Examing Anisotropic Optical Properties of Anatase and Rutile
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Glancing Angle Deposition of Thin Films Engineering the Nanoscale
Wiley Series in Materials for Electronic & Optoelectronic Applications Matthew M. Hawkeye Michael T. Taschuk Michael J. Brett Glancing Angle Deposition of Thin Films Engineering the Nanoscale Glancing Angle Deposition of Thin Films Wiley Series in Materials for Electronic and Optoelectronic Applications www.wiley.com/go/meoa Series Editors Professor Arthur Willoughby, University of Southampton, Southampton, UK Dr Peter Capper, SELEX Galileo Infrared Ltd, Southampton, UK Professor Safa Kasap, University of Saskatchewan, Saskatoon, Canada Published Titles Bulk Crystal Growth of Electronic, Optical and Optoelectronic Materials, Edited by P. Capper Properties of Group-IV, III–V and II–VI Semiconductors, S. Adachi Charge Transport in Disordered Solids with Applications in Electronics, Edited by S. Baranovski Optical Properties of Condensed Matter and Applications, Edited by J. Singh Thin Film Solar Cells: Fabrication, Characterization and Applications, Edited by J. Poortmans and V. Arkhipov Dielectric Films for Advanced Microelectronics, Edited by M. R. Baklanov, M. Green and K. Maex Liquid Phase Epitaxy of Electronic, Optical and Optoelectronic Materials, Edited by P. Capper and M. Mauk Molecular Electronics: From Principles to Practice, M. Petty CVD Diamond for Electronic Devices and Sensors, Edited by R. S. Sussmann Properties of Semiconductor Alloys: Group-IV, III–V and II–VI Semiconductors, S. Adachi Mercury Cadmium Telluride, Edited by P. Capper and J. Garland Zinc Oxide Materials for Electronic and Optoelectronic Device Applications, Edited by C. Litton, D. C. Reynolds and T. C. Collins Lead-Free Solders: Materials Reliability for Electronics, Edited by K. N. Subramanian Silicon Photonics: Fundamentals and Devices, M. Jamal Deen and P. K. Basu Nanostructured and Subwavelength Waveguides: Fundamentals and Applications, M. -
Thin Films Sectional Programme Overview THIN FILMS Prof. Dr. Bernd Rauschenbach
Thin Films Sectional Programme Overview THIN FILMS DUNNE¨ SCHICHTEN (DS) Prof. Dr. Bernd Rauschenbach (DPG) Prof. Dr. Klaus Wandelt (EPS) Leibniz-Institut f¨urOberfl¨achenmodifizierung Universit¨at Bonn Permoserstr. 15 Institut f¨urPhysikalische und Theoretische Chemie 04318 Leipzig Wegelerstr. 12 [email protected] 53115 Bonn [email protected] OVERVIEW OF INVITED TALKS AND SESSIONS (lecture rooms GER 37, GER 38) Invited Talks DS 2.1 Mon 11:15 (GER 37) Phase change materials for optical and electronic storage, Ch. Steimer, R. Detemple, H. Dieker, J. Kalb, D. Wamwangi, W. Welnic, M. Wuttig, RWTH Aachen DS 3.1 Mon 09:30 (GER 38) X-ray diffraction analysis of residual stress fields in thin films - basic aspects and applications, Ch. Genzel, Hahn-Meitner-Institut, Berlin DS 6.1 Mon 14:00 (GER 38) Direct observation of substrate-dependent organic layer growth, E. Umbach1, T. Schmidt1, A. Sch¨oll1, H. Marchetto2, H.-J. Freund2, R. Fink3, 1University of W¨urzburg, 2Fritz-Haber-Institute Berlin, 3Max-Planck-Gesellschaft, University of Erlangen DS 8.1 Tue 09:30 (GER 37) Strained silicon-transistor performance increase with new materials, M. Hecker, L. Zhu, J. Rinderknecht, H. Geisler, E. Zschech, AMD Dresden DS 11.2 Tue 11:30 (GER 38) Fluorescence from ultrathin organic films on crystalline surfaces, M. Sokolowski, Universit¨at Bonn DS 15.1 Wed 15:30 (GER 38) Nanoparticulate films of high anisotropy magnetic materials: A status quo, B. Rellinghaus, Leibniz-Institut f¨urWerkstofforschung, Dresden DS 16.1 Thu 09:30 (GER 37) Ion beam shaping of nanometals, A. Vredenberg, Utrecht University DS 18.5 Thu 10:30 (GER 38) Formation and decay of Si/Ge nanostructures at the atomic level, B. -
Perspectives on Oblique Angle Deposition of Thin Films
Progress in Materials Science 76 (2016) 59–153 Contents lists available at ScienceDirect Progress in Materials Science journal homepage: www.elsevier.com/locate/pmatsci Perspectives on oblique angle deposition of thin films: From fundamentals to devices ⇑ Angel Barranco, Ana Borras, Agustin R. Gonzalez-Elipe , Alberto Palmero Instituto de Ciencia de Materiales de Sevilla (CSIC-US), c/ Americo Vespucio 49, 41092 Seville, Spain article info abstract Article history: The oblique angle configuration has emerged as an invaluable tool Received 9 October 2014 for the deposition of nanostructured thin films. This review Received in revised form 19 May 2015 develops an up to date description of its principles, including the Accepted 12 June 2015 atomistic mechanisms governing film growth and nanostructuration Available online 28 August 2015 possibilities, as well as a comprehensive description of the applica- tions benefiting from its incorporation in actual devices. In contrast Keywords: Oblique angle deposition with other reviews on the subject, the electron beam assisted evap- Glancing angle deposition oration technique is analyzed along with other methods operating at Magnetron sputtering oblique angles, including, among others, magnetron sputtering and Electron beam evaporation pulsed laser or ion beam-assisted deposition techniques. To account Nanostructured films for the existing differences between deposition in vacuum or in the Growth modeling presence of a plasma, mechanistic simulations are critically revised, Monte Carlo discussing well-established paradigms such as the tangent or cosine Thin film devices rules, and proposing new models that explain the growth of tilted Transparent conductive oxide porous nanostructures. In the second part, we present an extensive Energy harvesting Sensors description of applications wherein oblique-angle-deposited thin Optical devices films are of relevance. -
Nilusha Perera Thesis
Study of Far-Side Geometrical Enhancement in Surface-Enhanced Raman Scattering A thesis submitted for the degree of Doctor of Philosophy by Nilusha Perera Centre for Quantum and Optical Science Faculty of Science, Engineering and Technology Swinburne University of Technology Melbourne, Australia 2017 “One of the basic rules of the universe is that nothing is perfect. Perfection simply doesn't exist... Without imperfection, neither you nor I would exist.” Stephen Hawking i Dedication This thesis is dedicated to my parents (Thaththa Edward and Amma Desy) who have provided me endless love and courage to follow my dream over the years and to my loving husband Rajith who has always been with me throughout this wonderful journey of PhD. iii Abstract Surface-enhanced Raman scattering (SERS) is a promising method for detection of biomolecules and trace chemicals. The well-established concepts of electromagnetic and chemical enhancements provide the theoretical background of SERS. Over the years since the discovery of SERS, a few research groups have observed an additional enhancement in the SERS signal when exciting the SERS substrate through an underlying transparent dielectric substrate (referred to here as ‘far-side geometrical enhancement’). The experimental evidence was not only limited to planar SERS substrates, but also observed for some SERS-active angled fibre tips. The first significant attempts to explain the origin of this geometrically-enhanced SERS signal appeared in 2013. The supporting information in those works was limited to a single excitation wavelength and provided only qualitative agreement between the proposed theories and the experimental results. Consequently, there remains a need to more carefully study this extra enhancement by addressing some of the gaps in the proposed theories, and comparing the theoretical predictions against more detailed experiments.