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Si3N4 Deposition & the Virtual Chemical Vapor Deposition Lab

Making a , the general process A closer look at chemical vapor deposition and the virtual lab Images courtesy Run Educational Video, VCVD Lab Screenshot Why Si3N4 Deposition…Making Microprocessors

http://www.sonyericsson.com/cws/products/mobilephones /overview/x1?cc=us&lc=en

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On a wafer, billions of are housed on a single square chip. One malfunctioning transistor could cause a chip to short-circuit, ruining the chip. Thus, the process of creating each microscopic transistor must be very precise.

Wafer image: http://upload.wikimedia.org/wikipedia/fr/thumb/2/2b/PICT0214.JPG/300px-PICT0214.JPG What size do you think an individual transistor being made today is? Size of Transistors

One chip is made of millions or billions of transistors packed into a length and width of less than half an inch. Channel lengths in MOSFET transistors are less than a tenth of a micrometer. Human hair is approximately 100 micrometers in diameter.

Scaling of successive generations of into the nanoscale regime (from ). Transistor: MOS

We will illustrate the process sequence of creating a transistor with a Metal Oxide (MOS) transistor. Wafers – 12” Diameter

½” to ¾”

Source Gate Drain conductor Insulator n-Si n-Si p-Si

Image courtesy: Pro. Milo Koretsky Chemical Engineering Department at OSU IC Manufacturing Process IC Processing consists of selectively adding material (Conductor, insulator, semiconductor) to, removing it from or modifying it Wafers

Deposition / Photo/ Ion Implant / Pattern Etching / CMP

Oxidation Anneal Clean Clean Transfer

Loop

(Note that these steps are not all the steps to create a transistor. Some steps are skipped. This is purely to show the various stages in the loop to create a transistor.) Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Making a Transistor: Starting Silicon Wafer Wafers

Clean

Deposition /

Oxidation

Transfer

Pattern

Photo/ Loop

Si

Etching Etching /

CMP

Ion Ion Implant / Anneal

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Clean substrate

Clean Deposition /

Oxidation Polished Silicon Wafer

Transfer

Pattern

Photo/

Loop

Etching Etching / CMP

Si

Ion Ion Implant / Anneal

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Chemical Vapor Deposition: Si3N4

Clean

Process 200 Wafers at a Time

Deposition /

Oxidation

Transfer

Pattern

Photo/

Loop

Etching Etching / CMP

Si

Ion Ion Implant / Anneal

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Spin Coating of Photoresist

Clean

Deposition / Oxidation

mask

Transfer

Pattern

Photo/

Loop

Etching Etching / CMP

Si

Ion Ion Implant / Anneal

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Develop Photoresist

Clean

Deposition /

Oxidation

Transfer

Pattern

Photo/

Loop

Etching Etching / CMP

Si

Ion Ion Implant / Anneal

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Plasma Etch Si3N4

Clean

Deposition /

Oxidation

Transfer

Pattern

Photo/

Loop

Etching Etching / CMP

Si

Ion Ion Implant / Anneal

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Plasma Etch: Strip Photoresist

Clean

Deposition /

Oxidation

Transfer

Pattern

Photo/

Loop

Etching Etching / CMP

Si

Ion Ion Implant / Anneal

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU

Clean

IONS IONS IONS

Deposition /

Oxidation

Transfer

Pattern

Photo/

Loop

Etching Etching / CMP Si

1.75 u

Ion Ion Implant / Anneal 1/50th of a human hair

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Anneal

• Clean before anneal Clean

Activate (& diffuse) the dopant

Deposition / Oxidation

HEAT HEAT HEAT

Transfer

Pattern

Photo/

Loop

Etching Etching / CMP

Si

Ion Ion Implant / Anneal

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU The Final Steps…a completed transistor

Gate: +

Source - Drain: +

- - e e Si

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Chemical Vapor Deposition A Closer Look: Si3N4

Reactions:

__SiCl2H2 (g) + __NH3 (g) Si3N4 (s) + HCl (g) + H2 (g) Dichlorosilane Ammonia Silicon Hydrogen chloride Hydrogen nitride

__HCl (g) + __NH3 (g) ___NH4 Cl(g) NH4Cl (gas) NH3 (gas) Hydrogen chloride Ammonia Ammonium chloride H2 (gas) DCS (gas)

Silicon nitride

DCS (gas)

NH3 (gas) Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Chemical Vapor Deposition A Closer Look: Si3N4 Reactions:

3 SiCl2H2 (g) + 4 NH3 (g) 1 Si3N4 (s) + 6 HCl (g) + 6 H2 (g) Dichlorosilane Ammonia Silicon Hydrogen chloride Hydrogen nitride NH4Cl (gas) NH3 (gas) H2 (gas) DCS (gas) 1 HCl (g) + 1 NH3 (g) 1 NH4 Cl(g) Hydrogen chloride Ammonia Ammonium chloride

Silicon nitride

DCS (gas)

NH3 (gas) Overall Reaction:

3 SiCl2H2 (g)+10 NH3 (g) Si3N4 (s) + 6 NH4Cl (g)+ 6 H2 (g) Dichlorosilane Ammonia Silicon Ammonium chloride Hydrogen (DCS) nitride

Graphics copy-write Pro. Milo Koretsky Chemical Engineering Department at OSU Concentration

What factors do you think affect the reaction and film growth? Temperature

Reaction/Deposition Time Virtual CVD Overview Choosing the Virtual CVD reactor parameters

Pressure is Fixed Factors that Effect Reaction and Film Growth: Concentration  Absolute flow rates of PV = nRT NH3 to SiCl2H2

 Ratio of NH3 to SiCl2H2 NH4Cl (gas) NH3 (gas) H2 (gas)  Pressure (fixed) SiCl2H2 (gas)

SiCl2H2 (gas)

NH3 (gas)

Graphics copy-write Pro. Milo Koretsky, Chemical Engineering Department at OSU and Silicon Run Educational Video Factors that Effect Reaction and Film Growth: Temperature There are 5 First order reaction (thermal): temperature zones A B Remember

(18.12, Addison-Wesley, Chemistry) 1 k Energy B Rate = [A] Ea,f

A  Ea, f  k  k exp  0  RT  Reaction coordinate The Arrhenius Equation

 Factors that Effect Reaction and Film Growth: Temperature

What can you do with the 5 temperature zones??? PV = nRT NH4Cl (gas) NH3 (gas) H2 (gas) SiCl2H2 (gas)

SiCl2H2 (gas)

NH3 (gas)

Graphics copy-write Pro. Milo Koretsky, Chemical Engineering Department at OSU and Silicon Run Educational Video Factors that Effect Reaction and Film Growth: Deposition Time aka Reaction Time

Reaction/Deposition Time = the amount of time the reactor runs How do you think deposition time effects the film thickness??? Virtual CVD Overview Choosing the Virtual CVD reactor parameters

Pressure is Fixed

Each run costs $ Measurement – Thickness & Uniformity

 Film thickness is determined by the amount of material that reacts and is grown on the wafer  Uniformity describes the evenness of film thickness on the wafer 45% Uniformity 100% Uniformity

1000 1000

800 800

600 600

400 400

200 200

Film Thickness [A] Thickness Film [A] Thickness Film 0 0 -150 -50 50 150 -150 -50 50 150 x position x position Measurement – Thickness & Uniformity

 Film thickness is determined by the amount of material that reacts and is grown on the wafer  Uniformity describes the evenness of film thickness on the wafer

NH4Cl (gas) NH3 (gas) H2 (gas) SiCl2H2 (gas) 200 50% Overall Efficiency 150

100 Wafer # Wafer

50

0 0 2000 4000 6000 8000 10000 SiCl2H2 (gas) Thickness [A]

NH3 (gas) 79% Overall Efficiency Measurement via Ellipsometer

Light Source  The ellipsometer is used to measure the Detector thickness and refractive index of Light Control transparent films.  It is made of a light source and polarizer Analyzing Polarizing on one side and a analyzer and detector Polarizer Sheet on the other side. Substrate

Analyzer & Light Source, Detector Control & Polarizing  Light from the source is polarized Sheet and reflected off the film.  The analyzer is rotated till no light passes through it.  The angle of rotation depends on the thickness of the film. Virtual CVD Overview Choosing the locations on the wafer to measure

Each measurement costs $ Virtual Chemical Vapor Deposition (VCVD) Program Semiconductor Manufacturing Fab VCVD Program

Photo Courtesy of http://webmedia.national.com/gallery/06/06_rgb.jpg Your Objectives:

Determine how temperature, flow rates, and

reaction time impact deposition of Si3N4 Minimize cost of testing process used to determine the impact of these parameters Extra Credit: Find an optimized “recipe” that produces high uniformity (within wafer and between wafers) and meets a target thickness of 1000 Angstroms Economy of Transistors

~$300 /chip X ~200 chips/wafer

http://www.nitride.co.jp/english X 200 wafers/furnace /products/wafer.html load = $12 Million per furnace load http://www.dvhardware.net/article16696.html Let’s Get Started

Open VCVD Program...