nanoIR3-s Nano-FTIR Spectroscopy Highest Performance s-SNOM and AFM Imaging

The nanoIR3-s system combines scattering scanning near-field optical microscopy (s-SNOM) and nanoscale IR spectroscopy (AFM-IR) with an integrated atomic force microscope (AFM), all in a single platform. Building upon the legacy of Anasys technology leadership in AFM-based nano-optical characterization, nanoIR3-s provides nanoscale IR spectroscopy, chemical imaging, and optical property mapping with 10-nanometer spatial resolution demonstrated on 2D material samples. The system also enables AFM topographic imaging and material property mapping with nanometer-scale resolution, making it an ideal instrument for correlative studies across a wide range of material science applications.

The nanoIR3-s System Features: Correlative analysis of spatial map reconstructed from separate correlated AFM and chemical measurements reveal molecular „ Femtosecond broadband nano-FTIR spectroscopy orientation of vacuum-deposited PTCDA defects. Science Advances, 2 (10), e1601006 - E. A. Muller, et al. „ Complementary s-SNOM, and AFM-IR techniques „ Fully featured, high-resolution AFM with electrical, mechanical, and thermal modes

Nanoscale Infrared Spectroscopy Innovation with Integrity spatial resolution. of thermaltransitiontemperatures atnanoscale the nanoTA technique for quantitative measurements is theoptiontoimagelocalthermalpropertiesvia in asample’s mechanical properties. Additionally, there ResonanceContact technique (LCR)tomapvariations frequencies ofan AFM cantilever usingtheLorentz resonance tomeasure contact has thecapability In additiontonanoscaleIRspectroscopy, nanoIR3-s Analysis andElectrical AFM Modes Mechanical Property Mapping,Nanothermal libraries. spectral database andaresearchableinterpretation, againstexisting IR absorbance spectra,allowing for straightforward absorbance spectracanbedirectlyrelatedtoFT-IR deflection ofthe AFMprobe. The resultingIR which isdetectedby theresulting mechanical sample, causingrapidandtransientlocalexpansion, The pulsedradiationisselectively absorbedby the down) withabroadband,pulsed,tunable mid-IRlaser. instrument functionsby illuminatingthesample(top The resonance-enhanced AFM-IR componentofthe Resonance-Enhanced AFM-IR depending uponthesampletype. chemical imagingto10 nanometersorbelow, sample andisabletoachieve higherspatial resolution AFM-IR provides lower AFM probesforces onthe expansion usingdifferent harmonicmodes. Tapping mode,sensingphotothermal resonances intapping AFM-IR probeisdriven atdifferent harmonicmodes/ the sensingmechanism. A speciallydesigned Tapping AFM-IR, butusestapping AFM modeoperationas detection mechanism asresonance-enhanced Tapping AFM-IR usesthesamephotothermal Tapping AFM-IR CW QCLLaseroperation. provides both spectroscopy andchemical imagingfor that spectra. POINTspectraisapatentedcapability wavelength ofthesourcechanged toprovide near-field probe canbepositionedatafixed locationandthe withthetopographysimultaneous image,orthe the samplesurface tocreatenear-field opticalimages This canbe donewhiletheprobeisscanningacross amplitude andphaseofthescattered lightismeasured. Using patentedtechniques for s-SNOM,thenear-field s-SNOM NanoscaleTechniquesComplementary www.bruker.com/nanoIR [email protected] Phone +1.866.262.4040 Barbara,Santa CA•USA Bruker NanoSurfaces andMetrology Division

Modes Sample Size andMovement QCL Laser QCL POINTspectra Key LaserOptions Modes AFM Imaging Modes Chemical Field ofView Field Objective Zoom Digital Resolution CCD Illumination Optical Microscopes Range Z stage Range Stage XY heightSample Size Sample Accuracy Positioning Tip Stage Scan XY Resolution Scan Range Z Scan Range Scan XY Z Noise AFM Performance Diode Laser Diode NIR nm 1550 Laser HeNe nm 632.8 Visible Laser CO2 Laser QCL Chip Single/Multiple with 950-1900 cm 950-1900 with wave/pulsed continuous 4chip 6 or KPFM C-AFM; Optional calibration; lateral force; EFM/MFM Standard Imaging;Hyperspectral s-SNOM FASTmapping (AFM-IR); (AFM-IR); FASTspectraTapping AFM-IR; ~450 x 300 μm min μm x300 ~450 max; μm x600 ~900 10X 3X 5MP 1.5 μm Brightfield motorized mm >5 motorized 8 xmm <10 max mm max dia mm <25 nm ±10 sensing closed-loop Flexure capacitive with pixels x1024 ≤1024 μm >4 μm x50 μm 50 RMS <130 pm integration into nanoIR3-s for package optics 5 mw and integration into nanoIR3-s for package 10 optics mw and s-SNOM with use For for s-SNOM ranges different with pulsed spectral wave/ continuous multi-chip or Single request upon available wavelengths additional AFM-IR, and : NanoTA; SThM; LCR; LCR; : NanoTA; SThM; : tapping; contact: phase; force -1 range for s-SNOM range for s-SNOM

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