/ + Zr Photoionization 5.00 eV 27 1+ Free-Free Transition 59.50 keV Th 112 hi/ + Zr Ex 2 hi/ + Nb Photoexcitation 3.82-7.16 eV hi/ + Mo Free-Free Transition 59.50 keV Th 112 hi/ + Mo Elastic Scattering 19.80-20.30 keV Th 79 hi/ + Sn1+ Free-Free Transition 59.50 keV Th 112 hi/ + Sb Photoexcitation 8.86 eV Ex 13 hi/ + Sb1+ Total Absor., Scat. 20.00-200.00 eV 37 hi/ + Sb2+ Total Absor., Scat. 20.00-200.00 eV 37 hi/ + Sb3+ Total Absor., Scat. 20.00-200.00 eV 37 hi/ + Sb4+ Total Absor., Scat. 20.00-200.00 eV 37 hi/ + I"1 Total Absor., Scat. 20.00-200.00 eV 37 hi/ + I"1 Photodetachment 40.00-136.00 eV 90 hi/ + I Photoionization 40.00-136.00 eV 90 hi/ + I2+ Photoionization 40.00-136.00 eV 90 hi/ + Xe Photoionization 40.00-136.00 eV 90 hi/ + Xe Photon Collisions Th 82 hi/ + Xe Elastic Scattering 1.00-116.00 keV 100 Fluorescence 2.46-2.61 eV E/T 36 Photoexcitation Th 82

12 hv + Xe Photoionization Th 113 hv + Xe Photoionization 80.00-250.00 eV 110 hv + Xe Photoionization E/T 91 hv + Xe Photoionization Th 82 hv + Xe Photoionization 4.66 eV Ex 55 hv + Xe Photoionization 2.46-2.61 eV E/T 36 hv + Xe Photoionization 0.04-5.00 keV Th 6 hi/ + Xe1+ Photoionization 50.00-150.00 eV 77 hv + Cs Photoionization 5.00 eV E/T 27 hv + Ba Photoionization 5.61-5.93 eV Ex 44 h^ + Nd32+ Photoexcitation 62.00-744.00 eV 7 hv + Sm34+ Photoexcitation 62.00-744.00 eV 7 h^ + Eu Fluorescence 3.36-4.54 eV Ex 63 hv + Eu Photoexcitation 3.36-4.54 eV Ex 63 hv + Eu Photoionization 120.00-160.00 eV 66 hi/ + Eu35+ Photoexcitation 62.00-744.00 eV 7 hv + Gd Fluorescence 59.54 keV Ex 101 hi/ 4- Gd Photoexcitation 59.54 keV Ex 101 h^ + Dy Fluorescence 59.54 keV Ex 101 hv + Dy Photoexcitation 59.54 keV Ex 101 hv + Er Fluorescence 59.54 keV Ex 101 hv + Er Fluorescence 59.50 keV Ex 69 hi/ + Er Photoexcitation 59.54 keV Ex 101 hv + Er Photoionization 59.50 keV Ex 69 hi/ +Yb Photoionization 59.50 keV Ex 121 hv + Lu1+ Photoexcitation 1.24-7.44 eV E/T 12 hi/ + Lu2+ Photoexcitation 1.24-7.44 eV E/T 12 hv + Hf Photoionization 59.50 keV Ex 121 hi/ + Ta Fluorescence 59.50 keV Ex 69 hv + Ta Photoionization 59.50 keV Ex 69 hf + Ta45+ Photoexcitation 62.00-744.00 eV 7 hv + W Fluorescence 59.50 keV Ex 69 hi/ + W Photoionization 59.50 keV Ex 121 hi/ + ^V Photoionization 59.50 keV Ex 69 hi/ + W46+ Photoexcitation 62.00-744.00 eV 7 hv + Os Photoionization 59.50 keV Ex 121 hi/ + Ir"1 Photodetachment 1.56-2.13 eV Ex 84 hv + Pt1 Photodetachment 1.56-2.13 eV Ex 84 hv + Au Fluorescence 59.50 keV Ex 69 hi/ + Au Photoionization 59.50 keV Ex 69 hv + Hg Fluorescence 59.50 keV Ex 69 hi/ + Hg Photoionization 59.50 keV Ex 121 hv + Hg Photoionization 59.50 keV Ex 69 hv + Tl Fluorescence 59.50 keV Ex 69 hi/ + T1 Photoionization 59.50 keV Ex 121 hv + Tl Photoionization 59.50 keV Ex 69 hi/ + Pb Fluorescence 59.50 keV Ex 69 hv + Pb Photoionization 59.50 keV Ex 121 hi/ + Pb Photoionization 13.00-18.00 keV Ex 83 hi/ + Pb Photoionization 59.50 keV Ex 69 hv + Th Fluorescence 19.60-80.00 keV E/T 85 hi/ + Th Fluorescence 59.50 keV Ex 69 hv + Th Photoionization 59.50 keV Ex 121 hi/ + Th Photoionization 19.60-80.00 keV E/T 85

13 hi/4-Th Photoionization 13.00-18.00 keV Ex 83 hi/4-Th Photoionization 59.50 keV Ex 69 hi/ 4- CF4 Photoionization 15.80 eV Th 53 hi/4-U Elastic Scattering 1.00-116.00 keV 100 hi/4- U Fluorescence 19.60-80.00 keV E/T 85 hi/ + U Fluorescence 59.50 keV Ex 69 hi/ + U Photoionization 59.50 keV Ex 121 hi/ 4- U Photoionization 19.60-80.00 keV E/T 85 hi/ 4- U Photoionization 13.00-18.00 keV Ex 83 hi/4-U Photoionization 59.50 keV Ex 69 hi/ + OCS Photoionization 191.00 eV 80 hi/ + Bi Fluorescence 59.50 keV Ex 69 hi/ + Bi Photoionization 59.50 keV Ex 69 hi/4- OH Total Absor., Scat. 8.05 eV Ex 23 1+ hi/ 4- Na93 Photoionization 3.10 eV Th 105 1+ hi/ + CD2H2 Photoionization 12.62-12.63 eV Ex 21 hi/ 4- PH3 Photoionization 200.00 eV 28 H1+ +H Photoionization 2.72 eV Th 92 Cs2 4- hi/ Photoexcitation LOOK Ex 73 nhi/ 4- H"1 Photoionization 0.09-0.37 eV Th 88 nhi/ 4- H1+ Photodetachment 0.09-0.37 eV Th 88 nhi/ 4- H2 Photoionization Th 39 nhi/ + He Photoionization 4.90-26.40 eV Th 87 nhi/ + He Photoionization 4.99 eV Th 74 nhi/ + F"1 Photodetachment 0.08-0.25 Ry Th 68 nhi/ 4- Xe Photoionization Th 113 2hi/ + H Photoionization Th 40 2hi/ 4- H2 Photodissociation 2.86-2.96 eV Ex 20 2hz/ 4- N2 Photoexcitation 1.42-14.46 eV Ex 19 3hi/ 4- F"1 Photodetachment 0.08-0.25 Ry Th 68 3hi/ 4- Xe Photoionization 4.66 eV Ex 55 Na2 Photoexcitation 0.00 K Ex 109 hi/ + H Elastic Scattering 0.50-8.00 K Th 316 hi/ 4- H Charge Transfer 1.00-30.00 keV Th 285 Interaction Potentials Th 332 Interaction Potentials 13.61-435.40 eV 270 hi/ 4- H Recombination 1.00-30.00 keV Th 285 hi/4-H Excitation 10.00 kK Th 260 ±LJ/ ~~\~~ Xl Ionization Th 331 XIJ/ —j— XJL Ionization 25.00 keV Th 290 hi/ 4- Ne Ionization Th 331 hi/ 4- Ne Ionization 0.10-0.50 MeV/ Ex 319 hi/ 4- Ne Ionization 0.10-0.50 MeV/ Ex 319 hi/ 4- Ca Ionization Th 331 hi/ 4- Zr Ionization Th 331 hi/ 4- Pb Ionization Th 331

14 2.2.2 Electron Collisions

1 e + H- Angular Scattering 10.00-20.00 eV Th 183 e + H-1 Detachment 10.00-20.00 eV Th 183 e + H Bremsstrahlung 3.00 Ry Th 188 e + H Elastic Scattering 40.80-54.40 eV Th 211 e + H Elastic Scattering 3.00 Ry Th 188 e + H Angular Scattering 30.00-100.00 eV 191 e + H Angular Scattering 14.60-40.80 eV Th 143 e + H Recombination 40.80-54.40 eV Th 211 e + H Recombination 0.10-10.00 eV Th 201 e + H Excitation 40.80-54.40 eV Th 211 e + H Excitation 30.00-100.00 eV 191 e + H Excitation 3.00 Ry Th 188 e + H Excitation 1.50-15.00 Ry Th 176 e + H Excitation 2.70-272.00 eV 149 e + H Excitation 12.10-27.00 eV Th 145 e + H Ionization 13.50-13.70 eV Th 215 e + H Ionization 15.60-30.00 eV Th 166 e + H Ionization 2.70-272.00 eV 149 e + H Ionization 14.60-40.80 eV Th 143 6.00 eV e + H2 Attachment E/T 207 6.00 eV e + H2 Dissociation E/T 207 400.00 eV e + H2 Dissociation 173 10.00 eV e + H2 Elastic Scattering Th 204 1.00-20.00 eV e + H2 Elastic Scattering Th 199 40.00 eV e H2 Elastic Scattering Ex 133 10.00 eV e H2 Angular Scattering Th 204 400.00 eV e H2 Excitation 173 7.50 eV e H2O Excitation Ex 132 1+ 0.00-0.25 eV e H3O Dissociation Ex 139 1+ 0.00-0.25 eV e D3O Dissociation Ex 139 e He Angular Scattering 30.00-100.00 eV 191 19.80-24.00 eV e He Angular Scattering Ex 178 1.58 keV e + He Angular Scattering E/T 151 27.00-109.00 eV e + He Fluorescence 175 1.58 keV e + He Fluorescence E/T 151 30.00-100.00 eV e + He Excitation 191 19.80-24.00 eV e + He Excitation Ex 178 27.00-109.00 eV e + He Excitation 175 500.00 eV e + He Excitation 161 1.58 keV e + He Excitation E/T 151 e + He Excitation Th 129 e + He Excitation 1.50-440.00 eV 123 e + He Ionization 25.00-200.00 eV 208 e + He Ionization 10.00 keV Th 202 e + He Ionization 200.00 eV 185 e + He Ionization 1.00-5.00 keV Th 147 e + He1+ Excitation Th 189 e + Ionization 75.00-500.00 eV 210 e + Ionization 132.00-168.00 eV 179 e + Be Elastic Scattering 1.00 keV Th 216 e + Be Angular Scattering 1.00 keV Th 216 e + C Elastic Scattering 1.00 keV Th 216 e + C Angular Scattering 1.00 keV Th 216

15 C3+ Excitation 5.00-200.00 eV 141 C3+ Ionization 290.00-350.00 eV 187 C5+ Excitation Th 189 CH4 Dissociation 60.00 eV Ex 130 CH4 Elastic Scattering 1.00-500.00 eV 196 CH4 Excitation 60.00 eV Ex 130 CH4 Ionization Th 186 CH4 Ionization 60.00 eV Ex 130 CO2 Angular Scattering 1.30-2.00 keV E/T 203 CO2 Excitation 1.30-2.00 keV E/T 203 C2H2 Dissociation 120.00 eV 152 C2H2 Ionization 120.00 eV 152 e + N2 Ionization 1.00 keV Ex 154 e + NO Angular Scattering 15.00-50.00 eV Ex 171 e + NO Excitation 15.00-50.00 eV Ex 172 e + NO Excitation 15.00-50.00 eV Ex 171 e NO Ionization 1.00 keV Ex 138 1.50-100.00 eV e N2O Elastic Scattering 155 1.50-100.00 eV e N2O Angular Scattering 155 1.50-100.00 eV e N2O Excitation 155 1.00 keV e NO2 Ionization Ex 138 0.00-100.00 keV e + O Elastic Scattering 190 20.00-300.00 keV/amu e + O Excitation 135 Excitation 2.50-40.00 eV Th 164 e + O5+ Excitation 5.00-200.00 eV 141 e + O2 Excitation 6.00-18.00 eV E/T 195 e + Ne Excitation 15.00-250.00 eV 209 e + Ne Excitation 2.50 eV Th 157 e + Ne Ionization 44.60 eV Ex 181 e + Ne2+ Excitation 0.00-1.00 GeV Th 167 e + Ne8+ Ionization 0.30-7.00 keV Th 213 e + Na Excitation 10.00-250.00 eV 198 e + Mg* Excitation 5.00-30.00 eV Ex 136 e + Mg Excitation 5.00-30.00 eV Ex 136 e + Mg* Ionization 5.00-30.00 eV Ex 136 e + Mg Ionization 5.00-30.00 eV Ex 136 Mgx+ Ionization 44.00-66.00 eV Th 146 Al Elastic Scattering 1.00 keV Th 216 Al Angular Scattering 1.00 keV Th 216 Al13+ Bremsstrahlung 20.00-70.00 keV Th 150 S2+ Excitation 15.00 eV E/T 125 Cl Ionization 0.01-1.00 keV Th 131 Cl Ionization 250.00 eV 137 2 16.00-80.00 eV e + Ar Angular Scattering Ex 169 470.00 eV e + Ar Excitation 193 2.00-100.00 eV e + Ar Excitation 192 2.00-100.00 eV e + Ar* Excitation 192 16.00-80.00 eV e + Ar Ex 169 Excitation 20.00-80.00 eV e + Ar Excitation Ex 160 e + Ar Ionization E/T 197 e + Ar Ionization 0.01-1.00 keV Th 131 e + K Excitation 18.70-31.00 eV Th 156 e + Ca Angular Scattering 0.04-1.50 keV Ex 144 e + Ca Ionization 4.00-20.00 eV E/T 174

16 e + Ti19+ Recombination 53.00 eV Ex 184 e + Mn Elastic Scattering 20.00 eV E/T 180 e + Mn5+ Ionization 4.00 keV Ex 200 e + Mn6+ Ionization 4.00 keV Ex 200 e + Mn7+ Ionization 4.00 keV Ex 200 e + Mn8+ Ionization 4.00 keV Ex 200 e + Fe9+ Excitation 0.00-6.00 kK Th 126 e + Fe10+ Excitation 0.00-6.00 kK Th 126 e + Fe12+ Excitation 0.00-6.00 kK Th 126 e + Fe15+ Excitation 0.05-1.00 kK Th 170 e + Fe16+ Excitation 0.95-2.72 keV Th 124 e + Fe20+ Excitation 3.54 keV Th 127 e + Fe22+ Excitation Th 128 e + Cu Elastic Scattering 1.00 keV Th 216 e + Cu Angular Scattering 1.00 keV Th 216 e + Ga Elastic Scattering 0.00-100.00 keV 190 e + Ga Angular Scattering 0.00-100.00 keV 190 e + Ge Bremsstrahlung 59.50 keV Ex 206 e + Br Ionization 0.01-1.00 keV Th 131 e + Kr Angular Scattering 15.00-20.00 eV E/T 159 e + Kr Angular Scattering 12.00-20.00 eV E/T 158 e + Kr Excitation 15.00-20.00 eV E/T 159 e + Kr Excitation 12.00-20.00 eV E/T 158 e + Kr Excitation 2.50 eV Th 157 e + Kr Ionization E/T 197 e + Kr Ionization 0.01-1.00 keV Th 131 e + Kr10+ Ionization 0.30-3.00 keV Th 165 e + Kr11+ Ionization 0.30-3.00 keV Th 165 e + Kr26+ Excitation 0.60-2.20 keV Th 212 e + Ag Elastic Scattering 1.00 keV Th 216 e + Ag Angular Scattering 1.00 keV Th 216 e + I Ionization 0.01-1.00 keV Th 131 e + Xe Excitation 2.50 eV Th 157 e + Xe Ionization E/T 197 e + Xe Ionization 0.01-1.00 keV Th 131 e + Ba Elastic Scattering 0.00-100.00 keV 190 e + Ba Angular Scattering 0.00-100.00 keV 190 e + La Excitation 100.00-600.00 eV 214 e + La Ionization 100.00-600.00 eV 214 e + Au Elastic Scattering 1.00 keV Th 216 e + Au Angular Scattering 1.00 keV Th 216 e + Au79+ Bremsstrahlung 20.00-70.00 keV Th 150 e + Hg Elastic Scattering 1.50 keV Ex 148 e + Hg Angular Scattering 1.50 keV Ex 148 e + Hg Fluorescence 1.50 keV Ex 148 e + Pb79+ Recombination 300.00 eV 194 e + CF4 Elastic Scattering 20.00 eV Th 168 e + CF4 Angular Scattering 20.00 eV Th 168 e + CC14 Elastic Scattering 20.00 eV Th 168 e + CCI4 Angular Scattering 20.00 eV Th 168 e + SiH4 Ionization 1.00 keV Th 140 e + SF6 Elastic Scattering 2.70-75.00 eV Ex 182 e + C2H4 Angular Scattering 3.20-15.50 eV Ex 162 e + C2H4 Excitation 3.20-15.50 eV Ex 162

17 e + HF Attachment 6.00 eV E/T 207 e + HF Dissociation 6.00 eV E/T 207 e + C2H6 Angular Scattering 3.20-15.50 eV Ex 162 e + C2H6 Excitation 3.20-15.50 eV Ex 162 e + SiH Ionization 1.00 keV Th 140 e + H Seq. Angular Scattering Th 142 e + H Seq. Recombination 0.00-1.00 MeV Th 122 e + H Seq. Excitation Th 134 e + H Seq. Ionization Th 142 e + HC1 Elastic Scattering 0.20-1.00 eV Ex 177 e + HC1 Angular Scattering 0.20-1.00 eV Ex 177 e + HC1 Excitation 0.20-1.00 eV Ex 177 e + C2F6 Elastic Scattering 1.00-250.00 eV 153 e + BC13 Elastic Scattering 5.00-50.00 eV Th 205 e + BCI3 Angular Scattering 5.00-50.00 eV Th 205 e + BCI3 Total Scattering 5.00-50.00 eV Th 205 e + BBr3 Elastic Scattering 5.00-50.00 eV Th 205 e + BBr3 Angular Scattering 5.00-50.00 eV Th 205 e + BBr3 Total Scattering 5.00-50.00 eV Th 205 e + BI3 Elastic Scattering 5.00-50.00 eV Th 205 e + BI3 Angular Scattering 5.00-50.00 eV Th 205 e + BI3 Total Scattering 5.00-50.00 eV Th 205 e + WF6 Elastic Scattering 1.00-250.00 eV 153 e + H2S2 Elastic Scattering 5.00 eV Th 163 e + H2S2 Angular Scattering 5.00 eV Th 163 e + CHBrCIF Elastic Scattering 5.00 eV Th 163 e + CHBrCIF Angular Scattering 5.00 eV Th 163 e + SiF Ionization 1.00 keV Th 140 e + SiF Ionization 2 1.00 keV Th 140 e + SiF Ionization 3 1.00 keV Th 140 e + SiH Ionization 2 1.00 keV Th 140 e + SiH Ionization 3 1.00 keV Th e + He+ Seq. Excitation 140 5 Th 189 e + C+ Seq. Excitation Th 189 e + O Excitation 20.00-300.00 keV/amu e + H Seq. Excitation 259 Th 258

2.2.3 Heavy Particle Collisions

H* + H Interaction Potentials Th 332 1+ H + H2 Interaction Potentials Th 230 H + HD Interchange reaction 0.40-1.40 eV Th 253 H + He Elastic Scattering 0.50-5.00 keV Th 326 H + CH4 Interchange reaction Th 237 H + Ne Elastic Scattering 0.50-5.00 keV Th 326 H + Ne Ionization 0.10-0.50 MeV/amu Ex 319 H + Ne Ionization 0.10-0.50 MeV/amu Ex 319 H + Na Line Broadening 0.30-10.00 K Th 279 Charge Transfer 1.00-30.00 keV Th 285 Recombination 1.00-30.00 keV Th 285 H Charge Transfer 0.01-1.50 MeV/amu Th 344 H Excitation 10.00 kK Th 260

18 H1+ +H Ionization 2.72 eV Th 321 1+ H + H2 Charge Transfer 0.05-6.25 keV/amu E/T 282 1+ H + H2 Interaction Potentials Th 230 1+ H + H2 Total Scattering 0.30-10.00 MeV Th 301 1+ H + H2 Total Scattering 40.00 keV E/T 288 1+ H + H2 Excitation 0.30-10.00 MeV Th 301 1+ H + H2 Ionization 40.00 keV E/T 288 H1+ + He Elastic Scattering 0.50-5.00 keV Th 326 H1+ + He Total Scattering 1.00 MeV Th 311 H1+ + He Total Scattering 0.11-2.50 MeV/amu Th 303 H1+ + He Total Scattering 40.00 keV E/T 288 H1+ + He Excitation 1.00 MeV Th 311 H1+ + He Excitation 100.00 keV 293 H1+ + He Ionization 1.00 MeV Th 311 H1+ + He Ionization 0.11-2.50 MeV/amu Th 303 H1+ + He Ionization 100.00 keV 293 H1+ + He Ionization 40.00 keV E/T 288 H1+ + He Ionization 1.50 MeV Th 278 H1+ + He1+ Ionization 0.20-2.00 MeV E/T 339 H1+ + He2+ Ionization 0.01-2.00 MeV/amu Th 349 H1+ + Be3+ Ionization 0.01-2.00 MeV/amu Th 349 Hl+ + B4+ Ionization 0.01-2.00 MeV/amu Th 349 H1+ + C Charge Transfer 1.00-3.50 MeV Ex 305 H1+ + C Ionization 1.00-3.50 MeV Ex 305 H*+ + C5+ Ionization 0.01-2.00 MeV/amu Th 349 H1+ + CO Elastic Scattering 0.10-20.00 keV/amu Th 324 H1+ + CO Charge Transfer 0.10-20.00 keV/amu Th 324 H1+ + N1+ Excitation 0.00-70.00 keV Th 218 H1+ + O Charge Transfer 1.00-200.00 keV 340 H1+ + O Excitation 1.00-200.00 keV 340 H1+ + O Excitation 20.00-300.00 keV/amu 259 H1+ + O Ionization 0.01-1.00 MeV Th 348 H1+ + O Ionization 1.00-200.00 keV 340 2 Hi+ + O + Excitation 0.00-70.00 keV Th 218 H1+ + Ne Elastic Scattering 0.50-5.00 keV Th 326 H1+ + Ne Charge Transfer 0.00-5.00 MeV Th 315 H1+ + Ne Ionization 0.00-5.00 MeV Th 315 R!+ + Ne3+ Excitation 0.00-70.00 keV Th 218 H1+ + Na Charge Transfer 1.00 keV E/T 318 H1+ + Mg6+ Excitation 0.00-70.00 keV Th 218 H1+ + Al Ionization 0.01-10.00 MeV Th 307 8+ Hi+ + Si Excitation 0.00-70.00 keV Th 218 JJ1+ + Ar12+ Excitation 0.00-70.00 keV Th 218 H*+ + Ca14+ Excitation 0.00-70.00 keV Th 218 Hi+ + Tii6+ Excitation 0.00-70.00 keV Th 218 Hi+ + Cri8+ Excitation 0.00-70.00 keV Th 218 H1+ + Fe Ionization 0.01-10.00 MeV Th 307 Hi+ + Fe20+ Excitation 0.00-70.00 keV Th 218 Hl+ + Nj22+ Excitation 0.00-70.00 keV Th 218 H1+ + Zr Ionization 0.01-10.00 MeV Th 307 H1+ + Tb Fluorescence 6.00-30.00 MeV Ex 327 H1+ + Tb Excitation 6.00-30.00 MeV Ex 327 H1+ + Tb Ionization 6.00-30.00 MeV Ex 327 H1+ + PERT Excitation 3.50 MeV Th 308

19 H1+ + PERT Ionization 3.50 MeV Th 308 H1+ + H Seq. Excitation Th 258 H1+ + O Excitation 20.00-300.00 keV/amu 135 H1+ + H Seq. Excitation Th 134 H2 +H2 De-excitation 6.00-12.00 kK Th 298 H2 + H2 Energy Transfer 6.00-12.00 kK Th 298 H2 4- H2 Energy Transfer 0.05-3.00 K Th 224 H2 + Cl Interchange reaction 255.00-620.00 K 226 1+ H2 + He Interchange reaction 0.95-1.15 eV Th 233 1+ H3 + O Interchange reaction 295.00 K 234 HD + CN Interchange reaction 0.10-0.60 eV Th 250 D -t-Ne Ionization 0.10-0.50 MeV/amu Ex 319 D + Ne Ionization 0.10-0.50 MeV/amu Ex 319 Di+ + Ni+ Excitation 0.00-70.00 keV Th 218 2 Di+ + o + Excitation 0.00-70.00 keV Th 218 3+ Di+ + Ne Excitation 0.00-70.00 keV Th 218 D1+ + Mg6+ Excitation 0.00-70.00 keV Th 218 Di+ + Sis+ Excitation 0.00-70.00 keV Th 218 Di+ + Ari2+ Excitation 0.00-70.00 keV Th 218 D1+ + Ca14+ Excitation 0.00-70.00 keV Th 218 Di+ + Tii6+ Excitation 0.00-70.00 keV Th 218 Dl+ + Cr18+ Excitation 0.00-70.00 keV Th 218 20 Di+ + Fe + Excitation 0.00-70.00 keV Th 218 Di+ + Ni22+ Excitation 0.00-70.00 keV Th 218 1+ D2 + Ne Ionization 0.10-0.50 MeV/amu Ex 319 1+ D2 + Ne Ionization 0.10-0.50 MeV/amu Ex 319 Ti+ + NI+ Excitation 0.00-70.00 keV Th 218 T!+ + O2+ Excitation 0.00-70.00 keV Th 218 T1+ + Ne3+ Excitation 0.00-70.00 keV Th 218 T1+ + Mg6+ Excitation 0.00-70.00 keV Th 218 T1+ + Si8+ Excitation 0.00-70.00 keV Th 218 Ti+ + Ari2+ Excitation 0.00-70.00 keV Th 218 T1+ + Ca14+ Excitation 0.00-70.00 keV Th 218 T1+ + Ti16+ Excitation 0.00-70.00 keV Th 218 Ti+ + Cris+ Excitation 0.00-70.00 keV Th 218 20+ Ti+ + Fe Excitation 0.00-70.00 keV Th 218 Ti+ + Ni22+ Excitation 0.00-70.00 keV Th 218 He-1 + He Interaction Potentials Th 273 He + H Ionization 0.00-1.00 GeV/amu E/T 337 He + H2 Energy Transfer 3.00-10.00 eV Th 249 He + HD Excitation 0.30-1.00 K Th 217 He + He Elastic Scattering 0.50-5.00 keV Th 326 He + He Elastic Scattering Th 221 He-t-He Interaction Potentials Th 322 He + He Ionization 0.00 K Ex 336 He* + Li De-excitation 100.00 MeV 262 He + Li De-excitation 100.00 MeV 262 He + Li Ionization 100.00 MeV 262 He + Be Interaction Potentials Th 242 He+ CO Energy Transfer 100.00 K 264 He* + CO2 Ionization 245.00 K 245 He + CO2 Ionization 245.00 K 245 He+ O2 De-excitation 0.10-10.00 K Th 330

20 He + o Elastic Scattering 0.10-10.00 K Th 330 He + N2e Elastic Scattering 0.50-5.00 keV Th 326 He + Ne Ionization 0.10-0.50 MeV/amu Ex 319 He + Ne Ionization 0.10-0.50 MeV/amu Ex 319 He + Mg Interaction Potentials Th 242 He + Ca Interaction Potentials Th 242 He + Sr Interaction Potentials Th 242 He + Ba Interaction Potentials Th 242 He1+ + H Ionization 0.00-1.00 GeV/amu E/T 337 1+ He + H2 Dissociation 10.00-50.00 eV Th 239 1+ He + H2 Charge Transfer 10.00-50.00 eV Th 239 He1+ + He2+ Charge Transfer 0.01-10.00 keV Th 283 He1+ + He2+ Total Scattering 0.01-10.00 keV Th 283 He1+ + He2+ Ionization 0.01-10.00 keV Th 283 He1+ + CO Dissociation 1.00-10.00 MeV Ex 219 He1+ + Ne Ionization 0.10-0.50 MeV/amu Ex 319 He1+ 4-Ne Ionization 0.10-0.50 MeV/amu Ex 319 He2+ + H Charge Transfer 0.01-1.50 MeV/amu Th 344 He2+ + H Charge Transfer 0.50-2.75 MeV E/T 342 He2+ + H Charge Transfer E/T 291 He2+ + H Charge Transfer 1.00-100.00 keV/amu 281 2+ He + H2 Charge Transfer 0.50-2.75 MeV E/T 342 He2+ + Li Charge Transfer 1.00-100.00 keV/amu 281 He2+ 4- N1+ Excitation 0.00-70.00 keV Th 218 He2+ + o Ionization 0.01-1.00 MeV Th 348 He2+ 4- O2+ Excitation 0.00-70.00 keV Th 218 He2+ + Ne3+ Excitation 0.00-70.00 keV Th 218 He2+ 4- Na Charge Transfer 12.20-32.90 eV Th 299 He2+ + Na Total Scattering 12.20-32.90 eV Th 299 He2+ + Mg6+ Excitation 0.00-70.00 keV Th 218 He2+ 4-Si8+ Excitation 0.00-70.00 keV Th 218 He2+ 4- Ar12+ Excitation 0.00-70.00 keV Th 218 He2+ 4- Ca14+ Excitation 0.00-70.00 keV Th 218 He2+ + Ti16+ Excitation 0.00-70.00 keV Th 218 He2+ 4- Cr18+ Excitation 0.00-70.00 keV Th 218 He2+ 4- Fe20+ Excitation 0.00-70.00 keV Th 218 He2+ + Ni22+ Excitation 0.00-70.00 keV Th 218 Li + He De-excitation Th 325 Li* 4 He De-excitation Th 325 Li4- C60 Dissociation 2.00 MeV Ex 314 Li4- C60 Charge Transfer 2.00 MeV Ex 314 Li + C60 Ionization 2.00 MeV Ex 314 Li + HF Interchange reaction 0.40 eV Th 243 1+ Li + H2 Charge Transfer 0.05-6.25 keV/amu E/T 282 Li1+ + Li Interaction Potentials Th 247 Li1+ + C60 Dissociation 2.00 MeV Ex 314 1+ Li + C6o Charge Transfer 2.00 MeV Ex 314 Li1+ 4- Ceo Ionization 2.00 MeV Ex 314 Li2+ 4-He2+ Ionization 0.01-2.00 MeV/amu Th 349 Li2+ 4-Li3+ Charge Transfer 0.01-10.00 keV Th 283 Li2+ + Li3+ Total Scattering 0.01-10.00 keV Th 283 Li2+ + Li3+ Ionization 0.01-10.00 keV Th 283 Li2+ + C60 Dissociation 2.00 MeV Ex 314 2+ Li + C6o Charge Transfer 2.00 MeV Ex 314 2+ Li 4- CKO Ionization 2.00 MeV Ex 314

21 Li3+ 4 H Charge Transfer 1.00-100.00 keV/amu 281 Li3+ 4 Li Charge Transfer 1.00-100.00 keV/amu 281 Li3+ + c Dissociation 2.00 MeV Ex 314 3+ 60 Li 4 C60 Charge Transfer 2.00 MeV Ex 314 Li3+ 4 Ceo Ionization 2.00 MeV Ex 314 Be 4 Interaction Potentials Th 244 co2 Be3+ 4He2+ Ionization 0.01-2.00 MeV/amu Th 349 Be3+ 4Be4+ Charge Transfer 0.01-10.00 keV Th 283 Be3+ 4Be4+ Total Scattering 0.01-10.00 keV Th 283 Be3+ 4Be4+ Ionization 0.01-10.00 keV Th 283 Be4+ 4H Charge Transfer 1.00-100.00 keV/amu 281 Be4+ 4 Li Charge Transfer 1.00-100.00 keV/amu 281 B4+ 4H Charge Transfer 0.06-10.00 keV Th 329 B4+ 4He2+ Ionization 0.01-2.00 MeV/amu Th 349 5 B4+ 4B + Charge Transfer 0.01-10.00 keV Th 283 5+ B4+ 4 B Total Scattering 0.01-10.00 keV Th 283 5+ B4+ 4 B Ionization 0.01-10.00 keV Th 283 B5+ 4H Charge Transfer 1.00-100.00 keV/amu 281 B5+ 4 Li Charge Transfer 1.00-100.00 keV/amu 281 c + H Ionization 0.00-1.00 GeV/amu E/T 337 c1+ 4H Ionization 0.00-1.00 GeV/amu E/T 337 c1+ 4 Ca Ionization 0.01-10.00 MeV Th 307 c1+ 4Sc Ionization 0.01-10.00 MeV Th 307 4Ti Ionization 0.01-10.00 MeV Th 307 4 V Ionization 0.01-10.00 MeV Th 307 c1+ 4 Cr Ionization 0.01-10.00 MeV Th 307 c1+ 4Fe Ionization 0.01-10.00 MeV Th 307 c1+ 4 Cu Ionization 0.01-10.00 MeV Th 307 C2+ 4H Charge Transfer 6.00 keV E/T 297 C2+ 4H Charge Transfer 0.10-300.00 keV 272 C2+ 4H Ionization 0.00-1.00 GeV/amu E/T 337 C2+ 4Ca Ionization 2.00-19.00 MeV/amu E/T 341 C2+ 4 Ti Ionization 2.00-19.00 MeV/amu E/T 341 C2+ 4 Cr Ionization 2.00-19.00 MeV/amu E/T 341 C2+ 4 Fe Ionization 2.00-19.00 MeV/amu E/T 341 C3+ 4H Charge Transfer 1.00-3.00 MeV E/T 286 C3+ 4H Ionization 0.00-1.00 GeV/amu E/T 337 3+ C 4H2 Charge Transfer 1.00-3.00 MeV E/T 286 C3+ 4 Ca Ionization 2.00-19.00 MeV/amu E/T 341 C3+ 4 Ti Ionization 2.00-19.00 MeV/amu E/T 341 C3+ 4 Cr Ionization 2.00-19.00 MeV/amu E/T 341 C3+ 4Fe Ionization 2.00-19.00 MeV/amu E/T 341 Q4+ 4 Ca Ionization 2.00-19.00 MeV/amu E/T 341 Q4+ 4Ti Ionization 2.00-19.00 MeV/amu E/T 341 C4+ 4 Cr Ionization 2.00-19.00 MeV/amu E/T 341 C4+ 4Fe Ionization 2.00-19.00 MeV/amu E/T 341 c4+ 4Tb Fluorescence 6.00-30.00 MeV Ex 327 C4+ 4Tb Excitation 6.00-30.00 MeV Ex 327 C4+ 4Tb Ionization 6.00-30.00 MeV Ex 327 2+ C5+ 4He Ionization 0.01-2.00 MeV/amu Th 349 C6+ 4H Charge Transfer 1.00-100.00 keV/amu 281 C6+ 4 He Total Scattering 0.11-2.50 MeV/amu Th 303 C6+ 4 He Total Scattering 100.00 MeV/amu 275 C6+ 4 He Total Scattering 100.00 MeV/amu 274

22 6 C + + He Ionization 0.11-2.50 MeV/amu Th 303 C6+ + He Ionization 100.00 MeV/amu 275 C6+ + He Ionization 100.00 MeV/amu 274 C6+ + Li Charge Transfer 1.00-100.00 keV/amu 281 CH + He De-excitation 295.00-383.00 K 241 CH + Ar De-excitation 295.00-383.00 K 241 CH2 + O2 Interchange reaction 300.00 K 240 1+ CH3 + H2 Association 10.00-100.00 K 292 CD + He De-excitation 295.00-383.00 K 241 CD +Ar De-excitation 295.00-383.00 K 241 CO + CO Interaction Potentials Th 227 CO2 + H2 Association 1.00-2.00 eV Th 251 N + H2 Interchange reaction 0.40-2.50 K Th 263 N + H2 Interchange reaction Th 238 N* + H2 Interchange reaction Th 238 N + H2 Interchange reaction 2.50-46.00 eV Ex 228 N + H2 Interaction Potentials Th 238 N* +H2 Interaction Potentials Th 238 N + H2 Fluorescence 2.50-46.00 eV Ex 228 N + N2 Dissociation 0.10-4.50 eV Th 254 N + N2 Energy Transfer 0.10-4.50 eV Th 254 N1+ + Ca Ionization 0.01-10.00 MeV Th 307 N1+ + Sc Ionization 0.01-10.00 MeV Th 307 Na+ + Ti Ionization 0.01-10.00 MeV Th 307 N1+ + V Ionization 0.01-10.00 MeV Th 307 N1+ + Cr Ionization 0.01-10.00 MeV Th 307 N1+ + Fe Ionization 0.01-10.00 MeV Th 307 N1+ -1- Cu Ionization 0.01-10.00 MeV Th 307 N2+ + Yb , Ionization 0.30-3.50 MeV/amu Ex 345 N3+ + Yb Ionization 0.30-3.50 MeV/amu Ex 345 N5+ + Cs Charge Transfer 20.00 keV Ex 346 N5+ + Cs Excitation 20.00 keV Ex 346 N7+ +H Charge Transfer 1.00-100.00 keV/amu 281 N7+ + Li Charge Transfer 1.00-100.00 keV/amu 281 1+ N2 + N2 Energy Transfer 0.04-0.10 eV Th 246 NO* + H2O Interchange reaction 300.00 keV 257 NO* + H2O Interaction Potentials 300.00 keV 257 O + H2 Interchange reaction Ex 261 O* +H2 Interchange reaction Ex 261 O* +HD Interchange reaction Ex 261 O + HD Interchange reaction Ex 261 O* +HD Interchange reaction 0.20 eV Th 222 O +HD Interchange reaction 0.20 eV Th 222 O + O2 Interaction Potentials Th 252 O2+ + Ca Ionization 2.00-19.00 MeV/amu E/T 341 O2+ + Ti Ionization 2.00-19.00 MeV/amu E/T 341 O2+ + Cr Ionization 2.00-19.00 MeV/amu E/T 341 O2+ + Fe Ionization 2.00-19.00 MeV/amu E/T 341 O3+ + Ca Ionization 2.00-19.00 MeV/amu E/T 341 O3+ + Ti Ionization 2.00-19.00 MeV/amu E/T 341 O3+ + Cr Ionization 2.00-19.00 MeV/amu E/T 341 O3+ + Fe Ionization 2.00-19.00 MeV/amu E/T 341 O3+ + Os Ionization 0.40-2.00 MeV/amu E/T 306 O3+ + Au Ionization 0.40-2.00 MeV/amu E/T 306

23 O3+ + Th Ionization 0.40-2.00 MeV/amu E/T 306 O3+ + U Ionization 0.40-2.00 MeV/amu E/T 306 O3+ + Bi Ionization 0.40-2.00 MeV/amu E/T 306 5 O + + H2 Dissociation 75.00-345.00 keV 300 5+ O + H2 Charge Transfer 75.00-345.00 keV 300 5 O + + H2 Energy Transfer 75.00-345.00 keV 300 5+ O + H2 Total Scattering 75.00-345.00 keV 300 O6+ + Ca Ionization 2.00-19.00 MeV/amu E/T 341 Q6+ + Ti Ionization 2.00-19.00 MeV/amu E/T 341 O6+ + Cr Ionization 2.00-19.00 MeV/amu E/T 341 O6+ + Fe Ionization 2.00-19.00 MeV/amu E/T 341 O6+ + Cs Charge Transfer 20.00 keV Ex 346 O6+ + Cs Excitation 20.00 keV Ex 346 O7+ + CO Dissociation 0.00-11.40 MeV E/T 294 O7+ + CO Charge Transfer 0.00-11.40 MeV E/T 294 O7+ + CO Total Scattering 0.00-11.40 MeV E/T 294 O7+ + CO Ionization 0.00-11.40 MeV E/T 294 O7+ + Ne Charge Transfer 0.83 MeV/amu Ex 343 O7+ + Ne Ionization 0.83 MeV/amu Ex 343 O8+ + H Charge Transfer E/T 291 O8+ + H Charge Transfer 1.00-100.00 keV/amu 281 O8+ + Li Charge Transfer 1.00-100.00 keV/amu 281 8 O + + C60 Dissociation 80.00 keV Ex 302 8 O + + C60 Ionization 80.00 keV Ex 302 1+ O2 + O2 Line Broadening 290.00 K 220 F + H2 Interchange reaction 0.40 eV Th 225 F +HD Interchange reaction 0.02-0.06 eV Th 223 F7+ + Cs Charge Transfer 20.00 keV Ex 346 F7+ + Cs Excitation 20.00 keV Ex 346 F9+ + H Charge Transfer 1.00-100.00 keV/amu 281 F9+ + Li Charge Transfer 1.00-100.00 keV/amu 281 Ne* + CO2 Ionization 245.00 K 245 Ne + CO2 Ionization 245.00 K 245 Ne + Ne Interaction Potentials Th 334 Ne* + Ne* Interaction Potentials Th 334 Ne + Ne Interaction Potentials Th 322 Ne+ Ne Ionization Th 331 Ne3+ + Ca Ionization 2.00-19.00 MeV/amu E/T 341 Ne3+ + Ti Ionization 2.00-19.00 MeV/amu E/T 341 Ne3+ + Cr Ionization 2.00-19.00 MeV/amu E/T 341 Ne3+ + Fe Ionization 2.00-19.00 MeV/amu E/T 341 Ne6+ + Ca Ionization 2.00-19.00 MeV/amu E/T 341 Ne6+ + Ti Ionization 2.00-19.00 MeV/amu E/T 341 Ne6+ + Cr Ionization 2.00-19.00 MeV/amu E/T 341 Ne6+ + Fe Ionization 2.00-19.00 MeV/amu E/T 341 Ne8+ + Ca Ionization 2.00-19.00 MeV/amu E/T 341 Ne8+ + Ti Ionization 2.00-19.00 MeV/amu E/T 341 Ne8+ + Cr Ionization 2.00-19.00 MeV/amu E/T 341 Ne8+ + Fe Ionization 2.00-19.00 MeV/amu E/T 341 Ne8+ + Cs Charge Transfer 20.00 keV Ex 346 Ne8+ + Cs Excitation 20.00 keV Ex 346 Ne10+ + H Charge Transfer 1.00-100.00 keV/amu 281 Ne10+ + Li Charge Transfer 1.00-100.00 keV/amu 281 Na* + Na* Association 0.00 K Ex 333

24 Na + Na Association 0.50 K Th 313 Na + Na De-excitation Ex 312 Na + Na Interaction Potentials 13.61-435.40 eV 270 Na1+ + Li Charge Transfer E/T 268 1+ Na + N2 Interaction Potentials Th 248 Si4+ + Os Ionization 0.40-2.00 MeV/amu E/T 306 Si4+ + Au Ionization 0.40-2.00 MeV/amu E/T 306 Si4+ + Th Ionization 0.40-2.00 MeV/amu E/T 306 Si4+ + U Ionization 0.40-2.00 MeV/amu E/T 306 Si4+ 4- Bi Ionization 0.40-2.00 MeV/amu E/T 306 Si7+ 4- Yb Ionization 0.30-3.50 MeV/amu Ex 345 Si8+ 4- Ar Charge Transfer 0.90-4.00 MeV/amu E/T 267 Si8+ 4- Yb Ionization 0.30-3.50 MeV/amu Ex 345 Si13+ 4- Ar Charge Transfer 0.90-4.00 MeV/amu E/T 267 Si14+ 4- Ar Charge Transfer 0.90-4.00 MeV/amu E/T 267 S 4-H2 Interchange reaction Th 236 c 1 tr Interchange reaction Th 231 0 -+- JI2 S +HD Interchange reaction Th 236 S + D2 Interchange reaction Th 236 S + D2 Interchange reaction Th 231 S6+ 4- Os Ionization 0.40-2.00 MeV/amu E/T 306 S6+ 4- Au Ionization 0.40-2.00 MeV/amu E/T 306 S6+ 4- Th Ionization 0.40-2.00 MeV/amu E/T 306 S6+ 4-U Ionization 0.40-2.00 MeV/amu E/T 306 S6+ 4- Bi Ionization 0.40-2.00 MeV/amu E/T 306 ci + cr1 Interaction Potentials Th 289 Cl4- Cl Interaction Potentials Th 289 Cl1+ 4- Cl Interaction Potentials Th 289 Cl16+ 4- H Charge Transfer 0.10-5.00 keV Ex 287 Ar 4- OH Energy Transfer 0.09 eV Ex 266 Ar 4- OH Energy Transfer 0.09 eV Ex 265 Ar6+ 4- He Charge Transfer 9.00 keV E/T 296 Ar6+ 4- He Excitation 9.00 keV E/T 296 Ar8+ + Na4o Charge Transfer 80.00-320.00 keV 328 Ar8+ + Na4o Excitation 80.00-320.00 keV 328 Ar8+ 4- Na4o Ionization 80.00-320.00 keV 328 Ca+ Ne Line Broadening 0.00-272.00 eV 276 Ca+ Ne Charge Transfer 0.06-0.25 eV Th 320 Ca + Na Line Broadening 0.00-272.00 eV 276 Ca+ Ca Ionization Th 331 Tiio+ + Yb Ionization 0.30-3.50 MeV/amu Ex 345 Tin+ + Yb Ionization 0.30-3.50 MeV/amu Ex 345 Ni1+ 4- Ti Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Ti Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Cr Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Cr Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Fe Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Fe Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Ni Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Ni Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Cu Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Cu Ionization 15.00-25.00 MeV Ex 310 Ni1+ + Zn Ionization 15.00-25.00 MeV Ex 310 Ni1+ 4- Zn Ionization 15.00-25.00 MeV Ex 310

25 + Ge Ionization 15.00-25.00 MeV Ex 310 "N'T • + Ge Ionization 15.00-25.00 MeV Ex 310 Kr1+ + He Total Scattering 1.00-5.00 keV Ex 280 Krx+ + He Ionization 1.00-5.00 keV Ex 280 1+ Kr + CH4 Interchange reaction 0.10-1.00 eV Ex 255 Kr1+ + Ne Total Scattering 1.00-5.00 keV Ex 280 Kr1+ + Ne Ionization 1.00-5.00 keV Ex 280 Kri+ 4-Ar Total Scattering 1.00-5.00 keV Ex 280 Kr1+ + Ar Ionization 1.00-5.00 keV Ex 280 Kri+ + Xe Total Scattering 1.00-5.00 keV Ex 280 Krx+ + Xe Ionization 1.00-5.00 keV Ex 280 Rb4 Rb Association Th 335 Rb4- Rb Interaction Potentials Th 335 Rb 4 Cs Interaction Potentials Th 284 Zr 4- Zr Ionization Th 331 Cd* + Ar Interaction Potentials Th 256 Cd-(- Ar Interaction Potentials Th 256 Cd* + Cd Interaction Potentials Th 256 Cd -t- Cd Interaction Potentials Th 256 I + H2 Interchange reaction 1.75-2.60 K Ex 235 J6+ _j- Cs Charge Transfer E/T 291 J7+ _|- Cs Charge Transfer E/T 291 j8+ _j- Cs Charge Transfer E/T 291 j9+ _|^Cs Charge Transfer E/T 291 J10+ + Cs Charge Transfer E/T 291 Jll + + Cs Charge Transfer E/T 291 T12+ + Cs Charge Transfer E/T 291 T13+ + Cs Charge Transfer E/T 291 J14+ + Cs Charge Transfer E/T 291 J15+ + Cs Charge Transfer E/T 291 + Cs Charge Transfer E/T 291 J17+ + Cs Charge Transfer E/T 291 + Cs Charge Transfer E/T 291 J19+ + Cs Charge Transfer E/T 291 J20+ + Cs Charge Transfer E/T 291 121 + + Cs Charge Transfer E/T 291 J22+ + Cs Charge Transfer E/T 291 J23+ + Cs Charge Transfer E/T 291 J24+ + Cs Charge Transfer E/T 291 J25+ 4- Cs Charge Transfer E/T 291 J26+ + Cs Charge Transfer E/T 291 J27+ 4- Cs Charge Transfer E/T 291 J28+ 4- Cs Charge Transfer E/T 291 J29+ 4- Cs Charge Transfer E/T 291 J30+ 4- Cs Charge Transfer E/T 291 Xe* 4-Xe Line Broadening Ex 232 Xe- f Xe Line Broadening Ex 232 Xe* 4- Xe Interaction Potentials Ex 232 Xe- f Xe Interaction Potentials Ex 232 23 Xe + + H2 Dissociation 75.00-345.00 keV 300 23 Xe + + H2 Charge Transfer 75.00-345.00 keV 300 23 Xe + + H2 Energy Transfer 75.00-345.00 keV 300 23 Xe + + H2 Total Scattering 75.00-345.00 keV 300 Cs + Cs Association LOOK Ex 295

26 Cs+ Cs De-excitation Ex 312 Cs + Cs De-excitation LOOK Ex 295 Cs _+ Cs Elastic Scattering Ex 323 Au53+ + Ionization 3.60 MeV/amu Ex 317 Hg* + CO Line Broadening 333.00 K 229 Hg+ CO Line Broadening 333.00 K 229 Hg* + N2 Line Broadening 333.00 K 229 Hg + N2 Line Broadening 333.00 K 229 Pb + Ne Ionization Th 331 Pb + Ca Ionization Th 331 Pb + Zr Ionization Th 331 Pb + Pb Ionization Th 331 PERT + Detachment 10.00-200.00 eV 277 PERT + B Ionization 10.00-200.00 eV 277 PERT1+ Cu Excitation 10.00 MeV/amu Th 309 PERT1+ + Cu Ionization 10.00 MeV/amu Th 309 PERT1+ 4- PERT Charge Transfer 0.10-10.00 eV Th 347 U9090+ Ar Excitation 223.20 MeV/amu 338 U90+ Ar Ionization 223.20 MeV/amu 338 U90+ Kr Excitation 223.20 MeV/amu 338 U90+ Kr Ionization 223.20 MeV/amu 338 U90+ Xe Excitation 223.20 MeV/amu 338 U90+ Xe Ionization 223.20 MeV/amu 338 Bi81+ C Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi81+ C Fluorescence 0.10-1.00 GeV/amu Th 304 Bi81+ C Ionization 0.10-1.00 GeV/amu Th 304 Bi81+ + Al Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi81+ + Al Fluorescence 0.10-1.00 GeV/amu Th 304 Bi81+ + Al Ionization 0.10-1.00 GeV/amu Th 304 Bi81+ Cu Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi81+ Cu Fluorescence 0.10-1.00 GeV/amu Th 304 Bi81+ Cu Ionization 0.10-1.00 GeV/amu Th 304 81+ Bi + Ag Charge Transfer 0.10-1.00 GeV/amu Th 304 81+ Bi + Ag Fluorescence 0.10-1.00 GeV/amu Th 304 81+ Bi + Ag Ionization 0.10-1.00 GeV/amu Th 304 81+ Bi + Au Charge Transfer 0.10-1.00 GeV/amu Th 304 81+ Bi + Au Th 304 81 Fluorescence 0.10-1.00 GeV/amu Bi + + Au Ionization 0.10-1.00 GeV/amu Th 304 82+ Bi + He Excitation 119.00-470.00 MeV/amu 271 82+ Bi + He Ionization 119.00-470.00 MeV/amu 271 82+ Bi + C Charge Transfer 0.10-1.00 GeV/amu Th 304 82+ Bi + C Fluorescence 0.10-1.00 GeV/amu Th 304 Bi82+ + C Ionization 0.10-1.00 GeV/amu Th 304 Bi82+ + A1 Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi82+ + A1 Fluorescence 0.10-1.00 GeV/amu Th 304 Bi82+ + Al Ionization 0.10-1.00 GeV/amu Th 304 Bi82+ + Cu Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi82+ + Cu Fluorescence 0.10-1.00 GeV/amu Th 304 Bi82+ + Cu Excitation 119.00-470.00 MeV/amu 271 Bi82+ + Cu Ionization 0.10-1.00 GeV/amu Th 304 82+ Bi + Cu Ionization 119.00-470.00 MeV/amu 271 Bi82+ + Ag Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi82+ + Ag Fluorescence 0.10-1.00 GeV/amu Th 304 Bi82+ + Ag Ionization 0.10-1.00 GeV/amu Th 304

27 Bi82+ + Au Charge Transfer 0.10-1.00 GeV/amu Th 304 Bj82+ + Au Fluorescence 0.10-1.00 GeV/amu Th 304 Bi82+ 4- Au Ionization 0.10-1.00 GeV/amu Th 304 Bi83+ + C Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi83+ 4- C Fluorescence 0.10-1.00 GeV/amu Th 304 Bi83+ + C Ionization 0.10-1.00 GeV/amu Th 304 Bi83+ + Al Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi83+ + Al Fluorescence 0.10-1.00 GeV/amu Th 304 Bi83+ + Al Ionization 0.10-1.00 GeV/amu Th 304 Bi83+ + Cu Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi83+ + Cu Fluorescence 0.10-1.00 GeV/amu Th 304 Bi83+ + Cu Ionization 0.10-1.00 GeV/amu Th 304 Bi83+ + Ag Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi83+ + Ag Fluorescence 0.10-1.00 GeV/amu Th 304 Bi83+ + Ag Ionization 0.10-1.00 GeV/amu Th 304 Bi83+ + Au Charge Transfer 0.10-1.00 GeV/amu Th 304 Bi83+ + Au Fluorescence 0.10-1.00 GeV/amu Th 304 Bi83+ + Au Ionization 0.10-1.00 GeV/amu Th 304 Li2 + Ne De-excitation Th 269 Li2 + Ne Energy Transfer Th 269

2.3 Surface Interactions

2.3.1 Sputtering e + SiH Sputtering 32.00 keV Th 422 n + Mg Sputtering 14.90 MeV Ex 372 n + Al Sputtering 14.90 MeV Ex 372 n + Sc Sputtering 14.90 MeV Ex 372 n + V Sputtering 14.90 MeV Ex 372 n + Fe Sputtering 14.90 MeV Ex 372 n + Fe Sputtering 14.90 MeV Ex 372 n + Co Sputtering 14.90 MeV Ex 372 n + Cu Sputtering 14.90 MeV Ex 372 n 4- Zr Sputtering 14.90 MeV Ex 372 n 4- Au Sputtering 14.90 MeV Ex 372 n 4- SS Sputtering 14.90 MeV Ex 372 H + C Sputtering 0.10-10.00 keV Ex 448 H + C Sputtering Ex 447 H+ + C Sputtering 0.01-8.00 keV Ex 371 H+ 4- C Sputtering 20.00-300.00 eV 370 H+ +N2 Sputtering 2.00 MeV Ex 414 H+ 4- Si Sputtering 20.00-300.00 eV 370 H+ + SiC Sputtering 20.00-300.00 eV 370 H+ + Ar Sputtering 2.00 MeV Ex 414 H+ +Fe Sputtering 0.10-1.50 keV Ex 469 H+ 4- LiF Sputtering 0.02-1.00 keV Ex 378 H+ 4- SS Sputtering 0.10-1.50 keV Ex 469 D + C Sputtering 0.10-10.00 keV Ex 448 D+ + C Sputtering 0.01-8.00 keV Ex 371 D+ 4-C Sputtering 20.00-300.00 eV 370 D+ 4-Si Sputtering 20.00-300.00 eV 370

28 D+ + SiC Sputtering 20.00-300.00 eV 370 D+ + Fe Sputtering 0.10-1.50 keV Ex 469 D+ + SS Sputtering 0.10-1.50 keV Ex 469 He+ + LiF Sputtering 0.02-1.00 keV Ex 378 He+ + GaAs Sputtering 1.00-13.00 keV Th 466 Be + C Sputtering 0.00-1.00 MeV Th 373 Be + W Sputtering 0.00-1.00 MeV Th 373 C + Be Sputtering 0.00-1.00 MeV Th 373 C + W Sputtering 0.00-1.00 MeV Th 373 C+ + LiF Sputtering 0.02-1.00 keV Ex 378 C2+ + LiF Sputtering 0.02-1.00 keV Ex 378 N+ + LiF Sputtering 0.02-1.00 keV Ex 378 N2+ + LiF Sputtering 0.02-1.00 keV Ex 378 N2+ + Si Sputtering 1.50-9.00 keV Ex 463 O+ + LiF Sputtering 0.02-1.00 keV Ex 378 O2+ + LiF Sputtering 0.02-1.00 keV Ex 378 F+ + LiF Sputtering 0.02-1.00 keV Ex 378 F2+ + LiF Sputtering 0.02-1.00 keV Ex 378 Ne+ + Cu Sputtering 0.50-1.50 keV Ex 460 Ne+ + Ag Sputtering 0.50-1.50 keV Ex 460 Ne+ + Pt Sputtering 0.50-1.50 keV Ex 460 Ne+ + Pt Sputtering 3.00-9.00 keV E/T 399 Ne+ + Au Sputtering 0.50-1.50 keV Ex 460 Ne+ + LiF Sputtering 0.02-1.00 keV Ex 378 Ne2+ + LiF Sputtering 0.02-1.00 keV Ex 378 Na+ + LiF Sputtering 0.02-1.00 keV Ex 378 Na2+ + LiF Sputtering 0.02-1.00 keV Ex 378 Si+ + SiO2 Sputtering 3.00-5.00 MeV Ex 402 P2+ + LiF Sputtering 0.02-1.00 keV Ex 378 S+ + LiF Sputtering 0.02-1.00 keV Ex 378 S2+ + LiF Sputtering 0.02-1.00 keV Ex 378 Ar+ + BN Sputtering 0.30-10.00 keV Th 464 Ar+ + C Sputtering 6.00 keV Ex 404 Ar+ + C Sputtering 0.10-100.00 keV 398 Ar+ + Na Sputtering 370.00 eV 461 Ar+ + Al Sputtering 150.00-250.00 eV 405 Ar+ + Si Sputtering 3.00-15.00 keV Ex 467 Ar+ + Si Sputtering 1.50-9.00 keV Ex 463 Ar+ + Si Sputtering 5.00 keV Ex 462 Ar+ -1- Si Sputtering 370.00 eV 461 Ar+ + Si Sputtering 5.00 keV Ex 406 Ar+ +K Sputtering 370.00 eV 461 Ar+ + Fe Sputtering 1.00-10.00 keV Th 397 Ar+ + Co Sputtering 3.00-15.00 keV Ex 467 Ar+ + Co Sputtering 3.00-15.00 keV Ex 401 Ar+ + Ni Sputtering 3.00-15.00 keV Ex 467 Ar+ + Ni Sputtering 10.00-40.00 eV Th 408 Ar+ + Ni Sputtering 3.00-15.00 keV Ex 401 Ar+ + Cu Sputtering 1.00-13.00 keV Th 466 Ar+ + Cu Sputtering 5.00 keV Ex 462 Ar+ + Cu Sputtering 5.00 keV Ex 406 Ar+ + Cu Sputtering 1.00-10.00 keV Th 397 Ar+ + Ge Sputtering 1.00-10.00 keV Th 397 Ar+ + Sr Sputtering 3.00-15.00 keV Ex 401

29 Ar+ + Pd Sputtering 2.00 keV Th 410 Ar+ + Ag Sputtering 2.00 keV Th 410 Ar+ + Ag Sputtering 1.00-10.00 keV Th 397 Ar+ 4- Cs Sputtering 370.00 eV 461 Ar+ 4- W Sputtering 150.00-250.00 eV 405 Ar+ + W Sputtering 0.10-100.00 keV 398 Ar+ + we Sputtering 0.10-100.00 keV 398 Ar+ 4-Pt Sputtering 1.00-30.00 keV Th 407 Ar+ 4-Pt Sputtering 1.00-10.00 keV Th 397 Ar+ 4- Au Sputtering 2.00 keV Th 410 Ar+ 4- Au Sputtering 1.00-10.00 keV Th 397 Ar+ + LiF Sputtering 0.02-1.00 keV Ex 378 Ar+ + PERT Sputtering 1.00 keV Th 429 Ar+ + PERT Sputtering 1.00-10.00 keV Th 397 Ar+ + TiO Sputtering 6.00 keV Ex 404 Ar+ 4- GaN Sputtering 0.30-10.00 keV Th 464 Ar+ 4- Cs 4- Si Sputtering 370.00 eV 461 Ar+ 4-K 4- Si Sputtering 370.00 eV 461 Ar+ + Na 4- Si Sputtering 370.00 eV 461 Ar+ 4-A1N Sputtering 0.30-10.00 keV Th 464 Ar2+ -1-LiF Sputtering 0.02-1.00 keV Ex 378 Cu+ 4- A12O3 Sputtering 30.00-100.00 keV 425 Cu+ 4-SiO2 Sputtering 30.00-100.00 keV 425 Cu+ + SiO2 Sputtering 3.00-5.00 MeV Ex 402 Cu+ + LiF Sputtering 0.02-1.00 keV Ex 378 Zn+ + LiF Sputtering 0.02-1.00 keV Ex 378 Kr 4 Cu Sputtering 5.00 keV Th 400 Kr+ 4- A12O3 Sputtering 5.00 keV Ex 430 Kr2+ + LiF Sputtering 0.02-1.00 keV Ex 378 Ag+ + A12O3 Sputtering 30.00-100.00 keV 425 Ag+ 4-SiO2 Sputtering 30.00-100.00 keV 425 Ag+ 4- SiO2 Sputtering 3.00-5.00 MeV Ex 402 Ag+ + Ag Sputtering 8.00 keV Ex 395 Xe-t-Cu Sputtering 5.00 keV Th 400 Xe+ + H2O Sputtering 1.00-9.00 keV Ex 409 Xe+ + D2O Sputtering 1.00-9.00 keV Ex 409 Xe+ + Al Sputtering 150.00-250.00 eV 405 Xe+ + Ag Sputtering 8.50-12.50 keV Ex 394 Xe+ 4-Ag Sputtering 15.00 keV Ex 391 Xe+ 4-W Sputtering 150.00-250.00 eV 405 Xe+ + GaAs Sputtering 1.00-13.00 keV Th 466 Cs+ 4- C Sputtering 14.50 keV Ex 393 Cs+ 4-Si Sputtering 14.50 keV Ex 393 Cs+ 4-SiC Sputtering 14.50 keV Ex 393 W + Be Sputtering 0.00-1.00 MeV Th 373 W + C Sputtering 0.00-1.00 MeV Th 373 Au- ^Si Sputtering 9.00-18.00 keV Ex 465 Au- 1 4-Nb Sputtering 6.00-18.00 keV Ex 403 Au+ 4- A12O3 Sputtering 30.00-100.00 keV 425 + Au + SiO2 Sputtering 30.00-100.00 keV 425 Au+ 4- Au Sputtering 16.00 keV Th 445 Au+ 4- Au Sputtering 10.00-30.00 keV Ex 396 Au+ + Au Sputtering 15.00 keV Th 392 1 Au2 - + Si Sputtering 9.00-18.00 keV Ex 465

30 AU3"1 + Si Sputtering 9.00-18.00 keV Ex 465

2.3.2 Chemical Reactions

H + Si Chemical Reactions 200.00-800.00 K 360 H+ + C Chemical Reactions 5.00 keV Ex 452 H+ + H + C Chemical Reactions 5.00 keV Ex 452 C+ + BN Chemical Reactions 30.00-100.00 keV 427 + C + A12O3 Chemical Reactions 30.00-100.00 keV 427 + N2 + Si Chemical Reactions 5.00 keV Ex 426 + O2 + AI2O3 Chemical Reactions 30.00-320.00 eV 424 A1+ + A12O3 Chemical Reactions 180.00 keV 423 Si+ + Co Chemical Reactions 1.00 MeV Ex 368 Si+ + Ag Chemical Reactions 1.00 MeV Ex 368 Ar+ + C Chemical Reactions 5.00 keV Ex 452 Ar+ + H + C Chemical Reactions 5.00 keV Ex 452 Si+ + Ag -(- Co Chemical Reactions 1.00 MeV Ex 368

2.3.3 Neutralization, Ionization, Dissociation hi/ + Al Neutraliz., Ioniz., Diss. Th 386 H + Ru Neutraliz., Ioniz., Diss. Th 351 H+ + Mg Neutraliz., Ioniz., Diss. Th 383 H2 + Ni Neutraliz., Ioniz., Diss. 0.60 eV Th 443 H2 + Cu Neutraliz., Ioniz., Diss. 1.00 eV Th 454 H2 + Cu Neutraliz., Ioniz., Diss. 5.00-200.00 eV 439 H2 + Rh Neutraliz., Ioniz., Diss. 0.10-2.00 eV Ex 350 H2 + Pd Neutraliz., Ioniz., Diss. 0.10-2.00 eV Ex 350 H2 + Hg Neutraliz., Ioniz., Diss. 0.10-2.00 eV Ex 350 H2+ + Al Neutraliz., Ioniz., Diss. 0.00-10.00 keV Th 387 + H2 + Pt Neutraliz., Ioniz., Diss. 0.00-10.00 keV Th 387 He+ + Al Neutraliz., Ioniz., Diss. 0.20-5.00 keV E/T 434 C + Ru Neutraliz., Ioniz., Diss. Th 351 CH + Ru Neutraliz., Ioniz., Diss. Th 351 CH2 + Ru Neutraliz., Ioniz., Diss. Th 351 CH3 + Ru Neutraliz., Ioniz., Diss. Th 351 CO + K Neutraliz., Ioniz., Diss. 125.00 K 362 CO + Cu Neutraliz., Ioniz., Diss. 125.00 K 362 CO + Ru Neutraliz., Ioniz., Diss. Th 363 CO + K + Cu Neutraliz., Ioniz., Diss. 125.00 K 362 N2 + Ni Neutraliz., Ioniz., Diss. 0.40 eV Ex 459 O2 + Al Neutraliz., Ioniz., Diss. 300.00 K 451 O2 + Cu Neutraliz., Ioniz., Diss. 50.00-500.00 meV 455 Ne+ + Cu Neutraliz., Ioniz., Diss. 0.50-1.50 keV Ex 460 Ne+ + Ag Neutraliz., Ioniz., Diss. 0.50-1.50 keV Ex 460 Ne+ + Pt Neutraliz., Ioniz., Diss. 0.50-1.50 keV Ex 460 Ne+ + Au Neutraliz., Ioniz., Diss. 0.50-1.50 keV Ex 460

31 2.3.4 Adsorption, Desorption hi/ + H Desorption 280.00-310.00 eV 444 hi/ + CO Desorption 1.55 eV Ex 365 hi/ + Ru Desorption 1.55 eV Ex 365 hi/ + CO + Ru Desorption 1.55 eV Ex 365 hi/ + H + C Desorption 280.00-310.00 eV 444 hi/ + H + KCl Desorption 16.00-125.00 eV 441 hi/ + H + KBr Desorption 16.00-125.00 eV 441 hi/ + H + NaCl Desorption 16.00-125.00 eV 441 hi/ + H + NaF Desorption 16.00-125.00 eV 441 hv + H + LiF Desorption 16.00-125.00 eV 441 e + CO2 Desorption 10.00-30.00 eV Ex 366 e + CO2 + Pt Desorption 10.00-30.00 eV Ex 366 e + H + KCl Desorption 16.00-125.00 eV 441 e + H + KBr Desorption 16.00-125.00 eV 441 e + H + NaCl Desorption 16.00-125.00 eV 441 e + H + NaF Desorption 16.00-125.00 eV 441 e + H + LiF Desorption 16.00-125.00 eV 441 H + C Adsorption, Desorption 0.30-1.50 K Th 355 H + Si Desorption 200.00-800.00 K 360 H + Ni Adsorption, Desorption Th 468 H + Ni Adsorption, Desorption 300.00 K 456 H + Ni Desorption Th 468 H + Cu Adsorption, Desorption 300.00 K 450 H + Nb Adsorption, Desorption Th 468 H + Nb Desorption Th 468 H + Ru Desorption Th 351 H + Pt Adsorption, Desorption Th 352 H2 + H Desorption 160.00 K 364 H2 + Ni Adsorption, Desorption 0.60 eV Th 443 H2 + Rh Adsorption, Desorption 0.10-2.00 eV Ex 350 H2 + Rh Desorption 0.10-2.00 eV Ex 350 H2 + Pd Adsorption, Desorption 0.80 eV Th 359 H2 +Pd Adsorption, Desorption 0.10-2.00 eV Ex 350 H2 + Pd Desorption 0.10-2.00 eV Ex 350 H2 + Ir Desorption 160.00 K 364 H2 + Hg Adsorption, Desorption 0.10-2.00 eV Ex 350 H2+Hg Desorption 0.10-2.00 eV Ex 350 H2 + GaAs Adsorption, Desorption 0.08 eV Ex 376 D + Cu Adsorption, Desorption 300.00 K 450 C + Ru Desorption Th 351 CH + Ru Desorption Th 351 CH2 + Ru Desorption Th 351 CH3 + Ru Desorption Th 351 CO + Cu Adsorption, Desorption 125.00-300.00 K 357 CO + Cu Adsorption, Desorption 25.00-150.00 K 354 CO + Cu Desorption 25.00-150.00 K 354 N + Ru Adsorption, Desorption 300.00 K 457 NO + Ru Adsorption, Desorption 300.00 K 457 O + Be Adsorption, Desorption 300.00 K 449 O + Cu Adsorption, Desorption 125.00-300.00 K 357 O + Ru Adsorption, Desorption 300.00 K 457 O + W Adsorption, Desorption 300.00 K 458 O + W Adsorption, Desorption 300.00 K 449

32 O + Au Adsorption, Desorption 300.00 K 449 C1+ Cu Adsorption, Desorption Th 358 Xe + Ni Adsorption, Desorption 0.03-1.20 K Ex 356 H2 + H + Ir Desorption 160.00 K 364

2.3.5 Reflection

1 H- + LiF Reflection 100.00 eV 442 H+ + Ag Reflection 0.50-1.00 keV Ex 384 H+ + LiF Reflection 10.00 keV Ex 385 H+ + LiF Reflection 0.30-25.00 keV Ex 380 H2 + GaAs Reflection 0.08 eV Ex 376 H2+ + Al Reflection 0.00-10.00 keV Th 387 + H2 + Pt Reflection 0.00-10.00 keV Th 387 He+ + Si Reflection 4.00 keV Th 382 He+ + Ni Reflection 4.00 keV Th 382 He+ + Ge Reflection 4.00 keV Th 382 Be + C Reflection 0.00-1.00 MeV Th 373 Be +W Reflection 0.00-1.00 MeV Th 373 C + Be Reflection 0.00-1.00 MeV Th 373 C +W Reflection 0.00-1.00 MeV Th 373 O+ + Ag Reflection 0.50-1.00 keV Ex 384 F+ + Ag Reflection 0.50-1.00 keV Ex 384 F+ + NaCl Reflection 4.00 keV Ex 381 Ne+ + Ni Reflection 0.20-3.00 keV E/T 390 Ne+ + NaCl Reflection 4.00 keV + Ex 381 Ne + KC1 Reflection 15.00-30.00 keV Ex 379 Na +W Reflection 50.00 eV Th 453 Na+ + NaCl Reflection 4.00 keV Ex 381 Ar+ + Ni Reflection 10.00-40.00 eV Th 408 Ar+ + Pd Reflection 0.20-3.00 keV E/T 390 Ar+ + Ag Reflection 0.20-3.00 keV E/T 390 Ar+ + Ta Reflection 0.20-3.00 keV E/T 390 Ar+ + Pt Reflection 0.20-3.00 keV E/T 390 Ar+ + Pb Reflection 0.20-3.00 keV 7+ E/T 390 Ar + Au Reflection 2.00-8.00 keV Ex 377 Ar9+ + Au Reflection 2.00-8.00 keV 13+ Ex 377 Ar + Au Reflection 2.00-8.00 keV Ex 377 Xe+ Ge Reflection 1.00-30.00 eV Th 389 Xe+ Ge Reflection 1.00-30.00 eV Th 389 Xe +Ag Reflection 1.00-30.00 eV Th 389 Xe + Ag Reflection 1.00-30.00 eV Th 389 Xe + GaAs Reflection 1.00-30.00 eV Th 389 Xe + GeAs Reflection 1.00-30.00 eV Th 389 W + Be Reflection 0.00-1.00 MeV Th 373 W + C Reflection 0.00-1.00 MeV Th 373

33 2.3.6 Secondary Electron Emission hi/ + Al Second. Elect. Emiss. 10.00-50.00 keV Th 411 e + Al Second. Elect. Emiss. 0.25-3.50 MeV/amu Th 431 e + Al Second. Elect. Emiss. 3.00 keV Ex 418 e + Al Second. Elect. Emiss. 3.00 keV Ex 417 e + Al Second. Elect. Emiss. 0.40-20.00 keV Ex 369 e + Fe Second. Elect. Emiss. 0.40-20.00 keV Ex 369 e+Cu Second. Elect. Emiss. 0.25-3.50 MeV/amu Th 431 e+Cu Second. Elect. Emiss. 3.00 keV Ex 418 e+ Pt Second. Elect. Emiss. 0.40-20.00 keV Ex 369 e + Au Second. Elect. Emiss. 2.00 keV Th 416 e + SS 1 Second. Elect. Emiss. 0.40-20.00 keV Ex 369 H" + Al Second. Elect. Emiss. 10.00-50.00 keV Th 411 H+ + C Second. Elect. Emiss. 9.20 MeV/amu Ex 446 H+ + C Second. Elect. Emiss. 50.00-250.00 keV 420 H+ +N2 Second. Elect. Emiss. 2.00 MeV Ex 414 H+ + Al Second. Elect. Emiss. 4.00-100.00 keV 440 H+ + Al Second. Elect. Emiss. 6.00 MeV/amu Ex 437 H+ + Al Second. Elect. Emiss. 2.00-6.00 keV Ex 435 H+ + Al Second. Elect. Emiss. 0.25-3.50 MeV/amu Th 431 H+ + Al Second. Elect. Emiss. 50.00-250.00 keV 420 H+ + Al Second. Elect. Emiss. 3.00 keV Ex 417 H+ + Al Second. Elect. Emiss. 20.00 keV/amu Ex 412 H+ + Al Second. Elect. Emiss. 10.00-50.00 keV Th 411 H+ + Si Second. Elect. Emiss. 0.10-3.50 MeV/amu Ex 428 H+ + Si Second. Elect. Emiss. 8.00 MeV/amu Ex 415 H+ + Ar Second. Elect. Emiss. 2.00 MeV Ex 414 H+ +Fe Second. Elect. Emiss. 28.00-182.00 MeV 436 H+ + Cu Second. Elect. Emiss. 0.25-3.50 MeV/amu Th 431 H+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex 437 H+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex 437 H+ + LiF Ex 421 H+ + LiF Second. Elect. Emiss. 0.50 MeV H+ + SS Second. Elect. Emiss. 10.00 keV Ex 385 He +Al Second. Elect. Emiss. 28.00-182.00 MeV 436 He+ + Al Second. Elect. Emiss. 20.00 keV/amu Ex 412 He+ + Si Second. Elect. Emiss. 20.00 keV/amu Ex 412 He+ + SnTe Second. Elect. Emiss. 0.10-3.50 MeV/amu Ex 428 He2+ + C Second. Elect. Emiss. 1.00-2.00 MeV Ex 432 He2+ + Al Second. Elect. Emiss. 9.20 MeV/amu Ex 446 He2+ + Al Second. Elect. Emiss. 6.00 MeV/amu Ex 437 He2+ + Al Second. Elect. Emiss. 0.25-3.50 MeV/amu Th 431 He2+ + Si Second. Elect. Emiss. 3.00 keV Ex 418 He2+ + Cu Second. Elect. Emiss. 8.00 MeV/amu Ex 415 He2+ + Cu Second. Elect. Emiss. 0.25-3.50 MeV/amu Th 431 He2+ + Ag Second. Elect. Emiss. 3.00 keV Ex 418 He2+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex 437 He2+ + SnTe Second. Elect. Emiss. 6.00 MeV/amu Ex 437 C6+ +C Second. Elect. Emiss. 1.00-2.00 MeV Ex 432 C6+ + Al Second. Elect. Emiss. 9.20 MeV/amu Ex 446 C6+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex 437 C6+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex 437 N7+ + Al Second. Elect. Emiss. 6.00 MeV/amu Ex 437 N7+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Second. Elect. Emiss. 6.00 MeV/amu Ex 437

34 N7+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex 437 O8+ + Al Second. Elect. Emiss. 6.00 MeV/amu Ex 437 O8+ + Si Second. Elect. Emiss. 0.10-3.50 MeV/amu Ex 428 O8+ + Fe Second. Elect. Emiss. 28.00-182.00 MeV 436 O8+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex 437 O8+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex 437 O8+ + SS Second. Elect. Emiss. 28.00-182.00 MeV 436 Ne + Au Second. Elect. Emiss. 1.00-17.00 keV Th 388 Ne+ + Al Second. Elect. Emiss. 4.50 keV E/T 438 Ne+ + Al Second. Elect. Emiss. 1.00-5.00 keV Ex 413 Ne+ + Au Second. Elect. Emiss. 1.00-17.00 keV Th 388 Ne2+ + Al Second. Elect. Emiss. 4.50 keV E/T 438 Ne3+ + Al Second. Elect. Emiss. 4.50 keV E/T 438 Ne4+ + Al Second. Elect. Emiss. 4.50 keV E/T 438 Ne5+ + Al Second. Elect. Emiss. 4.50 keV E/T 438 Ne6+ + Al Second. Elect. Emiss. 4.50 keV E/T 438 Ne10+ + Al Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Ne10+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Ne10+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Si14+ + Al Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Si14+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Si14+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Ar+ + Al Second. Elect. Emiss. 1.00-5.00 keV Ex 413 Ar6+ + Au Second. Elect. Emiss. 8.00-40.00 keV E/T 433 Ar7+ + Au Second. Elect. Emiss. 8.00-40.00 keV E/T 433 Ar8+ + Au Second. Elect. Emiss. 8.00-40.00 keV E/T 433 Ari8+ + A1 Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Aris+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Ar18+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex 437 Ca20+ + C Second. Elect. Emiss. 9.20 MeV/amu Ex 446 Ni27+ + C Second. Elect. Emiss. 9.20 MeV/amu Ex 446 Mo39+ + C Second. Elect. Emiss. 9.20 MeV/amu Ex 446 Au+ + C Second. Elect. Emiss. 150.00-500.00 keV 419 Au+ + Au Second. Elect. Emiss. 150.00-500.00 keV 419 Au+ + Au Second. Elect. Emiss. 1.00-22.00 keV Ex 367 Au2+ + Au Second. Elect. Emiss. 1.00-22.00 keV Ex 367 Au3+ + Au Second. Elect. Emiss. 1.00-22.00 keV Ex 367 Au31+ + Fe Second. Elect. Emiss. 28.00-182.00 MeV 436 Au31+ + SS Second. Elect. Emiss. 28.00-182.00 MeV 436

2.3.7 Other Surface Interactions

Surface Interactions 0.10-12.00 eV Th 374 hi/ + Ag Surface Interactions 0.10-12.00 eV Th 374 H+ +N2 Surface Interactions 2.00 MeV Ex 414 H+ + Al Surface Interactions 1.00 MeV E/T 375 H+ + Ar Surface Interactions 2.00 MeV Ex 414 Be + C Surface Interactions 0.00-1.00 MeV Th 373 Be +W Surface Interactions 0.00-1.00 MeV Th 373 C +Be Surface Interactions 0.00-1.00 MeV Th 373 C + W Surface Interactions 0.00-1.00 MeV Th 373 W + Be Surface Interactions 0.00-1.00 MeV Th 373

35 W + C Surface Interactions 0.00-1.00 MeV Th 373

2.4 Particle Beam-Matter Interactions hv + C Part. Beam-Matter Int. 1.00-3.50 MeV Ex 486 e + O2 Part. Beam-Matter Int. 6.00-18.00 eV E/T 512 e + Al Part. Beam-Matter Int. 0.25-3.50 MeV/amu Th 509 e + Cu Part. Beam-Matter Int. 0.25-3.50 MeV/amu Th 509 H* 4- e Part. Beam-Matter Int. Th 503 H* + e Part. Beam-Matter Int. Th 503 H + e Part. Beam-Matter Int. Th 503 H + e Part. Beam-Matter Int. Th 503 H + C Part. Beam-Matter Int. Th 515 H1+ + e Part. Beam-Matter Int. Th 503 H1+ + e Part. Beam-Matter Int. Th 503 H1+ + H Part. Beam-Matter Int. 0.00-1.00 MeV Th 500 H1+ + H Part. Beam-Matter Int. 0.50-2.00 MeV Th 477 H1+ + H1+ Part. Beam-Matter Int. 0.10-12.00 MeV Th 476 Hi+ + Di+ Part Beam-Matter Int. 0.10-12.00 MeV Th 476 H1+ + He Part. Beam-Matter Int. 0.00-1.00 MeV Th 500 H1+ + He1+ Part. Beam-Matter Int. 0.10-12.00 MeV Th 476 H1+ -f Li Part. Beam-Matter Int. 1.00-100.00 keV 495 H1+ + Li1+ Part. Beam-Matter Int. 0.10-12.00 MeV Th 476 H1+ + C Part. Beam-Matter Int. 9.20 MeV/amu Ex 519 H1+ + C Part. Beam-Matter Int. 1.00-100.00 keV 495 H1+ + C Part. Beam-Matter Int. 0.40-1.60 keV Ex 491 H1+ 4- C Part. Beam-Matter Int. 1.00-3.50 MeV Ex 486 H1+ + C Part. Beam-Matter Int. 0.03-10.00 MeV/amu Th 472 H1+ + Ne Part. Beam-Matter Int. 100.00 keV 487 H1+ + Ne Part. Beam-Matter Int. 100.00 keV 487 H1+ + Mg Part. Beam-Matter Int. 15.00-650.00 keV/amu 517 H1+ 4- Al Part. Beam-Matter Int. 0.25-3.50 MeV/amu Th 509 H1+ + Al Part. Beam-Matter Int. 0.25-3.50 MeV/amu Th 509 H1+ + Al Part. Beam-Matter Int. 9.00 keV Ex 481 1+ H 4- A12O3 Part. Beam-Matter Int. 0.90-2.50 MeV Th 505 H1+ + Si Part. Beam-Matter Int. 1.00 MeV Ex 506 H1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 H1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 H1+ + Si Part. Beam-Matter Int. 0.10-12.00 MeV Th 476 H1+ + Si Part. Beam-Matter Int. 100.00 keV 474 H1+ + Ti Part. Beam-Matter Int. 0.20-13.50 MeV Ex 482 H1+ + Cu Part. Beam-Matter Int. 0.25-3.50 MeV/amu Th 509 H1+ + Cu Part. Beam-Matter Int. 0.25-3.50 MeV/amu Th 509 H1+ + Pd Part. Beam-Matter Int. 2.00-10.00 keV Ex 484 H1+ + Au Part. Beam-Matter Int. 2.00-10.00 keV Ex 484 H1+ + Au Part. Beam-Matter Int. 9.00 keV Ex 481 H1+ + LiF Part. Beam-Matter Int. 0.30-25.00 keV Ex 494 H2 + C Part. Beam-Matter Int. Th 515 1+ H2 + C Part. Beam-Matter Int. 25.00-125.00 keV 490 1+ H2 + C Part. Beam-Matter Int. 0.03-10.00 MeV/amu Th 472 1+ H2 + Al Part. Beam-Matter Int. 25.00-125.00 keV 490 1+ H3 + C Part. Beam-Matter Int. 0.03-10.00 MeV/amu Th 472

36 C Part. Beam-Matter Int. 0.40-1.60 keV Ex 491 Mg Part. Beam-Matter Int. 15.00-650.00 keV/amu 517 A12O3 Part. Beam-Matter Int. 0.90-2.50 MeV Th 505 D1+ + Si Part. Beam-Matter Int. 1.00 MeV Ex 506 D1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 D1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 He* + e Part. Beam-Matter Int. Th 503 He* + e Part. Beam-Matter Int. Th 503 He + e Part. Beam-Matter Int. Th 503 He + e Part. Beam-Matter Int. Th 503 He + Si Part. Beam-Matter Int. 1.50-3.00 MeV Ex 501 He1+ + e Part. Beam-Matter Int. Th 503 1+ He e Part. Beam-Matter Int. Th 503 1+ He O Part. Beam-Matter Int. 1.10-2.60 MeV Ex 510 He1+ Mg Part. Beam-Matter Int. 0.05-1.00 MeV E/T 518 He1+ Al Part. Beam-Matter Int. 0.05-1.00 MeV E/T 518 He1+ Al Part. Beam-Matter Int. 1.10-2.60 MeV Ex 510 1+ Part. Beam-Matter Int. He A12O3 1.10-2.60 MeV Ex 510 He1+ + Si Part. Beam-Matter Int. 0.05-1.00 MeV E/T 518 He1+ + Si Part. Beam-•Matter Int. 1.10-2.60 MeV Ex 510 He1+ + Si Part. Beam-Matter Int. 1.00 MeV Ex 506 He1+ + Si Part. Beam-•Matter Int. 0.40-1.50 MeV Ex 498 He1+ + Si Part. Beam-•Matter Int. 0.50-2.00 MeV Th 477 1+ Part. Beam-•Matter Int. He SiO2 1.10-2.60 MeV Ex 510 1+ Part. Beam- He Ca •Matter Int. 0.05-1.00 MeV E/T 518 1+ Part. Beam-•Matter Int. He Cr 0.05-1.00 MeV E/T 518 1+ Part. Beam-•Matter Int. He Fe 0.05-1.00 MeV E/T 518 1+ Part. Beam-•Matter Int. He Zn 0.05-1.00 MeV E/T 518 1+ Part. Beam-•Matter Int. He Ge 0.05-1.00 MeV E/T 518 Part. Beam-•Matter Int. He1+ Rb 0.05-1.00 MeV E/T 518 Part. Beam-•Matter Int. He1+ Sr 0.05-1.00 MeV E/T 518 Part. Beam-•Matter Int. He1+ Y 0.05-1.00 MeV E/T 518 Part. Beam-•Matter Int. He1+ Ag 0.05-1.00 MeV E/T 518 Part. Beam-•Matter Int. He1+ 0.05-1.00 MeV E/T 518 Cd Part. Beam-•Matter Int. He1+ 0.05-1.00 MeV E/T 518 Sn Part. Beam-•Matter Int. He1+ 0.05-1.00 MeV E/T 518 Au Part. Beam-•Matter Int. He1+ Pb 0.05-1.00 MeV E/T 518 1+ Part. Beam-•Matter Int. 0.05-1.00 MeV He Bi Part. Beam-•Matter Int. E/T 518 2+ 9.20 MeV/amu Ex He C Part. Beam--Matter Int. 519 He2+ C 2.00 MeV Ex 513 2+ Part. Beam--Matter Int. He Al Part. Beam--Matter Int. 0.25-3.50 MeV/amu Th 509 He2+ + Al 0.25-3.50 MeV/amu Th 509 2+ Part. Beam--Matter Int. He + Si Part. Beam--Matter Int. 0.40-1.50 MeV Ex 498 He2+ + Cu 0.25-3.50 MeV/amu Th 509 2+ Part. Beam-Matter Int. He + Cu Part. Beam- Matter Int. 0.25-3.50 MeV/amu Th 509 Li* + e Part. Beam- Matter Int. Th 503 Li* 4- e Part. Beam- Matter Int. Th 503 Li + e Part. Beam- Matter Int. Th 503 Li + e Part. Beam- Matter Int. Th 503 Part. Beam--Matter Int. Th 503 Part. Beam--Matter Int. Th 503 + C Part. Beam-Matter Int. 0.05-10.00 MeV/amu Th 479 + Ni Part. Beam-.-Matter Int. 0.01-10.00 MeV/amu Th 478 Li2+ + C 63.40 MeV Th 507

37 3+ Li + C Part. Beam-Matter Int. 63.40 MeV Th 507 Be* + e Part. Beam-Matter Int. Th 503 Be* + e Part. Beam-Matter Int. Th 503 Be + e Part. Beam-Matter Int. Th 503 Be + e Part. Beam-Matter Int. Th 503 Be1+ + e Part. Beam-Matter Int. Th 503 Be1+ + e Part. Beam-Matter Int. Th 503 Be1+ + C Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 1+ Be + CH2 Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 Be1+ + Al Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 Be1+ + Ni Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 2+ Be + N2 Part. Beam-Matter Int. 0.33 MeV/amu Ex 488 4+ Be + N2 Part. Beam-Matter Int. 0.33 MeV/amu Ex 488 B + C Part. Beam-Matter Int. 25.00 keV Th 485 B1+ + C Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 B1+ + C Part. Beam-Matter Int. 25.00 keV Th 485 1+ B + CH2 Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 B1+ + Al Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 B1+ + Si Part. Beam-Matter Int. 0.10-10.00 MeV Th 508 B1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 B1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 B1+ + Ni Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 B2+ + C Part. Beam-Matter Int. 25.00 keV Th 485 B3+ + C Part. Beam-Matter Int. 25.00 keV Th 485 3+ B + N2 Part. Beam-Matter Int. 0.33 MeV/amu Ex 488 B4+ + C Part. Beam-Matter Int. 25.00 keV Th 485 B5+ + C Part. Beam-Matter Int. 25.00 keV Th 485 5+ B + N2 Part. Beam-Matter Int. 0.33 MeV/amu Ex 488 Bi9+ + A1 part Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 B19+ + Al Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 B19+ + Cu Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 Bi9+ + Cu part Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 B19+ + Ag Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 Bi9+ + Ag part Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 Bi9+ + Au Part Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 Bi9+ + Au part_ Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 C + C Part. Beam-Matter Int. Th 515 C1+ + C Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 C1+ + C Part. Beam-Matter Int. 0.05-10.00 MeV/amu Th 479 C1+ + C Part. Beam-Matter Int. 0.01-10.00 MeV/amu Th 478 1+ C + CH2 Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 C1+ + Al Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 C1+ + Ni Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 C1+ + Au Part. Beam-Matter Int. 0.10-12.00 MeV Th 476 C6+ + C Part. Beam-Matter Int. 9.20 MeV/amu Ex 519 N1+ + C . Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 1+ N + CH2 Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 N1+ + Al Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 N1+ + Ni Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 4+ N + N2 Part. Beam-Matter Int. 0.33 MeV/amu Ex 488 N7+ + C Part. Beam-Matter Int. 5.00 MeV/amu Th 492 O + C Part. Beam-Matter Int. 25.00 keV Th 485 1+ O + H2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504

38 H2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 o1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 o1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 C Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 f^^"^" -4- C Part. Beam-Matter Int. 0.40-5.70 MeV Ex 497 C Part. Beam-Matter Int. 25.00 keV Th 485 CH2 Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 f)l + I CH4 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Ql+ I CH4 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Ql+ _I_ N2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ O + N2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 O^~^~ 4- Ne Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Ne Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 O1+ + Al Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 Al Part. Beam-Matter Int. 0.40-5.70 MeV Ex 497 O^~^~ -4- Ti Part. Beam-Matter Int. 0.40-5.70 MeV Ex 497 Ql+ _j_ Ni Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 01+ 1 Cu Part. Beam-Matter Int. 0.40-5.70 MeV Ex 497 Ql+ _L Kr Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 /^jl-f- 1 Kr Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Nb Part. Beam-Matter Int. 0.40-5.70 MeV Ex 497 Part. Beam-Matter Int. Ag 0.40-5.70 MeV Ex 497 O2+ + C Part. Beam-Matter Int. 25.00 keV Th 485 3+ Part. Beam-Matter Int. 25.00 keV o + C Th 485 4+ Part. Beam-Matter Int. 25.00 keV o + Th 485 5+ c Part. Beam-Matter Int. 25.00 keV o + Th 485 6 c Part. Beam-Matter Int. 25.00 keV O + + Th 485 7 c Part. Beam-Matter Int. 25.00 keV O + + Th 485 c Part. Beam-Matter Int. 25.00 keV 8+ Th 485 o + c Part. Beam-Matter Int. 1.00 MeV/amu F1+ + Ex 502 c Part. Beam-Matter Int. 0.40-5.70 MeV Ex c Part. Beam-Matter Int. 1.00 MeV/amu 497 pl+ -L CH2 Ex 502 •pl-f- ( Part. Beam-Matter Int. 1.00 MeV/amu Al Part. Beam-Matter Int. 0.40-5.70 MeV Ex 502 Al Ex 497 1+ Part. Beam-Matter Int. 0.40-5.70 MeV F + Ti Part. Beam-Matter Int. 1.00 MeV/amu Ex 497 Ni Ex 502 1+ Part. Beam-Matter Int. 0.40-5.70 MeV F + Cu Part. Beam-Matter Int. 0.40-5.70 MeV Ex 497 Nb Part. Beam-Matter Int. Ex 497 "|Tll-|- 1 0.40-5.70 MeV Ag Part. Beam-Matter Int. 1.00 MeV/amu Ex 497 Ne1+ • Ex 502 1+ + c Part. Beam-Matter Int. 1.00 MeV/amu Ne •+ CH2 Part. Beam-Matter Int. 1.00 MeV/amu Ex 502 Ne1+ •+ Al Ex 502 1+ Part. Beam-Matter Int. 1.00 MeV/amu Ne •+ Ni Part. Beam-Matter Int. 15.00-30.00 keV Ex 502 Nex+ + KC1 Ex 493 6+ Part. Beam-Matter Int. 2.00 MeV/amu Ne + c Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 6+ Ne •4-C Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne6+ •+ Nb E/T 514 6+ Part. Beam-Matter Int. 2.00 MeV/amu Ne •+ Nb Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne7+-+ C E/T 514 7 Part. Beam-Matter Int. 2.00 MeV/amu Ne + + c Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne7+ + Nb E/T 514 7+ Part. Beam-Matter Int. 2.00 MeV/amu Ne + Nb Part. Beam-Matter Int. E/T 514 8+ 2.00 MeV/amu Ne Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 8+ + c Ne + c Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne8+ + Nb E/T 514

39 Ne8+ Nb Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne9+ C Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne9+ + C Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne9+ + Nb Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne9+ + Nb Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne10+ + C Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne10+ + C Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne10+ + Nb Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Ne10+ + Nb Part. Beam-Matter Int. 2.00 MeV/amu E/T 514 Al Part. Beam-Matter Int. 0.70-3.50 MeV Ex 499 Part. Beam-Matter Int. 0.70-3.50 MeV A12O3 Ex 499 Si1+ + Si Part. Beam-Matter Int. 0.70-3.50 MeV Ex 499 Part. Beam-Matter Int. 0.70-3.50 MeV SiO2 Ex 499 Zr Part. Beam-Matter Int. 0.70-3.50 MeV Ex 499 Sb Part. Beam-Matter Int. 3.00 MeV Ex 470 Sb Part. Beam-Matter Int. 3.00 MeV Ex 470 Part. Beam-Matter Int. 0.70-3.50 MeV ZrO2 Ex 499 P1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 P1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 S8+ + Al Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 S8+ + Al Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 S8+ + Cu Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 8+ 1.50-2.00 MeV/amu S + Cu Part. Beam-Matter Int. Ex 483 8 1.50-2.00 MeV/amu S + + Ag Part. Beam-Matter Int. Ex 483 S8+ + Ag Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 8 1.50-2.00 MeV/amu S + + Au Part. Beam-Matter Int. Ex 483 8 Part. Beam-Matter Int. 1.50-2.00 MeV/amu S + + Au Ex 483 Part. Beam-Matter Int. 25.00 keV Ar + C Th 485 1+ Part. Beam-Matter Int. Ar + H2 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. Ar + H2 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. Ar + He 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. Ar + He 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. Ar + C 25.00 keV Th 485 1+ Part. Beam-Matter Int. Ar C 0.05-10.00 MeV/amu Th 479 1+ Part. Beam-Matter Int. Ar CH4 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. Ar CH 25.00-40.00 MeV/amu Ex 504 1+ 4 Part. Beam-Matter Int. Ar N 25.00-40.00 MeV/amu Ex 504 1+ 2 Part. Beam-Matter Int. Ar N 25.00-40.00 MeV/amu Ex 504 1+ 2 Part. Beam-Matter Int. Ar Ne 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. Ar Ne 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. Ar Kr 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. Ar Kr 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. Ar + PERT 1.00 MeV/amu Th 480 2+ Part. Beam-Matter Int. Ar + C 25.00 keV Th 485 3+ Part. Beam-Matter Int. Ar + C 25.00 keV Th 4+ Part. Beam-Matter Int. 485 Ar + C 25.00 keV 5+ Part. Beam-Matter Int. Th 485 Ar + C 25.00 keV 6+ Part. Beam-Matter Int. Th 485 Ar + C 25.00 keV Th 485 Ar7+ + C Part. Beam-Matter Int. 25.00 keV Th 485 Ar8+ + C Part. Beam-Matter Int. 25.00 keV Th 485 Ar9+ + C Part. Beam-Matter Int. 25.00 keV Th 485 Arlo+ + C Part. Beam-Matter Int. 25.00 keV Th 485 Ar11+ + C Part. Beam-Matter Int . 25.00 keV Th 485 Ar12+ + C Part. Beam-Matter Int . 25.00 keV Th 485

40 13+ Ar + C Part. Beam-Matter Int. 25.00 keV Th 485 Ar14+ + C Part. Beam-Matter Int. 25.00 keV Th 485 Ar15+ + C Part. Beam-Matter Int. 25.00 keV Th 485 Ar16+ + C Part. Beam-Matter Int. 5.00 MeV/amu Th 492 Ar16+ + C Part. Beam-Matter Int. 25.00 keV Th 485 Ar17+ + C Part. Beam-Matter Int. 25.00 keV Th 485 Ar17+ + C Part. Beam-Matter Int. 13.60 MeV/amu E/T 471 Ar18+ + C Part. Beam-Matter Int. 25.00 keV Th 485 Ca20+ C Part. Beam-Matter Int. 9.20 MeV/amu Ex 519 Ni23+ C Part. Beam-Matter Int. 5.00 MeV/amu Th 492 Ni27+ + C Part. Beam-Matter Int. 9.20 MeV/amu Ex 519 1+ Cu + A12O3 Part. Beam-Matter Int. 30.00-100.00 keV 496 1+ Cu + SiO2 Part. Beam-Matter Int. 30.00-100.00 keV 496 As1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 As1+ + Si Part. Beam-Matter Int. 2.50-200.00 keV 489 As1+ + Sb Part. Beam-Matter Int. 3.00 MeV Ex 470 Asa+ Sb Part. Beam-Matter Int. 3.00 MeV Ex 470 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr H2 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr H2 Ex 504 Kr1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Kr1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr + CH4 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr CH4 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr N2 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr N2 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr Ne Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr Ne Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr Kr Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Kr Kr Ex 504 30+ Part. Beam-Matter Int. 5.00 MeV/amu Kr + C Th 492 34+ Part. Beam-Matter Int. 700.00 MeV Kr + C Part. Beam-Matter Int. 700.00 MeV 516 Kr34+ + c 516 39+ Part. Beam-Matter Int. 9.20 MeV/amu Mo 4- C Part. Beam-Matter Int. 30.00-100.00 keV Ex 519 Ag1+ + AI2O3 496 1+ Part. Beam-Matter Int. 30.00-100.00 keV Ag + SiO2 496 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Te + H2 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Te 4- H2 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Te + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Te1+ + He Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Te + CH4 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Te CH4 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Te N2 Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Te N2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Te1+ Ne Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Te Ne Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Te1+ Kr Ex 504 1+ Part. Beam-Matter Int. 25.00-40.00 MeV/amu Te Kr Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 504 I25+ + Al Ex 483 25+ Part. Beam-Matter Int. 1.50-2.00 MeV/amu I + Al Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 j25+ + Cu Ex 483 25 Part. Beam-Matter Int. 1.50-2.00 MeV/amu I + + Cu Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 I25+ + Ag Ex 483 25 Part. Beam-Matter Int. 1.50-2.00 MeV/amu I + + Ag Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 I25+ + Au Ex 483

41 25 I + + Au Part. Beam-Matter Int. 1.50-2.00 MeV/amu Ex 483 1+ Xe + H2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ Xe + H2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Xe1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Xe1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ Xe + CH4 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ Xe + CH4 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 I+ Xe + N2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ Xe + N2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 + Ne Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Xe1+ + Ne Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ Xe + Kr Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ Xe + Kr Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ Xe + PERT Part. Beam-Matter Int. 1.00 MeV/amu Th 480 1+ Er + Si Part. Beam-Matter Int. 2.00 MeV Ex 511 1+ Au + Be Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 1+ Au + Be Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 1+ Au + Be Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 1+ Au + Al Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 1+ Au + Al Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Au1+ + Al Part. Beam-Matter Int. 0.10-1.00 GeV/amu 1+ Th 475 Au + A12O3 Part. Beam-Matter Int. 30.00-100.00 keV 1+ 496 Au + SiO2 Part. Beam-Matter Int. 30.00-100.00 keV 1+ 496 Au + Cu Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Au1+ + Cu Part. Beam-Matter Int. 0.10-1.00 GeV/amu 1+ Th 475 Au + Cu Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 1+ Part. Beam-Matter Int. Au + Ag 0.10-1.00 GeV/amu Th 475 1+ Part. Beam-Matter Int. Au + Ag 0.10-1.00 GeV/amu Th 475 1+ Part. Beam-Matter Int. Au + Ag 0.10-1.00 GeV/amu Th 475 1+ Part. Beam-Matter Int. Au + Ta 0.10-1.00 GeV/amu Th 475 1+ Part. Beam-Matter Int. Au + Ta 0.10-1.00 GeV/amu Th 475 1+ Part. Beam-Matter Int. Au + Ta 0.10-1.00 GeV/amu Th 475 1+ Part. Beam-Matter Int. Au + Au 0.10-1.00 GeV/amu Th 475 Au1+ + Au Part. Beam-Matter Int. 0.10-1.00 GeV/amu 1+ Part. Beam-Matter Int. Th 475 Au + Au 0.10-1.00 GeV/amu Th 475 Au1+ + Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu 1+ Part. Beam-Matter Int. Th 475 Au + Pb 0.10-1.00 GeV/amu Th 475 Au1+ + Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu 1+ Part. Beam-Matter Int. Th 475 Pb + H2 25.00-40.00 MeV/amu Ex 504 Pb1+ + H Part. Beam-Matter Int. 2 25.00-40.00 MeV/amu Ex 504 Pb1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Pb1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Pb1+ + Be Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Be Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Be Part. Beam-Matter Int. 0.10-1.00 GeV/amu 1+ Th 475 Pb + CH4 Part. Beam-Matter Int. 25.00-40.00 MeV/amu 1+ Ex 504 Pb Part. Beam-Matter Int. 25.00-40.00 MeV/amu 1+ CH Ex 504 Pb 4 Part. Beam-Matter Int. 25.00-40.00 MeV/amu 1+ N Ex 504 Pb 2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu 1+ N Ex 504 Pb 2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu 1+ Ne Ex 504 Pb Part. Beam-Matter Int. 25.00-40.00 MeV/amu 1+ Ne Ex 504 Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu 1+ Al Th 475 Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu 1+ Al Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Al Th 475

42 1+ Pb + Cu Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Cu Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Cu Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Kr Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Pb1+ + Kr Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 Pb1+ + Ag Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Ag Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Ag Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Ta Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Ta Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Ta Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Au Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Au Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Au Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb1+ + Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 PERT1+ + C Part. Beam-Matter Int. 1.00-4.00 MeV/amu Th 473 PERT1+ + C Part. Beam-Matter Int. 1.00-4.00 MeV/amu Th 473 Be Seq. + e Part. Beam-Matter Int. Th 503 Be Seq. + e Part. Beam-Matter Int. Th 503 Li Seq. + e Part. Beam-Matter Int. Th 503 Li Seq. + e Part. Beam-Matter Int. Th 503 1+ U + H2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ U + H2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 U1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 U1+ + He Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ U + CH4 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ U + CH4 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ U + N2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 1+ U + N2 Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 U1+ + Ne Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 U1+ + Ne Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 U1+ + Kr Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 U1+ + Kr Part. Beam-Matter Int. 25.00-40.00 MeV/amu Ex 504 U68+ + C Part. Beam-Matter Int. 5.00 MeV/amu Th 492 Bi1+ + Be Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Be Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Be Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Al Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Al Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Al Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Cu Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Cu Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Cu Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Ag Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Ag Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Ag Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Ta Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Ta Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Ta Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Au Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Au Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Au Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475

43 Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 Bi1+ + Pb Part. Beam-Matter Int. 0.10-1.00 GeV/amu Th 475 He Seq. + e Part. Beam-Matter Int. Th 503 He Seq. + e Part. Beam-Matter Int. Th 503 H Seq. + e Part. Beam-Matter Int. Th 503 H Seq. + e Part. Beam-Matter Int. Th 503 C2 + C Part. Beam-Matter Int. Th 515

2.5 Interactions of Atomic Particles with Fields e + H Int. At. Part. Fields 0.10-10.00 eV Th 545 e + Ti19+ Int. At. Part. Fields 53.00 eV Ex 535 Int. At. Part. Fields Th 543 H Int. At. Part. Fields 15.00-250.00 eV 534 H Int. At. Part. Fields Th 529 H Int. At. Part. Fields Th 527 H Int. At. Part. Fields 0.54 eV Th 526 H Int. At. Part. Fields E/T 525 H Int. At. Part. Fields 4.90-15.00 eV Th 524 H Int. At. Part. Fields 2.00-100.00 K 521 H Int. At. Part. Fields 2.72 eV Th 540 H2 Int. At. Part. Fields 2.72 keV Th 548 Int. At. Part. Fields Th 522 He Int. At. Part. Fields 0.10-10.00 K Th 546 He Int. At. Part. Fields 1.36-13.61 eV Th 541 He Int. At. Part. Fields 4.90-26.40 eV Th 539 He Int. At. Part. Fields 272.00 eV 530 He+ He Int. At. Part. Fields 0.00 K Ex 549 Li Int. At. Part. Fields 0.54 eV Th 526 Li2+ Int. At. Part. Fields 30.00 eV Th 528 CO2 Int. At. Part. Fields Ex 531 Int. At. Part. Fields 17.00-29.00 kK Ex 523 Ne1+ Int. At. Part. Fields 25.00-45.00 MeV Ex 520 Na + Na Int. At. Part. Fields 0.50 K Th 538 Na + Na Int. At. Part. Fields Ex 537 Rb + Rb Int. At. Part. Fields Th 547 Int. At. Part. Fields 248.00 eV 536 Cs + Cs Int. At. Part. Fields Ex 542 Cs + Cs Int. At. Part. Fields Ex 537 Cs + Cs Int. At. Part. Fields LOOK Ex 533 PERT Int. At. Part. Fields Th 532 HF Int. At. Part. Fields Th 544

44 3 BIBLIOGRAPHY 3.1 Structure and Spectra

1. D. Andrae Finite nuclear charge density distributions in electronic structure calculations for atoms and molecules. Phys. Rep. 336, 413 (2000) Structure, Spectra Atomic Structure Th Structure, Spectra Molecular Structure Th

3.2 Atomic and Molecular Collisions

3.2.1 Photon Collisions

2. C. M. Sikstrom, H. Lundberg, G. M. Wahlgren, Z. S. Li, C. Lynga, S. Johansson, D. S. Leckrone New Zr II oscillator strengths and the zirconium conflict in the HgMn star x Ltipi. Astron. Astrophys. 342, 297 (1999) hi/ + Zr1+ Photoexcitation 3.82-7.16 eV Ex

3. R. Schnabel, M. Kock, H. Holweger Selected Fe II lifetimes and f-values suitable for a solar abundance study. Astron. Astrophys. 342, 610 (1999) hv + Fe1+ Photoexcitation 4.79-5.59 eV Ex

4. E. Charro, I. Martin Oscillator strengths for transitions of astrophysical importance in S III. Astron. Astrophys. 343, 634 (1999) hi/ + S2+ Photoexcitation 0.04-29.53 eV Th

5. H. Nilsson, C. M. Sikstrom, Z. S. Li, H. Lundberg, A. J. J. Raassen, S. Johansson, D. S. Leckrone, S. Svanberg The FERRUM project: new experimental and theoretical f-values for 4p-4d transitions in Fe II applied to HST spectra of x Lupi. Astron. Astrophys. 362, 410 (2000) hz/ + Fe1+ Photoexcitation 6.20 eV Ex

6. A. Derevianko, W. R. Johnson, K. T. Cheng Non-dipole effects in photoelectron angular distributions for rare gas atoms. At. Data Nucl. Data Tables 73, 153 (1999) hi/ + He Photoionization 0.04-5.00 keV Th hf + Ne Photoionization 0.04-5.00 keV Th hz/ + Ar Photoionization 0.04-5.00 keV Th hz/ + Kr Photoionization 0.04-5.00 keV Th hi/ + Xe Photoionization 0.04-5.00 keV Th

7. K. M. Aggarwal, P. H. Norrington, K. L. Bell, F. P. Keenan, G. J. Pert, S. J. Rose Radiative rates for allowed transitions in Ni-like Nd, Sm, Eu, Ta, and W. At. Data Nucl. Data Tables 74, 157 (2000) hv + Nd32+ Photoexcitation 62.00-744.00 eV hz/ + Sm34+ Photoexcitation 62.00-744.00 eV hi/ + Eu35+ Photoexcitation 62.00-744.00 eV hi/ + Ta45+ Photoexcitation 62.00-744.00 eV hi/ + W46+ Photoexcitation 62.00-744.00 eV

45 8. G. P. Gupta, A. Z. Msezane Fine-structure calculation of energy levels, oscillator strengths, and transition probabilities in Mg-like sulfur. At. Data Nucl. Data Tables 74, 267 (2000) hz/ + S4+ Photoexcitation 4.69-43.35 eV E/T 9. H. S. Chakraborty, P. C. Deshmukh, E. W. B. Dias, S. T. Manson Relativistic effects in atomic and ionic photoionization: "anomalous" behavior at the low end of isoelectronic sequences. Astrophys. J., Part 1 537, 1094 (2000) hi/ + Ne Photoionization 21.80-81.60 eV Th hi/+ Na1+ Photoionization 21.80-81.60 eV Th hz/ + Mg2+ Photoionization 21.80-81.60 eV Th

10. J. A. Fedchak, L. M. Wiese, J. E. Lawler Vacuum ultraviolet resonance absorption f-values for Ni II. Astrophys. J., Part 1 538, 773 (2000) hz/ + Ni1+ Photoexcitation 7.08-8.55 eV Ex

11. E. Trabert, P. Beiersdorfer, S. B. Utter, G. V. Brown, H. Chen, C. L. Harris, P. A. Neill, D. W. Savin, A. J. Smith Experimental Ml transition rates of coronal lines from Ar X, Ar XIV, and Ar XV. Astrophys. J., Part 1 541, 506 (2000) hz/ + Ar9+ Photoexcitation 2.10-2.82 eV Ex hz/ + Ar13+ Photoexcitation 2.10-2.82 eV Ex hz/ + Ar14+ Photoexcitation 2.10-2.82 eV Ex

12. J. A. Fedchak, E. A. Den Hartog, J. E. Lawler, P. Palmeri, P. Quinet, E. Biemont Experimental and theoretical radiative lifetimes, branching fractions, and oscillator strengths for Lu I and experimental lifetimes for Lu II and Lu III. Astrophys. J., Part 1 542, 1109 (2000) hz/ + Lu1+ Photoexcitation 1.24-7.44 eV E/T hz/ + Lu2+ Photoexcitation 1.24-7.44 eV E/T

13. R. M. Schectman, S. Cheng, L. J. Curtis, S. R. Federman, M. C. Fritts, R. E. Irving Lifetime measurements in Sn II. Astrophys. J., Part 1 542, 400 (2000) hz/ + Sn1+ Photoexcitation 8.86 eV Ex 14. C. Lavin, E. Olalla, I. Martin Intensities for transitions involving highly excited states of N II: A relativistic treatment. Astrophys. J., Part 1 543, 1051 (2000) • hz/ + N1+ Photoexcitation 2.48-24.80 eV Th

15. P. S. Ganas Oscillator strengths for As I-III. Astrophys. J. Suppl. Ser. 143, 491 (2000) hi/ + As Photoexcitation 6.20-24.80 eV Th hz/ + As1+ Photoexcitation 6.20-24.80 eV Th hz/ + As2+ Photoexcitation 6.20-24.80 eV Th

16. S. N. Nahar, F. Delahaye, A. K. Pradhan, C. J. Zeippen Atomic data from the Iron Project. XLIII. Transition probabilities for Fe V. Astrophys. J. Suppl. Ser. 144, 141 (2000) hv + Fe4+ Photoexcitation Th

46 17. E. Charro, I. Martin, D. Bielinska-Waz Electric quadrupole transitions in Ni XVIII. Astrophys. J. Suppl. Ser. 146, 349 (2000) hi/ + Ni17+ Photoexcitation Th

18. G. X. Chen, A. K. Pradhan Atomic data from the Iron Project. XLIV. Transition probabilities and line ratios for Fe VI with fluorescent excitation in planetary nebulae. Astrophys. J. Suppl. Ser. 147, 111 (2000) hi/ + Fe5+ Photoexcitation 50.30 eV Th

19. A. de Lange, W. Ubachs 1 1 1 1 Observation of the j ^ - c4' £+ and k ^ - c4' S+ systems of N2. Chem. Phys. Lett. 310, 471 (1999)

hi/ + N2 Photoexcitation 1.42-14.46 eV Ex 2hi/ + N2 Photoexcitation 1.42-14.46 eV Ex

20. C. R. Scheper, C. A. de Lange, A. de Lange, E. Reinhold, W. Ubachs Dissociation of H2 in the energy region at the H(n=l)+H(n=3) dissociation threshold after (1+1') resonance-enhanced two-photon ionization via the Bx£+ state. Chem. Phys. Lett. 312, 131 (1999)

hi/ + H2 Photodissociation 2.86-2.96 eV Ex Zhv + H2 Photodissociation 2.86-2.96 eV Ex

21. R. Signorell, M. Sommavilla, F. Merkt + Jahn-Teller distortion in CD2H2 from a rotationally resolved photoelectron spectrum. Chem. Phys. Lett. 312, 139 (1999) 1+ hi' + CH4 Photoionization 12.62-12.63 eV Ex 1+ hi/ + CD2H2 Photoionization 12.62-12.63 eV Ex

22. R. C. Shiell, M. Evans, S. Stimson, C.-W. Hsu, C. Y. Ng, J. W. Hepburn A ZEKE photoelectron study of the D2II and 32S+ satellite states of CO+. Chem. Phys. Lett. 315, 390 (1999) hz/ + CO Photoionization 22.30-23.75 eV Ex

23. H. T. Barry, B. Babowski, L. Corner, T. Freegarde, 0. T. W. Hawkins, G. C. Hancock, R. M. J. Jacobs, R. Peverall, G. A. D. Ritchie OH detection by absorption of frequency-doubled diode laser radiation at 308 nm. Chem. Phys. Lett. 319, 125 (1999) hi/ + OH Total Absor., Scat. 8.05 eV Ex

24. M. Neeb, A. Kivimaki, B. Kempgens, H. M. Koppe, K. Maier, A. M. Bradshaw, N. Kosugi Partial electron yield spectrum of N2: doubly excited states at the K-shell threshold. Chem. Phys. Lett. 320, 217 (2000)

hi/ + N2 Photoionization 404.00-420.00 eV

25. K. Okada, K. Ueda, T. Tokushima, Y. Senba, H. Yoshida, Y. Shimizu, M. Simon, H. Chiba, H. Okumura, Y. Tamenori, H. Ohashi, N. Saito, S. Nagaoka, I. H. Suzuki, E. Ishiguro, I. Koyano, T. Ibuki, A. Hiraya High-resolution angle-resolved ion-yield measurements of H2O and D2O in the region of O Is to Rydberg transitions. Chem. Phys. Lett. 326, 314 (2000)

hi/ + H2O Photodissociation 536.50-539.50 eV hi/ + D2O Photodissociation 536.50-539.50 eV hi/ + H2O Photoionization 536.50-539.50 eV hi/ + D2O Photoionization 536.50-539.50 eV

47 26. B. F. Minaev Oxygen absorption below and near the Herzberg I continuum. Ab initio calculation of the transitions probability from metastable states. Chem. Phys. 252, 25 (2000) hi/ + O2 Total Absor., Scat. 4.13-6.46 eV Th 27. I. D. Petrov, V. L. Sukhorukov, E. Leber, H. Hotop Near threshold photoionization of excited alkali atoms Ak(np) (Ak = Na, K, Rb, Cs; n = 3-6). Eur. Phys. J. D 10, 53 (2000) hi/ + Na Photoionization 5.00 eV E/T hi/ + K Photoionization 5.00 eV E/T hi/ + Rb Photoionization 5.00 eV E/T hz/ + Cs Photoionization 5.00 eV E/T

28. M. Stener, P. Decleva Time-dependent density functional calculations of molecular photoionization cross sections: N2 and PH3. J. Chem. Phys. 112, 10871 (2000)

hz/ + N2 Photoionization 200.00 eV hi/ + PH3 Photoionization 200.00 eV

29. D. H. Glass, P. G. Burke Resonances in multiphoton ionization of He at the KrF laser wavelength. J. Phys. B 3, 407 (2000) hi/ + He Photoionization 5.00-5.19 eV Th 30. J. S. Parker, L. R. Moore, E. S. Smyth, K. T. Taylor One- and two-electron numerical models of multiphoton ionization of helium. J. Phys. B 33, 1057 (2000) hi/ + He Photoionization 4.99 eV Th 31. M. Stener, S. Furlan, P. Decleva Density functional calculations of photoionization with an exchange-correlation potential with the correct asymptotic behaviour. J. Phys. B 33, 1081 (2000)

hi/ + H2O Photoionization 10.00-70.00 eV E/T hi/ + CO Photoionization 10.00-70.00 eV E/T hi/ + N2 Photoionization 10.00-70.00 eV E/T

32. V. A. Pazdzersky, V. I. Usachenko, A. V. Ushnurtsev Cross sections of one- and two-photon detachment of the hydrogen negative ion. J. Phys. B 33, 1135 (2000) hi/ + H"1 Photodetachment 0.38-5.00 eV Th

33. F. N. Pu, J. C. Liu, Y. S. Cheng Inner-shell photoionization with excitation from excited atomic Na. J. Phys. B 33, 1203 (2000) hi/ + Na* Photoexcitation 50.00-120.00 eV hu + Na Photoexcitation 50.00-120.00 eV hi/ + Na* Photoionization 50.00-120.00 eV hi/ + Na Photoionization 50.00-120.00 eV

34. M. Gajda, J. Krzywinski, L. Plucinski, B. Piraux Interaction of a hydrogen atom with an intense pulse of vacuum ultraviolet radiation. J. Phys. B 33, 1271 (2000)

48 hi/ + H Photoionization 17.00 eV Th

35. H. Le Rouzo Exact double-continuum solution of a correlated atomic model. J. Phys. B 33, 1283 (2000) hv + He Photoionization 79.00-160.00 eV

36. B. M. Lagutin, I. D. Petrov, Ph. V. Demekhin, V. L. Sukhorukov, F. Vollweiler, H. Lievel, A. Ehresmann, S. Lauer, H. Schmoranzer, O. Wilhelmi, B. Zimmermann, K.-H. Schartner Alignment of ions after autoionization decay of atomic resonances: I. The 4dg<26p3/2 (J=l) resonance in Xe. J. Phys. B 33, 1337 (2000) hv + Xe Photoionization 2.46-2.61 eV E/T hv + Xe Fluorescence 2.46-2.61 eV E/T

37. R. D'Arcy, J. T. Costello, E. T. Kennedy, C. McGuinness, J. P. Mosnier, G. O'Sullivan The evolution of 4d photoabsorption in Sb with increasing ionization. J. Phys. B 33, 1383 (2000) hv + Sb Total Absor., Scat. 20.00-200.00 eV hv + Sb1+ Total Absor., Scat. 20.00-200.00 eV hi/ + Sb2+ Total Absor., Scat. 20.00-200.00 eV hi/ + Sb3+ Total Absor., Scat. 20.00-200.00 eV hv + Sb4+ Total Absor., Scat. 20.00-200.00 eV

38. H. Kjeldsen, J. B. West, F. Folkmann, H. Knudsen, T. Andersen The absolute photoionization cross section of singly charged magnesium ions in the extreme ultraviolet. J. Phys. B 33, 1403 (2000) hi/ + Mg1+ Photoionization 25.00-160.00 eV

39. P. G. Burke, J. Colgan, D. H. Glass, K. Higgins R-matrix-Floquet theory of molecular multiphoton processes. J. Phys. B 33, 143 (2000) hv + H2 Photoionization Th nhz/ + H-2 Photoionization Th

40. A. Jaron, E. Mese, R. M. Potvliege Flo quet analysis of laser-induced continuum structures. J. Phys. B 33, 1487 (2000) hv + H Photoionization Th 2hi/ + H Photoionization Th

41. F. Combet-Farnoux, P. Lablanquie, J. Mazeau, A. Huetz Theoretical and experimental study of inner-valence-shell satellites above the double-photoionization threshold of argon. J. Phys. B 33, 1597 (2000) hv + Ar Photoionization 45.00-58.00 eV E/T

42. P. Suresh, B. S. Reddy, T. S. Reddy, M. L. N Raju, B. V. T. Rao, B. M. Rao, M. V. R Murti K x-ray satellite spectrum of Al by photon excitation. J. Phys. B 33, 1645 (2000) hv + Al Photoexcitation Ex hv + AI2O3 Photoexcitation Ex

49 43. H. W. Van der Hart Configuration-interaction effects in and intensity dependence of F~ multiphoton detach- ment. J. Phys. B 33, 1789 (2000) hz/ + F'1 Photodetachment 1.10-3.50 eV Th

44. K. Maeda, K. Ueda, M. Aymar, T. Matsui, H. Chiba, K. Ito Absolute photoionization cross sections of the Ba ground state in the autoionization region: II. 221-209 nm. J. Phys. B 33, 1943 (2000) hv + Ba Photoionization 5.61-5.93 eV Ex

45. S. Geltman Ionization of H(ls) by laser pulses: a close-coupling study. J. Phys. B 33, 1967 (2000) hv + H Photoionization 4.90-15.00 eV Th

46. E. Oks, T. Uzer Multifrequency resonance transitions in the ionization of hydrogen by a single-frequency microwave field. J. Phys. B 33, 1985 (2000) hv + H Photoionization E/T

47. C. R. Feeler, R. E. Olson Single ionization of Ne by intense laser fields. J. Phys. B 33, 1997 (2000) hv + Ne Photoionization 1.55 eV E/T

48. R. Hasbani, E. Cormier, H. Bachau Resonant and non-resonant ionization of helium by XUV ultrashort and intense laser pulses. J. Phys. B 33, 2101 (2000) hv + He Photoionization 5.40-32.60 eV Th

49. E. Oks, T. Uzer Rydberg atoms as sensitive magnetic probes. J. Phys. B 33, 2207 (2000) hv + H Photoionization Th

50. A. Iwarnae, A. Hishkawa, K. Yamanouchi Extraction of molecular dynamics in intense laser fields from mass-resolved momentum imaging maps: application to Coulomb explosion of NO. J. Phys. B 33, 223 (2000) hv + NO Photoionization Ex

51. J. P. Connerade, V. K. Dolmatov, S. T. Manson On the nature and origin of confinement resonances. J. Phys. B 33, 2279 (2000) hz/ + Li2+ Photoionization 30.00 eV Th

52. S. A. Novikov, A. N. Hopersky Two-photon excitation/ionization of atomic inner shells. J. Phys. B 33, 2287 (2000) hz/ + Ne Photoionization 0.00-1.63 keV Th hz/ + Ne Photoexcitation 0.00-1.63 keV Th

50 53. H. Tachikawa A full dimensional ab initio dynamics study on the ionization processes of CF4. J. Phys. B 33, 2367 (2000)

hi/ + CF4 Photoionization 15.80 eV Th

54. S. Cvejanovic, J. P. Wightman, T. J. Reddish, F. Maulbetsch, M. A. MacDonald, A. S. Kheifets, I. Bray Photodouble ionization of helium at an excess energy of 40 eV. J. Phys. B 33, 265 (2000) hi/ + He Photoionization 40.00 eV E/T

55. A. Giugni, S. Cavalieri, R. Eramo, L. Fini, M. Materazzi Electron angular distributions in non-resonant three-photon ionization of xenon. J. Phys. B 33, 285 (2000) hi/ + Xe Photoionization 4.66 eV Ex 3hz/ + Xe Photoionization 4.66 eV Ex

56. 0. Zatsarinnyi, C. Froese-Fischer The use of basis splines and non-orthogonal orbitals in R-matrix calculations: application to Li photoionization. J. Phys. B 33, 313 (2000) hv + Li Photoexcitation 64.50-67.50 eV Th hi/ + Li Photoionization 64.50-67.50 eV Th

57. T. Hayaishi, Y. Fujita, M. Izumisawa, T. J. Tanaka, E. Murakami, E. Shigemasa, A. Yagishita, Y. Morioka Multi-step post-collision interaction effects in K-shell photoionization of Kr. J. Phys. B 33, 37 (2000) hi/ + Kr Photoionization 14.31-14.36 eV Ex

58. J. Ortner Relativistic photoelectron spectra in the ionization of atoms by elliptically polarized light. J. Phys. B 33, 383 (2000) hi/ + Ne7+ Photoionization Th

59. K. Mitsuke, Y. Hikosaka, K. Iwasaki Laser photoionization of polarized Ar atoms produced by excitation with synchrotron radi- ation. J. Phys. B 33, 391 (2000) hi/ + Ar Photoexcitation 2.33-30.00 eV Ex h¡/ + Ar Photoionization 2.33-30.00 eV Ex

60. M. Lein, E.K.U. Gross, V. Engel On the mechanism of strong-field double photoionization in the helium atom. J. Phys. B 33, 433 (2000) hi/ + He Photoionization 1.59 eV Th

61. S. S. Tayal, L. M. Richardson Oscillator strengths and inelastic scattering of electrons from O II. J. Phys. B 33, 443 (2000) hi/ + O1+ Photoexcitation 2.50-40.00 eV Th

62. A. Ehresmann, S. Machida, M. Kitajima, M. Ukai, K. Kameta, N. Kouchi, Y. Hatano, E. Shigemasa, T. Hayaishi Dissociative single and double photoionization with excitation between 37 and 69 eV in N-2- J. Phys. B 33, 473 (2000)

51 hv + N2 Photoionization 37.00-69.00 eV Ex hv + N2 Photodissociation 37.00-69.00 eV Ex

63. Z. Zhiguo, Z. S. Li, H. Lundberg, K. Y. Zhang, Z. W. Dai, J. Zhankui, S. Svanberg Radiative properties of Eu II and Eu III obtained from lifetime and branching ratio mea- surements. J. Phys. B 33, 521 (2000) hi/ + Eu Fluorescence 3.36-4.54 eV Ex hv + Eu Photoexcitation 3.36-4.54 eV Ex

64. K. Ito, J.-I. Adachi, R. J. Hall, S. Motoki, E. Shigemasa, K. Soejima, A. Yahishita Photoelectron angular distributions from dissociative photoionization channels of fixed-in- space molecular hydrogen. J. Phys. B 33, 527 (2000)

hi/ + H2 Photodissociation 44.00-76.00 eV Ex hi/ + H2 Photoionization 44.00-76.00 eV Ex

65. Jr. Borges, I., C. E. Bielschowsky Doubly excited states of molecular hydrogen: theoretical absorption and photodissociation cross sections. J. Phys. B 33, 713 (2000)

hi/ + H2 Photodissociation Th hz/ + H2 Total Absor., Scat. Th

66. X.-M. Tong, D. Kato, T. Watanabe, S. Ohtani Mechanisms of giant resonance in 4d photoionization of Eu. J. Phys. B 33, 717 (2000) hz/ + Eu Photoionization 120.00-160.00 eV

67. W. A. Bryan, J. H. Sanderson, A. El-Zein, W. R. Newell, P. F. Taday, A. J. Langley Laser-induced Coulomb explosion, geometry modification and reorientation of carbon diox- ide. J. Phys. B 33, 745 (2000)

hz/ + CO2 Photodissociation Ex

68. G. F. Gribakin, V. K. Ivanov, A. V. Korol, M. Yu Kuchiev Three-photon detachment of electrons from the fluorine negative ion. J. Phys. B 33, 821 (2000) hi/ + F"1 Photodetachment 0.08-0.25 Ry Th nhi/ + F-1 Photodetachment 0.08-0.25 Ry Th 3hi/ + F-1 Photodetachment 0.08-0.25 Ry Th

69. M. Sahin, L. Demir, 0. Sogut, M. Ertugrul, O. Icelli L-subshell fluorescence cross sections and L-subshell fluorescence yields in elements 68 < Z < 92 by 59.5 keV photons. J. Phys. B 33, 93 (2000) hi/ + Er Fluorescence 59.50 keV Ex hi/ + Ta Fluorescence 59.50 keV Ex hi/ + W Fluorescence 59.50 keV Ex hi/ + Au Fluorescence 59.50 keV Ex hi/ + Hg Fluorescence 59.50 keV Ex hv + Tl Fluorescence 59.50 keV Ex hv + Pb Fluorescence 59.50 keV Ex hi/ + Th Fluorescence 59.50 keV Ex hv + U Fluorescence 59.50 keV Ex hv + Bi Fluorescence 59.50 keV Ex

52 hz/ + Er Photoionization 59.50 keV Ex hi/ + Ta Photoionization 59.50 keV Ex hz/ + W Photoionization 59.50 keV Ex hz/ + Au Photoionization 59.50 keV Ex hi/ + Hg Photoionization 59.50 keV Ex hz/ + Tl Photoionization 59.50 keV Ex hz/ + Pb Photoionization 59.50 keV Ex hz/ + Th Photoionization 59.50 keV Ex hz/ + U Photoionization 59.50 keV Ex hi/ + Bi Photoionization 59.50 keV Ex

70. J. B. Watson, K. Burnett, P. L. Knight Double ionization of helium in an elliptically polarized laser field. J. Phys. B 33, L103 (2000) hz/ + He Photoionization 1.77 eV Th

71. F. Maulbetsch, I. L. Cooper, A. S. Dickinson From direct to resonant photo-double ionization. J. Phys. B 33, LI 19 (2000) hi/ + Ca Photoionization 31.40 eV Th 72. Th. Weber, M. Weckenbrock, A. Staudte, L. Spielberger, 0. Jagutzki, V. Mergel, F. Afaneh, G. Urbasch, M. Vollmer, H. Giessen, R. Dorner Sequential and nonsequential contributions to double ionization in strong laser fields. J. Phys. B 33, L127 (2000) hi/ + Ar Photoionization 1.55 eV Ex

73. B. Ueberholz, S. Kuhr, D. Frese, D. Meschede, V. Gomer Counting cold collisions. J. Phys. B 33, L135 (2000)

Cs2 + hi/ Photoexcitation 1.00 K Ex

74. J. S. Parker, D. H. Glass, L. R. Moore, E. S. Smyth, K. T. Taylor, P. G. Burke Time-dependent and time-independent methods applied to multiphoton ionization of he- lium. J. Phys. B 33, L239 (2000) lav + He Photoionization 4.99 eV Th nhz/ + He Photoionization 4.99 eV Th

75. J. P. Connerade, V. K. Dolmatov, S. T. Manson Controlled strong non-dipole eflfects in photoionization of confined atoms. J. Phys. B 33, L275 (2000) hi/ + H Photoionization 15.00-250.00 eV

76. I. Alvarez, F. B. Yousif, J. de Urquijo, C. Cisneros Experimental verification of quasibound predissociative states of Hs+ above the H+ + H-2 dissociation limit. J. Phys. B 33, L317 (2000) 1+ hi/ + H3 Photodissociation 1.17 eV Ex

77. M. Ya Amusia, N. A. Cherepkov, L. V. Chernysheva, S. T. Manson Multielectron correlation effects in Xe2+ formation resulting from the photoionization of Xe+ ions. J. Phys. B 33, L37 (2000) hi/ + Xe1+ Photoionization 50.00-150.00 eV

53 78. M. A. Bautista Photoionization of Fe XV from threshold to the K-shell. J. Phys. B 33, L419 (2000) hz/ + Fe14+ Photoionization 33.59-600.00 Ry

79. A. N. Hopersky, V. A. Yavna, S. A. Novikov, V. V. Chuvenkov Anomalous elastic scattering of an x-ray photon by a molybdenum atom near the K-edge. J. Phys. B 33, L433 (2000) hi/ + Mo Elastic Scattering 19.80-20.30 keV Th

80. E. Kukk, J. D. Bozek, J. A. Sheehy, P. W. Langhoff, N. Berrah Angular distribution of molecular-field- and spin-orbit sulfur 2p photoemission in OCS: a sensitive probe of the molecular environment. J. Phys. B 33, L51 (2000) hz/ + OCS Photoionization 191.00 eV

81. J. S. Briggs, V. Schmidt Differential cross sections for photo-double-ionization of the helium atom. J. Phys. B 33, Rl (2000) hv + He Photoionization 90.00-130.00 eV

82. G. B. Armen, H. Aksela, T. Aberg, S. Aksela The resonant Auger effect. J. Phys. B 33, R49 (2000) hz/ + Ar Photoexcitation Th hz/ + Kr Photoexcitation Th hi/ + Xe Photoexcitation Th hi/ + Ar Photoionization Th lav + Kr Photoionization Th hi/ + Xe Photoionization Th hi/ + Ar Photon Collisions Th hz/ + Kr Photon Collisions Th hz/ + Xe Photon Collisions Th

83. 0. Simsek Determination of L2 subshell X-ray production cross-sections and fluorescence yields of Pb, Th and U. Nucl. Instrum. Methods Phys. Res. B 170, 293 (2000) hi/ + Pb Photoionization 13.00-18.00 keV Ex hz/ + Th Photoionization 13.00-18.00 keV Ex hi/ + U Photoionization 13.00-18.00 keV Ex

84. R. C. Bilodeau, M. Scheer, H. K. Haugen, R. L. Brooks Near-threshold laser spectroscopy of iridium and platinum negative ions: Electron affinities and the threshold law. Phys. Rev. A 61, 012505 (2000) hi/ + Ir"1 Photodetachment 1.56-2.13 eV Ex hi/ + Pt-1 Photodetachment 1.56-2.13 eV Ex

85. P.-A. Raboud, J.-Cl. Dousse, J. Hoszowska, I. Savoy Li to Ng atomic level widths of thorium and uranium as inferred from measurements of L and M x-ray spectra. Phys. Rev. A 61, 012507 (2000) Fluorescence 19.60-80.00 keV E/T hv + V Fluorescence 19.60-80.00 keV E/T hz/ + Th Photoionization 19.60-80.00 keV E/T hz/ + U Photoionization 19.60-80.00 keV E/T

54 86. J. Yuan Core-valence electron correlation effects in photodetachment of Ca~ ions. Phys. Rev. A 61, 012704 (2000) hv + CsT1 Photodetachment 0.10-4.00 eV Ex

87. T. Mercouris, S. I. Themelis, C. A. Nicolaides Nonperturbative theory and computation of the nonlinear response of He to dc and ac fields. Phys. Rev. A 61, 013407 (2000) hv + He Photoionization 4.90-26.40 eV Th nhi/ + He Photoionization 4.90-26.40 eV Th

88. D. A. Telnov, S.-I. Chu High-order perturbation expansion of non-Hermitian Floquet theory for multiphoton and above-threshold ionization processes. Phys. Rev. A 61, 013408 (2000) hv + H1+ Photodetachment 0.09-0.37 eV Th nhi/ + H1+ Photodetachment 0.09-0.37 eV Th hv + H"1 Photoionization 0.09-0.37 eV Th nhi/ + H-1 Photoionization 0.09-0.37 eV Th

89. M. J. Jamieson, A. Dalgarno, B. Zygelman, P. S. Krstic, D. R. Schultz Collisions of ground-state hydrogen atoms. Phys. Rev. A 61, 014701 (2000) hv + H Photoionization 0.50-8.00 K Th

90. M. Ya Amusia, N. A. Cherepkov, L. V. Chernysheva, S. T. Manson Photoionization of atomic iodine and its ions. Phys. Rev. A 61, 020701 (2000) hv + I"1 Photodetachment 40.00-136.00 eV hv + I'1 Photoionization 40.00-136.00 eV hv + I Photoionization 40.00-136.00 eV hv + I2+ Photoionization 40.00-136.00 eV

91. A. A. Sorokin, L. A. Shmaenok, S. V. Bobashev, B. Mobus, M. Richter, G. Ulm Measurements of electron-impact ionization cross sections of argon, krypton, and xenon by comparison with photoionization. Phys. Rev. A 61, 022723 (2000) hv + Ar Photoionization E/T hi/ + Kr Photoionization E/T hv + Xe Photoionization E/T

92. L. Feng, Y.-K. Ho Quantum simulation of collinear p + H collisions in an intense laser field. Phys. Rev. A 61, 023407 (2000) H1+ + H Photoionization 2.72 eV Th

93. M. Hiyama, K. Someda Stabilization of diatomic molecules against ionization in intense laser fields: Effects of over- lapping resonance. Phys. Rev. A 61, 023411 (2000) hv + N2 Photoionization Th hv + O2 Photoionization Th

94. T. W. Gorczyca Auger decay of the photo excited Is""1 np Rydberg series in neon. Phys. Rev. A 61, 024702 (2000)

55 hz/ + Ne Photoionization 865.00 eV hz/ + Ne Photoexcitation 865.00 eV

95. K. T. Chung, J. C. Chang Structure of complex atom and photoionization of lithium below Li+ Is3s 3S. Phys. Rev. A 61, 030701 (2000) hz/ + Li Photoionization 71.00-74.00 eV Th

96. Z. Altun, S. T. Manson Photoelectron angular distributions of ns subshells of open-shell atoms as indicators of in- terchannel coupling: Sc 4s photoionization. Phys. Rev. A 61, 030702 (2000) hz/ + Sc Photoionization 5.00-80.00 eV Th

97. Z. Chen, A. Z. Msezane Generalized oscillator strength for the Na 3s-3p transition. Phys. Rev. A 61, 030703 (2000) hi/ + Na Photoexcitation 10.00-250.00 eV

98. R. Wehlitz, T. Pattard, M.-T. Huang, I. A. Sellin, J. Burgdorfer, Y. Azuma Near-threshold triple-photoionization cross section of lithium. Phys. Rev. A 61, 030704 (2000) hz/ + Li Photoionization 205.00-240.00 eV

99. S. K. Semenov, N. A. Cherepkov, G. H. Fecher, G. Schonhense Generalization of the atomic random-phase-approximation method for diatomic molecules: N-2 photoionization cross-section calculations. Phys. Rev. A 61, 032704 (2000)

hv + N2 Photoionization 90.00 eV Th

100. N. L. Manakov, A. V. Meremianin, J. P. J. Carney, R. H. Pratt Circular dichroism effects in atomic x-ray scattering. Phys. Rev. A 61, 032711 (2000) hz/ + Cu Elastic Scattering 1.00-116.00 keV hz/ + Xe Elastic Scattering 1.00-116.00 keV hz/ + U Elastic Scattering 1.00-116.00 keV

101. C. Baraldi, E. Casnati, A. Tartari, G. D. Domenico, B. Singh Measurement of x-ray emission from Gd, Dy, and Er stimulated by 59.54-keV photons. Phys. Rev. A 61, 032714 (2000) hz/ + Gd Photoexcitation 59.54 keV Ex hz/ + Dy Photoexcitation 59.54 keV Ex hz/ + Er Photoexcitation 59.54 keV Ex hz/ + Gd Fluorescence 59.54 keV Ex hz/ +• Dy Fluorescence 59.54 keV Ex hz/ + Er Fluorescence 59.54 keV Ex

102. A. Karawajczyk, P. Erman, E. Rachlew-Kallne, J. R. I. Riu, M. Stankiewicz, K. Y. Franzen, L. Veseth Neutral fragmentation of superexcited oxygen molecules. Phys. Rev. A 61, 032718 (2000)

hz/ + O2 Fluorescence 15.00-25.00 eV Ex hi/ + O2 Photodissociation 15.00-25.00 eV Ex

103. Y. Jiang, J. Yan, J.-M. Li, J. Q. Sun, L. Wan Photoionization of helium between the N=2 and N=5 thresholds of He"1": Partial differential cross sections. Phys. Rev. A 61, 032721 (2000)

56 hv + He Photoionization 69.00-76.80 eV Th hv + He Photoexcitation 69.00-76.80 eV Th

104. S. Pasic, K. Ilakovac Accurate determination of Compton backscattering in germanium at 86.5 keV on an absolute scale. Phys. Rev. A 61, 032722 (2000) hv + Ge Photoexcitation 86.50 keV Ex hv + Ge Elastic Scattering 86.50 keV Ex hv + Ge Total Absor., Scat. 86.50 keV Ex

105. G. F. Bertsch, N. Van Giai, N. V. Mau Cluster ionization via two-plasmon excitation. Phys. Rev. A 61, 033202 (2000) 1+ hv + Na93 Photoionization 3.10 eV Th 106. C. Rangan, A. R. P. Rau Photo detachment in combined static and dynamic electric fields. Phys. Rev. A 61, 033405 (2000) hi/ + H"1 Photodetachment Th

107. C. Guo, M.-Y. Li, J. P. Nibarger, G. N. Gibson Nonsequential double ionization of molecular fragments. Phys. Rev. A 61, 033413 (2000) 2+ hv + N2 Photoionization Ex 2+ hi/ + O2 Photoionization Ex 2+ hv + N2 Photodissociation Ex 2+ hv + O2 Photodissociation Ex

108. J. P. J. Carney, R. H. Pratt, N. L. Manakov, A. V. Meremianin Dependence of photon-atom scattering on energy resolution and target angular momentum. Phys. Rev. A 61, 042704 (2000) hv + H Elastic Scattering 5.00-300.00 eV hv + H* Elastic Scattering 5.00-300.00 eV hv + B Elastic Scattering 5.00-300.00 eV

109. A. Amelink, K. M. Jones, P. D. Lett, P. Van der Straten, H. G. M. Heideman Spectroscopy of autoionizing doubly excited states in ultracold Na2 molecules produced by photodissociation. Phys. Rev. A 61, 042707 (2000)

Na2 Photoexcitation 0.00 K Ex

110. G. Snell, E. Kukk, B. Langer, N. Berrah Angular distribution measurements of the xenon N4>5O2,3O2:3 Auger electrons: Determina- tion of alignment and intrinsic parameters. Phys. Rev. A 61, 042709 (2000) hv + Xe Photoionization 80.00-250.00 eV

111. S. Pasic, K. Ilakovac Absolute-scale determination of bremsstrahlung following photoabsorption of incident x and gamma rays. Phys. Rev. A 61, 042710 (2000) hv + Ge Photoionization 59.50 keV Ex

112. O. Simsek Differential cross sections for incoherent scattering of gamma rays by elements. Phys. Rev. A 61, 042711 (2000)

57 hv + Zr Free-Free Transition 59.50 keV Th hu + Nb Free-Free Transition 59.50 keV Th hv + Mo Free-Free Transition 59.50 keV Th

113. J. F. Gao, D.-S. Guo, Y.-S. Wu Resonant above-threshold ionization at quantized laser intensities. Phys. Rev. A 61, 043406 (2000) hv + Xe Photoionization Th nhv + Xe Photoionization Th

114. S. Rioual, B. Rouvellou, L. Avaldi, G. Battera, R. Camilloni, G. Stefani, G. Turri Interference effects in the Ne double photoionization studied by photoelectron-Auger-electron coincidence experiments. Phys. Rev. A 61, 044702 (2000) hv + Ne Photoionization 92.21 eV Ex

115. P. Morin, M. Simon, C. Miron, N. Leclercq, E. Kukk, J. D. Bozek, N. Berrah Role of bending in the dissociation of selective resonant inner-shell excitation as observed in CO2. Phys. Rev. A 61, 050701 (2000)

hv + CO2 Photoionization 290.00-298.00 eV hv + CO2 Photodissociation 290.00-298.00 eV

116. J. P. J. Carney, R. H. Pratt, L. Kissel, S. C. Roy, S. K. Sen Gupta Rayleigh scattering from excited states of atoms and ions. Phys. Rev. A 61, 052714 (2000) hv + C Elastic Scattering 0.10-10.00 keV Th hv + C1+ Elastic Scattering 0.10-10.00 keV Th hv + C2+ Elastic Scattering 0.10-10.00 keV Th hv + C3+ Elastic Scattering 0.10-10.00 keV Th hv + C4+ Elastic Scattering 0.10-10.00 keV Th

117. T. K. Fang, T. N. Chang Photoionization from excited Mg atoms. Phys. Rev. A 61, 052716 (2000) hv + Mg Photoionization 2.00-19.00 MeV/amu E/T

118. S. Diehl, D. Cubaynes, H. L. Zhou, L. Voky, F. J. Wuilleumier, E. T. Kennedy, J. M. Bizau, S. T. Manson, T. J. Morgan, C. Blancard, N. Berrah, J. Bozek Angle-resolved photoelectron spectrometry studies of the autoionization of the 2s22p 2P triply excited state of atomic lithium: Experimental results and R-matrix calculations. Phys. Rev. Lett. 84, 1677 (2000) hv + Li Photoionization 142.00-142.60 eV

119. P. Erman, A. Karawajczyk, E. Rachlew-Kallne, J. R. I. Riu, M. Stankiewicz, K. Y. Franzén, A. W. Moen, L. Veseth Non Franck-Condon effects in photoionization of molecular oxygen. Phys. Scr. 62, 294 (2000)

hv + O2 Photoionization 16.00-35.00 eV E/T

120. M. Mohan, R. Kundliya, K. Baliyan Photoionization of ground state of NiXIX using a relativistic Breit-Pauli approximation. Phys. Scr. 62, 307 (2000) hv + Ni18+ Photoionization 112.00-122.00 eV

58 121. Y. Ozdemir, R. Durak Measurements of U, La, and I/y X-ray production cross sections and average L shell fluo- rescence yields for elements in the atomic range 70 < Z < 92 at 59.54 keV. Phys. Scr. 62, 41 (2000) hz/ + Yb Photoionization 59.50 keV Ex hz/ + Hf Photoionization 59.50 keV Ex hz/ + W Photoionization 59.50 keV Ex hz/ + Os Photoionization .59.50 keV Ex hv + Hg Photoionization 59.50 keV Ex hz/ + Tl Photoionization 59.50 keV Ex hi/ + Pb Photoionization 59.50 keV Ex hz/ + Th Photoionization 59.50 keV Ex Photoionization 59.50 keV Ex

3.2.2 Electron Collisions

122. A. Ichihara, J. Eichler Cross sections for radiative recombination and the photoelectric effect in the K, L, and M shells of one-electron systems with 1 < Z < 112 calculated within an exact relativistic description. At. Data Nucl. Data Tables 74, 1 (2000) e + H Seq Recombination 0.00-1.00 MeV Th

123. I. L. Beigman, L. A. Vainshtein, M. Brix, A. Pospieszczyk, I. Bray, D. V. Fursa, Yu. V Ralchenko Excitation and ionization cross sections for He I from normalized Born and K-matrix calcu- lations: As = 0 transitions from N = 2, 3 excited states. At. Data Nucl. Data Tables 74, 123 (2000) e + He Excitation 1.50-440.00 eV

124. G. P. Gupta, N. C. Deb, A. Z. Msezane R-matrix calculation of electron impact excitation of fine-structure levels of Ne-like iron. At. Data Nucl. Data Tables 74, 257 (2000) e + Fe16+ Excitation 0.95-2.72 keV Th

125. S. J. Smith, J. B. Greenwood, A. Chutjian, S. S. Tayal Electron excitation cross sections for the 3s23p2 3P -> 3s3p3 5S° transition in S2+. Astrophys. J., Part 1 541, 501 (2000) e + S2+ Excitation 15.00 eV E/T

126. S. S. Tayal Effective collision strengths of fine-structure transitions in Fe X, Fe XI, and Fe XIII. Astrophys. J., Part 1 544, 575 (2000) e + Fe9+ Excitation 0.00-6.00 kK Th e + Fe10+ Excitation 0.00-6.00 kK Th e + Fe12+ Excitation 0.00-6.00 kK Th

127. K. Butler, C. J. Zeippen Atomic data from the IRON Project. XLII. Electron impact excitation of Fe XXI. Astrophys. J. Suppl. Ser. 143, 483 (2000) e + Fe20+ Excitation 3.54 keV Th

128. M. C. Chidichimo, V. Zeman, J. A. Tully, K. A. Berrington Errata. Atomic data from the IRON Project. XXXVI. Electron excitation of Be-like Fe 2 2 XXIII between Is 2U2I2SLJ and Is 2132l4 S'L'J'. Astrophys. J. Suppl. Ser. 143, 541 (2000)

59 e + Fe22+ Excitation Th

129. I. Bray, A. Burgess, D. V. Fursa, J. A. Tully He(l XS, 2 3S, 2 1S, 2 3P -» n 13L): Thermally averaged electron collision strengths for n < 5. Astrophys. J. Suppl- Ser. 146, 481 (2000) e + He Excitation Th 130. K. Furuya, K. Ishikawa, T. Ogawa Mass analysis of polyatomic high-Rydberg fragments produced by electron impact on methane.

Chem. Phys. Lett. 319, 335 (1999) e + CH4 Dissociation 60.00 eV Ex e + CH4 Excitation 60.00 eV Ex e + CH4 Ionization 60.00 eV Ex 131. W. M. Huo, Y.-K. Kim Use of relativistic effective core potentials in the calculation of total electron-impact ioniza- tion cross-sections. Chem. Phys. Lett. 319, 576 (1999) e + Cl Ionization 0.01-1.00 keV Th e + Ar Ionization 0.01-1.00 keV Th e + Br Ionization 0.01-1.00 keV Th e + Kr Ionization 0.01-1.00 keV Th e + I Ionization 0.01-1.00 keV Th e + Xe Ionization 0.01-1.00 keV Th

132. A. El-Zein, M. J. Brunger, W. R. Newell Resonance phenomena in electron impact excitation of the fundamental vibrational modes of water. Chem. Phys. Lett. 319, 701 (1999)

e + H2O Excitation 7.50 eV Ex 133. J. Amorim, J.L.S. Lino, J. Loureiro, M.A.P. Lima, F. J. De Paixao 3 Superelastic collisions of electrons with the c IIM metastable state in hydrogen dc positive column. Chem. Phys. 246, 275 (1999)

e + H2 Elastic Scattering 40.00 eV Ex 134. Y. B. Duan, L. M. Wang, W. J. Qian Non-partial-wave Coulomb-Born theory for the excitation of many-electron atomic ions. II: Numerical description and application. Eur. Phys. J. D 11, 25 (2000) e + H Seq Excitation Th H1+ + H Seq Excitation Th

135. O. Wilhelmi, K.-H. Schartner Proton and electron impact on molecular and atomic oxygen: II. Emission cross-sections for ionisation and excitation of atomic oxygen. Eur. Phys. J. D 11, 45 (2000) e + O Excitation 20.00-300.00 keV/amu H1+ + O Excitation 20.00-300.00 keV/amu

136. T. A. Snegurskaya, N. A. Margitich, I. I. Shafran'osh Spectroscopic study of the production of magnesium ions from the atomic metastable states 3s3p3Po,2 by electron impact. J. Appl. Phys. 88, 661 (2000)

60 e + Mg Ionization 5.00-30.00 eV Ex e + Mg Excitation 5.00-30.00 eV Ex e + Mg* Ionization 5.00-30.00 eV Ex e + Mg* Excitation 5.00-30.00 eV Ex

137. P. Calandra, C. S. S. O'Connor, S. D. Price Electron-impact ionization of the chlorine molecule. J. Chem. Phys. 112, 10821 (2000)

e + Cl2 Ionization 250.00 eV

138. B. G. Lindsay, M. A. Mangan, H. C. Straub, R. F. Stebbings Absolute partial cross sections for electron-impact ionization of NO and NO2 from threshold to 1000 eV. J. Chem. Phys. 112, 9404 (2000) e + NO Ionization 1.00 keV Ex e + NO2 Ionization 1.00 keV Ex

139. A. Neau, A. Al Khalili, S. Rosen, A. Le Padellec, A. M. Derkatch, W. Shi, L. Vikor, M. Larsson, J. Semaniak, R. Thomas, M. B. Nagard, K. Andersson, H. Danared, M. af Ugglas Dissociative recombination of D3O"1" and HsO+: Absolute cross sections and branching ra- tios. J. Chem. Phys. 113, 1762 (2000) 1+ e + H3O Dissociation 0.00-0.25 eV Ex 1+ e + D3O Dissociation 0.00-0.25 eV Ex

140. N. O. Malcolm, D. L. Yeager Purely theoretical electron-impact ionization cross-sections of silicon hydrides and silicon fluorides obtained from explicitly correlated methods. J. Chem. Phys. 113, 8 (2000)

e + SiH4 Ionization 1.00 keV Th e + SiH Ionization 1.00 keV Th e + SiF Ionization 1.00 keV Th e -)- SiF2 Ionization 1.00 keV Th e + SiF3 Ionization 1.00 keV Th e + SiH2 Ionization 1.00 keV Th e + SiH3 lonization 1.00 keV Th

141. D. C. Griffin, N. R. Badnell, M. S. Pindzola Electron-impact excitation of C3+ and O5+: the effects of coupling to the target continuum states. J. Phys. B 33, 1013 (2000) e + C3+ Excitation 5.00-200.00 eV e + O5+ Excitation 5.00-200.00 eV

142. C. R. Stia, O. A. Fojon, R. D. Rivarola Ionization of hydrogenic targets by electron impact. Scaling laws. J. Phys. B 33, 1211 (2000) e + H Seq Angular Scattering Th e + H Seq Ionization Th

143. M. R. H. Rudge A calculation of ionization amplitudes for e~-H scattering. J. Phys. B 33, 1223 (2000) e + H Angular Scattering 14.60-40.80 eV Th e + H Ionization 14.60-40.80 eV Th

61 144. B. Feuerstein, O. I. Zatsarinnyi, W. Mehlhorn Cross sections of the 3p-1 diagram and satellite Auger states in atomic calcium for electron impact. J. Phys. B 33, 1237 (2000) e + Ca Angular Scattering 0.04-1.50 keV Ex

145. H. Anderson, C. P. Ballance, N. R. Badnell, H. P. Summers An R-matrix with pseudostates approach to the electron-impact excitation of H I for diag- nostic applications in fusion plasmas. J. Phys. B 33, 1255 (2000) e 4- H Excitation 12.10-27.00 eV Th

146. Z. Felfli, K. A. Berrington, A. Z. Msezane Electron-impact ionization of Mg+ near the 2p inner-shell edge. J. Phys. B 33, 1263 (2000) e + Mg1+ Ionization 44.00-66.00 eV Th

147. M. Grin, C. Dal Cappello, R. El Mkhanter, J. Rasch Angular distribution in (e, 3e) collisions on helium. J. Phys. B 33, 131 (2000) e + He Ionization 1.00-5.00 keV Th

148. R. F. Feng, Q. Ji, L. F. Zhu, Q. Shi, S. Wu, X. Zhang, Z. Zhong, K. Xu Electron-impact studies for dipole oscillator strengths and elastic electron-scattering differ- ential cross sections of mercury vapour. J. Phys. B 33, 1357 (2000) e + Hg Angular Scattering 1.50 keV Ex e + Hg Fluorescence 1.50 keV Ex e + Hg Elastic Scattering 1.50 keV Ex

149. G. van de Sand, J. M. Rost Inelastic semiclassical Coulomb scattering. J. Phys. B 33, 1423 (2000) e + H Ionization 2.70-272.00 eV e + H Excitation 2.70-272.00 eV

150. H. K. Tseng Corrigenda: Relativistic calculation of an elementary process of electron bremstrahlung from atoms. J. Phys. B 33, 1471 (2000) e + Al13+ Bremsstrahlung 20.00-70.00 keV Th e + Au79+ Bremsstrahlung 20.00-70.00 keV Th

151. V. V. Balashov, I. V. Bodrenko Corrigenda: Triple coincidence (e, 2eY) measurements as a 'perfect experiment' instrument for ionization-excitation studies. J. Phys. B 33, 1473 (2000) e + He Angular Scattering 1.58 keV E/T e + He Fluorescence 1.58 keV E/T e + He Excitation 1.58 keV E/T

152. K. Furuya, K. Maruyama, E. Koto, A. Matsuo, T. Ogawa Fragment ion-photon coincidence study of dissociative ionization accompanying light emis- sion by electron impact on acetylene. J. Phys. B 33, 1475 (2000)

62 e + C2H2 Ionization 120.00 eV e + C2H2 Dissociation 120.00 eV

153. C. Z. Szmytkowski, P. Mozejko, G. Kasperski, E. Ptasinska-Denga Electron scattering from hexafluoride molecules: WF6 and C2F6. Absolute total cross section measurements from 1 to 250 eV. J. Phys. B 33, 15 (2000)

e + C2F6 Elastic Scattering 1.00-250.00 eV e + WF6 Elastic Scattering 1.00-250.00 eV

154. R. Flammini, E. Fainelli, L. Avaldi Observation of doubly excited states in the Nj 2

e + N2 Ionization 1.00 keV Ex 155. M. Kitajima, Y. Sakamoto, R. J. Gulley, M. Hoshino, J. C. Gibson, H. Tanaka, S. J. Buckman Electron scattering from N2O: absolute elastic scattering and vibrational excitation. J. Phys. B 33, 1687 (2000)

e + N2O Angular Scattering 1.50-100.00 eV e + N2O Excitation 1.50-100.00 eV e + N2O Elastic Scattering 1.50-100.00 eV

156. A. N. Grum-Grzhimailo, K. Bartschat Excitation of the 3p5 4s2 2P autoionizing state in potassium by electron impact at low energies: an R-matrix calculation. J. Phys. B 33, 1843 (2000) e + K Excitation 18.70-31.00 eV Th

157. D. H. Yu, P. A. Hayes, J. F. Williams, V. Zeman, K. Bartschat Internal spin-orbit coupling and electron exchange in the excitation of np5(n + l)p states of neon, krypton and xenon atoms by polarized electrons. J. Phys. B 33, 1881 (2000) e + Ne Excitation 2.50 eV Th e + Kr Excitation 2.50 eV Th e + Xe Excitation 2.50 eV Th

158. X. Guo, D. F. Mathews, G. Mikaelian, M. A. Khakoo, A. Crowe, I. Kanik, S. Trajmar, V. Zeman, K. Bartschat, C. J. Fontes Differential cross sections for electron-impact excitation of krypton at low incident energies: I. Excitation of the 4p55s configuration. J. Phys. B 33, 1895 (2000) e + Kr Angular Scattering 12.00-20.00 eV E/T e + Kr Excitation 12.00-20.00 eV E/T

159. X. Guo, D. F. Mathews, G. Mikaelian, M. A. Khakoo, A. Crowe, I. Kanik, S. Trajmar, V. Zeman, K. Bartschat, C. J. Fontes Differential cross sections for electron-impact excitation of krypton at low incident energies: II. Excitation of the 4p55p, 4p54d and 4p56s configurations. J. Phys. B 33, 1921 (2000) e + Kr Angular Scattering 15.00-20.00 eV E/T e + Kr Excitation 15.00-20.00 eV E/T

160. D. M. Filipovic, B. P. Marinkovic, V. Pejcev, L. Vuskovic Electron-impact excitation of argon: II. The lowest resonance 4s[3/2]j. and metastable 4s[3/2]2 and 4s'[l/2]0 states. J. Phys. B 33, 2081 (2000)

63 e + Ar Excitation 20.00-80.00 eV Ex

161. D. Cvejanovic, K. Clague, D. V. Fursa, K. Bartschat, I. Bray, A. Crowe Excitation and polarization of the 33D state of helium by electron impact. J. Phys. B 33, 2265 (2000) e + He Excitation 500.00 eV

162. B. Mapstone, M. J. Brunger, W. R. Newell Vibrational excitation of ethane and ethene by electron impact. J. Phys. B 33, 23 (2000) e + C2H4 Angular Scattering 3.20-15.50 eV Ex e 4- C2H6 Angular Scattering 3.20-15.50 eV Ex e + C2H4 Excitation 3.20-15.50 eV Ex e 4- C2H6 Excitation 3.20-15.50 eV Ex

163. A. Busalla, K. Blum, D. G. Thompson Collisions with chiral molecules prepared by optical pumping. J. Phys. B 33, 2317 (2000) e 4 H2S2 Angular Scattering 5.00 eV Th e 4- CHBrCIF Angular Scattering 5.00 eV Th e 4 H2S2 Elastic Scattering 5.00 eV Th e 4- CHBrCIF Elastic Scattering 5.00 eV Th

164. S. S. Tayal, L. M. Richardson Oscillator strengths and inelastic scattering of electrons from O II. J. Phys. B 33, 443 (2000) e + O1+ Excitation 2.50-40.00 eV Th

165. H. Teng, P. Defrance, C. Chen, Y. Wang Electron-impact single ionization of Kr10+ and Kr11+ ions. J. Phys. B 33, 463 (2000) e 4- Kr10+ Ionization 0.30-3.00 keV Th e + Kr11+ Ionization 0.30-3.00 keV Th

166. I. Bray Low-energy electron-impact ionization of atomic hydrogen with equal energy outgoing elec- trons. J. Phys. B 33, 581 (2000) e + H Ionization 15.60-30.00 eV Th

167. B. M. McLaughlin, K. L. Bell 2 2 4 3 Electron collisional excitation of Ne III: (Is 2s 2p P2,i,o5 ^2, '•So) fine-structure transi- tions. J. Phys. B 33, 597 (2000) e + Ne2+ Excitation 0.00-1.00 GeV Th

168. R. Curik, F. A. Gianturco, N. Sanna Electron and positron scattering from halogenated methanes: a comparison of elastic cross sections. J. Phys. B 33, 615 (2000)

e 4 CF4 Angular Scattering 20.00 eV Th e 4 CCI4 Angular Scattering 20.00 eV Th e 4- CF4 Elastic Scattering 20.00 eV Th e 4 CCI4 Elastic Scattering 20.00 eV Th

64 169. D. M. Filipovic, B. P. Marinkovic, V. Pejcev, L. Vuskovic Electron-impact excitation of argon: I. The 4s'[l/2]l5 4p[l/2]i, and 4p'[l/2]0 states. J. Phys. B 33, 677 (2000) e + Ar Angular Scattering 16.00-80.00 eV Ex e + Ar Excitation 16.00-80.00 eV Ex

170. M. A. Bautista Electron-impact inner-shell excitation of Fe XVI. J. Phys. B 33, 71 (2000) e + Fe15+ Excitation 0.05-1.00 kK Th

171. M. J. Brunger, L. Campbell, D. C. Cartwright, A. G. Middleton, B. Mojarrabi, P. J. O. Teubner Electron-impact excitation of Rydberg and valence electronic states of nitric oxide: I. Dif- ferential cross sections. J. Phys. B 33, 783 (2000) e + NO Angular Scattering 15.00-50.00 eV Ex e + NO Excitation 15.00-50.00 eV Ex

172. M. J. Brunger, L. Campbell, D. C. Cartwright, A. G. Middleton, B. Mojarrabi, P. J. 0. Teubner Electron-impact excitation of Rydberg and valence electronic states of nitric oxide: II. Integral cross sections. J. Phys. B 33, 809 (2000) e + NO Excitation 15.00-50.00 eV Ex

173. A. K. Edwards, Q. Zheng Excitation of the 2p7rM state of H^ as a function of alignment of the molecular axis. J. Phys. B 33, 881 (2000)

e + H2 Dissociation 400.00 eV e + H2 Excitation 400.00 eV

174. I. I. Shafranyosh, M. 0. Margitich Electron-impact ionization cross section for metastable Ca (3p64s4p 3Po,2) atoms. J. Phys. B 33, 905 (2000) e + Ca Ionization 4.00-20.00 eV E/T

175. F. B. Rosmej The He^g emission in dense non-Maxwellian plasmas. J. Phys. B 33, LI (2000) e + He Fluorescence 27.00-109.00 eV e + He Excitation 27.00-109.00 eV

176. K. F. Kam, J. A. D. Matthew Integrated asymmetry trends in the Born-Ochkur approximation. J. Phys. B 33, L203 (2000) e + H Excitation 1.50-15.00 Ry Th

177. M. Allan, M. Cizek, J. Horacek, W. Domcke Electron scattering in cooled HCI: boomerang structures and outer-well resonances in elastic and vibrational excitation cross sections. J. Phys. B 33, L209 (2000) e + HCI Angular Scattering 0.20-1.00 eV Ex e + HCI Excitation 0.20-1.00 eV Ex e + HCI Elastic Scattering 0.20-1.00 eV Ex

65 178. M. Allan Excitation of the 2 3S state of helium by electron impact from threshold to 24 eV: measure- ments with the 'magnetic angle changer'. J. Phys. B 33, L215 (2000) e + He Angular Scattering 19.80-24.00 eV Ex e + He Excitation 19.80-24.00 eV Ex

179. H. Teng Indirect processes in electron-impact ionization of Li+. J. Phys. B 33, L227 (2000) e + Li1+ Ionization 132.00-168.00 eV

180. R. Meintrup, G. F. Hanne, K. Bartschat Spin exchange in elastic collisions of polarized electrons with manganese atoms. J. Phys. B 33, L289 (2000) e + Mn Elastic Scattering 20.00 eV E/T

181. A. J. Murray, F. H. Read Low energy (e, 2e) differential cross section measurements on neon from the coplanar to the perpendicular plane geometry. J. Phys. B 33, L297 (2000) e + Ne Ionization 44.60 eV Ex

182. H. Cho, R. J. Gulley, S. J. Buckman The total elastic cross section for electron scattering from SFg. J. Phys. B 33, L309 (2000)

e + SF6 Elastic Scattering 2.70-75.00 eV Ex

183. M. S. Pindzola, F. Robicheaux Ejected-energy differential cross sections for the electron-impact detachment of H~. J. Phys. B 33, L427 (2000) e + H"1 Angular Scattering 10.00-20.00 eV Th e 4- H-1 Detachment 10.00-20.00 eV Th

184. T. Bartsch, S. Schippers, M. Beutelspacher, S. Bohm, M. Grieser, G. Gwinner, A. A. Saghiri, G. Saathoff, R. Schuch, D. Schwalm, A. Wolf, A. Mueller Enhanced dielectronic recombination of lithium-like Ti19+ ions in external E x B fields. J. Phys. B 33, L453 (2000) e + Ti19+ Recombination 53.00 eV Ex

185. M. Dogan, A. Crowe Correlation studies of excited states of the helium ion. J. Phys. B 33, L461 (2000) e + He Ionization 200.00 eV

186. S. P. Khare, S. Tomar, M. K. Sharma Electron impact molecular ionization. J. Phys. B 33, L59 (2000) e 4- CH4 Ionization Th

187. M. P. Scott, H. Teng, P. G. Burke Autoionizing states in electron-impact ionization of C3+. J. Phys. B 33, L63 (2000) e + C3+ Ionization 290.00-350.00 eV

66 188. C. Plottke, I. Bray Calculation of the free-free transitions in the electron-hydrogen scattering S-wave model. J. Phys. B 33, L71 (2000) e + H Bremsstrahlung 3.00 Ry Th e + H Excitation 3.00 Ry Th e + H Elastic Scattering 3.00 Ry Th

189. A. Ohsaki, S. Nagasaki, S.-I. Uramoto, K. Takayanaki Electron-impact excitation of ions - effects of presence of another ion. J. Phys. Soc. Jpn. 69, 378 (2000) e + He1+ Excitation Th e + C5+ Excitation Th e + He+ + Seq. Excitation Th e + C+5 Seq. Excitation Th

190. G. V. Miloshevsky, V. I. Tolkach, S. Rozin, G. Shani Elastic scattering of electrons by gadolinium and barium atoms. Nucl. Instrum. Methods Phys. Res. B 168, 467 (2000) e + Ga Angular Scattering 0.00-100.00 keV e + Ba Angular Scattering 0.00-100.00 keV e + O Elastic Scattering 0.00-100.00 keV e + Ga Elastic Scattering 0.00-100.00 keV e + Ba Elastic Scattering 0.00-100.00 keV

191. M. A. Khakoo, M. Larsen, B. Paolini, X. Guo, I. Bray, A. T. Stelbovics, I. Kanik, S. Trajmar, G. K. James Electron-impact excitation of the 1 2S -*• 2 2S + 2 2P levels of atomic hydrogen at 30, 40, 50, 54.4, and 100 eV. Phys. Rev. A 61, 012701 (2000) e + H Angular Scattering 30.00-100.00 eV e + He Angular Scattering 30.00-100.00 eV e + H Excitation 30.00-100.00 eV e + He Excitation 30.00-100.00 eV

192. A. Dasgupta, M. Blaha, J. L. Giuliani Electron-impact excitation from the ground and the metastable levels of Ar I. Phys. Rev. A 61, 012703 (2000) e + Ar* Excitation 2.00-100.00 eV e + Ar Excitation 2.00-100.00 eV

193. C. M. Maloney, J. L. Peacher, K. Bartschat, D. H. Madison Excitation of Ar 3p5 4s - 3p5 4p transitions by electron impact. Phys. Rev. A 61, 022701 (2000) e + Ar Excitation 470.00 eV

194. D. M. Mitnik, M. S. Pindzola, N. R. Badnell Dielectronic recombination of Pb79+ atomic ions at high spectral resolution. Phys. Rev. A 61, 022705 (2000) e + Pb79+ Recombination 300.00 eV 195. L. E. M Campbell, M. A. Green, M. J. Brunger, P. J. O. Teubner, D. C. Cartwright Determination of differential cross sections for electron-impact excitation of electronic states of molecular oxygen. Phys. Rev. A 61, 022706 (2000)

e + O2 Excitation 6.00-18.00 eV E/T

67 196. I. Iga, M.-T. Lee, M. G. P. Homem, L. E. Machado, L. M. Brescansin Elastic cross sections for e^-CHLj collisions at intermediate energies. Phys. Rev. A 61, 022708 (2000)

e + CH4 Elastic Scattering 1.00-500.00 eV

197. A. A. Sorokin, L. A. Shmaenok, S. V. Bobashev, B. Mobus, M. Richter, G. Ulm Measurements of electron-impact ionization cross sections of argon, krypton, and xenon by comparison with photoionization. Phys. Rev. A 61, 022723 (2000) e + Ar lonization E/T e + Kr Ionization E/T e + Xe Ionization E/T

198. Z. Chen, A. Z. Msezane Generalized oscillator strength for the Na 3s-3p transition. Phys. Rev. A 61, 030703 (2000) e + Na Excitation 10.00-250.00 eV

199. M. Polasek, M. Jurek, M. Ingr, P. Carsky, J. Horacek Discrete momentum representation of the Lippmann-Schwinger equation and its application to electron-molecule scattering. Phys. Rev. A 61, 032701 (2000)

e + H2 Elastic Scattering 1.00-20.00 eV Th

200. R. Rejoub, R. A. Phaneuf Electron-impact single ionization of multiply charged manganese ions. Phys. Rev. A 61, 032706 (2000) e + Mn5+ Ionization 4.00 keV Ex e + Mn6+ Ionization 4.00 keV Ex e + Mn7+ Ionization 4.00 keV Ex e + Mn8+ Ionization 4.00 keV Ex

201. M. Yu. Kuchiev, V. N. Ostrovsky Multiphoton radiative recombination of electron assisted by a laser field. Phys. Rev. A 61, 033414 (2000) e + H Recombination 0.10-10.00 eV Th

202. Y.-K. Kim, W. R. Johnson, M. E. Rudd Cross sections for singly differential and total ionization of helium by electron impact. Phys. Rev. A 61, 034702 (2000) e + He Ionization 10.00 keV Th

203. I. G. Eustatiu, T. Tyliszczak, A. P. Hitchcock, C. C. Turci, A. B. Rocha, C. E. Bielschowsky Experimental and theoretical study of generalized oscillator strengths for C Is and O Is excitations in CO2. Phys. Rev. A 61, 042505 (2000)

e + CO2 Angular Scattering 1.30-2.00 keV E/T e + CO2 Excitation 1.30-2.00 keV E/T

204. D. L. Azevedo, A. J. R. da Silva, M. A. P. Lima Effective configurations in electron-molecule scattering. Phys. Rev. A 61, 042702 (2000)

e + H2 Angular Scattering 10.00 eV Th e + H2 Elastic Scattering 10.00 eV Th

68 205. M. H. F. Bettega Elastic scattering of low-energy electrons by boron trihalides. Phys. Rev. A 61, 042703 (2000)

e + BC1S Total Scattering 5.00-50.00 eV Th e + BBrs Total Scattering 5.00-50.00 eV Th e + BI3 Total Scattering 5.00-50.00 eV Th e + BCI3 Angular Scattering 5.00-50.00 eV Th e + BBr3 Angular Scattering 5.00-50.00 eV Th e + BI3 Angular Scattering 5.00-50.00 eV Th e + BCI3 Elastic Scattering 5.00-50.00 eV Th e + BBr3 Elastic Scattering 5.00-50.00 eV Th e + BI3 Elastic Scattering 5.00-50.00 eV Th

206. S. Pasic, K. Ilakovac Absolute-scale determination of bremsstrahlung following photoabsorption of incident x and gamma rays. Phys. Rev. A 61, 042710 (2000) e + Ge Bremsstrahlung 59.50 keV Ex

207. Y. J. Xu, G. A. Gallup, I. I. Fabrikant Dissociative electron attachment to vibrationally and rotationally excited H2 and HF molecules.

Phys. Rev. A 61, 052705 (2000)

e + H2 Attachment 6.00 eV E/T e + HF Attachment 6.00 eV E/T e + H2 Dissociation 6.00 eV E/T e + HF Dissociation 6.00 eV E/T

208. M. S. Pindzola, F. J. Robicheaux Time-dependent close-coupling calculations for the electron-impact ionization of helium. Phys. Rev. A 61, 052707 (2000) e + He Ionization 25.00-200.00 eV

209. J. E. Chilton, Jr. Stewart, M. D., C. C. Lin Electron-impact excitation cross sections of neon. Phys. Rev. A 61, 052708 (2000) e + Ne Excitation 15.00-250.00 eV

210. M. S. Pindzola, D. M. Mitnik, J. Colgan, D. C. Griffin Electron-impact ionization of Li+. Phys. Rev. A 61, 052712 (2000) e + Li1+ lonization 75.00-500.00 eV

211. S. E. Jones, A. T. Stelbovics Complete numerical solution of electron-hydrogen model collision problem above the ion- ization threshold. Phys. Rev. Lett. 84, 1878 (2000) e + H Recombination 40.80-54.40 eV Th e + H Excitation 40.80-54.40 eV Th e + H Elastic Scattering 40.80-54.40 eV Th

212. G. P. Gupta, N. C. Deb, A. Z. Msezane Electron impact excitation of fine-structure levels in neon-like Krypton (Kr XXVII) using R-matrix method. Phys. Scr. 61, 175 (2000)

69 e + Kr26+ Excitation 0.60-2.20 keV Th

213. M. F. Gadi, A. Makhoute, M. H. Cherkani Electron-impact ionisation of Ne8+. Phys. Scr. 61, 437 (2000) e + Ne8+ Ionization 0.30-7.00 keV Th

214. K. Nuroh Dynamic effects in electron scattering in the 3d-subshell of Lanthanum. Phys. Scr. 61, 589 (2000) e + La Ionization 100.00-600.00 eV e + La Excitation 100.00-600.00 eV

215. U. Roy, K. Roy, N. C. Sil Threshold limit of electron and positron impact ionization of hydrogen atom in the effective charge model. Phys. Scr. 62, 310 (2000) e + H Ionization 13.50-13.70 eV Th

216. A. Jablonski, C. J. Powell Effects of interaction potential on elastic-electron-scattering parameters in surface-sensitive electron spectroscopies. Surf. Sci. 463, 29 (2000) e + Be Angular Scattering 1.00 keV Th e + C Angular Scattering 1.00 keV Th e + Al Angular Scattering 1.00 keV Th e + Cu Angular Scattering 1.00 keV Th e + Ag Angular Scattering 1.00 keV Th e + Au Angular Scattering 1.00 keV Th e + Be Elastic Scattering 1.00 keV Th e + C Elastic Scattering 1.00 keV Th e + Al Elastic Scattering 1.00 keV Th e + Cu Elastic Scattering 1.00 keV Th e + Ag Elastic Scattering 1.00 keV Th e + Au Elastic Scattering 1.00 keV Th

3.2.3 Heavy Particle Collisions

217. E. Roueff, C. J. Zeippen Rotational excitation of HD molecules by He atoms. Astron. Astrophys. 343, 1005 (1999) He + HD Excitation 0.30-1.00 K Th

218. R. S. I. Ryans, V. J. Foster-Woods, F. P. Keenan, R. H. G. Reid Cross sections and rate coefficients for excitation of the ls'22s22p2 3Pj -» Is22s22p2 3P.,-, fine- structure transitions in carbon-like ions by heavy particle impact. At. Data Nucl. Data Tables 73, 1 (1999) H1+ + N1+ Excitation 0.00-70.00 keV Th H1+ + O2+ Excitation 0.00-70.00 keV Th H1+ + Ne3+ Excitation 0.00-70.00 keV Th H1+ + Mg6+ Excitation 0.00-70.00 keV Th H1+ + Si8+ Excitation 0.00-70.00 keV Th H1+ + Ar12+ Excitation 0.00-70.00 keV Th H1+ + Ca14+ Excitation 0.00-70.00 keV Th

70 Ti16+ Excitation 0.00-70.00 keV Th Cr18+ Excitation 0.00-70.00 keV Th Fe20+ Excitation 0.00-70.00 keV Th Ni22+ Excitation 0.00-70.00 keV Th Excitation 0.00-70.00 keV Th O2+ Excitation 0.00-70.00 keV Th Excitation 0.00-70.00 keV Th Mg6+ Excitation 0.00-70.00 keV Th Si8+ Excitation 0.00-70.00 keV Th Ari2+ Excitation 0.00-70.00 keV Th Ca14+ Excitation 0.00-70.00 keV Th

Ti16+ Excitation 0.00-70.00 keV Th

Cr18+ Excitation 0.00-70.00 keV Th Fe20+ Excitation 0.00-70.00 keV Th Nj22+ Excitation 0.00-70.00 keV Th Excitation 0.00-70.00 keV Th Excitation 0.00-70.00 keV Th Ne3+ Excitation 0.00-70.00 keV Th Mg6+ Excitation 0.00-70.00 keV Th Si8+ Excitation 0.00-70.00 keV Th Excitation 0.00-70.00 keV Th Ca14+ Excitation 0.00-70.00 keV Th Ti16+ Excitation 0.00-70.00 keV Th Cr18+ Excitation 0.00-70.00 keV Th Fe20+ Excitation 0.00-70.00 keV Th Ni22+ Excitation 0.00-70.00 keV Th He2+ Excitation 0.00-70.00 keV Th He2+ O2+ Excitation 0.00-70.00 keV Th He2+ Ne3+ Excitation 0.00-70.00 keV Th He2+ Mg6+ Excitation 0.00-70.00 keV Th He2+ Si8+ Excitation 0.00-70.00 keV Th He2+ Ar12+ Excitation 0.00-70.00 keV Th He2+ Ca14+ Excitation 0.00-70.00 keV Th He2+ Ti16+ Excitation 0.00-70.00 keV Th He2+ Cr18+ Excitation 0.00-70.00 keV Th He2+ Fe20+ Excitation 0.00-70.00 keV Th He2+ Ni22+ Excitation 0.00-70.00 keV Th

219. V. H. S Kwong, D. Chen, Z. Fang Dissociative charge-transfer between ground-state He+ and CO at electron-volt energies. Astrophys. J., Part 1 536, 954 (2000) He1+ + CO Dissociation 1.00-10.00 MeV Ex

220. T. Amano, K. Akao, H. Oka, O. Unno x Pressure broadening of O2 in the a Afl state. Chem. Phys. Lett. 31, 433 (1999) 1+ O2 + O2 Line Broadening 290.00 K

221. M. J. Jamieson Adiabatically corrected scattering lengths and effective ranges for collisions of helium atoms.

Chem. Phys. Lett. 310, 222 (1999) He + He Elastic Scattering Th

222. F. J. Aoiz, L. Banares, V. J. Herrero A theoretical study of the dynamics of the O(XD) + HD reaction. Chem. Phys. Lett. 310, 277 (1999)

71 O + HD Interchange reaction 0.20 eV Th O* + HD Interchange reaction 0.20 eV Th

223. M. Baer Strong isotope effects in the F-HD reactions at the low-energy interval: a quantum-mechanical study. Chem. Phys. Lett. 312, 203 (1999) F + HD Interchange reaction 0.02-0.06 eV Th

224. V. A. Zenevich, G. D. Billing, G. Jolicard Vibrational-rotational energy transfer in H2-H2 collisions: II. The relative roles of the initial rotational excitation of both diatoms. Chem. Phys. Lett. 312, 530 (1999)

H2 + H2 Energy Transfer 0.05-3.00 K Th 225. D. Sokolovski, J. F. Castillo, C. Tully Semiclassical angular scattering in the F-|-H2 —> HF+H reaction: Regge pole analysis using the Pade approximation. Chem. Phys. Lett. 313, 225 (1999)

F + H2 Interchange reaction 0.40 eV Th

226. U. Manthe, W. Bian, H.-J. Werner Quantum-mechanical calculation of the thermal rate constant for the H2+CI —> H+HC1 reaction. Chem. Phys. Lett. 313, 647 (1999)

H2 + Cl Interchange reaction 255.00-620.00 K

227. M. Rode, J. Sadlej, R. Moszynski, P. E. S Wormer, A. van der Avoird The importance of high-order correlation effects for the CO-CO interaction potential. Chem. Phys. Lett. 314, 326 (1999) CO + CO Interaction Potentials Th

228. Ch. Ottinger, M. Brozis, A. Kowalski 4 3 3 Hot-atom chemiluminescence: a beam study of the reaction N( S)+H2 —» NH(A II)+H. Chem. Phys. Lett. 315, 355 (1999)

N + H2 Fluorescence 2.50-46.00 eV Ex N + H2 Interchange reaction 2.50-46.00 eV Ex

229. K. Ohmori, T. Kurosawa, H. Chiba, M. Okunishi, Y. Sato, A. Z. Devdariani, E. E. Nikitin Far-wing excitation study on the transition regions of the metastable mercury atom colli- 3 sions: Hg(6 P2) + N2 and CO. Chem. Phys. Lett. 315, 411 (1999) Hg + CO Line Broadening 333.00 K Hg* + CO Line Broadening 333.00 K Hg + N2 Line Broadening 333.00 K Hg* + N2 Line Broadening 333.00 K

230. B. Jin, H. L. Schraider, D. Wardlaw Potential energy surfaces for the collinear H3+ system. Chem. Phys. Lett. 317, 464 (1999) 1+ H + H2 Interaction Potentials Th 1+ H + H2 Interaction Potentials Th

231. S.-H. Lee, K. Liu 1 Erratum to: "Isotope effects and excitation functions for the reactions of S( D)+H2, D2 and HD [Chem. Phys. Lett. 290 (1998) 323]." Chem. Phys. Lett. 317, 516 (1999)

72 S + H2 Interchange reaction Th S + D2 Interchange reaction Th

232. J. B. Nee, C. T. Kuo, H. C. Tseng, S. Y. Wang Potential energy curves of Xej derived from the pressure-dependent fluorescence excitation spectra of the 1st and 2nd continuum. Chem. Phys. Lett. 318, 402 (1999) Xe 4- Xe Line Broadening Ex Xe + Xe Interaction Potentials Ex Xe* + Xe Line Broadening Ex Xe* + Xe Interaction Potentials Ex

233. V. Aquilanti, G. Capecchi, S. Cavalli, D. De Fazio, P. Palmieri, C. Puzzarini, A. Aguilar, X. Gimenez, J. M. Lucas The He + H2"1" reaction: a dynamical test on potential energy surfaces for a system exhibiting a pronounced resonance pattern. Chem. Phys. Lett. 318, 619 (1999) 1+ H2 + He Interchange reaction 0.95-1.15 eV Th 234. D. B. Milligan, M. J. McEwan Hs+ -}- O: an experimental study. Chem. Phys. Lett. 319, 482 (1999) 1+ H3 + O Interchange reaction 295.00 K 235. J. V. Michael, S. S. Kumaran, M.-C. Su, K. P. Lim Thermal rate constants over thirty orders of magnitude for the I+H2 reaction. Chem. Phys. Lett. 319, 99 (1999)

I + H2 Interchange reaction 1.75-2.60 K Ex 236. A. H. H. Chang, S. H. Lin 1 A theoretical study of the reactions of S( D)+H2, HD, D2. Chem. Phys. Lett. 320, 161 (2000) S + H2 Interchange reaction Th S + HD Interchange reaction Th S + D2 Interchange reaction Th

237. R. S. Zhu, R. Q. Zhang, K. S. Chan Carbon nitride formation in gas-phase reactions of CH4, NH3 and H2: an ab initio study. Chem. Phys. Lett. 320, 561 (2000) H + CH4 Interchange reaction Th 238. T. Takayanagi, Y. Kurosaki, K. Yokoyama 4 2 2 Ab initio molecular orbital calculations of potential energy surfaces for the N( S, D, P)+H2 reactions. Chem. Phys. Lett. 321, 106 (2000) N* + H2 Interaction Potentials Th N + H2 Interaction Potentials Th N* + H2 Interchange reaction Th N + H2 Interchange reaction Th 239. A. E. Martinez, D. Grimbert, F. Aguillon + Calculations of quantum cross-sections for dissociative charge transfer in the He -f-H2 col- lision in the 10-50 eV center of mass energy range. Chem. Phys. Lett. 322, 103 (2000) 1+ He + H2 Dissociation 10.00-50.00 eV Th 1+ He + H2 Charge Transfer 10.00-50.00 eV Th

73 240. H. Su, W. Mao, F. Kong 3 1 1 Reactions of CH2(X Bi) and CH2(a A ) with O2 studied by time-resolved FTIR spec- troscopy. Chem. Phys. Lett. 322, 21 (2000)

CH2 + O2 Interchange reaction 300.00 K

241. M. A. Blitz, M. Pesa, M. J. Pilling, P. W. Seakins Vibrational relaxation of the CH(D)(X2II, v=l,2) radical by helium and argon: evidence for a curve crossing mechanism. Chem. Phys. Lett. 322, 280 (2000) CH + He De-excitation 295.00-383.00 K CH + Ar De-excitation 295.00-383.00 K CD + He De-excitation 295.00-383.00 K CD + Ar De-excitation 295.00-383.00 K

242. U. Kleinekathofer Ground state potentials for alkaline-earth-helium diatoms calculated by the surface integral method. Chem. Phys. Lett. 324, 403 (2000) He + Be Interaction Potentials Th He + Mg Interaction Potentials Th He + Ca Interaction Potentials Th He + Sr Interaction Potentials Th He + Ba Interaction Potentials Th

243. A. Lagana, A. Bolloni, S. Crocchianti, G. A. Parker On the effect of increasing the total angular momentum on Li-HF reactivity. Chem. Phys. Lett. 324, 466 (2000) Li + HF Interchange reaction 0.40 eV Th

244. D.-Y. Hwang, A. M. Mebel Theoretical study on reforming of CO2 catalyzed with Be. Chem. Phys. Lett. 325, 639 (2000)

Be + CO2 Interaction Potentials Th

245. R. Maruyama, H. Tanaka, Y. Yamakita, F. Misaizu, K. Ohno Penning ionization electron spectroscopy of CO2 clusters in collision with metastable rare gas atoms. Chem. Phys. Lett. 327, 104 (2000)

He + CO2 Ionization 245.00 K He* + CO2 Ionization 245.00 K Ne + CO2 Ionization 245.00 K Ne* + CO2 Ionization 245.00 K

246. K. Sohlberg

Mechanism of efficient V-V in collisions of N^ (v > 0) with N2. Chem. Phys. 246, 307 (1999) 1+ N2 + N2 Energy Transfer 0.04-0.10 eV Th

247. S. Magnier, S. Rousseau, A. R. Allouche, G. Hadinger, M. Aubert-Frecon Potential energy curves of 58 states of LiJ. Chem. Phys. 246, 57 (1999) Li1+ + Li Interaction Potentials Th

248. A. E. Thompson, R. G. A. R. Maclagan, P. W. Harland + The ab-initio calculation of the gas phase ion mobility of Na in N2. Chem. Phys. 248, 127 (1999)

74 1+ Na + N2 Interaction Potentials Th 249. K. Sakimoto A semiclassical study of vibrational and rotational transition in He + H2 at suprathermal energies. Chem. Phys. 249, 1 (1999)

He 4- H2 Energy Transfer 3.00-10.00 eV Th 250. Y. Zhang, Z. Tan, H. Zhang, Q. Zhang, J. Z. H. Zhang Time-dependent quantum dynamics study of reactive scattering of the HD+CN system in the potential averaged 5D model. Chem. Phys. 252, 191 (2000) HD + CN Interchange reaction 0.10-0.60 eV Th 251. H. Chevreau, E. Boullant, C. Dezarnaud-Dandine, A. Sevin A theoretical exploratory study of low-energy (1-2 eV) electron catalysis in the CO2 + H2 —> HCOOH gas phase process. Chem. Phys. 254, 99 (2000) CO2 + H2 Association 1.00-2.00 eV Th 252. Y. Zheng, S. Ding Algebraic approach to the potential energy surface for the electronic ground state of ozone. Chem. Phys. 255, 217 (2000) O 4- O2 Interaction Potentials Th 253. S. Zhang, Z. Tan, H. Zhang, Y. Zhang, J. Z. H. Zhang Reactant-product decoupling approach to state-to-state reactive scattering H+DH. Chem. Phys. 255, 397 (2000) H + HD Interchange reaction 0.40-1.40 eV Th

254. F. Esposito, M. Capitelli, C. Gorse Quasi-classical dynamics and vibrational kinetics of N+N2(v) system. Chem. Phys. 257, 193 (2000)

N + N2 Dissociation 0.10-4.50 eV Th N + N2 Energy Transfer 0.10-4.50 eV Th 255. A. Kok, P.A. Zeijlmans van Emmichoven, A. Niehaus State selected reactions of krypton ions with methane. Chem. Phys. 258, 47 (2000) 1+ Kr + CH4 Interchange reaction 0.10-1.00 eV Ex 256. G. D. Roston, M. S. Helmi 3 The interatomic potentials and dipole moments of the excited \u state of Cd-Cd and 1 state of Cd-Ar. Chem. Phys. 258, 55 (2000) Cd + Ar Interaction Potentials Th Cd* 4- Ar Interaction Potentials Th Cd + Cd Interaction Potentials Th Cd* + Cd Interaction Potentials Th

257. H. Umemoto, N. Terada, K. Tanaka, T. Takayanagi, Y. Kurosaki 2 + Production processes of H(D) atoms in the reactions of NO(A £ ) with C2H2, C2H4, H2O, and their isotopic variants. Chem. Phys. 259, 39 (2000)

NO* + H2O Interaction Potentials 300.00 keV NO* + H2O Interchange reaction 300.00 keV

75 258. Y. B. Duan, L. M. Wang, W. J. Qian Non-partial-wave Coulomb-Born theory for the excitation of many-electron atomic ions. II: Numerical description and application. Eur. Phys. J. D 11, 25 (2000) e 4- H Seq Excitation Th H1+ + H Seq Excitation Th

259. 0. Wilhelmi, K.-H. Schartner Proton and electron impact on molecular and atomic oxygen: II. Emission cross-sections for ionisation and excitation of atomic oxygen. Eur. Phys. J. D 11, 45 (2000) e 4- O Excitation 20.00-300.00 keV/amu H1+ + O Excitation 20.00-300.00 keV/amu

260. N. F. Allard, J. F. Kielkopf, I. Drira, P. Schmelcher A collision-induced satellite in the Lyman-/3 profile due to H-H collisions. Eur. Phys. J. D 12, 263 (2000) hi/ 4- H Excitation 10.00 kK Th H1+ 4- H Excitation 10.00 kK Th

261. X. Liu, J. J. Lin, S. A. Harich Quantum state specific dynamics for the O(XD) + HD —> OD + H reaction. J. Chem. Phys. 113, 1325 (2000)

O* + H2 Interchange reaction Ex O 4- H2 Interchange reaction Ex O 4- HD Interchange reaction Ex O* + HD Interchange reaction Ex

262. M. Movre, L. Thiel, W. Meyer Theoretical investigation of the autoionization process in molecular collision complexes: He*(23S) + Li(22S) -> He 4- Li+ + e~. J. Chem. Phys. 113, 1484 (2000) He 4- Li Ionization 100.00 MeV He + Li De-excitation 100.00 MeV He* + Li De-excitation 100.00 MeV

263. S. Zhang, T. N. Truong Direct ab initio dynamics studies of N4-H-2 <-> NH4-H reaction. J. Chem. Phys. 113, 6149 (2000)

N + H2 Interchange reaction 0.40-2.50 K Th

264. N. Balakrishnan, A. Dalgarno Vibrational relaxation of CO by collisions with 4He at ultracold temperatures. J. Chem. Phys. 113, 621 (2000) He 4- CO Energy Transfer 100.00 K

265. M. C. van Beek, J. J. ter Muelen, M. H. Alexander Rotationally inelastic collisions of OH(X2II) 4- Ar. I. State-to-state cross sections. J. Chem. Phys. 113, 628 (2000) Ar + OH Energy Transfer 0.09 eV Ex

266. M. C. van Beek, J. J. ter Muelen Rotationally inelastic collisions of OH(X2II) 4- Ar. II. The effect of molecular orientation. J. Chem. Phys. 113, 637 (2000) Ar 4- OH Energy Transfer 0.09 eV Ex

76 267. B. B. Dhal, L. C. Tribedi, U. Tiwari, P. N. Tandon, T. G. Lee, C. D. Lin, L. Gulyas Strong double K-K transfer channel in near symmetric collisions of Si + Ar at intermediate velocity range. J. Phys. B 33, 1069 (2000) Si8+ + Ar Charge Transfer 0.90-4.00 MeV/amu E/T Si13+ + Ar Charge Transfer 0.90-4.00 MeV/amu E/T Si14+ + Ar Charge Transfer 0.90-4.00 MeV/amu E/T

268. L. Kristensen, T. Bove, B. D. DePaola, T. Ehrenreich, E. Horsdal-Pedersen, O. E. Povlsen Electron capture from elliptic Rydberg states: impact perpendicular to the minor axis. J. Phys. B 33, 1103 (2000) Na1+ + Li Charge Transfer E/T

269. S. Clare, A. J. McCaffery Quasi-resonant vibration-rotation transfer, a collisional pumping mechanism for highly ex- cited molecules. J. Phys. B 33, 1121 (2000)

Li2 + Ne Energy Transfer Th Li2 + Ne De-excitation Th

270. J. E. Blackwood, G. A. Robinson, M. R. H. Rudge The estimation of potential energy curves of diatomic molecules. J. Phys. B 33, 1185 (2000) hv + H Interaction Potentials 13.61-435.40 eV Na + Na Interaction Potentials 13.61-435.40 eV

271. A. B. Voitkiv, M. Gail, N. Grun Impact parameter dependence of projectile-electron excitation and loss in relativistic colli- sions with atomic targets. J. Phys. B 33, 1299 (2000)

Bj82+ + He Ionization 119.00-470.00 MeV/amu Bi82+ + Cu Ionization 119.00-470.00 MeV/amu Bi82+ + He Excitation 119.00-470.00 MeV/amu Bi82+ + Cu Excitation 119.00-470.00 MeV/amu

272. L. F. Errea, A. Macias, L. Mendez, A. Riera Close-coupling treatment of C2+-H collisions. J. Phys. B 33, 1369 (2000) C2+ + H Charge Transfer 0.10-300.00 keV

273. N. C. Bacalis Existence of He2~ negative ions with two remote electrons in antibonding orbitals. J. Phys. B 33, 1415 (2000) He"1 + He Interaction Potentials Th

274. B. Bapat, S. Keller, R. Moshammer, R. Mann, J. Ullrich Double ionization of helium in fast ion collisions: the role of the correlated initial state. J. Phys. B 33, 1437 (2000) C6+ + He Total Scattering 100.00 MeV/amu C6+ + He Ionization 100.00 MeV/amu

275. S. Keller, B. Bapat, R. Moshammer, J. Ullrich, R. M. Dreizler Double ionization of helium in fast ion collisions: comparative study of model wavefunc- tions. J. Phys. B 33, 1447 (2000)

77 C6+ + He Total Scattering 100.00 MeV/amu C6+ + He Ionization 100.00 MeV/amu

276. I. I. Fabrikant, V. S. Lebedev Quenching of Ftydberg states by atoms with small electron affinities. J. Phys. B 33, 1521 (2000) Ca + Ne Line Broadening 0.00-272.00 eV Ca + Na Line Broadening 0.00-272.00 eV

277. A. B. Voitkiv, N. Grun, W. Scheid Theoretical investigation of B~ neutralization in energetic collisions with charged bare pro- jectiles. J. Phys. B 33, 1533 (2000) perturbation + B"1 Detachment 10.00-200.00 eV perturbation + B"1 Ionization 10.00-200.00 eV

278. M. J. Roberts The half-on-shell Coulomb T-matrix in a double-scattering approximation to the ionization of helium by fast protons. J. Phys. B 33, 169 (2000) H1+ + He Ionization 1.50 MeV Th 279. T. Leininger, F. X. Gadea, A. S. Dickinson Broadening of the sodium 568.8, 589, 615.4 and 819.4 nm lines by atomic hydrogen. J. Phys. B 33, 1805 (2000) H + Na Line Broadening 0.30-10.00 K Th 280. H. Martinez, A. Amaya-Tapia, J. M. Hernandez Single electron loss of Kr+ ions in gaseous media. J. Phys. B 33, 1935 (2000) 1+ Kr + He Total Scattering 1.00-5.00 keV Ex Kr1+ + Ne Total Scattering 1.00-5.00 keV Ex Kr1+ + Ar Total Scattering 1.00-5.00 keV Ex Kr1+ + Xe Total Scattering 1.00-5.00 keV Ex Kr1+ + He Ionization 1.00-5.00 keV Ex Kr1+ + Ne Ionization 1.00-5.00 keV Ex Kr1+ + Ar Ionization 1.00-5.00 keV Ex Kr1+ + Xe Ionization 1.00-5.00 keV Ex

281. K. R. Cornelius, K. Wojtkowski, R. E. Olson State-selective cross section scalings for electron capture collisions. J. Phys. B 33, 2017 (2000) He2+ + H Charge Transfer 1.00-100.00 keV/amu He2+ + Li Charge Transfer 1.00-100.00 keV/amu Li3+ + H Charge Transfer 1.00-100.00 keV/amu Li3+ + Li Charge Transfer 1.00-100.00 keV/amu Be4+ + H Charge Transfer 1.00-100.00 keV/amu Be4+ + Li Charge Transfer 1.00-100.00 keV/amu B5+ + H Charge Transfer 1.00-100.00 keV/amu B5+ + Li Charge Transfer 1.00-100.00 keV/amu C6+ + H Charge Transfer 1.00-100.00 keV/amu C6+ + Li Charge Transfer 1.00-100.00 keV/amu N7+ + H Charge Transfer 1.00-100.00 keV/amu N7++ Li Charge Transfer 1.00-100.00 keV/amu O8++H Charge Transfer 1.00-100.00 keV/amu O8+ + Li Charge Transfer 1.00-100.00 keV/amu

78 F9+ + H Charge Transfer 1.00-100.00 keV/amu F9+ + Li Charge Transfer 1.00-100.00 keV/amu Nelo+ + H Charge Transfer 1.00-100.00 keV/amu Ne10+ + Li Charge Transfer 1.00-100.00 keV/amu

282. D. Elizaga, L. F. Errea, J. D. Gorfinkiel, L. Mendez, A. Macias, A. G. Riera, A. Rojas + + Ab initio study of collisions between Li or H ions and H2 (D2, DT, T2) molecules. J. Phys. B 33, 2037 (2000) 1+ H + H2 Charge Transfer 0.05-6.25 keV/amu E/T 1+ Li + H2 Charge Transfer 0.05-6.25 keV/amu E/T

283. J. T. Shepherd, A. S. Dickinson Cross sections for symmetric resonance charge transfer in one-electron ion-ion collisions. J. Phys. B 33, 2219 (2000) He1+ + He2+ Total Scattering 0.01-10.00 keV Th Li2+ + Li3+ Total Scattering 0.01-10.00 keV Th Be3+ + Be4+ Total Scattering 0.01-10.00 keV Th B4+ + B5+ Total Scattering 0.01-10.00 keV Th He1+ + He2+ Ionization 0.01-10.00 keV Th Li2+ + Li3+ Ionization 0.01-10.00 keV Th Be3+ + Be4+ Ionization 0.01-10.00 keV Th B4+ + B5+ Ionization 0.01-10.00 keV Th He1+ + He'2+ Charge Transfer 0.01-10.00 keV Th Li2+ + Li3+ Charge Transfer 0.01-10.00 keV Th Be3+ + Be4+ Charge Transfer 0.01-10.00 keV Th B4+ + B5+ Charge Transfer 0.01-10.00 keV Th

284. A. R. Allouche, M. Korek, K. Fakherddin, A. Chaalan, M. Dagher, F. Taher, M. Aubert-Frecon Theoretical electronic structure of RbCs revisited. J. Phys. B 33, 2307 (2000) Rb + Cs Interaction Potentials Th

285. J.-G. Wang, J. P. Hansen, A. Dubois Neutralization and charge transfer in H+-H~ and H-H collisions. J. Phys. B 33, 241 (2000) hv + H Recombination 1.00-30.00 keV Th H1+ + H-1 Recombination 1.00-30.00 keV Th hi/ + H Charge Transfer 1.00-30.00 keV Th H1+ + ET1 Charge Transfer 1.00-30.00 keV Th

286. M. M. Sant'Anna, W. S. Melo, A. C. F. Santos, M. B. Shah, G. M. Sigaud, E. C. Montenegro Absolute measurements of electron capture cross sections of C3+ from atomic and molecular hydrogen. J. Phys. B 33, 353 (2000) C3+ + H Charge Transfer 1.00-3.00 MeV E/T 3+ C + H2 Charge Transfer 1.00-3.00 MeV E/T

287. A. Hedqvist, M. O'Mullane, J. Nordquist, E. Rachlew-Kallne, K.-D. Zastrow Contributions of thermal charge exchange excitation to the Rydberg series of Cl16+. J. Phys. B 33, 375 (2000) C116++H Charge Transfer 0.10-5.00 keV Ex

288. B. S. Nesbitt, M. B. Shah, F. S. C. O'Rourke, J. Geddes, D. S. F. Crothers Local saddles and local maxima in double differential cross sections of single ionization in ion-atom collisions. J. Phys. B 33, 637 (2000)

79 J H + + H2 Total Scattering 40.00 keV E/T H1+ + He Total Scattering 40.00 keV E/T 1+ H + H2 Ionization 40.00 keV E/T H1+ + He Ionization 40.00 keV E/T

289. T. Leininger, F. X. Gadea Ab initio calculations for electron attachment to J. Phys. B 33, 735 (2000) Cl + Cl"1 Interaction Potentials Th Cl + Cl Interaction Potentials Th Cl1+ + Cl Interaction Potentials Th

290. L. Sarkadi, K. Tokesi, R. 0. Barrachina Electron capture to the continuum induced by dipolar interaction. J. Phys. B 33, 847 (2000) h.v + H Ionization 25.00 keV Th

291. F. Sattin A semiclassical over-barrier model for charge exchange between highly charged ions and one-optical-electron atoms. J. Phys. B 33, 861 (2000) He2+ + H Charge Transfer E/T O8+ + H Charge Transfer E/T I6+ + Cs Charge Transfer E/T I7+ + Cs Charge Transfer E/T I8+ + Cs Charge Transfer E/T I9+ + Cs Charge Transfer E/T I10+ + Cs Charge Transfer E/T I11+ + Cs Charge Transfer E/T I12+ + Cs Charge Transfer E/T I13+ + Cs Charge Transfer E/T I14+ + Cs Charge Transfer E/T I15+ + Cs Charge Transfer E/T I16+ + Cs Charge Transfer E/T I17+ + Cs Charge Transfer E/T I18+ + Cs Charge Transfer E/T I19+ + Cs Charge Transfer E/T I20+ + Cs Charge Transfer E/T I21+ + Cs Charge Transfer E/T I22+ + Cs Charge Transfer E/T I23+ + Cs Charge Transfer E/T I24+ + Cs Charge Transfer E/T I25+ + Cs Charge Transfer E/T I26+ + Cs Charge Transfer E/T I27+ + Cs Charge Transfer E/T I28+ + Cs Charge Transfer E/T I29+ + Cs Charge Transfer E/T I30+ + Cs Charge Transfer E/T

292. M. C. Bacchus-Montabonel, D. Talbi, M. Persico Quantum chemical determination of the rate coefficients for radiative association of CH3"1" and H2. J. Phys. B 33, 955 (2000) 1+ CH3 + H2 Association 10.00-100.00 K

80 293. A. L. Godunov, P. B. Ivanov, V. A. Schipakov, P. Moretto-Capelle, D. Bordenave-Montesquieu, A. Bor denave-Montesquieu Excitation of autoionizing states of helium by 100 keV proton impact: II. Excitation cross sections and mechanisms of excitation. J. Phys. B 33, 971 (2000) H1+ + He Ionization 100.00 keV H1+ + He Excitation 100.00 keV

294. M. Tarisien, L. Adoui, F. Fremont, D. Lelievre, L. Guillaume, J.-Y. Chesnel, H. Zhang, A. Dubois, D. Mathur, S. V. K. Kumar, M. Krishnamurthy, A. Cassimi Ion-induced molecular fragmentation: beyond the Coulomb explosion picture. J. Phys. B 33, Lll (2000) O7+ + CO Total Scattering 0.00-11.40 MeV E/T O7+ + CO Ionization 0.00-11.40 MeV E/T O7+ + CO Charge Transfer 0.00-11.40 MeV E/T O7+ + CO Dissociation 0.00-11.40 MeV E/T

295. B. Ueberholz, S. Kuhr, D. Frese, D. Meschede, V. Gomer Counting cold collisions. J. Phys. B 33, L135 (2000) Cs + Cs De-excitation 1.00 K Ex Cs 4- Cs Association 1.00 K Ex

296. E. Y. Kamber, M. A. Abdallah, C. L. Cocke, M. Stockli, J. Wang, J. P. Hansen Experimental evidence of transfer excitation in Ar6+-He collisions. J. Phys. B 33, LI 71 (2000) Ar6+ + He Excitation 9.00 keV E/T Ar6+ + He Charge Transfer 9.00 keV E/T

297. D. Voulot, D. R. Gillen, W. R. Thompson, H. B. Gilbody, R. W. McCullough, L. Errea, A. Macias, L. Méndez, A. Riera First studies of state-selective electron capture in collisions of state-prepared ions with atomic hydrogen; the case of C2+ - H(ls). J. Phys. B 33, L187 (2000) C2+ + H Charge Transfer 6.00 keV E/T

298. D. R. Flower Vibrational relaxation of H2 in collisions with rotationally excited H2 molecules. J. Phys. B 33, L193 (2000)

H2 + H2 De-excitation 6.00-12.00 kK Th H2 + H2 Energy Transfer 6.00-12.00 kK Th

299. A. Dubois, S. E. Nielsen, J. P. Hansen, J. Wang Left-right capture asymmetry in He2+-Na(3p_i) collisions: classical versus quantal collision dynamics. J. Phys. B 33, L197 (2000) He2+ + Na Total Scattering 12.20-32.90 eV Th He2+ + Na Charge Transfer 12.20-32.90 eV Th

300. F. Fremont, C. Bedouet, M. Tarisien, L. Adoui, A. Cassimi, A. Dubois, J.-Y. Chesnel, X. Husson 2+ 23+ 5+ Fragmentation of H2 ions following double electron capture in slow Xe and O + H2 collisions. J. Phys. B 33, L249 (2000)

81 5+ O + H2 Total Scattering 75.00-345.00 keV 23+ Xe + H2 Total Scattering 75.00-345.00 keV 5+ O + H2 Energy Transfer 75.00-345.00 keV 23+ Xe + H2 Energy Transfer 75.00-345.00 keV 5 O + + H2 Dissociation 75.00-345.00 keV 23+ Xe + H2 Dissociation 75.00-345.00 keV 5+ O + H2 Charge Transfer 75.00-345.00 keV 23+ Xe + H2 Charge Transfer 75.00-345.00 keV

301. D. Bodea, L. Nagy Double excitation of the hydrogen molecule by fast charged particle impact. J. Phys. B 33, L27 (2000) 1+ H + H2 Total Scattering 0.30-10.00 MeV Th 1+ H + H2 Excitation 0.30-10.00 MeV Th

302. B. A. Huber Hollow ion formation studied by electron spectroscopy of 18O8+ - C@o at 4.4 keV/amu. J. Phys. B 33, L357 (2000) 8+ O + C60 Dissociation 80.00 keV Ex 8+ O + C60 Ionization 80.00 keV Ex

303. F. D. Colavecchia, G. Gasaneo, C. R. Garibotti Electron-ion correlation effects in ion-atom single ionization. J. Phys. B 33, L467 (2000) H1+ + He Total Scattering 0.11-2.50 MeV/amu Th C6++ He Total Scattering 0.11-2.50 MeV/amu Th H1+ + He Ionization 0.11-2.50 MeV/amu Th C6++ He Ionization 0.11-2.50 MeV/amu Th

304. H. Weick, H. Geissel, C. Scheidenberger, F. Attallah, T. Baumann, D. Cortina, M. Hausmann, B. Lommel, G. Munzenberg, N. Nankov, F. Nickel, T. Radon, H. Schatz, K.-H. Schmidt, J. Stadlmann, K. Summerer, M. Winkler, H. Wollnik Slowing down of relativistic few-electron heavy ions. Nucl. Instrum. Methods Phys. Res. B 164/165, 168 (2000) Bi81+ + C Fluorescence 0.10-1.00 GeV/amu Th Bi81+ + Al Fluorescence 0.10-1.00 GeV/amu Th Bi81+ + Cu Fluorescence 0.10-1.00 GeV/amu Th Bi81+ + Ag Fluorescence 0.10-1.00 GeV/amu Th Bi81+ + Au Fluorescence 0.10-1.00 GeV/amu Th Bi82+ + c Fluorescence 0.10-1.00 GeV/amu Th Bi82+ + Al Fluorescence 0.10-1.00 GeV/amu Th Bi82+ + Cu Fluorescence 0.10-1.00 GeV/amu Th Bi82+ + Ag Fluorescence 0.10-1.00 GeV/amu Th Bi82+ + Au Fluorescence 0.10-1.00 GeV/amu Th Bi83+ + c Fluorescence 0.10-1.00 GeV/amu Th Bi83+ + Al Fluorescence 0.10-1.00 GeV/amu Th Bi83+ + Cu Fluorescence 0.10-1.00 GeV/amu Th Bi83+ + Ag Fluorescence 0.10-1.00 GeV/amu Th Bj83+ + Au Fluorescence 0.10-1.00 GeV/amu Th Bi81+ + C Ionization 0.10-1.00 GeV/amu Th Bi81+ + Al Ionization 0.10-1.00 GeV/amu Th Bi81+ + Cu Ionization 0.10-1.00 GeV/amu Th Bi81+ + Ag Ionization 0.10-1.00 GeV/amu Th Bi81+ + Au Ionization 0.10-1.00 GeV/amu Th Bi82+ + C Ionization 0.10-1.00 GeV/amu Th Bi82+ + Al Ionization 0.10-1.00 GeV/amu Th

82 Bi82+ + Cu Ionization 0.10-1.00 GeV/amu Th Bi82+ + Ag Ionization 0.10-1.00 GeV/amu Th Bi82+ + Au Ionization 0.10-1.00 GeV/amu Th Bj83+ + c Ionization 0.10-1.00 GeV/amu Th Bi83+ + A1 Ionization 0.10-1.00 GeV/amu Th Bi83+ + Cu Ionization 0.10-1.00 GeV/amu Th Bi83+ + Ag Ionization 0.10-1.00 GeV/amu Th Bi83+ + Au Ionization 0.10-1.00 GeV/amu Th Bi81+ + C Charge Transfer 0.10-1.00 GeV/amu Th Bi81+ 4 Al Charge Transfer 0.10-1.00 GeV/amu Th Bi81+ + Cu Charge Transfer 0.10-1.00 GeV/amu Th Bi81+ + Ag Charge Transfer 0.10-1.00 GeV/amu Th Bi81+ + Au Charge Transfer 0.10-1.00 GeV/amu Th Bi82+ + C Charge Transfer 0.10-1.00 GeV/amu Th Bi82+ + A1 Charge Transfer 0.10-1.00 GeV/amu Th Bi82+ + Cu Charge Transfer 0.10-1.00 GeV/amu Th Bi82+ + Ag Charge Transfer 0.10-1.00 GeV/amu Th Bi82+ + Au Charge Transfer 0.10-1.00 GeV/amu Th Bi83+ + c Charge Transfer 0.10-1.00 GeV/amu Th Bi83+ + Al Charge Transfer 0.10-1.00 GeV/amu Th Bi83+ + Cu Charge Transfer 0.10-1.00 GeV/amu Th Bi83+ + Ag Charge Transfer 0.10-1.00 GeV/amu Th Bi83+ + Au Charge Transfer 0.10-1.00 GeV/amu Th

305. H. Ogawa, N. Sakamoto, H. Tsuchida Electron loss and capture cross-sections of 1.0-3.5 MeV H° and H+ in carbon foils. Nucl. Instrum. Methods Phys. Res. B 164/165, 279 (2000) H1+ + C Ionization 1.00-3.50 MeV Ex H1+ + C Charge Transfer 1.00-3.50 MeV Ex

306. D. Banas, J. Braziewicz, A. Kubala-Kukus, U. Majewska, M. Pajek, J. Semaniak, T. Czyzewski, M. Jaskola, W. Kretschmer, T. Mukoyama Solid state effects in L-O X-ray transitions induced by O, Si and S ions in heavy metals. Nucl. Instrum. Methods Phys. Res. B 164/165, 344 (2000) O3+ + Os Ionization 0.40-2.00 MeV/amu E/T O3+ + Au Ionization 0.40-2.00 MeV/amu E/T O3+ 4 Th Ionization 0.40-2.00 MeV/amu E/T O3+ + U Ionization 0.40-2.00 MeV/amu E/T O3+ + Bi lonization 0.40-2.00 MeV/amu E/T Si4+ 4 Os Ionization 0.40-2.00 MeV/amu E/T Si4+ + Au Ionization 0.40-2.00 MeV/amu E/T Si4+ + Th Ionization 0.40-2.00 MeV/amu E/T Si4+ + U Ionization 0.40-2.00 MeV/amu E/T Si4+ 4- Bi Ionization 0.40-2.00 MeV/amu E/T S6+ + Os Ionization 0.40-2.00 MeV/amu E/T S6+ + Au Ionization 0.40-2.00 MeV/amu E/T S6+ + Th lonization 0.40-2.00 MeV/amu E/T S6+ 4- U Ionization 0.40-2.00 MeV/amu E/T S6+ + Bi Ionization 0.40-2.00 MeV/amu E/T

307. C. M. Romo-Kroger An empirical curve describing the ionization cross-sections in atomic collisions involving heavy ions. Nucl. Instrum. Methods Phys. Res. B 164/165, 349 (2000) H1+ 4- Al Ionization 0.01-10.00 MeV Th H1+ 4- Fe Ionization 0.01-10.00 MeV Th

83 1+ H + Zr Ionization 0.01-10.00 MeV Th C1+ + Ca Ionization 0.01-10.00 MeV Th C1+ + Sc Ionization 0.01-10.00 MeV Th C1+ + Ti Ionization 0.01-10.00 MeV Th C1+ + V Ionization 0.01-10.00 MeV Th C1+ + Cr Ionization 0.01-10.00 MeV Th C1+ + Fe Ionization 0.01-10.00 MeV Th C1+ + Cu Ionization 0.01-10.00 MeV Th N1+ + Ca Ionization 0.01-10.00 MeV Th N1+ + Sc lonization 0.01-10.00 MeV Th N1+ + Ti Ionization 0.01-10.00 MeV Th N1+ + V Ionization 0.01-10.00 MeV Th N1+ + Cr Ionization 0.01-10.00 MeV Th N1+ + Fe Ionization 0.01-10.00 MeV Th N1+ 4- Cu Ionization 0.01-10.00 MeV Th 308. J. L. Campbell, T. L. Hopman, J. A. Maxwell, Z. Nejedly The Guelph PIXE software package III: Alternative proton database. Nucl. Instrum. Methods Phys. Res. B 170, 193 (2000) H1+ + perturbation Excitation 3.50 MeV Th H1+ + perturbation Ionization 3.50 MeV Th 309. V. Horvat, R. L. Watson, J. M. Blackadar Target-atom inner-shell vacancy distributions created in collisions with heavy ion projec- tiles. Nucl. Instrum. Methods Phys. Res. B 170, 336 (2000) perturbation14" 4- Cu Excitation 10.00 MeV/amu Th perturbation1+ 4- Cu Ionization 10.00 MeV/amu Th 310. M. Kiisk, P. Persson, R. Hellborg, Z. Smit, B. Erlandsson, M. Faarinen, G. Skog, K. Stenstrom Characteristic X-ray production in heavy ion collisions. Nucl. Instrum. Methods Phys. Res. B 172, 182 (2000) Ni1+ + Ti Ionization 15.00-25.00 MeV Ex Ni1+ + Ti lonization 15.00-25.00 MeV Ex Ni1+ 4- Cr Ionization 15.00-25.00 MeV Ex Ni1+ 4- Cr Ionization 15.00-25.00 MeV Ex Ni1+ + Fe Ionization 15.00-25.00 MeV Ex Ni1+ 4- Fe lonization 15.00-25.00 MeV Ex Ni1+ 4- Ni Ionization 15.00-25.00 MeV Ex Ni1+ 4- Ni Ionization 15.00-25.00 MeV Ex Ni1+ 4- Cu Ionization 15.00-25.00 MeV Ex Ni1+ + Cu lonization 15.00-25.00 MeV Ex Ni1+ + Zn Ionization 15.00-25.00 MeV Ex Ni1+ + Zn Ionization 15.00-25.00 MeV Ex Ni1+ 4- Ge Ionization 15.00-25.00 MeV Ex Ni1+ 4- Ge Ionization 15.00-25.00 MeV Ex 311. Z. Osvath, L. Nagy Double-differential cross sections for the ionization-excitation of the helium by fast proton and antiproton impact. Phys. Lett. A 271, 385 (2000) H1+ + He Total Scattering 1.00 MeV Th H1+ 4- He Ionization 1.00 MeV Th H1+ + He Excitation 1.00 MeV Th 312. J. P. Shaffer, W. Chalupczak, N. P. Bigelow Ultracold collisions in saturating optical fields: Universal behavior in the entrance channel. Phys. Rev. A 61, 011404 (2000)

84 Na + Na De-excitation Ex Cs + Cs De-excitation Ex

313. K. M. Jones, P. D. Lett, E. Tiesinga, P. S. Julienne Fitting line shapes in photoassociation spectroscopy of ultracold atoms: A useful approxi- mation. Phys. Rev. A 61, 012501 (2000) Na + Na Association 0.50 K Th

314. A. Itoh, H. Tsuchida, T. Majima, S. Anada, A. Yogo, N. Imanishi Multifragmentation of Ceo by fast Li° atoms and Li3+ ions in electron loss and capture collisions. Phys. Rev. A 61, 012702 (2000)

Li + C60 Ionization 2.00 MeV Ex 1+ Li + C60 Ionization 2.00 MeV Ex 2+ Li + C60 Ionization 2.00 MeV Ex Li3+ + Ceo Ionization 2.00 MeV Ex Li + C60 Charge Transfer 2.00 MeV Ex 1+ Li + Ceo Charge Transfer 2.00 MeV Ex 2+ Li + C60 Charge Transfer 2.00 MeV Ex 3+ Li + C60 Charge Transfer 2.00 MeV Ex Li + C60 Dissociation 2.00 MeV Ex 2 Li + + C60 Dissociation 2.00 MeV Ex 2+ Li + C60 Dissociation 2.00 MeV Ex 3+ Li + C60 Dissociation 2.00 MeV Ex

315. T. Kirchner, H. J. Ludde, R. M. Dreizler Effective single-particle description of single and multiple processes in p + Ne collisions. Phys. Rev. A 61, 012705 (2000) H1+ + Ne Ionization 0.00-5.00 MeV Th H1+ + Ne Charge Transfer 0.00-5.00 MeV Th

316. M. J. Jamieson, A. Dalgarno, B. Zygelman, P. S. Krstic, D. R. Schultz Collisions of ground-state hydrogen atoms. Phys. Rev. A 61, 014701 (2000) hv + H Elastic Scattering 0.50-8.00 K Th 317. M. Schulz, R. Moshammer, W. Schmitt, H. Kollmus, R. Mann, S. Magnmann, R. E. Olson, J. Ullrich Correlated three-electron continuum states in triple ionization by fast heavy-ion impact. Phys. Rev. A 61, 022703 (2000) Au53+ + Ne Ionization 3.60 MeV/amu Ex 318. Z. Roller-Lutz, Y. Wang, H. 0. Lutz, S. E. Nielsen, A. Dubois Quantum-mechanically complete study of charge transfer from nonisotropic initial to non- isotropic final states in H+-Na(3p+_j) collisions. Phys. Rev. A 61, 022710 (2000) H1+ + Na Charge Transfer 1.00 keV E/T 319. T. Jalowy, D. H Jakubassa-Amundsen, M. W. Lucas, K. 0. Groenveld Momentum spectroscopy of electrons lost by light projectiles in collisions with neon targets. Phys. Rev. A 61, 022714 (2000) hi/ -1- Ne Ionization 0.10-0.50 MeV/amu Ex hi/ + Ne Ionization 0.10-0.50 MeV/amu Ex H + Ne Ionization 0.10-0.50 MeV/amu Ex H + Ne Ionization 0.10-0.50 MeV/amu Ex D + Ne Ionization 0.10-0.50 MeV/amu Ex

85 D + Ne Ionization 0.10-0.50 MeV/amu Ex 1+ D2 + Ne Ionization 0.10-0.50 MeV/amu Ex 1+ D2 + Ne Ionization 0.10-0.50 MeV/amu Ex He + Ne Ionization 0.10-0.50 MeV/amu Ex He + Ne Ionization 0.10-0.50 MeV/amu Ex He1+ + Ne Ionization 0.10-0.50 MeV/amu Ex He1+ + Ne Ionization 0.10-0.50 MeV/amu Ex

320. I. I. Fabrikant, M. I. Chibisov Close-coupling calculations of Ca" formation by charge transfer from Rydberg atoms. Phys. Rev. A 61, 022718 (2000) Ca + Ne Charge Transfer 0.06-0.25 eV Th

321. L. Feng, Y.-K. Ho Quantum simulation of collinear p + H collisions in an intense laser field. Phys. Rev. A 61, 023407 (2000) H1+ + H Ionization 2.72 eV Th 322. E. Engel, A. Hock, R. M. Dreizler van der Waals bonds in density-functional theory. Phys. Rev. A 61, 032502 (2000) He + He Interaction Potentials Th Ne + Ne Interaction Potentials Th

323. S. A. Hopkins, S. Webster, J. Arlt, P. Bance, S. Cornish, 0. Marago, C. J. Foot Measurement of elastic cross section for cold cesium collisions. Phys. Rev. A 61, 032707 (2000) Cs + Cs Elastic Scattering Ex

324. M. Kimura, J.-P. Gu, G. Hirsch, R. J. Buenker, P. C. Stancil Electron capture in collisions of protons with CO molecules in the keV region: The steric effect. Phys. Rev. A 61, 032708 (2000) H1++ CO Elastic Scattering 0.10-20.00 keV/amu Th H1+ + CO Charge Transfer 0.10-20.00 keV/amu Th

325. B. C. Saha, A. Kumar Quenching of Li low-n Rydberg atoms by ground-state He atoms: A low-energy molecular- state calculation. Phys. Rev. A 61, 032709 (2000) Li* + He De-excitation Th Li 4- He De-excitation Th

326. R. Cabrera-Trujillo, J. R. Sabin, Y. Ohm, E. Deumens Direct differential-cross-section calculations for ion-atom and atom-atom collisions in the keV range. Phys. Rev. A 61, 032719 (2000) H + He Elastic Scattering 0.50-5.00 keV Th H + Ne Elastic Scattering 0.50-5.00 keV Th H1+ + He Elastic Scattering 0.50-5.00 keV Th H1+ + Ne Elastic Scattering 0.50-5.00 keV Th He + He Elastic Scattering 0.50-5.00 keV Th He + Ne Elastic Scattering 0.50-5.00 keV Th

86 327. S. Ito, M. Tosaki, N. Maeda Observation of satellite structures for Tb L 7 x-ray emission in the presence of M- and N-shell multiple vacancies. Phys. Rev. A 61, 032720 (2000) H1+ + Tb Excitation 6.00-30.00 MeV Ex C4+ + Tb Excitation 6.00-30.00 MeV Ex H1+ + Tb Ionization 6.00-30.00 MeV Ex C4+ + Tb Ionization 6.00-30.00 MeV Ex H1+ + Tb Fluorescence 6.00-30.00 MeV Ex C4+ + Tb Fluorescence 6.00-30.00 MeV Ex

328. L. Plagne, J. Daligault, K. Yabana, T. Tazawa, Y. Abe, C. Guet Semiclassical versus quantal time-dependent mean-field descriptions of electron dynamics in ion-cluster collisions. Phys. Rev. A 61, 033201 (2000) Ar8+ + Na4o Ionization 80.00-320.00 keV Th 8+ Ar + Na40 Charge Transfer 80.00-320.00 keV Th 8+ Ar + Na40 Excitation 80.00-320.00 keV Th

329. H. C. Tseng, C. D. Lin Total and state-selective electron capture cross sections for B4+ + H collisions. Phys. Rev. A 61, 034701 (2000) B4+ + H Charge Transfer 0.06-10.00 keV Th

330. J. L. Bohn Molecular spin relaxation in cold atom-molecule scattering. Phys. Rev. A 61, 040702 (2000)

He + O2 De-excitation 0-10-10.00 K Th He + O2 Elastic Scattering 0.10-10.00 K Th

331. A. J. Baltz Exact Dirac-equation calculation of ionization induced by ultrarelativistic heavy ions. Phys. Rev. A 61, 042701 (2000) hz/ + H Ionization Th hi/ + Ne Ionization Th hv + Ca Ionization Th hi/ + Zr Ionization Th hv + Pb Ionization Th Ne + Ne Ionization Th Ca + Ca Ionization Th Zr + Zr Ionization Th Pb + Ne Ionization Th Pb + Ca Ionization Th Pb + Zr Ionization Th Pb + Pb Ionization Th

332. M. J. Jamieson, A. Dalgarno, L. Wolniewicz Calculation of properties of two-center systems. Phys. Rev. A 61, 042705 (2000) hu + H Interaction Potentials Th H* + H Interaction Potentials Th

333. A. Amelink, K. M. Jones, P. D. Lett, P. Van der Straten, H.G.M. Heideman Spectroscopy of autoionizing doubly excited states in ultracold Naj molecules produced by photo dissociation. Phys. Rev. A 61, 042707 (2000)

87 Na* + Na* Association 0.00 K Ex

334. S. Kotochigova, E. Tiesinga, I. Tupitsyn Nonrelativistic ab initio calculation of the interaction potentials between metastable Ne atoms. Phys. Rev. A 61, 042712 (2000) Ne* + Ne* Interaction Potentials Th Ne + Ne Interaction Potentials Th

335. J. M. Vogels, R. S. Freeland, C. C. Tsai, B. J. Verhaar, D. J. Heinzen Coupled singlet-triplet analysis of two-color cold-atom photoassociation spectra. Phys. Rev. A 61, 043407 (2000) Rb + Rb Association Th Rb + Rb Interaction Potentials Th

336. N. Herschbach, P. J. J. Tol, W. Hogervorst, W. Vassen Suppression of Penning ionization by spin polarization of cold He(2 3S) atoms. Phys. Rev. A 61, 050702 (2000) He + He Ionization 0.00 K Ex

337. A. F. Barghouty Robust estimates of hydrogen-impact ionization cross sections over a wide energy range. Phys. Rev. A 61, 052702 (2000) He + H Ionization 0.00-1.00 GeV/amu E/T He1+ + H Ionization 0.00-1.00 GeV/amu E/T C + H Ionization 0.00-1.00 GeV/amu E/T C1+ + H Ionization 0.00-1.00 GeV/amu E/T C2+ + H Ionization 0.00-1.00 GeV/amu E/T C3+ + H Ionization 0.00-1.00 GeV/amu E/T

338. T. Ludziejewski, Th. Stohlker, D. C. Ionescu, P. Rymuza, H.-J. Beyer, F. Bosch, C. Kozhuharov, A. Kramer, D. Liesen, P. H. Mokler, Z. Stachura, P. Swiat, A. Warczak, R. W. Dunford Simultaneous excitation and ionization of He-like uranium ions in relativistic collisions with gaseous targets. Phys. Rev. A 61, 052706 (2000) U90+ + Ar Ionization 223.20 MeV/amu U90+ + Kr Ionization 223.20 MeV/amu U90+ + Xe Ionization 223.20 MeV/amu U90+ + Ar Excitation 223.20 MeV/amu Xj90+ + Kr Excitation 223.20 MeV/amu U90+ + Xe Excitation 223.20 MeV/amu

339. T. G. Winter, J. R. Winter Ionization in collisions between (200-2000)-keV protons and He+ (Is, 2s, or 3s) ions studied using a Sturmian basis. Phys. Rev. A 61, 052709 (2000) H1+ 4- He1+ Ionization 0.20-2.00 MeV E/T

340. T. Kirchner, H. J. Ludde, M. Horbatsch, R. M. Dreizler Quantum-mechanical description of ionization, capture, and excitation in proton collisions with atomic oxygen. Phys. Rev. A 61, 052710 (2000) H1+ + O Ionization 1.00-200.00 keV H1+ + O Charge Transfer 1.00-200.00 keV H1+ + O Excitation 1.00-200.00 keV 341. M. Kavcic, M. Budnar, A. Muhleisen, P. Pelicon, Z. Smit, M. Zitnik, D. Castella, D. Corminboeuf, J.-Cl. Dousse, J. Hoszowska, P. A. Raboud, K. Tokesi L-shell ionization in near-central collisions of heavy ions with low-Z atoms. Phys. Rev. A 61, 052711 (2000) C2+ + Ca Ionization 2.00-19.00 MeV/amu E/T C2+ + TÍ Ionization 2.00-19.00 MeV/amu E/T C2+ + Cr Ionization 2.00-19.00 MeV/amu E/T C2+ + Fe Ionization 2.00-19.00 MeV/amu E/T C3+ + Ca Ionization 2.00-19.00 MeV/amu E/T C3+ + Ti Ionization 2.00-19.00 MeV/amu E/T C3+ + Cr Ionization 2.00-19.00 MeV/amu E/T C3+ + Fe Ionization 2.00-19.00 MeV/amu E/T C4+ + Ca Ionization 2.00-19.00 MeV/amu E/T C4+ + Ti Ionization 2.00-19.00 MeV/amu E/T C4+ + Cr Ionization 2.00-19.00 MeV/amu E/T C4+ + Fe Ionization 2.00-19.00 MeV/amu E/T O2+ + Ca Ionization 2.00-19.00 MeV/amu E/T o2+ + Ti Ionization 2.00-19.00 MeV/amu E/T O2+ + Cr Ionization 2.00-19.00 MeV/amu E/T O2+ + Fe Ionization 2.00-19.00 MeV/amu E/T O3+ + Ca Ionization 2.00-19.00 MeV/amu E/T O3+ + Ti Ionization 2.00-19.00 MeV/amu E/T O3+-f Cr Ionization 2.00-19.00 MeV/amu E/T o3+ + Fe Ionization 2.00-19.00 MeV/amu E/T O6+ + Ca Ionization 2.00-19.00 MeV/amu E/T o6+ + Ti Ionization 2.00-19.00 MeV/amu E/T O6+ -f- Cr Ionization 2.00-19.00 MeV/amu E/T O6+ + Fe Ionization 2.00-19.00 MeV/amu E/T Ne3+ + Ca Ionization 2.00-19.00 MeV/amu E/T Ne3+ + Ti Ionization 2.00-19.00 MeV/amu E/T Ne3+ + Cr Ionization 2.00-19.00 MeV/amu E/T Ne3+ + Fe Ionization 2.00-19.00 MeV/amu E/T Ne6+ + Ca Ionization 2.00-19.00 MeV/amu E/T Ne6+ + Ti Ionization 2.00-19.00 MeV/amu E/T Ne6+ + Cr Ionization 2.00-19.00 MeV/amu E/T Ne6+ + Fe Ionization 2.00-19.00 MeV/amu E/T Ne8+ + Ca Ionization 2.00-19.00 MeV/amu E/T Ne8+ + Ti Ionization 2.00-19.00 MeV/amu E/T Ne8+ + Cr Ionization 2.00-19.00 MeV/amu E/T Ne8+ + Fe Ionization 2.00-19.00 MeV/amu E/T 342. M. M. Sant'Anna, W. S. Melo, A. C. F. Santos, V. L. B. de Jesus, M. B. Shah, G. M. Sigaud, E. C. Montenegro, H. F. Busnengo, S. E. Corchs, R. D. Rivarola, L. Gulyas Electronic capture by He2+ from atomic and molecular hydrogen. Phys. Rev. A 61, 052717 (2000) He2+ + H Charge Transfer 0.50-2.75 MeV E/T 2+ He + H2 Charge Transfer 0.50-2.75 MeV E/T 343. M. A. Abdallah, C. R. Vane, C. C. Havener, D. R. Schultz, H. T. Krause, N. Jones, S. Datz Multiple ionization in fast ion-atom collisions: Simultaneous measurement of recoil momen- tum and projectile energy loss. Phys. Rev. Lett. 85, 278 (2000) O7+ 4- Ne Charge Transfer 0.83 MeV/amu Ex O7+ + Ne Ionization 0.83 MeV/amu Ex 344. J. F. McCann, Y. H. Ng The distorted-wave impulse approximation for electron capture into excited states. Phys. Scr. 61, 180 (2000)

89 H1+ + H Charge Transfer 0.01-1.50 MeV/amu Th He2+ + H Charge Transfer 0.01-1.50 MeV/amu Th

345. P. Verma, J. S. Braich, A. Mandal, T. K. Nandi, H. R. Verma Multiple ionization produced in Yb due to N-, Si- and Ti-ion impact. Phys. Scr. 61, 335 (2000) N2+ + Yb Ionization 0.30-3.50 MeV/amu Ex N3+ + Yb Ionization 0.30-3.50 MeV/amu Ex Si7+ + Yb Ionization 0.30-3.50 MeV/amu Ex Si8+ + Yb Ionization 0.30-3.50 MeV/amu Ex Ti10+ + Yb Ionization 0.30-3.50 MeV/amu Ex Ti11+ + Yb Ionization 0.30-3.50 MeV/amu Ex

346. A. Denis, M. C. Buchet-Poulizac, J. Bernard, L. Chen, S. Martin, J. Desesquelles Measurement of the Is2s2p 4P°5/2 - Is2p3d 4F°9/2 electric quadrupole transition in doubly excited N4+, O5+ , F6+ and Ne7+ Lithium-like ions. Phys. Scr. 61, 431 (2000) N5+ + Cs Charge Transfer 20.00 keV Ex O6+ + Cs Charge Transfer 20.00 keV Ex F7+ + Cs Charge Transfer 20.00 keV Ex Ne8+ + Cs Charge Transfer 20.00 keV Ex N5+ + Cs Excitation 20.00 keV Ex O6+ + Cs Excitation 20.00 keV Ex F7+ + Cs Excitation 20.00 keV Ex Ne8+ + Cs Excitation 20.00 keV Ex

347. B. M. Smirnov Tables for cross sections of the resonant charge exchange process. Phys. Scr. 61, 595 (2000) PERT1+ + PERT Charge Transfer 0.10-10.00 eV Th

348. S. Sahoo Ionization of atomic oxygen in collision with proton and alpha particle. Phys. Scr. 62, 145 (2000) H1+ -+• O Ionization 0.01-1.00 MeV Th He2+ + O Ionization 0.01-1.00 MeV Th

349. R. Das, S. Sahoo, K. Roy Ionization cross sections of hydrogen-like atoms under heavy particle impact. Phys. Scr. 62, 289 (2000) H1+ + He2+ Ionization 0.01-2.00 MeV/amu Th H1+ + Be34" Ionization 0.01-2.00 MeV/amu Th 4 JJ}+ + B + Ionization 0.01-2.00 MeV/amu Th H*+ + C5+ Ionization 0.01-2.00 MeV/amu Th Li2+ + He2+ Ionization 0.01-2.00 MeV/amu Th Be3+ 4- He2+ Ionization 0.01-2.00 MeV/amu Th B4+ + He2+ Ionization 0.01-2.00 MeV/amu Th C5+ + He2+ Ionization 0.01-2.00 MeV/amu Th

3.3 Surface Interactions

350. A. Eichler, J. Hafner, A. Gross, M. Scheffler Rotational effects in the dissociation of H2 on metal surfaces studied by ab initio quantum- dynamics calculations. Chem. Phys. Lett. 311, 1 (1999)

90 H2 + Rh Desorption 0.10-2.00 eV Ex H2 + Pd Desorption 0.10-2.00 eV Ex H2 + Hg Desorption 0.10-2.00 eV Ex H2 + Rh Adsorption, Desorption 0.10-2.00 eV Ex H2 + Pd Adsorption, Desorption 0.10-2.00 eV Ex H2 + Hg Adsorption, Desorption 0.10-2.00 eV Ex H2 + Rh Neutraliz., Ioniz., Diss. 0.10-2.00 eV Ex H2 + Pd Neutraliz., Ioniz., Diss. 0.10-2.00 eV Ex H2 + Hg Neutraliz., Ioniz., Diss. 0.10-2.00 eV Ex

351. I. M. Cioba, F. Frechard, R. A. van Santen, A. W. Kleyn, J. Hafher A theoretical study of CHX chemisorption on the Ru(0001) surface. Chem. Phys. Lett. 311, 185 (1999) H + Ru Desorption Th C + Ru Desorption Th CH + Ru Desorption Th CH2 + Ru Desorption Th CH3 + Ru Desorption Th H + Ru Neutraliz., Ioniz., Diss. Th C + Ru Neutraliz., loniz., Diss. Th CH + Ru Neutraliz., Ioniz., Diss. Th CH2 + Ru Neutraliz., Ioniz., Diss. Th CH3 + Ru Neutraliz., Ioniz., Diss. Th

352. X. Xu, D. Y. Wu, B. Ren, H. Xian, Z.-Q. Tian On-top adsorption of hydrogen at platinum electrodes: a quantum-chemical study. Chem. Phys. Lett. 311, 193 (1999) H + Pt Adsorption, Desorption Th

353. A. Dinger, C. Lutterloh, J. Kuppers Kinetics of D abstraction with H atoms from the monodeuteride phase on Si(100) surfaces. Chem. Phys. Lett. 311, 202 (1999) H + D Trapping, Detrapping 640.00 K H + (D + Si) Trapping, Detrapping 640.00 K

354. J. K. Eve, E. M. McCash Low-temperature adsorption of CO on Cu(lll) studied by reflection absorption infrared spectroscopy. Chem. Phys. Lett. 313, 575 (1999) CO + Cu Desorption 25.00-150.00 K CO + Cu Adsorption, Desorption 25.00-150.00 K

355. Y. H. Kim, J. Ree, H. K. Shin Formation of vibrationally excited hydrogen molecules on a graphite surface. Chem. Phys. Lett. 314, 1 (1999) H + C Adsorption, Desorption 0.30-1.50 K Th

356. E. Nabighian, X. D. Zhu Diffusion of Xe on Ni(lll). Chem. Phys. Lett. 316, 177 (1999) Xe + Ni Adsorption, Desorption 0.03-1.20 K Ex

357. C.-L. Hsu, E. F. McCullen, R. G. Tobin Evidence for an adsorbate-dependent mechanism for surface resistivity: formic acid, oxygen and CO on Cu(100). Chem. Phys. Lett. 316, 336 (1999)

91 CO + Cu Adsorption, Desorption 125.00-300.00 K O + Cu Adsorption, Desorption 125.00-300.00 K

358. K. Doll, N. M. Harrison Chlorine adsorption on the Cu(lll) surface. Chem. Phys. Lett. 317, 282 (1999) Cl + Cu Adsorption, Desorption Th

359. H. F. Busnengo, W. Dong, A. Salin Six-dimensional classical dynamics of H2 dissociative adsorption on Pd(lll). Chem. Phys. Lett. 320, 328 (2000)

H2 + Pd Adsorption, Desorption 0.80 eV Th

360. A. Dinger, C. Lutterloh, J. Kuppers Stationary and non-stationary etching of Si(100) surfaces with gas phase and adsorbed hy- drogen. Chem. Phys. Lett. 320, 405 (2000) H + Si Desorption 200.00-800.00 K H + Si Chemical Reactions 200.00-800.00 K

361. D.-Y. Hwang, A. M. Mebel Theoretical study on the reversible storage of H2 by BeO. Chem. Phys. Lett. 321, 95 (2000) H2 + BeO Trapping, Detrapping Th

362. J. Onsgaard, S. V. Hoffmann, P. J. Godowski, P. J. Moller, J. B. Wagner, A. Groso, A. Baraldi, G. Comelli, G. Paolucci Dissociation of CO and formation of carbonate on a stepped, K-modified Cu(115) surface. Chem. Phys. Lett. 322, 247 (2000) CO + K Neutraliz., Ioniz., Diss. 125.00 K CO + Cu Neutraliz., Ioniz., Diss. 125.00 K CO + K + Cu Neutraliz., Ioniz., Diss. 125.00 K

363. M. V. Bollinger, K. W. Jacobson, J. K. Norskov Surface chemistry in three dimensions: CO dissociation between two surfaces. Chem. Phys. Lett. 322, 307 (2000) CO + Ru Neutraliz., Ioniz., Diss. Th

364. M. Okada, K. Moritani, M. Nakamura, T. Kasai, Y. Murata Hot-atom mechanism in hydrogen exchange reaction on the IrlOO surface. Chem. Phys. Lett. 323, 586 (2000)

H2 + H Desorption 160.00 K H2 + Ir Desorption 160.00 K H2 + H + Ir Desorption 160.00 K

365. Ch. Hess, M. Bonn, S. Funk, M. Wolf Hot-band excitation of CO chemisorbed on Ru(OOl) studied with broadband-IR sum-frequency generation. Chem. Phys. Lett. 325, 139 (2000) hv + CO Desorption 1.55 eV Ex hv + Ru Desorption 1.55 eV Ex hv + CO + Ru Desorption 1.55 eV Ex

366. M. Tronc, R. Azria, Y. Le Coat, L. Sanche Kinetic energy distributions for O~ and metastable CO* produced by electron stimulated desorption from condensed CO2. Chem. Phys. 254, 69 (2000)

92 e + CO2 Desorption 10.00-30.00 eV Ex e 4- CO2 + Pt Desorption 10.00-30.00 eV Ex

367. H. Eder, W. Messerschmidt, HP. Winter, F. Aumayr Electron emission from clean gold bombarded by slow Au'+ (q=l-3) ions. J. Appl. Phys. 87, 8198 (2000) Au+ 4 Au Second. Elect. Emiss. 1.00-22.00 keV Ex Au2+ + Au Second. Elect. Emiss. 1.00-22.00 keV Ex Au3+ + Au Second. Elect. Emiss. 1.00-22.00 keV Ex

368. T. Veres, M. Cai, R. W. Cochrane, S. Roorda Ion-beam modification of Co/Ag multilayers I: Structural evolution and magnetic response. J. Appl. Phys. 87, 8504 (2000) Si+ 4 Co Chemical Reactions 1.00 MeV Ex Si+ 4- Ag Chemical Reactions 1.00 MeV Ex Si+ + Ag + Co Chemical Reactions 1.00 MeV Ex

369. C. A. F. Pintao, R. Hessel Total secondary-electron yield of metals measured by a dynamic method. J. Appl. Phys. 88, 478 (2000) e 4 Al Second. Elect. Emiss. 0.40-20.00 keV Ex e 4- Fe Second. Elect. Emiss. 0.40-20.00 keV Ex e + Pt Second. Elect. Emiss. 0.40-20.00 keV Ex e 4- SS Second. Elect. Emiss. 0.40-20.00 keV Ex

370. M. Balden, J. Roth Comparison of the chemical erosion of Si, C and SiC under deuterium ion bombardment. J. Nucl. Mater. 279, 351 (2000) H+ 4- C Sputtering 20.00-300.00 eV H+ 4- Si Sputtering 20.00-300.00 eV H+ 4- SiC Sputtering 20.00-300.00 eV D+ 4- C Sputtering 20.00-300.00 eV D+ 4- Si Sputtering 20.00-300.00 eV D+ 4 SiC Sputtering 20.00-300.00 eV

371. M. Balden, J. Roth New weight-loss measurements of the chemical erosion yields of carbon materials under hydrogen ion bombardment. J. Nucl. Mater. 280, 39 (2000) H+ 4 C Sputtering 0.01-8.00 keV Ex D+ 4 C Sputtering 0.01-8.00 keV Ex

372. B. Ye, Y. Kasugai, Y. Ikeda, Y. Fan, J. Du, X. Zhou, R. Han Measurement of backward sputtering yields induced by fast neutrons. J. Nucl. Mater. 281, 112 (2000) n 4- Mg Sputtering 14.90 MeV Ex n + Al Sputtering 14.90 MeV Ex n+ Sc Sputtering 14.90 MeV Ex n4 V Sputtering 14.90 MeV Ex n 4 Fe Sputtering 14.90 MeV Ex n + Fe Sputtering 14.90 MeV Ex n 4 Co Sputtering 14.90 MeV Ex n 4- Cu Sputtering 14.90 MeV Ex n+Zr Sputtering 14.90 MeV Ex n 4- Au Sputtering 14.90 MeV Ex n + SS Sputtering 14.90 MeV Ex

93 373. W. Eckstein Dynamic behaviour of the systems Be-C, Be-W and C-W. J. Nucl. Mater. 281, 195 (2000) Be + C Surface Interactions 0.00-1.00 MeV Th Be + W Surface Interactions 0.00-1.00 MeV Th C + Be Surface Interactions 0.00-1.00 MeV Th C + W Surface Interactions 0.00-1.00 MeV Th W + Be Surface Interactions 0.00-1.00 MeV Th w + c Surface Interactions 0.00-1.00 MeV Th Be + C Reflection 0.00-1.00 MeV Th Be + W Reflection 0.00-1.00 MeV Th C + Be Reflection 0.00-1.00 MeV Th C +W Reflection 0.00-1.00 MeV Th W + Be Reflection 0.00-1.00 MeV Th W + C Reflection 0.00-1.00 MeV Th Be + C Sputtering 0.00-1.00 MeV Th Be +W Sputtering 0.00-1.00 MeV Th C 4- Be Sputtering 0.00-1.00 MeV Th c +w Sputtering 0.00-1.00 MeV Th W 4-Be Sputtering 0.00-1.00 MeV Th w + c Sputtering 0.00-1.00 MeV Th 374. U. Schwengelbeck, L. Plaja, L. Roso, E. C. Jarque Plasmon-induced photon emission from thin metal films. J. Phys. B 33, 1653 (2000) hv + Li Surface Interactions 0.10-12.00 eV Th Yiv + Ag Surface Interactions 0.10-12.00 eV Th

375. A. V. Korol, A. G. Lyalin, 0. I. Obolensky, A. V. Solov'yov Manifestation of the Bethe ridge in the polarizational bremsstrahlung process. J. Phys. B 33, L179 (2000) H+ + Al Surface Interactions 1.00 MeV E/T 376. M. Ohashi, M. Ozeki, J. Cui Dynamical behavior of hydrogen molecule on GaAs(OOl) surface. J. Vac. Sci. Technol. A 18, 2497 (2000)

H2 4- GaAs Adsorption, Desorption 0.08 eV Ex H2 4- GaAs Reflection 0.08 eV Ex

377. Z. D. Pesic, H. Lebius, R. Schuch, Gy. Vikor, V. Hoffman, D. Niemann, N. Stolterfoht Energy dependence of neutralization in scattering of slow highly charged Ar ions from an Au surface. Nucl. Instrum. Methods Phys. Res. B 164/165, 511 (2000) Ar7+ 4- Au Reflection 2.00-8.00 keV Ex Ar9+ 4- Au Reflection 2.00-8.00 keV Ex Ari3+ + Au Reflection 2.00-8.00 keV Ex 378. G. Hayderer, C. Lemell, L. Wirtz, M. Schmid, J. Burgdorfer, P. Varga, HP. Winter, F. Aumayr Observation of a threshold in potential sputtering of LiF surfaces. Nucl. Instrum. Methods Phys. Res. B 164/165, 517 (2000) H+ 4- LiF Sputtering 0.02-1.00 keV Ex He+ 4- LiF Sputtering 0.02-1.00 keV Ex C+ 4- LiF Sputtering 0.02-1.00 keV Ex C2+ 4- LiF Sputtering 0.02-1.00 keV Ex N+ 4- LiF Sputtering 0.02-1.00 keV Ex N2+ 4- LiF Sputtering 0.02-1.00 keV Ex

94 O+ + LiF Sputtering 0.02-1.00 keV Ex O2+ + LiF Sputtering 0.02-1.00 keV Ex F+ + LiF Sputtering 0.02-1.00 keV Ex F2+ + LiF Sputtering 0.02-1.00 keV Ex Ne+ + LiF Sputtering 0.02-1.00 keV Ex Ne2+ + LiF Sputtering 0.02-1.00 keV Ex Na+ + LiF Sputtering 0.02-1.00 keV Ex Na2+ + LiF Sputtering 0.02-1.00 keV Ex P2+ + LiF Sputtering 0.02-1.00 keV Ex S+ + LiF Sputtering 0.02-1.00 keV Ex S2+ + LiF Sputtering 0.02-1.00 keV Ex Ar+ + LiF Sputtering 0.02-1.00 keV Ex Ar2+ + LiF Sputtering 0.02-1.00 keV Ex Cu+ + LiF Sputtering 0.02-1.00 keV Ex Zn+ + LiF Sputtering 0.02-1.00 keV Ex 2+ Kr + LiF Sputtering 0.02-1.00 keV Ex

379. K. Nakajima, S. Sonobe, K. Kimura Stopping power of a KCl(OOl) surface for low energy Ne atoms. Nucl. Instrum. Methods Phys. Res. B 164/165, 553 (2000) Ne+ + KC1 Reflection 15.00-30.00 keV Ex

380. H. Winter, C. Auth, A. Mertens Stopping of low energy protons during grazing scattering from a LiF(OOl) surface. Nucl. Instrum. Methods Phys. Res. B 164/165, 559 (2000) H+ + LiF Reflection 0.30-25.00 keV Ex

381. M. Richard-Viard, C. Benazeth, P. Benoit-Cattin, P. Cafarelli, S. Abidi, J. P. Ziesel Scattering of 4 keV Ne+, Na+ and F+ ions from a NaCl(lOO) surface under a small angle of incidence. Angular distributions and charge fractions. Nucl. Instrum. Methods Phys. Res. B 164/165, 575 (2000) F+ + NaCl Reflection 4.00 keV Ex Ne+ + NaCl Reflection 4.00 keV Ex Na+ + NaCl Reflection 4.00 keV Ex

382. M. Boudjema, N. D'bichi, Y. Boudouma, A. C. Chami, B. Arezki, K. Khalal, C. Benazeth, P. Benoit- Cattin Inelastic energy loss of light particles scattered by solid surfaces at low energy: influence of the 'gap.' Nucl. Instrum. Methods Phys. Res. B 164/165, 588 (2000) He+ + Si Reflection 4.00 keV Th He+ + Ni Reflection 4.00 keV Th He+ + Ge Reflection 4.00 keV Th

383. H. Jouin, F. A. Gutierrez, C. Harel, S. Jequier, J. Rangama Plasmon dispersion effects for surface plasmon mediated proton neutralization at Mg sur- faces. Nucl. Instrum. Methods Phys. Res. B 164/165, 595 (2000) H+ + Mg Neutraliz., Ioniz., Diss. Th 384. L. Guillemot, S. Lacombe, V. A. Esaulov Time dependent characteristics of electron tunnelling processes in H~, O~ and F~ formation on Ag(lll). Nucl. Instrum. Methods Phys. Res. B 164/165, 601 (2000) H+ + Ag Reflection 0.50-1.00 keV Ex O+ + Ag Reflection 0.50-1.00 keV Ex F+ + Ag Reflection 0.50-1.00 keV Ex

95 385. H. Khemliche, J. Villette, P. Roncin, M. Barat Surface exciton population in proton impact with LiF(lOO). Nucl. Instrum. Methods Phys. Res. B 164/165, 608 (2000) H+ + LiF Second. Elect. Emiss. 10.00 keV Ex H+ + LiF Reflection 10.00 keV Ex

386. B. Bahrim, P. Kurpick, U. Thumm, U. Wille Electron dynamics and level broadening in slow atomic interactions with metal surfaces and thin metallic films. Nucl. Instrum. Methods Phys. Res. B 164/165, 614 (2000) hi/ + Al Neutraliz., Ioniz., Diss. Th

387. I. A. Wojciechowski, M. V. Medvedeva, V. Kh. Ferleger, K. Bruning, W. Heiland + Dissociative grazing scattering of H2 on metal surfaces: Analysis of the high-energy parts of the spectra of the scattered molecule constituents. Nucl. Instrum. Methods Phys. Res. B 164/165, 626 (2000)

H2+ + Al Reflection 0.00-10.00 keV Th H2+ + Pt Reflection 0.00-10.00 keV Th + H2 + Al Neutraliz., Ioniz., Diss. 0.00-10.00 keV Th + H2 + Pt Neutraliz., Ioniz., Diss. 0.00-10.00 keV Th

388. J. Lorincik, Z. Sroubek Non-adiabatic electron excitation in ion-induced kinetic electron emission from metal sur- faces. Nucl. Instrum. Methods Phys. Res. B 164/165, 633 (2000) Ne + Au Second. Elect. Emiss. 1.00-17.00 keV Th Ne+ + Au Second. Elect. Emiss. 1.00-17.00 keV Th 389. V. Kh. Ferleger, I. A. Wojciechowski On non-binary nature of the collisions of heavy hyperthermal particles with solid surfaces. Nucl. Instrum. Methods Phys. Res. B 164/165, 641 (2000) Xe + Ge Reflection 1.00-30.00 eV Th Xe + Ge Reflection 1.00-30.00 eV Th Xe + Ag Reflection 1.00-30.00 eV Th Xe + Ag Reflection 1.00-30.00 eV Th Xe + GaAs Reflection 1.00-30.00 eV Th Xe + GeAs Reflection 1.00-30.00 eV Th

390. F. F. Umarov, N. Narkulov, F. B. Abdulkasymov Inelastic energy losses of low-energy ions scattered on atoms in gas and on the solid surface. Nucl. Instrum. Methods Phys. Res. B 164/165, 656 (2000) Ne+ + Ni Reflection 0.20-3.00 keV E/T Ar+ + Pd Reflection 0.20-3.00 keV E/T Ar+ 4- Ag Reflection 0.20-3.00 keV E/T Ar+ + Ta Reflection 0.20-3.00 keV E/T Ar+ + Pt Reflection 0.20-3-00 keV E/T Ar+ + Pb Reflection 0.20-3.00 keV E/T

391. C. Staudt, R. R. Heinrich, A. Wucher Formation of large clusters during sputtering of silver. Nucl. Instrum. Methods Phys. Res. B 164/165, 677 (2000) Xe+ + Ag Sputtering 15.00 keV Ex

392. T. J. Colla, H. M. Urbassek Au sputtering by cluster bombardment: A molecular dynamics study. Nucl. Instrum. Methods Phys. Res. B 164/165, 687 (2000)

96 Au+ + Au Sputtering 15.00 keV Th

393. H. Gnaser Negative cluster ions in sputtering of Si, SiC and graphite: Abundance distributions, energy spectra and fragmentation processes. Nucl. Instrum. Methods Phys. Res. B 164/165, 705 (2000) Cs+ + C Sputtering 14.50 keV Ex Cs+ + Si Sputtering 14.50 keV Ex Cs+ + SiC Sputtering 14.50 keV Ex

394. C. Staudt, R. R. Heinrich, P. Mazarov, A. Wucher, V. I. Tugushev, N. Kh. Dzhemilev On the temperature dependence of sputtered cluster yields. Nucl. Instrum. Methods Phys. Res. B 164/165, 715 (2000) Xe+ + Ag Sputtering 8.50-12.50 keV Ex

395. R. R. Heinrich, A. Wucher Cluster formation under bombardment with polyatomic projectiles. Nucl. Instrum. Methods Phys. Res. B 164/165, 720 (2000) Ag+ + Ag Sputtering 8.00 keV Ex

396. H. H. Andersen, A. Johansen, V. S. Touboltsev The angular distribution of gold selfsputtered under thermal-spike conditions. Nucl. Instrum. Methods Phys. Res. B 164/165, 727 (2000) Au+ + Au Sputtering 10.00-30.00 keV Ex

397. V. I. Shulga Angular distribution of atoms sputtered from amorphous and polycrystalline targets. Nucl. Instrum. Methods Phys. Res. B 164/165, 733 (2000) Ar+ + Fe Sputtering 1.00-10.00 keV Th Ar+ + Cu Sputtering 1.00-10.00 keV Th Ar+ + Ge Sputtering 1.00-10.00 keV Th Ar+ + Ag Sputtering 1.00-10.00 keV Th Ar+ + Pt Sputtering 1.00-10.00 keV Th Ar+ + Au Sputtering 1.00-10.00 keV Th Ar+ + perturbation Sputtering 1.00-10.00 keV Th

398. W. Eckstein, V. I. Shulga Depth of origin of atoms sputtered from W^Ci-j, compounds and the pure elements. A TRIM.SP and TRIDYN simulation study. Nucl. Instrum. Methods Phys. Res. B 164/165, 748 (2000) Ar++ C Sputtering 0.10-100.00 keV Ar++ W Sputtering 0.10-100.00 keV Ar+ + WC Sputtering 0.10-100.00 keV

399. V. S. Chernysh, W. Eckstein, A. A. Haidarov, V. S. Kulikauskas, E. S. Mashkova, V. A. Molchanov Angular distributions of particles sputtered from polycrystalline platinum by low-energy ions. Nucl. Instrum. Methods Phys. Res. B 164/165, 755 (2000) Ne+ + Pt Sputtering 3.00-9.00 keV E/T

400. T. T. Nuver, H. Rudolph, P.A. Zeijlmans van Emmichoven, A. Niehaus Preferential ejection of high-energy sputtered Cu atoms in keV atom - Cu(llO) collisions. Nucl. Instrum. Methods Phys. Res. B 164/165, 785 (2000) Kr + Cu Sputtering 5.00 keV Th Xe + Cu Sputtering 5.00 keV Th

97 401. E. Vandeweert, J. Bastiaansen, V. Philipsen, P. Lievens, R. E. Silverans Resonant electron transfer during ion-beam sputtering of metals studied by double-resonant laser ionization. Nucl. Instrum. Methods Phys. Res. B 164/165, 795 (2000) Ar+ + Co Sputtering 3.00-15.00 keV Ex Ar+ + Ni Sputtering 3.00-15.00 keV Ex Ar+ + Sr Sputtering 3.00-15.00 keV Ex

402. N. Imanishi, H. Ohta, S. Ninomiya, A. Itoh Emission energy distribution of secondary ions produced through the electronic sputtering process under heavy ion bombardment. Nucl. Instrum. Methods Phys. Res. B 164/165, 803 (2000) Si+ + SiOa Sputtering 3.00-5.00 MeV Ex Cu+ + SiO2 Sputtering 3.00-5.00 MeV Ex + Ag + SiO2 Sputtering 3.00-5.00 MeV Ex

403. S. F. Belykh, B. Habets, U. Kh. Rasulev, A. V. Samartsev, L. V. Stroev, I. V. Veryovkin Relative yields, mass distributions and energy spectra of cluster ions sputtered from niobium under keV atomic and polyatomic gold ion bombardment. Nucl. Instrum. Methods Phys. Res. B 164/165, 809 (2000) Au"1 + Nb Sputtering 6.00-18.00 keV Ex

404. A. Goehlich, H. F. Dobele Determination of time-of-flight distributions of sputtered oxygen and carbon atoms by res- onant multi-photon ionization. Nucl. Instrum. Methods Phys. Res. B 164/165, 827 (2000) Ar+ + C Sputtering 6.00 keV Ex Ar+ + TiO Sputtering 6.00 keV Ex

405. A. Goehlich, D. Gillmann, H. F. Dobele Angular resolved energy distributions of sputtered atoms at low bombarding energy. Nucl. Instrum. Methods Phys. Res. B 164/165, 834 (2000) Ar+ + Al Sputtering 150.00-250.00 eV Ar+ + W Sputtering 150.00-250.00 eV Xe+ + Al Sputtering 150.00-250.00 eV Xe+ + W Sputtering 150.00-250.00 eV

406. D. Ishikawa, R. Ishigami, S. D. Dhole, K. Morita Energy distributions of neutral species ejected from well-characterized surfaces measured by means of multiphoton resonance ionization spectroscopy. Nucl. Instrum. Methods Phys. Res. B 164/165, 840 (2000) Ar+ + Si Sputtering 5.00 keV Ex Ar+ + Cu Sputtering 5.00 keV Ex

407. V. A. Kurnaev, V. V. Marinyuk, V. S. Remizovich, N. N. Trifonov Contributions of the inward and backward ion fluxes to sputtering at the grazing incidence of the beam. Nucl. Instrum. Methods Phys. Res. B 164/165, 848 (2000) Ar+ + Pt Sputtering 1.00-30.00 keV Th

408. Z. B. Guvenc, Y. Hundur, R. Hippler Sputtering yield and dynamical analysis of Ni(100) surface: A comparison of four different Ar-surface interaction potentials. Nucl. Instrum. Methods Phys. Res. B 164/165, 854 (2000) Ar+ + Ni Reflection 10.00-40.00 eV Th Ar+ + Ni Sputtering 10.00-40.00 eV Th

98 409. R. Pedrys, F. Krok, P. Keskiewicz, J. Schou, U. Podschaske, B. Cleff Time-of-fiight study of water ice sputtered by slow xenon ions. Nucl. Instrum. Methods Phys. Res. B 164/165, 861 (2000)

Xe+ + H2O Sputtering 1.00-9.00 keV Ex Xe+ + D2O Sputtering 1.00-9.00 keV Ex

410. A. Galdikas, L. Pranevicius Surface composition changes of ternary alloys in the non-steady state regime of preferential sputtering. Nucl. Instrum. Methods Phys. Res. B 164/165, 868 (2000) Ar+ + Pd Sputtering 2.00 keV Th Ar+ + Ag Sputtering 2.00 keV Th Ar+ + Au Sputtering 2.00 keV Th

411. M. Rosier First principles calculation of ion induced kinetic electron emission from nearly free-electron metals below the plasmon threshold. Nucl. Instrum. Methods Phys. Res. B 164/165, 873 (2000) hi/ + Al Second. Elect. Emiss. 10.00-50.00 keV Th H-1 + Al Second. Elect. Emiss. 10.00-50.00 keV Th H+ + Al Second. Elect. Emiss. 10.00-50.00 keV Th

412. R. A. Baragiola, S. M. Ritzau, R. C. Monreal Probing inelastic interactions of ions moving in solids by electron spectroscopy. Nucl. Instrum. Methods Phys. Res. B 164/165, 879 (2000) H+ + Al Second. Elect. Emiss. 20.00 keV/amu Ex He + Al Second. Elect. Emiss. 20.00 keV/amu Ex He+ + Al Second. Elect. Emiss. 20.00 keV/amu Ex

413. P. Riccardi, P. Barone, M. Camarca, A. Oliva, R. A. Baragiola Plasmon excitation in Al by keV Ne and Ar ions. Nucl. Instrum. Methods Phys. Res. B 164/165, 886 (2000) Ne+ + Al Second. Elect. Emiss. 1.00-5.00 keV Ex Ar+ + Al Second. Elect. Emiss. 1.00-5.00 keV Ex

414. D. E. Grosjean, R. A. Baragiola, W. L. Brown Effects of under- and overlayers on particle and photon emission from solid argon induced by 2 MeV protons. Nucl. Instrum. Methods Phys. Res. B 164/165, 891 (2000)

H+ + N2 Surface Interactions 2.00 MeV Ex H+ + Ar Surface Interactions 2.00 MeV Ex H+ + N2 Second. Elect. Emiss. 2.00 MeV Ex H+ + Ar Second. Elect. Emiss. 2.00 MeV Ex H+ + N2 Sputtering 2.00 MeV Ex H+ + Ar Sputtering 2.00 MeV Ex

415. H. Kudo, S. Seki, K. Sumitomo, K. Narumi, S. Yamamoto, H. Naramoto Ion-induced electron measurements using crystal targets overlaid with noncrystalline layers. Nucl. Instrum. Methods Phys. Res. B 164/165, 897 (2000) H+ + Si Second. Elect. Emiss. 8.00 MeV/amu Ex He2+ + Si Second. Elect. Emiss. 8.00 MeV/amu Ex

416. K. Nishimura, J. Kawata, K. Ohya Comparative study of secondary electron emission from solids under positron and electron impacts. Nucl. Instrum. Methods Phys. Res. B 164/165, 903 (2000)

99 e + Au Second. Elect. Emiss. 2.00 keV Th

417. 0. Benka, M. Steinbatz, A. Schinner, E. Steinbauer Temperature dependence of the electron and proton induced electron emission yield of Al. Nucl. Instrum. Methods Phys. Res. B 164/165, 910 (2000) e + Al Second. Elect. Emiss. 3.00 keV Ex H+ + Al Second. Elect. Emiss. 3.00 keV Ex

418. E. Steinbauer, A. Schinner, M. Steinbatz, 0. Benka Electron emission yield from thin Cu layers on Al induced by 3 MeV He++ and 3 keV electron impact. Nucl. Instrum. Methods Phys. Res. B 164/165, 915 (2000) e + Al Second. Elect. Emiss. 3.00 keV Ex e + Cu Second. Elect. Emiss. 3.00 keV Ex He2+ + Al Second. Elect. Emiss. 3.00 keV Ex He2+ + Cu Second. Elect. Emiss. 3.00 keV Ex

419. M. Fallavier, R. Kirsch, J. C. Poizat, J. Remillieux, J. P. Thomas + Backward electron emission from carbon and gold foils under impact of MeV Aun clusters. Nucl. Instrum. Methods Phys. Res. B 164/165, 920 (2000) Au+ + C Second. Elect. Emiss. 150.00-500.00 keV Au+ + Au Second. Elect. Emiss. 150.00-500.00 keV

420. C. D. Denton, T. Jalowy, H. Luna, J. Fiol, D. Fregenal, S. Suarez, G. Bernardi, A. D. Gonzalez, N. R. Arista, K. 0. Groenveld Minimum in the distribution of electrons emitted from solids in the backward direction. Nucl. Instrum. Methods Phys. Res. B 164/165, 927 (2000) H+ + C Second. Elect. Emiss. 50.00-250.00 keV H+ + Al Second. Elect. Emiss. 50.00-250.00 keV

421. K. Kimura, G. Andou, K. Nakajima Surface-plasmon-assisted secondary-electron emission from an atomically flat LiF(OOl) sur- face. Nucl. Instrum. Methods Phys. Res. B 164/165, 933 (2000) H+ + LiF Second. Elect. Emiss. 0.50 MeV Ex

422. T. Horiki, A. Koyama Monte Carlo calculation of elastic recoil H-atom emission induced by fast electron impact. Nucl. Instrum. Methods Phys. Res. B 164/165, 986 (2000) e + SiH Sputtering 32.00 keV Th

423. J. K. N. Lindner, W. Schlosser, B. Stritzker Aluminum and aluminum nitride formation in sapphire by ion beam synthesis. Nucl. Instrum. Methods Phys. Res. B 166/167, 133 (2000)

A1+ + A12O3 Chemical Reactions 180.00 keV

424. J. C. Barbour, J. A. Knapp, D. M. Follstaedt, T. M. Mayer, K. G. Minor, D. L. Linam The mechanical properties of alumina films formed by plasma deposition and by ion irradi- ation of sapphire. Nucl. Instrum. Methods Phys. Res. B 166/167, 140 (2000) + O2 + A12O3 Chemical Reactions 30.00-320.00 eV

425. A. L. Stepanov, V. A. Zhikharev, D. E. Hole, P. D. Townsend, I. B. Khaibullin Depth distribution of Cu, Ag and Au ions implanted at low energy into insulators. Nucl. Instrum. Methods Phys. Res. B 166/167, 26 (2000)

100 Cu+ + A12O3 Sputtering 30.00-100.00 keV Cu+ + SiO2 Sputtering 30.00-100.00 keV Ag++ A12O3 Sputtering 30.00-100.00 keV Ag+ + SiO2 Sputtering 30.00-100.00 keV Au+ + A12O3 Sputtering 30.00-100.00 keV Au+ + SiO2 Sputtering 30.00-100.00 keV 426. J. A. Diniz, A. P. Sotero, G. S. Lujan, P. J. Tatsch, J. W. Swart High quality of ultra-thin silicon oxynitride films formed by low-energy nitrogen implanta- tion into silicon with additional plasma or thermal oxidation. Nucl. Instrum. Methods Phys. Res. B 166/167, 64 (2000)

N2+ + Si Chemical Reactions 5.00 keV Ex 427. A. V. Kabyshev, F. V. Konusov, A. G. Kurakov, V. V. Lopatin Properties of oxide and nitride ceramics after ion-heat modification. Nucl. Instrum. Methods Phys. Res. B 166/167, 92 (2000) C+ + BN Chemical Reactions 30.00-100.00 keV C+ + AI2O3 Chemical Reactions 30.00-100.00 keV 428. H. Kudo, N. Kanamura, K. Shibuya, K. Narumi, S. Yamamoto, H. Naramoto, K. Sumitomo, S. Seki Ion-induced electron emission from Si crystal targets covered with noncrystalline Si layers. Nucl. Instrum. Methods Phys. Res. B 168, 181 (2000) H+ + Si Second. Elect. Emiss. 0.10-3.50 MeV/amu Ex He+ + Si Second. Elect. Emiss. 0.10-3.50 MeV/amu Ex O8+ + Si Second. Elect. Emiss. 0.10-3.50 MeV/amu Ex

429. V. I. Shulga The density effects in sputtering of amorphous materials. Nucl. Instrum. Methods Phys. Res. B 170, 347 (2000) Ar+ + perturbation Sputtering 1.00 keV Th 430. O. Varenne, P.-G. Fournier, J. Fournier, B. Bellaoui, A.-I. Fake, J. Rostas, G. Taieb Internal population distribution of the B state of A1O formed by fast ion beam bombardment or laser ablation of an AI2O3 (Al) surface. Nucl. Instrum. Methods Phys. Res. B 171, 259 (2000) Kr+ + A12O3 Sputtering 5.00 keV Ex 431. E. Steinbauer, A. Schinner, O. Benka Simulation of particle-induced electron emission in aluminum and copper. Nucl. Instrum. Methods Phys. Res. B 171, 291 (2000) e + Al Second. Elect. Emiss. 0.25-3.50 MeV/amu Th e + Cu Second. Elect. Emiss. 0.25-3.50 MeV/amu Th H+ + Al Second. Elect. Emiss. 0.25-3.50 MeV/amu Th H+ + Cu Second. Elect. Emiss. 0.25-3.50 MeV/amu Th He2+ + Al Second. Elect. Emiss. 0.25-3.50 MeV/amu Th He2+ + Cu Second. Elect. Emiss. 0.25-3.50 MeV/amu Th

432. K. Kimura, S. Ooki, G. Andou, K. Nakajima Secondary-electron emission by MeV He ions reflected from a SnTe(OOl) surface: Separation of above- and below-surface processes. Phys. Rev. A 61, 012901 (2000) He+ + SnTe Second. Elect. Emiss. 1.00-2.00 MeV Ex He2+ + SnTe Second. Elect. Emiss. 1.00-2.00 MeV Ex

433. C. Lemell, J. Stockl, J. Burgdorfer, G. Betz, HP. Winter, F. Aumayr Coincidence measurements of highly charged ions interacting with a clean Au(lll) surface. Phys. Rev. A 61, 012902 (2000)

101 Ar6+ 4- Au Second. Elect. Emiss. 8.00-40.00 keV E/T Ar7+ + Au Second. Elect. Emiss. 8.00-40.00 keV E/T Ar8+ + Au Second. Elect. Emiss. 8.00-40.00 keV E/T

434. B. van Someren, P. A. Zeijlmans van Emmichoven, A. Niehaus Neutralization of He+ ions in front of an aluminum surface. Phys. Rev. A 61, 022902 (2000) He+ + Al Neutraliz., Ioniz., Diss. 0.20-5.00 keV E/T

435. B. van Someren, P. A. Zeijlmans van Eminichoven, I. F. Urazgil'din, A. Niehaus Subthreshold plasmon excitation in proton Al(lll) collisions. Phys. Rev. A 61, 032902 (2000) H+ + Al Second. Elect. Emiss. 2.00-6.00 keV Ex

436. P. Thieberger, A. L. Hanson, D. B. Steski, V. Zajic, S. Y. Zhang, H. Ludewig Secondary-electron yields and their dependence on the angle of incidence on stainless-steel surfaces for three energetic ion beams. Phys. Rev. A 61, 042901 (2000) H+ + Fe Second. Elect. Emiss. 28.00-182.00 MeV H+ + SS Second. Elect. Emiss. 28.00-182.00 MeV O8+ + Fe Second. Elect. Emiss. 28.00-182.00 MeV O8+ + SS Second. Elect. Emiss. 28.00-182.00 MeV Au31+ + Fe Second. Elect. Emiss. 28.00-182.00 MeV Au31+ + SS Second. Elect. Emiss. 28.00-182.00 MeV

437. Y. Sato, A. Higashi, D. Ohsawa, Y. Fujita, Y. Hashimoto, S. Muto Projectile charge dependence of electron emission from foils. Phys. Rev. A 61, 052901 (2000) H+ + Al Second. Elect. Emiss. 6.00 MeV/amu Ex- H+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex H+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex He2+ 4- Al Second. Elect. Emiss. 6.00 MeV/amu Ex He2+ 4- Ag Second. Elect. Emiss. 6.00 MeV/amu Ex He2+ 4- Au Second. Elect. Emiss. 6.00 MeV/amu Ex C6+ 4 Al Second. Elect. Emiss. 6.00 MeV/amu Ex C6+ 4 Ag Second. Elect. Emiss. 6.00 MeV/amu Ex 6+ Au Second. Elect. Emiss. 6.00 MeV/amu Ex c 7 + N + 4• Al Second. Elect. Emiss. 6.00 MeV/amu Ex N7+ 4 Ag Second. Elect. Emiss. 6.00 MeV/amu Ex N7+ 4 Au Second. Elect. Emiss. 6.00 MeV/amu Ex O8+ 4 Al Second. Elect. Emiss. 6.00 MeV/amu Ex O8+ 4- Ag Second. Elect. Emiss. 6.00 MeV/amu Ex O8+ 4 Au Second. Elect. Emiss. 6.00 MeV/amu Ex Nelo+ 4- Al Second. Elect. Emiss. 6.00 MeV/amu Ex Nelo+ 4- Ag Second. Elect. Emiss. 6.00 MeV/amu Ex Neio+ 4- Au Second. Elect. Emiss. 6.00 MeV/amu Ex Sii4+ + Al Second. Elect. Emiss. 6.00 MeV/amu Ex Sii4+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex Siu+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex Ar18+ + Al Second. Elect. Emiss. 6.00 MeV/amu Ex Ar18+ + Ag Second. Elect. Emiss. 6.00 MeV/amu Ex Ar18+ + Au Second. Elect. Emiss. 6.00 MeV/amu Ex

438. N. Stolterfoht, D. Niemann, V. Hoffmann, M. Rosier, R. A. Baragiola Plasmon production by the decay of hollow Ne atoms near an Al surface. Phys. Rev. A 61, 052902 (2000)

102 Ne+ + Al Second. Elect. Emiss. 4.50 keV E/T Ne2+ + Al Second. Elect. Emiss. 4.50 keV E/T Ne3+ + Al Second. Elect. Emiss. 4.50 keV E/T Ne4+ + Al Second. Elect. Emiss. 4.50 keV E/T Ne5+ + Al Second. Elect. Emiss. 4.50 keV E/T Ne6+ + Al Second. Elect. Emiss. 4.50 keV E/T

439. A. Fukui, H. Kasai, H. Nakanishi, A. Okiji Orientation dependence in the dissociative scattering of hydrogen molecules from metal surfaces: Interference of electron waves in the scattering process. Phys. Rev. B 61, 14136 (2000)

H2 + Cu Neutraliz., Ioniz., Diss. 5.00-200.00 eV

440. E. A. Sanchez, J. E. Gayone, M. L. Martiarena, 0. Grizzi, R. A. Baragiola Excitation of volume plasmons in glancing collisions of protons with Al(lll) surfaces. Phys. Rev. B 61, 14209 (2000) H+ + Al Second. Elect. Emiss. 4.00-100.00 keV

441. L. T. Hudson, N. H. Tolk, C. Bao, P. Nordlander, D. P. Russell, J. Xu Electron- and photon-stimulated desorption of atomic hydrogen from radiation-modified alkali halide surfaces. Phys. Rev. B 62, 10535 (2000) hi/ + H + KC1 Desorption 16.00-125.00 eV h.v + H + KBr Desorption 16.00-125.00 eV hz/ + H + NaCl Desorption 16.00-125.00 eV hv + H + NaF Desorption 16.00-125.00 eV hz/ + H + LiF Desorption 16.00-125.00 eV e + H + KC1 Desorption 16.00-125.00 eV e + H + KBr Desorption 16.00-125.00 eV e + H + NaCl Desorption 16.00-125.00 eV e + H + NaF Desorption 16.00-125.00 eV e + H + LiF Desorption 16.00-125.00 eV

442. A. G. Borisov, J. P. Gauyacq Electron detachment processes in H~ grazing scattering from, a LiF(OOl) surface. Phys. Rev. B 62, 4265 (2000) H"1 + LiF Reflection 100.00 eV

443. G. Kresse Dissociation and sticking of H2 on the Ni(lll), (100), and (110) substrate. Phys. Rev. B 62, 8295 (2000)

H2 + Ni Neutraliz., Ioniz., Diss. 0.60 eV Th H2 4- Ni Adsorption, Desorption 0.60 eV Th

444. A. Hoffman, A. Laikhtman, G. Comtet, L. Hellner, G. Dujardin H+ photodesorption processes induced by inner-shell excitation from defective hydrogenated diamond films surfaces studied by synchrotron radiation. Phys. Rev. B 62, 8446 (2000) hi/ + H Desorption 280.00-310.00 eV hv + H + C Desorption 280.00-310.00 eV

445. T. J. Colla, R. Aderjan, R. Kissel, H. M. Urbassek Sputtering of Au(lll) induced by 16-keV Au cluster bombardment: Spikes, craters, late emission, and fluctuations. Phys. Rev. B 62, 8487 (2000) Au+ + Au Sputtering 16.00 keV Th

103 446. M. Beuve, M. Caron, B. Gervais, H. Rothard Charge dependence of electron emission in swift heavy-ion collisions with carbon. Phys. Rev. B 62, 8818 (2000) H+ + C Second. Elect. Emiss. 9.20 MeV/amu Ex He2+ + C Second. Elect. Emiss. 9.20 MeV/amu Ex C6+ + i Second. Elect. Emiss. 9.20 MeV/amu Ex 20 c Ca + -f- C Second. Elect. Emiss. 9.20 MeV/amu Ex Ni27+ _, Second. Elect. Emiss. 9.20 MeV/amu Ex 39+ - c Mo + c Second. Elect. Emiss. 9.20 MeV/amu Ex 447. R. D. Monk, C. H. Amiss, H. Y. Guo, G. F. Matthews, G. M. McCracken, M. F. Stamp The behaviour of the apparent chemical sputtering yield in the JET tokamak. Phys. Scr. T81, 54 (1999) H + C Sputtering Ex

448. M. Balden Overview on the effects of dopants on chemical erosion and RES of carbon-based materials. Phys. Scr. T81, 64 (1999) H + C Sputtering 0.10-10.00 keV Ex D + C Sputtering 0.10-10.00 keV Ex

449. Ch. Linsmeier, J. Wanner Reactions of oxygen atoms and molecules with Au, Be, and W surfaces. Surf. Sci. 454-456, 305 (2000) O + Be Adsorption, Desorption 300.00 K O 4- W Adsorption, Desorption 300.00 K O + Au Adsorption, Desorption 300.00 K

450. D. Kolovos-Vellianitis, Th. Kammler, J. Kuppers Interaction of gaseous H atoms with Cu(100) surfaces: adsorption, absorption, and abstrac- tion. Surf. Sci. 454-456, 316 (2000) H + Cu Adsorption, Desorption 300.00 K D + Cu Adsorption, Desorption 300.00 K

451. T. Sasaki, T. Ohno Density functional study on the dissociation process of oxygen on the Al(lll) surface. Surf. Sci. 454-456, 337 (2000)

O2 + Al Neutraliz., Ioniz., Diss. 300.00 K

452. M. Portail, I. Forbeaux, N. Papageorgiou, M. Carrere, D. Roy, J. M. Layet Study by HREELS of elementary reactions on graphite surface induced by Ar+ and H+ ion bombardment. Surf. Sci. 454-456, 384 (2000) H+ + C Chemical Reactions 5.00 keV Ex H+ + H + C Chemical Reactions 5.00 keV Ex Ar+ + C Chemical Reactions 5.00 keV Ex Ar+ + H + C Chemical Reactions 5.00 keV Ex

453. D. R. Guan, X. Z. Yi, Y. J. Zheng, S. L. Ding, J. Z. Sun, J. A. Olson The effects of the motion of the surface atom on resonant charge transfer in atom-surface scattering. Surf. Sci. 457, L361 (2000) Na + W Reflection 50.00 eV Th

104 454. Z. S. Wang, G. R. Darling, S. Holloway Translation-to-rotational energy transfer in scattering of H2 molecules from Cu(lll) sur- faces. Surf. Sci. 458, 63 (2000) H2 + Cu Neutraliz., Ioniz., Diss. 1.00 eV Th 455. S. Y. Liem, J.H.R Clarke, G. Kresse Pathways to dissociation of O2 on Cu(220) surface: first principles simulations. Surf. Sci. 459, 104 (2000) O2 + Cu Neutraliz., Ioniz., Diss. 50.00-500.00 meV 456. G. Kresse, J. Hafner First-principles study of the adsorption of atomic H on Ni(lll), (100) and (110). Surf. Sci. 459, 287 (2000) H + Ni Adsorption, Desorption 300.00 K 457. B. Hammer Adsorption, diffusion, and dissociation of NO, N and O on flat and stepped Ru(OOl). Surf. Sci. 459, 323 (2000) N + Ru Adsorption, Desorption 300.00 K NO + Ru Adsorption, Desorption 300.00 K O + Ru Adsorption, Desorption 300.00 K 458. R. X. Ynzunza, R. Denecke, F. J. Palomares, J. Morais, E. D. Tober, Z. Wang, F. J. G. de Abajo, J. Liesegang, Z. Hussain Kinetics and atomic structure of O adsorption on W(110) from time- and state-resolved photo electron spectroscopy and full-solid-angle photoelectron diffraction. Surf. Sci. 459, 69 (2000) O 4- W Adsorption, Desorption 300.00 K 459. C. M. Matthews, F. Balzer, A. J. Hallock, M. D. Ellison, R. N. Zare Scattering of N2 from Ni(lll). Surf. Sci. 460, 12 (2000) N2 + Ni Neutraliz., Ioniz., Diss. 0.40 eV Ex 460. A. Tolstogouzov, S. Daolio, C. Pagura, C. L. Greenwood Neutralization of low-energy Ne+ ions scattered from metal surfaces: study by mass-resolved ion-scattering spectrometry. Surf. Sci. 460, 127 (2000) + Ne + Cu Neutraliz., Ioniz., Diss. 0.50-1.50 keV Ex Ne+ + Ag Neutraliz., Ioniz., Diss. 0.50-1.50 keV Ex Ne+ -I- Pt Neutraliz., Ioniz., Diss. 0.50-1.50 keV Ex Ne+ + Au Neutraliz., Ioniz., Diss. 0.50-1.50 keV Ex Ne+ + Cu Sputtering 0.50-1.50 keV Ex Ne+ + Ag Sputtering 0.50-1.50 keV Ex Ne+ + Pt Sputtering 0.50-1.50 keV Ex Ne+ + Au Sputtering 0.50-1.50 keV Ex 461. T. Kan, K. Mitsukawa, T. Ueyama, M. Takada, T. Yasue, T. Koshikawa Secondary ion emission processes of sputtered alkali ions from alkali/Si(100) and Si(lll). Surf. Sci. 460, 214 (2000) Ar+ + Na Sputtering 370.00 eV Ar+ + Si Sputtering 370.00 eV Ar+ + K Sputtering 370.00 eV Ar+ + Cs Sputtering 370.00 eV Ar+ + Cs + Si Sputtering 370.00 eV Ar+ + K + Si Sputtering 370.00 eV Ar+ + Na + Si Sputtering 370.00 eV

105 462. K. Morita Studies on energy distributions of species ejected from solid surfaces by means of multipho- ton resonance ionization spectroscopy. Vacuum 56, 233 (2000) Ar+ + Si Sputtering 5.00 keV Ex Ar+ + Cu Sputtering 5.00 keV Ex

463. V. I. Bachurin, P. A. Lepshin, V. K. Smirnov Angular dependences of surface composition, sputtering and ripple formation on silicon under N2+ ion bombardment. Vacuum 56, 241 (2000) + N2 + Si Sputtering 1.50-9.00 keV Ex Ar+ + Si Sputtering 1.50-9.00 keV Ex

464. A. A. Promokhov, A. S. Mosunov, S. S. Elovikov, V. E. Yurasova Features of sputtering of nitrides with various component mass ratios. Vacuum 56, 247 (2000) Ar+ + BN Sputtering 0.30-10.00 keV Th Ar+ + GaN Sputtering 0.30-10.00 keV Th Ar+ + A1N Sputtering 0.30-10.00 keV Th

465. S. F. Belykh, U. Kh. Rasulev, A. V. Samartsev, L. V. Stroev, A. V. Zinoviev High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment. Vacuum 56, 257 (2000) Au"1 + Si Sputtering 9.00-18.00 keV Ex AU2"1 + Si Sputtering 9.00-18.00 keV Ex AU3-1 + Si Sputtering 9.00-18.00 keV Ex

466. Z. Sroubek, J. Lorincik Electronic excitations in solids during impact of atomic particles. Vacuum 56, 263 (2000) He+ + GaAs Sputtering 1.00-13.00 keV Th Ar+ + Cu Sputtering 1.00-13.00 keV Th Xe+ + GaAs Sputtering 1.00-13.00 keV Th

467. V. Philipsen, J. Bastiaansen, P. Lievens, E. Vandeweert, R. E. Silverans Resonant electron transfer in the emission of ion-beam sputtered metal atoms studied by double resonance laser ionization. Vacuum 56, 269 (2000) Ar+ + Si Sputtering 3.00-15.00 keV Ex Ar+ + Co Sputtering 3.00-15.00 keV Ex Ar+ + Ni Sputtering 3.00-15.00 keV Ex

468. A. A. Pisarev, A. M. Vaitonene Sorption of athermal hydrogen atoms. Vacuum 56, 275 (2000) H + Ni Desorption Th H + Nb Desorption Th H + Ni Trapping, Detrapping Th H + Nb Trapping, Detrapping Th H 4- Ni Adsorption, Desorption Th H + Nb Adsorption, Desorption Th

469. A. Bardamid, V. Bryk, V. V. Konovalov, D. V. Orlinskij, A. Shtan, A. Shapoval, S. Solodovchenko, V. Voitsenya, K. Yakimov, N. Zakharenko Erosion of steel under bombardment with ions of a deuterium plasma. Vacuum 58, 10 (2000)

106 H+ +Fe Sputtering 0.10-1.50 keV Ex H+ + SS Sputtering 0.10-1.50 keV Ex D+ + Fe Sputtering 0.10-1.50 keV Ex D+ + SS Sputtering 0.10-1.50 keV Ex

3.4 Particle Beam-Matter Interactions

470. G. Lulli, M. Bianconi, S. Solmi, E. Napolitani, A. Camera Vacancy effects in transient diffusion of Sb induced by ion implantation of Si+ and As+ ions. J. Appl. Phys. 87, 8461 (2000) Si1+ + Sb Part. Beam-Mat. Int. 3.00 MeV Ex Si1+ + Sb Part. Beam-Mat. Int. 3.00 MeV Ex As1+ + Sb Part. Beam-Mat. Int. 3.00 MeV Ex As1+ + Sb Part. Beam-Mat. Int. 3.00 MeV Ex

471. C. O. Reinhold, D. G. Arbo, J. Burgdorfer, B. Gervais, E. Lamour, D. Vernhet, J.-P. Rozet Enhanced population of high-1 states due to the interplay between multiple scattering and dynamical screening in ion-solid collisions. J. Phys. B 33, Llll (2000) Ar17+ + C Part. Beam-Mat. Int. 13.60 MeV/amu E/T 472. N. R. Arista Stopping of molecules and clusters. Nucl. Instrum. Methods Phys. Res. B 164/165, 108 (2000) H1+ + C Part. Beam-Mat. Int. 0.03-10.00 MeV/amu Th 1+ H2 + C Part. Beam-Mat. Int. 0.03-10.00 MeV/amu Th 1+ H3 + C Part. Beam-Mat. Int. 0.03-10.00 MeV/amu Th

473. G. Maynard, M. Chabot, D. Gardes Density effect and charge dependent stopping theories for heavy ions in the intermediate velocity regime. Nucl. Instrum. Methods Phys. Res. B 164/165, 139 (2000) perturbation1+ + C Part. Beam-Mat. Int. 1.00-4.00 MeV/amu Th perturbation14- + C Part. Beam-Mat. Int. 1.00-4.00 MeV/amu Th

474. J. M. Pitarke, I. Campillo Band structure effects on the interaction of charged particles with solids. Nucl. Instrum. Methods Phys. Res. B 164/165, 147 (2000) H1+ + Si Part. Beam-Mat. Int. 100.00 keV

475. H. Weick, H. Geissel, C. Scheidenberger, F. Attallah, T. Baumann, D. Cortina, M. Hausmann, B. Lommel, G. Munzenberg, N. Nankov, F. Nickel, T. Radon, H. Schatz, K.-H. Schmidt, J. Stadlmann, K. Summerer, M. Winkler, H. Wollnik Slowing down of relativistic few-electron heavy ions. Nucl. Instrum. Methods Phys. Res. B 164/165, 168 (2000) Au1+ + Be Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1+ + Be Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1+ + Be Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1+ + Al Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1+ + Al Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1+ + Al Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1+ -f Cu Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1+ + Cu Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1+ + Cu Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th

107 Au1* -f Ag Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* -f Ag Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* -f Ag Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* -f Ta Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* -f Ta Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* -f Ta Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* •f Au Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* -f Au Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* •f Au Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* •f Pb Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* •f Pb Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Au1* -f Pb Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* -I-Be Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* -f Be Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* -f Be Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th f Al Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th pj-jl+ „f Al Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* -f Al Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th f Cu Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th f Cu Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th •pi-jl-J- f Cu Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* f Ag Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* * Ag Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* * Ag Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* -f Ta Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* f Ta Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* f Ta Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* -1- Au Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* -f Au Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* f Au Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* •f Pb Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* f Pb Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Pb1* -•I-Pb Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1+H- Be Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* -|- Be Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* -1- Be Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* -)- Al Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* H- Al Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* -|- Al Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* -1- Cu Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* H- Cu Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* Hh Cu Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* H- Ag Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* Hh Ag Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* Hf- Ag Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* Hh Ta Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* HhTa Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* -f- Ta Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* -1- Au Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1*-1- Au Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* -t- Au Part. Beam-Mat. Int, 0.10-1.00 GeV/amu Th Bi1* -1- Pb Part. Beam-Mat. Int. 0.10-1.00 GeV/amu Th Bi1* -f-Pb Part. Beam-Mat. Int, 0.10-1.00 GeV/amu Th Bi1* -I-Pb Part. Beam-Mat. Int 0.10-1.00 GeV/amu Th 476. V. A. Khodyrev, W. M. Arnoldbik, G. A. Iferov, D. O. Boerma Study of the higher-order corrections of the impact-parameter dependence of energy loss.

108 Nucl. Instrum. Methods Phys. Res. B 164/165, 191 (2000) 1+ 1+ H + H Part. Beam-Mat. Int. 0.10-12.00 MeV Th HJ+ + D1+ Part. Beam-Mat. Int. 0.10-12.00 MeV Th H1+ 4- He1+ Part. Beam-Mat. Int. 0.10-12.00 MeV Th H1+ + Li1+ Part. Beam-Mat. Int. 0.10-12.00 MeV Th H1+ + Si Part. Beam-Mat. Int. 0.10-12.00 MeV Th C1+ + Au Part. Beam-Mat. Int. 0.10-12.00 MeV Th

477. G. de M. Azevedo, P. L. Grande, G. Schiwietz Impact-parameter dependent energy loss of screened ions. Nucl. Instrum. Methods Phys. Res. B 164/165, 203 (2000) H1+ + H Part. Beam-Mat. Int. 0.50-2.00 MeV Th He1+ + Si Part. Beam-Mat. Int. 0.50-2.00 MeV Th

478. H. Paul, A. Schinner, P. Sigmund Electronic stopping of swift lithium and carbon ions. Nucl. Instrum. Methods Phys. Res. B 164/165, 212 (2000) Li1+ + Ni Part. Beam-Mat. Int. 0.01-10.00 MeV/amu Th C1+ + C Part. Beam-Mat. Int. 0.01-10.00 MeV/amu Th

479. A. Schinner, P. Sigmund Polarization effect in stopping of swift partially screened heavy ions: Perturbative theory. Nucl. Instrum. Methods Phys. Res. B 164/165, 220 (2000) Li1+ + C Part. Beam-Mat. Int. 0.05-10.00 MeV/amu Th C1+ + C Part. Beam-Mat. Int. 0.05-10.00 MeV/amu Th Ar1+ + C Part. Beam-Mat. Int. 0.05-10.00 MeV/amu Th

480. E. E. Zhurkin, S. D. Bogdanov Investigation of the effect of high order Zi terms in electronic stopping powers on the ranges of heavy ions with energies of about 1 GeV/amu. Nucl. Instrum. Methods Phys. Res. B 164/165, 230 (2000) Ar1+ + perturbation Part. Beam-Mat. Int. 1.00 MeV/amu Th Xe1+ + perturbation Part. Beam-Mat. Int. 1.00 MeV/amu Th

481. M. Fama, G. H. Lantschner, J. C. Eckhardt, C. D. Denton, N. R. Arista Energy-angle distribution of low-energy hydrogen ions in thin aluminum and gold foils. Nucl. Instrum. Methods Phys. Res. B 164/165, 241 (2000) H1+ + Al Part. Beam-Mat. Int. 9.00 keV Ex H1+ + Au Part. Beam-Mat. Int. 9.00 keV Ex

482. N. Sakamoto, H. Ogawa, H. Tsuchida Stopping powers of Ti for protons from 0.2 to 13.5 MeV: Correction for the actual path length due to multiple scattering. Nucl. Instrum. Methods Phys. Res. B 164/165, 250 (2000) H1+ + Ti Part. Beam-Mat. Int. 0.20-13.50 MeV Ex

483. S. Ouichaoui, E. Hourani, L. Rosier, R. Bimbot, H. Beaumevieille, B. Bouzid, S. Mammeri Energy loss straggling of swift heavy ions in metal foils at E/A 2 MeV/u. Nucl. Instrum. Methods Phys. Res. B 164/165, 259 (2000) B19+ + Al Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex B19+ + Al Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex B19+ + Cu Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex B19+ + Cu Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex B19+ + Ag Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex Bw+ + Ag Part Beam-Mat. Int. 1.50-2.00 MeV/amu Ex

109 B19+ + Au Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex Bi9+ + Au Part_ Beam-Mat. Int. 1.50-2.00 MeV/amu Ex S8+ + Al Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex S8+ + Al Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex S8+ + Cu Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex S8+ + Cu Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex S8+ + Ag Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex S8+ + Ag Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex S8+ + Au Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex S8+ + Au Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex I25+ 4 Al Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex I25+ + Al Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex I25+ + Cu Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex I25+ + Cu Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex I25+ -I- Ag Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex I25+ + Ag Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex I23+ + Au Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex I25+ + Au Part. Beam-Mat. Int. 1.50-2.00 MeV/amu Ex

484. J. E. Valdes, C. Agurto, F. Ortega, P. Vargas, R. Labbe, N. R. Arista Energy loss of protons at low velocities in Pd and Au polycrystalline thin films. Nucl. Instrum. Methods Phys. Res. B 164/165, 268 (2000) H1+ + Pd Part. Beam-Mat. Int. 2.00-10.00 keV Ex H1+ + Au Part. Beam-Mat. Int. 2.00-10.00 keV Ex

485. Y. Mu, A. Burenkov, H. Ryssel, Y. Xia, L. Mei Charge-state dependence of stopping power for light ions penetrating thin carbon foils at low velocity. Nucl. Instrum. Methods Phys. Res. B 164/165, 272 (2000) B 4-Ci Part. Beam-Mat. Int. 25.00 keV Th B1+ 4 C Part. Beam-Mat. Int. 25.00 keV Th B2+4 C Part. Beam-Mat. Int. 25.00 keV Th B3+ 4 c Part. Beam-Mat. Int. 25.00 keV Th B4+ 4 c Part. Beam-Mat. Int. 25.00 keV Th B5+ 4 c Part. Beam-Mat. Int. 25.00 keV Th O + C Part. Beam-Mat. Int. 25.00 keV Th O1+ 4 c Part. Beam-Mat. Int. 25.00 keV Th O2+ 4 c Part. Beam-Mat. Int. 25.00 keV Th O3+ 4 c Part. Beam-Mat. Int. 25.00 keV Th O4+ 4 c Part. Beam-Mat. Int. 25.00 keV Th O5+ 4 c Part. Beam-Mat. Int. 25.00 keV Th O6+ 4 c Part. Beam-Mat. Int. 25.00 keV Th O7+ 4- c Part. Beam-Mat. Int. 25.00 keV Th O8+ 4 c Part. Beam-Mat. Int. 25.00 keV Th Ar 4- c Part. Beam-Mat. Int. 25.00 keV Th Ar:+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Ar2+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Ar3+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Ar4+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Ar5+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Ar6+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Ar7+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Ar8+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Ar9+ + C Part. Beam-Mat. Int. 25.00 keV Th Arlo+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Arii+ 4- C Part. Beam-Mat. Int. 25.00 keV Th Ar12+ 4 C Part. Beam-Mat. Int. 25.00 keV Th

110 13+ Ar + C Part. Beam-Mat. Int. 25.00 keV Th Ar14+ + C Part. Beam-Mat. Int. 25.00 keV Th Ar15+ + C Part. Beam-Mat. Int. 25.00 keV Th Ar16+ + C Part. Beam-Mat. Int. 25.00 keV Th Ar17+ -(- C Part. Beam-Mat. Int. 25.00 keV Th Ar18+ + C Part. Beam-Mat. Int. 25.00 keV Th

486. H. Ogawa, N. Sakamoto, H. Tsuchida Electron loss and capture cross-sections of 1.0-3.5 MeV H° and H+ in carbon foils. Nucl. Instrum. Methods Phys. Res. B 164/165, 279 (2000) hi/ + C Part. Beam-Mat. Int. 1.00-3.50 MeV Ex H1+ + C Part. Beam-Mat. Int. 1.00-3.50 MeV Ex 487. D. Semrad, M. Bergsmann, P. Bauer, R. Diez-Muino, S. A. Arnau How far are transmission measurements of pre-equilibrium stopping influenced by impact parameter selection? Nucl. Instrum. Methods Phys. Res. B 164/165, 284 (2000) H1+ + Ne Part. Beam-Mat. Int. 100.00 keV H1+ + Ne Part. Beam-Mat. Int. 100.00 keV

488. Ya. A. Teplova, I. S. Dmitriev, Yu. A. Belkova Density effects in heavy ion charge-exchange processes in gaseous and solid targets. Nucl. Instrum. Methods Phys. Res. B 164/165, 291 (2000) 2+ Be + N2 Part. Beam-Mat. Int. 0.33 MeV/arau Ex 4+ Be + N2 Part. Beam-Mat. Int. 0.33 MeV/amu Ex 3 B + + N2 Part. Beam-Mat. Int. 0.33 MeV/amu Ex 5 B + + N2 Part. Beam-Mat. Int. 0.33 MeV/amu Ex 4 N + + N2 Part. Beam-Mat. Int. 0.33 MeV/amu Ex

489. J. Sillanpaa Electronic stopping of silicon from a 3D charge distribution. Nucl. Instrum. Methods Phys. Res. B 164/165, 302 (2000) H1+ + Si Part. Beam-Mat. Int. 2.50-200.00 keV H1+ + Si Part. Beam-Mat. Int. 2.50-200.00 keV D1+ + Si Part. Beam-Mat. Int. 2.50-200.00 keV D1+ + Si Part. Beam-Mat. Int. 2.50-200.00 keV B1+ + Si Part. Beam-Mat. Int. 2.50-200.00 keV B1+ + Si Part. Beam-Mat. Int. 2.50-200.00 keV P1+ + Si Part. Beam-Mat. Int. 2.50-200.00 keV P1+ 4- Si Part. Beam-Mat. Int. 2.50-200.00 keV As1+ + Si Part. Beam-Mat. Int. 2.50-200.00 keV As1+ + Si Part. Beam-Mat. Int. 2.50-200.00 keV

490. R. Garcia-Molina, I. Abril, C. D. Denton, N. R. Arista + Exit angle, energy loss and internuclear distance distributions of H2 ions dissociated when traversing different materials. Nucl. Instrum. Methods Phys. Res. B 164/165, 310 (2000) 1+ H2 + C Part. Beam-Mat. Int. 25.00-125.00 keV 1+ H2 + Al Part. Beam-Mat. Int. 25.00-125.00 keV 491. G. G. Ross, G. Granger, M. Gauthier Depth distribution of 0.4-1.6 keV deuterium ions implanted into polystyrene and hydro- genated carbon. Nucl. Instrum. Methods Phys. Res. B 164/165, 324 (2000) H1+ + C Part. Beam-Mat. Int. 0.40-1.60 keV Ex D1+ + C Part. Beam-Mat. Int. 0.40-1.60 keV Ex

111 492. G. Schiwietz, G. Xiao, E. Luderer, P. L. Grande Auger electrons from ion tracks. Nucl. Instrum. Methods Phys. Res. B 164/165, 353 (2000) N7+ + C Part. Beam-Mat. Int. 5.00 MeV/amu Th Ar16+ + C Part. Beam-Mat. Int. 5.00 MeV/amu Th 5.00 MeV/amu Th Ni23+ + c part_ Beam-Mat. Int. Kr30+ + C Part. Beam-Mat. Int. 5.00 MeV/amu Th U68+ + C Part. Beam-Mat. Int. 5.00 MeV/amu Th 493. K. Nakajima, S. Sonobe, K. Kimura Stopping power of a KCl(OOl) surface for low energy Ne atoms. Nucl. Instrum. Methods Phys. Res. B 164/165, 553 (2000) Ne1+ + KC1 Part. Beam-Mat. Int. 15.00-30.00 keV Ex

494. H. Winter, C. Auth, A. Mertens Stopping of low energy protons during grazing scattering from a LiF(OOl) surface. Nucl. Instrum. Methods Phys. Res. B 164/165, 559 (2000) H1+ + LiF Part. Beam-Mat. Int. 0.30-25.00 keV Ex

495. J. P. Biersack Calculation of the first four moments of electronic energy loss of protons in insulators. Nucl. Instrum. Methods Phys. Res. B 166/167, 19 (2000) H1+ + Li Part. Beam-Mat. Int. 1.00-100.00 keV H1+ + C Part. Beam-Mat. Int. 1.00-100.00 keV

496. A. L. Stepanov, V. A. Zhikharev, D. E. Hole, P. D. Townsend, I. B. Khaibullin Depth distribution of Cu, Ag and Au ions implanted at low energy into insulators. Nucl. Instrum. Methods Phys. Res. B 166/167, 26 (2000) 1+ Cu + A12O3 Part. Beam-Mat. Int. 30.00-100.00 keV 1+ Cu + SiO2 Part. Beam-Mat. Int. 30.00-100.00 keV 1+ Ag + A12O3 Part. Beam-Mat. Int. 30.00-100.00 keV 1+ Ag + SiO2 Part. Beam-Mat. Int. 30.00-100.00 keV Au1+ + AI2O3 Part. Beam-Mat. Int. 30.00-100.00 keV 1+ Au + SiO2 Part. Beam-Mat. Int. 30.00-100.00 keV 497. L. Xiting, X. Zonghuang, Z. Tao, S. Yixiong Stopping powers of C, Al, Ti, Cu, Nb and Ag for 16O and 19F ions. Nucl. Instrum. Methods Phys. Res. B 168, 287 (2000) O1+ + C Part. Beam-Mat. Int. 0.40-5.70 MeV Ex O1+ + Al Part. Beam-Mat. Int. 0.40-5.70 MeV Ex O1+ + Ti Part. Beam-Mat. Int. 0.40-5.70 MeV Ex O1+ + Cu Part. Beam-Mat. Int. 0.40-5.70 MeV Ex O1+ + Nb Part. Beam-Mat. Int. 0.40-5.70 MeV Ex O1+ + Ag Part. Beam-Mat. Int. 0.40-5.70 MeV Ex F1+ + C Part. Beam-Mat. Int. 0.40-5.70 MeV Ex F1+ + Al Part. Beam-Mat. Int. 0.40-5.70 MeV Ex F1+ + Ti Part. Beam-Mat. Int. 0.40-5.70 MeV Ex F1+ + Cu Part. Beam-Mat. Int. 0.40-5.70 MeV Ex F1+ + Nb Part. Beam-Mat. Int. 0.40-5.70 MeV Ex F1+ + Ag Part. Beam-Mat. Int. 0.40-5.70 MeV Ex

498. G. de M. Azevedo, J. R. A. Kaschny, M. Behar, P. L. Grande, Ch. Klatt, S. Kallbitzer Charge equilibration of energetic He ions in the SijlOOi channel. Nucl. Instrum. Methods Phys. Res. B 168, 321 (2000) He1+ + Si Part. Beam-Mat. Int. 0.40-1.50 MeV Ex He2+ + Si Part. Beam-Mat. Int. 0.40-1.50 MeV Ex

112 499. K. Arstila An experimental method for precise determination of electronic stopping powers for heavy ions. Nucl. Instrum. Methods Phys. Res. B 168, 473 (2000) Al Part. Beam-Mat. Int. 0.70-3.50 MeV Ex A12O3 Part. Beam-Mat. Int. 0.70-3.50 MeV Ex Si Part. Beam-Mat. Int. 0.70-3.50 MeV Ex SiO2 Part. Beam-Mat. Int. 0.70-3.50 MeV Ex Zr Part. Beam-Mat. Int. 0.70-3.50 MeV Ex ZrO2 Part. Beam-Mat. Int. 0.70-3.50 MeV Ex

500. R. Cabrera-Trujillo, E. Deumens, Y. Ohrn, J. R. Sabin Impact parameter dependence of electronic and nuclear energy loss of swift ions: H+ —> He and H+ -> H. Nucl. Instrum. Methods Phys. Res. B 168, 484 (2000) H1+ + H Part. Beam-Mat. Int. 0.00-1.00 MeV Th H1+ + He Part. Beam-Mat. Int. 0.00-1.00 MeV Th

501. G. Lulli, E. Albertazzi, M. Bianconi, G. G. Bentini, R. Nipoti, R. Lotti Determination of He electronic energy loss in crystalline Si by Monte-Carlo simulation of Rutherford backscattering-channeling spectra. Nucl. Instrum. Methods Phys. Res. B 170, 1 (2000) He + Si Part. Beam-Mat. Int. 1.50-3.00 MeV Ex

502. C. Angulo, T. Delbar, J.-S. Graulich, P. Leleux Stopping powers of ions at 1 MeV per nucleon. Nucl. Instrum. Methods Phys. Res. B 170, 21 (2000) +- C Part. Beam-Mat. Int. 1.00 MeV/amu Ex 1+ Be f CH2 Part. Beam-Mat. Int. 1.00 MeV/amu Ex Be1+ f Al Part. Beam-Mat. Int. 1.00 MeV/amu Ex Be1+ 4-Ni Part. Beam-Mat. Int. 1.00 MeV/amu Ex B1+ 4 C Part. Beam-Mat. Int. 1.00 MeV/amu Ex 1+ B 4 CH2 Part. Beam-Mat. Int. 1.00 MeV/amu Ex B1+ + Al Part. Beam-Mat. Int. 1.00 MeV/amu Ex Ni Part. Beam-Mat. Int. 1.00 MeV/amu Ex tf""**l~l~ J_ C Part. Beam-Mat. Int. 1.00 MeV/amu Ex 1+ c + CH2 Part. Beam-Mat. Int. 1.00 MeV/amu Ex c1+ + Al Part. Beam-Mat. Int. 1.00 MeV/amu Ex c1+ + Ni Part. Beam-Mat. Int. 1.00 MeV/amu Ex N1+ 4 C Part. Beam-Mat. Int. 1.00 MeV/amu Ex 1+ N 4 CH2 Part. Beam-Mat. Int. 1.00 MeV/amu Ex N1+ 4 Al Part. Beam-Mat. Int. 1.00 MeV/amu Ex N1+ 4- Ni Part. Beam-Mat. Int. 1.00 MeV/amu Ex O^"*" 4 C Part. Beam-Mat. Int. 1.00 MeV/amu Ex O*"*" 4 CH2 Part. Beam-Mat. Int. 1.00 MeV/amu Ex O^"*~ 4 Al Part. Beam-Mat. Int. 1.00 MeV/amu Ex 1 O "*" 4•Ni Part. Beam-Mat. Int. 1.00 MeV/amu Ex F1+ 4- C Part. Beam-Mat. Int. 1.00 MeV/amu Ex 1+ F 4- CH2 Part. Beam-Mat. Int. 1.00 MeV/amu Ex Al Part. Beam-Mat. Int. 1.00 MeV/amu Ex Ni Part. Beam-Mat. Int. 1.00 MeV/amu Ex + C Part. Beam-Mat. Int. 1.00 MeV/amu Ex 1+ Ne 4 CH2 Part. Beam-Mat. Int. 1.00 MeV/amu Ex Ne1+ 4-Al Part. Beam-Mat. Int. 1.00 MeV/amu Ex Nex+ 4Ni Part. Beam-Mat. Int. 1.00 MeV/amu Ex

113 503. M. Moneta Stopping of slow H- to Be-like ions in an electron gas. Nucl. Instrum. Methods Phys. Res. B 170, 28 (2000) H + e Part. Beam-Mat. Int. Th H + e Part. Beam-Mat. Int. Th H* + e Part. Beam-Mat. Int. Th H* + e Part. Beam-Mat. Int. Th H1+ + e Part. Beam-Mat. Int. Th H1+ + e Part. Beam-Mat. Int. Th He + e Part. Beam-Mat. Int. Th He + e Part. Beam-Mat. Int. Th He* + e Part. Beam-Mat. Int. Th He* + e Part. Beam-Mat. Int. Th He1+ + e Part. Beam-Mat. Int. Th He1+ + e Part. Beam-Mat. Int. Th Li + e Part. Beam-Mat. Int. Th Li + e Part. Beam-Mat. Int. Th Li* + e Part. Beam-Mat. Int. Th Li* + e Part. Beam-Mat. Int. Th Li1+ + e Part. Beam-Mat. Int. • Th Li1+ + e Part. Beam-Mat. Int. Th Be + e Part. Beam-Mat. Int. Th Be + e Part. Beam-Mat. Int. Th Be* + e Part. Beam-Mat. Int. Th Be* + e Part. Beam-Mat. Int. Th Be1+ + e Part. Beam-Mat. Int. Th Be1+ + e Part. Beam-Mat. Int. Th Be Seq + e Part. Beam-Mat. Int. Th Be Seq + e Part. Beam-Mat. Int. Th Li Seq + e Part. Beam-Mat. Int. Th Li Seq + e Part. Beam-Mat. Int. Th He Seq + e Part. Beam-Mat. Int. Th He Seq + e Part. Beam-Mat. Int. Th H Seq + e Part. Beam-Mat. Int. Th H Seq + e Part. Beam-Mat. Int. Th

504. R. Bimbot, A. Khoumri, A. Fahli, S. Barbey, T. Benfoughal, M. Mirea, A. Hachem, G. Fares, R. Anne, H. Delagrange, C. Tribouillard, Y. Georget, J. C. Foy Stopping powers of gases for 40 MeV/u tellurium ions. Nucl. Instrum. Methods Phys. Res. B 170, 329 (2000) 1+ O + H2 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ O 4- H2 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex O1+ + He Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex O1+ 4- He Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ O + CH4 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ O + CH4 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ O + N2 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ O + N2 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex O1+ + Ne Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex O1+ + Ne Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex O1+ + Kr Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex O1+ + Kr Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ Ar + H2 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ Ar + H2 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex Ar1+ + He Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex Ar1+ + He Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ Ar -I- CH4 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex

114 1+ Ar CH4 Part. Beam-Mat. Int. 25.00-40.,00 MeV/amu Ex 1+ Ar N2 Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex 1+ Ar N2 Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Ar1+ Ne Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Ar1+ Ne Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Ar1+ Kr Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Ar1+ Kr Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex 1+ Kr H2 Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex 1+ Kr H2 Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Kr1+ + He Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Kr1+ + He Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex 1+ Kr + CH4 Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex 1+ Kr CH4 Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex 1+ Kr N2 Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex 1+ Kr N2 Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Kr1+ Ne Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Kr1+ Ne Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Kr1+ Kr Part. Beam-Mat. Int. 25.00-40.,00 MeV/amu Ex Kr1+ Kr Part. Beam-Mat. Int. 25.00-40.,00 MeV/amu Ex 1+ Te H2 Part. Beam-Mat. Int. 25.00-40J.00 MeV/amu Ex 1+ Te H2 Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Te1+ + He Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Te1+ + He Part. Beam-Mat. Int. 25.00-40.,00 MeV/amu Ex 1+ ,00 MeV/amu Ex Te CH4 Part. Beam-Mat. Int. 25.00-40. 1+ .00 MeV/amu Ex Te CH4 Part. Beam-Mat. Int. 25.00-40. 1+ Part. Beam-Mat. Int. ,00 MeV/amu Ex Te N2 25.00-40. 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Te N2 25.00-40. Te1+ Ne Part. Beam-Mat. Int. 25.00-40.,00 MeV/amu Ex Te1+ Ne Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Te1+ Kr Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex Te1+ Kr Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Xe H2 25.00-40. 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Xe H2 25.00-40. Xe1+ + He Part. Beam-Mat. Int. 25.00-40,.00 MeV/amu Ex Xe1+ + He Part. Beam-Mat. Int. 25.00-40,.00 MeV/amu Ex 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Xe + CH4 25.00-40 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Xe CH4 25.00-40 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Xe N2 25.00-40 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Xe N2 25.00-40 Xe1+ Ne Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex Xe1+ Ne Part. Beam-Mat. Int. 25.00-40..00 MeV/amu Ex Xe1+ Kr Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex Xe1+ Kr Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex Part. Beam-Mat. Int. .00 MeV/amu Ex H2 25.00-40 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Pb H2 25.00-40 Pb1+ + He Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex Pb1+ + He Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Pb + CH4 25.00-40 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Pb CH4 25.00-40 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Pb N2 25.00-40 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Pb + N2 25.00-40 1+ Part. Beam-Mat. Int. .00 MeV/amu Ex Pb + Ne 25.00-40 1+ Part. Beam-Mat. Int. LOO MeV/amu Ex Pb + Ne 25.00-40 1+ Part. Beam-Mat. Int. 1.00 MeV/amu Ex Pb + Kr 25.00-40 1+ Part. Beam-Mat. Int. '.00 MeV/amu Ex Pb + Kr 25.00-40 Part. Beam-Mat. Int. i.OO MeV/amu Ex H 25.00-40 2 Part. Beam-Mat. Int. 1.00 MeV/amu Ex H2 25.00-40

115 U1+ + He Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex U1+ + He Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ U + CH4 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ U + CH4 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ U + N2 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex 1+ U + N2 Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex U1+ + Ne Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex U1+ + Ne Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex U1+ + Kr Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex U1+ + Kr Part. Beam-Mat. Int. 25.00-40.00 MeV/amu Ex

505. L. E. Porter Analyses of stopping power measurements for 0.90-2.50 MeV protons and deuterons travers- ing AI2O3 targets. Nucl. Instrum. Methods Phys. Res. B 170, 35 (2000) H1+ + AI2O3 Part. Beam-Mat. Int. 0.90-2.50 MeV Th 1+ D + A12O3 Part. Beam-Mat. Int. 0.90-2.50 MeV Th

506. H. Erramli, M. A. Misdaq, G. Blondiaux Determination of the electronic energy loss of light ions in a silicon lattice by using the transmission ion channeling method. Nucl. Instrum. Methods Phys. Res. B 170, 362 (2000) H1+ + Si Part. Beam-Mat. Int. 1.00 MeV Ex D1+ + Si Part. Beam-Mat. Int. 1.00 MeV Ex He1+ + Si Part. Beam-Mat. Int. 1.00 MeV Ex

507. L. Glazov, P. Sigmund Energy-loss spectra of charged particles in the presence of charge exchange: Addendum on 6Li spectra. Nucl. Instrum. Methods Phys. Res. B 170, 39 (2000) Li2+ + C Part. Beam-Mat. Int. 63.40 MeV Th Li3+ + C Part. Beam-Mat. Int. 63.40 MeV Th

508. I. E. Mozolevski, P. L. Grande On the use of the backward Fokker-Planck equation to calculate range profiles. Nucl. Instrum. Methods Phys. Res. B 170, 45 (2000) B1+ + Si Part. Beam-Mat. Int. 0.10-10.00 MeV Th

509. E. Steinbauer, A. Schinner, 0. Benka Simulation of particle-induced electron emission in aluminum and copper. Nucl. Instrum. Methods Phys. Res. B 171, 291 (2000) e + Al Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th e + Cu Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th H1+ + Al Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th H1+ + Al Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th H1+ + Cu Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th H1+ + Cu Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th He2+ + Al Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th He'2+ + Al Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th He2+ + Cu Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th He2+ + Cu Part. Beam-Mat. Int. 0.25-3.50 MeV/amu Th

510. Y. Hoshino, T. Okazawa, T. Nishii, T. Nishimura, Y. Kido Correction of Ziegler's stopping powers of Al, Si and their oxides for MeV He ions. Nucl. Instrum. Methods Phys. Res. B 171, 409 (2000)

116 + o Part. Beam-Mat. Int. 1.10-2.60 MeV Ex + Al Part. Beam-Mat. Int. 1.10-2.60 MeV Ex Part. Beam-Mat. Int. 1.10-2.60 MeV Ex + A12O3 + Si Part. Beam-Mat. Int. 1.10-2.60 MeV Ex Part. Beam-Mat. Int. 1.10-2.60 MeV Ex + SiO2 511. Y. Li, C. Tan, J. Zhang, C. Xue, H. Xu, P. Liu, L. Wang Implanted dopant and associated damage profile in MeV 166Er+ implanted silicon. Phys. Lett. A 264, 459 (2000) Er1+ + Si Part. Beam-Mat. Int. 2.00 MeV Ex

512. L. E. M. Campbell, M. A. Green, M. J. Brunger, P. J. 0. Teubner, D. C. Cartwright Determination of differential cross sections for electron-impact excitation of electronic states of molecular oxygen. Phys. Rev. A 61, 022706 (2000)

e + O2 Part. Beam-Mat. Int. 6.00-18.00 eV E/T

513. H. Ogawa, N. Sakamoto, N. Shiomi-Tsuda, H. Tsuchida Emergent-angle-dependent charge-state distributions of 2-MeV 4He transmitted through a thin carbon foil. Phys. Rev. A 61, 032717 (2000) He2+ + C Part. Beam-Mat. Int. 2.00 MeV Ex

514. A. Blazevic, H. G. Bohlen, W. Von Oertzen Charge-state changing processes for Ne ions passing through thin carbon foils. Phys. Rev. A 61, 032901 (2000) Ne6+ + C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne6+ C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne6+ Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne6+ Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne7+ C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne7+ C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne7+ Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne7+ Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne8+ C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne8+ C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne8+ Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne8+ Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne9+ C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne9+ C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne9+ Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne9+ Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T Nelo+ + C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Nelo+ + C Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne10+ + Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T Ne10+ + Nb Part. Beam-Mat. Int. 2.00 MeV/amu E/T

515. J. O. Jensen, P. Sigmund Electronic stopping of swift partially stripped molecules and clusters. Phys. Rev. A 61, 032903 (2000) H + C Part. Beam-Mat. Int. Th H2 + C Part. Beam-Mat. Int. Th C + C Part. Beam-Mat. Int. Th C2 + C Part. Beam-Mat. Int. Th

117 516. E. P. Kanter, R. W. Dunford, D. S. Gemmell, M. Jung, T. LeBrun, K. E. Rehm, L. Young Evolution of beam-foil-excited Rydberg states on femtosecond time scales. Phys. Rev. A 61, 042708 (2000) Kr34+ + C Part. Beam-Mat. Int. 700.00 MeV Kr34+ + C Part. Beam-Mat. Int. 700.00 MeV

517. M. Bergsmann, W. Raab, G. Schrenk, F. Kastner, R. Diez Muino, A. Arnau, A. Salin, P. Bauer, P. M. Echenique Phase effect in stopping of H ions in Mg. Phys. Rev. B 62, 3153 (2000) H1+ + Mg Part. Beam-Mat. Int. 15.00-650.00 keV/amu D1+ + Mg Part. Beam-Mat. Int. 15.00-650.00 keV/amu

518. I. Nagy, Ch. Eppacher, D. Semrad Stopping power of solid targets for slow helium ions. Phys. Rev. B 62, 5270 (2000) Mg Part. Beam-Mat. Int. 0.05-1.00 MeV E/T Al Part. Beam-Mat. Int. 0.05-1.00 MeV E/T Si Part. Beam-Mat. Int. 0.05-1.00 MeV E/T He^ Ca Part. Beam-Mat. Int. 0.05-1.00 MeV E/T Cr Part. Beam-Mat. Int. 0.05-1.00 MeV E/T He1+ Fe Part. Beam-Mat. Int. 0.05-1.00 MeV E/T Zn Part. Beam-Mat. Int. 0.05-1.00 MeV E/T Ge Part. Beam-Mat. Int. 0.05-1.00 MeV E/T Rb Part. Beam-Mat. Int. 0.05-1.00 MeV E/T He1+ Sr Part. Beam-Mat. Int. 0.05-1.00 MeV E/T He1+ Y Part. Beam-Mat. Int. 0.05-1.00 MeV E/T He1+ Ag Part. Beam-Mat. Int. 0.05-1.00 MeV E/T He1+ Cd Part. Beam-Mat. Int. 0.05-1.00 MeV E/T Sn Part. Beam-Mat. Int. 0.05-1.00 MeV E/T He1+ Au Part. Beam-Mat. Int. 0.05-1.00 MeV E/T He1+ Pb Part. Beam-Mat. Int. 0.05-1.00 MeV E/T Bi Part. Beam-Mat. Int. 0.05-1.00 MeV E/T

519. M. Beuve, M. Caron, B. Gervais, H. Rothard Charge dependence of electron emission in swift heavy-ion collisions with carbon. Phys. Rev. B 62, 8818 (2000) H1+~ + C Part. Beam-Mat. Int. 9.20 MeV/amu Ex He2+ Hh C Part. Beam-Mat. Int. 9.20 MeV/amu Ex C6+ + Part. Beam-Mat. Int. 9.20 MeV/amu Ex 20+ c Ca + c Part. Beam-Mat. Int. 9.20 MeV/amu Ex Ni27+ -f C Part. Beam-Mat. Int. 9.20 MeV/amu Ex Mo39+ + c Part. Beam-Mat. Int. 9.20 MeV/amu Ex

3.5 Interactions of Atomic Particles with Fields

520. J. A. del Val, J. A. Aparicio, S. Mar Stark width measurements of Ne II spectral lines. Astrophys. J., Part 1 536, 998 (2000) Ne1+ Int. At. Part. Fields 25.00-45.00 MeV Ex

521. M. A. Gonzalez, M. A. Gigosos Tables of dipolar emission and two-photon absorption Lyman-a profiles. Astrophys. J. Suppl. Ser. 145, 491 (2000)

118 H Int. At. Part. Fields 2.00-100.00 K

522. Y. Duan, W.-K. Liu, J.-M. Yuan + Classical dynamics of H2 in intense laser fields: a planar model. Chem. Phys. Lett. 322, 181 (2000) 1+ H2 Int. At. Part. Fields Th

523. S. Mar, J. A. Aparicio, M. I. de la Rose, J. A. del Val, M. A. Gigosos, V. R. Gonzalez, C. Perez Measurement of Stark broadening and shift of visible N II lines. J. Phys. B 33, 1169 (2000) N1+ Int. At. Part. Fields 17.00-29.00 kK Ex 524. S. Geltman Ionization of H(ls) by laser pulses: a close-coupling study. J. Phys. B 33, 1967 (2000) H Int. At. Part. Fields 4.90-15.00 eV Th

525. E. Oks, T. Uzer Multifrequency resonance transitions in the ionization of hydrogen by a single-frequency microwave field. J. Phys. B 33, 1985 (2000) H Int. At. Part. Fields E/T

526. S. Sahoo, Y. K. Ho The complex absorbing potential method (CAP) to study the Stark effect in hydrogen and lithium. J. Phys. B 33, 2195 (2000) H Int. At. Part. Fields 0.54 eV Th Li Int. At. Part. Fields 0.54 eV Th

527. E. Oks, T. Uzer Rydberg atoms as sensitive magnetic probes. J. Phys. B 33, 2207 (2000) H Int. At. Part. Fields Th

528. J. P. Connerade, V. K. Dolmatov, S. T. Manson On the nature and origin of confinement resonances. J. Phys. B 33, 2279 (2000) Li2+ Int. At. Part. Fields 30.00 eV Th 529. A. A. Kamenski, V. D. Ovsiannikov Field dependence of the hydrogen Stark line intensities. J. Phys. B 33, 491 (2000) H Int. At. Part. Fields Th 530. W. Becken, P. Schmelcher Non-zero angular momentum states of the helium atom in a strong magnetic field. J. Phys. B 33, 545 (2000) He Int. At. Part. Fields 272.00 eV

531. W. A. Bryan, J. H. Sanderson, A. El-Zein, W. R. Newell, P. F. Taday, A. J. Langley Laser-induced Coulomb explosion, geometry modification and reorientation of carbon diox- ide. J. Phys. B 33, 745 (2000)

CO2 Int. At. Part. Fields Ex

119 532. D. Pitrelli, D. Bauer, A. Macchi, F. Cornolti Ionization of the Thomas-Fermi atom in intense laser fields: the static limit revisited. J. Phys. B 33, 829 (2000) perturbation Int. At. Part. Fields Th

533. B. Ueberholz, S. Kuhr, D. Frese, D. Meschede, V. Gomer Counting cold collisions. J. Phys. B 33, L135 (2000) Cs + Cs Int. At. Part. Fields 1.00 K Ex

534. J. P. Connerade, V. K. Dolmatov, S. T. Manson Controlled strong non-dipole effects in photoionization of confined atoms. J. Phys. B 33, L275 (2000) H Int. At. Part. Fields 15.00-250.00 eV

535. T. Bartsch, S. Schippers, M. Beutelspacher, S. Bohm, M. Grieser, G. Gwinner, A. A. Saghiri, G. Saathoff, R. Schuch, D. Schwalm, A. Wolf, A. Mueller Enhanced dielectronic recombination of lithium-like Ti19+ ions in external E x B fields. J. Phys. B 33, L453 (2000) e + Ti19+ Int. At. Part. Fields 53.00 eV Ex

536. I. S. Lim, J. K. Laerdahl, P. Schwerdtfeger The static electric dipole polarizability of Rb+. J. Phys. B 33, L91 (2000) Rb1+ Int. At. Part. Fields 248.00 eV

537. J. P. Shaffer, W. Chalupczak, N. P. Bigelow Ultracold collisions in saturating optical fields: Universal behavior in the entrance channel. Phys. Rev. A 61, 011404 (2000) Na + Na Int. At. Part. Fields Ex Cs + Cs Int. At. Part. Fields Ex

538. K. M. Jones, P. D. Lett, E. Tiesinga, P. S. Julienne Fitting line shapes in photoassociation spectroscopy of ultracold atoms: A useful approxi- mation. Phys. Rev. A 61, 012501 (2000) Na + Na Int. At. Part. Fields 0.50 K Th

539. T. Mercouris, S. I. Themelis, C. A. Nicolaides Nonperturbative theory and computation of the nonlinear response of He to dc and ac fields. Phys. Rev. A 61, 013407 (2000) He Int. At. Part. Fields 4.90-26.40 eV Th

540. L. Feng, Y.-K. Ho Quantum simulation of collinear p + H collisions in an intense laser field. Phys. Rev. A 61, 023407 (2000) H1+ + H Int. At. Part. Fields 2.72 eV Th

541. S. I. Themelis, T. Mercouris, C. A. Nicolaides Quantum-mechanical versus semiclassical calculations of dc-field-induced tunneling rates for helium for field strengths in the range 0.067-1.0 a.u. Phys. Rev. A 61, 024101 (2000) He Int. At. Part. Fields 1.36-13.61 eV Th

120 542. S. A. Hopkins, S. Webster, J. Arlt, P. Bance, S. Cornish, 0. Marago, C. J. Foot Measurement of elastic cross section for cold cesium collisions. Phys. Rev. A 61, 032707 (2000) Cs + Cs Int. At. Part. Fields Ex

543. C. Rangan, A. R. P. Rau Photodetachment in combined static and dynamic electric fields. Phys. Rev. A 61, 033405 (2000) H-1 Int. At. Part. Fields 0.50-1.20 eV Th

544. J. T. Lin, S. H. Lin, T. F. Jiang Dissociation and dynamics of the high-vibrational-state HF molecules under intense half- cycle and few-cycle pulses. Phys. Rev. A 61, 033407 (2000) HF Int. At. Part. Fields Th

545. M. Yu. Kuchiev, V. N. Ostrovsky Multiphoton radiative recombination of electron assisted by a laser field. Phys. Rev. A 61, 033414 (2000) e + H Int. At. Part. Fields 0.10-10.00 eV Th

546. A. Scrinzi Ionization of multielectron atoms by strong static electric fields. Phys. Rev. A 61, 041402 (2000) He Int. At. Part. Fields 0.10-10.00 K Th

547. J. M. Vogels, R. S. Freeland, C. C. Tsai, B. J. Verhaar, D. J. Heinzen Coupled singlet-triplet analysis of two-color cold-atom photoassociation spectra. Phys. Rev. A 61, 043407 (2000) Rb 4- Rb Int. At. Part. Fields Th

548. P. Schmelcher, T. Detmer, L. S. Cederbaum Excited states of the hydrogen molecule in magnetic fields: The singlet S states of the parallel configuration. Phys. Rev. A 61, 043411 (2000)

H2 Int. At. Part. Fields 2.72 keV Th

549. N. Herschbach, P. J. J. Tol, W. Hogervorst, W. Vassen Suppression of Penning ionization by spin polarization of cold He(2 3S) atoms. Phys. Rev. A 61, 050702 (2000) He + He Int. At. Part. Fields i.0.00 K Ex

121 4 AUTHOR INDEX Abdallah M. A., 296, 343 Auth C, 380, 494 Abdulkasymov F. B., 390 Avaldi L., 114, 154 Abe Y., 328 Aymar M., 44 Aberg T., 82 Azevedo D. L., 204 Abidi S., 381 Azevedo G. de M., 477, 498 Abril I., 490 Azria R., 366 Adachi J.-L, 64 Azuma Y., 98 Aderjan R., 445 Babowski B., 23 Adoui L., 294, 300 Bacalis N. C, 273 Afaneh F., 72 Bacchus-Montabonel M. C, 292 Aggarwal K. M., 7 Bachau H., 48 Aguilar A., 233 Bachurin V. L, 463 Agufflon F., 239 Badnell N. R., 141, 145, 194 Agurto C, 484 Baer M., 223 Akao K., 220 Bahrim B., 386 Aksela H., 82 Balakrishnan N., 264 Aksela S., 82 Balashov V. V., 151 Al Khalili A., 139 Balden M., 370, 371, 448 Albertazzi E., 501 Baliyan K., 120 Alexander M. H., 265 Ballance C. P., 145 Allan M., 177, 178 Baltz A. J., 331 Allard N. F., 260 Balzer F., 459 Allouche A. R., 247, 284 Bañares L., 222 Altun Z., 96 Banas D., 306 Alvarez L, 76 Bance P., 323, 542 Amano T., 220 Bao C, 441 Amaya-Tapia A., 280 Bapat B., 274, 275 Amelink A., 109, 333 Baragiola R. A., 412, 413, 414, 438, 440 Amiss C. H., 447 Baraldi A., 362 Amorim J., 133 Baraldi C, 101 Amusia M. Ya, 77, 90 Barat M., 385 Anada S., 314 Barbey S., 504 Andersen H. H., 396 Barbour J. C, 424 Andersen T., 38 Bardamid A., 469 Anderson H., 145 Barghouty A. F., 337 Andersson K., 139 Barone P., 413 Andou G., 421, 432 Barrachina R. O., 290 Andrae D., 1 Barry H. T., 23 Ángulo C, 502 Bartsch T., 184, 535 Anne R., 504 Bartschat K., 156, 157, 158, 159, 161, 180, 193 Aoiz F. J., 222 Bastiaansen J., 401, 467 Aparicio J. A., 520, 523 Batiera G., 114 Aquilanti V., 233 Bauer D., 532 Arbo D. G., 471 Bauer P., 487, 517 Arezki B., 382 Baumann T., 304, 475 Arista N. R., 420, 472, 481, 484, 490 Bautista M. A., 78, 170 Arlt J., 323, 542 Beaumevieille H., 483 Armen G. B., 82 Becken W., 530 Arnau A., 517 Bedouet C, 300 Arnau S. A., 487 Behar M., 498 Arnoldbik W. M., 476 Beiersdorfer P., 11 Arstila K., 499 Beigman I. L., 123 Attallah F., 304, 475 Belkova Yu. A., 488 Aubert-Frecon M., 247, 284 Bell K. L., 7, 167 Aumayr F., 367, 378, 433 Bellaoui B., 430

123 Belykh S. F., 403, 465 Bozek J., 118 Benazeth C, 381, 382 Bozek J. D., 80, 115 Benfoughal T., 504 Bradshaw A. M., 24 Benka O., 417, 418, 431, 509 Braich J. S., 345 Benoit-Cattin P., 381, 382 Bray I., 54, 123, 129, 161, 166, 188, 191 Bentini G. G., 501 Braziewicz J., 306 Bergsmann M., 487, 517 Brescansin L. M., 196 Bernard J., 346 Briggs J. S., 81 Bernardi G., 420 Brix M., 123 Berrah N., 80, 110, 115, 118 Brooks R. L., 84 Berrington K. A., 128, 146 Brown G. V., 11 Bertsch G. F., 105 Brown W. L., 414 Bettega M. H. F., 205 Brozis M., 228 Betz G., 433 Brunger M. J., 132, 162, 171, 172, 195, 512 Beutelspacher M., 184, 535 Bruning K., 387 Beuve M., 446, 519 Bryan W. A., 67, 531 Beyer H.-J., 338 Bryk V., 469 Bian W., 226 Buchet-Poulizac M. C, 346 BianconiM., 470, 501 Buckman S. J., 155, 182 Bielinska-Waz D., 17 Budnar M., 341 Bielschowsky C. E., 65, 203 Buenker R. J., 324 Biemont E., 12 Burenkov A., 485 Bier sack J. P., 495 Burgdorfer J., 98, 378, 433, 471 Bigelow N. P., 312, 537 Burgess A., 129 Billing G. D., 224 Burke P. G., 29, 39, 74, 187 Bilodeau R. C, 84 Burnett K., 70 Bimbot R., 483, 504 Busalla A., 163 Bizau J. M., 118 Busnengo H. F., 342, 359 Blackadar J. M., 309 Butler K., 127 Blackwood J. E., 270 Cabrera-Trujillo R., 326, 500 Blaha M., 192 Cafarelli P., 381 Blancard C, 118 Cai M., 368 Blazevic A., 514 Calandra P., 137 Blitz M. A., 241 Camarca M., 413 Blondiaux G., 506 Camilloni R., 114 Blum K., 163 Campbell J. L., 308 Bobashev S. V., 91, 197 Campbell L., 171, 172 Bodea D., 301 Campbell L. E. M., 195, 512 Bodrenko I. V., 151 Campillo L, 474 Boerma D. O., 476 Capecchi G., 233 Bogdanov S. D., 480 Capitelli M., 254 Bohlen H. G., 514 Camera A., 470 Bohm S., 184, 535 Carney J. P. J., 100, 108, 116 Bohn J. L., 330 Caron M., 446, 519 Bollinger M. V., 363 Carrere M., 452 Bolloni A., 243 Carsky P., 199 Bonn M., 365 Cartwright D. C, 171, 172, 195, 512 Bordenave-Montesquieu A., 293 Casnati E., 101 Bordenave-Montesquieu D., 293 Cassimi A., 294, 300 Borges, I. Jr., 65 CastellaD., 341 Borisov A. G., 442 Castillo J. F., 225 Bosch F., 338 Cavalieri S., 55 BoudjemaM., 382 Cavalli S., 233 Boudouma Y., 382 Cederbaum L. S., 548 Boullant E., 251 Chaalan A., 284 Bouzid B., 483 Chabot M., 473 Bove T., 268 Chakraborty H. S., 9

124 Chalupczak W., 312, 537 Costello J. T., 37 Chami A. C, 382 Crocchianti S-, 243 Chan K. S., 237 Crothers D. S. F., 288 Chang A. H. H., 236 Crowe A., 158, 159, 161, 185 Chang J. C, 95 Cubaynes D., 118 Chang T. N., 117 Cui J., 376 Charro E., 4, 17 Curik R., 168 Chen C, 165 Curtis L. J., 13 Chen D., 219 Cvejanovic D., 161 Chen G. X., 18 Cvejanovic S., 54 Chen H., 11 CzyzewskiT., 306 Chen L., 346 D'Arcy R., 37 Chen Z., 97, 198 D'bichi N., 382 Cheng K. T., 6 Dagher M., 284 Cheng S., 13 Dai Z. W., 63 Cheng Y. S., 33 Dal Cappello C, 147 Cherepkov N. A., 77, 90, 99 Dalgarno A., 89, 264, 316, 332 Cherkani M. H., 213 Daligault J., 328 Chernysh V. S., 399 Danared H., 139 Chernysheva L. V., 77, 90 Daolio S., 460 Chesnel J.-Y., 294, 300 Darling G. R., 454 Chevreau H., 251 Das R., 349 Chiba H., 25, 44, 229 Dasgupta A., 192 Chibisov M. I., 320 Datz S., 343 Chidichimo M. C, 128 De Fazio D., 233 Chilton J. E., 209 De Paixao F. J., 133 Cho H., 182 DePaolaB. D., 268 Chu S.-L, 88 Deb N. C, 124, 212 Chung K. T., 95 Decleva P., 28, 31 Chutjian A., 125 Defrance P., 165 Chuvenkov V. V., 79 Delagrange H., 504 Ciobal. M.,351 Delahaye F., 16 Cisneros C, 76 Delbar T., 502 Cizek M., 177 Demekhin Ph. V., 36 Clague K., 161 Demir L., 69 Clare S., 269 Den Hartog E. A., 12 Clarke J. H. R., 455 Denecke R., 458 Cleff B., 409 Denis A., 346 Coat Y. Le, 366 Dentón C. D., 420, 481, 490 Cochrane R. W., 368 Derevianko A., 6 Cocke C. L., 296 Derkatch A. M., 139 Colavecchia F. D., 303 Desesquelles J., 346 Colgan J., 39, 210 Deshmukh P. C, 9 Colla T. J., 392, 445 Detmer T., 548 Combet-Farnoux F., 41 Deumens E., 326, 500 Comelli G., 362 Devdariani A. Z., 229 Comtet G., 444 Dezarnaud-Dandine C, 251 Connerade J. P., 51, 75, 528, 534 Dhal B. B., 267 Cooper I. L., 71 Dhole S. D., 406 Corchs S. E., 342 Dias E.W.B., 9 Cormier E., 48 Dickinson A. S., 71, 279, 283 Corminboeuf D., 341 Diehl S., 118 Cornelius K. R., 281 Diez-Muino R., 487, 517 Corner L., 23 Ding S., 252 Cornish S., 323, 542 Ding S. L., 453 Cornolti F., 532 Dinger A., 353, 360 Cortina D., 304, 475 Diniz J. A., 426

125 Dmitriev I. S., 488 Fang T. K., 117 Döbele H. F., 404, 405 Fang Z., 219 Dogan M., 185 Fares G., 504 Doll K.; 358 Fecher G. H., 99 Dolmatov V. K., 51, 75, 528, 534 Fedchak J. A., 10, 12 Domeke W., 177 Federman S. R., 13 Domenico G. D., 101 Feeler C. R., 47 Dong W., 359 Felfli Z., 146 Dorner R., 72 Feng L., 92, 321, 540 Dousse J.-CL, 85, 341 FengR. F., 148 Dreizler R. M., 275, 315, 322, 340 Ferleger V. Kh., 387, 389 Drira I., 260 Feuerstein B., 144 Du J., 372 Filipovic D. M., 160, 169 Duan Y., 522 Fini L., 55 Duan Y. B., 134, 258 Fiol J., 420 Dubois A., 285, 294, 299, 300, 318 Flammini R., 154 Dujardin G., 444 Flower D. R., 298 Dunford R. W., 338, 516 Fojon O. A., 142 Durak R., 121 Folkmann F., 38 Dzhemilev N. Kh., 394 Follstaedt D. M., 424 Echenique P. M., 517 Fontes C. J., 158, 159 Eckhardt J. C, 481 Foot C. J., 323, 542 Eckstein W., 373, 398, 399 Forbeaux I., 452 Eder H., 367 Foster-Woods V. J., 218 Edwards A. K., 173 Four nier J., 430 Ehrenreich T., 268 Fournier P.-G., 430 Ehresmann A., 36, 62 Foy J. C, 504 Eichler A., 350 Franzén K. Y., 102, 119 Eichler J., 122 Frechard F., 351 El Mkhanter R., 147 FreegardeT., 23 El-Zein A., 67, 132, 531 Freeland R. S., 335, 547 ElizagaD., 282 Fregenal D., 420 Ellison M. D., 459 Fremont F., 294, 300 Elovikov S. S., 464 Frese D., 73, 295, 533 Engel E., 322 Fritts M. C, 13 Engel V., 60 Froese-Fischer C, 56 Eppacher Ch., 518 Fujita Y., 57, 437 Eramo R., 55 Fukui A., 439 Erlandsson B., 310 Funk S., 365 Erman P., 102, 119 Furian S., 31 Erramli H., 506 Fursa D. V., 123, 129, 161 Errea L. F., 272, 282, 297 Furuya K., 130, 152 Ertugrul M., 69 GadeaF. X., 279,289 Esaulov V. A., 384 Gadi M. F., 213 Esposito F., 254 Gail M., 271 Eustatiu I. G., 203 Gajda M., 34 Evans M., 22 Galdikas A., 410 Eve J. K., 354 Gallup G. A., 207 Faarinen M., 310 Ganas P. S., 15 Fabrikant I. L, 207, 276, 320 Gao J. F., 113 Fahli A., 504 Garcia-Molina R., 490 Fainelli E., 154 Gardes D., 473 Fake A.-L, 430 Garibotti C. R., 303 Fakherddin K., 284 Gasaneo G., 303 Fallavier M., 419 Gauthier M., 491 Fama M., 481 Gauyacq J. P., 442 Fan Y., 372 Gayone J. E., 440

126 Geddes J., 288 Guo D.-S., 113 Geissei H., 304, 475 Guo H. Y., 447 Geltman S., 45, 524 Guo X., 158, 159, 191 Gemmell D. S., 516 Gupta G. P., 8, 124, 212 Georget Y., 504 Gutierrez F. A., 383 Gervais B., 446, 471, 519 Guvenc Z. B., 408 Gianturco F. A., 168 Gwinner G., 184, 535 Gibson G. N., 107 Habets B., 403 Gibson J. C, 155 Hachem A., 504 Giessen H., 72 Hadinger G., 247 Gigosos M. A., 521, 523 Hafher J., 350, 351, 456 Gilbody H. B., 297 Haidarov A.A., 399 Gillen D. R., 297 Hall R. J., 64 Gillmann D., 405 Hallock A. J., 459 Giménez X., 233 Hammer B., 457 Giugni A., 55 Han R., 372 Giuliani J. L., 192 Hancock G. C, 23 Glass D. H., 29, 39, 74 Hanne G. F., 180 Glazov L., 507 Hansen J. P., 285, 296, 299 Gnaser H., 393 Hanson A. L., 436 Godowski P. J., 362 Harel C, 383 Godunov A. L., 293 Harich S. A., 261 Goehlich A., 404, 405 Harland P. W., 248 Gomer V., 73, 295, 533 Harris C. L., 11 Gonzalez A. D., 420 Harrison N. M., 358 Gonzalez M. A., 521 Hasbani R., 48 Gonzalez V. R., 523 Hashimoto Y., 437 GorczycaT. W., 94 Hatano Y., 62 Gorfinkiel J. D., 282 Haugen H. K., 84 Gor se C, 254 Hausmann M., 304, 475 Grande P. L., 477, 492, 498, 508 Havener C. C, 343 Granger G., 491 Hawkins O.T.W., 23 Graulich J.-S., 502 HayaishiT., 57,62 Green M. A., 195, 512 Hayderer G., 378 Greenwood C. L., 460 Hayes P. A., 157 Greenwood J. B., 125 Hedqvist A., 287 Gribakin G. F., 68 Heideman H. G. M., 109, 333 Grieser M., 184, 535 Heiland W., 387 Griffin D. C, 141, 210 Heinrich R. R., 391, 394, 395 Grimbert D., 239 Heinzen D. J., 335, 547 Grin M., 147 Hellborg R., 310 Grizzi O., 440 Hellner L., 444 Groenveld K. O., 319, 420 Helmi M. S., 256 Grosjean D. E., 414 Hepburn J. W., 22 Groso A., 362 Hernandez J. M., 280 Gross A., 350 Herrero V. J., 222 Gross E.K.U., 60 Herschbach N., 336, 549 Grum-Grzhimailo A. N., 156 Hess Ch., 365 Grun N., 271, 277 Hessel R, 369 Gu J.-P., 324 Higashi A., 437 Guan D. R., 453 Higgins K., 39 Guet C, 328 HikosakaY., 59 Guillaume L., 294 Hippler R-, 408 Guillemot L., 384 Hiraya A., 25 Gulley R. J., 155, 182 Hirsch G., 324 Gulyas L., 267, 342 Hishkawa A., 50 Guo C, 107 Hitchcock A. P., 203

127 HiyamaM., 93 Iwasaki K., 59 Ho Y.-K., 92, 321, 526, 540 Izumisawa M., 57 Hock A., 322 Jablonski A., 216 Hoffman A., 444 Jacobs R. M .J., 23 Hoffman V., 377 Jacobson K. W., 363 Hoffmann S. V., 362 Jagutzki O., 72 Hoffmann V., 438 Jakubassa-Amundsen D. H, 319 Hogervorst W., 336, 549 Jalowy T., 319, 420 Hole D. E., 425, 496 James G. K., 191 Holloway S., 454 Jamieson M. J., 89, 221, 316, 332 Holweger H., 3 Jaron A., 40 Hörnern M. G. P., 196 Jarque E. C, 374 Hopersky A. N., 52, 79 Jaskola M., 306 Hopkins S. A., 323, 542 Jensen J. O., 515 Hopman T. L., 308 Jequier S., 383 Horacek J., 177, 199 Ji Q., 148 Horbatsch M., 340 Jiang T. F., 544 Horiki T., 422 Jiang Y., 103 Horsdal-Pedersen E., 268 Jin B., 230 Horvat V., 309 Johansen A., 396 Hoshino M., 155 Johansson S., 2, 5 Hoshino Y., 510 Johnson W. R., 6, 202 Hoszowska J., 85, 341 Jolicard G., 224 Hotop H., 27 Jones K. M., 109, 313, 333, 538 Hourani E., 483 Jones N., 343 Hsu C.-L., 357 Jones S. E., 211 Hsu C.-W., 22 Jouin H., 383 Huang M.-T., 98 Julienne P. S., 313, 538 Huber B. A., 302 Jung M., 516 Hudson L. T., 441 Jurek M., 199 Huetz A., 41 Kabyshev A. V., 427 Hundur Y., 408 Kallbitzer S., 498 Huo W. M., 131 Kam K. F., 176 Hussain Z., 458 Kamber E. Y., 296 Husson X., 300 Kamenski A. A., 529 Hwang D.-Y., 244, 361 Kameta K., 62 Ibuki T., 25 Kammler Th., 450 Icelli O., 69 Kan T., 461 Ichihara A., 122 Kanamura N., 428 Iferov G. A., 476 Kanik L, 158, 159, 191 IgaL, 196 Kanter E. P., 516 Ikeda Y., 372 Karawajczyk A., 102, 119 Ilakovac K., 104, 111, 206 Kasai H., 439 Imanishi N., 314, 402 Kasai T., 364 Ingr M., 199 Kaschny J. R. A., 498 Ionescu D. C, 338 Kasperski G., 153 Irving R. E., 13 Kastner F., 517 Ishigami R., 406 Kasugai Y., 372 Ishiguro E., 25 Ishikawa D., 406 Kato D., 66 Ishikawa K., 130 Kavcic M., 341 Ito K., 44, 64 Kawata J., 416 Ito S., 327 Keenan F. P., 7, 218 Itoh A., 314, 402 Keller S., 274, 275 Ivanov P. B., 293 Kempgens B., 24 Ivanov V. K., 68 Kennedy E. T., 37, 118 Iwamae A., 50 Keskiewicz P., 409 Khaibullin I. B., 425, 496

128 Khakoo M. A., 158, 159, 191 Kudo H., 415, 428 Khalal K., 382 Kuhr S., 73, 295, 533 Khare S. P., 186 Kukk E., 80, 110, 115 Kheifets A. S., 54 Kulikauskas V. S., 399 Khemliche H., 385 Kumar A., 325 Khodyrev V. A., 476 Kumar S. V. K., 294 Khoumri A., 504 Kumaran S. S., 235 Kido Y.,510 Kundliya R., 120 Kielkopf J. F., 260 Kuo C. T., 232 Kiisk M., 310 Kuppers J., 353, 360, 450 Kim Y. H., 355 Kurakov A. G., 427 Kim Y.-K., 131, 202 Kurnaev V. A., 407 Kimura K., 379, 421, 432, 493 Kurosaki Y., 238, 257 KimuraM., 324 Kurosawa T., 229 Kirchner T., 315, 340 Kurpick P., 386 Kirsch R., 419 Kwong V. H. S., 219 Kissel L., 116 Labbe R., 484 Kissel R., 445 Lablanquie P., 41 Kitajima M., 62, 155 LacombeS., 384 Kivimaki A., 24 Laerdahl J. K., 536 Kjeldsen H., 38 Lagana A., 243 Klatt Ch., 498 Lagutin B. M., 36 Kleinekathofer U., 242 Laikhtman A., 444 Kleyn A. W., 351 Lamour E., 471 Knapp J. A., 424 Langer B., 110 Knight P. L., 70 Langhoff P. W., 80 Knudsen H., 38 Langley A. J., 67, 531 Kock M., 3 Lantschner G. H., 481 Kok A., 255 Larsen M., 191 Kollmus H., 317 Larsson M., 139 Kolovos-Vellianitis D., 450 Lauer S., 36 Kong F., 240 Lavin C, 14 Konovalov V. V., 469 Lawler J. E., 10, 12 Konusov F. V., 427 Layet J. M., 452 Koppe H. M., 24 Le Padellec A., 139 Korek M., 284 Le Rouzo H., 35 Korol A. V., 68, 375 LeBrun T., 516 Koshikawa T., 461 Lebedev V. S., 276 Kosugi N., 24 Leber E., 27 Koto E., 152 Lebius H., 377 Kotochigova S., 334 Leckrone D. S., 2, 5 Kouchi N., 62 Leclercq N., 115 Kowalski A., 228 Lee M.-T., 196 Koyama A., 422 Lee S.-H., 231 Koyano L, 25 Lee T. G., 267 Kozhuharov C, 338 Lein M., 60 Kramer A., 338 Leininger T., 279, 289 Krause H. T., 343 Leleux P., 502 Kresse G., 443, 455, 456 Lelievre D., 294 Kretschmer W., 306 Lemell C, 378, 433 Krishnamurthy M., 294 Lepshin P. A., 463 Kristensen L., 268 Lett P. D., 109, 313, 333, 538 Krok F., 409 Li J.-M., 103 Krstic P. S., 89, 316 Li M.-Y., 107 Krzywinski J., 34 Li Y., 511 Kubala-Kukus A., 306 Li Z. S., 2, 5, 63 Kuchiev M. Yu., 68, 201, 545 Liera S. Y., 455

129 Liesegang J., 458 Maloney C. M., 193 Liesen D., 338 Mammeri S., 483 Lievel H., 36 Manakov N. L., 100, 108 Lievens P., 401, 467 Mandai A., 345 Lim I. S., 536 Mangan M. A., 138 Lim K. P., 235 Mann R., 274, 317 Lima M. A. P., 133, 204 Manson S. T., 9, 51, 75, 77, 90, 96, 118, 528, 534 Lin C. C, 209 Manthe U., 226 Lin C. D., 267, 329 Mao W., 240 Lin J. J., 261 Mapstone B., 162 Lin J. T., 544 Mar S., 520, 523 Lin S. H., 236, 544 Marago O., 323, 542 Linam D. L., 424 Margitich M. O., 174 Lindner J. K. N., 423 Margitich N. A., 136 Lindsay B. G., 138 Marinkovic B. P., 160, 169 Lino J. L. S., 133 Marinyuk V. V., 407 Linsmeier Ch., 449 Martiarena M. L., 440 Liu J. C, 33 Martini., 4, 14, 17 Liu K., 231 Martin S., 346 Liu P., 511 Martínez A. E., 239 Liu W.-K., 522 Martinez H., 280 Liu X., 261 Maruyama K., 152 Lommel B., 304, 475 Maruyama R., 245 Lopatin V. V., 427 Mashkova E. S., 399 Lorincik J., 388, 466 Materazzi M., 55 Lotti R., 501 MathewsD. F., 158, 159 Loureiro J., 133 Mathur D., 294 Lucas J. M., 233 Matsui T., 44 Lucas M. W., 319 Matsuo A., 152 Ludde H. J., 315, 340 Matthew J. A. D., 176 Luderer E., 492 Matthews C. M., 459 Ludewig H., 436 Matthews G. F., 447 Ludziejewski T., 338 Mau N. V., 105 Lujan G. S., 426 Maulbetsch F., 54, 71 Lulli G., 470, 501 Maxwell J. A., 308 Luna H., 420 Mayer T. M., 424 Lundberg H., 2, 5, 63 Maynard G., 473 Lutterloh C, 353, 360 MazarovR, 394 Lutz H. O., 318 Mazeau J., 41 Lyalin A. G., 375 McCaffery A. J., 269 LyngaC, 2 McCann J. F., 344 MacDonald M. A., 54 McCash E. M., 354 Macchi A., 532 McCracken G. M., 447 Machado L. E., 196 McCullen E. F., 357 Machida S., 62 McCullough R. W., 297 Macias A., 272, 282, 297 McEwan M. J., 234 Maclagan R. G. A. R., 248 McGuinness C, 37 Madison D. H., 193 McLaughlin B. M., 167 Maeda K., 44 Mebel A. M., 244, 361 Maeda N., 327 Medvedeva M. V., 387 Magnier S., 247 Mehlhorn W., 144 Magnmann S., 317 Mei L., 485 Maier K., 24 Meintrup R., 180 Majewska U., 306 Melo W. S., 286, 342 Majima T., 314 Méndez L., 272, 282, 297 Makhoute A., 213 Mercouris T., 87, 539, 541 Malcolm N. O., 140 Meremianin A. V., 100, 108

130 Mergel V., 72 Murti M. V. R., 42 Merkt F., 21 MutoS., 437 Mertens A., 380, 494 Nabighian E., 356 Meschede D., 73, 295, 533 Nagaoka S., 25 Mese E., 40 Nagard M. B., 139 Messerschmidt W., 367 Nagasaki S., 189 Meyer W., 262 Nagy I., 518 Michael J. V., 235 Nagy L., 301, 311 Middleton A. G., 171, 172 Nahar S. N., 16 Mikaelian G., 158, 159 Nakajima K.; 379, 421, 432, 493 Milligan D. B., 234 Nakamura M., 364 Miloshevsky G. V., 190 Nakanishi H., 439 Minaev B. F., 26 Nandi T. K., 345 Minor K. G., 424 Nankov N., 304, 475 Mirea M., 504 Napolitani E., 470 Mirón C, 115 Naramoto H., 415, 428 Misaizu F., 245 Narkulov N., 390 Misdaq M. A., 506 Narumi K., 415, 428 Mitnik D. M., 194, 210 Neau A., 139 Mitsukawa K., 461 Nee J. B., 232 Mitsuke K., 59 Neeb M., 24 Mobus B., 91, 197 Neill P. A., 11 Moen A. W., 119 Nejedly Z., 308 Mohan M., 120 Nesbitt B. S., 288 Mojarrabi B., 171, 172 Newell W. R., 67, 132, 162, 531 Mokier P. H., 338 Ng C. Y., 22 Molchanov V. A., 399 Ng Y. H., 344 Möller P. J., 362 Nibarger J. P., 107 Moneta M., 503 Nickel F., 304, 475 Monk R. D., 447 Nicolaides C. A., 87, 539, 541 Monreal R. C, 412 Niehaus A., 255, 400, 434, 435 Montenegro E. C, 286, 342 Nielsen S. E., 299, 318 Moore L. R., 30, 74 Niemann D., 377, 438 Moráis J., 458 Nikitin E. E., 229 Moretto-Capelle P., 293 Nilsson H., 5 Morgan T. J., 118 Ninomiya S., 402 Morin P., 115 Nipoti R., 501 Morioka Y., 57 Nishii T., 510 Morita K-, 406, 462 Nishimura K., 416 Moritani K., 364 Nishimura T., 510 Moshammer R., 274, 275, 317 Nordlander P., 441 Mosnier J. P., 37 Nordquist J., 287 Mosunov A. S., 464 Norrington P. H., 7 Moszynski R., 227 Norskov J. K., 363 Motoki S., 64 Novikov S. A., 52, 79 Movre M., 262 Nuroh K., 214 Mozejko P., 153 Nuver T. T., 400 Mozolevskil. E., 508 O'Connor C. S. S., 137 Msezane A. Z., 8, 97, 124, 146, 198, 212 O'Mullane M., 287 Mu Y., 485 O'Rourke F. S. C, 288 Mueller A., 184, 535 O'Sullivan G., 37 Muhleisen A., 341 Obolensky O. I., 375 Mukoyama T., 306 Ogawa H., 305, 482, 486, 513 Munzenberg G., 304, 475 Ogawa T., 130, 152 Murakami E., 57 Ohashi H., 25 Murata Y., 364 Ohashi M., 376 Murray A. J., 181 Ohmori K., 229

131 Ohno K., 245 Peverall R., 23 Ohno T., 451 Phaneuf R. A., 200 Ohrn Y., 326, 500 Philipsen V., 401, 467 Ohsaki A., 189 Pilling M. J., 241 Ohsawa D., 437 Pindzola M. S., 141, 183, 194, 208, 210 Ohta EL, 402 Pintao C. A. F., 369 Ohtani S., 66 Pir aux B., 34 Ohya K., 416 Pisarev A. A., 468 Oka H., 220 Pitarke J. M., 474 Okada K., 25 Pitrelli D., 532 Okada M., 364 Plagne L., 328 Okazawa T., 510 Plaja L., 374 Okiji A., 439 Plottke C, 188 Oks E., 46, 49, 525, 527 Plucinski L., 34 Okumura H., 25 Podschaske IL, 409 Okunishi M., 229 Poizat J. C, 419 Olalla E., 14 Polasek M., 199 Oliva A., 413 Portail M., 452 Olson J. A., 453 Porter L. E., 505 Olson R. E., 47, 281, 317 Pospieszczyk A., 123 Onsgaard J., 362 Potvliege R. M., 40 Ooki S., 432 Povlsen O. E., 268 Orlinskij D. V., 469 Powell C. J., 216 Ortega F., 484 Pradhan A. K., 16, 18 Ortner J., 58 Pranevicius L., 410 Ostrovsky V. N., 201, 545 Pratt R. H., 100, 108, 116 Osvath Z., 311 Price S. D., 137 Ottinger Ch., 228 Promokhov A. A., 464 Ouichaoui S., 483 Ptasinska-Denga E., 153 Ovsiannikov V. D., 529 Pu F. N., 33 Özdemir Y., 121 Puzzarini C, 233 Ozeki M., 376 Qian W. J., 134, 258 Pagura C, 460 Quinet P., 12 Pajek M., 306 Raab W., 517 Palmeri P., 12 Raassen A. J. J., 5 Palmieri P., 233 Raboud P. A., 85, 341 Palomares F. J., 458 Rachlew-Kallne E., 102, 119, 287 Paolini B., 191 Radon T., 304, 475 Paolucci G., 362 Raju M. L. N, 42 Papageorgiou N., 452 Ralchenko Yu. V, 123 Parker G. A., 243 Rangama J., 383 Parker J. S., 30, 74 Rangan C, 106, 543 Pasic S., 104, 111, 206 Rao B. M., 42 Pattard T., 98 Rao B. V. T., 42 Paul H., 478 Rasch J., 147 Pazdzersky V. A., 32 Rasulev U. Kh., 403, 465 Peacher J. L., 193 Rau A. R. P., 106, 543 Pedrys R., 409 Read F. H., 181 Pejcev V., 160, 169 Reddish T. J., 54 Pelicon P., 341 Reddy B. S., 42 Perez C, 523 Reddy T. S., 42 Pérsico M., 292 Ree J., 355 Persson P., 310 Rehm K. E., 516 Pert G. J., 7 Reid R. H. G-, 218 Pesa M., 241 Reinhold C. O., 471 Pesic Z. D., 377 Reinhold E., 20 Petrov I. D., 27, 36 Rejoub R., 200

132 Remillieux J., 419 Sahoo S., 349, 526 Remizovich V. S., 407 Saito N., 25 Ren B., 352 Sakamoto N., 305, 482, 486, 513 Riccardi P., 413 Sakamoto Y., 155 Richard-Viard M., 381 Sakimoto K., 249 Richardson L. ML, 61, 164 Salin A., 359, 517 Richter M., 91, 197 Samartsev A. V., 403, 465 Riera A., 272, 282, 297 Sanche L., 366 Rioual S., 114 Sanchez E. A., 440 Ritchie G. A. D., 23 Sanderson J. EL, 67, 531 Ritzau S. M., 412 Sanna N., 168 Riu J. R. I., 102, 119 Sant'Anna M. M., 286, 342 Rivarola R. D., 142, 342 Santos A. C. F, 286, 342 Roberts M. J., 278 Sarkadi L., 290 Robicheaux F., 183, 208 Sasaki T., 451 Robinson G. A-, 270 Sato Y., 229, 437 Rocha A. B., 203 Sattin F., 291 Rode M., 227 Savin D. W., 11 Rojas A., 282 Savoy I., 85 Roller-Lutz Z., 318 Schartner K.-H., 36, 135, 259 Romo-Kroger C. M., 307 Schatz H., 304, 475 Roncin P., 385 Schectman R. M., 13 RoordaS., 368 Scheer M., 84 Rose S. J., 7 Schemer M., 350 Rosen S., 139 Scheid W., 277 Rosier L., 483 Scheidenberger C, 304, 475 Rosler M., 411, 438 Scheper C. R., 20 Rosmej F. B., 175 Schinner A., 417, 418, 431, 478, 479, 509 Roso L., 374 Schipakov V. A., 293 Ross G. G., 491 Schippers S., 184, 535 Rost J. M., 149 Schiwietz G., 477, 492 Rostas J., 430 Schlosser W., 423 Roston G. D., 256 Schmeicher P., 260, 530, 548 Roth J., 370, 371 SchmidM.,378 Rothard H., 446, 519 Schmider H. L., 230 Roueff E., 217 Schmidt K.-H., 304, 475 Rousseau S., 247 Schmidt V., 81 Rouvellou B., 114 Schmitt W., 317 Roy D., 452 Schmoranzer H-, 36 Roy K., 215, 349 Schnabel R., 3 Roy S. C, 116 Schonhense G., 99 Roy U., 215 Schou J., 409 Rozet J.-P., 471 Schrenk G., 517 Rozin S., 190 Schuch R., 184, 377, 535 Rudd M. E., 202 Schultz D. R., 89, 316, 343 Rudge M. R. H., 143, 270 Schulz M., 317 Rudolph H., 400 Schwalm D., 184, 535 Russell D. P., 441 Schwengelbeck U., 374 Ryans R. S. L, 218 Schwerdtfeger P., 536 Rymuza P., 338 Scott M. P., 187 Ryssel H., 485 Scrinzi A., 546 Saathoff G., 184, 535 Seakins P. W., 241 Sabin J. R., 326, 500 Seki S., 415, 428 Sadlej J., 227 Sellin I. A., 98 Saghiri A. A., 184, 535 Semaniak J., 139,306 Saha B. C, 325 Semenov S. K., 99 Sahin M., 69 Semrad D., 487, 518

133 Sen Gupta S. K., 116 Stancil P. C, 324 Senba Y., 25 Stankiewicz M., 102, 119 Sevin A., 251 Staudt C, 391, 394 Shaffer J. P., 312, 537 Staudte A., 72 Shafranyosh I. I., 136, 174 Stebbings R. F., 138 Shah M. B., 286, 288, 342 Stefani G., 114 Shani G., 190 Steinbatz M., 417, 418 Shapoval A., 469 Steinbauer E., 417, 418, 431, 509 Sharma M. K., 186 Stelbovics A. T., 191, 211 Sheehy J. A., 80 Stener M., 28, 31 Shepherd J. T., 283 Stenström K., 310 Shi Q., 148 Stepanov A. L., 425, 496 Shi W., 139 Steski D. B., 436 Shibuya K., 428 Stewart, M. D. Jr., 209 Shiell R. C, 22 Stia C. R., 142 Shigemasa E., 57, 62, 64 Stimson S., 22 Shimizu Y., 25 Stockl J., 433 Shin H. K., 355 Stockli M., 296 Shiomi-TsudaN., 513 Stohlker Th., 338 Shmaenok L. A., 91, 197 Stolterfoht N., 377, 438 Shtan A., 469 Sträub H. C, 138 Shulga V. I., 397, 398, 429 Stritzker B., 423 Sigaud G. M., 286, 342 StroevL. V., 403, 465 Sigmund P., 478, 479, 507, 515 Su H., 240 Signorell R., 21 Su M.-C, 235 Sikstrom C. M., 2, 5 Suarez S., 420 Sil N. C, 215 Sukhorukov V. L., 27, 36 Sillanpaa J., 489 Sumitomo K., 415, 428 Silver ans R. E., 401, 467 Summerer K., 304, 475 Simon M., 25, 115 Summers H. P., 145 Simsek O., 83, 112 Sun J. Q., 103 Singh B., 101 Sun J. Z., 453 Skog G., 310 Suresh P., 42 Smirnov B. M., 347 Suzuki I. H., 25 Smirnov V. K., 463 SvanbergS., 5, 63 Smit Z., 310, 341 Swart J. W., 426 Smith A. J., 11 Swiat P., 338 Smith S. J., 125 Szmytkowski C. Z., 153 Smyth E. S-, 30, 74 Tachikawa H., 53 Snegurskaya T. A., 136 Taday P. F., 67, 531 Snell G., 110 Taher F., 284 Soejima K., 64 Taieb G., 430 Sogut O., 69 Takada M., 461 Sokolovski D., 225 Takayanagi T., 238, 257 Solmi S., 470 Takayanaki K., 189 Solodovchenko S., 469 Talbi D., 292 Solov'yov A. V., 375 Tamenori Y., 25 Someda K., 93 Tan C, 511 Sommavilla M., 21 Tan Z., 250, 253 Sonobe S., 379, 493 Tanaka H., 155, 245 Sorokin A.A., 91, 197 Tanaka K., 257 Sotero A. P., 426 Tanaka T. J., 57 Spielberger L., 72 Tandon P. N., 267 Sroubek Z., 388, 466 Tao Z., 497 Stachura Z., 338 Tarisien M., 294, 300 Stadlmann J., 304, 475 Tartari A., 101 Stamp M. F., 447 Tatsch P. J., 426

134 Tayal S. S., 61, 125, 126, 164 Ulm G., 91, 197 Taylor K. T., 30, 74 Umarov F. F., 390 Tazawa T., 328 Umemoto H., 257 Telnov D. A., 88 Unno O., 220 Teng H., 165, 179, 187 Uramoto S.-L, 189 Teplova Ya. A., 488 Urazgil'din I. F., 435 Terada N., 257 Urbasch G., 72 Teubner P. J. O., 171, 172, 195, 512 Urbassek H. M., 392, 445 Themelis S. L, 87, 539, 541 Usachenko V. L, 32 Thieberger P., 436 Ushnurtsev A. V., 32 Thiel L., 262 Utter S. B., 11 Thomas J. P., 419 Uzer T., 46, 49, 525, 527 Thomas R., 139 Vainshtein L. A., 123 Thompson A. E., 248 Vaitonene A. M., 468 Thompson D. G., 163 Valdes J. E., 484 Thompson W. R., 297 Van Giai N., 105 Thumm IL, 386 Van der Hart H. W., 43 Tian Z.-Q., 352 Van der Stråten P., 109, 333 Tiesinga E., 313, 334, 538 Vandeweert E., 401, 467 Tiwari IL, 267 Vane C. R., 343 Tober E. D., 458 Varenne 0., 430 Tobin R. G., 357 Varga P., 378 Tokesi K., 290, 341 Vargas P., 484 Tokushima T., 25 Vassen W., 336, 549 Toi P. J. J., 336, 549 Veres T., 368 Tolk N. H., 441 Verhaar B. J., 335, 547 Tolkach V. L, 190 Verma H. R., 345 Tolstogouzov A., 460 Verma P., 345 Tomar S., 186 Vernhet D., 471 TongX.-M., 66 Veryovkin I. V., 403 Tosaki M., 327 Veseth L., 102, 119 Touboltsev V. S., 396 Vikor Gy., 377 Townsend P. D., 425, 496 Vikor L., 139 Trabert E., 11 Villette J., 385 Trajmar S., 158, 159, 191 Vogels J. M., 335, 547 Tribedi L. C, 267 Voitkiv A. B., 271, 277 Tribouillard C, 504 Voitsenya V., 469 Trifonov N. N., 407 Voky L., 118 Tronc M., 366 Vollmer M., 72 Truong T. N., 263 Vollweiler F., 36 Tsai C. C, 335, 547 Von Oertzen W., 514 Tseng H. C, 232, 329 Voulût D., 297 Tseng H. K., 150 Vuskovic L., 160, 169 Tsuchida H., 305, 314, 482, 486, 513 Wagner J. B., 362 Tugushev V. L, 394 Wahlgren G. M., 2 Tully C, 225 Wan L., 103 Tully J. A., 128, 129 Wang J., 296, 299 Tupitsyn L, 334 Wang J.-G., 285 Turci C. C, 203 Wang L., 511 Turri G., 114 Wang L. M., 134, 258 Tyliszczak T., 203 Wang S. Y., 232 Ubachs W., 19, 20 Wang Y., 165, 318 Ueberholz B., 73, 295, 533 Wang Z., 458 Ueda K., 25, 44 Wang Z. S., 454 UeyamaT.,461 Wanner J., 449 Ukai M., 62 Warczak A., 338 Ullrich J., 274, 275, 317 Wardlaw D., 230

135 Watanabe T., 66 YnzunzaR. X., 458 Watson J. B., 70 Yogo A., 314 Watson R. L., 309 Yokoyama K., 238 Weber Th., 72 Yoshida H., 25 Webster S., 323, 542 Young L., 516 Weckenbrock M., 72 Yousif F. B., 76 Wehlitz R., 98 Yu D. H., 157 Weick H., 304, 475 Yuan J., 86 Werner H.-J., 226 Yuan J.-M., 522 West J. B., 38 Yurasova V. E., 464 Wiese L. M., 10 Zajic V., 436 Wightman J. P., 54 Zakharenko N., 469 Wilhelmi 0., 36, 135, 259 Zare R. N., 459 Wille U-, 386 Zastrow K.-D., 287 Williams J. F., 157 Zatsarinnyi 0., 56, 144 Winkler M., 304, 475 Zeijlmans van Emmichoven P. A., 255, 400, 434, 435 Winter H., 380, 494 Zeippen C. J., 16, 127, 217 Winter HP., 367, 378, 433 Zeman V., 128, 157, 158, 159 Winter J. R., 339 Zenevich V. A., 224 Winter T. G., 339 Zhang H., 250, 253, 294 Wirtz L., 378 Zhang J., 511 Wojciechowski I. A., 387, 389 Zhang J.Z.H, 250, 253 Wojtkowski K., 281 Zhang K. Y., 63 Wolf A., 184, 535 Zhang Q., 250 Wolf M., 365 Zhang R. Q., 237 Wollnik H., 304, 475 Zhang S., 253, 263 Wolniewicz L., 332 Zhang S. Y., 436 Wormer P. E. S, 227 Zhang X., 148 Wu D. Y., 352 Zhang Y., 250, 253 Wu S., 148 Zhankui J., 63 Wu Y.-S-, 113 Zheng Q., 173 Wucher A., 391, 394, 395 Zheng Y., 252 Wuilleumier F. J., 118 Zheng Y. J., 453 XiaY.,485 Zhiguo Z., 63 Xian H., 352 Zhikharev V. A., 425, 496 Xiao G., 492 Zhong Z., 148 Xiting L., 497 Zhou H. L., 118 Xu H., 511 Zhou X., 372 Xu J., 441 Zhu L. F., 148 Xu K-, 148 Zhu R. S., 237 Xu X., 352 Zhu X. D., 356 Xu Y. J., 207 Zhurkin E. E., 480 Xue C, 511 Ziesel J. P., 381 Yabana K, 328 Zimmermann B., 36 Yagishita A., 57 Zinoviev A. V., 465 Yahishita A., 64 Zitnik M., 341 Yakimov K., 469 Zonghuang X., 497 Yamakita Y., 245 Zygelman B., 89, 316 Yamamoto S., 415, 428 af Ugglas M., 139 Yamanouchi K., 50 da Silva A. J. R., 204 Yan J., 103 de Abajo F. J. G., 458 Yasue T., 461 de Jesus V. L. B., 342 Yavna V. A., 79 de Lange A., 19, 20 Ye B., 372 de Lange C. A., 20 Yeager D. L., 140 de Urquijo J., 76 Yi X. Z., 453 de la Rose M. I., 523 Yixiong S., 497 del Val J. A., 520, 523

136 ter Muelen J. J., 265, 266 van Someren B., 434, 435 van Beek M. C, 265, 266 van de Sand G., 149 van Santen R. A., 351 van der Avoird A., 227

137 LIST OF ELEMENTS

1 H hydrogen 38 Sr strontium 75 Re rhenium 2 He helium 39 Y yttrium 76 Os osmium 3 Li lithium 40 Zr zirconium 77 Ir iridium 4 Be beryllium 41 Nb niobium 78 Pt platinum 5 B boron 42 Mo molybdenum 79 Au gold 6 C carbon 43 Tc technetium 80 Hg mercury 7 N nitrogen 44 Ru ruthenium 81 TI thallium 8 0 oxygen 45 Rh rhodium 82 Pb lead 9 F fluorine 46 Pd palladium 83 Bi bismuth 10 Ne neon 47 Ag silver 84 Po polonium 11 Na sodium 48 Cd cadmium 85 At astatine 12 Mg magnesium 49 In indium 86 Rn radon 13 Al aluminium 50 Sn tin 87 Fr francium 14 Si silicon 51 Sb antimony 88 Ra radium 15 P phosphorus 52 Te tellurium 89 Ac actinium 16 S sulphur 53 I iodine 90 Th thorium 17 Cl chlorine 54 Xe xenon 91 Pa protactinium 18 Ar argon 55 Cs cesium 92 U uranium 19 K potassium 56 Ba barium 93 Np neptunium 20 Ca calcium 57 La lanthanum 94 Pu Plutonium 21 Sc scandium 58 Ce cerium 95 Am americium 22 Ti titanium 59 Pr praseodymium 96 Cm curium 23 V vanadium 60 Nd neodymium 97 Bk berkelium 24 Cr chromium 61 Pm promethium 98 Cf californium 25 Mn manganese 62 Sm samarium 99 Es einsteinium 26 Fe iron 63 Eu europium 100 Fm fermium 27 Co cobalt 64 Gd gadolinium 101 Md mendelevium 28 Ni nickel 65 Tb terbium 102 No nobelium 29 Cu copper 66 Dy dysprosium 103 Lr lawrencium 30 Zn zinc 67 Ho holmium 104 Rf rutherfordium 31 Ga gallium 68 Er erbium 105 Db dubnium 32 Ge germanium 69 Tm thulium 106 sg seaborgium 33 As arsenic 70 Yb ytterbium 107 Bh bohrium 34 Se selenium 71 Lu lutetium 108 Hs hassium 35 Br bromine 72 Hf hafnium 109 Mt meitnerium 36 Kr krypton 73 Ta tantalum 37 Rb rubidium 74 W tungsten

ISSN 0258-8048