Introduction to VNA Basics ––
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Spectrum Analyzer
Test & Measurement Product Catalog 版权所有 仿冒必究 V01-15 Contents Digital Oscilloscope 3 DS6000 Series Digital Oscilloscope 4 MSO/DS4000 Series Digital Oscilloscope 6 DS4000E Series Digital Oscilloscope 8 MSO/DS2000A Series Digital Oscilloscope 10 MSO/DS1000Z Series Digital Oscilloscope 12 DS1000B Series Digital Oscilloscope 14 DS1000D/E Series Digital Oscilloscope 14 Bus Analysis Guide 16 Power Measurement and Analysis 16 Current & Active Probes 17 Probes & Accessories Guide 18 Spectrum Analyzer 19 DSA800/E Series Spectrum Analyzer 20 DSA700 Series Spectrum Analyzer 22 DSA1000/A Series Spectrum Analyzer 24 EMI Test System(S1210) 25 NFP-3 Near Field Probes 25 Common RF Accessories 26 RF Accessories Selection Guide 27 RF Signal Generator 28 DSG3000 Series RF Signal Generator 29 DSG800 Series RF Signal Generator 31 Function/Arbitrary Waveform Generator 33 DG5000 Series Function/Arbitrary Waveform Generator 34 DG4000 Series Function/Arbitrary Waveform Generator 36 DG1000Z Series Function/Arbitrary Waveform Generator 38 DG1000 Series Function/Arbitrary Waveform Generator 40 Digital Multimeter 41 DM3058 5½ Digits Digital Multimeter 41 DM3058E 5½ Digits Digital Multimeter 41 DM3068 6½ Digits Digital Multimeter 41 Data Acquisition/Switch System 43 M300 Series Data Acquisition/Switch System 43 Programmable DC Power Supply 45 DP800 Series Programmable DC Power Supply 46 DP700 Series Programmable DC Power Supply 48 Programmable DC Electronic Load 50 DL3000 Series Programmable DC Electronic Load 50 2 RIGOL Digital Oscilloscope Digital oscilloscope, an essential electronic equipment for By adopting the innovative technique “UltraVision”, R&D, manufacture and maintenance, is used by electronic DS6000 realizes deeper memory depth, higher waveform engineers to observe various kinds of analog and digital capture rate, real time waveform record and multi-level signals. -
Analysis of Microwave Networks
! a b L • ! t • h ! 9/ a 9 ! a b • í { # $ C& $'' • L C& $') # * • L 9/ a 9 + ! a b • C& $' D * $' ! # * Open ended microstrip line V + , I + S Transmission line or waveguide V − , I − Port 1 Port Substrate Ground (a) (b) 9/ a 9 - ! a b • L b • Ç • ! +* C& $' C& $' C& $ ' # +* & 9/ a 9 ! a b • C& $' ! +* $' ù* # $ ' ò* # 9/ a 9 1 ! a b • C ) • L # ) # 9/ a 9 2 ! a b • { # b 9/ a 9 3 ! a b a w • L # 4!./57 #) 8 + 8 9/ a 9 9 ! a b • C& $' ! * $' # 9/ a 9 : ! a b • b L+) . 8 5 # • Ç + V = A V + BI V 1 2 2 V 1 1 I 2 = 0 V 2 = 0 V 2 I 1 = CV 2 + DI 2 I 2 9/ a 9 ; ! a b • !./5 $' C& $' { $' { $ ' [ 9/ a 9 ! a b • { • { 9/ a 9 + ! a b • [ 9/ a 9 - ! a b • C ) • #{ • L ) 9/ a 9 ! a b • í !./5 # 9/ a 9 1 ! a b • C& { +* 9/ a 9 2 ! a b • I • L 9/ a 9 3 ! a b # $ • t # ? • 5 @ 9a ? • L • ! # ) 9/ a 9 9 ! a b • { # ) 8 -
Frequency Domain Measurements: Spectrum Analyzer Or Oscilloscope?
Keysight Technologies Frequency Domain Measurements: Spectrum Analyzer or Oscilloscope? Selection Guide Changes in test and measurement technologies are blurring the lines between platforms and giving engineers new options Introduction For generations, the rules for RF engineers were simple: frequency-domain measurements (output frequency, band power, signal bandwidth, etc.) were done by a spectrum analyzer, and time domain measurements (pulse width and repetition rate, signal timing, etc.) were done by an oscilloscope. As the digital revolution made signal processing techniques easier and more widespread, the lines between the two platforms began to blur. Oscilloscopes started incorporating Fast Fourier Transform (FFT) techniques that converted the time-domain traces to the frequency domain. Spectrum analyzers began capturing their data in the time domain and using post-processing to generate displays. Still, there were some clear distinctions between the two platforms. For example, oscilloscopes were limited in sample speed. They could see signals down to DC, but only up to a few GHz. Spectrum analyzers could see high into the microwave range, but they missed transient signals as they swept. What if you needed to see a signal in the time domain with a carrier frequency of 40 GHz or capture a complete wideband pulse in X-band? As technologies in EW, radar and communications move ahead, the demands on the test equipment become greater. As more possibilities have opened for RF and microwave equipment because of new digital processing technologies, they have also increased opportunities for test equipment. Spectrum analyzers and oscilloscopes can do much more than they could even a few years ago, and as they expand in capabilities, the lines between them become blurred and sometimes even erased. -
TM 11-5099 D E P a R T M E N T O F T H E a R M Y T E C H N I C a L M a N U a L SPECTRUM ANALYZER AN/UPM-58 This Reprint Inclu
TM 11-5099 DEPARTMENT OF THE ARMY TECHNICAL MANUAL SPECTRUM ANALYZER AN/UPM-58 This reprint includes all changes in effect at the time of publication; changes 1 through 3. HEADQUARTERS, DEPARTMENT OF THE ARMY MAY 1957 Changes in force: C 1, C 2, and C 3 TM 11-5099 C3 CHANGE HEADQUARTERS DEPARTMENT OF THE ARMY No. 3 } WASHINGTON, D.C., 4 May 1967 SPECTRUM ANALYZER AN/UPM-58 TM 11-5099, 28 May 1957, is changed as follows: Note. The parenthetical reference to previous Report of errors, omissions, and recommendations for changes (example: page 1 of C 2) indicate that pertinent Improving this manual by the individual user is material was published in that change. encouraged. Reports should be submitted .on DA Form Page 2, paragraph 1.1, line 6 (page 1 of C 2). Delete 2028 (Recommended Changes to DA Publications) and "(types 4, 6, 7, 8, and 9)" and substitute: (types 7, 8, and forwarded direct to Commanding General, U.S. Army 9). Paragraph 2c (page 1 of C 2). Delete subparagraph Electronics Command, ATTN: AMSEL-MR-NMP-AD, c and substitute: Fort Monmouth, N.J. 07703. c. Reporting of Equipment Manual Improvements. Page 77. Add section V after section 1V. Section V. DEPOT OVERHAUL STANDARDS 95.1. Applicability of Depot Overhaul Standards requirements for testing this equipment. The tests outlined in this chapter are designed to b. Technical Publications. The technical measure the performance capability of a repaired publication applicable to the equipment to be tested is equipment. Equipment that is to be returned to stock TM 11-5099. -
Scattering Parameters
Scattering Parameters Motivation § Difficult to implement open and short circuit conditions in high frequencies measurements due to parasitic L’s and C’s § Potential stability problems for active devices when measured in non-operating conditions § Difficult to measure V and I at microwave frequencies § Direct measurement of amplitudes/ power and phases of incident and reflected traveling waves 1 Prof. Andreas Weisshaar ― ECE580 Network Theory - Guest Lecture ― Fall Term 2011 Scattering Parameters Motivation § Difficult to implement open and short circuit conditions in high frequencies measurements due to parasitic L’s and C’s § Potential stability problems for active devices when measured in non-operating conditions § Difficult to measure V and I at microwave frequencies § Direct measurement of amplitudes/ power and phases of incident and reflected traveling waves 2 Prof. Andreas Weisshaar ― ECE580 Network Theory - Guest Lecture ― Fall Term 2011 1 General Network Formulation V + I + 1 1 Z Port Voltages and Currents 0,1 I − − + − + − 1 V I V = V +V I = I + I 1 1 k k k k k k V1 port 1 + + V2 I2 I2 V2 Z + N-port 0,2 – port 2 Network − − V2 I2 + VN – I Characteristic (Port) Impedances port N N + − + + VN I N Vk Vk Z0,k = = − + − Z0,N Ik Ik − − VN I N Note: all current components are defined positive with direction into the positive terminal at each port 3 Prof. Andreas Weisshaar ― ECE580 Network Theory - Guest Lecture ― Fall Term 2011 Impedance Matrix I1 ⎡V1 ⎤ ⎡ Z11 Z12 Z1N ⎤ ⎡ I1 ⎤ + V1 Port 1 ⎢ ⎥ ⎢ ⎥ ⎢ ⎥ - V2 Z21 Z22 Z2N I2 ⎢ ⎥ = ⎢ ⎥ ⎢ ⎥ I2 + ⎢ ⎥ ⎢ ⎥ ⎢ ⎥ V2 Port 2 ⎢ ⎥ ⎢ ⎥ ⎢ ⎥ - V Z Z Z I N-port ⎣ N ⎦ ⎣ N1 N 2 NN ⎦ ⎣ N ⎦ Network I N [V]= [Z][I] V + Port N N + - V Port i i,oc- Open-Circuit Impedance Parameters Port j Ij N-port Vi,oc Zij = Network I j Port N Ik =0 for k≠ j 4 Prof. -
Fieldfox Handheld Analyzers Configuration Guide
FieldFox Handheld Analyzers 4/6.5/9/14/18/26.5/32/44/50 GHz This configuration guide describes configurations, options and accessories for the FieldFox A-Series family of portable analyzers. This guide should be used in conjunction with the technical overview and data sheet for a Included accessories complete description of the analyzers. The table on Page 3 titled “FieldFox A-Series Family and Options” shows a comparison of the functions available The following accessories are included with every in the FieldFox A-Series family of analyzers. FieldFox Note: Combination analyzer (combo) = Cable and antenna tester (CAT) + • AC/DC adapter Vector network analyzer (VNA) + Spectrum analyzer (SA) • Battery • Soft carrying case • LAN cable • Quick Reference Guide Find us at www.keysight.com Page 1 Table of Contents FieldFox A-Series Family and Options ......................................................................................................... 3 FieldFox RF and Microwave (Combination) Analyzers ................................................................................. 4 Analyzer models ........................................................................................................................................ 4 Analyzer options ........................................................................................................................................ 5 FieldFox RF and Microwave (Combination) Analyzer FAQs ........................................................................ 7 ERTA System Typical Configuration -
Measurement Procedure and Test Equipment Used
MOTOROLA INC. FCC ID: ABZ99FT4056 TEST SET-UP PROCEDURES AND TEST EQUIPMENT USED Pursuant to 47 CFR 2.947 Except where otherwise stated, all measurements are made following the Telecommunications Industries Association/Electronic Industries Association (TIA/EIA) “Land Mobile FM or PM Communications Equipment Measurement and Performance Standards” (TIA/EIA-603-A). This exhibit presents a brief summary of how the measurements were made, the required limits, and the test equipment used. The following procedures are presented with this application: 1) Test Equipment List 2) RF Power Output 3) Audio Frequency Response 4) Post Limiter Lowpass Filter Response 5) Modulation Limiting Characteristic 6) Occupied Bandwidth 7) Conducted Spurious Emissions 8) Radiated Spurious Emissions 9) Frequency Stability vs. Temperature and Voltage 10) Transient Frequency Behavior EXHIBIT 7 SHEET 1 OF 6 MOTOROLA INC. FCC ID: ABZ99FT4056 Test Equipment List Pursuant to 47 CFR 2.1033(c) The following test equipment was used to perform the measurements of the submitted data. The calibration of this equipment is performed at regular intervals. Transmitter Frequency: HP 5385A Frequency Counter with High-Stability Reference Temperature Measurement: HP 2804A Quartz Thermometer Transmitter RF Power: HP 435A Power Meter with HP 8482A Power Sensor DC Voltages and Currents: Fluke 8010A Digital Voltmeter Audio Responses: HP 8903B Audio Analyzer Deviation: HP 8901B Modulation Analyzer Transmitter Conducted Spurious and Harmonic Emissions: HP 8566B Spectrum Analyzer with HP 85685A Preselector Transmitter Occupied Bandwidth: HP 8591A Spectrum Analyzer Radiated Spurious and Harmonic Emissions: Radiated Spurious and Harmonic Emissions were performed by: Motorola Plantation OATS (Open Area Test Site) Lab 8000 West Sunrise Blvd. -
Scattering Parameters - Wikipedia, the Free Encyclopedia Page 1 of 13
Scattering parameters - Wikipedia, the free encyclopedia Page 1 of 13 Scattering parameters From Wikipedia, the free encyclopedia Scattering parameters or S-parameters (the elements of a scattering matrix or S-matrix ) describe the electrical behavior of linear electrical networks when undergoing various steady state stimuli by electrical signals. The parameters are useful for electrical engineering, electronics engineering, and communication systems design, and especially for microwave engineering. The S-parameters are members of a family of similar parameters, other examples being: Y-parameters,[1] Z-parameters,[2] H- parameters, T-parameters or ABCD-parameters.[3][4] They differ from these, in the sense that S-parameters do not use open or short circuit conditions to characterize a linear electrical network; instead, matched loads are used. These terminations are much easier to use at high signal frequencies than open-circuit and short-circuit terminations. Moreover, the quantities are measured in terms of power. Many electrical properties of networks of components (inductors, capacitors, resistors) may be expressed using S-parameters, such as gain, return loss, voltage standing wave ratio (VSWR), reflection coefficient and amplifier stability. The term 'scattering' is more common to optical engineering than RF engineering, referring to the effect observed when a plane electromagnetic wave is incident on an obstruction or passes across dissimilar dielectric media. In the context of S-parameters, scattering refers to the way in which the traveling currents and voltages in a transmission line are affected when they meet a discontinuity caused by the insertion of a network into the transmission line. This is equivalent to the wave meeting an impedance differing from the line's characteristic impedance. -
Scattering Parameters
Chapter 1 Scattering Parameters Scattering parameters are a powerful analysis tool, providing much insight on the electrical behavior of circuits and devices at, and beyond microwave frequencies. Most vector network analyzers are designed with the built-in capability to display S parameters. To an experienced engineer, S parameter plots can be used to quickly identify problems with a measurement. A good understanding of their precise meaning is therefore essential. Talk about philosophy behind these derivations in order to place reader into context. Talk about how the derivations will valid for arbitrary complex reference impedances (once everything is hammered out). Talk about the view of pseudo-waves and the mocking of waveguide theory mentionned on p. 535 of [1]. Talk about alterantive point of view where S-parameters are a conceptual tool that can be used to look at real traveling waves, but don’t have to. Call pseudo-waves: traveling waves of a conceptual measurement setup. Is the problem of connecting a transmission line of different ZC than was used for the measurement that it may alter the circuit’s response (ex: might cause different modes to propagate), and thus change the network?? Question: forward/reverse scattering parameters: Is that when the input (port 1) is excited, or simly incident vs. reflected/transmitted??? The reader is referred to [2][1][3] for a more general treatment, including non-TEM modes. Verify this statement, and try to include this if possible. Traveling Waves And Pseudo-Waves Verify the following statements with the theory in [1]. Link to: Scattering and pseudo-scattering matrices. -
Authors Benjamin J
Authors Benjamin J. Chapman, Eric I. Rosenthal, Joseph Kerckhoff, Bradley A. Moores, Leila R. Vale, J. A. B. Mates, Kevin Lalumière, Alexandre Blais, and K.W. Lehnert This article is available at CU Scholar: https://scholar.colorado.edu/jila_facpapers/2 PHYSICAL REVIEW X 7, 041043 (2017) Widely Tunable On-Chip Microwave Circulator for Superconducting Quantum Circuits † Benjamin J. Chapman,1,* Eric I. Rosenthal,1 Joseph Kerckhoff,1, Bradley A. Moores,1 Leila R. Vale,2 ‡ J. A. B. Mates,2 Gene C. Hilton,2 Kevin Lalumi`ere,3, Alexandre Blais,3,4 and K. W. Lehnert1 1JILA, National Institute of Standards and Technology and the University of Colorado, Boulder, Colorado 80309, USA and Department of Physics, University of Colorado, Boulder, Colorado 80309, USA 2National Institute of Standards and Technology, Boulder, Colorado 80305, USA 3D´epartement de Physique, Universit´e de Sherbrooke, Sherbrooke, Qu´ebec J1K 2R1, Canada 4Canadian Institute for Advanced Research, Toronto, Ontario M5G 1Z8, Canada (Received 13 July 2017; published 22 November 2017) We report on the design and performance of an on-chip microwave circulator with a widely (GHz) tunable operation frequency. Nonreciprocity is created with a combination of frequency conversion and delay, and requires neither permanent magnets nor microwave bias tones, allowing on-chip integration with other superconducting circuits without the need for high-bandwidth control lines. Isolation in the device exceeds 20 dB over a bandwidth of tens of MHz, and its insertion loss is small, reaching as low as 0.9 dB at select operation frequencies. Furthermore, the device is linear with respect to input power for signal powers up to hundreds of fW (≈103 circulating photons), and the direction of circulation can be dynamically reconfigured. -
S-Parameter Techniques – HP Application Note 95-1
H Test & Measurement Application Note 95-1 S-Parameter Techniques Contents 1. Foreword and Introduction 2. Two-Port Network Theory 3. Using S-Parameters 4. Network Calculations with Scattering Parameters 5. Amplifier Design using Scattering Parameters 6. Measurement of S-Parameters 7. Narrow-Band Amplifier Design 8. Broadband Amplifier Design 9. Stability Considerations and the Design of Reflection Amplifiers and Oscillators Appendix A. Additional Reading on S-Parameters Appendix B. Scattering Parameter Relationships Appendix C. The Software Revolution Relevant Products, Education and Information Contacting Hewlett-Packard © Copyright Hewlett-Packard Company, 1997. 3000 Hanover Street, Palo Alto California, USA. H Test & Measurement Application Note 95-1 S-Parameter Techniques Foreword HEWLETT-PACKARD JOURNAL This application note is based on an article written for the February 1967 issue of the Hewlett-Packard Journal, yet its content remains important today. S-parameters are an Cover: A NEW MICROWAVE INSTRUMENT SWEEP essential part of high-frequency design, though much else MEASURES GAIN, PHASE IMPEDANCE WITH SCOPE OR METER READOUT; page 2 See Also:THE MICROWAVE ANALYZER IN THE has changed during the past 30 years. During that time, FUTURE; page 11 S-PARAMETERS THEORY AND HP has continuously forged ahead to help create today's APPLICATIONS; page 13 leading test and measurement environment. We continuously apply our capabilities in measurement, communication, and computation to produce innovations that help you to improve your business results. In wireless communications, for example, we estimate that 85 percent of the world’s GSM (Groupe Speciale Mobile) telephones are tested with HP instruments. Our accomplishments 30 years hence may exceed our boldest conjectures. -
Introduction to RF Measurements and Instrumentation
Introduction to RF measurements and instrumentation Daniel Valuch, CERN BE/RF, [email protected] Purpose of the course • Introduce the most common RF devices • Introduce the most commonly used RF measurement instruments • Explain typical RF measurement problems • Learn the essential RF work practices • Teach you to measure RF structures and devices properly, accurately and safely to you and to the instruments Introduction to RF measurements and instrumentation 2 Daniel Valuch CERN BE/RF ([email protected]) Purpose of the course • What are we NOT going to do… But we still need a little bit of math… Introduction to RF measurements and instrumentation 3 Daniel Valuch CERN BE/RF ([email protected]) Purpose of the course • We will rather focus on: Instruments: …and practices: Methods: Introduction to RF measurements and instrumentation 4 Daniel Valuch CERN BE/RF ([email protected]) Transmission line theory 101 • Transmission lines are defined as waveguiding structures that can support transverse electromagnetic (TEM) waves or quasi-TEM waves. • For purpose of this course: The device which transports RF power from the source to the load (and back) Introduction to RF measurements and instrumentation 5 Daniel Valuch CERN BE/RF ([email protected]) Transmission line theory 101 Transmission line Source Load Introduction to RF measurements and instrumentation 6 Daniel Valuch CERN BE/RF ([email protected]) Transmission line theory 101 • The telegrapher's equations are a pair of linear differential equations which describe the voltage (V) and current (I) on an electrical transmission line with distance and time. • The transmission line model represents the transmission line as an infinite series of two-port elementary components, each representing an infinitesimally short segment of the transmission line: Distributed resistance R of the conductors (Ohms per unit length) Distributed inductance L (Henries per unit length).