Title Electrical treeing: A phase-field model Author(s) Cai, Ziming; Wang, Xiaohui; Li, Longtu; Hong, Wei Extreme mechanics letters, 28, 87-95 Citation https://doi.org/10.1016/j.eml.2019.02.006 Issue Date 2019-04 Doc URL http://hdl.handle.net/2115/79673 © 2019. This manuscript version is made available under the CC-BY-NC-ND 4.0 license Rights https://creativecommons.org/licenses/by-nc-nd/4.0/ Rights(URL) https://creativecommons.org/licenses/by-nc-nd/4.0/ Type article (author version) File Information manuscript-electric-treeing-WH-19-2-18-no-mark.pdf Instructions for use Hokkaido University Collection of Scholarly and Academic Papers : HUSCAP Electrical treeing: a phase-field model Ziming Caia,d, Xiaohui Wanga, Longtu Lia, Wei Hongb,c,d* a State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, PR China b Department of Mechanics and Aerospace Engineering, Southern University of Science and Technology, Shenzhen, Guangdong 518055, PR China c Global Station for Soft Matter, Global Institution for Collaborative Research and Education, Hokkaido University, Sapporo, Japan d Department of Aerospace Engineering, Iowa State University, Ames, IA 50010, USA Corresponding Author *Wei Hong, E-mail:
[email protected] Abstract Electrical treeing is a commonly observed phenomenon associated with dielectric breakdown in solid dielectrics. In this work, a phase-field model is developed to study the initiation and propagation of electrical trees in two different geometries: a parallel capacitor and a cylindrical capacitor. The model utilizes a continuous field of damage variable to distinguish the localized damaged regions from the undamaged bulk material.