Development of an experimental facility for the study of microparticle initiated radio-frequency vacuum breakdown R. Casagrande,1, 2, 3, a) H. Faugel,2 F. Fischer,2 H. Fünfgelder,2 F. Riedl,2 G. Siegl,2 P. Bettini,3 J.-M. Noterdaeme,1, 2 and K. Crombé1, 4 1)Department of Applied Physics, Ghent University, 9000 Gent, Belgium 2)Max-Planck-Institut für Plasmaphysik, 85748 Garching, Germany 3)Università degli Studi di Padova, 35122 Padova, Italy 4)Laboratory for Plasma Physics, ERM/KMS, 1000 Brussels, Belgium (Dated: 8 December 2020) An ongoing objective in ion cyclotron range of frequencies (ICRF) systems is the improvement of power coupling to the plasma. During the last decade, this goal has been mainly pursued through the study of the coupling resistance, either by optimizing the layout or by tailoring the Scrape-O Layer (SOL) prole with gas pung. Another approach is to increase the handling capability of the ICRF system, limited by breakdown in the launchers or in the transmission lines. This paper describes the design of IBEX, a device to investigate fundamental aspects of radio-frequency arcs in ICRF-relevant conditions. IBEX can achieve a peak voltage of 48 kV at 54 MHz, with 5 kW input power.

I. INTRODUCTION kV/mm on all the other locations2. These boundaries are extrapolated from the operational conditions of ex- In next generation fusion devices, in order to meet isting antennas, hence the strategy to ensure reliability the tritium breeding ratio requirements, heating sys- and availability is to provide a reasonably large margin tems with reduced impact on the breeder volume will be on the main macroscopic parameters aecting the break- required1. If the port-plug antenna design adopted for down in known systems. However, arcs in ICRF antennas ITER is maintained for future reactors, the requirement are still poorly understood, due to the complexity and the of a small footprint will inevitably lead to high power range of spurious interactions the tokamak environment density launchers, and in turn to high on the can give rise to, and the diculty of direct observation ICRF system. The ITER antenna, coupling 20 MW to and diagnosis of breakdown inside the antenna box. Sig- the plasma in the 40÷55 MHz frequency range, will have nicantly higher electric elds, with respect to the ones a maximum voltage on the straps2 in excess of 40 kV. In established by IO, are routinely achieved in closed vac- case of an in-port solution for DEMO, electric eld limits uum environments, e.g. RF cavities for particle accel- will also be major design issues. It is then desirable to erators, where extremely good control over the surface extend the range of operational voltage and electric eld conditions can be obtained. Conversely, ICRF launchers in ICRF systems, not only to reduce design complexity can be subjected to dust contamination due to erosion but also to improve the reliability of antennas. of plasma-facing components, as well as plasma interac- A device dedicated to the study of fundamental mech- tion during intense transient events such as Edge Local- anisms of radio-frequency arcs has been developed at ized Modes (ELMs)3. Studies on the eect of plasma the Max-Planck-Institut für Plasmaphysik in Garching interaction on voltage stand-o have been carried out - Germany, with the aim of gaining improved informa- in ASDEX Upgrade with an RF probe4, providing some tion on voltage limits of ICRF launchers. In this paper insights on the observed correlation between ELMs and we describe the design of ICRF Breakdown EXperiment antenna breakdown. On the other hand, the eect of (IBEX), particularly focusing on the development of an microparticles on the voltage holding of ICRF launchers RF system able to meet the voltage and frequency re- has not been explored in detail yet, both concerning par- quirements. ticulate contamination and dust impact on the antenna.

II. ICRF ENVIRONMENT B. Dust deleterious eects

A. Operational limits Microparticles are well known to aect the voltage holding of vacuum insulated gaps, either by producing The voltage limit imposed by ITER Organization (IO) enhanced eld emission sites if deposited on the elec- on the ICRF system is 45 kV, with a maximum electric trodes surface, or by being accelerated by the background eld of 2 kV/mm along the magnetic eld lines and 3 electric eld, which in turn can lead to evaporation of the particle or formation of craters upon impact with the electrodes5. The latter is usually not a relevant phe- nomenon in RF structures, since the charge to mass ra- a)Electronic mail: [email protected] tio of typically encountered particles does not allow for 2 enough acceleration during half RF period. Nonetheless, ˆ Bias-Tee: guarantees electrical separation between large amounts of particulate is generated in nuclear fu- DC and RF circuit. This allows the DC of sion reactors68, which can reach the ICRF launchers. the transmission line (e.g. for glow discharge con- Microparticles can be remobilized and deposited on the ditioning), and measurement of the rectied eld antenna surface, or be subjected to acceleration in the emission current, other than providing protection edge plasma, reaching velocities up to several hundred of to the SSA. m/s prior to the vaporization or impact with the plasma- RF voltage and current in the resonator are monitored facing components9. IBEX aims at providing a test plat- through capacitive and inductive probes. For impedance form to investigate the parameters that can inuence matching, a variable vacuum is used. Figure 1 voltage holding, specically in ICRF relevant conditions, shows the basic outline of IBEX. focusing on microparticle contamination during the ini- tial experimental phase. IV. GENERATION OF HIGH RF VOLTAGE

III. EXPERIMENT SPECIFICATIONS A. Quality factor and standing wave maximum

A. Main requirements A key aspect in the design of IBEX was the maxi- mization of the voltage on the test electrodes, given the The main requirement of IBEX is to provide voltage limited 5 kW input power (Pi). In a quarter wavelength and electric eld conditions at the test electrodes at and coaxial resonator (gure 2) with constant characteristic above the typical limits of ICRF systems. Since these val- impedance (Z0), assuming a perfect matching with the ues can greatly vary between dierent machines, the lim- source output impedance and a total reection of the itations on ITER ICRF were considered as design basis. wave at the extremes, the peak voltage at the open end Other requirements include background pressure well be- can be estimated as low the typical observed limits for modied multipactor r discharge, i.e. less than −4 mbar10. IBEX should also 8P QZ 10 V = i 0 . (1) guarantee a quick replacement of the test electrodes and open π have the possibility to interface with a microparticle in- The maximization variables for Vopen are then the jection system. characteristic impedance and the quality factor (Q). Q represents the ratio between stored and dissipated en- ergy in a RF cycle. For a coaxial transmission line with B. Experiment outline phase constant β and attenuation constant α, the value of Q arising from resistive losses in the conductors is High voltages in the frequency range of interest can be obtained by generating a standing wave pattern in a β 2π QTL = = , (2) coaxial transmission line. The maximum voltage stand- 2α λRTL ing wave ratio (VSWR) is achieved in resonant condi- with RTL resistance per unit length of the transmission tions: in IBEX, a λ/4 coaxial resonator is used to obtain line. In IBEX, the main contribution in terms of power a high RF voltage on the test electrodes, positioned at losses per RF cycle comes from the vacuum section of the open-end. The terminal part of the resonator is com- the resonator, since it is composed of stainless steel pip- posed of a vacuum piping section and connected to a ing segments with an inner diameter of 153 mm acting as pumping system, to achieve experimental pressures be- the outer conductor. To minimize losses and to achieve low 10−4 mbar. Vacuum tightness and electrical continu- good vacuum compatibility, the inner conductor mate- ity are ensured by a coaxial ceramic feedthrough in the rial was chosen to be oxygen-free copper. The resistance initial segment of the transmission line. A linear manipu- per meter of the mixed-materials coaxial line can be ex- lator allows the precise adjustment of the electrodes gap. pressed as Several access ports are available in the test chamber, √ √ to provide a direct view on the electrodes and an inter- r  µ ρ µ ρ  fµ0 in in out out (3) face with the microparticle accelerator. The experiment RTL = + . π din dout is powered through a 5 kW solid-state amplier (SSA), connected to the feeding point via: With d, µ and ρ respectively the diameter, permeability and resistivity, subscripts identifying the inner or outer ˆ RF switch: allows the connection of a network an- conductor. The lower conductivity of the coaxial line alyzer to the resonator, to perform the tuning pro- outer conductor is not extremely penalizing in terms of cedure. power losses, due to the larger penetration depth and cross sectional area. Z0=116 W yields the optimal un- ˆ Directional coupler: monitoring of forward and re- loaded Q, although the maximum voltage at the res- ected power. onator open end, given by eq. 1, is achieved with a 3

FIG. 1: IBEX schematic representation. A)Solid-state amplier B)RF switch C)Directional coupler D)Bias tee E)9" transmission line T section F)Tuning vacuum capacitor G) Voltage and current probes H)Vacuum feedthrough I)High impedance transmission line section J)Test electrodes K)Linear manipulator L)Microparticle source M)High speed camera N)Pumping system

FIG. 3: Z0 dependence of Q factor and open-end voltage in a λ/4 coaxial resonator

FIG. 2: Voltage and current distribution in a quarter-wavelength coaxial resonator a variable vacuum capacitor connected in parallel to the open-ended coaxial line. The reactance seen from the feeding point can be increased by adding a section of lower quality factor, for a characteristic impedance of transmission line (shorter than λ/4) in series with the 167 W (gure 3). Therefore, the vacuum section of the vacuum capacitor, thus reducing its contribution to the transmission line (gure 1-I) must have high characteris- matching capacitance and therefore increasing Q. Referring to the scheme in gure 4, resonance and tic impedance, hereinafter referred to as Z0,vs. matching are achieved for the following condition:

B. Matching network 1 Y = = Y + Y in Z vs mn For maximum power transfer, the input impedance of amp the resonator needs to be matched to the 50 W output jωCtun + Ymn tanh(γmnLmn) = Yvs tanh(γvsLvs) + . (4) of the amplier (Zamp). In IBEX, this is performed with Ymn + jωCtun tanh(γmnLmn) 4

characteristic impedance of the vacuum section and the capacitance introduced by the test electrodes. Matching was achieved through minimization of S11, using the tun- ing capacitance as optimization variable. With respect to the optimal characteristic impedance estimated in section IV A, the maximum voltage in the realistic conguration

is achieved at higher Z0,vs (Figure 6). Due to mechanical constraints, a compromise had to be made between max- imization of the open-end voltage and sucient support FIG. 4: Schematic representation of resonator and of the inner conductor, which is cantilevered from the ce- matching network ramic feedthrough. The inner conductor diameter in the vacuum section of the resonator was thus chosen to be 12 mm, leading to a characteristic impedance of 153 Ω.

L, γ Z0 and Y are respectively the length of the trans- mission line, its propagation constant, its characteristic impedance and the admittance seen from the reference points in gure 4. Subscripts denote the matching net- work, vacuum section and input. For a xed length of the transmission lines, equation 4 has two solutions. The maximum Q in this congura- tion is always achieved for the higher of the two resonant frequencies. Figure 5 represents how the matching con- dition is reached.

FIG. 6: Simulated voltage at the open-end of the resonator and Q factor of transmission line and tuning

capacitor as a function of Z0,vs, for 5 kW input power

The electrode capacitance (Cel) can also signicantly inuence the Q factor, thus the peak voltage achievable.

In particular, the resistance to ground (Rgnd) plays a ma- jor role on the system performances, when considering the capacitance introduced by the test electrodes. For

FIG. 5: Approaching the resonant and maximum power higher Cel, the leakage current to ground is increased, transfer conditions through variation of the tuning reducing the Q factor with a magnitude which depends capacitance. C is varied stepwise until the input on Rgnd. When the electrodes capacitance becomes suf- tun ciently small, Q stabilizes to a value depending on the susceptance (Bin) is zero. Maximum power transfer is achieved when the input impedance at resonance equals quality factor of the tuning capacitor and transmission Z line; this threshold is also conditioned by the resistance amp to ground (gure 7).

C. Circuit analysis

The actual IBEX setup is more complex than the sim- plied schemes used for preliminary design considerations in sections IV A, IV B. The presence of a lumped tun- ing capacitor, changes in characteristic impedance and ceramic supports do not allow for a direct evaluation of the maximum voltage with equation 1. To study the res- onator behaviour and predict the maximum achievable voltage in the realistic setup, a circuit model was devel- FIG. 7: Dependence of quality factor and open-end 11 oped in QucsStudio . Given a xed physical length of voltage on C and R , for Z = 153 Ω the transmission lines, the resonant frequency and the EL GND 0,vs open-end voltage were investigated, depending on the 5

TABLE I: Parameters for microparticle injection studies shows the maximum velocities achievable by tungsten microparticles, accelerated by a 25 kV potential. The ex- Electrode material Stainless steel perimentally observed velocities are in general lower than Microparticles composition Tungsten the estimate given by equation 5, due to the incomplete Microparticles velocity < 1000 m/s charging of particles. Microparticles size 0.5 - 30 µm

V. MICROPARTICLE SOURCE

A. Requirements

Microscopic dust particles are produced in all magnetic connement fusion devices, due to plasma/surface inter- actions. Dust dynamics can be signicantly aected by the edge plasma, accelerating the particles to mean ve- 12 locities exceeding 100 m/s . Hypervelocity dust impact FIG. 8: Maximum velocity of microparticles for V = events have been recorded in tokamaks, even though at 25kV lower rate, indicating that microparticles can reach veloc- ities > 1 km/s13,14. Dust analysis in several machines in- dicate that a dominant fraction of the particles consist of The charging voltage is limited by eld emission and plasma-facing materials, with morphology varying from eld evaporation, respectively for negative and positive 19 spheroids to irregular shapes7. Theoretical modelling charging . Field evaporation of tungsten at room tem- and experimental evidence indicate that microparticles perature occurs in the 5 MV/Å range, whereas discharge accelerated in a high voltage vacuum gap can trigger the of the microparticle due to eld emission happens at one breakdown through a variety of processes. Microparticle order of magnitude lower electric elds. To achieve higher injection experiments, both at hypervelocity15 and low charging (and accelerating) potential and to reduce the velocity16, dened a range of microparticles parameters breakdown probability, microparticles are charged posi- for which the trigger discharge is most likely to occur. tively. The maximum charging voltage achievable, given Considering the typical dust size and velocity observed the eld evaporation limit of 5 MV/Å (Eev), is in tokamaks, experimental ndings regarding micropar- ticle triggered discharges and ICRF antennas materials, EevrT Vmax = , (6) the set of parameters in table I have been dened for k particle injection studies in IBEX. in which k is an amplication factor depending on rT/rP. For the smallest microtip radius considered (5 µm) and the highest rT/rP, the absolute voltage limit B. Design of the dust source is 100 kV. The actual constraint in terms of potential is instead dened by the pulse modulating , capable For particle acceleration up to the velocity range de- of handling a maximum voltage of 30 kV. ned in table I, an electrostatic source17 was developed. A reservoir containing the microparticles and a microtip are kept at high potential. A beam triode allows to switch VI. TEST ELECTRODES the reservoir potential to ground. During this phase the dust is lifted inside the chamber, with a fraction deposit- A. Electrodes for microparticle deposition experiments ing on the charging tip. Here the microparticles acquire a high charge, and upon detachment from the tip are accelerated through a pinhole aperture in the reservoir. Plane-parallel electrode conguration was chosen to in- A grounded extraction plate completes the acceleration, vestigate the eect of microparticle contamination on the leading to an einzel lens for beam focusing. For a charg- breakdown rate. This geometry allows for simple surface preparation with standard grinding and polishing met- ing tip of radius rT and a particle of radius rP < rT , the velocity acquired by the microparticle can be estimated18 allographic techniques. Given the performances foreseen as in equation 5. for IBEX in terms of maximum voltage and experimen- tally observed RF breakdown elds in vacuum20, the gap πV rε r considered is below 2.5 mm. For electrodes diameter of 40 v = 0 T . (5) P r + r ρ r mm and the aforementioned spacing, the eld enhance- P T P ment at the edges is not extremely pronounced. There- This assuming, as in the setup above, that the accel- fore, a Borda prole was chosen to minimize the edge ef- erating and charging voltages (V) are equal. Figure 8 fect (gure 9) and to maintain a more compact footprint 6 with respect to Rogowski and Bruce proles. A smaller size was desirable to lower the stress on the cantilevered inner conductor of the resonator and due to limitations on the sample dimensions allowed in the Scanning Elec- tron Microscope (SEM).

FIG. 11: Electrodes capacitance for the two congurations considered

Due to the small surface area, Q factor degradation can be neglected for the point-plane conguration. On FIG. 9: Normalized surface electric eld distribution for the other hand, the plane-parallel electrodes introduce dierent electrodes spacing a large capacitance for the whole range of spacing con- sidered. To avoid a signicant decrease of performances, particular care will need to be taken for minimization of the RF resistance to ground in the case of microparticle deposition experiments. B. Electrodes for microparticle injection experiments

To provide an impact surface for the microparticles VII. DIAGNOSTIC FOR FIELD EMISSION CURRENT injected from the dust accelerator, which is installed or- thogonally with respect to the axis of the resonator, a A. Field emission current in RF regime point-plane electrode conguration is used. The pointed electrode is a truncated cone terminating in a 2 mm diam- eter hemisphere. Figure 10 represents the two geometries For suciently high surface electric eld, electrons can chosen for experiments. tunnel through the potential barrier and give rise to a eld emitted current. In high voltage vacuum systems, this current controls fundamental parameters of arc for- mation such as eld emitter evaporation and Coulomb C. Capacitance of the test electrodes explosion, thus playing a major role as precursor to the breakdown21. The Fowler-Nordheim expression provides Following the considerations of section IV C, capaci- the eld emission current density for a given work func- tance of the two electrode congurations has been com- tion (φ), macroscopic electric eld (E) and enhancement puted with nite element method (gure 11). factor (β). The simplied expression given by Wang and Loew22 reads:

−0.5 1.54 · 10−6 · 104.52φ (βE)2 j = FE φ −6.53 · 109φ1.5  exp . (7) βE (a) Plane-parallel conguration Since the tunnelling time is extremely short with re- spect to the RF period, it can be assumed that the eld emission process is the same as in the DC regime. Thus, if a time-varying electric eld is applied to a plane-parallel electrode conguration, current will be eld emitted al- ternately from the two electrodes for the negative half period, responding to the instantaneous electric eld. If (b) Point-plane conguration contaminants are introduced, there is a probability that they will turn into eld emitters, thus increasing - and FIG. 10: Test electrodes β emitting area - for a specic electrode. 7

B. Current-measurement circuit B. RF resistance to ground

To measure the eld emission current in the nA range, The Q factor of the resonator was measured for vary- a device consisting of a low-pass lter followed by a ing CEL, to investigate the eect of its degradation in high gain transimpedance amplier was developed. The relation with the magnitude of RF resistance to ground. voltage output - proportional to the average eld emis- To observe the eect over a large range of capacitances, sion current over one RF period - is then monitored two electrodes sets have been used: through a low noise multimeter with large dynamic range. ˆ plane-parallel electrodes: C 1pF The current-measurement circuit is connected to the res- EL & onator through the bias-tee (gure 1-D), which provides ˆ plane-sphere electrodes: C 1pF RF insulation. The additional low-pass lter is used prior EL . to the transimpedance amplier to reduce the RF input Figure 13 shows the measured Q factor, in comparison signal below the noise oor level. Given the extreme with the results obtained from simulations. Referring to sensitivity of eld emission on the local electric eld, a the capacitance of the test electrodes considered (gure variation of 1% between the two β already leads to a neg- 11), it is clear that for the plane-parallel conguration ligible current emitted from the electrode with the lower the RF resistance to ground will need to be reduced, to value (gure 12). In principle it will thus be possible to avoid excessive degradation of Q. discriminate the eld emitting electrode with this setup.

FIG. 13: Measured Q factor with varying electrodes FIG. 12: Field emission current during one RF period capacitance, and comparison with simulated values on plane-parallel conguration, with dierent β on the two electrodes

C. Multipactor

Multipactor can be used as a conditioning tool to re- move adsorbed contaminants from the electrodes. The VIII. PRELIMINARY TESTS ON IBEX currents generated from ionization of the desorbed gases, which aect the eld emission measurements, can then be suppressed. A. Measurement of Q factor

Quality factor measurements were carried out on IBEX to compare the simulated results with the actual setup performances. The loaded Q was computed from the S11 parameter, measured with a network analyzer. Central frequency is determined from the minimum of S11 am- plitude, whereas the -3dB points are found as maximum and minimum of S11 imaginary part, after correction of the phase oset in the Smith chart. The maximum Q factor, i.e. measured without the loading eect intro- duced by the electrodes capacitance, is 830. This value FIG. 14: Multipactor current measured with an electron is 83% of the simulated Q, leading to a reduction of 10% probe biased at 100 V, positioned at the open-end of on the maximum achievable voltage at the open end with the resonator respect to the value obtained from circuit analysis. 8

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