The X-Ray Polarization Probe Mission Concept
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The X-ray Polarization Probe mission concept Keith Jahodaa, Henric Krawczynskib, Fabian Kislatc, Herman Marshalld, Takashi Okajimaa aNASA/Goddard Space Flight Center, Greenbelt MD, 20771 bWashington University, St.Louis, MO, 63130 cUniversity of New Hampshire, Durham, NH, 03824 dMIT Kavli Institute, Cambridge, MA, 02139 Co-authors: Ivan Agudo (CSIC), Lorella Angelini (NASA/GSFC), Matteo Bachetti (INAF), Luca Baldini (U. Pisa), Matthew G. Baring (Rice U.), Wayne Baumgartner (NASA/MSFC), Ronaldo Bellazzini (INFN), Stefano Bianchi (U. Roma Tre), Niccolo` Bucciantini (INAF/OAC), Ilaria Ca- iazzo (UBC), Fiamma Capitanio (INAF/IAPS), Paolo Coppi (Yale U.), Ettore Del Monte (INAF), Alessandra De Rosa (IAPS/INAF), Laura Di Gesu (ASI), Niccolo’ Di Lalla (INFN), Victor Doroshenko (U. Tubingen),¨ Michal Dovciak (Cz. Acad. Sci.), Riccardo Ferrazzoli (INAF/IAPS), Alan Gar- ner (MIT), Pranab Ghosh (Tata Inst.), Denis Gonzalez-Caniulef´ (UBC), Victoria Grinberg (U. Tubingen),¨ Shuichi Gunji (Yamagata U.), Dieter Hartmann (Clemson U.), Kiyoshi Hayashida (Os- aka), Jeremy Heyl (UBC), Joanne Hill (NASA/GSFC), Adam Ingram (Oxford U.), Wataru Buz Iwakiri (Chuo U.), Svetlana Jorstad (BU), Phil Kaaret (U. Iowa), Timothy Kallman (NASA/GSFC), Vladimir Karas (Cz. Acad. Sci.), Ildar Khabibullin (MPA), Takao Kitaguchi (RIKEN), Jeff Kolodziejczak (NASA/MSFC), Chryssa Kouveliotou (GWU), Ioannis Liodakis (Stanford U.), Thomas Maccarone (Texas Tech U.), Alberto Manfreda (INFN), Frederic Marin (U. Strasbourg), Andrea Marinucci (ASI), Craig Markwardt (NASA/GSFC), Alan Marscher (BU), Giorgio Matt (U. Roma Tre), Mark McConnell (UNH), Jon Miller (U. Michigan), Ikuyuki Mitsubishi (Nagoya U.), Tsune- fumi Mizuno (U. Hiroshima), Alexander Mushtukov (Leiden U.), C.-Y. Ng (Hong Kong U.), Michael A. Nowak (Wash. U. in St. Louis), Steve O’Dell (NASA/MSFC), Alessandro Papitto (INAF/OAR), Dheeraj Pasham (MIT), Mark Pearce (KTH), Lawrence Peirson (Stanford U.), Mat- teo Perri (SSDC/ASI), Melissa Pesce-Rollins (INFN), Vahe Petrosian (Stanford U.), Pierre-Olivier Petrucci (U. Grenoble), Maura Pilia (INAF/OAC), Andrea Possenti (INAF/OAC, U. Cagliari), Juri Poutanen (U. Turku), Chanda Prescod-Weinstein (UNH), Simonetta Puccetti (ASI), Tuomo Salmi (U. Turku), Kevin Shi (MIT), Paolo Soffitta (IAPS/INAF), Gloria Spandre (INFN), James F. Steiner (SAO), Tod Strohmayer (NASA/GSFC), Valery Suleimanov (U. Tubingen),¨ Jiri Svo- boda (Cz. Acad. Sci.), Jean Swank (NASA/GSFC), Toru Tamagawa (RIKEN), Roberto Taverna (U. Roma Tre), John Tomsick (UCB), Alessio Trois (INAF/OAC), Sergey Tsygankov (U. Turku), Roberto Turolla (U. Padova), Jacco Vink (U. Amsterdam), Jorn¨ Wilms (U. Erlangen-Nuremberg), Kinwah Wu (MSSL, UCL), Fei Xie (INAF), Alessandra Zaino (U. Roma Tre), Anna Zajczyk (NASA/GSFC, UMBC), Silvia Zane (MSSL, UCL), Andrzej Zdziarski (NCAC), Haocheng Zhang (Purdue U.), Wenda Zhang (Cz. Acad. Sci.), Ping Zhou (U. Amsterdam) Abstract: The X-ray Polarization Probe (XPP) is a second generation X-ray polarimeter fol- lowing up on the Imaging X-ray Polarimetry Explorer (IXPE). The XPP will offer true broadband polarimetery over the wide 0.2-60 keV bandpass in addition to imaging polarimetry from 2-8 keV. The extended energy bandpass and improvements in sensitivity will enable the simultaneous mea- surement of the polarization of several emission components. These measurements will give qual- itatively new information about how compact objects work, and will probe fundamental physics, i.e. strong-field quantum electrodynamics and strong gravity. 1 Key Science Goals and Objectives The X-ray Polarization Probe (XPP) is a mission concept for a second-generation polarimetry mis- sion following up on the Imaging X-ray Polarimetry Explorer (IXPE) mission to be launched in 2021.1,2 IXPE will open the field of observational X-ray polarimetry with a modest instrument, compatible with the constraints of NASA’s Small Explorer program, and consequently has a mod- est bandpass (a factor of 4 between the limiting energies at the upper and lower ends of the band) and effective area (peaking near 130 cm2 at 2.2 keV). XPP, as a second generation instrument, aspires to at least an order of magnitude increase in both effective area and band width and to substantially improved imaging capabilities. XPP will extend the 2-8 keV bandpass of IXPE to 0.2 keV - 60 keV and improve on IXPE’s sensitivity in IXPE’s core energy range from 2-8 keV by a factor between 3 and 10. The XPP includes two telescopes with Hitomi style mirrors simul- taneously illuminating three instruments which span the 0.2 - 60 keV band and one telescope with IXPE-type imaging polarimetric capabilities (15” Half Power Diameter, HPD) in the 2-8 keV en- ergy range. The use of novel Si mirrors may make it possible to improve the angular resolution of all three telescopes to a few arc sec. These capabilities will make it possible to obtain quantitatively new information about the most extreme objects in the Universe: black holes, neutron stars, magnetars and Active Galactic Nuclei. Although the number of objects accessible to XPP is still modest (a few hundred sources with high signal to noise ratio polarization measurements), the observations will enable physics- type experiments probing the inner workings of these sources of high-energy X-rays, and probing the underlying physical laws in truly extreme conditions. Our XPP science white paper3 identified three high-profile science investigations: (1) Dissect the structure of inner accretion flow onto black holes and observe strong gravity effects; (2) Use neutron stars as fundamental physics laboratories; (3) Probe how cosmic particle accelerators work and what role magnetic fields play. Here we report on a possible implementation of the XPP based on a detailed mission imple- mentation study performed in cooperation with the COMPASS Team at the NASA Glenn Research Center. The XPP science objectives require sensitivity to faint signals, which drives requirements for large collecting area over a wide band and precise control of systematic effects. The large area requires grazing incidence mirrors. The need to limit systematics leads to tight requirements on alignment and pointing, which XPP addresses with a stiff and thermally stable optical bench. The optical bench is designed without the need for in-orbit extension as shown in Figure1. To reduce residual and uncalibrated asymmetries in the payload, XPP will rotate about the line of sight. 2 Technical Overview 2.1 Key Observables The XPP measures the arrival times, energies, and linear polarization of 0.2-60 keV X-rays making use of three complimentary techniques. The instruments exploit polarization dependent scattering cross sections at low energies (below 1 keV), measure the polarization dependent initial direction of the photoelectron that is ejected after a photoelectric absorption at intermediate 2-10 keV photon energies, and measure the polarization dependent direction of a Compton scattered photon at 10-60 keV photon energies. The cross over in energy between photoelectric dominated interactions and Compton dominated interactions depends on the atomic number of the absorbing medium; for the XPP instrument complement, the photoelectric process dominates the sensitivity below ∼10 keV 1 Fig 1 XPP employs fixed solar panels surrounding a 10 m optical bench and fixed phased-array antennas for commu- nication. The only (one-time) deployables are a sun shade and the three telescope doors. and the Compton process dominates above. Separate photon counting instruments observe simul- taneously below 1 keV (scattering), below 10 keV (photoelectric), and above 10 keV (Compton). 2.2 Instrument and Spacecraft Performance Requirements The XPP measures the arrival times and energies of 0.2-60 keV X-rays with < 1µs and < 20% energy resolution at all wavelengths, respectively. Most importantly, it measures the linear po- larization fraction and polarization angle. The design aims at a sensitivity of <1% Minimum Detectable Polarization (MDP) at 99% confidence level for a 105 sec observation of a 1 mCrab source. This sensitivity will enable the study of statistical samples (each: ∼10-50 sources) of the key sources: stellar mass black holes, active galactic nuclei, pulsars, magnetars, X-ray binaries, super nova remnants, and blazars. Systematic errors below 0.2% in the polarization fraction are re- quired to measure the typical polarization fractions of ∼5% with sufficient accuracy to distinguish between competing models. Imaging polarimetry with angular resolutions between 1” (goal) and 15” (requirement) enable the studies of extended sources such as pulsar wind nebulae, supernova remnants, and the jets from active galactic nuclei. Three of the instruments on XPP do not have an imaging capability, which creates two high level Attitude Control requirements. First, pointing must be controlled to a small fraction of the telescope point spread function and second, the Observatory must rotate about the line of sight to both measure and eliminate residual asymmetries in the angular response. 2.3 Mission Architecture The XPP payload consists of three grazing incidence X-ray mirrors and four focal instruments. Each mirror has a diameter of 60 cm and a focal length of 10 m. Two of the telescopes are designed for maximum throughput, and simultaneously illuminate a Low Energy Polarimeter (LEP, sensitive from ∼0.2-0.8 keV), a Medium Energy Polarimeter (MEP, sensitive from ∼2 - 10 keV), and a High Energy Polarimeter (HEP, sensitive from ∼6 - 60 keV). These instruments are not