MOS Transistor Theory
• So far, we have viewed a MOS transistor as an ideal switch (digital operation) – Reality: less than ideal
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Introduction • So far, we have treated transistors as ideal switches • An ON transistor passes a finite amount of current – Depends on terminal voltages – Derive current-voltage (I-V) relationships • Transistor gate, source, drain all have capacitance – I = C (V/t) -> t = (C/I) V – Capacitance and current determine speed
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1 MOS Capacitor
• Gate and body form MOS capacitor • Operating modes – Accumulation – Depletion – Inversion
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MOS Transistor Theory
• Study conducting channel between source and drain • Modulated by voltage applied to the gate (voltage- controlled device) • nMOS transistor: majority carriers are electrons (greater mobility), p-substrate doped (positively doped) • pMOS transistor: majority carriers are holes (less mobility), n-substrate (negatively doped)
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2 Gate Biasing Gate Source SiO2 Drain
+ + n Channel n • Vgs=0: no current flows from + - source to drain (insulated by two reverse biased pn E junctions p-substrate • Vgs>0: electric field created across substrate VSS (Gnd) • Electrons accumulate under gate: region changes from p-type to n-type • Conduction path between source and drain
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nMOS Device Behavior Inversion p-substrate Polysilicon gate Oxide insulator Region (n-type)
Depletion region Depletion region
Vgs << Vt Vgs = Vt Vgs > Vt Accumulation Depletion mode Inversion mode mode • Enhancement-mode transistor: Conducts when gate bias
Vgs > Vt • Depletion-mode transistor: Conducts when gate bias is zero
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3 Transistor Operating Regions
• Cut-off region: accumulation mode, zero current flow
• Linear region: Vds <= Vgs-Vt, weak inversion layer, drain current depends on Vgs and Vds
• Saturated region: Vds > Vgs-Vt, strong inversion layer, drain current independent of Vds
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Terminal Voltages
• Mode of operation depends on Vg, Vd, Vs
– Vgs = Vg – Vs
– Vgd = Vg – Vd
– Vds = Vd – Vs = Vgs - Vgd • Source and drain are symmetric diffusion terminals – By convention, source is terminal at lower voltage
– Hence Vds 0 • nMOS body is grounded. First assume source is 0 too. • Three regions of operation – Cutoff – Linear – Saturation
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4 nMOS Cutoff
• No channel
• Ids 0
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nMOS Linear
• Channel forms • Current flows from d to s – e- from s to d
• Ids increases with Vds • Similar to linear resistor
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5 nMOS Saturation • Channel pinches off
• Ids independent of Vds • We say current saturates • Similar to current source
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Threshold Voltage: Concept
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6 Current-Voltage Relations
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Current-Voltage Relations
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7 Current-Voltage Relations
k n: transconductance of transistor W : width-to-length ratio L
• As W increases, more carriers available to conduct current
• As L increases, Vds diminishes in effect (more voltage drop). Takes longer to push carriers across the transistor, reducing current flow
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Typical Parameter Values
k Vt n-type 24 microA/V2 0.8V p-type 9 microA/V2 -0.8V
Why is k higher for n-type transistors?
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8 Transistor in Saturation
Channel is pinched off
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nMOS I-V Summary
• Shockley 1st order transistor models
3: CMOS Transistor 18 Theory
9 pMOS I-V
• All dopings and voltages are inverted for pMOS – Source is the more positive terminal
• Mobility μp is determined by holes
– Typically 2-3x lower than that of electrons μn – 120 cm2/V•s in AMI 0.6 μm process • Thus pMOS must be wider to provide same current
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Capacitance
• Any two conductors separated by an insulator have capacitance • Gate to channel capacitor is very important – Creates channel charge necessary for operation • Source and drain have capacitance to body – Across reverse-biased diodes – Called diffusion capacitance because it is associated with source/drain diffusion
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10 Gate Capacitance • Approximate channel as connected to source
• Cgs = oxWL/tox = CoxWL = CpermicronW
• Cpermicron is typically about 2 fF/μm
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The Gate Capacitance
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11 Diffusion Capacitance
• Csb, Cdb • Undesirable, called parasitic capacitance • Capacitance depends on area and perimeter – Use small diffusion nodes
– Comparable to Cg for contacted diff
– Cg for uncontacted – Varies with process
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Diffusion Capacitance
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12 Parasitic Resistances Polysilicongate Drain contact G LD VGS,eff S D W RS RD
Drain
RS = (LS/W)R + RC RC: contact resistance RD = (LD/W)R + RC R : sheet resistance per square of drain-source diffusion
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Body Effect
• Many MOS devices on a common substrate – Substrate voltage of all devices are normally equal • But several devices may be connected in series – Increase in source-to-substrate voltage as we proceed vertically along the chain
g2 d2 s2 • Net effect: slight increase g1 d1 Vsb2 = 0 in threshold voltage Vt, V12 s1 Vsb1 = 0 Vt2>Vt1 V11
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13 Making Chips
Masks
Processed Chemicals Processing wafer Chips
Wafers
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CMOS Fabrication
• CMOS transistors are fabricated on silicon wafer • Lithography process similar to printing press • On each step, different materials are deposited or etched • Easiest to understand by viewing both top and cross-section of wafer in a simplified manufacturing process
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14 Fabrication Steps
• Features are patterned on a wafer by a photolithographic process – Photo-light lithography, n. process of printing from a plane surface on which image to be printed is ink-receptive and the blank area is ink-repellant • Cover the wafer with a light-sensitive, organic material called photoresist • Expose to light with the proper pattern (mask) • Patterns left by photoresist can be used to control where oxide is grown or materials are placed on surface of wafer
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Basic Processing Steps
• N-diffusion created by doping regions of the substrate • Poly and metal are laid over the substrate, with oxide to insulate them from substrate and each other • Wires are added in layers, alternating with oxide • Vias are cut in the oxide
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15 Basic Fabrication Steps • Layout contains information on what patterns have to made on the wafer • Masks are created using the layout information provided by the designer • Procedure involves selective removal of the oxide – Coat the oxide with photoresist, polymerized by UV light (applied through mask) – Polymerized photoresist dissolves in acid – Photoresist itself is acid-resistant
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Basic Processing Steps
• Start with wafer at current step • Add photoresist • Pattern photoresist with mask • Step-specific etch, implant, etc. • Wash off resist
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16 Inverter Cross-section • Typically use p-type substrate for nMOS transistors • Requires n-well for body of pMOS transistors
Well and Substrate Taps
• Substrate must be tied to GND and n-well to VDD • Metal to lightly-doped semiconductor forms poor connection called Shottky Diode • Use heavily doped well and substrate contacts / taps
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17 Inverter Mask Set
• Transistors and wires are defined by masks • Cross-section taken along dashed line
Detailed Mask Views
• Six masks – n-well – Polysilicon – n+ diffusion – p+ diffusion – Contact – Metal
18 Fabrication • Chips are built in huge factories called fabs • Contain clean rooms as large as football fields
Courtesy of International Business Machines Corporation. Unauthorized use not permitted.
Fabrication Steps
• Start with blank wafer • Build inverter from the bottom up • First step will be to form the n-well
– Cover wafer with protective layer of SiO2 (oxide) – Remove layer where n-well should be built – Implant or diffuse n dopants into exposed wafer
– Strip off SiO2
19 Oxidation
• Grow SiO2 on top of Si wafer
– 900 – 1200 C with H2O or O2 in oxidation furnace
Photoresist
• Spin on photoresist – Photoresist is a light-sensitive organic polymer – Softens where exposed to light
20 Lithography
• Expose photoresist through n-well mask • Strip off exposed photoresist
Etch
• Etch oxide with hydrofluoric acid (HF) – Seeps through skin and eats bone; nasty stuff!!! • Only attacks oxide where resist has been exposed
21 Strip Photoresist
• Strip off remaining photoresist – Use mixture of acids called piranah etch • Necessary so resist doesn’t melt in next step
n-well
• n-well is formed with diffusion or ion implantation • Diffusion – Place wafer in furnace with arsenic gas – Heat until As atoms diffuse into exposed Si • Ion Implanatation – Blast wafer with beam of As ions
– Ions blocked by SiO2, only enter exposed Si
22 Strip Oxide
• Strip off the remaining oxide using HF • Back to bare wafer with n-well • Subsequent steps involve similar series of steps
Polysilicon
• Deposit very thin layer of gate oxide – < 20 Å (6-7 atomic layers) • Chemical Vapor Deposition (CVD) of silicon layer
– Place wafer in furnace with Silane gas (SiH4) – Forms many small crystals called polysilicon – Heavily doped to be good conductor
23 Polysilicon Patterning
• Use same lithography process to pattern polysilicon
Self-Aligned Process
• Use oxide and masking to expose where n+ dopants should be diffused or implanted • N-diffusion forms nMOS source, drain, and n-well contact
24 N-diffusion • Pattern oxide and form n+ regions • Self-aligned process where gate blocks diffusion • Polysilicon is better than metal for self-aligned gates because it doesn’t melt during later processing
N-diffusion cont.
• Historically dopants were diffused • Usually ion implantation today • But regions are still called diffusion
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• Strip off oxide to complete patterning step
P-Diffusion
• Similar set of steps form p+ diffusion regions for pMOS source and drain and substrate contact
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26 Contacts
• Now we need to wire together the devices • Cover chip with thick field oxide • Etch oxide where contact cuts are needed
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Metallization • Sputter on aluminum over whole wafer • Pattern to remove excess metal, leaving wires
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27 Layout • Chips are specified with set of masks • Minimum dimensions of masks determine transistor size (and hence speed, cost, and power) • Feature size f = distance between source and drain – Set by minimum width of polysilicon • Feature size improves 30% every 3 years or so • Normalize for feature size when describing design rules • Express rules in terms of = f/2 – E.g. = 0.3 μm in 0.6 μm process
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Design Rules • Design rules govern the layout of individual components: transistors, wires, contacts, vias – How small can the gates be, and how small can the wires be made? • Conflicting Demands: – component packing: more functionality, higher speed – Chip yield: smaller sizes can reduce yield (fraction of good chips) • Conservative vs aggressive design rules
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28 Geometric Design Rules
• Resolution – Width and spacing of lines on one layer • Alignment – make sure interacting layers overlap (or don’t) – Contact surround – Poly overlap of diffusion – Well surround of diffusion
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SCMOS Design Rules • Scalable CMOS design rules • Feature size = half the drawn gate length (poly width) • Mentor Graphics IC tool has built-in design rule checker (DRC) Example design rules:
Layer Minimum Width Separation Metal 1 3 3 Metal 2 3 4 Poly 2 poly-poly: 2 poly-diff: 1
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29 Foundry Interface
Layout (mask set)
Designer Foundry
Design Rules Process Parameters
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Simplified Design Rules
• Conservative rules to get you started
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30 Tub Ties and Latchup
• Substrate must be connected to power supply
• p-tub for nMOS to VSS (Gnd) • n-tub for pMOS to VDD • Connections made by special vias called tub ties • Conservative design rule: place tub ties for every one or two transistors • Why not place one tie in each tub that has 50 transistors?
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Latchup • Too few ties: high resistance between tub and power supply, leads to parasitic bipolar transistors inhibiting normal chip operation • Parasitic silicon-controlled rectifier (SCR) • When both bipolar transistors are off, SCR conducts no current
• SCR turns on: high current short-circuit between VDD and Gnd.
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31 Stick Diagrams • Designing complete layout in terms of rectangles can be overwhelming • Stick diagram: abstraction between transistor schematic and layout – Cartoon of a chip layout • Replace rectangles by lines
VDD (blue) p-type diffusion transistor VDD (yellow)
a Metal 1 (blue) a a Poly (red) n-type diffusion Gnd (green) VSS (Gnd)
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Stick Diagram
VDD Metal 1 VDD
a b p-diffusion a z b a
b Poly Gnd n-diffusion
Metal 1 Gnd
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32 Cell Minimization • Chip area (cell size) must be minimized carefully Impact of die size/chip area on cost (unpackaged dies) Nominal 1% increase 15% increase Pentium die in die size in die size Wafer cost $1,460 $1,460 $1,460 Die size 160.2 mm2 161.8 mm2 184.2 mm2 Die cost $84.06 $85.33 $102.55 Chips fabricated per week 498.1 K 482.9 K 337.5 K Added annual cost $63.5 M $961 M
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Minimize number of diffusion strips • How do we order the gate inputs (poly)? • More diffusion strips more spacing, more area V DD Try a, b, c, d, e:
VDD e x x x x x a d
b c F F
a x x x x x x x b a b c d e d e c Gnd Two n-diff gaps, zero p-diff gaps
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33 e b VDD a a
e d c a d e d b c
b c pMOS graph nMOS graph
a b d e c
Gnd
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• Euler path: Visit every edge exactly once • Find all Euler paths for nMOS and pMOS graphs • Find p- and n-path that have identical labeling
• For example: d, e, a, b, c • If no such path exists, then break diffusion into strips
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34 V e b DD pMOS graph a a
e d a d e c d b c
b c nMOS graph
VDD x x x a F x x b c e F d Gnd
Ordering: d, e, a, b, c: x x x x x Zero n-diff gaps, zero p-diff gaps Gnd d e a b c
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Some Layout Hints • Plan the global structure • Wiring on orthogonal (“big picture”), then metal layers design cells – Assign preferred – Floorplan directions to M1 and – Wiring strategy M2 – Power and ground – Use diffusion only for distribution devices, not for interconnect – Systematic placement – Use poly only for very – Keep all pMOS/nMOS local interconnect together – Place transistors in rows: share source/drain diffusion
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35 Inverter Layout
• Transistor dimensions specified as Width / Length – Minimum size is 4 / 2, sometimes called 1 unit – In f = 0.6 μm process, this is 1.2 μm wide, 0.6 μm long
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Summary
• MOS transistors are stacks of gate, oxide, silicon • Act as electrically controlled switches • Build logic gates out of switches • Draw masks to specify layout of transistors
• Now you know everything necessary to start designing schematics and layout for a simple chip!
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