2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

MONDAY, AUGUST 7, 2017

WORKSHOP & 8:30 AM – 5:30 PM TUTORIAL MARYLAND A

MO-AM-1 & MO-PM-1 EMC FUNDAMENTALS Sponsored by IEEE EMCS Education Committee (EdCom)

Chair: Transmission Lines and Basic Signal Integrity Introduction to EMI Filters Lee Hill, Silent Solutions LLC. PLANNED SPEAKERS Fundamentals Randy Jost (Ball Aerospace & Technologies Amherst, NH, USA Xaioning Ye (Intel Corporation, Hillsboro, OR, USA) Corporation, Boulder, CO, USA) AND TOPICS Time and frequency behavior of transmission Parasitic effects in real world filter components. Co-chair: lines; transmission line impedance, matching, Differential and common-mode signals; imbalance Sarah Seguin, Resonant Frequency, MO-AM-1 and reflection; brief introduction to S-parameters; in differential-mode circuits, the concept of noise Minneapolis, MN, USA impact of transmission line behavior on signal blocking and noise diversion; common filter Introduction to Crosstalk integrity. Differential and common-mode configurations; filtering of common-mode and This tutorial is an overview of many of the Thomas Jerse (Boeing, Seattle, WA, USA) signaling; very basic channel analysis (eye differential mode noise; implementation of filters for major topics that need to be considered The physical and mathematical basis behind diagrams, bit-error rate, jitter, equalization). power lines and for I/O; measurement of conducted crosstalk; identifying inductive/capacitive/ noise. when designing an electronic product or common-impedance coupling mechanisms; MO-PM-1 system to meet EMI/EMC requirements. The mitigation techniques, including shielding. PCB Grounding

MONDAY, AUGUST 7 AUGUST - MONDAY, PROGRAM TECHNICAL and cables/connectors. (LearnEMC, Stoughton, WI, USA)

Todd Hubing 7 AUGUST - MONDAY, PROGRAM TECHNICAL tutorial will present the foundational ideas Radiated Emissions (RE) The difference between a “ground” and a “signal from physics and mathematics and will Lee Hill (SILENT Solutions, LLC., Amherst, NH, USA) Inductance and Capacitance Frequency content of digital signals; generation return”; where to ground for emissions and demonstrate the engineering approaches (IBM Corporation, Research Bruce Archambeault of electric and magnetic fields; identifying typical immunity and why; where to ground for safety to help the attendees to successfully design, Triangle Park, NC, USA) noise sources that drive unintentional antennas. and why; ground loops; purpose of single-point Relationship between voltage, E-fields and evaluate, diagnose, and/or solve EMI/EMC Efficiency of unintentional antenna vs. physical/ grounds to avoid low frequency conducted capacitance. Relationship between currents, problems. The main objective of this tutorial electric size. coupling. Relationship between grounding and is to provide a learning opportunity for those H-fields and inductance. Definition of inductance bonding. Resistance/impedance levels for various from Faraday’s law, loop inductance (highlight types of grounding connections – DC vs. RF. Shielding 101 that are new to EMC/EMI as well as provide loop size and current density as secondary but Bob Scully (National Aeronautics and Space a review of the basics to those who already important in some cases), how to calculate, mutual Administration (NASA), Houston, TX, USA) inductance (effect of distance between loops). have experience in this area. Topics included A brief introduction to the theory of shielding, Definition and concepts of internal and external in the Tutorial are emissions, printed circuit absorption and reflection loss, the difference inductance, self and mutual inductance, partial between electric, low-frequency magnetic and boards, grounding, shielding, cables, filters inductance. Estimating inductance of canonical high-frequency magnetic field shielding. Near field and testing fundamentals. structures. shielding vs. shielding to reduce far field radiation. Shielded enclosures and the influence of apertures Fundamentals of EMC: Current Return Path and holes on shielding effectiveness. Shielding (General Motors, LLC., Milford, MI, USA) Scott Piper materials and gaskets; effective and ineffective The influence of frequency and inductance on techniques of implementing a shield. Discussion of return currents; the impact of the return path on cable shielding. emissions and susceptibility. Effect of traces near edge of planes, return current spread (microstrip vs. stripline), effect of via transitions on return The EMC Fundamentals tutorial continues current. Current paths in buildings, vehicles and on Friday morning in FR-AM-1. enclosures; as well as current paths at the PCB- level and IC-level. See page 78 for the planned speakers and topics.

18 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 19 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

WORKSHOP & 8:30 AM – 12:00 PM WORKSHOP & 8:30 AM – 12:00 PM TUTORIAL MARYLAND B TUTORIAL MARYLAND 1 & 2

MO-AM-2 MO-AM-3 MILITARY & AEROSPACE 1 - AUTOMOTIVE EMC UPDATES on Measurement Techniques, Test Standards, DoD Directives & Spectrum Engineering Methodologies and Product Design

Chair: Chair: Robert H. Davis, Lockheed Martin Space PLANNED SPEAKERS Janet O’Neil, ETS-Lindgren, Cedar Park, PLANNED SPEAKERS Systems Company, Syracuse, NY, USA AND TOPICS TX, USA AND TOPICS Co-chairs: Co-chairs: Kenneth Carrigan, NAVSEA Dahlgren, Segment 1: Military Standards, Garth D’Abreu, ETS-Lindgren, Cedar Park, Issues in E-Field Measurements Between Dahlgren, VA, USA DoD Directive and Instructions TX, USA 10 kHz and 30 MHz Brian Farmer, NAVSEA Dahlgren, Summary of Changes to MIL-STD-461 Revision G Robert Kado, Fiat Chrysler Automobiles Carlo Carobbi (University of Florence, Firenze, , Italy) Dahlgren, VA, USA Joseph Deboy (U.S. Air Force, Dayton, OH, USA) (FCA), Auburn Hills, MI, USA Common RF Absorbers Evaluations in W-Band Status of DOD Tri-Service Working Group – (75-100 GHz) Achieving electromagnetic compatibility Revision D of MIL-STD-464 The rapid development of advanced Zhong Chen (ETS-Lindgren, Cedar Park, TX, USA), with military equipment, systems, and Joseph Deboy (U.S. Air Force, Dayton, OH, USA) automotive features and the trend Susceptibility Testing of Wiring Harness on Board platforms requires significant effort. EMC toward autonomy continue to drive the DoD Directives and MIL-STD Update Status Vehicles must be considered at all life cycle stages Brian Farmer (EMC Management Concepts, Sterling, need for more sophisticated automotive Flavia Grassi (Politecnico di Milano, Milan, Italy); and involves design and testing at various VA, USA) EMC design and test scenarios. Vehicle Giordano Spadacini (Politecnico di Milano, Milan, Italy); Sergio A. Pignari (Politecnico di Milano, stages of production, assembly and platforms continue to become increasingly Segment 2: Spectrum Engineering Milan, Italy) integration. Various Military EMC standards EMC and its Relationship to Spectrum Sharing more complex with propulsion, MONDAY, AUGUST 7 AUGUST - MONDAY, PROGRAM TECHNICAL have been developed for electromagnetic Barry Fell, (Schafer Governnment Services, LLC., entertainment and safety related systems Testing Options in a Growing Automotive RF 7 AUGUST - MONDAY, PROGRAM TECHNICAL environmental effects (E3) testing and Arlington, VA, USA) all having to function reliably without Environment Garth D’Abreu (ETS-Lindgren, Cedar Park, TX, USA) analysis to reduce the risk of equipment DON CIO Strategic Spectrum Initiatives of impacting safety or the legacy and systems failing to meet their Interest to Electromagnetic Compatibility communications infrastructure. Essential Design Steps to Ensure that Autonomous operational performance requirements due Community Vehicles Meet EMC Requirements (LearnEMC, Stoughton, WI, USA) to detrimental E3. The tutorial will focus Tom Kidd (Department of the Navy, Washington, DC, USA) In this tutorial, experts from industry and Todd H. Hubing on new updates to primary US military DoD CIO Perspectives – Challenges and academia will share their latest research standards, and selected specialized Opportunities in Electromagnetic Spectrum in automotive EMC to address these military topics including frequency Policy emerging automotive trends. Automotive spectrum management. James Campion (Department of Defense, Washington, EMC design and test system planning for DC, USA) the future, addressing both component level and full-vehicle level radiated emission and radiated immunity will be addressed.

20 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 21 22 TECHNICAL PROGRAM - MONDAY, AUGUST 7 I FINALPROGRAM Co-chairs: Chair: in Japanfor MultimediaEquipment NEW VCCI COUNCIL RULES MO-AM-4 countries. consider applying CISPR32Ed.2inother and areference bodiesthat for regulatory manufactures thatexport MMEto Japan This tutorial willbeaguidelinefor a new ruleoperation. market samplingtest andevaluation upon a measurementfacility registration and a Ed.2, operational guidance, new rules of between thenew rulesandCISPR32 of thenew operation rules,difference view for achangeof rules,thecontents world. This tutorial consists of apointof Ed.2 asthefirst to dosointhe country the operation corresponding to CISPR32 On November 1,2016,VCCI Council started Toshiki Shimasaki, Yoko Inagaki, Naoyuki Tsurumi, Japan WORKSHOP & TUTORIAL I WWW.EMC2017.EMCSS.ORG VCCI Council, Tokyo, Japan Tokyo, Council, VCCI VCCI Council, Tokyo, Japan Tokyo, Council, VCCI VCCI Council, Tokyo, Tokyo, Council, VCCI 8:30 AM–12:00PM MARYLAND 3&4 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM Corresponding toCISPR32Ed.2 Facility Registration Regulation andtheContents of aMeasurement Enactment andOperation of theNew VCCI VCCI Pointof View for aNew Rule Guidance for Operation The Contents of aNew Technical Standardandthe AND TOPICS PLANNED SPEAKERS Akira Oda Minoru Hirahara Shinji Mine (VCCI Council, Tokyo, Japan) Tokyo, Council, (VCCI (VCCI Council, Tokyo, Japan) Japan) Tokyo, Council, (VCCI (VCCI Council, Tokyo, , Japan) , Tokyo, Council, (VCCI 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM SMART GRIDSUPPORTANDEMCISSUES MO-AM-5 primary USorganizations ontheproject. primary an integral partof theSmart Gridandthe work stillneededto bedoneto make it in perspective the EMCstatusandthe will begiven. Finally, thetutorial willplace in transmission and distributionfacilities for Intelligent Electronic Devices installed standards work ontesting requirements environments. Areview of theIEEE used inpower stationandsubstation immunity testing neededfor Smartdevices will alsogive specific examples of the connected power inverters. The tutorial (carrier current)communications andgrid levels between thepopularpower line is not.ItwilldiscussEMCcompatibility including what is being accepted and what the 2016activityonEMCimplications, group onthetopic. The focus willbeon provide anexample of anEMCworking EMC activitiesof key organizations and tutorial willreview thelatest SmartGrid banner year for working onSmartGrid.This worldwide. 2016proved to beanother The SmartGridcontinues to beahottopic Chair: Sponsored by SC1 Donald N.Heirman, Consultants, Lincroft, NJ, USA NJ, Lincroft, Consultants, WORKSHOP & TUTORIAL 8:30 AM–12:00PM Don HEIRMAN HEIRMAN Don MARYLAND 5&6 Systems intheFrequencyRange2-150kHz EMC Between Communication CircuitsandPower EM Interoperability IssuesWorking Group(EMIIWG) Application of Selected EMCStandardsby theSGIP its Testing andCertification Committee US SmartGridInteroperability Panel(SGIP 2.0)and Devices inTransmission andDistributionFacilities Testing Requirementsfor Intelligent Electronic Environments Immunity for Power StationandSubstation AND TOPICS PLANNED SPEAKERS NJ, USA) USA) NJ, United Kingdom) United NJ, USA) USA) NJ, Dave Thomas Don Heirman Don Heirman Jerry Ramie William A.Radasky USA) USA) CA, USA) CA, (ARC Technical Resources, Inc., San Jose, Jose, San Inc., Resources, Technical (ARC (Don HEIRMAN Consultants, Lincroft, Lincroft, Consultants, HEIRMAN (Don Lincroft, Consultants, HEIRMAN (Don (University of Nottingham, Nottingham, Nottingham, Nottingham, of (University FINAL PROGRAM (Metatech Corporation, Goleta, CA, CA, Goleta, Corporation, (Metatech I WWW.EMC2017.EMCSS.ORG I

23 TECHNICAL PROGRAM - MONDAY, AUGUST 7 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

WORKSHOP & 1:30 PM – 5:30 PM WORKSHOP & 1:30 PM – 5:30 PM TUTORIAL MARYLAND B TUTORIAL MARYLAND 1 & 2

MO-PM-2 MO-PM-3 MILITARY & AEROSPACE 2 - EMP/HEMP & E3 Measurements EMC DESIGN 1 - Modeling Fundamentals Sponsored by TC9

Chair: Chair: Robert Davis, Lockheed Martin Space PLANNED SPEAKERS Bruce Archambeault, IBM Corporation, PLANNED SPEAKERS Systems Company, Syracuse, NY, USA AND TOPICS Research Triangle Park, NC, USA AND TOPICS Co-chairs: Co-chair: Kenneth Carrigan, NAVSEA Dahlgren, Segment 3: EMP/HEMP Chuck Bunting, Oklahoma State University, Transmission Line Matrix Method (TLM) David P. Johns (CST, Framingham, MA, USA) Dahlgren, VA, USA DTRA Operation Independent Spark Overview: Stillwater, OK, USA Brian Farmer, NAVSEA Dahlgren, Dahlgren, SREMP Test on an Operational Transmission- Introduction to the Finite-Difference Time-Domain VA, USA Distribution Power Substation and Components This tutorial will provide an introduction to (FDTD) Technique at HERMES III Bruce Archambeault (Missouri University of Science & (Defence Threat Reduction Agency all of the commonly used numerical EMC Michael R. Rooney Technology, FOUR OAKS, NC, USA) Achieving electromagnetic compatibility (DTRA), Ft. Belvoir, VA, USA) modeling techniques. It is intended to with military equipment, systems, and provide EMC engineers who are interested Introduction to the Finite Element Method platforms requires significant effort. EMC Overview of MIL-STD-3023 HEMP Protection in learning the basics of these modeling Chuck Bunting (Oklahoma State University, Stillwater, must be considered at all life cycle stages of Military Aircraft and MIL-STD-4023 HEMP OK, USA) Protection of Military Surface Ships techniques a fundamental understanding and involves design and testing at various Walter Scott (Engility Corporation, Lorton, VA, USA) of all the different techniques, without Integral Equation Methods (MoM) in Numerical stages of production, assembly and the need for detailed math. Practicing Modeling integration. Various Military EMC standards Electromagnetic Pulse Experiments on the modelers will also benefit from learning Ömer Yildiz (Hamburg University of Technology, Ex-United States Coast Guard Cutter MONHEGAN Hamburg, Germany); Heinz-D. Brüns (Hamburg have been developed for electromagnetic (U.S. Navy, Dahlgren, VA, USA) the fundamentals of modeling techniques MONDAY, AUGUST 7 AUGUST - MONDAY, PROGRAM TECHNICAL Sheryl Martin University of Technology, Hamburg, Germany); MONDAY, AUGUST 7 AUGUST - MONDAY, PROGRAM TECHNICAL environmental effects (E3) testing and they are currently not using. Each C. Schuster (Hamburg University of Technology, analysis to reduce the risk of equipment Segment 4: Test and Measurement technique will be presented along with Hamburg, Germany) and systems failing to meet their Technical Challenges for E3 Test Facilities their strengths and weakness, so engineers Meeting New MIL-STD Requirements Introduction to the (PEEC) Partial Element operational performance requirements Alan Mazuc (Department of the Navy, Patuxent River, can decide which techniques are Equivalent Circuit Approach Applied to SI/PI due to detrimental E3. The tutorial will MD, USA) appropriate for their types of problems. Albert E. Ruehli (Missouri University of Science and focus on Electromagnetic Pulse (EMP) and Technology, Rolla, MO, USA) Military E3 test and measurement. Standardization of Ordnance Testing Mark Waller (US Army Redstone Test Center, Redstone The format will be a conference The Importance of Validation for All Simulations Arsenal, AL, USA); Jeff Craven (US Army Redstone Test presentation style (lecture) followed by Scott Piper (General Motors, LLC., Milford, MI, USA) Center, Redstone Arsenal, AL, USA) questions moderated by the chairmen. CS118 Personnel Borne Electrostatic Discharge The chairmen take responsibility for by MIL-STD 461G weaving the threads of cohesiveness and Fred Heather (NAVAIR, Patuxent River, MD, USA) dissimilarities between the methods.

Indirect Effect Lightning Test by MIL-STD 461G Fred Heather (NAVAIR, Patuxent River, MD, USA)

24 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 25 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

WORKSHOP & 1:30 PM – 5:30 PM WORKSHOP & 1:30 PM – 5:30 PM TUTORIAL MARYLAND 3 & 4 TUTORIAL MARYLAND 5 & 6

MO-PM-4 MO-PM-5 UPDATE ON THE SOON-TO-BE-PUBLISHED ANSI C63.25 LOW FREQUENCY ISSUES DRAFT STANDARD for Test Site Validation above 1 GHz Sponsored by TC7 Sponsored by TC2

Chair: measurement, attendees will learn the Chair: Janet O’Neil, ETS-Lindgren, Cedar Park, TX, USA difference between time domain and Flavia Grassi, Politecnico di Milano, PLANNED SPEAKERS Co-chairs: frequency domain measurements. The role Milan, Italy AND TOPICS Dan Sigouin, ETS-Lindgren, Cedar Park, TX, USA of the Vector Network Analyzer (VNWA) in Co-chairs: Dan Hoolihan, Hoolihan EMC Consulting, time domain SVSWR measurements and David Thomas, University of Nottingham, Low Frequency Issues: Experiences from the Field Lindstrom, MN, USA Nottingham, United Kingdom Frank Leferink (University of Twente, Enschede, instrumentation limitations due to VNWA Netherlands In this tutorial, the future standard ANSI settings and antennas will be discussed. This tutorial focuses on low frequency Understanding of the Geomagnetic Storm C63.25 requirements for the validation of Attendees will also learn about additional applications of time domain measurements EMC issues with emphasis on interference Environment as it Impacts the Electric Power Grid radiated emission test sites in the frequency (Metatech Corporation, Goleta, between equipment for renewables and William A. Radasky range of 1 GHz to 18 GHz are discussed. in an EMC laboratory. CA, USA); Edward B. Savage (Metatech Corporation, These requirements are applicable to fully smart meters. The scope is limited to Goleta, CA,USA) Furthermore, the relationship between ANSI conducted disturbances up to the range anechoic rooms (FAR) and open-area C63.4 and the draft C63.25 will be discussed. Measurements and Modelling in the Frequency test sites (OATS) as well as semi-anechoic of a few hundred kilohertz. The ongoing In addition, an update on the on-going work progress in standardization will be part of Range 2-150 kHz chambers (SAC) when treated by absorber on site validation in the frequency range Dave Thomas (University of Nottingham, Nottingham, the tutorial. United Kingdom) placement on the ground plane. Work on this 30 MHz to 1 GHz related to Normalized MONDAY, AUGUST 7 AUGUST - MONDAY, PROGRAM TECHNICAL standard was formally started in 2016, with 7 AUGUST - MONDAY, PROGRAM TECHNICAL Site Attenuation (NSA) requirements will The increased use of electronic equipment Proficiency Tests through Interlaboratory much work completed in prior years. The be provided. The tutorial includes speakers Comparisons of Conducted Emission expected publication of this standard is late in power systems has demonstrated the Measurements in the 9 kHz to 30 MHz Frequency involved in the development of this future need for more wide-spread understanding 2017/early 2018. EMC laboratory managers standard, including the chair of the ANSI Range of low frequency EMC issues and mitigation Carlo Carobbi (University of Florence, Firenze, Italy) should take note of the application of this C63.25 working group as well as the working techniques. Low-frequency emissions standard which can reduce the time required group chair of standard ANSI C63.4. Conductive EMI Issues in Power Electronics to perform the validation of radiated emission from inverters used in wind power and Systems test sites in the frequency range above 1 GHz. photovoltaic solar power equipment and Shuo Wang (University of Florida, Gainesville, FL, USA) An overview and history of the work involved PLANNED SPEAKERS from electronically operated luminaries interfere with the correct functioning of Conducted Emissions in the Powertrain of Electric will be provided, including a presentation of AND TOPICS Vehicles smart metering devices. Related discussion data taken at multiple test laboratories in the Overview and History of the ANSI C63.25 Standard G. Spadacini (Politecnico di Milano, Milan, Italy); US in support of the proposed time domain Dan Sigouin (Hoolihan EMC Consulting, Lindstrom, MN, USA) includes questions regarding compatibility F. Grassi (Politecnico di Milano, Milan, Italy); S.A. Pignari (Politecnico di Milano, Milan, Italy); measurement technique for site validation. levels, adequate immunity of equipment Data Collected to Support C63.25 and What it Means to low-frequency disturbances and proper In addition, discussion will be provided to EMC Test Labs Greg Kiemel (Element Materials Technology, Hillsboro, limits on emissions in the related frequency on applying the measured results from OR, USA) range. the time domain Site Voltage Standing Wave Ratio (SVSWR) to estimate emissions Implications of Site VSWR Measurements Knowledgeable EMC speakers who are measurement uncertainties. A presentation Uncertainties on Radiated Emissions Measurements Zhong Chen (ETS-Lindgren, Cedar Park, TX, USA) fully engaged in low frequency EMC and will illustrate how the time domain method Power Quality and standardization will can make it easier to perform the uncertainty Test Equipment Considerations for Time Domain make presentations. An open discussion evaluation for emissions measurements than SVSWR Measurements will follow the presentations where Werner Schaefer (Schaefer Associates, Novato, CA, USA) for the traditional SVSWR method. Since attendees can ask further questions of the test instrumentation is of key importance for Expanding C63 Test Site Validation Techniques and speakers. the proposed time domain site validation Frequency Coverage Don Heirman (Don HEIRMAN Consultants, Lincroft, NJ, USA) 26 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 27 28 TECHNICAL PROGRAM - TUESDAY, AUGUST 8 I FINALPROGRAM perhaps moreimportantnow thanever before. enforcement. Allof thesefactors highlightthatthework of theEMCSanditsmembersis EMCstandards,theequipmentauthorizationthe statusof FCC program and industry and FCC’s Technological Advisory Council. The presentationwilltouch onrelated topics suchas concern for many inthecommunications asreflected inrecommendations industry of the to theintroductionof certain technologies andthesheervolume of sources of RFnoiseisa applications someof whicharerelated to safety. The perceived riseinthenoisefloordue often relyonreception of weak signals,andareexpected to be reliablefor amultitudeof the numberof devices isgrowing atamonumentalpace, they arespaced closelytogether, is becoming more andmorechallengingas EMC for everything-wireless thefuture world toRadio Service, namejustafew. Ensuring TV white spaces andtheCitizen’s Broadband spectrumaccessbased ondynamic suchas broadband satellite andtechnologies services connected vehicles, unmannedaerialsystems, expanding useof thespectrum-5G,IoT, The talkwillprovide anoverview of theever- WORLD EVERYTHING-WIRELESS ACHIEVING EMCINAN in electrical engineering fromtheCityCollege of New York in1974. Noel Luddy Award. Mr.Knapp isaLife Memberof theIEEE. Hereceived aBachelor’sdegree Fellow Award; andtheAssociation of Federal Communications Consulting EngineersE. the WCAI Government Leadershipaward; theNational SpectrumManagementAssociation the Federal Communications BarAssociationExcellence inGovernment Award; Service Eugene C.Bowler award for exceptional professionalism anddedication to public service; achievement inthecareer SeniorExecutive Mr.Knapphasbeen therecipientof the Service. Commission aswell asthePresidentialDistinguished Rank Award for exceptional He received theFCC’s Silver andGoldMedal Awards for atthe distinguishedservice Bureaus andOffices. provides technical support to theChairman,Commissioners andFCC resourceOET istheCommission’s for primary engineeringexpertise and Chief of theFCC’s Office of Engineeringand (OET) since 2006. Technology Julius KnapphasbeenwiththeFCC for 42years asthe andhasserved TUESDAY, AUGUST 8,2017 PRESENTATION ABOUT JULIUSKNAPP KEYNOTE I WWW.EMC2017.EMCSS.ORG MARYLAND BALLROOM CD 8:30 AM–10:00 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM from ISO7637. well asreviewing theautomotive transients STD-461 CS115&CS116waveforms, as be showing everyone how MIL- to verify Fast Transient (EFT),Ringwave. We allalso over include:LightningSurge,Electronic of thecommercial tests we willbegoing the different typesof waveforms. Afew you know how to setupthencharacterize correct waveform, thusitisimportantthat your test equipment isoutputtingthe testing. Often you that willneedto verify different transients often seeninEMC over thepre-testing verification of several In thishands-ondemonstration we willgo WAVEFORMS: OF EMCTRANSIENT HANDS-ON VERIFICATION AUTOMOTIVE, MIL-STD-461 SOFTWARE DEMONSTRATIONS HARDWARE EXPERIMENTS& of Advanced Test Equipment Rentals, Rentals, Equipment Test Advanced of Jamison BergandGabeAlcala San Diego, CA, USA CA, Diego, San REAR OFEXHIBITHALL 9:00 AM–11:00 CE, for fast problemsolving. troubleshooter withexciting new insight and quantifiable. This provides theEMC invisible signalsappearperfectly visible spectrum analysis can make previously transceivers to demonstrate how real-time digital clocksources, andBluetooth supply, motor controller, brushDC motor, sources including aswitch-mode power This presentation willusereal-world noise SYSTEMS CO-LOCATED WIRELESS EMISSIONS AND RADIATED &CONDUCTED TROUBLESHOOTING OF FOR FASTER SPECTRAL ANALYSIS USING REAL-TIME SOFTWARE DEMONSTRATIONS HARDWARE EXPERIMENTS& Lee Hill, Worcester Polytechnic Institute (WPI), (WPI), Institute Polytechnic Worcester Amherst, NH, USA NH, Amherst, SILENT Solutions LLC & GmbH, GmbH, & LLC Solutions SILENT FINAL PROGRAM REAR OFEXHIBITHALL 9:00 AM–11:00 I WWW.EMC2017.EMCSS.ORG I

29 TECHNICAL PROGRAM - TUESDAY, AUGUST 8 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

HARDWARE EXPERIMENTS & 9:00 AM – 11:00 AM HARDWARE EXPERIMENTS & 9:00 AM – 11:00 AM 10:30 AM–12:00 AM 10:30 AM–12:00 AM SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL PANEL DISCUSSION EXHIBIT HALL THEATRE PANEL DISCUSSION MARYLAND A

INCORPORATING EMC SIMULATION FOR WOMEN IN ENGINEERING TU-AM-1 EQUIPMENT UNDER EARLY STAGE ANALYSIS PANEL DISCUSSION ARE YOU MEASURING TEST (EUT) MONITORING AND TROUBLESHOOTING WHAT YOU THINK YOU WITHIN IMMUNITY OF DC-DC CONVERTER Chair: ARE MEASURING? Elena Uchiteleva, IEEE Women in TESTING CONDUCTED EMISSIONS Engineering (IEEE WIE) Region 7 (Canada), London, ON, Canada Chair: Jack McFadden, ETS-Lindgren, Cedar Park, Yushi Tan, CST of America, LLC, Framingham, Alistair Duffy, De Montfort University, TX, USA MA, USA In general women are under-represented Leicester, United Kingdom in the fields of mechanical, electrical, When we take measurements, do we Automating the EMC test process has In modern electronic applications a and aeronautical engineering, both really understand what we are actually the benefits of improving measurement majority of devices utilize switched AC/ in academia and industry. One of the measuring? Does it really matter so accuracy and repeatability while also DC or DC/DC converters in their power contributing factors to such skewed long as we are consistent and have well increasing test throughput. The automated networks. The power provided from a representation is the discouragement documented procedures to ensure EMC test process is further enhanced source, is switched by the converter in of women by stereotypes and societal everyone takes measurements in the same by incorporating EUT monitoring using order to adjust the output voltage level barriers. IEEE Women in Engineering (WIE) way? This panel, along with the audience, a vision system within the test program. (Switch Mode Power Supply - SMPS). is the largest international professional will explore these issues. Immunity testing with built-in EUT Unfortunately the switching always creates organization dedicated to promoting monitoring decreases error probability. noise, which may be significant at higher women engineers and scientists and This demonstration will show how a vision frequencies. Furthermore, this unwanted inspiring girls around the world to PANELISTS: system can be incorporated into immunity emission can upset the source or any other follow their academic interests to a TUESDAY, AUGUST 8 AUGUST - TUESDAY, PROGRAM TECHNICAL testing and reduce potential errors. device in the same supply power network, Bruce Archambeault, University of Missouri Science and 8 AUGUST - TUESDAY, PROGRAM TECHNICAL career in engineering. Our panel of WIE Technology, Rolla, Missouri, USA because it is easily transmitted through the representatives have a wealth of experience John Ladbury, NIST, Boulder, Colorado, USA power lines. Don Sweeney, DLS Electronic Systems, Wheeling, from their own careers and from advising Illinois, USA With coupled 3D EM field and circuit and mentoring others. Come and Valentino Trainotti, University of Buenos Aires, Buenos co-simulation, early stage analysis can discuss some of the problems and more Aires, Argentina be performed before a prototype of the Henry Benitez, Electromagnetic Investigations, importantly what we can do, individually Hillsboro, Oregon, USA device is manufactured. The subject of this and together, to stereotypes and societal demonstration is a typical bulk step-down barriers. DC/DC converter. We will show how to simulate the overall level of the conducted emissions and how EMI filtering can PANELISTS: help suppress this. The effect of the PCB Robert Scully, NASA Johnson Space Center, Houston, layout will also be shown and discussed. TX, USA Joanna Hill, JPHill, LLC, Detroit, MI, USA The simulation model and results will be Kristen Russell, IEEE Technical Activities, Piscataway, NJ, compared directly to live measurement of USA the physical hardware sample. Vicky Drury, Microtrac Inc., Montgomeryville, PA, USA

30 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 31 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

10:30 AM–12:00 AM 11:00 AM–12:00 AM 10:30 AM–12:00 AM 10:30 AM–12:00 AM TECHNICAL SESSION MARYLAND 1 & 2 TECHNICAL SESSION MARYLAND B TECHNICAL SESSION MARYLAND 3 & 4 TECHNICAL SESSION MARYLAND 5 & 6

TU-AM-2 TU-AM-5 TU-AM-6 TU-AM-7 EMC EDUCATION JOINT SESSION ON SIPI HIGH-SPEED ELECTROMAGNETIC AND EM ENVIRONMENTS NANOTECHNOLOGY LINKS 1 EFFECTS IN SPACECRAFT Sponsored by TC1/TC3 AND EMI CONTROL Sponsored by TC10 Sponsored by SC7 Sponsored by TC11/TC4 Chair: Chair: Chair: Thomas Braxton, Shure Incorporated, Chair: Mikheil Tsiklauri, Missouri University of James Lukash, Lockheed Martin Space Niles, IL, USA Science and Technology, Rolla, MO, USA Emmanuel Decrossas, California Institute of Systems Company, Sunnyvale, CA, USA Co-chair: Technology, Pasadena, CA, USA Co-chair: 10:30 AM – 11:00 AM Fred Heather, NAVAIR, Patuxent River, Co-chair: Pablo Narvaez, National Aeronautics and MD, USA Measurement and Correlation of the PCB Daren Shanholtzer, California Institute of Space Administration (NASA), Jet Propulsion Technology, Pasadena, CA, USA High Speed Links Laboratory, California Institute of Technology, 10:30 AM – 11:00 AM ABSTRACT REVIEWED Pasadena, CA, USA EMC Education for the Citizen-Engineer 11:00 AM – 11:30 AM Tao Wang (Teradyne, Agoura Hills, CA, USA); ABSTRACT REVIEWED Brian Brecht (Teradyne, Agoura Hills, CA, USA); 10:30 AM – 11:00 AM A New Class of Lightweight, Roger Sinsheimer (Teradyne, Agoura Hills, CA, USA) Jerry D. Meyerhoff (JDM Labs, LLC., Buffalo Grove, IL, Multifunctional Material for Design Implications of the Time USA); Sandy J. Rotter (Sanford Rotter Consultants, Dependence of Surface Charging in a Madison, WI, USA) Electromagnetic Compatibility 11:00 AM – 11:30 AM BEST SIPI STUDENT PAPER AWARD FINALIST Space Plasma Larry Christy (General Nano, LLC., Cincinnati, OH, USA); 11:00 AM – 11:30 AM Chaminda Jayasinghe (General Nano, LLC., Cincinnati, Design and Verification of a High-Speed Bryon Neufeld (Electro Magnetic Applications, Ultra Wideband Electromagnetic Field OH, USA); Joe Sprengard (General Nano, LLC., Connector for Multi-Media Lakewood, CO, USA) Cincinnati, OH, USA) Coupling to Instrumented Electrically (Korea Advanced Institute of Science TUESDAY, AUGUST 8 AUGUST - TUESDAY, PROGRAM TECHNICAL Huijin Song 11:00 AM – 11:30 AM 8 AUGUST - TUESDAY, PROGRAM TECHNICAL Initiated Devices (EIDs) 11:30 AM – 12:00 AM and Technology (KAIST), Daejeon, Korea, Republic of (South)); Jonghoon J. Kim (Korea Advanced Institute Feasibility of Powerline Communications Rakesh Kichouliya (Research Centre Imarat, Hyderabad, A Study for Designing an ESL-Cancelling of Science and Technology (KAIST), Daejeon, Korea, (PLC) on Future Spacecraft: EMI/EMC Test Telangana, India); Pawan Kumar (Research Centre Circuit for Shunt Capacitor Filters based Republic of (South)); Junyong Park (Korea Advanced Results on COTS PLC Technology Imarat, Hyderabad, India); U. Raja Babu (Research Institute of Science and Technology (KAIST), Daejeon, Centre Imarat, Hyderabad, India); G. Satheesh Reddy on the Biot-Savart Law Korea, Republic of (South)); Joungho Kim (Korea Manuel Martin Soriano (NASA, Pasadena, CA, USA); (Research Centre Imarat, Hyderabad, India) Satoshi Yoneda (Mitsubishi Electric Corporation, Advanced Institute of Science and Technology (KAIST), Andrew W. Mitchell (NASA, Pasadena, CA, USA); Kamakura, Japan); Kenji Hirose (Mitsubishi Electric Daejeon, Korea, Republic of (South)); Junho Lee (Korea 11:30 AM – 12:00 PM Corporation, Kamakura, Japan); Akihito Kobayashi Electronic Terminal Co., Ltd., Incheon, Korea, Republic of 11:30 AM – 12:00 PM Frequency-Offset Method to Determine (Mitsubishi Electric Corporation, Kamakura, Japan); (South)); Seongmin Choi (Korea Electronic Terminal Co., Compatibility Tests between the Mars Yuichi Sasaki (Mitsubishi Electric Corporation, Ltd., Incheon, Korea, Republic of (South)) Conversion Coefficient of Extremely Kamakura, Japan); Chiharu Miyazaki (Mitsubishi Electric Vehicle System Test Bed and RIMFAX Low-Frequency Magnetic Field Detector Corporation, Kamakura, Japan) 11:30 AM – 12:00 PM Radar Antenna Prototype for the Mars Jung-Hwan Hwang (Electronics and Crosstalk and EMI in Mixed-Signal/ 2020 Mission Telecommunications Research Institute, Daejeon, Korea, (NASA, Pasadena, CA, USA); Republic of (South)); Jong-Hwa Kwon (Electronics and Microwave Multi-Layer PC Boards Edward Gonzales (NASA, Pasadena, CA, USA); Telecommunications Research Institute, Daejeon, Korea, Todd Rider (Kansas State University, Manhattan, Elizabeth Cordoba (Forsvarets Forskningsinstitutt, Republic of (South)); Hyung-Do Choi (Electronics and KS, USA); William B. Kuhn (Kansas State University, Svein-Erik Hamran Kjeller, Norway) Telecommunications Research Institute, Daejeon, Korea, Manhattan, KS, USA); Ambrose Wolf (Honeywell FM&T, Republic of (South)) Kansas City, MO, USA)

32 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 33 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

1:30 PM–5:30 PM 1:30 PM–5:30 PM TECHNICAL SESSION MARYLAND A SPECIAL SESSION MARYLAND 1 & 2

TU-PM-1 TU-PM-2 EMC MEASUREMENTS ADVANCES IN UNCERTAINTY QUANTIFICATION AND Sponsored by TC2 MODELING IN COMPUTATIONAL EM AND SIPI Sponsored by TC9 & TC10 Chair: Don Heirman, Don HEIRMAN Consultants, Chair: 1:30 PM – 2:00 PM Lincroft, NJ, USA Paolo Manfredi, Politecnico di Torino, Worst-Case EMC Investigation of Co-chair: Torino, Italy Single-Wire Transmission Lines based Monrad Monsen, Oracle, Broomfield, CO, USA Co-chair: on Taylor Arithmetic Sourajeet Roy, Colorado State University, Paolo Manfredi (Ghent University, Gent, Belgium); 1:30 PM – 2:00 PM 4:00 PM – 4:30 PM Fort Collins, CO, USA Riccardo Trinchero (Politecnico di Torino, Torino, Italy); Verification of Coexistence Measurement BEST EMC PAPER AWARD FINALIST Igor S. Stievano (Politecnico di Torino, Torino, Italy) Methods: Radiated Anechoic and Open Source Isolation Measurements in a Description: The purpose of this special 2:00 PM – 2:30 PM Environment Multi-Source Coupled session is to disseminate knowledge BEST EMC PAPER AWARD FINALIST Ryan T. Jacobs (National Institute of Standards and Abhishek Patnaik (Missouri University of Science and and discuss the latest advances in Stochastic-Deterministic and Sensitivity Technology (NIST), Boulder, CO, USA); Jason B. Coder Technology, Rolla, MO, USA); Guangyao Shen (Missouri (National Institute of Standards and Technology University of Science and Technology, Rolla, MO, USA); the important field of uncertainty Analysis of the Transient Field Generated (NIST), Boulder, CO, USA); Nickolas J. LaSorte (National David Pommerenke (Missouri University of Science and quantification (UQ) for SIPI/EMC by GPR Dipole Antenna and Transmitted Telecommunications and Information Administration, Technology, Rolla, MO, USA); Martin Boettcher (Robert investigations. UQ techniques are critical Washington, DC, USA) Bosch GmbH, Stuttgart, Germany); Hermann Aichele into a Lossy (Robert Bosch GmbH, Stuttgart, Germany); Christoph tools for variation-aware analysis and Anna Šušnjara (University of Split, Split, Croatia); Dragan 2:00 PM – 2:30 PM Keller (Robert Bosch GmbH, Stuttgart, Germany); design, and in recent years they have Poljak (University of Split, Split, Croatia); Silvestar Šesnić Victor Khilkevich (Missouri University of Science and become the subject of extensive research. (University of Split, Split, Croatia); Khalil El Khamlichi

TUESDAY, AUGUST 8 AUGUST - TUESDAY, PROGRAM TECHNICAL Reproducibility of CISPR 25 ALSE Test Technology, Rolla, MO, USA) Drissi (Institut Pascal, Clermont-Ferrand, France); Pierre 8 AUGUST - TUESDAY, PROGRAM TECHNICAL Method With the rapid strides made in the field Bonnet (Institut Pascal, Clermont-Ferrand, France); Carlo Carobbi (University of Florence, Firenze, Italy); 4:30 PM – 5:00 PM of UQ, it is essential to disseminate Francoise Paladian (Institut Pascal, Clermont-Ferrand, Danilo Izzo (Automotive Lighting Reutlingen GmbH, A Practical Approach for Calibration of knowledge regarding the most recent France); Sébastien Lalléchère (Institut Pascal, Clermont- Reutlingen, Germany) Ferrand, France) Harmonics and Flicker Test Systems and impactful advances among the EMC 2:30 PM – 3:00 PM ABSTRACT REVIEWED community, to showcase applicability 2:30 PM – 3:00 PM Improving the Accuracy of Radiated Stephen Phillips (EMC Technologies, Keilor Park, to critical SIPI/EMC investigations, and A Possibilistic Approach to Radiated Australia); Chris Zombolas (EMC Technologies, Keilor Emission Measurements for Frequency Park, Australia) to foster discussion over open issues Susceptibility of Twisted-Wire Pairs Below 30 MHz by using a Fiber Optic and future research. Towards this end, L. Badini (Politecnico di Milano, Milan, Italy); N. Toscani 5:00 PM – 5:30 PM (Politecnico di Milano, Milan, Italy); G. Spadacini Isolated Rod this session will focus on research (Politecnico di Milano, Milan, Italy); F. Grassi (Politecnico Alessandro Gandolfo (Narda Safety Test Solutions S.r.l., Evaluation of the Tubular Wave methodologies that allow for efficient yet di Milano, Milan, Italy); S.A. Pignari (Politecnico di Cisano sul Neva, Italy); Renzo Azaro (EMC S.r.l., Genova, Coupler Model Parameters for Setups accurate quantitative assessment of the Milano, Milan, Italy); Italy); Domenico Festa (IBD International Business Involving Wires Development S.a.s., Chiari, Italy); impact of multidimensional uncertainty 3:30 PM – 4:00 PM Nicola Toscani (Politecnico di Milano, Milan, Italy); in general EM system, integrated circuits, Sensitivity Analysis and Empirical 3:30 PM – 4:00 PM Flavia Grassi (Politecnico di Milano, Milan, Italy); (Politecnico di Milano, Milan, Italy); and electronic packaging. The format will BEST EMC PAPER AWARD FINALIST Giordano Spadacini Optimization of Cross-Domain Coupling Sergio A. Pignari (Politecnico di Milano, Milan, Italy) be a presentation followed by a short Q&A on RFICs using Polynomial Chaos Estimation of Required Absorbing session moderated by the session chairs. Material Dimensions inside Metal Cavities Expansion Ömer F. Yildiz (Hamburg University of Technology, using Neural Networks Hamburg, Germany); Jan B. Preibisch (Hamburg Neda Nourshamsi (Oklahoma State University, University of Technology, Hamburg, Germany); Stillwater, OK, USA); Martin T. Hagan (Oklahoma State Jan Niehof (NXP Semiconductors, Eindhoven, University, Stillwater, OK, USA); Charles F. Bunting Netherlands); Christian Schuster (Hamburg University (Oklahoma State University, Stillwater, OK, USA) of Technology, Hamburg, Germany)

34 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 35 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

1:30 PM–5:30 PM 1:30 PM–5:30 PM SPECIAL SESSION MARYLAND 1 & 2 TECHNICAL SESSION MARYLAND C

TU-PM-2 CONTINUED TU-PM-3 EMC FOR EMERGING WIRELESS TECHNOLOGIES, PART 1 Sponsored by TC12

4:00 PM – 4:30 PM 5:00 PM – 5:30 PM Chair: 2:30 PM – 3:00 PM BEST EMC PAPER AWARD FINALIST Stochastic Electromagnetic-Circuit Yihong Qi, General Test Systems, Inc., Debug and Analysis Considerations for A Novel Dimension Fusion based Simulation for System-Level EMI Analysis Shenzhen, China Optimizing Power in your Internet of Polynomial Chaos Approach for Xiao Ma (University of Illinois at Urbana-Champaign, Co-chair: Things Design Mixed Aleatory-Epistemic Uncertainty Urbana, IL, USA); Xu Chen (University of Illinois at Daren Shanholtzer, General Test Systems, ABSTRACT REVIEWED Urbana-Champaign, Urbana, IL, USA); Aosheng Rong Inc., Shenzhen, China Quantification of Carbon Nanotube (University of Illinois at Urbana-Champaign, Urbana, Chris Armstrong (Rigol, Beaverton, OR, USA) Interconnects IL, USA); José E. Schutt-Ainé (University of Illinois at Urbana-Champaign, Urbana, IL, USA); Andreas C. 1:30 PM – 2:00 PM 3:30 PM – 4:00 PM Aditi Prasad (Colorado State University, Fort Collins, CO, Cangellaris (University of Illinois at Urbana-Champaign, USA); Sourajeet Roy (Colorado State University, Fort Isotropy Study for Over-the-Air Debug and Analysis Considerations Urbana, IL, USA) Collins, CO, USA) Measurements in a Loaded Reverberation for Optimizing Signal Integrity in your Chamber 4:30 PM – 5:00 PM Internet of Things Design Damir Senic (National Institute of Science and ABSTRACT REVIEWED Differential Integrated Crosstalk Noise Technology (NIST), Boulder, CO, USA); Diego Cavaliere Chris Armstrong (Rigol, Beaverton, OR, USA) (ICN) Reduction among Multiple (National Institute of Science and Technology (NIST), Differential BGA and Via Pairs by using Boulder, CO, USA); Matt V. North (National Institute of Science and Technology (NIST), Boulder, CO, USA); 4:00 PM – 4:30 PM Design of Experiments (DoE) Method Maria G. Becker (National Institute of Science and Channel Propagation Emulation in Mode Bichen Chen (Missouri University of Science and Technology (NIST), Boulder, CO, USA); Kate A. Remley Stirred Reverberating Chambers Technology, Rolla, MO, USA); Muqi Ouyang (Missouri (National Institute of Science and Technology (NIST), Wilfrid Quenum (ONERA – The French Aerospace Lab, TUESDAY, AUGUST 8 AUGUST - TUESDAY, PROGRAM TECHNICAL University of Science and Technology, Rolla, MO, Boulder, CO, USA); Chih-Ming Wang (National Institute 8 AUGUST - TUESDAY, PROGRAM TECHNICAL USA); Shaohui Yong (Missouri University of Science of Science and Technology (NIST), Boulder, CO, USA); Toulouse, France); Nicolas Jeannin (ONERA – The French and Technology, Rolla, MO, USA); Yansheng Wang Christopher L. Holloway (National Institute of Science Aerospace Lab, Toulouse, France); Isabelle Junqua (Missouri University of Science and Technology, Rolla, and Technology (NIST), Boulder, CO, USA) (ONERA – The French Aerospace Lab, Toulouse, France) MO, USA); Junda Wang (Missouri University of Science and Technology, Rolla, MO, USA); Shuai Jin (Missouri 2:00 PM – 2:30 PM 4:30 PM – 5:00 PM University of Science and Technology, Rolla, MO, USA); Wideband Characterization of LCD The Extraneous Electromagnetic Field Yadong Bai (Huawei Technologies Co., Ltd., Shenzhen, China); Yan Zhou (Huawei Technologies Co., Ltd, Baseband Noise Modulation for RF Produced by a Wireless Power Transfer Shenzhen, China); Jun Fan (Missouri University of Interference in Mobile Phones System Employing DD Polarized Couplers Science and Technology, Rolla, MO, USA) Chulsoon Hwang (Missouri University of Science James McLean (TDK R&D Corporation, Cedar Park, TX, and Technology, Rolla, MO, USA); Takashi Enomoto USA); Heinrich Foltz (University of Texas Rio Grande (Sony Global Manufacturing and Operations Valley, Edinburg, TX, USA); Robert Sutton (TDK R&D Corporation, Tokyo, Japan); Junji Maeshima (Sony Corporation, Cedar Park, TX, USA) Global Manufacturing and Operations Corporation, Tokyo, Japan); Kenji Araki (Sony Global Manufacturing and Operations Corporation, Tokyo, Japan); David Pommerenke (Missouri University of Science and Technology, Rolla, MO, USA); Jun Fan (Missouri University of Science and Technology, Rolla, MO, USA);

36 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 37 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

1:30 PM–5:30 PM 1:30 PM–5:30 PM TECHNICAL SESSION MARYLAND D TECHNICAL SESSION MARYLAND B

TU-PM-4 3:30 PM – 4:00 PM BEST EMC STUDENT PAPER AWARD FINALIST TU-PM-5 ESD Efficient Circuit and EM Model of SIPI HIGH-SPEED LINKS 2 Sponsored by TC5 Electrostatic Discharge Generator Sponsored by TC10 Jawad Yousaf (Sungkyunkwan University, Suwon, Korea, Republic of (South)); Jaeyoung Shin (Sungkyunkwan Chair: University, Suwon, Korea, Republic of (South)); Hosang Chair: 3:30 PM – 4:00 PM William Radasky, Metatech Corporation, Lee (Sungkyunkwan University, Suwon, Korea, Republic Bill Chen, Yangtze Delta Region Institute of Measurement and Correlation-Based Goleta, CA, USA of (South)); Wansoo Nah (Sungkyunkwan University, Tsinghua University, Beijing, China Suwon, Korea, Republic of (South)); Jinsung Youn Methodology for Estimating Worst-Case Co-chair: (Samsung Electronics Co., Ltd., Hwaseong, Korea, Co-chair: Skew due to Glass Weave Effect Michael McInerney, US Army Corp of Republic of (South)); (Samsung Electronics Daehee Lee Davy Pissoort, KU Leuven, Ostend, Belgium Kartheek Nalla (Cisco Systems, Inc., San Jose, CA, USA); Co., Ltd., Hwaseong, Korea, Republic of (South)); Engineers, Champaign, IL, USA Amendra Koul (Cisco Systems, Inc., San Jose, CA, USA); ChanSeok Hwang (Samsung Electronics Co., Ltd., 1:30 PM – 2:00 PM Seungyong Baek (Cisco Systems, Inc., San Jose, CA, Hwaseong, Korea, Republic of (South) 1:30 PM – 2:00 PM Methodology to Minimize Power Via USA); Mike Sapozhnikov (Cisco Systems, Inc., San Jose, BEST EMC STUDENT PAPER AWARD FINALIST CA, USA); Giorgi Maghlakelidze (Missouri University 4:00 PM – 4:30 PM Resonance Modes for 25Gbps+ High of Science and Technology, Rolla, MO, USA); Jun Fan An On-Chip Detector of Transient Stress BEST EMC PAPER AWARD FINALIST Speed Signal Applications (Missouri University of Science and Technology, Rolla, MO, USA) Events A Study on Correlation Between Near-Field IL-Young Park (Cisco Systems, Inc., San Jose, CA, USA); A. Patnaik (Missouri University of Science and (Molex, Inc., Lisle, IL, USA); Pu Xie EMI Scan and ESD Susceptibility of ICs Peerouz Amleshi 4:00 PM – 4:30 PM Technology, Rolla, MO, USA); M. Suchak (Missouri (Molex, Inc., Lisle, IL, USA); David Brunker (Molex, Inc., Ahmad Hosseinbeig (Missouri University of Science University of Science and Technology, Rolla, MO, USA); Lisle, IL, USA); Jayanthi Natarajan (Cisco Systems, Inc., Study of Fiberweave Effect through and Technology, Rolla, MO, USA); R. Seva (Missouri University of Science and Technology, Omid Hoseini Izadi San Jose, CA, USA) (Missouri University of Science and Technology., Rolla, Simulation and Measurement on Rolla, MO, USA); K. Pamidimukkala (Missouri University of Science and Technology, Rolla, MO, USA); MO, USA); Satyajeet Shinde (Missouri University of Performance of Differential Stripline at Science and Technology, Rolla, MO, USA); 2:00 PM – 2:30 PM D. Pommerenke (Missouri University of Science and (Missouri University of Science and High Frequency Technology, Rolla, MO, USA); G. Edgington (NXP David Pommerenke Accurate and Efficient Modeling of (Ciena, Ottawa, ON, Canada); TUESDAY, AUGUST 8 AUGUST - TUESDAY, PROGRAM TECHNICAL Technology, Rolla, MO, USA); (Sony Nasser Ghassemi Semiconductors, Austin, TX, USA); R. Moseley (NXP Hideki Shumiya Multi-Gigabit Serial links Channels with 8 AUGUST - TUESDAY, PROGRAM TECHNICAL Global Manufacturing and Operations Corporation, Wenqian Han (Cienna, Ottawa, ON, Canada); Semiconductors, Austin, TX, USA); J. Feddeler (NXP Tokyo, Japan); (Sony Global Cut-and-Stitch Methodology Hugues Tournier (Ciena, Ottawa, ON, Canada) Semiconductors, Austin, TX, USA); M. Stockinger (NXP Junji Maeshima Manufacturing and Operations Corporation, Tokyo, Semiconductors, Austin, TX, USA); D. Beetner (Missouri ABSTRACT REVIEWED Japan); Kenji Araki (Sony Global Manufacturing and 4:30 PM – 5:00 PM University of Science and Technology, Rolla, MO, USA) (Cadence Design Systems, Inc., Bangalore, Operations Corporation, Tokyo, Japan) Jay Shah India); Joe Socha (Cadence Design Systems, Inc., In Situ Stripline Laminate Property 2:00 PM – 2:30 PM Columbia, MD, USA); Chaiwen Shih (Cadence Design 4:30 PM – 5:00 PM Extraction Accounting for Effective BEST EMC STUDENT PAPER AWARD FINALIST Systems, Inc., Hsinchu, Taiwan); Bradley Brim (Cadence ESD Susceptibility Evaluation on Design Systems, Inc., Bellevue, WA, USA) Surface Roughness Losses Detection Methods for Secondary ESD Capacitive Fingerprint Module Jason J. Ellison (The Siemon Company, New Discharge during IEC 61000-4-2 Testing 2:30 PM – 3:00 PM Cumberland, PA, USA); Sedig Agili (Pennsylvania State Pengyu Wei (Missouri University of Science and (Missouri University of Science University, Middletown, PA, USA) Shubhankar Marathe Technology, Rolla, MO, USA); Shubhankar Marathe BEST SIPI PAPER AWARD FINALIST and Technology, Rolla, MO, USA); Hossein Rezaei (Missouri University of Science and Technology, Rolla, Effective Channel Budget Technique for (Missouri University of Science and Technology, Rolla, MO, USA); Jianchi Zhou (Missouri University of Science MO, USA); (Missouri University of High-Speed Channels due to Differential 5:00 PM – 5:00 PM David Pommerenke and Technology, Rolla, MO, USA); David Pommerenke Science and Technology, Rolla, MO, USA); Mike Hertz (Missouri University of Science and Technology, Rolla, P/N Skew Automotive SiP LPDDR4 Design Space (Teledyne LeCroy, Chestnut Ridge, NY, USA) MO, USA) ABSTRACT REVIEWED Exploration for Achieving System-Level SI 2:30 PM – 3:00 PM David Nozadze (Cisco Systems, Inc. / Missouri University Performance 5:00 PM – 5:30 PM of Science and Technology, San Jose, CA, USA); BEST EMC PAPER AWARD FINALIST Wang Yao (Qualcomm Technologies, Inc., San Diego, BEST EMC STUDENT PAPER AWARD FINALIST (Cisco Systems, Inc., San Jose, CA, USA); Amendra Koul CA, USA); Lakshmi Baskaran (Qualcomm Technologies, A Simple Frequency Response (Cisco Systems, Inc., San Jose, CA, USA); Electrostatic Discharge Currents Kartheek Nalla Inc., San Diego, CA, USA); Jaemin Shin (Qualcomm (Cisco Systems, Inc., San Jose, CA, Compensation Method for Current Probe Representation using the Multi-Peaked Mike Sapozhnikov Technologies, Inc., San Diego, CA, USA); Tim Michalka USA); Victor Khilkevich (Missouri University of Science (Qualcomm Technologies, Inc., San Diego, CA, USA); Measurements of ESD Currents and Technology, Rolla, MO, USA) Analytically Extended Function by Scott Powers (Qualcomm Technologies, Inc., San Diego, Sen Yang (Missouri University of Science and Interpolation on a D-Optimal Design CA, USA) Technology, Rolla, MO, USA); Jianchi Zhou (Missouri University of Science and Technology, Rolla, MO, USA); ABSTRACT REVIEWED David Pommerenke (Missouri University of Science Karl Lundengård (Mälardalen University, Vaesteraas, and Technology, Rolla, MO, USA); Dazhao Liu (Missouri Sweden); Milica Rančić (Mälardalen University, Vasteras, University of Science and Technology, Rolla, MO, USA) Sweden); Vesna Javor (University of Nis, Nis, Serbia); Sergei Silvestrov (Mälardalen University, Vasteras, Sweden)

38 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 39 40 TECHNICAL PROGRAM - TUESDAY, AUGUST 8 I FINALPROGRAM Power Integrity Simulation Current DistributionalongtheViafor Cavity ModelMethodbasedwithGradient BEST SIPIPAPER AWARD FINALIST 2:30 PM–3:00 ABSTRACT REVIEWED Pitch Devices Designing-In LargerPin-Count, Smaller PCB Power Integrity Flow –Efficiently 2:00 PM–2:30 ABSTRACT REVIEWED based Power Delivery Analysis of Integrated Voltage Regulator Distributed Effects inVoltage Ripple 1:30 PM–2:00 Co-chair: Chair: Sponsored by TC10 SIPI POWER INTEGRITY1 TU-PM-6 TECHNICAL SESSION Zhao CA, USA); USA); CA, Rolla, MO, USA); USA); MO, Rolla, MO, USA); USA); MO, (Missouri University of Science and Technology, Rolla, Rolla, Technology, and Science of University (Missouri Erping Li Sichen Yang Hanbiao Jin Hanzhi Ma Joe Socha Sameer Shekhar Amit K.Jain Shaowu Huang, Jiangqi He, MO, USA) MO, San Jose, CA, USA CA, Jose, San (Missouri University of Science and Technology, Rolla, Rolla, Technology, and Science of University (Missouri Systems, Inc., San Jose, CA, USA) CA, Jose, San Inc., Systems, of Science and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science of and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Inc., San Jose, CA, USA); USA); CA, Jose, San Inc., (Missouri University of Science and Technology, Technology, and Science of University (Missouri (Zhejiang University, Hangzhou, China); China); Hangzhou, University, (Zhejiang Sam Chitwood Albert Ruehli (Cadence Design Systems, Inc., San Jose, Jose, San Inc., Systems, Design (Cadence I (Zhejiang University, Hangzhou, China); China); Hangzhou, University, (Zhejiang WWW.EMC2017.EMCSS.ORG (Zhejiang University, Hangzhou, China); China); Hangzhou, University, (Zhejiang (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Zhejiang University, Hangzhou, China); China); Hangzhou, University, (Zhejiang Chandler, AZ, USA AZ, Chandler, Chenxi Huang (Intel Corporation, Hillsboro, OR, USA) OR, Hillsboro, Corporation, (Intel

Invensas Corporation, Corporation, Invensas Bradley Brim (Missouri University of Science Science of University (Missouri (Cadence Design Systems, Systems, Design (Cadence MARYLAND 3&4 1:30 PM–5:30PM (Missouri University University (Missouri James Drewniak 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY (Cadence Design Design (Cadence Siqi Bai Biyao TECHNICAL PROGRAM

Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Becker USA); J USA); Cracraft (Missouri University of Science and Technology, Rolla, MO, MO, Rolla, Technology, and Science of University (Missouri Jonghyun Cho Model Computing System basedonCavity Modeling andAnalysis of PKG PDNfor 3:30 PM–4:00 in Compact IoT System Designs Electrical Modelingfor Sub-Millivolt Noise 5:00 PM–5:30 for PCBs Ripple onthePower Distribution Network Component for theReductionof Voltage A Novel Z-Directed Embedded 4:30 PM–5:00 using Bilateral MagneticCoupling Surface MountShuntCapacitor Filters 4:00 PM–4:30 Corporation, New York, NY, USA); USA); NY, York, New Corporation, Corporation, Research Triangle Park, NC, USA); USA); NC, Park, Triangle Research Corporation, of Science and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science of and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Japan); Japan); Hosseinbeig Amit K.Jain Shalini Sankar Sameer Shekhar James Drewniak Nana Dikhaminjia Biyao Zhao Naoto Oka Akihito Kobayashi (Lexmark International, Inc., Lexington, KY, USA); USA); KY, Lexington, Inc., International, (Lexmark (Mitsubishi Electric Corporation, Kamakura, Japan); Japan); Kamakura, Corporation, Electric (Mitsubishi International, Inc., Lexington, KY, USA); USA); KY, Lexington, Inc., International, International, Inc., Lexington, KY, USA); USA); KY, Lexington, Inc., USA); MO, International, Rolla, Technology, and Science of University Electric Corporation, Kamakura, Japan); Japan); Kamakura, Corporation, Electric Corporation, Kamakura, Japan) Kamakura, Corporation, Technology, Rolla, MO, USA) USA) MO, Rolla, Technology, Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Japan); Kamakura, ames Drewniak (IBM Corporation, Poughkeepsie, NY, USA) USA) NY, Poughkeepsie, Corporation, (IBM (IBM Corporation, Poughkeepsie, NY, USA); USA); NY, Poughkeepsie, Corporation, (IBM Hideyuki Oh-hashi (Mitsubishi Electric Corporation, Kamakura, Kamakura, Corporation, Electric (Mitsubishi (Missouri University of Science and and Science of University (Missouri (Missouri University of Science and and Science of University (Missouri (Intel Corporation, Hillsboro, OR, USA) OR, Hillsboro, Corporation, (Intel (Missouri University of Science and and Science of University (Missouri (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Missouri University of Science and and Science of University (Missouri (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Missouri University of Science and and Science of University (Missouri Satoshi Yoneda (Mitsubishi Electric Corporation, Corporation, Electric (Mitsubishi (Missouri University of Science Science of University (Missouri Siqi Bai (Mitsubishi Electric Electric (Mitsubishi Zach Kratzer Ying S.Cao Keith Hardin Samuel Connor Matteo Cocchini (Missouri University University (Missouri (Mitsubishi (Mitsubishi John Fessler Ahmad Yuichi Sasaki (Missouri (Missouri Albert Ruehli (Lexmark (Lexmark (Lexmark (Lexmark Michael A. (IBM (IBM (IBM (IBM Dale

2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM Adjustable SpeedMotor Drive Systems Modeling andNoiseReductionfor Advances inElectromagneticInterference BEST SIPIPAPER AWARD FINALIST 2:30 PM–3:00 from WindEnergyConversion Systems Radiated ElectromagneticEmissions BEST SIPIPAPER AWARD FINALIST 2:00 PM–2:30 Motor Drives Progagation andFilter DesigninAC-Fed Impact of Diode-RectifieronEMC-Noise 1:30 PM–2:00 Co-chair: Chair: Sponsored by SC5 TU-PM-7 ELECTRONICS EMC SIPI POWER TECHNICAL SESSION Germany); Germany); Helsinki, Finland) Helsinki, Jianghua Feng Shuo Wang Le Yang Germany) Hannover, Hannover, Universität (Leibniz Sebastian Koj Bernhard Wunsch Shuo Wang, Siming Pan, Gainesville, FL, USA FL, Gainesville, Universität Hannover, Hannover, Germany); Germany); Hannover, Hannover, Universität AG, Baden, Switzerland); Switzerland); Baden, AG, Hannover, Hannover, Germany); Germany); Hannover, Hannover, Baden, Switzerland); Switzerland); Baden, Switzerland); Switzerland); Zhuzhou, China) Zhuzhou, (University of Florida, Gainesville, FL, USA); USA); FL, Gainesville, Florida, of (University Cornelia Reschka (University of Florida, Gainesville, FL, USA); USA); FL, Gainesville, Florida, of (University

Uwe Drofenik (Leibniz Universität Hannover, Hannover, Hannover, Hannover, Universität (Leibniz (CRRC Zhuzhou Institute Co., Ltd., Ltd., Co., Institute Zhuzhou (CRRC E-Charging, Inc., ShenZhen, China ShenZhen, Inc., E-Charging, University of Florida, Florida, of University (ABB Switzerland AG, Baden, Baden, AG, Switzerland (ABB Stanislav Skibin Ville Forsstrom (ABB Switzerland AG, AG, Switzerland (ABB MARYLAND 5&6 (Leibniz Universität Universität (Leibniz 1:30 PM–5:30PM Sven Fisahn (ABB Switzerland Switzerland (ABB (ABB Oy Drives, Drives, Oy (ABB Heyno Garbe (Leibniz (Leibniz validation. draft ANSIC63.25standardfor test site technique thatisdescribedinthenew provides anexample of thismeasurement CISPR method.Note thisdemonstration and dataisshown to correlate to the processed through statistical techniques, the results.Timedomainsite VSWR ispost- the datapost-processing, andanalysis of effectiveness of themeasurementprocess, be derived. The demonstration shows the of frequencycanchamber) -asafunction consequently the VSWRof thetest site (or gating andFFT,thereflection coefficient, responses dueto timedelays. After time can beseparated fromthedirectantenna FFT. The reflections fromtheenvironment transformed to timedomainviainverse between two antennas. The datais analyzer isusedto obtaintheS21response for test site validation. Avector network the site VSWRascalled outinCISPR domain measurementprocess of obtaining This demonstration shows thetime Park, USA Cedar TX, ETS-Lindgren, Zhong Chen, VSWR MEASUREMENTS TIME DOMAINSITE SOFTWARE DEMONSTRATIONS HARDWARE EXPERIMENTS& FINAL PROGRAM REAR OFEXHIBITHALL 2:00 PM–4:00PM I WWW.EMC2017.EMCSS.ORG I

41 TECHNICAL PROGRAM - TUESDAY, AUGUST 8 42 TECHNICAL PROGRAM - TUESDAY, AUGUST 8 I FINALPROGRAM 3-dimensional antenna performance. approach may alsobeusedto measure in a2-dimensionaltest system, butthis example of thismeasurementtechnique Note thisdemonstration provides an measurements for 5G/mmWave antennas. order to perform accurate andconfident emphasizes thetasks thatlieaheadin wave communications andfurther presents thechallengesinmillimeter in theazimuth plane.The demonstration Analyzer (VSA) whiletheAUT isrotated analyzedfurther withaVector Signal with adualpolarized hornantenna and transmitted signalisthenmeasured by aVector SignalGenerator (VSG).The signalthatiscreated Multiplexing (OFDM) Orthogonal FrequencyDivision test (AUT) isfed withamodulated (mmWave) antenna. The antenna under measurement for a5G/millimeter wave 2-dimensional antenna pattern This demonstration shows asimple Jari Vikstedt, MEASUREMENTS 5G PERFORMANCE Cedar Park, TX, USA TX, Park, Cedar SOFTWARE DEMONSTRATIONS HARDWARE EXPERIMENTS& I WWW.EMC2017.EMCSS.ORG

ETS-Lindgren, ETS-Lindgren, REAR OFEXHIBITHALL 2:00 PM–4:00PM 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM ON EMISSIONS SHIELD IMPACT OFCABLE broad frequencyrange. the context of transfer impedance across a performance. Conclusions willbedrawn in and termination method/location effect to demonstrate how wiregauge,length their shieldtermination methodsmodified demonstration, several cables willhave length becomes long.Inthis sufficiently EMI environments whenthepigtail on acable ineffective withincertain a pigtail)willoften rendertheshielding cable shieldsusingawire(also known as shielding effectiveness. Terminating have the potential to notablydegrade continuous 360-degree connection terminations thatarelessthana and susceptibility signals.Cableshield shielding to ensurecontrol of emissions while beingableto provide therequired designed for cost effective manufacturing Cable/Connector assembliesmustbe Rockwell Valles, Juan and Juszczyk Matt PERFORMANCE Collins, Cedar Rapids, IA, USA IA, Rapids, Cedar Collins, SOFTWARE DEMONSTRATIONS HARDWARE EXPERIMENTS& TERMINATIONS REAR OFEXHIBITHALL 2:00 PM–4:00PM

2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM including: to perform awidearray of assessments, will beonusingasinglegeometricmodel to space plasmaenvironments. Emphasis quantitative assessmentof EMCrisks due This demonstration willpresenta overall vehicle EMCrisk. of theimpactof thesemodifications on the modelto obtainacomprehensive view design variations can beincorporated into program. Different materials andother andflexibilityefficiency foraspace single geometricmodelprovides great wide array of numerical analyses froma design process. The abilityto perform a EMC analysis animportantpartof the space vehicle platforms makes numerical ceramics andotherinsulatingmaterials in transient coupling. The modernuseof distortion to surface chargingto box level vehicles, ranging fromantenna pattern USA CO Space plasmaspresentmany risks to space Denver, EMA, Neufeld, Bryon ANALYSIS SPACE PLASMAEMC COMPREHENSIVE SINGLE SOFTWARE DEMONSTRATIONS HARDWARE EXPERIMENTS& Susceptibility Radiated Emissions/Radiated Pattern Distortion Thruster Plume-induced Antenna Discharge Coupling to Cable Internal Charging(coupon) Surface Charging MODEL USING A USING A REAR OFEXHIBITHALL 2:00 PM–4:00PM barriers. and together, to stereotypes andsocietal importantly whatwe can do,individually discuss someof theproblems andmore and mentoring others.Come and from theirown careers andfromadvising representatives have awealth of experience career inengineering.Ourpanelof WIE follow theiracademic interests to a inspiring girlsaroundtheworld to women engineersandscientists organization dedicated to promoting is thelargestinternational professional barriers. IEEEWomen inEngineering(WIE) of women by stereotypes andsocietal representation isthediscouragement contributing factors to suchskewed in academia Oneof the andindustry. and aeronautical engineering,both in thefields of mechanical, electrical, In general women areunder-represented Co-chairs: FOR NEWACQUISITIONS REQUIREMENTS MIL-STD-461/464 EMC TAILORING OF PANELISTS: PANEL DISCUSSION Mark Mallory, Joseph Deboy, Fred Heather, Kurt Mikoleit, Syracuse, Martin, Lockheed Davis, H. Robert New York, USA York, New Wright Patterson AFB, OH USA OH AFB, Patterson Wright NAVSEA Dahlgren, Dahlgren, NAVSEA Carrigan, Kenneth Dahlgren, Virginia, USA Virginia, Dahlgren, EMC Management Concepts, Concepts, Management EMC Farmer, Brian Annapolis, Maryland, USA Maryland, Annapolis, FINAL PROGRAM NAVSEA, Dahlgren, VA USA VA Dahlgren, NAVSEA, NAVAIR, Patuxent River, MD USA MD River, Patuxent NAVAIR, NAVAIR, Patuxent River, MD USA MD River, Patuxent NAVAIR, U.S. Air Force AFLCMC/EZAC, AFLCMC/EZAC, Force Air U.S. CHESAPEAKE DE 3:30 PM–5:00PM I WWW.EMC2017.EMCSS.ORG I

43 TECHNICAL PROGRAM - TUESDAY, AUGUST 8 44 TECHNICAL PROGRAM - WEDNESDAY, AUGUST 9 I FINALPROGRAM EMC community can help. spectrumchallenges,andhowfuture the community. Joinusto discusscurrentand government agencieswithin thespectrum highly accomplished individualsfrom more complex. Ourpanelismadeup of and technologies willcontinue to become managing thedeployment of new systems properly. Thus, thechallengeof efficiently spectrum thatisquietenoughto operate of Things, requirebothspectrumand near field communication andtheInternet congested andmany new uses,suchas bands withinthespectrumarealready commercial systems. Many frequency be, critical to many government and spectrum hasbeen,andcontinues to applications. Access to unencumbered andcommercialfor bothmilitary resource anditsuseisrapidly expanding The electromagnetic spectrumisafinite Co-chairs: Sponsored by TC6 WED-AM-1 HOW THEEMCCOMMUNITY CAN HELP SPECTRUM CHALLENGESINTHENEXT10YEARS– WEDNESDAY, AUGUST 9,2017 PANEL DISCUSSION Raytheon Company Company Raytheon Dyberg, Karen Marlborough, MA USA MA Marlborough, Naval Research Laboratory, Laboratory, Research Naval Cohen, Larry Washington, D.C. USA D.C. Washington, I WWW.EMC2017.EMCSS.ORG

8:30 AM–10:00AM MARYLAND A 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM PANELISTS: Telecommunications Sciences (ITS), Boulder, Boulder, (ITS), Sciences Telecommunications Fred Moorefield, Ian Atkins, Julius Knapp, Keith Gremban, Colorado, USA Colorado, Technology, Federal Communications Communications Federal Technology, Federal Aviation Administration (FAA), (FAA), Administration Aviation Federal & International Engagements, Department of of Department Engagements, International & Commission, (FCC), Washington DC, USA DC, Washington (FCC), Commission, Washington DC, USA DC, Washington Defense (DoD) Chief Information Officer (CIO), (CIO), Officer Information Chief (DoD) Defense Fort Meade MD, USA MD, Meade Fort Director, Spectrum Engineering, Engineering, Spectrum Director, Chief, Office of Engineering Engineering of Office Chief, Director, Institute for for Institute Director, Director, Spectrum Policy Policy Spectrum Director, 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM Semi-Isolated Power Supply Suppression Designof aDC/DC Conducted EmissionAnalysis and 9:30 AM–10:00 a Three-Phase Transformer Compatibility andPower QualityIssuesat Concerns on Electromagnetic 9:00 AM–9:30 EMI-Reduction Coding basedon8b/10b BEST EMCPAPER AWARD FINALIST 8:30 AM–9:00 Chair: Sponsored by TC6/TC7 LOW FREQUENCYEMC ENGINEERING AND SESSION ONSPECTRUM TC6/TC7 JOINT WED-AM-2 TECHNICAL SESSION Taipei City, Taiwan) City, Taipei Institute of Technology, Shenzhen, China) Shenzhen, Technology, of Institute Institute of Technology, Shenzhen, China); China); Shenzhen, Technology, of Institute Nicolae Junping He Bo Zheng Romania); Craiova, Craiova, of (University Petre-Marian Nicolae Chiu-Chih Chou Giordano Spadacini, Milan, Italy Milan, Craiova, Craiova, Romania); Romania); Craiova, Craiova, Romania); Romania); Taiwan); Taiwan); (University of Craiova, Craiova, Romania) Romania) Craiova, Craiova, of (University Tzong-Lin Wu (Shenzhen Graduate School of Harbin Harbin of School Graduate (Shenzhen Marian-Ştefan Nicolae (Shenzhen Graduate School of Harbin Harbin of School Graduate (Shenzhen (National Taiwan University, Taipei, Taipei, University, Taiwan (National (University of Craiova, Craiova, Craiova, Craiova, of (University (National Taiwan University, University, Taiwan (National Politecnico di Milano, Milano, di Politecnico Ionuț DanielSmărăndescu 8:30 AM–10:00AM MARYLAND 1&2 (University of of (University Ileana-Diana using Discrete Hilbert A Methodto Detect Causality Violations 9:30 AM–10:00 ABSTRACT REVIEWED and Vias Method to ModelInterconnects of Traces Using BroadbandGreen’sFunction 9:00 AM–9:30 ABSTRACT REVIEWED Objects basedonIsogeometricAnalysis Electromagnetic Simulationof Curved 8:30 AM–9:00 Co-chair: Chair: Sponsored by TC9 ELECTROMAGNETICS (I) COMPUTATIONAL TU-AM-3 TECHNICAL SESSION Colombia); Colombia); Swiss Federal Institute of Technology (EPFL), Bogota, Bogota, (EPFL), Technology of Institute Federal Swiss Lausanne, Switzerland) Switzerland) Lausanne, Rachidi Juan Becerra Leung Tsang Shaowu Huang Tadatoshi Sekine Ying Cao, Matthias Troescher, Germany Technology, Rolla, MO, USA MO, Rolla, Technology, Technology (EPFL), Lausanne, Switzerland); Switzerland); Lausanne, (EPFL), Technology Japan) (Swiss Federal Institute of Technology (EPFL), (EPFL), Technology of Institute Federal (Swiss Felix Vega Missouri University of Science and and Science of University Missouri (University of Michigan, Ann Arbor, MI, USA USA MI, Arbor, Ann Michigan, of (University (Universidad Nacional de Colombia / / Colombia de Nacional (Universidad FINAL PROGRAM (Xperi Corporation, San Jose, CA, USA); USA); CA, Jose, San Corporation, (Xperi (Shizuoka University, Hamamatsu-shi, Hamamatsu-shi, University, (Shizuoka (Swiss Federal Institute of of Institute Federal (Swiss CST AG, Munich, Munich, AG, CST 8:30 AM–10:00AM MARYLAND C I WWW.EMC2017.EMCSS.ORG Farhad I

45 TECHNICAL PROGRAM - WEDNESDAY, AUGUST 9 46 TECHNICAL PROGRAM - WEDNESDAY, AUGUST 9 I FINALPROGRAM against EMAttacks withLow Overhead Enhancing Reactive Countermeasure 9:30 AM–10:00 the Stratified Lossy Ground Lightning-Induced Voltages Considering Calculation of theObliqueChannel 8:30 AM–9:00 Co-chair: Chair: Sponsored by TC5 HPEM TOPICS WED-AM-4 TECHNICAL SESSION Shijiazhuang, China); China); Shijiazhuang, Shijiazhuang, China); China); Shijiazhuang, Daisuke Fujimoto Yu-ichi Hayashi Homma Naofumi Daisuke Ishihata Hao-jiang Wan Ya-zhou Chen William Radasky, Michael McInerney, Goleta, CA, USA CA, Goleta, USA IL, Champaign, Engineers, Engineering College, Shijiazhuang, China) China) Shijiazhuang, College, Engineering Engineering College, Shijiazhuang, China); China); Shijiazhuang, College, Engineering Japan) Kobe, Japan); Japan); Kobe, Japan); Japan); Yokohama, Japan); Japan); Yokohama, Noriyuki Miura I WWW.EMC2017.EMCSS.ORG Takafumi Aoki (Ordnance Engineering College, College, Engineering (Ordnance (Ordnance Engineering College, College, Engineering (Ordnance (Tohoku Gakuin University, Tgajyo, Tgajyo, University, Gakuin (Tohoku (Tohoku University, Sendai, Japan); Japan); Sendai, University, (Tohoku (Tohoku University, Sendai, Japan); Japan); Sendai, University, (Tohoku (Yokohama National University, University, National (Yokohama Makoto Nagata Erwei Cheng Erwei Xiaojia Wang Metatech Corporation, Corporation, Metatech (Kobe University, Kobe, Japan); Japan); Kobe, University, (Kobe US Army Corp of of Corp Army US 8:30 AM–10:00AM (Tohoku University, Sendai, Sendai, University, (Tohoku MARYLAND D 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY (Ordnance (Ordnance (Ordnance (Ordnance (Kobe University, University, (Kobe TECHNICAL PROGRAM 3D-ICs basedonThrough Silicon Via(TSV) Detection of OpenandShortFaultsin 8:30 AM–9:00 Chair: Sponsored by TC10 SIPI 3DIC WED-AM-5 System Nanoscale 3DNeuromorphicComputing Opportunities andChallengeson BEST SIPIPAPER AWARD FINALIST 9:30 AM–10:00 X-Talk, andPower Noise Estimation Methodfor HBMincludingISI, Investigation of Statistical Eye-Diagram 9:00 AM–9:30 TECHNICAL SESSION Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Rolla, MO, USA); USA); MO, Rolla, Francesco dePaulis Stefano Piersanti Biancun Xie, Yang Yi Zhen Zhou Hongyu An Jun Fan Jonghyun Cho Korea, Republic of (South)); (South)); of Republic Korea, Republic of (South)); (South)); of Republic USA University of Science and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science of University Jose, CA, USA) USA) CA, Jose, of Science & Technology, Rolla, MO, USA) USA) MO, Rolla, Technology, & Science of Institute of Science and Technology (KAIST), Daejeon, Daejeon, (KAIST), Technology and Science of Institute Science and Technology (KAIST), Daejeon, Korea, Korea, Daejeon, (KAIST), Technology and Science Italy); Italy); Italy); Italy); Daniel H.Jung Antonio Orlandi (Missouri University of Science and Technology, Technology, and Science of University (Missouri (University of Kansas, Lawrence, KS, USA) KS, Lawrence, Kansas, of (University (Intel Corporation, Santa Clara, CA, USA); USA); CA, Clara, Santa Corporation, (Intel (University of Kansas, Lawrence, KS, USA); USA); KS, Lawrence, Kansas, of (University (Missouri University of Science and and Science of University (Missouri Intel Corporation, Phoenix, AZ, AZ, Phoenix, Corporation, Intel Brice Achkir (University of L’Aquila, L’Aquila, Italy); Italy); L’Aquila, L’Aquila, of (University (Korea Advanced Institute of of Institute Advanced (Korea (University of L’Aquila, L’Aquila, L’Aquila, L’Aquila, of (University Jungo Kim (University of L’Aquila, L’Aquila, L’Aquila, L’Aquila, of (University Jun Fan 8:30 AM–10:00AM Heegon Kim (Cisco Systems, Inc., San San Inc., Systems, (Cisco MARYLAND B (Korea Advanced Advanced (Korea (Missouri University University (Missouri (Missouri (Missouri 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM Optimization Improved MMSEAlgorithmfor DFE 9:30 AM–10:00 Analysis Function anditsApplication inJitter Numerical Conditional ProbablityDensity 9:00 AM–9:30 Physical Units S-Parameters QualityEstimationin 8:30 AM–9:00 Co-chair: Chair: Sponsored by TC10 METHODS 1 SIPI NUMERICAL WED-AM-6 TECHNICAL SESSION Mikulchenko Phares Lee MO, USA); USA); MO, USA); MO, (Dell, Inc., Round Rock, TX, USA) TX, Rock, Round Inc., (Dell, A. Chada Rolla, Technology, and Science of University (Missouri N. Dikhaminjia Rob Friar Adam Norman Kai Xiao Alaeddin Aydiner Yunhui Chu Rolla, Technology, and Science of University (Missouri Mikheil Tsiklauri Hillsboro, Corporation, Intel Chu, Yunhui L’Aquila, of University Orlandi, Antonio (Samsung Electronics Co. Ltd., San Jose, CA, USA); USA); CA, Jose, San Ltd., Co. Electronics (Samsung University of Science and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science of University USA) MO, Rolla, Technology, and Science of University of Science and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science of and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and OR, USA OR, Italy L’Aquila, Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, (Intel Corporation, Santa Clara, CA, USA); USA); CA, Clara, Santa Corporation, (Intel (Intel Corporation, Hillsboro, OR, USA) USA) OR, Hillsboro, Corporation, (Intel (Intel Corporation, Dupont, WA, USA); USA); WA, Dupont, Corporation, (Intel (Dell, Inc., Round Rock, TX, USA); USA); TX, Rock, Round Inc., (Dell, (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel M. Tsiklauri Jun Fan (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Intel Corporation, Santa Clara, CA, USA); USA); CA, Clara, Santa Corporation, (Intel (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Missouri University of Science and and Science of University (Missouri (Missouri University of Science and and Science of University (Missouri (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Missouri University of Science and and Science of University (Missouri (Missouri University of Science Science of University (Missouri 8:30 AM–10:00AM MARYLAND 3&4 J. He James Drewniak Nana Dikhaminjia J. Drewniak (Missouri University University (Missouri B. Mutnury B. Mutnury Dan Oh H. Deng Beomtaek Beomtaek (Missouri (Missouri (Missouri (Missouri Charles Charles Oleg Oleg

Patterns Pairs Simulated and Measured Radiation Assigning aCorrelation Score to 9:30 AM–10:00 ABSTRACT REVIEWED Converter Environment on±320kV VSC-HVDC Simulation of Electromagnetic 9:00 AM–9:30 Magnetic Composite Structures Homogenization Modelingof Periodic 8:30 AM–9:00 Co-chair: Chair: Sponsored by SC5 ELECTROMAGNETICS (II) COMPUTATIONAL WED-AM-7 TECHNICAL SESSION Israel) Beijing, China); China); Beijing, China) China) Pavel Vilner Bo Xu Jian Zhang Zhong Chen Zubiao Xiong Zhen Zhou, Scott Piper, (North China Electric Power University, Beijing, China); China); Beijing, University, Power Electric China (North USA CA, USA CA, Electric Power University, Beijing, China); China); Beijing, University, Power Electric University, Beijing, China); China); Beijing, University, (North China Electric Power University, Beijing, Beijing, University, Power Electric China (North (North China Electric Power University, University, Power Electric China (North (Mellanox Technologies Ltd., Yokneam, Yokneam, Ltd., Technologies (Mellanox (ETS-Lindgren, Cedar Park, TX, USA) TX, Park, Cedar (ETS-Lindgren, (ETS-Lindgren, Cedar Park, TX, USA); USA); TX, Park, Cedar (ETS-Lindgren, FINAL PROGRAM Intel Corporation, Santa Clara, Clara, Santa Corporation, Intel General Motors, LLC., Milford, MI, MI, Milford, LLC., Motors, General Tiebing Lu Weidong Zhang (North China Electric Power Power Electric China (North 8:30 AM–10:00AM MARYLAND 5&6 I WWW.EMC2017.EMCSS.ORG Xiuwu Zhang (North China China (North

I

47 TECHNICAL PROGRAM - WEDNESDAY, AUGUST 9 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

HARDWARE EXPERIMENTS & 9:00 AM–11:00 AM HARDWARE EXPERIMENTS & 9:00 AM–11:00 AM HARDWARE EXPERIMENTS & 9:00 AM–11:00 AM HARDWARE EXPERIMENTS & 9:00 AM–11:00 AM SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL

TRANSMISSION LINE CONDUCTED TRANSIENTS IMPROVING PULSED/ HYBRID PEEC/MTL REFLECTIONS AT A LOAD ON SPACECRAFT INTERMITTENT SIGNAL SOLUTION FOR ANALYSIS AND AT A DISCONTINUITY PRIMARY POWER LINES MEASUREMENTS OF TRANSMISSION-LINE UTILIZING TIME DOMAIN EFFECTS ON PCB Dr. Bogdan Adamczyk, Grand Valley State John McCloskey and Jen Dimov, NASA/Goddard University, Grand Rapids, MI, USA Space Flight Center, Greenbelt, MD, USA SCAN AND REAL-TIME SPECTRUM ANALYSIS Irina Oganezova, EMCoS Ltd., Tbilisi, Georgia This demonstration addresses the One of the sources of potential interference This demonstration material describes phenomenon of reflections on on spacecraft primary power lines is Bill Wangard, Rohde & Schwarz, Kildeer, IL, USA a hybrid approach for investigation of transmission lines. First, the concept of that of conducted transients resulting performance of printed circuit board the voltage and current waves travelling from equipment being switched on The growing complexity of electronics (PCB) by examining the impact of parasitic along a transmission line is presented, and off of the bus. Susceptibility to within both military and commercial parameters of the board design on the together with a simple transmission line such transients is addressed by some products is resulting in the emissions of efficiency of a device. Firstly, parasitic model. Then the effect of the resistive version of the CS06 requirement of more pulsed/intermittent signals which parameters are extracted from board terminations on the signal integrity is MIL-STD-461/462. This demonstration must be properly characterized during layout by 3D quasistatic field solvers. discussed. Subsequently, the effect of provides a basis for understanding of EMC testing. Unfortunately pulsed and/ Secondly, the corresponding equivalent the discontinuity along the line is shown. the sources of these transients, analysis or intermittent signals are difficult circuit is constructed. Thirdly, the extracted Real-time measurements are performed to techniques for determining their worst- to detect and even more difficult to parasitic circuits are incorporated into support the analytical models developed. case characteristics (e.g. magnitude and properly characterize for electromagnetic functional circuit model. Finally, Modified duration), and guidelines for minimizing interference. It is well known that Time Nodal Analysis (MNA) is used to examine their magnitudes and applying the Domain Scan offers a significant speed complete network. The hybridization requirement appropriately. advantage over traditional swept spectrum makes it possible to vary circuit parameters WEDNESDAY, AUGUST 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL analyzers, however it is not as well known and layout independently to achieve 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL that Time Domain Scan also offers a maximum system performance. Validation significant improvement in the ability of the proposed method is performed PANEL DISCUSSION 10:30 AM–12:00 PM to capture and characterizer pulse and by comparison of simulation results EXHIBIT HALL THEATRE intermittent signals. Real-time spectrum with measurements of GSM band signal analysis also provides invaluable insight amplifier. ASK THE EXPERTS - SIPI PANEL to analyzing pulsed signals in order to Chair: determine the proper dwell times of EMC Jun Fan, Missouri University of Science and Technology, Rolla, Missouri, USA measurements.

This Ask the Experts Panel is a great opportunity to ask those difficult-to-answer questions! This hardware demonstration will utilize The panelists were selected to provide a broad range of experience and knowledge in a USB comb generator with a pulsed the area of Signal and Power Integrity. No question is too simple or too hard! Bring your spectrum to compare the differences in questions! the ability of a swept spectrum analyzer and receiver utilizing time domain scan to characterize pulsed emissions. Real- PANELISTS: time spectrum analysis will also be used Jun Fan, Missouri University of Science and Technology, Joungho Kim, Korea Advanced Institute of Science and to characterize the time varying spectrum Rolla, Missouri, USA Technology (KAIST), Daejeon, The Republic of Korea Dale Becker, IBM Corporation, Poughkeepsie, New York, Eric Bogatin, Teledyne LeCroy, Longmont, CO 80501, USA and resultant analysis used to properly USA Madhavan Swaminathan, Georgia Tech, Georgia, USA. configure the receiver parameters for EMC Xiaoning Ye, Intel Corporation, Hillsboro, Oregon, USA emissions measurements. Bidyut Sen, Cisco Systems, Inc., San Jose, California, USA

48 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 49 50 TECHNICAL PROGRAM - WEDNESDAY, AUGUST 9 I FINALPROGRAM Crosstalk onSingle-EndedStriplines Novel DesignwithMinimized Far-End Solution for HighSpeedDifferential IO On-Die Common ModeNoiseReduction based onAnalytical Equations for Differential ViaswithShared-Antipad Estimating theVia-PlaneCapacitance Ion-Flow Field Characteristics of InsulatingFilmin Research onSurface Charge ABSTRACT REVIEWED Artificial Neural Network Model Prediction of PCBwiththeImproved The ElectromagneticRadiated Emission POSTER SESSION Malaysia); Malaysia); Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, China); Beijing, Telecommunications, Beijing, China); China); Beijing, Telecommunications, Rolla, MO, USA); USA); MO, Rolla, Chyi Tseng Beijing, China) Beijing, Khang Choong Yong BoonPing Koh Jun Xu Ying Zhang China); Beijing, University, Power Xingming Bian Electric China (North Qinyuan Li ( Telecommunications, and Posts of University (Beijing Dan Shi Jackson Yen Hank Lin China); China); University of Science and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science of University China); Beijing, Institute, Vehicle Special Electric Power University, Beijing, China); China); Beijing, University, Power Electric University of Science and Technology, Rolla, MO, USA) MO, Rolla, Technology, and Science of University Jose, CA, USA); USA); CA, Jose, University of Posts and Telecommunications, Beijing, Beijing, Telecommunications, and Posts of University CA, USA); USA); CA, University, Beijing, China); China); Beijing, University, Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, China); Beijing, Telecommunications, Malaysia) Malaysia); Malaysia); Beijing, China) Beijing, Yinting Liu (Missouri University of Science and Technology, Technology, and Science of University (Missouri (Beijing University of Posts and and Posts of University (Beijing (ASUSTek Computer, Inc., Taipei, Taiwan); Taiwan); Taipei, Inc., Computer, (ASUSTek Shuai Jin Amit K. Srivastava Wil Choon Song I WWW.EMC2017.EMCSS.ORG (ASUSTek Computer, Inc., Taipei, Taiwan); Taiwan); Taipei, Inc., Computer, (ASUSTek North China Electric Power University, University, Power Electric China North (Missouri University of Science and and Science of University (Missouri (ASUSTek Computer Inc., Taipei, Taiwan) Taipei, Inc., Computer (ASUSTek (Intel Corporation, Penang, Malaysia); Malaysia); Penang, Corporation, (Intel Bidyut Sen Bo Chen (North China Electric Power University, University, Power Electric China (North Chunchun Sui (Beijing University of Posts and and Posts of University (Beijing (Missouri University of Science and and Science of University (Missouri (Intel Corporation, Penang, Penang, Corporation, (Intel (North China Electric Power Power Electric China (North Donglai Wang (Intel Corporation, Penang, Penang, Corporation, (Intel (Cisco Systems, Inc., San Jose, Jose, San Inc., Systems, (Cisco (Intel Corporation, Penang, Penang, Corporation, (Intel Jun Fan Yansheng Wang (Cisco Systems, Inc., San San Inc., Systems, (Cisco 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY Bing Li Na Lv (Missouri (Missouri Yougang Gao Tiebing Lu (North China China (North (Beijing (Beijing (Beijing (Beijing (Missouri (Missouri TECHNICAL PROGRAM Bin- research andfindings of your peers. Browse posters anddiscover thescientific Estimation Electromagnetic Interference (EMI) Characteristics for Accurate Inductances Effect onSwitching Analysis of Power Inverter Parasitic Printed CircuitBoards Common-Mode Filtering inMultilayer Frequency-Range of MobileTerminal the Inverter EquipmentattheCarrier Analysis of RadioWave Unnecessary Near (South)); (South)); Technology (KAIST), Daejeon, Korea, Republic of (South)) of Republic Korea, Daejeon, (KAIST), Technology Haute, IN, USA); USA); IN, Haute, and Technology (KAIST), Daejeon, Korea, Republic of of Republic Korea, Daejeon, (KAIST), Technology and Japan); Japan); (KAIST), Daejeon, Korea, Republic of (South)); (South)); of Republic Korea, Daejeon, (KAIST), IN, USA); USA); IN, Yujie He Yasuyuki Okiyoneda Koichi Kondo Masahiro Yamaguchi Masahiro Nishizawa Satoshi Tanaka ( Yasunori Miyazawa ( Technology and Science Joungho Kim of Institute Advanced (Korea Gyeyoung Park USA) IN, USA); USA); IN, USA); USA); Daejeon, Korea, Republic of (South)); (South)); of Republic Korea, Daejeon, Korea, Republic of (South)); (South)); of Republic Korea, Republic of (South)); (South)); of Republic Systems and Technology Group, Poughkeepsie, NY, NY, Poughkeepsie, Group, Technology and Systems (Rose-Hulman Institute of Technology, Terre Haute, Haute, Terre Technology, of Institute (Rose-Hulman (Rose-Hulman Institute of Technology, Terre Haute, IN, IN, Haute, Terre Technology, of Institute (Rose-Hulman Advanced Institute of Science and Technology (KAIST), (KAIST), Technology and Science of Institute Advanced Institute of Science and Technology (KAIST), Daejeon, Daejeon, (KAIST), Technology and Science of Institute Technology, Terre Haute, IN, USA); USA); IN, Haute, Terre Technology, of Technology, Terre Haute, IN, USA); USA); IN, Haute, Terre Technology, of Technology, Terre Haute, IN, USA); USA); IN, Haute, Terre Technology, Japan); Japan); of Science and Technology (KAIST), Daejeon, Korea, Korea, Daejeon, (KAIST), Technology and Science of Akishima, Japan) Japan) Akishima, USA); USA); Garrett Shaffer Sang Goo Kang Makoto Nagata Jingyan Ma (Rose-Hulman Institute of Technology, Terre Terre Technology, of Institute (Rose-Hulman Jinwook Song Edward Wheeler Joseph Faia (Korea Advanced Institute of Science and and Science of Institute Advanced (Korea (TOKIN Corporation, Sendai, Miyagi, Miyagi, Sendai, Corporation, (TOKIN (Korea Advanced Institute of Science Science of Institute Advanced (Korea Zach Silva Tohoku University, Sendai, Japan); Japan); Sendai, University, Tohoku (Tohoku University, Sendai, Japan); Japan); Sendai, University, (Tohoku (Purdue University, West Lafayette, Lafayette, West University, (Purdue Tohoku University, Sendai, Japan); Japan); Sendai, University, Tohoku Seungtaek Jung (Tohoku University, Sendai, Sendai, University, (Tohoku (Rose-Hulman Institute of of Institute (Rose-Hulman (Showa Aircraft Industry Co., Ltd., Ltd., Co., Industry Aircraft (Showa (Stanford University, Stanford, CA, CA, Stanford, University, (Stanford (Tohoku University, Sendai, Japan); Japan); Sendai, University, (Tohoku (Kobe University, Kobe, Japan); Japan); Kobe, University, (Kobe (Korea Advanced Institute Institute Advanced (Korea (Rose-Hulman Institute of of Institute (Rose-Hulman (Rose-Hulman Institute Institute (Rose-Hulman Youngwoo Kim Michael Cracraft Shelby Van Hoosier Zach Bergstedt Hyunwoo Shim (Korea Advanced Advanced (Korea (Korea (Korea (IBM (IBM

2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM Optical andCopper Approaches Thunderbolt Interconnect –Comparing Levels of Noise Currents inanEnvironment withVariable Denoising HighlyDistorted Small ABSTRACT REVIEWED Applications in Three-Phase SiCInverters for Aircraft Trade-off Between LossesandEMIIssues (TIBC) Tensor Condition Impedance Boundary Carbon FiberComposite Material using Shielding Effectiveness Analysis of USA); USA); QC, Canada); Canada); QC, Christine Krause Hengju Cheng Jerry Gao Guobin Liu Ileana-Diana Nicolae Victor Dos Santos Kai Wang Saint Exupéry, Toulouse, France) Toulouse, Exupéry, Saint Exupéry, Toulouse, France); France); Toulouse, Exupéry, (University of Craiova, Craiova, Romania) Craiova, Craiova, of (University Toulouse, Toulouse, France); France); Toulouse, Toulouse, Toulouse, Toulouse, France); France); Toulouse, Toulouse, Polytechnique de Montréal, Montreal, QC, Canada) QC, Montreal, Montréal, de Polytechnique Paris Saclay, Cachan, France); France); Cachan, Saclay, Paris Canada); QC, Montreal, Montréal, de Craiova, Romania); Romania); Craiova, Romania); Romania); USA); USA); Toulouse, Toulouse, , France); France); , Toulouse, Toulouse, USA); USA); Li Yuan Edmond Lau Hui-Chin Wu (Intel Corporation, Santa Clara, CA, USA); USA); CA, Clara, Santa Corporation, (Intel (École Polytechnique de Montréal, Montreal, Montreal, Montréal, de Polytechnique (École Petre-Marian Nicolae (Intel Corporation, Santa Clara, CA, USA); USA); CA, Clara, Santa Corporation, (Intel Jean-Jacques Laurin (Intel Corporation, Santa Clara, CA, USA); USA); CA, Clara, Santa Corporation, (Intel (Intel Corporation, Santa Clara, CA, CA, Clara, Santa Corporation, (Intel (Intel Corporation, Santa Clara, CA, USA) CA, Clara, Santa Corporation, (Intel (IRT Saint Exupéry / University of of University / Exupéry Saint (IRT Ionuţ-Daniel Smărăndescu (Intel Corporation, Santa Clara, CA, CA, Clara, Santa Corporation, (Intel (Intel Corporation, Santa Clara, CA, CA, Clara, Santa Corporation, (Intel (University of Craiova, Craiova, Craiova, Craiova, of (University WEDNESDAY, AUGUST 9,2017•10:30AM–12:00PM Nicolas Roux Bertrand Revol Bruno Sareni Bernardo Cougo Jean-Pierre Carayon (University of Craiova, Craiova, of (University (École Polytechnique Polytechnique (École Ke Wu MARYLAND BALLROOM FOYER (University of of (University (University of of (University (École (École (SATIE – ENS ENS – (SATIE (IRT Saint Saint (IRT

(IRT (IRT ABSTRACT REVIEWED Baseband Noise Multiple Output-BiasBoardwithLow Precision andNoiseSensitive ICsusing Measurement Technique for High with TSVs Power DistributionNetwork in3DICs Modeling andImpedance Analysis of Bus Method for Unmatched Memory and Efficient Accurate Jitter Modeling Transmission Line Mushroom StructureinDifferential Mode NoiseSuppressionwithMultilayer A BroadbandFilter Designfor Common- Taiwan) Hsinchu, Taiwan); Taiwan); Hsinchu, and Technology, Taipei, Taiwan); Taiwan); Taipei, Technology, and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Ping Hsieh Shawn S.H. Hsu Yin-Cheng Chang Chunyu Wu Zhaowen Yan Wei Zhang Roman Meltser Marwan Dakroub Ritochit Chakraborty Jun Liao Ding-Bing Lin Taiwan); Taiwan); (Ministry of Economic Affairs, Taipei, Taiwan) Taipei, Affairs, Economic of (Ministry (National Tsing Hua University, Hsinchu, Taiwan); Taiwan); Hsinchu, University, Hua Tsing (National (National Taipei University of Technology, Taipei, Taipei, Technology, of University Taipei (National University, Beijing, China) Beijing, University, of Economic Affairs, Taipei, Taiwan); Taiwan); Taipei, Affairs, Economic of Research Laboratories, Hsinchu, Taiwan); Taiwan); Hsinchu, Laboratories, Research Applied Research Laboratories, Hsinchu, Taiwan); Taiwan); Hsinchu, Laboratories, Research Applied University, Keelung, Taiwan); Taiwan); Keelung, University, USA); USA); Laboratories, Hsinchu, Taiwan); Taiwan); Hsinchu, Laboratories, Hsinchu, Taiwan); Taiwan); Hsinchu, Kinger Cai (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel Chun-Te Wu (National Applied Research Laboratories, Laboratories, Research Applied (National (Beihang University, Beijing, China); China); Beijing, University, (Beihang (Missouri University of Science and and Science of University (Missouri (Beihang University, Beijing, China); China); Beijing, University, (Beihang (National Taiwan University of Science Science of University Taiwan (National FINAL PROGRAM (National Tsing Hua University, University, Hua Tsing (National (Intel Corporation, Haifa, Israel) Haifa, Corporation, (Intel (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel Mao-Hsu Yen Da-Chiang Chang (National Applied Research Research Applied (National (Da-Yeh University, Taichung, Taichung, University, (Da-Yeh (Intel Corporation, Hillsboro, OR, OR, Hillsboro, Corporation, (Intel Yen-Tang Chang Jianwei Wang Ya-Wen Ou (National Taiwan Ocean Ocean Taiwan (National I Yi-Chien Chen WWW.EMC2017.EMCSS.ORG Chang-Chiu Chen (National Applied Applied (National Ping-Yi Wang (National (National (Beihang (Beihang (Ministry (Ministry

Chao-

I

51 TECHNICAL PROGRAM - WEDNESDAY, AUGUST 9 52 TECHNICAL PROGRAM - WEDNESDAY, AUGUST 9 I FINALPROGRAM Capabilities of AC/DC Power Supplies Resulting fromEFT/BURSTAttenuation Changes intheEMCGenericStandards ABSTRACT REVIEWED Device Technology for LiquidCristalDisplay Conducted EmissionReduction ABSTRACT REVIEWED to Avoid Transmitter PhaseNoise Developing FPGAVCCR PDNSpecification High SpeedSystem Level PDNAnalysis: BEST EMCPAPER AWARD FINALIST ABSTRACT REVIEWED Extraction withNoise Injection High SpeedReceiver Bandwidth ABSTRACT REVIEWED and EMI Suppression of Power Noise,Crosstalk Novel throughHoleAbsorberfor ABSTRACT REVIEWED POSTER SESSIONCONTINUED Greg Moore Marjan Mokhtaari Steve Christionson Cory Mason Jun Liao Kai Xiao Xiaoning Ye Beomtaek Lee Shaowu Huang Poland) Poznań, Warehousing, and Logistics of (Institute Krzysztof Sieczkarek Byunghee Kim Gyeonggi-do, Korea, Republic of (South)) of Republic Korea, Gyeonggi-do, Warehousing, Poznań, Poland); Poland); Poznań, Warehousing, USA); USA); USA) Republic of (South)); (South)); of Republic June Feng (Intel Corporation, Hillsboro, OR, USA; USA; OR, Hillsboro, Corporation, (Intel (Intel Corporation, Dupont, WA, USA) WA, Dupont, Corporation, (Intel I WWW.EMC2017.EMCSS.ORG (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Intel Corporation, San Jose, CA, USA) CA, Jose, San Corporation, (Intel (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (LG Display Co., Ltd., Gyeonggi-do, Korea, Korea, Gyeonggi-do, Ltd., Co., Display (LG (Intel Corporation, Santa Clara, CA, USA); USA); CA, Clara, Santa Corporation, (Intel (Intel Corporation, DuPont, WA, USA); USA); WA, DuPont, Corporation, (Intel (Intel Corporation, San Jose, CA, USA); USA); CA, Jose, San Corporation, (Intel (Intel Corporation, San Jose, CA, CA, Jose, San Corporation, (Intel (Intel Corporation, Hillsboro, OR, OR, Hillsboro, Corporation, (Intel Seungjae Lee (Institute of Logistics and and Logistics of (Institute Adam Maćkowiak 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY (LG Display Co., Ltd., Ltd., Co., Display (LG TECHNICAL PROGRAM System Consideration onPulsedKicker Magnet Electromagnetic Interference Inteference (EMI)Shielding for Package-Level Electromagnetic Effects of Grounded-LidApertures BEST EMCPAPER AWARD FINALIST Method Cables –The Multi-Network Analyzer In SituCrosstalkMeasurementsof Long BEST EMCSTUDENTPAPER AWARD FINALIST Mismatch An Investigation onOscilloscope Input Applications Near-Field Scanning anditsEMC (IHPC), A*STAR, Singapore, Singapore); Singapore); Singapore, A*STAR, (IHPC), China); China); Yung-Hui Liu Xuequan Yu Xing-Chang Wei Yu-Fei Shu Chris J. Collins Carlo F.M. Carobbi En-Xiao Liu A*STAR, Singapore, Singapore); Singapore); Singapore, A*STAR, Taiwan); Taiwan); Singapore, Singapore); Singapore); Singapore, Singapore); Singapore); (Institute of High Performance Computing (IHPC), (IHPC), Computing Performance High of (Institute Synchroton Radiation Research Center, Hsinchu, Hsinchu, Center, Research Radiation Synchroton of High Performance Computing (IHPC), A*STAR, A*STAR, (IHPC), Computing Performance High of College of Canada, Kingston, ON, Canada) ON, Kingston, Canada, of College Performance Computing (IHPC), A*STAR, Singapore, Singapore, A*STAR, (IHPC), Computing Performance Hangzhou, China) Hangzhou, Shanghai, China) Shanghai, Radiation Research Center, Hsinchu, Taiwan) Hsinchu, Center, Research Radiation Canada); ON, Kingston, Center, Hsinchu, Taiwan); Taiwan); Hsinchu, Center, Chen-Jun Liu June-Rong Chen (Zhejiang University, Hangzhou, China); China); Hangzhou, University, (Zhejiang Xing-Chang Wei (Institute of High Performance Computing Computing Performance High of (Institute (Huawei Technologies Co., Ltd., Shanghai, Shanghai, Ltd., Co., Technologies (Huawei (National Synchroton Radiation Research Research Radiation Synchroton (National (Royal Military College of Canada, Canada, of College Military (Royal (Zhejiang University, Hangzhou, China); China); Hangzhou, University, (Zhejiang (University of Florence, Firenze, Italy) Firenze, Florence, of (University (Huawei Technologies Co. Ltd., Ltd., Co. Technologies (Huawei Siping Gao Joey R. Bray Chih-Shen Chen (National Synchroton Synchroton (National (Zhejiang University, University, (Zhejiang Binfang Wang (Institute of High High of (Institute (Royal Military Military (Royal Wei-Jiang Zhao (National (National (Institute (Institute

2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM Conductive Concrete Structures Shielding Effectiveness Performance of Sputtered Materials of ShieldingEffectiveness of Different Measurement andComparative Analysis BEST EMCPAPER AWARD FINALIST of (South)); (South)); of of (South)); (South)); of Base, NE, USA) NE, Base, Republic Korea, Daejeon, (KAIST), Technology and USA); USA); (South)) of Republic Republic Korea, Daejeon, (KAIST), Technology and J. Metzger Technology, Inc., Hwaseong, Korea, Republic of (South)); (South)); of Republic Korea, Hwaseong, Inc., Technology, James P. Zemotel Lim Nguyen Yusup Jung Hongseok Kim Kyunghwan Song (KAIST), Daejeon, Korea, Republic of (South)); (South)); of Republic Korea, Daejeon, (KAIST), Daejeon, Korea, Republic of (South)); (South)); of Republic Korea, Daejeon, Korea, Republic of (South)); (South)); of Republic Korea, Republic of (South)); (South)); of Republic (South)); of Republic (Korea Advanced Institute of Science and Technology Technology and Science of Institute Advanced (Korea Strategic Command, Offutt Air Force Base, NE, USA); USA); NE, Base, Force Air Offutt Command, Strategic Advanced Institute of Science and Technology (KAIST), (KAIST), Technology and Science of Institute Advanced Command, Offutt Air Force Base, NE, USA); USA); NE, Base, Force Air Offutt Command, Nebraska-Lincoln, Omaha, NE, USA); USA); NE, Omaha, Nebraska-Lincoln, Inc., Hwaseong, Korea, Republic of (South)); (South)); of Republic Korea, Hwaseong, Inc., Institute of Science and Technology (KAIST), Daejeon, Daejeon, (KAIST), Technology and Science of Institute of Science and Technology (KAIST), Daejeon, Korea, Korea, Daejeon, (KAIST), Technology and Science of Korea, Daejeon, (KAIST), Technology and Science of Force Base, NE, USA); USA); NE, Base, Force Dahlgren, VA, USA); USA); VA, Dahlgren, Aaron Krause (US Strategic Command, Offutt Air Force Force Air Offutt Command, Strategic (US Joungho Kim Yeonje Cho (CNI Technology, Inc., Hwaseong, Korea, Korea, Hwaseong, Inc., Technology, (CNI (University of Nebraska-Lincoln, Omaha, NE, NE, Omaha, Nebraska-Lincoln, of (University (Korea Advanced Institute of Science Science of Institute Advanced (Korea (Korea Advanced Institute of Science Science of Institute Advanced (Korea (US Strategic Command, Offutt Air Air Offutt Command, Strategic (US Christopher Tuan (US Naval Sea Systems Command, Command, Systems Sea Naval (US Bongsuk Kim Subin Kim Holly McNerney (Korea Advanced Institute Institute Advanced (Korea WEDNESDAY, AUGUST 9,2017•10:30AM–12:00PM (Korea Advanced Institute Institute Advanced (Korea Seungtaek Jeong (Korea Advanced Advanced (Korea (CNI Technology, Technology, (CNI Joel D. Blasey Dong-Hyun Kim (University of of (University (US Strategic Strategic (US MARYLAND BALLROOM FOYER Ferdinand Jin Heo (Korea (Korea (US (US (CNI (CNI

Reference ClockinPCB Compact Delay Matching Solutionfor ABSTRACT REVIEWED Distortions Transmission Passive Intermodulation Analysis andMeasurementof Outputs of AC/DC Power Converters Frequency Common ModeVoltages atthe Investigation andReductionof Line ABSTRACT REVIEWED Loop Antenna System usingDouble-GappedShielded Sub-30 MHzRadiationEmissionTest Digital Comb-Generator for Validating USA); USA); USA); USA); Science and Technology (AIST), Tsukuba, Japan) Japan) Tsukuba, (AIST), Technology and Science USA); USA); Beijing, China); China); Beijing, Beomtaek Lee Hanqiao Zhang Feng Gao Satoru Kurokawa Masanori Ishii Michitaka Ameya Honggang Sheng Shuo Wang Yiming Li (Copyright Protection Centre of China, Beijing, China) Beijing, China, of Centre Protection (Copyright Mountain View, CA, USA) CA, View, Mountain View, CA, USA); USA); CA, View, Institute Co., Ltd, Beijing, China); China); Beijing, Ltd, Co., Institute and Technology (AIST), Tsukuba, Japan; Japan; Tsukuba, (AIST), Japan; Technology Tsukuba, and (AIST), Technology and Science Kai Xiao Gong Ouyang Srikanth Lakshmikanthan (China Mobile Group Design Institute Co., Ltd, Ltd, Co., Institute Design Group Mobile (China (University of Florida, Gainesville, FL, USA); USA); FL, Gainesville, Florida, of (University (University of Florida, Gainesville, FL, USA); USA); FL, Gainesville, Florida, of (University (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (National Institute of Advanced Science Science Advanced of Institute (National (Intel Corporation, Hillsboro, OR, USA) OR, Hillsboro, Corporation, (Intel FINAL PROGRAM Yi Gao Choon Ping Chng (Intel Corporation, Hillsboro, OR, OR, Hillsboro, Corporation, (Intel (National Institute of Advanced Advanced of Institute (National (National Institute of Advanced Advanced of Institute (National (Google, Inc., Mountain View, CA, CA, View, Mountain Inc., (Google, (Intel Corporation, Hillsboro, OR, OR, Hillsboro, Corporation, (Intel (China Mobile Group Design Design Group Mobile (China I Runhong Shan WWW.EMC2017.EMCSS.ORG (Google, Inc., Mountain Mountain Inc., (Google, (Google, Inc., Inc., (Google,

I

53 TECHNICAL PROGRAM - WEDNESDAY, AUGUST 9 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

WORKSHOP & 1:30 PM – 5:30 PM WORKSHOP & 1:30 PM – 5:30 PM TUTORIAL MARYLAND A TUTORIAL MARYLAND 1 & 2

WED-PM-1 LTE impacts to GPS receivers. Maintaining WED-PM-2 GPS receiver requirements in expanded EMC FOR IoT LTE wireless networks represents an urgent SIGNAL INTEGRITY AND POWER INTEGRITY challenge. Attendees will learn about the FUNDAMENTALS FOR COMPUTING AND Co-chairs: test methodology and key performance COMMUNICATION SYSTEMS Janet O’Neil, ETS-Lindgren, Cedar Park, indicators measured in the testing. Sponsored by TC10 Texas, USA Jari Vikstedt, ETS-Lindgren, Cedar Park, We will also share recent research into Texas, USA Intentional Electromagnetic Interference Co-chairs: Intel Corporation, Dupont, WA, PLANNED SPEAKERS (IEMI), a topic increasingly becomes a reality. Chunfei Ye, IoT affects many aspects of managing USA AND TOPICS In December 2016 the US Congress of the Huawei, Chandler, AZ, USA and measuring wireless resources. The Jiangqi He, Critical Infrastructure Protection Act (CIPA), Fundamentals of Signal Integrity – For Computing proliferation of wireless technologies addressing the vulnerability of wireless Signal integrity (SI) and power integrity and Communication into every corner of our lives, starting communication to IEMI as a priority. Chunfei Ye, (Intel Corporation, Dupont, WA, USA) with traditional cellular and wireless LAN (PI) becomes more and more important as critical factors for the design of Fundamentals of Power Integrity technologies and leading to the evolution of ANSI C63 created Subcommittee (Google, Inc., Mountain View, CA, USA) today’s computing and communication Zhiping Yang, connected cars and the “Internet of Things” 4 “Wireless and ISM Equipment systems. This tutorial will introduce some all require the use of one common asset: Measurements” last year to address several important concepts, principles and recent BANDWIDTH. The availability of spectrum, rapidly emerging wireless technologies developments in SI and PI area, including especially at frequencies compatible with to address existing standards and add modeling, simulation, and measurement most of today’s applications, is severely new draft standards related to Lighting to address SI and PI design challenges and limited. While regulatory agencies such as products, Wireless Power Transfer and ISM possible enablers that may improve SI and the FCC continue to repurpose and open Equipment. Attendees will learn what’s up spectrum for wireless communication, PI performance. WEDNESDAY, AUGUST 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL driving the need for these standards and 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL it’s still not enough to address our insatiable expected requirements to meet them. hunger for bandwidth. Other technologies continue to evolve to make better utilization 2018 IEEE Symposium on Electromagnetic Compatibility, of the available bandwidth, including PLANNED SPEAKERS MIMO, beam forming and spectrum Signal and Power Integrity sharing and reuse. The added complexity AND TOPICS of these “smart” wireless systems affects The IEEE IoT Initiative and EMC MARK YOUR CALENDAR the complexity testing these technologies. Mike Violette, (Washington Laboratories and American Certification Body, Mclean, VA, USA);Adam Drobot Hence, laboratory test methodologies must (Open TechWorks, Wayne, PA, USA) July 30 - August 3, 2018 advance to assess over-the-air performance of these devices in a practical way. Shared Spectrum Metrology: Measuring the Impacts The Long Beach Convention & Entertainment Center of Adjacent-band LTE Waveforms on GPS Receivers William Young, (National Institute of Standards and Host Hotel - Hyatt Regency Long Beach Spectrum sharing offers a potential leap Technology (NIST), Boulder, CO, USA) forward on how the frequency spectrum is accessed and utilized. However, as the Vulnerability of Wireless Systems to (Intentional) EMI Frank Leferink, (Thales Nederland B.V., Hengelo, density of users in the spectrum increases, Netherlands); Stefan van De Beek, (University of Twente, the potential for interference also increases. Enschede, Netherlands) Attendees will learn about recent testing Test Challenges of Smart Antenna Systems done at National Institute of Standards Jari Vikstedt, (ETS-Lindgren, Cedar Park, TX, USA) and Technology in support of the National Advanced Spectrum and Communications The FCC and the Internet of Things Ira Keltz, (Federal Communications Commission (FCC), Test Network (NASCTN) project focused on Washington, DC, USA)

54 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 55 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

WORKSHOP & 1:30 PM – 5:30 PM WORKSHOP & 1:30 PM – 5:30 PM TUTORIAL MARYLAND C TUTORIAL MARYLAND D

WED-PM-3 WED-PM-4 MEDICAL EMC BASIC EMC MEASUREMENTS Sponsored by TC2 Chair: presented. This edition is a recent revision Darryl Ray, Darryl Ray EMC Consulting, and is having a significant impact on the Chair: Carlsbad, CA, USA medical device industry. Compliance with Don Heirman, Don HEIRMAN Consultants, PLANNED SPEAKERS this standard will become mandatory at Lincroft, New Jersey, USA AND TOPICS EMC/EMI compliance of medical devices the end of 2018. Actual lab experience is regulated differently from that of other with this edition will be presented. Basic EMC immunity measurements Basic Measurement Sites, Methods, and Associated types of equipment, for reasons of patient Errors methods cover a wide range of (Don HEIRMAN Consultants, and operator safety. The medical device In addition, the new IEC/TR 60601-4-2:2016 Don Heirman, electromagnetic phenomena. This Lincroft, NJ, USA) industry must work to a complex set of will be introduced, pertaining to the EMC of medical devices. For many medical devices, tutorial will be an introduction to product standards, regulations and requirements. immunity testing to comply with either Immunity to Continuous RF Disturbances: IEC Test For example, medical devices are required obtaining regulatory approval can be a very Methods involved process. An FDA representative corporate or regulatory requirements with John Maas, (IBM Corporation, Rochester, MN, USA) to have very low leakage current, which a focus on a sampling of those standards precludes some of the usual EMI mitigation will share the Agency’s thoughts and experiences on this issue. Experience in the that replicate these phenomena and are IEC View of Transient Immunity Testing design techniques. Also, the immunity Thomas E. Braxton, (Shure Incorporated, Niles, IL, USA) field will also be presented. used for basic measurements. Included requirements are very stringent. Testing will be a description of the immunity requirements are in many cases unique. High Power Electromagnetics Test Facilities and test sites, those becoming popular, and Measurement Methods their validation requirements and an William A. Radasky (Metatech Corporation, The applicable IEC and EN standards Goleta, CA, USA) now have requirements to manage safety PLANNED SPEAKERS overview of test setups. The reference for risks that could foreseeably be caused by this will be the latest activity in national WEDNESDAY, AUGUST 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL AND TOPICS 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL errors, malfunctions and faults that could and international standards related to continuous and transient (low power and occur as a result of EM disturbances (i.e. Basics of Medical EMC electromagnetic interference, EMI). Medical Darryl Ray, (Darryl Ray EMC Consulting, LLC., Carlsbad, high power) EMC immunity measurements CA, USA) devices are required to comply with risk and application. Where appropriate, attendees will be asked questions as to management requirements that are not Lab Experiences with IEC 60601-1-2 4th Edition widely understood. Similar requirements Harald Buchwald, (CSA Group, Strasskirchen, Germany) what they learned and have an opportunity are already common for safety-related and for extended questioning of the speakers’ Risk Management of Electromagnetic Disturbances subjects at the end of the session. safety-critical electronic equipment of all Keith Armstrong, (Cherry Clough Consultants, Ltd., types, under IEC 61000-1-2:2016. Stafford, United Kingdom)

The special issues associated with IEC TR 60601-4-2 1st Edition Overview Darryl Ray, (Darryl Ray EMC Consulting, LLC., pacemakers and neurostimulators will be Carlsbad, CA, USA) presented. EMC Aspects for Active Implantable Medical The wireless presentation discusses some Devices important trends in medical wireless Curt Sponberg, (Medtronic, Minneapolis, MN, USA); (Boston Scientific, Minneapolis, MN, USA) technologies as well as key strategies that Ron Reitan product developers can use to successfully Electrical Equipment in Medical Practice address the EMC regulatory requirements Steve Hayes (Element Materials Technology, Hillsboro, OR, USA); Greg Kiemel (Element Materials Technology, for wireless medical devices. Hillsboro, OR, USA)

A review of the medical EMI safety An FDA Perspective on EMC of Medical Devices standard IEC 60601-1-2:2014 will be Jeff Silberberg, (FDA Center for Devices and Radiological Health, Silver Spring, MD, USA) 56 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 57 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

WORKSHOP & 1:30 PM – 5:30 PM SPECIAL SESSION 1:30 PM–5:30 PM TUTORIAL MARYLAND B MARYLAND 5 & 6

WED-PM-5 WED-PM-7 EMC FOR THE NUCLEAR INDUSTRY: Addressing the Existing RF DESENSE AND CO-EXISTENCE Requirements and a Look at the New Guidance Being Developed Sponsored by TC12

Chair: and wireless devices, a complete set of Chair: 2:00 PM – 2:30 PM Chad Kiger, AMS Corporation, EMC qualification criteria must be satisfied. Zhiping Yang, Google Inc., Mountain View, Impact of Broadband and Out-of-Band Knoxville, Tennessee, USA CA, USA Radio Frequency Interference (RFI) Noise Co-chair: on WiFi Performance This tutorial will provide an overview Ying Cao, Missouri University of Science and Jaejin Lee (Intel Corporation, Hillsboro, OR, USA); of the issues facing plant operators Technology, Rolla, MO, USA Hao-han Hsu (Intel Corporation, Hillsboro, OR, USA); Pujitha Davuluri (Intel Corporation, Hillsboro, OR, USA); and test laboratories as it relates to (Intel Corporation, Penang, Malaysia); RF Desense is the degradation Yingern Ho ensuring electromagnetic compatibility Abstract: Joseph Chen (Intel Corporation, Hillsboro, OR, USA) in RF receiver sensitivity due to noise (EMC) of instrumentation, control, and sources, typically which are generated by 2:30 PM – 3:00 PM power systems in nuclear power plants. PLANNED SPEAKERS the same device which the victim radio is Effectively Resolving De-Sense Issues in Nuclear plants, originally commissioned in. RF co-existence is the ability of one RF Practical Wireless System Design: for 40 years, are being maintained on- AND TOPICS system to perform a task in a given shared An EMC Engineer’s Approach line beyond that time by upgrading General Overview of the EMC Guidance for the environment in which other RF systems Henry Zeng (NVIDIA Semiconductor Co., Ltd., equipment, expanding and improving Nuclear Industry Shenzhen, China); Elliott Cao (NVIDIA Semiconductor have an ability to perform their tasks and safety systems, and making improvements Chad Kiger (AMS Corporation, Knoxville, TN, USA) Co., Ltd., Shenzhen, China); Charlie Shu (NVIDIA may or may not be using the same set of Corporation, Santa Clara, CA, USA); Bruce Luo (NVIDIA in plant operations. At the core of the Guidelines for Electromagnetic Compatibility rules. Semiconductor Co., Ltd., Shenzhen, China) upgrade and modernization efforts is Testing of Power Plant Equipment: Revision 4 to the critical emphasis on assuring EMC in EPRI TR-102323 3:30 PM – 4:00 PM

WEDNESDAY, AUGUST 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL With the recent proliferation 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL these installations. Safety-critical systems Stephen Lopez (Electric Power Research Institute Description: BEST EMC PAPER AWARD FINALIST (EPRI), Charlotte, NC, USA) of smart phones, consumer electronics, must be sufficiently robust to withstand Studying the Effects of Location Offset on and IoT (Internet of Things) devices, wireless potential threats from radiated and the Evaluation of MIMO Performance based Technical Basis for Revising Regulatory Guide RF communication is becoming more and conducted interference. Upgrades must 1.180: Guidelines for Evaluating EMI/RFI in Safety on the Radiated Two-Stage (RTS) Method more popular and important. Wireless (Missouri University of Science and be shown to have no impact on the safety- Related I&C Systems Yansheng Wang David Dawood (NRC, Rockwood, MD, USA); Richard RF communication quality is not only Technology, Rolla, MO, USA); Songping Wu (Google, related equipment already installed, nor Inc., Mountain View, CA, USA); (Google, Wood (University of Tennessee, Knoxville, TN, USA); important for customer experience and Zhiping Yang have issues that would cause a loss of Inc., Mountain View, CA, USA); Penghui Shen (General Plant Perspective for the Digital I&C satisfaction, but also critical for personal Test Systems, Inc., Shenzhen, China); Jun Fan (Missouri generation. University of Science and Technology, Rolla, MO, USA) Implementation Process with Respect to EMC and public safety. RF desense and co- Michael A. Hoffman (Exelon Generation, Delta, PA, USA) existence issues have been happenings for Expanded deployment of wireless systems 4:00 PM – 4:30 PM many years, but they are getting more and for both plant communications and International Perspective for Developing a Nuclear The Advantages of the RTS Method in more challenging and difficult with more condition monitoring, add additional EMC Program MIMO OTA Measurements Hrvoje Grganić (Krško NPP, Krsko, Slovenia) RF signals (Cellular, Wifi, bluetooth, GPS, concern. It must be demonstrated that Penghui Shen (Hunan University, Changsha, China); etc.) and RF bands. Yihong Qi (DBJ Technologies, Zhuhai, China); Jun Fan these wireless devices will not have Grounding and Lightning (Missouri University of Science and Technology, Rolla, a negative impact on existing plant Richard Brehm (Tennessee Valley Authority (TVA), 1:30 PM – 2:00 PM MO, USA); Yansheng Wang (Missouri University of instrumentation and control systems. Chattanooga, TN, USA) Science and Technology, Rolla, MO, USA) Design-by-Desense: A Multi-Fidelity As plants become more dependent on EMC Nuclear Equipment Qualification Approach to Interference-Free Design for 4:30 PM – 5:00 PM wireless communications, a new set of Steven G. Ferguson (Washington Laboratories, Ltd., Electronic Devices Modeling of RF Desense for Mobile Gaithersburg, MD, USA) issues dealing with radiated interference, Jason Bommer (ANSYS, Inc., Canonsburg, PA, USA); Electronics Baolong Li (ANSYS, Inc., Canonsburg, PA, USA); channel capacity, and bandwidth Darryl Kostka (CST of America, San Mateo, CA, USA); EMC Standard Developed by IEEE NPEC- Fred German (ANSYS, Inc., Canonsburg, PA, USA) become of greater concern. As part of the Subcommittee 2-Qualification Andreas Barchanski (CST AG, Darmstadt, Germany); commissioning of upgraded equipment Suresh Channarasappa (Westinghouse Electric Ilari Hänninen (CST AG, Darmstadt, Germany); Marcel Company, New Stanton, PA, USA) Plonka (CST AG, Darmstadt, Germany); Christian Rieckmann (CST AG, Darmstadt, Germany)

58 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 59 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

HARDWARE EXPERIMENTS & 2:00 PM–4:00 PM HARDWARE EXPERIMENTS & 2:00 PM–4:00 PM HARDWARE EXPERIMENTS & 2:00 PM–4:00 PM HARDWARE EXPERIMENTS & 2:00 PM–4:00 PM SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL

FREQUENCY SPECTRA MEASURING SHIELDING DISTINGUISHING MODELING AND OF TRANSIENTS EFFECTIVENESS AT THE COMMON MODE FROM SIMULATION OF CABLE IC LEVEL DIFFERENTIAL MODE HARNESS RADIATION John McCloskey and NASA/Goddard CONDUCTED EMISSIONS AND SUSCEPTIBILITY Jen Dimov, Stephan Pfennig, Space Flight Center, Langer EMV-Technik GmbH, Bannewitz, FOR AUTOMOTIVE AND Greenbelt, MD, USA Jerry Meyerhoff, JDM Labs LLC, Buffalo Grove, Germany IL, USA AIRCRAFT STRUCTURES Radiated emissions measurements as Langer EMV-Technik has developed a Dr. Marius H. Vogel, Altair Engineering, Inc., specified by MIL-STD- 461 are performed The method can separate differential new method allowing for the separate Hampton, VA, USA in the frequency domain, which is best mode (DM) and common mode (CM) measurement of both the electric and effects, in both time & frequency domain. suited to continuous wave (CW) types In EMC/EMI applications, electrical cables magnetic field when measuring immunity Power supply samples with improved CM of signals. However, many platforms and cable bundles are often the main and shielding effectiveness at the IC level. and DM filtering will be compared. DIY and implement signals that are single event source of concern. Due to their lengths, The approach uses the Langer ground very low cost instruments are used for Pre- pulses or transients. Such signals can they can be effective radiators or receivers plane GND25, a spacer, and the field compliance, but with care they do correlate potentially generate momentary radiated of radiation. This simulation demonstration sources P1401 and P1501. The test board well with formal laboratory methods. emissions that can cause interference in with the mounted IC is placed into the will teach how to model and simulate the system, but they may be missed with dedicated opening of the ground plane relevant scenarios, and will provide a traditional measurement techniques. This with the IC facing upwards. The electric- refresher on transforming frequency- demonstration provides measurement field source P1401 or magnetic-field domain data to the time domain and vice and analysis techniques that effectively source P1501 is then placed above the versa. A few scenarios will be discussed, e.g. evaluate the potential emissions from such IC using a ring-shaped spacer, which lightning, high-frequency radiated fields, signals in order to evaluate their potential and automotive EMC. In the latter case, a

WEDNESDAY, AUGUST 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL defines the height of the source above WEDNESDAY, AUGUST 9 AUGUST - WEDNESDAY, PROGRAM TECHNICAL impacts to system performance. the IC. The P1401 generates a dominant recipe will be provided to determine the electric field and the P1501 generates a differential-to- common-mode conversion dominant magnetic field. This allows the that takes place on the PCB, and, for a IC immunity to electric and magnetic digital signal, to determine the resulting fields to be measured separately. This radiation from a twisted-wire pair and advantage was then used to investigate the compare it with government regulations. shielding effectiveness of various shielding In addition, we will discuss PCB modeling configurations applied to integrated with the Partial Element Equivalent Circuit circuits. method for EMC and Signal Integrity applications.

In addition, simulation techniques for shielding enclosures with gaskets will be discussed. Due to aspect ratios of gaskets, such simulations can be challenging.

60 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 61 62 TECHNICAL PROGRAM - THURSDAY, AUGUST 10 I FINALPROGRAM Magnetic Near-Field Development of a3D Scanning System for 9:30 AM–10:00 Fully AnechoicRooms Deconvolution Filter for Site Validation of using TimeDomainGatingand Free Space Antenna Factor Computation 9:00 AM–9:30 Reverberation Chambers Measurement of theQualityFactor of Required Bandwidthfor Time-Domain BEST EMCPAPER AWARD FINALIST 8:30 AM–9:00 Co-chairs: Sponsored by TC2 TIME DOMAIN/NEARFIELDAPPLICATIONS TH-AM-1 THURSDAY, AUGUST 10,2017 TECHNICAL SESSION France); France); N. Sivaraman K. Jomaa Kazuo Shimada Zhong Chen Anoop Adhyapak Neda Nourshamsi Park, Cedar ETS-Lindgren, Chen, Zhong (Oklahoma State University, Stillwater, OK, USA) USA) OK, Stillwater, University, State (Oklahoma University, Stillwater, OK, USA); USA); OK, Stillwater, University, TX, USA TX, Lebanon); Lebanon); Lebanon); Grenoble, France); France); Grenoble, Lebanon) Stillwater, OK, USA); USA); OK, Stillwater, Hewlett Packard, Vancouver, Vancouver, Packard, Hewlett Arnett, Dave WA, USA WA, F. Ndagijimana (Université Grenoble Alpes, Grenoble, France); France); Grenoble, Alpes, Grenoble (Université J. Jomaah M. Fadlallah I WWW.EMC2017.EMCSS.ORG (ETS-Lindgren, Cedar Park, TX, USA); USA); TX, Park, Cedar (ETS-Lindgren, (Université Grenoble Alpes, Grenoble, Grenoble, Alpes, Grenoble (Université (ETS-Lindgren, Tokyo, Japan) Japan) Tokyo, (ETS-Lindgren, (ETS-Lindgren, Cedar Park, TX, USA); USA); TX, Park, Cedar (ETS-Lindgren, (Oklahoma State University, University, State (Oklahoma H. Ayad James C.West (Lebanese University, Beirut, Beirut, University, (Lebanese (Lebanese University, Beirut, Beirut, University, (Lebanese (Université Grenoble Alpes, Alpes, Grenoble (Université (Lebanese University, Beirut, Beirut, University, (Lebanese 8:30 AM–12:00PM MARYLAND A Charles F. Bunting 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY (Oklahoma State State (Oklahoma

TECHNICAL PROGRAM ABSTRACT REVIEWED The Futureof Immunity Testing 11:30 AM–12:00PM GHz 1 above Uncertainties Measurement Site Contributions for Radiated Emission 11:00 AM–11:30 Near-Field MeasurementinEMC A Low FrequencyElectric FieldProbefor BEST EMCPAPER AWARD FINALIST 10:30 AM–11:00 Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Flynn LawrenceFlynn Zubiao Xiong Zhong Chen Guanghua Li MO, USA); USA); MO, (Missouri University of Science and Technology, Rolla, Rolla, Technology, and Science of University (Missouri Jose, CA, USA) CA, Jose, Souderton, PA, USA) PA, Souderton, Jin Min (ETS-Lindgren, Cedar Park, TX, USA); USA); TX, Park, Cedar (ETS-Lindgren, (Missouri University of Science and and Science of University (Missouri (ETS-Lindgren, Cedar Park, TX, USA) TX, Park, Cedar (ETS-Lindgren, (AR RF/Microwave Instrumentation, Instrumentation, RF/Microwave (AR (Amber Precision Instruments, San San Instruments, Precision (Amber David Pommerenke

2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM Completely De-Embeded? Fixture Crosstalkwhenitisnot for VNAMeasurement:How to Quantify Fixture CrosstalkAssessmentStructure 9:30 AM–10:00 Loss MeasurementAccuracy Physics-Based Fittingto Improve PCB 9:00 AM–9:30 De-Embedding Algorithms Development of aPCBKitfor S-Parameter 8:30 AM–9:00 Co-chair: Chair: Sponsored by TC10 MEASUREMENT TECHNIQUE PASSIVE COMPONENTS MODELINGAND TH-AM-2 TECHNICAL SESSION Benjamin L.Garcia Michael Brownell Xiaoning Ye Se-Jung Moon Marko Balogh Xiaoning Ye Jose Moreira Heidi Barnes Tao Wang, Jim Nadolny, PA, USA PA, Technology, Rolla, MO, USA MO, Rolla, Technology, CA, USA) CA, Mexico); USA); USA); Eric Bogatin Hansel Dsilva (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Advantest, Boeblingen, Germany) Boeblingen, (Advantest, (Keysight Technologies, Santa Rosa, CA, CA, Rosa, Santa Technologies, (Keysight Missouri University of Science and and Science of University Missouri (Intel Corporation, Hillsboro, OR, USA) OR, Hillsboro, Corporation, (Intel (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel Samtec, Mechanicsburg, Mechanicsburg, Samtec, (Intel Corporation, Santa Clara, USA); USA); Clara, Santa Corporation, (Intel (Teledyne LeCroy, Boulder, CO, USA); USA); CO, Boulder, LeCroy, (Teledyne (Intel Corporation, Guadalajara, Guadalajara, Corporation, (Intel (Intel Corporation, Santa Clara, Clara, Santa Corporation, (Intel 8:30 AM–12:00PM MARYLAND A USA); USA); Results in2xThru De-Embedding Error BoundsAnalysis of De-Embedded BEST EMCPAPER AWARD FINALIST 11:30 AM–12:00PM Parallel Plates High-Speed Differential Viabetween Two A Survey onModelingStrategies for 11:00 AM–11:30 Yasin Damgaci ABSTRACT REVIEWED Properties usingaT-Resonator Only XMOT: eXtract andMOnitor PCBMaterial 10:30 AM–11:00 Fremont, CA, USA) USA) CA, Fremont, CA, USA); USA); CA, Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, Rolla, MO, USA); USA); MO, Rolla, Xiaoning Ye Chunyu Wu Jun Xu MO, USA); USA); MO, USA); USA); (Missouri University of Science and Technology, Rolla, Rolla, Technology, and Science of University (Missouri University of Science and Technology, Rolla, MO, MO, Rolla, Technology, and Science of University University of Science and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science of University University of Science and Technology, Rolla, MO, USA) MO, Rolla, Technology, and Science of University and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science CA, USA); USA); CA, and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and CA, USA); USA); CA, Yongjin Choi Tsiklauri Mikheil Christopher Cheng (Missouri University of Science and Technology, Technology, and Science of University (Missouri Shuai Jin Bidyut Sen Chunchun Sui (Hewlett-Packard Enterprise, Fremont, CA, CA, Fremont, Enterprise, (Hewlett-Packard (Missouri University of Science and and Science of University (Missouri (Intel Corporation, Hillsboro, OR, USA) OR, Hillsboro, Corporation, (Intel FINAL PROGRAM (Hewlett-Packard Enterprise, Fremont, Fremont, Enterprise, (Hewlett-Packard Yansheng Wang (Missouri University of Science Science of University (Missouri (Cisco Systems, Inc., San Jose, Jose, San Inc., Systems, (Cisco (Missouri University of Science Science of University (Missouri

(Cisco Systems, Inc., San Jose, Jose, San Inc., Systems, (Cisco (Hewlett-Packard Enterprise, Enterprise, (Hewlett-Packard Bichen Chen I WWW.EMC2017.EMCSS.ORG (Missouri University of of University (Missouri Jun Fan Jun Fan Ying Zhang (Missouri (Missouri (Missouri (Missouri (Missouri (Missouri

I

63 TECHNICAL PROGRAM - THURSDAY, AUGUST 10 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

8:30 AM–12:00 PM 8:30 AM–12:00 PM TECHNICAL SESSION MARYLAND C TECHNICAL SESSION MARYLAND D

TH-AM-3 TH-AM-4 EMC FOR EMERGING WIRELESS TECHNOLOGIES, PART 2 COMPUTATIONAL ELECTROMAGNETICS (III) Sponsored by TC12 Sponsored by TC9

Chair: 10:30 AM – 11:00 AM Chair: 9:30 AM – 10:00 AM Harry Skinner, Intel Corporation, Hillsboro, Comparison Study of RF-Induced Heating Yunhui Chu, Intel Corporation, Hillsboro, Comparison of in-Vivo and in-Vitro MRI RF OR, USA in Leg Phantom with Circular External OR, USA Heating for Orthopedic Implant at 3 Tesla Co-chair: Fixator for TEM and Birdcage Coils at 3 T Co-chair: ABSTRACT REVIEWED Ahalya Srikanth, Intel Corporation, Hillsboro, ABSTRACT REVIEWED Zhichao Zhang, Intel Corporation, Ran Guo (University of Houston, Houston, TX, USA); OR, USA Rui Yang (University of Houston, Houston, TX, USA); Chandler, AZ, USA Matthew Chen (University of Houston, Houston, TX, Jianfeng Zheng (University of Houston, Houston, TX, USA); Jianfeng Zheng (University of Houston, Houston, USA); (University of Houston, Houston, TX, USA); TX, USA); Rui Yang (University of Houston, Houston, TX, 8:30 AM – 9:00 AM Ji Chen 8:30 AM – 9:00 AM Wolfgang Kainz (FDA, Silver Spring, MD, USA) USA); Ji Chen (University of Houston, Houston, TX, USA); Method of Controlling the Low Speed The Impact of High-Speed De-Emphasis (FDA, Silver Spring, MD, USA) Single-Ended Signal Interference to the RF 11:00 AM – 11:30 AM and Multi-Stage Passive RC Equalization 10:00 AM – 10:30 AM ABSTRACT REVIEWED BEST EMC PAPER AWARD FINALIST on the Radiated EMI and Signal Integrity Techniques for Improving System- BoonPing Koh (Intel Corporation, Penang, Malaysia); MoM based Current Reconstruction using Performances of a 5Gbs Microstrip in-Package Integration and Electrical Dong-ho Han (Intel Corporation, Hillsboro, OR, USA) Near-Field Scanning Channel ABSTRACT REVIEWED Qiaolei Huang (Missouri University of Science and David Norte (RICOH USA, Inc., Boulder, CO, USA) 9:00 AM – 9:30 AM Technology, Rolla, MO, USA); Liang Li (Missouri University Shaowu Huang (Xperi Corporation, San Jose, CA, USA); Javier DeLaCruz (Xperi Corporation, San Jose, CA, USA) Optimal Decoupling Strategy to Suppress of Science and Technology, Rolla, MO, USA); Xin Yan 9:00 AM – 9:30 AM Radio Frequency Interference (RFI) (Missouri University of Science and Technology, Rolla, MO, USA); Bumhee Bae (Samsung Electronics Co. Ltd., The Application of the NIPC Method and from Double Data-Rate (DDR) Memory Suwon, Korea, Republic of (South)); Harkbyeong Park the FSV Method on the Validation of EM Power-Plane Radiation (Samsung Electronics Co. Ltd., Suwon, Korea, Republic THURSDAY, AUGUST 10 AUGUST - THURSDAY, PROGRAM TECHNICAL of (South)); Chulsoon Hwang (Missouri University of Simulation under HIRF Environment 10 AUGUST - THURSDAY, PROGRAM TECHNICAL (Intel Corporation, Penang, Malaysia); Ying-Ern Ho Science and Technology, Rolla, MO, USA); Jun Fan Yue-Qian Wu (CAEP Software Center for High Hao-Han Hsu (Intel Corporation, Hillsboro, OR, USA); (Missouri University of Science and Technology, Rolla, Performance Numerical Simulation / Institute of Jaejin Lee (Intel Corporation, Hillsboro, OR, USA) MO, USA) Applied Physics and Computational Mathematics, Beijing, China); Hai-Jing Zhou (Institute of Applied 9:30 AM – 10:00 AM Physics and Computational Mathematics, Beijing, Wireless MIMO base Station Near and Far China); Xian-Feng Bao (CAEP Software Center for High Performance Numerical Simulation / Institute Field Measurement Challenges of Applied Physics and Computational Mathematics, Dheena Moongilan (Nokia Bell Labs, Murray Hill, Beijing, China); Han-yu Li (Institute of Applied Physics NJ, USA) and Computational Mathematics, Beijing, China); Wen-Yan Yin (Zhejiang University, Hangzhou, China)

64 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 65 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

8:30 AM–12:00 PM 8:30 AM–12:00 PM TECHNICAL SESSION MARYLAND B SPECIAL SESSION MARYLAND 3 & 4

TH-AM-5 TH-AM-6 SIPI POWER INTEGRITY 2 NEW DEVELOPMENTS IN POWER QUALITY AND Sponsored by TC10 LOW FREQUENCY EMC Sponsored by TC7 Chair: 10:30 AM – 11:00 AM Chunfei Ye, Intel Corporation, Dupont, WA, Mesh Conforming Electro-Thermal Chair: 8:30 AM – 9:00 AM USA Co-Analysis with Application to PCB Flavia Grassi, Politecnico di Milano, Milan, BEST EMC PAPER AWARD FINALIST Power Integrity Italy Harmonic Cancellation in a Novel 8:30 AM – 9:00 AM Jeannick Sercu (Keysight Technologies, Gent, Belgium); Multilevel Converter Topology for the Modeling Capacitor Derating in Power Heidi Barnes (Keysight Technologies, Santa Rosa, Co-chair: Future Smart Grid Integrity Simulation CA, USA) Dave Thomas, University of Nottingham, Nottingham, United Kingdom Niek Moonen (University of Twente, Enschede, (Google, Inc., Mountain View, CA, USA); Tianjian Lu 11:00 AM – 11:30 AM Netherlands); Mladen Gagiç (Technical University of (Google, Inc., Mountain View, CA, USA); Ken Wu Delft, Delft, Netherlands); Frits Buesink (University (Google, Inc., Mountain View, CA, Modeling of Power Supply Induced Jitter Zhiping Yang Description: This special session will of Twente, Enschede, Netherlands); Jan A. Ferreira USA); (University of Illinois at Urbana Jian-Ming Jin (PSIJ) Transfer Function at Inverter (Technical University of Delft, Delft, Netherlands); Frank Champaign, Urbana, IL, USA) focus on new developments in modeling, Heegon Kim (Missouri University of Science and measurement, and mitigation of Leferink (Thales Nederland B.V., Hengelo, Netherlands) Technology, Rolla, MO, USA); Jun Fan (Missouri 9:00 AM – 9:30 AM University of Science and Technology, Rolla, MO, USA); conducted emissions and power quality 9:00 AM – 9:30 AM Fast Decap Assignment Algorithm for Chulsoon Hwang (Missouri University of Science and issues in emerging fields of research, such Conducted Interference on Smart Meters Technology, Rolla, MO, USA) Optimization of Power Distribution as power electronics converters for electric Cees Keyer (University of Twente / University of Applied Networks 11:30 AM – 12:00 PM vehicles, renewable energy applications, Sciences, Amsterdam, Netherlands); Frank Leferink (University of Twente / Thales Nederland B.V., Hengelo, Kyoungchoul Koo (Missouri University of Science Design and Analysis of Receiver Channels as well as smart power systems and Netherlands) and Technology, Rolla, MO, USA); Gerardo Romo L. meters. Contributions on new advances (Qualcomm Technology, Inc., San Diego, CA, USA); Tao of Glass Interposer for Dual Band Wi-Fi

THURSDAY, AUGUST 10 AUGUST - THURSDAY, PROGRAM TECHNICAL Wang (Qualcomm Technology, Inc., San Diego, CA, Front End Module (FEM) in the standardization process will also be 9:30 AM – 10:00 AM 10 AUGUST - THURSDAY, PROGRAM TECHNICAL USA); Tim Michalka (Qualcomm Technologies, Inc., San (Korea Advanced Institute of Science presented. Design of a Wide Bandwidth Active Filter Diego, CA, USA); James Drewniak (Missouri University of Gapyeol Park Science and Technology, Rolla, MO, USA) and Technology (KAIST), Daejeon, Korea, Republic of for Common Mode EMI Suppression in (South)); Youngwoo Kim (Korea Advanced Institute Automotive Systems of Science and Technology (KAIST), Daejeon, Korea, 9:30 AM – 10:00 AM Republic of (South)); Kyungjun Cho (Korea Advanced Alessandro Amaducci (Schaffner Group, Luterbach, On Inductance of Power Islands and its Institute of Science and Technology (KAIST), Daejeon, Switzerland) Impact on Decoupling Behavior in High Korea, Republic of (South)); Joungho Kim (Korea Advanced Institute of Science and Technology 10:30 AM – 11:00 AM Speed (KAIST), Daejeon, Korea, Republic of (South)); Minsuk Conducted Emission of Wireless Power Mosin Mondal (Mentor Graphics (India) Pvt. Ltd., Noida, Kim (Georgia Institute of Technology, Atlanta, GA, India); Bruce Archambeault (IBM Corporation / Missouri USA); Pulugurtha Markondeya Raj (Georgia Institute Transfer Charging System in Electric University of Science and Technology, Rolla, MO, USA) of Technology, Atlanta, GA, USA); Venky Sundaram Shaowu Huang (Xperi Corporation, San Jose, CA, USA); (Georgia Institute of Technology, Atlanta, GA, USA); Javier DeLaCruz (Xperi Corporation, San Jose, CA, USA) Rao Tummala (Georgia Institute of Technology, Atlanta, GA, USA) 11:00 AM – 11:30 AM Study of the Conducted Emissions of an IPT System Composed of an Array of Magnetically Coupled Resonators José Alberto (University of Bologna, Bologna, Italy); Ugo Reggiani (University of Bologna, Bologna, Italy); Leonardo Sandrolini (University of Bologna, Bologna, Italy)

66 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 67 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

8:30 AM–12:00 PM HARDWARE EXPERIMENTS & 9:00 AM–11:00 AM HARDWARE EXPERIMENTS & 9:00 AM–11:00 AM TECHNICAL SESSION MARYLAND 5 & 6 SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL SOFTWARE DEMONSTRATIONS REAR OF EXHIBIT HALL

TH-AM-7 ESD MEASUREMENT CONTROL OF ELECTRIC ESD AND ICS TECHNIQUES WITH AND MAGNETIC RADIATED Sponsored by TC5 OSCILLOSCOPES EMISSIONS AT LOW AND HIGH FREQUENCIES Chair: 9:30 AM – 10:00 AM Mike Hertz, Teledyne LeCroy, MI, USA BEST EMC PAPER AWARD FINALIST Michael McInerney, US Army Corp of Pablo Narvaez and Charles Rhoads, Engineers, Champaign, IL, USA Human Body Impedance Modelling for ESD Example topics included in my Jet Propulsion Laboratory, California Institute of Co-chair: I. Oganezova (EMCoS, Ltd. / Tbilisi State University, Tbilisi, presentation include: Technology, Pasadena, CA, USA Georgia); D. Pommerenke (Missouri University of Science • ESD Pulse Test Requirements and William Radasky, Metatech Corporation, and Technology, Rolla, MO, USA); J. Zhou (Missouri Goleta, CA, USA University of Science and Technology, Rolla, MO, USA); K. Measurement Thresholds The Jet Propulsion Laboratory has Ghosh (Missouri University of Science and Technology, • Sequenced Acquisition for EFT participated in multiple projects whereby 8:30 AM – 9:00 AM Rolla, MO, USA); A. Hosseinbeig (Missouri University of Science and Technology, Rolla, MO, USA); J. Lee (Electrical Fast Transient) Debug implementation of proper electric and Combined Effects of Relative Humidity (Samsung Electronics Co. Ltd., Suwon, Korea, Republic • Surge Testing magnetic field shielding has been a key and Temperature on Air Discharges of of (South)); N. Tsitskishvili (EMCoS, Ltd., Tbilisi, Georgia); • Voltage Testing Below Battery Level component in successful space missions Electrostatic Discharge Generator T. Jobava (EMCoS, Ltd., Tbilisi, Georgia); Z. Sukhiashvili (EMCoS, Ltd., Tbilisi, Georgia); R. Jobava (EMCoS, Ltd. / • Sample Rate and V/div Effect on ESD free of electromagnetic interference. This ABSTRACT REVIEWED Tbilisi State University, Tbilisi, Georgia) Pulse Measurements hardware experiment/demonstration Takeshi Ishida (Noise Laboratory Co., Ltd., Sagamihara- • Level-At-Pulse, Time-To-Value, and presents typical radiated electric and shi, Japan); Hiroaki Okajima (Anritzu Customer Support 10:30 AM – 11:00 AM Co., Ltd., Atsugi, Japan); Kiyoshi Endo (e-OHTAMA, Ltd., BEST EMC PAPER AWARD FINALIST Parameter Limiters magnetic field shielding methods similar Kawasaki, Japan); Masamichi Kinoshita (Olympus to those applied on JPL hardware for Effect of Relative Humidity and Materials • ESD RC Time Constant Measurement Corporation, Hachioji, Japan); Osamu Fujiwara (Noise • Radiated Immunity Testing typical flight programs. Laboratory Co., Ltd., Sagamihara-shi, Japan); Shuichi on Triboelectric Charging of USB Cables Nitta (Noise Laboratory Co., Ltd., Sagamihara-shi, Japan) Hossein Rezaei (Missouri University of Science and Technology, Rolla, MO, USA); Li Guan (Missouri THURSDAY, AUGUST 10 AUGUST - THURSDAY, PROGRAM TECHNICAL 9:00 AM – 9:30 AM University of Science and Technology, Rolla, MO, USA); 10 AUGUST - THURSDAY, PROGRAM TECHNICAL Analysis of Pressure and Temperature Atieh Talebzadeh (Missouri University of Science and Technology, Rolla, MO, USA); Shubhankar Marathe Effect based on ESD New Measurement (Missouri University of Science and Technology, Rolla, System MO, USA); Pengyu Wei (Missouri University of Science ABSTRACT REVIEWED and Technology, Rolla, MO, USA); David Pommerenke (Missouri University of Science and Technology, Rolla, Ruan Fangming (Guizhou Normal University, Guiyang, MO, USA) China); Zhou Kui (Guizhou University, Guiyang, China); Su Ming (Guizhou Normal University, Guiyang, China); 11:00 AM – 11:30 AM Qizheng Ji (Beijing Oriental Institute of Metrology and Test, Beijing, China); Wang Heng (Guizhou BEST EMC PAPER AWARD FINALIST Normal University, Guiyang, 550001, China); Davide Prediction of Trichel Pulse Amplitude Pommerenke (Missouri University of Science and for Smooth Conductors and Stranded Technology, Rolla, MO, USA); Meng Yang (Beijing University of Post and Telecommunications, Beijing, Conductors based on Improved Effective China); Huang Jun (Guizhou Normal University, Guiyang, Ionization Integral China); Zhang Chao (Guizhou University, Guiyang, China) Pengfei Xu (Tsinghua University, Beijing, China); Bo Zhang (Tsinghua University, Beijing, China); Han Yin (State Grid WuHan Power Supply Company, WuHan, China); Shuiming Chen (Tsinghua University, Beijing, China); Jinliang He (Tsinghua University, Beijing, China)

11:30 AM – 12:00 AM Measuring Shielding Effectiveness at the IC Level ABSTRACT REVIEWED Stephan Pfennig (Langer EMV-Technik GmbH, Bannewitz, Germany)

68 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 69 70 TECHNICAL PROGRAM - THURSDAY, AUGUST 10 I FINALPROGRAM the workflow to arealdevice. demonstration willshow theapplication of design process. Aninteractive software significant additional overhead to the can beaccomplished withoutintroducing techniques, designingwith RFIinmind show thatby usingexisting tools and in thedesignflow aspossible. We will coexistence anddesenseissuesasearly identification andmitigation of RF by designengineersto enablethe processes andtools commonly inuse wireless devices. The workflow leverages (RFI) throughoutthedesignprocess of addressing radio frequencyinterference engineering designworkflow for This demonstration willshow an integrated design process aspossible. consider RFIissues asearlyintheproduct the device, introduces anurgentneedto emissions thatcan “desense”receivers on digital signalsthatthemselves produce RF in aconfined environment, richwith simultaneous operation. This “co-existence” of continuous anduninterrupted smallspacevery withtheexpectation sources andsensors co-located ina multiple RFtransceivers, digitaldata commonplace for devices to include modern commercial electronics.Itis seeing ever increasingcomplexity in In ourmodernwirelessworld, we are Champaign, Inc., ANSYS, German, Fred Dr. DEVICES DESIGN OFELECTRONIC INTERFERENCE-FREE WORKFLOW FOR A SIMULATION IL, USA IL, SOFTWARE DEMONSTRATIONS HARDWARE EXPERIMENTS& I WWW.EMC2017.EMCSS.ORG REAR OFEXHIBITHALL 9:00 AM–11:00AM 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM questions! is too simpleortoo hard!Bringyour to straightforward solutions.Noquestion panelists willhelpto stripproblemsdown no simpler(supposedlyby Einstein). Our should bemadeassimplepossible,but particularly inEMC.Ithasbeensaidthings complex solutionsto complex problems, easy to getwrapped upinlookingfor knowledge intheareaof EMC.Itisvery provide abroadrange of experience and questions! The panelistswere selected to opportunity to askthosedifficult-to-answer This AsktheExpertsPanelisagreat Chair: EMC PANEL ASK THEEXPERTS- PANELISTS: for Protective Technologies and NBC Protection, Protection, NBC and Technologies Protective for Polytechnic Institute (WPI), Amherst, New New Amherst, (WPI), Institute Polytechnic Keith Armstrong, Frank Sabath, Farhad Rachidi, Bruce Archambeault Lee Hill, University, Montfort De Duffy, Alistair Science and Technology, Rolla, Missouri, USA USA Missouri, Rolla, Technology, and Science Munster, Germany Munster, Stafford, UK Stafford, Hampshire, USA USA Hampshire, Technology (EPFL), Lausanne, Switzerland Switzerland Lausanne, (EPFL), Technology Leicester, United Kingdom United Leicester, PANEL DISCUSSION SILENT Solutions LLC, Worcester Worcester LLC, Solutions SILENT Bundeswehr Research Institute Institute Research Bundeswehr The Swiss Federal Institute of of Institute Federal Swiss The Cherry Clough Consultants, Consultants, Clough Cherry EXHIBIT HALLTHEATRE , Missouri University of of University Missouri , 10:30 AM–12:00PM

2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM Scattering Parameters a Multiple-NoiseSource usingActive Interference between anAntenna and Analysis of ElectromagneticField BEST EMCPAPER AWARD FINALIST 3:00 PM–3:30 ABSTRACT REVIEWED High Decoupling Effect upto 6 Novel NoiseSuppressionSheetExhibiting 2:30 PM–3:00 Co-chair: Chair: Sponsored by TC4 INTERFERENCE CONTROL TH-PM-1 TECHNICAL SESSION Yousaf IA, USA IA, Miyagi, Japan); Japan); Miyagi, (Samsung Electronics Co., Ltd., Hwaseong, Korea, Republic Republic Korea, Hwaseong, Ltd., Co., Electronics (Samsung University, Suwon, Korea, Republic of (South)); (South)); of Republic Korea, Suwon, University, Hwaseong, Korea, Republic of (South)); (South)); of Republic Korea, Hwaseong, of (South) of (Samsung Electronics Co, Ltd., Hwaseong, Korea, Republic Republic Korea, Hwaseong, Ltd., Co, Electronics (Samsung Hosang Lee Toshiyuki Igarashi Fin O’Connor, John Kraemer, Suwon, Korea, Republic of (South)); (South)); of Republic Korea, Suwon, Republic of (South)); (South)); of Republic of (South)); (South)); of of (South)); (South)); of Rapids, IA, USA IA, Rapids, University, Sendai, Miyagi, Japan) Miyagi, Sendai, University, Sendai, Miyagi, Japan); Japan); Miyagi, Sendai, Japan); Japan); Miyagi, Japan); Japan); Miyagi, (Sungkyunkwan University, Suwon, Korea, Republic Republic Korea, Suwon, University, (Sungkyunkwan Koichi Kondo Daehee Lee Wansoo Nah (Sungkyunkwan University, Suwon, Korea, Korea, Suwon, University, (Sungkyunkwan Toshiaki Oka Masashi Ikeda Rockwell Collins, Cedar Cedar Collins, Rockwell (TOKIN Corporation, Sendai, Miyagi, Miyagi, Sendai, Corporation, (TOKIN Rockwell Collins, Cedar Rapids, Rapids, Cedar Collins, Rockwell Kwangho Kim (TOKIN Corporation, Sendai, Sendai, Corporation, (TOKIN (Samsung Electronics Co., Ltd., Ltd., Co., Electronics (Samsung Shigeyoshi Yoshida (Sungkyunkwan University, University, (Sungkyunkwan

(TOKIN Corporation, Sendai, Sendai, Corporation, (TOKIN 2:30 PM–5:30PM (TOKIN Corporation, Corporation, (TOKIN MARYLAND A Jinsung Youn (Sungkyunkwan (Sungkyunkwan Chanseok Hwang (Tohoku (Tohoku Jawad

Automotive Systems Remote Keyless Entry Bulk CurrentInjectionAssessmentof 5:00 PM–5:30 Method Method Characterized withtheStriplineTest the ShieldingEffectiveness of EMIwhen Influence of Sample ShapeandSize on 4:30 PM–5:00 Effectiveness of BoardLevel Shields Worst Case Predictionof Shielding BEST EMCSTUDENTPAPER AWARD FINALIST 4:00 PM–4:30 MA, USA); USA); MA, of Science and Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, and Science of Belgium); Belgium); Paul Dixon (Laird, Randolph, MA, USA); USA); MA, Randolph, (Laird, Dixon Paul Rolla, MO, USA); USA); MO, Rolla, Patrick DeRoy J. Catrysse D. Pissoort Ruijie He LLC, Plymouth, MI, USA); USA); MI, Plymouth, LLC, Milano, Milan, Italy) Milan, Milano, (Schlegel Electronic Materials, Leffinge, Belgium) Belgium) Leffinge, Materials, Electronic (Schlegel Pty. Ltd., Melbourne, Australia); Australia); Melbourne, Ltd., Pty. di Milano, Milan, Italy); Italy); Milan, Milano, di LLC, Plymouth, MI, USA); USA); MI, Plymouth, LLC, Germany); Germany); Plymouth, MI, USA); USA); MI, Plymouth, Randolph, MA, USA) MA, Randolph, USA); USA); (Missouri University of Science and Technology, Rolla, MO, MO, Rolla, Technology, and Science of University (Missouri Plymouth, MI, USA); USA); MI, Plymouth, Leuven, Ostend, Belgium); Belgium); Ostend, Leuven, Mohammad AliKhorrami (Missouri University of Science and Technology, Technology, and Science of University (Missouri F. Vanhee (KU Leuven, Ostend, Belgium); Belgium); Ostend, Leuven, (KU Andreas Barchanski (KU Leuven, Ostend, Belgium); Belgium); Ostend, Leuven, (KU Cyrous RostamzadehCyrous FINAL PROGRAM (CST of America, LLC., Framingham, Framingham, LLC., America, of (CST Victor Khilkevich (KU Leuven, Ostend, Belgium); Belgium); Ostend, Leuven, (KU Michael Grobosky Christopher Jones Sergio A.Pignari Chris Englefield Ryan Frost D. Vanoost (Laird, Randolph, MA, USA); USA); MA, Randolph, (Laird, Flavia Grassi (CST AG, Darmstadt, Darmstadt, AG, (CST (Missouri University University (Missouri I (Robert Bosch LLC, LLC, Bosch (Robert WWW.EMC2017.EMCSS.ORG (KU Leuven, Ostend, Ostend, Leuven, (KU (Robert Bosch LLC, LLC, Bosch (Robert Yoeri Arien (Robert Bosch Bosch (Robert (Robert Bosch Bosch (Robert (Politecnico di di (Politecnico Christian Brull T. Claeys (Robert Bosch Bosch (Robert Ling Zhang (Politecnico (Politecnico (KU (KU (Laird, (Laird,

I

71 TECHNICAL PROGRAM - THURSDAY, AUGUST 10 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

2:30 PM–5:30 PM 2:30 PM–5:30 PM TECHNICAL SESSION MARYLAND 1 & 2 SPECIAL SESSION MARYLAND C

TH-PM-2 TH-PM-3 REVERBERATION CHAMBERS TECHNICAL SOLUTIONS FOR THE SPECTRUM CRISIS Sponsored by TC2 Sponsored by TC6

Chair: 4:30 PM – 5:00 PM Chair: spectrum allocations, future changes, and Vignesh Rajamani, Exponent, Phoenix, AZ, USA On Applying the Generalized Extreme Sarah Seguin, Resonant Frequency, specific challenges related to the spectrum Co-chair: Value Distribution to Undermoded Cavities Minneapolis, MN, USA relocation, the Internet of Things (IoT), Chuck Bunting, Oklahoma State University, within a Reverberation Chamber Co-chair: antenna propagation, 4G/5G standards, Stillwater, OK, USA Carl E. Hager IV (Naval Surface Warfare Center (NSWC) Larry Cohen, Naval Research Laboratory, LTE and radar coexistence, as well as Dahlgren, Dahlgren, VA, USA); Justin D. Rison (Naval Surface Washington, DC, USA measurement techniques and modelling Warfare Center (NSWC) Dahlgren, Dahlgren, VA, USA) 2:30 PM – 3:00 PM advances. BEST EMC PAPER AWARD FINALIST 5:00 PM – 5:30 PM The Special Session, “Technical Solutions to Impact of the Shape of Lossy Materials Optimizing Measurement SNR for Weak the Spectrum Crisis” provides a forum to 2:30 PM – 3:00 PM Understanding the Impact of Terrain Inside a Reverberation Near-Field Scanning Applications inform the Electromagnetic Compatibility Neda Nourshamsi (Oklahoma State University, BEST EMC PAPER AWARD FINALIST community and others on current research Databases on the Irregular Terrain Model Stillwater, OK, USA); Charles F. Bunting (Oklahoma and development efforts to better manage, Chriss Hammerschmidt (Institute for Telecommunication Li Guan (Missouri University of Science and Technology, State University, Stillwater, OK, USA) control and quantify spectrum occupancy. Sciences (NTIA/ITS), Boulder, CO, USA); Robert Johnk Rolla, MO, USA); Giorgi Maghlakelidze (Missouri (Institute for Telecommunication Sciences (NTIA/ITS), 3:00 PM – 3:30 PM University of Science and Technology, Rolla, MO, USA); Boulder, CO, USA) Xin Yan (Missouri University of Science and Technology, Description: The Special Session will present BEST EMC STUDENT PAPER AWARD FINALIST Rolla, MO, USA); (Missouri University Satyajeet Shinde methodologies and measurement techniques 3:00 PM – 3:30 PM Stirring Performance of Helically of Science and Technology, Rolla, MO, USA); David Distributed Paddles Pommerenke (Missouri University of Science and to better manage, control and quantify the use A High-Performance CW Mobile Channel Technology, Rolla, MO, USA) of spectrum. The electromagnetic spectrum is Sounder Valerio Creta (Università Politecnica delle Marche, Ancona,

THURSDAY, AUGUST 10 AUGUST - THURSDAY, PROGRAM TECHNICAL Italy); Luca Bastianelli (Università Politecnica delle Marche, a finite resource and its use is rapidly expanding Robert Johnk (Institute for Telecommunication Sciences 10 AUGUST - THURSDAY, PROGRAM TECHNICAL Ancona, Italy); Franco Moglie (Università Politecnica delle for both military and commercial applications. (NTIA/ITS), Boulder, CO, USA); Chriss Hammerschmidt Marche, Ancona, Italy); Valter Mariani Primiani (Università Access to unencumbered spectrum has (Institute for Telecommunication Sciences (NTIA/ITS), Politecnica delle Marche, Ancona, Italy); Luk R. Arnaut Boulder, CO, USA); Irena Stange (Institute for (Queen Mary University London, London, United Kingdom) been, and continues to be, critical to many Telecommunication Sciences (NTIA/ITS), Boulder, CO, USA) government and commercial systems. Many 4:00 PM – 4:30 PM frequency bands within the spectrum are 4:00 PM – 4:30 PM Calibration of Reverberation Chambers already congested and the challenge of Impact of Spectrum Sharing on 4G and 5G from S21 Measurements efficiently managing the deployment of new Standards: A Review of How Coexistance Guillaume Andrieu (University of Limoges, Limoges, France) systems and technologies will continue to and Spectrum Sharing is Shaping 3GPP become more complex. Additionally, with the Standards increase in unlicensed activity, such as near Andreas Roessler (Rohde & Schwarz America, Flower field communication (NFC) applications and Mound, TX, USA) the Internet of Things (IOT), technical issues, 4:30 PM – 5:00 PM such as changes in noise floor, and low-level Impact of the Antenna Fidelity Pattern on interference receivers sensitivity, there are many Waveform Design and Spectrum Sharing technical issues that have to be addressed Sarah A. Seguin (Resonant Frequency, Maple Grove, MN, hand in hand with policy issues. In order to USA); Brian D. Cordill (Consultant, Los Angeles, CA, USA) efficiently utilize limited spectral resources, systems will need to become more efficient 5:00 PM – 5:30 PM with their use and resilient to the effects of EMI Coexistence of LTE and Radar Systems: and other occupiers of the spectrum that is Methodology for Benchmarking currently allocated to users. Cooperative Radar Receiver Performance Darren McCarthy (Rohde & Schwarz America, Papers in this session will address the Beaverton, OR, USA); Steffen Heuel (Rohde & Schwarz current state of US and international GmbH & Co. KG, Munich, Germany)

72 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 73 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

2:30 PM–5:30 PM 2:30 PM–5:30 PM TECHNICAL SESSION MARYLAND D TECHNICAL SESSION MARYLAND B

TH-PM-4 TH-PM-5 COMPUTATIONAL ELECTROMAGNETICS (IV) SIPI NUMERICAL METHODS 2 Sponsored by TC9 Sponsored by TC10

Chair: 4:00 PM – 4:30 PM Chair: 4:30 PM – 5:00 PM Shaowu Huang, Invensas Corporation, Reduction of EMC Simulation Efforts Zhichao Zhang, Intel Corporation, Chandler, Transient Thermal Analysis of Integrated San Jose, CA, USA using Design of Experiments AZ, USA Systems by Discontinuous Galerkin Time Co-chair: Janne Hein (BMW AG and Technical University of Co-chair: Domain (DGTD) Method Munich, Munich, Germany); (BMW Oemer Faruk Yildiz, Hamburg University of Johannes Hippeli Zhen Zhou, Intel Corporation, Santa Clara, Yilin Dong (Shanghai Jiao Tong University, Shanghai, AG, Munich, Germany); (Technical Thomas F. Eibert China); Min Tang (Shanghai Jiao Tong University, Technology, Hamburg, Germany University of Munich, Munich, Germany) CA, USA Shanghai, China); Junfa Mao (Shanghai Jiao Tong University, Shanghai, China); Ping Li (The University of 2:30 PM – 3:00 PM 4:30 PM – 5:00 PM 2:30 PM – 3:00 PM Hong Kong, Hong Kong, Hong Kong) Flexible Printed Circuit Meshed Ground BEST EMC STUDENT PAPER AWARD FINALIST High-Speed Link Analysis with System Plane Modeling Methodology Simulation of LED Lighting System under Identification Approach 5:00 PM – 5:30 PM BEST SIPI PAPER AWARD FINALIST ABSTRACT REVIEWED ALSE Test Setup YongJin Choi (Hewlett-Packard Enterprise, Fremont, CA, USA); (Hewlett-Packard Enterprise, Subgrid-Based Equivalent Circuit for Chaitanya Sreerama (Intel Corporation, Hillsboro, OR, I. Oganezova (EMCoS, Ltd. / Tbilisi State University, Tbilisi, Christopher Cheng Fremont, CA, USA) USA); Stephen H. Hall (Intel Corporation, Hillsboro, OR, Georgia); R. Kado (Fiat Chrysler Automobiles (FCA), Transient Thermal Analysis using Latency USA); Eric Gantner (Intel Corporation, Hillsboro, OR, USA) Auburn Hills, MI, USA); Z. Kutchadze (EMCoS, Ltd., Tbilisi, Insertion Method Georgia); R. Jobava (EMCoS, Ltd. / Tbilisi State University, 3:00 PM – 3:30 PM (Shizuoka University, Hamamatsu- 3:00 PM – 3:30 PM Tbilisi, Georgia) BEST SIPI PAPER AWARD FINALIST Anh Ha Ngo shi, Japan); Tadatoshi Sekine (Shizuoka University, BEST EMC STUDENT PAPER AWARD FINALIST Modeling and Analysis of Neuronal 5:00 PM – 5:30 PM Hamamatsu-shi, Japan); Hideki Asai (Shizuoka Experimental Validation of a Discrete Membrane Electrical Activities in 3D University, Hamamatsu-shi, Japan) Comparison of In Situ Aircraft Spectral Representation of the Neuromorphic Computing System Electromagnetic Environment THURSDAY, AUGUST 10 AUGUST - THURSDAY, PROGRAM TECHNICAL Electromagnetic Field within an Ideal M. Amimul Ehsan (University of Kansas, Lawrence, KS, 10 AUGUST - THURSDAY, PROGRAM TECHNICAL Measurements with Time Domain Reverberation Chamber USA); Zhen Zhou (Intel Corporation, Santa Clara, CA, Simulations USA); Yang Yi (University of Kansas, Lawrence, KS, USA) Rahul Bakore (Oklahoma State University, Stillwater, (US Air Force, Eglin AFB, FL, USA); OK, USA); James C. West (Oklahoma State University, Michael Johnson Bryan Hays (US Air Force, Eglin AFB, FL, USA); 4:00 PM – 4:30 PM Stillwater, OK, USA); Charles F. Bunting (Oklahoma Jon Bean State University, Stillwater, OK, USA) (US Air Force, Eglin AFB, FL, USA); Omar Ali (US Air Extending the Validity of the Time- Force, Eglin AFB, FL, USA) Domain Contour Integral Method using the Admittance-Wall Boundary Condition Martin Stumpf (Brno University of Technology, Brno, Czech Republic)

74 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 75 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

2:30 PM–5:30 PM 2:30 PM–5:30 PM TECHNICAL SESSION MARYLAND 3 & 4 SPECIAL SESSION MARYLAND 5 & 6

TH-PM-6-SIPI TH-PM-7 SIPI AND EMC CO-DESIGN EMI/EMC FOR POWER ELECTRONICS SYSTEMS Sponsored by TC10 Sponsored by SC5

Chair: 4:00 PM – 4:30 PM Chair: 2:30 PM – 3:00 PM Lijun Jiang, The University of Hong Kong, BEST SIPI PAPER AWARD FINALIST Siming Pan, E-Charging, Inc., BEST EMC PAPER AWARD FINALIST Hong Kong, Hong Kong SI and EMI Performance Comparison ShenZhen, China Investigating the Interference of Common of Standard QSFP and Flyover QSFP Co-chair: Mode Noise of AC/DC Power Adapters to 2:30 PM – 3:00 PM Connectors for 56+ Gbps Applications Chulsoon Hwang, Missouri University of the Touchscreens of Consumer Electronics Characterizing EMI Radiation Physics Atieh Talebzadeh (Missouri University of Science Science and Technology, Rolla, MO, USA Yiming Li (University of Florida, Gainesville, FL, USA); Shuo for Edge- and Broad-Side Coupled and Technology, Rolla, MO, USA); Kyoungchoul Koo Wang (University of Florida, Gainesville, FL, USA); Honggang Connectors (Missouri University of Science and Technology, Rolla, Abstract: A modern power electronics Sheng (Google, Inc., Mountain View, CA, USA); Srikanth MO, USA); Pranay Kumar Vuppunutala (Missouri Lakshmikanthan (Google, Inc., Mountain View, CA, USA); Ying S. Cao (Missouri University of Science and University of Science and Technology, Rolla, MO, USA); system generates high EMI due to its high di/ Choon Ping Chng (Google, Inc., Mountain View, CA, USA) Technology, Rolla, MO, USA); Xu Wang (University of Jim Nadolny (Samtec, Mechanicsburg, PA, USA); dt and high dv/dt. EMI must be reduced to Electronic Science and Technology (UESTC), Chengdu, Angela Li (Juniper Networks, Sunnyvale, CA, USA); Qian meet different EMI, sensitivity standards and 3:00 PM – 3:30 PM China); Wending Mai (University of Electronic Science Liu (Juniper Networks, Sunnyvale, CA, USA); Philippe BEST EMC PAPER AWARD FINALIST and Technology (UESTC), Chengdu, China); Yansheng Sochoux (Juniper Networks, Sunnyvale, CA, USA); safety standards. EMC engineers often lack Wang (Missouri University of Science and Technology, David Pommerenke (Missouri University of Science fundamentals on power electronics and on Predicting Far-Field Radiation with Rolla, MO, USA); Lijun Jiang (The University of Hong and Technology, Rolla, MO, USA); James L. Drewniak the other hand, power electronics engineers Emission Models of Power Converters Kong, Hong Kong, Hong Kong); Albert E. Ruehli (Missouri University of Science and Technology, Rolla, lack knowledge on how EMI is generated and Yingjie Zhang (University of Florida, Gainesville, FL, USA); (Missouri University of Science and Technology, Rolla, MO, USA) Shuo Wang (University of Florida, Gainesville, FL, USA); MO, USA); Shiquan He (University of Electronic Science propagated in power electronics systems. Yongbin Chu (Texas Instruments Inc., Dallas, TX, USA) and Technology (UESTC), Chengdu, China); Huapeng 4:30 PM – 5:00 PM In this special session, some important EMI/ Zhao (University of Electronic Science and Technology 4:00 PM – 4:30 PM (UESTC), Chengdu, China); Jun Hu (University of An Early-EMI Analysis Method for the EMC topics will be covered based on their Coil Design for 100 KHz and 6.78 MHz WPT THURSDAY, AUGUST 10 AUGUST - THURSDAY, PROGRAM TECHNICAL Electronic Science and Technology (UESTC), Chengdu, LPDDR Interface industry application. 10 AUGUST - THURSDAY, PROGRAM TECHNICAL China); (Missouri University of Science and Jun Fan Dongchul Kim (Samsung Electronics Co. Ltd., System: Litz and Solid Wires and Winding Technology, Rolla, MO, USA); James L. Drewniak Hwaseong-si, Korea, Republic of (South)); Sumant Topics will include; EMC Design Jonghyun Cho (Missouri University of Science and (Missouri University of Science and Technology, Rolla, Description: Srikant (Samsung Electronics Co. Ltd., Hwaseong-si, Technology, Rolla, MO, USA); Jingdong Sun (Missouri MO, USA) and Analysis in Wireless Power Transfer, Korea, Republic of (South)); Bo Pu (Samsung Electronics University of Science and Technology, Rolla, MO, Co. Ltd., Hwaseong-si, Korea, Republic of (South)); EMI of Power Electronics for Touch Screen USA); Heegon Kim (Missouri University of Science 3:00 PM – 3:30 PM Sungwook Moon (Samsung Electronics Co. Ltd., Enabled Electronic Products, EMI of Power and Technology, Rolla, MO, USA); Jun Fan (Missouri BEST SIPI STUDENT PAPER AWARD FINALIST Hwaseong-si, Gyeonggki-do, Korea, Republic of (South)) Electronics for Electric Vehicles, Radiated University of Science and Technology, Rolla, MO, USA); Electrostatic Discharge Protection Device Yanling Lu (E-Charging, Inc., Shenzhen, China); Siming 5:00 PM – 5:30 PM EMI of High Frequency Power Converters, Pan (E-Charging, Inc., Shenzhen, China) and Common Mode Suppression Circuit FIT Rate Aware EM Analysis and EMI Reduction with Active Filters. on Printed Circuit Board Codesign The fundamentals of EMI in these power 4:30 PM – 5:00 PM Govind Saraswat (Oracle, Inc., Bangalore, India); (National Taiwan University, Taipei, Taiwan); Chin-Yi Lin William Au (Oracle, Inc., Santa Clara, CA, USA); electronics systems will be presented. Modeling and Analysis of Conductive (National Taiwan University, Taipei, Taiwan) Tzong-Lin Wu Qing He (Oracle, Inc., Santa Clara, CA, USA); The mechanism of EMI generation and Voltage Noise for a DC-DC Buck Converter Subramanian Venkateswaran (Oracle, Inc., Santa Clara, propagation in these power electronics Yanling Lu (E-Charging, Inc. / University of Electronic CA, USA) systems will be deciphered. The EMI Science and Technology of China, Shenzhen, China); Siming Pan (E-Charging, Inc., Shenzhen, China); Jun Fan debugging techniques and EMI reduction (Missouri University of Science and Technology, Rolla, techniques will be investigated. The papers MO, USA); Tun Li (E-Charging, Inc., Shenzhen, China); and presentations will greatly benefit Chaoyong Wang (Nubia Technology Co., Ltd., Shenzhen, China); Yuanci Gao (Missouri University of Science and engineers, students and researchers from Technology, Rolla, MO, USA) both EMC and power electronics. 5:00 PM – 5:30 PM High Density EMI Mitigation Solution using Active Approaches Balaji Narayanasamy (The Ohio State University, Columbus, OH, USA); Fang Luo (The Ohio State University, Columbus, OH, USA); Yongbin Chu (Texas Instruments, Inc., Dallas, TX, USA)

76 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 77 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

WORKSHOP & 8:30 AM – 12:00 PM FRIDAY, AUGUST 11, 2017 TUTORIAL MARYLAND B FR-AM-2 EMC DESIGN 2: EMI FILTER DESIGN WORKSHOP & 8:30 AM – 12:00 PM Sponsored by TC4 TUTORIAL MARYLAND A

FR-AM-1 Chair: John Kraemer, Rockwell Collins, Cedar PLANNED SPEAKERS EMC FUNDAMENTALS Rapids, IA, USA AND TOPICS Sponsored by IEEE EMCS Education Committee (EdCom) EMI Filter Design Tutorial – Introduction This tutorial will provide a basic background John G. Kraemer (Rockwell Collins, Cedar Rapids, IA, Chair: on how EMI filters perform their intended USA) Lee Hill, SILENT Solutions, LLC., PLANNED SPEAKERS functions – functions that include reduction Amherst, NH, USA AND TOPICS of emissions on power input and signal How EMI Filters Work Co-chair: Randy J. Jost (Ball Aerospace & Technologies lines, transient suppression, reduction of Corporation, Boulder, CO, USA) Sarah Seguin, Resonant Frequency, Power Integrity Concepts for High-Speed Design on RF interference to susceptible power and Minneapolis, MN, USA Multi-Layer PCBs J. Drewniak (Missouri University of Science and signal circuits, and providing immunity to Transient Suppression with Filters Technology, Rolla, MO, USA) audio frequency threats at the power input. Keith Armstrong (Cherry Clough Consultants, Ltd., Stafford, United Kingdom) This tutorial is a continuation of MO-AM-1 Key areas of design and implementation, EMC Fundamentals: ESD and MO-AM-2. To read the full abstract David Pommerenke (Missouri University of Science and such as requirements capture, determining Circuit Board Layout Mistakes that Limit the and session details, see pages 18-19. Technology, Rolla, MO, USA) the number of filter elements needed, Effectiveness of EMI Filters Todd H. Hubing (LearnEMC, Stoughton, WI, USA)

FRIDAY, AUGUST 11 AUGUST - FRIDAY, PROGRAM TECHNICAL the impacts of the EMI compliance test FRIDAY, AUGUST 11 AUGUST - FRIDAY, PROGRAM TECHNICAL Antenna Fundamentals setup and measurement specifics, real Zhong Chen (ETS-Lindgren, Cedar Park, TX, USA) Designing for Immunity to Power Input Audio characteristics of components, filter and Frequency Susceptibility (AFCS) Conducted Emissions and You – A Brief Overview of component characterization, interaction John G. Kraemer (Rockwell Collins, Cedar Rapids, IA, Conducted Emissions with power converter circuits, component USA) Christopher Semanson (Renesas, Durham, NC, USA) ratings, and safety will be covered by Safety and Component Rating Considerations practicing designers. Several examples will Keith Armstrong (Cherry Clough Consultants, Ltd., be presented. Stafford, United Kingdom)

78 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 79 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

WORKSHOP & 8:30 AM – 12:00 PM WORKSHOP & 8:30 AM – 12:00 PM TUTORIAL MARYLAND B TUTORIAL MARYLAND 3 & 4

FR-AM-3 FR-AM-4 EMC MANAGEMENT FOR PRODUCT DESIGNERS MEASUREMENT TECHNIQUES FOR LIGHTNING CURRENTS AND TEST LAB MANAGERS Sponsored by TC5 Staying Competitive in Today’s Quickly Changing Industry Sponsored by TC1 Chair: Marcos Rubinstein, University of Applied PLANNED SPEAKERS Chair: process. If EMC principles are applied as Sciences Western Switzerland, Yverdon-les- AND TOPICS Janet O’Neil, ETS-Lindgren, Cedar Park, TX, USA an afterthought it can be certain that both Bains, Switzerland Co-chair: Measurement Techniques for Lightning Currents: Co-chairs: cost and time to market will suffer. After Introduction to Lightning Measurements Farhad Rachidi, The Swiss Federal Institute Tom Braxton, Shure Incorporated, Niles, IL, USA the product is successfully designed, how Farhad Rachidi, (The Swiss Federal Institute of of Technology (EPFL), Lausanne, Switzerland Dan Hoolihan, Hoolihan EMC Consulting, do you cost effectively have it tested to Technology (EPFL), Lausanne, CH1015, Switzerland); Marcos Rubinstein, (University of Applied Sciences Lindstrom, MN, USA confirm the intended performance results? It is intrinsically difficult to make lightning Western Switzerland, Yverdon-les-Bains, Switzerland) Are you aware of the EMC standards – This tutorial will look at EMC management current measurements since the including recent and future pending Direct Current Measurements from both a product design and EMC lab electromagnetic environment created by Fridolin Heidler, University of Federal Armed Forces, revisions – that may impact the current and manager perspective, together with a the high currents and fields associated Munich, Germany number of different viewpoints from veteran next generation of your product design? with the phenomenon create challenging Indirect Measurements Using Far Fields and LLSs experts on EMC Management in order to For EMC Lab managers, as with product EMC conditions. In addition, remote Gerhard Diendorfer, OVE-ALDIS,Vienna, Austria provide a well-rounded discussion of the measurements made with lightning Farhad Rachidi, École Polytechnique Fédérale de designers, you have a considerable investment Lausanne (EPFL), Lausanne, Switzerland topic. For the product designer, the tutorial to protect. Overlooking maintenance of your detection and location systems may suffer FRIDAY, AUGUST 11 AUGUST - FRIDAY, PROGRAM TECHNICAL FRIDAY, AUGUST 11 AUGUST - FRIDAY, PROGRAM TECHNICAL will provide a means to incorporate EMC chamber and instrumentation can derail from insufficient bandwidth or imperfect Interpretation of the Measurements under the design as a fully integrated part of a product’s an EMC test lab. Products out of calibration detection efficiencies. Moreover, challenges Performance Constraints life cycle, from concept through development Farhad Rachidi, EPFL, Lausanne, Switzerland or lack of facility-maintenance can affect have arisen in the interpretation of the data Marcos Rubinstein, Institute for Information and to production, and note the practical issues your chamber performance and optimal obtained from all of these techniques. Communications Technologies, Yverdon-les-Bains, over the product lifetime. Throughout the throughput of your lab, not to mention the Switzerland design process it is usual to incorporate This workshop presents the main lightning possibility of some unhappy customers who Discussion new and existing devices or subsystems. cannot secure lab time when needed. Are you current measurement techniques as Attendees will gain an understanding of how keeping abreast of required lab-accreditations well as their limitations both, in terms of these parts will work together; with both to ensure your lab is compliant not only with the techniques themselves and in the measurements and computer simulations the independent accreditations, but with your interpretation of the measured data. discussed and examples provided. For EMC customers’ needs? lab managers, tips and tools will be shared on the importance of timely calibration and maintenance and how these services can be PLANNED SPEAKERS easily scheduled into a management plan for AND TOPICS the lab. Staying current with the various lab EMC Aspects in Product Design Life Cycle accreditation-standards and requirements is Colin Brench (Amphenol-AHSI, Nashua, NH, USA) critical to any quality-competitive test lab. An The Importance of EMC Standards in Product Design update on lab-accreditation and guidance Tom Braxton (Shure Incorporated, Niles, IL, USA) on how to avoid “nonconformities in lab Antenna Calibrations and Chamber Maintenance: accreditation schemes” will be provided. What’s Current and Why You Should Care Doug Kramer (ETS-Lindgren, Inc., Cedar Park, TX, USA) For product designers responsible for EMC, the final EMC performance of any device or Management Challenges of an EMC Lab – Meeting the Requirements of ISO/IEC 17025 system is dependent upon decisions made Daniel David Hoolihan (Hoolihan EMC Consulting, at many points throughout the design Lindstrom, MN, USA)

80 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 81 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM WORKSHOPS & TUTORIALS WORKSHOPS & TUTORIALS

WORKSHOP & 8:30 AM – 12:00 PM WORKSHOP & 1:30 PM – 5:30 PM TUTORIAL MARYLAND 5 & 6 TUTORIAL MARYLAND A

FR-AM-5 FR-PM-1 EMC CONSULTANT’S TOOLKIT MILITARY & AEROSPACE 3 - Design and Test for Space Sponsored by SC7 Chair: Jerry Meyerhoff, JDM Labs LLC, PLANNED SPEAKERS Chair: Buffalo Grove, IL, USA AND TOPICS Caroline Chan, Lockheed Martin Space PLANNED SPEAKERS Systems Company, Santa Clara, CA, USA As more engineering and design firms Marketing Yourself AND TOPICS Jerry Meyerhoff (JDM Labs, LLC., Buffalo Grove, IL, USA) Co-chair: outsource and reduce staff, more qualified John McCloskey, NASA/Goddard Space Electronics Design of Avionics Hardware using EMC engineers are finding themselves The Seven Habits of Highly Successful EMC Flight Center, Greenbelt, MD, USA Worst Case Analysis Techniques: EMC Applications Consultants and Examples “homeless”. As well, there are hundreds of (National Aeronautic and Space Kenneth Wyatt (Wyatt Technical Services, LLC., Reinaldo J. Perez companies that do not have the resources Administration (NASA) Jet Propulsion Laboratory, Woodland Park, CO, USA) This workshop and tutorial will present to hire a full-time EMC engineer. The all aspects of EMI/EMC/ESD, including Pasadea, CA, USA) purpose of this workshop is to provide an Professional Consulting: How to Look and Act the reliability, lightning, transients, space Control of Power Bus Switching Transients on introduction to the technical, business Part, and Prepare Yourself for Business charging/corona/multipaction mitigation, Patrick G. André (Andre Consulting, Inc., Spacecraft and marketing skills to interested EMC John McCloskey (National Aeronautic and Space Mill Creek, WA, USA) and ground testing at an Integrated Space engineers so that they can successfully Administration (NASA) Goddard Space Flight Center, vehicle Assembly The target audience Greenbelt, MD, USA) locate, market and provide effective Business Savvy Consulting ranges from the novice engineers, who services to these companies at a fair profit Joanna Hill (JPHill, LLC., Holly, MI, USA) just want to have an overall understanding Testing Challenges on NASA’s James Webb Space and with job satisfaction. on how flight vehicles are designed, to Telescope (JWST) Spacecraft FRIDAY, AUGUST 11 AUGUST - FRIDAY, PROGRAM TECHNICAL Acquiring Test Equipment and Developing a John McCloskey (National Aeronautic and Space 11 AUGUST - FRIDAY, PROGRAM TECHNICAL Low-Cost EMC Troubleshooting Kit experienced engineers, who want to catch Administration (NASA) Goddard Space Flight Center, Topics to be addressed include practical Kenneth Wyatt (Wyatt Technical Services, LLC., a deeper understanding of requirements, Greenbelt, MD, USA tools and skills in the area of marketing Woodland Park, CO, USA); Patrick André (André Consulting, Inc., Mill Creek, WA, USA) especially when they are non-standard. and self-promotion, acquiring low-cost Mitigating Potential Hazards of TIG Welding on Spacecraft equipment, developing a troubleshooting EMC Consultant’s Panel Discussion Michael Bodeau (Northrop Grumman, kit using new and low-cost DIY tools & Jerry Meyerhoff (JDM Labs, LLC., Buffalo Grove, IL, USA) Redondo Beach, CA, USA) probes, how to use social media marketing such as LinkedIn to bring in business, Lightning Protection for Space Vehicles Jennifer Kitaygorsky (Electro Magnetic Applications, networking practices, advertising, setting Lakewood, CO, USA); Tim McDonald (Electro Magnetic up your office, pricing your services, Applications, Inc., Lakewood, CO, USA) tracking your time, best business practices, how to present yourself professionally, tax Practical Aspects of a Comprehensive Space Charging Analysis and legal obligations and how to review Bryon Neufeld (Electro Magnetic Applications, contracts and non-disclosure agreements. Lakewood, CO, USA); Timothy McDonald (Electro Magnetic Applications, Lakewood, CO, USA)

Multipactor and Corona Discharge: Theoretical Fundamentals and Analysis with CST and SPARK3D Software Tools Carlos Vicente (Aurora Software and Testing S.L.U. (CST/3DS), Valencia, Valencia, Spain)

82 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 83 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY 2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL AND POWER INTEGRITY TECHNICAL PROGRAM TECHNICAL PROGRAM

WORKSHOP & 1:30 PM – 5:30 PM WORKSHOP & 1:30 PM – 5:30 PM TUTORIAL MARYLAND B TUTORIAL MARYLAND 3 & 4

FR-PM-2 FR-PM-4 WIRELESS EMC EQUIPMENT SYSTEM DESIGN FOR EMC Sponsored by TC4 Chair: Chris Harvey, Chris Harvey EMC Consultants PLANNED SPEAKERS Chair: Inc., Ellicott City, MD, USA AND TOPICS Huadong Li, Molex, LLC., Lisle, IL, USA INTRODUCTORY Co-chair: Steven Ferguson, Washington Laboratories, US/Canada (FCC/ISED) Requirements and REMARKS Application Process for Approval This tutorial will address the common Gaithersburg, MD, USA Equipment and System Design for EMC Chris Harvey (Chris Harvey EMC Consultants, Inc., and real EMC concerns and issues at the Ellicott City, MD, USA) Ross Carlton (National Instruments, Austin, TX, USA) As Internet of Things (IoT) continues to system level when designing electrical Proper Cable Construction and Shielding expand at an exponential rate, wireless Technical Report Content from an Approval and electronic equipment and systems, Authority including methods for mitigation. Techniques connectivity expands in concert. The Bob Scully (National Aeronautics and Space Administration Gregory Czumak (American Certification Body, Inc., These areas of interest are related to developer of almost any device from McLean, VA, USA); Tim Johnson (American Certification (NASA), Houston, TX, USA) sensors, tracking devices and monitoring Body, Inc., McLean, VA, USA) the conventional EMC compliance requirements as well as the spectrum Electrical Grounding and Bonding functions to worldwide communications Bob Scully (National Aeronautics and Space Administration Radio Equipment Directive requirements on modern radio equipment. (NASA), Houston, TX, USA) links must consider incorporation of Steve Koster (Washington Laboratories, wireless connectivity. An awareness of Gaitersburg, MD, USA) The workshop is divided into topics of cable and connector design for EMC; EMI Issues with Cables and Connectors requirements to meet the international Eran Jones (Molex, LLC., Maumelle, AR, USA); Wireless Device Approvals “Rest-of-World product grounding for EMC, product David Brunker (Molex, LLC., Maumelle, AR, USA) market is an integral part to that Compliance”

FRIDAY, AUGUST 11 AUGUST - FRIDAY, PROGRAM TECHNICAL chassis and housing design for EMC; 11 AUGUST - FRIDAY, PROGRAM TECHNICAL design consideration. The technical and Mark W. Maynard (American Certification Body, Inc., equipment/system configuration design Equipment Chassis and Housing Design for EMC administrative processes are combined Round Rock, TX, USA) Huadong Li (Molex, LLC., Lisle, IL, USA) into one tutorial with specialists addressing for EMC, automotive system integration Wireless Device Approvals Wireless Aspects – Automotive System Integration for EMC the various issues. This broad coverage of for EMC; the Era of 5G and its impacts on MIL-STD-461 FR-PM-5 design and testing Karen Burnham (Ford Motor Company, Dearborn, MI, USA) international approval processes in this Steven G. Ferguson (Washington Laboratories, Ltd., tutorial will guide the attendee considering Gaithersburg, MD, USA) The Era of 5G and its Impacts on EMC Design and Testing incorporating wireless functionality Qin Yu (Nokia Bell Labs, New Albany, OH, USA) into electronic devices and systems on the methods to attain approval for 5G US Spectrum Development, Products and international market access. Included mmWave Testing Including Measurements of Fixed Satellite Service (FSS) Earth Station Spillover is a panel discussion at the end of the Emissions various presentations to reach out to the Walter Steve Majkowski (Nokia Bell Labs, New Providence, specialists with specific questions. NJ, USA) Discussion

84 I FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I 85 86 TECHNICAL PROGRAM - FRIDAY, AUGUST 11 I FINALPROGRAM end linkmodels. S-parameters before usingtheminend-to- integrity of themeasured,de-embedded measured response,andhow the to verify the fixture’s contribution fromthe overall de-embedding tool correctly subtracted proper test fixture,how that to your verify to meettheelectrical requirements of a The discussionwill cover detailsof how to a“real-world” characterization study. how onewould standard applythefuture the P370working groupwillbeexplaining development project,andmembersof captured intheIEEEP370standards characterization methodologyisbeing at frequenciesupto 50GHz.This characterizing ahigh-speedinterconnect through theproperprocess to usewhen This tutorial willleadtheaudience Co-chairs: Chair: Sponsored by TC10 High SpeedSIMeasurements SIGNAL &POWER INTEGRITY(SIPI)2- FR-PM-5 and Technology, Rolla, MO, USA MO, Rolla, Technology, and Triangle Park, NC, USA NC, Park, Triangle Rosa, CA, USA CA, Rosa, Samuel Connor, Mikheil Tsiklauri, Heidi Barnes, WORKSHOP & TUTORIAL I WWW.EMC2017.EMCSS.ORG Keysight Technologies, Santa Santa Technologies, Keysight IBM Corporation, Research Research Corporation, IBM Missouri University of Science Science of University Missouri 1:30 PM–5:30 MARYLAND 5&6 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM Lab, Longmont, CO, USA) CO, Longmont, Lab, Connor Xiaoning Ye Overview of thePurposeandScope of P370 Interconnect usingtheIEEE P370Standard–Brief Electrical Characterization of aHigh-Speed Mikheil Tsiklauri S-Parameters Integrity andValidation Eric Bogatin Process, andSomeConsistency Tests Verification of aDe-EmbeddingAlgorithmand Heidi Barnes Test Fixtures Design Considerations andAcceptance Criteria for Science and Technology, Rolla, MO, USA) MO, Rolla, Technology, and Science Technology, Rolla, MO, USA); USA); MO, Rolla, Technology, AND TOPICS PLANNED SPEAKERS (IBM Corporation, Research Triangle Park, NC, USA) NC, Park, Triangle Research Corporation, (IBM (Intel Corporation, Hillsboro, OR, USA); USA); OR, Hillsboro, Corporation, (Intel (Teledyne LeCroy Front Range Signal Integrity Integrity Signal Range Front LeCroy (Teledyne (Keysight Technologies, Santa Rosa, CA, USA) CA, Rosa, Santa Technologies, (Keysight (Missouri University of Science and and Science of University (Missouri Jun Fan (Missouri University of of University (Missouri Sam 2017 IEEEINTERNATIONAL SYMPOSIUMONELECTROMAGNETIC COMPATIBILITY, SIGNAL ANDPOWER INTEGRITY TECHNICAL PROGRAM FINAL PROGRAM I WWW.EMC2017.EMCSS.ORG I

87 TECHNICAL PROGRAM - SPECIAL SESSIONS