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Bi-41X Serial Bus Test Instruments

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Bi-41X Serial Bus Test Instruments Bi-41x Serial Bus Test Instruments Bi4-Series™ Multiple Module Serial Bus Test Instrument KEY FEATURES ½ High density tester-per-pin architecture ½ Four independent programmable bi-directional modules on one VXI C-Size card ½ Reconfigurable bus protocols and parametrics ½ Bus emulation for MIL-STD-1553, RS232, RS422, RS485, ARINC429 and more ½ Model-based serial bus test capability ½ No external elec- tronics, no custom circuitry and no compromises eradyne offers a breakthrough in serial bus The functional test capabilities promised by Ttest and emulation with the Bi4-Series of Teradyne’s core system instrumentation Bus Test Instruments (BTI). Now, the full (CSi) technology are field-proven in a wide power of factory and depot level testing can be range of both military and commercial appli- deployed at all echelons of support using cations. Teradyne's revolutionary synthetic tester-per- Teradyne’s high-performance instruments pin subsystem architecture. have been integrated in test equipment sup- The Bi4-Series offers Teradyne's latest inno- plied to the U.S. Department of Defense, vation in capabilities for functional test. In including the U.S. Marine Corps, U.S. Air a compact format, BTI combines superior Force, U.S. Army and the U.S. Navy. They are performance with all the advantages of a also designed into a number of third-party test standard, commercial-off-the-shelf (COTS) systems. solution, including architecture-flexibility, configurablity, high reliability, and lower Tester-Per Pin Architecture acquisition and lifecycle costs. Teradyne's Bi4-Series subsystem is the With industry-compliant, standards-based industry's first instrument designed specif- software drivers and hardware, Bi4-Series Bus ically to address the unique requirements of Test Instrument capabilities are more easily real-time bus test and emulation at func- deployable for integration in any support role. tional test. A Breakthrough in Test with Flexible Bus Module Architecture ½ Simultaneous ½ Flexible pin elec- transmit and tronics provides receive on every signal conditioning bus module for most bus pro- ½ Handshake, trigger tocols and clock on every module With an innovative load-and-forget pro- capable of operating in single-ended mode. gramming environment, native support Bus Testing Options On Every for popular buses and the flexibility to emu- Module late custom buses or variations of standard buses, each of the four bus modules gives you Other features such as passive loads and the option to emulate any bus at any time adjustable slew rates are available to each with no external circuitry. driver. The main driver contains termina- tion circuitry to provide selectable output Flexible Serial Bus Testing impedance, termination voltages, and resist- Capability ance. All drivers and receivers have relayed The Bi4-Series uses CSi technology to provide disconnects to provide full isolation. the ultimate in flexibility for both board and The transmitter is capable of sending more box level testing. Using the Bi4-Series architec- than just data. For instance, it can send bit ture ensures complete communications bus errors, symbol errors, parity errors, and tim- access without the need to reconfigure the test ing errors can be inserted into the outgoing system for each application. Each BTI has data stream. Both the outgoing and incoming four independent bus modules that support data streams can be logged together with the MIL-STD-1553, TIA/EIA-RS-232, TIA/EIA- RS-422, TIA/EIA-RS-485, H009, ARINC timing stamp for each word. Microcontroller 429, MIC/UBIC, CAN II, and more. With the intelligence performs jumps, loops, handle Bi4-Series there is no need for external elec- interrupts and allow both recirculating and tronics, no need for custom circuitry and no asynchronous messages. need for compromises. Flexible Programming Techniques for Easy Test Integration Full Bi-Directional Differential Signal Capability The Bi4-Series driver provides two levels of Every bus module has the capability to trans- programming. The high level interface mit, receive, and record bus data in real-time. option hides many of the details associated This gives the instrument complete flexibility with bus programming and performs tasks to interact with a bus system in any capacity, that apply to specific bus types; for exam- such as an emulator, a controller, or a moni- ple, MIL-STD-1553 or ARINC 429. The tor. If more than four bus models are required lower level interface option is designed to simultaneously for a particular system, a single allow users maximum flexibility in creating VXI chassis may be configured with more a test for any bus protocol that can be sup- than one BTI. ported by Bi4-Series hardware. Bus model definitions of various protocols are provid- Each bus module contains a primary differ- ed in XML files. ential driver and receiver, plus three sets of drivers and receivers for miscellaneous func- Phase Synchronous Operation tions such as triggering and handshaking. The A unique architectural advantage designed main differential drivers are truly differential into Teradyne's Bi4-Series is full inter-module over the full operating range, and are also triggering. Each module can share trigger Easy Program Integration & Intuitive Software Development Tools events with other modules to provide a TestStudio Provides Test highly reliable triggering mechanism used Development and Execution across a wide variety of bus test applications, TestStudio, Teradyne’s open-architecture ATE including custom bus definitions. operating software environment, provides a flexible and modular approach for managing The VXIplug&play™ software driver pro- the test development process. vides a soft front panel, programming interfaces for all Microsoft Windows 2000™ Programming of signal functions within and Windows XP™ applications develop- TestStudio is an easy as a push of a button ment environments (ADEs), a graphical test with the web-based user interface. Tests are development environment, and a graphical bus model editor. ½ Soft front panel (SFP) provides a convenient interface for performing self- test and viewing bus test log files. TestStudio inte- ½ Applications programming interface (API) gration makes provides access to the Bi4-Series hard- test develop- ware and supports the popular ADEs, ment quick and including National Instruments LabView/ easy LabWindows™, Agilent VEE Pro™ and Microsoft's programming tools. Faster Programming and Debugging Environment and Bus Model Editor Rapid test program development starts with the Bi4-Series full feature software driver and intuitive graphical user interfaces. Given the complexity of today's serial bus test require- ments, fast programming development response to system changes are critical to a project's success. Industry Standard Format, Breakthrough Architecture The Bi4-Series is fully compliant with C-size VXI standard (IEEE Std 1155-1992) interface specifications. The VXI bus supports external defined within TestStudio as high-level appli- communications, including synchronization cations functions, such as “send a message and triggering for precision digital testing. using Channel2 to Unit under Test Pin 5.” Model-Based Programming for Rapid Teradyne provides the means to minimize Test Deployment complex programming steps with fast test program development and repeatable results. The Bi4-Series revolutionary programming architecture uses the latest object-oriented Flexible Data Collection and Repair programming methods to provide a point Services solution for most bus protocols. Once a pro- TestStudio also provides connectivity to repair tocol model and parametric definition is facilities for intelligent diagnostic and auto- loaded into a module, tests are written using mated data collection to meet the challenges that bus-specific terminology. of today’s mobile functional test environ- ments. Teradyne has 45 years of experience ½ Confidence testing automatically ½ Error Injection & Detection in the test business to ensuring the verifies functionality in less than one ½ Programmable delays, word/mes- reliability of the Bi4-Series and mini- minute to confirm basic instrument sage gaps, and timeouts ½ Programmable Frames and Data mizing support costs: capabilities. ½ lists ½ Shake and vibration testing and elec- Self-test software isolates instrument ½ Real-time Parity & 16 Bit CRC ½ trical stress testing ensures that the failures to a single line-replaceable Time Stamping Bi-41x is rugged enough for ship- unit (LRU), a process that takes Analog Signal Capabilities minutes. board or mobile environments. ½ T/R Differential ½ Rigorous reliability testing maxi- Onboard Calibration Hardware and ½ 2 Bi-Direction Handshake ½ 1 Ext Clock In mizes mean time between failures Software ½ (MTBF) 1 Clock out Instrument calibration can be per- ½ ½ Trigger In/Out High-density packaging reduces the formed semi-automatically in the ½ Slew Rate Control (.5-500V/ms) number of components and inter- field by connecting NIST-traceable ½ +/- 12V, (18-37V 1553) connections. instrument standards to a front- ½ Transformer/Direct Coupling ½ Output impedance -5 to 100 Bus Model & Protocol Specific API panel connector. The Bi-41x driver and SFP package includes calibration Ohms, selectable Support Provided for: ½ Term: 25 to 100 Ohms, selectable routines to make it easy to insure ½ MIL-STD-1553 A/B, ARINC 429, your system remains in calibration. Load: 1k to 8k Ohms, selectable ARINC 573, H009, RS-232, RS- ½ V Swing 0.9 to 24 V 422, RS-423, RS-485,
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