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Investigation of Microscale Electromagnetic Forming Reid Vanbenthysen University of New Hampshire, Durham

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Investigation of Microscale Electromagnetic Forming Reid Vanbenthysen University of New Hampshire, Durham University of New Hampshire University of New Hampshire Scholars' Repository Master's Theses and Capstones Student Scholarship Spring 2011 Investigation of microscale electromagnetic forming Reid VanBenthysen University of New Hampshire, Durham Follow this and additional works at: https://scholars.unh.edu/thesis Recommended Citation VanBenthysen, Reid, "Investigation of microscale electromagnetic forming" (2011). Master's Theses and Capstones. 644. https://scholars.unh.edu/thesis/644 This Thesis is brought to you for free and open access by the Student Scholarship at University of New Hampshire Scholars' Repository. It has been accepted for inclusion in Master's Theses and Capstones by an authorized administrator of University of New Hampshire Scholars' Repository. For more information, please contact [email protected]. INVESTIGATION OF MICROSCALE ELECTROMAGNETIC FORMING BY REID VANBENTHYSEN Baccalaureate of Science, University of New Hampshire, 2008 Submitted to the University of New Hampshire In Partial Fulfillment of The Requirements for the Degree of Master of Science in Mechanical Engineering May, 2011 UMI Number: 1498975 All rights reserved INFORMATION TO ALL USERS The quality of this reproduction is dependent upon the quality of the copy submitted. In the unlikely event that the author did not send a complete manuscript and there are missing pages, these will be noted. Also, if material had to be removed, a note will indicate the deletion. UMI Dissertation Publishing UMI 1498975 Copyright 2011 by ProQuest LLC. All rights reserved. This edition of the work is protected against unauthorized copying under Title 17, United States Code. uest ProQuest LLC 789 East Eisenhower Parkway P.O. Box 1346 Ann Arbor, Ml 48106-1346 This thesis has been examined and approved. Thesis Director, Brad Kinsey, Associate Professor of Mechanical Engineering v4/0Z T^u/ct&V Igor Tsukrs»v, Professor of Mechanical Engineering ?J*> i.L.^ Robert Jerard, Professor of Mechanical Engineering S/sr/(i Date Dedicated to Josephine (Mimi) III ACKNOWLEDGEMENTS Support from NSF (CMMI-0644705 and 0928319) for my research is gratefully acknowledged. I would like to thank my advisor, Brad Kinsey, who has been a constant source of knowledge and support throughout both my undergraduate and graduate degrees. Technical assistance from Sheldon Parent, Robert Champlin in the machine shop and Adam Perkins in Electrical Engineering is greatly appreciated. Many thanks are due to Tracey Harvey who has worked diligently throughout my schooling to assist me in any way possible. I am also thankful to Jianhui Shang of Hirotec America Inc. and American Trim, Glenn Daehn's research group at The Ohio State University as well as Turbocam of Barrington, NH for use of their CMM. An immense deal of gratitude is due to my parents, Barbara and Gene, my brother, Brett, and my late grandmother, Josephine (Mimi), whose support and motivation for further education could not have been sought after more than it was given. IV Table of Contents ACKNOWLEDGEMENTS IV LIST OF TABLES VII LIST OF FIGURES VIII ABSTRACT XI CHAPTER I: INTRODUCTION 1 CHAPTER II: INITIAL INVESTIGATION OF FLANGING WITH EM AND QUASI- STATIC PROCESSES 7 2.1 TOOLING 7 2.2 SPECIMENS 8 2.3 INITIAL EM FLANGING EXPERIMENTAL SET-UP 9 2.4 INITIAL EM FLANGING RESULTS 12 2.5 EMF ANALYTICAL MODEL 16 2.6 QUASI-STATIC EXPERIMENTAL SET-UP 18 2.7 QUASI-STATIC RESULTS 19 2.8 COMPARISON OF EMF AND QUASI-STATIC PROCESSES 25 2.9 CHAPTER SUMMARY 30 CHAPTER III: EM FLANGING EXPERIMENTS WITH FLAT SPIRAL COIL 31 3.1 COIL DESIGN 32 3.2 MICRO FLANGING INVESTIGATION 37 3.2.1 Tooling 37 3.2.2 Specimens 38 3.2.3 Experimental Set-up 40 3.2.4 Experimental Results 45 3.2.5 Discussion 45 3.3 PLANAR AREA INVESTIGATION 46 3.3.1 Tooling 46 3.3.2 Specimens 47 3.3.3 Experimental Set-up 48 3.3.4 Experimental Results 49 3.3.5 Discussion 55 3.4 CHAPTER SUMMARY 57 V CHAPTER IV: INVESTIGATION OF MAGNETIC PULSED WELDING 59 4.1 SPECIMENS 59 4.2 COIL DESIGN 60 4.3 EXPERIMENTAL SET-UP 65 4.4 EXPERIMENTAL RESULTS 66 4.5 CHAPTER SUMMARY 71 CHAPTER V: CONCLUSIONS 72 CHAPTER VI: FUTURE WORK 74 REFERENCES 76 APPENDICES 78 APPENDIX A 78 APPENDIX B 80 APPENDIX C 81 APPENDIX D 82 APPENDIX E 84 VI LIST OF TABLES Table 2.1: Specimen Grain Size Information 9 Table 2.2: Comparison of EM flanging angles and grain size ratios (grains through thickness) for various energy inputs 14 Table 2.3: Parameters for electromagnetic forming process 17 Table 2.4: Springback angle values in degrees for various cases 21 Table 2.5: Comparison of flanging and three point bending data 25 Table 2.6: Comparison of EMF forces and experimental flanging forces 25 Table 3.1: Specimen Grain Size and Heat Treating Information 39 VII LIST OF FIGURES Figure 1.1: Effects of miniaturization on yield strength during bending [4] 2 Figure 1.2: Shape anomaly during micro-extrusion of coarse grain pin [3] 2 Figure 1.3: Effect of miniaturization on springback angle and data scatter during 3 point bending [5] 3 Figure 2.1: Die and punch schematic with scaling factors 8 Figure 2.2: Specimen dimensions as feature of thickness 9 Figure 2.3: Schematic and dimensions of copper coil for initial EM flanging experiments. 10 Figure 2.4: Initial EM flanging set-up showing copper coil, specimen and current path. 10 Figure 2.5: Experimental set-up for the initial EM flanging experiments 11 Figure 2.6: Flanging set-up of specimen on die 11 Figure 2.7: Effect of energy input on EM flanging angle for 0.508 mm specimen 13 Figure 2.8: Non-uniform EM flanging of 1.588 mm specimen 13 Figure 2.9: EM flanging of the 0.127 mm sample with a larger sheet of the same material acting as a driver 15 Figure 2.10: Complete EM flanging of 0.127 mm specimen using a driver material (not shown) 16 Figure 2.11: SEM loading stage with 1.588 mm tooling and sample 18 Figure 2.12: Flanging force versus punch displacement for a) 1.588 mm, b) 0.508 mm and c) 0.127 mm thickness samples with varying grains through the thickness 20 Figure 2.13: Springback of a 0.508 mm specimen measured from superimposed pictures. 21 Figure 2.14: Normalized flanging force versus normalized displacement for a) 2 grains through the thickness andb) 10 grains through the thickness 23 Figure 2.15: Process schematics for (a) three point bending and (b) flanging [14] 24 Figure 2.16: Microhardness measurements through the thickness and length 26 VIII Figure 2.17: Contour plots of hardness for the a) quasi-static and b) 3.1kJ EM processes, both 10 grains/thickness 27 Figure 2.18: Hardness plot for 3.7kJ, 10 grains/thickness 28 Figure 2.19: Results from past 3 point bending experiments conducted at UNH. a) 1 set or measurements and b) an average of 4 sets 29 Figure 3.1: Working chamber to house EMF experiments 32 Figure 3.2: CAD model of spiral coil for EM Flanging 32 Figure 3.3: a) MAGNET model and b) magnetic flux density of U-shaped coil end 34 Figure 3.4: a) MAGNET model and b) Magnetic Flux Density of flat spiral coil 35 Figure 3.5: Schematic of coil construction: a) spiral pocket machined into polycarbonate sheet, b) annealed wire pressed into spiral pocket with leads to/from capacitor bank, c) coil/sheet combination mounted in polycarbonate ring and d) filled with epoxy 36 Figure 3.6: Flat spiral coil embedded in high strength epoxy and secured in a polycarbonate tube 37 Figure 3.7: Clamping of 1.588 mm specimen with polycarbonate block 38 Figure 3.8: Microstructure of a) 1.588 mm specimen (800C, 180min) demonstrating 3-5 grains present through the thickness and b) 1.588 specimen (670C, 30min) exhibiting both coarse and fine grains 40 Figure 3.9: Experimental set-up for EM flanging 41 Figure 3.10: Diagram of current acquisition system 42 Figure 3.11: Current acquired from a Rogowski coil at 50% machine input voltage level. 43 Figure 3.12: Current measurements at the incoming and outgoing leads of flat spiral coil. 43 Figure 3.13: Current response from five tests at a 15% input voltage level 45 Figure 3.14: Largest specimen (47 mm x 47 mm x 0.508 mm) fixtured to polycarbonate die with 4-40 screws 47 Figure 3.15: Top view showing die and spiral coil coverage of all specimens (10, 14, 18, 22, 35 and 47 mm) 48 Figure 3.16: Increased flanging with increased specimen width for a) all cases with equal overhang and b) most cases with biased overhang 50 IX Figure 3.17: Schematic of one set of measurement locations for a) 14 mm and b) 47 wide specimens 51 Figure 3.18: Flanging angle versus specimen width for a) equal overhang and b) biased overhang cases 53 Figure 3.19: Flanging angle versus location through specimen width for a) equal overhang and b) biased overhang cases 55 Figure 3.20: Increase in flanging angle versus specimen width for all cases 57 Figure 4.1: Single turn axi-symmetric coil design for MPW 60 Figure 4.2: Cross-sectional view of single turn axi-symmetric coil with taper angle (6). 60 Figure 4.3: MAGNET model of single turn axi-symmetric coil, flier tube and target tube. 61 Figure 4.4: MAGNET results of magnetic flux density (B) for 60 degree case 62 Figure 4.5: Magnetic flux density versus horizontal X-distance inward from coil landing.
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