Gated ICCD Camera Series Ideal for Imaging Extreme Low Light Fast Phenomena!
Gated ICCD Camera Series Ideal for imaging extreme low light fast phenomena!
Applications
Visualization of discharge and plasma phenomena Observation of fuel spray and combustion state in engine Study of laser ablation Observation of shock waves Study of high-speed phenomena in laser fusion Analysis of inkjet discharge Discharge of xexon lamp
Captures extreme low light ultrafast phenomena.
Gated ICCD camera series are highy sensitivity cameras capable of high speed gate operation (high speed shutter) to capture images of transient phenomena. Coupling a CCD camera to an image intensifier (or I.I.) High High speed captures instantaneous high speed transient phenomena or sensitivity gate instantaneous phenomena occurring with low-level light emission. operoperationation The variety of products best meets your needs of gate time, resolution or spectral sensitivity characteristics.
Features
Super high speed gating to a minimum of 5 ns Allows time-resolved imaging of ultrafast phenomenon in the subnanosecond range. Time-resolved imaging made simple by an auto-delay function Makes your time-resolved imaging easy by programming any desired sampling time period. DIC mode captures 2 image frames at super high speed (C11370-11-2) Capable of capturing 2 consecutive frames with a 1 μs interval. Simultaneous imaging on up to 4 channels (option) Captures up to 4 image frames at a minimum 5 ns interval in a single shot. Also simultaneously captures images at 4 different wavelengths. Captures digital (12 bits) images Low noise digital CCD camera delivers images with a high S/N ratio. High sensitivity with a quantum efficiency of 50 % (GaAsP) Photon counting for spectrum measurement at super high sensitivity
C11370-10-1 C11370-10-3 (Camera: C8484-05G/C8484-05C) (Camera: C10600-10B) 2 Selection Select from a wide product range to match your application
Specifications
Model Number C11370-10-1 C11370-20-1 C11370-30-1 C11370-11-2 Features High resolution Enhanced near infrared sensitivity Enhanced visible sensitivity DIC operation Minimum gate time 5 ns 10 ns Spectral response characteristics 160 nm to 900 nm 370 nm to 920 nm 280 nm to 720 nm 185 nm to 850 nm Photocathode Multialkali GaAs GaAsP Multialkali Number of CCD pixels 1344×1024 1344×1024 Image intensifier resolution 64 lp/mm 57 lp/mm 57 lp/mm 57 lp/mm Gate repetition*1 200 kHz 50 kHz Frame rate 8 Hz 1 MHz*2 Output 12 bit digital Data analyzer*3 C6808-36, -37 C6808-51, -52 *1 It is different from the number of the shot frames. *2 It takes the 2 consecutive frames only. *3 Optional * Effective area size C11370-X0-1, C11370-11-2: 13.0 mm × 9.907 mm (X=1, 2, 3)
Spectral sensitivity range Spectral response characteristic graph 100 Frame rate: 8 Hz GaAsP Multialkali GaAs C11370-10-1
C11370-20-1 10
C11370-30-1
Frame rate: 1 MHz C11370-11-2 1
200 400 600 800 1000 Wavelength (nm) Quantum efficiency (%) Quantum efficiency 0.1
0.01 200 400 600 800 1000 Wavelength (nm)
The specification are available below.
Description of model name C11370- - 1 2 3
1 Photocathode 2 The number of MCP / Phosphor screen 3 CCD Camera 1 Photocathode 2 The number of MCP Phospher screen 3 CCD Camera 1 Multialkali 0 1 P43 - No Camera 2 GaAs 1 1 P46 1 C8484-05G 3 GaAsP 5 2 P43 2 C8484-05C 3 C10600-10B
3 Basic operating principle / Measurement technique examples
Basic operating principle
High-speed gated ICCD cameras are high-sensitivity CCD cameras that feature high-speed gate High High speed operation (high shutter speed). The image intensifier (or I.I.) coupled to a CCD camera enables high- speed gating along with high-sensitivity imaging. ICCD cameras can capture instantaneous action of sensitivity gate operoperationation high-speed phenomena as well as the faint light that occurs in instantaneous phenomena. They can also offer time-resolved imaging of reproducible phenomena by programming the gate delay timing.
I.I. ( Image Intensifier) Photons are converted to electrons at the photocathode. MCP Channel Structure of MCP Output electrons After the electrons are multiplied to several thousands, (thousands times) Incident electron Channel wall e e e e e e e e e e the electrons are converted back to photons again. e e e e e e e e e e e e e e e e e e e e e e e e e e e e e e e Phospher e e e e e e e e e e screen Fiber optics e e e e e e e e e e Photocathode MCP e e e e e e e e e e e e e e e e e e e e VD e e e e e e e e e e e e e e e e e e e e e e e e e e e e e e
Amplification of an image is accomplished using an MCP built e P P P P e e P P inside the image intensifier (I.I.). Each channel in the MCP is a secondary electron multiplier, multiplying electrons with each bounce off the channel wall.
Gate operation Operating principle of gate This is a fast shutter function. This gating which is synchronized Photocathode MCP Phospher Photocathode MCP Phospher with trigger input can allow us to capture fast phenomenon. screen screen
e P P e P e Phospher e P screen Fiber optics e P Photocathode MCP P e P e e P e P e P e P e P
0 V
e P P P P e -200 V e P P Gate operation is performed by reversing the potential between the photocathode and anode. A high-speed Gate signal squarewave voltage signal is applied. The width of this Synchronizing squarewave determines the gate time (shutter speed).
Measurement technique examples
1 When measuring repetitive phenomena, time-resolved imaging Time-resolved imaging can be performed by shifting the gate delay timing automatically using sampling method according to a user-programmed scheme.
2 When the target phenomenon is buried in background light, the Eliminating background gating timing can be synchronized to match the target by high-speed gating phenomenon to create clear images with high signal-to-noise ratio.
3 Capturing fluorescence This technique captures fluorescence images of samples of (scattering) images interest and its cross section by synchronizing the timing with a by using a pulsed laser pulsed laser or excitation light source.
4 Capturing high-speed Dual Image Capture (DIC) mode can capture 2 consectutive frames at a 1 μs interval using just one camera. This mode is images of 2 consecutive ideal for high-speed imaging of non-repeatable events. This frames by DIC mode option is available on C11370-11-2. 4 Measurement examples
Visualization of CF2 by LIF in a high frequency plasma
A plasma is generated by applying high frequency waves of 150 MHz to 6 mm in diameter alumina electrodes placed at a gap of 1 mm in a gas mixture (1 atm pressure) of He (99 %) and CF (1 %). (Excitation wavelength: 261.77 nm, gate width: 50 ns, optical filter spectral transmittance: 280 nm to 370 nm)
▲The illustration which saw the electrode from the side. Left figure is ultraviolet light image in square region. Green region shows plasma of 500 μm gap.
▲LIF image of 1 mm gap ▲LIF image of 500 μm gap ▲Position relation of gap and a plasma (Subtracted background plasma emission) emission distribution
(Data courtesy of Dr. Y. Oshikane, Division of Precision Science and technology and Applied Physics, Graduate School of Engineering, Osaka University, Japan) Spontaneous emission from radicals in burner flame
50 OH CH C2 306.3 nm 431.4 nm 516.5 nm CH, 431.4 nm C2, 516.5 nm 40
30 OH, 306.4 nm
20
10
Emission intensity (a.u.)
0 350 400 450 500 550 600 650 700 Wavelength (nm) ▲ Spontaneous emission of radical from bunsen burner flame ▲Spontaneous emission spectra of radical from bunsen burner flame. Fuel: Liquefied petroleum gas Fuel: Liquefied petroleum gas. Exposure time: 10 ms
Observation of positive nanosecond pulse discharges in atmospheric air
Reference T ns T + 1 ns T + 2 ns T + 4 ns
(Data courtesy: Dr. Takao Namihira, Department of Electrical and Computer Engineering, Faculty of Engineering, Kumamoto University, Japan)
5 Application examples
Multi-channel measurements
Chamber Camera A Controller Bidirectional simultaneous imaging I.I. CONTROLLER C7970-01
PROTECT/ TRIG.IN Bidirectional simultaneous imaging ERROR TTL/50Ω
POWER
MONITOR OUT Capturing images simultaneously from 2 cameras oriented at different angles allows 3D analysis. Delay generator
S ms us ns ps POWER TRIGGER MENU ON OFF LCD TRIG TRIG DELAY OUTPUT BUSY + RATE MUM BSP 789 /- INT REM GPIB STORE RECALL 4 56EXP 0 1 2 3 EXC LCD To ABA BA B C D C D C D Camera B Camera
I.I. CONTROLLER C7970-01
PROTECT/ TRIG.IN ERROR TTL/50Ω POWER Camera A image Camera B image MONITOR OUT
Controller PC for analysis
Dual-wavelength simultaneous imaging Chamber Dual-wavelength simultaneous imaging Camera A Controller
I.I. CONTROLLER C7970-01
PROTECT/ TRIG.IN ERROR TTL/50Ω Delay adjustment by DG535 Light flux is split by a dichroic mirror and POWER
MONITOR OUT a band-pass filter is placed in each Trigger optical path to allow only light on the 1ch Camera A required wavelengths to pass through. Gate Simultaneous imaging by 2 camera units Controller I.I. CONTROLLER C7970-01
PROTECT/ TRIG.IN ERROR TTL/50Ω POWER 2ch allows capturing images at the same MONITOR OUT Camera B
timing at different wavelengths. Also 2 B Camera Gate image frames can be captured at Delay generator extremely small intervals by removing the
S ms us ns ps POWER TRIGGER MENU ON OFF LCD TRIG TRIG DELAY OUTPUT BUSY + RATE MUM BSP 789 /- INT REM GPIB STORE RECALL 4 56EXP 0 1 2 3 EXC filters and delaying camera gate time on LCD To ABA BA B C D C D C D Phenomenon one camera unit versus the other camera. PC for analysis
Spectrum measurement Spectrum measurement Spectroscopy Camera Delay adjustment by DG535 Trigger
Spectrum measurement Gate Wavelength analysis of high-speed Delay generator Controller
I.I. CONTROLLER C7970-01
PROTECT/ TRIG.IN ERROR TTL/50Ω S ms us ns ps POWER TRIGGER MENU ON OFF POWER LCD phenomena can be performed by TRIG BUSY TRIG DELAY OUTPUT RATE BSP 789+/ MUM - MONITOR OUT INT REM GPIB STORE RECALL 4 56EXP 0 1 2 3 EXC LCD combining with a polychromator. The To ABA BA B C D C D C D polychromator can contain 3 gratings that Phenomenon allow versatile measurements by 200 100 switching the spectral range and/or Trgger GPIB
spectral resolution. *1 0 200 400 600 Wavelength(nm) Chamber PC for analysis
Spectroscopy Camera Multi-wavelength spectrum measurement Delay adjustment by DG535 Trigger Multi-wavelength spectrum Delay generator Controller
measurement* I.I. CONTROLLER C7970-01
PROTECT/ TRIG.IN ERROR TTL/50Ω
S ms us ns ps POWER POWER TRIGGER MENU ON OFF LCD TRIG TRIG BUSY DELAY OUTPUT Gate + MONITOR OUT RATE MUM BSP 789 /- INT REM GPIB STORE RECALL 4 56EXP 0 1 2 3 EXC Connecting a dedicated fiber (5-branch LCD To ABA BA B C D C D C D taps on input) to a polychromator allows high speed analysis at 5 different locations. Phenomenon Trgger GPIB 200
100 Chamber PC for analysis 0 200 400 600 Wavelength(nm) Delay generator
S ms us ns ps POWER TRIGGER MENU ON OFF LCD TRIG TRIG DELAY OUTPUT BUSY + RATE MUM BSP 789 /- INT REM GPIB STORE RECALL 4 56EXP 0 1 2 3 EXC LCD High speed gated spectrum To ABA BA B C D C D C D measurement PC for analysis Changes in specific wavelength distributions can be acquired with time resolution in the nanosecond range by inserting a band-pass filter and acquiring images at incremental Camera timing delays preprogrammed in the ICCD software. *1 Separate software is required for wavelength analysis.
6 Options
Data analyzer Optics
Type Number C6808-36, -37, -51, -52 UV Lens A12692-01 Interface Digital Focus length 105 mm ICCD Gate time F value F4.5 camera Image intensifier gain Spectral transmittance 200 nm control Binning Lens mount F-mount External synchronize exposure Number of compatible cameras Up to 2 cameras (-51 only) UV Lens A4869 Image One shot Focus length 50.4 mm acquisition Sequential acquisition F value F3.5 Image Dark current correction Spectral transmittance 200 nm or more correction Shading correction Lens mount C-mount Distortion correction Attachment size 40.5 mm (P=0.5 mm) Image Profile processing Statistical processing Inter-image arithmetic operation Image zoom in/out Magnifying Optics A7976-02 Brightness/contrast LUT The A7976-02 is a simple magnifying lens Control unit DG535 (-37, -52 only) optimized for imaging in the visible through External control Image file (Supports only some functions) near-infrared range. It can be used to Data save TIFF(8/16 bit) capture images at various wavelengths by DIB
Digital delay generator DG535
This general-purpose delay generator is ideal for controling the timing and synchronization of ICCD camera, pulsed laser and other instruments. Can be externally or internally triggered. Up to four channels can be pre-programmed in the ICCD soft- ware for easy operation.
Number of output channel 4 channels (BNC) Output level TTL, ECL, NIM, VAR 50 Ω/HIGH Delay setting range 0 ps to 999.9 s Delay resolution 5 ps Minimum delay time 85 ns Reptition frequency Single, 0.001 Hz to 1 MHz Sync output TTL, ECL, NIM, VAR 50 Ω / HIGH External trigger input 50 Ω / HIGH rise / fall Thresh hold voltage ± 2.56 V Control GPIB control Trigger jitter 60 ps +1E-6 × Delay time Power supply AC100 V, 120 V, 220 V Power consumption Approx.100 VA
7 Dimensional outlines / Analog camera system
Dimensional outlines (Unit: mm)
C11370-xx-1, -2 Series (Approx. 2.0 kg) C11370-xx-3 Series (Approx. 2.8 kg)
1-32UNC 238±5 1-32UNC 188±5 0.5 ± 0.5 0.5 ± ± 139.5 130 130 0.5 0.5 ± ± 92 92
40±0.2 1/4-20UNC D=6 1/4-20UNC D=6 42.5±0.5 50±0.2 50±0.2 40±0.2 42.5±0.5 50±0.2 50±0.2 6-M4 D=6 6-M4 D=6 ± 95 0.5 95±0.5 0.2 0.2 ± ± 25 25
Gated I.I. Controller (Approx. 2.8 kg)
I.I CONTROLLER C11370
PROTECT/ TRIG.IN ERROR TTL/50 1 POWER ±
MONITOR OUT 74
170±2 23±2 260±2 2 232±1 ± 308±1 7
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