A Guide to Calibrating Your Spectrum Analyzer
Total Page:16
File Type:pdf, Size:1020Kb
Load more
Recommended publications
-
MXG X-Series Signal Generators N5183B Microwave Analog 9 Khz to 13, 20, 31.8, Or 40 Ghz
MXG X-Series Signal Generators N5183B Microwave Analog 9 kHz to 13, 20, 31.8, or 40 GHz Find us at www.keysight.com Page 1 Definitions Specification (spec): Specifications represent warranted performance of a calibrated instrument that has been stored for a minimum of 2 hours within the operating temperature range of 0 to 55 °C, unless otherwise stated, and after a 45 minutes warm-up period. The specifications include measurement uncertainty. Data represented in this document are specifications unless otherwise noted. Typical (typ): Typical (typ) describes additional product performance information. It is performance beyond specifications that 80 percent of the units exhibit with a 95 percent confidence level at room temperature (approximately 25 °C). Typical performance does not include measurement uncertainty. Nominal (nom) or measured (meas): Nominal (nom) or measured (meas) describes a performance attribute that is by design or measured during the design phase for the purpose of communicating sampled, mean, or average performance, such as the 50-ohm connector or amplitude drift vs. time. This data is not warranted and is measured at room temperature (approximately 25 °C). Find us at www.keysight.com Page 2 Frequency Specifications Range Frequency range Option 513 9 kHz to 13 GHz Option 520 9 kHz to 20 GHz Option 532 9 kHz to 31.8 GHz Option 540 9 kHz to 40 GHz Resolution 0.001 Hz Phase offset Adjustable in nominal 0.1° increments Frequency switching speed 1 () = typical Standard Option UNZ 2, 4 Option UZ2 3, 4 CW mode SCPI mode (≤ 5 ms) ≤ 1.15 ms (≤ 750 μs) < 1.65 ms (1 ms) List/step sweep mode (≤ 5 ms) ≤ 900 μs (≤ 600 μs) < 1.4 ms (850 μs) 1. -
Spectrum Analyzer
Test & Measurement Product Catalog 版权所有 仿冒必究 V01-15 Contents Digital Oscilloscope 3 DS6000 Series Digital Oscilloscope 4 MSO/DS4000 Series Digital Oscilloscope 6 DS4000E Series Digital Oscilloscope 8 MSO/DS2000A Series Digital Oscilloscope 10 MSO/DS1000Z Series Digital Oscilloscope 12 DS1000B Series Digital Oscilloscope 14 DS1000D/E Series Digital Oscilloscope 14 Bus Analysis Guide 16 Power Measurement and Analysis 16 Current & Active Probes 17 Probes & Accessories Guide 18 Spectrum Analyzer 19 DSA800/E Series Spectrum Analyzer 20 DSA700 Series Spectrum Analyzer 22 DSA1000/A Series Spectrum Analyzer 24 EMI Test System(S1210) 25 NFP-3 Near Field Probes 25 Common RF Accessories 26 RF Accessories Selection Guide 27 RF Signal Generator 28 DSG3000 Series RF Signal Generator 29 DSG800 Series RF Signal Generator 31 Function/Arbitrary Waveform Generator 33 DG5000 Series Function/Arbitrary Waveform Generator 34 DG4000 Series Function/Arbitrary Waveform Generator 36 DG1000Z Series Function/Arbitrary Waveform Generator 38 DG1000 Series Function/Arbitrary Waveform Generator 40 Digital Multimeter 41 DM3058 5½ Digits Digital Multimeter 41 DM3058E 5½ Digits Digital Multimeter 41 DM3068 6½ Digits Digital Multimeter 41 Data Acquisition/Switch System 43 M300 Series Data Acquisition/Switch System 43 Programmable DC Power Supply 45 DP800 Series Programmable DC Power Supply 46 DP700 Series Programmable DC Power Supply 48 Programmable DC Electronic Load 50 DL3000 Series Programmable DC Electronic Load 50 2 RIGOL Digital Oscilloscope Digital oscilloscope, an essential electronic equipment for By adopting the innovative technique “UltraVision”, R&D, manufacture and maintenance, is used by electronic DS6000 realizes deeper memory depth, higher waveform engineers to observe various kinds of analog and digital capture rate, real time waveform record and multi-level signals. -
Frequency Domain Measurements: Spectrum Analyzer Or Oscilloscope?
Keysight Technologies Frequency Domain Measurements: Spectrum Analyzer or Oscilloscope? Selection Guide Changes in test and measurement technologies are blurring the lines between platforms and giving engineers new options Introduction For generations, the rules for RF engineers were simple: frequency-domain measurements (output frequency, band power, signal bandwidth, etc.) were done by a spectrum analyzer, and time domain measurements (pulse width and repetition rate, signal timing, etc.) were done by an oscilloscope. As the digital revolution made signal processing techniques easier and more widespread, the lines between the two platforms began to blur. Oscilloscopes started incorporating Fast Fourier Transform (FFT) techniques that converted the time-domain traces to the frequency domain. Spectrum analyzers began capturing their data in the time domain and using post-processing to generate displays. Still, there were some clear distinctions between the two platforms. For example, oscilloscopes were limited in sample speed. They could see signals down to DC, but only up to a few GHz. Spectrum analyzers could see high into the microwave range, but they missed transient signals as they swept. What if you needed to see a signal in the time domain with a carrier frequency of 40 GHz or capture a complete wideband pulse in X-band? As technologies in EW, radar and communications move ahead, the demands on the test equipment become greater. As more possibilities have opened for RF and microwave equipment because of new digital processing technologies, they have also increased opportunities for test equipment. Spectrum analyzers and oscilloscopes can do much more than they could even a few years ago, and as they expand in capabilities, the lines between them become blurred and sometimes even erased. -
TM 11-5099 D E P a R T M E N T O F T H E a R M Y T E C H N I C a L M a N U a L SPECTRUM ANALYZER AN/UPM-58 This Reprint Inclu
TM 11-5099 DEPARTMENT OF THE ARMY TECHNICAL MANUAL SPECTRUM ANALYZER AN/UPM-58 This reprint includes all changes in effect at the time of publication; changes 1 through 3. HEADQUARTERS, DEPARTMENT OF THE ARMY MAY 1957 Changes in force: C 1, C 2, and C 3 TM 11-5099 C3 CHANGE HEADQUARTERS DEPARTMENT OF THE ARMY No. 3 } WASHINGTON, D.C., 4 May 1967 SPECTRUM ANALYZER AN/UPM-58 TM 11-5099, 28 May 1957, is changed as follows: Note. The parenthetical reference to previous Report of errors, omissions, and recommendations for changes (example: page 1 of C 2) indicate that pertinent Improving this manual by the individual user is material was published in that change. encouraged. Reports should be submitted .on DA Form Page 2, paragraph 1.1, line 6 (page 1 of C 2). Delete 2028 (Recommended Changes to DA Publications) and "(types 4, 6, 7, 8, and 9)" and substitute: (types 7, 8, and forwarded direct to Commanding General, U.S. Army 9). Paragraph 2c (page 1 of C 2). Delete subparagraph Electronics Command, ATTN: AMSEL-MR-NMP-AD, c and substitute: Fort Monmouth, N.J. 07703. c. Reporting of Equipment Manual Improvements. Page 77. Add section V after section 1V. Section V. DEPOT OVERHAUL STANDARDS 95.1. Applicability of Depot Overhaul Standards requirements for testing this equipment. The tests outlined in this chapter are designed to b. Technical Publications. The technical measure the performance capability of a repaired publication applicable to the equipment to be tested is equipment. Equipment that is to be returned to stock TM 11-5099. -
Fieldfox Handheld Analyzers Configuration Guide
FieldFox Handheld Analyzers 4/6.5/9/14/18/26.5/32/44/50 GHz This configuration guide describes configurations, options and accessories for the FieldFox A-Series family of portable analyzers. This guide should be used in conjunction with the technical overview and data sheet for a Included accessories complete description of the analyzers. The table on Page 3 titled “FieldFox A-Series Family and Options” shows a comparison of the functions available The following accessories are included with every in the FieldFox A-Series family of analyzers. FieldFox Note: Combination analyzer (combo) = Cable and antenna tester (CAT) + • AC/DC adapter Vector network analyzer (VNA) + Spectrum analyzer (SA) • Battery • Soft carrying case • LAN cable • Quick Reference Guide Find us at www.keysight.com Page 1 Table of Contents FieldFox A-Series Family and Options ......................................................................................................... 3 FieldFox RF and Microwave (Combination) Analyzers ................................................................................. 4 Analyzer models ........................................................................................................................................ 4 Analyzer options ........................................................................................................................................ 5 FieldFox RF and Microwave (Combination) Analyzer FAQs ........................................................................ 7 ERTA System Typical Configuration -
The Oscilloscope and the Function Generator: Some Introductory Exercises for Students in the Advanced Labs
The Oscilloscope and the Function Generator: Some introductory exercises for students in the advanced labs Introduction So many of the experiments in the advanced labs make use of oscilloscopes and function generators that it is useful to learn their general operation. Function generators are signal sources which provide a specifiable voltage applied over a specifiable time, such as a \sine wave" or \triangle wave" signal. These signals are used to control other apparatus to, for example, vary a magnetic field (superconductivity and NMR experiments) send a radioactive source back and forth (M¨ossbauer effect experiment), or act as a timing signal, i.e., \clock" (phase-sensitive detection experiment). Oscilloscopes are a type of signal analyzer|they show the experimenter a picture of the signal, usually in the form of a voltage versus time graph. The user can then study this picture to learn the amplitude, frequency, and overall shape of the signal which may depend on the physics being explored in the experiment. Both function generators and oscilloscopes are highly sophisticated and technologically mature devices. The oldest forms of them date back to the beginnings of electronic engineering, and their modern descendants are often digitally based, multifunction devices costing thousands of dollars. This collection of exercises is intended to get you started on some of the basics of operating 'scopes and generators, but it takes a good deal of experience to learn how to operate them well and take full advantage of their capabilities. Function generator basics Function generators, whether the old analog type or the newer digital type, have a few common features: A way to select a waveform type: sine, square, and triangle are most common, but some will • give ramps, pulses, \noise", or allow you to program a particular arbitrary shape. -
Modern Architecture Advances Vector Network Analyzer Performance Vector Network Analyzers (Vnas) Are Based on the Use of Either Mixers Or Samplers
White Paper Modern Architecture Advances Vector Network Analyzer Performance Vector Network Analyzers (VNAs) are based on the use of either mixers or samplers. In traditional sampling VNAs, samplers are gated by pulses generated with a Step-Recovery Diode (SRD) circuit, with the Local Oscillator (LO) and RF source phase locked to a common frequency reference. An alternative architecture is a VNA based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators. NLTL-based samplers configured to provide scalable operation characteristics now offer a more beneficial alternative. Not only do they allow for a simplified VNA architecture, but they also enable VNAs that are much more cost effective than those employing fundamental mixing. This paper provides an overview of the high-frequency technology deployed in Anritsu’s VNA families. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity when compared with existing solutions. These capabilities, combined with the frequency-scalable nature of the reflectometers provide VNA users with a unique and compelling solution for their current and future high-frequency measurement needs. Limitations of Prior VNA Architectures VNAs make use of samplers, harmonic mixers, or combinations thereof to down-convert measurement signals to intermediate frequencies (IF) before digitizing them. Such down-conversion components play a critical role in VNAs because they set bounds on important parameters like conversion efficiency, receiver compression, isolation between measurement channels, and spurious generation at the ports of a device under test (DUT). Mixers tend to be the down converters of choice at RF frequencies, due mainly to their simpler local oscillator (LO) drive system and enhanced spur-management advantages. -
Design About Simple Tester of Low Capacitance Based on MAX038
Information Technology and Mechatronics Engineering Conference (ITOEC 2015) Design about Simple Tester of Low Capacitance Based on MAX038 Zheng Liping1,a 1Photoelectric Engineering College of Yunnan Open University, Kunming, China, 650500 [email protected] Keywords: MAX038, test of low capacitance, TM4C123GH6PM, frequency measurement by equal precision Abstract. Simple tester of low capacitance was designed based on MAX038 in this paper. The principle is that external capacitor of MAX038 as test capacitor to provide corresponding frequency signal output, and TM4C123GH6PM was selected to measure frequency by equal precision and calculate test capacitance. In order to improve the accuracy, data were piecewise fitted by the least square method, and comparison tests were between high accuracy capacitance tester and the simple tester to realize auto correction and show measurement results. The tester can detect 10pF~1µF capacitor. Test results show that the tester is running stable, rapid measuring; accuracy is grade 1. Introduction In this paper, through the research of how standard function signals are generated and the relationship between signal frequency and capacitance values, we designed this portable capacitor tester based on MAX038. In the design, we applied digital signal processing technique [1,4] and the method of ratio correcting [5], making the tester faster and more accurate. It can be functioned not only as a general portable capacitance tester, but also as suitable subject for students, so that they can grow through practice, and be excellent after repeated renovation. The Hardware Components and Working Principle of Simple Tester of Low Capacitance The capacitance test system designed in this paper include power module, function signal generator module, zoom conditioning module, TM4C123GH6PM control system and display module, the systematic structure can be shown in Figure 1. -
Measurement Procedure and Test Equipment Used
MOTOROLA INC. FCC ID: ABZ99FT4056 TEST SET-UP PROCEDURES AND TEST EQUIPMENT USED Pursuant to 47 CFR 2.947 Except where otherwise stated, all measurements are made following the Telecommunications Industries Association/Electronic Industries Association (TIA/EIA) “Land Mobile FM or PM Communications Equipment Measurement and Performance Standards” (TIA/EIA-603-A). This exhibit presents a brief summary of how the measurements were made, the required limits, and the test equipment used. The following procedures are presented with this application: 1) Test Equipment List 2) RF Power Output 3) Audio Frequency Response 4) Post Limiter Lowpass Filter Response 5) Modulation Limiting Characteristic 6) Occupied Bandwidth 7) Conducted Spurious Emissions 8) Radiated Spurious Emissions 9) Frequency Stability vs. Temperature and Voltage 10) Transient Frequency Behavior EXHIBIT 7 SHEET 1 OF 6 MOTOROLA INC. FCC ID: ABZ99FT4056 Test Equipment List Pursuant to 47 CFR 2.1033(c) The following test equipment was used to perform the measurements of the submitted data. The calibration of this equipment is performed at regular intervals. Transmitter Frequency: HP 5385A Frequency Counter with High-Stability Reference Temperature Measurement: HP 2804A Quartz Thermometer Transmitter RF Power: HP 435A Power Meter with HP 8482A Power Sensor DC Voltages and Currents: Fluke 8010A Digital Voltmeter Audio Responses: HP 8903B Audio Analyzer Deviation: HP 8901B Modulation Analyzer Transmitter Conducted Spurious and Harmonic Emissions: HP 8566B Spectrum Analyzer with HP 85685A Preselector Transmitter Occupied Bandwidth: HP 8591A Spectrum Analyzer Radiated Spurious and Harmonic Emissions: Radiated Spurious and Harmonic Emissions were performed by: Motorola Plantation OATS (Open Area Test Site) Lab 8000 West Sunrise Blvd. -
Massachusetts Institute of Technology Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology Department of Electrical Engineering and Computer Science 6.002 - Circuits and Electronics Fall 2004 Lab Equipment Handout (Handout F04-009) Prepared by Iahn Cajigas González (EECS '02) Updated by Ben Walker (EECS ’03) in September, 2003 This handout is intended to provide a brief technical overview of the lab instruments which we will be using in 6.002: the oscilloscope, multimeter, function generator, and the protoboard. It incorporates much of the material found in the individual instrument manuals, while including some background information as to how each of the instruments work. The goal of this handout is to serve as a reference of common lab procedures and terminology, while trying to build technical intuition about each instrument's functionality and familiarizing students with their use. Students with previous lab experience might find it helpful to simply skim over the handout and focus only on unfamiliar sections and terminology. THE OSCILLOSCOPE The oscilloscope is an electronic instrument based on the cathode ray tube (CRT) – not unlike the picture tube of a television set – which is capable of generating a graph of an input signal versus a second variable. In most applications the vertical (Y) axis represents voltage and the horizontal (X) axis represents time (although other configurations are possible). Essentially, the oscilloscope consists of four main parts: an electron gun, a time-base generator (that serves as a clock), two sets of deflection plates used to steer the electron beam, and a phosphorescent screen which lights up when struck by electrons. The electron gun, deflection plates, and the phosphorescent screen are all enclosed by a glass envelope which has been sealed and evacuated. -
Function Generator and Oscilloscope
Summer 2007 Lab 2 EE100/EE43 EECS 100/43 Lab 2 – Function Generator and Oscilloscope 1. Objective In this lab you learn how to use the oscilloscope and function generator 2. Equipment a. Breadboard b. Wire cutters c. Wires d. Oscilloscope e. Function Generator f. 1k resistor x 2 h. Various connectors (banana plugs-to-alligator clips) for connecting breadboard to power supply and for multimeter connections. 3. Theory a. The HP33120A Function Generator The front panel of your function generator is shown in Figure 1. This instrument outputs a time-varying periodic voltage signal (the OUTPUT connector, do not use the sync connector, refer to figure 2). By pushing the appropriate buttons on the front panel, the user can specify various characteristics of the signal. Figure 1. Front panel of your function generator (Ref: Agilent Function Generator User’s Guide #33120-90006) University of California, Berkeley Department of EECS Summer 2007 Lab 2 EE100/EE43 Figure 2. Make sure you use BLACK BNC input cables. Connect them to the OUTPUT terminal as shown above. Do not use the SYNC connector The main characteristics that you will be concerned with in this class are: • Shape: sine, square, or triangle waves. • Frequency: inverse of the period of the signal; units are cycles per second (Hz) • Vpp: peak to peak Voltage value of the signal • DC Offset: constant voltage added to the signal to increase or decrease its mean or average level. In a schematic, this would be a DC voltage source in series with the oscillating voltage source. Figure 3 below illustrates a couple of the parameters above. -
EE 462G Laboratory #1 Measuring Capacitance
EE 462G Laboratory #1 Measuring Capacitance Drs. A.V. Radun and K.D. Donohue (1/24/07) Revised by Samaneh Esfandiarpour and Dr. David Chen (9/17/2019) Department of Electrical and Computer Engineering University of Kentucky Lexington, KY 40506 I. Instructional Objectives Introduce lab instrumentation with linear circuit elements Introduce lab report format Develop and analyze measurement procedures based on two theoretical models Introduce automated lab measurement and data analysis II. Background A circuit design requires a capacitor. The value of an available capacitor cannot be determined from its markings, so the value must be measured; however a capacitance meter is not available. The only available resources are different valued resistors, a variable frequency signal generator, a digital multi-meter (DMM), and an oscilloscope. Two possible ways of measuring the capacitor’s value are described in the following paragraphs. For this experiment, the student needs to select resistors and frequencies that are convenient and feasible for the required measurements and instrumentation. Be sure to use the digital multi-meter (DMM) to measure and record the actual resistance values used in each measurement procedure. III. Pre-Laboratory Exercise Step Response Model 1. For a series circuit consisting of a voltage source v(t), resistor R, and capacitor C, derive (show all steps) the complete solution for the capacitor voltage vc(t) when the source is a step with amplitude A and the initial capacitor voltage is 0. 2. Assume the source v(t) is a function generator, where the source voltage can only be measured after the 50 Ω internal resistance.