Product Catalog 2019 — Vol
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PRODUCT CATALOG 2019 — VOL. 1 TEST & MEASUREMENT SOLUTIONS For Engineers by Engineers CONTENTS CONTENTS APPLICATION SOLUTIONS 2 SPECTRUM ANALYZERS 45 POWER SUPPLIES, CONTINUED SERVICE SOLUTIONS 5 Selection Guide 45 2220/2230 Programmable Multiple Channel OSCILLOSCOPES 7 RSA306B USB Spectrum Analyzer 46 DC Power Supplies with Remote Sensing 71 RSA500A Series 47 2230G Series High Power, 3-Channel Selection Guide 9 Programmable DC Power Supplies 71 RSA600A Series 47 Mixed Signal and Mixed Domain 2260B Series Programmable DC MDO3000 Series 17 RSA5000B Real-Time Spectrum Analyzer 48 Power Supply (360 W, 720 W, 1080 W) 72 MDO4000C Series 17 RSA7100A 48 2280S Series Precision Measurement MSO/DPO2000B Series 18 SignalVu-PC 49 DC Power Supply 72 Advanced Signal Analysis DataVu-PC 49 2281S Series Precision DC Power Supply Spectrum Analyzer Software 50 with Battery Test and MSO/DPO5000B Series 18 Battery Simulation Functions 73 5 Series MSO 19 SOURCEMETER® SMU INSTRUMENTS 52 2290 High Voltage Power Supply 73 6 Series MSO 19 Selection Guide 52 2300 Series Portable Device Battery/ 5 Series MSO Low Profile 20 Charger Simulator 74 2450/2460/2461 Graphical Touchscreen 53 DPO7000C Series 20 2303 High Speed Power Supply 74 2450/2460/2461 SourceMeter® SMU MSO/DPO70000 and DX Series 21 Instruments 53 DC ELECTRONIC LOADS 75 DPO70000SX Series 21 Series 2400 SourceMeter® SMU Instruments 54 Selection Guide 75 Sampling Oscilloscopes 2450-EC, 2460-EC, and 2461-EC 2380 Series 76 DSA8300 Series 22 Graphical Potentionstats 54 Basic Oscilloscopes Series 2600B System SourceMeter® FREQUENCY COUNTER/TIMERS 77 SMU Instruments 55 TBS1000B Series 23 2606B High Density SourceMeter® Selection Guide 77 TBS1000B-EDU Series 23 SMU Instrument 55 FCA3100/3000 Series 78 TBS1000 Series 24 Series 2650A High Power System MCA3000 Series 78 TBS2000 Series 24 SourceMeter® SMU Instruments 56 POWER ANALYZER 79 Battery Powered and Handheld DIGITAL MULTIMETERS 57 THS3000 Series 25 Selection Guide 79 Selection Guide 57 TPS2000B Series 25 PA1000 Power Analyzer 80 2000, 2100, 2110 58 TDS Oscilloscopes PA3000 Power Analyzer 80 2001, 2002, 2010 58 TDS2000C Series 26 DMM7510 7½-Digit Graphical LOGIC ANALYZERS 81 TDS3000C Series 26 Sampling Multimeter 59 Selection Guide 81 Oscilloscope Application Software 27 DMM4020 59 TLA6400 Series 82 Oscilloscope Probes and Accessories 31 DMM4040/4050 60 TLA7000 Series 82 IsoVu™ Technology 32 DMM6500 6½-Digit Bench/System Digital Multimeter 60 BIT ERROR RATE TESTERS 83 SIGNAL GENERATORS 33 DMM7512 Dual Channel 7½-Digit Selection Guide 83 Selection Guide 33 Sampling Multimeter 61 BA/BSA Bit Error Rate Tester 84 AFG1000 Series 35 ULTRA-SENSITIVE MEASUREMENT 62 BSX Series Bit Error Rate Tester 84 AFG2000 35 Selection Guide 62 AFG3000C Series 36 COHERENT OPTICAL SOLUTIONS 85 2182A Nanovoltmeter 63 AFG31000 Series 36 Selection Guide 85 6220 / 6221 Current Sources 63 AWG5000 Series 37 OM2210 Coherent Receiver 6485 Picoammeter, Calibration Source 86 AWG70000 Series 37 6487/6482 Picoammeter & Voltage Sources 64 AWG5200 Series 38 6514/6517B/6430 Electrometers 64 SWITCH SYSTEMS 87 AWGSYNC01 AWG Synchronization Hub 38 DATA ACQUISITION SYSTEMS 65 Selection Guide 87 SourceXpress™ 39 System 46 RF Microwave Switch System 88 Signal Generator Software 39 Selection Guide 65 Semiconductor Switch Matrix Mainframes 88 EDUCATION SOLUTIONS 41 2700 Series 66 3700A Series 66 SEMICONDUCTOR TEST SYSTEM 89 TekSmartLab™ - Education Solution 42 DAQ6510 Data Acquisition Selection Guide 89 TekBench™ Control Software 42 and Logging Multimeter System 67 4200A-SCS Parameter Analyzer 90 VECTOR NETWORK ANALYZERS 43 POWER SUPPLIES 68 Parametric Curve Tracer (PCT) Configurations 90 Selection Guide 43 Selection Guide 68 S530 Parametric Test System, S535 Multi-Site Test System and TTR500 Series 44 PWS2000 Series Single-Channel S500 Integrated Test System 91 Power Supply 69 S540 Power Semiconductor Test System 91 PWS4000 Series USB Programmable, Single-Channel Power Supply 69 Automated Characterization Suite (ACS) Software, ACS Basic, ACS Wafer Level 2200 Programmable Single-Channel Reliability Option 92 DC Power Supplies with Remote Sensing 70 2231A-30-3 Triple-Channel DC Power Supply 70 010719AH TEK.COM | 1 DRIVE INNOVATION FASTER We celebrate this Age of the Engineer. Our experts will help you frame the future. With regular updates on applications and technology trends to achieve measurement insight, Tektronix will boost your productivity and accelerate your time to market. Wired Next Gen Power Communication Media ENERGIZE >> CONNECT >> SEE >> The desire for smaller and more powerful As data rates increase, get the measurement Simplify your 4K HDR Video test and batteries is increasing complexity within power insight to get ahead. Accelerate PCIe, SAS, monitoring. Get true visibility into your cloud management and measurement. Congruently, SATA Compliance Testing with a single test video delivery network for more efficient power efficiency and density are becoming solution including automation and debug quality control and compliance. Close the increasingly critical to design considerations. capabilities. Speed up your 400G product knowledge gap between SDI and IP worlds Engineers from fab to end-product are development with PAM4 testing to efficiently and foster collaboration between broadcast thinking about safe, precise and fast lab and validate your technology advances. Get to engineers and IT experts. Accelerate your wafer test environments; testing challenges compliance faster with your Type-C devices. video delivery or creation evolution with the resulting from the adoption of SiC and GaN most robust test and monitoring tool sets in into designs and how to solve them; and how the industry. to minimize power draw and maximize battery life for end-products. Learn how to address Connected Car the complexities within power management Military and MOBILIZE >> and measurement. Government Get the insight and tools to test confidently ADVANCE >> in today’s world of advanced automotive 3D Sensing electronics. Speed through validation, Accurately simulate threat radar in operational debugging and compliance testing your environments while measuring ECM DISCOVER >> Automotive Ethernet PHY design. Reduce Techniques. Utilize powerful DSP technology ECU validation and debug time with to characterize spectrum and identify signals Many depth sensing technologies use automated protocol analysis of important of interest. Integrate, scale and deploy low structured light or Time of Flight (ToF). standards like CAN and CAN FD. Swap, high fidelity RF sensors to characterize Learn more about Laser Diode Array Test spectrum. Ensure complex modulation for 3D Sensing and also about enhancing techniques used in Satcom systems are low Trigger Synchronization for High Volume in bit error rate and provide secure, reliable Production Testing of VCSELs. communications. TOGETHER WE CAN DEFINE THE NEXT GENERATION OF DESIGNS We are the measurement insight company committed to performance, and compelled by possibilities. Together we empower engineers to create and realize technological advances with ever greater ease, speed and accuracy. Tektronix solutions have supported many of humankind’s greatest advances of the past 70 years. Health. Communication. Mobility. Space. We are committed to the scientists, engineers and technicians around the world who will define the future. LEARN MORE 2 | TEK.COM/DRIVE-INNOVATION-FASTER APPLICATION & INNOVATION POWER EFFICIENCY • Safe, Precise, Fast MOSFET • Fully-automated HV • Determine the load Testing for Si, SiC and GaN Wafer-level testing • Overcome high common current profile devices • Move from high voltage mode voltages • Simulate any battery • Wide power envelope to low voltage without • Simultaneously measure • Model any type of battery • Safely set up your test changing test setup multiple control and timing signals • 2X Faster Device • Measure capacitance Characterization for improved without manual • Faster automated power time to market reconfiguration Fast measurements automation • Avoid expensive overdesigning • Don't fail compliance of your wide bandgap device LEARN MORE WIRED COMMUNICATIONS • No more trial and error • Accelerate 400G product development • Automate to reduce calibration • Automate calibration • Get to compliance faster times and measure accurately • Close the loop on for next gen USB, • Validate faster and loopback debug DisplayPort, HDMI increase yield • Superior signal integrity • Build confidence on the and debug margin of devices • Avoid expensive overdesigning NEXT GEN MEDIA LEARN MORE • Meet Challenges of 4K HDR • Automated Live Stream Monitoring • Solutions for Live IP Video Production Production & Delivery • Maintaining quality in OTT • Capturing in UHD environments • Diagnosing faults in an IP environment • Adapting to new color gamuts • Proactive automated monitoring • Bridging the gap from SDI to IP • Simplifying quality and • Encryption and DRM • An invisible transition compliance checks LEARN MORE TEK.COM/DRIVE-INNOVATION-FASTER | 3 APPLICATION & INNOVATION CONNECTED CAR • Reduce EMI/EMC compliance • Debugging ECUs with • Achieving Reliability design and test costs Automated Decode & Trigger and Interoperability • Overcome high common • Accelerate debug time • Debug the decoded protocol • Validate your designs mode voltages with automated test set-ups • Troubleshoot signal faults • Speed through debugging • Simultaneously measure and reporting generation multiple control and timing • Visualize multiple channels/ and troubleshooting