MAC Report 2013: IV Industrial Processes Sector
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The State of Stratospheric Ozone Depletion
The State of Stratospheric Ozone Depletion September 2003 I. Executive Summary Ozone, composed of three molecules of oxygen bonded together, forms a protective barrier in the Earth's upper atmosphere. The greatest concentration of ozone molecules, about 90 percent of all found on the planet, is found about 15 miles (25 km) above the Earth's surface in the stratosphere. This concentration is what scientists refer to as the ozone layer. Ozone shields the Earth from harmful ultraviolet (UV) radiation that damages all living things on the planet. Over 30 years ago, scientists began noticing a decrease in the concentration of ozone in the Earth’s stratosphere. They noticed new health and ecological problems and pinpointed ozone-destroying substances, created and released by natural, and overwhelmingly, human, processes as causing the thinning of Earth’s protective ozone layer. Through years of study, scientists are beginning to understand the processes contributing to breakdown of stratospheric ozone, especially over the polar regions. They have worked with governments and industries in the U.S. and around the world to institute measures to address those factors and find substitutes for the chemicals causing the problem. While important strides have been made through the cooperative efforts of the scientific community, governments and industry, much remains to be done before stratospheric ozone depletion ceases to be a serious environmental problem. Continued perseverance and dedication to finding and developing the best solutions to this phenomenon is necessary to enable the full recovery of this critical atmospheric resource. The world has come far, but not far enough, on solutions to stratospheric ozone depletion. -
Difluoromethane (HFC-32) CAS No
Difluoromethane (HFC-32) CAS No. 75-10-5 (Second Edition) JACC No. 54 ISSN-0773-6339-54 Brussels, June 2008 Difluoromethane (HFC-32) CAS No. 75-10-5 ECETOC JACC REPORT No. 54 © Copyright – ECETOC AISBL European Centre for Ecotoxicology and Toxicology of Chemicals 4 Avenue E. Van Nieuwenhuyse (Bte 6), B-1160 Brussels, Belgium. All rights reserved. No part of this publication may be reproduced, copied, stored in a retrieval system or transmitted in any form or by any means, electronic, mechanical, photocopying, recording or otherwise without the prior written permission of the copyright holder. Applications to reproduce, store, copy or translate should be made to the Secretary General. ECETOC welcomes such applications. Reference to the document, its title and summary may be copied or abstracted in data retrieval systems without subsequent reference. The content of this document has been prepared and reviewed by experts on behalf of ECETOC with all possible care and from the available scientific information. It is provided for information only. ECETOC cannot accept any responsibility or liability and does not provide a warranty for any use or interpretation of the material contained in the publication. ECETOC JACC No. 54 Difluoromethane (HFC-32) CAS No. 75-10-5 Difluoromethane (HFC-32) CAS No. 75-10-5 CONTENTS EXECUTIVE SUMMARY 1 ECETOC SCHEME FOR THE JOINT ASSESSMENT OF COMMODITY CHEMICALS 2 1. SUMMARY AND CONCLUSIONS 3 2. IDENTITY, PHYSICAL AND CHEMICAL PROPERTIES, ANALYTICAL METHODS 5 2.1 Identity 5 2.2 EU classification and labelling 6 2.3 Physical and chemical properties 6 2.4 Conversion factors 8 2.5 Analytical methods 8 3. -
JUN 241996Science
Non-Perfluorocompound Chemistries for Plasma Etching of Dielectrics by Benjamin A. Tao S.B., Materials Science and Engineering Massachusetts Institute of Technology, 1993 Submitted to the Department of Materials Science and Engineering in partial fulfillment of the requirements for the degree of Master of Science in Materials Science and Engineering at the Massachusetts Institute of Technology June 1996 © 1996 Massachusetts Institute of Technology. All rights reserved. Signature of Author .............. I6epartment of Materials Science and Engineering May 10, 1996 Certified b y ............. ......................................... L. Rafael Reif Director, Microsystems Technology Laboratories Professor, Department of Electrical Engineering and Computer Science Thesis Supervisor Accepted by.............. -ivncnaeI P. Rubner TDK Professor of Polymer Materials Science and Engineering Chair, Departmental Committee on Graduate Students Rea( byby... ... ...................... SEugene A. Fitzgerald Professor, Department of Materials Science and Engineering .aASSACGHIS iNS 0tU! E OF TECHNO'OGY JUN 241996Science LIBRARIES Non-Perfluorocompound Chemistries for Plasma Etching of Dielectrics by Benjamin A. Tao Submitted to the Department of Materials Science and Engineering on May 10, 1996 in partial fulfillment of the requirements for the degree of Master of Science in Materials Science and Engineering ABSTRACT Perfluorocompounds commonly used by the microelectronics industry are considered potent global warming gases. These fully fluorinated compounds have global warming potentials thousands to tens of thousands times greater than that of carbon dioxide. Using gases with lower or zero global warming potential as replacements is an option for reducing this environmental threat. This thesis begins the work of determining the viability of using replacement chemistries as an option for controlling perfluorocompound emissions. This work was comprised of three stages. -
HCFC-123) CAS No
1,1-Dichloro-2,2,2-trifluoroethane (HCFC-123) CAS No. 306-83-2 (Third Edition) JACC No. 47 ISSN-0773-6339-47 Brussels, May 2005 1,1-Dichloro-2,2,2-trifluoroethane (HCFC-123) ECETOC JACC REPORT No. 47 © Copyright – ECETOC European Centre for Ecotoxicology and Toxicology of Chemicals 4 Avenue E. Van Nieuwenhuyse (Bte 6), B-1160 Brussels, Belgium. All rights reserved. No part of this publication may be reproduced, copied, stored in a retrieval system or transmitted in any form or by any means, electronic, mechanical, photocopying, recording or otherwise without the prior written permission of the copyright holder. Applications to reproduce, store, copy or translate should be made to the Secretary General. ECETOC welcomes such applications. Reference to the document, its title and summary may be copied or abstracted in data retrieval systems without subsequent reference. The content of this document has been prepared and reviewed by experts on behalf of ECETOC with all possible care and from the available scientific information. It is provided for information only. ECETOC cannot accept any responsibility or liability and does not provide a warranty for any use or interpretation of the material contained in the publication. ECETOC JACC No. 47 1,1-Dichloro-2,2,2-trifluoroethane (HCFC-123) 1,1-Dichloro-2,2,2-trifluoroethane (HCFC-123) CAS No. 306-83-2 (Third Edition) CONTENTS EXECUTIVE SUMMARY 1 THE ECETOC SCHEME FOR THE JOINT ASSESSMENT OF COMMODITY CHEMICALS 2 LIST OF SPECIAL ABBREVIATIONS 3 1. SUMMARY AND CONCLUSIONS 4 2. IDENTITY, PHYSICAL AND CHEMICAL PROPERTIES, ANALYTICAL METHODS 8 2.1 Identity 8 2.2 EU classification and labelling 8 2.3 Physical and chemical properties 9 2.4 Conversion factors 10 2.5 Analytical methods 10 3.