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MOS Theory

• So far, we have viewed a MOS transistor as an ideal switch (digital operation) – Reality: less than ideal

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Introduction • So far, we have treated as ideal switches • An ON transistor passes a finite amount of current – Depends on terminal voltages – Derive current-voltage (I-V) relationships • Transistor gate, source, drain all have capacitance – I = C (V/t) -> t = (C/I) V – Capacitance and current determine speed

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1 MOS Capacitor

• Gate and body form MOS capacitor • Operating modes – Accumulation – Depletion – Inversion

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MOS Transistor Theory

•  Study conducting channel between source and drain • Modulated by voltage applied to the gate (voltage- controlled device) • nMOS transistor: majority carriers are electrons (greater mobility), p-substrate doped (positively doped) • pMOS transistor: majority carriers are holes (less mobility), n-substrate (negatively doped)

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2 Gate Biasing Gate Source SiO2 Drain

+ + n  Channel n  • Vgs=0: no current flows from + - source to drain (insulated by  two reverse biased pn  E junctions p-substrate • Vgs>0: electric field created  across substrate VSS (Gnd) • Electrons accumulate under gate: region changes from p-type to n-type • Conduction path between source and drain

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nMOS Device Behavior Inversion p-substrate Polysilicon gate Oxide insulator Region (n-type)

Depletion region Depletion region

Vgs << Vt Vgs = Vt Vgs > Vt Accumulation Depletion mode Inversion mode mode • Enhancement-mode transistor: Conducts when gate bias

Vgs > Vt • Depletion-mode transistor: Conducts when gate bias is zero

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3 Transistor Operating Regions

• Cut-off region: accumulation mode, zero current flow

• Linear region: Vds <= Vgs-Vt, weak inversion layer, drain current depends on Vgs and Vds

• Saturated region: Vds > Vgs-Vt, strong inversion layer, drain current independent of Vds

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Terminal Voltages

• Mode of operation depends on Vg, Vd, Vs

– Vgs = Vg – Vs

– Vgd = Vg – Vd

– Vds = Vd – Vs = Vgs - Vgd • Source and drain are symmetric diffusion terminals – By convention, source is terminal at lower voltage

– Hence Vds  0 • nMOS body is grounded. First assume source is 0 too. • Three regions of operation – Cutoff – Linear – Saturation

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4 nMOS Cutoff

• No channel

• Ids  0

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nMOS Linear

• Channel forms • Current flows from d to s  – e- from s to d

• Ids increases with Vds • Similar to linear resistor

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5 nMOS Saturation • Channel pinches off

• Ids independent of Vds • We say current saturates • Similar to current source

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Threshold Voltage: Concept

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6 Current-Voltage Relations

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Current-Voltage Relations

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7 Current-Voltage Relations

k n: transconductance of transistor W : width-to-length ratio L

• As W increases, more carriers available to conduct current

• As L increases, Vds diminishes in effect (more voltage drop). Takes longer to push carriers across the transistor, reducing current flow

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Typical Parameter Values

k Vt n-type 24 microA/V2 0.8V p-type 9 microA/V2 -0.8V

Why is k higher for n-type transistors?

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8 Transistor in Saturation

Channel is pinched off

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nMOS I-V Summary

• Shockley 1st order transistor models

3: CMOS Transistor 18 Theory

9 pMOS I-V

• All dopings and voltages are inverted for pMOS – Source is the more positive terminal

• Mobility μp is determined by holes

– Typically 2-3x lower than that of electrons μn – 120 cm2/V•s in AMI 0.6 μm process • Thus pMOS must be wider to  provide same current

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Capacitance

• Any two conductors separated by an insulator have capacitance • Gate to channel capacitor is very important – Creates channel charge necessary for operation • Source and drain have capacitance to body – Across reverse-biased  – Called diffusion capacitance because it is associated with source/drain diffusion

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10 Gate Capacitance • Approximate channel as connected to source

• Cgs = oxWL/tox = CoxWL = CpermicronW

• Cpermicron is typically about 2 fF/μm 

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The Gate Capacitance

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11 Diffusion Capacitance

• Csb, Cdb • Undesirable, called parasitic capacitance • Capacitance depends on area and perimeter – Use small diffusion nodes

– Comparable to Cg  for contacted diff

–  Cg for uncontacted – Varies with process

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Diffusion Capacitance

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12 Parasitic Resistances Polysilicongate Drain contact G  LD  VGS,eff S D W RS RD

Drain

RS = (LS/W)R + RC RC: contact resistance RD = (LD/W)R + RC R : sheet resistance per square of drain-source diffusion

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Body Effect

• Many MOS devices on a common substrate – Substrate voltage of all devices are normally equal • But several devices may be connected in series – Increase in source-to-substrate voltage as we proceed vertically along the chain

g2 d2 s2 • Net effect: slight increase g1 d1 Vsb2 = 0 in threshold voltage Vt, V12 s1 Vsb1 = 0 Vt2>Vt1 V11

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13 Making Chips

Masks

Processed Chemicals Processing wafer Chips

Wafers

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CMOS Fabrication

• CMOS transistors are fabricated on wafer • Lithography process similar to printing press • On each step, different materials are deposited or etched • Easiest to understand by viewing both top and cross-section of wafer in a simplified manufacturing process

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14 Fabrication Steps

• Features are patterned on a wafer by a photolithographic process – Photo-light lithography, n. process of printing from a plane surface on which image to be printed is ink-receptive and the blank area is ink-repellant • Cover the wafer with a light-sensitive, organic material called photoresist • Expose to light with the proper pattern (mask) • Patterns left by photoresist can be used to control where oxide is grown or materials are placed on surface of wafer

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Basic Processing Steps

• N-diffusion created by regions of the substrate • Poly and metal are laid over the substrate, with oxide to insulate them from substrate and each other • Wires are added in layers, alternating with oxide • Vias are cut in the oxide

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15 Basic Fabrication Steps • Layout contains information on what patterns have to made on the wafer • Masks are created using the layout information provided by the designer • Procedure involves selective removal of the oxide – Coat the oxide with photoresist, polymerized by UV light (applied through mask) – Polymerized photoresist dissolves in acid – Photoresist itself is acid-resistant

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Basic Processing Steps

• Start with wafer at current step • Add photoresist • Pattern photoresist with mask • Step-specific etch, implant, etc. • Wash off resist

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16 Inverter Cross-section • Typically use p-type substrate for nMOS transistors • Requires n-well for body of pMOS transistors

Well and Substrate Taps

• Substrate must be tied to GND and n-well to VDD • Metal to lightly-doped forms poor connection called Shottky  • Use heavily doped well and substrate contacts / taps

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17 Inverter Mask Set

• Transistors and wires are defined by masks • Cross-section taken along dashed line

Detailed Mask Views

• Six masks – n-well – Polysilicon – n+ diffusion – p+ diffusion – Contact – Metal

18 Fabrication • Chips are built in huge factories called fabs • Contain clean rooms as large as football fields

Courtesy of International Business Machines Corporation. Unauthorized use not permitted.

Fabrication Steps

• Start with blank wafer • Build inverter from the bottom up • First step will be to form the n-well

– Cover wafer with protective layer of SiO2 (oxide) – Remove layer where n-well should be built – Implant or diffuse n dopants into exposed wafer

– Strip off SiO2

19 Oxidation

• Grow SiO2 on top of Si wafer

– 900 – 1200 C with H2O or O2 in oxidation furnace

Photoresist

• Spin on photoresist – Photoresist is a light-sensitive organic polymer – Softens where exposed to light

20 Lithography

• Expose photoresist through n-well mask • Strip off exposed photoresist

Etch

• Etch oxide with hydrofluoric acid (HF) – Seeps through skin and eats bone; nasty stuff!!! • Only attacks oxide where resist has been exposed

21 Strip Photoresist

• Strip off remaining photoresist – Use mixture of acids called piranah etch • Necessary so resist doesn’t melt in next step

n-well

• n-well is formed with diffusion or  • Diffusion – Place wafer in furnace with gas – Heat until As atoms diffuse into exposed Si • Ion Implanatation – Blast wafer with beam of As ions

– Ions blocked by SiO2, only enter exposed Si

22 Strip Oxide

• Strip off the remaining oxide using HF • Back to bare wafer with n-well • Subsequent steps involve similar series of steps

Polysilicon

• Deposit very thin layer of gate oxide – < 20 Å (6-7 atomic layers) • Chemical Vapor Deposition (CVD) of silicon layer

– Place wafer in furnace with Silane gas (SiH4) – Forms many small called polysilicon – Heavily doped to be good conductor

23 Polysilicon Patterning

• Use same lithography process to pattern polysilicon

Self-Aligned Process

• Use oxide and masking to expose where n+ dopants should be diffused or implanted • N-diffusion forms nMOS source, drain, and n-well contact

24 N-diffusion • Pattern oxide and form n+ regions • Self-aligned process where gate blocks diffusion • Polysilicon is better than metal for self-aligned gates because it doesn’t melt during later processing

N-diffusion cont.

• Historically dopants were diffused • Usually ion implantation today • But regions are still called diffusion

25 N-diffusion cont.

• Strip off oxide to complete patterning step

P-Diffusion

• Similar set of steps form p+ diffusion regions for pMOS source and drain and substrate contact

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26 Contacts

• Now we need to wire together the devices • Cover chip with thick field oxide • Etch oxide where contact cuts are needed

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Metallization • Sputter on aluminum over whole wafer • Pattern to remove excess metal, leaving wires

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27 Layout • Chips are specified with set of masks • Minimum dimensions of masks determine transistor size (and hence speed, cost, and power) • Feature size f = distance between source and drain – Set by minimum width of polysilicon • Feature size improves 30% every 3 years or so • Normalize for feature size when describing design rules • Express rules in terms of  = f/2 – E.g.  = 0.3 μm in 0.6 μm process

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Design Rules • Design rules govern the layout of individual components: transistors, wires, contacts, vias – How small can the gates be, and how small can the wires be made? • Conflicting Demands:  – component packing: more functionality, higher speed – Chip yield: smaller sizes can reduce yield (fraction of good chips) • Conservative vs aggressive design rules

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28 Geometric Design Rules

• Resolution – Width and spacing of lines on one layer • Alignment – make sure interacting layers overlap (or don’t) – Contact surround – Poly overlap of diffusion – Well surround of diffusion

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SCMOS Design Rules • Scalable CMOS design rules • Feature size  = half the drawn gate length  (poly width) • Mentor Graphics IC tool has built-in design  rule checker (DRC) Example design rules:

Layer Minimum Width Separation Metal 1 3   3 Metal 2 3   4 Poly 2   poly-poly: 2 poly-diff: 1

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29 Foundry Interface

Layout (mask set)

Designer Foundry

Design Rules Process Parameters

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Simplified Design Rules

• Conservative rules to get you started

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30 Tub Ties and Latchup

• Substrate must be connected to power supply

• p-tub for nMOS to VSS (Gnd) • n-tub for pMOS to VDD • Connections made by special vias called tub ties • Conservative design rule: place tub ties for every one or two transistors • Why not place one tie in each tub that has 50 transistors?

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Latchup • Too few ties: high resistance between tub and power supply, leads to parasitic bipolar transistors inhibiting normal chip operation • Parasitic silicon-controlled rectifier (SCR) • When both bipolar transistors are off, SCR conducts no current

• SCR turns on: high current short-circuit between VDD and Gnd.

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31 Stick Diagrams • Designing complete layout in terms of rectangles can be overwhelming • Stick diagram: abstraction between transistor schematic and layout – Cartoon of a chip layout • Replace rectangles by lines

VDD (blue) p-type diffusion transistor VDD (yellow)

a Metal 1 (blue) a a Poly (red) n-type diffusion Gnd (green) VSS (Gnd)

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Stick Diagram

VDD Metal 1 VDD

a b p-diffusion a z b a

b Poly Gnd n-diffusion

Metal 1 Gnd

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32 Cell Minimization • Chip area (cell size) must be minimized carefully Impact of size/chip area on cost (unpackaged dies) Nominal 1% increase 15% increase Pentium die in die size in die size Wafer cost $1,460 $1,460 $1,460 Die size 160.2 mm2 161.8 mm2 184.2 mm2  Die cost $84.06 $85.33 $102.55 Chips fabricated per week 498.1 K 482.9 K 337.5 K  Added annual cost $63.5 M $961 M

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Minimize number of diffusion strips • How do we order the gate inputs (poly)? • More diffusion strips  more spacing, more area V  DD Try a, b, c, d, e: 

VDD e x x x x x a d

b c F F

a x x x x x x x b a b c d e d e c Gnd Two n-diff gaps, zero p-diff gaps

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33 e b VDD a a

e d c a d e d b c

b c pMOS graph nMOS graph

a b d e c

Gnd

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• Euler path: Visit every edge exactly  once • Find all Euler paths for nMOS and  pMOS graphs • Find p- and n-path that have identical labeling

• For example: d, e, a, b, c  • If no such path exists, then break diffusion into strips

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34 V  e b DD pMOS graph a a

e d a d e c d b c

b c nMOS graph

VDD x x x a F x x b c e F d Gnd

Ordering: d, e, a, b, c:  x x x x x Zero n-diff gaps, zero p-diff gaps Gnd d e a b c

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Some Layout Hints • Plan the global structure • Wiring on orthogonal (“big picture”), then metal layers design cells – Assign preferred – Floorplan directions to M1 and – Wiring strategy M2 – Power and ground – Use diffusion only for distribution devices, not for interconnect – Systematic placement – Use poly only for very – Keep all pMOS/nMOS local interconnect together – Place transistors in rows: share source/drain diffusion

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35 Inverter Layout

• Transistor dimensions specified as Width / Length – Minimum size is 4 / 2, sometimes called 1 unit – In f = 0.6 μm process, this is 1.2 μm wide, 0.6 μm long

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Summary

• MOS transistors are stacks of gate, oxide, silicon • Act as electrically controlled switches • Build logic gates out of switches • Draw masks to specify layout of transistors

• Now you know everything necessary to start designing schematics and layout for a simple chip!

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