Tools Used in Modeling of the Economic Processes Marian Pompiliu Cristescu
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Infrastructure) IMS > J
NE DO-IT-O 0 16 <i#^^0%'IW#^#^#(Hyper-Intellectual-IT Infrastructure) IMS > J TO 1 3 ¥ 3 M NEDD H»* r— • ^ ’V^^ m) 010018981-0 (Hyper-Intellectual-IT fr9, (Hyper IT) i-6Z 6 & g 1% ^ L/bo i2 NEDO-IT-0016 < (Hyper-Intel lectual-IT Infrastructure) 9H3E>J 1 3 # 3 ^ lT5fe (%) B^f-r^'a'W^ZPJf (Summary) -f — t 7-j'<7)7*0- K/O- % -y f-7-? ±K*EL/--:#<<7)->5a.v-j'^T*-j'^-7OTSmiLr1 Eft • Skit • tWs§ (Otis ti® o T S T V' £ „ Ltf' U - 7- L*{Hffi,»ftffiIBIS<7)'> 5 a. V- -> 3 >^x- ? ^-Xfijfflic-7V>TI±#<<7)*®»:C0E@»S»6L, -en<b»sili*5tL^itn(i\ *7h Ty — t’ 4-^hLfcE&tt>fc1SSSeF% • Eft • KS& k" f> $ $ & b ttv>, (1) 3>ti- (2) f -^ (3) $-y t-7-7 (4) ->i ( 5 ) 7 7 t 73H7ft#-9— fxwilttas Sti:, ±EP$t t k ic, KSUWSSiaBF^ ■ Elt ■ # ## k T-<7)FB1«6 4-$v>tti u iirn *iiM LrtlSS-S k a6* 0 (1) Hyper-IT 4 7 —-y OEE$l&teH k $l!$ (2 ) Hyper-IT -f7-y*k##<7)tbK (3) KS<7)i5tv^k (4) #@<7)SEE • IISE<7)#S (5) Hwif^silftftkn-KvyT ’tt Summary In recently years, we have broad band network and The Internet environment , using these infrastructure, we will develop knowledge co-operate manufacturing support system, which can be use various kinds of simulators and databases. But knowledge co-operate manufacturing support system has a lot of problems, such as data format, legal problems, software support system and so no. -
Best Practices in Business Instruction. INSTITUTION Delta Pi Epsilon Society, Little Rock, AR
DOCUMENT RESUME ED 477 251 CE 085 038 AUTHOR Briggs, Dianna, Ed. TITLE Best Practices in Business Instruction. INSTITUTION Delta Pi Epsilon Society, Little Rock, AR. PUB DATE 2001-00-00 NOTE 97p. AVAILABLE FROM Delta Pi Epsilon, P.O. Box 4340, Little Rock, AR 72214 ($15). Web site: http://www.dpe.org/ . PUB TYPE Collected Works General (020) Guides Classroom Teacher (052) EDRS PRICE EDRS Price MF01/PC04 Plus Postage. DESCRIPTORS Accounting; *Business Education; Career Education; *Classroom Techniques; Computer Literacy; Computer Uses in Education; *Educational Practices; *Educational Strategies; Group Instruction; Keyboarding (Data Entry); *Learning Activities; Postsecondary Education; Secondary Education; Skill Development; *Teaching Methods; Technology Education; Vocational Adjustment; Web Based Instruction IDENTIFIERS *Best Practices; Electronic Commerce; Intranets ABSTRACT This document is intended to give business teachers a few best practice ideas. Section 1 presents an overview of best practice and a chart detailing the instructional levels, curricular areas, and main competencies addressed in the 26 papers in Section 2. The titles and authors of the papers included in Section 2 are as follows: "A Software Tool to Generate Realistic Business Data for Teaching" (Catherine S. Chen); "Alternatives to Traditional Assessment of Student Learning" (Nancy Csapo); "Applying the Principles of Developmental Learning to Accounting Instruction" (Burt Kaliski); "Collaborative Teamwork in the Classroom" (Shelia Tucker); "Communicating Statistics Measures of Central Tendency" (Carol Blaszczynski); "Creating a Global Business Plan for Exporting" (Les Dlabay); "Creating a Supportive Learning Environment" (Rose Chinn); "Developing Job Survival Skills"(R. Neil Dortch); "Engaging Students in Personal Finance and Career Awareness Instruction: 'Welcome to the Real World!'" (Thomas Haynes); "Enticing Students to Prepare for and to Stay 'Engaged' during Class Presentations/Discussions" (Zane K. -
Integration Definition for Function Modeling (IDEF0)
NIST U.S. DEPARTMENT OF COMMERCE PUBLICATIONS £ Technology Administration National Institute of Standards and Technology FIPS PUB 183 FEDERAL INFORMATION PROCESSING STANDARDS PUBLICATION INTEGRATION DEFINITION FOR FUNCTION MODELING (IDEFO) » Category: Software Standard SUBCATEGORY: MODELING TECHNIQUES 1993 December 21 183 PUB FIPS JK- 45C .AS A3 //I S3 IS 93 FIPS PUB 183 FEDERAL INFORMATION PROCESSING STANDARDS PUBLICATION INTEGRATION DEFINITION FOR FUNCTION MODELING (IDEFO) Category: Software Standard Subcategory: Modeling Techniques Computer Systems Laboratory National Institute of Standards and Technology Gaithersburg, MD 20899 Issued December 21, 1993 U.S. Department of Commerce Ronald H. Brown, Secretary Technology Administration Mary L. Good, Under Secretary for Technology National Institute of Standards and Technology Arati Prabhakar, Director Foreword The Federal Information Processing Standards Publication Series of the National Institute of Standards and Technology (NIST) is the official publication relating to standards and guidelines adopted and promulgated under the provisions of Section 111 (d) of the Federal Property and Administrative Services Act of 1949 as amended by the Computer Security Act of 1987, Public Law 100-235. These mandates have given the Secretary of Commerce and NIST important responsibilities for improving the utilization and management of computer and related telecommunications systems in the Federal Government. The NIST, through its Computer Systems Laboratory, provides leadership, technical guidance, -
Fielder Elected
• ——— •—- •^ »!• m«g -mmiMMa&rr »• t-^ •iwiiiiiiiwum I*T The Leading and Most Widely Circulated Weekly Newspaper in Union County WESTFIELD, NEW JERSEY, WEDNESDAY, NOVEMBEB, 5, 1913, FOURTEEN PAGKS—2 CENTS NOVEMBER 5, 1913 Money deposited in our Savings Department on or before the above date, will draw interest at 4 per cent, from NOVEMBER FIRST. Check Accounts—largo or small- ? A FEW DID The Two Clark's ore Re-elected in Westfield with Many received on liberal terms. Votes to the Good—Casey Polls Big Vote in the COUNTY DEMOGRATiO ASSETS OVER $1,000,000.00 T l/OTE YESTERDAY Fourth and is Returned to the Council ASSEMBLYCANDIDATES The Early Returns Showed Traynor Running Strong for The Oldest Banking Institution in Westfield sgistsrcd Men Were Goif- Assessor, but Denman Receives Majority Elected by About Six Hundred inp or Motoring in ' of Over Two Hundred Votes Majority and Run Far Other Placos Behind Ticket MITCHELL AND ENTIRE FOSION TICKET WINS IN NEW YORE VOTES THE TOTAL CAST MAYOR EVANS WAS DEFEATED Fielder Elected "v ivory 1.308 volt's uasi in ilnyir Kvans proved his jni|m- !<i ui tiis vlcctinn nnii 17 litritv in Westiiold by luimiup •IN liii' noxt. Governor ul" New di'i-scy. 1 rejected. There were 'J2S iiliciid of l'.'.s uriiiTSl opjuMi- voters in Wcsl- cnt but imt'oHuiiiiU'ly went down Kledcd becmise of failhfu! and cfllcionl Rcrvice it tiiis t lection which prows with liis tiok«t fur tin1 Di'inncrntic in tile past. i did not avail Uiomselvcs AsKi'inlily in llio county won out right or sufTrap-d. -
DATA MODELS to SUPPORT METROLOGY by Saeed
DATA MODELS TO SUPPORT METROLOGY by Saeed Heysiattalab A dissertation submitted to the faculty of The University of North Carolina at Charlotte in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Mechanical Engineering Charlotte 2017 Approved by: ______________________________ Dr. Edward P. Morse ______________________________ Dr. Robert G. Wilhelm ______________________________ Dr. Jimmie A Miller ______________________________ Dr. M. Taghi Mostafavi ______________________________ Dr. Jing Xiao ii ©2017 Saeed Heysiattalab ALL RIGHTS RESERVED iii ABSTRACT SAEED HEYSIATTALAB. Data models to support metrology (Under the supervision of Dr. EDWARD P. MORSE) The Quality Information Framework (QIF) is a project initiated in 2010 by the Dimensional Metrology Standards Consortium (DMSC is an American Standards Developing Organization) to address metrology interoperability. Specifically, the QIF supports the exchange of metrology-relevant information throughout the product lifecycle from the design stage through manufacturing, inspection, maintenance, and recycling / end-of-life processing. The QIF standard is implemented through a set of XML schemas called "Application Schemas" along with common core "XML schema libraries". Of these schemas, QIF Measurement Resources and QIF Rules are the two application schemas on which this research is focused. QIF Measurement Resources is an application schema developed to provide standard representations of physical measuring tools and components, and can be used to support measurement planning, statistical studies, traceability, etc. The Resources schema was supported by the creation of a new hierarchy of metrology resources in support of the product lifecycle. The QIF Rules schema is under development to provide the language with which manufacturers can define how dimensional measurement equipment is selected for various tasks, and how this equipment is used during the measurement task. -
A Study on Process Description Method for DFM Using Ontology
Invited Paper A Study on Process Description Method for DFM Using Ontology K. Hiekata1 and H. Yamato2 1Department of Systems Innovation, Graduate School of Engineering, The University of Tokyo, 5-1-5, Kashiwanoha, Kashiwa-city, Chiba 277-8563, Japan 2Department of Human and Engineered Environmental Studies, Graduate School of Frontier Sciences, The University of Tokyo, 5-1-5, Kashiwanoha, Kashiwa-city, Chiba 277-8563, Japan [email protected], [email protected] Abstract A method to describe process and knowledge based on RDF which is an ontology description language and IDEF0 which is a formal process description format is proposed. Once knowledge of experienced engineers is embedded into the system the knowledge will be lost in the future. A production process is described in a proposed format similar to BOM and the process can be retrieved as a flow diagram to make the engineers to understand the product and process. Proposed method is applied to a simple production process of common sub-assembly of ships for evaluation. Keywords: Production process, DFM, Ontology, Computer system 1 INTRODUCTION (Unified Resource Identifier) is assigned to all the objects, There are many research and computer program for and metadata is defined for all objects using the URI. supporting optimization of production process in Metadata is defined as a statement with subject, shipyards. And knowledge of experienced engineers is predicate and object. The statement is called triple in embedded into the system. Once the knowledge is RDF. Two kinds of elements, Literal or Resource, can be embedded into computer system, the knowledge is not a component of a statement. -
Using Telelogic DOORS and Microsoft Visio to Model and Visualize
Using DOORS & Visio to Model and Visualize Complex Business Processes Bob Sherman - [email protected] [email protected] Using Telelogic DOORS and Microsoft Visio to Model and Visualize Complex Business Processes - v1.0 © 2005 Galactic Solutions Group LLC – Authors: Bob Sherman ([email protected]), [email protected] 1 © Telelogic AB Agenda • The Unmet Need • The Solution – Strategy: Business Driven Application Lifecycle – Tactics: Business Modeling via DOORS & VISIO – Tactics: DOORS/VISIO Integration • Case Study Results Using Telelogic DOORS and Microsoft Visio to Model and Visualize Complex Business Processes - v1.0 © 2005 Galactic Solutions Group LLC – Authors: Bob Sherman ([email protected]), [email protected] 2 © Telelogic AB Chronic IT Project Problems Top IT Project Problems • User/Stakeholder Engagement Outages • Unclear Objectives • Incomplete or Changing Requirements *Standish Group Chaos Studies Using Telelogic DOORS and Microsoft Visio to Model and Visualize Complex Business Processes - v1.0 © 2005 Galactic Solutions Group LLC – Authors: Bob Sherman ([email protected]), [email protected] 3 © Telelogic AB Chronic IT Project Problems Rework • 35-65% of project budget *Standish Group spent on rework. • ~50% of rework is due to requirements errors * IEEE & University of Southern California Using Telelogic DOORS and Microsoft Visio to Model and Visualize Complex Business Processes - v1.0 © 2005 Galactic Solutions Group LLC – Authors: -
Modelling, Analysis and Design of Computer Integrated Manueactur1ng Systems
MODELLING, ANALYSIS AND DESIGN OF COMPUTER INTEGRATED MANUEACTUR1NG SYSTEMS Volume I of II ABDULRAHMAN MUSLLABAB ABDULLAH AL-AILMARJ October-1998 A thesis submitted for the DEGREE OP DOCTOR OF.PHILOSOPHY MECHANICAL ENGINEERING DEPARTMENT, THE UNIVERSITY OF SHEFFIELD 3n ti]S 5íamc of Allai]. ¿Hoot (gractouo. iHHoßt ¿Merciful. ACKNOWLEDGEMENTS I would like to express my appreciation and thanks to my supervisor Professor Keith Ridgway for devoting freely of his time to read, discuss, and guide this research, and for his assistance in selecting the research topic, obtaining special reference materials, and contacting industrial collaborations. His advice has been much appreciated and I am very grateful. I would like to thank Mr Bruce Lake at Brook Hansen Motors who has patiently answered my questions during the case study. Finally, I would like to thank my family for their constant understanding, support and patience. l To my parents, my wife and my son. ABSTRACT In the present climate of global competition, manufacturing organisations consider and seek strategies, means and tools to assist them to stay competitive. Computer Integrated Manufacturing (CIM) offers a number of potential opportunities for improving manufacturing systems. However, a number of researchers have reported the difficulties which arise during the analysis, design and implementation of CIM due to a lack of effective modelling methodologies and techniques and the complexity of the systems. The work reported in this thesis is related to the development of an integrated modelling method to support the analysis and design of advanced manufacturing systems. A survey of various modelling methods and techniques is carried out. The methods SSADM, IDEFO, IDEF1X, IDEF3, IDEF4, OOM, SADT, GRAI, PN, 10A MERISE, GIM and SIMULATION are reviewed. -
H)EF3 Technical Report Version 1.0 Chard J. Mayer Christopher P
L. H)EF3 Technical Report Version 1.0 _| i L, _chard J. Mayer Christopher P. Menzel : i_:_pa_la S.D. Mayer Know!edge Based Systems Laboratory L Depar tment- 0 fin-dustrial Engineering Texas A&M University College Station TX 77843 Reviewed by Michad-K, Painter, Capt, USAF Armstrong Laboratory Logistics Research Division Wright-Patterson =Air Force Base, Ohio 45433-6503 :_ _=_January 1991 i _: ?_ | - , i (NASA-CR-I90279) {RESEARCH ACCOMPLISHED AT N92-26587 THE KNOWLEDGE BASED SYSTEMS LAB: IDEF3, VERSION 1.0] (Texas A&M Univ.) 56 p Unclag G]/_I 0086873 L == ; IDEF3 Technical Report Version 1.0 Richard J. Mayer Christopher P. Menzel Paula S.D. Mayer Knowledge Based Systems Laboratory Department of Industrial Engineering Texas A&M University College Station TX 77843 Reviewed by Michael K. Painter, Capt, USAF Armstrong Laboratory Logistics Research Division Wright-Patterson Air Force Base, Ohio 45433-6503 January 1991 umd w _- :7. m w Preface This paper describes the research accomplished at the Knowledge Based Systems Laboratory of the Department of Industrial Engineering at Texas A&M University. Funding for the Laboratory's research in Integrated Information System Development Methods and Tools has been provided by the Air Force Armstrong Laboratory, Logistics Research Division, AFWAL/LRL, Wright-Patterson Air Force Base, Ohio 45433, under the technical direction of USAF Captain Michael K. Painter, under subcontract through the NASA RICIS Program at the University of Houston. The authors and the design team wish to acknowledge the technical insights and ideas provided by Captain Painter in the performance of this research as well as his assistance in the preparation of this report. -
The IDEF Family of Languages
CHAPTER 10 The IDEF Family of Languages Christopher Menzel, Richard J. Mayer The purpose of this contribution is to serve as a clear introduction to the modeling languages of the three most widely used IDEF methods: IDEFO, IDEFIX, and IDEF3. Each language is presented in turn, beginning with a discussion of the underlying "ontology" the language purports to describe, followed by presentations of the syntax of the language - particularly the notion of a model for the language - and the semantical rules that determine how models are to be interpreted. The level of detail should be sufficient to enable the reader both to understand the intended areas of application of the languages and to read and construct simple models of each of the three types. 1 Introduction A modeling method comprises a specialized modeling language for represent ing a certain class of information, and a modeling methodology for collecting, maintaining, and using the information so represented. The focus of this paper will be on the languages of the three most widely used IDEF methods: The IDEFO business function modeling method, the IDEFIX data modeling method, and the IDEF3 process modeling method. Any usable modeling language has both a syntax and a semantics: a set of rules (often implicit) that determines the legitimate syntactic constructs of the language, and a set of rules (often implicit) the determines the meanings of those constructs. It is not the purpose of this paper is to serve as an exhaus tive reference manual for the three IDEF languages at issue. Nor will it dis cuss the methodologies that underlie the applications of the languages. -
Analysis of Methods TECHNICAL REPORT
Analysis of Methods Final Report Richard J. Mayer, ed. Knowledge Based Systems Laboratory Texas A&M University March 8, 1991 w -o _0 co ! m f_ U cD C 0 Z 0 Cooperative Agreement NCC 9-16 Research Activity No. IM.06: Methodologies for Integrated 0 Information Management Systems r CDOC NASA Johnson Space Center Information Systems Directorate Information Technology Division -J • 0 _D A _OE e._ ,t C I LL -C,-- ::2" I C" m E Research Institute for Computing and Information Systems v;I _0 University of Houston-C/ear Lake TECHNICAL REPORT The RICIS Concept The University of Houston-Clear Lake established the Research lnsUtute for Computing and Information Systems (RICIS) in 1986 to encourage the NASA Johnson Space Center (JSC) and local industry to actively support research in the computing and information sciences. As part of thls endeavor. UHCL proposed a partnership with JSC to Jointly define and manage an integrated program of research in advanced data processing technology needed for JSC's main missions, including administrative, engineering and science responsi- bilities. JSC agreed and entered into a continuing cooperative agreement with UHCL beginning in May 1986, to Jointly plan and execute such research through RICIS. Additionally, under Cooperative Agreement NCC 9-16, computing and educaUonal facilities are shared by the two instituUons to conduct the research. The UHCL/RICIS mission is to conduct, coordinate, and disseminate research and professional level edueaUon in computing and information systems to serve the needs of the government, industry, community and academia. RICIS combines resources ofUHCLand Itsgateway affiliatestoresearch and develop materials, prototypes and publications on topics of mutual interest to its sponsors and researchers. -
Product Realization Process Modeling
NAT’L INST. OF STAND & .TECH R I.C III! Ill" I" 'I mill mill II ml II II AlllDM NISTIR 5745 Product Realization Process Modeling: A study of requirements, methods and and research issues Kevin W. Lyons U.S. DEPARTMENT OF COMMERCE Technology Administration National Institute of Standards and Technology Gaithersburg, MD 20899 Michael R. Duffey Richard C. Anderson George Washington University QC 100 NIST .056 NO. 5745 1995 Product Realization Process Modeling: A study of requirements, methods and and research issues Kevin W. Lyons U.S. DEPARTMENT OF COMMERCE Technology Administration National Institute of Standards and Technology Gaithersburg, MD 20899 Michael R. Duffey Richard C. Anderson George Washington University June 1995 c U.S. DEPARTMENT OF COMMERCE Ronald H. Brown, Secretary TECHNOLOGY ADMINISTRATION Mary L. Good, Under Secretary for Technology NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY Arati Prabhakar, Director . r•^ - . 'it'/ ' ' ' ' - ' ' -•*'1 X' . r • ^.,' v./f/v ’• '^^,. • T,?. - ^ •' V.y' ’ ' :AIa ' / ><- l> r / PRP Modeling: Page 2 1. Introduction 7 2. Definition of a PRP Model 8 3. Overview of PRP Methods and Modeling Issues in Manufacturing Industries 9 3.1 PERT-based Models 9 3.2 IDEF-based Models 10 3.3 Traditional PRP Modeling Practices 12 3.4 Emerging PRP Model Applications in Industry 14 3.5 Industry Requirements for PRP Models 14 4. Modeling Issues for Advanced PRP Computer Tools 16 4. 1 Activity Network Representations 17 4.2 Representing Design Iteration and Activity "Overlapping" 18 4.3 Uncertainty Modeling of a PRP 20 4.3.1 Some Simulation Considerations 20 4.3.2 Activity Duration Uncertainty 21 4.3.3 Concurrent Activities and Stochastic Modeling 22 4.3.4 Alternative Representations of Uncertainty 23 4.4 Representing Economic Information 24 4.5 Data Collection and Validation Issues for PRP Models 27 4.6 Knowledge-Based Representations in PRP Models 28 5.