4. Fresnel and Fraunhofer Diffraction
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Path Loss, Delay Spread, and Outage Models As Functions of Antenna Height for Microcellular System Design
IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, VOL. 43, NO. 3, AUGUST 1994 487 Path Loss, Delay Spread, and Outage Models as Functions of Antenna Height for Microcellular System Design Martin J. Feuerstein, Kenneth L. Blackard, Member, IEEE, Theodore S. Rappaport, Senior Member, IEEE, Scott Y. Seidel, Member, IEEE, and Howard H. Xia Abstract-This paper presents results of wide-band path loss be encountered in a microcellular system using lamp-post- and delay spread measurements for five representative microcel- mounted base stations at street comers, Measurement locations Mar environments in the San Francisco Bay area at 1900 MHz. were chosen to coincide with places where microcellular Measurements were made with a wide-band channel sounder using a 100-ns probing pulse. Base station antenna heights of systems will likely be deployed in urban and suburban areas. 3.7 m, 8.5 m, and 13.3 m were tested with a mobile receiver The power delay profiles recorded at each receiver lo- antenna height of 1.7 m to emulate a typical microcellular cation were used to calculate path loss and delay spread. scenario. The results presented in this paper provide insight into Path loss and delay spread are two important methods of the satistical distributions of measured path loss by showing the characterizing channel behavior in a way that can be related validity of a double regression model with a break point at a distance that has first Fresnel zone clearance for line-of-sight to system performance measures such as bit error rate [4] topographies. The variation of delay spread as a function of and outage probability [7]. -
Phase Retrieval Without Prior Knowledge Via Single-Shot Fraunhofer Diffraction Pattern of Complex Object
Phase retrieval without prior knowledge via single-shot Fraunhofer diffraction pattern of complex object An-Dong Xiong1 , Xiao-Peng Jin1 , Wen-Kai Yu1 and Qing Zhao1* Fraunhofer diffraction is a well-known phenomenon achieved with most wavelength even without lens. A single-shot intensity measurement of diffraction is generally considered inadequate to reconstruct the original light field, because the lost phase part is indispensable for reverse transformation. Phase retrieval is usually conducted in two means: priori knowledge or multiple different measurements. However, priori knowledge works for certain type of object while multiple measurements are difficult for short wavelength. Here, by introducing non-orthogonal measurement via high density sampling scheme, we demonstrate that one single-shot Fraunhofer diffraction pattern of complex object is sufficient for phase retrieval. Both simulation and experimental results have demonstrated the feasibility of our scheme. Reconstruction of complex object reveals depth information or refraction index; and single-shot measurement can be achieved under most scenario. Their combination will broaden the application field of coherent diffraction imaging. Fraunhofer diffraction, also known as far-field diffraction, problem12-14. These matrix complement methods require 4N- does not necessarily need any extra optical devices except a 4 (N stands for the dimension) generic measurements such as beam source. The diffraction field is the Fourier transform of Gaussian random measurements for complex field15. the original light field. However, for visible light or X-ray Ptychography is another reliable method to achieve image diffraction, the phase part is hardly directly measurable1. with good resolution if the sample can endure scanning16-19. Therefore, phase retrieval from intensity measurement To achieve higher spatial resolution around the size of atom, becomes necessary for reconstructing the original field. -
Fresnel Diffraction.Nb Optics 505 - James C
Fresnel Diffraction.nb Optics 505 - James C. Wyant 1 13 Fresnel Diffraction In this section we will look at the Fresnel diffraction for both circular apertures and rectangular apertures. To help our physical understanding we will begin our discussion by describing Fresnel zones. 13.1 Fresnel Zones In the study of Fresnel diffraction it is convenient to divide the aperture into regions called Fresnel zones. Figure 1 shows a point source, S, illuminating an aperture a distance z1away. The observation point, P, is a distance to the right of the aperture. Let the line SP be normal to the plane containing the aperture. Then we can write S r1 Q ρ z1 r2 z2 P Fig. 1. Spherical wave illuminating aperture. !!!!!!!!!!!!!!!!! !!!!!!!!!!!!!!!!! 2 2 2 2 SQP = r1 + r2 = z1 +r + z2 +r 1 2 1 1 = z1 + z2 + þþþþ r J þþþþþþþ + þþþþþþþN + 2 z1 z2 The aperture can be divided into regions bounded by concentric circles r = constant defined such that r1 + r2 differ by l 2 in going from one boundary to the next. These regions are called Fresnel zones or half-period zones. If z1and z2 are sufficiently large compared to the size of the aperture the higher order terms of the expan- sion can be neglected to yield the following result. l 1 2 1 1 n þþþþ = þþþþ rn J þþþþþþþ + þþþþþþþN 2 2 z1 z2 Fresnel Diffraction.nb Optics 505 - James C. Wyant 2 Solving for rn, the radius of the nth Fresnel zone, yields !!!!!!!!!!! !!!!!!!! !!!!!!!!!!! rn = n l Lorr1 = l L, r2 = 2 l L, , where (1) 1 L = þþþþþþþþþþþþþþþþþþþþ þþþþþ1 + þþþþþ1 z1 z2 Figure 2 shows a drawing of Fresnel zones where every other zone is made dark. -
Line-Of-Sight-Obstruction.Pdf
App. Note Code: 3RF-E APPLICATION NOT Line of Sight Obstruction 6/16 E Copyright © 2016 Campbell Scientific, Inc. Table of Contents PDF viewers: These page numbers refer to the printed version of this document. Use the PDF reader bookmarks tab for links to specific sections. 1. Introduction ................................................................ 1 2. Fresnel Zones ............................................................. 4 3. Fresnel Zone Clearance ............................................. 6 4. Effective Earth Radius ............................................... 7 5. Signal Loss Due to Diffraction .................................. 9 6. Conclusion ............................................................... 10 Figures 1-1. Wavefronts with 180° Phase Shift ....................................................... 2 1-2. Multipath Reception ............................................................................. 2 1-3. Totally Obstructed LOS ....................................................................... 3 1-4. Knife-Edge Type Obstruction .............................................................. 4 2-1. Fresnel Zones ....................................................................................... 5 3-1. Effective Ellipsoid Shape ..................................................................... 6 3-2. Path Profile Traversing Uneven Terrain with Knife-Edge Obstruction ....................................................................................... 7 5-1. Diffraction Parameter .......................................................................... -
Fraunhofer Diffraction Effects on Total Power for a Planckian Source
Volume 106, Number 5, September–October 2001 Journal of Research of the National Institute of Standards and Technology [J. Res. Natl. Inst. Stand. Technol. 106, 775–779 (2001)] Fraunhofer Diffraction Effects on Total Power for a Planckian Source Volume 106 Number 5 September–October 2001 Eric L. Shirley An algorithm for computing diffraction ef- Key words: diffraction; Fraunhofer; fects on total power in the case of Fraun- Planckian; power; radiometry. National Institute of Standards and hofer diffraction by a circular lens or aper- Technology, ture is derived. The result for Fraunhofer diffraction of monochromatic radiation is Gaithersburg, MD 20899-8441 Accepted: August 28, 2001 well known, and this work reports the re- sult for radiation from a Planckian source. [email protected] The result obtained is valid at all temper- atures. Available online: http://www.nist.gov/jres 1. Introduction Fraunhofer diffraction by a circular lens or aperture is tion, because the detector pupil is overfilled. However, a ubiquitous phenomenon in optics in general and ra- diffraction leads to losses in the total power reaching the diometry in particular. Figure 1 illustrates two practical detector. situations in which Fraunhofer diffraction occurs. In the All of the above diffraction losses have been a subject first example, diffraction limits the ability of a lens or of considerable interest, and they have been considered other focusing optic to focus light. According to geo- by Blevin [2], Boivin [3], Steel, De, and Bell [4], and metrical optics, it is possible to focus rays incident on a Shirley [5]. The formula for the relative diffraction loss lens to converge at a focal point. -
Optics of Gaussian Beams 16
CHAPTER SIXTEEN Optics of Gaussian Beams 16 Optics of Gaussian Beams 16.1 Introduction In this chapter we shall look from a wave standpoint at how narrow beams of light travel through optical systems. We shall see that special solutions to the electromagnetic wave equation exist that take the form of narrow beams – called Gaussian beams. These beams of light have a characteristic radial intensity profile whose width varies along the beam. Because these Gaussian beams behave somewhat like spherical waves, we can match them to the curvature of the mirror of an optical resonator to find exactly what form of beam will result from a particular resonator geometry. 16.2 Beam-Like Solutions of the Wave Equation We expect intuitively that the transverse modes of a laser system will take the form of narrow beams of light which propagate between the mirrors of the laser resonator and maintain a field distribution which remains distributed around and near the axis of the system. We shall therefore need to find solutions of the wave equation which take the form of narrow beams and then see how we can make these solutions compatible with a given laser cavity. Now, the wave equation is, for any field or potential component U0 of Beam-Like Solutions of the Wave Equation 517 an electromagnetic wave ∂2U ∇2U − µ 0 =0 (16.1) 0 r 0 ∂t2 where r is the dielectric constant, which may be a function of position. The non-plane wave solutions that we are looking for are of the form i(ωt−k(r)·r) U0 = U(x, y, z)e (16.2) We allow the wave vector k(r) to be a function of r to include situations where the medium has a non-uniform refractive index. -
Angular Spectrum Description of Light Propagation in Planar Diffractive Optical Elements
Angular spectrum description of light propagation in planar diffractive optical elements Rosemarie Hild HTWK-Leipzig, Fachbereich Informatik, Mathematik und Naturwissenschaften D-04251 Leipzig, PF 30 11 66 Tel.: 49 341 5804429 Fax:49 341 5808416 e-mail:[email protected] Abstract The description of the light propagation in or between planar diffractive optical elements is done with the angular spec- trum method. That means, the confinement to the paraxial approximation is removed. In addition it is not necessary to make a difference between Fraunhofer and Fresnel diffraction as usually done by the solution of the of the Rayleigh Sommerfeld formula. The diffraction properties of slits of varying width are analysed first. The transitional phenomena between Fresnel and Fraunhofer diffraction will be discussed from the view point of metrology. The transition phenomena is characterised as a problem of reduced resolution or low pass filtering in free space propagation. The light distributions produced by a plane screen , including slits, line and space structures or phase varying structures are investigated in detail. Keywords: Optical Metrology in Production Engineering, Photon Management- diffractive optics, microscopy, nanotechnology 1. Introduction The knowledge of the light intensity distributions that are created by planar diffractive optical elements is very important in modern technologies like microoptics, the optical lithography or in the combination of both techniques 1. The theoretical problem consists in the description of the imaging properties of small optical elements or small diffrac- tion apertures up to the region of the wave length. In general the light intensities created in free space or optical media by such elements, are calculated with the solution of the diffraction integral. -
Optimal Focusing Conditions of Lenses Using Gaussian Beams
BNL-112564-2016-JA File # 93496 Optimal focusing conditions of lenses using Gaussian beams Juan Manuel Franco, Moises Cywiak, David Cywiak, Mourad Idir Submitted to Optics Communications June 2016 Photon Sciences Department Brookhaven National Laboratory U.S. Department of Energy USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22) Notice: This manuscript has been authored by employees of Brookhaven Science Associates, LLC under Contract No. DE- SC0012704 with the U.S. Department of Energy. The publisher by accepting the manuscript for publication acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. 1 DISCLAIMER This report was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government nor any agency thereof, nor any of their employees, nor any of their contractors, subcontractors, or their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or any third party’s use or the results of such use of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise, does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof or its contractors or subcontractors. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof. -
Chapter on Diffraction
Chapter 3 Diffraction While the particle description of Chapter 1 works amazingly well to understand how ra- diation is generated and transported in (and out of) astrophysical objects, it falls short when we investigate how we detect this radiation with our telescopes. In particular the diffraction limit of a telescope is the limit in spatial resolution a telescope of a given size can achieve because of the wave nature of light. Diffraction gives rise to a “Point Spread Function”, meaning that a point source on the sky will appear as a blob of a certain size on your image plane. The size of this blob limits your spatial resolution. The only way to improve this is to go to a larger telescope. Since the theory of diffraction is such a fundamental part of the theory of telescopes, and since it gives a good demonstration of the wave-like nature of light, this chapter is devoted to a relatively detailed ab-initio study of diffraction and the derivation of the point spread function. Literature: Born & Wolf, “Principles of Optics”, 1959, 2002, Press Syndicate of the Univeristy of Cambridge, ISBN 0521642221. A classic. Steward, “Fourier Optics: An Introduction”, 2nd Edition, 2004, Dover Publications, ISBN 0486435040 Goodman, “Introduction to Fourier Optics”, 3rd Edition, 2005, Roberts & Company Publishers, ISBN 0974707724 3.1 Fresnel diffraction Let us construct a simple “Camera Obscura” type of telescope, as shown in Fig. 3.1. We have a point-source at location “a”, and we point our telescope exactly at that source. Our telescope consists simply of a screen with a circular hole called the aperture or alternatively the pupil. -
Fraunhofer Diffraction with a Laser Source
Second Year Laboratory Fraunhofer Diffraction with a Laser Source L3 ______________________________________________________________ Health and Safety Instructions. There is no significant risk to this experiment when performed under controlled laboratory conditions. However: • This experiment involves the use of a class 2 diode laser. This has a low power, visible, red beam. Eye damage can occur if the laser beam is shone directly into the eye. Thus, the following safety precautions MUST be taken:- • Never look directly into the beam. The laser key, which is used to switch the laser on and off, preventing any accidents, must be obtained from and returned to the lab technician before and after each lab session. • Do not remove the laser from its mounting on the optical bench and do not attempt to use the laser in any other circumstances, except for the recording of the diffraction patterna. • Be aware that the laser beam may be reflected off items such as jewellery etc ______________________________________________________________ 26-09-08 Department of Physics and Astronomy, University of Sheffield Second Year Laboratory 1. Aims The aim of this experiment is to study the phenomenon of diffraction using monochromatic light from a laser source. The diffraction patterns from single and multiple slits will be measured and compared to the patterns predicted by Fourier methods. Finally, Babinet’s principle will be applied to determine the width of a human hair from the diffraction pattern it produces. 2. Apparatus • Diode Laser – see Laser Safety Guidelines before use, • Photodiode, • Optics Bench, • Traverse, • Box of apertures, • PicoScope Analogue to Digital Converter, • Voltmeter, • Personal Computer. 3. Background (a) General The phenomenon of diffraction occurs when waves pass through an aperture whose width is comparable to their wavelength. -
Huygens Principle; Young Interferometer; Fresnel Diffraction
Today • Interference – inadequacy of a single intensity measurement to determine the optical field – Michelson interferometer • measuring – distance – index of refraction – Mach-Zehnder interferometer • measuring – wavefront MIT 2.71/2.710 03/30/09 wk8-a- 1 A reminder: phase delay in wave propagation z t t z = 2.875λ phasor due In general, to propagation (path delay) real representation phasor representation MIT 2.71/2.710 03/30/09 wk8-a- 2 Phase delay from a plane wave propagating at angle θ towards a vertical screen path delay increases linearly with x x λ vertical screen (plane of observation) θ z z=fixed (not to scale) Phasor representation: may also be written as: MIT 2.71/2.710 03/30/09 wk8-a- 3 Phase delay from a spherical wave propagating from distance z0 towards a vertical screen x z=z0 path delay increases quadratically with x λ vertical screen (plane of observation) z z=fixed (not to scale) Phasor representation: may also be written as: MIT 2.71/2.710 03/30/09 wk8-a- 4 The significance of phase delays • The intensity of plane and spherical waves, observed on a screen, is very similar so they cannot be reliably discriminated – note that the 1/(x2+y2+z2) intensity variation in the case of the spherical wave is too weak in the paraxial case z>>|x|, |y| so in practice it cannot be measured reliably • In many other cases, the phase of the field carries important information, for example – the “history” of where the field has been through • distance traveled • materials in the path • generally, the “optical path length” is inscribed -
Monte Carlo Ray-Trace Diffraction Based on the Huygens-Fresnel Principle
Monte Carlo Ray-Trace Diffraction Based On the Huygens-Fresnel Principle J. R. MAHAN,1 N. Q. VINH,2,* V. X. HO,2 N. B. MUNIR1 1Department of Mechanical Engineering, Virginia Tech, Blacksburg, VA 24061, USA 2Department of Physics and Center for Soft Matter and Biological Physics, Virginia Tech, Blacksburg, VA 24061, USA *Corresponding author: [email protected] The goal of this effort is to establish the conditions and limits under which the Huygens-Fresnel principle accurately describes diffraction in the Monte Carlo ray-trace environment. This goal is achieved by systematic intercomparison of dedicated experimental, theoretical, and numerical results. We evaluate the success of the Huygens-Fresnel principle by predicting and carefully measuring the diffraction fringes produced by both single slit and circular apertures. We then compare the results from the analytical and numerical approaches with each other and with dedicated experimental results. We conclude that use of the MCRT method to accurately describe diffraction requires that careful attention be paid to the interplay among the number of aperture points, the number of rays traced per aperture point, and the number of bins on the screen. This conclusion is supported by standard statistical analysis, including the adjusted coefficient of determination, adj, the root-mean-square deviation, RMSD, and the reduced chi-square statistics, . OCIS codes: (050.1940) Diffraction; (260.0260) Physical optics; (050.1755) Computational electromagnetic methods; Monte Carlo Ray-Trace, Huygens-Fresnel principle, obliquity factor 1. INTRODUCTION here. We compare the results from the analytical and numerical approaches with each other and with the dedicated experimental The Monte Carlo ray-trace (MCRT) method has long been utilized to results.